Lightweight backlight module power-on test device

Abstract

The invention relates to the field of electrical performance testing, and discloses a lightweight backlight module power-on testing device which comprises a testing frame, a support is arranged at the top of the testing frame, a sensor is arranged on the support, and a power-on guide rail is arranged in the testing frame. The actual position of a lamp bead pin can be detected in real time, automatic stop is achieved when the guide rail groove is horizontally aligned with the lamp bead pin, and only vertical inserting action continues to be executed. By means of the mode, redundant transverse sliding of the guide rails near the pins is avoided, alignment deviation caused by the distance difference of the lamp beads is remarkably reduced, and the inserting precision and the stability of electrical connection are effectively improved. By means of the self-adaptive positioning mechanism, the device does not need to depend on the fixed probe distance, the arrangement characteristics of different modules can be automatically matched, and therefore the testing device is endowed with higher universality and environment adaptability, and the device is particularly suitable for the testing scene of multi-specification backlight modules with different lamp bead arrangement densities and large distance span.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical performance testing, and particularly to a lightweight backlight module power-on testing device. Background Art

[0002] Backlight modules are widely used in large-size liquid crystal displays, televisions, and professional displays. Their structural feature is that LED lamp beads are directly arranged in a matrix form under the light guide plate, and the light is emitted upward from the bottom. After passing through the diffuser plate and the prism sheet, a uniform surface light source is formed. This design has the advantages of higher brightness and better light uniformity compared with the side-entry type, but it also brings the problem of lamp bead spacing differences during the production and testing processes.

[0003] When designing different models of direct-lit backlight modules, the arrangement density and spacing of LED lamp beads are optimized according to different screen sizes, resolutions, and optical performances. This results in significant differences in the lamp bead spacing of each module. For example, large-size displays usually use wider lamp bead spacing to reduce light and heat accumulation and optimize heat dissipation, while high-resolution small-size displays use denser lamp bead arrays to improve brightness and picture fineness.

[0004] This lamp bead spacing difference not only affects the optical performance of the backlight module but also poses higher requirements for power-on testing. Traditional fixed probes or manual alignment methods are difficult to adapt to this diverse spacing change. It is often necessary to frequently adjust the probe position, which is not only inefficient but also easily causes wear and poor contact of the LED electrodes, affecting the accuracy and consistency of the test. Summary of the Invention

[0005] In view of the deficiencies of the prior art, the present invention provides a lightweight backlight module power-on testing device, aiming to alleviate the above problems to at least a certain extent.

[0006] The above technical objectives of the present invention are achieved through the following technical solutions:

[0007] A lightweight backlight module power-on testing device includes a test frame. A bracket is provided at the top of the test frame, and a sensor is provided on the bracket. An energization guide rail is provided inside the test frame. A positioning component for positioning the module is provided on the test frame. A test component is provided between the test frame and the energization guide rail. The test component is used to drive the energization guide rail to adjust its position in different test states and automatically cycle between two modes;

[0008] In the horizontal lifting mode, the test component drives the energization guide rail to move horizontally and perform vertical fine-tuning. After it contacts the pins of the LED lamp beads and stays for a preset time, it then switches to the next mode;

[0009] In the vertical descent mode, the test component drives the energized guide rail to move downward, and after leaving the lamp bead pin, it returns to the initial horizontal position to enter the next round of position adjustment.

[0010] Preferably, the positioning component includes a supporting bracket connected within the test frame. A cylinder a is connected to the side wall of the test frame. The telescopic shaft of the cylinder a extends into the test frame and is connected to a positioning block. A rubber pad is provided on one side of the positioning block close to the backlight module frame.

[0011] Preferably, a test cross bar is provided within the test frame. The energized guide rail is connected to the test cross bar. A positioning rod is connected within the test frame. A support bar a that is slidably connected to the positioning rod is provided at the bottom of the test cross bar. A folding rod fixed to the support bar a is connected to the bottom of the bracket.

[0012] Preferably, the test component includes a lead screw a rotatably connected to the test frame. A support bar b is slidably connected to the bottom of the test cross bar. The support bar a and the support bar b are both arranged along the vertical direction of the test cross bar and are slidably connected to the test cross bar, and a spring a is connected between them and the test cross bar. The support bar b is in threaded cooperation with the lead screw a, and the lead screw a is a reciprocating lead screw.

