Communication transceiver module mutual testing method

Abstract

The invention discloses a mutual testing method for communication transceiving modules, which comprises the following steps of: setting one communication transceiving module as a tested piece communication transceiving module and setting the other communication transceiving module as a tester communication transceiving module through an upper computer; when mutual testing is executed, the method comprises the following steps: S1, a tester communication transceiver module sends an inquiry signal; s2, the communication transceiving module of the tested piece receives the inquiry signal, processes the inquiry signal and generates and sends a response signal; and S3, the tester communication transceiver module receives the response signal, and tests the response signal to obtain a test result. The electrical performance parameter test of the communication transceiver module is realized, external instruments such as an oscilloscope and a frequency spectrograph are not needed, cable connection is reduced, the test complexity is reduced, and the operation is simple; the system supports rapid deployment, is suitable for multi-environment testing, and is high in testing speed, high in efficiency and convenient to carry.

Description

Technical Field

[0001] The present invention belongs to the technical field of communication transceiver module testing, and particularly relates to a method for mutual testing of communication transceiver modules. Background Art

[0002] A communication transceiver module is an electronic device that, when receiving a radio interrogation signal, responds within a specified delay time and then generates a response signal, having functions of receiving and transmitting signals; such a device is widely used in fields such as aerospace, wireless communication, metrology and testing, etc.; to test the correctness of its working performance, it is necessary to test the electrical performance parameters of the communication transceiver module, and a standard signal source is required to generate an interrogation signal, and standard instruments such as an oscilloscope, a spectrum analyzer, and a power meter are used to test the response signal.

[0003] To test the correctness of the electrical performance parameters of the communication transceiver module, standard instruments such as a signal source, an oscilloscope, a spectrum analyzer, and a power meter are required; and the communication transceiver module needs to be applied in different environments according to actual requirements, so the test instruments need to be moved to different environments for testing. Therefore, this method has defects such as a large number of processes, complex operations, a large number of test instruments, cumbersome cable connections, high requirements for test personnel, low efficiency, high cost, and poor mobility.

[0004] For example, Chinese Patent with publication number CN102947802A discloses a system and method for providing driver software to a test controller to facilitate testing a device under test through a wireless transceiver tester. When using the wireless transceiver tester, executable tester instructions can be accessed from one or more computer-readable media, and based on this operation, two-way signal communication is established between the wireless transceiver tester and the test controller, and between the wireless transceiver tester and the DUT. Further access to the executable driver instructions communicated to the test controller, which includes a plurality of executable driver program instructions for driving at least one of the wireless transceiver tester and the DUT. However, this patent requires the use of a specific tester, with cumbersome cable connections, high requirements for test personnel, low efficiency, and high cost. Summary of the Invention

[0005] To solve the above technical problems, the present invention provides a method for mutual testing of communication transceiver modules, including: setting one communication transceiver module as the communication transceiver module under test through a host computer, and setting the other communication transceiver module as the tester communication transceiver module;

[0006] When performing mutual testing, the following steps are included:

[0007] S1. The tester communication transceiver module sends an interrogation signal;

[0008] S2. The communication transceiver module of the device under test receives the interrogation signal, processes the interrogation signal, generates and sends a response signal;

[0009] S3. The communication transceiver module of the tester receives the response signal and tests the response signal to obtain the test result;

[0010] Among them, the host computer is electrically connected to the communication transceiver module, and the host computer controls the communication between the communication transceiver modules to implement the test of the communication transceiver module;

[0011] One of the communication transceiver modules includes: a baseband unit, a radio frequency unit, and an antenna unit; the baseband unit is electrically connected to the radio frequency unit, and the radio frequency unit is electrically connected to the antenna unit, and the radio frequency unit is electrically connected to the antenna unit.

[0012] Preferably, the step that S2, the communication transceiver module of the device under test receives the interrogation signal, processes the interrogation signal, generates and sends a response signal includes the following steps:

[0013] S21. The communication transceiver module of the device under test receives the interrogation signal and sets a delay time;

[0014] S22. Process the interrogation signal through the radio frequency unit and send it to the baseband unit;

[0015] S23. Wait until the delay time, and the baseband unit generates a response signal according to the interrogation signal;

[0016] S24. After the radio frequency unit processes the response signal, send the response signal out through the antenna unit.

