Flash memory particle test method and system, computer equipment and storage medium thereof

Abstract

The embodiment of the invention provides a flash memory particle test method and system, computer equipment and a storage medium thereof, the method is applied to the flash memory particle test system, and the flash memory particle test system comprises a test host, a protocol host, a test execution unit and a variable temperature box, the method comprises the steps that a test host obtains a command combination packaged by operation of a flash memory and operation of a temperature changing box, the command combination is forwarded to a test execution unit through a protocol host so that the test execution unit can execute the command combination, test data generated by the test execution unit in the process of executing the command combination are received through the protocol host, and the test data are sent to the test execution unit. Extracting feature information of the test data, and generating a general chart according to the feature information. According to the embodiment of the invention, the test efficiency is improved by packaging the operation commands of the flash memory and the variable temperature box, visual test result analysis is provided for a user by extracting the feature information of the test data and generating the general chart, and low-temperature test is realized while batch automatic test is realized.

Description

Technical Field

[0001] This application relates to the technical field of data testing, and particularly to a method and system for testing flash memory particles, a computer device, and a storage medium thereof. Background Art

[0002] In the related art, currently, an FPGA (Field Programmable Gate Array) is used as a flash memory controller, and a heating sheet or a socket with a heating function is used to achieve temperature control. However, the number of tests is insufficient. Usually, there are at most a dozen test units in the test equipment, and batch testing cannot be completed. At the same time, the test temperature is limited, and the existing test socket only has a heating function. Summary of the Invention

[0003] This application aims to solve at least one of the technical problems existing in the prior art. For this purpose, this application provides a method and system for testing flash memory particles, a computer device, and a storage medium thereof, aiming to achieve batch automated testing and low-temperature testing at the same time.

[0004] In a first aspect, an embodiment of this application provides a method for testing flash memory particles, which is applied to a flash memory particle testing system. The flash memory particle testing system includes a test host, a protocol host, a test execution unit, and a temperature-changing box. The test host is connected to the test execution unit through the protocol host. The test execution unit is used to be installed inside the temperature-changing box, and the test host is also connected to the temperature-changing box. The method includes: Obtaining a command combination encapsulated by operations of the flash memory and operations of the temperature-changing box; Forwarding the command combination to the test execution unit through the protocol host, so that the test execution unit executes the command combination; Receiving, through the protocol host, test data generated by the test execution unit during the execution of the command combination; Extracting feature information of the test data and generating a total chart according to the feature information.

[0005] According to some embodiments of this application, the method further includes: Adjusting the temperature of the temperature-changing box to obtain the real-time temperature of the temperature-changing box; When the real-time temperature is equal to a preset temperature, performing read and write operations on the flash memory and recording the test data generated by the read and write operations.

[0006] According to some embodiments of the present application, extracting the characteristic information of the test data includes: extracting the average read / write speed and latency time of the flash memory from the test data, and extracting the temperature change range and stabilization time of the temperature chamber from the test data.

[0007] According to some embodiments of the present application, generating the overall chart based on the characteristic information includes: Obtaining a performance curve graph showing the change of the read / write speed of the flash memory over time based on the average read / write speed and the latency time; Obtaining a temperature curve graph showing the change of the temperature of the temperature chamber over time based on the temperature change range and the stabilization time; Generating an overall chart based on the performance curve graph and the temperature curve graph.

[0008] In a second aspect, an embodiment of the present application provides a flash memory particle test system. Based on the method described in the first aspect, the flash memory particle test system includes: A test host; A protocol host, the test host is connected to the protocol host through a USB or network port protocol; A test execution unit, the protocol host and the test execution unit exchange data through an EMMC protocol or a UFS protocol. The test execution unit includes a main control chip and a flash memory test socket, and the main control chip is encapsulated with a protocol controller and a flash memory controller; A temperature chamber, the test host is connected to the temperature chamber through a serial port protocol.

[0009] According to some embodiments of the present application, the test host includes: An analysis data module, which is used to extract the characteristic information of the data; A display data module, which is used to display the overall chart.