[0013] Preferably, the test component further includes a gear connected to the lead screw a. A ratchet mechanism is provided between the gear and the lead screw a. An avoidance opening is formed on the folding rod. A connecting rod is connected to the side wall of the test cross bar. A connecting opening is formed on the side wall of the test frame. The connecting rod passes through the avoidance opening and extends into the connecting opening. A lifting frame is slidably connected within the connecting opening. A rack adapted to the gear is connected to the lifting frame, and the lifting frame is located at the bottom of the connecting rod.

[0014] Preferably, a positioning frame is slidably connected to the top of the test cross bar. A spring b is connected between the positioning frame and the test cross bar. A connecting ring is fixed to the outer wall of the lead screw a. A clamping bar is slidably connected to the connecting ring. A spring c is connected between the clamping bar and the connecting ring. A plurality of card slots adapted to the clamping bar are formed on the inner wall of the ratchet structure in the ratchet mechanism.

[0015] Preferably, a lead screw b is rotatably connected to the bracket. An installation table is slidably connected to the bracket. The sensor is connected to the installation table, and the installation table is in threaded cooperation with the lead screw b.

[0016] Preferably, when the test component executes Mode I, it can synchronously push the sensor to move along the direction of the bracket, and when it executes Mode II, it can reset the sensor to the initial position;

[0017] A guiding tube is rotatably connected to the folding rod. A spiral guiding opening is formed in the outer wall of the guiding tube. A limiting rod is connected to the folding rod. A guiding rod inserted into the spiral guiding opening is slidably connected to the limiting rod. A spring d is connected between the guiding rod and the limiting rod. A connecting rod is rotatably connected to the connecting rod. The other end of the connecting rod is rotatably connected to the guiding rod. A chain mechanism is connected between the guiding tube and the lead screw b.

[0018] Preferably, a roller shaft is rotatably connected to the connecting rod.

[0019] Preferably, a cylinder b is connected to the test frame. The telescopic shaft of the cylinder b extends into the connection opening and is connected to the lifting frame.

[0020] In summary, the present invention mainly has the following beneficial effects:

[0021] In this application, by setting an energized track with a rail groove structure and cooperating with a horizontal lifting mode, rapid identification and high-precision insertion of the pins of LED lamp beads in different columns are achieved. During the horizontal movement of the energized track in this application, the actual position of the lamp bead pins can be detected in real time, and it will automatically stop when the rail groove is horizontally aligned with them, and only continue to perform the vertical insertion action. This method avoids unnecessary lateral sliding of the rail near the pins, significantly reduces the alignment deviation caused by the difference in lamp bead spacing, and effectively improves the insertion accuracy and the stability of electrical connection. The adaptive positioning mechanism enables this application to be independent of a fixed probe spacing and can automatically match the layout characteristics of different modules, thereby endowing the testing equipment with higher versatility and environmental adaptability, especially suitable for the testing scenarios of multi-specification backlight modules with different lamp bead arrangement densities and large spacing spans.

[0022] In addition, in the temperature detection link, the "power-on then power-off and then detect" strategy adopted in this application further improves the resolution ability of fault identification. Compared with the traditional method of directly measuring the temperature in the continuous power-on state of the LED, the traditional scheme is prone to the surface temperature of each lamp bead tending to be the same due to the overall heat accumulation, thus masking individual lamp beads with heat dissipation structure defects, poor soldering or abnormal packaging, and it is difficult to reflect internal problems through the surface temperature difference, resulting in a high misjudgment rate. In contrast, after the lamp beads are powered on in this application, the temperature of the just-powered-off lamp beads is immediately collected by the sensor in sequence, and the temperature decay curve during the natural cooling process of the LED is used as the judgment basis. Due to different heat dissipation performances, defective lamp beads will show characteristics such as slow cooling rate, abnormal curve or formation of a temperature platform during the cooling process, enabling the sensor to more accurately distinguish normal lamp beads from faulty lamp beads and improving the sensitivity and reliability of the detection results.

[0023] Through the above optimization settings, the present application not only improves the electrical contact accuracy in the power-on test of LED lamp beads, but also breaks through the limitations of traditional methods in the temperature detection aspect, enhances the device's response ability to minute abnormalities, and improves the adaptability of the backlight module to multiple models and the stability and quality control ability of the full-process automated test. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 is a schematic diagram of the overall structure of the present invention;

[0025] Figure 2 is a schematic diagram of the overall structure of the present invention after hiding the test frame;

[0026] Figure 3 is a schematic diagram of the test bar structure of the present invention;

[0027] Figure 4 is another schematic diagram of the test bar structure of the present invention;

[0028] Figure 5 is a sectional schematic diagram of the test bar structure of the present invention;

[0029] Figure 6 is a schematic diagram of the gear and rack structure of the present invention;

[0030] Figure 7 is a sectional schematic diagram of the gear structure of the present invention;

[0031] Figure 8 is Figure 7 a partially enlarged schematic diagram of the structure at position a in

[0032] Figure 9 is a schematic diagram of the folding rod structure of the present invention;

[0033] Figure 10 is a schematic diagram of the guide tube structure of the present invention;

[0034] Figure 11 is a schematic diagram of the sensor structure of the present invention.

