Solid state disk quality testing method, device and equipment and storage medium

Abstract

The invention discloses a solid state disk quality test method and device, equipment and a storage medium, and relates to the technical field of computers, and the method comprises the steps: obtaining a current operation value of a control parameter of temperature control equipment, and carrying out the polling collection of the real-time temperature of a to-be-tested solid state disk, and inputting the current operation value of the control parameter and the real-time temperature of the solid state disk into the strategy optimization model to obtain a temperature control adjustment instruction, and adjusting the output temperature of the temperature control equipment according to the temperature control adjustment instruction, so that the temperature of the solid state disk is maintained at the target test temperature, and the quality test is completed. Full-automatic temperature adjustment of the solid state disk is realized, the technical problems of inaccurate temperature control in the testing process, uneven temperature of the solid state disk and low accuracy of the final testing result caused by manual operation are solved, and the purposes of improving the accuracy of temperature control, improving the temperature uniformity of the solid state disk and improving the testing efficiency are achieved. Therefore, the accuracy of the quality test result is improved.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a solid-state hard drive quality testing method, apparatus, device, and storage medium. Background Art

[0002] As a high-performance data storage device, solid-state drives have been widely used in various fields such as terminals, medical care, and navigation. Therefore, in order to ensure that the functions of solid-state drives can operate normally during use, quality testing of solid-state drives is particularly important.

[0003] Currently, SSD quality testing is primarily performed manually to create the required temperature environment. However, this manual operation can easily lead to inaccurate temperature control during testing, uneven SSD temperatures, and inaccurate test results. Summary of the Invention

[0004] The present application provides a solid-state hard drive quality testing method, apparatus, equipment and storage medium to at least solve the problem in the related art that manual operation easily causes inaccurate temperature control during the test process, uneven temperature of the solid-state hard drive, and low accuracy of the final test results.

[0005] This application provides a solid state drive quality testing method, including:

[0006] Obtain the test script and test conditions for the solid-state drive to be tested, where the test conditions include the target test temperature and test duration;

[0007] Send the test script to the solid-state drive so that the solid-state drive can run the test script;

[0008] During the running of the test script, the real-time temperature of the solid-state hard disk is collected by polling according to the first preset period;

[0009] Real-time monitoring of whether the difference between the real-time temperature and the target test temperature exceeds the preset temperature deviation threshold;

[0010] When the difference between the monitored real-time temperature and the target test temperature exceeds a preset temperature deviation threshold, obtaining current operating values of one or more control parameters of the temperature control device, wherein the control parameters are used to adjust the output temperature of the temperature control device, wherein the temperature control device is used to provide a temperature environment for the solid-state drive;

[0011] Input the real-time temperature of the solid-state drive, the target test temperature, and the current operating values of one or more control parameters into the strategy optimization model, and output a temperature control adjustment instruction;

[0012] Adjust the operating value of one or more control parameters of the temperature control equipment according to the temperature control adjustment instruction;

[0013] When the test time of the test script meets the test duration, the solid-state hard drive is stopped from running the test script to complete the quality test of the solid-state hard drive.

[0014] The present application also provides a solid state drive quality testing device, comprising:

[0015] An acquisition module is used to obtain the test script and test conditions of the solid-state drive to be tested, wherein the test conditions include the target test temperature and test duration;

[0016] A sending module is used to send the test script to the solid state drive so that the solid state drive runs the test script;

[0017] The acquisition module is used to poll and collect the real-time temperature of the solid-state hard disk according to a first preset period during the execution of the test script;

[0018] A monitoring module is used to monitor in real time whether the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold;

[0019] The acquisition module is further configured to acquire current operating values of one or more control parameters of the temperature control device when the difference between the monitored real-time temperature and the target test temperature exceeds a preset temperature deviation threshold, wherein the control parameters are used to adjust the output temperature of the temperature control device, wherein the temperature control device is used to provide a temperature environment for the solid-state drive;

[0020] An output module, configured to input the real-time temperature of the solid-state drive, the target test temperature, and the current operating values of one or more control parameters into the strategy optimization model, and output a temperature control adjustment instruction;

[0021] An adjustment module, configured to adjust the operating values of one or more control parameters of the temperature control device according to the temperature control adjustment instruction;

[0022] The stop module is used to stop the solid-state drive from running the test script when the test time of the test script meets the test duration, thereby completing the quality test of the solid-state drive.

