Quality control method and device for photoelectric product generation and manufacturing

Abstract

The invention relates to the technical field of photoelectric product manufacturing, in particular to a quality control method and device for photoelectric product generation and manufacturing. The embodiment of the invention provides a quality control method for photoelectric product generation and manufacturing. The method comprises the following steps: acquiring multiple groups of production data in a photoelectric product production process in real time; wherein each group of production data comprises the same kind of data obtained according to a time sequence; analyzing and processing the production data to obtain an analysis result; wherein the analysis result comprises a conformity standard and a non-conformity standard; when the analysis result is that the standard is not met, an adjustment instruction is produced; wherein the adjusting instruction is used for being sent to a control module used for controlling production so that the control module can adjust parameters. The embodiment of the invention provides a quality control method and device for photoelectric product generation and manufacturing, electronic equipment and a storage medium, which can monitor and adjust each link in the production process in real time to ensure that the quality of the product meets the standard.

Description

Technical Field

[0001] The present invention relates to the technical field of optoelectronic product manufacturing, and particularly relates to a quality control method and device for the production and manufacturing of optoelectronic products. Background Art

[0002] Optoelectronic products are an important part of modern society and are widely used in military, civilian, commercial and other fields. In the production process of optoelectronic products, quality control is a very important link. Traditional quality control methods often rely on manual inspection and control, which are difficult to meet the needs of modern production, and are prone to misjudgment or missed judgment, resulting in unstable product quality. Therefore, an intelligent quality control method and technology are needed to ensure the quality of optoelectronic products. Summary of the Invention

[0003] Embodiments of the present invention provide a quality control method, device, electronic device and storage medium for the production and manufacturing of optoelectronic products, which can monitor and adjust each link in the production process in real time to ensure that the quality of the product meets the standards.

[0004] In a first aspect, embodiments of the present invention provide a quality control method for the production and manufacturing of optoelectronic products, including:

[0005] Obtaining multiple groups of production data in the production process of optoelectronic products in real time; wherein, each group of the production data includes the same type of data obtained in chronological order;

[0006] Analyzing and processing the production data to obtain an analysis result; wherein, the analysis result includes meeting the standards and not meeting the standards;

[0007] When the analysis result is not meeting the standards, generating a production adjustment instruction; wherein, the adjustment instruction is used to be sent to a control module for controlling production so that the control module adjusts parameters.

[0008] In a possible design, the analyzing and processing the production data includes:

[0009] Comparing each group of the production data collected with its corresponding standard data to determine whether the current group of the production data meets the standards. If it does not meet the standards, the analysis result further includes the deviation value between the production data and the standard data.

[0010] In a possible design, when the analysis result is not meeting the standards, generating a production adjustment instruction includes:

[0011] When the analysis result is not meeting the standards, generating a production adjustment instruction according to the deviation value; wherein, the adjustment instruction includes a parameter adjustment value, and the parameter adjustment value is used to adjust the parameters of the control module.

[0012] In a possible design, it further includes:

[0013] Real-time monitor multiple groups of the production data during the production process. When the production data exceeds the alarm threshold, generate a production alarm instruction; wherein, the alarm instruction is used to be sent to the control module so that the control module stops the device.

[0014] In a possible design, after the production is completed, conduct a product evaluation based on all the obtained production data.

[0015] In a possible design, the production data includes temperature, pressure, speed, and accuracy.

[0016] In a possible design, the control module includes a PLC controller.

[0017] In a second aspect, an embodiment of the present invention further provides a quality control device for the production and manufacturing of optoelectronic products, which is used to implement any one of the above methods. The device includes

[0018] An acquisition module, which is used to acquire multiple groups of production data during the production process of optoelectronic products in real time; wherein, each group of the production data includes the same type of data obtained in chronological order;

[0019] An analysis module, which is used to analyze and process the production data to obtain an analysis result; wherein, the analysis result includes meeting the standard and not meeting the standard;

[0020] An adjustment module, which is used to generate an adjustment instruction when the analysis result does not meet the standard; wherein, the adjustment instruction is used to be sent to the control module for controlling production so that the control module adjusts the parameters.

[0021] In a third aspect, an embodiment of the present invention further provides an electronic device, which includes a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the method described in any embodiment of this specification is implemented.

[0022] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed on a computer, the computer is made to execute the method described in any embodiment of this specification.

