Multi-segment winding test transformer design scheme generation method and device, computer equipment, storage medium and computer program product

Abstract

The invention relates to a multi-segment winding test transformer design scheme generation method and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: determining first candidate winding information of a to-be-designed multi-segment winding test transformer; screening out second candidate winding information of which the corresponding short-circuit impedance value is greater than or equal to a target short-circuit impedance threshold value from the first candidate winding information; inputting the second candidate winding information into a cost prediction model corresponding to the to-be-designed multi-segment winding test transformer to obtain a total cost value corresponding to the second candidate winding information; screening out corresponding target winding information with the minimum total cost value from the second candidate winding information; and based on the target winding information, generating target design scheme information of the to-be-designed multi-segment winding test transformer. By adopting the method, the manufacturing cost of the multi-segment winding test transformer can be reduced.

Description

Technical Field

[0001] The present application relates to the technical field of power grids, and in particular, to a method, device, computer device, computer-readable storage medium, and computer program product for generating a design scheme of a multi-segment winding test transformer. Background Art

[0002] In the power system, it is crucial to manufacture a multi-segment winding test transformer to ensure the stability of the power system.

[0003] In the traditional technology, during the manufacturing process of a multi-segment winding test transformer, the short-circuit impedance of the multi-segment winding test transformer is generally increased by simply increasing the number of winding turns; however, this method is likely to greatly increase the usage amount of wire materials, resulting in a high manufacturing cost of the multi-segment winding test transformer. Summary of the Invention

[0004] Based on this, in view of the above technical problems, it is necessary to provide a method, device, computer device, computer-readable storage medium, and computer program product for generating a design scheme of a multi-segment winding test transformer that can reduce the manufacturing cost of the multi-segment winding test transformer.

[0005] In a first aspect, the present application provides a method for generating a design scheme of a multi-segment winding test transformer, including:

[0006] In response to a design scheme generation instruction for a multi-segment winding test transformer to be designed, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, determine a target finite element model of the multi-segment winding test transformer to be designed from a database;

[0007] According to the target finite element model, determine first candidate winding information of the multi-segment winding test transformer to be designed;

[0008] Determine the short-circuit impedance value corresponding to the first candidate winding information;

[0009] From each of the first candidate winding information, screen out the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to a target short-circuit impedance threshold as the second candidate winding information of the multi-segment winding test transformer to be designed;

[0010] Input the second candidate winding information into a cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information;

[0011] From each of the second candidate winding information, screen out the second candidate winding information with the smallest corresponding total cost value as the target winding information corresponding to the multi-segment winding test transformer to be designed;

[0012] Generate an instruction through the design scheme, and generate the target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information.

[0013] In one embodiment, the determining the target finite element model of the multi-segment winding test transformer to be designed based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed includes:

[0014] Obtain the correspondence between the short-circuit test requirement information and the winding division method;

[0015] Query the correspondence to determine the winding division method corresponding to the current short-circuit test requirement information as the target winding division method of the multi-segment winding test transformer to be designed;

[0016] Obtain the candidate finite element models of the multi-segment winding test transformer to be designed from the database, and screen out the candidate finite element models whose corresponding winding division methods meet the target winding division method from each of the candidate finite element models as the target finite element model of the multi-segment winding test transformer to be designed.

[0017] In one embodiment, the determining the first candidate winding information of the multi-segment winding test transformer to be designed according to the target finite element model includes:

[0018] Generate a finite element simulation file corresponding to the target finite element model;

[0019] Perform format conversion processing on the finite element simulation file to obtain a target file that meets the preset format;

[0020] Extract the first candidate winding information of the multi-segment winding test transformer to be designed from the target file.

[0021] In one embodiment, the extracting the first candidate winding information of the multi-segment winding test transformer to be designed from the target file includes:

[0022] Extract the initial winding information of the multi-segment winding test transformer to be designed from the target file;

[0023] Adjust the initial winding information to obtain the adjusted winding information of the multi-segment winding test transformer to be designed;

[0024] Both the initial winding information and the adjusted winding information are used as the first candidate winding information of the multi-segment winding test transformer to be designed.

[0025] In one embodiment, the step of inputting the second candidate winding information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information includes:

[0026] Obtain the cost element information and the structural dimension information corresponding to the multi-segment winding test transformer to be designed;

[0027] Input the second candidate winding information, the cost element information, and the structural dimension information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the copper material cost value, the iron core cost value, and the manufacturing cost value corresponding to the second candidate winding information;

[0028] Sum up the copper material cost value, the iron core cost value, and the manufacturing cost value to obtain the total cost value corresponding to the second candidate winding information.

[0029] In one embodiment, before screening out the first candidate winding information with a corresponding short-circuit impedance value greater than or equal to the target short-circuit impedance threshold from each of the first candidate winding information as the second candidate winding information of the multi-segment winding test transformer to be designed, it further includes:

[0030] Obtain the preset cost value corresponding to the multi-segment winding test transformer to be designed;

[0031] Determine the adjustment values of multiple initial short-circuit impedance thresholds of the multi-segment winding test transformer to be designed according to the preset cost value;

[0032] Adjust the multiple initial short-circuit impedance thresholds according to the adjustment values of the multiple initial short-circuit impedance thresholds to obtain multiple adjusted short-circuit impedance thresholds;

[0033] Perform a fusion process on the multiple adjusted short-circuit impedance thresholds to obtain the target short-circuit impedance threshold.

[0034] In a second aspect, the present application further provides a device for generating a design scheme of a multi-segment winding test transformer, including:

[0035] A model determination module, configured to, in response to a design scheme generation instruction for a multi-segment winding test transformer to be designed, determine the target finite element model of the multi-segment winding test transformer to be designed from a database based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed;

[0036] An information determination module, configured to determine first candidate winding information of the multi-segment winding test transformer to be designed according to the target finite element model;

[0037] An impedance determination module, configured to determine a short-circuit impedance value corresponding to the first candidate winding information;

[0038] An information screening module, configured to screen out, from each of the first candidate winding information, the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to a target short-circuit impedance threshold, as second candidate winding information of the multi-segment winding test transformer to be designed;

[0039] A cost prediction module, configured to input the second candidate winding information into a cost prediction model corresponding to the multi-segment winding test transformer to be designed, and obtain a total cost value corresponding to the second candidate winding information;

[0040] A target screening module, configured to screen out, from each of the second candidate winding information, the second candidate winding information with the smallest corresponding total cost value as target winding information corresponding to the multi-segment winding test transformer to be designed;

[0041] A scheme generation module, configured to generate target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through the design scheme generation instruction.

