A test apparatus and system

Abstract

Embodiments of the present application provide a test device and system. The test device comprises: a database module configured to store expected data; a comparison module configured to compare the expected data with test data to obtain a comparison result, the expected data corresponding to the comparison result; a data selection module configured to determine a matching relationship of the comparison result according to the expected data and a correspondence between the expected data and the comparison result; and a plurality of count storage modules configured to count the matched comparison result according to the matching relationship to obtain and store a fail bit count result. The test device and system provided by the present application can improve test efficiency.

Description

Technical Field

[0001] This application relates to the field of chip testing technology, specifically to a testing device and system. Background Technology

[0002] Random data testing comprehensively evaluates the cell durability and crosstalk characteristics of memory under dynamic stress conditions by simulating random read and write operations in real-world user scenarios. Pattern testing, on the other hand, assesses memory reliability under different data write / read conditions by statistically analyzing the proportion of failed bits for different fixed data patterns. Because the requirements of fixed-pattern testing and random data testing are contradictory, the two types of fixed data (all 0s and all 1s) need to be tested separately. The reliability of random testing is then indirectly evaluated by statistically analyzing the FBC (Fail Bit Count) information for the all-0s and all-1s states, thus increasing the testing time. Summary of the Invention

[0003] This application provides a testing device and system that can shorten testing time and improve testing efficiency.

[0004] In a first aspect, this embodiment provides a testing device, including:

[0005] The database module is configured to store the desired data;

[0006] The comparison module is configured to compare expected data with test data to obtain a comparison result, with the expected data corresponding to the comparison result.

[0007] The data selection module is configured to determine the matching relationship of the comparison results based on the expected data and the correspondence between the expected data and the comparison results.

[0008] Multiple counting storage modules are configured to count the comparison results of the matching based on the matching relationship, so as to obtain the failure bit count result and store it.

[0009] In some embodiments, the desired data includes N first digits, the comparison result includes N second digits, and the first digit and the second digit under the same digit have a first digit correspondence relationship.

[0010] The data selection module is configured to select a target counting storage module from multiple counting storage modules based on a first value, and match the target counting storage module with a second value based on a first digit correspondence, so as to obtain a matching relationship between the target counting storage module and the second value.

[0011] In some embodiments, the data selection module includes a selection unit and N connection units, each connection unit being used to acquire a first value and a second value;

[0012] The selection unit is configured to select the corresponding target counting storage module for the connection unit from a plurality of counting storage modules based on a first value.

[0013] The connection unit is configured to be coupled to the target count storage module and transmits the second value corresponding to the connection unit to the target count storage module to obtain a matching relationship.

[0014] In some embodiments, when the desired data is binary data, the first value includes a first digit and a second digit, and the counting storage module includes a first counting storage module and a second counting storage module.

[0015] The first counting storage module is configured to count the second value corresponding to the first digital number to obtain and store the first invalid bit count result;

[0016] The second counting storage module is configured to count the second value corresponding to the second digital code to obtain the second failure bit count result.

[0017] In some embodiments, the counting storage module includes a counting unit and a storage unit connected to the corresponding counting unit;

[0018] The counting unit is configured to count the matched second value to obtain the failure bit count result corresponding to the first value;

[0019] The storage unit is configured to store the result of the failure bit count.

[0020] In some embodiments, the test data includes N-digit third values, and there is a second digit correspondence between the first and third values ​​under the same digit. The second value includes a first comparison state and a second comparison state.

[0021] The comparison module is configured to compare the third value and the first value for each digit according to the second digit correspondence; if the third value and the first value are the same, a first comparison state is obtained; if the third value and the first value are different, a second comparison state is obtained.

[0022] In some embodiments, the test device further includes a command generation and transmission module, which is configured to generate a data read command according to a first configuration parameter and transmit it to the memory under test. The test data is the data read by the memory under test in response to the data read command.

