Length measuring machine-based step gauge measuring method and step gauge measuring system

Abstract

The present disclosure provides a step gauge measurement method and system based on a length measuring machine, the length measuring machine comprising a guide rail, a measuring seat arranged on the guide rail and movable along the guide rail, and a measuring head arranged on the measuring seat, the step gauge comprising a plurality of gauge blocks arranged in a straight line, the step gauge being arranged on one side of the guide rail through a bearing table, and the direction of the guide rail being a first axis, the step gauge measurement method comprising: making the step gauge parallel to the guide rail; moving the measuring head in a direction perpendicular to the first axis and moving the measuring seat along the guide rail to make the measuring head contact a surface to be measured, for adjacent gauge blocks in the plurality of gauge blocks, the surface to be measured close to the gap between the adjacent gauge blocks is referred to as a gap surface, the measuring head is first moved to the gap between the adjacent gauge blocks, and then contacts the gap surface; and in response to the force on the measuring head represented by the measurement value of the measuring head reaching a preset range, recording the position of the measuring seat as the position of the surface to be measured. Thus, the equipment cost of measuring the step gauge can be reduced.

Description

Technical Field

[0001] This disclosure relates to the intelligent manufacturing equipment industry, and in particular to a step gauge measurement method and system based on a length measuring machine. Background Technology

[0002] A step gauge is a high-precision measuring instrument consisting of multiple gauge blocks arranged in a straight line. It is widely used for calibrating coordinate measuring machines and inspecting the movement accuracy of machine tool tables. To ensure the accuracy of the step gauge, it needs to be calibrated before use, which requires measuring each gauge block.

[0003] Currently, the measurement of step gauges mainly relies on the combined use of a coordinate measuring machine (CMM) and a laser interferometer. The laser interferometer's reflector and the step gauge are mounted on the CMM's worktable, and the optical path is adjusted so that the laser beam is parallel to the direction of the worktable's movement. The CMM is then used to aim at each face of the step gauge, and the readings are measured using the laser interferometer's indication.

[0004] However, existing step gauge measurement methods suffer from high equipment costs. Coordinate measuring machines and laser interferometers are both high-precision metrology devices, which are not only expensive to purchase but also require regular maintenance and calibration, resulting in high operating costs. Furthermore, the operation and maintenance of these devices require specialized technicians, further increasing labor costs. Summary of the Invention

[0005] This disclosure is made in view of the above-mentioned situation, and its purpose is to provide a step gauge measurement method and system based on a length measuring machine that can reduce the equipment cost of measuring step gauges.

[0006] Therefore, a first aspect of this disclosure provides a step gauge measurement method based on a length measuring machine. The length measuring machine includes a guide rail, a measuring seat disposed on the guide rail and movable along the guide rail, and a probe disposed on the measuring seat. The step gauge includes a plurality of gauge blocks arranged in a straight line. The step gauge is disposed on one side of the guide rail via a support platform, with the direction of the guide rail as a first axis. The step gauge measurement method includes: making the step gauge parallel to the guide rail; controlling the probe to move in a direction perpendicular to the first axis and controlling the measuring seat to move along the guide rail to make the probe contact the surface to be measured, wherein the surface to be measured is the surface of the gauge block among the plurality of gauge blocks, wherein, for adjacent gauge blocks among the plurality of gauge blocks, the surface to be measured near the gap between the adjacent gauge blocks is called the gap surface; the probe first moves to the gap between the adjacent gauge blocks and then contacts the gap surface; and in response to the force on the probe, as indicated by the measured value of the probe, reaching a preset range, the position of the measuring seat is recorded as the position of the surface to be measured.

[0007] In the first aspect of the present disclosure, the position of the surface to be measured can be determined by measuring the step gauge using the length measuring machine, which can reduce the cost of the equipment for measuring the step gauge. In addition, the position of the surface to be measured can be determined using the position of the measuring seat of the length measuring machine, and the position of the measuring seat can be recorded when the force on each surface to be measured is substantially the same, in combination with the measurement value of the measuring head of the length measuring machine, which can ensure the consistency of the measurement conditions and improve the accuracy of the step gauge. In addition, the step gauge is placed on one side of the guide rail, which can avoid the length of the step gauge limiting the movement range of the measuring seat, thereby improving the measurement range of the length of the step gauge, on the one hand, and avoiding the measuring seat or the step gauge from being damaged due to the measuring seat colliding with the step gauge, on the other hand. In addition, the position of the measuring head can be reduced, and the original structure of the length measuring machine can be changed. In addition, the step gauge is placed on one side of the guide rail through the bearing table, which can fix the step gauge during measurement to reduce the interference caused by the shaking of the step gauge, and facilitate the adjustment of the posture of the step gauge through the bearing table. In addition, the measuring head is first moved to the gap between the adjacent gauge blocks, and then contacts the gap surface, which can control the movement speed of different steps through step-by-step operation, and can balance the measurement efficiency and the safety of the measuring head or the surface to be measured.

[0008] In addition, in the step gauge measurement method of the first aspect of the present disclosure, the second axis is perpendicular to the first axis and in the same horizontal plane as the first axis, and the measuring head is parallel to the second axis. In this case, when the step gauge is placed on one side of the guide rail, the probability of the measuring head colliding with the bottom of the step gauge can be reduced, and the risk of damaging the measuring head can be reduced. In addition, the measuring head is parallel to the second axis, which can improve the convenience of controlling the measuring head.

[0009] In addition, in the step gauge measurement method of the first aspect of the present disclosure, the second axis is perpendicular to the first axis and in the same horizontal plane as the first axis, and the third axis is perpendicular to the first axis and the second axis. The bearing table can rotate or tilt around the second axis and the third axis. In this way, the posture of the step gauge can be adjusted.

[0010] In addition, in the step gauge measurement method of the first aspect of the present disclosure, optionally, the step of making the step gauge parallel to the guide rail comprises: controlling the measurement seat to move along the guide rail to make the measuring head contact a reference surface, the reference surface being a surface of one of the plurality of gauge blocks; repeatedly performing the following steps until the measurement value of the measuring head in the current reciprocating movement has a variation that is not greater than a preset value: controlling the measuring head to reciprocate in the direction of the second axis, and in response to the variation being greater than the preset value, adjusting the rotation of the bearing table around the third axis; and repeatedly performing the following steps until the variation is not greater than the preset value: controlling the measuring head to reciprocate in the direction of the third axis, and in response to the variation being greater than the preset value, adjusting the rotation of the bearing table around the second axis. In this way, the step gauge is conveniently made parallel to the guide rail.

