Integrated burn-in test circuit and system for vacuum arc-extinguishing chamber

Abstract

The invention discloses an aging test circuit and system of a vacuum arc-extinguishing chamber comprehensive mode, and relates to the technical field of high-voltage power equipment. The circuit comprises a booster circuit, a rectifier bridge, a voltage divider, a first high-voltage switch, a capacitor tower, a reactor group, an ignition device, a frequency modulation resistor, a frequency modulation capacitor, an auxiliary switch, a second high-voltage switch, a first transformer, a variable-frequency power supply, a detachable vacuum arc-extinguishing chamber and a direct-current measuring resistor. The circuit can adjust the stored energy of the capacitor tower and the voltage of the variable-frequency power supply according to the ablation condition of a contact in the vacuum arc-extinguishing chamber, so as to adjust the magnitude and frequency of the current released by the capacitor tower during an aging test and the magnitude and frequency of the voltage released by the transformer. Therefore, aging energy of large current / or small current / or voltage with different frequencies is applied during an aging test, and the aging energy and the action mode of the energy are ensured to be matched with the current state of the contact by controlling the energy applying mode and the energy applying frequency under different contact opening distances.

Description

Technical Field

[0001] The present invention relates to the technical field of high-voltage electrical equipment, and in particular to a vacuum interrupter integrated burn-in test circuit and system. Background Art

[0002] As a core component of medium- and high-voltage power switches, the vacuum interrupter's primary function is to rapidly extinguish arcs and suppress current flow after power is disconnected from medium- and high-voltage circuits through the excellent insulation properties of the vacuum within the tube, thereby preventing accidents and incidents. In practical applications, the performance of the vacuum interrupter plays a decisive role in its ability to successfully extinguish arcs. Therefore, the selection of contact materials and the appropriate treatment process are crucial. The vacuum interrupter burn-in test, an effective cleaning and treatment method designed to enhance the performance and reliability of the interrupter, bombards and heats the contact surfaces of the vacuum interrupter with an electric arc, removing gases and impurities from the contact surfaces and improving the surface structure of the contact material, thereby enhancing the insulation performance and interrupting capacity of the interrupter. This process is crucial for ensuring the stability and reliability of the vacuum interrupter during actual operation.

[0003] Existing technologies for vacuum interrupter aging primarily include current aging and voltage aging. Current aging involves applying a direct or alternating current, utilizing the high temperature of the arc to remove impurities and gases from the contact surfaces, improving the contact surface condition and enhancing arc extinguishing performance. Voltage aging, on the other hand, involves applying a high voltage to create a glow discharge or spark discharge between the contacts, thereby improving the contact surface condition and increasing voltage resistance.

[0004] A detailed comparison shows that current aging offers the advantages of thorough degassing and effective contact surface purification, but it may also cause some contact surface erosion. Voltage aging, on the other hand, requires simple equipment and is widely applicable, but the aging process can be lengthy, and the effectiveness of contact surface improvement is affected by various factors. Furthermore, other techniques, such as the parallel capacitor method, have been proposed to improve aging efficiency and quality.

[0005] The aging energy (the energy of the released current or voltage) released during the vacuum interrupter aging test has a significant impact on the aging effect. Insufficient aging energy may lead to incomplete purification of the contact surface and the inability to effectively remove gases, oxides and impurities, thereby affecting the withstand voltage and breaking performance of the interrupter. Sufficient aging energy can ensure that the contact surface is comprehensively and evenly treated, improve the purity and surface quality of the contact material, and thus enhance the electrical performance and operational reliability of the interrupter. However, the aging circuits of vacuum interrupters currently on the market lack high-current generating devices at the 10,000-ampere level. For interrupters with larger rated short-circuit breaking currents, there is a problem of insufficient aging energy. Summary of the Invention

[0006] In light of this, embodiments of the present invention provide a vacuum interrupter integrated burn-in test circuit and system to address issues such as insufficient burn-in energy, excessive burn-in energy, and uneven burn-in during burn-in tests. The burn-in energy application method and magnitude provided by the vacuum interrupter integrated burn-in test circuit can be iteratively optimized based on collected feedback information for different vacuum interrupter products, achieving optimal burn-in results and processes.

[0007] To achieve the above objectives, the embodiments of the present invention provide the following technical solutions:

[0008] A vacuum interrupter integrated burn-in test circuit comprising:

[0009] Boost circuit, rectifier bridge, voltage divider, first high-voltage switch, capacitor tower, reactor group, ignition device, frequency modulation resistor, frequency modulation capacitor, auxiliary switch, second high-voltage switch, first transformer, variable frequency power supply, detachable vacuum interrupter and DC current measuring resistor;

[0010] The input end of the boost circuit is connected to an AC power supply;

[0011] The input end of the rectifier bridge is connected to the output end of the boost circuit;

[0012] The first end of the voltage divider is connected to the output end of the rectifier bridge, and the second end of the voltage divider is grounded;

[0013] The first high-voltage switch and the reactor group are connected in series between the first end of the ignition device and the output end of the rectifier bridge;

[0014] A first end of the capacitor tower is connected to a common end of the first high-voltage switch and the reactor group, and a second end of the capacitor tower is grounded;

[0015] The frequency modulation resistor and the frequency modulation capacitor are connected in series between the second end of the ignition device and the ground;

[0016] The first end of the auxiliary switch is connected to the second end of the ignition device;

[0017] The input end of the detachable vacuum interrupter is connected to the second end of the auxiliary switch, the output end of the detachable vacuum interrupter is grounded, the opening distance of the contacts in the detachable vacuum interrupter is adjustable, and the opening and closing speed of the contacts in the detachable vacuum interrupter is adjustable;

[0018] The first end of the second high-voltage switch is connected to the second end of the ignition device;

[0019] A first end of the main winding of the first transformer is connected to a second end of the second high-voltage switch;

[0020] A first end of the variable frequency power supply is connected to a first end of the secondary winding of the first transformer, and a second end of the secondary winding and a second end of the variable frequency power supply are grounded;

[0021] One end of the DC current measuring resistor is connected to the second end of the voltage divider, and the other end is grounded.

[0022] Optionally, in the above-mentioned vacuum interrupter integrated burn-in test circuit, the boost circuit includes:

[0023] voltage regulator and second transformer;

[0024] A first end of the main winding of the voltage regulator is connected to the AC power supply, and a second end of the main winding of the voltage regulator is grounded;

[0025] The secondary winding of the voltage regulator is connected in parallel with the main winding of the second transformer;

[0026] A first end of the secondary winding of the second transformer serves as an output end of the boost circuit, and a second end of the secondary winding of the second transformer is connected to a second end of the voltage divider.