[0042] In a third aspect, the present application further provides a computer device, including a memory and a processor, where the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0043] In response to a design scheme generation instruction for a multi-segment winding test transformer to be designed, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, determine a target finite element model of the multi-segment winding test transformer to be designed from a database;

[0044] According to the target finite element model, determine first candidate winding information of the multi-segment winding test transformer to be designed;

[0045] Determine a short-circuit impedance value corresponding to the first candidate winding information;

[0046] From each of the first candidate winding information, screen out the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to a target short-circuit impedance threshold as second candidate winding information of the multi-segment winding test transformer to be designed;

[0047] Input the second candidate winding information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed, and obtain the total cost value corresponding to the second candidate winding information;

[0048] From each of the second candidate winding information, screen out the second candidate winding information with the smallest corresponding total cost value as the target winding information corresponding to the multi-segment winding test transformer to be designed;

[0049] Generate a target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through the design scheme generation instruction.

[0050] Fourthly, the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0051] In response to a design scheme generation instruction for a multi-segment winding test transformer to be designed, determine a target finite element model of the multi-segment winding test transformer to be designed from a database based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed;

[0052] Determine the first candidate winding information of the multi-segment winding test transformer to be designed according to the target finite element model;

[0053] Determine the short-circuit impedance value corresponding to the first candidate winding information;

[0054] From each of the first candidate winding information, screen out the first candidate winding information with the corresponding short-circuit impedance value greater than or equal to the target short-circuit impedance threshold as the second candidate winding information of the multi-segment winding test transformer to be designed;

[0055] Input the second candidate winding information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed, and obtain the total cost value corresponding to the second candidate winding information;

[0056] From each of the second candidate winding information, screen out the second candidate winding information with the smallest corresponding total cost value as the target winding information corresponding to the multi-segment winding test transformer to be designed;

[0057] Generate a target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through the design scheme generation instruction.

[0058] Fifthly, the present application also provides a computer program product, including a computer program. When the computer program is executed by a processor, the following steps are implemented:

[0059] In response to a command for generating a design plan for a multi-segment winding test transformer to be designed, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, determine a target finite element model of the multi-segment winding test transformer to be designed from a database;

[0060] According to the target finite element model, determine first candidate winding information of the multi-segment winding test transformer to be designed;

[0061] Determine the short-circuit impedance value corresponding to the first candidate winding information;

[0062] From each of the first candidate winding information, screen out the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to a target short-circuit impedance threshold as second candidate winding information of the multi-segment winding test transformer to be designed;

[0063] Input the second candidate winding information into a cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information;

[0064] From each of the second candidate winding information, screen out the second candidate winding information with the smallest corresponding total cost value as the target winding information corresponding to the multi-segment winding test transformer to be designed;

[0065] Through the design plan generation command, based on the target winding information, generate target design plan information of the multi-segment winding test transformer to be designed.

[0066] The above method, device, computer equipment, storage medium and computer program product for generating the design scheme of a multi-segment winding test transformer. First, in response to a design scheme generation instruction for the multi-segment winding test transformer to be designed, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, a target finite element model of the multi-segment winding test transformer to be designed is determined from a database. According to the target finite element model, the first candidate winding information of the multi-segment winding test transformer to be designed is determined. Then, the short-circuit impedance value corresponding to the first candidate winding information is determined, and from each piece of the first candidate winding information, the first candidate winding information with a corresponding short-circuit impedance value greater than or equal to the target short-circuit impedance threshold is selected as the second candidate winding information of the multi-segment winding test transformer to be designed. Next, the second candidate winding information is input into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information. Then, from each piece of the second candidate winding information, the second candidate winding information with the smallest corresponding total cost value is selected as the target winding information corresponding to the multi-segment winding test transformer to be designed. Finally, through the design scheme generation instruction, based on the target winding information, the target design scheme information of the multi-segment winding test transformer to be designed is generated. In this way, during the manufacturing process of the multi-segment winding test transformer, the target finite element model is determined according to the current short-circuit test requirement information, and then the first candidate winding information of the multi-segment winding test transformer is obtained. The information with a short-circuit impedance value greater than or equal to the target short-circuit impedance threshold is selected from the first candidate winding information as the second candidate winding information, and the one with the smallest total cost value is selected from each piece of the second candidate winding information as the target winding information. Thus, the target design scheme information generated based on the target winding information can meet the target short-circuit impedance threshold while having the lowest corresponding total cost value. Furthermore, the precise control of the manufacturing cost is achieved while meeting the performance requirements, avoiding the defect that simply increasing the number of winding turns is likely to greatly increase the usage amount of wire materials, resulting in a relatively high manufacturing cost of the multi-segment winding test transformer, which is beneficial to improving the manufacturing cost of the multi-segment winding test transformer. Brief Description of the Drawings

[0067] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments of the present application or related technologies. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, other related drawings can be obtained based on these drawings without creative efforts.

[0068] Figure 1 It is a schematic flowchart of the method for generating the design scheme of a multi-segment winding test transformer in an embodiment;

[0069] Figure 2 A schematic flowchart of a method for generating a design scheme of a multi-segment winding test transformer in another embodiment;

[0070] Figure 3 A schematic flowchart of the design of a test transformer in one embodiment;

[0071] Figure 4 A structural block diagram of a device for generating a design scheme of a multi-segment winding test transformer in one embodiment;

[0072] Figure 5 An internal structure diagram of a computer device in one embodiment. Detailed implementation manners

[0073] In order to make the objectives, technical solutions and advantages of the present application clearer and more understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0074] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data need to comply with relevant regulations.

[0075] In an exemplary embodiment, as Figure 1 shown, a method for generating a design scheme of a multi-segment winding test transformer is provided. In this embodiment, an example is given where this method is applied to a server; it can be understood that this method can also be applied to a terminal, and can also be applied to a system including a terminal and a server, and is implemented through the interaction between the terminal and the server. Among them, the terminal can be, but is not limited to, various personal computers, laptop computers, smart phones and tablet computers; the server can be implemented by an independent server or a server cluster composed of multiple servers. In this embodiment, the method includes the following steps:

[0076] Step S101, in response to a design scheme generation instruction for a multi-segment winding test transformer to be designed, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, determine a target finite element model of the multi-segment winding test transformer to be designed from a database.