[0023] The present application also provides an electronic device, comprising: a memory for storing a computer program; and a processor for implementing the steps of any of the above-mentioned solid-state hard drive quality testing methods when executing the computer program.

[0024] The present application also provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned solid-state hard drive quality testing methods are implemented.

[0025] Through this application, since the real-time temperature of the solid-state hard drive, the target test temperature and the current operating value of the control parameter are input into the strategy optimization model, the temperature control adjustment instruction can be output; according to the temperature control adjustment instruction, the output temperature value of the temperature control device can be adjusted, thereby adjusting the real-time temperature of the solid-state hard drive, and realizing fully automated solid-state hard drive temperature adjustment. Therefore, it can solve the technical problem that manual operation easily causes inaccurate temperature control during the test, uneven temperature of the solid-state hard drive, and low accuracy of the final test results, thereby achieving the technical effect of improving the accuracy of temperature control, improving the temperature uniformity of the solid-state hard drive, and thus improving the accuracy of the quality test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0027] Figure 1 A schematic diagram of a solid-state drive quality testing method provided in an embodiment of the present application;

[0028] Figure 2 Schematic diagram of the process of the solid state drive quality testing method provided in the embodiment of the present application Figure 1 ;

[0029] Figure 3 Schematic diagram of the process of the solid state drive quality testing method provided in the embodiment of the present application Figure 2 ;

[0030] Figure 4 A schematic diagram of the structure of a solid-state drive quality testing device provided in an embodiment of the present application;

[0031] Figure 5 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0032] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0033] It should be noted that, in the description of this application, the terms "comprises," "includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. The terms "first," "second," etc., in this application are used to distinguish similar objects, and are not used to describe a particular order or sequence.

[0034] Currently, SSD quality testing is primarily performed manually to create the required temperature environment. However, this manual operation can easily lead to inaccurate temperature control during testing, uneven SSD temperatures, and inaccurate test results.

[0035] The SSD quality testing method proposed in this application collects the real-time temperature of the SSD to be tested through polling, inputs it into a strategy optimization model, and obtains temperature control adjustment instructions. Based on the temperature control adjustment instructions, the output temperature of the temperature control device is adjusted to maintain the SSD temperature at the target test temperature to complete the quality test. This method can save human resources, improve the accuracy of temperature control, enhance the temperature uniformity of the SSD, and thus improve the accuracy of quality test results.

[0036] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0037] In conjunction with the specific application environment architecture or specific hardware architecture on which the execution of the solid-state drive quality test method depends, the specific application environment architecture or specific hardware architecture is described here. Figure 1 , Figure 1 The following is a scenario diagram of the solid state drive quality test method. Figure 1 As shown, the specific application scenarios of this application include: temperature control device 101 and solid state drive 102.

[0038] The temperature control device 101 may be a high and low temperature test box.

[0039] Specifically, the temperature control device 101 sends a test script to the solid-state drive 102; the solid-state drive 102 executes the test script; during the execution of the test script, the temperature control device 101 polls to obtain the real-time temperature of the solid-state drive 102; the temperature control device 101 obtains a temperature control adjustment instruction based on the current operating value of one or more of its own control parameters and the real-time temperature of the solid-state drive 102, and executes the temperature control adjustment instruction; when the test time of the test script meets the test duration, the temperature control device 101 sends a stop test instruction to the solid-state drive 102, so that the solid-state drive 102 stops running the test script and completes the quality test of the solid-state drive.

[0040] Figure 2 Schematic diagram of the process of the solid state drive quality testing method provided in the embodiment of the present application Figure 1 ,like Figure 2 As shown, the embodiment of the present application provides a solid state drive quality testing method, which is described in detail as follows:

[0041] S201: Obtain a test script and test conditions for a solid state drive to be tested, wherein the test conditions include a target test temperature and a test duration.

[0042] Among them, the target test temperature and test duration can be pre-set by the tester. The target test temperature can be 77 degrees or 80 degrees, and the test duration can be 30 days. It can be adjusted according to actual conditions and this application does not impose any restrictions.

[0043] The test script includes disk performance test instructions with fixed input / output load.

[0044] Specifically, a pre-stored test file is read and parsed to obtain a test script and test conditions.

[0045] S202: Send the test script to the solid state drive so that the solid state drive runs the test script.

[0046] S203: During the execution of the test script, the real-time temperature of the solid state drive is collected by polling according to a first preset period.

[0047] Among them, the first preset period can be 1s, which can be adjusted according to actual conditions and is not limited in this application.

