Automatic analysis device and abnormality diagnosis method

Abstract

The present invention makes it possible to diagnose an abnormality in a matching circuit that matches the electrical impedance of a drive circuit and an ultrasonic element. An automatic analysis device for stirring a reaction liquid (500) by irradiating the reaction liquid (500) inside a reaction container (300) with ultrasonic waves, the automatic analysis device being provided with: a piezoelectric element (25) for irradiating the reaction liquid (500) with ultrasonic waves; a power supply unit (22) that supplies power for driving the piezoelectric element (25); a matching circuit (23) that matches the impedance of the piezoelectric element (25) and the impedance of the power supply unit (22); and a diagnosis circuit (27) that measures the voltage or current on the input side of the matching circuit (23) and the voltage or current on the output side of the matching circuit (23), and diagnoses an abnormality in the matching circuit (23) on the basis of the voltage or current on the input side and the voltage or current on the output side.

Description

Technical Field

[0001] The present invention relates to an automatic analysis device and an abnormality diagnosis method, and particularly to an automatic analysis device and an abnormality diagnosis method for irradiating a specimen and a reagent in a reaction vessel with ultrasonic waves to stir the specimen and the reagent. Background Art

[0002] In a conventional automatic analysis device, in order to stir a specimen and a reagent, a method of inserting a stirring rod into a reaction vessel filled with the specimen and the reagent and rotating or reciprocating the stirring rod is used. In such an automatic analysis device, a phenomenon called carry-over contamination may occur in which the specimen or reagent adhering to the stirring rod affects the next analysis result, and thus a mechanism for cleaning the stirring rod is required.

[0003] To solve this problem, Patent Documents 1 and 2 disclose an automatic analysis device that irradiates ultrasonic waves into a specimen and a reagent in a reaction vessel to perform stirring. In the technologies of Patent Documents 1 and 2, since the specimen and the reagent are stirred by ultrasonic waves without going through a stirring rod or the like, it is not necessary to prepare a stirring mechanism for cleaning the stirring rod. Therefore, carry-over contamination caused by using a stirring rod and the introduction of cleaning water used in the mechanism can be avoided.

[0004] Prior Art Documents

[0005] Patent Documents

[0006] Patent Document 1: Japanese Patent Application Laid-Open No. 2001-013149

[0007] Patent Document 2: Japanese Patent Application Laid-Open No. 2001-188070 Summary of the Invention

[0008] Problems to be Solved by the Invention

[0009] In an ultrasonic-based stirring mechanism, the height position at which ultrasonic waves are irradiated changes according to the liquid volume in the reaction vessel. Therefore, in order to select the height at which ultrasonic waves are irradiated, an array-type ultrasonic element is sometimes used. There is a problem that the resolution of the height position at which ultrasonic waves are irradiated is restricted because there are restrictions on the area of the array-type ultrasonic element in order to match the impedance of the drive circuit with that of the ultrasonic element.

[0010] Therefore, in order to improve the impedance mismatch between the drive circuit and the ultrasonic element, a method of controlling the power transfer ratio by using a matching circuit is considered. At this time, abnormality diagnosis of the matching circuit becomes a problem for the stable operation of the device.

[0011] The present invention is accomplished to solve the above-mentioned problems, and an object thereof is to provide an automatic analysis device and an abnormality diagnosis method capable of performing an abnormality diagnosis of a matching circuit that matches the impedance between a drive circuit and an ultrasonic element.

[0012] Means for Solving the Problems

[0013] To solve the above-mentioned problems, the automatic analysis device of the present invention is an automatic analysis device that irradiates ultrasonic waves to a specimen and a reagent in a reaction vessel to stir the specimen and the reagent, and includes: an ultrasonic element that irradiates ultrasonic waves to the specimen and the reagent; a drive circuit that supplies electric energy for driving the ultrasonic element; a matching circuit that matches the impedance between the ultrasonic element and the drive circuit; and a diagnosis circuit that measures the voltage or current on the input side of the matching circuit and the voltage or current on the output side of the matching circuit, and diagnoses an abnormality of the matching circuit based on the voltage or current on the input side and the voltage or current on the output side.

[0014] In addition, the abnormality diagnosis method of the present invention is an abnormality diagnosis method for a matching circuit. The matching circuit matches the impedance between an ultrasonic element and a drive circuit. The ultrasonic element irradiates ultrasonic waves to a specimen and a reagent in a reaction vessel, and the drive circuit supplies electric energy for driving the ultrasonic element. The abnormality diagnosis method includes the following processes: measuring the voltage or current on the input side of the matching circuit; measuring the voltage or current on the output side of the matching circuit; and diagnosing an abnormality of the matching circuit based on the measured value of the voltage or current on the input side and the measured value of the voltage or current on the output side.

[0015] This specification includes the disclosure of Japanese Patent Application No. 2023-004434, which is the basis of the priority of this application.