[0077] Among them, the multi-segment winding test transformer to be designed refers to the multi-segment winding test transformer that needs to be designed.

[0078] Among them, the multi-segment winding test transformer refers to a test transformer with a winding structure having multiple segments.

[0079] Among them, the design scheme generation instruction refers to the instruction corresponding to the design scheme of the multi-segment winding test transformer to be designed.

[0080] Among them, the current short-circuit test requirement information refers to various specific requirements and conditions related to the test during the short-circuit test of the multi-segment winding test transformer to be designed, such as short-circuit test voltage, short-circuit test current, test duration, etc.

[0081] Among them, the target finite element model refers to the finite element model that matches the multi-segment winding test transformer to be designed.

[0082] Exemplarily, the server establishes a network path with the terminal, and through this network path, receives the design scheme generation instruction sent by the terminal for the multi-segment winding test transformer to be designed; then, the server performs integrity verification processing on the design scheme generation instruction to obtain the verification result corresponding to the design scheme generation instruction; then, when the verification result indicates that the design scheme generation instruction is complete, the server responds to the design scheme generation instruction for the multi-segment winding test transformer to be designed, and according to the identification information of the multi-segment winding test transformer to be designed, obtains the current short-circuit test requirement information of the multi-segment winding test transformer to be designed; then, the server determines, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, a finite element model that matches the multi-segment winding test transformer to be designed from the database as the target finite element model.

[0083] Step S102, determine the first candidate winding information of the multi-segment winding test transformer to be designed according to the target finite element model.

[0084] Among them, the first candidate winding information refers to the candidate winding information of the multi-segment winding test transformer to be designed determined according to the target finite element model, including the candidate winding turns and the candidate winding pitch.

[0085] Exemplarily, the server performs parsing processing on the target finite element model to obtain parsing information; then, the server filters out the candidate performance parameters of the multi-segment winding test transformer to be designed from the parsing information; then, the server extracts the candidate winding turns and the candidate winding pitch of the multi-segment winding test transformer to be designed from these candidate performance parameters as the first candidate winding information.

[0086] Step S103, determine the short-circuit impedance value corresponding to the first candidate winding information.

[0087] Among them, the short-circuit impedance value refers to the impedance value presented by the transformer winding during the short-circuit test of the multi-segment winding test transformer to be designed.

[0088] Exemplarily, the server obtains the resistance component corresponding to the first candidate winding information according to the correspondence between the candidate winding information and the resistance component, and obtains the reactance component corresponding to the first candidate winding information according to the correspondence between the candidate winding information and the reactance component; then, the server performs vector addition on the resistance component and the reactance component corresponding to the first candidate winding information to obtain the short-circuit impedance value corresponding to the first candidate winding information.

[0089] Step S104: From each piece of first candidate winding information, filter out the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to the target short-circuit impedance threshold, and use it as the second candidate winding information of the multi-segment winding test transformer to be designed.

[0090] Wherein, the target short-circuit impedance threshold refers to the comprehensively set short-circuit impedance threshold of the multi-segment winding test transformer to be designed.

[0091] Wherein, the second candidate winding information refers to the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to the target short-circuit impedance threshold.

[0092] Exemplarily, the server filters out the candidate short-circuit impedance threshold that matches the multi-segment winding test transformer to be designed from multiple candidate short-circuit impedance thresholds as the target short-circuit impedance threshold; then, the server filters out the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to the target short-circuit impedance threshold from each piece of first candidate winding information, and uses these first candidate winding information as the second candidate winding information of the multi-segment winding test transformer to be designed.

[0093] Step S105: Input the second candidate winding information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed, and obtain the total cost value corresponding to the second candidate winding information.

[0094] Wherein, the cost prediction model is used to represent the cost function that can use the second candidate winding information to obtain the total cost value corresponding to the second candidate winding information.

[0095] Wherein, the total cost value refers to the total manufacturing cost value corresponding to the multi-segment winding test transformer to be designed.

[0096] Exemplarily, the server preprocesses the second candidate winding information to obtain the preprocessed winding information; then, the server performs feature extraction processing on the preprocessed winding information to obtain the feature vector of the preprocessed winding information; then, the server filters out the cost prediction model corresponding to the multi-segment winding test transformer to be designed from multiple cost prediction models, and inputs the feature vector into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information.

[0097] Step S106: From each piece of second candidate winding information, screen out the second candidate winding information with the smallest corresponding total cost value as the target winding information corresponding to the multi-segment winding test transformer to be designed.

[0098] Among them, the target winding information refers to the second candidate winding information with the smallest corresponding total cost value.

[0099] Exemplarily, the server screens out the second candidate winding information with the smallest corresponding total cost value from each piece of second candidate winding information and uses this second candidate winding information as the target winding information corresponding to the multi-segment winding test transformer to be designed.

[0100] Step S107: Generate the target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through a design scheme generation instruction.

[0101] Among them, the target design scheme information is used to represent the design scheme information matching the multi-segment winding test transformer to be designed.

[0102] Exemplarily, the server generates the winding design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through a design scheme generation instruction; then, the server obtains the core design scheme information and the tank design scheme information of the multi-segment winding test transformer to be designed; then, the server combines and processes the winding design scheme information, the core design scheme information, and the tank design scheme information of the multi-segment winding test transformer to be designed to obtain the target design scheme information of the multi-segment winding test transformer to be designed.

[0103] In the above method for generating the design scheme of the multi-segment winding test transformer, first, in response to the design scheme generation instruction for the multi-segment winding test transformer to be designed, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, the target finite element model of the multi-segment winding test transformer to be designed is determined from the database, and according to the target finite element model, the first candidate winding information of the multi-segment winding test transformer to be designed is determined. Then, the short-circuit impedance value corresponding to the first candidate winding information is determined, and from each piece of first candidate winding information, the first candidate winding information with the corresponding short-circuit impedance value greater than or equal to the target short-circuit impedance threshold is selected as the second candidate winding information of the multi-segment winding test transformer to be designed. Next, the second candidate winding information is input into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information. Then, from each piece of second candidate winding information, the second candidate winding information with the corresponding minimum total cost value is selected as the target winding information corresponding to the multi-segment winding test transformer to be designed. Finally, through the design scheme generation instruction, based on the target winding information, the target design scheme information of the multi-segment winding test transformer to be designed is generated. In this way, during the manufacturing process of the multi-segment winding test transformer, the target finite element model is determined according to the current short-circuit test requirement information, and then the first candidate winding information of the multi-segment winding test transformer is obtained. The information with the short-circuit impedance value greater than or equal to the target short-circuit impedance threshold is selected from the first candidate winding information as the second candidate winding information, and the one with the minimum total cost value is selected from each piece of second candidate winding information as the target winding information. Thus, the target design scheme information generated based on the target winding information can meet the target short-circuit impedance threshold while having the lowest corresponding total cost value. Furthermore, the precise control of the manufacturing cost is achieved under the premise of meeting the performance requirements, avoiding the defect that simply increasing the number of winding turns is likely to greatly increase the usage amount of wire materials, resulting in a relatively high manufacturing cost of the multi-segment winding test transformer, which is beneficial to reducing the manufacturing cost of the multi-segment winding test transformer.