[0023] Alternatively, a data write command can be generated based on the second configuration parameter and transmitted to the memory under test, the data write command including the expected data;

[0024] Both the first and second configuration parameters are obtained from the test controller.

[0025] In some embodiments, the desired data is a random number.

[0026] On the other hand, embodiments of this application also provide a testing system, including the testing device as described above and a memory to be tested, wherein the testing device is coupled to the memory to be tested;

[0027] The memory under test is configured to send the read test data to the test device in response to a data read command, which is generated by the test device.

[0028] In some embodiments, the test system further includes a test controller coupled to the test device, the test controller being configured to output a first profile and a second profile;

[0029] The test equipment is configured to generate a data read command based on a first configuration file, or a data write command based on a second configuration file, the data write command including the desired data.

[0030] The testing equipment and system provided in this embodiment match the comparison results with the counting storage module through a data selection module. The counting storage module counts each matching comparison result according to the matching relationship, thereby obtaining the failure bit count results under different values. In other words, when the expected data is random, the testing equipment provided in this application can simultaneously record the failure bit count information corresponding to "0" and the failure bit count information corresponding to "1", meeting the needs of both fixed-mode testing and random data testing. It eliminates the need for separate testing of all "0"s and all "1"s to help the testing equipment distinguish between "0" and "1" data streams. This not only simulates real user scenario testing but also significantly saves testing time and improves testing efficiency. Furthermore, the testing equipment independently completes the failure bit counts corresponding to "0" and "1" without the need for a test controller, saving communication overhead and time between the test controller and the testing equipment. Attached Figure Description

[0031] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0032] Figure 1 This is one of the structural schematic diagrams of the test equipment provided in some embodiments of this application;

[0033] Figure 2 This is a second schematic diagram of the structure of the test equipment provided in some embodiments of this application;

[0034] Figure 3 This is the third of the structural schematic diagrams of the test equipment provided in some embodiments of this application;

[0035] Figure 4 This is a schematic diagram of the structure of a test system provided in some embodiments of this application.

[0036] Explanation of reference numerals in the attached figures:

[0037] 1. Test equipment; 10. Database module; 20. Comparison module; 30. Data selection module; 40. Counting and storage module; 301. Selection unit; 302. Connection unit; 401. First counting and storage module; 402. Second counting and storage module; 4011. First counting unit; 4012. First storage unit; 4021. Second counting unit; 4022. Second storage unit; 2. Memory under test; 3. Test controller. Detailed Implementation

[0038] In fixed-mode testing, it's necessary to analyze failure sensitivity under specific data patterns, such as recording FBC information for all-0 or all-1 states. However, in random data testing, the overall reliability of random data is evaluated through the recorded overall FBC information, without needing to distinguish between "0" and "1" FBCs. Therefore, these two requirements are contradictory. Currently, the underlying hardware of testing equipment cannot distinguish between "0" and "1" data streams; it records overall FBC information. While this meets the requirements of random data testing, fixed-mode testing for all-0 and all-1 states needs to be performed separately, significantly increasing testing time. To address this issue, some testing equipment transmits the expected data and test data to a test controller connected to the testing equipment. The upper-level software in the test controller compares the expected data and test data and records the "0" and "1" FBC information. However, during the process of recording FBC information of "0" and "1" with the help of the test controller, a large amount of invalid information will be included in the test data and expected data. This will put pressure on the communication between the test equipment and the test controller, increase the communication time cost, which will increase the test duration and lead to low test efficiency.

[0039] In view of this, embodiments of this application provide a testing device and system. The testing device uses a data selection module to match comparison results with a counting storage module. The counting storage module counts each matching comparison result according to the matching relationship, thereby obtaining failure bit count results under different values. That is, when the expected data is random, the testing device provided by this application can simultaneously record failure bit count information corresponding to "0" and failure bit count information corresponding to "1," satisfying the needs of both fixed-mode testing and random data testing. It eliminates the need for separate testing of all "0"s and all "1"s to help the testing device distinguish between "0" and "1" data streams. This not only simulates real user scenario testing but also significantly saves testing time and improves testing efficiency. Furthermore, the testing device independently completes the failure bit counts corresponding to "0" and "1," without the need for a test controller, saving communication overhead and time between the test controller and the testing device.

