High-resolution particle detector structure suitable for muon imaging

Abstract

The invention discloses a high-resolution particle detector structure suitable for muon imaging, by using a scintillator with an integral structure, the scintillator material does not need to be spliced or processed, the processing difficulty and cost are reduced, and the scintillator with the integral structure improves the photon transmission efficiency of a light guide array; the light guide array plays a role in distribution sampling of optical signals generated by muons and other particles in the scintillator, and the array structure formed by the light guide blocks can reflect the optical signals for multiple times, so that the optical fiber can absorb the optical signals, the photoelectric sensing module can collect more photon signals for one muon event, and the detection accuracy is improved. The position detection resolution and accuracy of the muon and other particles are improved; according to the technical scheme, the scintillator is easy to replace under the condition that the scintillator has faults such as aging or the material and the structure of the scintillator are technically updated, so that the maintenance cost is reduced, and replacement and upgrading are easy to realize. The method is widely applied to the technical field of particle detection.

Description

Technical Field

[0001] The present invention relates to the field of particle detection technology, and in particular to a high-resolution particle detector structure suitable for muon imaging. Background Art

[0002] As a product of collisions between primordial cosmic rays and the atmosphere, cosmic muons possess strong penetrating power due to their weak interaction with matter. Most cosmic muons travel close to the speed of light and follow very close to straight lines. Muon imaging, a technique developed based on these characteristics of muons, is generally categorized into transmission imaging and scattering imaging. The former allows for non-destructive internal structure probing of large objects, while the latter is more suitable for examining smaller, high-atomic-number materials.

[0003] The principle of muon imaging is similar to that of X-rays, differing in that muons have greater penetrating power, enabling imaging of larger objects and larger areas. Applications include monitoring large ancient buildings, monitoring the health of nuclear reactors and spent fuel, surveying volcanoes and glaciers, and performing underground mineral and groundwater exploration. In recent years, muon 3D imaging has also been developed. This technology, similar to CT scans, utilizes multiple detectors to perform multi-angle detection around the target and reconstructs the results into a 3D density distribution within the target. Natural cosmic rays contain abundant muons, and muon imaging utilizes this natural particle source, making it a green and pollution-free nuclear imaging technology.

[0004] Successful muon imaging requires a high-performance particle detector. Given the same amount of data, the key parameter that determines the imaging quality is the detector's intrinsic position resolution. The more precise the detector's resolution, the more accurately it reflects the actual muon direction. However, current muon detectors generally suffer from low resolution or require high costs to achieve high resolution. Summary of the Invention

[0005] In order to solve the technical problems of low resolution of muon detectors and high implementation cost of high resolution, the present invention aims to provide a high-resolution particle detector structure suitable for muon imaging.

[0006] An embodiment of the present invention includes a high-resolution particle detector structure suitable for muon imaging, wherein the high-resolution particle detector structure suitable for muon imaging includes:

[0007] The high-resolution particle detector structure suitable for muon imaging includes:

[0008] Scintillator; the scintillator is an integral structure, generally a flat plate;

[0009] A light guide array; the light guide array is made of a transparent first material, and includes a base plate and a plurality of light guide blocks extending from the base plate, one side of the base plate being bonded to the scintillator, the light guide blocks being located on the other side of the base plate, and each light guide block being provided with a channel for passing an optical fiber;

[0010] A plurality of optical fibers; the optical fibers pass through the light guide block through the channel.

[0011] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0012] Auxiliary fixing buckle; the auxiliary fixing buckle is used to fix or release the scintillator and the light guide array, and at the same time, provides clamping for the optical fiber to fix the optical fiber.

[0013] Furthermore, the light guide blocks are arranged in a first direction and a second direction respectively to form a rectangular array; the first direction is perpendicular to the second direction;

[0014] Any of the light guide blocks comprises a first channel and a second channel; the first channel extends along the first direction, and the second channel extends along the second direction;

[0015] The first channels of any two adjacent light guide blocks in the first direction are on the same straight line;

[0016] The second channels of any two adjacent light guide blocks in the second direction are on the same straight line;

[0017] The first channel or the second channel on the same straight line is for the same optical fiber to pass through.

[0018] Furthermore, all of the first channels are located on the same plane, all of the second channels are located on the same plane, and the plane where the first channels are located is parallel to the plane where the second channels are located.

