Method for testing electrical stability of high-speed data connection terminal wire

Abstract

The invention relates to the technical field of electrical variable measurement, in particular to an electrical stability test method for a high-speed data connection terminal wire, which comprises the following steps of: determining an abnormal fluctuation area of a current signal of a test sub-wire according to a signal fluctuation steady-state value of each signal fluctuation area of the current signal of the test sub-wire; according to the signal fluctuation steady-state value of the abnormal fluctuation area, the occurrence frequency of each signal maximum value point in the abnormal fluctuation area and the time distance between each signal maximum value point and the adjacent minimum value point, determining an anti-interference coefficient of the abnormal fluctuation area; determining a signal transmission disorder factor of the connection terminal line according to the current mean value of the test sub-line before the connection terminal and the current mean value of the test sub-line after the connection terminal; and determining an electrical stability test result of the high-speed data connection terminal line according to the signal transmission disorder factor and the anti-interference coefficient. According to the invention, the accuracy of the electrical stability test result of the high-speed data connection terminal line is effectively improved.

Description

Technical Field

[0001] The present invention relates to the technical field of measuring electrical variables, and in particular to a method for testing the electrical stability of a high-speed data connection terminal line. Background Art

[0002] In modern electronic devices, high-speed electrical connectors play a critical role, ensuring fast data transmission and stable connections between devices. As data transmission demands continue to increase, so too do the performance requirements for electrical connectors. High-speed data connector cable electrical stability testing evaluates whether cables used for high-speed data transmission (such as optical fiber, coaxial cable, or twisted pair) can maintain stable signal transmission under varying conditions. Its primary goal is to ensure data integrity and reliability during transmission, especially at high frequencies and with large data volumes.

[0003] Existing electrical stability testing methods for high-speed data connector cables primarily assess their stability by identifying current signal fluctuations at different voltages. However, during data transmission, external electromagnetic interference and the steady-state nature of the signal structure during propagation can cause deviations in the relationship between the actual current variation in the connector cable and the expected electrical stability of the sub-cable under different voltage conditions, resulting in inaccurate stability assessment results. Summary of the Invention

[0004] In order to solve the technical problem of inaccurate evaluation of electrical stability test results for high-speed data connection terminal cables, the present invention aims to provide a method for testing the electrical stability of high-speed data connection terminal cables. The technical solution adopted is as follows: determining an abnormal fluctuation region of the current signal of the test sub-line according to a signal fluctuation steady-state value of each signal fluctuation region of the current signal of the test sub-line; Determining the impedance interference coefficient of the abnormal fluctuation area based on the signal fluctuation steady-state value of the abnormal fluctuation area, the occurrence frequency of each signal maximum point in the abnormal fluctuation area, and the time distance between each signal maximum point and its adjacent minimum point; Determining a signal transmission disorder factor of the connection terminal line according to an average current value of the test sub-line before the connection end and an average current value of the test sub-line after the connection end; An electrical stability test result of the high-speed data connection terminal line is determined according to the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area.

[0005] Preferably, the method for determining each signal fluctuation area of the current signal of the test sub-line includes: When the difference between the signal fluctuation steady-state value of the i-th signal sampling point and the signal fluctuation steady-state value of the i+1-th signal sampling point in the current signal of the test sub-line is less than a preset first threshold, it is determined that the i-th signal sampling point and the i+1-th signal sampling point are in the same signal fluctuation area; wherein i is a positive integer.

[0006] Preferably, the method for determining the signal fluctuation steady-state value of each signal fluctuation region of the current signal of the test sub-line includes: Determine a target window area corresponding to an i-th signal sampling point in the current signal of the test sub-line; The signal fluctuation steady-state value of the i-th signal sampling point is determined according to the signal maximum value, signal minimum value and waveform disorder coefficient in the target window area.

