Large-view-field high-resolution short-wave infrared imaging system

Abstract

The invention discloses a large-view-field high-resolution short-wave infrared imaging system, which belongs to the technical field of optical imaging and comprises a rotary scanning mirror group, an imaging mirror group, a plane reflecting mirror group and a detector which are sequentially arranged from an object space to an image space, the rotary scanning mirror group consists of a first wedge mirror and a second wedge mirror, and each wedge mirror is connected with the electric control mechanism and realizes 360-degree independent rotation through the electric control mechanism; the imaging lens group comprises a refractive-diffractive mixed plano-convex lens; the plane reflector group comprises two reflectors; the photosensitive surface of the detector coincides with the image surface of the optical system; light emitted by an object space target enters the rotary scanning mirror group, then enters the imaging mirror group through steering adjustment, then is turned through the plane reflecting mirror group, is finally focused on a photosensitive surface of the detector, and is subjected to photoelectric conversion by the detector to generate a target image. The device comprises a small number of optical elements, is compact in structure and reasonable in layout, can greatly shorten the processing and integration installation and adjustment period, and reduces the development cost.

Description

Technical Field

[0001] The present invention belongs to the technical field of optical imaging, and in particular relates to a short-wave infrared imaging system with a large field of view and high resolution. Background Art

[0002] Traditional imaging systems often face the contradiction of difficult to balance field of view and resolution. Increasing the field of view means sacrificing resolution, while pursuing high resolution limits the observation range. A relatively mature solution is to achieve field of view scanning through an electronic control mechanism. Among them, the solution based on rotating biprisms achieves beam deflection by coaxial rotation of two sets of achromatic prisms, which can achieve large field of view scanning imaging without sacrificing system resolution. It has a compact structure, high pointing accuracy, low power consumption and fast response. However, the dispersion characteristics of the prism make the solution based on rotating biprisms mostly used for beam deflection control in monochromatic light scenes. In order to achieve beam deflection control in polychromatic light wide-band scenes, it is necessary to select different material combinations to achieve achromatic design, which inevitably increases the number of prisms, resulting in an increase in the system's geometric size, weight and implementation cost.

[0003] More importantly, traditional high-resolution imaging lenses often require a combination of multiple groups and pieces of optical components, which makes them difficult to reduce in weight, and their stability requires a complex structure to ensure.

[0004] Furthermore, traditional large-field-of-view, high-resolution imaging systems struggle to guarantee good image quality across the entire field of view. Image quality at the edges of the field of view is generally poor, and significantly different from the center. To achieve good visual effects across the entire field of view, traditional large-field-of-view, high-resolution imaging systems place high demands on the spatially nonlinear response of image processing algorithms, increasing algorithmic complexity and consuming significant computing resources. Furthermore, a single large-field-of-view, high-resolution imaging mode is not conducive to performing complex tasks such as rapid search and discovery, gaze tracking and recognition, detail description, and intention judgment. Summary of the Invention

[0005] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0006] A large-field-of-view, high-resolution short-wave infrared imaging system comprises: a rotating scanning mirror group, an imaging mirror group, a plane reflector group, and a detector, wherein the rotating scanning mirror group, the imaging mirror group, the plane reflector group, and the detector are arranged in sequence from the object side to the image side along the optical axis;

[0007] The rotating scanning mirror group consists of a first wedge mirror and a second wedge mirror, each of which is connected to an electric control mechanism and can independently rotate 360 degrees through the electric control mechanism; the imaging mirror group includes only one refractive-diffractive hybrid plano-convex lens; the plane reflector group includes a first reflector and a second reflector; the photosensitive surface of the detector coincides with the image plane of the optical system;

[0008] The light emitted by the target on the object side is incident on the rotating scanning mirror group, then adjusted and incident on the imaging mirror group, then turned by the plane reflector group, and finally focused on the photosensitive surface of the detector, which performs photoelectric conversion to generate the target image.

[0009] Furthermore, the second reflector is supported by an electrically controlled micro-displacement platform and has the functions of rapid electrically controlled adjustment of one-dimensional translation, tilt and pitch.

[0010] Furthermore, the first wedge mirror and the second wedge mirror are both single-piece refractive and diffractive hybrid achromatic elements, and their diffractive micro-nano structures are multi-wavelength multiplexing structures, in which each sub-wavelength micro-nano structure is described by a grating equation.