[0027] Optionally, the burn-in test circuit of the vacuum interrupter integrated method further includes: a grounding switch, a protective resistor, a first low-voltage switch and a second low-voltage switch;

[0028] The first end of the grounding switch is connected to the second end of the voltage divider, and the second end of the grounding switch is connected to the second end of the capacitor tower;

[0029] The protection resistor is arranged between the rectifier bridge and the first high-voltage switch;

[0030] The first end of the first low-voltage switch is connected to the second end of the grounding switch, and the second end of the first low-voltage switch is connected to the second end of the capacitor tower;

[0031] A first end of the second low-voltage switch is grounded, and a second end of the second low-voltage switch is connected to a second end of the main winding of the first transformer.

[0032] Optionally, the above-mentioned vacuum interrupter comprehensive burn-in test circuit further includes an image acquisition device, which is used to capture images of contacts in the vacuum interrupter and to capture image information of the discharge process in the vacuum interrupter.

[0033] Optionally, in the above-mentioned vacuum interrupter integrated burn-in test circuit, the capacitor tower adopts a design structure in which layers can be connected in series or in parallel.

[0034] Optionally, in the above-mentioned vacuum interrupter integrated burn-in test circuit, the reactance value of the reactor group is adjustable and the capacitance value of the frequency modulation capacitor is adjustable.

[0035] Optionally, in the above-mentioned vacuum interrupter integrated burn-in test circuit, the variable frequency power supply includes:

[0036] Protection module, voltage module, full-bridge inverter, control module and voltage and current sampling module;

[0037] The input end of the protection module is connected to a DC power supply;

[0038] The input end of the voltage module is connected to the output end of the protection module;

[0039] The input end of the full-bridge inverter is connected to the output end of the voltage module, the positive output end of the full-bridge inverter serves as the first end of the variable frequency power supply, and the negative output end of the full-bridge inverter serves as the second end of the variable frequency power supply;

[0040] The first control signal output terminal of the control module is connected to the control terminal of the protection module, the second control signal output terminal of the control module is connected to the control terminal of the voltage module, and the third control signal output terminal of the control module is used to provide a PWM control signal to the full-bridge inverter;

[0041] The voltage and current sampling module is used to collect the output and output voltage of the variable frequency power supply and send the sampling results to the control module.

[0042] A vacuum interrupter integrated burn-in test system comprises any one of the vacuum interrupter integrated burn-in test circuits described above.

[0043] Optionally, the vacuum interrupter integrated burn-in test system further includes: a host computer;

[0044] The host computer is used to set and control the number of tests of the burn-in test circuit of the vacuum interrupter integrated mode, and to set the configuration parameters or states of target devices in the burn-in test circuit of the vacuum interrupter integrated mode;

[0045] The target device includes at least a boost circuit, a first high-voltage switch, a capacitor tower, a reactor group, an ignition device, a frequency-modulating resistor, a frequency-modulating capacitor, an auxiliary switch, a second high-voltage switch, a first transformer, a variable-frequency power supply, and a detachable vacuum interrupter.

[0046] Optionally, in the above-mentioned vacuum interrupter integrated burn-in test system, when setting the configuration parameters of the target device in the vacuum interrupter integrated burn-in test circuit, the host computer is specifically used to:

[0047] identifying a target discharge mode selected by a user based on the selection instruction, the target discharge mode including arc discharge, glow discharge, and spark discharge;

[0048] The vacuum interrupter integrated burn-in test circuit is configured based on configuration parameters matching the target discharge mode.

[0049] Based on the above technical solution, the aging test circuit of the above-mentioned vacuum interrupter comprehensive method provided in an embodiment of the present invention includes: a boost circuit, a rectifier bridge, a voltage divider, a first high-voltage switch, a capacitor tower, an inductor group, an ignition device, a frequency-modulating resistor, a frequency-modulating capacitor, an auxiliary switch, a second high-voltage switch, a first transformer, a variable frequency power supply, a detachable vacuum interrupter and a DC current measuring resistor; the circuit can adjust the stored energy of the capacitor tower according to the contact ablation condition in the vacuum interrupter to adjust the size of the current released by the capacitor tower during the aging test, thereby applying large current / or small current aging energy during the aging test to ensure that the aging energy is adapted to the current state of the contact.

[0050] The current frequency during the aging test can also be adjusted by adjusting the capacitance value of the capacitor tower and the impedance value of the reactor group. The host computer sets the number of cyclic aging cycles of the high-frequency current to ensure aging uniformity.

[0051] It is also possible to adjust the opening and closing speeds of the contacts of the detachable vacuum interrupter, and set the control current phase and opening time on the host computer to achieve different arcing times and control the ablation effect of the arc on the contacts.

[0052] The above circuit is also provided with a variable frequency power supply, the output of which is regulated by a first transformer to increase the voltage. Voltage sources of different frequencies and voltage amplitudes can be used to perform high voltage aging on the arc chamber at different opening distances (dynamic separation distance between the two contacts in the vacuum arc chamber). This can realize an aging method combining voltage aging and current aging, ensuring better results of the aging test. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are merely embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying any creative work.

[0054] Figure 1 A schematic diagram of a vacuum interrupter integrated burn-in test circuit according to an embodiment of the present application;

[0055] Figure 2A schematic diagram of the structure of a variable frequency power supply provided in an embodiment of the present application;

[0056] Figure 3 A schematic diagram of the structure of the ignition device provided in an embodiment of the present application;

[0057] Figure 4 A schematic diagram of the structure of a control system in a vacuum interrupter integrated burn-in test system provided in an embodiment of the present application;

[0058] Figure 5 A schematic diagram of signal transmission and communication principles of a control system provided in an embodiment of the present application;

[0059] Figure 6 This is a structural diagram of the measurement system in the vacuum interrupter integrated burn-in test system disclosed in an embodiment of the present application. DETAILED DESCRIPTION

[0060] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0061] This application discloses a vacuum interrupter comprehensive burn-in test circuit. Figure 1 , the circuit may include:

[0062] Boost circuit 100, rectifier bridge D1, voltage divider 200, first high-voltage switch K1, capacitor tower C0, reactor group L, ignition device 300, frequency modulation resistor R4, frequency modulation capacitor C1, auxiliary switch K2, second high-voltage switch K3, first transformer Q, variable frequency power supply V1, detachable vacuum interrupter 400 and DC current measuring resistor R5;

[0063] The input end of the boost circuit 100 is connected to an AC power source;

[0064] The input end of the rectifier bridge D1 is connected to the output end of the boost circuit 100;

[0065] The first end of the voltage divider 200 is connected to the output end of the rectifier bridge D1, and the second end of the voltage divider 200 is grounded; the voltage divider 200 is composed of a high-voltage ratio resistor R1 and a low-voltage arm resistor R2 connected in series, and the end of the high-voltage ratio resistor R1 not connected to the low-voltage arm resistor R2 is connected to the output end of the rectifier bridge D1 as the first end of the voltage divider 200, and the end of the low-voltage ratio resistor R1 not connected to the high-voltage arm resistor R2 is grounded as the second end of the voltage divider 200.