[0007] Preferably, determining the abnormal fluctuation region of the current signal of the test sub-line according to the signal fluctuation steady-state value of each signal fluctuation region of the current signal of the test sub-line includes: Calculating an average value of the signal fluctuation steady-state values of all signal sampling points in the signal fluctuation area corresponding to the i-th signal sampling point; When the average value is less than a preset second threshold, the signal fluctuation area corresponding to the i-th signal sampling point is determined as an abnormal fluctuation area.

[0008] Preferably, determining the impedance interference coefficient of the abnormal fluctuation region according to the signal fluctuation steady-state value of the abnormal fluctuation region, the occurrence frequency of each signal maximum point in the abnormal fluctuation region, and the time distance between each signal maximum point and its adjacent minimum point includes: Calculate the product of the occurrence frequency of the xth signal maximum point in the jth abnormal fluctuation area and the time distance between the xth signal maximum point and its adjacent minimum point to obtain a first parameter of the xth signal maximum point; Multiplying the first parameters of all signal maximum points in the j-th abnormal fluctuation area to obtain the second parameter of the j-th abnormal fluctuation area; The second parameter of the j-th abnormal fluctuation region is corrected by using the signal fluctuation steady-state value of the j-th abnormal fluctuation region to obtain the impedance interference coefficient of the j-th abnormal fluctuation region; wherein x and j are positive integers.

[0009] Preferably, determining the signal transmission disorder factor of the connection terminal line according to the current average value of the test sub-line before the connection end and the current average value of the test sub-line after the connection end includes: Determine, based on the current values of the signal sampling points of the test sub-line at a voltage of 220V, the current average of the test sub-line before the connection end and the current average of the test sub-line after the connection end; Calculating a difference between a current average of the test sub-line before the connection end and a current average of the test sub-line after the connection end to obtain an alternative transmission disorder factor; The candidate transmission disorder factor is corrected according to a preset phase stability coefficient of the current signal of the test sub-line to obtain a signal transmission disorder factor of the connection terminal line.

[0010] Preferably, the preset phase stability coefficient is determined by: determining a phase delay of a connection end of the test sub-line under a plurality of preset load voltage conditions; The variance of the phase delay of the connection end of the test sub-line is determined as a preset phase stability coefficient.

[0011] Preferably, the method for determining the phase delay of the connection end of the test sub-line includes: The phase delay of the connection end of the test sub-line is determined based on the phase information of the signal frequency in the current signal of the test sub-line before the connection end, the phase information of the signal frequency in the current signal of the test sub-line after the connection end, and the component loss coefficient of the signal frequency in the current signal of the test sub-line.

[0012] Preferably, determining the electrical stability test result of the high-speed data connection terminal line according to the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area includes: The product of the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area is calculated, and the reciprocal of the product is determined as the electrical stability test result of the high-speed data connection terminal line.

[0013] Preferably, the method further comprises: The electrical stability test results of the high-speed data connection terminal line within a preset time interval are analyzed, and the cause of the abnormality is determined based on the analysis results.

[0014] The present invention has the following beneficial effects: The abnormal fluctuation area of the current signal of the test sub-line is determined based on the steady-state value of the signal fluctuation in each signal fluctuation area of the test sub-line; the impedance interference coefficient of the abnormal fluctuation area is determined based on the steady-state value of the signal fluctuation in the abnormal fluctuation area, the frequency of occurrence of each signal maximum point in the abnormal fluctuation area, and the time distance between each signal maximum point and its adjacent minimum point; the signal transmission disorder factor of the connecting terminal line is determined based on the current average value of the test sub-line before the connection end and the current average value of the test sub-line after the connection end; the electrical stability test result of the high-speed data connecting terminal line is determined based on the signal transmission disorder factor of the connecting terminal line and the impedance interference coefficient of the abnormal fluctuation area. It can be seen that by analyzing the signal in the abnormal fluctuation area, the electrical stability of the high-speed data connecting terminal line is evaluated from two aspects: the signal transmission disorder factor of the connecting terminal line and the impedance interference coefficient of the abnormal fluctuation area, so that the determined electrical stability test result of the high-speed data connecting terminal line is more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0016] Figure 1 A flow chart of a method for testing the electrical stability of a high-speed data connection terminal line provided by one embodiment of the present invention; Figure 2 A method flow chart of step S120 of a method for testing electrical stability of a high-speed data connection terminal line provided by one embodiment of the present invention; Figure 3 This is a flow chart of step S130 of a method for testing electrical stability of a high-speed data connection terminal line provided by one embodiment of the present invention. DETAILED DESCRIPTION