[0011] In addition, in the step gauge measurement method of the first aspect of the present disclosure, optionally, the step of controlling the measurement seat to move along the guide rail to make the measuring head align with the gap; the step of controlling the measuring head to move in a direction perpendicular to the first axis to make the measuring head align with the gap enter the gap; and the step of controlling the measurement seat to move along the guide rail to make the measuring head in the gap contact the gap surface. In this way, the measurement efficiency can be further improved, and the safety of the measuring head or the surface to be measured can be improved.

[0012] In addition, in the step gauge measurement method of the first aspect of the present disclosure, optionally, the gap surface comprises opposite first and second surfaces to be measured. After the measuring head moves to the gap, the first surface to be measured is first contacted to measure the position of the first surface to be measured, and then the second surface to be measured is contacted to measure the position of the second surface to be measured, and then the position of the next gap surface is measured. In this way, the travel time of the measuring head can be reduced to improve the measurement efficiency.

[0013] In addition, in the step gauge measurement method of the first aspect of the present disclosure, optionally, the measuring head is arranged on the measurement seat by a clamp, and the clamp is configured to control the measuring head to move in a direction perpendicular to the first axis. In this case, the measuring head can be moved in multiple directions perpendicular to each other by combining the measurement seat and the clamp, so as to facilitate the movement of the measuring head to the target position (for example, the adjacent area of the surface to be measured).

[0014] In addition, in the step gauge measurement method of the first aspect of the present disclosure, optionally, the clamp comprises a pressing plate, a vertical sliding block and a horizontal push rod; the pressing plate is installed on the measurement seat; the vertical sliding block is arranged on the side wall of the pressing plate in a movable manner in the vertical direction; and the horizontal push rod is arranged on the vertical sliding block in a movable manner in the horizontal direction and is connected with the measuring head. In this way, the measuring head can be conveniently controlled to move in the direction of the second axis and the direction of the third axis.

[0015] In addition, in the step gauge measurement method according to the first aspect of the present disclosure, the measurement seat can optionally include a driving wheel for controlling movement of the measurement seat along the guide rail, and a fine adjustment wheel for controlling fine movement of the measurement seat along the guide rail; the driving wheel is used to control movement of the measurement seat along the guide rail so that the probe is in one of the following states: aligned with the adjacent area of the surface to be measured and in contact with or away from the surface to be measured; after the probe is in contact with the surface to be measured, the fine adjustment wheel is used to control fine movement of the measurement seat along the guide rail so that the force on the probe represented by the measurement value reaches the preset range. In this case, the driving wheel is used to move at a high speed to the vicinity of the target area, the travel time is reduced to improve the measurement efficiency, and the fine adjustment wheel is used for slow adjustment to reduce positioning errors caused by inertia or overshoot.

[0016] The second aspect of the present disclosure provides a step gauge measurement system based on a length measuring machine, which includes a length measuring machine and a support table. The length measuring machine includes a guide rail, a measurement seat arranged on the guide rail and movable along the guide rail, and a probe arranged on the measurement seat. A step gauge includes a plurality of gauge blocks arranged in a straight line. The step gauge is arranged on one side of the guide rail by the support table. In the direction of the guide rail as the first axis, when measuring the surface to be measured of the step gauge, the probe moves in the direction perpendicular to the first axis, and the measurement seat moves along the guide rail to make the probe contact the surface to be measured. For adjacent gauge blocks in the plurality of gauge blocks, the surface to be measured of the adjacent gauge blocks close to the gap between the adjacent gauge blocks is referred to as the gap surface. The probe first moves to the gap between the adjacent gauge blocks, and then contacts the gap surface. In response to the force on the probe represented by the measurement value reaching a preset range, the position of the measurement seat is recorded as the position of the surface to be measured. The surface to be measured is the surface to be measured of the gauge blocks in the plurality of gauge blocks.

[0017] According to the present disclosure, a step gauge measurement method and system based on a length measuring machine are provided, which can reduce the cost of equipment for measuring a step gauge. BRIEF DESCRIPTION OF DRAWINGS

[0018] The present disclosure will now be explained in further detail by way of example only with reference to the accompanying drawings.

[0019] Figure 1 FIG. 1 is a schematic diagram showing a measurement environment of a step gauge according to an example of the present disclosure.

[0020] Figure 2 FIG. 2 is a schematic diagram showing assembly of a length measuring machine and a clamp according to an example of the present disclosure.

[0021] Figure 3 FIG. 3 is a schematic diagram showing a user interface according to an example of the present disclosure.

[0022] Figure 4 is an exemplary plan view showing a step gauge involved in the example of the present disclosure.

[0023] Figure 5 is a schematic view showing an assembly of a jig and a probe involved in the example of the present disclosure.

[0024] Figure 6 is an exemplary flowchart showing a measurement method involved in the example of the present disclosure.

[0025] Figure 7 is an exemplary flowchart showing a step of making a step gauge parallel to a guide rail involved in the example of the present disclosure.

[0026] Figure 8 is a schematic view showing a change in position of a probe when measuring a gap surface of adjacent gauge blocks involved in the example of the present disclosure.

[0027] Figure 9 is an exemplary flowchart showing a step of making a probe contact a gap surface of adjacent gauge blocks involved in the example of the present disclosure.

[0028] Figure 10 is an exemplary flowchart showing an embodiment of a measurement method involved in the example of the present disclosure. DETAILED DESCRIPTION

[0029] Hereinafter, a preferred embodiment of the present disclosure will be described in detail with reference to the accompanying drawings. In the following description, for the purpose of explanation, identical components are assigned with identical reference numerals, and repetitive description is omitted. In addition, the drawings are schematic views, and the ratio of the dimensions between the components or the shape of the components, etc. can be different from the actual ones. It should be noted that the terms "comprise" and "have" and any variations thereof, such as a series of steps or units included or possessed in a process, method, system, product, or apparatus, are not necessarily limited to those steps or units clearly listed, but can include or have other steps or units that are not clearly listed or inherent to the process, method, product, or apparatus.

[0030] In view of the above problems, the inventors have made studies and have come up with a scheme based on a length measuring machine, which measures a step gauge using the length measuring machine. Thus, it is possible to reduce the equipment cost for measuring a step gauge. Specifically, the inventors have changed the measurement method of a worktable, which normally places a measured object on a guide rail of a length measuring machine, and placed a step gauge, for example, on one side of the guide rail, and thus made it possible to measure a step gauge using a length measuring machine (i.e., made it possible to apply a length measuring machine to a step gauge measurement).

[0031] In addition, in the following description, a surface of a gauge block in the plurality of gauge blocks of the step gauge, on which a measurement is to be performed, is referred to as a measurement surface. A direction of a guide rail of the length measuring machine is referred to as a first axis, a direction perpendicular to the first axis and in the same horizontal plane as the first axis is referred to as a second axis, and a direction perpendicular to both the first axis and the second axis is referred to as a third axis. For example, the direction of the guide rail is a horizontal direction, the direction of the first axis can be a horizontal direction, the direction of the second axis can be another horizontal direction perpendicular to the direction of the first axis, and the direction of the third axis can be a vertical direction. In some examples, the first axis can be referred to as an X axis, the second axis can be referred to as a Y axis, and the third axis can be referred to as a Z axis.