[0048] The real-time temperature of the solid-state hard disk may be the real-time temperature of the flash memory particles of the solid-state hard disk.

[0049] Specifically, a SMART read instruction is sent to the solid-state drive so that the solid-state drive executes the SMART read instruction, reads the temperature sensor data of the flash memory particles, and obtains smart-log data; receives the smart-log data fed back by the solid-state drive, and parses the smart-log data to obtain the real-time temperature of the flash memory particles of the solid-state drive.

[0050] S204: Real-time monitoring is performed to determine whether the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold.

[0051] Among them, the preset temperature deviation threshold can be 0 degrees or ±0.1 degrees, which can be adjusted according to actual conditions and is not limited in this application.

[0052] S205: When the difference between the real-time temperature and the target test temperature is monitored to exceed a preset temperature deviation threshold, the current operating value of one or more control parameters of the temperature control device is obtained, where the control parameters are used to adjust the output temperature of the temperature control device, and the temperature control device is used to provide a temperature environment for the solid-state hard drive.

[0053] The control parameters include one or more of the following: heater power, fan speed, wind direction angle, and cooler power.

[0054] Among them, the heater power can range from 50W to 2000W, and the step size can be 1W; the fan speed can range from 500 RPM to 5000 RPM, and the step size can be 1RPM; the wind direction angle can range from 0 degrees to 180 degrees, and the step size can be 1 degree; the cooler power can range from 60W to 500W, and the step size can be 1W.

[0055] S206: Inputting the real-time temperature of the solid state drive, the target test temperature, and the current operating values of one or more control parameters into the strategy optimization model, and outputting a temperature control adjustment instruction.

[0056] The policy optimization model may be a pre-trained policy optimization model.

[0057] Pre-training is defined as a strategy for training deep learning models. Its core is to initially train the model using large-scale datasets, enabling it to learn common feature representations. This process is similar to the basic learning stage humans go through before acquiring new knowledge, accumulating experience through extensive reading and observation.

[0058] Pre-trained policy optimization models are a hybrid approach combining pre-training and reinforcement learning. The policy model is first trained using large-scale data (such as simulated environments, human demonstrations, or offline datasets) to learn general representations or basic policy capabilities. It is then fine-tuned or optimized online on specific tasks using a policy optimization algorithm, allowing it to quickly adapt to downstream tasks. The core advantage of this type of model is that it leverages pre-trained prior knowledge to reduce the exploration cost in reinforcement learning, balancing generalization and task specificity.

[0059] Among them, the policy optimization model can be an artificial intelligence model based on the proximal policy optimization algorithm.

[0060] S207: Adjust the operating values of one or more control parameters of the temperature control device according to the temperature control adjustment instruction.

[0061] The temperature control adjustment instruction may be an action vector, including an adjustment amount of an operating value of one or more control parameters or a target operating value of one or more control parameters.

[0062] Specifically, the temperature control adjustment instruction is executed to adjust the operating value of one or more control parameters of the temperature control device.

[0063] S208: When the test time of the test script meets the test duration, stop the solid state drive from running the test script, and complete the quality test of the solid state drive.

[0064] Specifically, the test time of the test script is monitored, and when the test time of the test script reaches the test duration, a stop test instruction is sent to the solid state drive to stop the solid state drive from running the test script and complete the quality test of the solid state drive.

[0065] It should be noted that the deployment test environment includes: 1. Physical test environment: inserting the solid-state drive into the temperature control device and powering it on. 2. Software test environment: pre-set test scripts and test conditions; loading the strategy optimization model into the temperature control device.

[0066] The solid-state drive quality testing method provided in the embodiments of the present application collects the real-time temperature of the solid-state drive through polling; obtains the current operating values of one or more control parameters of the temperature control device; inputs the real-time temperature of the solid-state drive, the target test temperature, and the current operating values of one or more control parameters into a strategy optimization model, and outputs a temperature control adjustment instruction; and adjusts the operating values of one or more control parameters of the temperature control device according to the temperature control adjustment instruction, thereby adjusting the real-time temperature of the solid-state drive. This achieves fully automated solid-state drive temperature adjustment, saving human resources while improving the accuracy of temperature control and the temperature uniformity of the solid-state drive, thereby improving the accuracy of quality test results.