[0017] To further illustrate the technical means and effectiveness of the present invention in achieving its intended purpose, the following, in conjunction with the accompanying drawings and preferred embodiments, describes in detail the specific implementation, structure, features, and effectiveness of a method for testing the electrical stability of high-speed data connection terminal lines proposed by the present invention. In the following description, different references to "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. Furthermore, specific features, structures, or characteristics of one or more embodiments may be combined in any suitable manner.

[0018] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0019] A specific solution of a method for testing the electrical stability of a high-speed data connection terminal line provided by the present invention will be described in detail below with reference to the accompanying drawings.

[0020] See also Figure 1 , which shows a method flow chart of a method for testing the electrical stability of a high-speed data connection terminal line provided by one embodiment of the present invention. In an exemplary embodiment, a method for testing the electrical stability of a high-speed data connection terminal line is provided, comprising: S110, determining an abnormal fluctuation region of the current signal of the test sub-line according to a signal fluctuation steady-state value of each signal fluctuation region of the current signal of the test sub-line; S120, determining an impedance interference coefficient of the abnormal fluctuation region based on a signal fluctuation steady-state value of the abnormal fluctuation region, an occurrence frequency of each signal maximum point in the abnormal fluctuation region, and a time distance between each signal maximum point and its adjacent minimum point; S130, determining a signal transmission disorder factor of the connection terminal line according to a current average value of the test sub-line before the connection end and a current average value of the test sub-line after the connection end; S140 , determining an electrical stability test result of the high-speed data connection terminal line according to the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area.

[0021] In step S110, illustratively, the test sub-line can be a designated sub-line or an arbitrarily selected sub-line, which is not limited here. The current signal of the test sub-line is obtained by a current sensor. In this embodiment, a high-precision current sensor (such as a Hall effect sensor) with a range of 2 times the current to be measured, a frequency response of 50MHZ and an accuracy within ±1% is selected to ensure that the current signal passing through the test sub-line can be accurately captured. The input end of the current sensor is connected in parallel to the sub-line to be measured, and the connection is fixed with screws to ensure that the connection point is firm and meets the test requirements. The collected current signal data will be transmitted to the data processing platform via wireless network technology. On the data processing platform, the original current data is first preprocessed, including common signal processing methods such as denoising and data interpolation. These preprocessing steps are intended to improve signal quality for subsequent analysis. Finally, the preprocessed current signal data is stored for subsequent analysis and research.

[0022] Preferably, the method for determining the signal fluctuation steady-state value of each signal fluctuation area of the current signal of the test sub-line includes: determining the target window area corresponding to the i-th signal sampling point in the current signal of the test sub-line; determining the signal fluctuation steady-state value of the i-th signal sampling point based on the signal maximum value, signal minimum value and waveform disorder coefficient in the target window area; wherein i is a positive integer.

[0023] Exemplarily, several signal sampling points can be pre-set as a window area. Specifically, the real-time current signal data of the test sub-line in the past hour is obtained as the original analysis data. For any signal sampling point in the current signal of the test sub-line, a window area is set, and its step size is the set of 19 signal sampling points before the i-th signal sampling point. When the number of sampling points before the i-th signal sampling point is insufficient, all remaining sampling points are regarded as a window area. The current signal characteristics within the window area are regarded as the signal characteristics at the i-th signal sampling point. Then use the peak detection data to identify all signal peaks in the current signal data, use the dynamic time warping matching algorithm to identify the peak points corresponding to all signal peaks in the window area corresponding to the i-th signal sampling point, and calculate the variance of the distance between adjacent peak points. The above variance is regarded as the waveform disorder coefficient of the target window area corresponding to the i-th signal sampling point. The larger the value, the more abnormal changes the signal waveform has produced in the target window area. At the same time, the maximum value of the signal in the window area corresponding to the i-th signal sampling point is obtained. , and the minimum ; The formula for the steady-state value of the signal fluctuation at the i-th signal sampling point is as follows: in, Indicates the original analysis data of the test sub-line signal sampling points, Indicates the The signal sampling point corresponds to the maximum signal value in the area. Indicates the The signal sampling point corresponds to the minimum signal value in the area. Indicates the The waveform disorder coefficient in the area corresponding to each signal sampling point is: Indicates the The steady-state value of the signal fluctuation at each signal sampling point.

