Integrated detector self-debugging method and system

By performing frequency domain analysis and noise correction on the integrated detector signal, the problem of noise interference in traditional debugging methods is solved, the debugging accuracy and reliability of the detector are improved, and efficient debugging in complex environments is adapted.

CN120446918AActive Publication Date: 2025-08-08CHANGCHUN ZHONGKE CHANGGUANG SPATIOTEMPORAL PHOTOELECTRIC TECH CO LTD +1
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Patent Information

Application Number
CN202510964408.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-07-14
Publication Date
2025-08-08
Estimated Expiration
2045-07-14

AI Technical Summary

Technical Problem

Traditional detector debugging methods are difficult to effectively deal with complex noise interference, resulting in misjudgment of echo signals in lidar systems and reduced signal-to-noise ratio in optical communication systems, affecting the accuracy and reliability of the detector and failing to meet the actual application needs.

Method used

By frequency domain transformation of the basic signals received by the integrated detector and the laser signal, the energy and correlation of the defrequency signal are analyzed, the noise intensity and information loss degree are determined, the noise is corrected by quantizing energy and information entropy, and the denoising strategy is automatically adjusted to realize self-debugging.

Benefits of technology

It improves the quality and clarity of the laser signal, optimizes the noise suppression ability, ensures the performance consistency and stability of the detector under different operating conditions, reduces manual intervention, and improves debugging efficiency and adaptability.

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Abstract

The invention relates to the technical field of data processing, in particular to an integrated detector self-debugging method and system. The method comprises the following steps: acquiring a basic signal and a laser signal of the integrated detector under each working condition when each equipment index is debugged, and multiple groups of de-frequency signals of the basic signal and the laser signal; determining the noise intensity of each group of de-frequency signals of the basic signal; determining the information missing degree of each group of de-frequency signals of the laser signals; determining de-noised laser signals of the integrated detector under various working conditions when various equipment indexes are debugged; and debugging the integrated detector based on the de-noised laser signal. By analyzing the frequency domain signals of the basic signals and the laser signals, different types of noise signals can be accurately identified, the intensity of the noise signals can be quantized, and interference of effective signals and noise can be distinguished; by adopting quantization modes such as energy and information entropy, noise in a laser signal is corrected, and the influence of background noise on the performance of the detector is reduced.
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Description

Technical Field

[0001] The present invention relates to the technical field of data processing, and in particular to a self-debugging method and system for an integrated detector. Background Art

[0002] In fields such as communications and radar, integrated detectors are widely used due to their high integration and high performance. The core working principle of laser detectors is to convert received light signals into current signals, thereby obtaining the intensity and waveform of the current signal corresponding to the laser signal, thereby achieving accurate detection of the laser signal. With the development of cutting-edge technologies such as 5G / 6G communications, unmanned laser radar, and quantum communications, integrated detectors need to adapt to more complex usage scenarios, such as high-dynamic range lighting environments, areas of strong electromagnetic interference, and ultra-long-distance detection requirements. In practical applications, real-time and precise debugging of detectors has become a key link in ensuring system performance.

[0003] However, during the detector debugging process, multiple noise signals are inevitably superimposed on the optical signal received by the detector. These noises come from a wide range of sources, including the detector's own dark current noise and thermal noise, as well as background light noise and electromagnetic interference noise from the external environment. In lidar systems, background light noise can interfere with the detection of echo signals, leading to misjudgments of target distance and position; in optical communication systems, thermal noise can reduce the signal-to-noise ratio and cause data transmission errors. Traditional debugging methods have difficulty effectively dealing with the interference of these complex noises. During actual debugging, noise signals can interfere with the accurate recognition of laser signals, affecting the accuracy and reliability of detector debugging, resulting in a decline in detector performance and an inability to meet actual application requirements. Therefore, a method to reduce the impact of noise on detector debugging is urgently needed. Summary of the Invention

[0004] In order to solve the problems that, during the debugging process of the detector, multiple noise signals are inevitably superimposed on the optical signal received by the detector, in the lidar system, background light noise will interfere with the detection of the echo signal, resulting in misjudgment of the target distance and position; in the optical communication system, thermal noise will reduce the signal-to-noise ratio of the signal, causing data transmission errors; traditional debugging methods are difficult to effectively deal with the interference of these complex noises. In the actual debugging process, the noise signal will interfere with the accurate identification of the laser signal, affecting the accuracy and reliability of the detector debugging, resulting in a decline in the detector performance and an inability to meet the actual application requirements, the present invention provides an integrated detector self-debugging method and system.

