Hard disk interface test system and test tool plate for hard disk interface
Through the multi-interface extension design of the hard disk interface test system, the problem of low manual plug-in and unplugging efficiency in the U.2 interface and NVMe and SAS hard disk communication link test is solved, and the simultaneous testing of multiple hard disk types is realized, improving the testing efficiency and accuracy.
Patent Information
- Application Number
- CN202510559660.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-29
- Publication Date
- 2025-07-29
AI Technical Summary
In the prior art, the communication link test between the U.2 interface and NVMe and SAS hard disk requires manual plug-in and unplugging, resulting in inefficient testing.
Design a hard disk interface test system, which can achieve the expansion of the hard disk interface through multiple hard disk sub-interfaces on the test tool board, supports simultaneous connection of multiple hard disk types, and reduces manual plug-in and unplugging operations.
It improves testing efficiency, saves manpower, and realizes that multiple hard disk types of communication links can be completed in one test, improving the accuracy and efficiency of the test.
Smart Images
Figure CN120386679A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing technologies, and particularly to a hard disk interface testing system and a test tool board for a hard disk interface. Background Art
[0002] The U.2 interface is a common hard disk interface in servers. The U.2 interface is also known as the SFF-8639 interface. This interface supports connections with three types of hard disks, namely NVMe (Non-Volatile Memory Express), SATA (Serial Advanced Technology Attachment), and SAS (Serial Attached SCSI), simultaneously. Therefore, when conducting production testing on the U.2 interface, it is necessary to cover the testing of the communication links between the U.2 interface and NVMe, SAS, and SATA hard disks. It should be noted that since the SATA protocol used by SATA hard disks is a subset of the SAS protocol used by SAS hard disks, it is possible to only test the communication links between the U.2 interface and NVMe and SAS hard disks, which can also ensure the completeness of the U.2 interface testing.
[0003] In related technologies, during the process of testing the communication links between the U.2 interface and NVMe and SAS hard disks, it is necessary to manually plug and unplug to switch between NVMe hard disks and SAS hard disks, resulting in low testing efficiency. Summary of the Invention
[0004] Embodiments of this application provide a hard disk interface testing system and a test tool board for a hard disk interface, which can improve the testing efficiency.
[0005] According to a first aspect of the embodiments of this application, a hard disk interface testing system is provided, including: a testing device, a device under test, and a test tool board;
[0006] The testing device is electrically connected to the device under test; the device under test is electrically connected to the test tool board;
[0007] The test tool board is provided with M hard disk interfaces and N hard disk sub-interfaces; where M is a positive integer greater than or equal to 2; N is a positive integer greater than or equal to 4;
[0008] Each hard disk interface is electrically connected to K hard disk sub-interfaces; where K is a positive integer greater than or equal to 2;
[0009] The hard disk interface is electrically connected to the hard disk interface to be tested on the device under test;
[0010] The hard disk sub-interface is used for electrically connecting a hard disk; wherein, the type of the hard disk is one of all types of hard disks that can be connected by the hard disk interface to be tested; the protocol types of the hard disks connected by K hard disk sub-interfaces are different;
[0011] The test device is used to perform tests on the hard disks electrically connected to each hard disk sub-interface through the hard disk interface to be tested and the hard disk interface.
[0012] In this embodiment, the hard disk interface test system includes a test tool board. The K hard disk sub-interfaces connected to each hard disk interface on the test tool board realize the expansion of each hard disk interface. Through these K hard disk sub-interfaces, the hard disk interface can be connected to multiple types of hard disks simultaneously. In this way, when the hard disk interface is electrically connected to the hard disk interface to be tested on the board under test, it is equivalent to indirectly realizing the connection of the hard disk interface to be tested to multiple types of hard disks simultaneously. Further, when the test device performs tests, it can implement the test of the communication link between the hard disk interface to be tested and different types of hard disks supported by the hard disk interface to be tested in one test. Compared with the solutions of the related art, there is no need to manually plug and unplug the hard disk multiple times, saving manpower and improving the test efficiency.
[0013] In addition, according to the hard disk interface test system of the first aspect of the embodiments of the present application, the test tool board further includes:
[0014] A power supply interface; the power supply interface is electrically connected to an external power supply; the power supply interface is used to supply power to the hard disks electrically connected to at least one hard disk sub-interface.
[0015] Setting the power supply interface in this embodiment can meet the power supply requirements of the hard disks connected to the hard disk sub-interfaces on the test tool board and ensure the normal operation of the hard disks.
[0016] In addition, according to the hard disk interface test system of the first aspect of the embodiments of the present application, the hard disk interface test system further includes: a power supply board; the interface of the power supply board is electrically connected to the power supply interface; the power supply board is used to provide an external power supply.
[0017] In this embodiment, the power supply board is an external power supply independent of the test device, the test tool board, and the board under test. Therefore, its power supply reliability is not affected by the test device, the test tool board, and the board under test, which helps to ensure the normal operation of the hard disks powered by this power supply board.
[0018] In addition, according to the hard disk interface test system of the first aspect of the embodiments of the present application, the external power supply comes from the power supply of the test device.