[0066] The first high-voltage switch K1 and the reactor group L are connected in series between the first end of the ignition device 300 and the output end of the rectifier bridge D1;

[0067] A first end of the capacitor tower C0 is connected to a common end of the first high-voltage switch K1 and the reactor group L, and a second end of the capacitor tower C0 is grounded;

[0068] The frequency modulation resistor R4 and the frequency modulation capacitor C1 are connected in series between the second end of the ignition device 300 and the ground;

[0069] The first end of the auxiliary switch K2 is connected to the second end of the ignition device 300;

[0070] The input end of the detachable vacuum interrupter 400 is connected to the second end of the auxiliary switch K2, the output end of the detachable vacuum interrupter 400 is grounded, the opening distance of the contacts in the detachable vacuum interrupter is adjustable, and the opening and closing speed of the contacts in the detachable vacuum interrupter is adjustable;

[0071] The first end of the second high-voltage switch K3 is connected to the second end of the ignition device 300;

[0072] A first end of the main winding of the first transformer Q is connected to a second end of the second high-voltage switch K3;

[0073] A first end of the variable frequency power supply V1 is connected to a first end of the secondary winding of the first transformer Q, and a second end of the secondary winding and a second end of the variable frequency power supply V1 are grounded;

[0074] One end of the DC current measuring resistor R5 is connected to the second end of the voltage divider 200 , and the other end is grounded.

[0075] When performing a burn-in test, an AC power source AC is provided to the boost circuit 100. The AC power source increases the voltage after passing through the boost circuit 100. The increased voltage is converted into DC power after passing through the rectifier bridge D1. The DC power then passes through the first high-voltage switch K1 to charge the capacitor tower C0. At the same time, the DC power also collects a voltage signal through the voltage divider 200 and a current signal through the DC current measuring resistor R5. The collected voltage and current signals are then uploaded to the monitoring device, so that the monitoring device can control the charging voltage and current of the capacitor tower C0 during the charging process by adjusting the boost circuit 100 based on the collected voltage and current signals. After the capacitor tower C0 is fully charged, the first high-voltage switch K1 is disconnected, and the ignition device 300 is controlled to perform an ignition action. At this time, the capacitor tower C0 stores The electrical energy is discharged through the circuit formed by the reactor group L, frequency modulation resistor R4, frequency modulation capacitor C1, auxiliary switch K2, and the detachable vacuum interrupter 400. At the same time, the detachable vacuum interrupter 400 performs an opening operation. During the opening operation, the arcing process in the vacuum interrupter completes a burn-in test. Before the burn-in test, the energy stored in the capacitor tower C0 can be adjusted based on the contact erosion during the previous burn-in test to adjust the current released by the capacitor tower C0 during the burn-in test. In this way, a high current / low current burn-in energy is applied during the next burn-in test to ensure that the burn-in energy is compatible with the current state of the contacts. At the same time, the impedance value of the reactor group L can be adjusted to adjust the number of high-frequency current cycles during the burn-in test to ensure burn-in uniformity. The host computer can also adjust the different contact opening and closing speeds of the detachable vacuum interrupter to control the current phase and opening time to achieve different arcing times and control the arc erosion effect on the contacts. At the same time, the above circuit is also provided with a variable frequency power supply V1. The output of the variable frequency power supply V1 is adjusted to increase the voltage through the first transformer Q. Voltage sources of different frequencies and voltage amplitudes can be used to perform high voltage aging on the arc chamber at different opening distances (dynamic separation distance between the two contacts in the vacuum arc chamber). This can realize an aging method combining voltage aging and current aging, ensuring better results of the aging test.

[0076] The boost charging process of the capacitor tower C0 is as described above. The discharge arcing process of the contacts during the aging test can be divided into multiple times. By reasonably configuring the configuration parameters of each component in the above circuit, the above circuit can be made into a combination of multiple cycles of a 50Hz 10,000 ampere level high current and a high-frequency current of more than 500Hz during the aging test. By configuring a combination of different current amplitudes, frequencies, application times, application times, and other parameters during the aging test, the aging energy and uniformity can be adjusted. Figure 1As shown, the above circuit may also include an image acquisition device for capturing images of the contacts within the vacuum interrupter. The image acquisition device may be a high-speed camera. In this case, the present application can also observe the arcing process and contact erosion through the high-speed camera and the detachable vacuum interrupter 400. The user can change the parameter settings in the burn-in test circuit to adjust the burn-in energy and uniformity based on the contact erosion. Furthermore, in this embodiment, the contact opening distance within the detachable vacuum interrupter 400 is adjustable. By adjusting the contact opening distance within the detachable vacuum interrupter 400, burn-in tests can be performed at different opening distances, ultimately achieving the desired burn-in effect. At the same time, the user can also use the output voltage of the variable frequency power supply V1 to adjust the voltage through the first transformer Q to perform high-voltage burn-in tests on the interrupter at different opening distances.

[0077] In this embodiment, see Figure 1 In order to make the working process of the vacuum interrupter integrated burn-in test circuit more reliable, the circuit may further include a grounding switch, a protective resistor R3, a first low-voltage switch K4 and a second low-voltage switch K5;

[0078] A first end of the grounding switch is connected to a second end of the voltage divider 200 , and a second end of the grounding switch is connected to a second end of the capacitor tower C0 .

[0079] The protection resistor R3 is arranged between the rectifier bridge D1 and the first high-voltage switch K1;

[0080] The first end of the first low-voltage switch K4 is connected to the second end of the grounding switch, and the second end of the first low-voltage switch K4 is connected to the second end of the capacitor tower C0;

[0081] A first end of the second low-voltage switch K5 is grounded, and a second end of the second low-voltage switch K5 is connected to a second end of the main winding of the first transformer Q.

[0082] The first low-voltage switch K4 is linked to the first high-voltage switch K1. The second low-voltage switch K5 is linked to the second high-voltage switch K3. When the grounding switch is closed, the first high-voltage switch K1 and the first low-voltage switch K4 are in an open state. At this time, the current output by the rectifier bridge D1 can be measured by the DC current measuring resistor R5. When the first high-voltage switch K1 and the first low-voltage switch K4 are in a closed state, the grounding switch is in an open state.

[0083] In this embodiment, see Figure 1The boost circuit 100 may be composed of a voltage regulator 101 and a second transformer 102. The first end of the primary winding of the voltage regulator 101 is connected to the AC power source, the second end of the primary winding of the voltage regulator 101 is grounded, the secondary winding of the voltage regulator 101 is connected in parallel with the primary winding of the second transformer 102, the first end of the secondary winding of the second transformer 102 serves as the output end of the boost circuit 100, and the second end of the secondary winding of the second transformer 102 is connected to the second end of the voltage divider 200. In this case, the AC power output by the AC power source AC is boosted sequentially through the voltage regulator 101 and the second transformer 102.