[0010] According to some embodiments of the present application, the temperature adjustment range of the temperature chamber is greater than or equal to -50°C and less than or equal to 150°C.

[0011] According to some embodiments of the present application, the flash memory particle test system further includes a signal transfer board. The first end of the signal transfer board is connected to the test execution unit, and the other end of the signal transfer board is connected to the protocol host.

[0012] In a third aspect, an embodiment of the present application provides a computer device, including: At least one memory; At least one processor; At least one computer program; The at least one computer program is stored in the at least one memory, and the at least one processor executes the at least one computer program to implement the flash memory particle testing method described in the first aspect above.

[0013] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program for causing a computer to execute the flash memory particle testing method described in the first aspect above.

[0014] According to the technical solution of the embodiment of the present application, there are at least the following beneficial effects: The method of the embodiment of the present application is applied to a flash memory particle testing system, which includes a test host, a protocol host, a test execution unit, and a temperature change box. The test host is connected to the test execution unit through the protocol host. The test execution unit is used to be installed inside the temperature change box, and the test host is also connected to the temperature change box. The method includes: obtaining a command combination encapsulated by the operations of the flash memory and the temperature change box; forwarding the command combination to the test execution unit through the protocol host so that the test execution unit executes the command combination; receiving, through the protocol host, test data generated by the test execution unit during the execution of the command combination; extracting feature information of the test data and generating a total chart according to the feature information. By encapsulating the operation commands of the flash memory and the temperature change box, the embodiment of the present application improves the test efficiency. By extracting the feature information of the test data and generating a total chart, it provides an intuitive test result analysis for users, and realizes low-temperature testing while achieving batch automated testing.

[0015] The additional aspects and advantages of the present application will be partially given in the following description, partially become obvious from the following description, or be understood through the practice of the present application. Description of the Drawings

[0016] The drawings are used to provide a further understanding of the technical solution of the present application, and constitute a part of the specification. Together with the embodiments of the present application, they are used to explain the technical solution of the present application and do not constitute a limitation to the technical solution of the present application.

[0017] Figure 1 It is a flowchart of a flash memory particle testing method provided by an embodiment of the present application; Figure 2 It is a flowchart of recording test data provided by an embodiment of the present application; Figure 3 It is a flowchart of generating a total chart provided by an embodiment of the present application; Figure 4 It is a schematic diagram of a flash memory particle testing system provided by an embodiment of the present application; Figure 5 It is a connection schematic diagram of a flash memory particle testing system provided by an embodiment of the present application; Figure 6 It is a schematic diagram of the hardware structure of a computer device provided by an embodiment of the present application. Detailed implementation manners

[0018] The embodiments of the present application will be described in detail below. The examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals represent the same or similar elements or elements with the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application and should not be construed as a limitation to the present application.

[0019] In the description of the present application, it should be understood that the orientation or positional relationship indicated by terms such as up, down, front, back, left, right, etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present application.

[0020] In the description of the present application, the meaning of several is one or more, the meaning of multiple is two or more, greater than, less than, exceeding, etc. are understood as not including the number itself, and above, below, within, etc. are understood as including the number itself. If the first and second are described only for the purpose of distinguishing technical features, they should not be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or the sequence relationship of the indicated technical features.

[0021] In the description of the present application, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present application in combination with the specific content of the technical solution.

[0022] The flash memory particle testing method provided by the embodiments of the present application will be specifically described through the following embodiments. First, the flash memory particle testing method in the embodiments of the present application will be described.

[0023] The embodiments of the present application can acquire and process relevant data based on artificial intelligence technology. Among them, artificial intelligence (AI) is a theory, method, technology and application system that uses a digital computer or a machine controlled by a digital computer to simulate, extend and expand human intelligence, perceive the environment, acquire knowledge and use the knowledge to obtain the best results.