[0019] In this embodiment, reusing the power supply provided by the test device without separately setting an independent external power supply outside the test device, the test tool board, and the board under test can reduce the test cost of the hard disk interface test system.
[0020] In addition, for the hard disk interface test system according to the first aspect of the embodiments of the present application, the protocol type of the hard disk interface is U.2; the protocol types of the hard disks connected to the hard disk sub-interfaces include the Non-Volatile Memory Express (NVMe) type and the Serial Attached SCSI (SAS) type.
[0021] In this embodiment, the protocol type of the hard disk interface supports U.2, and the protocol types of the hard disks connected to the hard disk sub-interfaces support the Non-Volatile Memory Express (NVMe) type and the Serial Attached SCSI (SAS) type. This helps to be compatible with the types of hard disks that can be connected by the existing hard disk interfaces, and enables the test of the hard disk interfaces to be tested in the existing DUT board.
[0022] In addition, for the hard disk interface test system according to the first aspect of the embodiments of the present application, an external power supply is used to supply power to the hard disks of the Serial Attached SCSI (SAS) type.
[0023] In this embodiment, using an external power supply to supply power to the hard disks of the Serial Attached SCSI (SAS) type helps to preferentially ensure the reliable operation of high-performance hard disks.
[0024] In addition, for the hard disk interface test system according to the first aspect of the embodiments of the present application, a test device is used to perform tests on the hard disks electrically connected to each hard disk sub-interface through the hard disk interface to be tested and the hard disk interface, including:
[0025] Controlling the hard disks connected to each hard disk sub-interface to perform read and write operations respectively through the hard disk interface to be tested and the hard disk interface;
[0026] Outputting the hardware function test result of the hard disk interface to be tested according to the results of the read and write operations and the types of the hard disks connected to each hard disk sub-interface obtained.
[0027] In this embodiment, the test device realizes the hardware function test of the hardware interface to be tested by controlling the hard disks connected to the hard disk sub-interfaces to perform read and write operations. The read and write operations can more accurately reflect the hardware functions of the hard disks. Therefore, by controlling the hard disks to perform read and write operations, it helps to improve the accuracy of the test.
[0028] In addition, for the hard disk interface test system according to the first aspect of the embodiments of the present application, controlling the hard disks connected to each hard disk sub-interface to perform read and write operations respectively through the hard disk interface to be tested and the hard disk interface includes:
[0029] Obtaining the number of hard disks connected to each hard disk sub-interface;
[0030] Starting the hard disk read and write sub-processes of the obtained number, and controlling the hard disks connected to each hard disk sub-interface to perform read and write operations in parallel through the hard disk interface to be tested and the hard disk interface.
[0031] In this embodiment, by obtaining the number of hard disks connected to the hard disk sub-interface and starting the corresponding number of hard disk read / write sub-processes to perform read / write operations on the hard disks, it is possible to effectively reduce resource waste and avoid occupying too many software and hardware resources in the test equipment.
[0032] In addition, according to the hard disk interface test system of the first aspect of the embodiments of the present application, based on the results of the read / write operations and the types of hard disks connected to each hard disk sub-interface obtained, the hardware function test results of the hard disk interface to be tested are output, including:
[0033] Obtain the read / write operation result threshold corresponding to the type;
[0034] Compare the result of the read / write operation with the read / write operation result threshold to determine the hardware function test result of the hard disk interface to be tested.
[0035] In this embodiment, setting different read / write operation thresholds for different types of hard disks for testing helps to improve the accuracy of the finally output hardware function test results.
[0036] According to the second aspect of the embodiments of the present application, a test tool board for a hard disk interface is provided, including: M hard disk interfaces and N hard disk sub-interfaces are provided on the test tool board; wherein, M is a positive integer greater than or equal to 2; N is a positive integer greater than or equal to 4;
[0037] Each hard disk interface is electrically connected to K hard disk sub-interfaces; wherein, K is a positive integer greater than or equal to 2;
[0038] The hard disk interface is electrically connected to the hard disk interface to be tested on the board under test;
[0039] The hard disk sub-interface is used to electrically connect to a hard disk; wherein, the type of the hard disk is one of all types of hard disks that the hard disk interface to be tested can connect; the protocol types of the hard disks connected by K hard disk sub-interfaces are different.
[0040] In this embodiment, the K hard disk sub-interfaces connected to each hard disk interface on the test tool board realize the expansion of each hard disk interface. Through these K hard disk sub-interfaces, it is possible to connect multiple types of hard disks to the hard disk interface at the same time. In this case, when the hard disk interface is electrically connected to the hard disk interface to be tested on the board under test, it is equivalent to indirectly realizing the connection of the hard disk interface to be tested to multiple types of hard disks at the same time. Further, when the test equipment performs a test, it is possible to test the communication link between the hard disk interface to be tested and different types of hard disks supported by the hard disk interface to be tested in one test. Compared with the solutions of the related art, there is no need to manually plug and unplug the hard disks multiple times, saving manpower and improving the test efficiency.