[0016] Advantages of the Invention

[0017] According to the present invention, it is possible to perform an abnormality diagnosis of a matching circuit that matches the impedance between a drive circuit and an ultrasonic element, and stable operation of the device can be achieved.

[0018] In addition, regarding the above-mentioned problems, structures, and effects, they will be clarified by the description of the following embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram showing the overall structure of the automatic analysis device 100 of Embodiment 1.

[0020] Figure 2 It is a diagram showing the details of the stirring unit 14 of Embodiment 1.

[0021] Figure 3 It is a hardware block diagram of the diagnosis circuit 27 of Embodiment 1.

[0022] Figure 4 It is a diagram showing the relationship between the measurement results of the diagnostic circuit 27 in Embodiment 1 and the abnormal part.

[0023] Figure 5 It is a flowchart of the abnormality diagnosis performed by the diagnostic circuit 27 in Embodiment 1.

[0024] Figure 6 It is a diagram showing the measurement results of the input voltage and output voltage of the matching circuit 23 in the open - end state of Embodiment 1.

[0025] Figure 7 It is a diagram showing the measurement results of the input voltage and output voltage of the matching circuit 23 in the open - end state of Embodiment 1.

[0026] Figure 8 It is a diagram showing the measurement results of the input voltage, input current, output voltage, and output current of the matching circuit 23 in the operating state of Embodiment 1.

[0027] Figure 9 It is a diagram showing the measurement results of the output voltage and output current of the matching circuit 23 in the operating state of Embodiment 1.

[0028] Figure 10 It is a diagram showing the details of the stirring unit 14 in Embodiment 2.

[0029] Figure 11 It is a diagram showing the relationship between the measurement results of the diagnostic circuit 27 in Embodiment 2 and the abnormal part.

[0030] Figure 12 It is a flowchart of the abnormality diagnosis performed by the diagnostic circuit 27 in Embodiment 2.

[0031] Figure 13 It is a diagram showing the measurement results of the input voltage, input current, output voltage, and output current of the matching circuit 23 in the virtual load state of Embodiment 2.

[0032] Figure 14 It is a diagram showing the details of the stirring unit 14 in Embodiment 3. Detailed implementation mode

[0033] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. The embodiments are examples for explaining the present invention, and for the sake of clarity of explanation, appropriate omissions and simplifications are made. The present invention can also be implemented in various other ways. Unless otherwise specified, each component can be single or multiple.

[0034] For ease of understanding the invention, the positions, sizes, shapes, ranges, etc. of the respective components shown in the drawings sometimes do not represent the actual positions, sizes, shapes, ranges, etc. Therefore, the present invention is not necessarily limited to the positions, sizes, shapes, ranges, etc. disclosed in the drawings.

[0035] In cases where there are multiple components that are the same or have the same function, sometimes different subscripts are attached to the same reference numerals for explanation. Additionally, in cases where it is not necessary to distinguish these multiple components, sometimes the subscripts are omitted for explanation.

[0036] In the embodiments, sometimes the processing performed by executing a program is described. Here, the computer executes a program through a processor (such as a CPU, GPU), while using storage resources (such as a memory), interface devices (such as a communication port), etc., and performs the processing determined by the program. Therefore, the entity performing the processing by executing the program can also be set as the processor. Similarly, the entity performing the processing by executing the program can also be a controller, device, system, computer, node having a processor. The entity performing the processing by executing the program only needs to be an arithmetic unit, and can also include a dedicated circuit that performs a specific processing. Here, the dedicated circuit is, for example, an FPGA (Field Programmable Gate Array), an ASIC (Application Specific Integrated Circuit), a CPLD (Complex Programmable Logic Device), etc.

[0037] The program can also be installed on the computer from a program source. The program source can be, for example, a program distribution server or a computer-readable storage medium. In the case where the program source is a program distribution server, the program distribution server includes a processor and a storage resource that stores the distribution target program, and the processor of the program distribution server can also distribute the distribution target program to other computers. Additionally, in the embodiments, two or more programs can be implemented as one program, or one program can be implemented as two or more programs.

[0038] Embodiment 1

[0039] First, the automatic analysis device of Embodiment 1 will be described.

[0040] (Automatic Analysis Device 100)

[0041] Figure 1 is a schematic diagram showing the overall structure of the automatic analysis device 100 of Embodiment 1. As Figure 1As shown, the automatic analysis device 100 includes a specimen mounting unit 11, a reagent setting unit 12, a reaction unit 13, a stirring unit 14, a measurement unit 15, a cleaning unit 16, a specimen dispensing mechanism 17, and a reagent dispensing mechanism 18. The operations of each unit 11 to each unit 18 are controlled by a control unit (not shown).