[0011] Furthermore, the aperture of the imaging lens assembly coincides with the micro-nanostructure surface of the refractive-diffractive hybrid plano-convex lens.

[0012] Furthermore, a filter film is coated on the non-micro / nano structure surfaces of the first wedge mirror and the second wedge mirror.

[0013] Furthermore, the front surface of the refractive-diffractive hybrid plano-convex lens is a traditional refractive convex surface, and the rear surface is a planar multi-wavelength multiplexing micro-nano structure.

[0014] Furthermore, each sub-wavelength micro-nanostructure of the planar multi-wavelength multiplexing micro-nanostructure is described by a phase function of formula (1):

[0015] (1)

[0016] in, To describe the phase function of the micro-nanostructure, is the diffraction order, is the phase coefficient of the micro-nanostructure, is the normalized radius, set to 1, is the polynomial number.

[0017] Furthermore, when the large-field-of-view high-resolution short-wave infrared imaging system operates in a large-field-of-view scanning imaging mode, the electric control mechanism is used to drive the first wedge mirror and the second wedge mirror to rotate respectively to realize field-of-view scanning; the imaging mirror group and the plane reflector group are both in a stationary state and their relative positions remain unchanged, focusing the light signal emitted by the target under the scanning field of view onto the photosensitive surface of the detector, and the detector triggers the light signal collection and generates an image according to the position signal of the electric control mechanism; when the large-field-of-view high-resolution short-wave infrared imaging system operates in a high-resolution imaging mode, the rotating scanning mirror group points to a specific field of view, and the other components of the system all operate normally and keep their relative positions fixed. The imaging mirror group is used to focus the light emitted by the target onto the photosensitive surface of the detector, and the detector outputs a high-resolution image. When the system works in super-resolution imaging mode, the rotating scanning mirror group points to a specific field of view, and the imaging mirror group and the plane reflector group are both stationary and their relative positions remain unchanged. The light signal emitted by the target in the scanning field of view is focused onto the photosensitive surface of the detector. Then, the electrically controlled micro-displacement platform supporting the second reflector is used to drive the second reflector to perform high-frequency, small-amplitude, regular tilt and pitch micro-scanning movements to obtain multiple frames of images containing sub-pixel information of the target. Then, super-resolution imaging is achieved through the super-resolution reconstruction algorithm to achieve a detailed description of the target.

[0018] Furthermore, the large field of view scanning imaging mode includes a high-speed multi-frame image stitching algorithm, the super-resolution imaging mode includes a super-resolution reconstruction algorithm, and the high-resolution imaging mode includes a fast off-target amount extraction algorithm.

[0019] Furthermore, the refractive-diffractive hybrid plano-convex lens is split into a closely connected plano-convex lens and a thin-plate micro-nanostructure element, wherein the plano-convex lens is processed using a traditional cold optical method, and the thin-plate micro-nanostructure element is prepared on the surface of the thin plate using a micro-optical processing method.

[0020] The present invention has the following beneficial effects:

[0021] The proposed wide-field-of-view, high-resolution shortwave infrared imaging system utilizes a monolithic achromatic rotating prism (first wedge mirror 1, second wedge mirror 2) and a multi-wavelength multiplexing micro-nanostructure. Leveraging its dispersion control properties, this system achieves wide-band achromatic beam deflection, simplifying the wide-field-of-view scanning system and significantly reducing the power consumption of the electrically controlled rotating scanning mechanism. Furthermore, a novel monolithic achromatic lens (a refractive-diffractive hybrid plano-convex lens 3) positioned behind the monolithic achromatic rotating prism enables wide-band shortwave infrared high-resolution imaging, significantly simplifying the optical imaging system. Without increasing the number of components, the present invention utilizes a plane mirror (second mirror 5) on an electrically controlled micro-displacement platform as the actuator for focusing, image stabilization, and micro-scanning, integrating multiple functions into one, enabling multiple operating modes with minimal effort.