[0032] Figure 1 FIG. 1 is a schematic diagram illustrating a measurement environment of a step gauge 200 according to some examples of the present disclosure. Figure 1 FIG. 2 illustrates a portion of the length measuring machine 100.

[0033] In some examples, the step gauge measurement method (described later) according to some examples of the present disclosure can be applied in a measurement environment as shown in FIG. 1. It should be noted that this does not represent a limitation on the present disclosure. Figure 1

[0034] In some examples, with reference to FIG. 1, in the measurement environment, the length measuring machine 100 and the step gauge 200 can be included. The length measuring machine 100 can be configured to measure a position of a measurement surface 211 of the step gauge 200, thereby achieving measurement of the step gauge 200. In some examples, a carrier table 300 can also be included in the measurement environment, and the carrier table 300 can be configured to carry (e.g., support or fix) the step gauge 200. In some examples, a clamp 400 can also be included in the measurement environment, and the clamp 400 can be configured to clamp a probe 130 (described later) of the length measuring machine 100 and control movement of the probe 130 in a non-guide rail direction of the length measuring machine 100. Figure 1

[0035] In addition, the length measuring machine 100 can be a length measuring instrument. That is, the length measuring machine 100 can be configured to measure a length parameter of a measured object. In some examples, the length measuring machine 100 can be a contact type length measuring machine. In some examples, the contact type length measuring machine can include at least one of a grating length measuring machine and a mechanical length measuring machine.

[0036] ​​In some examples, the length measuring machine 100 can be configured to determine the position information of the corresponding position of the measured object (e.g. the position of the surface 211 of the step gauge 200 to be measured) by the position of the measurement seat 120 (to be described later). For example, the measurement seat 120 can be moved to make the probe 130 of the length measuring machine 100 contact the measured object, and the position of the measurement seat 120 corresponding to the corresponding position of the measured object is sampled to obtain the position information of the corresponding position. In some examples, the length measuring machine 100 can be configured to determine the position information of the corresponding position of the measured object by the position of the measurement seat 120 and the measurement value of the probe 130. In some examples, the measurement seat 120 can also be referred to as a head seat.

[0037] Figure 2 is a schematic view showing the assembly of the length measuring machine 100 and the clamp 400 involved in the examples of the present disclosure. Figure 3 is a schematic view showing the user interface 500 involved in the examples of the present disclosure.

[0038] In some examples, referring to Figure 2 , the length measuring machine 100 can include a guide rail 110, a measurement seat 120, and a probe 130. The measurement seat 120 can be arranged on the guide rail 110 and can be moved along the guide rail 110. In this way, it is convenient to determine the position information of the corresponding position of the measured object by the position of the measurement seat 120. In addition, the probe 130 can be arranged on the measurement seat 120. In this case, in combination with the measurement value of the probe 130, the consistency of the contact state of the probe 130 with the measured object when recording the position of the measurement seat 120 can be ensured (i.e. the consistency of the measurement condition is ensured), thereby improving the accuracy of measuring the measured object. In some examples, the probe 130 can be arranged on the measurement seat 120 through the clamp 400. In this case, through the clamp 400, it is convenient to adjust the position of the probe 130 in the non-guide rail direction of the length measuring machine 100.

[0039] The relevant components of the length measuring machine 100 are described below taking the surface 211 of the step gauge 200 to be measured as an example of the corresponding position of the measured object. It should be noted that this does not represent a limitation of the present disclosure.

[0040] In some examples, for a grating length measuring machine, the guide rail 110 can have a first grating ruler. The position of the measurement seat 120 can be determined by the grating value measured by the first grating ruler. That is, the grating value of the first grating ruler can represent the position of the measurement seat 120. In this way, using a grating length measuring machine can improve the accuracy of the position of the measurement seat 120. In addition, the grating value measured by the first grating ruler can also be referred to as a guide rail grating value. In some examples, the guide rail 110 can have a grating groove, and the first grating ruler can be installed in the grating groove.

[0041] In some examples, referring to Figure 2In some examples, the measurement seat 120 can include a drive wheel 121 and a fine adjustment wheel 122. The drive wheel 121 can control the movement of the measurement seat 120 along the guide rail 110 (i.e., the drive wheel 121 can coarsely adjust the position of the measurement seat 120). The fine adjustment wheel 122 can control the fine movement of the measurement seat 120 along the guide rail 110 (i.e., the fine adjustment wheel 122 can finely adjust the position of the measurement seat 120). In other words, the movement speed of the measurement seat 120 along the guide rail 110 controlled by the fine adjustment wheel 122 can be less than the movement speed of the measurement seat 120 along the guide rail 110 controlled by the drive wheel 121. In this case, it is convenient to move to the vicinity of the target region at a high speed by the drive wheel 121, reduce the travel time to improve the measurement efficiency, and then slowly adjust by the fine adjustment wheel 122 to reduce the positioning error caused by inertia or overshoot.

[0042] In some examples, the measurement seat 120 can include a measurement head 130. The measurement head 130 can be configured to contact the surface 211 to be measured. In some examples, the measurement head 130 can be configured to sense the force between the surface 211 to be measured and the measurement head 130. Figure 2 In some examples, the measurement seat 120 can further include a locking handle 123 for locking the drive wheel 121. The drive wheel 121 can be locked by the locking handle 123 before the movement of the measurement seat 120 along the guide rail 110 is controlled by the fine adjustment wheel 122. The drive wheel 121 can be released by the locking handle 123 before the movement of the measurement seat 120 along the guide rail 110 is controlled by the drive wheel 121, in response to the locking handle 123 being in the locked state. In this way, the interference of the drive wheel 121 can be reduced when the measurement seat 120 is finely adjusted.

[0043] In some examples, the measurement seat 120 can further include a body portion 124, which can be configured to serve as a support. In some examples, the measurement seat 120 can further include a measurement rod (not shown) fixed to the body portion 124.

[0044] In addition, the measurement head 130 can be configured to sense the force between the surface 211 to be measured and the measurement head 130 by contacting the surface 211 to be measured. The measurement value of the measurement head 130 (i.e., the reading of the measurement head 130) can represent the force received by the measurement head 130. In addition, the force received by the measurement head 130 can refer to the force received by the measurement head 130. In other words, the force received by the measurement head 130 can be the force between the surface 211 to be measured and the measurement head 130. In some examples, the measurement head 130 can be a contact sensor.

[0045] In some examples, the measurement value of the measurement head 130 can be a fixed value (e.g., 0) when the measurement head 130 is not in contact with the surface 211 to be measured, and the measurement value of the measurement head 130 can change relative to the fixed value when the measurement head 130 is in contact with the surface 211 to be measured. In this way, the force received by the measurement head 130 can be determined based on the measurement value of the measurement head 130.