[0040] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0041] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more features. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

[0042] "A and / or B" includes the following three combinations: A only, B only, and a combination of A and B.

[0043] The use of "applies to" or "configured to" in this application implies open and inclusive language, which does not preclude applicability to or configuration to devices performing additional tasks or steps. Furthermore, the use of "based on" implies openness and inclusivity, because processes, steps, calculations, or other actions "based on" one or more conditions or values ​​may in practice be based on additional conditions or values ​​beyond those conditions.

[0044] In this application, the term "exemplary" is used to mean "used as an example, illustration, or description." Any embodiment described as "exemplary" in this application is not necessarily to be construed as being more preferred or advantageous than other embodiments. The following description is provided to enable any person skilled in the art to make and use this application. Details are set forth in the following description for purposes of explanation. It should be understood that those skilled in the art will recognize that this application can be made without using these specific details. In other instances, well-known structures and processes are not described in detail to avoid obscuring the description of this application with unnecessary detail. Therefore, this application is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of the principles and features disclosed in this application.

[0045] On the one hand, this embodiment provides a testing device 1, such as Figure 1 As shown, the test device 1 includes a database module 10, a comparison module 20, a data selection module 30, and multiple counting storage modules 40. The database module 10 is connected to the comparison module 20 and the data selection module 30, respectively. The comparison module 20 is connected to the data selection module 30, and the data selection module 30 is also connected to the multiple counting storage modules 40.

[0046] The database module 10 (Data Base Management, DBM) is configured to store expected data; the comparison module 20 is configured to compare the expected data with the test data to obtain a comparison result, and the expected data corresponds to the comparison result; the data selection module 30 is configured to obtain a matching relationship between the comparison result and the counting storage module 40 based on the expected data and the correspondence between the expected data and the comparison result; and multiple counting storage modules 40 are configured to count the matched comparison results according to the matching relationship to obtain and store the failure bit count result.

[0047] The expected data can be a random data stream generated in random mode or preset data in fixed mode. The test data is read from the memory under test 2. This test data is formed by the test device 1 writing the expected data into the memory under test 2 in advance. Therefore, ideally, the test data corresponds exactly to the expected data. However, in the actual test process, due to factors such as the physical characteristics of the memory under test 2, process deviations, aging effects, and external environmental interference, there may be differences between the test data and the expected data. By analyzing these differences, the performance evaluation of the memory under test 2 can be completed.

[0048] The comparison module 20 is used to compare the differences between the test data and the expected data and output the comparison result. The comparison result includes two comparison states: the test data matches the expected data, and the test data does not match the expected data. The comparison result corresponds to the expected data in a one-to-one correspondence with the digits of the expected data. For example, if the expected data is 100, the test data is 101, and the comparison result is 001, then the 0th digit "0" in the expected data corresponds to the 0th digit "1" in the comparison result. Similarly, the 1st digit "0" corresponds to "0", and the 2nd digit "1" corresponds to "0". In other words, a "0" in the comparison result indicates that the expected data matches the test data, and a "1" indicates that the two data do not match.

[0049] The data selection module 30 matches different counting storage modules 40 to the values ​​of different digits of the comparison result based on the expected data and the first digit correspondence between the expected data and the comparison result, thereby outputting the matching relationship between the comparison result and the counting storage module 40.

[0050] Each counting storage module 40 is used to count and store the comparison results of a specific value. This specific value is determined based on the range of the expected data. For example, when the expected data is binary data, since each bit of the expected data is either "0" or "1", the specific value is also "0" and "1". Based on this, there are two counting storage modules 40: one counts and stores the matching results for the expected data value of "0", and the other counts and stores the matching results for the expected data value of "1". It can be understood that each counting storage module 40 stores a failure bit count result, and each failure bit count result corresponds to a specific value. Based on the aforementioned example, in the "0" and "1" states, the failure bit count result has two types: a failure bit count result of "0" and a failure bit count result of "1".

[0051] The test device 1 provided in this application uses a data selection module 30 to match the comparison results with a counting storage module 40. The counting storage module 40 counts each of the matched comparison results according to the matching relationship, thereby obtaining the failure bit count results under different values. In other words, when the expected data is random, the test device 1 provided in this application can simultaneously record the failure bit count information corresponding to "0" and the failure bit count information corresponding to "1", satisfying the needs of both fixed-mode testing and random data testing. It eliminates the need for separate testing of all "0"s and all "1"s to help the test device 1 distinguish between "0" and "1" data streams. This not only simulates real user scenario testing but also significantly saves testing time and improves testing efficiency. Furthermore, the test device 1 independently completes the failure bit counts corresponding to "0" and "1" without the need for the test controller 3, saving communication overhead and time between the test controller 3 and the test device 1. In addition, the test device 1 provided in this application is also applicable to fixed modes.

[0052] In some embodiments, the expected data includes N-bit first values, and the comparison result includes N-bit second values. The first and second values ​​at the same bit position have a bit correspondence. It is understood that the range of the first value depends on the data encoding format of the expected data. In binary, the first value is "0" or "1". In decimal, the first value ranges from 0 to 9, for a total of 10 states. The following embodiments use binary as an example. The second value has only two states: one where the expected data matches the test data, and the other where they do not match. The second value in the matching and non-matching states can be set. For example, the second value is 0 in the matching state and 1 in the non-matching state; or the second value is 0 in the matching state and 2 in the non-matching state, etc. The following embodiments use the example of the second value being 0 in the matching state and 1 in the non-matching state. The N-bit first values ​​in the expected data can be the same or different, and the N-bit second values ​​in the comparison result can also be the same or different.

[0053] The data selection module 30 is configured to select a target counting storage module from a plurality of counting storage modules 40 according to a first value, and match the target counting storage module with a second value according to a first digit correspondence relationship to obtain a matching relationship between the target counting storage module and the second value.

[0054] That is, the data selection module 30 selects a counting storage module 40 for each digit based on the magnitude of the first value, thus forming a correspondence between the first value and the target counting storage module. Illustratively, when the expected data is binary data, there are a total of two counting storage modules 40: one for counting the invalid bits of "0" and the other for counting the invalid bits of "1". When the first value is "0", the digit containing that first value corresponds to the target counting storage module used for counting the invalid bits of "0", and vice versa. Taking the data shown in Table 1 as an example, the expected data, test data, and comparison result all have 8 bits. The 0th, 3rd, 6th, and 7th bits of the expected data that are 1 correspond to counting storage module "1", and the 1st, 2nd, 4th, and 5th bits of the expected data that are 0 correspond to counting storage module "0". The data selection module 30 matches the second value of the same digit with the target counting module according to the first digit correspondence relationship to obtain the matching relationship between the second value and the target counting storage module. Taking Table 1 as an example, the second value of the 0th, 3rd, 6th, and 7th digits in the comparison result matches the counting storage module "1", and the second value of the 1st, 2nd, 4th, and 5th digits in the comparison result matches the counting storage module "0". The target counting storage module counts the matched second values. The counting storage module "0" obtains a count result of 1 for the invalid digit of "0", and the counting storage module "1" obtains a count result of 1 for the invalid digit of "1".

[0055] Table 1: Data Correspondence Diagram

[0056]

[0057]

[0058] The test device 1 provided in this application embodiment realizes the splitting of failure bit data with different values ​​through the data selection module 30, so that the counting storage module 40 can count failure bits separately and finally obtain the failure bit count results with different values ​​at the same time. It does not require separate testing or the use of the test controller 3, which greatly improves the testing efficiency.

[0059] In some embodiments, such as Figure 2 as well as Figure 3 As shown, the data selection module 30 includes a selection unit 301 and N connection units 302. Each connection unit 302 is used to obtain a first value and a second value, that is, each connection unit 302 obtains the first value and the second value of the same digit.

[0060] The selection unit 301 is configured to select a corresponding target counting storage module for the connection unit 302 from a plurality of counting storage modules 40 based on a first value.

[0061] The connection unit 302 is configured to be coupled to the target count storage module and transmits the second value corresponding to the connection unit 302 to the target count storage module to obtain a matching relationship.

[0062] That is, the connection between the connection unit 302 and the corresponding counting storage module 40 is established based on the first value, and then the second value corresponding to the connection unit 302 is transmitted separately to the corresponding counting storage module 40, thereby realizing the counting of failure bits with different values. (Illustratively, as shown...) Figure 3 As shown, the expected data has an 8-bit first value DBM[7:0], and the comparison result has an 8-bit second value D[7:0]. Correspondingly, there are 8 connection units 302. Each connection unit 302 acquires the first and second values ​​for the same digit. Taking the data in Table 1 as an example, the connection units 302 for bits 1, 2, 4, and 5 are coupled to the counting storage module "0", and the connection units 302 for bits 0, 3, 6, and 7 are coupled to the counting storage module "1". The matching relationship between the target counting storage module and the second value is obtained through the above coupling. It can be understood that the coupling relationship between the connection units 302 and the counting storage module 40 changes in real time depending on the expected data. The number of connection units 302 is the same as the number of first values ​​in the expected data.

[0063] The test device 1 provided in this application embodiment achieves coupling between the connection unit 302 and the target counting storage module through the selection unit 301, thereby realizing the splitting of comparison results. This not only improves test efficiency, but also only requires adding a data selection module 30 including the selection unit 301 and the connection unit 302 to the test device 1 to achieve data stream differentiation, reducing the cost and difficulty caused by modifications to the test device 1.

[0064] In some embodiments, when the desired data is binary data, the first value includes a first digit "0" and a second digit "1", and the counting storage module 40 includes a first counting storage module 401 and a second counting storage module 402. That is, the counting storage module 40 is determined according to the value range of the first value. If the first value is "0" or "1", then the counting storage module 40 has 2 modules; if the first value is 0 to 9, then the counting storage module 40 has 10 modules.

[0065] The first counting storage module 401 is configured to count the second value corresponding to the first digit to obtain a first failure bit count result; the second counting storage module 402 is configured to count the second value corresponding to the second digit to obtain a second failure bit count result. That is, the first counting storage module 401 is used to count the failure bits of "0", and the second counting storage module 402 is used to count the failure bits of "1".

[0066] The test device 1 provided in this application embodiment counts the failure bits of "0" using the first counting storage module 401 and the failure bits of "1" using the second counting storage module 402. It can evaluate the impact of "0" on the memory under test 2 based on the failure bit information of "0" and evaluate the impact of "1" on the memory under test 2 based on the failure bit information of "1". Simultaneously, it analyzes the cell durability and crosstalk characteristics of the memory under test 2 under dynamic stress conditions based on the total failure bit information of "0" and "1". Therefore, the test device 1 provided in this application embodiment can simultaneously meet the needs of fixed-mode testing and random data testing. Furthermore, when the expected data is random, the test device 1 provided in this application embodiment can complete the acquisition of threshold voltage (VT) under Set and Reset operations, eliminating the need to separately collect VT datasets after each operation. This reduces the VT dataset acquisition time by half, significantly improving efficiency. Specifically, the Set operation switches the memory cell in the memory under test 2 from a high-resistance state to a low-resistance state, corresponding to a decrease in the threshold voltage VT, which corresponds to a binary "1". Conversely, the Reset operation switches the memory cell from a low-resistance state to a high-resistance state (HRS), which corresponds to an increase in the threshold voltage VT, and is associated with binary "0". The electrical characteristics and reliability of the memory cell are evaluated using the VT data.