[0024] Furthermore, after determining the signal fluctuation steady-state values of all signal sampling points in the original analysis data of the test sub-line, it is necessary to re-partition the signal fluctuation regions of all signal sampling points to ensure the accuracy of the region division.

[0025] Preferably, the method for determining each signal fluctuation area of the current signal of the test sub-line includes: when the difference between the signal fluctuation steady-state value of the i-th signal sampling point and the signal fluctuation steady-state value of the i+1-th signal sampling point in the current signal of the test sub-line is less than a preset first threshold, determining that the i-th signal sampling point and the i+1-th signal sampling point are the same signal fluctuation area.

[0026] Specifically, a preset first threshold is set based on scenario experience Calculate the absolute value of the difference between each signal sampling point and its adjacent sampling point on the right. Adjacent signal sampling points whose absolute value of the difference in signal fluctuation steady-state values is less than a preset first threshold are considered to be in the same signal fluctuation region, thereby achieving the division of signal fluctuation regions.

[0027] Furthermore, step S110 includes: calculating the average value of the signal fluctuation steady-state values of all signal sampling points in the signal fluctuation area corresponding to the i-th signal sampling point; when the average value is less than a preset second threshold, determining the signal fluctuation area corresponding to the i-th signal sampling point as an abnormal fluctuation area.

[0028] Specifically, a preset second threshold is set based on scenario experience. After determining each signal fluctuation region, the average value of the signal fluctuation steady-state values of all signal sampling points within each signal fluctuation region is calculated to obtain the average value of the signal fluctuation steady-state value corresponding to each signal fluctuation region. The average value of the signal fluctuation steady-state value corresponding to each signal fluctuation region is compared with a preset second threshold value. Any value less than the preset second threshold value is marked as an abnormal fluctuation region, and any value less than the threshold value is not marked. In this way, the abnormal fluctuation region is demarcated.

[0029] In step S120, illustratively, an impedance mismatch point refers to a place in a circuit where the characteristic impedances between two components or lines are inconsistent, which will cause reflection and distortion of the signal during transmission. In the electrical stability test of high-speed data connections, the impedance mismatch between the connection terminal and the sub-line will cause the original current signal to be reflected, resulting in abnormal signal waveforms. These anomalies usually appear as periodic glitches or spikes, which are different from the random waveform changes caused by normal external interference. These signal anomalies will affect the subsequent electrical stability test results of the connection terminal line based on the current signal. Therefore, it is necessary to determine the impedance interference coefficient of the abnormal fluctuation area.

[0030] Preferably, if Figure 2 As shown, step S120 includes: S1210, calculating the occurrence frequency of the xth signal maximum point in the jth abnormal fluctuation area and the product of the time distance between the xth signal maximum point and its adjacent minimum point to obtain a first parameter of the xth signal maximum point; S1220, multiplying the first parameters of all signal maximum points in the j-th abnormal fluctuation region to obtain a second parameter of the j-th abnormal fluctuation region; S1230. Use the signal fluctuation steady-state value of the j-th abnormal fluctuation area to correct the second parameter of the j-th abnormal fluctuation area to obtain the impedance interference coefficient of the j-th abnormal fluctuation area.

