A gas chamber structure optimization method and system based on a gas sensor

Abstract

The present application relates to the technical field of structure optimization, in particular to a gas chamber structure optimization method and system based on a gas sensor, comprising the following steps: obtaining gas chamber channel flow rate and temperature data, identifying compression section numbers, positioning light beam reflection abnormal paths, reconstructing local structure proportions, calculating volume and flow rate difference values, screening retention area numbers, setting coating configuration parameters, establishing reflection control lists, correlating structure adjustments and wavelength response intervals, and generating optimized gas chamber structure configuration information.The present application effectively identifies structures that need to be optimized by obtaining and analyzing test data of the gas chamber channel and comparing structure compression critical proportions, improves the adaptability of the structure, enhances the measurement accuracy and response speed of the analyzer, performs abnormal detection and optimization on the light beam path, effectively reduces the overlap and interference of the light beam, improves the reliability of the detection results, and optimizes the flow efficiency of the gas by redesigning the channel form and proportion.

Description

Technical Field

[0001] This invention relates to the field of structural optimization technology, and in particular to a method and system for optimizing the structure of a gas chamber based on a gas sensor. Background Technology

[0002] The field of structural optimization technology primarily involves the multi-objective coordination and optimization of engineering structures in terms of functionality, strength, stiffness, size, shape, mass distribution, and manufacturing feasibility through system design, mechanical analysis, and mathematical modeling. This aims to achieve optimal or near-optimal results for the structure while meeting performance constraints. This field is widely used in technology-intensive industries such as mechanical engineering, aerospace, automotive engineering, precision instruments, and electronic equipment, with a particular focus on improving the efficiency, reliability, and manufacturing economy of structural systems. Common methods include topology optimization, dimensional optimization, shape optimization, and multidisciplinary collaborative optimization, combined with tools such as finite element analysis and parameter sensitivity analysis to achieve accurate prediction and iterative improvement of structural performance.

[0003] The gas chamber structure optimization method aims to improve the design of the gas channel cavity structure in a spectroscopic gas analyzer. This approach achieves uniform gas flow, stable optical signal transmission, and minimized interference signals through precise control of factors such as the shape and size ratio of the gas channel's inner wall, the optical path, and reflection interference characteristics. This method primarily improves the detection accuracy, response time, and gas utilization efficiency of spectroscopic gas analyzers, and is suitable for applications requiring high-precision gas concentration measurement, such as industrial monitoring, medical diagnostics, and environmental monitoring.

[0004] Traditional optimization methods focus on multi-objective mathematical modeling and analysis of structural geometry, stress distribution, and material configuration. However, in gas channel structures, they lack consideration of the interplay between fluid behavior and optical signal propagation characteristics, making it difficult to balance gas flow uniformity and optical interference stability in the optimization results. For example, structural topology optimization based solely on finite element models cannot reflect gas stagnation caused by local gas velocity fluctuations in real time during the design process. It also struggles to identify the interference overlap behavior of light beams in multiple reflection paths, leading to signal jitter, response lag, or insufficient detection accuracy under high-frequency response or high-sensitivity measurement conditions. Furthermore, traditional methods rely on uniform materials or full-coverage coatings to control the reflection characteristics of the gas chamber walls, lacking a grouping control mechanism based on spectral center wavelength response characteristics. This results in frequent superposition of wall interference signals and unstable reflection paths in multi-wavelength measurement tasks, causing noise redundancy and distribution shifts in the detection data, affecting the accuracy and reliability of monitoring and judgment. Summary of the Invention

[0005] The purpose of this invention is to overcome the shortcomings of the existing technology and propose a gas chamber structure optimization method and system based on a gas sensor.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: a method for optimizing the structure of a gas chamber based on a gas sensor, comprising the following steps:

[0007] S1: Obtain test data of the analyzer's gas chamber channel, calculate the ratio of gas velocity to cross-sectional area in each segment, compare the ratio with the set structural compression critical ratio in the channel segment by segment, identify the list of structural numbers with compression requirements, and generate a set of structural segment numbers to be optimized.

[0008] S2: Call the set of structural segments to be optimized, and by judging whether the number of beam overlaps on a single path segment is greater than the upper limit standard of channel reflection load, filter the location of the reflection signal disorder area and generate a set of abnormal beam path segments.

[0009] S3: Based on the set of abnormal beam path segments, identify the area number where the gas stagnation risk value exceeds the stagnation judgment value, reset the corresponding channel shape to an unequal width channel structure, record the new cross-sectional ratio of each structural segment, and generate a set of channel reconstruction structure ratio parameters.

[0010] S4: Call the channel to reconstruct the structural ratio parameter set, obtain the difference value of the reflection path and the range of the center reflection wavelength before and after the structural deformation, divide it into multiple reflection influence groups according to the wavelength range, analyze the required reflection reduction range according to the target reflectivity, set the required coating thickness and material number, and generate a wall reflection control ratio list.

[0011] The present invention is improved in that the set of structural segments to be optimized includes a structural segment number sequence, a structural compression critical value, and a corresponding channel position identifier; the set of abnormal beam path segments includes a reflection path superposition segment number, an optical path number threshold, and a range of inner wall reflection point coordinates; the set of channel reconstruction structural ratio parameters specifically includes a cross-sectional ratio setting value, a channel segment number mapping relationship, and a reconstruction volume index sequence; and the wall reflection control ratio list includes a reflectivity adjustment group number, a corresponding wavelength range, and a coating thickness parameter index.

[0012] The present invention is improved in that the step of obtaining the set of structural segment numbers to be optimized is specifically as follows:

[0013] S111: Acquire test data of the analyzer gas chamber channel, including the instantaneous flow velocity and temperature stability values ​​of the front, middle and final sections under steady-state gas inlet conditions. Pair the flow velocity value of each section with the corresponding cross-sectional area in the channel geometry, calculate the ratio between the gas flow velocity and the cross-sectional area of ​​each section, and generate a flow velocity-area ratio sequence.

[0014] S112: Based on the velocity-area ratio sequence, according to each ratio data segment, call the structural compression critical ratio value set inside the channel, compare each ratio segment with the structural compression critical ratio value in sequence, determine the segment number whose ratio is lower than the structural compression critical ratio value, obtain the set of numbers that can implement structural compression, and generate a compression requirement segment number sequence.

[0015] S113: Based on the compression requirement paragraph number sequence, and according to the paragraph structure region number corresponding to each number, the corresponding channel segment positions in the three-dimensional structure model of the air chamber are numbered and summarized. A number list is constructed according to the paragraph numbering sorting rules to form a set of structural segment numbers to be optimized.

[0016] The present invention is improved in that the step of obtaining the set of abnormal beam path segments is specifically as follows:

[0017] S211: Call the set of structural segments to be optimized, obtain the number of each structural segment, extract the incident angle and exit angle values ​​of the beam in the analyzer gas chamber channel, and combine the channel contour information in the three-dimensional structural diagram to locate the coordinate points of the inner wall reflecting surface of each segment. Determine the propagation direction difference between the incident path and the exit path through coordinate association, and generate a segment angle and coordinate matching dataset.