[0005] In a first aspect, the present invention provides a self-debugging method for an integrated detector, which adopts the following technical solution: A self-debugging method for an integrated detector includes: recording any operating condition of the integrated detector when debugging any equipment indicator as a target operating condition, obtaining current signals before and after the integrated detector receives a laser electrical signal within the same duration under the target operating condition, recording the current signal before the integrated detector receives the laser electrical signal as a base signal, and recording the current signal after the integrated detector receives the laser electrical signal as a laser signal; converting both the base signal and the laser signal into frequency domain signals to obtain multiple groups of de-frequencyed signals corresponding one-to-one to the base signal and the laser signal; determining the noise intensity of each group of de-frequencyed signals of the base signal based on the energy of the base signal, the energy of each group of de-frequencyed signals of the base signal, and the correlation between the base signal and each group of de-frequencyed signals of the base signal; determining the degree of information loss of each group of de-frequencyed signals of the laser signal based on the information entropy of the laser signal and the information entropy of each group of de-frequencyed signals of the laser signal; correcting each group of de-frequencyed signals of the laser signal based on the noise intensity and the degree of information loss to determine the denoised laser signal of the integrated detector under the target operating condition; and debugging the integrated detector based on the denoised laser signal.

[0006] The beneficial effects are: by performing frequency domain transformation on the basic signal and the laser signal and analyzing the energy and correlation of the de-frequencyed signals, the noise intensity is accurately evaluated, and then the noise of different frequency components in the laser signal is corrected in a targeted manner, effectively improving the quality and clarity of the laser signal; combining information entropy to evaluate the information loss of each group of de-frequencyed signals of the laser signal, it is possible to sensitively capture information damage caused by noise, optimize the signal denoising strategy, and enhance the system's ability to suppress various complex noises such as background light noise and thermal noise; through a debugging method based on the denoised laser signal, it is possible to avoid misjudgments and errors caused by noise interference in traditional methods, improve the performance consistency and stability of the detector under different working conditions, and ensure the accuracy of equipment indicator debugging; through automatic calculation of noise intensity and information loss, signal correction is completed independently, reducing manual intervention and complex debugging steps, and improving the system's adaptability and debugging efficiency.

[0007] Furthermore, the conversion of the basic signal and the laser signal into frequency domain signals is performed through Fourier transform.

[0008] Furthermore, the multiple groups of de-frequencyed signals are obtained as follows: each frequency with a non-zero amplitude in the frequency domain signal of the basic signal is marked as 0 to obtain several initial de-frequencyed signals of the basic signal, and the multiple initial de-frequencyed signals of the basic signal are converted into time domain signals and recorded as several converted de-frequencyed signals of the basic signal; each frequency with a non-zero amplitude in the frequency domain signal of the laser signal and the frequency domain signal of the basic signal that has a non-zero amplitude at the corresponding position is marked as 0 to obtain several initial de-frequencyed signals of the laser signal, and the multiple initial de-frequencyed signals of the laser signal are converted into time domain signals and recorded as several converted de-frequencyed signals of the laser signal; the converted de-frequencyed signals marked at the same frequency position in the frequency domain signals of the basic signal and the laser signal are recorded as a group of de-frequencyed signals that correspond one-to-one to the basic signal and the laser signal, and multiple groups of de-frequencyed signals that correspond one-to-one to the basic signal and the laser signal are obtained.

[0009] Furthermore, the conversion of the plurality of initial frequency-removed signals into time domain signals is performed through inverse Fourier transform.