[0017] Preferably, the host computer includes: a test main control unit; the test main control unit is electrically connected to the baseband unit;

[0018] The test main control unit includes: a tester sub-module and a device under test sub-module;

[0019] The tester sub-module is used to use the communication transceiver module as a tester and send an interrogation signal to the device under test;

[0020] The device under test sub-module is used to use the communication transceiver module as the device under test and send a response signal according to the interrogation signal.

[0021] Preferably, the baseband unit includes: an FPGA chip, an AD chip, a serial port chip, a baseband power supply chip, and a crystal oscillator chip; the FPGA chip is electrically connected to the AD chip, the serial port chip, and the crystal oscillator chip respectively, and the baseband power supply chip is electrically connected to the FPGA chip, the AD chip, the serial port chip, and the crystal oscillator chip respectively;

[0022] The FPGA chip is used to process the signals sent by the radio frequency unit, obtain the decoded signals and send them to the host computer through the serial port chip, process the signals sent by the host computer, obtain the frequency conversion signals and transmit them to the radio frequency unit;

[0023] The serial port chip is used for serial communication;

[0024] The baseband power supply chip is used to supply power to the components of the baseband unit;

[0025] The AD chip is used for data transceiver;

[0026] The crystal oscillator chip is used to provide the crystal oscillator frequency.

[0027] Preferably, the serial port chip supports the RS422 serial port chip.

[0028] Preferably, the processing of the signals sent by the radio frequency unit specifically refers to: frequency conversion, demodulation, and decoding of the signals sent by the radio frequency unit;

[0029] The processing of the signals sent by the host computer specifically refers to: encoding, modulation, and frequency conversion of the signals sent by the host computer.

[0030] Preferably, the radio frequency unit includes a radio frequency chip, a phase-locked loop chip, and a radio frequency power supply chip; the radio frequency chip is electrically connected to the phase-locked loop chip, and the radio frequency power supply chip is electrically connected to the radio frequency chip and the phase-locked loop chip respectively;

[0031] The radio frequency chip is used to process the radio signals fed by the antenna unit, send the generated signals to the baseband module, process the signals output by the baseband unit, and send them out through the antenna unit;

[0032] The phase-locked loop chip is used to provide a frequency source;

[0033] The radio frequency power supply chip is used to supply power to the components of the radio frequency unit.

[0034] Preferably, the processing of the radio signals fed by the antenna unit specifically refers to: mixing and down-converting the radio signals fed by the antenna unit;

[0035] The processing of the signals output by the baseband unit specifically refers to: filtering, mixing, and amplifying the signals output by the baseband unit.

[0036] Preferably, the DUT communication transceiver module and the tester communication transceiver module set the same address code and carrier frequency code through the serial port chip.

[0037] The beneficial effects of the present invention are as follows:

[0038] 1. The electrical performance parameters of the communication transceiver module are tested, eliminating the need for external instruments such as oscilloscopes and spectrum analyzers, reducing cable connections, lowering the test complexity, and being easy to operate.

[0039] 2. It supports rapid deployment, is suitable for multi-environment testing, has a fast test speed, high efficiency, and is easy to carry.

[0040] 3. It reduces the dependence on expensive standard instruments and saves costs.

[0041] 4. It has strong scalability, the module parameters can be customized, and it is convenient to modify, adapting to different test requirements. Description of the Drawings

[0042] Figure 1 It is a schematic diagram of signal transmission between the communication transceiver module under test and the communication transceiver module of the tester provided by an embodiment of the present invention.

[0043] Figure 2 It is a flowchart of the method provided by an embodiment of the present invention. Detailed Embodiments

[0044] The technical solutions of the present invention will be further described below, but the scope of protection is not limited thereto.

[0045] As Figure 1 shown, a method for mutual testing of communication transceiver modules includes: setting one communication transceiver module as the communication transceiver module under test through the host computer, and setting the other communication transceiver module as the communication transceiver module of the tester.

[0046] The host computer includes: a test main control unit; the test main control unit is electrically connected to the baseband unit.

[0047] The test main control unit includes: a tester sub-module and a DUT (Device Under Test) sub-module.

[0048] The tester sub-module is used to use the communication transceiver module as a tester and send an interrogation signal to the DUT.

[0049] The DUT sub-module is used to use the communication transceiver module as the DUT and send a response signal according to the interrogation signal.