[0019] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0020] A plurality of spacers; the spacers are made of the second material and are arranged between two adjacent light guide blocks.

[0021] Furthermore, the first material is a transparent solid material with high transmittance, and the second material is air; or the first material is air, and the second material is a solid material with high reflectivity.

[0022] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0023] A high-reflection surface; the high-reflection surface is arranged on the outer surface of the light guide array; the outer surface of the light guide array is the surface of the light guide array that is not connected to the scintillator.

[0024] Furthermore, the transparent solid material is a high-transmittance material such as transparent resin, organic glass or polycarbonate, the high-reflection surface is a high-reflection material such as aluminum foil, reflective film or titanium oxide coating, and the optical fiber is a wavelength-shifting optical fiber.

[0025] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0026] A photoelectric sensing module; the photoelectric sensing module is connected to each of the optical fibers, and the photoelectric sensing module is used to convert the optical signal transmitted by the optical fiber into an electrical signal;

[0027] A signal processing board; the signal processing board is connected to the photoelectric sensor module, and the signal processing board is used to process the electrical signal into a digital signal;

[0028] Data analysis system; the data analysis system is used to process the digital signal and determine the muon impact position in the scintillator based on the processing result.

[0029] Furthermore, the photoelectric sensor module includes:

[0030] a plurality of first photoelectric sensor devices; each of the first photoelectric sensor devices is connected to the first end of a corresponding optical fiber, the second end of each optical fiber is light-proofed, and the first photoelectric sensor device is used to convert the optical signal transmitted by the connected optical fiber into an electrical signal;

[0031] or

[0032] a plurality of first photoelectric sensor devices and a plurality of second photoelectric sensor devices; each of the first photoelectric sensor devices is connected to the first end of a corresponding optical fiber, and each of the second photoelectric sensor devices is connected to the second end of a corresponding optical fiber, and the first photoelectric sensor devices and the second photoelectric sensor devices are respectively used to convert the optical signal transmitted by the connected optical fiber into an electrical signal.

[0033] The beneficial effects of the present invention are as follows: the high-resolution particle detector structure suitable for muon imaging in the embodiment has the following beneficial effects:

[0034] By using a scintillator with an integral structure, there is no need to perform processing such as cutting or splicing on the scintillator material, which reduces the processing difficulty and cost. The scintillator with an integral structure improves the transmission efficiency of the light guide array for photons.

[0035] On the one hand, the light guide array plays a role in the distribution sampling of the light signals generated by particles such as muons in the scintillator. On the other hand, the array structure formed by the light guide blocks, combined with the reflective surface, can reflect the light signals multiple times, which is beneficial for the optical fiber to absorb the light signal. This allows the photoelectric sensing module to collect more light signals in a single instance, reducing statistical errors and improving the resolution and accuracy of the position detection of particles such as muons.

[0036] The base plate and each optical conductor in the light guide array form an integral structure, which can simultaneously perform the matching of a large number of channels, improve the signal-to-noise ratio of the system, and effectively deal with the influence of background signals;

[0037] The light guide array and scintillator are easily decoupled structures. When the scintillator fails due to aging or other reasons, or when the material and structure of the scintillator are technologically updated, the scintillator can be easily replaced, thereby reducing maintenance costs and facilitating replacement and upgrades.

[0038] By providing an auxiliary fixing buckle, the optical fiber can be clamped to fix the optical fiber, which is beneficial for the optical fiber to absorb light signals;

[0039] By using the first material to manufacture the light guide array and the second material to manufacture the separator, it is advantageous for the light signal to be absorbed by the optical fiber inside the light guide array. Moreover, the first material and the second material can be various materials, thus having good material selection flexibility.

[0040] By providing a highly reflective surface on the light guide array, the attenuation of the optical signal can be reduced;

[0041] The photoelectric sensing module can be in the form of only setting the first photoelectric sensing device, which can realize the light signal detection function and reduce the structural complexity and cost; the photoelectric sensing module can also be in the form of setting the first photoelectric sensing device and the second photoelectric sensing device, thereby improving the detection efficiency of the light signal and the accuracy of the particle impact position detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Figure 1 is a side cross-sectional view of a high-resolution particle detector structure suitable for muon imaging in an embodiment;

[0043] Figure 2 Schematic diagram of the overall structure of a high-resolution particle detector suitable for muon imaging in an embodiment;