[0084] In order to make the variable frequency power supply V1 work more reliably, see Figure 2 ,In this embodiment, it includes: a protection module, a voltage module, a full-bridge inverter, a control module and a voltage and current sampling module;

[0085] The input end of the protection module is connected to a DC power supply;

[0086] The input end of the voltage module is connected to the output end of the protection module;

[0087] The input end of the full-bridge inverter is connected to the output end of the voltage module, the positive output end of the full-bridge inverter serves as the first end of the variable frequency power supply V1, and the negative output end of the full-bridge inverter serves as the second end of the variable frequency power supply V1;

[0088] The first control signal output terminal of the control module is connected to the control terminal of the protection module, the second control signal output terminal of the control module is connected to the control terminal of the voltage module, and the third control signal output terminal of the control module is used to provide a PWM control signal to the full-bridge inverter;

[0089] The voltage and current sampling module is used to collect the output and output voltage of the variable frequency power supply V1 and send the sampling results to the control module.

[0090] See also Figure 2 The variable frequency power supply V1 may further include a keyboard module and a display module connected to the control module. The keyboard module is used to assist the user in configuring relevant parameters of the variable frequency power supply V1 through the control module and display them through the display module. The variable frequency power supply V1 may further include an auxiliary power supply, which is used as a backup input power supply for the variable frequency power supply V1.

[0091] In the technical solution disclosed in this embodiment, the capacitor tower C0 can be implemented using pulse capacitors. Specifically, the pulse capacitors can be MAM series capacitors. Considering the dispersed blasting capacity, for example, MAM 6.6-400 unit capacitors can be used. The capacitor tower C0 adopts a design that allows for both serial and parallel connections between layers, enabling it to provide sufficient electrical energy capacity. For example, in this solution, the capacitor tower C0 can be composed of two parallel strings of 116 capacitors, for a total of 232 capacitors in the capacitor tower C0, providing a total energy storage capacity of 23,200 μF. Each capacitor has a rated voltage of 6.6 kV and a rated capacitance of 400 μF. These capacitors are composed of four small capacitor towers, each with two parallel strings of 29 capacitors. Each capacitor tower has a capacity of 5,800 μF, for a total capacity of 23,200 μF across all four towers.

[0092] The ignition device 300 is mainly used as a closing device in the burn-in test circuit of the vacuum interrupter integrated mode. It can realize the closing function of large current and has the advantages of fast action and strong current carrying capacity. The structure of the ignition device 300 is as follows: Figure 3 As shown, the ignition device 300 includes: a trigger control box, a high-voltage ignition box, an ignition ball and a grounding resistor, see Figure 3 The test control area is connected to the trigger control box through an ignition pulse transmission cable. The ignition control box is connected to the high-voltage ignition box through a communication optical fiber and an ignition control optical fiber. The output end of the high-voltage ignition box is connected to the trigger pole of the ignition ball. One end of the ignition ball is connected to the capacitor tower C0 through the reactor group L, and the other end is connected to the auxiliary hook through the busbar.

[0093] When test preparations are complete, the power switch in the high-voltage ignition box is closed, converting the DC power from the battery in the high-voltage ignition box into high-voltage DC power, which charges the capacitor inside the high-voltage ignition box. After charging is complete, both the trigger control box and the high-voltage ignition box are in a ready-to-use state. At this point, the high-voltage ignition box housing is grounded via a high-resistance, high-insulation-strength resistor, providing interference shielding. When the synchronization control device in the test control area sends a start pulse to the trigger control box via the ignition pulse transmission cable, the trigger control box receives the electrical signal from the remote control room, converts it into an optical signal, and then transmits the signal to the high-voltage ignition box via optical fiber. Upon receiving this optical signal, the high-voltage ignition box immediately activates and emits a high-voltage ignition pulse. This pulse voltage is applied via the high-voltage line between the core (trigger electrode) and the shell of the controllable ignition ball, causing a breakdown between the core and shell. This triggers a strong ignition pulse from the trigger gap of the controllable ignition ball, breaking down the main gap of the controllable ignition ball and penetrating the main circuit. The ignition control device isolates the high-voltage circuit from the low-voltage circuit via optical fibers (communication fiber and ignition control fiber), thereby ensuring the safety of the secondary control system. In this embodiment, the ignition device 300's key technical parameters are: ignition actuation time ≤ 50µs, with the unit controlling charging and ignition signals via optical fiber transmission. It should also exhibit excellent resistance to strong electromagnetic interference. Short-term current capacity: 50kA (50Hz frequency), current flow time: 100ms.

[0094] The first high-voltage switch K1 is a pneumatic charging disconnect switch, and the capacitor tower C0 is designed with a safety discharge switch and a shorting switch (grounding switch). A detachable vacuum interrupter 400 is mounted on the fixture and is operated by a control mechanism. The circuit breaker terminals of the detachable vacuum interrupter 400 are connected to the busbar. There is one outgoing and one return line, and the busbar current capacity must be no less than 50kA. The outgoing lines are supported by porcelain bottles with a voltage of no less than 40.5kV to ground, while the return lines are supported by porcelain bottles with a voltage of no less than 10kV. All switches in this solution can be pneumatically operated, and compressed air can be supplied from a pipeline or a gas tank. In the above device, to effectively charge the capacitor tower C0, the voltage regulator 101 has a capacity of ≥40kVA, and the transformer has a capacity of ≥40kVA, 15kV / 380V. The rectifier bridge D1 is configured as 25kV / 2A. The first high-voltage switch K1 is a two-phase switch with a voltage of 250A / 15kV. The inductance of the reactor group L is not less than 0.8735mH, and the current carrying capacity is not less than 25kA (effective value) for more than 50mS. The insulation level of the burn-in test circuit to ground meets at least the 40.5kV voltage level operation requirement, and the sound level during operation does not exceed 65dB.