[0023] Compared with the prior art, the present invention has at least the following beneficial effects:

[0024] The quality control method and system for the production and manufacturing of optoelectronic products proposed in this patent adopt intelligent quality control technology, which can monitor and adjust each link in the production process in real time, effectively improving the quality and production efficiency of optoelectronic products. At the same time, this method and system also have the advantages of high reliability, simple operation, low cost, etc., and have important practical value and application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0026] Figure 1 is a flowchart of a quality control method for the production and manufacturing of optoelectronic products provided by an embodiment of the present invention;

[0027] Figure 2 is a hardware architecture diagram of an electronic device provided by an embodiment of the present invention;

[0028] Figure 3 is a structural diagram of a quality control device for the production and manufacturing of optoelectronic products provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0029] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts fall within the scope of protection of the present invention.

[0030] The following describes the specific implementation of the above concept.

[0031] Please refer to Figure 1 , an embodiment of the present invention provides a quality control method for the production and manufacturing of optoelectronic products, including:

[0032] Real-time acquisition of multiple sets of production data during the production process of optoelectronic products; wherein, each set of production data includes the same type of data obtained in chronological order;

[0033] Analyze and process the production data to obtain an analysis result; wherein, the analysis result includes meeting the standard and not meeting the standard;

[0034] When the analysis result does not meet the standard, a production adjustment instruction; wherein, the adjustment instruction is used to be sent to a control module for controlling production to enable the control module to adjust parameters.

[0035] The quality control method and system for the production and manufacturing of optoelectronic products proposed in this patent adopt intelligent quality control technology, can monitor and adjust each link in the production process in real time, and effectively improve the quality and production efficiency of optoelectronic products. At the same time, this method and system also have the advantages of high reliability, simple operation, low cost, etc., and have important practical value and application prospects.

[0036] In some embodiments of the present invention, analyzing and processing production data includes:

[0037] Comparing each set of collected production data with its corresponding standard data to determine whether the current set of production data meets the standard. If it does not meet the standard, the analysis result further includes the deviation value between the production data and the standard data.

[0038] In some embodiments of the present invention, when the analysis result does not meet the standard, a production adjustment instruction includes:

[0039] When the analysis result does not meet the standard, a production adjustment instruction is generated according to the deviation value; wherein, the adjustment instruction includes a parameter adjustment value, and the parameter adjustment value is used to adjust the parameters of the control module.

[0040] In some embodiments of the present invention, it further includes:

[0041] Real-time monitoring of multiple sets of production data during the production process. When the production data exceeds the alarm threshold, a production alarm instruction; wherein, the alarm instruction is used to be sent to the control module to enable the control module to stop the equipment.

[0042] In some embodiments of the present invention, after the production is completed, product evaluation is performed based on all the obtained production data.

[0043] In some embodiments of the present invention, the production data includes temperature, pressure, speed, and accuracy.

[0044] In some embodiments of the present invention, the control module includes a PLC controller.

[0045] Such as Figure 2 、 Figure 3 shown, the embodiments of the present invention provide a quality control device for the production and manufacturing of optoelectronic products. The device embodiments can be implemented by software, or by hardware or a combination of software and hardware. From the hardware level, as Figure 2 shown, it is a hardware architecture diagram of an electronic device where the quality control device for the production and manufacturing of optoelectronic products provided by the embodiments of the present invention is located. Except forFigure 2 In addition to the processor, memory, network interface, and non-volatile memory shown, the electronic device where the device is located in the embodiments may generally further include other hardware, such as a forwarding chip responsible for processing packets, and so on. Taking software implementation as an example, as Figure 3 shown, as a device in a logical sense, it is formed by the CPU of the electronic device where it is located reading the corresponding computer program in the non-volatile memory into the memory and running it. A quality control device for the production and manufacturing of optoelectronic products provided in this embodiment includes:

[0046] An acquisition module, configured to acquire multiple groups of production data during the production process of optoelectronic products in real time; wherein, each group of the production data includes the same type of data obtained in chronological order;

[0047] An analysis module, configured to analyze and process the production data to obtain an analysis result; wherein, the analysis result includes meeting the standard and not meeting the standard;

[0048] An adjustment module, configured to generate a production adjustment instruction when the analysis result is not meeting the standard; wherein, the adjustment instruction is used to be sent to a control module for controlling production so that the control module adjusts parameters.

[0049] It can be understood that the structure schematically shown in the embodiments of the present invention does not constitute a specific limitation on a quality control device for the production and manufacturing of optoelectronic products. In other embodiments of the present invention, a quality control device for the production and manufacturing of optoelectronic products may include more or fewer components than shown, or combine certain components, or split certain components, or have different component arrangements. The components shown can be implemented in hardware, software, or a combination of software and hardware.