[0044] Figure 3 A schematic structural diagram of a light conductor in an embodiment;

[0045] Figure 4 Schematic diagram of a first connection method between a photoelectric sensor module and an optical fiber in an embodiment;

[0046] Figure 5 A schematic diagram of a second connection method between a photoelectric sensor module and an optical fiber in an embodiment;

[0047] Figure 6 Schematic diagram of the working principle of a high-resolution particle detector structure suitable for muon imaging in an embodiment;

[0048] Figure 7 Schematic diagram of particle impact direction reconstruction of a high-resolution particle detector structure suitable for muon imaging in an embodiment;

[0049] Figure 8 Schematic diagram of the structure of the separator in the embodiment. DETAILED DESCRIPTION

[0050] Explanation of terms:

[0051] Muon: also known as muon, a particle in the standard particle model, belonging to the lepton category, with a unit negative charge;

[0052] Cosmic-born muons: High-energy cosmic rays from outer space collide with atoms and molecules in the atmosphere, producing high-energy particles that decay further and produce secondary particles such as muons. High-energy muons have strong penetrating power and a long average lifetime. Therefore, the muon flux level near the surface is significantly higher than that of other particles (such as electrons, positrons, protons, and neutrons). They become the main component of cosmic rays measured on the surface and are therefore also called "cosmic ray muons" or "cosmic-born muons."

[0053] Plastic scintillator: The main component is polystyrene plastic doped with some fluorescent agents. When muons pass through the scintillator, they deposit some energy in it, stimulating the scintillator to emit light. The photoelectric device converts the energy into an electrical signal, which can be used to detect the muons. It is a commonly used detection medium in the field of particle detection.

[0054] Position resolution: There is often a certain deviation between the particle impact position detected by the detector and the actual position. Position resolution is a statistical measure of the size of this error. The higher the resolution (reflected in the smaller the value), the more accurate the position detection;

[0055] Wavelength-shifting optical fiber: absorbs short-wavelength light (such as blue-violet light) and emits long-wavelength light (such as yellow-green light), playing the role of light collection in the field of particle detection;

[0056] Detection efficiency: The probability of a particle being detected by a detector when it passes through it. The higher the better.

[0057] Background: The signal received at the detector end is not entirely the desired target signal, and is inevitably mixed with some other signals, such as the noise of other electronics themselves, the dark noise of optoelectronic devices, etc. These noises can be collectively referred to as background.

[0058] There are two ways to implement a scintillator-based muon detector. The first is to form a detector array using a large number of slender scintillator strips, arranged in two planes, X and Y. Each scintillator strip is wrapped with a reflective layer and a light-shielding layer. Position detection is achieved through the pixelation of the scintillator. The scintillator strips can be shaped like rectangular parallelepipeds, triangular prisms, and other shapes. The second method is to slot the scintillator and embed a wavelength-shifting optical fiber into the scintillator. This allows the scintillation light collected by the fiber to be used to reconstruct the location of the particle impact.

[0059] First, both methods inevitably involve processing scintillators, which is difficult due to their low melting point, contributing to the high cost of scintillator detectors. In some applications, multiple scintillator detectors are required to simultaneously acquire data for 3D reconstruction, further exacerbating cost pressures. This high cost has hindered the further application of the environmentally friendly technology of Miu Imaging in various imaging scenarios.

[0060] Moreover, in the first method, the resolution of the detector is related to the number and volume of the scintillator strips. Specifically, the more and smaller the scintillator strips, the higher the scintillator granularity and the higher the resolution of the detector. Therefore, the first method improves the resolution at the expense of increased costs. Taking a 30cm x 30cm x 1cm scintillator plane as an example, compared with 30 30cm x 1cm x 1cm rectangular scintillator strips, with the same effective area, the market purchase price of the latter is more than 7 times that of the former; compared with 60 30cm x 1cm x 1xm (height) triangular prism scintillator strips, the market purchase price is more than 12 times that of the whole piece. This means that in the first method, the material cost will account for a considerable part of the detector cost.

[0061] While the second method of slotting the scintillator is slightly less expensive than the first, it suffers from more significant drawbacks. First, positioning accuracy is poor, lacking effective position resolution. Second, detection efficiency is low. The air gap between the slot and the optical fiber causes a large number of total internal reflections, preventing many photons emitted by the scintillator from entering the optical fiber for collection and readout, resulting in low detection efficiency. This results in increased time required to collect the same amount of data, reducing imaging efficiency. Furthermore, because the slot does not secure the optical fiber, it can shift within the slot, compromising detector stability and significantly increasing the likelihood of damage during transportation.