[0046] In some examples, for the grating length measuring machine, the measuring head 130 can have a second grating ruler. The measurement value can be a grating value measured by the second grating ruler, and the measurement value can also be referred to as a head grating value. That is, the grating value of the second grating ruler can represent the force acting on the measuring head 130. Thus, the grating length measuring machine can improve the accuracy of the measurement value.

[0047] In some examples, the reference Figure 2 When measuring the pitch gauge 200, the measuring head 130 can be parallel to the second axis F2. In this case, when the pitch gauge 200 is placed on one side of the guide rail 110, the probability of the measuring head 130 hitting the bottom of the pitch gauge 200 can be reduced, and the risk of damaging the measuring head 130 can be reduced. In addition, the measuring head 130 parallel to the second axis F2 can also improve the convenience of controlling the measuring head 130.

[0048] In some examples, the length measuring machine 100 can also include a tailstock 140. In some examples, the position of the tailstock 140 can serve as a reference position for determining the position of the measuring seat 120. In some examples, the position of the tailstock 140 can be fixed. In some examples, the tailstock 140 can be configured to assist in supporting and positioning the measured piece. In some examples, the tailstock 140 can include a fixed seat and a measuring rod (not shown) fixed on the top of the fixed seat.

[0049] In some examples, the length measuring machine 100 can also include a workbench (not shown) disposed on the guide rail 110. The workbench can be configured to carry other measured pieces in addition to the pitch gauge 200. That is, the workbench disposed on the guide rail 110 is not the carrying table 300 described above. In this case, it is possible to support the measurement of the pitch gauge 200 while maintaining the original workpiece types that can be measured by the length measuring machine 100, facilitating the measurement of a variety of measured pieces. That is, the measurement range of the length measuring machine 100 can be improved.

[0050] In addition, the workbench can at least control the rotation and / or inclination of the measured piece. In some examples, the workbench can include at least one of a two-axis workbench and a five-axis workbench.

[0051] In some examples, the length measuring machine 100 can also include a base 150. In some examples, the guide rail 110 and the tailstock 140 can be disposed on the base 150. In some examples, the material of the base 150 can be marble. Thus, it is helpful to make the length measuring machine 100 not easy to deform when working and to reduce the interference of external vibration, thereby improving the stability and reliability of the length measuring machine 100.

[0052] In some examples, the length measuring machine 100 can also include a horizontal adjustment leg (not shown) disposed below the base 150, which can be configured to adjust the levelness of the base 150.

[0053] In some examples, the length measuring machine 100 can display measurement data. In some examples, the measurement data may include at least one of the measurement value of the probe 130 and the position of the measuring seat 120. In some examples, reference... Figure 2 The length measuring machine 100 may include a display device 160 (e.g., a monitor), which may be configured to display measurement data.

[0054] In some examples, display device 160 may display user interface 500 (see reference). Figure 3 The user interface 500 can be configured to display measurement data and / or set information about the measured object.

[0055] In some examples, reference Figure 3 The user interface 500 may include a first area 510, which may be configured to display measurement data. As an example, Figure 3 The position of the measuring base 120 is shown in box 511 of the first region 510, wherein the position of the measuring base 120 is represented by the grating value of the first grating ruler. Additionally, Figure 3 The image also shows an example of the measurement value of the probe 130 displayed in box 512 of the first region 510, wherein the measurement value of the probe 130 is represented by the grating value of the second grating ruler.

[0056] In some examples, the first area 510 may also include a sampling button 513, which may be configured to record the position of the measuring seat 120 in response to a user's click.

[0057] In some examples, reference Figure 3 The user interface 500 may also include a second area 520, which may be configured to set information about the test device (e.g., selecting the standard of the test device and entering parameters such as the specifications of the test device).

[0058] Figure 4 This is an exemplary plan view showing the step gauge 200 involved in the example of this disclosure.

[0059] In some examples, reference Figure 1 and Figure 4 The step gauge 200 may include multiple gauge blocks 210 arranged in a straight line. There may be gaps between adjacent gauge blocks 210.

[0060] Additionally, the surface 211 to be measured of gauge block 210 can be located between the two ends of step gauge 200 (see...). Figure 4 The first and second test surfaces 211a and 211b in the step gauge 200 can also be located at the end of the step gauge 200 (see [reference]). Figure 4The third test surface 211c in the plurality of gauge blocks 210. Therefore, the adjacent region of the test surface 211 may include at least one of the gap between adjacent gauge blocks 210 and the region near the end of the step gauge 200. For ease of description, the test surface 211 of adjacent gauge blocks near the gap is referred to as the gap surface. In addition, refer to Figure 4 The gap surface may include a first test surface 211a and a second test surface 211b, which are opposite each other.

[0061] Additionally, the step gauge 200 can be positioned in a location that does not obstruct the movement of the measuring base 120. For example, the step gauge 200 may not be mounted on the worktable of the guide rail 110.

[0062] In some examples, the step gauge 200 can be placed on one side of the guide rail 110. In this case, when measuring the step gauge 200, on the one hand, the length of the step gauge 200 can avoid limiting the movement range of the measuring seat 120, thereby increasing the measurement range of the length of the step gauge 200 (i.e., it can measure longer step gauges 200). On the other hand, it can avoid the measuring seat 120 from colliding with the step gauge 200 and causing damage to the measuring seat 120 or the step gauge 200. Furthermore, it can reduce the positional requirements of the probe 130 (for example, if the step gauge 200 is set on the worktable on the guide rail 110, the length of the step gauge 200 limits the movement range of the measuring seat 120, and it is also necessary to consider whether the movement range of the probe 130 in the guide rail direction is sufficient to cover the area to be measured by the step gauge 200). In addition, it can reduce the modification of the original structure of the length measuring machine 100.

[0063] In some examples, the step gauge 200 can be placed on one side of the guide rail 110 via the support platform 300. Specifically, refer to... Figure 1 The support platform 300 can be placed on one side of the guide rail 110, and the step gauge 200 can be placed on the support platform 300. In this case, the step gauge 200 can be fixed during measurement to reduce interference caused by the shaking of the step gauge 200.

[0064] In some examples, the step gauge 200 may also be positioned above the guide rail 110 in a location that allows the measuring seat 120 to pass through. For example, the probe 130 may be parallel to the third axis F3 and pass under the step gauge 200 as the measuring seat 120 moves, thereby measuring the individual surfaces 211 to be measured.

[0065] As described above, the support platform 300 can be configured to support the step gauge 200. In some examples, the support platform 300 can rotate or tilt at least about the second axis F2 and the third axis F3. This allows for adjustment of the attitude of the step gauge 200.