[0104] In an exemplary embodiment, in step S101 above, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, the target finite element model of the multi-segment winding test transformer to be designed is determined from the database, which specifically includes the following content: Obtain the correspondence between the short-circuit test requirement information and the winding division method; query the correspondence to determine the winding division method corresponding to the current short-circuit test requirement information as the target winding division method of the multi-segment winding test transformer to be designed; obtain the candidate finite element models of the multi-segment winding test transformer to be designed from the database, and screen out the candidate finite element models whose corresponding winding division methods meet the target winding division method from each candidate finite element model as the target finite element model of the multi-segment winding test transformer to be designed.

[0105] Among them, the correspondence between the short-circuit test requirement information and the winding division method is used to represent the association information between the short-circuit test requirement information and the winding division method. For example, when the short-circuit test requirement information is a high-voltage and small-current short-circuit test, the corresponding winding division method is a multi-segment series winding; when the short-circuit test requirement information is a low-voltage and large-current short-circuit test, the corresponding winding division method is a multi-segment parallel winding; when the short-circuit test requirement information is a high-frequency short-circuit test, the corresponding winding division method is a Litz wire-wound segmented winding.

[0106] Among them, the target winding division method refers to the winding division method that matches the multi-segment winding test transformer to be designed.

[0107] Among them, the candidate finite element model refers to the finite element model associated with the multi-segment winding test transformer to be designed.

[0108] Exemplarily, the server obtains the correspondence between the short-circuit test requirement information and the winding division method from the database; then, the server queries the correspondence to determine the winding division method corresponding to the current short-circuit test requirement information and takes this winding division method as the target winding division method of the multi-segment winding test transformer to be designed; then, the server obtains the candidate finite element models of the multi-segment winding test transformer to be designed from the database according to the geometric parameters of the multi-segment winding test transformer to be designed, and screens out the candidate finite element models whose corresponding winding division methods meet the target winding division method from each candidate finite element model, and takes this candidate finite element model as the target finite element model of the multi-segment winding test transformer to be designed.

[0109] In this embodiment, by obtaining the correspondence between the short-circuit test requirement information and the winding division method, the target winding division method can be determined according to the specific test requirements, making the designed multi-segment winding test transformer more suitable for the actual application scenario, meeting the requirements of specific short-circuit tests, avoiding the performance mismatch problems that may be brought by the general design, and improving the pertinence and effectiveness of the design.

[0110] In an exemplary embodiment, in step S102 above, according to the target finite element model, the first candidate winding information of the multi-segment winding test transformer to be designed is determined, which specifically includes the following contents: generating a finite element simulation file corresponding to the target finite element model; performing format conversion processing on the finite element simulation file to obtain a target file in a preset format; and extracting the first candidate winding information of the multi-segment winding test transformer to be designed from the target file.

[0111] Among them, the finite element simulation file refers to an electronic file containing the finite element analysis related data corresponding to the target finite element model.

[0112] Among them, the target file in the preset format refers to an m file adapted to MATLAB (Matrix Laboratory).

[0113] Exemplarily, the server obtains the model parameters of the target finite element model, and generates a finite element simulation file corresponding to the target finite element model according to these model parameters; then, the server determines the current format of the finite element simulation file, and generates a format conversion instruction corresponding to the current format and the preset format; then, the server performs format conversion processing on the finite element simulation file according to the format conversion instruction to obtain a target file in a preset format; then, the server extracts the first candidate winding information of the multi-segment winding test transformer to be designed from the target file.

[0114] In this embodiment, by performing format conversion processing on the finite element simulation file corresponding to the target finite element model to obtain a target file in a preset format, the data compatibility and interoperability are enhanced, so as to extract the corresponding first candidate winding information from the target file, which is beneficial to improving the extraction convenience of the first candidate winding information of the multi-segment winding test transformer to be designed.

[0115] In an exemplary embodiment, extracting the first candidate winding information of the multi-segment winding test transformer to be designed from the target file specifically includes the following contents: extracting the initial winding information of the multi-segment winding test transformer to be designed from the target file; adjusting the initial winding information to obtain the adjusted winding information of the multi-segment winding test transformer to be designed; and using both the initial winding information and the adjusted winding information as the first candidate winding information of the multi-segment winding test transformer to be designed.

[0116] Among them, the initial winding information refers to the original winding information of the multi-segment winding test transformer to be designed in the target file.

[0117] Among them, the adjusted winding information refers to the initial winding information obtained after adjustment.

[0118] Exemplarily, the server parses the target file to obtain parsing information; then, the server extracts the initial winding information of the multi-segment winding test transformer to be designed from the parsing information; then, the server determines the adjustment coefficient of the initial winding information according to the electromagnetic field simulation information of the multi-segment winding test transformer to be designed, and adjusts the initial winding information according to the adjustment coefficient to obtain the adjusted winding information of the multi-segment winding test transformer to be designed; then, the server performs a combination process on the initial winding information and the adjusted winding information according to a preset combination method to obtain the first candidate winding information of the multi-segment winding test transformer to be designed.

[0119] In this embodiment, by taking both the initial winding information and the adjusted winding information as the first candidate winding information, more alternative solutions can be provided for transformer design, enabling designers to compare and weigh among multiple different design solutions, and then find the most suitable winding design for specific requirements, which is beneficial to improving the determination accuracy of the first candidate winding information.