[0018] S212: Based on the segment angle and coordinate matching dataset, according to the incident angle, exit angle, and reflection point coordinates, combined with the reflection path trajectory of the structural segment in the air chamber channel structure, calculate the number of reflections and the total optical path length of the corresponding structural segment, and record whether the beam reflection path spatially overlaps in the channel wall. Compare the number of beam reflections and the optical path length with the upper limit standard of reflection load per unit channel segment, using the formula:

[0019]

[0020] The reflection load deviation value is obtained by calculation. The segment number of the reflection load deviation value is greater than the set deviation judgment benchmark value and is included in the abnormal segment set to generate a reflection abnormal segment identification list.

[0021] Among them, R i N represents the deviation value of the reflected load in the i-th segment. i L represents the number of reflections of the i-th beam segment. i Let P be the total optical path length of the i-th segment. ij T represents the projected area of ​​the reflection point of the j-th path in the i-th segment on the channel surface. i Let m be the allowable reflection load threshold for the i-th channel segment, and m be the total number of beam paths in the i-th segment.

[0022] S213: Based on the list of abnormal reflection segments, retrieve the position of each segment number in the air chamber structure, extract the marking status and path coordinates of overlapping reflection segments, filter the segment numbers that meet the standard that the number of beam overlap paths exceeds the reflection load, and generate a set of abnormal beam path segments.

[0023] The present invention is improved in that the specific steps for obtaining the channel reconstruction structure ratio parameter set are as follows:

[0024] S311: Obtain the set of abnormal beam path segments, extract the cross-sectional width value, height value, channel segment length value and number of reflection points of the corresponding channel segment, calculate the cross-sectional area and local area volume index, and generate a local volume index sequence;

[0025] S312: Based on the aforementioned local volume index sequence, according to the volume value of each numbered segment and the gas flow rate value within the channel segment, the ratio of each segment's volume index to its corresponding flow rate value is calculated using the following formula:

[0026]

[0027] The gas stagnation risk value of each numbered segment is obtained through calculation. The stagnation risk value is compared with the gas retention judgment value. The set of numbers whose gas stagnation risk value exceeds the gas retention judgment value is filtered out to generate a channel retention segment identification list.

[0028] Among them, S k V represents the risk value of gas stagnation in the k-th segment. k Let F be the volume index for the k-th segment. k Let A be the gas velocity value in the k-th segment. k Let D be the cross-sectional area of ​​the k-th segment. k Q represents the number of reflection points in the k-th segment. k Let k be the length of the channel segment.

[0029] S313: Based on the channel stagnation segment identification list, adjust the channel shape of each segment to be of unequal width, record the new width and height values ​​of the cross-section after the structural segment adjustment, calculate and archive the new width-to-height ratio of the cross-section, establish a correlation record table between the structural segment number and the corresponding new cross-section ratio, and generate a channel reconstruction structural ratio parameter set.

[0030] The present invention is improved in that the specific steps for obtaining the wall reflection control ratio list are as follows:

[0031] S411: Call the channel reconstruction structure ratio parameter set, obtain the reflection path trajectory data of the corresponding structure segment under the conditions before and after deformation, calculate the difference in the number of path segments and the difference in the total length of the reflection path for each structure segment, combine the path difference with the center wavelength response segment to form a difference label set, and generate a reflection path difference feature set.

[0032] S412: The reflection path difference feature set is invoked. Based on the center wavelength response segment of each numbered segment, the response segment is divided into multiple wavelength coverage intervals. The target reflectivity is set in conjunction with the reflectivity threshold standard of the spectral analyzer. The required reflectivity adjustment range for the coating is calculated based on the difference between the current reflectivity value and the target reflectivity value in each wavelength interval, using the formula:

[0033]

[0034] The reflection modulation offset value corresponding to each wavelength range is obtained through calculation, and the offset value is used as the reflectivity optimization range identification parameter to obtain the reflectivity reduction group corresponding to each segment number, thereby generating a wavelength reflection modulation group set.

[0035] Among them, R xge W represents the reflection modulation offset value of segment x within the wavelength range g. xce W represents the current reflectance value for segment x. xre Z represents the reflectivity value of the target in segment x. xe H represents the cross-sectional proportion of the x-th structural segment after deformation. xe Let B be the projection height value of the x-th optical path segment. xe Let A be the total length of the current reflection path in segment x. xe Let x be the number of the original paths in segment x;

[0036] S413: Based on the wavelength reflection control set, match and map the reflection control offset value of each set with the material number and thickness correspondence already identified in the coating database, select the coating material number whose reflectivity adjustment capability is higher than the target reflectivity offset value, and mark the required coating thickness value, establish a matching table between structural segment number, wavelength range, material number and thickness value, and generate a wall reflection control ratio list.

[0037] The present invention has an improvement, wherein the method further includes:

[0038] S5: Call the wall reflection control ratio list, compare the wavelength values ​​of the sensitive interval in the sensor calibration response spectrum, identify the segment number that overlaps with the sensitive interval in the frequency domain after structural adjustment, build an optimized structural parameter combination set including channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value, and generate optimized air chamber structure configuration information.

[0039] The optimized air chamber structure configuration information specifically refers to the structural segment arrangement sequence, structural cross-sectional combination parameters, optical path structure index, inner wall reflection parameter labels, and sensor response target band.

[0040] The present invention is improved in that the step of obtaining the optimized air chamber structure configuration information is specifically as follows:

[0041] S511: Call the wall reflection control ratio list, extract the structural ratio configuration value, reflection control material number and reflection path adjustment value of the corresponding segment, obtain the wavelength start value and end value of the sensor calibration response spectrum, determine whether the center wavelength of the reflection path formed after structural deformation is within the sensitive range, filter the segment number set of overlapping wavelength bands, and generate a frequency domain overlapping segment identifier set.

[0042] S512: Based on the frequency domain overlapping segment identifier set, obtain the cross-sectional width and height values ​​of the corresponding segment, calculate the cross-sectional ratio and extract the reflection path value and material number, integrate the three data into a segment structure state group, arrange them in the order of segment number to construct a number index, associate the structure state group with the channel structure morphology structure map, and generate a segment structure coupling parameter group.

[0043] S513: Call the paragraph structure coupling parameter group, and according to the number index and structural feature parameters, integrate the paragraph order, cross-sectional ratio value, number of reflection paths, coating number, and target response band into a unified form structure, and embed it into the overall structure mapping diagram of the gas channel in sequence according to the coupling association order, establish the set information of each paragraph configuration, and generate optimized gas chamber structure configuration information.

[0044] A gas sensor-based gas chamber structure optimization system is provided, wherein the gas sensor-based gas chamber structure optimization system is used to implement the above-mentioned gas sensor-based gas chamber structure optimization method, and the system includes:

[0045] The optimized structure identification module acquires test data from the analyzer's gas chamber channel, calculates the ratio of gas velocity to cross-sectional area in each segment, compares the ratio with the set structural compression critical ratio within the channel segment by segment, identifies a list of structural numbers with compression requirements, and generates a set of structural segment numbers to be optimized.

[0046] The beam anomaly identification module calls the set of structural segments to be optimized, and by judging whether the number of beam overlaps on a single path segment is greater than the upper limit standard of channel reflection load, it filters the location of the reflected signal disorder area and generates a set of beam path anomaly segments.

[0047] Based on the set of abnormal beam path segments, the channel reconstruction analysis module identifies the region number where the gas stagnation risk value exceeds the stagnation judgment value, resets the corresponding channel shape to an unequal width channel structure, and generates a set of channel reconstruction structure ratio parameters.