[0035] Reference Signs:

[0036] 100, test frame; 101, bracket; 102, sensor; 103, power-on guide rail;

[0037] 200, carrier; 201, cylinder a; 202, positioning block; 203, rubber pad; 204, test bar; 205, positioning rod; 206, bar a; 207, folding rod;

[0038] 300, lead screw a; 301, support bar b; 302, spring a; 303, gear; 304, ratchet mechanism; 305, avoidance opening; 306, connecting rod; 307, connection opening; 308, lifting frame; 309, rack; 310, roller shaft; 311, cylinder b;

[0039] 400, positioning frame; 401, spring b; 402, connection ring; 403, clamping bar; 404, spring c; 405, clamping groove;

[0040] 500, lead screw b; 501, mounting table; 502, guide tube; 503, spiral guide opening; 504, limiting rod; 505, guide rod; 506, spring d; 507, connecting rod; 508, chain mechanism. Detailed implementation manner

[0041] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0042] Reference Figures 1 - 11 , a lightweight backlight module power-on test device, including a test frame 100. A bracket 101 is provided at the top of the test frame 100. A sensor 102 is provided on the bracket 101. The sensor 102 can slide along the direction of the bracket 101 at the bottom of the bracket 101. A power-on guide rail 103 is provided inside the test frame 100. The guide rail groove on the power-on guide rail 103 is adapted to the pins of the LED lamp beads. A positioning component for positioning the backlight module frame is provided on the test frame 100. A test component is provided between the test frame 100 and the power-on guide rail 103. A test component for adjusting the position of the power-on guide rail 103 is provided between the test frame 100 and the power-on guide rail 103. The test component is used to drive the power-on guide rail 103 to adjust its position in different test states and automatically cycle between two modes;

[0043] Mode 1 is the horizontal lifting mode. In the horizontal lifting mode, the test component drives the power-on guide rail 103 to move horizontally and synchronously performs fine height adjustment, so that the power-on guide rail 103 gradually approaches and contacts the pins of the LED lamp beads. After alignment, it stops horizontal movement and stays for a preset time, and then enters the next mode;

[0044] Mode 2 is the vertical descent mode. In the vertical descent mode, the test component drives the power-on guide rail 103 to descend vertically, so that the guide rail leaves the lamp bead pins. After returning to the initial horizontal height, it starts the next round of position adjustment;

[0045] Among them, when the test component executes the horizontal lifting mode, it can synchronously push the sensor 102 to move along the direction of the bracket 101. When performing the vertical descending mode, it can reset the sensor 102 to the initial position;

[0046] With the above settings, at the beginning of the test, first place the LED backlight module to be tested in the test frame 100, with the light-emitting end of the LED lamp beads facing up and the pin ends of the lamp beads facing the power-on track direction, and position the frame of the backlight module by the set positioning component to ensure that the module will not shift during the test. The power-on track is used to simultaneously power on a row of LED lamp beads during the test. Its structure is made of a highly conductive metal strip, and the upper surface of the conductive metal strip is provided with grooves adapted to the lamp bead pins, which can form a reliable electrical connection after contact.

[0047] After positioning, the operator adjusts the position of the power-on track through the test component to ensure that the guide rail groove can accurately dock with the pins of the LED lamp beads. The test component first drives the power-on track into the horizontal lifting mode, makes it move horizontally, and drives the bracket 101 to move synchronously (meanwhile, the sensor 102 on the bracket 101 moves along the bracket 101 to prepare for the subsequent homing movement detection), ensuring that the guide rail groove is accurately aligned with the first row of lamp beads. During this process, the movement trajectory of the track is an inclined upward trajectory, that is, it moves and lifts at the same time. When the guide rail groove is horizontally aligned with the pins of the first row of lamp beads, the horizontal movement automatically stops, and only the vertical lifting action continues until the guide rail groove is completely inserted into the lamp bead pins to complete the power-on.