[0024] The basic technologies of artificial intelligence generally include technologies such as sensors, dedicated artificial intelligence chips, cloud computing, distributed storage, big data processing technologies, operation / interaction systems, and mechatronics. The software technologies of artificial intelligence mainly include several major directions such as computer vision technology, robotics, biometric technology, speech processing technology, natural language processing technology, and machine learning / deep learning.

[0025] The flash memory particle testing method provided by the embodiments of the present application relates to the technical field of data testing. The flash memory particle testing method provided by the embodiments of the present application can be applied to a terminal, can also be applied to a server side, or can also be software running on a terminal or a server side. In some embodiments, the terminal can be a smart phone, a tablet computer, a notebook computer, a desktop computer, etc.; the server side can be configured as an independent physical server, can also be configured as a server cluster or a distributed system composed of multiple physical servers, or can also be configured as a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communications, middleware services, domain name services, security services, CDN, and big data and artificial intelligence platforms; the software can be an application that implements the flash memory particle testing method, etc., but is not limited to the above forms.

[0026] The present application can be used in many general or special computer system environments or configurations. For example: personal computers, server computers, handheld or portable devices, tablet devices, multi-processor systems, microprocessor-based systems, set-top boxes, programmable consumer electronic devices, network PCs, minicomputers, mainframe computers, distributed computing environments including any of the above systems or devices, and so on. The present application can be described in the general context of computer-executable instructions executed by a computer, such as program modules. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform specific tasks or implement specific abstract data types. The present application can also be practiced in a distributed computing environment, where tasks are performed by remote processing devices connected through a communication network. In a distributed computing environment, program modules can be located in local and remote computer storage media including storage devices.

[0027] It should be noted that in each specific embodiment of the present application, when it comes to performing relevant processing based on data related to the user's identity or characteristics, such as user information, user behavior data, user historical data, and user location information, the user's permission or consent will be obtained first. Moreover, the collection, use, and processing of these data will comply with relevant laws, regulations, and standards. In addition, when the embodiments of the present application need to obtain the user's sensitive personal information, the user's separate permission or separate consent will be obtained through methods such as pop-up windows or redirecting to a confirmation page. After clearly obtaining the user's separate permission or separate consent, the necessary user-related data for the normal operation of the embodiments of the present application will be obtained.

[0028] Please refer to Figure 1 , Figure 1 which is a schematic flow chart of a flash memory particle test method provided by an embodiment of the present application; as Figure 1 shown, a flash memory particle test method provided by an embodiment of the present application includes, but is not limited to, steps S110 - S140. Each step will be introduced in turn below. Step S110: Obtain a command combination encapsulated by the operations of the flash memory and the temperature change box; Step S120: Forward the command combination to the test execution unit through the protocol host so that the test execution unit executes the command combination; Step S130: Receive, through the protocol host, the test data generated by the test execution unit during the execution of the command combination; Step S140: Extract the characteristic information of the test data and generate a total chart based on the characteristic information.

[0029] In one embodiment, the test host obtains a command combination encapsulated by the operations of the flash memory and the temperature change box, forwards the command combination to the test execution unit through the protocol host so that the test execution unit executes the command combination, receives, through the protocol host, the test data generated by the test execution unit during the execution of the command combination, extracts the characteristic information of the test data, and generates a total chart based on the characteristic information. By encapsulating the operation commands of the flash memory and the temperature change box in the embodiments of the present application, the test efficiency is improved. The entire test process is automatically completed by the protocol host and the test execution unit, reducing manual intervention, improving the accuracy and repeatability of the test. By extracting the characteristic information of the test data and generating a total chart, intuitive test result analysis is provided for users, and low-temperature testing is achieved while realizing batch automated testing.

[0030] It should be noted that the operations of the flash memory include read / write tests, erase operations, and endurance tests. The operations of the temperature chamber include temperature adjustment, humidity control, and temperature cycle tests. Temperature adjustment includes heating up and cooling down. Command combination encapsulation can encapsulate the flash memory operations and the temperature chamber operations into a command sequence. The command combination can be in the form of a script (such as a Python script), an instruction set (such as an API call), or a protocol data packet. The command combination ensures the sequentiality and dependency of the operations. For example, the temperature of the temperature chamber is adjusted first, and then the flash memory test is performed.