[0095] Corresponding to the above-mentioned vacuum arc chamber integrated burn-in test circuit, the present application also provides a vacuum arc chamber integrated burn-in test system. In addition to the above-mentioned burn-in test circuit, the burn-in test system also has a control system control. The control system at least includes a host computer. The host computer in the control system can participate in the control of the burn-in test circuit. For example, the host computer can be used to set and control the number of tests of the burn-in test circuit of the vacuum arc chamber integrated mode, and set the configuration parameters or status of the target device in the burn-in test circuit of the vacuum arc chamber integrated mode; the target device at least includes a boost circuit 100, a first high-voltage switch K1, a capacitor tower C0, a reactor group L, an ignition device 300, a frequency modulation resistor R4, a frequency modulation capacitor C1, an auxiliary switch K2, a second high-voltage switch K3, a first transformer Q, a variable frequency power supply V1 and a detachable vacuum arc chamber 400. For details, see Figure 4The control system includes a host computer, a field control cabinet, an air pump, a test room air tank, a control cabinet main power supply, a primary circuit power charging system control interface, and an isolating switch operating mechanism. The field control cabinet contains a PLC system, a power supply system, an electrical conversion module, and a gas circuit control system. The primary circuit power charging system control interface is used to control the AC power output state of the AC power supply in the burn-in test circuit. Each switch in the burn-in test circuit is a pneumatic switch. The isolating switch operating mechanism is used to control the on / off state of each switch in the burn-in test circuit. The field control cabinet is equipped with an isolation transformer, a voltage-stabilized power supply, a UPS, a filter, a PLC, a fiber-optic communication module, a switch operating handle, and an output relay. Fiber-optic cables or other accessories are used for communication and connection between the field control cabinet and the host computer. The host computer controls the state of the AC power supply and each switch in the burn-in test circuit through the field control cabinet. The field control cabinet utilizes a highly reliable power supply system, specifically, an isolation transformer, a voltage-stabilized power supply, a UPS, and a filter. The host computer utilizes fiber-optic communication to enhance reliability. The PLC in the field control cabinet primarily implements system program control, issuing control commands to the Gree switch operating mechanism to control the charging of each pneumatic switch and simultaneously obtain information about the current status of each pneumatic switch. All controls within the field control cabinet can also be manually operated. The pneumatic control cabinet within the field control cabinet primarily includes solenoid valves, a gas-to-electric converter, gas valves, and a gas filtration system. The solenoid valves controlling the gas circuits are two-position, five-way, and three-position, five-way solenoid valves. The gas-to-electric converter is used to feed back the results of the Gree switch operating mechanism's execution to the PLC, completing the control and feedback of the isolating switch operating mechanism. The PLC output circuit is connected to an overvoltage protection element, a varistor, and an RC circuit to protect the PLC and related components. The entire system features comprehensive safety interlock control, real-time online help, and fault display and alarm functions. After the burn-in test preparation is complete, the PLC can shut down all PLC outputs unrelated to the charging of capacitor tower C0 to prevent PLC interference and malfunction during the test. All PLC programs are stored and backed up on the industrial computer. In the event of a PLC program failure, the PLC program can be easily refreshed from the industrial computer to resolve the issue.

[0096] See also Figure 5 The host computer is set at the background monitoring end, and the field control cabinet group is provided with an LCD, which is used to display at least the current state of the field control cabinet and the current state of each switch in each aging test circuit. Figure 5The switch in the control cabinet controls whether the field control cabinet group is powered on or not. The field control cabinet group is provided with an expansion module, and the user can expand the function of the field control cabinet group through the expansion module. The PLC can drive each gas-electric switch through the drive circuit. The gas-electric switch is used to control the ventilation state of the corresponding tracheal passage. The tracheal passage is connected to each switch in the aging test circuit and is used to control the state of each switch in the aging test circuit. The PLC can also collect the current state data of each gas-electric switch through an optical isolation device to identify the state of each switch in the aging test circuit according to the current state of the gas-electric switch. The total pressure of the tracheal passage is not less than 2.0MPa, and the outlet pressure of the tracheal passage is within the range of 0.4-1.0MPa.

[0097] The control system in the test control area remotely controls the switches in the burn-in test circuit and completes wiring changes. The control system includes a host computer, which monitors the status of the switches in the burn-in test circuit and the switches within the on-site control cabinet. It also monitors system alarms, interlocking information, and test chamber gas tank pressure data. The host computer includes robust networking capabilities and communication interfaces supporting TCP / IP, Modem, and 486 / 422 / 232 protocols, facilitating future intelligent management.

[0098] The control system's timing control is the core of the burn-in test. The program controller within the control system can control the timing accuracy of the primary circuit in the burn-in test circuit under various test conditions. This ensures that the current injection timing of capacitor tower C0 and the opening timing of the detachable vacuum interrupter 400 during the burn-in test are synchronized, thereby improving the test success rate and ensuring efficient and economical testing. The control system also features parameter storage, allowing for recall of historical parameter settings.

[0099] In addition, the control system has flexible control, a user-friendly interface, and a human-machine interface, which can complete various control functions conveniently and quickly. The control system can include a remote control system and a local control system. The control system can complete the test tasks according to preset requirements. Among them, the local control system is used to control the opening and closing of all switches, isolating switches, grounding switches, automatic switches, and contactors in the aging test system, and can meet the use requirements under special working conditions such as debugging and maintenance. The remote control system can remotely control the aging test system through the serial port or Ethernet, and at the same time receive information uploaded by the component protection and controller. Both the remote control system and the local control system can realize manual or automatic control of all switches and switches in the aging test system. The control system also has at least one output channel for digital output, which is used to start the data collected when the aging test starts at the beginning of the test. The main interface of the control system also has a remote signal display function, and the control system can also set various test parameters through the human-machine interface.

[0100] The aging test system may also include a measurement system, which includes a host, a sensor, a waveform recorder (which can be replaced by an oscilloscope), a fiber optic isolation signal amplifier converter, control acquisition software, etc. In addition, a computer network system and a printer are used in conjunction with the waveform recorder, which are referred to as supporting equipment below. The computer and the waveform recorder (which can be replaced by an oscilloscope) are connected via an Ethernet network and can transmit test data and related information to each other. The computer is connected to the waveform recorder for measurement acquisition, data analysis and processing, test report page processing and editing, and printing. Figure 6 As shown, the primary sensors of the measurement system measure various data of the target node, transmit the collected results to the photoelectrically isolated receiving end via an optically isolated transmitting end and an optical fiber, record the waveform data of the collected results via a waveform recorder, and transmit the waveform data to a computer. The computer uses built-in measurement software to perform waveform analysis and print the results via a printer. The primary sensors include at least a sensor for measuring the target node in the burn-in test circuit.

[0101] In this embodiment, the target node data to be measured includes the loop current I of the burn-in test circuit, the test voltage U during the burn-in test, and the break voltage Ur. Current is measured using a Rogowski coil, while voltage is measured using a high-voltage probe and voltage divider 200, which have good transient response characteristics. The configuration of the implementation coil is as follows:

[0102] (1) Cut-off frequency: 10MHz

[0103] (2) Frequency band (-3dB): 25MHz

[0104] (3) Measurement range: 10mA~100kA

[0105] See also Figure 6 The signal collected by the primary sensor enters the waveform recorder (or oscilloscope) through the optoelectronic isolation module, which can accurately record all data during the test, including transient and steady-state processes. The data acquisition device of the waveform recorder (or oscilloscope) can simultaneously collect at least 4 analog signals for voltage and current measurement. The data can be exported to facilitate the completion of related calculations and analysis; the data acquisition device has a remote communication function, which can communicate with the remote background in real time and transmit the collected data to the control computer in a timely manner. The waveform recorder (or oscilloscope) has more than 2 switching inputs, and the start and stop of data recording are triggered by the switching input. Optionally, the waveform recorder (or oscilloscope) also has temperature monitoring and display functions. During the test, a large short-circuit current may flow in the loop, causing the equipment to heat up. Temperature monitoring is installed as needed to monitor the temperature at any time.