[0041] It is to be understood that both the foregoing general description and the following detailed description are exemplary and intended to provide further explanation of the claimed technology. BRIEF DESCRIPTION OF THE DRAWINGS
[0042] The above and other objects, features, and advantages of the present application will become more apparent by describing the embodiments of the present application in more detail in conjunction with the accompanying drawings. The accompanying drawings are used to provide a further understanding of the embodiments of the present application and constitute a part of the specification. Together with the embodiments of the present application, they are used to explain the present application and do not constitute a limitation to the present application. In the drawings, the same reference numerals generally represent the same components or steps.
[0043] Figure 1 is a schematic diagram of a test system shown in the related art.
[0044] Figure 2 is another schematic diagram of a test system shown in the related art.
[0045] Figure 3 is a schematic diagram illustrating the application of a hard disk interface test system according to an embodiment of the present application.
[0046] Figure 4 is another schematic diagram illustrating the application of a hard disk interface test system according to an embodiment of the present application.
[0047] Figure 5 is a schematic diagram illustrating the application of a hard disk powered by an external power supply for a test tool board according to an embodiment of the present application.
[0048] Figure 6 is another schematic diagram illustrating the application of a hard disk interface test system according to an embodiment of the present application.
[0049] Figure 7 is a schematic flowchart illustrating the application of a hard disk interface test method according to an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0050] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application usually described and illustrated in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but merely represents the selected embodiments of the present application. All other embodiments obtained by those skilled in the art based on the embodiments of the present application without creative efforts fall within the scope of protection of the present application.
[0051] It should be noted that similar reference numerals and letters denote similar items in the following figures. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.
[0052] The term "and / or" in this article merely describes an associated relationship, indicating that there can be three relationships. For example, A and / or B can represent three cases: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the term "at least one" in this article means any one of multiple or any combination of at least two of multiple. For example, including at least one of A, B, and C can mean including any one or more elements selected from the set composed of A, B, and C.
[0053] In the related art, the proposed solution for testing the communication link between the U.2 interface and NVMe and SAS hard disks has the problem of low test efficiency due to the need to manually plug and unplug and switch between NVMe hard disks and SAS hard disks.
[0054] The following takes Figure 1 and Figure 2 the given test system as an example to illustrate the solution for testing the U.2 interface in the related art.
[0055] There are two U.2 interfaces to be tested on the DUT board, namely the U.2-1 interface and the U.2-2 interface. Therefore, when performing interface testing, it is necessary to test the communication links between the U.2-1 interface and NVMe hard disks and SAS hard disks, and between the U.2-2 interface and NVMe hard disks and SAS hard disks respectively. During the test process, it is necessary to manually plug and unplug and switch between NVMe hard disks / SAS hard disks, and at least 2 tests are required to cover all functions of these two U.2 interfaces to be tested.
[0056] A test program is pre-deployed in the equipment server communicating with the DUT board. Taking the test order configured in the test program, which first tests the communication links between the two U.2 interfaces to be tested and NVMe hard disks, and then tests the communication links between the two U.2 interfaces to be tested and SAS hard disks, as an example, Figure 1 and Figure 2 are described.
[0057] Please refer to Figure 1 , Figure 1 is a schematic diagram of using the test system to test the communication links between the U.2-1 interface and the U.2-2 interface and NVMe hard disks. As Figure 1As shown, when conducting the test, two NVMe hard drives need to be manually inserted into the U.2-1 interface and the U.2-2 interface respectively first, and then the test program deployed in the equipment server is started to obtain the test results of the communication link between the U.2-1 interface and the NVMe hard drive, and the test results of the communication link between the U.2-2 interface and the NVMe hard drive.
[0058] After completing the test of the communication link between the two U.2 interfaces to be tested and the NVMe hard drive according to the schematic diagram shown in Figure 1 , manually remove the NVMe hard drives connected to the U.2-1 interface and the U.2-2 interface, and then insert two SAS hard drives into the U.2-1 interface and the U.2-2 interface respectively, and the schematic diagram of testing the communication link between the U.2-1 interface and the U.2-2 interface and the SAS hard drive using the test system as shown in Figure 2 can be obtained. After starting the test program deployed in the equipment server again, the test results of the communication link between the U.2-1 interface and the SAS hard drive, and the test results of the communication link between the U.2-2 interface and the SAS hard drive can be obtained.
[0059] The test program deployed in the equipment server can perform read and write operations on the hard drives connected to the U.2 interface through the two U.2 interfaces to be tested on the board to be tested. Specifically, in Figure 1 , the test program controls the NVMe hard drives connected to the U.2-1 interface and the U.2-2 interface respectively through the U.2-1 interface and the U.2-2 interface on the board to be tested to perform read and write operations, and obtains the read and write operation results of these two NVMe hard drives respectively through the U.2-1 interface and the U.2-2 interface, analyzes the read and write operation results, and obtains the test and results of the communication link between the U.2-1 interface and the U.2-2 interface and the NVMe hard drive.
