Capacitive touch screen test data management method based on MES system

Abstract

The invention relates to the technical field of industrial data processing, in particular to a capacitive touch screen test data management method based on an MES (Manufacturing Execution System), which comprises the following steps: acquiring a capacitive touch screen to be detected and performing a first test mode, wherein the first test mode tests the touch screen according to the first test temperature, the second test temperature, the test duration, the test period and the specified operation set; obtaining first test mode data after all the touch screens complete the first test mode; analyzing the data to obtain first abnormal data of the touch screen, wherein the first abnormal data comprises abnormal temperature and abnormal test operation of the touch screen; performing test optimization on the touch screen according to the abnormal temperature and the abnormal test operation, and performing a second test mode; obtaining second test mode data after all the touch screens complete the second test mode; analyzing the second test mode data to obtain second abnormal data; and according to the first abnormal data and the second abnormal data, judging whether the to-be-detected capacitive touch screen has a hardware fault or not.

Description

Technical Field

[0001] The present invention relates to the technical field of industrial data processing, and particularly to a method for managing capacitive touch screen test data based on an MES system. Background Art

[0002] With the rapid iteration of intelligent technologies, the application scenarios of touch screens have been continuously expanded, and the size specifications, technical principles, and interaction complexities have been significantly improved. Traditional test methods have gradually revealed limitations. Existing test schemes are mostly designed for a single technical principle or static touch scenarios, lacking compatibility tests for multiple types of touch screens, and having a single test dimension, making it difficult to cover complex operations such as dynamic gestures and multi-touch. In addition, in actual use, touch screens often face complex environmental factors such as oil stains, water stains, temperature, and electromagnetic interference. However, the traditional test environment is too idealized, ignoring the influence of pollutants and environmental interference, resulting in a deviation between the test results and the actual performance, and it is difficult to accurately evaluate the true reliability of the product.

[0003] Existing test processes generally rely on manual operations and decentralized management. The design of test cases lacks systematicness and is difficult to adapt to the production requirements of multiple varieties and small batches. Especially in the scenario of multi-station collaborative testing, the hardware differences between different stations are likely to introduce test errors, and the consistency of test results is insufficient. At the same time, the test data is disconnected from the visual feedback of the actual operations of users, and key indicators such as response delay and touch sensitivity lack multi-modal analysis, further weakening the scientific nature and guiding value of the test results. How to achieve the automation, scenarioization, and precision of the test process has become a key challenge in improving the quality control level of touch screens.

[0004] Therefore, a method for managing capacitive touch screen test data based on an MES system is proposed. Summary of the Invention

[0005] The purpose of the present invention is to provide a method for managing capacitive touch screen test data based on an MES system to improve the efficiency and accuracy of touch screen quality detection. By obtaining the capacitive touch screen to be detected and performing a first test mode, where the first test mode tests the touch screen according to the first test temperature, the second test temperature, the test duration, the test cycle, and a specified operation set; after all touch screens complete the first test mode, obtaining the first test mode data; analyzing the data to obtain the first abnormal data of the touch screen, including the abnormal temperature and abnormal test operations of the touch screen; performing test optimization on the touch screen according to the abnormal temperature and abnormal test operations, and performing a second test mode; after all touch screens complete the second test mode, obtaining the second test mode data; analyzing the second test mode data to obtain the second abnormal data; and judging whether the capacitive touch screen to be detected has a hardware failure according to the first abnormal data and the second abnormal data.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A method for managing test data of a capacitive touch screen based on an MES system, comprising:

[0008] Obtain a capacitive touch screen to be detected and perform a first test mode, wherein the first test mode tests the touch screen according to a first test temperature, a second test temperature, a test duration, a test period, and a specified operation set; after all touch screens complete the first test mode, obtain first test mode data;

[0009] Further, the first test mode specifically includes:

[0010] The number of test periods of the first test mode is equal to the number of types of test operations in the specified operation set;

[0011] Obtain the first test temperature, the second test temperature, and the test duration, wherein the first test temperature is less than the second test temperature; within the test duration of the i-th test period, the test temperature uniformly increases from the first test temperature to the second test temperature; within the i-th test period, obtain the i-th type of test operation in the specified operation set and test the touch screen;

[0012] After completing the first test mode, obtain first test mode data.

[0013] Divide the first test mode data according to a temperature division value to obtain data of the touch screen within each test temperature range; analyze the data to obtain first abnormal data of the touch screen, including the abnormal temperature and abnormal test operation of the touch screen;

[0014] Further, the specific steps of dividing the first test mode data according to the temperature division value include:

[0015] Obtain a temperature division value, wherein the temperature division value is much smaller than the difference between the second test temperature and the first test temperature; the MES system divides the test temperature according to the temperature division value to obtain a set of test temperature ranges; obtain the data at the test time corresponding to the test temperature range to obtain data of the touch screen within each test temperature range.