[0031] Specifically, the set M of all signal maximum points in each abnormal fluctuation area and the frequency P of the current amplitude at the signal maximum point in the overall signal of the local area are obtained respectively, and the time distance between any data maximum point and the nearest minimum point in the current signal in the area is calculated. (i.e., the time distance between the xth signal maximum point and its adjacent minimum point).

[0032] The formula for the impedance interference coefficient of the jth abnormal fluctuation area is as follows: in, Indicates the test line d Abnormal fluctuation area, Indicates the The signal fluctuation steady-state value in the abnormal fluctuation area, Indicates the The set of all signal maximum points in the abnormal fluctuation area, Represents The first in the collection signal maximum points, Indicates the The signal maximum point is at The frequency of occurrence in the abnormal fluctuation area, Represents the time distance between the xth signal maximum point and the nearest minimum point, Represents the The impedance interference coefficient of each abnormally fluctuating area. It should be noted that when the transmission current signal has an interface with different impedances between the connection end and the sub-line, part of the signal will be reflected, resulting in periodic glitch signals in the local area. The frequency of these glitch signals is higher than that of the chaotic signals generated by external interference. In addition, the time interval between the maximum and minimum values in the glitch signal waveform will also increase.

[0033] In step S130 , illustratively, the current average value of the test sub-line before the connection terminal and the current average value of the test sub-line after the connection terminal are determined under a load voltage condition.

[0034] Preferably, if Figure 3As shown, step S130 includes: S1310, determining the current average of the test sub-line before the connection end and the current average of the test sub-line after the connection end according to the current value of each signal sampling point of the test sub-line under the voltage of 220V; S1320, calculating a difference between a current average of the test sub-line before the connection end and a current average of the test sub-line after the connection end, to obtain an alternative transmission disorder factor; S1330 : Correct the candidate transmission disorder factor according to the preset phase stability coefficient of the current signal of the test sub-line to obtain a signal transmission disorder factor of the connection terminal line.

[0035] Exemplarily, the preset phase stability coefficient is expressed as the variance of the signal phase delay. Preferably, the preset phase stability coefficient is determined by: determining the phase delay of the connection end of the test sub-line under multiple preset load voltage conditions; and determining the variance of the phase delay of the connection end of the test sub-line as the preset phase stability coefficient. The voltage load conditions include operating at 220V, 230V, and 240V.

[0036] Specifically, current data is collected over the past hour at all locations on the test sub-line's connection end (before, after, and at the connection end) under different voltage load conditions (i.e., 220V, 230V, and 240V). The phase delay of the current signal at the connection end of the test sub-line under each voltage condition is then calculated, and the variance of the connection end of the test sub-line under all load voltage conditions is determined. This variance is the preset phase stability coefficient. A larger value means that the fluctuation of the phase delay under different voltage load conditions increases significantly, indicating that there is instability in the connection between the connection end and the sub-line.

[0037] Among them, the method for determining the phase delay of the connection end of the test sub-line includes: determining the phase delay of the connection end of the test sub-line based on the phase information of the signal frequency in the current signal of the test sub-line before the connection end, the phase information of the signal frequency in the current signal of the test sub-line after the connection end, and the component loss coefficient of the signal frequency in the current signal of the test sub-line.

[0038] Specifically, in high-speed data transmission, an unstable connection between the terminal and the sub-line will increase the noise interference of the current signal. When the impedance interference is large, this instability will aggravate the abnormal fluctuations, thereby reducing the effective signal component in the signal. The current signal will produce a phase delay when passing through the junction between the terminal and the sub-line. This is mainly due to the relatively stable influence of the material properties and geometric structure of the two on signal propagation. Even under different voltage load conditions, the phase delay usually shows consistency. However, when the connection between the terminal and the line is unstable, it may cause the phase delay to deviate from the normal value, becoming more disordered.

[0039] Therefore, the current data of the test sub-line before and after the connection end are collected respectively, and the fast Fourier transform algorithm is used to convert all current signals from the time domain to the frequency domain, and the amplitude and phase information of each frequency component are obtained, and the number of all signal frequency components in the statistical signal is N, and the phase information of the signal target frequency component before the connection end is obtained. , and the phase information after the connection end . And use trigonometric functions to convert the phase information into data for subsequent calculation and analysis.