[0060] Similarly, in Figure 2 , the test program controls the SAS hard drives connected to the U.2-1 interface and the U.2-2 interface respectively through the U.2-1 interface and the U.2-2 interface on the board to be tested to perform read and write operations, and obtains the read and write operation results of these two SAS hard drives respectively through the U.2-1 interface and the U.2-2 interface, analyzes the read and write operation results, and obtains the test and results of the communication link between the U.2-1 interface and the U.2-2 interface and the SAS hard drive.
[0061] To alleviate the technical problems existing in the related art, an embodiment of the present application provides a hard disk interface test system and a test tool board for a hard disk interface. The test tool board included in the hard disk interface test system is provided with M hard disk interfaces and K hard disk sub-interfaces electrically connected to each hard disk interface. The hard disk interfaces can be connected to the hard disk interfaces to be tested on the board under test. Each hard disk sub-interface is used to electrically connect a hard disk, and the type of the electrically connected hard disk is one of all types of hard disks that the hard disk interface to be tested can connect. The K hard disk sub-interfaces connected to each hard disk interface on the test tool board realize the expansion of each hard disk interface. Through these K hard disk sub-interfaces, the hard disk interface can be connected to multiple types of hard disks simultaneously. In this way, when the hard disk interface is electrically connected to the hard disk interface to be tested on the board under test, it is equivalent to indirectly realizing the connection of the hard disk interface to be tested to multiple types of hard disks simultaneously. Further, when the test device conducts a test, it can realize the test of the communication link between the hard disk interface to be tested and different types of hard disks supported by the hard disk interface to be tested in one test. Compared with the related art solutions, there is no need to manually plug and unplug the hard disk multiple times, saving manpower and improving the test efficiency.
[0062] Please refer to Figure 3 , Figure 3 which is a schematic diagram of a hard disk interface test system disclosed in an embodiment of the present application. As Figure 3 shown, the hard disk interface test system includes:
[0063] a test device 31, a board under test 32, and a test tool board 33;
[0064] The test device 31 and the board under test 32 are electrically connected; the board under test 32 and the test tool board 33 are electrically connected;
[0065] The test tool board 33 is provided with M hard disk interfaces and N hard disk sub-interfaces; where M is a positive integer greater than or equal to 2; N is a positive integer greater than or equal to 4;
[0066] Each hard disk interface is electrically connected to K hard disk sub-interfaces; where K is a positive integer greater than or equal to 2;
[0067] The hard disk interfaces are electrically connected to the hard disk interfaces to be tested on the board under test 32;
[0068] The hard disk sub-interfaces are used to electrically connect hard disks; where the type of the hard disk is one of all types of hard disks that the hard disk interface to be tested can connect; the protocol types of the hard disks connected by the K hard disk sub-interfaces are different;
[0069] The test device 31 is used to execute tests on the hard disks electrically connected to the hard disk sub-interfaces through the hard disk interfaces to be tested and the hard disk interfaces.
[0070] In this embodiment, the number of hard disk interfaces on the test tool board is greater than or equal to the number of hard disk interfaces to be tested on the board under test. When the number of hard disk interfaces on the test tool board is the same as the number of hard disk interfaces to be tested on the board under test, the hard disk interfaces on the test tool board are electrically connected to the hard disk interfaces to be tested on the board under test in a one-to-one correspondence.
[0071] In this embodiment, each hard disk interface on the test tool board is connected to K hard disk sub-interfaces. Therefore, the number of hard disk interfaces is greater than the number of hard disk sub-interfaces. The number of hard disk interfaces is expanded through the hard disk sub-interfaces, which helps to realize the test of different types of hard disks connected electrically at the same time.
[0072] In this embodiment, the protocol types of the hard disks connected to each hard disk sub-interface include, but are not limited to, the Non-Volatile Memory Express (NVMe) type and the Serial Attached SCSI (SAS) type, etc.
[0073] In this embodiment, each of the M hard disk interfaces is connected to K hard disk sub-interfaces, and there is no intersection between the hard disk sub-interfaces connected to different hard disk interfaces. The hard disk interfaces to be tested connected to different hard disk interfaces can be interfaces on the same board under test or interfaces on different boards under test.
[0074] In this embodiment, the hard disk interface is electrically connected to the hard disk interface to be tested on the board under test by, but not limited to, physical cables or plugging and unplugging.
[0075] In some embodiments, in order to improve the anti-interference ability of the signal and maintain the integrity of the signal, differential signals are used for data transmission between the hard disk interface and the hard disk sub-interface in the test tool board. Differential signals refer to using two wires (usually called the positive wire (+) and the negative wire (-)) to transmit a signal.
[0076] In some embodiments, the hard disk interface in the test tool board is a U.2 interface, that is, the protocol type of the hard disk interface is U.2. The hard disk sub-interface connected to the U.2 interface can be a SAS interface. When realizing the connection between the U.2 interface and the SAS interface, the U.2 interface includes multiple groups of first differential transmission pins, and each group of first differential transmission pins includes a first positive differential pin and a first negative differential pin. The SAS interface includes a first transmission pin group corresponding to each group of first differential transmission pins, and the first transmission pin group includes a first positive differential pin and a first negative differential pin; the first positive differential pin is connected to the first positive differential pin for transmitting signals of the serial interface communication type; the first negative differential pin is connected to the first negative differential pin for receiving signals of the serial interface communication type.