[0048] Subsequently, the test component remains in the powered-on state for a period of time, and starts the vertical descending mode after stable power-on. The guide rail descends vertically and gradually disengages from the lamp bead pins to disconnect the electrical connection. At the same time, the sensor 102 starts the homing movement, passes above each lamp bead in this row that has just been powered off in turn, and collects the surface temperature of each lamp bead, recording the data curve of the temperature change over time.

[0049] The above process continues to cycle until the entire module is tested. After the test is completed, cancel the positioning of the backlight module frame by the positioning component and take out the backlight module. Let the power-on track return to its original position and wait for the next power-on test.

[0050] This application realizes the rapid identification and high-precision insertion of the pins of LED lamp beads in different columns by setting an energized track with a guide rail groove structure and cooperating with a horizontal lifting mode. Most traditional testing equipment uses fixed spacing or manual alignment methods, which are difficult to adapt to the differences in lamp bead spacing caused by different screen sizes, brightness requirements, or design structures in different backlight modules. For example, large-sized modules often use sparse arrangements to enhance heat dissipation, while small-sized or high-brightness modules tend to be densely arranged. Such structural differences can easily lead to insertion misalignment or poor pin contact during the testing process, affecting the reliability of the test.

[0051] To address the above problems, during the horizontal movement of the energized track in this application, the actual position of the lamp bead pins can be detected in real time, and it will automatically stop when the guide rail groove is horizontally aligned with them, and only continue to perform the vertical insertion action. This method avoids unnecessary lateral sliding of the guide rail near the pins, significantly reduces the alignment deviation caused by the difference in lamp bead spacing, and effectively improves the insertion accuracy and the stability of electrical connection. The adaptive positioning mechanism enables this application to not rely on a fixed probe spacing and can automatically match the arrangement characteristics of different modules, thus endowing the testing equipment with higher versatility and environmental adaptability, especially suitable for the testing scenarios of multi-specification backlight modules with different lamp bead arrangement densities and large spacing spans.

[0052] In addition, in the temperature detection link, the "energize then power off and then detect" strategy adopted in this application further improves the resolution ability of fault identification. Compared with the traditional method of directly measuring the temperature under the continuous power-on state of the LED, the traditional scheme is prone to the surface temperatures of each lamp bead tending to be the same due to the overall heat accumulation, thus masking individual lamp beads with heat dissipation structure defects, poor soldering, or abnormal packaging, and it is difficult to reflect internal problems through the surface temperature difference, resulting in a high misjudgment rate. In contrast, after the lamp beads are energized in this application, the sensor 102 immediately collects the temperature of the just-powered-off lamp beads in sequence, and uses the temperature decay curve of the LED during the natural cooling process as the judgment basis. Due to different heat dissipation performances, defective lamp beads will show characteristics such as slow cooling rate, abnormal curve, or formation of a temperature platform during the cooling process, enabling the sensor 102 to more accurately distinguish normal lamp beads from faulty lamp beads, improving the sensitivity and reliability of the detection results.

[0053] Through the above optimized design, this application not only improves the electrical contact accuracy in the power-on test of LED lamp beads, but also breaks through the limitations of traditional methods in the temperature detection aspect, improves the equipment's response ability to minor abnormalities, enhances the adaptability of the backlight module to multiple models, and the stability and quality control ability of the full-process automated test.

[0054] As a further solution of the present invention, the positioning component includes a support bracket 200 connected inside the test frame 100. A cylinder a 201 is connected to the side wall of the test frame 100. The telescopic shaft of the cylinder a 201 extends into the test frame 100 and is connected with a positioning block 202. A rubber pad 203 is provided on the side of the positioning block 202 close to the backlight module frame.

[0055] With the above arrangement, after the backlight module is placed in the test frame 100, the positioning component can drive the positioning block 202 to move inward by the cylinder a 201, so that the rubber pad 203 contacts the side surface of the frame of the backlight module, thereby reliably limiting and clamping the module, and avoiding position deviation caused by vibration or rail insertion during subsequent testing. The setting of the rubber pad 203 not only enhances the friction force and improves the clamping stability, but also buffers the impact force during the cylinder pushing process, prevents damage to the surface of the module, and ensures the accuracy and safety of the test. This structure realizes the rapid adaptation and positioning of modules of different sizes, and improves the versatility and automation level of the test system.

[0056] As a further solution of the present invention, a test cross bar 204 is provided inside the test frame 100. The power-on guide rail 103 is connected to the test cross bar 204. A positioning rod 205 is connected inside the test frame 100. A support bar a 206 slidably connected to the positioning rod 205 is provided at the bottom of the test cross bar 204. A folding rod 207 fixed to the support bar a 206 is connected to the bottom of the bracket 101.