[0010] Furthermore, the noise intensity satisfies: Where, The basic signal The noise intensity of the frequency-removed signal, is the energy of the basic signal, The basic signal The energy of the frequency signal is removed. The basic signal and the basic signal The correlation between the frequency signals of the group is removed. is the normalized function of the correlation.

[0011] The beneficial effect is that by combining the energy and correlation of the frequency-removed signal, the strength of the noise components in signals of different frequency bands can be accurately reflected, avoiding the deviation caused by relying solely on energy or correlation, and improving the accuracy of noise intensity assessment.

[0012] Furthermore, the correlation adopts cosine similarity.

[0013] Furthermore, the degree of information loss satisfies: Where, The laser signal The degree of information loss of the group-de-frequency signal, is the information entropy of the laser signal, The laser signal The information entropy of the group-de-frequency signal, is a linear normalization function.

[0014] The beneficial effects are: using the difference between the overall information entropy and the information entropy of each group to measure the size of the information loss can scientifically identify which frequency band signals have information missing due to noise or interference, thereby providing an objective basis for subsequent signal correction; through linear normalization, the numerical values of the degree of information loss in different frequency bands have a unified dimension and standard, which facilitates the reasonable allocation of weights in weighted fusion and improves the stability and robustness of the algorithm.

[0015] Furthermore, the denoised laser signal satisfies: Where, To integrate the de-noised laser signal of the detector under the target working condition, is the number of groups of frequency-removed signals, The basic signal The noise intensity of the frequency-removed signal, The laser signal The degree of information loss of the group-de-frequency signal, The laser signal Group frequency signal, It is a custom parameter used to adjust the influence of noise intensity and information loss degree on weights in weighted fusion.

[0016] The beneficial effects are: by weighting the noise intensity and information missing degree index, the weights of different frequency components in the denoised signal are dynamically adjusted, so that the contribution of frequency components with severe noise or significant information missing is reduced, high-quality signals are highlighted, and the overall signal purity is improved; custom parameters allow debugging personnel to freely adjust the impact of noise and information missing according to different application requirements, realize personalized optimization of denoising strategies, and adapt to different scenarios and noise environments; the weighted fusion mechanism reasonably distributes the signal contribution of each frequency band, reduces the signal distortion caused by traditional simple filtering denoising, realizes high-quality laser signal recovery, and optimizes the response performance of the detector.

[0017] Furthermore, the debugging of the integrated detector based on the denoised laser signal includes: when debugging any device indicator of the integrated detector, the working condition corresponding to the denoised laser signal of the integrated detector under all working conditions with the highest similarity to the ideal laser electrical signal is used as the final working condition of the integrated detector when debugging the device indicator, so as to realize self-debugging of the integrated detector.

[0018] The beneficial effects are: automatically identifying the working state that best matches the ideal signal, avoiding the traditional tedious process of relying on manual experience judgment and repeated experiments, and improving the intelligence level of debugging; there is no need for manual screening of working conditions and signals, and the algorithm automatically completes the optimal matching of working conditions, greatly shortening the debugging cycle and reducing manpower and test resource consumption; by accurately determining the optimal working conditions, assisting in detector parameter adjustment and performance optimization, ensuring that the equipment achieves optimal working performance in actual use and meets the needs of high precision and high stability.

[0019] In a second aspect, the present invention provides an integrated detector self-debugging system, which adopts the following technical solution: An integrated detector self-debugging system includes: a processor and a memory, wherein the memory stores computer program instructions, and when the computer program instructions are executed by the processor, the above-mentioned integrated detector self-debugging method is implemented.

[0020] By adopting the above technical solution, the above-mentioned integrated detector self-debugging method is generated into a computer program and stored in a memory to be loaded and executed by a processor, thereby making a terminal device based on the memory and the processor for easy use.