[0062] Furthermore, the performance of the plastic scintillator medium degrades over time. This degradation can affect the accuracy and reliability of data acquisition during long-term monitoring. Both the first and second approaches require meticulous packaging or processing of the scintillator. If scintillator performance degrades or detector components unexpectedly malfunction, the scintillator must be disassembled and repackaged, a time-consuming and labor-intensive process that increases maintenance costs.

[0063] To address the shortcomings of the first and second approaches described above, this embodiment provides a high-resolution particle detector structure suitable for muon imaging, which differs from both the first and second approaches. The high-resolution particle detector structure in this embodiment is suitable for muon imaging, but is not limited to muon imaging. Because the particle detection principles share certain similarities, the present invention can also be used to detect other types of charged particles, such as electrons.

[0064] In this embodiment, the side cross-sectional view of the high-resolution particle detector structure suitable for muon imaging is as follows: Figure 1 As shown, the overall structure is as Figure 2 As shown. Figure 1 and Figure 2 The high-resolution particle detector structure suitable for muon imaging includes a scintillator, a light guide array, and multiple optical fibers.

[0065] Reference Figure 1 The scintillator is an integral structure, for example, polystyrene plastic doped with fluorescent agent is used to make the scintillator through one-piece molding. From the morphological point of view, the scintillator is a whole piece of plastic material, and is not spliced or combined by smaller components, and does not need to be split or processed.

[0066] The scintillator can be in the shape of a square plate, a circular plate, a triangular plate, etc. For example, if a square plate scintillator is used, the light guide array and the like are also in the shape of a square, so that the overall structure of the high-resolution particle detector suitable for muon imaging can be as follows: Figure 2 Shown is also a square.

[0067] Reference Figure 1 The light guide array includes a base plate and multiple light guide blocks extending from the base plate. One side of the base plate is bonded to the scintillator, while the light guide blocks are grown on the other side. In this embodiment, the light guide array is fabricated using a transparent first material. Specifically, a transparent solid material such as transparent resin, organic glass, or polycarbonate can be used as the first material. The light guide array can be 3D printed, or it can be produced using other methods such as mechanical processing.

[0068] The structure of a single light guide block is as follows Figure 3 As shown. Figure 1 and Figure 3 , it is possible to produce rectangular light guide blocks, each of which has the same shape and size. For example, a light guide block measuring 1 cm × 1 cm × 0.7 cm can be used. The specific size of the light guide block can be adjusted based on the desired spatial resolution. For example, if a higher-resolution detector is desired, a smaller light guide block size can be used. Since light guides can be produced using 3D printing, changing the size does not increase the cost.

[0069] Reference Figure 1 , multiple light guiding blocks are arranged along a first direction (X direction) and a second direction (Y direction) perpendicular to each other. For example, multiple light guiding blocks are arranged in rows along the first direction (X direction), and multiple light guiding blocks are arranged in columns along the second direction (Y direction), thereby forming a rectangular array.

[0070] Reference Figure 1 and Figure 3 Each light guide block is provided with a first channel extending along a first direction and a second channel extending along a second direction. 3D printing technology can be used to print and manufacture the light guide blocks using a transparent solid material as the first material for 3D printing.

[0071] In this embodiment, within a tolerance range, the diameters of the first and second channels are identical to those of the optical fibers, allowing the optical fibers to pass through them. The light guide blocks simultaneously support and secure the optical fibers. The inner walls of the first and second channels can be smoothed, for example, to facilitate insertion of the optical fibers. Furthermore, when fabricating the light guide array via 3D printing, the optical fibers can be pre-placed in the corresponding positions of the first and second channels, and the light guide array can then be 3D printed, resulting in a pre-assembled optical fiber light guide array.

[0072] In this embodiment, refer to Figure 1 , the manufacturing parameters of the light guide blocks can be controlled so that the relative positions of the first channel and the second channel in each light guide block are the same in the entire light guide block. In this way, when multiple light guide blocks are produced to form a rectangular array, the first channels of each light guide block on the same row are located on the same straight line, and the second channels of each light guide block on the same column are located on the same straight line. This makes the optical fibers passing through the first channels of each light guide block on the same row and the optical fibers passing through the second channels of each light guide block on the same row straight, reducing the bending loss of the optical fiber.