[0120] In an exemplary embodiment, in step S105 above, inputting the second candidate winding information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information specifically includes the following: obtaining the cost element information and structural dimension information corresponding to the multi-segment winding test transformer to be designed; inputting the second candidate winding information, the cost element information, and the structural dimension information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the copper material cost value, the iron core cost value, and the manufacturing cost value corresponding to the second candidate winding information; performing a summation process on the copper material cost value, the iron core cost value, and the manufacturing cost value to obtain the total cost value corresponding to the second candidate winding information.

[0121] Among them, the cost element information includes the unit cost of copper material, the unit cost of iron core, and the unit volume manufacturing cost.

[0122] Among them, the structural dimension information includes the radius value of the innermost winding, the distance value between the outermost winding and the side column, and the height value of the iron core corresponding to the multi-segment winding test transformer to be designed.

[0123] Among them, the copper material cost value refers to the cost generated by the copper material used for the winding during the manufacturing of the transformer.

[0124] Among them, the core cost value refers to the cost required to manufacture the transformer core.

[0125] Among them, the manufacturing cost value refers to all other cost expenditures in the transformer manufacturing process.

[0126] Exemplarily, the server obtains the cost element information and structural dimension information corresponding to the multi-segment winding test transformer to be designed; then, the server preprocesses the second candidate winding information, cost element information, and structural dimension information respectively to obtain the preprocessed winding information, preprocessed cost element information, and preprocessed structural dimension information; then, the server performs feature extraction processing on the preprocessed winding information, preprocessed cost element information, and preprocessed structural dimension information respectively to obtain the first feature vector corresponding to the preprocessed winding information, the second feature vector corresponding to the preprocessed cost element information, and the third feature vector corresponding to the preprocessed structural dimension information; then, the server performs fusion processing on the first feature vector, the second feature vector, and the third feature vector to obtain a fusion feature vector; then, the server inputs the fusion feature vector into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the copper material cost value, core cost value, and manufacturing cost value corresponding to the second candidate winding information; then, the server obtains the first weight corresponding to the copper material cost value, the second weight corresponding to the core cost value, and the third weight corresponding to the manufacturing cost value; then, the server sums up the copper material cost value, core cost value, and manufacturing cost value according to the first weight, the second weight, and the third weight to obtain the total cost value corresponding to the second candidate winding information.

[0127] For example, the total cost value can be calculated by the following formula:

[0128] , Equation (1)

[0129] Among them, C 总 is the total cost value, C 铜 is the copper material cost value, C 铁 is the core cost value, C 制造 is the manufacturing cost value, C1 is the unit cost of copper material, C2 is the unit cost of the core, C3 is the unit volume manufacturing cost, and C1 to C3 are all given by the manufacturer; l1 is the radius value of the innermost winding, l2 is the distance value between the outermost winding and the side column, l3 is the height value of the core, and l1 to l3 are given by engineering experience; N is the number of winding turns, d is the winding pitch, and n is the number of windings.

[0130] In this embodiment, by comprehensively considering the second candidate winding information, cost element information, and structural dimension information, and combining with the cost prediction model, the copper material cost value, iron core cost value, and manufacturing cost value corresponding to the second candidate winding information can be obtained more accurately, and then the total cost value corresponding to the second candidate winding information can be obtained more accurately, which is beneficial to improving the determination accuracy of the total cost value.

[0131] In an exemplary embodiment, before step S104 of screening out the first candidate winding information with a corresponding short-circuit impedance value greater than or equal to the target short-circuit impedance threshold from each first candidate winding information as the second candidate winding information of the multi-segment winding test transformer to be designed, the following specific contents are included: obtaining the preset cost value corresponding to the multi-segment winding test transformer to be designed; determining the adjustment values of multiple initial short-circuit impedance thresholds of the multi-segment winding test transformer to be designed according to the preset cost value; adjusting the multiple initial short-circuit impedance thresholds according to the adjustment values of the multiple initial short-circuit impedance thresholds to obtain multiple adjusted short-circuit impedance thresholds; and performing a fusion process on the multiple adjusted short-circuit impedance thresholds to obtain the target short-circuit impedance threshold.

[0132] The preset cost value refers to the actual budget fund value corresponding to the multi-segment winding test transformer.

[0133] The multiple initial short-circuit impedance thresholds refer to multiple preset short-circuit impedance values according to the basic design requirements of the multi-segment winding test transformer.

[0134] The adjustment value refers to the value used to change the initial short-circuit impedance threshold determined according to the preset cost value of the transformer to be designed.

[0135] The adjusted short-circuit impedance threshold refers to the initial short-circuit impedance threshold after adjustment.

[0136] Exemplarily, the server queries the corresponding relationship between the design parameters and the preset cost value according to the design parameters of the multi-segment winding test transformer to be designed to obtain the preset cost value corresponding to the multi-segment winding test transformer to be designed; then, the server obtains the multiple initial short-circuit impedance thresholds of the multi-segment winding test transformer to be designed and queries the corresponding relationship between the preset cost value and the adjustment value according to the preset cost value to obtain the adjustment values of the multiple initial short-circuit impedance thresholds of the multi-segment winding test transformer to be designed; then, the server sums the adjustment values of the multiple initial short-circuit impedance thresholds with the multiple initial short-circuit impedance thresholds respectively to obtain multiple adjusted short-circuit impedance thresholds; then, the server performs a weighted summation process on the multiple adjusted short-circuit impedance thresholds according to the weight information corresponding to the multiple adjusted short-circuit impedance thresholds to obtain the target short-circuit impedance threshold.

[0137] In this embodiment, the adjustment values of multiple initial short-circuit impedance thresholds can be accurately determined through the preset cost value corresponding to the multi-segment winding test transformer to be designed, so that the multiple initial short-circuit impedance thresholds can be adjusted more accurately, and then the target short-circuit impedance threshold can be determined more accurately, which is beneficial to improving the determination accuracy of the target short-circuit impedance threshold.

[0138] In an exemplary embodiment, as Figure 2 shown, another method for generating a design scheme of a multi-segment winding test transformer is provided. Taking the application of this method to a server as an example, the specific steps are as follows:

[0139] Step S201: In response to a design scheme generation instruction for the multi-segment winding test transformer to be designed, obtain the correspondence between the short-circuit test requirement information and the winding division method.

[0140] Step S202: Query the correspondence to determine the winding division method corresponding to the current short-circuit test requirement information as the target winding division method of the multi-segment winding test transformer to be designed.

[0141] Step S203: Obtain the candidate finite element models of the multi-segment winding test transformer to be designed from the database, and screen out the candidate finite element models whose corresponding winding division methods meet the target winding division method from each candidate finite element model as the target finite element model of the multi-segment winding test transformer to be designed.