[0050] As Figure 2 shown, when performing mutual testing, the following steps are included:

[0051] S1. The communication transceiver module of the tester sends an interrogation signal.

[0052] Among them, the host computer is electrically connected to the communication transceiver module, and the host computer controls the communication between the communication transceiver modules to implement the test of the communication transceiver module.

[0053] A communication transceiver module includes: a baseband unit, a radio frequency unit, and an antenna unit; the baseband unit is electrically connected to the radio frequency unit, and the radio frequency unit is electrically connected to the antenna unit, and the radio frequency unit is electrically connected to the antenna unit.

[0054] The baseband unit includes: an FPGA chip, an AD chip, a serial port chip, a baseband power supply chip, and a crystal oscillator chip; the FPGA chip is electrically connected to the AD chip, the serial port chip, and the crystal oscillator chip respectively, and the baseband power supply chip is electrically connected to the FPGA chip, the AD chip, the serial port chip, and the crystal oscillator chip respectively;

[0055] The FPGA chip is used to process the signals sent by the radio frequency unit, obtain the decoded signals and send them to the host computer through the serial port chip, process the signals sent by the host computer, obtain the frequency conversion signals and transmit them to the radio frequency unit;

[0056] Processing the signals sent by the radio frequency unit specifically refers to: performing frequency conversion, demodulation, and decoding on the signals sent by the radio frequency unit;

[0057] Processing the signals sent by the host computer specifically refers to: performing encoding, modulation, and frequency conversion on the signals sent by the host computer.

[0058] The serial port chip is used for serial communication;

[0059] The serial port chip supports the RS422 serial port chip.

[0060] The communication transceiver module is connected to the host computer through the RS422 serial port to realize data transmission between the communication transceiver module and the host computer.

[0061] The baseband power supply chip is used to supply power to the components of the baseband unit;

[0062] The AD chip is used for data transmission and reception;

[0063] The crystal oscillator chip is used to provide the crystal oscillator frequency.

[0064] The radio frequency unit includes a radio frequency chip, a phase-locked loop chip, and a radio frequency power supply chip; the radio frequency chip is electrically connected to the phase-locked loop chip, and the radio frequency power supply chip is electrically connected to the radio frequency chip and the phase-locked loop chip respectively;

[0065] The radio frequency chip is used to process the radio signals fed by the antenna unit, and send the generated signals to the baseband module, process the signals output by the baseband unit, and send them out through the antenna unit;

[0066] Processing the radio signals fed by the antenna unit specifically refers to: performing mixing and down-conversion on the radio signals fed by the antenna unit;

[0067] Processing the signals output by the baseband unit specifically refers to: performing filtering, mixing, and amplification on the signals output by the baseband unit.

[0068] The phase-locked loop chip is used to provide a frequency source;

[0069] The RF power supply chip is used to supply power to the components of the RF unit.

[0070] S2. The DUT communication transceiver module receives the interrogation signal, processes the interrogation signal, and generates and sends a response signal;

[0071] Specifically, step S2 includes the following steps:

[0072] S21. The DUT communication transceiver module receives the interrogation signal and sets the delay time;

[0073] S22. Process the interrogation signal through the RF unit and send it to the baseband unit;

[0074] S23. Wait until the delay time has elapsed, and the baseband unit generates a response signal according to the interrogation signal;

[0075] S24. After the RF unit processes the response signal, send the response signal out through the antenna unit.

[0076] The DUT communication transceiver module and the tester communication transceiver module set the same address code and carrier frequency code through the serial port chip.

[0077] S3. The tester communication transceiver module receives the response signal and tests the response signal to obtain the test result;

[0078] After the tester communication transceiver module receives the response signal, it tests the response signal through the baseband unit and the RF unit to obtain the test result, uploads the test result to the host computer, and displays the test result through the host computer. By cooperating with the baseband unit, the RF unit and the host computer to replace external instruments such as oscilloscopes and spectrum analyzers, the electrical performance parameters of the communication transceiver module can be tested without external instruments.

[0079] At the same time, the present invention supports rapid deployment, is suitable for multi-environment testing, has a fast test speed, high efficiency, and is easy to carry; reduces the dependence on expensive standard instruments, saves costs; has strong scalability, the module parameters can be customized, and the modification is convenient, adapting to different test requirements.