[0073] In this embodiment, refer to Figure 1 , all the first channels are located on the same plane, all the second channels are located on the same plane, and the two planes are parallel, for example, parallel to the bottom plate. Figure 1In the embodiment, the plane where the second channel is located is above the plane where the first channel is located, that is, the distance between the second channel and the bottom plate is farther. It can also be reversed so that the plane where the first channel is located is above the plane where the second channel is located.

[0074] In this embodiment, the optical fibers used are wavelength-shifting optical fibers. An optical fiber is inserted into the first channel of each row of optical conductors in the light guide array, and an optical fiber is inserted into the second channel of each column of optical conductors in the light guide array. Thus, each optical fiber sequentially passes through multiple optical conductors in the same row along each first channel, or sequentially passes through multiple optical conductors in the same column along each second channel. Each optical fiber has two ends: a first end and a second end.

[0075] In this embodiment, refer to Figure 1 The high-resolution particle detector structure suitable for muon imaging also includes a photoelectric sensor module and a signal processing board as well as Figure 1 The data analysis system is not shown.

[0076] In this embodiment, the photoelectric sensor module can be Figure 4 or Figure 5 connected to each optical fiber in a manner similar to that of FIG.

[0077] Reference Figure 4 The photoelectric sensor module includes multiple first photoelectric sensor devices, the number of which equals the number of optical fibers. Specifically, the first photoelectric sensor devices may be photomultiplier tubes, silicon photomultiplier devices, or photodiodes. Each first photoelectric sensor device is connected to the first end of a corresponding optical fiber. The second end of each optical fiber (i.e., the end not connected to the first photoelectric sensor device) can be shielded from light. The data end of each first photoelectric sensor device is connected to a signal processing board, which is in turn connected to a data analysis system.

[0078] In this embodiment, the working principle of the high-resolution particle detector structure suitable for muon imaging is as follows: Figure 2 and Figure 6 As shown. Figure 2 When muons or other charged particles enter the scintillator, they strike a specific location within the scintillator, depositing energy there. The scintillator then converts some of this energy into photons, which propagate along the scintillator to the baseplate of the lightguide array and are then transmitted to the lightguide blocks of the lightguide array. Because the multiple lightguide blocks form a rectangular array, light can undergo total internal reflection at the interface between the lightguide and air. Therefore, optical signals entering the lightguide array will reflect multiple times within the array and will not propagate rapidly beyond it. This allows the optical signals to be collected by optical fibers and transmitted to photoelectric sensors.

[0079] In this embodiment, a highly reflective surface such as aluminum foil, a reflective film, or a titanium oxide coating can be provided on the outer surface of the light guide array, that is, the surface not in contact with the scintillator. Providing a highly reflective surface can increase the amount of reflection of light signals entering the light guide array within the light guide array, leading to absorption by the optical fibers.

[0080] Reference Figure 2 and Figure 6 When particles such as muons strike the scintillator, they emit light. The light signal enters the corresponding light guide block and travels along the optical fiber to the photoelectric sensor. The first photoelectric sensor converts the light signal transmitted by the connected optical fiber into an electrical signal. The programmable gate array signal processing board collects the electrical signals collected by each first photoelectric sensor, packages them into digital signals, and transmits them to the data analysis system, the host computer system, via media such as Ethernet.

[0081] The data analysis system processes the digital signal and determines the muon impact position in the scintillator based on the processing results. For example, the data analysis system can determine the muon impact position using a center of gravity reconstruction method or a fitting method.

[0082] In this embodiment, two reconstruction methods are provided. In the first reconstruction method, the data analysis system uses the following formula

[0083]

[0084] Calculate the impact position of the particle. Taking the first direction as an example, X i represents the spatial position of the i-th optical fiber perpendicular to the first direction (e.g., the coordinate on the X-axis in the first direction), E i is the signal intensity detected by the photoelectric sensor connected to the i-th optical fiber perpendicular to the first direction, Σ represents the sum of all optical fibers traversing the first direction, is the coordinate of the reconstructed particle impact position in the first direction. This formula actually obtains the distribution of light intensity parallel to the first direction. By weighted average, as shown in the formula, the impact position of the particle in the first direction can be obtained. Similarly, the optical fiber traversed in the second direction and the signal intensity detected therefrom are used as X i and E i , thus calculating The particle impact position is determined by combining the position coordinates in the two directions.