[0031] In one embodiment, the protocol host receives the encapsulated command combination and forwards the command combination to the test execution unit through a preset communication protocol (such as TCP / IP, serial communication, industrial bus protocol, etc.). The test execution unit sends the generated test data back to the data processing module through the protocol host. The protocol host is responsible for receiving and forwarding these data to ensure the integrity and accuracy of the data.

[0032] Please refer to Figure 2 , Figure 2 which is a schematic flow diagram of recording test data provided by an embodiment of the present application; as Figure 2 shown, a flash memory particle test method provided by an embodiment of the present application includes, but is not limited to, steps S210 - S220. Each step will be introduced in turn below. Step S210: Adjust the temperature of the temperature chamber to obtain the real-time temperature of the temperature chamber; Step S220: When the real-time temperature is equal to the preset temperature, perform read / write operations on the flash memory and record the test data generated by the read / write operations.

[0033] In one embodiment, a high-precision temperature sensor is installed inside the temperature chamber to monitor the temperature inside the chamber in real time. The temperature inside the temperature chamber is adjusted through a heater or a refrigeration system. The control system automatically adjusts the heating or cooling power according to the feedback of the temperature sensor to reach the preset temperature. When the temperature is lower than the preset value, the heater starts; when the temperature is higher than the preset value, the refrigeration system starts. The temperature sensor collects temperature data at a fixed frequency (such as once per second) and sends the data to the test system. Before the test starts, the temperature sensor is calibrated to ensure its measurement accuracy. The test system receives the temperature data in real time and displays the current temperature value on the interface for the operator to view. After the real-time temperature of the temperature chamber reaches the preset temperature, the system will continuously monitor the temperature fluctuation to ensure the reliability of the test environment. When the temperature cannot reach a stable state within the specified time, the system will issue an alarm and prompt the operator to check the performance of the temperature chamber.

[0034] In one embodiment, the read and write operations on the flash memory are started only when the real-time temperature of the temperature-changing box reaches the preset temperature and remains stable. The test system determines whether the triggering condition is met by monitoring the temperature data in real time. When the condition is met, the read and write test of the flash memory is automatically started. The read and write operations on the flash memory include reading the pre-stored data from the flash memory to test indexes such as the read speed and error rate, and writing data to the flash memory to test performance indexes such as the write speed and latency.

[0035] In one embodiment, according to the test requirements, the data volume of the read and write operations is set. The size of the data volume can be 1GB or 10GB, and the size of the data volume can be adjusted according to the actual situation. For the read and write modes, there are two modes: sequential read and write and random read and write, so as to evaluate the performance of the flash memory under different usage scenarios. During the test, the system displays key indexes such as the read and write speeds and latency in real time, which is convenient for the operator to monitor the test progress. When an abnormality occurs during the test, such as the read and write speed being lower than expected or the error rate being too high, the system will automatically pause the test and prompt the operator to check.

[0036] In addition, it can be understood that regarding the type of the temperature sensor, it can be a capacitive temperature sensor, a resistive temperature sensor, a semiconductor temperature sensor, or other types of temperature sensors. The specific type of the temperature sensor is not limited in the embodiments of the present application.

[0037] In one embodiment, extracting the characteristic information of the test data includes extracting the average read and write speed and latency of the flash memory from the test data, and extracting the temperature change range and stable time of the temperature-changing box from the test data.

[0038] In one embodiment, during the flash memory test, the read and write speeds are recorded in the form of a time series. For example, the current read and write speeds (unit: MB / s or GB / s) are recorded once per second. For the read operation, all the recorded read speed values are added up and then divided by the total number of records to obtain the average read speed; for the write operation, all the recorded write speed values are added up and then divided by the total number of records to obtain the average write speed; the latency is the time interval from initiating the read and write operation to the completion of the operation, and is recorded in milliseconds (ms).