[0021] The present invention has the following technical effects: By analyzing the frequency domain signals of the basic signal and the laser signal, different types of noise signals can be accurately identified and their intensities can be quantified to ensure that the interference between the effective signal and the noise can be distinguished; by using quantification methods such as energy and information entropy, the noise components in the laser signal are corrected, which significantly reduces the impact of background noise on the detector performance, improves the signal-to-noise ratio of the signal, and thus improves the overall detection accuracy of the system; in the actual debugging process, it can be adjusted according to the denoised laser signal under the current working conditions of the detector, so that the system can continue to provide efficient and accurate debugging results in different working environments; the present invention can handle multiple different types of noise (such as background light noise and thermal noise, etc.), so that the detector can work normally in complex environments and can effectively resist external interference. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a flow chart of a method for self-debugging an integrated detector according to an embodiment of the present invention. DETAILED DESCRIPTION

[0023] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work shall fall within the scope of protection of the present invention.

[0024] The embodiment of the present invention discloses a self-debugging method for an integrated detector, referring to Figure 1 , including steps S01 to S05: S01: Obtaining basic signals and laser signals of the integrated detector under various working conditions when debugging various equipment indicators, as well as multiple groups of frequency-removed signals of the basic signals and the laser signals.

[0025] Any working condition of the integrated detector during the debugging of any equipment indicator is recorded as the target working condition, and the current signals of the integrated detector before and after receiving the laser electrical signal within the same duration under the target working condition (for example, the acquisition duration is 10 seconds and the acquisition frequency is 1s / time) are obtained. The current signal before the integrated detector receives the laser electrical signal is recorded as the basic signal, and the current signal after the integrated detector receives the laser electrical signal is recorded as the laser signal. Both the basic signal and the laser signal are converted into frequency domain signals to obtain multiple groups of de-frequencyed signals with one-to-one correspondence between the basic signal and the laser signal.

[0026] Specifically, the conversion of the basic signal and the laser signal into frequency domain signals is performed through Fourier transform.

[0027] Specifically, the multiple groups of frequency-removed signals are obtained in the following manner: Mark each frequency with a non-zero amplitude in the frequency domain signal of the basic signal as 0, and obtain several initial frequency-removed signals of the basic signal. Convert the several initial frequency-removed signals of the basic signal into time domain signals and record them as several converted frequency-removed signals of the basic signal. For example, if the frequency domain signal of the basic signal is (0100010002), then the first group of initial frequency-removed signals is (0000010002), the second group of initial frequency-removed signals is (0100000002), and the third group is (0100010000). Only the amplitude of one frequency in the frequency domain signal of the basic signal is changed each time. Each frequency in the frequency domain signal of the laser signal that has a non-zero amplitude and appears in the frequency domain signal of the base signal is marked as 0, and a number of initial frequency-de-frequencyed signals of the laser signal are obtained. The several initial frequency-de-frequencyed signals of the laser signal are converted into time domain signals and recorded as a number of converted frequency-de-frequencyed signals of the laser signal. For example, if the frequency domain signal of the laser signal is (0001020003, where the first value is 0, representing that the amplitude of the first frequency is 0, the second value is 0, representing that the amplitude of the second frequency is 0, ..., the fourth value is 1, representing that the amplitude of the fourth frequency is 1, and so on), then the first group of initial frequency-de-frequencyed signals is (0001000003), and the second group of initial frequency-de-frequencyed signals is (0001020000). Each time, only the amplitude of a frequency in the frequency domain signal of the laser signal that has the same position as that in the frequency domain signal of the base signal is changed. The frequency-domain signals of the basic signal and the laser signal, in which the conversion and de-frequency signals marked at the same frequency position are recorded as a group of de-frequency signals corresponding one-to-one to the basic signal and the laser signal, thereby obtaining multiple groups of de-frequency signals corresponding one-to-one to the basic signal and the laser signal. For example, the frequency domain signals of the first group of de-frequency signals corresponding one-to-one to the basic signal and the laser signal before conversion (i.e., the initial de-frequency signals) are (0100000002) and (0001000003), and the frequency domain signals of the second group of de-frequency signals corresponding one-to-one to the basic signal and the laser signal before conversion are (0100010000) and (0001020000).

[0028] Specifically, the conversion of the several initial frequency-removed signals into time domain signals is performed through inverse Fourier transform.

[0029] S02: Determine the noise intensity of each group of frequency-removed signals of the basic signal.