[0016] Further, the steps of obtaining the first abnormal data include:

[0017] The MES system obtains the data of the touch screen within each test temperature range, and divides it according to the duration of the test operation to obtain several test data groups. Each test data group includes capacitance data and video data. The capacitance data includes the capacitance values of the contacts of the test operation, and the video data includes the display images of the touch screen. Feature extraction is performed on the capacitance data according to the capacitance change rate to obtain capacitance features. Feature extraction is performed on the video data according to the color change rate of the display image to obtain display features. Test operation features are constructed based on the capacitance features and display features, and further an operation feature set is obtained.

[0018] The MES system obtains the test operation features within the corresponding test temperature range in the historical normal data and obtains the clustering center through a clustering algorithm. It obtains the operation set features in the operation feature set and calculates the distance from the clustering center. If it exceeds the threshold, it is marked as abnormal. If the abnormal proportion in the operation feature set exceeds the threshold, the test operation of the touch screen within this test temperature range is marked as the first abnormal data, including marking the test temperature range as an abnormal temperature and the test operation as an abnormal test operation.

[0019] Test optimization and adjustment of the touch screen are carried out according to the abnormal temperature and abnormal test operation, and a second test mode is carried out. After all touch screens complete the second test mode, second test mode data is obtained.

[0020] Furthermore, the test optimization and adjustment of the touch screen according to the abnormal temperature and abnormal test operation include:

[0021] If there is no abnormality in the test of the test operation at all temperatures, the touch screen will no longer be tested for this test operation at all temperatures.

[0022] If there is an abnormality in the test operation within the test temperature range, the temperature rise speed of the abnormal temperature is obtained according to the first abnormal data, and the duration of the test temperature range is adjusted according to the temperature rise speed of the abnormal temperature; and the execution frequency of the test operation is adjusted.

[0023] Furthermore, the second test mode specifically includes:

[0024] The number of test cycles of the second test mode is equal to the number of types of abnormal test operations obtained in the first test mode.

[0025] Obtain the first test temperature, the test temperature range of the abnormal temperature, the second test temperature, and the growth rate, where the first test temperature is less than the second test temperature; within the test duration of the j-th test cycle, within the test temperature range corresponding to the normal temperature, the growth rate of the temperature is the same as the temperature rise rate of the first test mode; within the test temperature range corresponding to the abnormal temperature, the growth rate of the temperature is the temperature rise rate of the abnormal temperature; within the j-th test cycle, obtain the j-th abnormal test operation and test the capacitive touch screen.

[0026] After completing the second test mode, obtain the second test mode data.

[0027] Process and analyze the second test mode data to obtain the second abnormal data; judge whether the capacitive touch screen to be detected has a hardware fault according to the first abnormal data and the second abnormal data.

[0028] Further, the steps of obtaining the second abnormal data include:

[0029] The MES system divides the second test mode data according to the duration of the abnormal test operation to obtain several abnormal test data groups; processes the data to obtain the abnormal operation feature set, obtains the abnormal operation set feature in the abnormal operation feature set and calculates the distance from the clustering center. If it exceeds the threshold, it is marked as abnormal, and further obtains the abnormal ratio.

[0030] Further, the steps of judging whether the capacitive touch screen to be detected has a hardware fault include:

[0031] The MES system obtains the first abnormal ratio according to the ratio of the abnormal test operation of the second abnormal data in all test operations of the first test mode and the second test mode; obtains the second abnormal ratio according to the ratio of the abnormal test operation in all test operations of its type, constructs the abnormal index of the touch screen according to the first abnormal ratio and the second abnormal ratio. If it exceeds the abnormal index threshold, the capacitive touch screen to be detected has a hardware fault.

[0032] Compared with the prior art, the beneficial effects of the present invention are:

[0033] 1. According to the tiny capacitance change rate and the display image color change rate, a detailed test operation feature set is constructed, and then through clustering comparison with normal data, it can accurately judge which test operations may be abnormal; when the abnormal ratio reaches the threshold, the system can timely mark the corresponding test temperature range and test operation as abnormal data, thus providing reliable data support for subsequent quality inspection and test optimization, not only improving the accuracy and sensitivity of abnormal detection, but also optimizing the entire test process and effectively reducing the misjudgment risk.

[0034] 2. By conducting targeted test optimization and adjustment on abnormal temperatures and abnormal test operations, including adjusting the temperature rise rate, extending the test duration, and increasing the operation execution frequency, a second test mode is constructed for retesting, and the data of the second test mode is analyzed, enabling abnormal test operations to be captured more meticulously, providing a reliable data basis for the performance evaluation and quality control of the touch screen.