[0042] The specimen 200 to be measured mounted on the specimen mounting unit 11 is sampled in an amount required for analysis by the specimen dispensing mechanism 17 and discharged to the reaction vessel 300 at the specimen discharge position P1. The reagent in the reagent setting unit 12 is sampled in an amount required for analysis by the reagent dispensing mechanism 18 and discharged to the reaction vessel 300 containing the specimen 200 to be measured at the reagent discharge position P2. The reaction vessel 300 containing the specimen 200 to be measured and the reagent is moved to the stirring position P3. At this stirring position P3, the specimen 200 to be measured and the reagent in the reaction vessel 300 are ultrasonically stirred by the ultrasonic waves irradiated from the piezoelectric element 25 (refer to Figure 2 ) of the stirring unit 14. The specimen 200 to be measured sufficiently stirred by the stirring unit 14 is subjected to component analysis in the measurement unit 15. After the component analysis is completed, the reaction vessel 300 is cleaned by the cleaning unit 16 and reused for other analyses.

[0043] (Stirring unit 14)

[0044] Figure 2 is a diagram showing the details of the stirring unit 14 of Example 1. As Figure 2 shown, the stirring unit 14 includes a stirring control unit 21, a power supply unit 22, a matching circuit 23, an electrode selector 24, a piezoelectric element 25, a plurality of electrodes 26, and a diagnostic circuit 27.

[0045] (Stirring control unit 21)

[0046] The stirring control unit 21 controls each unit of the stirring unit 14. For example, the stirring control unit 21 selects one or more electrodes 26 to which a voltage is applied according to the liquid volume of the reaction liquid 500 (specimen 200 to be measured and reagent) in the reaction vessel 300, and instructs the electrode selector 24 to turn on the selected electrodes 26. In addition, for the fault diagnosis of the power supply unit 22, the matching circuit 23, and the piezoelectric element 25, the stirring control unit 21 controls the on and off of each switch of the electrode selector 24.

[0047] (Power supply unit 22)

[0048] The power supply unit 22 is a drive circuit that supplies electric energy for driving the piezoelectric element 25. The power supply unit 22 generates a voltage to be applied to the electrodes 26 according to the signal input from the stirring control unit 21, applies the voltage to the electrodes 26 via the matching circuit 23 and the electrode selector 24, and vibrates the piezoelectric element 25. This signal is generated based on the liquid volume of the reaction liquid 500 in the reaction vessel 300 and the timing of stirring the reaction liquid 500.

[0049] (Matching circuit 23)

[0050] The matching circuit 23 matches the impedance between the power supply unit 22 and the piezoelectric element 25. The matching circuit 23 can select a transformer type that winds a signal line around a ferrite and matches the impedance with a turns ratio of once and twice, a low-pass filter type including a series coil and a parallel capacitor, a high-pass filter type including a series capacitor and a parallel coil, etc. By setting them as single units or multi-stages, the impedance between the power supply unit 22 and the piezoelectric element 25 can be matched.

[0051] (Electrodes 26, electrode selector 24)

[0052] A plurality of electrodes 26 are mounted on the piezoelectric element 25 along the height direction of the reaction vessel 300. The electrode selector 24 is a selection circuit that selects one or more electrodes 26 from the plurality of electrodes 26 provided on the piezoelectric element 25, and electrically connects the power supply unit 22 to the selected electrode 26.

[0053] (Piezoelectric element 25)

[0054] The piezoelectric element 25 is an ultrasonic element that irradiates ultrasonic waves to the reaction liquid 500 in the reaction vessel 300. When a voltage is applied from the power supply unit 22, the piezoelectric element 25 vibrates and outputs ultrasonic waves. The output ultrasonic waves irradiate the reaction liquid 500 in the reaction vessel 300 to stir the reaction liquid 500. The piezoelectric element 25 is arranged so as to face the inner wall of the thermostatic bath 13a filled with the ultrasonic propagation medium 400 and the side surface of the reaction vessel 300 along the ultrasonic propagation medium 400. The ultrasonic propagation medium 400 is, for example, constant temperature water controlled at 37°.

[0055] (Diagnostic circuit 27)

[0056] The diagnostic circuit 27 measures the voltage or current on the input side of the matching circuit 23 and the voltage or current on the output side of the matching circuit 23, and diagnoses abnormalities in the power supply unit 22, the matching circuit 23, and the piezoelectric element 25. Specifically, the diagnostic circuit 27 measures the voltage or current on the input side of the matching circuit 23 in a state where the electrode selector 24 is not connected to a load at the open end, and diagnoses an abnormality in the power supply unit 22. In addition, the diagnostic circuit 27 measures the voltage or current on the input side of the matching circuit 23 and the voltage or current on the output side of the matching circuit 23 in the open end state, and diagnoses an abnormality in the matching circuit 23. In addition, the diagnostic circuit 27 measures the voltage or current on the output side of the matching circuit 23 in the open end state and the state during the operation when the electrode selector 24 is connected to a load (piezoelectric element 25), thereby diagnosing an abnormality in the piezoelectric element 25.