[0142] Step S204: Generate a finite element simulation file corresponding to the target finite element model; perform format conversion processing on the finite element simulation file to obtain a target file that conforms to the preset format.

[0143] Step S205: Extract the initial winding information of the multi-segment winding test transformer to be designed from the target file; adjust the initial winding information to obtain the adjusted winding information of the multi-segment winding test transformer to be designed.

[0144] Step S206: Use both the initial winding information and the adjusted winding information as the first candidate winding information of the multi-segment winding test transformer to be designed.

[0145] Step S207: Determine the short-circuit impedance value corresponding to the first candidate winding information.

[0146] Step S208: Screen out the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to the target short-circuit impedance threshold from each first candidate winding information as the second candidate winding information of the multi-segment winding test transformer to be designed.

[0147] Step S209: Obtain the cost element information and structural dimension information corresponding to the multi-segment winding test transformer to be designed.

[0148] Step S210: Input the second candidate winding information, cost element information, and structural dimension information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed, and obtain the copper material cost value, iron core cost value, and manufacturing cost value corresponding to the second candidate winding information.

[0149] Step S211: Perform a summation process on the copper material cost value, iron core cost value, and manufacturing cost value to obtain the total cost value corresponding to the second candidate winding information.

[0150] Step S212: From each second candidate winding information, screen out the second candidate winding information with the smallest corresponding total cost value as the target winding information corresponding to the multi-segment winding test transformer to be designed.

[0151] Step S213: Generate the target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through a design scheme generation instruction.

[0152] In the above method for generating the design scheme of the multi-segment winding test transformer, during the manufacturing process of the multi-segment winding test transformer, the target finite element model is determined according to the current short-circuit test requirement information, and then the first candidate winding information of the multi-segment winding test transformer is obtained. The information with a short-circuit impedance value greater than or equal to the target short-circuit impedance threshold is screened out from the first candidate winding information as the second candidate winding information, and the one with the smallest total cost value is screened out from each second candidate winding information as the target winding information. Thus, the target design scheme information generated based on the target winding information can meet the target short-circuit impedance threshold while having the lowest corresponding total cost value. Furthermore, it realizes the precise control of the manufacturing cost under the premise of meeting the performance requirements, avoiding the defect that simply increasing the number of winding turns is likely to greatly increase the usage amount of wire materials, resulting in a relatively high manufacturing cost of the multi-segment winding test transformer, which is beneficial to reducing the manufacturing cost of the multi-segment winding test transformer.

[0153] In an exemplary embodiment, in order to more clearly illustrate the method for generating the design scheme of the multi-segment winding test transformer provided by the embodiments of the present application, the following uses a specific embodiment to specifically describe the method for generating the design scheme of the multi-segment winding test transformer. In one embodiment, the present application also provides a design method for a multi-segment winding test transformer. During the manufacturing process of the multi-segment winding test transformer, by constructing an optimization problem with the lowest cost, reasonably designing the number of winding turns and the spacing, and combining with finite element simulation software to calculate and determine whether the short-circuit impedance meets the threshold, the optimization design of the short-circuit impedance is realized at the lowest cost. The specific contents are as follows:

[0154] The design process of the test transformer involved in this embodiment is as follows Figure 3 as shown, and the specific design method includes the following steps:

[0155] Step 1, construct a finite element model of the test transformer:

[0156] Based on the geometric parameters of the traditional test transformer, a finite element model of the transformer is established in the finite element simulation software. The specific steps are as follows: The finite element model of the transformer is divided into three parts: the iron core, the winding, and the oil tank. Among them, the iron core structure is designed in the form of silicon steel sheet stacking; the winding is simplified into a cylindrical structure; the oil tank is simplified into a cuboid structure. Subsequently, according to the requirements of the actual short-circuit test, the cylindrical winding is divided into multiple sub-windings to obtain a finite element model of the test transformer with multiple segmented windings.

[0157] Step 2, write the m code corresponding to the finite element model:

[0158] In the finite element simulation software, export the finite element simulation file constructed in Step 1 as an m file adapted to MATLAB to obtain the m file of the test transformer with multiple segmented windings. Then use MATLAB to rewrite the m file, set the number of turns and spacing of each winding as independent variables, and write a loop code for subsequent steps to loop and retrieve the best design scheme of the number of turns and spacing. The function of this loop is: on the premise of ensuring that the short-circuit impedance meets the test requirements, by changing the number of turns and spacing of each winding, obtain the design scheme with the lowest manufacturing cost. At the same time, a maximum threshold should be set for the number of turns and spacing of each winding to limit the traversal and retrieval range of the m file, and this threshold can be adjusted independently according to the actual budget.

[0159] Step 3, construct an optimization problem with the lowest cost:

[0160] Here, a single-phase layer winding transformer is taken as an example to illustrate. It is known that the cost price of the test transformer includes copper material cost, iron core cost, and manufacturing cost. The copper material cost is the copper cost consumed for winding the winding, which is mainly related to the winding length, and the winding length is directly affected by the number of turns and spacing. The iron core cost is related to the iron core volume. In engineering, the cross-sectional area of the iron core is generally a fixed value, so the iron core cost is mainly related to the iron core length. The manufacturing cost is directly related to the volume of the transformer. Based on the above analysis, the cost function of the single-phase layer transformer can be written as:

[0161] , Equation (1)

[0162] In the formula, C 总 is the total cost value, C 铜 is the copper material cost value, C 铁 is the iron core cost value, C 制造Let \(C\) be the manufacturing cost value, \(C_1\) be the unit cost of copper material, \(C_2\) be the unit cost of iron core, \(C_3\) be the unit volume manufacturing cost, and \(C_1\) to \(C_3\) are all given by the manufacturer; \(l_1\) is the radius value of the innermost winding, \(l_2\) is the distance value between the outermost winding and the side column, \(l_3\) is the height value of the iron core, and \(l_1\) to \(l_3\) are given by engineering experience; \(N\) is the number of winding turns, \(d\) is the winding pitch, and \(n\) is the number of windings.

[0163] Set the threshold of the short-circuit impedance according to the needs of the short-circuit test, and use this as a constraint condition to form an optimization problem with the objective function.

[0164] , Equation (2)

[0165] In the formula, \(Z\) sc is the short-circuit impedance, is the set short-circuit impedance threshold.