[0085] In the second reconstruction method, the data analysis system uses the following formula

[0086]

[0087] Calculate the impact position of the particle. Taking the first direction as an example, X i represents the spatial position of the i-th optical fiber perpendicular to the first direction (e.g., the coordinate on the X-axis in the first direction), E i is the signal intensity detected by the photoelectric sensor connected to the i-th optical fiber perpendicular to the first direction, t i It's E i The signal triggering time, σ t is the standard deviation of time, which is an adjustable coefficient. Σ represents the sum of all optical fibers in the first direction. is the position coordinate of the reconstructed particle impact position in the first direction. Similarly, the optical fiber traversed in the second direction and the signal intensity detected therefrom are taken as X i and E i , thus calculating The particle impact position is determined by combining the position coordinates in the two directions.

[0088] In this embodiment, the principle of the second reconstruction method is that since light transmission takes time, the optical fiber farther away from the particle impact position receives the optical signal later, that is, the larger the t value, and thus the coefficient is set for each optical fiber (the i-th optical fiber) As a result, channels with earlier responses receive higher weights. This further emphasizes the contribution of channels with closer hit locations to the total signal intensity detected by the data analysis system, while reducing the contribution of peripheral channels, effectively improving detection accuracy. This simultaneous reconstruction method combining both time and energy information is a unique reconstruction method brought about by this structured light guide array.

[0089] In this embodiment, both the first reconstruction method and the second reconstruction method can reconstruct the particle impact position at a certain moment. The data analysis system can reconstruct the particle impact trajectory by tracking the particle impact position at each moment.

[0090] Reference Figure 5 In another structure of the photoelectric sensor module, a plurality of first photoelectric sensor devices and a plurality of second photoelectric sensor devices are included, and the number of the first photoelectric sensor devices and the second photoelectric sensor devices is equal to the number of the optical fibers. The second photoelectric sensor device can be a photomultiplier tube, a silicon photomultiplier device or a photodiode. The connection method between the first photoelectric sensor device and the optical fiber is the same as that of the first photoelectric sensor device. Figure 4 The same, but Figure 5In this design, the second end of the optical fiber is not shielded from light and is instead connected to a second photoelectric sensor. Both the first and second photoelectric sensors participate in optical signal detection. For example, the sum of the optical signals detected by the first and second photoelectric sensors for the same optical fiber can be used as the optical signal detection result for that fiber. The inclusion of a second photoelectric sensor improves the accuracy and sensitivity of optical signal detection, further enhancing the resolution of the particle detector structure.

[0091] In this embodiment, a high-resolution particle detector structure suitable for muon imaging can also be used to reconstruct the particle direction. Figure 7 As shown, using two Figure 2 The high-resolution particle detector structures shown are suitable for muon imaging and can be placed in parallel. If the path of a particle such as a muon passes through these two high-resolution particle detector structures at the same time, each high-resolution particle detector structure can reconstruct the impact position of the particle separately, thereby obtaining two impact positions. Based on these two impact positions, the impact direction of the particle can be determined, thereby realizing particle direction reconstruction.

[0092] In this embodiment, refer to Figure 8 A separator can be provided between each two adjacent light guide blocks. The separator is made of a second material. Specifically, the second material can be air. In this case, if the light guide array is manufactured using a transparent solid material through a process such as 3D printing, the air in the environment will act as the second material and fill the space between adjacent light guide blocks to form a separator.

[0093] In this embodiment, a solid material with high light reflectivity can also be used as the second material, and a solid separator can be made and installed between adjacent light guide blocks, which is beneficial to enhance the reflection of the light signal inside the light guide array, so that it can be better absorbed by the optical fiber.

[0094] In this embodiment, refer to Figure 1 The high-resolution particle detector structure suitable for muon imaging also includes an auxiliary fixing buckle. The auxiliary fixing buckle consists of two parts, the lower part of which can support the scintillator, and the upper part of which can be installed with a separator and fix the light guide array. Through the mechanical connection between the upper and lower parts, the auxiliary fixing buckle can fix the scintillator and the light guide array together. After releasing the mechanical connection between the upper and lower parts, the scintillator and the light guide array can be released and separated.