[0077] In some embodiments, the hard disk interface in the test tool board is a U.2 interface, and the hard disk sub-interface connected to the U.2 interface can be an NVMe interface. When implementing the connection between the U.2 interface and the NVMe interface, the hard disk interface includes multiple groups of second differential transmission pins, and each group of second differential transmission pins includes a second positive differential pin and a first negative differential pin; the second hard disk sub-interface includes a second transmission pin group corresponding to each group of second differential transmission pins, and the second transmission pin group includes a second positive differential pin and a second negative differential pin; the second positive differential pins are connected to each other for transmitting signals of the non-volatile memory express type; the second negative differential pins are connected to each other for receiving signals of the non-volatile memory express type.
[0078] In some embodiments, a test program is deployed in the test device, and starting the test program can perform tests on the hard disks electrically connected to each hard disk sub-interface. In applications, the test device includes, but is not limited to, a server.
[0079] In the hard disk interface test system provided in this embodiment, an M hard disk interface and K hard disk sub-interfaces electrically connected to each hard disk interface are provided on the test tool board. The hard disk interface can be connected to the hard disk interface to be tested on the board to be tested. Each hard disk sub-interface is used to electrically connect a hard disk, and the type of the electrically connected hard disk is one of all types of hard disks that the hard disk interface to be tested can connect. The K hard disk sub-interfaces connected to each hard disk interface on the test tool board realize the expansion of each hard disk interface. Through these K hard disk sub-interfaces, the hard disk interface is connected to multiple types of hard disks at the same time. In this way, when the hard disk interface is electrically connected to the hard disk interface to be tested on the board to be tested, it is equivalent to indirectly realizing the connection of the hard disk interface to be tested to multiple types of hard disks at the same time. Further, when the test device performs tests, it can implement the test of the communication link between the hard disk interface to be tested and different types of hard disks supported by the hard disk interface to be tested in one test. Compared with the solutions in the related art, it is not necessary to manually insert and remove the hard disk multiple times, saving manpower and improving the test efficiency.
[0080] As an example, a hard disk interface test system as shown in Figure 4 is given. As shown in Figure 4As shown in the figure, the hard disk interface test system includes a device under test board 41, a test tool board 42, and a test device 43. The test tool board 42 includes a U.2-1 interface, a U.2-2 interface, an NVMe1 interface, an SAS1 interface, an NVMe2 interface, and an SAS2 interface. Among them, the U.2-1 interface and the U.2-2 interface are hard disk interfaces, the NVMe1 interface and the SAS1 interface are hard disk sub-interfaces connected to the U.2-1 interface, the NVMe2 interface and the SAS2 interface are hard disk sub-interfaces connected to the U.2-2 interface. The NVMe1 interface and the NVMe2 interface are used to connect NVMe hard disks, and the SAS1 interface and the SAS2 interface are used to connect SAS hard disks.
[0081] On the device under test board 41, there are two hard disk interfaces to be tested, namely the U.2-1 interface and the U.2-2 interface. Among them, the U.2-1 hard disk interface to be tested is connected to the U.2-1 interface on the test tool board 42, and the U.2-2 hard disk interface to be tested is connected to the U.2-2 interface on the test tool board 42.
[0082] When it is necessary to test the U.2-1 interface and the U.2-2 interface on the device under test board 41, the NVMe1 interface and the NVMe2 interface are respectively connected to NVMe hard disks, and the SAS1 interface and the SAS2 interface are respectively connected to SAS hard disks. In this way, in one test, it is possible to implement the test of the communication link between the U.2-1 interface in the device under test board 41 and NVMe hard disks and SAS hard disks, and to implement the test of the communication link between the U2.2 interface in the device under test board 41 and NVMe hard disks and SAS hard disks. Compared with Figure 1 and Figure 2 in the related art shown, it is necessary to conduct two separate tests to complete the test of the communication link between the U2 interface (including the U.2-1 interface and the U.2-2 interface) and NVMe hard disks and SAS hard disks, which saves manpower and improves the test efficiency.
[0083] In some embodiments, in order to meet the power supply requirements of the hard disks connected to the hard disk sub-interfaces on the test tool board and ensure the normal operation of the hard disks, a power supply interface for connecting an external power supply can also be provided on the test tool board. Through the external power supply, the power supply interface can supply power to the hard disks electrically connected to at least one hard disk sub-interface on the test tool board.
[0084] In this embodiment, the number of power supply interfaces is related to the types of hard disks that the hard disk sub-interfaces can connect to. Taking the hard disk interface as a U.2 interface as an example, the hard disk sub-interfaces are NVMe interfaces and SAS interfaces. The NVMe interface is used to connect NVMe hard disks, and the SAS interface is used to connect SAS hard disks. Both NVMe hard disks and SAS hard disks require 12V and 3.3V power supplies. Therefore, in this case, two power supply interfaces need to be set on the test tool board, one connected to an external 12V power supply, and the other connected to an external 3.3V power supply.