[0057] With the above arrangement, the test cross bar 204 serves as the installation and moving platform of the power-on guide rail 103, and can drive the power-on guide rail 103 to perform compound movement in the horizontal and vertical directions inside the test frame 100, realizing the precise positioning and insertion of the LED lamp bead pins. While the power-on guide rail 103 is connected to the test cross bar 204, the bracket 101 is also connected to the test cross bar 204 through the support bar, ensuring that the bracket 101 always remains perpendicular to the power-on guide rail 103 during the horizontal movement of the power-on guide rail 103, so as to adapt to the position of the current lamp bead. To meet the functional requirements of the above-mentioned synchronous following horizontal movement of the power-on guide rail 103 and the bracket 101.

[0058] As a further solution of the present invention, the test component includes a lead screw a 300 rotatably connected to the test frame 100. A support bar b 301 is slidably connected to the bottom of the test cross bar 204. The support bar a 206 and the support bar b 301 are both arranged along the vertical direction of the test cross bar 204, are slidably connected to the test cross bar 204, and a spring a 302 is connected between them and the test cross bar 204. The support bar b 301 is in threaded cooperation with the lead screw a 300, and the lead screw a 300 is a reciprocating lead screw.

[0059] With the above settings, the strip a206 and the strip b301 are slidably engaged in the vertical direction of the test cross bar 204, and elastic support is provided by the spring a302, enabling the test cross bar 204 to move up and down in the vertical direction. The strip b301 and the lead screw a300 are in threaded engagement. Driven by the rotation of the lead screw a300, the moving stroke of the test cross bar 204 in the horizontal direction can be precisely controlled. The lead screw a300 adopts a reciprocating lead screw structure, that is, its thread trajectory has a two-way circulation characteristic in the axial direction of the screw rod. After the power-on guide rail 103 completes the test of the backlight module, by continuing to rotate in the same direction, the strip b301 can be guided by the screw thread of the lead screw and continue to move along the preset path. In the design of the reciprocating lead screw, there are thread turning points. When moving to the end of the thread in a certain direction, the lead direction of the lead screw a300 is reversed, causing the strip b301 to automatically start the return stroke in the opposite direction (such as to the left) to prepare for the next test.

[0060] As a further solution of the present invention, the test component further includes a gear 303 connected to the lead screw a300. A ratchet mechanism 304 is provided between the gear 303 and the lead screw a300. An avoidance opening 305 is formed on the folding rod 207. A connecting rod 306 is connected to the side wall of the test cross bar 204. A connecting opening 307 is formed on the side wall of the test frame 100. The connecting rod 306 passes through the avoidance opening 305 and extends into the connecting opening 307. A lifting frame 308 is slidably connected in the connecting opening 307. A rack 309 adapted to the gear 303 is connected to the lifting frame 308. The lifting frame 308 is located at the bottom of the connecting rod 306;

[0061] With the above settings, when executing Mode 1 (horizontal lifting mode), the position of the lifting frame 308 can be vertically moved upward, causing the lifting frame 308 to move upward with the connecting rod 306 at its top. The connecting rod 306 is fixed to the test cross bar 204 and can drive the test cross bar 204 to move upward. The height of the support bar a206 and the support bar b301 remains unchanged, and the test cross bar 204 slides on the support bar a206 and the support bar b301. At the same time, the provided rack 309 rises vertically under the drive of the lifting frame 308. Due to the meshing relationship between the rack 309 and the gear 303, the gear 303 can be rotated and the lead screw a300 can be rotated through the ratchet mechanism 304, causing the threaded structure on the lead screw a300 to horizontally push the support bar b301, and further driving the test cross bar 204 to move horizontally on the horizontal plane through the movement of the support bar b301. This compound action not only achieves precise alignment of the energized guide rail 103 in the horizontal direction but also ensures slow lifting of the guide rail in the vertical direction, forming a horizontal + vertical compound movement path. When the test cross bar 204 completes the plugging and positioning of the first row of lamp beads in the horizontal lifting mode and energizes the lamp beads for a preset time, the test component switches to Mode 2 (vertical descent mode). In this mode, the position of the lifting frame 308 is lowered back, and the connecting rod 306 descends synchronously with the lifting frame 308, causing the test cross bar 204 to slowly slide down under the guiding restriction of the support bar a206 and the support bar b301 and the potential energy of the spring a302, realizing the separation of the guide rail groove from the lamp bead pins and disconnecting the electrical connection. During this process, although the gear 303 rotates in the reverse direction, due to the ratchet mechanism 304 provided between the gear 303 and the lead screw a300, the gear 303 can idle on the lead screw a300 without changing the current angle of the lead screw a300. This structure ensures that the horizontal position of the lead screw a300 remains unchanged during the vertical descent, that is, the test cross bar 204 will not cause horizontal displacement due to the reverse rotation of the gear 303 during vertical reset, locking the current column position. The main purpose of this design is that when the guide rail groove is completely separated from the pins of the current row of lamp beads, the sensor 102 can remain above the current row of lamp beads in the horizontal direction and detect the surface temperature of each just-powered-off lamp bead in this row one by one, avoiding position misalignment caused by horizontal position drift during vertical descent. This structure ensures that during the return process of the sensor 102, it only passes above the current row of lamp beads one by one without accidentally shifting to the positions of other rows of lamp beads, ensuring the accuracy of the temperature data.