[0166] Step 4, simulate and search for the optimal design scheme:

[0167] As can be seen from Equation (1), on the premise that the given quantities are known, the total cost is only related to the number of winding turns \(N\) and the winding pitch \(d\). Based on the m-file written in Step 2, add the relevant codes of intelligent algorithms such as genetic algorithm and particle swarm optimization algorithm, and combine with the finite element simulation software to simulate the electromagnetic field of the multi-segment winding. During the simulation process, adjust the number of winding turns \(N\) and the winding pitch \(d\) through the intelligent algorithm, and the m-file then calls the finite element simulation software to calculate and judge whether the short-circuit impedance meets the constraint conditions and evaluate the manufacturing costs of different design schemes. Using the intelligent algorithm for global search will effectively improve the retrieval speed, and then the optimal winding design scheme will be found, thus effectively reducing the manufacturing cost and improving the test effect.

[0168] Step 5, manufacture and test the test transformer:

[0169] According to the optimized design scheme, manufacture a multi-segment winding test transformer and conduct a short-circuit test to verify its performance. Compare the coincidence degree between the actual test results and the simulation results, and further adjust the design parameters to ensure that the performance of the test transformer meets the expectations.

[0170] In the above embodiments, during the manufacturing process of the multi-segment winding test transformer, the target finite element model is determined according to the current short-circuit test requirement information, and then the first candidate winding information of the multi-segment winding test transformer is obtained. The information with a short-circuit impedance value greater than or equal to the target short-circuit impedance threshold is selected from the first candidate winding information as the second candidate winding information, and the one with the minimum total cost value is selected from each piece of second candidate winding information as the target winding information. Thus, the target design scheme information generated based on the target winding information can meet the target short-circuit impedance threshold while having the lowest corresponding total cost value. Furthermore, the precise control of the manufacturing cost is achieved under the premise of meeting the performance requirements, avoiding the defect that simply increasing the number of winding turns is likely to greatly increase the usage amount of wire materials, resulting in a relatively high manufacturing cost of the multi-segment winding test transformer, which is beneficial to reducing the manufacturing cost of the multi-segment winding test transformer. At the same time, compared with traditional test transformers, the multi-segment winding test transformer increases the combination number of short-circuit tests; by reasonably designing the number of turns and spacing of each segment of the winding, the multi-segment winding test transformer improves the short-circuit impedance of the transformer at a relatively low cost.

[0171] It should be understood that although the steps in the flowcharts involved in the above embodiments are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise clearly stated in this article, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, at least some of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential either, but can be executed alternately or in turn with at least some of the steps or stages in other steps or other steps.

[0172] Based on the same inventive concept, the embodiments of the present application also provide a multi-segment winding test transformer design scheme generation device for implementing the multi-segment winding test transformer design scheme generation method described above. The solution provided by this device for solving problems is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the multi-segment winding test transformer design scheme generation device provided below can refer to the limitations on the multi-segment winding test transformer design scheme generation method in the above text, and will not be repeated here.

[0173] In an exemplary embodiment, as Figure 4As shown, a device for generating a design scheme of a multi-segment winding test transformer is provided, including: a model determination module 401, an information determination module 402, an impedance determination module 403, an information screening module 404, a cost prediction module 405, a target screening module 406, and a scheme generation module 407, where:

[0174] The model determination module 401 is configured to, in response to a design scheme generation instruction for the multi-segment winding test transformer to be designed, determine a target finite element model of the multi-segment winding test transformer to be designed from a database based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed.

[0175] The information determination module 402 is configured to determine first candidate winding information of the multi-segment winding test transformer to be designed according to the target finite element model.

[0176] The impedance determination module 403 is configured to determine a short-circuit impedance value corresponding to the first candidate winding information.

[0177] The information screening module 404 is configured to screen out, from each piece of first candidate winding information, the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to a target short-circuit impedance threshold as second candidate winding information of the multi-segment winding test transformer to be designed.

[0178] The cost prediction module 405 is configured to input the second candidate winding information into a cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain a total cost value corresponding to the second candidate winding information.

[0179] The target screening module 406 is configured to screen out, from each piece of second candidate winding information, the second candidate winding information with the smallest corresponding total cost value as target winding information corresponding to the multi-segment winding test transformer to be designed.

[0180] The scheme generation module 407 is configured to generate target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through a design scheme generation instruction.

[0181] In an exemplary embodiment, the model determination module 401 is further configured to obtain a correspondence between short-circuit test requirement information and a winding division method; query the correspondence to determine the winding division method corresponding to the current short-circuit test requirement information as the target winding division method of the multi-segment winding test transformer to be designed; obtain candidate finite element models of the multi-segment winding test transformer to be designed from the database, and screen out, from each candidate finite element model, the candidate finite element model whose corresponding winding division method meets the target winding division method as the target finite element model of the multi-segment winding test transformer to be designed.

[0182] In an exemplary embodiment, the information determination module 402 is further configured to generate a finite element simulation file corresponding to the target finite element model; perform format conversion processing on the finite element simulation file to obtain a target file that conforms to a preset format; and extract first candidate winding information of the multi-segment winding test transformer to be designed from the target file.

[0183] In an exemplary embodiment, the information determination module 402 is further configured to extract initial winding information of the multi-segment winding test transformer to be designed from the target file; adjust the initial winding information to obtain adjusted winding information of the multi-segment winding test transformer to be designed; and use both the initial winding information and the adjusted winding information as the first candidate winding information of the multi-segment winding test transformer to be designed.

[0184] In an exemplary embodiment, the cost prediction module 405 is further configured to obtain cost element information and structural dimension information corresponding to the multi-segment winding test transformer to be designed; input the second candidate winding information, the cost element information, and the structural dimension information into a cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain a copper material cost value, an iron core cost value, and a manufacturing cost value corresponding to the second candidate winding information; and perform a summation process on the copper material cost value, the iron core cost value, and the manufacturing cost value to obtain a total cost value corresponding to the second candidate winding information.

[0185] In an exemplary embodiment, the multi-segment winding test transformer design scheme generation device further includes a threshold determination module, configured to obtain a preset cost value corresponding to the multi-segment winding test transformer to be designed; determine adjustment values of multiple initial short-circuit impedance thresholds of the multi-segment winding test transformer to be designed according to the preset cost value; adjust the multiple initial short-circuit impedance thresholds according to the adjustment values of the multiple initial short-circuit impedance thresholds to obtain multiple adjusted short-circuit impedance thresholds; and perform a fusion process on the multiple adjusted short-circuit impedance thresholds to obtain a target short-circuit impedance threshold.