[0085] In this embodiment, the hard disk sub-interface that needs to be powered by an external power supply can be specifically determined based on the performance of the hard disk connected to the hard disk sub-interface. For example, considering the instability of the external power supply, it can be set to preferentially connect the power supply interface to the hard disk sub-interface of the hard disk with low connection performance.
[0086] In some embodiments, the external power supply connected to the power supply interface can come from an external power supply board or directly from the test device. When the external power supply comes from the power supply board, the interface of the power supply board is electrically connected to the power supply interface. When the external power supply comes from the test device, the power supply interface is electrically connected to the test device.
[0087] In this embodiment, when the external power supply comes from the test device, the 12V power supply of the test device is directly used. When the external power supply comes from the power supply board, the AC power supply of the power supply board is converted into a DC power supply for use as the external power supply.
[0088] The power supply board is an external power supply independent of the test device, test tool board, and the board under test. Therefore, its power supply reliability is not affected by the test device, test tool board, and the board under test, which helps to ensure the normal operation of the hard disks powered by this power supply board. When reusing the external power supply provided by the test device, since there is no need to separately set up an independent external power supply outside the test device, test tool board, and the board under test, the test cost of the hard disk interface test system can be reduced.
[0089] In some embodiments, the external power supply is used to power hard disks of the serial attached SCSI (SAS) type interface.
[0090] In this embodiment, compared with hard disks of the non-volatile memory express (NVMe) type interface, hard disks of the serial attached SCSI (SAS) type interface are slightly inferior in both transmission speed and data access speed. Therefore, when using an external power supply, it is preferably used to power hard disks of the serial attached SCSI (SAS) type interface, while hard disks of the non-volatile memory express (NVMe) type interface are powered by the internal power supply of the hard disk interface test system. This helps to preferentially ensure the stable operation of high-performance hard disks.
[0091] As an example, please refer toFigure 5 , Figure 5 This is a schematic diagram showing the power supply to the hard disk connected to the test tool board through an external power supply as shown in this application. As Figure 5 shown, there are a total of x hard disk interfaces, namely U.2-1, U.2-2, U.2-3... U.2-x, on the test tool board, and for each hard disk interface, there is an NVMe interface and a SAS interface. Each hard disk interface is connected to the corresponding NVMe interface and SAS interface. Each NVMe interface is connected to an NVMe hard disk, and each SAS interface is connected to a SAS hard disk. Since the performance of the NVMe hard disk is higher than that of the SAS hard disk, the SAS hard disk is powered by an external power supply when set.
[0092] Continuing to refer to Figure 5 , taking the hard disk interface U.2-1 and the NVMe interface and SAS interface connected to the hard disk interface U.2-1 as an example, the connection line 1 between the hard disk interface U.2-1 and the NVMe interface represents the communication link between the hard disk interface U.2-1 and the NVMe interface, and the connection line 2 between the hard disk interface U.2-1 and the NVMe interface represents the power supply from the hard disk interface U.2-1 to the NVMe interface. The connection line 3 between the hard disk interface U.2-1 and the SAS interface represents the communication link between the hard disk interface U.2-1 and the SAS interface. At the same time Figure 5 it also shows the connection line 4 between the external power supply and the SAS interface, and the connection line 4 represents that the SAS interface is powered by the external power supply.
[0093] In some embodiments, when the test device performs tests on the hard disks connected to each hard disk sub-interface, it controls the hard disks connected to each hard disk sub-interface to perform read and write operations respectively through the hard disk interface to be tested and the hard disk interface, and outputs the hardware function test results of the hard disk interface to be tested according to the results of the read and write operations and the types of the hard disks connected to each hard disk sub-interface obtained.
[0094] In this embodiment, when the hard disk interface to be tested is connected to the hard disk interface and the hard disk interface is connected to each hard disk sub-interface, the test device can control the hard disks connected to each hard disk sub-interface to perform read and write operations. And the test device can also obtain the types of the hard disks connected to each hard disk sub-interface. It should be understood that the test device needs to implement the control of the hard disk for read and write operations through a hard disk driver, and which hard disk driver to call is related to the type of the hard disk to be read and written. Therefore, the type of the hard disk connected to each hard disk sub-interface can be determined according to the hard disk driver called during the read and write operation process.
[0095] In this embodiment, the states of the hard disk sub-interfaces connected to hard disks and those not connected to hard disks are different. Therefore, based on the states of the hard disk sub-interfaces, it is possible to determine which interfaces are the hard disk sub-interfaces connected to hard disks. Furthermore, based on the number of these interfaces, the number of hard disks connected to the hard disk interface test board can be determined. Further, hard disk read / write sub-processes equal in number to the number of hard disks are started, and these read / write sub-processes control the hard disks connected to each hard disk sub-interface to perform read / write operations. As an example, the state of the hard disk sub-interface connected to a hard disk can be set to 0, and the state of the hard disk sub-interface not connected to a hard disk is 1. Then, by counting the number of hard disk sub-interfaces with a state of 0, the number of hard disks connected to the test board can be obtained.