[0030] It should be noted that before the detector receives the laser signal, it will have a certain amount of dark current, thermal noise, and background noise caused by background light. After the detector receives the laser signal, this noise will be superimposed on the electrical signal of the laser signal, thus affecting the recognition and use of the laser signal. Therefore, this step obtains the noise intensity based on the current signal before the detector receives the laser electrical signal.

[0031] The noise intensity of each group of frequency-removed signals of the basic signal is determined according to the energy of the basic signal, the energy of each group of frequency-removed signals of the basic signal, and the correlation between the basic signal and each group of frequency-removed signals of the basic signal.

[0032] Specifically, the noise intensity satisfies: ; Where, The basic signal The noise intensity of the frequency-removed signal, is the energy of the basic signal, The basic signal The energy of the frequency signal is removed. The basic signal and the basic signal The correlation between the frequency signals of the group is removed. is the normalized function of the correlation.

[0033] Specifically, the correlation adopts cosine similarity.

[0034] Among them, since the basic signal is the current signal output when the detector does not receive the laser electrical signal, the data in the basic signal are all noise data. Indicates the The relative size of the energy of the group frequency-removed signal. The larger the value, the The smaller the effect of the group frequency on the basic signal, the The smaller the effect of the group frequency on the noise data, the The smaller the noise intensity of the group-de-frequency signal (i.e., the frequency marked as 0); the smaller the value, the The greater the effect of the group frequency on the basic current signal, the The greater the effect of the group frequency on the noise data, the The greater the noise intensity of the group-removed frequency signal. Indicates the basic signal and the The similarity between the frequency-removed signals of the first group is larger. The larger the value is, the closer the basic signal is to the first group. The more similar the frequency signals of the groups are, the more The smaller the effect of the frequencies marked as 0 in the frequency-removed signal on the noise data, the The smaller the noise intensity of the frequency-removed signal, the smaller the value is. The greater the difference between the frequency signals of the groups, the higher the noise data The greater the influence of the frequency marked as 0 in the frequency-removed signal, the greater the influence of the first The greater the noise intensity of the group-removed frequency signal.

[0035] S03: Determine the degree of information loss of each group of de-frequency signals of the laser signal.

[0036] It should be noted that, due to the randomness of noise, the noise in the current signal generated after the detector receives the laser electrical signal is different from the basic signal, so the laser signal cannot be denoised by directly subtracting the basic signal, and some frequencies in the noise data are relatively fixed, and the laser electrical signal can be denoised by removing some frequencies in the laser electrical signal; since there may be a situation where the useful signal and the noise signal in the signal overlap in the frequency domain, that is, some frequencies may correspond to both the noise signal and the useful signal, it is necessary to remove the noise signal while retaining the useful signal in order to effectively utilize the laser signal, and the noise signal often only has a small impact on the laser signal, and only removing the noise signal will not significantly change the information entropy of the laser signal. Therefore, this step obtains the degree of information loss of each group of de-frequency signals of the laser signal through the information entropy of the de-frequency signal of the laser signal.

[0037] The degree of information loss of each group of de-frequencyed signals of the laser signal is determined according to the information entropy of the laser signal and the information entropy of each group of de-frequencyed signals of the laser signal.

[0038] Specifically, the degree of information missing satisfies: ; Where, The laser signal The degree of information loss of the group-de-frequency signal, is the information entropy of the laser signal, The laser signal The information entropy of the group-de-frequency signal, is a linear normalization function.

[0039] in, Indicates the laser signal and the laser signal The difference in information entropy between the frequency-demultiplexed signals, The larger the value, the more the first The greater the influence of the frequency marked as 0 in the group frequency signal on the laser signal, the greater the influence of the frequency marked as 0 on the laser signal. The greater the degree of information loss of the group-defrequency signal; The smaller it is, the more the laser signal is removed. The smaller the effect of the frequency marked as 0 in the group frequency signal on the laser signal, the The smaller the group frequency is, the smaller the degree of information loss of the signal is.

[0040] S04: Determine the denoised laser signal of the integrated detector under various working conditions when debugging various equipment indicators.