[0057] The diagnostic circuit 27 can measure only the voltage on the input side of the matching circuit 23, only the current, or both the voltage and the current. Additionally, the diagnostic circuit 27 can measure only the voltage on the output side of the matching circuit 23, only the current, or both the voltage and the current.

[0058] The diagnostic circuit 27 includes a detection unit 28 having a recording unit 28a and an analysis unit 29. The detection unit 28 measures the voltage or current on the input side of the matching circuit 23 and the voltage or current on the output side of the matching circuit 23. The measured values measured by the detection unit 28 are stored in the recording unit 28a. Additionally, the detection unit 28 sends the measured values to the analysis unit 29.

[0059] The analysis unit 29 analyzes the measured values received from the detection unit 28 and determines whether there are any abnormalities in the power supply unit 22, the matching circuit 23, and the piezoelectric element 25.

[0060] Here, refer to Figure 3 to describe the hardware structure of the diagnostic circuit 27. As Figure 3 shown, the diagnostic circuit 27 has a processor 31, a main storage unit 32, an auxiliary storage unit 33, and an input / output I / F 34. The processor 31 is a CPU (Central Processing Unit), GPU (Graphics Processing Unit), DSP (Digital Signal Processor), ASIC (Application Specific Integrated Circuit), etc. I / F is an abbreviation for interface. The main storage unit 32 is a DRAM (Dynamic Random Access Memory), etc. The auxiliary storage unit 33 is a ROM (Read Only Memory), etc., and stores, for example, an abnormality diagnosis program for determining the abnormal part within the stirring unit 14. The input / output I / F 34 is an interface for inputting the voltage or current on the input side and the output side of the matching circuit 23, and an interface for communicating with the stirring control unit 21.

[0061] Figure 4 is a diagram showing the relationship between the measurement results of the diagnostic circuit 27 in the first embodiment and the abnormal part. Next, refer to Figure 4Describe the relationship between the measurement results of the diagnostic circuit 27 and the abnormal part. There are two states of the voltage or current on the input side of the matching circuit 23 and the voltage or current on the output side of the matching circuit 23, namely the state where an open end without a load is connected to the output side of the matching circuit 23 and the state during the operation of the connected load (piezoelectric element 25). The voltage and current measured by the detection unit 28 are targeted at the input side and the output side of the matching circuit 23.

[0062] (1) When the measured value of the voltage (or current) on the input side of the matching circuit 23 is normal (OK) in the open-end state and the measured value of the voltage (or current) on the input side of the matching circuit 23 is normal, the diagnostic circuit 27 determines that there is no abnormality in the power supply unit 22, the matching circuit 23, and the piezoelectric element 25.

[0063] (2) When the measured value of the voltage (or current) on the input side of the matching circuit 23 is abnormal (NG) in the open-end state, the diagnostic circuit 27 determines that there is an abnormality in the power supply unit 22.

[0064] (3) When the measured value of the voltage (or current) on the input side of the matching circuit 23 is normal and the measured value of the voltage (or current) on the input side of the matching circuit 23 is abnormal in the open-end state, the diagnostic circuit 27 determines that there is an abnormality in the matching circuit 23.

[0065] (4) When the measured value of the voltage (or current) on the output side of the matching circuit 23 is normal during the operation state, the diagnostic circuit 27 determines that there is no abnormality in the power supply unit 22, the matching circuit 23, and the piezoelectric element 25.

[0066] (5) When the measured value of the voltage (or current) on the output side of the matching circuit 23 is abnormal during the operation state, the diagnostic circuit 27 determines that there is an abnormality in the piezoelectric element 25.

[0067] (Flowchart of abnormality diagnosis)

[0068] Figure 5 It is the flowchart of the abnormality diagnosis of the first embodiment. Next, refer to Figure 5 Describe the abnormality diagnosis method of the first embodiment. Figure 5 Each step of the flowchart is processed, for example, by the processor 31 of the diagnostic circuit 27 reading and executing the abnormality diagnosis program.

[0069] In S501, in the state where an open end without a load is connected to the output side of the matching circuit 23, the diagnostic circuit 27 measures the voltage on the input side of the matching circuit 23.

[0070] In S502, the diagnostic circuit 27 compares the measured value of the voltage on the input side of the matching circuit 23 with the normal value. If the measured value of the voltage is normal compared to the normal value, it proceeds to S503; if it is abnormal, it proceeds to S511.

[0071] In S511, the diagnostic circuit 27 notifies the agitation control unit 21 of the abnormality of the power supply unit 22. Moreover, when the agitation control unit 21 is notified of the abnormality of the power supply unit 22, it displays the abnormality of the power supply unit 22 on the display unit or the like, prompting replacement of the power supply unit 22.