[0096] In this embodiment, the criteria for evaluating the communication links between different types of hard disks and hard disk interfaces are different. Therefore, read / write operation result thresholds are pre-configured for different types of hard disks in the test device. In this way, when outputting the hardware function test results representing the situation of the communication link between the hard disk and the hard disk interface, the read / write operation result thresholds can be compared with the read / write operation results.
[0097] In an example, taking the hardware interface to be tested on the board under test and the hardware interface on the test board as both U.2 interfaces, and the test module being deployed in the equipment server communicating with the board under test as an example, the Figure 6 hard disk interface test system shown as follows is given. As Figure 6 shown, the hard disk interface test system includes:
[0098] a test device 61, a board under test 62, and a test board 63;
[0099] There are two hard disk interfaces to be tested, U.2-1 and U.2-2, on the board under test 62, and two hard disk interfaces, U.2-1 and U.2-2, on the test board 63. The hard disk sub-interfaces connected to the hard disk interface U.2-1 are NVMe1 and SAS1, and the hard disk sub-interfaces connected to the hard disk interface U.2-2 are NVMe2 and SAS2. NVMe1 and NVMe2 are respectively connected to NVMe hard disks, and SAS1 and SAS2 are respectively connected to SAS hard disks.
[0100] The test device 61 is electrically connected to the board under test 62 and communicates with the board under test 62 through a network port.
[0101] At the start of the test, the main process in the test device can enumerate the number of hard disk sub-interfaces connected to hard disks and start corresponding sub-processes based on this number to control the hard disks to perform read / write operations through the hard disk sub-interfaces. At the same time, according to the hard disk driver called, the main process can also obtain the type of the hard disk, so that the results of the hard disk read / write operations can be judged based on the type of the hard disk.
[0102] In an exemplary embodiment, taking Figure 6 the hard disk interface test system given as an example, a hard disk interface test method as shown in Figure 7 is given. Please refer to Figure 7 . This method may include the following steps:
[0103] Step 701: Insert the NVMe hard disk into the NVMe interface on the test tool board, and insert the SAS hard disk into the SAS interface on the test tool board.
[0104] Step 702: Connect the test tool board and the board under test using a physical cable, and confirm the communication between the board under test and the test equipment.
[0105] Step 703: The main process in the test equipment obtains the number and type of hard disks connected to the test tool board.
[0106] Step 704: The main process in the test equipment starts multiple hard disk read / write subprocesses equal in number to the number of hard disks.
[0107] It should be understood that these hard disk read / write subprocesses will control the hard disks connected to different hard disk sub-interfaces through the hard disk interface to perform read / write operations, obtain the results of the read / write operations, and output the results to be tested for the hardware functions according to the results of the read / write operations and the types of the obtained hard disks. Taking the example that there are N hard disks connected to the test tool board, the main process in the test equipment starts N hard disk read / write subprocesses, and each hard disk read / write subprocess controls one hard disk to perform read / write operations.
[0108] Step 705: The main process in the test equipment detects and receives the test results of each subprocess in real time.
[0109] In some embodiments, a test tool board for the hard disk interface is further provided. The test tool board is provided with M hard disk interfaces and N hard disk sub-interfaces; wherein, M is a positive integer greater than or equal to 2; N is a positive integer greater than or equal to 4;
[0110] Each hard disk interface is electrically connected to K hard disk sub-interfaces; wherein, K is a positive integer greater than or equal to 2;
[0111] The hard disk interface is electrically connected to the hard disk interface to be tested on the board under test;
[0112] The hard disk sub-interface is used to electrically connect to the hard disk; wherein, the type of the hard disk is one of all types of hard disks that can be connected to the hard disk interface to be tested; the protocol types of the hard disks connected by K hard disk sub-interfaces are different.
[0113] For other relevant descriptions of the test tool board, reference can be made to the description of the test tool board in the foregoing embodiments of the hard disk interface test system to avoid redundancy, and no further description will be given here.
[0114] The block diagrams of the devices, apparatuses, equipment, and systems involved in this application are only illustrative examples and are not intended to require or imply that they must be connected, arranged, and configured in the manner shown in the block diagrams. As those skilled in the art will recognize, these devices, apparatuses, equipment, and systems can be connected, arranged, and configured in any manner. Words such as "comprising," "including," "having," etc. are open-ended terms, meaning "including but not limited to," and can be used interchangeably with each other. The word "or" and "and" used herein refer to the phrase "and / or" and can be used interchangeably with it, unless the context clearly indicates otherwise. The phrase "such as" used herein refers to the phrase "such as but not limited to" and can be used interchangeably with it.
[0115] In addition, as used herein, the "or" used in the listing of items starting with "at least one" indicates a disjunctive listing, so that for example, the listing of "at least one of A, B, or C" means A or B or C, or AB or AC or BC, or ABC (i.e., A and B and C). Furthermore, the term "exemplary" does not mean that the examples described are preferred or better than other examples.
[0116] It should also be noted that in the systems and methods of this application, each component or each step can be decomposed and / or recombined. These decompositions and / or recombinations should be regarded as equivalent solutions of this application.
