Device, system and method for evaluating application adaptability of voltage reference source circuit

Abstract

The invention discloses a voltage reference source circuit application adaptability evaluation device, system and method wherein the voltage reference source circuit application adaptability evaluation device comprises a mother board and at least one daughter board; the daughter board comprises at least one connection interface module, and the connection interface module is used for realizing electrical connection between the daughter board and the mother board; the mother board comprises a control module, a test interface module and an acquisition module; the control module is connected with the acquisition module and is used for controlling the acquisition module to acquire the electric signal sent by the daughter board; and the test interface module is used for connecting peripheral test equipment and the daughter board. The voltage reference source circuit application adaptability evaluation device is composed of the mother board and at least one daughter board, the mother board and the daughter board work cooperatively through electrical connection, the mother board has the functions of multiplexing control, signal input and acquisition, and the daughter board only needs to adapt to devices with different packaging specifications. According to the invention, the compatibility of application adaptability evaluation of different voltage reference source circuits is improved through the daughter board and mother board structure.

Description

Technical Field

[0001] The present invention relates to the technical field of power supply adaptability evaluation of aerospace equipment, and in particular to a device, system and method for evaluating the application adaptability of a voltage reference source circuit. Background Art

[0002] Voltage reference circuits, as a common component in aerospace equipment, are subject to multiple environmental stresses in their actual applications, including electrical, mechanical, and thermal stresses. To mitigate the reliability risks associated with the use of less mature components in aerospace equipment, targeted application verification is required to fully evaluate their reliability.

[0003] Aerospace models utilize a wide variety of voltage reference circuits, encompassing both series and parallel types in terms of functional structure, and both direct-plug and surface-mount packaging in terms of packaging. Existing voltage reference circuit adaptability evaluation methods only validate a single voltage reference product model for a specific application scenario. To fully address the needs of aerospace models, specific boards must be developed for each voltage reference and validated for its specific application scenario, which is costly and time-consuming. Summary of the Invention

[0004] The present invention provides a device, system and method for evaluating the application adaptability of a voltage reference source circuit, so as to solve the problem of low applicability of the current device for evaluating the application adaptability of a voltage reference source circuit.

[0005] According to a first aspect of the present invention, a device for evaluating the adaptability of a voltage reference source circuit is provided. The device for evaluating the adaptability of a voltage reference source circuit is provided, and includes:

[0006] a motherboard and at least one daughterboard;

[0007] The daughter board includes at least one connection interface module, and the connection interface module is used to connect to the voltage reference source circuit;

[0008] The daughter board and the mother board are also electrically connected via the connection interface module;

[0009] The motherboard includes: a control module, a test interface module and an acquisition module;

[0010] The control module is connected to the acquisition module, and the control module is used to control the acquisition module to acquire the electrical signal sent by the daughter board; the test interface module is used to connect peripheral test equipment and the daughter board.

[0011] Optionally, at least two daughter boards are included, and the interface types of the connection interface modules of at least two daughter boards are different.

[0012] Optionally, the motherboard and the daughterboard are detachably and replaceably connected, wherein the detachably and replaceable daughterboard corresponds to voltage reference source circuits of different models and specifications.

[0013] Optionally, the daughter board further includes: a fixed load module;

[0014] The fixed load module includes at least one load with different parameters; the fixed load module is connected to the connection interface module.

[0015] Optionally, the motherboard further includes: a matrix switch switching module, the matrix switch switching module being connected to the fixed load module;

[0016] The matrix switch switching module is used to control the load parameters provided by the fixed load module to the voltage reference source circuit.

[0017] Optionally, the motherboard further includes: a communication module;

[0018] The communication module is connected to the control module and is used to communicate with the host computer to send the electrical signal under the control of the control module.

[0019] According to a second aspect of the present invention, a voltage reference source circuit application adaptability evaluation system is provided, the voltage reference source circuit application adaptability evaluation system comprising: peripheral test equipment, a host computer, and a voltage reference source circuit application adaptability evaluation device according to any embodiment of the present invention;

[0020] The interface of the peripheral test equipment is connected to the test interface module of the motherboard of the voltage reference source circuit application adaptability evaluation device, and the peripheral test equipment is used to provide a test electrical signal to the voltage reference source circuit application adaptability evaluation device;

[0021] The host computer is connected to the control module of the motherboard of the voltage reference source circuit application adaptability evaluation device; the host computer is used to receive the electrical signal sent by the voltage reference source circuit application adaptability evaluation device;

[0022] The host computer is also connected to the control terminal of the peripheral test equipment; the host computer is also used to control the peripheral test equipment to output a test electrical signal.