[0067] In one embodiment of the present application, based on the above embodiment, step S206 further provides another implementation method, which is described in detail as follows:

[0068] S2061: forming an experience tuple according to the real-time temperature and the current operating value of one or more control parameters, and storing the experience tuple in an optimization pool, wherein the optimization pool stores a continuous sequence of experience tuples sorted by time.

[0069] Specifically, S2061 includes Sa~Sc:

[0070] Sa: The environmental reward value is obtained based on the difference between the real-time temperature and the target test temperature.

[0071] Among them, the environmental reward value is defined as: the environmental reward value is a scalar signal fed back to the agent by the environment in reinforcement learning, which is used to evaluate the immediate effect of its actions and is the core mechanism for guiding the agent to learn the optimal strategy.

[0072] Sb: Get the operating value of one or more control parameters in the previous time step and the temperature adjustment instruction in the previous time step.

[0073] The time step is defined as the time interval between observation points in time series data. It is the basic time unit for processing data in a time series model or dynamic system, that is, the minimum time unit for completing the process of "obtaining real-time temperature → obtaining temperature control adjustment instructions → executing temperature control adjustment instructions".

[0074] Specifically, the data records in the circular buffer are read, and the data records are parsed to obtain the operating values of one or more control parameters in the previous time step and the temperature adjustment instructions in the previous time step.

[0075] The circular buffer is defined as follows: a circular buffer is a data structure used to manage a fixed-size data storage space and implement cyclic access to data.

[0076] Sc: Generates an experience tuple based on the operating values of one or more control parameters in the previous time step, the temperature adjustment instruction in the previous time step, the environmental reward value, and the current operating values of one or more control parameters.

[0077] S2062: Update the policy network of the policy optimization model based on the experience tuple sequence.

[0078] Specifically, batch experience tuple data is sampled in the optimization pool; based on the batch experience tuple data, the advantage function is calculated, the policy gradient is calculated based on the advantage function, and the policy network of the policy optimization model is updated based on the policy gradient.

[0079] Among them, the calculation formula of the policy gradient is:

[0080]

[0081] Where, is the gradient of the policy objective function J(θ), indicating the optimization direction of the parameter θ; represents the parameter strategy, that is, the probability of choosing action a when the state is s; represents the gradient of the policy log probability; represents the advantage function.

[0082] Here, the state is defined as the current operating value of one or more control parameters and the target test temperature.

[0083] Among them, the action is defined as the output temperature control adjustment instruction.

[0084] The calculation formula of the advantage function is:

[0085]

[0086] Where Q(s,a) represents the action value function; V(s) represents the state value function.

[0087] S2063: According to the difference between the real-time temperature and the target test temperature, the strategy network is used to adjust the current operating value of one or more control parameters to obtain a temperature control adjustment instruction.

[0088] Specifically, according to the difference between the real-time temperature and the target test temperature, a strategy network is used to adjust the current operating value of one or more control parameters to obtain the operating value of the pre-updated control parameter; the operating value of the pre-updated control parameter is detected according to the preset constraint conditions; if the operating value of the pre-updated control parameter meets the preset constraint conditions, a temperature control adjustment instruction is generated; if the operating value of the pre-updated control parameter does not meet the preset constraint conditions, the operating value of the control parameter is reset to the constraint conditions to obtain a temperature control adjustment instruction.

[0089] The constraint condition may be a range of operating values of the control parameter.

[0090] Specifically, if the pre-updated control parameters do not meet the preset constraints, the emergency stop mechanism is triggered and a punitive reward is added to the update of the policy network.

[0091] The solid-state hard drive quality testing method provided in the embodiment of the present application can reduce the cost of interaction between the strategy optimization model and the environment by updating the strategy network of the strategy optimization model based on the experience tuple sequence, effectively utilize historical interaction data to optimize the strategy optimization model, and thus improve the accuracy of temperature control.

[0092] In one embodiment of the present application, based on the above embodiment, the control parameters include multiple items. Accordingly, step S2062 also provides another implementation method, which is described in detail as follows:

[0093] Sd: Importance sampling is used to optimize the importance weight distribution of each parameter in the control parameters based on the sequence of experience tuples.

[0094] Among them, the calculation formula of importance sampling is:

[0095]

[0096] Where, represents the policy iteration objective function; E represents the expected function; represents the policy network before updating; represents the policy network to be updated; Indicates importance weight; represents the advantage function.

[0097] Se: Updates the policy network of the policy optimization model based on the importance weight distribution using a clipping objective function.