[0106] In this embodiment, a 400-unit removable vacuum interrupter is installed using system tooling and, in conjunction with a control system, can complete burn-in tests for vacuum interrupters with an effective current of 50kA or less. An automatic adjustment device enables computer-controlled remote switching of circuits, significantly improving test efficiency and ensuring tester safety. The burn-in system also features an emergency alarm system, which activates when a door is accidentally opened while energized, triggering the appropriate emergency stop control procedure. Changes in the threshold switch position automatically disconnect the test equipment.

[0107] The aging test system also has an on-site and remote manual emergency cut-out function, which can manually cut off the equipment from the power supply at any time. The aging test system also has an overcurrent / overvoltage protection function, which automatically cuts out the test equipment when the current / voltage exceeds the set value. The aging test system is equipped with an audible and visual warning light, which indicates the operating status of the equipment through different color audible and visual signals. The aging test system is highly integrated, and the equipment and internal devices should have professional seismic design. The aging test system has a remote monitoring function, which can detect abnormalities in time during the test through remote monitoring to ensure the safety of personnel and equipment. The aging test system also has a power supply system and lighting equipment.

[0108] The functions of the host control system are described as follows:

[0109] 1 System Architecture

[0110] 1.1 Hierarchical Control Architecture

[0111] The host computer adopts a three-layer structure to realize closed-loop control of the above-mentioned burn-in circuit and burn-in system:

[0112] 1.1.1 Perception layer: sensor array and signal acquisition hardware, used to collect signals from target nodes in the burn-in circuit and burn-in system;

[0113] 1.1.2 Decision-making layer: The core processing unit of the upper computer is used to control the burn-in circuit and the burn-in system based on the built-in control program and the signal acquisition results of the perception layer.

[0114] 1.1.3 Execution layer: driving circuits and actuators, used to drive the burn-in circuits and target objects in the burn-in system based on the decision results of the decision layer.

[0115] 1.2 Modular Components

[0116] Hierarchy Composition modules Perception Layer Sensor / Signal Conditioning / AD Conversion decision-making level Data processing / control algorithms Execution Layer DA conversion / actuator drive

[0117] 2 Signal Processing Flow

[0118] 2.1 Forward Control Flow

[0119] 2.1.1 Signal Acquisition Phase

[0120] The sensor detects physical quantities (voltage / current / displacement / image), that is, the sensor detects the data collection results of the target nodes in the burn-in circuit and the burn-in system. These collection results include but are not limited to the current value, voltage value, open distance value of the target node in the burn-in circuit and the image information collected by the image acquisition device.

[0121] The signal conditioning circuit is completed:

[0122] Analog signal amplification (adjustable gain): When amplifying the signal, it is used to amplify the collected analog signal to a level that can be accurately recognized by the subsequent circuit.

[0123] Noise filtering (hardware RC low-pass), the noise filtering circuit is used to filter the collected signal to filter out interference signals in the collected signal, such as burr signals.

[0124] Electrical isolation (optical coupling isolation) is used to achieve electrical isolation between different modules of a circuit to prevent excessive current or voltage from damaging another module.

[0125] 2.1.2 Digital Transformation

[0126] AD conversion (sampling rate ≥ 1kHz), which is used to convert the collected analog signal into a digital signal that can be recognized by the system.

[0127] Protocol encapsulation, the encapsulation protocol is used to encrypt the transmission signal to ensure the security of the signal.

[0128] 2.1.3 Host computer processing

[0129] -Data reception:

[0130] Multi-threaded serial port communication: when receiving data, the host computer can communicate in a multi-threaded serial port manner to improve communication efficiency.

[0131] Protocol analysis (CRC check)

[0132] -Data processing:

[0133] Digital filtering (sliding average + IIR), digital filters can design appropriate filtering algorithms based on the frequency characteristics of signals and noise, effectively remove or suppress noise, and improve the signal-to-noise ratio of the signal.

[0134] Feature extraction (FFT spectrum analysis), spectrum analysis analyzes the energy distribution of the collected signal at different frequencies and extracts the frequency characteristics of the signal.

[0135] -Control Decisions:

[0136] PID parameters: Kp = 2.5, Ki = 0.1, Kd = 0.05. In this solution, the voltage, current and aging frequency of the aging circuit can be adjusted through PID.

[0137] Adaptive adjustment step: 0.1%. During the PID adjustment process, the compensation for each adjustment is 0.1%.

[0138] 2.1.4 Control Output

[0139] -PWM waveform generation. In this solution, some control signals of the host computer are output in PWM mode, for example, the control signal of the rectifier bridge;

[0140] -DA conversion, which is used to convert a digital signal into an analog signal.

[0141] -Executive agency

[0142] 2.2 Feedback Optimization Loop

[0143] 2.2.1 Closed-loop control parameters:

[0144] Sampling period: 20ms±1ms. In this solution, the sampling period of each target node may be 20ms±1ms.

[0145] Feedback delay: ≤5ms. When the feedback delay of a sampling node is greater than 5ms, it indicates that a sampling failure has occurred at the node.

[0146] Overshoot: <5%

[0147] 2.2.2 Dynamic adjustment mechanism:

[0148] Error threshold triggers parameter readjustment (deviation > 10%)

[0149] Historical data sliding window (50 periods)

[0150] Control quantity output limit (0-100%)

[0151] 3 Auxiliary subsystems

[0152] 3.1 Human-Machine Interface (HMI)

[0153] -Real-time monitoring function:

[0154] Waveform display (supports multi-channel synchronization). In order to facilitate user observation, this application can display the target parameters (current / voltage / frequency) in each burn-in circuit to the user in the form of a waveform diagram.

[0155] Parameter panel (PID parameter online modification), in order to facilitate the user to actively intervene in the control of the burn-in circuit and burn-in system, the host computer also provides a parameter panel, the user can control the burn-in circuit and burn-in system through the parameter panel.

[0156] Alarm indication (three-level alarm color coding): when the burn-in circuit or burn-in system fails, the corresponding alarm can be issued through the alarm indication.