[0035] 3. Based on the first abnormal data and the second abnormal data, a method for judging comprehensive abnormal indicators is constructed. By quantifying the proportions of abnormal operations in the first and second test modes and in their respective types of test operations respectively, and using a weight coefficient to perform weighted fusion on the two, it can more comprehensively and accurately reflect the abnormal conditions of the touch screen in actual tests, and accurately determine whether there are hardware faults in the capacitive touch screen to be detected. Description of the Drawings

[0036] Figure 1 It is a flowchart of a method for managing test data of a capacitive touch screen based on the MES system provided by an embodiment of the present invention;

[0037] Figure 2 It is a flowchart for constructing the first abnormal data provided by an embodiment of the present invention;

[0038] Figure 3 It is a flowchart for constructing the second test mode provided by an embodiment of the present invention. Detailed Embodiments

[0039] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0040] Embodiment 1:

[0041] A certain company introduced a method for managing test data of a capacitive touch screen based on the MES system provided by the present invention during the process of quality inspection and analysis of the produced capacitive touch screens, and carried out industrial data collection, industrial data processing, industrial data mining, industrial data analysis, and industrial data processing during the quality inspection of the capacitive touch screens to improve the test efficiency and detection accuracy of the capacitive touch screens. The method flow is as Figure 1 shown, and the specific implementation is as follows:

[0042] First, obtain the capacitive touch screen to be detected and perform the first test mode, where the first test mode tests the touch screen according to the first test temperature, the second test temperature, the test duration, the test cycle, and the specified operation set; after all touch screens complete the first test mode, obtain the first test mode data;

[0043] Further, the first test mode specifically includes:

[0044] The number of test cycles in the first test mode is equal to the number of types of test operations in the specified operation set;

[0045] Obtain the first test temperature, the second test temperature, and the test duration, where the first test temperature is less than the second test temperature; within the test duration of the i-th test cycle, the test temperature uniformly increases from the first test temperature to the second test temperature; within the i-th test cycle, obtain the i-th type of test operation in the specified operation set and test the touch screen;

[0046] After completing the first test mode, obtain the first test mode data.

[0047] Further, there are many test operations in the specified operation set, including clicking, swiping, continuous clicking, and multi-finger simultaneous operations, etc. The number of test cycles in the first test mode is equal to the number of types of test operations in the specified operation set, that is, the test is carried out according to the types of test operations;

[0048] Further, within the test duration of a test cycle, the test temperature uniformly increases from the first test temperature to the second test temperature. During this process, a test of one type of test operation is carried out. After the test temperature reaches the second test temperature, terminate this test cycle, and the second test mode data corresponding to this test operation can be obtained, which specifically includes the test temperature growth curve, capacitance data, and video data, where the capacitance data includes the capacitance values of the contacts of the test operation, and the video data includes the display images of the touch screen;

[0049] Further, after completing the tests of all test operations in the specified operation set, the complete first test mode data can be obtained.

[0050] The first test mode is a comprehensive test method based on different temperature conditions, test cycles, and specified operation sets, aiming to comprehensively evaluate the performance of the touch screen at different test temperatures. By testing each test operation separately during the uniform rise of the test temperature and recording the test temperature growth curve, capacitance data, and video data, the impact of temperature changes on touch response, sensitivity, and display effect can be accurately captured. This test mode not only ensures the comparison consistency of each operation in a unified environment but also realizes the systematization and standardization of data collection, which helps to improve product quality control and process optimization.

[0051] Divide the first test mode data according to the temperature segmentation value to obtain the data of the touch screen within each test temperature range;

[0052] Further, the specific steps of dividing the first test mode data according to the temperature segmentation value include:

[0053] Obtain the temperature segmentation value, where the temperature segmentation value is much smaller than the difference between the second test temperature and the first test temperature; the MES system divides the test temperature according to the temperature segmentation value to obtain a set of test temperature ranges; obtain the data at the test time corresponding to the test temperature range to obtain the data of the touch screen within each test temperature range.

[0054] Further, in this embodiment, the first test temperature is -20°C, the second test temperature is 70°C, and the temperature segmentation value is 2°C. That is, -20°C to -18°C is the first test temperature range, -18°C to -16°C is the second test temperature range, and so on. Several test temperature ranges can be obtained to form a set of test temperature ranges;

[0055] Further, each test temperature range corresponds to a period of test time. At this test time, the touch screen has corresponding first test mode data, including capacitance data and video data, and finally realizes the segmentation of the first test mode data.

[0056] Each test temperature range corresponds to the capacitance data and video data obtained during the test time, providing high-resolution data support for the subsequent accurate analysis of the influence of temperature on touch response, stability, and display effect; this data segmentation method not only helps to more accurately evaluate the adaptability and reliability of the product in extreme temperature environments, finely capture the performance changes of the touch screen in different temperature ranges, but also provides an effective basis for optimizing the touch screen design and improving the quality control process, thereby enhancing the scientificity and effectiveness of the entire test process.

[0057] Analyze the data to obtain the first abnormal data of the touch screen, including the abnormal temperature and abnormal test operations of the touch screen;

[0058] Further, the process of obtaining the first abnormal data is as Figure 2 shown, and the specific steps include:

[0059] The MES system obtains the data of the touch screen within each test temperature range, and divides it according to the duration of the test operation to obtain several groups of test data. Each group of test data includes capacitance data and video data. The capacitance data includes the capacitance values of the contacts of the test operation, and the video data includes the display images of the touch screen; feature extraction is performed on the capacitance data according to the capacitance change rate to obtain capacitance features; feature extraction is performed on the video data according to the color change rate of the display image to obtain display features; test operation features are constructed based on the capacitance features and display features, and further an operation feature set is obtained.