[0098] Among them, the calculation formula of the clipping objective function is:

[0099]

[0100] Where, represents the clipping objective function; Represents the shear parameter, usually ; min is the minimum function; clip is the clipping function.

[0101] The solid-state drive quality testing method provided in the embodiment of the present application updates the policy network of the policy optimization model through importance sampling and clipping the objective function, which can reduce the number of interactions between the policy optimization model and the environment, improve sample efficiency, and reduce the risk of policy optimization model training crashes.

[0102] In one embodiment of the present application, based on the above embodiment, the test script includes multiple test tasks. Accordingly, after step S208, the process of storing the corresponding relationship between the test tasks, the target test temperature, and the temperature control adjustment instruction is further included, as detailed below:

[0103] S209: Obtain a duration during which the difference between the real-time temperature and the target test temperature does not exceed a preset temperature deviation threshold.

[0104] S210: If it is determined that the duration meets the preset stability duration, the test task, target test temperature and temperature control adjustment instruction corresponding to the duration are saved.

[0105] The preset stabilization time may be related to the test time of the test task.

[0106] S211: Save the corresponding relationship between the test task, the target test temperature and the temperature control adjustment instruction to the temperature control instruction library.

[0107] In one embodiment of the present application, based on the above embodiment, before step S203 of "polling and collecting the real-time temperature of the solid-state drive according to the first preset period", a process of monitoring whether the test task is changed is also included, which is detailed as follows:

[0108] S212: Polling according to a second preset period to obtain the test task currently being run by the solid state drive.

[0109] S213: Monitor in real time whether the test task currently being run by the solid state drive is changed.

[0110] S214: When it is detected that the test task being run by the solid state drive has been changed, the test task being run by the solid state drive and the target test temperature are processed. Alternatively, it is detected that the test task being run by the solid state drive has not been changed.

[0111] Specifically, in step S214, "processing the test task and target test temperature currently being run by the solid state drive" specifically includes Sf~Sg:

[0112] Sf: Matches the corresponding target temperature control adjustment instruction in the temperature control instruction library according to the test task currently being run by the solid-state drive and the target test temperature to obtain a matching result.

[0113] Sg: If the matching result includes the target temperature control adjustment instruction, the target temperature control adjustment instruction is executed. Alternatively, if the matching result does not include the target temperature control adjustment instruction,

[0114] The solid-state hard drive quality testing method provided in the embodiment of the present application can improve the temperature adjustment speed, improve the efficiency of temperature adjustment, and reduce resource consumption and equipment loss by matching the corresponding target temperature control adjustment instructions according to the test task currently running on the solid-state hard drive and the target test temperature.

[0115] Figure 3 Schematic diagram of the process of the solid state drive quality testing method provided in the embodiment of the present application Figure 2 ,like Figure 3 As shown, the embodiment of the present application also provides another solid state drive quality testing method, which is described in detail as follows:

[0116] S301: Obtain a test script and test conditions for a solid state drive to be tested, wherein the test conditions include a target test temperature and a test duration, and wherein the test script includes multiple test tasks.

[0117] S302: Send the test script to the solid state drive so that the solid state drive runs the test script.

[0118] S303: During the execution of the test script, polling is performed according to a second preset period to obtain the test task currently being executed by the solid state drive.

[0119] The second preset period may be related to the test duration of the test task.

[0120] S304: monitor in real time whether the test task being run by the solid state drive has been changed. When it is detected that the test task being run by the solid state drive has been changed, execute S305 to S308. When it is detected that the test task being run by the solid state drive has not been changed, execute S308.

[0121] S305: Matching a corresponding target temperature control adjustment instruction in a temperature control instruction library according to the test task currently being run by the solid state drive and the target test temperature to obtain a matching result.

[0122] S306: Determine whether the matching result includes the target temperature control adjustment instruction. If the matching result includes the target temperature control adjustment instruction, execute S307 and S308. If the matching result does not include the target temperature control adjustment instruction, execute S308.

[0123] S307: Adjust the operating values of one or more control parameters of the temperature control device according to the target temperature control adjustment instruction.

[0124] S308: Collecting the real-time temperature of the solid state drive through polling according to a first preset period.

[0125] S309: Real-time monitoring is performed to determine whether the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold.

[0126] S310: When the difference between the real-time temperature and the target test temperature is monitored to exceed a preset temperature deviation threshold, the current operating value of one or more control parameters of the temperature control device is obtained, where the control parameters are used to adjust the output temperature of the temperature control device, and the temperature control device is used to provide a temperature environment for the solid-state hard drive.