[0040] At the same time, calculate the mean impedance interference coefficient of all abnormal fluctuations of the sub-line current signal at the connection end , and regard it as the component loss coefficient. The larger the value, the stronger the interference noise the target signal frequency component is subjected to when passing through the connection end, and the greater the signal loss.

[0041] The formula for the phase delay of the target signal after passing through the connection end (i.e. the phase delay of the connection end of the test sub-line) is: in, Represents the set of all signal frequency components in the test sub-line current signal, express The first in the collection signal frequency, Indicates the Phase information of the signal frequency before the connection end, Indicates the The phase information of the signal frequency after the connection end, Indicates the The component loss coefficient of the signal frequency, Indicates the phase delay of the target signal after passing through the connection end.

[0042] It's important to note that comparing the phase information difference between the same frequency component before and after the connection effectively measures the phase delay of that frequency component. Furthermore, if the target frequency component experiences significant impedance interference while passing through the connection, this indicates significant signal component loss, reducing the effectiveness and quality of the frequency component. In the subsequent calculation of the overall signal phase delay, the contribution of this frequency component will be relatively small, thus helping to more accurately assess the phase delay of the target signal.

[0043] Specifically, the phase delay of the current signal at the connection end of the test sub-line under multiple load voltage conditions is calculated by the phase delay of the target signal after passing through the connection end, and then the variance of the phase delay of the current signal at the connection end under multiple load voltage conditions is calculated to obtain the preset phase stability coefficient.

[0044] Obtain the current value of each signal sampling point of the test sub-line under a voltage of 220V, and calculate the current average value of the test sub-line before the connection end and the current average value of the test sub-line after the connection end. The current average value of the test sub-line before the connection end represents the average value of the sub-line current data before the connection end of the test sub-line current signal under a voltage of 220V; the current average value of the test sub-line after the connection end represents the average value of the sub-line current data after the connection end of the test sub-line current signal under a voltage of 220V.

[0045] The calculation formula for the signal transmission disorder factor of the connecting terminal line is as follows: in, Indicates the phase stability coefficient of the test sub-line current signal, Indicates the average current of the test sub-line before the connection end, The average current of the test sub-line after the connection terminal, Indicates the signal transmission disorder factor of the connecting terminal line, represents the alternative transmission disorder factor.

[0046] It should be noted that in the electrical stability test of high-speed data connection terminal lines, when there is an unstable connection at the connection end, it will cause the sub-line signal transmission to be disordered, causing the sub-line transmission current to have different degrees of phase delay under different voltage load conditions. At the same time, the unstable connection is more likely to cause the signal to be interfered with by the outside world, causing the current signal to attenuate. This situation may cause data transmission errors or delays. Therefore, by analyzing the signal stability of the sub-line under different voltage load conditions through the phase stability coefficient, it is possible to improve the accuracy of the signal transmission disorder factor of the connection terminal line, thereby improving the accuracy of the electrical stability test results of the high-speed data connection terminal line.

[0047] In step S140, the impedance interference coefficient of the abnormal fluctuation region is illustratively represented by the average impedance interference coefficient of all abnormal fluctuation regions in the target high-speed data connection terminal line current signal. A larger value indicates a higher garbled bit rate during signal transmission at the target high-speed data connection terminal, i.e., poor signal quality.

[0048] Preferably, step S140 includes: calculating the product of the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area, and determining the reciprocal of the product as the electrical stability test result of the high-speed data connection terminal line.

[0049] Specifically, the electrical stability test result formula of the high-speed data connection terminal line is as follows: in, Indicates the signal transmission disorder factor of the connecting terminal line, The impedance interference coefficient representing the abnormal fluctuation area, Indicates the electrical stability test results of high-speed data connection terminal lines.