[0060] Further, taking the test operation of "single-finger click" as an example, the first test mode data of this test operation within the test temperature range of -20°C to -18°C is obtained, and the first test mode data is divided with the duration of a single operation of "single-finger click" as the division criterion, and the capacitance data and video data under the single "single-finger click" test operation within the test temperature range of -20°C to -18°C can be obtained.

[0061] Further, first analyze the capacitance data under the single "single-finger click" test operation within the test temperature range of -20°C to -18°C collected. By calculating the change rate of the capacitance value over time, capacitance features reflecting the response speed, sensitivity, and stability of the touch screen during the operation process are extracted. These features include the capacitance change amplitude, change rate of each test contact before and after touching, and the fluctuation situation under dynamic temperature or operation conditions, thus forming a set of capacitance features that can accurately reflect the capacitance response behavior of the device.

[0062] Further, process the collected video data, and extract display features by analyzing the rate of change of color over time in the screen display image. This process mainly focuses on the image changes on the screen before and after the touch operation, and uses parameters such as color change rate, brightness change, and color saturation to capture the subtle changes in the display image caused by the touch response, and obtain display features.

[0063] Further, combine the capacitance features and display features to construct comprehensive test operation features. The test operation features not only include the numerical characteristics of the capacitance change of the touch point, but also incorporate the visual information of the screen display change, and can more comprehensively describe the physical response and visual feedback of the touch screen during the touch operation process. At the same time, all the test operation features are integrated and classified to generate a complete set of operation feature sets for subsequent data comparison, model establishment, and product performance evaluation. Finally, through in-depth analysis and statistics of this operation feature set, the overall performance of the touch screen under different test conditions can be accurately evaluated, effectively guiding product quality improvement and process optimization.

[0064] The MES system obtains the test operation characteristics within the corresponding test temperature range from historical normal data and obtains the clustering centers through a clustering algorithm; it obtains the operation set characteristics in the operation characteristics set and calculates the distance from the clustering centers. If the distance exceeds the threshold, it is marked as abnormal; if the abnormal proportion in the operation characteristics set exceeds the threshold, the touch screen's test operation within the test temperature range is marked as the first abnormal data, including marking the test temperature range as the abnormal temperature and the test operation as the abnormal test operation.

[0065] Furthermore, as shown in Table 1, the distances between the test operation characteristics of "single-finger click" and the clustering centers within the test temperature range from -20°C to -18°C are presented. After calculation, the abnormal proportion of the "single-finger click" test operation within the test temperature range from -20°C to -18°C is 0, which does not exceed the threshold, indicating that there is no abnormality in the touch screen under the "single-finger click" test operation within the test temperature range from -20°C to -18°C.

[0066] Furthermore, after processing and analyzing all the test operations in the specified operation set, all types of abnormal test operations can be obtained, and these abnormal test operations will be tested more precisely in the second test mode.

[0067] Table 1. Partial test operation characteristics of "single-finger click"

[0068] Operation Number Distance from the Clustering Center Whether Exceeds the Threshold DZDJ0134 0.02 No DZDJ3491 0.18 No DZDJ1948 0.04 No DZDJ0439 0.07 No

[0069] The detection method based on historical normal data and clustering algorithm can capture the slight deviations of each test operation of the touch screen within a specific temperature range, thereby performing precise abnormal analysis on the test data. It not only improves the accuracy of abnormal detection but also can identify potential problems in real time, ensuring the stability and consistency of the product within each temperature range, thus providing scientific and reliable data support for product quality control, process optimization, and preventive maintenance.

[0070] According to the abnormal temperature and abnormal test operation, the touch screen is tested and optimized, and the second test mode is carried out. The process of constructing the second test mode is as Figure 3 shown; after all touch screens complete the second test mode, the second test mode data is obtained;

[0071] Furthermore, the test optimization and adjustment of the touch screen according to the abnormal temperature and abnormal test operation include:

[0072] If there is no abnormality in the test of the test operation at all temperatures, the touch screen will no longer be tested for this test operation at all temperatures;

[0073] If there is an abnormality in the test operation within the test temperature range, the temperature rise rate of the abnormal temperature is obtained based on the first abnormal data, and the duration of the test temperature range is adjusted according to the temperature rise rate of the abnormal temperature; and the execution frequency of the test operation is adjusted.

[0074] Furthermore, the more times the abnormal test operation occurs, the longer the time needed to stay in this temperature range. Therefore, the temperature rise rate should be slower. So, it is necessary to reduce the temperature rise rate of the test temperature range corresponding to the abnormal temperature. The calculation formula for the temperature rise rate is:

[0075]

[0076] Among them, represents the temperature rise rate of the j-th abnormal test operation in the test temperature range corresponding to the abnormal temperature, α represents the temperature adjustment coefficient, represents the number of times the j-th abnormal test operation appears in this test temperature range in the first test mode, represents the total number of test operations of the j-th test operation in this test temperature range in the first test mode, V base represents the temperature rise rate in the first test mode.

[0077] Furthermore, after the test cycle enters the test temperature range of the abnormal temperature, for the abnormal test operation in the current cycle, its execution frequency is increased. The calculation formula for the adjusted execution frequency is:

[0078]

[0079] Among them, represents the execution frequency of the j-th abnormal test operation, β represents the frequency adjustment coefficient, represents the number of times the j-th abnormal test operation appears in this test temperature range in the first test mode, represents the square root operation, F base represents the execution frequency of the test operation in the first test mode.

[0080] Furthermore, in the first test mode, after processing and judgment, "sliding" is an abnormal test operation, which is tested at a certain frequency F base in the first test mode; when entering the second test mode, after the test cycle enters the test temperature range corresponding to the abnormal temperature, that is, between the left-end temperature and the right-end temperature, the execution frequency of "sliding" is increased.

[0081] If no abnormalities are found in a certain test operation at all temperatures, there is no need to repeat the operation in subsequent tests, thus saving test time; for test operations with abnormalities in a specific test temperature range, adjusting the temperature rise speed and test frequency according to the abnormal data helps to capture abnormal details more fully, and can make the abnormal data more concentrated and representative.

[0082] Furthermore, the second test mode specifically includes:

[0083] The number of test cycles of the second test mode is equal to the number of types of abnormal test operations obtained in the first test mode;

[0084] Furthermore, if there are abnormalities in the "sliding" abnormal test operation in the test temperature range from 66°C to 68°C, obtain the first test temperature, the test temperature range of the abnormal temperature, the second test temperature, and the growth rate, where the first test temperature is less than the second test temperature; within the test duration of the jth test cycle, the test temperature uniformly increases from the first test temperature to the left-end temperature of the test temperature range of the abnormal temperature, with the growth rate being the same as that of the first test mode; the left-end temperature of the test temperature range of the abnormal temperature uniformly increases to the right-end temperature of the test temperature range of the abnormal temperature, with the growth rate being the temperature rise speed of the abnormal temperature; the right-end temperature of the test temperature range of the abnormal temperature increases to the second test temperature, with the growth rate being the same as that of the first test mode; within the jth test cycle, obtain the jth type of abnormal test operation and test the capacitive touch screen;

[0085] Furthermore, if there are multiple test temperature ranges corresponding to abnormal temperatures for the abnormal test operation, within the test temperature range corresponding to the normal temperature, the growth rate of the temperature is the same as the temperature rise speed of the first test mode, and within the test temperature range corresponding to the abnormal temperature, the growth rate of the temperature is the temperature rise speed of the abnormal temperature.

[0086] Furthermore, after completing the second test mode, second test mode data is obtained.

[0087] By maintaining the same temperature rise speed as the first test mode in the normal temperature range and adopting more refined temperature control, that is, reducing the temperature rise speed, in the test temperature range corresponding to the abnormal temperature, more detailed data can be obtained in the stage where the temperature change is most sensitive; at the same time, increasing the execution frequency of the abnormal test operation further enhances the acquisition density and accuracy of the abnormal data; doing so not only improves the test resolution and data reliability, but also can more accurately capture the performance changes of the touch screen at the key temperature segments.

[0088] Process and analyze the second test mode data to obtain second abnormal data;

[0089] Furthermore, the steps to obtain the second abnormal data include:

[0090] The MES system divides the second test mode data according to the duration of the abnormal test operation to obtain several groups of abnormal test data; processes the data to obtain an abnormal operation feature set, obtains the abnormal operation set feature in the abnormal operation feature set, calculates the distance from the clustering center, and marks it as abnormal if it exceeds the threshold, and further obtains the abnormal ratio.

[0091] Further, taking the "swipe" test operation as an example, first divide its second test mode data according to the duration of a single "swipe" test operation, and abnormal test data groups of the "swipe" test operation at all temperatures can be obtained; perform the same feature extraction on the capacitance data and video data in the abnormal test data groups as the first abnormal data to obtain an abnormal operation feature set, then calculate the distance from it to the clustering center, and if it exceeds the threshold, mark the corresponding single "swipe" test operation as an abnormal test operation; after processing all the data, the number of all "swipe" abnormal test operations can be obtained, and further calculate the ratio of the number of abnormal test operations to the number of all "swipe" test operations to obtain the abnormal ratio.

[0092] By dividing the second test mode data generated by a single test cycle according to the duration of a single test operation to obtain several groups of abnormal test data, then performing the same feature extraction on the capacitance data and video data as the first abnormal data, and calculating the distance from the clustering center, the system can quickly and accurately determine whether each test operation is abnormal; finally, by statistically calculating the ratio of the number of abnormal operations to the total number, the abnormal ratio is obtained, thereby providing a quantitative basis for further optimizing the test process and product quality, realizing the comprehensive monitoring of the performance state of the touch screen, and promoting subsequent automatic adjustment and process improvement.

[0093] Judge whether the capacitive touch screen to be detected has a hardware fault according to the first abnormal data and the second abnormal data.

[0094] Further, the steps for judging whether the capacitive touch screen to be detected has a hardware fault include:

[0095] The MES system obtains the first abnormal ratio according to the ratio of the abnormal test operation of the second abnormal data in all test operations of the first test mode and the second test mode; obtains the second abnormal ratio according to the ratio of the abnormal test operation in all test operations of the corresponding type, constructs an abnormal index of the touch screen according to the first abnormal ratio and the second abnormal ratio, and if it exceeds the abnormal index threshold, the capacitive touch screen to be detected has a hardware fault.

[0096] Table 2. Abnormal indexes of some capacitive touch screens to be detected

[0097] Touch Screen Number Abnormal Index Whether Exceeds the Threshold CMP0125 0.0009 No CMP8231 0.0008 No CMP3749 0.0008 No CMP8103 0.0007 No CMP4726 0.0006 No

[0098] Further, the calculation formula for the abnormal index is as follows:

[0099]

[0100] Among them, YCZB represents the abnormal index, θ1 represents the weight coefficient of the first abnormal ratio, J represents the number of types of abnormal test operations, YCCZ j represents the number of occurrences of the j-th type of abnormal test operation in the first test mode and the second test mode, CZ total represents the total number of test operations in the first test mode and the second test mode, θ2 represents the weight coefficient of the second abnormal ratio, represents the total number of the j-th type of test operation in the first test mode and the second test mode.

[0101] As shown in Table 2, the abnormal indexes of some capacitive touchscreens to be detected do not exceed the threshold of 0.001. By comprehensively analyzing the proportion of abnormal test operations in different test modes, an abnormal index that can objectively reflect the overall abnormal state of the touchscreen is constructed, realizing the rapid determination of whether there is a fault in the touchscreen and improving the test efficiency and detection accuracy.

[0102] Through a capacitive touchscreen test data management method based on the MES system provided by the present invention, accurate quality detection and analysis of the capacitive touchscreen are realized. First, data of the touchscreen under different temperature conditions are obtained through the first test mode, and the data are subdivided into different test temperature ranges by using temperature segmentation values, so as to accurately identify abnormal temperatures and abnormal test operations; then, the test process is optimized and adjusted according to these abnormal data, and the second test mode is adopted to further capture subtle abnormal phenomena; finally, an abnormal index is constructed by integrating the first abnormal data and the second abnormal data to scientifically judge whether there is a hardware fault in the touchscreen. This not only improves the accuracy and sensitivity of abnormal detection, but also provides reliable data support for product quality control, process improvement and intelligent manufacturing, significantly improving the stability and detection efficiency of the product.

[0103] Embodiment 2:

[0104] A certain company introduced a capacitive touchscreen test book management method based on the MES system provided by the present invention to improve the quality detection efficiency of large-size capacitive touchscreens. The specific implementation method is as follows:

[0105] The MES system, also known as the Manufacturing Execution System, is an integrated information management platform that runs through the enterprise's production workshop. It is responsible for real-time collection, transmission, storage, and analysis of various production data during the production process, and provides decision-making support for production scheduling, quality management, equipment maintenance, etc. The application of the MES system makes the management of production site data automated and real-time, greatly improving production efficiency and product quality.

[0106] First, obtain the capacitive touch screen to be tested and perform the first test mode, where the first test mode tests the touch screen according to the first test temperature, the second test temperature, the test duration, the test cycle, and the specified operation set; after all touch screens complete the first test mode, obtain the first test mode data;

[0107] Furthermore, the first test mode specifically includes:

[0108] The number of test cycles of the first test mode is equal to the number of types of test operations in the specified operation set;

[0109] Obtain the first test temperature, the second test temperature, and the test duration, where the first test temperature is less than the second test temperature; within the test duration of the i-th test cycle, the test temperature uniformly increases from the first test temperature to the second test temperature; within the i-th test cycle, obtain the i-th type of test operation in the specified operation set and test the touch screen;

[0110] After completing the first test mode, obtain the first test mode data.

[0111] According to the temperature segmentation value, segment the first test mode data to obtain the data of the touch screen in each test temperature interval; analyze the data to obtain the first abnormal data of the touch screen, including the abnormal temperature and abnormal test operation of the touch screen;

[0112] Furthermore, the specific steps of segmenting the first test mode data according to the temperature segmentation value include:

[0113] Obtain the temperature segmentation value, where the temperature segmentation value is much smaller than the difference between the second test temperature and the first test temperature; the MES system segments the test temperature according to the temperature segmentation value to obtain the set of test temperature intervals; obtain the data at the test time corresponding to the test temperature interval to obtain the data of the touch screen in each test temperature interval.

[0114] Furthermore, the steps of obtaining the first abnormal data include:

[0115] The MES system obtains the data of the touch screen within each test temperature range, and divides it according to the duration of the test operation to obtain a number of test data groups. Each test data group includes capacitance data and video data. The capacitance data includes the capacitance values of the contacts of the test operation, and the video data includes the display images of the touch screen. Feature extraction is performed on the capacitance data according to the capacitance change rate to obtain capacitance features. Feature extraction is performed on the video data according to the color change rate of the display image to obtain display features. Test operation features are constructed based on the capacitance features and display features, and further an operation feature set is obtained.

[0116] The MES system obtains the test operation features within the corresponding test temperature range in the historical normal data and obtains the clustering center through the clustering algorithm. Obtain the operation set features in the operation feature set and calculate the distance from the clustering center. If it exceeds the threshold, it is marked as abnormal. If the abnormal proportion in the operation feature set exceeds the threshold, the test operation of the touch screen within the test temperature range is marked as the first abnormal data, including marking the test temperature range as the abnormal temperature and the test operation as the abnormal test operation.

[0117] Test optimization and adjustment of the touch screen are carried out according to the abnormal temperature and abnormal test operation, and the second test mode is carried out. After all touch screens complete the second test mode, the second test mode data is obtained.

[0118] Furthermore, the test optimization and adjustment of the touch screen according to the abnormal temperature and abnormal test operation include:

[0119] If there is no abnormality in the test of the test operation at all temperatures, the touch screen will no longer perform the test of this test operation at all temperatures.

[0120] If there is an abnormality in the test operation within the test temperature range, the temperature rise speed of the abnormal temperature is obtained according to the first abnormal data, and the duration of the test temperature range is adjusted according to the temperature rise speed of the abnormal temperature; and the execution frequency of the test operation is adjusted.

[0121] Furthermore, the second test mode specifically includes:

[0122] The number of test cycles of the second test mode is equal to the number of types of abnormal test operations obtained in the first test mode.

[0123] Obtain the first test temperature, the test temperature range of the abnormal temperature, the second test temperature, and the growth rate, where the first test temperature is less than the second test temperature; within the test duration of the j-th test cycle, within the test temperature range corresponding to the normal temperature, the growth rate of the temperature is the same as the temperature rise rate of the first test mode; within the test temperature range corresponding to the abnormal temperature, the growth rate of the temperature is the temperature rise rate of the abnormal temperature; within the j-th test cycle, obtain the j-th type of abnormal test operation and test the capacitive touch screen.

[0124] After completing the second test mode, obtain the second test mode data.

[0125] Process and analyze the second test mode data to obtain the second abnormal data; determine whether the capacitive touch screen to be detected has a hardware fault based on the first abnormal data and the second abnormal data. As shown in Table 3, the distances from some test operation characteristics of "multi-touch" to the cluster center are shown, and it can be seen that some data are abnormal.

[0126] Table 3. Some test operation characteristics of "multi-touch"

[0127] Test Operation Number Distance from the Clustering Center Whether Exceeds the Threshold DDCP4729 0.23 Yes DDCP3792 0.12 No DDCP1946 0.34 Yes DDCP0234 0.16 No

[0128] Furthermore, the steps to obtain the second abnormal data include:

[0129] The MES system divides the second test mode data according to the duration of the abnormal test operation to obtain several groups of abnormal test data; processes the data to obtain the abnormal operation feature set, obtains the abnormal operation set feature in the abnormal operation feature set and calculates the distance to the cluster center. If it exceeds the threshold, it is marked as abnormal, and further obtains the abnormal ratio.

[0130] Furthermore, the steps to determine whether the capacitive touch screen to be detected has a hardware fault include:

[0131] The MES system obtains the first abnormal ratio according to the proportion of the abnormal test operation of the second abnormal data in all test operations of the first test mode and the second test mode; obtains the second abnormal ratio according to the proportion of the abnormal test operation in all test operations of its type. Construct the abnormal index of the touch screen based on the first abnormal ratio and the second abnormal ratio. If it exceeds the abnormal index threshold, the capacitive touch screen to be detected has a hardware fault. As shown in Table 4, the abnormal indexes of some large-size capacitive touch screens to be detected are shown. The abnormal indexes of some touch screens exceed the threshold of 0.001, indicating a hardware fault.

[0132] Table 4. Abnormal indexes of some large-size capacitive touch screens to be detected

[0133] Touch Screen Number Abnormal Index Whether Exceeds the Threshold BCMP4832 0.0013 Yes BCMP4795 0.0009 No BCMP2866 0.0008 No BCMP0153 0.0012 Yes

[0134] Through a capacitance touch screen test data management method based on the MES system provided by the present invention, accurate quality detection and analysis of large-size capacitance touch screens are achieved, and data support can be provided for subsequent production and manufacturing.

[0135] Although the embodiments of the present invention have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A method for managing capacitance touch screen test data based on the MES system, characterized in that, Including: Obtain a capacitive touch screen to be detected and perform a first test mode, where the first test mode tests the touch screen according to a first test temperature, a second test temperature, a test duration, a test period, and a specified operation set; After all touch screens complete the first test mode, obtain first test mode data; Segment the first test mode data according to a temperature segmentation value to obtain data of the touch screen in each test temperature range; Analyze the data to obtain first abnormal data of the touch screen, including abnormal temperature and abnormal test operations of the touch screen; perform test optimization and adjustment of the touch screen according to the abnormal temperature and abnormal test operations, and perform a second test mode; after all touch screens complete the second test mode, obtain second test mode data; Process and analyze the second test mode data to obtain second abnormal data; Judge whether the capacitive touch screen to be detected has a hardware fault according to the first abnormal data and the second abnormal data.

2. The capacitance touch screen test data management method based on the MES system according to claim 1, characterized in that, The first test mode specifically includes: The number of test periods of the first test mode is equal to the number of types of test operations in the specified operation set; Obtain a first test temperature, a second test temperature, and a test duration, where the first test temperature is less than the second test temperature; within the test duration of the i-th test period, the test temperature uniformly increases from the first test temperature to the second test temperature; within the i-th test period, obtain the i-th type of test operation in the specified operation set and test the touch screen; After completing the first test mode, obtain first test mode data.

3. A method for managing capacitance touch screen test data based on the MES system according to claim 1, characterized in that, The specific steps for segmenting the first test mode data according to the temperature segmentation value include: Obtain a temperature segmentation value, where the temperature segmentation value is less than the difference between the second test temperature and the first test temperature; the MES system segments the test temperature according to the temperature segmentation value to obtain a set of test temperature ranges; obtain the data at the test time corresponding to the test temperature range to obtain data of the touch screen in each test temperature range.

4. A method for managing capacitance touch screen test data based on an MES system according to claim 1, characterized in that, The steps for obtaining the first abnormal data include: The MES system obtains the data of the touch screen in each test temperature range and segments it according to the duration of the test operation to obtain a number of test data groups, where each test data group includes capacitance data and video data, where the capacitance data includes the capacitance values of the contacts of the test operation, and the video data includes the display image of the touch screen; extract features from the capacitance data according to the capacitance change rate to obtain capacitance features; extract features from the video data according to the color change rate of the display image to obtain display features; construct test operation features according to the capacitance features and the display features, and further obtain an operation feature set; The MES system obtains the test operation features in the corresponding test temperature range in the historical normal data and obtains the clustering center through a clustering algorithm; obtains the operation set features in the operation feature set and calculates the distance from the clustering center, and if it exceeds the threshold, it is marked as abnormal; if the abnormal proportion in the operation feature set exceeds the threshold, the test operation of the touch screen in this test temperature range is marked as the first abnormal data, including marking the test temperature range as the abnormal temperature and the test operation as the abnormal test operation.

5. A method for managing capacitive touch screen test data based on an MES system according to claim 1, characterized in that, The test optimization and adjustment of the touch screen according to abnormal temperature and abnormal test operations include: If there is no abnormality in the test of the test operation at all temperatures, the touch screen will no longer perform the test of this test operation at all temperatures; If there is an abnormality in the test operation within the test temperature range, obtain the temperature rise rate of the abnormal temperature according to the first abnormal data, adjust the duration of the test temperature range according to the temperature rise rate of the abnormal temperature; and adjust the execution frequency of the abnormal test operation.

6. The capacitive touch screen test data management method based on the MES system according to claim 1, wherein, The second test mode specifically includes: The number of test cycles of the second test mode is equal to the number of types of abnormal test operations obtained in the first test mode; Obtain the first test temperature, the test temperature range of the abnormal temperature, the second test temperature, and the growth rate of the test temperature, where the first test temperature is less than the second test temperature; within the test duration of the j-th test cycle, within the test temperature range corresponding to the normal temperature, the growth rate of the test temperature is the same as the temperature rise rate of the first test mode; within the test temperature range corresponding to the abnormal temperature, the growth rate of the test temperature is the temperature rise rate of the abnormal temperature; within the j-th test cycle, obtain the j-th type of abnormal test operation and test the capacitive touch screen; After completing the second test mode, obtain the second test mode data.

7. A method for managing capacitance touch screen test data based on the MES system according to claim 1, characterized in that, The steps to obtain the second abnormal data include: The MES system divides the second test mode data according to the duration of the abnormal test operation to obtain several groups of abnormal test data; processes the data to obtain the abnormal operation feature set, obtains the abnormal operation set feature in the abnormal operation feature set and calculates the distance from the clustering center, and if it exceeds the threshold, it is marked as abnormal and the abnormal ratio is obtained.

8. A method for managing capacitance touch screen test data based on an MES system according to claim 1, characterized in that, The steps to determine whether there is a hardware failure in the capacitive touch screen to be detected include: The MES system obtains the first abnormal ratio according to the ratio of the abnormal test operation of the second abnormal data in all test operations of the first test mode and the second test mode; obtains the second abnormal ratio according to the ratio of the abnormal test operation in all test operations of its type, constructs the abnormal index of the touch screen according to the first abnormal ratio and the second abnormal ratio, and if it exceeds the abnormal index threshold, there is a hardware failure in the capacitive touch screen to be detected.

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