[0039] In one embodiment, the temperature sensor of the temperature-changing box will record the temperature change in real time and store it in the form of a time series. The highest temperature and the lowest temperature are found from the temperature data, and the temperature change range is the difference between the highest temperature and the lowest temperature; the stable time is the time point when the temperature first enters the stable range from the temperature data, and the time interval from the start of temperature adjustment to temperature stability is calculated. The stable time reflects the adjustment speed and stability of the temperature-changing box. A shorter stable time means that the temperature-changing box can reach the test conditions faster and improve the test efficiency.

[0040] Please refer to Figure 3 , Figure 3 which is a schematic flowchart of generating a total chart provided by an embodiment of the present application; as Figure 3 shown, a flash memory particle testing method provided by an embodiment of the present application includes, but is not limited to, steps S310 - S330, and each step will be introduced in turn below.

[0041] Step S310: Obtain a performance curve graph showing the change of the read - write speed of the flash memory over time based on the average read - write speed and the latency time; Step S320: Obtain a temperature curve graph showing the change of the temperature of the temperature - varying chamber over time based on the temperature change range and the stabilization time; Step S330: Generate a total chart based on the performance curve graph and the temperature curve graph.

[0042] In one embodiment, record the speed values (unit: MB / s) of each read - write operation, record the latency values (unit: ms) of each operation, calculate the average read - write speed and the latency time at each time point, and use a data visualization tool to draw the performance curve graph. The horizontal axis is time (time points during the test process); the vertical axis is the read - write speed (MB / s) and the latency time (ms); the curves are the curves showing the change of the read speed, write speed, and latency time over time.

[0043] In one embodiment, extract temperature data from the records of the temperature sensor of the temperature - varying chamber, determine the temperature change range, which is the difference between the highest temperature and the lowest temperature, calculate the temperature stabilization time, which is the time when the temperature enters the stable range and remains stable, and use a data visualization tool to draw the temperature curve graph. The horizontal axis is time (time points during the test process); the vertical axis is temperature (°C); the curve is the curve showing the change of temperature over time.

[0044] In one embodiment, integrate the performance curve graph of the flash memory and the temperature curve graph of the temperature - varying chamber into the same chart, so as to visually compare the relationship between the flash memory performance and the temperature change. The horizontal axis is time (time points during the test process); the vertical axis is divided into two parts. The left side is temperature (°C), and the right side is the read - write speed (MB / s) and the latency time (ms); the curves include the temperature curve (distinguished by different colors or line types), the flash memory read - write speed curve, and the flash memory latency time curve.

[0045] Please refer to Figure 4 , Figure 4 which is a schematic diagram of a flash memory particle testing system provided by an embodiment of the present application; please refer to Figure 5 , Figure 5 which is a connection schematic diagram of a flash memory particle testing system provided by an embodiment of the present application.

[0046] In one embodiment, the flash memory particle testing system 400 includes: Test host 410; Protocol host 420, and the test host 410 is connected to the protocol host 420 through a USB or network port protocol; Test execution unit 430, the protocol host 420 and the test execution unit 430 send and receive data through an EMMC protocol or a UFS protocol. The test execution unit 430 includes a main control chip and a flash memory test socket, and the main control chip is packaged with a protocol controller and a flash memory controller; Temperature change box 440, and the test host 410 is connected to the temperature change box 440 through a serial port protocol.