[0050] In the technical solution of the present application, the abnormal fluctuation area of the current signal of the test sub-line is determined according to the signal fluctuation steady-state value of each signal fluctuation area of the current signal of the test sub-line; the impedance interference coefficient of the abnormal fluctuation area is determined according to the signal fluctuation steady-state value of the abnormal fluctuation area, the frequency of occurrence of each signal maximum point in the abnormal fluctuation area, and the time distance between each signal maximum point and its adjacent minimum point; the signal transmission disorder factor of the connecting terminal line is determined according to the current average value of the test sub-line before the connecting end and the current average value of the test sub-line after the connecting end. According to the signal transmission disorder factor of the connecting terminal line and the impedance interference coefficient of the abnormal fluctuation area, the electrical stability test result of the high-speed data connecting terminal line is determined. It can be seen that by analyzing the signal in the abnormal fluctuation area, the electrical stability of the high-speed data connecting terminal line is evaluated from two aspects: the signal transmission disorder factor of the connecting terminal line and the impedance interference coefficient of the abnormal fluctuation area, so that the determined electrical stability test result of the high-speed data connecting terminal line is more accurate.

[0051] In one embodiment, the method further comprises: The electrical stability test results of the high-speed data connection terminal line within a preset time interval are analyzed, and the cause of the abnormality is determined based on the analysis results.

[0052] Specifically, the preset time interval can be a time value set according to actual needs. In this embodiment, the electrical stability test results of the high-speed data connection terminal line within the preset time interval are obtained to facilitate analysis, such as statistical analysis (such as mean, standard deviation, maximum value, minimum value, etc.) and trend analysis. Based on the statistical and trend analysis results, the cause of any abnormality can be identified. For example, waveform analysis, spectrum analysis, and other techniques can be used to locate the source of the problem, such as a poor connection or interference source. Furthermore, a continuous monitoring mechanism can be established to regularly test the electrical stability of the connection terminal to ensure long-term reliability.

[0053] In other embodiments, a device is provided, comprising a memory and a processor. The memory is configured to store executable program code, and the processor is configured to retrieve and execute the executable program code from the memory, causing the device to perform the aforementioned method for testing the electrical stability of high-speed data connection terminal lines. The device may be a chip, component, or module, and the chip may include a connected processor and memory. The memory is configured to store instructions, and when the processor retrieves and executes the instructions, the chip can perform the aforementioned method for testing the electrical stability of high-speed data connection terminal lines.

[0054] In other embodiments, a computer program product is also provided. When the computer program product is run on a computer, the computer is caused to execute the above-mentioned related steps to implement a method for testing the electrical stability of a high-speed data connection terminal line provided in the above embodiment.

[0055] In other embodiments, a computer-readable storage medium is also provided, which stores computer program code. When the computer program code is run on a computer, the computer executes the above-mentioned related method steps to implement a method for testing the electrical stability of high-speed data connection terminal lines provided in the above embodiment.

[0056] Among them, the provided systems, devices, computer program products, and computer-readable storage media are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be repeated here.

[0057] It should be noted that the order in which the embodiments of the present invention are described above is for illustrative purposes only and does not necessarily represent the superiority or inferiority of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or sequential order shown to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0058] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments.

Claims

1. A method for testing the electrical stability of high-speed data connection terminals, characterized in that: The method comprises: determining an abnormal fluctuation region of the current signal of the test sub-line according to a signal fluctuation steady-state value of each signal fluctuation region of the current signal of the test sub-line; Determining the impedance interference coefficient of the abnormal fluctuation area based on the signal fluctuation steady-state value of the abnormal fluctuation area, the occurrence frequency of each signal maximum point in the abnormal fluctuation area, and the time distance between each signal maximum point and its adjacent minimum point; Determining a signal transmission disorder factor of the connection terminal line according to an average current value of the test sub-line before the connection end and an average current value of the test sub-line after the connection end; An electrical stability test result of the high-speed data connection terminal line is determined according to the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area.