[0022] The large-field-of-view, high-resolution short-wave infrared imaging system proposed in the present invention combines the functions of large-field-of-view scanning imaging mode, high-resolution imaging mode and super-resolution imaging mode. It contains a small number of optical elements, has a compact structure and a reasonable layout, and can greatly shorten the processing and integrated assembly cycle and reduce research and development costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 Schematic diagram of the optical path of the large-field-of-view high-resolution short-wave infrared imaging system of the present invention; wherein, (a) is a scanning state corresponding to a scanning field of view of 0°±0.55° in the sagittal direction and 0°±0.55° in the meridional direction, the first wedge mirror rotates 0° clockwise around the optical axis, and the second wedge mirror rotates 180° clockwise around the optical axis; (b) is a scanning state corresponding to a scanning field of view of 0°±0.55° in the sagittal direction and 1.5°±0.55° in the meridional direction, the first wedge mirror rotates 70.31° clockwise around the optical axis, and the second wedge mirror rotates 70.43° counterclockwise around the optical axis; (c) is a scanning state corresponding to a scanning field of view of The scanning state is as follows: the field of view is 0°±0.55° in the sagittal direction and 3°±0.55° in the meridional direction, the first wedge mirror rotates 47.78° clockwise around the optical axis, and the second wedge mirror rotates 47.95° counterclockwise around the optical axis; (d) is the scanning state corresponding to the scanning field of view of 0°±0.55° in the sagittal direction and 4.5°±0.55° in the meridional direction, the first wedge mirror rotates 0° clockwise around the optical axis, and the second wedge mirror rotates 0° clockwise around the optical axis; where 1 is the first wedge mirror, 2 is the second wedge mirror, 3 is the diffractive hybrid plano-convex lens, 4 is the first reflector, 5 is the second reflector, and 6 is the detector;

[0024] Figure 2 The MTF curves of the large-field-of-view, high-resolution short-wave infrared imaging system of the present invention under four different scanning fields of view; among them, (a) is the MTF curve when the scanning field of view is 0°±0.55° in the sagittal direction and 0°±0.55° in the meridional direction, (b) is the MTF curve when the scanning field of view is 0°±0.55° in the sagittal direction and 1.5°±0.55° in the meridional direction, (c) is the MTF curve when the scanning field of view is 0°±0.55° in the sagittal direction and 3°±0.55° in the meridional direction, and (d) is the MTF curve when the scanning field of view is 0°±0.55° in the sagittal direction and 4.5°±0.55° in the meridional direction. DETAILED DESCRIPTION

[0025] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only intended to illustrate the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

[0026] The technical solution of the present invention is described below with reference to embodiments.

[0027] Figure 1 The large-field-of-view high-resolution imaging system shown includes a rotating scanning mirror group, an imaging mirror group, a plane reflective mirror group and a detector 6 which are sequentially arranged along the optical axis from the object side to the image side.

[0028] The rotating scanning mirror group consists of a first wedge mirror 1 and a second wedge mirror 2. Each wedge mirror is connected to an electric control mechanism and can independently rotate 360 degrees through the electric control mechanism.

[0029] The imaging lens assembly includes only one diffractive-refractive hybrid plano-convex lens 3, and the aperture of the imaging lens assembly coincides with the micro-nanostructured surface of the diffractive-refractive hybrid plano-convex lens.

[0030] The plane reflector group includes a first reflector 4 and a second reflector 5; wherein the second reflector 5 is supported by an electrically controlled micro-displacement platform (the first reflector 4 can be supported by a fixed structure) and has the functions of one-dimensional translation, tilt, and pitch rapid electrically controlled adjustment.

[0031] The photosensitive surface of the detector 6 coincides with the image plane of the optical system.

[0032] After the light emitted by the object side is incident on the rotating scanning mirror group, it is adjusted and incident on the imaging mirror group, then turned by the plane reflection mirror group, and finally focused on the photosensitive surface of the detector 6, which performs photoelectric conversion to generate the target image.

[0033] The optical path diagram of the large field of view high resolution short wave infrared imaging system of the present invention is shown in FIG. Figure 1 ,in, Figure 1 (a) is a scanning state in which the corresponding scanning field of view is 0°±0.55° in the sagittal direction and 0°±0.55° in the tangential direction, the first wedge mirror is rotated 0° clockwise around the optical axis, and the second wedge mirror is rotated 180° clockwise around the optical axis; Figure 1 (b) is a scanning state in which the corresponding scanning field of view is 0°±0.55° in the sagittal direction and 1.5°±0.55° in the tangential direction, the first wedge mirror rotates 70.31° clockwise around the optical axis, and the second wedge mirror rotates 70.43° counterclockwise around the optical axis; Figure 1 (c) is a scanning state in which the corresponding scanning field of view is 0°±0.55° in the sagittal direction and 3°±0.55° in the meridional direction, the first wedge mirror rotates 47.78° clockwise around the optical axis, and the second wedge mirror rotates 47.95° counterclockwise around the optical axis; Figure 1 (d) is a scanning state in which the corresponding scanning field of view is 0°±0.55° in the sagittal direction and 4.5°±0.55° in the meridional direction, the first wedge mirror is rotated 0° clockwise around the optical axis, and the second wedge mirror is rotated 0° clockwise around the optical axis.