[0047] In one embodiment, the test host 410 is the control center of the system, used to generate test instructions, receive test data, and perform data analysis and chart generation. The test host 410 is connected to the protocol host 420 through a USB or network port protocol to achieve the transmission of instructions and the reception of data. The protocol host 420 serves as a relay device, responsible for forwarding the instructions sent by the test host 410 to the test execution unit 430 and receiving the data returned by the test execution unit 430; the protocol host 420 supports multiple communication protocols, including the EMMC protocol and the UFS protocol, for data interaction with the test execution unit 430. The test execution unit 430 is a module that executes specific test operations, including a main control chip and a flash memory test socket; the main control chip is packaged with a protocol controller and a flash memory controller, used to control the read and write operations of the flash memory, and communicate with the protocol host 420 through the EMMC or UFS protocol; the test execution unit 430 receives the instructions forwarded by the protocol host 420, executes the read and write tests of the flash memory, and returns the test data to the protocol host 420. The temperature change box 440 is used to simulate different temperature environments to test the performance of the flash memory under different temperature conditions; the test host 410 is connected to the temperature change box 440 through a serial port protocol to control the temperature adjustment of the temperature change box 440 and receive the temperature data. It should be noted that the relationship between the test host and the protocol host is one-to-many, and the relationship between the protocol host and the test execution unit is one-to-one.

[0048] In one embodiment, the test host 410 generates test instructions, including read and write operation instructions for the flash memory and temperature adjustment instructions for the temperature chamber 440. The test host 410 sends the instructions to the protocol host 420 through the USB or network port protocol. The protocol host 420 then forwards the instructions to the test execution unit 430 through the EMMC or UFS protocol. After receiving the instructions, the main control chip in the test execution unit 430 executes the read and write operations of the flash memory through the flash memory controller. The test execution unit 430 records test data such as read and write speeds and latency times, and returns the data to the test host 410 through the protocol host 420. The test host 410 controls the temperature adjustment of the temperature chamber 440 through the serial port protocol and collects temperature data in real time. The temperature sensor of the temperature chamber 440 records the temperature changes and sends the data to the test host 410. The test host 410 receives the flash memory test data and the temperature data of the temperature chamber 440, extracts key feature information, such as the average read and write speeds and latency times of the flash memory, as well as the temperature change range and stabilization time of the temperature chamber 440. The test host 410 generates a performance curve graph and a temperature curve graph based on the extracted feature information, and integrates them to generate a total graph for intuitively showing the relationship between the flash memory performance and temperature changes. The system supports multiple communication protocols (such as EMMC, UFS, serial port protocol), can adapt to different test requirements, and realizes the full-process automation from instruction generation to data collection through the collaborative work of the protocol host 420 and the test execution unit 430. By generating the performance curve graph and the temperature curve graph, the test results are intuitively shown, which is convenient for analysis and optimization.

[0049] In one embodiment, the test host includes: An analysis data module, which is used to extract the feature information of the data; A display data module, which is used to display the total graph.

[0050] It can be understood that the original data often contains a large amount of redundant information. Feature extraction can remove irrelevant or redundant parts, reduce the data dimension, and improve the processing efficiency. By extracting key features, the internal laws of the data can be more intuitively understood, providing a clearer direction for data analysis. The analysis data module and the test control device achieve data interaction through electrical connection and feedback the extracted feature information to the control device for further processing or decision-making.

[0051] In one embodiment, the display data module is used to display the total graph, which is generated based on the performance curve graph and the temperature curve graph. The performance curve graph is a graph showing the change of the read and write speed of the flash memory over time according to the average read and write speeds and latency times, and the temperature curve graph is a graph showing the change of the temperature of the temperature chamber over time according to the temperature change range and stabilization time.

[0052] In one embodiment, the temperature adjustment range of the temperature-changing box is greater than or equal to -50°C and less than or equal to 150°C.

[0053] It can be understood that during the test, the temperature of the temperature-changing box can be adjusted to -50°C, 0°C, 50°C, 100°C, and 150°C. The embodiment of the present application can adjust the temperature within the range of greater than or equal to -50°C and less than or equal to 150°C according to the temperature required for the test.

[0054] Please refer to Figure 5 , Figure 5 which is a connection schematic diagram of a flash memory particle test system provided by an embodiment of the present application.

[0055] In one embodiment, the flash memory particle test system further includes a signal transfer board. The first end of the signal transfer board is connected to the test execution unit, and the other end of the signal transfer board is connected to the protocol host.