[0066] Figure 5is an exemplary assembly schematic diagram showing the clamp 400 and the probe head 130 involved in the present disclosure example.

[0067] In addition, in order to increase the moving direction of the probe head 130, the inventors also designed a clamp 400 for controlling the probe head 130 to move in a non-rail direction (i.e. a direction other than the first axis F1). In some examples, the clamp 400 can be configured to control the probe head 130 to move in a direction perpendicular to the first axis F1. In this case, in combination with the measurement seat 120 and the clamp 400, the probe head 130 can be moved in multiple directions perpendicular to each other, thereby facilitating the movement of the probe head 130 to the target position (e.g. the adjacent area of the surface to be measured 211). In some examples, the clamp 400 can be configured to control the probe head 130 to move in the direction of the second axis F2 and the direction of the third axis F3.

[0068] In some examples, referring to Figure 5 , the clamp 400 can include a pressing plate 410, a vertical sliding block 420, and a horizontal push rod 430. The pressing plate 410 can be mounted to the measurement seat 120, the vertical sliding block 420 can be arranged on the side wall of the pressing plate 410 in a movable manner along the vertical direction, and the horizontal push rod 430 can be arranged on the vertical sliding block 420 in a movable manner along the horizontal direction and connected with the probe head 130. In this way, the movement of the probe head 130 in the direction of the second axis F2 and the direction of the third axis F3 can be controlled. In addition, by means of the horizontal push rod 430, the movement of the probe head 130 in the direction of the second axis F2 can be controlled by pushing or pulling the horizontal push rod 430. In some examples, the pressing plate 410 can be mounted to the measurement seat 120 by means of screws.

[0069] In some examples, referring to Figure 5 , the clamp 400 can further include a vertical push rod 440, which can be arranged on the pressing plate 410 and configured to control the movement of the vertical sliding block 420 in the direction of the third axis F3. In this way, by means of the vertical push rod 440, the movement of the probe head 130 in the direction of the third axis F3 can be controlled by pushing or pulling the vertical push rod 440.

[0070] The present disclosure example relates to a step gauge measurement method based on the length measuring machine 100 (which can also be referred to as a step gauge calibration method, or a step gauge calibration method, etc.), which uses the length measuring machine 100 to measure the step gauge 200 when the step gauge 200 is arranged on one side of the rail 110. In some examples, the probe head 130 can be parallel to the second axis F2. The step gauge measurement method based on the length measuring machine 100 involved in the present disclosure example will be referred to as the measurement method hereinafter. It should be noted that the above descriptions related to the length measuring machine 100, the step gauge 200, the carrier table 300 and the clamp 400 are also applicable to the measurement method unless there is a contradiction.

[0071] Figure 6is an exemplary flowchart illustrating a measurement method related to examples of the present disclosure.

[0072] In some examples, with reference to Figure 6 , the measurement method can include parallelizing the step gauge 200 with the guide rail 110 of the length measuring machine 100 (step S101), controlling the measuring seat 120 of the length measuring machine 100 to move along the guide rail 110 and controlling the measuring head 130 of the length measuring machine 100 to move in a direction perpendicular to the first axis F1 to make the measuring head 130 contact the surface to be measured 211 (step S102), in response to the measuring head force represented by the measurement value of the measuring head 130 reaching a preset range (i.e., the acting force between the measuring head 130 and the surface to be measured 211 reaching a certain degree), recording the position of the measuring seat 120 as the position of the surface to be measured 211 (step S103). In this case, using the length measuring machine 100 to measure the step gauge 200 to obtain the position of the surface to be measured 211 (i.e., measuring the position of the surface to be measured 211) can reduce the equipment cost of measuring the step gauge 200. In addition, using the position of the measuring seat 120 specific to the length measuring machine 100 to determine the position of the surface to be measured 211, and combining the measurement value of the measuring head 130 specific to the length measuring machine 100 as a basis to record the position of the measuring seat 120 when the force of each surface to be measured 211 remains substantially the same, can ensure the consistency of the measurement conditions, thereby improving the accuracy of measuring the step gauge 200.

[0073] In some examples, with reference to Figure 6 In step S101, the step gauge 200 can be disposed on one side of the guide rail 110 through the carrier table 300, and the carrier table 300 is adjusted to parallelize the step gauge 200 with the guide rail 110. In addition, the parallelization of the step gauge 200 with the guide rail 110 can be that the axis of the step gauge 200 is parallel to the axis of the guide rail 110.

[0074] Figure 7 is an exemplary flowchart illustrating the parallelization of the step gauge 200 with the guide rail 110 related to examples of the present disclosure.

[0075] In some examples, the parallelization of the step gauge 200 with the guide rail 110 can be determined by adjusting the carrier table 300 and combining the measurement value of the measuring head 130. For this purpose, examples of the present disclosure also provide an exemplary process for adjusting the carrier table 300 to parallelize the step gauge 200 with the guide rail 110, which adjusts the carrier table 300 to rotate around one of the second axis F2 and the third axis F3 while controlling the measuring head 130 to move in the direction of the other axis, and confirms whether the reference surface is parallel to the axis by combining the change amount of the measurement value of the measuring head 130. With reference to Figure 7 , the exemplary process includes:

[0076] Step S201: controlling the measuring seat 120 to move along the guide rail 110 to make the measuring head 130 contact the reference surface.

[0077] In addition, the reference surface can be a surface of one of the plurality of gauge blocks 210. That is, the reference surface can be a surface of any one of the plurality of gauge blocks 210. In some examples, the reference surface can be a surface of a gauge block 210 at an end of the step gauge 200, such as two surfaces at two ends of the step gauge 200. In this way, the reference surface can be located as quickly as possible. In some examples, the number of reference surfaces can be multiple.

[0078] Step S202: control the probe 130 to reciprocate in the direction of the second axis F2.

[0079] In some examples, the probe 130 can be controlled to move in the direction of the second axis F2 by the horizontal push rod 430. In some examples, the measurement of the probe 130 can be recorded or observed during movement.

[0080] Step S203: determine whether the change in the measurement of the probe 130 during the current reciprocation is greater than a preset value.

[0081] If the change is greater than the preset value, step S204 is performed. That is, if there is a certain change in the measurement of the probe 130 during movement of the probe 130, step S204 is performed. If the change is not greater than the preset value, step S205 is performed.

[0082] Step S204: adjust the rotation of the carrier table 300 about the third axis F3. In some examples, after step S204 is performed, step S202 can continue to be performed.

[0083] That is, steps S202 and S204 are repeatedly performed until the change in the measurement of the probe 130 during the current reciprocation is not greater than the preset value. In this way, the reference surface can be parallel to the second axis F2. That is, the probe 130 can continue to be in contact with the reference surface when moving in the direction of the second axis F2, and if the reference surface is not parallel to the second axis F2, the measurement will change, and if the reference surface is parallel to the second axis F2, the measurement can not change or change very little.