[0062] As a further solution of the present invention, a positioning frame 400 is slidably connected to the top of the test cross bar 204. A spring b401 is connected between the positioning frame 400 and the test cross bar 204. A connecting ring 402 is fixed to the outer wall of the lead screw a300. A clamping bar 403 is slidably connected to the connecting ring 402. A spring c404 is connected between the clamping bar 403 and the connecting ring 402. Multiple card slots 405 adapted to the clamping bar 403 are provided on the inner wall of the ratchet structure in the ratchet mechanism 304;

[0063] With the above settings, when the lifting frame 308 moves upward and executes Mode 1 (horizontal lifting mode), the rack 309 drives the gear 303 to rotate, and the gear 303 drives the ratchet structure to rotate synchronously through the pawl structure. At this time, since the clamping strip 403 and the clamping groove 405 are sleeved through the spring c404, the pre-tightening force of the spring c404 causes the clamping strip 403 to abut against the clamping groove 405, forming a certain frictional force. Using this frictional force, the lead screw a300 can rotate synchronously when the ratchet structure rotates, thereby pushing the test cross bar 204 to achieve lateral movement.

[0064] During the lateral and vertical compound movement of the test cross bar 204, when the positioning frame 400 gradually approaches the lamp bead pin, since the height of the positioning frame 400 is higher than the energized guide rail 103 on the test cross bar 204, the positioning frame 400 will contact the lamp bead pin first. At this time, the lateral movement of the positioning frame 400 will be restricted by the height of the pin, resulting in the continued movement of the test cross bar 204 in the horizontal direction being blocked.

[0065] However, in this state, the energized guide rail 103 on the test cross bar 204 may not be fully inserted into the lamp bead pin, and the test cross bar 204 still needs to continue to move upward to complete the insertion. If the lead screw a300 continues to rotate forcibly at this time, it may cause lateral pressure of the positioning frame 400 on the pin, resulting in pin bending or mechanical damage.

[0066] Therefore, a follow-up component composed of the clamping strip 403, the clamping groove 405 and the spring c404 is provided. When the positioning frame 400 contacts the lamp bead pin and the horizontal position of the test cross bar 204 is restricted, the lifting frame 308 that continues to rise will continue to push the test cross bar 204 to rise vertically through the connecting rod 306. At this time, the rotational resistance of the lead screw a300 will increase rapidly, exceeding the frictional force between the clamping strip 403 and the clamping groove 405, and the spring c404 will be compressed. The clamping strip 403 will shrink and avoid from the clamping groove 405, instantly releasing the synchronous linkage between the ratchet structure and the lead screw a300. This structural design enables the lead screw a300 to stop rotating and avoid when laterally blocked, and the test cross bar 204 can still continue to rise vertically.

[0067] This active avoidance mechanism not only ensures that the test crossbar 204 can automatically stop its lateral displacement when the positioning frame 400 touches the pins, but also further enhances the adaptability of the test device to different LED spacing. Its core principle is that when the positioning frame 400 does not encounter pins during its lateral movement, it means that the pin spacing of the current LED column is relatively large, and the test crossbar 204 can continue to move laterally to find the position of the next column of pins. At this time, since the clamping bar 403 still abuts inside the card slot 405 and the spring c404 is in a pre-compressed state, the synchronous linkage between the ratchet structure and the lead screw a300 remains normal, and the test crossbar 204 can move synchronously in the horizontal and vertical directions to achieve accurate inter-column positioning.