[0067] In some embodiments, the counting storage module 40 includes a counting unit and a storage unit connected to the corresponding counting unit. That is, each counting storage module 40 includes a counting unit and a storage unit, and the counting unit and the storage unit are connected. Figure 3 As shown in the example, the first counting storage module 401 includes a first counting unit 4011 and a first storage unit 4012; the second counting storage module 402 includes a second counting unit 4021 and a second storage unit 4022.

[0068] The counting unit is configured to count the matched second value to obtain the failure bit count result corresponding to the first value. The storage unit is configured to store the failure bit count result.

[0069] In some embodiments, the test data includes an N-digit third value, and the first and third values ​​at the same digit have a second digit correspondence. The second value includes a first comparison state and a second comparison state. The first comparison state can be represented by "0", and the second comparison state can be represented by "1". In other embodiments of this application, it can also be represented by other values ​​or forms.

[0070] The comparison module 20 is configured to compare the third value and the first value for each digit according to the second digit correspondence; if the third value and the first value are the same, a first comparison state is obtained; if the third value and the first value are different, a second comparison state is obtained.

[0071] In some embodiments, the test device 1 further includes a command generation and transmission module, which is configured to generate a data read command according to a first configuration parameter and transmit it to the memory under test 2, wherein the test data is the data read by the memory under test 2 in response to the data read command; or, generate a data write command according to a second configuration parameter and transmit it to the memory under test 2, wherein the data write command includes expected data.

[0072] Both the first and second configuration parameters are obtained from the test controller 3. The first configuration parameter includes initialization parameters such as the communication protocol, clock frequency, and power supply voltage for initializing the test device 1. The second configuration parameter includes parameters for the data mode and write address.

[0073] In some examples, the command generation and transmission module includes an ALPG (Algorithmic Pattern Generator) unit, a TG (Timing Generator) unit, and a WF (Waveform Formatter) unit. Taking data reading as an example, after obtaining the first configuration parameters, the ALPG unit generates the target physical address and opcode according to the pre-configured address pattern. The TG unit, in conjunction with the timing specifications of the memory protocol, inserts the necessary delay after the target physical address becomes valid and generates a command schedule table accurate to the clock cycle. The WF unit, based on the interface protocol and the timing of the scheduled commands output by the TG unit, converts the digital read command into a physical layer signal, adds a parity bit or pre-emphasis compensation, and finally forms the data read command. Similarly, the data write command is generated based on the ALPG unit, TG unit, and WF unit, and will not be described further here.

[0074] On the other hand, this embodiment also provides a testing system, such as Figure 4As shown, the test system includes a test device 1, a memory under test 2, and a test controller 3. The test controller 3 is coupled to the test device 1, and the test device 1 is coupled to the memory under test 2.

[0075] Test controller 3 is configured to output a first configuration file and a second configuration file.

[0076] Test device 1 is configured to generate a data read command based on a first configuration file, or a data write command based on a second configuration file, wherein the data write command includes the desired data.

[0077] The memory under test 2 is configured to send the read test data to the test device 1 in response to a data read command sent by the test device 1. The memory under test 2 is also used to write the desired data in response to a data write command sent by the test device 1.

[0078] In addition, the test device 1 includes a database module 10, a comparison module 20, a data selection module 30, and multiple counting storage modules 40. The multiple counting storage modules 40 are connected to the test controller 3, and the counting storage modules 40 send the recorded failure bit count results to the test controller 3. Furthermore, the comparison module 20 is also connected to the memory under test 2, and the comparison module 20 reads test data from the memory under test 2.