[0127] S311: Input the real-time temperature of the solid state drive, the target test temperature, and the current operating values of one or more control parameters into the strategy optimization model, and output a temperature control adjustment instruction.

[0128] S312: Adjust the operating values of one or more control parameters of the temperature control device according to the temperature control adjustment instruction.

[0129] S313: When the test time of the test script meets the test duration, stop the solid state drive from running the test script, and complete the quality test of the solid state drive.

[0130] S314: Obtain a duration during which the difference between the real-time temperature and the target test temperature does not exceed a preset temperature deviation threshold.

[0131] S315: If it is determined that the duration meets the preset stability duration, the test task, target test temperature and temperature control adjustment instruction corresponding to the duration are saved.

[0132] S316: Save the corresponding relationship between the test task, the target test temperature and the temperature control adjustment instruction to the temperature control instruction library.

[0133] The solid-state hard drive quality testing method provided in the embodiment of the present application realizes fully automated solid-state hard drive temperature adjustment, which can save human resources, while improving the accuracy of temperature control and the temperature uniformity of the solid-state hard drive, thereby improving the accuracy of quality test results.

[0134] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method.

[0135] Figure 4 This is a schematic diagram of the structure of the solid state drive quality testing device provided in the embodiment of the present application. Figure 4 As shown, an embodiment of the present application further provides a solid state drive quality testing device 40 , comprising: an acquisition module 401 , a sending module 402 , a collection module 403 , a monitoring module 404 , an output module 405 , an adjustment module 406 and a stop module 407 .

[0136] An acquisition module 401 is configured to acquire a test script and test conditions for the solid-state drive to be tested, wherein the test conditions include a target test temperature and a test duration;

[0137] The sending module 402 is used to send the test script to the solid state drive so that the solid state drive runs the test script;

[0138] The acquisition module 403 is used to collect the real-time temperature of the solid-state hard disk according to a first preset period during the execution of the test script;

[0139] Monitoring module 404, used to monitor in real time whether the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold;

[0140] The acquisition module 401 is further configured to acquire current operating values of one or more control parameters of a temperature control device when the difference between the monitored real-time temperature and the target test temperature exceeds a preset temperature deviation threshold, wherein the control parameters are used to adjust the output temperature of the temperature control device, wherein the temperature control device is used to provide a temperature environment for the solid-state drive;

[0141] Output module 405, for inputting the real-time temperature of the solid state drive, the target test temperature, and the current operating values of one or more control parameters into the strategy optimization model, and outputting a temperature control adjustment instruction;

[0142] An adjustment module 406 is configured to adjust the operating values of one or more control parameters of the temperature control device according to the temperature control adjustment instruction;

[0143] The stop module 407 is used to stop the solid state drive from running the test script when the test time of the test script meets the test duration, thereby completing the quality test of the solid state drive.

[0144] In one possible implementation, the output module 405 is specifically used to: form an experience tuple based on the real-time temperature and the current operating values of one or more control parameters, and store the experience tuple in an optimization pool, wherein the optimization pool stores a continuous sequence of experience tuples sorted by time; update the policy network of the policy optimization model based on the sequence of experience tuples; and adjust the current operating values of one or more control parameters using the policy network based on the difference between the real-time temperature and the target test temperature to obtain a temperature control adjustment instruction.

[0145] In one possible implementation, the control parameters include multiple items. Accordingly, when "updating the policy network of the policy optimization model according to the experience tuple sequence", the output module 405 is specifically used to: optimize the importance weight distribution of each parameter in the control parameters by importance sampling according to the experience tuple sequence; and update the policy network of the policy optimization model by using a clipping objective function according to the importance weight distribution.

[0146] In one possible implementation, the output module 405, when "forming an experience tuple based on the real-time temperature and the current operating values of one or more control parameters", is specifically used to: obtain an environmental reward value based on the difference between the real-time temperature and the target test temperature; obtain the operating values of one or more control parameters in the previous time step and the temperature adjustment instructions in the previous time step; generate an experience tuple based on the operating values of one or more control parameters in the previous time step, the temperature adjustment instructions in the previous time step, the environmental reward value and the current operating values of one or more control parameters.

[0147] In a possible implementation, the control parameter includes one or more of heater power, fan speed, wind direction angle, and refrigerator power.