Claims

1. A mutual measurement method for communication transceiver modules, characterized in that, Including: Set one communication transceiver module as the DUT (Device Under Test) communication transceiver module and another communication transceiver module as the tester communication transceiver module through the host computer. When performing mutual testing, the following steps are included: S1. The tester communication transceiver module sends an interrogation signal. S2. The DUT communication transceiver module receives the interrogation signal, processes the interrogation signal, generates and sends a response signal. S3. The tester communication transceiver module receives the response signal and tests the response signal to obtain the test result. Wherein, the host computer is electrically connected to the communication transceiver module, and the host computer controls the communication between the communication transceiver modules to implement the test of the communication transceiver module. One of the communication transceiver modules includes: a baseband unit, a radio frequency unit, and an antenna unit; the baseband unit is electrically connected to the radio frequency unit, and the radio frequency unit is electrically connected to the antenna unit, and the radio frequency unit is electrically connected to the antenna unit.

2. The communication transceiver module mutual measurement method according to claim 1, wherein The step where the DUT communication transceiver module in S2 receives the interrogation signal, processes the interrogation signal, generates and sends a response signal includes the following steps: S21. The DUT communication transceiver module receives the interrogation signal and sets the delay time. S22. Process the interrogation signal through the radio frequency unit and send it to the baseband unit. S23. Wait until the delay time, and the baseband unit generates a response signal according to the interrogation signal. S24. After the radio frequency unit processes the response signal, send the response signal out through the antenna unit.

3. The communication transceiver module mutual measurement method according to claim 1, characterized in that The host computer includes: a test main control unit; the test main control unit is electrically connected to the baseband unit. The test main control unit includes: a tester sub-module and a DUT sub-module. The tester sub-module is used to use the communication transceiver module as a tester and send an interrogation signal to the DUT. The DUT sub-module is used to use the communication transceiver module as a DUT and send a response signal according to the interrogation signal.

4. The communication transceiver module mutual measurement method according to claim 1, characterized in that The baseband unit includes: an FPGA chip, an AD chip, a serial port chip, a baseband power supply chip, and a crystal oscillator chip; the FPGA chip is electrically connected to the AD chip, the serial port chip, and the crystal oscillator chip respectively, and the baseband power supply chip is electrically connected to the FPGA chip, the AD chip, the serial port chip, and the crystal oscillator chip respectively. The FPGA chip is used to process the signal sent by the radio frequency unit, obtain the decoded signal and send it to the host computer through the serial port chip, process the signal sent by the host computer, obtain the frequency conversion signal and transmit it to the radio frequency unit. The serial port chip is used for serial communication. The baseband power supply chip is used to supply power to the components of the baseband unit. The AD chip is used for data reception and transmission. The crystal oscillator chip is used to provide the crystal oscillator frequency.

5. The communication transceiver module mutual measurement method according to claim 4, characterized in that The serial port chip supports an RS422 serial port chip.

6. The communication transceiver module mutual measurement method according to claim 4, wherein, The processing of the signal sent by the radio frequency unit specifically refers to: performing frequency conversion, demodulation, and decoding on the signal sent by the radio frequency unit. The processing of the signal sent by the host computer specifically refers to: performing encoding, modulation, and frequency conversion on the signal sent by the host computer.

7. The method for mutual testing of communication transceiver modules according to claim 1, wherein, The radio frequency unit includes a radio frequency chip, a phase-locked loop chip, and a radio frequency power supply chip; the radio frequency chip is electrically connected to the phase-locked loop chip, and the radio frequency power supply chip is electrically connected to the radio frequency chip and the phase-locked loop chip respectively. The radio frequency chip is used to process the radio signals fed by the antenna unit, and send the generated signals to the baseband module, process the signals output by the baseband unit, and send them out through the antenna unit; The phase-locked loop chip is used to provide a frequency source; The radio frequency power chip is used to supply power to the components of the radio frequency unit.

8. The method for mutual testing of communication transceiver modules according to claim 7, wherein, The processing of the radio signals fed by the antenna unit specifically refers to: mixing and down-converting the radio signals fed by the antenna unit; The processing of the signals output by the baseband unit specifically refers to: filtering, mixing, and amplifying the signals output by the baseband unit.

9. The method for mutual testing of communication transceiver modules according to claim 1, wherein, The DUT communication transceiver module and the tester communication transceiver module set the same address code and carrier frequency code through the serial port chip.

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