[0048] The wall reflection control module calls the channel reconstruction structure ratio parameter set, divides it into multiple reflection influence groups according to wavelength range, analyzes the required reflection reduction range based on the target reflectivity, sets the required coating thickness and material number, and generates a wall reflection control ratio list.

[0049] The structural optimization configuration module calls the wall reflection control ratio list, identifies the segment numbers that overlap with the sensitive interval in the frequency domain after structural adjustment, and assembles an optimized structural parameter combination set that includes the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value, and generates optimized air chamber structural configuration information.

[0050] Compared with the prior art, the advantages and positive effects of the present invention are as follows:

[0051] In this invention, by acquiring and analyzing test data of the gas chamber channel, the ratio of gas velocity to cross-sectional area in each segment is accurately calculated, and the critical compression ratio of the structure is compared, effectively identifying structural segments that need optimization and improving the adaptability of the structure. By reducing gas stagnation and turbulence in the channel, the measurement accuracy and response speed of the analyzer are enhanced. Anomaly detection and optimization of the beam path effectively reduce beam overlap and interference, optimize the stable transmission of optical signals, and improve the reliability of detection results. By redesigning the channel shape and proportions, the gas flow efficiency is optimized, and energy consumption and material usage are reduced, thereby improving the subsequent detection effect. Attached Figure Description

[0052] Figure 1 This is a flowchart of the method of the present invention;

[0053] Figure 2 This is a flowchart illustrating the process of obtaining the set of structural segment numbers to be optimized according to the present invention.

[0054] Figure 3 This is a flowchart illustrating the process of obtaining a set of abnormal beam path segments according to the present invention.

[0055] Figure 4 This is a flowchart illustrating the process of obtaining the channel reconstruction structure ratio parameter set according to the present invention.

[0056] Figure 5 This is a flowchart illustrating the process of obtaining the wall reflection control ratio list for this invention.

[0057] Figure 6 This is a flowchart illustrating the process of obtaining optimized air chamber structure configuration information for this invention. Detailed Implementation

[0058] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0059] In the description of this invention, it should be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. Furthermore, in the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0060] Please see Figure 1 This invention provides a technical solution: a method for optimizing the structure of a gas chamber based on a gas sensor, comprising the following steps:

[0061] S1: Acquire test data of the analyzer's gas chamber channel, including the instantaneous flow rate and temperature stability values ​​of the front, middle and final sections under steady-state gas flow conditions. Differentiate each section according to the geometric distribution area of ​​the channel cross-section, calculate the ratio of gas flow rate to cross-sectional area in each section, compare the ratio with the set structural compression critical ratio in the channel section by section, identify the list of structural numbers with compression requirements, and generate a set of structural segment numbers to be optimized.

[0062] S2: Call the set of structural segment numbers to be optimized, obtain the incident angle, exit angle and local inner wall reflection point coordinates of the beam in the segment, calculate the number of path segments and optical path length formed by the beam on the channel wall, and record the reflection surface number where there is beam overlap path. By judging whether the number of beam overlap on a single path segment is greater than the upper limit standard of channel reflection load, filter the location of the reflection signal disorder area and generate a set of abnormal beam path segments.

[0063] S3: Based on the set of abnormal beam path segments, extract the actual channel cross-sectional dimensions, number of reflection points and channel length of the corresponding area, and use the product of the cross-sectional area and channel length as the local volume index. Compare the local volume index with the gas flow velocity in the channel to identify the area number where the gas stagnation risk value exceeds the stagnation judgment value. Reset the channel shape corresponding to the number to an unequal width channel structure, record the new cross-sectional ratio of each structural segment, and generate a set of channel reconstruction structure ratio parameters.

[0064] S4: Call the channel to reconstruct the structural ratio parameter set, obtain the difference value of the reflection path and the central reflection wavelength range formed before and after the structural deformation according to the structural segment number, divide it into multiple reflection influence groups according to the wavelength range, analyze the required reflection reduction range according to the target reflectivity, set the required coating thickness and material number, and generate a wall reflection control ratio list.

[0065] S5: Call the wall reflection control ratio list, extract the structural ratio configuration, inner wall material number and reflection path adjustment value of the channel segment, compare the wavelength value of the sensitive interval in the sensor calibration response spectrum, identify the segment number that overlaps with the sensitive interval in the frequency domain after structural adjustment, summarize the cross-sectional ratio, optical path number and reflection control material configuration of the segment, and couple it with the overall shape of the gas channel to build an optimized structural parameter combination set including the channel segment layout order, local structural shape, optical path direction, reflection parameter number and sensor response target value, and generate optimized gas chamber structural configuration information;

[0066] The set of structural segments to be optimized includes the structural segment number sequence, structural compression critical value, and corresponding channel position identifier. The set of abnormal beam path segments includes the reflection path superposition segment number, optical path number threshold, and inner wall reflection point coordinate range. The set of channel reconstruction structural ratio parameters specifically includes the cross-sectional ratio setting value, channel segment number mapping relationship, and reconstruction volume index sequence. The wall reflection control ratio list includes the reflectivity adjustment group number, corresponding wavelength range, and coating thickness parameter index. The optimized air chamber structure configuration information specifically refers to the structural segment arrangement sequence, structural cross-sectional combination parameters, optical path structure index, inner wall reflection parameter label, and sensor response target band.

[0067] Please see Figure 2 The specific steps for obtaining the set of segment numbers to be optimized are as follows:

[0068] S111: Acquire test data of the analyzer gas chamber channel, including the instantaneous flow velocity and temperature stability values ​​of the front, middle and final sections under steady-state gas inlet conditions. Pair the flow velocity value of each section with the corresponding cross-sectional area in the channel geometry, calculate the ratio between the gas flow velocity and the cross-sectional area of ​​each section, and generate a flow velocity-area ratio sequence.

[0069] To obtain test data for the analyzer's gas chamber channel, specifically, under steady-state flow conditions, measurement points were set at the front, middle, and rear sections of the channel. Data was recorded at each point using a flow velocity sensor and a thermistor, obtaining the instantaneous flow velocities v1, v2, and v3, and the corresponding stable temperature values ​​T1, T2, and T3 for each section under steady-state conditions. Let v1 = 3.2 m / s, v2 = 2.7 m / s, v3 = 2.0 m / s, T1 = 298 K, T2 = 301 K, and T3 = 303 K. Then, based on the three-dimensional structural model of the gas chamber, the cross-sectional areas A1, A2, and A3 of each channel section were read from the model, with A1 = 1.2 cm. 2 A2 = 1.5cm 2 A3 = 1.8cm 2By performing a segment-by-segment pairing operation, that is, pairing the instantaneous flow velocity with the cross-sectional area of ​​each segment to form pairing terms (v1, A1), (v2, A2), and (v3, A3), and then performing a division operation on each segment, the flow velocity-area ratios r1, r2, and r3 corresponding to each segment are obtained. The specific calculation method is as follows:

[0070]

[0071] This calculation step does not involve setting thresholds, baseline values, weights, or coefficients, therefore it does not include parameter settings for the aforementioned types of items. This generates a velocity-area ratio sequence [r1, r2, r3] for use in subsequent steps.

[0072] S112: Based on the velocity-area ratio sequence, according to each ratio data segment, call the structural compression critical ratio value set inside the channel, compare each ratio segment with the structural compression critical ratio value in sequence, determine the segment number whose ratio is lower than the structural compression critical ratio value, obtain the set of numbers that can implement structural compression, and generate a compression requirement segment number sequence.