[0084] In addition, the present disclosure does not specifically limit the value of the preset value, which can be any value that can measure whether the reference surface is considered parallel to an axis (such as the second axis F2 or the third axis F3). In some examples, a suitable preset value can be selected based on the requirements of calibration.

[0085] Step S205: control the probe 130 to reciprocate in the direction of the third axis F3.

[0086] In some examples, the movement of the probe 130 in the direction of the third axis F3 can be controlled by the vertical push rod 440. In some examples, the measurement values of the probe 130 can be recorded or observed during the movement.

[0087] Step S206: Determine whether the change in the measurement values of the probe 130 during the current reciprocating movement is greater than a preset value.

[0088] If the change is greater than the preset value, step S207 is performed. That is, if there is a certain change in the measurement values of the probe 130 during the movement of the probe 130, step S207 is performed. If the change is not greater than the preset value, the execution ends.

[0089] Step S207: Adjust the rotation of the bearing table 300 around the second axis F2.

[0090] In some examples, after step S207 is performed, step S205 can be continuously performed.

[0091] That is, steps S205 and S207 are repeatedly performed until the change in the measurement values of the probe 130 during the current reciprocating movement is not greater than the preset value. Thus, the reference surface can be parallel to the third axis F3. The basic principle is similar to steps S202 and S204, which will not be repeated here.

[0092] In some examples, with reference to Figure 6 In step S102, the probe 130 is brought into contact with the surface to be measured 211 by combining the movement of the measuring seat 120 of the length measuring machine 100 along the guide rail 110 and the movement of the probe 130 of the length measuring machine 100 in a direction perpendicular to the first axis F1.

[0093] In some examples, the direction perpendicular to the first axis F1 can include at least one of the direction of the second axis F2 and the direction of the third axis F3. That is, the probe 130 can be brought into contact with the surface to be measured 211 by controlling the movement of the measuring seat 120 of the length measuring machine 100 along the guide rail 110 and the movement of the probe 130 in any one direction perpendicular to the direction of the guide rail.

[0094] In some examples, the probe 130 can be moved to an adjacent area of the surface 211 to be measured first, and then brought into contact with the surface 211 to be measured by controlling the movement of the probe 130 in a direction perpendicular to the first axis F1 and controlling the movement of the measurement seat 120 along the guide rail 110. That is, the probe 130 can be moved to the vicinity of the surface 211 to be measured first, and then brought into contact with the surface 211 to be measured. In this case, the movement speed of different steps can be controlled through a step-by-step operation, and the measurement efficiency and the safety of the probe 130 or the surface 211 to be measured can be taken into account (for example, the risk of damage to the probe 130 or the surface 211 to be measured can be reduced). In some examples, before the probe 130 is moved to the adjacent area of the surface 211 to be measured, the measurement seat 120 can be controlled to move along the guide rail 110 to align the probe 130 with the adjacent area of the surface 211 to be measured. That is, when the position of a certain surface 211 to be measured is to be measured, the probe 130 can be aligned with the adjacent area of the surface 211 to be measured first, moved to the adjacent area of the surface 211 to be measured, and then brought into contact with the surface 211 to be measured. In this way, the measurement efficiency and the safety of the probe 130 or the surface 211 to be measured can be further taken into account.

[0095] As described above, the measurement seat 120 can include the driving wheel 121. In some examples, the measurement seat 120 can be controlled to move along the guide rail 110 by the driving wheel 121 to make the probe 130 in one of the following states: aligned with the adjacent area of the surface 211 to be measured and in contact with or away from the surface 211 to be measured. In some examples, the measurement seat 120 can be controlled to move along the guide rail 110 by the driving wheel 121 to make the probe 130: aligned with the adjacent area of the surface 211 to be measured first, and then brought into contact with the surface 211 to be measured after the probe 130 is moved to the adjacent area of the surface 211 to be measured. Away from the surface 211 to be measured after the measurement of the surface 211 to be measured is completed.

[0096] The process of the probe 130 contacting the surface 211 to be measured is described below taking the adjacent area of the surface 211 to be measured as the gap between adjacent pieces as an example. Figure 8 is a schematic diagram showing the change in position of the probe 130 when measuring the gap surface of the adjacent pieces involved in the examples of the present disclosure. Figure 9 is an exemplary flowchart showing the probe 130 contacting the gap surface of the adjacent pieces involved in the examples of the present disclosure.

[0097] For adjacent pieces in the plurality of pieces 210, the adjacent area of the surface 211 to be measured can be the gap between the adjacent pieces. That is, in some examples, the probe 130 can be moved to the gap between the adjacent pieces first, and then brought into contact with the gap surface by controlling the movement of the probe 130 in a direction perpendicular to the first axis F1 and controlling the movement of the measurement seat 120 along the guide rail 110. Specifically, the probe 130 can be controlled to move in a direction perpendicular to the first axis F1 to enter the gap (seeFigure 8 of block D102), the measurement seat 120 is controlled to move along the guide rail 110 to make the probe 130 located in the gap contact the gap surface of the adjacent gauge block (see Figure 8 of block D103 and block D104). In some examples, before the probe 130 moves to the gap between the adjacent gauge blocks, the measurement seat 120 can be controlled to move along the guide rail 110 to make the probe 130 align with the gap between the adjacent gauge blocks (see Figure 8 of block D101).

[0098] As described above, the direction perpendicular to the first axis F1 can include at least one of the direction of the second axis F2 and the direction of the third axis F3. For this purpose, examples of the present disclosure also provide an exemplary flow of controlling the probe 130 to move in the direction of the second axis F2 and controlling the measurement seat 120 to move along the guide rail 110 to make the probe 130 contact the gap surface, in which the probe 130 enters the gap between the adjacent gauge blocks from the side of the step gauge 200. Referring to Figure 9 , the exemplary flow can include:

[0099] Step S301: controlling the measurement seat 120 to move along the guide rail 110 to make the probe 130 align with the gap between the adjacent gauge blocks (see Figure 8 of block D101).

[0100] Step S302: controlling the probe 130 to move in the direction of the second axis F2 to make the probe 130 aligned with the gap enter the gap (see Figure 8 of block D102).

[0101] Step S303: controlling the measurement seat 120 to move along the guide rail 110 to make the probe 130 located in the gap contact the gap surface of the adjacent gauge block (see Figure 8 of block D103 and block D104).

[0102] In addition, by controlling the probe 130 to move in the direction of the third axis F3 and controlling the measurement seat 120 to move along the guide rail 110 to make the probe 130 contact the surface to be measured 211, the exemplary flow is similar, and the same parts will not be repeated. For example, the probe 130 can enter the gap between the adjacent gauge blocks from above the step gauge 200. Specifically, the probe 130 can be located above the step gauge 200, the measurement seat 120 is controlled to move along the guide rail 110 to make the probe 130 align with the gap, and the probe 130 is controlled to move in the direction of the third axis F3 to make the probe 130 aligned with the gap enter the gap.