[0072] In S503, in a state where an open end of a load is not connected to the output side of the matching circuit 23, the diagnostic circuit 27 measures the voltage on the output side of the matching circuit 23.

[0073] In S504, the diagnostic circuit 27 compares the measured value of the voltage on the output side of the matching circuit 23 with the normal value. If the measured value of the voltage is normal compared to the normal value, it proceeds to S505; if it is abnormal, it proceeds to S512.

[0074] In S512, the diagnostic circuit 27 notifies the agitation control unit 21 of the abnormality of the matching circuit 23. Moreover, when the agitation control unit 21 is notified of the abnormality of the matching circuit 23, it displays the abnormality of the matching circuit 23 on the display unit or the like, prompting replacement of the matching circuit 23.

[0075] In S505, in a state where the piezoelectric element 25 is connected to the power supply unit 22 (the state during operation), the diagnostic circuit 27 measures the voltage and current on the input side and the output side of the matching circuit 23. In S505, the voltage and current on the input side and the output side of the matching circuit 23 are measured, but it is also possible to measure either the voltage or the current on either the input side or the output side of the matching circuit 23, or it is possible to measure either the voltage or the current on either the input side or the output side of the matching circuit 23, or it is possible to measure the voltage and current on either the input side or the output side of the matching circuit 23.

[0076] In S506, the diagnostic circuit 27 compares the measured values of the voltage and current on the input side and the output side of the matching circuit 23 with the normal values. If the measured values of the voltage and current on the input side and the output side of the matching circuit 23 are all normal compared to the normal values, this flowchart ends; if it is abnormal, it proceeds to S513.

[0077] In S513, the diagnostic circuit 27 notifies the agitation control unit 21 of the abnormality of the piezoelectric element 25. And when the agitation control unit 21 is notified of the abnormality of the piezoelectric element 25, it displays the abnormality of the piezoelectric element 25 on the display unit or the like, prompting replacement of the piezoelectric element 25.

[0078] In the determination of S502, asFigure 6 As in the time waveform of the voltage shown, when the voltage on the input side of the matching circuit 23 ( Figure 6 input voltage) is higher than the threshold value determined to be the normal state ( Figure 6 threshold value of the input voltage), (in the example of Figure 6 , when the voltage is temporarily higher than the threshold value within a predetermined time), it is determined to be in the normal state. On the other hand, as in the time waveform of the voltage shown in Figure 7 , when the voltage on the input side of the matching circuit 23 ( Figure 7 input voltage) is lower than the threshold value ( Figure 7 threshold value of the input voltage), (in the example of Figure 6 , when the voltage is always lower than the threshold value within a predetermined time), it is determined to be the abnormal state of the power supply unit 22.

[0079] In the determination of S504, as in the time waveform of the voltage shown in Figure 6 , when the voltage on the output side of the matching circuit 23 ( Figure 6 output voltage) is higher than the threshold value determined to be the normal state ( Figure 6 threshold value of the output voltage), it is determined to be in the normal state. On the other hand, as in the time waveform of the voltage shown in Figure 7 , when the voltage on the output side of the matching circuit 23 ( Figure 7 output voltage) is lower than the threshold value ( Figure 7 threshold value of the output voltage), it is determined to be the abnormal state of the matching circuit 23.

[0080] Here, an example of comparing the voltages on the input side and output side of the matching circuit 23 with the threshold value has been described, but a determination criterion other than the threshold value can also be used. For example, the magnification of the output voltage of the matching circuit 23 with respect to the input voltage can be used as a reference. A predetermined magnification (for example, 2 times) is set. As in Figure 6 shown, if the output voltage converges within the range of an appropriate magnification of the input voltage (for example, 2 times ± 10%), it is determined that the matching circuit 23 is in the normal state.

[0081] In addition, two determination criteria can also be used. For example, as in Figure 7 shown, even if the amplified output voltage converges within the range of an appropriate magnification, there is a case where the output voltage does not satisfy the threshold value ( Figure 7 threshold value of the output voltage). Therefore, the threshold value and the magnification are used in combination. Thereby, a robust abnormality diagnosis can be performed.

[0082] In the determination of S506, as in Figure 8 shown, the state of the piezoelectric element 25 is determined based on the threshold values of the voltage and current on the input side and output side of the matching circuit 23.

[0083] In addition, the phase difference between voltage and current (phase shift) can be used as a determination criterion, or a combination of a threshold value and the phase difference can be used as a determination criterion. For example, if the phase difference between voltage and current is within a certain range, it can be determined as a normal state, and if it is outside a certain range, it can be determined as an abnormal state.

[0084] In addition, by obtaining the phase difference between voltage and current, power calculation can be performed, and the calculated power can be used to quantitatively determine the power transmission state.

[0085] In addition, the effective value of voltage or current can be compared with the above-mentioned threshold value. When using the effective value, the threshold determination for sudden noise becomes a more reliable result.