[0157] 3.2 Data Management System

[0158] -Storage Architecture:

[0159] Real-time database: SQLite (1ms time accuracy)

[0160] Long-term storage: MySQL (hourly archiving)

[0161] -Data security mechanism:

[0162] Dual backup storage (local + cloud)

[0163] Data encryption (AES-256)

[0164] In the storage architecture, the host computer can store the operating data and configuration data of the burn-in circuit and burn-in system in real time and for a long time. In addition, in order to ensure that the data is not easily lost, a local + cloud dual backup storage method can be adopted, and the data can be encrypted to improve data security.

[0165] 3.3 Communication Management System

[0166] -Exception handling strategy:

[0167] Heartbeat packet detection interval: 500ms

[0168] Disconnection reconnection mechanism: 3 attempts / 30 seconds interval

[0169] Data retransmission: sliding window protocol.

[0170] When the host computer communicates with other objects, it can use heartbeat packets to detect whether the host computer and these objects remain connected. If the connection is disconnected, it will try to reconnect to the object three times / 30 seconds interval. If the connection still fails, it will output a corresponding alarm signal.

[0171] The configuration parameters of the aging test circuit in this embodiment can be set according to the test requirements. For example, the configuration parameters of the aging test circuit can be as shown in Table 1, wherein the current peak in Table 1 is the current value measured by the DC current measuring resistor R5, the charging voltage is the voltage value collected by the voltage divider 200, the capacitance μF is the capacitance value of the capacitor tower C0, the inductance μH is the reactance value of the reactor group L, and the frequency Hz is the discharge frequency determined based on the frequency modulation capacitor C1.

[0172]

[0173]

[0174] Based on the above-mentioned various solution courses, the technical solution disclosed in this application has the following advantages:

[0175] The capacitor tower C0 with a total capacity of 23200μF is capable of outputting a large current of 50kA effective value, providing sufficiently large aging energy. Increasing the aging energy helps to improve the aging effect of the contact surface, solving the problem that insufficient aging energy may lead to incomplete purification of the contact surface and inability to effectively remove gases, oxides and impurities.

[0176] Capacitor Tower C0 utilizes a flexible wiring scheme that allows for both serial and parallel connections between layers, allowing for independent operation. This allows for autonomous adjustment of the capacitance of Capacitor Tower C0. The voltage adjustment of the voltage regulator 101 and the second transformer 102 is controlled by a host computer. The burn-in energy is adjusted by adjusting the capacitance and charging voltage of Capacitor Tower C0. In practice, the capacitance and voltage parameters can be appropriately set based on the specific model and specifications of the arc extinguishing chamber to ensure the appropriate burn-in energy for optimal results.

[0177] Through the design of the frequency modulation capacitor C1 and the frequency modulation resistor R4, the recovery voltage rising rate after the vacuum interrupter breaks the arc is adjusted, making the whole process closer to the operating conditions and improving the equivalence.

[0178] During the burn-in test, charging and discharging are controlled by a host computer, enabling full remote control and automatic adjustment. Before the test, test parameters are input into the host computer, setting various configuration parameters for the burn-in test circuit. The host computer automatically adjusts the burn-in test circuit based on the input parameters, ensuring voltage accuracy and charging speed during the test.

[0179] The current frequency can be adjusted by adjusting the capacitance value of the frequency modulation capacitor C1 and the reactance value of the reactor group L, so that the capacitor tower C0 outputs high-frequency current and improves the aging uniformity.

[0180] The aging method of applying a high current of 50kA / 50Hz combined with a high-frequency current of 500Hz / 5000Hz for multiple cycles not only provides sufficiently large aging energy, but also makes it easier for the ablation position to shift during the aging process, thereby improving the uniformity of aging and thus enhancing the performance of the arc extinguishing chamber.

[0181] By configuring a high-speed camera and a detachable vacuum interrupter 400, the arcing process and contact erosion can be observed. According to the contact erosion, the aging energy of the applied high current is adjusted to ensure the appropriate aging energy. The number of cyclic aging cycles of the high-frequency current is adjusted to ensure aging uniformity.

[0182] By adjusting the different contact opening and closing speeds of the detachable vacuum interrupter, the host computer sets the control current phase and opening time to achieve different arcing times and control the arc ablation effect on the contacts.

[0183] By adjusting the contact opening distance in the detachable vacuum interrupter 400, different aging effects can be achieved. The detachable vacuum interrupter 400 can adjust the contact opening distance to achieve aging work at different opening distances. The electrode opening distance has a great influence on the achievable aging effect and stable breakdown voltage. When aging is performed at a larger opening distance, the electric field strength between the contact electrodes is bound to decrease, making it impossible to cause spark breakdown between the contacts. The spark discharge mainly occurs between the contact electrodes and the shielding cover, and the aging effect is incomplete. At a smaller opening distance, the electric field strength between the contact electrodes is enhanced, and the spark discharge only occurs between the contact electrodes. Spark discharge cannot occur between the contact electrodes and the shielding cover, and the aging effect is also incomplete. When aging is performed at an appropriate opening distance, the effective action area of the two electrode surfaces increases. The increase in effective area increases the degree of aging that can be achieved across the entire electrode surface. Simultaneously, the area of the shield exposed to the discharge zone also increases. This intensifies not only the spark discharge between the contacts but also the spark discharge between the contact edges and the shield. This allows for more complete aging of the contact electrodes and shield surfaces, eliminating high emission points on the contact and shield surfaces and increasing the stable breakdown voltage. In summary, the detachable vacuum interrupter 400 can be aging-controlled at different contact openings by adjusting the contact opening distance. Adjusting the aging opening distance improves the uniformity of aging energy application.

[0184] By adjusting the opening speed of the contacts, the ablation effect of the arc discharge process on the contacts is changed, and the desired aging effect is finally achieved after adjustment.

[0185] By using the variable frequency power supply V1, the voltage is increased by regulating through the first transformer Q, and the arc extinguishing chamber is subjected to high voltage aging at different tap heights, a aging method combining voltage aging and current aging can be implemented. Therefore, the system can also use the variable frequency power supply V1, the voltage is increased by regulating through the first transformer Q, and the arc extinguishing chamber is subjected to high voltage aging at different tap heights, ultimately achieving the desired aging effect.

[0186] The discharge principles of arc discharge, glow discharge and spark discharge modes are different, and their effects on vacuum interrupters are different, resulting in different aging effects. This system can set a variety of different configuration parameters in the host computer according to different principles. After identifying the target discharge mode (arc discharge, glow discharge, spark discharge) selected by the user based on the selection instruction, the host computer can determine the configuration parameters that match the target discharge mode, and automatically configure the aging test circuit of the vacuum interrupter comprehensive mode based on the configuration parameters that match the discharge principle, so that most vacuum interrupter comprehensive mode aging test circuits can have a variety of aging energy injection schemes, and users can also continuously adjust and optimize the configuration parameters in various energy injection schemes based on the information feedback from the high-speed camera to achieve better aging effects. Among them, the configuration parameters may include but are not limited to: the measured voltage assignment of the voltage divider, the amplitude of the current measured by the DC current measuring resistor, the frequency, polarity, duration, number of cycles, contact opening distance, opening speed and other characteristic parameters of the output current of the capacitor tower during the aging process. These parameters can be continuously adjusted and optimized based on the information fed back by high-speed cameras, and different combinations of input parameters can be used to derive more sophisticated burn-in schemes. The continuous iteration and optimization of the schemes have solved the problems of burn-in failure caused by over-aging, under-aging, unevenness, and structural defects of vacuum interrupters in the past.