[0034] To fully utilize the flexible imaging method of this embodiment, when performing wide-field search imaging (operating in wide-field scanning imaging mode), an electronically controlled mechanism drives the rotation of the first and second wedge mirrors 1 and 2 in the rotating scanning mirror assembly to achieve field-of-view scanning. The imaging mirror assembly and the plane reflector assembly are both stationary and their relative positions remain unchanged. Light signals emitted by targets within the scanning field of view are focused onto the photosensitive surface of detector 6. Detector 6, triggered by the position signal from the electronically controlled mechanism, collects the light signals and generates an image. To achieve rapid object-side scene search, the system's imaging resolution can be reduced by merging pixels on detector 6.

[0035] After searching and finding the target of interest, the system enters high-resolution imaging mode, rotates the scanning mirror group to point to a specific field of view, and the other components of the system operate normally and keep their relative positions fixed. The imaging mirror group is used to collect the light emitted by the target to the photosensitive surface of the detector 6, and the detector outputs a high-resolution image to identify and judge the target of interest.

[0036] After confirming the target type, the system enters super-resolution imaging mode, rotates the scanning mirror group to point to a specific field of view, and the imaging mirror group and the plane reflector group are both stationary and their relative positions remain unchanged. The light signal emitted by the target in the scanning field of view is focused onto the photosensitive surface of the detector. Then, the electrically controlled micro-displacement platform is used to drive the second reflector 5 to perform high-frequency, small-amplitude, regular tilt and pitch micro-scanning movements to obtain multiple frames of images containing target sub-pixel information. Then, super-resolution imaging is achieved through the super-resolution reconstruction algorithm to achieve a detailed description of the target.

[0037] By combining the three imaging modes of large field of view scanning imaging mode, high-resolution imaging mode and super-resolution imaging mode, the strong correlation between the system imaging quality and the field of view is improved, the huge amount of data processing and computational complexity for updating full-field-of-view high-resolution images are reduced, and the flexibility of imaging for different scenarios is increased.

[0038] In this embodiment, both the first and second wedge mirrors 1 and 2 in the rotating scanning mirror assembly are monolithic hybrid refractive and diffractive achromatic elements, and their diffractive micro-nanostructures are multi-wavelength multiplexing structures. Both wedge mirrors 1 and 2 are made of fused silica and have identical optical parameters, including a wedge angle of 4.84°. The diffractive micro-nanostructures employ a three-wavelength multiplexing grating structure with grating constants of 1.091 lines / mm, 0.9854 lines / mm, and 0.96 lines / mm, respectively. The dual-wedge mirror rotational combination enables ±5° scanning.

[0039] In order to reduce the impact of incident light in non-designed wavelengths, a filter film is plated on the non-micro-nanostructured surfaces of the first wedge mirror 1 and the second wedge mirror 2 in the scanning mirror assembly to achieve the system filtering function and replace the filter.

[0040] In this embodiment, the imaging lens assembly includes only one refractive-diffractive hybrid plano-convex lens 3, made of fused silica. The front surface of this refractive-diffractive hybrid plano-convex lens 3 is a traditional refractive convex surface with a radius of curvature of 296.255 mm and a conic coefficient of -0.557. The rear surface is a planar three-wavelength multiplexing micro-nanostructure, which is described in the optical design software using the phase function of Equation (1). In this embodiment, the first five polynomials are used to describe each micro-nanostructure separately. is the phase coefficient of the micro-nanostructure, the phase coefficient of the first micro-nanostructure to -0.1390 and -1.4354×10 -6 , 1.9432×10 -8 , -1.4945×10 -11 4.0408×10 -15 The phase coefficient of the second micro-nanostructure to They are: -0.1378, -2.7924×10 -6 , 1.9375×10 -8 , -1.4900×10 -11 , 4.0281×10 -15 The phase coefficient of the third micro-nanostructure to They are: -0.1346, -3.2764×10 -6 , 1.6858×10 -8 , -1.2962×10 -11 , 3.5038×10 -15 . Diffraction order =1, is the normalized radius, set to 1, is the polynomial number, is the phase function describing the micro-nanostructure.