[0068] When the positioning frame 400 encounters pins during its horizontal movement, it means that the pin spacing of the current LED column is relatively small, or that the position of the target column has been reached. At this time, the positioning frame 400 will first touch the pins, restricting the further advancement of the test crossbar 204 in the horizontal direction, and ensuring that the power-on guide rail 103 can be accurately inserted into the pin position. Thus, it can automatically adjust the horizontal movement range of the test crossbar 204 according to the actual situation of the pin spacing, allowing a longer horizontal movement when the spacing is large, and achieving rapid position locking when the spacing is small, avoiding unnecessary excessive insertion and mechanical interference. This adaptability significantly improves the versatility and compatibility of the test device in different models of modules, reducing the need for manual adjustment and secondary calibration.

[0069] As a further solution of the present invention, a lead screw b500 is rotatably connected to the bracket 101, a mounting table 501 is slidably connected to the bracket 101, the sensor 102 is connected to the mounting table 501, and the mounting table 501 is in threaded cooperation with the lead screw b500;

[0070] With the above settings, the lead screw b500 is rotatably connected to the bracket 101 and forms a threaded fit with the mounting table 501, and can drive the mounting table 501 to slide along the direction of the bracket 101 when the lead screw b500 rotates. Since the sensor 102 is fixedly connected to the mounting table 501, the sensor 102 also moves synchronously along the direction of the bracket 101 while the lead screw b500 rotates. This can achieve the purpose of causing the sensor 102 to generate displacement when the test component executes Mode 1 or Mode 2.

[0071] As a further solution of the present invention, a guide tube 502 is rotatably connected to the folding rod 207. A spiral guide opening 503 is formed on the outer wall of the guide tube 502. A limiting rod 504 is connected to the folding rod 207. A guide rod 505 inserted into the spiral guide opening 503 is slidably connected to the limiting rod 504. A spring d506 is connected between the guide rod 505 and the limiting rod 504. A connecting rod 507 is rotatably connected to the connecting rod 306. The other end of the connecting rod 507 is rotatably connected to the guide rod 505. A chain mechanism 508 is connected between the guide tube 502 and the lead screw b500;

[0072] Through the above settings, when the test cross bar 204 executes Mode 1 (horizontal lifting mode) and Mode 2 (vertical descending mode), the linkage structure of the guide tube 502, the guide rod 505, the limiting rod 504 and the connecting rod 507 can be used to realize the synchronous movement of the sensor 102 on the bracket 101.

[0073] Specifically, when executing Mode 1, the test cross bar 204 moves upward under the drive of the lifting frame 308, driving the connecting rod 306 thereon to be lifted upward together. During this process, the upper end of the connecting rod 306 gradually touches the lower end of the connecting rod 507, forcing the connecting rod 507 to rotate. The swing of the connecting rod 507 further pushes the guide rod 505 to slide along the limiting rod 504 and transmits the force to the spiral guide opening 503. Then, under the guidance of the spiral guide opening 503, the guide tube 502 is pushed to rotate. The rotation of the guide tube 502 is transmitted to the lead screw b500 through the chain mechanism 508, driving the mounting table 501 and the sensor 102 on the bracket 101 to move along the bracket 101, providing conditions for subsequent return displacement detection.

[0074] When executing Mode 2, the test cross bar 204 starts to reset downward, and the connecting rod 306 moves downward accordingly. The spring d506 helps the guide rod 505 to return to its position, and the rotation direction of the connecting rod 507 is reversed. The guide rod 505 continues to touch the spiral guide opening 503, causing the guide tube 502 to rotate in the reverse direction, driving the lead screw b500 to rotate in the reverse direction, and pushing the sensor 102 on the mounting table 501 back to the initial position. During this process, the sensor 102 can pass by multiple lamp beads in this column, so as to achieve the purpose of collecting temperature data of all lamp beads in this column one by one. The purpose of such a setting is to ensure that the sensor 102 can collect temperature data after the lamp beads are powered off, rather than during the powered-on state. It avoids temperature data errors caused by heat accumulation or electromagnetic interference during the powered-on state, and significantly improves the accuracy of temperature detection.

[0075] As a further solution of the present invention, a roller 310 is rotatably connected to the connecting rod 306;

[0076] With the above settings, when the lifting frame 308 drives the connecting rod 306 to move upward and pushes the test cross bar 204 to rise in the vertical direction, the rotation of the lead screw a300 will drive the test cross bar 204 to move horizontally. To reduce the frictional resistance of the connecting rod 306 on the surface of the lifting frame 308, a roller 310 is added, reducing the frictional force generated due to the horizontal displacement.

[0077] As a further aspect of the present invention, a cylinder b311 is connected to the test frame 100. The telescopic shaft of the cylinder b311 extends into the connection opening 307 and is connected to the lifting frame 308.