[0050] Regarding the information interaction, execution process, and other contents among the modules in the above device, since they are based on the same concept as the method embodiments of the present invention, the specific content can be referred to the description in the method embodiments of the present invention, and will not be elaborated here.

[0051] The embodiments of the present invention further provide an electronic device, including a memory and a processor, where a computer program is stored in the memory, and when the processor executes the computer program, it implements a quality control method for the production and manufacturing of optoelectronic products in any embodiment of the present invention.

[0052] The embodiments of the present invention further provide a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, it causes the processor to execute a quality control method for the production and manufacturing of optoelectronic products in any embodiment of the present invention.

[0053] Specifically, a system or device equipped with a storage medium can be provided, on which software program codes for implementing the functions of any one of the above embodiments are stored, and the computer (or CPU or MPU) of the system or device is caused to read and execute the program codes stored in the storage medium.

[0054] In this case, the program codes read from the storage medium itself can implement the functions of any one of the above embodiments, so the program codes and the storage medium storing the program codes constitute a part of the present invention.

[0055] Examples of the storage medium for providing the program codes include floppy disks, hard disks, magneto-optical disks, optical disks (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD+RW), magnetic tapes, non-volatile memory cards, and ROMs. Alternatively, the program codes can be downloaded from a server computer via a communication network.

[0056] In addition, it should be clear that not only can the functions of any one of the above embodiments be realized by executing the program codes read by the computer, but also by causing an operating system or the like operating on the computer based on the instructions of the program codes to complete part or all of the actual operations.

[0057] In addition, it can be understood that the program codes read from the storage medium are written into the memory provided in the expansion board inserted into the computer or into the memory provided in the expansion module connected to the computer, and then based on the instructions of the program codes, the CPU or the like installed on the expansion board or the expansion module is caused to execute part and all of the actual operations, thereby realizing the functions of any one of the above embodiments.

[0058] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising one..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the element.

[0059] Those of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions. The foregoing program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps including the above method embodiments; and the foregoing storage medium includes various media such as ROM, RAM, magnetic disk, or optical disc that can store program codes.

[0060] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A quality control method for the production and manufacturing of optoelectronic products, characterized in that, It includes: Obtaining multiple sets of production data during the production process of optoelectronic products in real time; wherein, each set of the production data includes the same type of data obtained in chronological order; Analyzing and processing the production data to obtain an analysis result; wherein, the analysis result includes meeting the standard and not meeting the standard; When the analysis result is not meeting the standard, generating a production adjustment instruction; wherein, the adjustment instruction is used to be sent to a control module for controlling production so that the control module adjusts parameters.

2. The control method according to claim 1, characterized in that, The analyzing and processing the production data includes: Comparing each set of the production data collected with its corresponding standard data to determine whether the current set of the production data meets the standard. If it does not meet the standard, the analysis result further includes the deviation value between the production data and the standard data.

3. The control method according to claim 2, wherein When the analysis result is not meeting the standard, generating a production adjustment instruction, including: When the analysis result is not meeting the standard, generating a production adjustment instruction according to the deviation value; wherein, the adjustment instruction includes a parameter adjustment value, and the parameter adjustment value is used to adjust the parameters of the control module.

4. The control method according to claim 1, characterized in that, It further includes: Monitoring multiple sets of the production data during the production process in real time. When the production data exceeds an alarm threshold, generating a production alarm instruction; wherein, the alarm instruction is used to be sent to the control module so that the control module stops the equipment.

5. The control method according to claim 1, wherein After the production is completed, conducting a product evaluation based on all the obtained production data.

6. The control method according to claim 1, characterized in that, The production data includes temperature, pressure, speed and precision.

7. The control method according to claim 1, wherein The control module includes a PLC controller.

8. A quality control device for the production and manufacturing of optoelectronic products, characterized in that, For implementing the method according to any one of claims 1-7, the control device includes: An acquisition module, configured to obtain multiple sets of production data during the production process of optoelectronic products in real time; wherein, each set of the production data includes the same type of data obtained in chronological order; An analysis module, configured to analyze and process the production data to obtain an analysis result; wherein, the analysis result includes meeting the standard and not meeting the standard; An adjustment module, configured to generate a production adjustment instruction when the analysis result is not meeting the standard; wherein, the adjustment instruction is used to be sent to a control module for controlling production so that the control module adjusts parameters.

9. An electronic device, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the method according to any one of claims 1-7 is implemented.

10. A computer-readable storage medium, on which a computer program is stored. When the computer program is executed in a computer, the computer is made to execute the method according to any one of claims 1-7.

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