[0023] According to a third aspect of the present invention, a method for evaluating the application adaptability of a voltage reference source circuit is provided, the method comprising: electrically connecting the voltage reference source circuit to a daughter board, electrically connecting a motherboard and the daughter board, and electrically connecting a peripheral test device to a test interface module of the motherboard;

[0024] The peripheral test equipment outputs a test electrical signal to the motherboard, and the test electrical signal is input to the voltage reference source circuit through the test interface module of the motherboard and the connection interface module of the daughterboard; the daughterboard collects the electrical signal of the voltage reference source circuit under the test electrical signal and sends it to the motherboard.

[0025] Optionally, the peripheral test equipment includes a DC power supply and an electronic load;

[0026] The test electrical signal includes at least one of a reference voltage output function application adaptability evaluation signal, a transient interference stability application adaptability evaluation signal, a power supply bias application adaptability evaluation signal, and a load bias application adaptability evaluation signal;

[0027] The peripheral test device outputting the reference voltage output function application adaptability evaluation signal to the motherboard includes: the DC power supply providing the first input signal of the voltage reference source circuit to the motherboard, and the electronic load providing the first load condition of the voltage reference source circuit to the motherboard;

[0028] Wherein, the first input signal is the rated input signal of the voltage reference source circuit, and the first load condition is the full-load output condition of the voltage reference source circuit;

[0029] The peripheral testing device outputting the transient interference stability application adaptability evaluation signal to the motherboard includes:

[0030] When the DC power supply provides the first input signal of the voltage reference source circuit to the motherboard and the electronic load provides the first load condition of the voltage reference source circuit to the motherboard, the DC power supply provides the first step signal of the voltage reference source circuit to the motherboard; wherein the first step signal is a rated reverse current of the voltage reference source circuit or an input voltage range of the voltage reference source circuit that changes from a low end to a high end and then changes from a high end to a low end;

[0031] Alternatively, when the DC power supply provides the first input signal of the voltage reference source circuit to the motherboard and the electronic load provides the first load condition of the voltage reference source circuit to the motherboard, the electronic load provides the motherboard with a second step signal of the voltage reference source circuit; the second step signal is a load current of the voltage reference source circuit that changes from a low end to a high end and then changes from a high end to a low end.

[0032] The peripheral test device outputting the power bias application adaptability evaluation signal to the motherboard includes: the DC power supply providing at least one second input signal of the voltage reference source circuit to the motherboard;

[0033] The second input signal covers a range of a rated reverse current of the voltage reference source circuit or an input voltage of the voltage reference source circuit;

[0034] The peripheral test device outputting the load bias application adaptability evaluation signal to the motherboard includes: the electronic load providing a second load condition of at least one voltage reference source circuit to the motherboard;

[0035] The second load condition covers a rated reverse current or load current range of the voltage reference source.

[0036] Optionally, the peripheral test equipment includes a DC power supply and an electronic load;

[0037] The peripheral test device outputs a test electrical signal to the motherboard, further comprising: a DC power supply providing a first input signal of the voltage reference source circuit to the motherboard, an electronic load providing a first load condition of the voltage reference source circuit to the motherboard, and the voltage reference source circuit is in a first temperature test condition or a second temperature test condition;

[0038] The level of the first input signal is the rated input voltage of the voltage reference source circuit, and the first load condition is the full-load output condition of the voltage reference source circuit;

[0039] The first temperature test condition includes: the voltage reference source circuit performs a preset number of temperature transition cycles between a first temperature condition and a second temperature condition, wherein the first temperature condition and the second temperature condition are respectively a high temperature condition and a low temperature condition;

[0040] The second temperature test condition includes: the voltage reference source circuit operates under a third temperature condition for a preset time period; wherein the third temperature condition is greater than the second temperature condition.

[0041] The voltage reference circuit application adaptability evaluation device, system, and method of the embodiments of the present invention include a motherboard integrated with multiple functional modules, including a control module, a test interface module, and an acquisition module. The control module is responsible for controlling the entire test process, including the operating status of the acquisition module and the generation of test signals. The acquisition module is used to collect electrical signals sent by the daughterboard connection interface module; these signals can reflect the operating status and performance of the voltage reference circuit. The test interface module is used to connect peripheral test equipment and the daughterboard to enable test signal transmission and data exchange. The daughterboard is responsible for connecting to the voltage reference circuit to be tested to accommodate voltage reference circuits of different models and specifications. The voltage reference circuit application adaptability evaluation device of the embodiments of the present invention consists of a motherboard and at least one daughterboard. The motherboard multiplexes control, signal input, and acquisition functions, while the daughterboard only needs to adapt to devices of different packaging specifications. This motherboard-daughterboard structure enables rapid and accurate application adaptability evaluation of different voltage reference circuits. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0043] Figure 1 This is a schematic structural diagram of a device for evaluating the application adaptability of a voltage reference source circuit provided by an embodiment of the present invention;

[0044] Figure 2 1 is a schematic structural diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention;

[0045] