Optical displacement measurement system for high-pressure environment

Abstract

The invention discloses an optical displacement measuring system for a high-pressure environment, which comprises a computer (22), an optical displacement tester (1), a data acquisition card (2), a universal meter (8), a high-voltage amplifier (5) and an operational amplifier (7), and is characterized in that the optical displacement tester (1) is provided with a load frame (4), a temperature adjusting part (21) and a pressurizing mechanism (3); the load frame (4) is used for applying radial pressure to the sample; the temperature adjusting part (21) is used for adjusting the environment temperature of the sample position; the pressurizing mechanism (3) is used for applying axial pressure to the sample; the device can be used for measuring the axial displacement of the piezoelectric ceramic sample in a radial high-pressure environment, and has the characteristics of low possibility of being influenced by the environment and high measurement precision.

Description

Technical Field

[0001] The present invention relates to the field of measurement systems, and particularly to an optical displacement measurement system for high-pressure environments. Background Art

[0002] In recent years, with the continuous development and maturity of piezoelectric materials and theories, various measurement devices for measuring the electromechanical, elastic, and dielectric parameters of piezoelectric ceramics have been continuously developed. However, new displacement measurement devices in high electric field and high-pressure environments have not been commercially developed. During the measurement of the axial strain of piezoelectric ceramic specimens, detection is usually carried out through a ferroelectric analyzer, which is easily affected by factors such as test environment interference and signal loss. The test results may have errors, data processing is cumbersome, and since there is no pressure application mechanism and the voltage is limited by the power supply, it is impossible to apply pressure and high-voltage electric fields to the sample, making it difficult to conduct data tests on the sample under high-pressure and high-voltage electric field environments. Summary of the Invention

[0003] The purpose of the present invention is to provide an optical displacement measurement system for high-pressure environments. The present invention can be used to measure the axial displacement of piezoelectric ceramic samples in a radial high-pressure environment, and has the characteristics of being not easily affected by the environment and having high measurement accuracy.

[0004] The technical solution of the present invention: An optical displacement measurement system for high-pressure environments includes a computer, an optical displacement tester, a data acquisition card, a multimeter, a high-voltage amplifier, and an operational amplifier. The optical displacement tester is provided with a load frame, a temperature regulator, and a pressure application mechanism; the load frame is used to apply radial pressure to the sample; the temperature regulator is used to adjust the ambient temperature of the sample position; the pressure application mechanism is used to apply axial pressure to the sample; the high-voltage input end of the optical displacement tester is connected to the high-voltage amplifier, and the charge signal output end of the optical displacement tester is connected to the operational amplifier; the pressure signal input end of the pressure application mechanism is connected to the multimeter; the data acquisition card is connected to the computer, the multimeter, the signal transmission ends of the temperature regulator, the displacement signal output end of the optical displacement tester, the radial pressure signal transmission end of the load frame, the signal output end of the operational amplifier, and the signal input end of the high-voltage amplifier.

[0005] In the above-mentioned optical displacement measurement system for high-pressure environments, the pressure application mechanism includes an upper sample holder and a lower sample holder that are arranged up and down on the optical displacement tester and are connected to the multimeter. The top of the optical displacement tester is provided with an optical fiber displacement sensor connected to the data acquisition card, and a contact pin located between the upper sample holder and the lower sample holder is provided on the optical fiber displacement sensor; the temperature regulator includes a crucible arranged on the lower sample holder and corresponding to the contact pin, and a temperature controller connected to the data acquisition card is connected to the crucible.

[0006] In the aforementioned optical displacement measurement system for high-pressure environments, the optical displacement tester is provided with a high-voltage input interface connected to a contact pin and a high-voltage output interface connected to a crucible. The high-voltage input interface and the high-voltage output interface are connected to a high-voltage amplifier.

[0007] In the aforementioned optical displacement measurement system for high-pressure environments, a reference capacitor connected to an operational amplifier is connected to the contact pin. The reference capacitor is used to store charges instead of the sample.

[0008] In the aforementioned optical displacement measurement system for high-pressure environments, the load frame includes a fixed block disposed on the side of the contact pin. A piezoelectric actuator, a piezoelectric sensor, and a loading die are sequentially provided on the fixed block. The piezoelectric sensor is connected to a data acquisition card.

[0009] In the aforementioned optical displacement measurement system for high-pressure environments, the computer includes a data analysis module and a virtual parameter actuation module. The data analysis module analyzes the received detection data. After the virtual parameter actuation module establishes relationships with the elements in the data analysis module, it changes the parameters within a specified range to drive various simulation analysis methods to perform computational solutions for different parameters.

[0010] In the aforementioned optical displacement measurement system for high-pressure environments, the test method for the optical displacement measurement system for high-pressure environments is to place the sample in the pressurizing mechanism of the optical displacement tester, adjust the clamping force of the pressurizing mechanism so that the multimeter remains at a fixed value. The high-voltage amplifier is controlled by the computer via the data acquisition card. After the alternating current is amplified in gain by the received function signal, it enters the optical displacement tester to form an electric field. The load frame is controlled by the computer via the data acquisition card to apply a radial pressure to the sample. The temperature adjustment component controls the ambient temperature inside the optical displacement tester. During the test, the displacement signal and charge signal of the optical displacement tester enter the computer through the data acquisition card for summarization.

[0011] Compared with the prior art, during the test of the present invention, the sample is placed in the pressurizing mechanism of the optical displacement tester. The clamping force of the pressurizing mechanism is adjusted to keep the multimeter at a fixed value. The high-voltage amplifier is controlled by the computer via the data acquisition card. After the received function signal is used to amplify the alternating current, it enters the optical displacement tester to form an electric field. The load frame is controlled by the computer via the data acquisition card to apply a radial pressure to the sample. The temperature regulating member controls the ambient temperature inside the optical displacement tester. During the test, the displacement signal and charge signal of the optical displacement tester enter the computer through the data acquisition card for summary. By applying an axial pressure to the sample through the pressurizing mechanism, a high-pressure test environment is obtained, and a high-voltage electric field test environment is obtained through the high-voltage amplifier. Furthermore, data tests can be carried out under high-pressure and high-voltage electric field environments. The pressurizing mechanism, temperature regulating member, and high-voltage amplifier are all controlled by the computer, and the test variables can be accurately controlled, thus being less susceptible to the environment. At the same time, the operational amplifier can improve the reliability of the signal quality to enhance the measurement accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 is a schematic structural diagram of the present invention;

[0013] Figure 2 is a schematic structural diagram of the optical displacement tester of the present invention;

[0014] Figure 3 is a schematic structural diagram of the load frame of the present invention.

[0015] The reference numerals in the drawings are: 1 - optical displacement tester; 2 - data acquisition card; 3 - pressurizing mechanism; 4 - load frame; 5 - high-voltage amplifier; 6 - temperature controller; 7 - operational amplifier; 8 - multimeter; 9 - upper sample clamping member; 10 - lower sample clamping member; 11 - fiber optic displacement sensor; 12 - contact pin; 13 - crucible; 14 - high-voltage input interface; 15 - high-voltage output interface; 16 - reference capacitor; 17 - fixing block; 18 - piezoelectric actuator; 19 - piezoelectric sensor; 20 - loading mold; 21 - temperature regulating member; 22 - computer. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0016] The present invention will be further described below with reference to the drawings and embodiments, but it shall not be used as a basis for limiting the present invention.

[0017] Embodiment: An optical displacement measurement system for high-pressure environments, as shown in the attached Figure 1 and the attached Figure 2As shown in the figure, it includes a computer 22, an optical displacement tester 1, a data acquisition card 2, a multimeter 8, a high-voltage amplifier 5, and an operational amplifier 7. A load frame 4, a temperature regulator 21, and a pressurizing mechanism 3 are assembled on the optical displacement tester 1. The load frame 4 is used to apply radial pressure to the sample. The temperature regulator 21 is used to adjust the ambient temperature of the sample position. The pressurizing mechanism 3 is used to apply axial pressure to the sample. The high-voltage input end of the optical displacement tester 1 is connected to the high-voltage amplifier 5, and the charge signal output end of the optical displacement tester 1 is connected to the operational amplifier 7. The pressure signal input end of the pressurizing mechanism 3 is connected to the multimeter 8. The data acquisition card 2 is connected to the computer 22, the multimeter 8, the signal transmission end of the temperature regulator 21, the displacement signal output end of the optical displacement tester 1, the radial pressure signal transmission end of the load frame 4, the signal output end of the operational amplifier 7, and the signal input end of the high-voltage amplifier 5. The pressurizing mechanism 3 includes an upper sample clamping member 9 and a lower sample clamping member 10 which are arranged up and down on the optical displacement tester 1 and are connected to the multimeter 8. The lower sample clamping member is connected to the optical displacement tester through a motor, and axial pressure is provided by the motor. The motor is connected to the multimeter. A fiber optic displacement sensor 11 connected to the data acquisition card 2 is fixedly connected to the top of the optical displacement tester 1. A contact pin 12 located between the upper sample clamping member 9 and the lower sample clamping member 10 is fixedly connected to the fiber optic displacement sensor 11, and an electric field is generated by the contact pin. The temperature regulator includes a crucible 13 arranged on the lower sample clamping member 10 and corresponding to the contact pin 12. A temperature controller 6 connected to the data acquisition card 2 is connected to the crucible 13. The crucible and the contact pin clamp the sample together. The crucible is an electrically heated crucible and can generate heat by itself. A high-voltage input interface 14 connected to the contact pin 12 and a high-voltage output interface 15 connected to the crucible 13 are provided on the optical displacement tester 1. The high-voltage input interface 14 and the high-voltage output interface 15 are connected to the high-voltage amplifier 5. A reference capacitor 16 connected to the operational amplifier 7 is connected to the contact pin 12. The reference capacitor 16 is used to store charge instead of the sample. As shown in the appendix Figure 3 As shown in the figure, the load frame 4 includes a fixed block 17 arranged on the side of the contact pin 12. A piezoelectric actuator 18, a piezoelectric sensor 19, and a loading die 20 are successively arranged on the fixed block 17. The piezoelectric actuator controls mechanical stress, and the piezoelectric sensor detects mechanical stress. The piezoelectric sensor 19 is connected to the data acquisition card 2. The computer includes a data analysis module and a virtual parameter actuation module. The data analysis module analyzes the data according to the received detection data through Labview. The virtual parameter actuation module is used to establish relationships with the elements in the data analysis module and then vary the parameters within a specified range, so as to drive various simulation analysis methods to perform calculation and solution for different parameters.

[0018] Working principle: Place the sample between the bottom electrical contact in the crucible and the spring-loaded and electrically isolated pins of the contact pin. Adjust the clamping force of the pressurizing mechanism so that the multimeter remains at a fixed value. The high-voltage amplifier is controlled by a computer via a data acquisition card. After amplifying the alternating current with a gain of 1000 with the received function signal, it enters the optical displacement tester to form an electric field. The load frame is controlled by a computer via a data acquisition card to apply a radial pressure to the sample. The temperature regulating component controls the ambient temperature inside the optical displacement tester. During the test, the displacement signal and charge signal of the optical displacement tester enter the computer via the data acquisition card for summary and processing.

[0019] The above embodiments only express the implementation modes of the present invention. The description is relatively specific and detailed, but it cannot be construed as a limitation on the scope of the invention patent. In this embodiment, up, down, left, right, front, and back only represent their relative positions and do not represent their absolute positions. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the present invention patent shall be subject to the appended claims.

Claims

1. An optical displacement measurement system for high-pressure environments, comprising a computer (22), an optical displacement tester (1), a data acquisition card (2), a multimeter (8), a high-voltage amplifier (5) and an operational amplifier (7), characterized in that: The optical displacement tester (1) is provided with a load frame (4), a temperature regulator (21) and a pressurizing mechanism (3); the load frame (4) is used to apply radial pressure to the sample; the temperature regulator (21) is used to adjust the ambient temperature of the sample position; the pressurizing mechanism (3) is used to apply axial pressure to the sample; the high-voltage input end of the optical displacement tester (1) is connected to a high-voltage amplifier (5), and the charge signal output end of the optical displacement tester (1) is connected to an operational amplifier (7); the pressure signal input end of the pressurizing mechanism (3) is connected to a multimeter (8); the data acquisition card (2) is connected to a computer (22), the multimeter (8), the signal transmission end of the temperature regulator (21), the displacement signal output end of the optical displacement tester (1), the radial pressure signal transmission end of the load frame (4), the signal output end of the operational amplifier (7) and the signal input end of the high-voltage amplifier (5).

2. The optical displacement measurement system for high-pressure environments according to claim 1, wherein: The pressurizing mechanism (3) includes an upper sample holder (9) and a lower sample holder (10) which are arranged up and down on the optical displacement tester (1) and are connected to the multimeter (8). A fiber optic displacement sensor (11) connected to the data acquisition card (2) is provided at the top of the optical displacement tester (1). A contact pin (12) located between the upper sample holder (9) and the lower sample holder (10) is provided on the fiber optic displacement sensor (11); the temperature regulator includes a crucible (13) arranged on the lower sample holder (10) and corresponding to the contact pin (12), and a temperature controller (6) connected to the data acquisition card (2) is connected to the crucible (13).

3. The optical displacement measurement system for a high-pressure environment according to claim 2, characterized in that: A high-voltage input interface (14) connected to the contact pin (12) and a high-voltage output interface (15) connected to the crucible (13) are provided on the optical displacement tester (1), and the high-voltage input interface (14) and the high-voltage output interface (15) are connected to the high-voltage amplifier (5).

4. The optical displacement measurement system for a high-pressure environment according to claim 2, characterized in that: A reference capacitor (16) connected to the operational amplifier (7) is connected to the contact pin (12), and the reference capacitor (16) is used to store charge instead of the sample.

5. The optical displacement measurement system for high-pressure environments according to claim 2, characterized in that: The load frame (4) includes a fixed block (17) arranged on the side of the contact pin (12). A piezoelectric actuator (18), a piezoelectric sensor (19) and a loading die (20) are successively arranged on the fixed block (17); the piezoelectric sensor (19) is connected to the data acquisition card (2).

6. The optical displacement measurement system for a high-pressure environment according to claim 1, wherein: The computer includes a data analysis module and a virtual parameter actuation module. The data analysis module analyzes the data according to the received detection data. After the virtual parameter actuation module establishes relationships with the elements in the data analysis module, it changes the parameters within a specified range, so as to drive various simulation analysis methods to perform calculation and solution for different parameters.

7. The optical displacement measurement system for a high-pressure environment according to any one of claims 1-6, characterized in that: The test method for the optical displacement measurement system used in a high-pressure environment is to place the sample in the pressurizing mechanism of the optical displacement tester, adjust the clamping force of the pressurizing mechanism so that the multimeter remains at a fixed value. The high-voltage amplifier is controlled by the computer via the data acquisition card, amplifies the alternating current with the received function signal and then enters the optical displacement tester to form an electric field. The load frame applies a radial pressure to the sample under the control of the computer via the data acquisition card. The temperature adjustment component controls the ambient temperature inside the optical displacement tester. During the test, the displacement signal and charge signal of the optical displacement tester enter the computer via the data acquisition card for summarization.

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