[0187] For the convenience of description, the above system is described as being divided into various modules according to their functions. Of course, when implementing the present invention, the functions of each module can be implemented in the same or multiple software and / or hardware.

[0188] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. The systems and system embodiments described above are merely schematic, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. A person of ordinary skill in the art can understand and implement it without expending creative effort.

[0189] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present invention.

[0190] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0191] It should also be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0192] The above description of the disclosed embodiments is intended to enable one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be readily apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not limited to the embodiments shown herein but is intended to conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A vacuum interrupter integrated burn-in test circuit, characterized in that: include: Boost circuit, rectifier bridge, voltage divider, first high-voltage switch, capacitor tower, reactor group, ignition device, frequency modulation resistor, frequency modulation capacitor, auxiliary switch, second high-voltage switch, first transformer, variable frequency power supply, detachable vacuum interrupter and DC current measuring resistor; The input end of the boost circuit is connected to an AC power supply; The input end of the rectifier bridge is connected to the output end of the boost circuit; The first end of the voltage divider is connected to the output end of the rectifier bridge, and the second end of the voltage divider is grounded; The first high-voltage switch and the reactor group are connected in series between the first end of the ignition device and the output end of the rectifier bridge; A first end of the capacitor tower is connected to a common end of the first high-voltage switch and the reactor group, and a second end of the capacitor tower is grounded; The frequency modulation resistor and the frequency modulation capacitor are connected in series between the second end of the ignition device and the ground; The first end of the auxiliary switch is connected to the second end of the ignition device; The input end of the detachable vacuum interrupter is connected to the second end of the auxiliary switch, the output end of the detachable vacuum interrupter is grounded, the opening distance of the contacts in the detachable vacuum interrupter is adjustable, and the opening and closing speed of the contacts in the detachable vacuum interrupter is adjustable; The first end of the second high-voltage switch is connected to the second end of the ignition device; A first end of the main winding of the first transformer is connected to a second end of the second high-voltage switch; A first end of the variable frequency power supply is connected to a first end of the secondary winding of the first transformer, and a second end of the secondary winding and a second end of the variable frequency power supply are grounded; One end of the DC current measuring resistor is connected to the second end of the voltage divider, and the other end is grounded.

2. The vacuum interrupter integrated burn-in test circuit according to claim 1, characterized in that: The boost circuit comprises: voltage regulator and second transformer; A first end of the main winding of the voltage regulator is connected to the AC power supply, and a second end of the main winding of the voltage regulator is grounded; The secondary winding of the voltage regulator is connected in parallel with the main winding of the second transformer; A first end of the secondary winding of the second transformer serves as an output end of the boost circuit, and a second end of the secondary winding of the second transformer is connected to a second end of the voltage divider.

3. The vacuum interrupter integrated burn-in test circuit according to claim 1, characterized in that: Also includes: A grounding switch, a protective resistor, a first low-voltage switch, and a second low-voltage switch; The first end of the grounding switch is connected to the second end of the voltage divider, and the second end of the grounding switch is connected to the second end of the capacitor tower; The protection resistor is arranged between the rectifier bridge and the first high-voltage switch; The first end of the first low-voltage switch is connected to the second end of the grounding switch, and the second end of the first low-voltage switch is connected to the second end of the capacitor tower; A first end of the second low-voltage switch is grounded, and a second end of the second low-voltage switch is connected to a second end of the main winding of the first transformer.

4. The vacuum interrupter integrated burn-in test circuit according to claim 1, characterized in that: It also includes an image acquisition device, which is used to acquire images of the contacts in the vacuum interrupter and acquire image information of the discharge process in the vacuum interrupter.

5. The vacuum interrupter integrated burn-in test circuit according to claim 1, characterized in that: The capacitor tower adopts a design structure in which layers can be connected in series or in parallel.

6. The vacuum interrupter integrated burn-in test circuit according to claim 1, characterized in that: The reactance value of the reactor group is adjustable, and the capacitance value of the frequency modulation capacitor is adjustable.

7. The vacuum interrupter integrated burn-in test circuit according to claim 1, characterized in that: The variable frequency power supply comprises: Protection module, voltage module, full-bridge inverter, control module and voltage and current sampling module; The input end of the protection module is connected to a DC power supply; The input end of the voltage module is connected to the output end of the protection module; The input end of the full-bridge inverter is connected to the output end of the voltage module, the positive output end of the full-bridge inverter serves as the first end of the variable frequency power supply, and the negative output end of the full-bridge inverter serves as the second end of the variable frequency power supply; The first control signal output terminal of the control module is connected to the control terminal of the protection module, the second control signal output terminal of the control module is connected to the control terminal of the voltage module, and the third control signal output terminal of the control module is used to provide a PWM control signal to the full-bridge inverter; The voltage and current sampling module is used to collect the output voltage of the variable frequency power supply and send the sampling result to the control module.

8. A vacuum interrupter integrated burn-in test system, characterized in that: A vacuum interrupter integrated burn-in test circuit comprising the vacuum interrupter integrated burn-in test circuit according to any one of claims 1 to 8.

9. The vacuum interrupter integrated burn-in test system according to claim 8, characterized in that: Also includes: Host computer and host computer control system functions; The host computer is used to set and control the number of tests of the burn-in test circuit of the vacuum interrupter integrated mode, and to set the configuration parameters of the target device in the burn-in test circuit of the vacuum interrupter integrated mode; The host computer adopts a system architecture design, signal processing flow, auxiliary subsystems, etc. that are compatible with the implementation of system functions; The target device includes at least a boost circuit, a first high-voltage switch, a capacitor tower, a reactor group, an ignition device, a frequency-modulating resistor, a frequency-modulating capacitor, an auxiliary switch, a second high-voltage switch, a first transformer, a variable-frequency power supply, and a detachable vacuum interrupter.

10. The vacuum interrupter integrated burn-in test system according to claim 9, characterized in that: When the host computer sets the configuration parameters of the target device in the burn-in test circuit of the vacuum interrupter integrated mode, it is specifically used to: identifying a target discharge mode selected by a user based on the selection instruction, the target discharge mode including arc discharge, glow discharge, and spark discharge; The vacuum interrupter integrated burn-in test circuit is configured based on configuration parameters matching the target discharge mode.

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