[0073] Based on the velocity-to-area ratio sequence [r1, r2, r3], the critical structural compression ratio value R set internally by the analyzer is invoked. t Each ratio in the sequence is compared with the given ratio value, and the judgment condition is set as follows: when a certain ratio r... i Satisfy r i <R t At that time, this segment number is recorded as the compression demand segment number. Structural compression critical ratio value R t This is the criterion set in the system, defined as follows: when the gas velocity density (velocity per unit area) is below this value, it indicates insufficient gas momentum in that section, posing a risk of spatial redundancy. This value is set based on the minimum working momentum threshold referenced in the gas channel design parameters (set through statistical regression analysis of the matching relationship between structural parameters and gas physical properties), and its unit is m·s. -1 ·cm -2 The setting value is R. t =1.50m·s -1 ·cm -2 The value was referenced from the lower quartile values ​​of 12 sets of cross-section and flow velocity matching samples in the same air chamber model structure to ensure that it was used to identify the 25% lower limit segment and avoid misjudgment. The judgment process is as follows: r1 = 2.67 > 1.50, which does not meet the compression condition; r2 = 1.80 > 1.50, which still does not meet the condition; r3 = 1.11 < 1.50, which meets the condition. Therefore, the segment number 3 is recorded as the compression requirement segment number. When performing the judgment operation, the system completes the process by traversing the ratio array and calling the comparison function, and writes the segment numbers that meet the conditions into the number set {3}, and finally generates the compression requirement segment number sequence [3].

[0074] S113: Based on the compression requirement paragraph number sequence, and according to the paragraph structure area number corresponding to each number, the corresponding channel segment positions in the three-dimensional structure model of the air chamber are numbered and summarized. A number list is constructed according to the paragraph numbering sorting rules to form a set of structural segment numbers to be optimized.

[0075] According to the generated compression requirement paragraph number sequence [3], consult the mapping table between paragraph number and structural segment position in the three-dimensional structural model, map paragraph number 3 to structural region number Z3, set Z3 to correspond to the end segment region of the air chamber channel, mark number Z3 as the target structural optimization region, when the system performs the number summary operation, write number 3 and its structural mapping number Z3 into the initial number set. The set is initially empty, and after adding it, it becomes {Z3}. Then, it is sorted according to the paragraph number sorting rules. The number set contains only one item in the current example. The sorting operation does not change the current set. The final structural segment number set to be optimized is {Z3}, which is used by the subsequent three-dimensional structural modeling software module for regional reconstruction. This section does not involve the use or judgment of "threshold", "benchmark value", "weight" or "coefficient". All judgments are based on the number screening results established in the previous steps and the number mapping operation is performed. No new settings are required.

[0076] Please see Figure 3 The specific steps for obtaining the set of abnormal beam path segments are as follows:

[0077] S211: Call the set of structural segment numbers to be optimized, obtain the number of each structural segment, extract the incident angle and exit angle values ​​of the beam in the analyzer gas chamber channel, and combine the channel contour information in the three-dimensional structural diagram to locate the coordinate points of the inner wall reflecting surface of each numbered segment. Determine the propagation direction difference between the incident path and the exit path through coordinate association, and generate a segment angle and coordinate matching dataset.

[0078] Call the set of structure segment numbers to be optimized and obtain the value Z of each structure segment number. i For each numbered segment, the beam incident angle θ at the channel location of that segment is extracted from the 3D model database. in,i With the exit angle θ out,i The incident angle is defined as the angle between the beam entering the channel section and the channel axis, and the exit angle is the angle between the beam after leaving the current channel segment and the axis. Then, based on the segment number, the position is mapped to a 3D structure diagram. By traversing the contour points of the inner wall of the channel defined in the model data, the inner wall surface corresponding to the segment number is selected, and the coordinates (x, y, y) of all vertices constituting the surface are obtained. i1 ,y i1 ,z i1 ), (x i2 ,y i2 ,z i2 )…(xin ,y in ,z in A local reflection plane is constructed using linear fitting, combined with the incident light direction vector. Vector of the direction of the emitted light Expressed in coordinate vector form, respectively (cosθ) in,i sinθ in,i ,0) and (cosθ out,i sinθ out,i The difference in propagation direction is calculated by the vector dot product and the inverse cosine function, where ,0). This directional difference serves as a characteristic index of the beam's propagation variation within the structural segment, with each segment numbered Z. i Angle of incidence θ in,i , emission angle θ out,i Difference in propagation direction δ i The coordinates of the reflecting surface are packaged together to form a data entry, which constitutes a paragraph angle and coordinate matching dataset.

[0079] S212: Based on the segment angle and coordinate matching dataset, according to the incident angle, exit angle, and reflection point coordinates, combined with the reflection path trajectory of the structural segment in the air chamber channel structure, the number of reflections and the total optical path length of the corresponding structural segment are calculated. It also records whether the beam reflection path spatially overlaps in the channel wall. The number of beam reflections and the optical path length are compared with the upper limit standard of reflection load per unit channel segment, using the formula:

[0080]

[0081] The reflection load deviation value is obtained by calculation. The segment number of the reflection load deviation value is greater than the set deviation judgment benchmark value and is included in the abnormal segment set to generate a reflection abnormal segment identification list.

[0082] This value measures whether the load on the beam reflection path in a single air chamber channel exceeds a set threshold. Its characteristic is the degree of deviation of the reflection load. Essentially, this value measures the deviation between the optical path complexity (number of reflections and length) per unit projected area and the preset load standard. A larger value indicates a more severe overload of that structural segment.

[0083] Among them, R i N represents the deviation value of the reflected load in the i-th segment. i L represents the number of reflections of the i-th beam segment. i Let P be the total optical path length of the i-th segment. ij T represents the projected area of ​​the reflection point of the j-th path in the i-th segment on the channel surface. i Let m be the allowable reflection load threshold for the i-th channel segment, and m be the total number of beam paths in the i-th segment.

[0084] Based on the paragraph angle and coordinate matching dataset, the incident angle θ of each structural segment is read. in,i , emission angle θ out,i Inner wall coordinate set (x ij ,y ij ,z ij Using geometric optics reflection rules, a beam path is constructed from the incident point along the incident direction. The reflection direction is calculated at each intersection with the inner wall plane. The path is then extended until the exit direction is reached, and the number of reflection segments N is recorded. i The total optical path length L is obtained by summing the lengths of each reflection path segment. i Let N i =5, L i =1.75m, for all reflection points along the reflection path within this segment, find the projected area P on the cross-sectional plane of the channel. i1 ,P i2 ,…,P im Let m = 4, and its value be P. i1 =2.0cm 2 P i2 =1.5cm 2 P i3 =1.8cm 2 P i4 =2.2cm 2 Then the total area is:

[0085]

[0086] Call to set the reflection load threshold T i This value is used to define the allowable comprehensive reflection load of this channel segment. It is determined by cross-referencing the thermo-optical load-bearing capacity of the material and the statistical results of the beam energy density during the design of this structural unit segment. The set value is T. i =1.2 (unitless), its specific calculation is based on the average number of reflections (4.2), average optical path length (1.5m), and average total projected area (8.0cm²) measured in previous structural sections, and is generated accordingly. The threshold value is set at 1.2, shifted upwards by 50% to accommodate higher load segments, representing the normal reflected load value for the median segment. Substituting into the formula:

[0087]

[0088] Set deviation judgment benchmark value Δ T =0.10, its setting is based on the maximum allowable photothermal deviation tolerance in the air chamber structure, and is based on the heat dissipation capacity test under high reflective load. In the test, a load deviation greater than 0.1 will cause the heat accumulation rate to increase non-linearly, so it is selected as a boundary value. This value will not change with the segment number. Because R i =0.0333<ΔT If the current segment number is not included in the abnormal segment set, it will be added to the abnormal segment number set, and finally a list of reflection abnormal segments will be generated.