[0041] It should be noted that each set of de-frequencyed laser signal signals removes some noise signals to varying degrees. By fusing these de-frequencyed laser signal groups, noise signals at each frequency can be removed. However, removing noise signals from some de-frequencyed laser signals may also remove useful signals. Therefore, to avoid removing useful signals during the de-noising process, this step denoises the laser signal based on noise intensity and the degree of information loss. The detector is then debugged using the de-noised laser signal.

[0042] According to the noise intensity and the degree of information loss, each group of de-frequencyed signals of the laser signal is corrected to determine the de-noised laser signal of the integrated detector under the target working condition.

[0043] Specifically, the denoised laser signal satisfies: ; Where, To integrate the de-noised laser signal of the detector under the target working condition, is the number of groups of frequency-removed signals, The basic signal The noise intensity of the frequency-removed signal, The laser signal The degree of information loss of the group-de-frequency signal, The laser signal Group frequency signal, It is a custom parameter used to adjust the influence of noise intensity and information loss degree on weights in weighted fusion.

[0044] Implementers can set the values of custom parameters according to the specific implementation situation to ensure That is, for example, 1.

[0045] Among them, Group frequency signal is a sequence. Multiplying a sequence by a value means multiplying each value in the sequence by the value, and the result is also a sequence. Adding each sequence to the sequence means adding the values at the same position in the sequence, and the result is also a sequence. For example, , . The larger the value, the more the first The frequencies marked as 0 in the frequency group are removed to achieve the denoising of the laser electrical signal. When performing signal fusion, Should have a greater proportion; The smaller it is, the less need there is to remove the first The frequencies marked as 0 in the frequency removal signal are used to avoid removing the useful signals in the laser electrical signal. Since the frequencies of the noise signal and the useful signal overlap, the useful signals in the laser electrical signal may be mistakenly eliminated in the process of forming the frequency removal signal of some laser signals, which may cause the useful signals in the laser electrical signal to be missing after denoising. Therefore, Use the gamma transform Make a downward correction. The bigger it is, If it is greater than 1, right The greater the downward correction degree is, the smaller the proportion of the de-frequency signal of the laser signal with a greater degree of information loss will be in the denoised laser electrical signal. The smaller the time, The closer it is to 1, the right The smaller the degree of downward correction, the smaller the degree of information loss, and the greater the proportion of the de-frequency signal in the denoised laser electrical signal. As The laser electrical signal is denoised by fusing multiple frequency-reduced signals.

[0046] S05: Debugging the integrated detector based on the denoised laser signal.

[0047] Specifically, debugging the integrated detector based on the denoised laser signal includes: When debugging any device indicator of the integrated detector (for example, the working voltage of the detector), the working condition corresponding to the denoised laser signal of the integrated detector under all working conditions (various working voltages) in which the similarity between the denoised laser signal and the ideal laser electrical signal is the highest is used as the final working condition (working voltage of the detector) of the integrated detector when debugging the device indicator, so as to realize self-debugging of the integrated detector.

[0048] An embodiment of the present invention further discloses an integrated detector self-debugging system, comprising a processor and a memory, wherein the memory stores computer program instructions, and when the computer program instructions are executed by the processor, an integrated detector self-debugging method according to the present invention is implemented.

[0049] The above system also includes other components well known to those skilled in the art, such as a communication bus and a communication interface. The configuration and functions of these components are known in the art and will not be described in detail here.

[0050] The above are all preferred embodiments of the present invention, and are not intended to limit the scope of protection of the present invention. Therefore, any equivalent changes made based on the structure, shape, and principle of the present invention should be included in the scope of protection of the present invention.