[0095] The scintillator and light guide array in this embodiment are easily decoupled, and the coupling and decoupling between the scintillator and light guide array are achieved by providing an auxiliary fixing buckle. For example, if the scintillator ages and affects detection performance, the mechanical connection of the auxiliary fixing buckle can be released, making it easier to remove and replace the scintillator, thereby reducing maintenance costs.

[0096] Reference Figure 1 and Figure 2 The auxiliary fixing buckle in this embodiment can also be used to support components such as the photoelectric sensor module and signal processing board. Therefore, the auxiliary fixing buckle can secure the various components of the high-resolution particle detector structure suitable for muon imaging, improving the integrity of the high-resolution particle detector structure suitable for muon imaging. This allows the high-resolution particle detector structure suitable for muon imaging to effectively cope with complex environments such as long-distance transportation and field exploration, which may be subject to severe vibration.

[0097] In this embodiment, the material properties of the first material and the second material can also be reversed. For example, air can be used as the first material to form the light guide array, and a high-reflectivity solid material such as aluminum foil, a reflective film, or titanium oxide can be used as the second material to form the separator. Specifically, the separator can be mounted on the auxiliary fixing clip, and the air in the environment can be used as the second material to fill the space between the scintillator and the separator to form the light guide array. When a low-loss medium such as air is used to form the light guide array, since the material of the larger light guide array is gas, it is beneficial to reduce the overall weight of the high-resolution particle detector structure suitable for muon imaging.

[0098] The high-resolution particle detector structure suitable for muon imaging in this embodiment can avoid splicing or processing of the scintillator material by using a scintillator with an integral structure, thereby reducing the processing difficulty and cost. Moreover, since the scintillator with an integral structure is not composed of multiple small scintillator structures, the negative effects of incomplete tight fitting caused by the packaging layer and the light-shielding layer between the multiple small scintillator structures, the existence of dead zones, that is, areas where particles cannot be detected, etc. are avoided, thereby improving the transmission efficiency of the light guide array for photons, so that the detection efficiency of the detector can reach more than 96%; on the one hand, the light guide array plays a role in sampling the distribution of light signals generated by particles such as muons in the scintillator, and on the other hand, the array structure formed by the light guide blocks can perform multiple sampling on the light signals. Secondary reflection is beneficial to the absorption of light signals by optical fibers, so that the photoelectric sensing module can collect more photon signals, reduce the detection error of light signals, and improve the position detection resolution and accuracy of particles such as muons; the base plate and each optical conductor in the optical waveguide array form an integral structure, which can simultaneously perform the coincidence of a large number of channels. Compared with technical solutions with only one channel or two channels and a small number of channels, it can greatly reduce the rate of accidental coincidence events, improve the signal-to-noise ratio of the system, and effectively deal with the influence of background signals; the optical waveguide array and the scintillator are easily decoupled structures. When the scintillator fails due to aging or other reasons, or when the material and structure of the scintillator are technologically updated, the scintillator can be easily replaced, thereby reducing maintenance costs and facilitating replacement and upgrading.

[0099] It should be noted that, unless otherwise specified, when a feature is referred to as being "fixed" or "connected" to another feature, it may be directly fixed or connected to the other feature, or it may be indirectly fixed or connected to the other feature. In addition, the descriptions of up, down, left, right, etc. used in this disclosure are only relative to the relative positional relationship of the components of the present disclosure in the accompanying drawings. The singular forms of "a" and "the" used in this disclosure are also intended to include the plural forms, unless the context clearly indicates otherwise. In addition, unless otherwise defined, all technical and scientific terms used in this embodiment have the same meaning as those generally understood by those skilled in the art. The terms used in the specification of this embodiment are only for describing specific embodiments and are not intended to limit the present invention. The term "and / or" used in this embodiment includes any combination of one or more related listed items.

[0100] It should be understood that, although the present disclosure may adopt the term first, second, third etc. to describe various elements, these elements should not be limited to these terms.These terms are only used to distinguish the elements of the same type from each other.For example, without departing from the scope of the present disclosure, the first element may also be referred to as the second element, and similarly, the second element may also be referred to as the first element.The use of any and all examples or exemplary language ("for example", "such as" etc.) provided by the present embodiment is only intended to better illustrate embodiments of the present invention, and unless otherwise required, the scope of the present invention will not be limited.