[0056] The method of the embodiment of the present application is applied to a flash memory particle test system. The flash memory particle test system includes a test host, a protocol host, a test execution unit, and a temperature-changing box. The test host is connected to the test execution unit through the protocol host. The test execution unit is used to be installed inside the temperature-changing box, and the test host is also connected to the temperature-changing box. The method includes: obtaining a command combination encapsulated by the operations of the flash memory and the temperature-changing box; forwarding the command combination to the test execution unit through the protocol host so that the test execution unit executes the command combination; receiving, through the protocol host, the test data generated by the test execution unit during the execution of the command combination; extracting the characteristic information of the test data and generating a total chart according to the characteristic information. By encapsulating the operation commands of the flash memory and the temperature-changing box, the test efficiency is improved. By extracting the characteristic information of the test data and generating a total chart, intuitive test result analysis is provided for users, and low-temperature testing is achieved while realizing batch automated testing.

[0057] The embodiment of the present application also provides a computer device, which includes: at least one memory, at least one processor, at least one computer program, and at least one computer program is stored in at least one memory. The at least one processor executes the at least one computer program to implement the flash memory particle test method in any one of the above embodiments. The computer device can be any intelligent terminal including a tablet computer, an in-vehicle computer, etc.

[0058] Refer to Figure 6 , Figure 6 which is a schematic diagram of the hardware structure of a computer device provided by an embodiment of the present application. The computer device includes: The processor 610 can be implemented in the form of a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, etc., and is used to execute relevant programs to implement the technical solutions provided in the embodiments of the present application; The memory 620 can be implemented in the form of a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM), etc. The memory 620 can store an operating system and other application programs. When implementing the technical solutions provided in the embodiments of this specification through software or firmware, the relevant program codes are stored in the memory 620 and are called by the processor 610 to execute the flash memory particle testing method of the embodiments of the present application; The input / output interface 630 is used to implement information input and output; The communication interface 640 is used to implement communication interaction between this device and other devices, and can implement communication through wired means (such as USB, network cable, etc.) or through wireless means (such as mobile network, WIFI, Bluetooth, etc.); The bus 650 transmits information between the various components of the device (such as the processor 610, the memory 620, the input / output interface 630, and the communication interface 640); Among them, the processor 610, the memory 620, the input / output interface 630, and the communication interface 640 are communicatively connected to each other inside the device through the bus 650.

[0059] The embodiments of the present application also provide a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the above-mentioned flash memory particle testing method is implemented.

[0060] As a non-transitory computer-readable storage medium, the memory can be used to store non-transitory software programs and non-transitory computer-executable programs. In addition, the memory may include a high-speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, a flash memory device, or other non-transitory solid-state storage devices. In some embodiments, the memory may optionally include a memory remotely set relative to the processor, and these remote memories can be connected to the processor through a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof.

[0061] The embodiments described in the embodiments of the present application are to more clearly illustrate the technical solutions of the embodiments of the present application, and do not constitute a limitation on the technical solutions provided by the embodiments of the present application. Those skilled in the art will know that with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of the present application are equally applicable to similar technical problems.

[0062] Those skilled in the art can understand that the technical solutions shown in the figures do not constitute a limitation on the embodiments of the present application, and may include more or fewer steps than shown in the figures, or combine certain steps, or different steps.

[0063] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, that is, they may be located in one place, or may be distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0064] Those of ordinary skill in the art can understand that all or some of the steps in the methods disclosed above, and the functional modules / units in the systems and devices, can be implemented as software, firmware, hardware, and their appropriate combinations.

[0065] The terms "first", "second", "third", "fourth", etc. (if any) in the specification of the present application and the above-mentioned drawings are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application described here can be implemented in an order other than those illustrated or described here. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or are inherent to these processes, methods, products, or devices.