[0089] S213: Based on the list of abnormal reflection segments, retrieve the position of each segment number in the air chamber structure, extract the marking status and path coordinates of overlapping reflection segments, filter the segment numbers that meet the standard that the number of beam overlap paths exceeds the reflection load, and generate a set of abnormal beam path segments.

[0090] Based on the segment numbers recorded in the list of anomalous reflection segments, the 3D model of the air chamber structure is retrieved item by item to find the segment position corresponding to each anomalous segment number. The spatial overlap flag of all beam paths within that segment is extracted using the status field in the structural data. If the number of spatially overlapping beam paths within a segment is C... i Exceeding the standard path overlap allowable number S of structural reflective load i Then, this segment number is assigned to the set of abnormal beam paths. Let the abnormal segment number be Z5, its number of overlapping paths be C5 = 6, the allowable standard be S5 = 3, and the allowable standard be S i The setting reference segment length d i With inner diameter D i Calculate the limit of the number of load-bearing paths for the channel cross section. If d i =5cm, D i =15cm, then At this point, C5 = S5, and it is not included in the path anomaly set; if C5 = 7, then C5 > S5, and it is included in the anomaly set. Finally, all segment numbers that meet the conditions are summarized to generate a beam path anomaly segment set.

[0091] Please see Figure 4 The specific steps for obtaining the channel reconstruction structure ratio parameter set are as follows:

[0092] S311: Obtain the set of abnormal beam path segments, extract the cross-sectional width, height, channel segment length and number of reflection points of the corresponding channel segments, calculate the cross-sectional area and local area volume index, and generate a local volume index sequence;

[0093] After obtaining the set of abnormal beam path segments, the structural segment channel data corresponding to each numbered segment k is read sequentially. The cross-sectional width W of each segment is extracted using the geometric parameter fields defined in the structural model. k Height H k Channel segment length Q k At the same time, the number of reflection points D was counted from the optical recording data of the segment. k Then calculate the cross-sectional area A of each segment. k According to formula A k =W k ×Hk Given the specific values, let the width of the k=2th segment be W2 = 3.5cm and the height be H2 = 2.0cm. Then the cross-sectional area of ​​this segment is A2 = 3.5 × 2.0 = 7.0cm. 2 Then calculate the local volume V based on the segment length. k The formula is V k =A k ×Q k If the channel segment length is set to Q2 = 12cm, then the volume index is V2 = 7.0 × 12 = 84.0cm². 3 After performing the above operations, the volume data V of each segment will be... k Cross-sectional area A k Section Chief Q k Number of reflection points D k The data are compiled into a structural record list and grouped into a local volume index sequence according to paragraph numbering, for use in subsequent flow and retention analysis steps.

[0094] S312: Based on the local volume index sequence, according to the volume value of each numbered segment and the gas flow rate value within the channel segment, the ratio of each segment's volume index to its corresponding flow rate value is calculated using the following formula:

[0095]

[0096] The gas stagnation risk value of each numbered segment is obtained through calculation. The stagnation risk value is compared with the gas retention judgment value. The set of numbers whose gas stagnation risk value exceeds the gas retention judgment value is filtered out to generate a channel retention segment identification list.

[0097] This value measures whether the gas flow efficiency in a localized area of ​​the channel has decreased to a level that poses a risk of stagnation, i.e., whether gas stagnation or dead zones are likely to occur. The first half... The first part represents the spatial capacity corresponding to a unit flow velocity, while the second part estimates the expected volume from the perspectives of geometry and reflected disturbances. A larger deviation indicates a mismatch between the design and the gas dynamic conditions, potentially leading to stagnation.

[0098] Among them, S k V represents the risk value of gas stagnation in the k-th segment. k Let F be the volume index for the k-th segment. k Let A be the gas velocity value in the k-th segment. k Let D be the cross-sectional area of ​​the k-th segment. k Q represents the number of reflection points in the k-th segment. k Let k be the length of the channel segment.

[0099] Based on the local volume index sequence, the volume index V corresponding to each segment numbered k is first extracted. k The gas flow velocity F measured in this sectionk Set F2 = 1.8 m / s, and substitute both values ​​into the left-hand side of the calculation formula. After unit conversion, V² = 84.0 cm 3 =8.4×10 -5 m 3 ,but Next, the cross-sectional area A is extracted based on the segment number correspondence. k Number of reflection points D k Paragraph length Q k In this example, A2 = 7.0 cm 2 =7.0×10 -4 m 2 Given D² = 6 and Q² = 0.12m, substitute these values ​​into the right-hand side of the formula to calculate...

[0100]

[0101] Then, according to the master formula:

[0102]

[0103] The gas retention threshold Γ = 0.12 is set as the lower limit of the residence time and the boundary of the local turbulent diffusion range in a typical gas chamber of the analyzer under normal gas replacement conditions. This is determined by measuring the mean of the maximum difference μ from 30 samples. 差 =0.09, and set it as the boundary value by floating it upwards by 30%, resulting in Γ = 0.12. If S k If S2 > Γ, then the number segment is determined to have a risk of gas stagnation. In this example, S2 = 0.18695 > Γ, so the number segment k = 2 is included in the list of stagnation segments.

[0104] S313: Based on the channel stagnation segment identification list, adjust the channel shape of each segment with unequal width, record the new width and height values ​​of the cross-section after the structural segment adjustment, calculate and archive the new width-to-height ratio of the cross-section, establish a correlation record table between the structural segment number and the corresponding new cross-section ratio, and generate a channel reconstruction structural ratio parameter set.

[0105] Based on the list of channel retention sections, read the original cross-sectional dimension W of the structural section corresponding to each section number in sequence. k H k Using this as the initial input, the system performs unequal width adjustment operations based on the retention index and geometric boundary constraints of this segment. The adjustment strategy is to prioritize reducing the width W. k To increase the concentration of the local velocity field, while appropriately increasing the height H kTo maintain volumetric flux, assuming the original W2 = 3.5cm and H2 = 2.0cm, the width is reduced by 10% according to the adjustment ratio rule, resulting in a new width W′2 = 3.15cm. The height is increased by 10%, resulting in H′2 = 2.2cm. The cross-sectional ratio value ρ2 = W′2 / H′2 = 3.15 / 2.2 ≈ 1.43 is recalculated. This adjusted parameter value is recorded, and a mapping record table is constructed. The number segment k = 2 is associated with the adjusted width-to-height ratio value ρ2 = 1.43, and it is added to the structural ratio parameter set for synchronous updating of channel structure reconstruction parameters.

[0106] Please see Figure 5 The specific steps for obtaining the wall reflection control ratio list are as follows:

[0107] S411: Call the channel reconstruction structure ratio parameter set, obtain the reflection path trajectory data of the corresponding structure segment before and after deformation, calculate the difference in the number of path segments and the difference in the total length of the reflection path for each structure segment, combine the path difference with the center wavelength response segment to form a difference label set, and generate a reflection path difference feature set.