2. The method according to claim 1, characterized in that The method for determining each signal fluctuation area of the current signal of the test sub-line includes: When the difference between the signal fluctuation steady-state value of the i-th signal sampling point and the signal fluctuation steady-state value of the i+1-th signal sampling point in the current signal of the test sub-line is less than a preset first threshold, it is determined that the i-th signal sampling point and the i+1-th signal sampling point are in the same signal fluctuation area; wherein i is a positive integer.

3. The method according to claim 2, characterized in that The method for determining the signal fluctuation steady-state value of each signal fluctuation region of the current signal of the test sub-line includes: Determine a target window area corresponding to an i-th signal sampling point in the current signal of the test sub-line; The signal fluctuation steady-state value of the i-th signal sampling point is determined according to the signal maximum value, signal minimum value and waveform disorder coefficient in the target window area.

4. The method according to claim 3, characterized in that Determining an abnormal fluctuation region of the current signal of the test sub-line according to a signal fluctuation steady-state value of each signal fluctuation region of the current signal of the test sub-line includes: Calculating an average value of the signal fluctuation steady-state values of all signal sampling points in the signal fluctuation area corresponding to the i-th signal sampling point; When the average value is less than a preset second threshold, the signal fluctuation area corresponding to the i-th signal sampling point is determined as an abnormal fluctuation area.

5. The method according to claim 1, characterized in that Determining the impedance interference coefficient of the abnormal fluctuation region according to the signal fluctuation steady-state value of the abnormal fluctuation region, the occurrence frequency of each signal maximum point in the abnormal fluctuation region, and the time distance between each signal maximum point and its adjacent minimum point includes: Calculate the product of the occurrence frequency of the xth signal maximum point in the jth abnormal fluctuation area and the time distance between the xth signal maximum point and its adjacent minimum point to obtain a first parameter of the xth signal maximum point; Multiplying the first parameters of all signal maximum points in the j-th abnormal fluctuation area to obtain the second parameter of the j-th abnormal fluctuation area; The second parameter of the j-th abnormal fluctuation region is corrected by using the signal fluctuation steady-state value of the j-th abnormal fluctuation region to obtain the impedance interference coefficient of the j-th abnormal fluctuation region; wherein x and j are positive integers.

6. The method according to claim 2, characterized in that Determining a signal transmission disorder factor of the connection terminal line according to a current average value of the test sub-line before the connection end and a current average value of the test sub-line after the connection end includes: Determine, based on the current values of the signal sampling points of the test sub-line at a voltage of 220V, the current average of the test sub-line before the connection end and the current average of the test sub-line after the connection end; Calculating a difference between a current average of the test sub-line before the connection end and a current average of the test sub-line after the connection end to obtain an alternative transmission disorder factor; The candidate transmission disorder factor is corrected according to a preset phase stability coefficient of the current signal of the test sub-line to obtain a signal transmission disorder factor of the connection terminal line.

7. The method according to claim 6, characterized in that The preset phase stability coefficient is determined by: determining a phase delay of a connection end of the test sub-line under a plurality of preset load voltage conditions; The variance of the phase delay of the connection end of the test sub-line is determined as a preset phase stability coefficient.

8. The method according to claim 7, characterized in that The method for determining the phase delay of the connection end of the test sub-line includes: The phase delay of the connection end of the test sub-line is determined based on the phase information of the signal frequency in the current signal of the test sub-line before the connection end, the phase information of the signal frequency in the current signal of the test sub-line after the connection end, and the component loss coefficient of the signal frequency in the current signal of the test sub-line.

9. The method according to claim 1, characterized in that Determining an electrical stability test result of the high-speed data connection terminal line according to the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area includes: The product of the signal transmission disorder factor of the connection terminal line and the impedance interference coefficient of the abnormal fluctuation area is calculated, and the reciprocal of the product is determined as the electrical stability test result of the high-speed data connection terminal line.

10. The method according to any one of claims 1 to 9, characterized in that The method further comprises: The electrical stability test results of the high-speed data connection terminal line within a preset time interval are analyzed, and the cause of the abnormality is determined based on the analysis results.

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