[0066] It should be understood that in this application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that there can be three relationships. For example, "A and / or B" can mean: only A exists, only B exists, and both A and B exist at the same time. Among them, A and B can be singular or plural. The character " / " generally represents an "or" relationship between the associated objects before and after. "At least one (one)" or a similar expression below refers to any combination of these items, including any combination of single items (ones) or plural items (ones). For example, at least one (one) of a, b, or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0067] In several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the above-mentioned division of units is only a logical function division. In actual implementation, there can be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection to each other can be through some interfaces. The indirect coupling or communication connection of devices or units can be in electrical, mechanical or other forms.

[0068] The units described above as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or they can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0069] In addition, each functional unit in various embodiments of this application can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0070] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes multiple instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes: various media that can store programs, such as USB flash drives, mobile hard disks, read-only memories (ROM), random access memories (RAM), magnetic disks, or optical discs.

[0071] The preferred embodiments of the embodiments of this application have been described above with reference to the accompanying drawings, and thus do not limit the scope of the rights of the embodiments of this application. Any modifications, equivalent replacements, and improvements made by those skilled in the art without departing from the scope and essence of the embodiments of this application shall be within the scope of the rights of the embodiments of this application.

Claims

1. A method for testing flash memory particles, characterized in that, Applied to a flash memory particle test system, the flash memory particle test system includes a test host, a protocol host, a test execution unit, and a temperature change box. The test host is connected to the test execution unit through the protocol host. The test execution unit is used to be installed inside the temperature change box, and the test host is also connected to the temperature change box. The method includes: Obtain a command combination encapsulated by the operations of the flash memory and the operations of the temperature change box; Forward the command combination to the test execution unit through the protocol host, so that the test execution unit executes the command combination; Receive, through the protocol host, test data generated by the test execution unit during the execution of the command combination; Extract the characteristic information of the test data, and generate a total chart according to the characteristic information.

2. The method according to claim 1, wherein The method further includes: Adjust the temperature of the temperature change box to obtain the real-time temperature of the temperature change box; When the real-time temperature is equal to the preset temperature, perform read and write operations on the flash memory and record the test data generated by the read and write operations.

3. The method according to claim 1, wherein The extracting the characteristic information of the test data includes: extracting the average read and write speed and latency of the flash memory from the test data, and extracting the temperature change range and stabilization time of the temperature change box from the test data.

4. The method according to claim 3, characterized in that, The generating the total chart according to the characteristic information includes: Obtain a performance curve graph of the read and write speed of the flash memory changing with time according to the average read and write speed and the latency; Obtain a temperature curve graph of the temperature of the temperature change box changing with time according to the temperature change range and the stabilization time; Generate a total chart according to the performance curve graph and the temperature curve graph.

5. A flash memory particle testing system, characterized in that, Based on the method according to any one of claims 1 to 4, the flash memory particle test system includes: A test host; A protocol host, the test host is connected to the protocol host through a USB or network port protocol; A test execution unit, the protocol host and the test execution unit transmit and receive data through an EMMC protocol or a UFS protocol. The test execution unit includes a main control chip and a flash memory test socket, and the main control chip is encapsulated with a protocol controller and a flash memory controller; A temperature change box, the test host is connected to the temperature change box through a serial port protocol.

6. The system according to claim 5, characterized in that, The test host includes: An analysis data module, the analysis data module is used to extract the characteristic information of the data; A display data module, the display data module is used to display the total chart.

7. The system according to claim 5, wherein The adjustable temperature range of the temperature change box is greater than or equal to -50°C and less than or equal to 150°C.

8. The system according to claim 5, characterized in that, The flash memory particle test system further includes a signal transfer board. The first end of the signal transfer board is connected to the test execution unit, and the other end of the signal transfer board is connected to the protocol host.

9. A computer device, characterized in that, Includes: At least one memory; At least one processor; At least one computer program; The at least one computer program is stored in the at least one memory, and the at least one processor executes the at least one computer program to implement: the method according to any one of claims 1 to 4.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, and the computer program is used to cause a computer to execute: the method according to any one of claims 1 to 4.

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