[0108] The system calls the channel to reconstruct the structural scale parameter set, retrieves the reflection path trajectory data before and after structural deformation one by one according to the number segment, and extracts the number N of path segments before deformation for each number segment. bx The number of path segments N after deformation ax And calculate the difference in the number of path segments ΔN. x =N ax -N bx At the same time, summarize the total length L of the original path. bx With the total path length L after deformation ax The total difference in reflection path length ΔL is obtained. x =L ax -L bx Taking the x=3rd segment as an example, let the number of path segments before transformation be N. b3 =6, the number of path segments after transformation is N a3 =4, then ΔN3 = 4 - 6 = -2, indicating that the reflection path has been simplified, and the original path length is L. b3 =1.75m, after deformation is L a3 =1.60m, so ΔL3 = -0.15m. Then, the center wavelength response record is consulted, and the center response wavelength range of the third segment is extracted as 540~560nm. The path segment difference ΔN3 and the path length difference ΔL3 are bound to this response band to form the reflection path difference label of this segment. The same operation is performed on all numbered segments to finally generate a set of quadruplets of segment number, path segment difference, path length difference and wavelength range, which constitutes the reflection path difference feature set.

[0109] S412: Call the reflection path difference feature set, divide the response segment into multiple wavelength coverage intervals based on the center wavelength response segment of each numbered segment, and set the target reflectivity in conjunction with the spectral analyzer's reflection threshold standard. Calculate the required reflectivity adjustment range for the coating based on the difference between the current reflectivity value and the target reflectivity value for each wavelength interval, using the formula:

[0110]

[0111] The reflection modulation offset value corresponding to each wavelength range is obtained through calculation, and the offset value is used as the reflectivity optimization range identification parameter to obtain the reflectivity reduction group corresponding to each segment number, thereby generating a wavelength reflection modulation group set.

[0112] This value is used to quantify the adjustment distance between the current reflectivity state of the channel segment and the target state, so as to guide the selection of coating materials and the control of coating thickness. This value takes into account the reflectivity adjustment requirements (i.e. numerical differences) within the wavelength range, the path influence caused by structural deformation (modulated by structural proportion and optical path characteristics), and optical path complexity, and finally quantifies it into an adjustment intensity index required for coating ratio control.

[0113] Among them, R xge W represents the reflection modulation offset value of segment x within the wavelength range g. xce W represents the current reflectance value for segment x. xre Z represents the reflectivity value of the target in segment x. xe H represents the cross-sectional proportion of the x-th structural segment after deformation. xe Let B be the projection height value of the x-th optical path segment. xe Let A be the total length of the current reflection path in segment x. xe Let x be the number of the original paths in segment x;

[0114] After calling the reflection path difference feature set, the center response wavelength range of each numbered segment is read and segmented in 5nm increments. Let the wavelength range of the x=3rd segment be 540–560nm. The resulting segments are g1 = [540, 545], g2 = [545, 550], g3 = [550, 555], and g4 = [555, 560]. Then, the standard reflection threshold data from the spectral analyzer is called to read the target reflectance W for each segment. xre Set the target reflectivity to 0.65, and then read the actual reflectivity value W of each interval in the current structure. xce Let W xce,g3 =0.53, calculate the difference W xce -W xre =0.53-0.65=-0.12, and simultaneously extract the cross-sectional proportion Z after structural deformation. xe =1.43, optical path projection height Hxe =2.2cm, current total reflection path length B xe =1.60m, original path number A xe =6, substitute the above parameters into the formula:

[0115]

[0116] Calculate the values ​​for each part:

[0117]

[0118] R xge =|-0.0676+0.2667|=0.1991;

[0119] The reflection control offset value R xge Used for comparison with the set offset tolerance value, the reflection control offset reference value is set to Λ = 0.15. This reference value is set based on the difference boundary between the maximum permissible reflection offset control range and the mean value of the coating spectral adjustment response in the multi-channel spectrometer. The set value Λ = 0.15 comes from the average deviation value of the upper bound of the 95% confidence interval in 20 sets of sample statistics. If R xge If the value is greater than Λ, then the segment and interval are included in the reflectivity reduction group. In this example, 0.1991 > 0.15, and the segment x = 3 and interval g = 3 satisfy the condition, so it is added to the wavelength reflection control group.

[0120] S413: Based on the wavelength reflection control set, match and map the reflection control offset value of each set with the material number and thickness correspondence already identified in the coating database, select the coating material number whose reflectivity adjustment capability is higher than the target reflectivity offset value, and mark the required coating thickness value, establish a matching table between structural segment number, wavelength range, material number and thickness value, and generate a wall reflection control ratio list.

[0121] Based on the wavelength reflection modulation set, each segment number and wavelength range is cyclically analyzed. A table comparing material numbers and thickness values ​​recorded in the coating database is used to compare the reflection modulation capability δR of each material combination within the target wavelength range. m (h), retrieve all conditions δR m (h)≥R xge The combination of materials and thicknesses, denoted by material number M. 17 At a thickness h = 150 nm, it can provide an adjustment capability of 0.21, satisfying δR. M17 (150) = 0.21 > R xge =0.1991, then select M. 17 As the matching coating for the third segment and the third wavelength range, and with a corresponding thickness of 150 nm, a structure segment numbered x=3, a wavelength range g=3, and a material number M were constructed.17 The relationship between the 150nm thickness quadruple is used to collect and organize all combinations that meet the conditions, generating a list of wall reflection control ratios.

[0122] Please see Figure 6 The specific steps for obtaining optimized air chamber structure configuration information are as follows:

[0123] S511: Call the wall reflection control ratio list, extract the structural ratio configuration value, reflection control material number and reflection path adjustment value of the corresponding segment, obtain the wavelength start value and end value of the sensor calibration response spectrum, determine whether the center wavelength of the reflection path formed after structural deformation is within the sensitive range, filter the segment number set of overlapping wavelength bands, and generate a frequency domain overlapping segment identifier set.

[0124] Retrieve the wall reflection control mix design list and extract the cross-sectional structural ratio value ρ corresponding to each structural segment number. x =W x / H x Reflection control material number M x With the center wavelength λ of the reflection path cx Extract the initial wavelength value λ of the response spectrum from the sensor calibration dataset. s With the final value λ e Let a segment be numbered x = 3, and its center wavelength be λ. c3 =553nm, sensor response spectrum is λ s =540nm, λ e =560nm, perform judgment operation λ s ≤λ cx ≤λ e Whether this holds true, in this example 553nm∈

[0125] If the condition is met (e.g., 540nm, 560nm), the center wavelength of that segment is considered to be within the sensitive range. If the condition is not met, the segment is discarded. All segments that meet the condition are numbered sequentially to form a set of numbers. This set is the frequency domain overlapping segment identifier set.

[0126] S512: Based on the frequency domain overlapping segment identifier set, obtain the cross-sectional width and height values ​​of the corresponding segment, calculate the cross-sectional ratio and extract the reflection path values ​​and material numbers, integrate the three data into a segment structure state group, arrange them in the order of segment numbers to construct a number index, associate the structure state group with the channel structure morphology diagram, and generate a segment structure coupling parameter group.