[0086] Figure 9 It is the measurement result determined as an abnormal state in the determination of S506. As Figure 9 shown, the output voltage of the matching circuit 23 does not satisfy the threshold value (threshold value of the output voltage), and the phase difference between voltage and current is also 180°, so it can be determined as an abnormal state where no power is transmitted.

[0087] (Effect of Example 1)

[0088] Based on the above, in Example 1, not only can the abnormality diagnosis of the power supply unit 22 and the piezoelectric element 25 be performed, but also the abnormality diagnosis of the matching circuit 23 that matches the impedance between the power supply unit 22 and the piezoelectric element 25 can be performed. Thus, stable operation of the automatic analysis device 100 can be achieved.

[0089] In addition, in the Figure 2 structure, there is a matching circuit 23 that efficiently controls the power transmission from the power supply unit 22 to the piezoelectric element 25, and the influence of the change in impedance caused by the change in the liquid volume and viscosity of the reaction liquid 500 on the circuit system can be adjusted by making the matching circuit 23 variable. Thus, the burden on the circuit system can be reduced. Moreover, an improvement effect on the resolution of the height position of the ultrasonic wave irradiation based on the piezoelectric element 25 can be obtained.

[0090] Example 2

[0091] Next, the automatic analysis device of Example 2 will be described.

[0092] Figure 10 It is a diagram showing the details of the stirring unit 14 of the automatic analysis device of Example 2. In Example 2, the description will be centered on parts different from those in Example 1.

[0093] The stirring unit 14 of Example 2 has one or more dummy loads 30. In each of the multiple systems branched within the electrode selector 24, the electrode selector 24 assumes a state of being connected to the electrode 26, a state of being connected to the dummy load 30, and a state of being connected to neither the electrode 26 nor the dummy load 30. In Figure 10 the dummy load 30 may be a structure that applies a load to multiple systems or a structure that applies a load only to a predetermined system. The impedance of the dummy load 30 is known and has a real part and an imaginary part of the impedance. The dummy load 30 is composed of a resistor, a coil, a capacitor, etc.

[0094] Figure 11 is a diagram showing the relationship between the measurement results of the diagnostic circuit 27 of Example 2 and the abnormal part. Next, with reference to Figure 11 the relationship between the measurement results of the diagnostic circuit 27 of Example 2 and the abnormal part will be described. There are three states of the voltage and current on the input side of the matching circuit 23 and the voltage and current on the output side of the matching circuit 23, namely, a state of an open end where no load is connected to the output side of the matching circuit 23, a state of a dummy load where the dummy load 30 is connected, and a state during the operation of the piezoelectric element 25 being connected. The voltage and current measured by the detection unit 28 are targeted at the input side and the output side of the matching circuit 23.

[0095] (1) When the measured value of the voltage (or current) on the input side of the matching circuit 23 is normal in the open-end state and the measured value of the voltage (or current) on the input side of the matching circuit 23 is normal, the diagnostic circuit 27 determines that the power supply unit 22, the matching circuit 23, and the piezoelectric element 25 are all normal.

[0096] (2) When the measured value of the voltage (or current) on the input side of the matching circuit 23 is abnormal in the open-end state, the diagnostic circuit 27 determines that there is an abnormality in the power supply unit 22.

[0097] (3) When the measured values of the voltage and current on the input side of the matching circuit 23 are normal in the dummy load state and the measured values of the voltage and current on the input side of the matching circuit 23 are abnormal, the diagnostic circuit 27 determines that there is an abnormality in the matching circuit 23.

[0098] (4) When the measured value of the voltage (or current) on the output side of the matching circuit 23 is normal during the operation state, the diagnostic circuit 27 determines that the piezoelectric element 25 has no abnormality.

[0099] (5) When the measured value of the voltage (or current) on the output side of the matching circuit 23 is abnormal during the operation state, the diagnostic circuit 27 determines that there is an abnormality in the piezoelectric element 25.

[0100] (Flowchart of Abnormality Diagnosis)

[0101] Figure 12 is a flowchart of the abnormality diagnosis in Example 2. Next, refer to Figure 12 to describe the abnormality diagnosis method of Example 2. In Example 2, the content of S703 in Example 1 is changed to S1203. The processes other than S1203 are the same as those in Example 1, so their descriptions are omitted.

[0102] In S1203, the diagnostic circuit 27 measures the voltages and currents on the input side and the output side of the matching circuit 23 in a state where a virtual load 30 is connected to the output side of the matching circuit 23. Here, in the state of the virtual load, the voltages and currents on the input side and the output side of the matching circuit 23 are measured, but it is also possible to measure the voltages and currents on either the input side or the output side of the matching circuit 23, or either the voltage or the current on either the input side or the output side of the matching circuit 23.