[0148] In a possible implementation, the test script includes multiple test tasks. Accordingly, the solid-state drive quality testing device 40 further includes:

[0149] A saving module is used to obtain the duration during which the difference between the real-time temperature and the target test temperature does not exceed the preset temperature deviation threshold; if it is determined that the duration meets the preset stability duration, the test task, target test temperature and temperature control adjustment instruction corresponding to the duration are saved; and the correspondence between the test task, target test temperature and temperature control adjustment instruction is saved to the temperature control instruction library.

[0150] In one possible implementation, the monitoring module 404 is further specifically used to: poll and obtain the test task being run by the solid-state hard disk according to a second preset period; monitor in real time whether the test task being run by the solid-state hard disk has been changed; when monitoring that the test task being run by the solid-state hard disk has been changed, process the test task being run by the solid-state hard disk and the target test temperature; or, monitoring that the test task being run by the solid-state hard disk has not been changed; the monitoring module 404, when "processing the test task being run by the solid-state hard disk and the target test temperature", specifically includes: matching the corresponding target temperature control adjustment instruction in the temperature control instruction library according to the test task being run by the solid-state hard disk and the target test temperature to obtain a matching result; the matching result includes the target temperature control adjustment instruction, and executing the target temperature control adjustment instruction; or, the matching result does not include the target temperature control adjustment instruction.

[0151] For the description of the features in the embodiment corresponding to the solid state drive quality testing device, please refer to the relevant description of the embodiment corresponding to the solid state drive quality testing method, and will not be repeated here.

[0152] Figure 5 This is a schematic diagram of the structure of the electronic device provided in the embodiment of the present application. Figure 5 As shown, the electronic device 50 provided in this embodiment includes: at least one processor 501 and a memory 502. Optionally, the electronic device 50 further includes a communication component 503. The processor 501, the memory 502 and the communication component 503 are connected via a bus.

[0153] In a specific implementation process, at least one processor 501 executes the computer-executable instructions stored in the memory 502 , so that the at least one processor 501 executes the above-mentioned solid-state hard disk quality testing method embodiment.

[0154] The specific implementation process of the processor 501 can be found in the above method embodiment. Its implementation principle and technical effects are similar and will not be repeated here in this embodiment.

[0155] In the above embodiments, it should be understood that the processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. A general-purpose processor may be a microprocessor or any conventional processor. The steps of the method disclosed in the application may be directly executed by a hardware processor or by a combination of hardware and software modules within the processor.

[0156] The memory may include random access memory (RAM) and may also include non-volatile memory (NVM), such as at least one disk storage.

[0157] A bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus. Buses can be categorized as address buses, data buses, and control buses. For ease of illustration, the buses in the drawings of this application are not limited to just one bus or just one type of bus.

[0158] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above-mentioned solid-state hard drive quality testing method embodiments when running.

[0159] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0160] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps of any of the above-mentioned solid-state hard drive quality testing method embodiments are implemented.

[0161] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-mentioned solid-state hard drive quality testing method embodiments.

[0162] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0163] The above is a detailed introduction to the solid-state hard drive quality testing method, device, equipment and storage medium provided by the present application. This article uses specific examples to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method and core ideas of the present application. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the claims of the present application.

Claims

1. A solid state drive quality testing method, characterized in that: include: Obtaining a test script and test conditions for the solid-state drive to be tested, wherein the test conditions include a target test temperature and a test duration; Sending the test script to the solid-state drive so that the solid-state drive runs the test script; During the running of the test script, polling and collecting the real-time temperature of the solid-state hard disk according to a first preset period; Real-time monitoring of whether the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold; When it is monitored that the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold, obtaining current operating values of one or more control parameters of a temperature control device, wherein the control parameters are used to adjust the output temperature of the temperature control device, wherein the temperature control device is used to provide a temperature environment for the solid-state drive; Inputting the real-time temperature of the solid-state drive, the target test temperature, and the current operating values of the one or more control parameters into a strategy optimization model, and outputting a temperature control adjustment instruction; adjusting the operating values of the one or more control parameters of the temperature control device according to the temperature control adjustment instruction; When the test time of the test script meets the test duration, the solid-state hard disk is stopped from running the test script to complete the quality test of the solid-state hard disk.