[0079] The database module 10 is configured to store expected data; the comparison module 20 is configured to compare the expected data with the test data to obtain a comparison result, and the expected data corresponds to the comparison result; the data selection module 30 is configured to obtain a matching relationship between the comparison result and the counting storage module 40 based on the expected data and the correspondence between the expected data and the comparison result; and multiple counting storage modules 40 are configured to count the matched comparison results according to the matching relationship to obtain and store the failure bit count result.

[0080] The testing system provided in this application embodiment realizes the counting of "0" failure bits and the counting of "1" failure bits through the testing device 1, without the need for separate testing or the use of the testing controller 3, thereby improving testing efficiency.

[0081] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0082] The above provides a detailed description of a testing device 1 and system provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A testing device, characterized in that, include: The database module is configured to store the desired data; A comparison module is configured to compare the expected data with the test data to obtain a comparison result, wherein the expected data corresponds to the comparison result. The data selection module is configured to determine the matching relationship of the comparison results based on the expected data and the correspondence between the expected data and the comparison results; Multiple counting storage modules are configured to count the comparison results of the matching according to the matching relationship, so as to obtain the failure bit count result and store it; The expected data includes N first digits, the comparison result includes N second digits, and the first digit and the second digit under the same digit have a first digit correspondence relationship; The data selection module is configured to select a target counting storage module from the plurality of counting storage modules according to the first value, and match the target counting storage module with the second value according to the first digit correspondence relationship to obtain the matching relationship between the target counting storage module and the second value; The first value includes a first digit and a second digit, and the counting storage module includes a first counting storage module and a second counting storage module; The first counting storage module is configured to count the second value corresponding to the first digital number to obtain and store the first invalid bit count result; The second counting storage module is configured to count the second value corresponding to the second digital code to obtain the second failure bit count result.

2. The testing equipment according to claim 1, characterized in that, The data selection module includes a selection unit and N connection units, each of which is used to acquire a first value and a second value. The selection unit is configured to select a corresponding target counting storage module for the connection unit from the plurality of counting storage modules according to the first value; The connection unit is configured to be coupled to the target counting storage module, and transmits the second value corresponding to the connection unit to the target counting storage module to obtain the matching relationship.

3. The testing equipment according to claim 1, characterized in that, The counting storage module includes a counting unit and a storage unit connected to the corresponding counting unit; The counting unit is configured to count the matched second value to obtain the failure bit count result corresponding to the first value; The storage unit is configured to store the failure bit count result.

4. The testing equipment according to claim 1, characterized in that, The test data includes N-digit third values, and there is a second digit correspondence between the first value and the third value under the same digit. The second value includes a first comparison state and a second comparison state. The comparison module is configured to compare the third value and the first value for each digit according to the second digit correspondence; and to obtain the first comparison state if the third value is the same as the first value. If the third value is different from the first value, the second comparison state is obtained.

5. The testing equipment according to claim 1, characterized in that, The testing device further includes a command generation and transmission module, which is configured to generate a data reading command according to a first configuration parameter and transmit it to the memory under test. The test data is the data read by the memory under test in response to the data reading command. Alternatively, a data write command can be generated based on the second configuration parameters and transmitted to the memory under test, wherein the data write command includes the desired data; Both the first configuration parameter and the second configuration parameter are obtained from the test controller.

6. The testing equipment according to any one of claims 1 to 5, characterized in that, The desired data is a random number.

7. A testing system, characterized in that, Includes the test device as described in any one of claims 1 to 6 and the memory under test, wherein the test device is coupled to the memory under test; The memory under test is configured to send the read test data to the test device in response to a data read instruction generated by the test device.

8. The testing system as described in claim 7, characterized in that, The testing system further includes a test controller, which is coupled to the testing equipment and is configured to output a first configuration file and a second configuration file. The test device is configured to generate a data read command based on the first configuration file, or to generate a data write command based on the second configuration file, wherein the data write command includes desired data.

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