[0103] Figure 13 is a diagram showing the measurement results of the voltages and currents when the virtual load 30 is connected in Example 3. As Figure 13 (a) shows, on the input side of the matching circuit 23, the voltage and current indicate normal values, and it can be determined that the power supply unit 22 is operating normally. On the other hand, as Figure 13 (b) shows, on the output side of the matching circuit 23, the amplitude of the voltage is insufficient, and the phase difference between the voltage and the current changes, so it can be determined that the matching circuit 23 is in an abnormal state. Moreover, the power can also be obtained by multiplying the measurement results of the phase difference between the voltage and the current, and the power transfer efficiency in the matching circuit 23 can be calculated. In addition, the impedance can also be calculated by dividing the voltage by the current. By comparing these values with the normal values, quantitative evaluation of the abnormal state and estimation of the abnormal part in the matching circuit 23 can be performed.

[0104] Based on the above, in Example 2, not only can the abnormality diagnosis of the power supply unit 22 and the piezoelectric element 25 be performed, but also the abnormality diagnosis and quantitative evaluation of the matching circuit 23 that controls the power transfer from the power supply unit 22 to the piezoelectric element 25 can be performed.

[0105] Example 3

[0106] Next, describe the automatic analysis device of Example 3.

[0107] Figure 14 is a diagram showing the details of the stirring unit 14 of the automatic analysis device of Example 3. In Example 3, the description is centered on the parts different from those in Examples 1 and 2.

[0108] In Embodiment 3, the voltage or current between the electrode selector 24 and the piezoelectric element 25 is measured, and the abnormality of the electrode selector 24 is determined by comparing it with a normal value. The detection unit 28 of the diagnostic circuit 27 measures not only the voltage or current on the input side and the output side of the matching circuit 23, but also the voltage or current on the output side of the electrode selector 24. Then, the analysis unit 29 of the diagnostic circuit 27 determines the abnormality of the electrode selector 24 based on the measured value of the voltage or current on the output side of the electrode selector 24 measured by the detection unit 28.

[0109] The timing of the abnormality diagnosis of the electrode selector 24 can be either the state of the open end or the state during operation. In the case of the state of the open end, the analysis unit 29 measures the voltages before and after the electrode selector 24, and determines normality by judging the threshold value of the amplitude value. Further, in the case of the state during operation, the analysis unit 29 measures the voltages before and after the electrode selector 24, and determines normality by judging the threshold value of the amplitude value.

[0110] As described above, according to Embodiment 3, it is possible not only to diagnose the abnormalities of the power supply unit 22, the piezoelectric element 25, and the matching circuit 23, but also to diagnose the abnormality of the electrode selector 24.

[0111] (Modification example)

[0112] The present invention is not limited to the above-described embodiments, and includes various modification examples. For example, the above-described embodiments are embodiments described in detail for easy understanding of the present invention, and are not necessarily limited to having all the structures described. Further, a part of the structure of a certain embodiment can be replaced with the structure of another embodiment, and further, the structure of another embodiment can be added to the structure of a certain embodiment. Further, with respect to a part of the structure of each embodiment, addition, deletion, and replacement of other structures can be performed.

[0113] For example, in the above-described Embodiment 1, the measured values of the input voltage and the output voltage are compared with a threshold value to determine whether the matching circuit 23 is normal or abnormal. However, the present invention is not limited thereto, and an intermediate value can also be set, and if the input voltage or the output voltage is the intermediate value, it is determined as a precursor of abnormality.

[0114] Further, it can also be configured such that the impedance of the virtual load in the above-described Embodiment 2 can be adjusted (the real part and the imaginary part of the complex impedance can be adjusted). Thereby, it is possible to measure the maximum values of the voltage, the current, and the power, and to grasp the state of the matching circuit 23 in detail.

[0115] Description of reference numerals

[0116] 100... Automatic analysis device,

[0117] 11... Specimen mounting unit,

[0118] 12… Reagent setting unit,

[0119] 13… Reaction unit,

[0120] 14… Stirring unit,

[0121] 15… Measuring unit,

[0122] 16… Cleaning unit,

[0123] 17… Specimen dispensing mechanism,

[0124] 18… Reagent dispensing mechanism,

[0125] 21… Stirring control unit,

[0126] 22… Power supply unit,

[0127] 23… Matching circuit,

[0128] 24… Electrode selector,

[0129] 25… Piezoelectric element,

[0130] 26… Electrode,

[0131] 27… Diagnostic circuit,

[0132] 28… Detection unit,

[0133] 28a… Recording unit,

[0134] 29… Analysis unit,

[0135] 30… Virtual load,

[0136] P1… Specimen discharge position,

[0137] P2… Reagent discharge position,

[0138] P3… Stirring position,

[0139] 200… Specimen to be measured,

[0140] 300… Reaction vessel,

[0141] 400… Ultrasonic propagation medium,

[0142] 500… Reaction solution.

[0143] All publications, patents, and patent applications cited in this specification are hereby incorporated by reference in their entirety into this specification.