[0078] With the above settings, the telescopic shaft of the cylinder b311 can drive the lifting frame 308 to move in the vertical direction during the process of extending or retracting, thereby achieving the purpose of providing a driving force for the movement of the lifting frame 308.

[0079] Although the embodiments of the present invention have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A lightweight backlight module power-on test device, including a test frame, a bracket is provided at the top of the test frame, and a sensor is provided on the bracket, characterized in that, An energized guide rail is provided inside the test frame. A positioning component for positioning the module is provided on the test frame. A test component is provided between the test frame and the energized guide rail. The test component is used to drive the energized guide rail to adjust its position under different test states and automatically cycle between two modes; In the horizontal lifting mode, the test component drives the energized guide rail to move horizontally and perform vertical fine-tuning. After it contacts the pins of the LED lamp beads and stays for a preset time, it then switches to the next mode; In the vertical descending mode, the test component drives the energized guide rail to move downward. After leaving the lamp bead pins, it returns to the initial horizontal position and enters the next round of position adjustment.

2. The lightweight backlight module power-on test device according to claim 1, wherein The positioning component includes a support bracket connected inside the test frame. A cylinder a is connected to the side wall of the test frame. The telescopic shaft of the cylinder a extends into the test frame and is connected to a positioning block. A rubber pad is provided on one side of the positioning block close to the backlight module frame.

3. The lightweight backlight module power-on test device according to claim 1, characterized in that, A test cross bar is provided inside the test frame. The energized guide rail is connected to the test cross bar. A positioning rod is connected inside the test frame. A support bar a that is slidably connected to the positioning rod is provided at the bottom of the test cross bar. The bottom of the bracket is connected to a folding rod fixed to the support bar a.

4. The lightweight backlight module power-on test device according to claim 3, characterized in that, The test component includes a lead screw a rotatably connected to the test frame. A support bar b is slidably connected to the bottom of the test cross bar. The support bar a and the support bar b are both arranged along the vertical direction of the test cross bar and are slidably connected to the test cross bar. A spring a is connected between them and the test cross bar. The support bar b is in threaded cooperation with the lead screw a. The lead screw a is a reciprocating lead screw.

5. The light-weight backlight module power-on test device according to claim 4, characterized in that The test component further includes a gear connected to the lead screw a. A ratchet mechanism is provided between the gear and the lead screw a. An avoidance opening is formed on the folding rod. A connecting rod is connected to the side wall of the test cross bar. A connecting opening is formed on the side wall of the test frame. The connecting rod passes through the avoidance opening and extends into the connecting opening. A lifting frame is slidably connected in the connecting opening. A rack adapted to the gear is connected to the lifting frame. The lifting frame is located at the bottom of the connecting rod.

6. The lightweight backlight module power-on test device according to claim 5, wherein, A positioning frame is slidably connected to the top of the test cross bar. A spring b is connected between the positioning frame and the test cross bar. A connecting ring is fixed to the outer wall of the lead screw a. A clamping bar is slidably connected to the connecting ring. A spring c is connected between the clamping bar and the connecting ring. A plurality of card slots adapted to the clamping bar are formed on the inner wall of the ratchet structure in the ratchet mechanism.

7. The power-on test device for a lightweight backlight module according to claim 5, characterized in that A lead screw b is rotatably connected to the bracket. An installation table is slidably connected to the bracket. The sensor is connected to the installation table. The installation table is in threaded cooperation with the lead screw b.

8. The lightweight backlight module power-on test device according to claim 7, characterized in that When the test component executes mode one, it can synchronously push the sensor to move along the direction of the bracket. When it executes mode two, it can reset the sensor to the initial position; A guiding tube is rotatably connected to the folding rod. A spiral guiding opening is formed in the outer wall of the guiding tube. A limiting rod is connected to the folding rod. A guiding rod inserted into the spiral guiding opening is slidably connected to the limiting rod. A spring d is connected between the guiding rod and the limiting rod. A connecting rod is rotatably connected to the connecting rod. The other end of the connecting rod is rotatably connected to the guiding rod. A chain mechanism is connected between the guiding tube and the lead screw b.

9. The power-on test device for a lightweight backlight module according to claim 5, characterized in that, A roller shaft is rotatably connected to the connecting rod.

10. The light-weight backlight module power-on test device according to claim 5, characterized in that A cylinder b is connected to the test frame. The telescopic shaft of the cylinder b extends into the connecting opening and is connected to the lifting frame.

Images