[0041] (1)

[0042] To reduce the difficulty of high-precision fabrication of the micro-nanostructure on the surface of the refractive-diffractive hybrid plano-convex lens 3, the lens was split into a closely connected plano-convex lens and a thin-plate micro-nanostructure element. The plano-convex lens was fabricated using traditional cold optics methods, while the thin-plate micro-nanostructure element was fabricated on the surface of the thin plate using micro-optical processing. The aperture of the wide-field-of-view, high-resolution short-wave infrared imaging system coincides with the surface of the thin-plate micro-nanostructure element of the imaging lens assembly.

[0043] In this embodiment, the angles between the first reflector 4 and the second reflector 5 and the optical axis are both 12°.

[0044] The plane mirror group realizes the function of folding the light path through multiple reflections, making the system more compact.

[0045] The second reflector 5, mounted on the electrically controlled micro-displacement platform, functions as a fast-reflection mirror, enabling micro-scanning and sub-pixel information acquisition. It also provides image stabilization and motion compensation for imaging moving targets, as well as the ability to adjust the distance between the imaging lens assembly and the detector surface within a certain range (the micro-displacement platform features one-dimensional translation, tilt, and pitch adjustment, enabling adjustment of the distance through translation), achieving clear imaging at varying object distances.

[0046] Different working modes contain dedicated image processing algorithms, mainly including the high-speed stitching algorithm of multi-frame images in the large field of view scanning imaging mode, the super-resolution reconstruction algorithm in the super-resolution imaging mode, and the fast extraction algorithm of off-target amount in the high-resolution imaging mode.

[0047] In this embodiment, a detector with a pixel size of 15 μm is selected, and its pixel size is 640×512. The modulation transfer function (MTF) curves of the imaging system under different fields of view are as follows: Figure 2 As shown. Figure 2 As shown in (a), in the field of view of 0°±0.55° in the sagittal direction and 0°±0.55° in the tangential direction, the system has an average MTF of 0.509 in the center field of view and an average MTF of 0.489 in the edge field of view at the detector Nyquist frequency (33.3lp / mm). Figure 2 As shown in (b), in the field of view of 0°±0.55° in the sagittal direction and 1.5°±0.55° in the tangential direction, the system has an average MTF of 0.494 in the center field of view and an average MTF of 0.480 in the edge field of view at the detector Nyquist frequency (33.3lp / mm). Figure 2 As shown in (c), in the field of view of 0°±0.55° in the sagittal direction and 3°±0.55° in the tangential direction, the system has an average MTF of 0.455 in the center field of view and an average MTF of 0.445 in the edge field of view at the detector Nyquist frequency (33.3lp / mm). Figure 2 As shown in (d), with a sagittal field of view of 0°±0.55° and a meridional field of view of 4.5°±0.55°, the system achieves an average MTF of 0.421 at the center of the field of view and 0.408 at the edge of the field of view at the detector's Nyquist frequency (33.3 lp / mm). These results demonstrate that, over a 10.1° circular field of view, the system's average MTF is better than 0.4, demonstrating the excellent image quality of the large-field-of-view, high-resolution imaging system disclosed in this embodiment.

[0048] The above descriptions are merely embodiments of the present invention and are not intended to limit the scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention description and drawings, or directly or indirectly applied to other related system fields, are also included in the scope of protection of the present invention.

[0049] The contents not described in detail in the specification of the present invention belong to the prior art known to those skilled in the art.

Claims

1. A large field of view, high resolution shortwave infrared imaging system, characterized in that: include: The rotating scanning mirror group, the imaging mirror group, the plane reflector group and the detector are arranged in sequence from the object side to the image side along the optical axis; The rotating scanning mirror group consists of a first wedge mirror and a second wedge mirror, each of which is connected to an electric control mechanism and can independently rotate 360 degrees through the electric control mechanism; the imaging mirror group includes only one refractive-diffractive hybrid plano-convex lens; the plane reflector group includes a first reflector and a second reflector; the photosensitive surface of the detector coincides with the image plane of the optical system; The light emitted by the target on the object side is incident on the rotating scanning mirror group, then adjusted and incident on the imaging mirror group, then turned by the plane reflector group, and finally focused on the photosensitive surface of the detector, which performs photoelectric conversion to generate the target image.