Claims

1. An automatic analysis device that irradiates ultrasonic waves to a specimen and a reagent in a reaction vessel to stir the specimen and the reagent, characterized in that: The automatic analysis device includes: An ultrasonic element that irradiates ultrasonic waves to the specimen and the reagent; A drive circuit that supplies electric energy to drive the ultrasonic element; A matching circuit that matches the impedance between the ultrasonic element and the drive circuit; and A diagnostic circuit that measures the voltage or current on the input side of the matching circuit and the voltage or current on the output side of the matching circuit, and diagnoses an abnormality of the matching circuit based on the voltage or current on the input side and the voltage or current on the output side.

2. The automatic analysis device according to claim 1, characterized in that: In a state where the ultrasonic element is not connected to the output side of the matching circuit, the diagnostic circuit measures the voltage or current on the input side of the matching circuit and the voltage or current on the output side of the matching circuit, and diagnoses an abnormality of the matching circuit and the drive circuit based on the voltage or current on the input side and the voltage or current on the output side of the matching circuit measured in a state where the ultrasonic element is not connected. In a state where the ultrasonic element is connected to the output side of the matching circuit, the diagnostic circuit measures the voltage or current on the output side of the matching circuit, and diagnoses an abnormality of the ultrasonic element based on the voltage or current on the output side of the matching circuit measured in a state where the ultrasonic element is connected.

3. The automatic analysis device according to claim 2, characterized in that: In a state where the ultrasonic element is connected to the output side of the matching circuit, the diagnostic circuit measures the voltage and current on the output side of the matching circuit, calculates the phase difference between the measured voltage and current, and diagnoses an abnormality of the ultrasonic element based on the magnitude of the phase difference.

4. The automatic analysis device according to claim 2, characterized in that: In a state where the ultrasonic element is connected to the output side of the matching circuit, the diagnostic circuit measures the voltage and current on the output side of the matching circuit, and diagnoses an abnormality of the ultrasonic element based on the power calculated from the measured voltage and current.

5. The automatic analysis device according to claim 1, characterized in that: The automatic analysis device further includes: A virtual load that can be connected to the output side of the matching circuit; and A selection circuit that selects the load connected to the output side of the matching circuit. In a state where the ultrasonic element and the virtual load are not connected to the output side of the matching circuit, the diagnostic circuit measures the voltage or current on the input side of the matching circuit and the voltage or current on the output side of the matching circuit, and diagnoses an abnormality of the drive circuit based on the voltage or current on the input side and the voltage or current on the output side of the matching circuit measured in a state where the ultrasonic element and the virtual load are not connected to the output side of the matching circuit. With the virtual load connected to the output side of the matching circuit, the diagnostic circuit measures the voltage or current at the output side of the matching circuit, and diagnoses an abnormality of the matching circuit based on the voltage or current at the output side of the matching circuit measured with the virtual load connected to the output side of the matching circuit. With the ultrasonic element connected to the output side of the matching circuit, the diagnostic circuit measures the voltage or current at the output side of the matching circuit, and diagnoses an abnormality of the ultrasonic element based on the voltage or current at the output side of the matching circuit measured with the ultrasonic element connected to the output side of the matching circuit.

6. The automatic analysis device according to claim 5, wherein: The impedance of the virtual load has a real part and an imaginary part.

7. The automatic analysis device according to claim 5, wherein: The impedance of the virtual load can be adjusted.

8. The automatic analysis device according to claim 1, wherein: The diagnostic circuit compares the voltage or current at the input side of the matching circuit with a first threshold value, and compares the voltage or current at the output side of the matching circuit with a second threshold value, and diagnoses an abnormality of the matching circuit.

9. The automatic analysis device according to claim 1, wherein: The measured values of the voltage or current at the input side of the matching circuit and the measured values of the voltage or current at the output side of the matching circuit include effective values.

10. The automatic analysis device according to claim 1, wherein: The automatic analysis device further includes: A plurality of electrodes provided along the height direction of the reaction vessel on the ultrasonic element; and A selection circuit that selects an electrode connected to the drive circuit from the plurality of electrodes, The diagnostic circuit also measures the voltage or current at the output side of the selection circuit, and diagnoses an abnormality of the selection circuit based on the voltage or current at the output side of the selection circuit.

11. An abnormality diagnosis method for a matching circuit, the matching circuit matching the impedance between an ultrasonic element and a drive circuit, the ultrasonic element irradiating ultrasonic waves to a specimen and a reagent in a reaction vessel, and the drive circuit supplying electric energy for driving the ultrasonic element, characterized in that: The abnormality diagnosis method has the following processes: Measuring the voltage or current at the input side of the matching circuit; Measuring the voltage or current at the output side of the matching circuit; and Diagnosing an abnormality of the matching circuit based on the measured values of the voltage or current at the input side and the measured values of the voltage or current at the output side.

Images