[0117] Various changes, substitutions, and alterations to the technologies described herein can be made without departing from the teachings defined by the appended claims. In addition, the scope of the claims of this application is not limited to the specific aspects of the processes, machines, manufactures, compositions of events, means, methods, and acts described above. Current or later-developed processes, machines, manufactures, compositions of events, means, methods, or acts that perform substantially the same function or achieve substantially the same result as the corresponding aspects described herein can be utilized. Thus, the appended claims include such processes, machines, manufactures, compositions of events, means, methods, or acts within their scope.
[0118] The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use this application. Various modifications to these aspects will be readily apparent to those skilled in the art, and the general principles defined herein can be applied to other aspects without departing from the scope of this application. Therefore, this application is not intended to be limited to the aspects shown herein, but rather to the broadest scope consistent with the principles and novel features disclosed herein.
[0119] The foregoing description has been presented for purposes of illustration and description. In addition, this description is not intended to limit embodiments of the present application to the forms disclosed herein. Although several example aspects and embodiments have been discussed above, those skilled in the art will recognize some of their variations, modifications, alterations, additions, and subcombinations.
Claims
1. A hard disk interface test system, characterized in that, Comprising: A test device, a board under test, and a test tool board; The test device is electrically connected to the board under test; the board under test is electrically connected to the test tool board; The test tool board is provided with M hard disk interfaces and N hard disk sub-interfaces; where M is a positive integer greater than or equal to 2; N is a positive integer greater than or equal to 4; Each of the hard disk interfaces is electrically connected to K hard disk sub-interfaces; where K is a positive integer greater than or equal to 2; The hard disk interface is electrically connected to the hard disk interface to be tested on the board under test; The hard disk sub-interface is used to electrically connect to a hard disk; where the type of the hard disk is one of all types of hard disks that can be connected to the hard disk interface to be tested; the protocol types of the hard disks connected by the K hard disk sub-interfaces are different; The test device is used to execute tests on the hard disks electrically connected to each hard disk sub-interface through the hard disk interface to be tested and the hard disk interface.
2. The hard disk interface test system according to claim 1, wherein, The test tool board further comprises: A power supply interface; the power supply interface is electrically connected to an external power supply; the power supply interface is used to supply power to the hard disks electrically connected to at least one of the hard disk sub-interfaces.
3. The hard disk interface test system according to claim 2, wherein The hard disk interface test system further comprises: a power supply board; the interface of the power supply board is electrically connected to the power supply interface; the power supply board is used to provide the external power supply.
4. The hard disk interface testing system according to claim 2, wherein: The external power supply comes from the power supply of the test device.
5. The hard disk interface test system according to any one of claims 1-4, characterized in that, The protocol type of the hard disk interface is U.2; the protocol types of the hard disks connected by the hard disk sub-interfaces include the Non-Volatile Memory Express (NVMe) type and the Serial Attached SCSI (SAS) type.
6. The hard disk interface testing system according to any one of claims 2 to 4, characterized in that: The external power supply is used to supply power to the hard disks of the Serial Attached SCSI (SAS) type.
7. The hard disk interface test system according to any one of claims 1-6, characterized in that, The test device is used to execute tests on the hard disks electrically connected to each hard disk sub-interface through the hard disk interface to be tested and the hard disk interface, including: Controlling the hard disks connected to each hard disk sub-interface to perform read and write operations respectively through the hard disk interface to be tested and the hard disk interface; Outputting the hardware function test result of the hard disk interface to be tested according to the result of the read and write operations and the types of the hard disks connected to each hard disk sub-interface obtained.
8. The hard disk interface test system according to claim 7, wherein, The controlling the hard disks connected to each hard disk sub-interface to perform read and write operations respectively through the hard disk interface to be tested and the hard disk interface includes: Obtaining the number of hard disks connected to each hard disk sub-interface; Starting the number of hard disk read and write sub-processes, and controlling the hard disks connected to each hard disk sub-interface to perform read and write operations in parallel through the hard disk interface to be tested and the hard disk interface.
9. The hard disk interface test system according to claim 8, characterized in that Outputting the hardware function test result of the hard disk interface to be tested according to the result of the read and write operations and the types of the hard disks connected to each hard disk sub-interface obtained, including: Obtaining the read and write operation result threshold corresponding to the type; Comparing the result of the read and write operations with the read and write operation result threshold to determine the hardware function test result of the hard disk interface to be tested.
10. A test tool board for a hard disk interface, characterized in that, Comprising: The test tool board is provided with M hard disk interfaces and N hard disk sub-interfaces; where M is a positive integer greater than or equal to 2; N is a positive integer greater than or equal to 4; Each of the hard disk interfaces is electrically connected to K hard disk sub-interfaces; where K is a positive integer greater than or equal to 2; The hard disk interface is electrically connected to the hard disk interface to be tested on the board under test; The hard disk sub-interface is used for electrically connecting the hard disk; wherein, the type of the hard disk is one of all types of hard disks that can be connected by the hard disk interface to be tested; the protocol types of the hard disks connected by the K hard disk sub-interfaces are different.