[0103] In some examples, in the measurement of the gap surface, after the probe 130 moves to the gap between adjacent blocks, the first to-be-measured surface 211a can be first contacted to measure the position of the first to-be-measured surface 211a, and then the second to-be-measured surface 211b is contacted to measure the position of the second to-be-measured surface 211b, and then the position of the next gap surface is measured. That is, the first to-be-measured surface 211a is first contacted to obtain the position of the first to-be-measured surface 211a, and then the second to-be-measured surface 211b is contacted to obtain the position of the second to-be-measured surface 211b. Thus, it is helpful to reduce the travel time of the probe 130 to improve the measurement efficiency. For details of how to obtain the position of a single to-be-measured surface 211 after contacting, see step S103.

[0104] As described above, the probe 130 can be brought into contact with the to-be-measured surface 211. In some examples, when the measurement value of the probe 130 starts to change relative to a fixed value (for example, when the second grating scale of the probe 130 appears a reading), it can be considered that the probe 130 is in contact with the to-be-measured surface 211. Thus, it is convenient to improve the consistency of controlling the probe 130 to be in contact with the to-be-measured surface 211.

[0105] As described above, the measurement seat 120 can include the fine adjustment wheel 122. In some examples, with reference to Figure 6 In step S103, after the probe 130 is in contact with the to-be-measured surface 211, the fine adjustment wheel 122 can be used to control the measurement seat 120 to move along the guide rail 110 to make the force on the probe represented by the measurement value reach a preset range. In this case, fine adjustment of the position of the measurement seat 120 by the fine adjustment wheel 122 of the length measuring machine 100 can keep the force on each to-be-measured surface 211 substantially the same, thereby reducing measurement errors.

[0106] In addition, the present disclosure does not specifically limit the value of the preset range, and a suitable preset range can be selected based on the requirements of calibration. In some examples, a suitable range representing the preset range to which the force on the probe is to be reached can be selected from 0.0001 mm (millimeter) to 0.5 mm based on the requirements of calibration. For example, when the measurement value is 0.3±0.001 mm, the force between the probe 130 and the to-be-measured surface 211 can be considered to reach a certain degree.

[0107] In some examples, the position of the measurement seat 120 can be recorded by clicking the sampling button 513 of the user interface 500.

[0108] In some examples, the positions of multiple test surfaces 211 of the step gauge 200 can be obtained by traversing the step gauge 200. In some examples, after completing the measurement of the current test surface 211, the probe 130 can be moved away from the current test surface 211 by controlling the probe 130 to move in a direction perpendicular to the first axis F1 and controlling the measuring seat 120 to move along the guide rail 110, and the measurement of the next test surface 211 can continue until the surface of each of the multiple gauge blocks 210 of the step gauge 200 is measured. In some examples, the multiple test surfaces 211 of the step gauge 200 can be traversed in order from one end of the step gauge 200 to the other end.

[0109] Taking the gap surface between adjacent gauge blocks as an example. In some examples, for adjacent gauge blocks, after measuring at least one of the measured surfaces 211 of the gap surface of the current adjacent gauge block, the probe 130 can be moved out of the gap between the current adjacent gauge blocks by controlling the probe 130 to move in a direction perpendicular to the first axis F1 (e.g., the direction of the second axis F2 or the direction of the third axis F3) and controlling the measuring seat 120 to move along the guide rail 110 (see...). Figure 8 (See box D105), and continue measuring the position of the next surface to be measured 211 (e.g., the gap surface of the next adjacent gauge block (see box D105)). Figure 8 The measurement is performed on the surface of each gauge block 210 in the multiple gauge blocks 210 of the step gauge 200, from the frame D106 or the end surface 211 to the completed measurement.

[0110] Figure 10 This is an exemplary flowchart illustrating one implementation of the measurement method according to the examples of this disclosure. The examples of this disclosure also provide an embodiment of the measurement method, with reference to... Figure 8 and Figure 10 This embodiment includes:

[0111] Step S401: Make the guide rail 110 and the step gauge 200 parallel.

[0112] Step S402: Rotate the drive wheel 121 to move the measuring seat 120, thereby aligning the probe 130 with the gap between adjacent gauge blocks.

[0113] Step S403: Control the probe 130 to move on the second axis F2 to enter the gap between adjacent gauge blocks. As described above, in some examples, the probe 130 can be controlled to move on the second axis F2 by the clamp 400.

[0114] Step S404: Rotate the drive wheel 121 to move the measuring seat 120, so that the probe 130 contacts one of the test surfaces 211 of the gap surface.

[0115] Step S405: Lock the drive wheel 121 by locking handle 123.

[0116] Step S406: Rotating the fine adjustment wheel 122 to make the force between the probe 130 and the surface 211 to be measured reach a preset range. The force can be determined according to the measurement value of the probe 130. In some examples, for the measurement value represented by the grating value of the second grating ruler, when the surfaces 211 to be measured are opposite (e.g., the first surface 211a and the second surface 211b), the grating values can be opposite, and the preset range represented by the preset grating value range is also opposite.

[0117] Step S407: Recording the position of the measurement seat 120. As described above, in some examples, the position of the measurement seat 120 can be the grating value of the first grating ruler of the guide rail 110.

[0118] Step S408: Loosening the driving wheel 121 by the locking handle 123.

[0119] Step S409: Rotating the driving wheel 121 to move the measurement seat 120, so that the probe 130 is in contact with another surface 211 to be measured of the gap surface to measure the position of the other surface 211 to be measured. That is, steps S405 to S408 are repeatedly performed to obtain the position of the measurement seat 120 corresponding to another surface 211 to be measured of the gap surface.

[0120] The embodiment also includes moving the probe 130 out of the gap between adjacent gauge blocks and repeatedly performing steps S402 to S409 until the measurement of the gap surface of each adjacent gauge block of the gauge block gauge 200 is completed. In addition, for the measurement of the surfaces 211 to be measured at the ends of the gauge block gauge 200, the probe 130 can be aligned with the adjacent area of the surface 211 to be measured and then measured similarly to the gap surface, which is not described here.

[0121] In addition, examples of the present disclosure also relate to a gauge block measurement system (also referred to as a gauge block calibration system, or a gauge block calibration system, etc.) based on the length measuring machine 100. It should be noted that unless there is a contradiction, the above description of the measurement method is also applicable to the gauge block measurement system.

[0122] In some examples, the gauge block measurement system can include the length measuring machine 100 and the carrying table 300. The length measuring machine 100 can include the guide rail 110, the measurement seat 120, and the probe 130. The measurement seat 120 can be arranged on the guide rail 110 and can be moved along the guide rail 110. The probe 130 can be arranged on the measurement seat 120. In addition, the gauge block 200 can be arranged on one side of the guide rail 110 of the length measuring machine 100 by the carrying table 300.