[0127] Based on the frequency domain overlapping segment identifier set, traverse each segment number x and extract its corresponding cross-sectional width W. x Height H x Calculate the cross-sectional ratio value Let the example segment x = 3, width W3 = 3.15cm, and height H3 = 2.20cm, then we get... Then read the number N of the reflection path segment. x Reflection control material number M x Let N3 = 5, M3 = M 17 The three parameters (ρ3, N3, M3) are combined to form a segment structure state group. The corresponding state group is generated for each segment in sequence. The segments are sorted in ascending order of their numbers to construct a segment number index list. The number index is used as the primary key. The structure state group is written into each segment entry in the channel structure morphology map database. A mapping from number to morphology state group is established in the structure map to realize the three-dimensional linkage between numbered segments and geometric parameters, reflection path information and material configuration, thus completing the construction of the segment structure coupling parameter group.

[0128] S513: Call the paragraph structure coupling parameter group, and integrate the paragraph order, cross-sectional ratio, number of reflection paths, coating number, and target response band into a unified form structure according to the number index and structural feature parameters. Then, embed it into the overall structure mapping diagram of the gas channel in sequence according to the coupling association order, establish the set information of each paragraph configuration, and generate optimized gas chamber structure configuration information.

[0129] Based on the paragraph structure coupling parameter group, each group of structural parameters is parsed sequentially according to the index, and the paragraph number x and the cross-sectional ratio value ρ are read. x Number of reflection paths N x Coating number M x Corresponding target response band [λ] sx ,λ ex The above five parameters are integrated into a unified structural data form item, which is then embedded sequentially into the overall structure mapping diagram of the gas channel. In the mapping diagram, the segment number and spatial distribution position are matched, and structural unit configuration data is inserted through the index position. The complete structural configuration fields, including shape ratio, path load, material number and band coverage range, are recorded in each structural node. In this way, the segment parameter set information is constructed, and the full configuration of the gas channel structure is constructed segment by segment according to the number, and finally the optimized gas chamber structure configuration information is generated.

[0130] A gas sensor-based gas chamber structure optimization system is provided to implement the aforementioned gas sensor-based gas chamber structure optimization method. The system includes:

[0131] The optimized structure identification module acquires test data from the analyzer's gas chamber channel, calculates the ratio of gas velocity to cross-sectional area in each segment, compares the ratio with the set structural compression critical ratio within the channel segment by segment, identifies a list of structural numbers with compression requirements, and generates a set of structural segment numbers to be optimized.

[0132] The beam anomaly identification module calls the set of structural segment numbers to be optimized, and filters the location of the reflected signal disordered area by judging whether the number of beam overlaps on a single path segment is greater than the upper limit standard of channel reflection load, and generates a set of beam path anomaly segments.

[0133] The channel reconstruction analysis module identifies the region number where the gas stagnation risk value exceeds the stagnation judgment value based on the set of abnormal beam path segments, resets the corresponding channel shape to an unequal width channel structure, records the new cross-sectional ratio of each structural segment, and generates a set of channel reconstruction structure ratio parameters.

[0134] The wall reflection control module calls the channel to reconstruct the structural ratio parameter set, divides it into multiple reflection influence groups according to wavelength range, analyzes the required reflection reduction range based on the target reflectivity, sets the required coating thickness and material number, and generates a wall reflection control ratio list.

[0135] The structural optimization configuration module calls the wall reflection control ratio list, identifies the segment numbers that overlap with the sensitive interval in the frequency domain after structural adjustment, and assembles an optimized structural parameter combination set that includes the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value, and generates optimized air chamber structural configuration information.

[0136] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention in any other way. Any person skilled in the art may make changes or modifications to the above-disclosed technical content to create equivalent embodiments that can be applied to other fields. However, any simple modifications, equivalent changes, and modifications made to the above embodiments based on the technical essence of the present invention without departing from the scope of the present invention shall still fall within the protection scope of the present invention.

Claims

1. A method for optimizing the structure of a gas chamber based on a gas sensor, characterized in that, Includes the following steps: S1: Obtain test data of the analyzer's gas chamber channel, calculate the ratio of gas velocity to cross-sectional area in each segment, compare the ratio with the set structural compression critical ratio in the channel segment by segment, identify the list of structural numbers with compression requirements, and generate a set of structural segment numbers to be optimized. S2: Call the set of structural segments to be optimized, and by judging whether the number of beam overlaps on a single path segment is greater than the upper limit standard of channel reflection load, filter the location of the reflection signal disorder area and generate a set of abnormal beam path segments. S3: Based on the set of abnormal beam path segments, identify the area number where the gas stagnation risk value exceeds the stagnation judgment value, reset the corresponding channel shape to an unequal width channel structure, record the new cross-sectional ratio of each structural segment, and generate a set of channel reconstruction structure ratio parameters. The specific steps for obtaining the channel reconstruction structure ratio parameter set are as follows: S311: Obtain the set of abnormal beam path segments, extract the cross-sectional width value, height value, channel segment length value and number of reflection points of the corresponding channel segment, calculate the cross-sectional area and local area volume index, and generate a local volume index sequence; S312: Based on the aforementioned local volume index sequence, according to the volume value of each numbered segment and the gas flow rate value within the channel segment, the ratio of each segment's volume index to its corresponding flow rate value is calculated using the following formula: ； The gas stagnation risk value of each numbered segment is obtained through calculation. The stagnation risk value is compared with the gas retention judgment value. The set of numbers whose gas stagnation risk value exceeds the gas retention judgment value is filtered out to generate a channel retention segment identification list. in, Indicates the first Risk value of gas stagnation in the segment For the first Section volume index, For the first Section gas flow rate value, For the first Cross-sectional area of ​​segment For the first Number of reflection points per segment For the first Segment channel length; S313: Based on the channel stagnation segment identification list, adjust the channel shape of each segment with unequal width, record the new width and height values ​​of the cross-section after the structural segment adjustment, calculate and archive the new width-to-height ratio of the cross-section, establish a correlation record table between the structural segment number and the corresponding new cross-section ratio, and generate a channel reconstruction structural ratio parameter set. S4: Call the channel to reconstruct the structural ratio parameter set, obtain the difference value of the reflection path and the range of the center reflection wavelength before and after the structural deformation, divide it into multiple reflection influence groups according to the wavelength range, analyze the required reflection reduction range according to the target reflectivity, set the required coating thickness and material number, and generate a wall reflection control ratio list.

2. The gas chamber structure optimization method based on a gas sensor according to claim 1, characterized in that, The set of structural segments to be optimized includes a structural segment number sequence, a structural compression critical value, and a corresponding channel position identifier. The set of abnormal beam path segments includes a reflection path superposition segment number, an optical path number threshold, and a range of inner wall reflection point coordinates. The set of channel reconstruction structural ratio parameters specifically includes a cross-sectional ratio setting value, a channel segment number mapping relationship, and a reconstruction volume index sequence. The wall reflection control ratio list includes a reflectivity adjustment group number, a corresponding wavelength range, and a coating thickness parameter index.

3. The gas chamber structure optimization method based on a gas sensor according to claim 2, characterized in that, The specific steps for obtaining the set of structural segment numbers to be optimized are as follows: S111: Acquire test data of the analyzer gas chamber channel, including the instantaneous flow velocity and temperature stability values ​​of the front, middle and final sections under steady-state gas inlet conditions. Pair the flow velocity value of each section with the corresponding cross-sectional area in the channel geometry, calculate the ratio between the gas flow velocity and the cross-sectional area of ​​each section, and generate a flow velocity-area ratio sequence. S112: Based on the velocity-area ratio sequence, according to each ratio data segment, call the structural compression critical ratio value set inside the channel, compare each ratio segment with the structural compression critical ratio value in sequence, determine the segment number whose ratio is lower than the structural compression critical ratio value, obtain the set of numbers that can implement structural compression, and generate a compression requirement segment number sequence. S113: Based on the compression requirement paragraph number sequence, and according to the paragraph structure region number corresponding to each number, the corresponding channel segment positions in the three-dimensional structure model of the air chamber are numbered and summarized. A number list is constructed according to the paragraph numbering sorting rules to form a set of structural segment numbers to be optimized.