2. The solid state drive quality testing method according to claim 1, wherein: The step of inputting the real-time temperature of the solid-state drive, the target test temperature, and the current operating values of the one or more control parameters into a strategy optimization model and outputting a temperature control adjustment instruction includes: forming an experience tuple according to the real-time temperature and the current operating values of the one or more control parameters, and storing the experience tuple in an optimization pool, wherein the optimization pool stores a continuous sequence of experience tuples sorted by time; updating the policy network of the policy optimization model according to the sequence of experience tuples; According to the difference between the real-time temperature and the target test temperature, the strategy network is used to adjust the current operating value of the one or more control parameters to obtain the temperature control adjustment instruction.

3. The solid state drive quality testing method according to claim 2, wherein: The control parameters include multiple items; Accordingly, updating the policy network of the policy optimization model according to the experience tuple sequence includes: According to the experience tuple sequence, importance sampling is used to optimize the importance weight distribution of each parameter in the control parameters; According to the importance weight distribution, a policy network of the policy optimization model is updated using a clipping objective function.

4. The solid state drive quality testing method according to claim 2, wherein: The forming of an experience tuple according to the real-time temperature and the current operating values of the one or more control parameters includes: Obtaining an environmental reward value according to a difference between the real-time temperature and the target test temperature; Obtaining the operating value of the one or more control parameters in the previous time step and the temperature adjustment instruction in the previous time step; The experience tuple is generated according to the operating values of the one or more control parameters in the previous time step, the temperature adjustment instruction in the previous time step, the environmental reward value and the current operating values of the one or more control parameters.

5. The solid state drive quality testing method according to claim 1, wherein: The control parameters include one or more of heater power, fan speed, wind direction angle and refrigerator power.

6. The solid state drive quality testing method according to any one of claims 1 to 5, characterized in that: The test script includes multiple test tasks; Accordingly, when the test time of the test script meets the test duration, the solid-state hard disk is stopped from running the test script, and after the quality test of the solid-state hard disk is completed, the method further includes: Obtaining a duration during which the difference between the real-time temperature and the target test temperature does not exceed a preset temperature deviation threshold; If it is determined that the duration meets the preset stability duration, the test task, the target test temperature and the temperature control adjustment instruction corresponding to the duration are saved; The corresponding relationship between the test task, the target test temperature and the temperature control adjustment instruction is saved in a temperature control instruction library.

7. The solid state drive quality testing method according to claim 6, wherein: Before collecting the real-time temperature of the solid state hard disk by polling according to the first preset period, the method further includes: Polling according to a second preset period to obtain the test task currently being run by the solid-state drive; Real-time monitoring of whether the test task being run by the solid-state drive is changed; When it is detected that the test task being run by the solid-state hard disk is changed, processing the test task being run by the solid-state hard disk and the target test temperature; Alternatively, it is detected that the test task currently being run by the solid-state drive has not been replaced; The processing of the test task currently being run by the solid state drive and the target test temperature includes: Matching a corresponding target temperature control adjustment instruction in the temperature control instruction library according to the test task currently being run by the solid-state hard disk and the target test temperature to obtain a matching result; The matching result includes the target temperature control adjustment instruction, and the target temperature control adjustment instruction is executed; Alternatively, the matching result does not include the target temperature control adjustment instruction.

8. A solid state hard disk quality testing device, characterized in that: include: An acquisition module, configured to acquire a test script and test conditions for the solid-state drive to be tested, wherein the test conditions include a target test temperature and a test duration; A sending module, configured to send the test script to the solid-state drive so that the solid-state drive runs the test script; An acquisition module, configured to collect the real-time temperature of the solid-state drive by polling according to a first preset period during the execution of the test script; A monitoring module, configured to monitor in real time whether the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold; The acquisition module is further configured to acquire current operating values of one or more control parameters of a temperature control device when it is detected that the difference between the real-time temperature and the target test temperature exceeds a preset temperature deviation threshold, wherein the control parameters are used to adjust the output temperature of the temperature control device, wherein the temperature control device is used to provide a temperature environment for the solid-state drive; an output module, configured to input the real-time temperature of the solid-state drive, the target test temperature, and the current operating values of the one or more control parameters into a strategy optimization model, and output a temperature control adjustment instruction; an adjustment module, configured to adjust the operating value of the one or more control parameters of the temperature control device according to the temperature control adjustment instruction; The stopping module is used to stop the solid-state hard disk from running the test script when the test time of the test script meets the test duration, thereby completing the quality test of the solid-state hard disk.

9. An electronic device, characterized in that: include: memory for storing computer programs; A processor, configured to implement the steps of the solid state drive quality testing method according to any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, the steps of the solid-state hard disk quality testing method according to any one of claims 1 to 7 are implemented.

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