[0123] In some examples, when measuring the surface 211 to be measured of the step gauge 200, the measurement seat 120 can be moved along the guide rail 110 and the probe 130 can be moved in a direction perpendicular to the first axis F1 to make the probe 130 contact the surface 211 to be measured, and in response to the probe force represented by the measurement value of the probe 130 reaching a preset range, the position of the measurement seat 120 is recorded as the position of the surface 211 to be measured.

[0124] In some examples, the step gauge measurement system can further include a clamp 400. The probe 130 can be arranged on the measurement seat 120 through the clamp 400.

[0125] Although the present disclosure is specifically described above in combination with the drawings and examples, it should be understood that the above description does not limit the present disclosure in any form. Those skilled in the art can modify and change the present disclosure as needed without departing from the essential spirit and scope of the present disclosure, and such modifications and changes fall within the scope of the present disclosure.

Claims

1. A step gauge measurement method based on a length measuring machine, wherein the length measuring machine includes a guide rail, a measuring seat disposed on the guide rail and movable along the guide rail, and a measuring head disposed on the measuring seat, and the step gauge includes a plurality of gauge blocks arranged in a straight line, characterized in that, The step gauge is mounted on one side of the guide rail via a support platform. The direction of the guide rail is taken as the first axis, the direction in the same horizontal plane as the first axis and perpendicular to it is taken as the second axis, and the direction perpendicular to both the first and second axes is taken as the third axis. The support platform can rotate or tilt at least around the second and third axes. The step gauge measurement method includes: aligning the step gauge parallel to the guide rail; controlling the movement of the probe in a direction perpendicular to the first axis and controlling the movement of the measuring seat along the guide rail to bring the probe into contact with the surface to be measured. The surface to be measured is the surface of one of the multiple gauge blocks. For adjacent gauge blocks, the surface of the adjacent gauge block closest to the gap between them is called the gap surface. The probe first moves to the gap between the adjacent gauge blocks, and then... The gap surface contacts; and in response to the force on the probe, as indicated by the measured value of the probe, reaching a preset range, the position of the measuring seat is recorded and used as the position of the surface to be measured, wherein making the step gauge parallel to the guide rail includes: controlling the measuring seat to move along the guide rail so that the probe contacts a reference surface, the reference surface being one surface of one of the plurality of gauge blocks; repeatedly executing the control of the probe to reciprocate in the direction of the second axis, and in response to the change in the measured value of the probe during the current reciprocating movement being greater than a preset value, adjusting the bearing platform to rotate around the third axis until the change is not greater than the preset value; and repeatedly executing the control of the probe to reciprocate in the direction of the third axis, and in response to the change in the measured value of the probe during the current reciprocating movement being greater than the preset value, adjusting the bearing platform to rotate around the second axis until the change is not greater than the preset value.

2. The step gauge measurement method according to claim 1, characterized in that, The probe is parallel to the second axis.

3. The step gauge measurement method according to claim 1, characterized in that, The measuring base is controlled to move along the guide rail to align the probe with the gap; the probe is controlled to move in a direction perpendicular to the first axis to enter the gap; and the measuring base is controlled to move along the guide rail to contact the probe located in the gap with the gap surface.

4. The step gauge measurement method according to claim 1, characterized in that, The gap surface includes a first test surface and a second test surface opposite to each other. After the probe moves to the gap, it first contacts the first test surface to measure the position of the first test surface, then contacts the second test surface to measure the position of the second test surface, and then measures the position of the next gap surface.

5. The step gauge measurement method according to any one of claims 1 to 4, characterized in that, The probe is mounted on the measuring base by a clamp; the clamp is configured to control the movement of the probe in a direction perpendicular to the first axis.

6. The step gauge measurement method according to claim 5, characterized in that, The fixture includes a pressure plate, a vertical slider, and a horizontal push rod; the pressure plate is mounted on the measuring base; the vertical slider is disposed on the side wall of the pressure plate in a manner that allows it to move in the vertical direction; the horizontal push rod is disposed on the vertical slider in a manner that allows it to move in the horizontal direction and is connected to the probe.

7. The step gauge measurement method according to claim 1, characterized in that, The measuring seat includes a drive wheel for controlling the movement of the measuring seat along the guide rail, and a fine-tuning wheel for controlling the slight movement of the measuring seat along the guide rail; The measuring base is moved along the guide rail by the drive wheel so that the probe is in one of the following states: aligned with the adjacent area of ​​the surface to be measured, in contact with the surface to be measured, and away from the surface to be measured; After the probe contacts the surface to be measured, the measuring seat is moved slightly along the guide rail by the fine-tuning wheel so that the force on the probe represented by the measured value reaches the preset range.

8. A step gauge measurement system based on a length measuring machine, comprising a length measuring machine and a support platform, wherein the length measuring machine includes a guide rail, a measuring seat disposed on the guide rail and movable along the guide rail, and a measuring head disposed on the measuring seat; the step gauge includes a plurality of gauge blocks arranged in a straight line, characterized in that, The step gauge is mounted on one side of the guide rail via the support platform. The guide rail's direction is defined as the first axis, a direction in the same horizontal plane as the first axis and perpendicular to it is defined as the second axis, and a direction perpendicular to both the first and second axes is defined as the third axis. The support platform can rotate or tilt at least around the second and third axes. When measuring the surface to be measured by the step gauge, the step gauge is parallel to the guide rail. The probe moves in a direction perpendicular to the first axis, and the measuring seat moves along the guide rail to bring the probe into contact with the surface to be measured. For adjacent gauge blocks among the plurality of gauge blocks, the surface to be measured near the gap between the adjacent gauge blocks is called the gap surface. The probe first moves to the gap between the adjacent gauge blocks and then contacts the gap surface. The measurement value represented by the probe... When the probe is subjected to force within a preset range, the position of the measuring seat is recorded and used as the position of the surface to be measured, wherein the surface to be measured is the surface of the gauge block among the plurality of gauge blocks. Making the step gauge parallel to the guide rail includes: controlling the measuring seat to move along the guide rail so that the probe contacts a reference surface, the reference surface being one surface of the gauge block among the plurality of gauge blocks; repeatedly controlling the probe to reciprocate in the direction of the second axis, and in response to the change in the measured value of the probe during the current reciprocating movement being greater than a preset value, adjusting the support platform to rotate around the third axis until the change is no greater than the preset value; and repeatedly controlling the probe to reciprocate in the direction of the third axis, and in response to the change in the measured value of the probe during the current reciprocating movement being greater than the preset value, adjusting the support platform to rotate around the second axis until the change is no greater than the preset value.

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