4. The gas chamber structure optimization method based on a gas sensor according to claim 3, characterized in that, The specific steps for obtaining the set of abnormal beam path segments are as follows: S211: Call the set of structural segments to be optimized, obtain the number of each structural segment, extract the incident angle and exit angle values ​​of the beam in the analyzer gas chamber channel, and combine the channel contour information in the three-dimensional structural diagram to locate the coordinate points of the inner wall reflecting surface of each segment. Determine the propagation direction difference between the incident path and the exit path through coordinate association, and generate a segment angle and coordinate matching dataset. S212: Based on the segment angle and coordinate matching dataset, according to the incident angle, exit angle, and reflection point coordinates, combined with the reflection path trajectory of the structural segment in the air chamber channel structure, calculate the number of reflections and the total optical path length of the corresponding structural segment, and record whether the beam reflection path spatially overlaps in the channel wall. Compare the number of beam reflections and the optical path length with the upper limit standard of reflection load per unit channel segment, using the formula: ； The reflection load deviation value is obtained by calculation. The segment number of the reflection load deviation value is greater than the set deviation judgment benchmark value and is included in the abnormal segment set to generate a reflection abnormal segment identification list. in, Representing the Segment reflection load deviation value, Indicates the first Number of beam reflections For the first Total optical path length, Indicates the first Section 1 The projected area of ​​the reflection points on the channel surface of the path. For the first The permissible reflection load threshold for a segment channel. For the first Total number of beam paths in a segment; S213: Based on the list of abnormal reflection segments, retrieve the position of each segment number in the air chamber structure, extract the marking status and path coordinates of overlapping reflection segments, filter the segment numbers that meet the standard that the number of beam overlap paths exceeds the reflection load, and generate a set of abnormal beam path segments.

5. The gas chamber structure optimization method based on a gas sensor according to claim 4, characterized in that, The specific steps for obtaining the wall reflection control ratio list are as follows: S411: Call the channel reconstruction structure ratio parameter set, obtain the reflection path trajectory data of the corresponding structure segment under the conditions before and after deformation, calculate the difference in the number of path segments and the difference in the total length of the reflection path for each structure segment, combine the path difference with the center wavelength response segment to form a difference label set, and generate a reflection path difference feature set. S412: The reflection path difference feature set is invoked. Based on the center wavelength response segment of each numbered segment, the response segment is divided into multiple wavelength coverage intervals. The target reflectivity is set in conjunction with the reflectivity threshold standard of the spectral analyzer. The required reflectivity adjustment range for the coating is calculated based on the difference between the current reflectivity value and the target reflectivity value in each wavelength interval, using the formula: ； The reflection modulation offset value corresponding to each wavelength range is obtained through calculation, and the offset value is used as the reflectivity optimization range identification parameter to obtain the reflectivity reduction group corresponding to each segment number, thereby generating a wavelength reflection modulation group set. in, Indicates the first The section in Reflection modulation offset value within the wavelength range For the first Current reflectivity value of the segment. For the first Segment target reflectivity value, For the first The cross-sectional proportions of the segment structure after deformation For the first Segment optical path projection height value, For the first The total length of the current reflection path. For the first Number of original paths in the segment; S413: Based on the wavelength reflection control set, match and map the reflection control offset value of each set with the material number and thickness correspondence already identified in the coating database, select the coating material number whose reflectivity adjustment capability is higher than the target reflectivity offset value, and mark the required coating thickness value, establish a matching table between structural segment number, wavelength range, material number and thickness value, and generate a wall reflection control ratio list.

6. The gas chamber structure optimization method based on a gas sensor according to claim 5, characterized in that, The method further includes: S5: Call the wall reflection control ratio list, compare the wavelength values ​​of the sensitive interval in the sensor calibration response spectrum, identify the segment number that overlaps with the sensitive interval in the frequency domain after structural adjustment, build an optimized structural parameter combination set including channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value, and generate optimized air chamber structure configuration information. The optimized air chamber structure configuration information specifically refers to the structural segment arrangement sequence, structural cross-sectional combination parameters, optical path structure index, inner wall reflection parameter labels, and sensor response target band.

7. The gas chamber structure optimization method based on a gas sensor according to claim 6, characterized in that, The specific steps for obtaining the optimized air chamber structure configuration information are as follows: S511: Call the wall reflection control ratio list, extract the structural ratio configuration value, reflection control material number and reflection path adjustment value of the corresponding segment, obtain the wavelength start value and end value of the sensor calibration response spectrum, determine whether the center wavelength of the reflection path formed after structural deformation is within the sensitive range, filter the segment number set of overlapping wavelength bands, and generate a frequency domain overlapping segment identifier set. S512: Based on the frequency domain overlapping segment identifier set, obtain the cross-sectional width and height values ​​of the corresponding segment, calculate the cross-sectional ratio and extract the reflection path value and material number, integrate the three data into a segment structure state group, arrange them in the order of segment number to construct a number index, associate the structure state group with the channel structure morphology structure map, and generate a segment structure coupling parameter group. S513: Call the paragraph structure coupling parameter group, and according to the number index and structural feature parameters, integrate the paragraph order, cross-sectional ratio value, number of reflection paths, coating number, and target response band into a unified form structure, and embed it into the overall structure mapping diagram of the gas channel in sequence according to the coupling association order, establish the set information of each paragraph configuration, and generate optimized gas chamber structure configuration information.

8. A gas chamber structure optimization system based on a gas sensor, characterized in that, The system is used to implement the gas sensor-based chamber structure optimization method according to any one of claims 1-7, and the system comprises: The optimized structure identification module acquires test data from the analyzer's gas chamber channel, calculates the ratio of gas velocity to cross-sectional area in each segment, compares the ratio with the set structural compression critical ratio within the channel segment by segment, identifies a list of structural numbers with compression requirements, and generates a set of structural segment numbers to be optimized. The beam anomaly identification module calls the set of structural segments to be optimized, and by judging whether the number of beam overlaps on a single path segment is greater than the upper limit standard of channel reflection load, it filters the location of the reflected signal disorder area and generates a set of beam path anomaly segments. Based on the set of abnormal beam path segments, the channel reconstruction analysis module identifies the region number where the gas stagnation risk value exceeds the stagnation judgment value, resets the corresponding channel shape to an unequal width channel structure, and generates a set of channel reconstruction structure ratio parameters. The wall reflection control module calls the channel reconstruction structure ratio parameter set, divides it into multiple reflection influence groups according to wavelength range, analyzes the required reflection reduction range based on the target reflectivity, sets the required coating thickness and material number, and generates a wall reflection control ratio list. The structural optimization configuration module calls the wall reflection control ratio list, identifies the segment numbers that overlap with the sensitive interval in the frequency domain after structural adjustment, and assembles an optimized structural parameter combination set that includes the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value, and generates optimized air chamber structural configuration information.

Images