[0186] Each module in the above multi-segment winding test transformer design scheme generation device can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in or independent of a processor in a computer device in the form of hardware, or stored in a memory in the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above respective modules.

[0187] In an exemplary embodiment, a computer device is provided. The computer device can be a server, and its internal structure diagram can be as Figure 5As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O), and a communication interface. Among them, the processor, the memory, and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store data such as short-circuit impedance values and total cost values. The input / output interface of the computer device is used to exchange information between the processor and external devices. The communication interface of the computer device is used to communicate with external terminals through a network connection. When the computer program is executed by the processor, it implements a method for generating a design scheme of a multi-segment winding test transformer.

[0188] Those skilled in the art can understand that Figure 5 the structure shown in is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0189] In an exemplary embodiment, a computer device is further provided, including a memory and a processor. A computer program is stored in the memory, and when the processor executes the computer program, the steps in the above method embodiments are implemented.

[0190] In an exemplary embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by the processor, the steps in the above method embodiments are implemented.

[0191] In an exemplary embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by the processor, the steps in the above method embodiments are implemented.

[0192] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in the present application can be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, data processing logics based on quantum computing, etc., without limitation.

[0193] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0194] The above-described embodiments only represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A method for generating a design scheme of a multi-segment winding test transformer, characterized in that, The method includes: In response to an instruction for generating a design scheme for a multi-segment winding test transformer to be designed, based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed, determine a target finite element model of the multi-segment winding test transformer to be designed from a database; According to the target finite element model, determine first candidate winding information of the multi-segment winding test transformer to be designed; Determine the short-circuit impedance value corresponding to the first candidate winding information; From each of the first candidate winding information, screen out the first candidate winding information whose corresponding short-circuit impedance value is greater than or equal to a target short-circuit impedance threshold as the second candidate winding information of the multi-segment winding test transformer to be designed; Input the second candidate winding information into a cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information; From each of the second candidate winding information, screen out the second candidate winding information with the smallest corresponding total cost value as the target winding information corresponding to the multi-segment winding test transformer to be designed; Through the design scheme generation instruction, based on the target winding information, generate target design scheme information of the multi-segment winding test transformer to be designed.

2. The method according to claim 1, characterized in that, The determining, from the database, the target finite element model of the multi-segment winding test transformer to be designed based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed includes: Obtain the correspondence between short-circuit test requirement information and winding division methods; Query the correspondence to determine the winding division method corresponding to the current short-circuit test requirement information as the target winding division method of the multi-segment winding test transformer to be designed; Obtain candidate finite element models of the multi-segment winding test transformer to be designed from the database, and screen out the candidate finite element models whose corresponding winding division methods meet the target winding division method from each of the candidate finite element models as the target finite element model of the multi-segment winding test transformer to be designed.

3. The method according to claim 1, wherein The determining, according to the target finite element model, the first candidate winding information of the multi-segment winding test transformer to be designed includes: Generate a finite element simulation file corresponding to the target finite element model; Perform format conversion processing on the finite element simulation file to obtain a target file in a preset format; Extract the first candidate winding information of the multi-segment winding test transformer to be designed from the target file.

4. The method according to claim 3, characterized in that, The extracting, from the target file, the first candidate winding information of the multi-segment winding test transformer to be designed includes: Extract the initial winding information of the multi-segment winding test transformer to be designed from the target file; Adjust the initial winding information to obtain the adjusted winding information of the multi-segment winding test transformer to be designed; Use both the initial winding information and the adjusted winding information as the first candidate winding information of the multi-segment winding test transformer to be designed.

5. The method according to claim 1, wherein Inputting the second candidate winding information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information includes: Obtaining the cost element information and structural dimension information corresponding to the multi-segment winding test transformer to be designed; Inputting the second candidate winding information, the cost element information, and the structural dimension information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the copper material cost value, iron core cost value, and manufacturing cost value corresponding to the second candidate winding information; Performing a summation process on the copper material cost value, the iron core cost value, and the manufacturing cost value to obtain the total cost value corresponding to the second candidate winding information.

6. The method according to any one of claims 1 to 5, characterized in that Before screening out the first candidate winding information with a corresponding short-circuit impedance value greater than or equal to the target short-circuit impedance threshold from each of the first candidate winding information as the second candidate winding information of the multi-segment winding test transformer to be designed, it further includes: Obtaining the preset cost value corresponding to the multi-segment winding test transformer to be designed; Determining the adjustment values of multiple initial short-circuit impedance thresholds of the multi-segment winding test transformer to be designed according to the preset cost value; Adjusting the multiple initial short-circuit impedance thresholds according to the adjustment values of the multiple initial short-circuit impedance thresholds to obtain multiple adjusted short-circuit impedance thresholds; Performing a fusion process on the multiple adjusted short-circuit impedance thresholds to obtain the target short-circuit impedance threshold.

7. A device for generating a design scheme of a multi-segment winding test transformer, characterized in that, The device includes: A model determination module, configured to, in response to a design scheme generation instruction for a multi-segment winding test transformer to be designed, determine the target finite element model of the multi-segment winding test transformer to be designed from a database based on the current short-circuit test requirement information of the multi-segment winding test transformer to be designed; An information determination module, configured to determine the first candidate winding information of the multi-segment winding test transformer to be designed according to the target finite element model; An impedance determination module, configured to determine the short-circuit impedance value corresponding to the first candidate winding information; An information screening module, configured to screen out the first candidate winding information with a corresponding short-circuit impedance value greater than or equal to the target short-circuit impedance threshold from each of the first candidate winding information as the second candidate winding information of the multi-segment winding test transformer to be designed; A cost prediction module, configured to input the second candidate winding information into the cost prediction model corresponding to the multi-segment winding test transformer to be designed to obtain the total cost value corresponding to the second candidate winding information; A target screening module, configured to screen out the second candidate winding information with the smallest corresponding total cost value from each of the second candidate winding information as the target winding information corresponding to the multi-segment winding test transformer to be designed; A scheme generation module, configured to generate the target design scheme information of the multi-segment winding test transformer to be designed based on the target winding information through the design scheme generation instruction.

8. A computer device, comprising a memory and a processor, the memory storing a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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