2. The large field of view, high resolution shortwave infrared imaging system according to claim 1, characterized in that: The second reflector is supported by an electrically controlled micro-displacement platform and has the functions of rapid electrically controlled adjustment of one-dimensional translation, tilt and pitch.

3. The large field of view, high resolution shortwave infrared imaging system according to claim 1, characterized in that: The first wedge mirror and the second wedge mirror are both single-piece refractive and diffractive hybrid achromatic elements, and their diffractive micro-nano structure is a multi-wavelength multiplexing structure, in which each sub-wavelength micro-nano structure is described by a grating equation.

4. The large field of view, high resolution shortwave infrared imaging system according to claim 1, characterized in that: The aperture of the imaging lens assembly coincides with the micro-nanostructure surface of the refractive-diffractive hybrid plano-convex lens.

5. The large-field-of-view high-resolution short-wave infrared imaging system according to claim 1, characterized in that: The non-micro / nano structure surfaces of the first wedge mirror and the second wedge mirror are coated with a filter film.

6. The large field of view, high resolution shortwave infrared imaging system according to claim 1, characterized in that: The front surface of the refractive-diffractive hybrid plano-convex lens is a traditional refractive convex surface, and the rear surface is a planar multi-wavelength multiplexing micro-nano structure.

7. The large-field-of-view, high-resolution short-wave infrared imaging system according to claim 6, characterized in that: Each sub-wavelength micro-nanostructure of the planar multi-wavelength multiplexing micro-nanostructure is described by the phase function of formula (1): （1） in, To describe the phase function of the micro-nanostructure, is the diffraction order, is the phase coefficient of the micro-nanostructure, is the normalized radius, set to 1, is the polynomial number.

8. The large-field-of-view, high-resolution short-wave infrared imaging system according to claim 1, characterized in that: When the large-field-of-view high-resolution short-wave infrared imaging system operates in a large-field-of-view scanning imaging mode, the electric control mechanism is used to drive the first wedge mirror and the second wedge mirror to rotate respectively to realize field-of-view scanning; the imaging mirror group and the plane reflector group are both in a stationary state and their relative positions remain unchanged, and the light signal emitted by the target under the scanning field of view is focused on the photosensitive surface of the detector, and the detector triggers the light signal collection and generates an image according to the position signal of the electric control mechanism; when the large-field-of-view high-resolution short-wave infrared imaging system operates in a high-resolution imaging mode, the rotating scanning mirror group points to a specific field of view, and the other components of the system operate normally and keep their relative positions fixed, and the imaging mirror group and the plane reflector group are used to focus the light signal emitted by the target under the scanning field of view onto the photosensitive surface of the detector. The imaging mirror group focuses the light emitted by the target onto the photosensitive surface of the detector, and the detector outputs a high-resolution image. When the system works in super-resolution imaging mode, the rotating scanning mirror group points to a specific field of view, and the imaging mirror group and the plane reflector group are both stationary and their relative positions remain unchanged. The light signal emitted by the target in the scanning field of view is focused onto the photosensitive surface of the detector. Then, the electrically controlled micro-displacement platform supporting the second reflector is used to drive the second reflector to perform high-frequency, small-amplitude, regular tilt and pitch micro-scanning movements to obtain multiple frames of images containing target sub-pixel information. Then, super-resolution imaging is achieved through the super-resolution reconstruction algorithm to achieve a detailed description of the target.

9. The large-field-of-view, high-resolution short-wave infrared imaging system according to claim 8, characterized in that: The large field of view scanning imaging mode includes a high-speed multi-frame image stitching algorithm, the super-resolution imaging mode includes a super-resolution reconstruction algorithm, and the high-resolution imaging mode includes a fast off-target amount extraction algorithm.

10. The large-field-of-view high-resolution short-wave infrared imaging system according to claim 1, characterized in that: The refractive-diffractive hybrid plano-convex lens is split into a closely connected plano-convex lens and a thin-plate micro-nanostructure element. The plano-convex lens is processed using a traditional cold optical method, and the thin-plate micro-nanostructure element is prepared on the surface of the thin plate using a micro-optical processing method.

Images