Claims

1. A self-debugging method for an integrated detector, characterized in that: include: Any working condition of the integrated detector during the debugging of any equipment indicator is recorded as a target working condition, and the current signals of the integrated detector before and after receiving the laser electrical signal within the same time period under the target working condition are obtained. The current signal before the integrated detector receives the laser electrical signal is recorded as a basic signal, and the current signal after the integrated detector receives the laser electrical signal is recorded as a laser signal. Both the basic signal and the laser signal are converted into frequency domain signals to obtain multiple sets of frequency-decoupled signals with one-to-one correspondence between the basic signal and the laser signal; determining the noise intensity of each group of frequency-removed signals of the base signal according to the energy of the base signal, the energy of each group of frequency-removed signals of the base signal, and the correlation between the base signal and each group of frequency-removed signals of the base signal; Determining the degree of information loss of each group of de-frequencyed signals of the laser signal according to the information entropy of the laser signal and the information entropy of each group of de-frequencyed signals of the laser signal; According to the noise intensity and the degree of information loss, each group of de-frequencyed signals of the laser signal is corrected to determine the de-noised laser signal of the integrated detector under the target working condition; The integrated detector is debugged based on the denoised laser signal.

2. The integrated detector self-debugging method according to claim 1, characterized in that: The conversion of the basic signal and the laser signal into frequency domain signals is performed through Fourier transformation.

3. The integrated detector self-debugging method according to claim 1, characterized in that: The multiple groups of frequency-removed signals are obtained as follows: each frequency with a non-zero amplitude in the frequency domain signal of the basic signal is marked as 0 to obtain several initial frequency-removed signals of the basic signal, and the multiple initial frequency-removed signals of the basic signal are converted into time domain signals and recorded as several converted frequency-removed signals of the basic signal; each frequency with a non-zero amplitude in the frequency domain signal of the laser signal and the frequency domain signal of the basic signal that has a non-zero amplitude at the corresponding position is marked as 0 to obtain several initial frequency-removed signals of the laser signal, and the multiple initial frequency-removed signals of the laser signal are converted into time domain signals and recorded as several converted frequency-removed signals of the laser signal; the converted frequency-removed signals marked at the same frequency position in the frequency domain signals of the basic signal and the laser signal are recorded as a group of frequency-removed signals that correspond one-to-one to the basic signal and the laser signal, and multiple groups of frequency-removed signals that correspond one-to-one to the basic signal and the laser signal are obtained.

4. The integrated detector self-debugging method according to claim 3, characterized in that: The conversion of the several initial frequency-removed signals into time domain signals is performed through inverse Fourier transform.

5. The integrated detector self-debugging method according to claim 1, characterized in that: The noise intensity satisfies: ; Where, The basic signal The noise intensity of the frequency-removed signal, is the energy of the basic signal, The basic signal The energy of the frequency signal is removed. The basic signal and the basic signal The correlation between the frequency signals of the group is removed. is the normalized function of the correlation.

6. The integrated detector self-debugging method according to claim 1 or 5, characterized in that: The correlation adopts cosine similarity.

7. The integrated detector self-debugging method according to claim 1, characterized in that: The degree of information missing meets the following requirements: ; Where, The laser signal The degree of information loss of the group-de-frequency signal, is the information entropy of the laser signal, The laser signal The information entropy of the frequency-removed signal, is a linear normalization function.

8. The integrated detector self-debugging method according to claim 1, characterized in that: The denoised laser signal satisfies: ; Where, To integrate the de-noised laser signal of the detector under the target working condition, is the number of groups of frequency-removed signals, The basic signal The noise intensity of the frequency-removed signal, The laser signal The degree of information loss of the group-de-frequency signal, The laser signal Group frequency signal, It is a custom parameter used to adjust the influence of noise intensity and information loss degree on weights in weighted fusion.

9. The integrated detector self-debugging method according to claim 1, characterized in that: The debugging of the integrated detector based on the denoised laser signal includes: When debugging any device indicator of the integrated detector, the working condition corresponding to the denoised laser signal of the integrated detector under all working conditions with the highest similarity to the ideal laser electrical signal is used as the final working condition of the integrated detector when debugging the device indicator, so as to realize self-debugging of the integrated detector.

10. An integrated detector self-debugging system, characterized in that: include: A processor and a memory, wherein the memory stores computer program instructions, and when the computer program instructions are executed by the processor, an integrated detector self-debugging method according to any one of claims 1 to 9 is implemented.

Citation Information

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