[0101] The above are merely preferred embodiments of the present invention. The present invention is not limited to the aforementioned embodiments. As long as the technical effects of the present invention are achieved by the same means, any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention. Within the scope of protection of the present invention, various modifications and variations of the technical solutions and / or implementation methods may be made.

Claims

1. A high-resolution particle detector structure suitable for muon imaging, characterized in that: The high-resolution particle detector structure suitable for muon imaging includes: Scintillator; the scintillator is an integral structure; A light guide array; the light guide array is made of a transparent first material, and includes a base plate and a plurality of light guide blocks extending from the base plate, one side of the base plate being bonded to the scintillator, the light guide blocks being located on the other side of the base plate, and each light guide block being provided with a channel for passing an optical fiber; A plurality of optical fibers; the optical fibers pass through the light guide block through the channel.

2. The high-resolution particle detector structure suitable for muon imaging according to claim 1, characterized in that: The high-resolution particle detector structure suitable for muon imaging further includes: Auxiliary fixing buckle; the auxiliary fixing buckle is used to fix or release the scintillator and the light guide array, and at the same time, provides clamping for the optical fiber to fix the optical fiber.

3. The high-resolution particle detector structure suitable for muon imaging according to claim 1, characterized in that: The light guide blocks are arranged in a first direction and a second direction respectively to form a rectangular array; the first direction is perpendicular to the second direction; Any of the light guide blocks includes a first channel and a second channel; The first channel extends along the first direction, and the second channel extends along the second direction; The first channels of any two adjacent light guide blocks in the first direction are on the same straight line; The second channels of any two adjacent light guide blocks in the second direction are on the same straight line; The first channel or the second channel on the same straight line is for the same optical fiber to pass through.

4. The high-resolution particle detector structure suitable for muon imaging according to claim 3, characterized in that: All of the first channels are located on the same plane, all of the second channels are located on the same plane, and the plane where the first channels are located is parallel to the plane where the second channels are located.

5. The high-resolution particle detector structure suitable for muon imaging according to claim 1, characterized in that: The high-resolution particle detector structure suitable for muon imaging further includes: A plurality of spacers; the spacers are made of the second material and are arranged between two adjacent light guide blocks.

6. The high-resolution particle detector structure suitable for muon imaging according to claim 5, characterized in that: The first material is a transparent solid material with high transmittance, and the second material is air; or the first material is air, and the second material is a solid material with high reflectance.

7. The high-resolution particle detector structure suitable for muon imaging according to claim 6, characterized in that: The high-resolution particle detector structure suitable for muon imaging further includes: A high-reflection surface; the high-reflection surface is arranged on the outer surface of the light guide array; the outer surface of the light guide array is the surface of the light guide array that is not connected to the scintillator.

8. The high-resolution particle detector structure suitable for muon imaging according to claim 7, characterized in that: The transparent solid material is transparent resin, organic glass or polycarbonate, the high-reflection surface is aluminum foil, reflective film or titanium oxide coating, and the optical fiber is a wavelength-shifting optical fiber.

9. The high-resolution particle detector structure suitable for muon imaging according to any one of claims 1 to 8, characterized in that: The high-resolution particle detector structure suitable for muon imaging further includes: A photoelectric sensing module; the photoelectric sensing module is connected to each of the optical fibers, and the photoelectric sensing module is used to convert the optical signal transmitted by the optical fiber into an electrical signal; A signal processing board; the signal processing board is connected to the photoelectric sensor module, and the signal processing board is used to process the electrical signal into a digital signal; Data analysis system; the data analysis system is used to process the digital signal and determine the muon impact position in the scintillator based on the processing result.

10. The high-resolution particle detector structure suitable for muon imaging according to claim 9, characterized in that: The photoelectric sensing module includes: a plurality of first photoelectric sensor devices; each of the first photoelectric sensor devices is connected to the first end of a corresponding optical fiber, the second end of each optical fiber is light-proofed, and the first photoelectric sensor device is used to convert the optical signal transmitted by the connected optical fiber into an electrical signal; or a plurality of first photoelectric sensor devices and a plurality of second photoelectric sensor devices; each of the first photoelectric sensor devices is connected to the first end of a corresponding optical fiber, and each of the second photoelectric sensor devices is connected to the second end of a corresponding optical fiber, and the first photoelectric sensor devices and the second photoelectric sensor devices are respectively used to convert the optical signal transmitted by the connected optical fiber into an electrical signal.

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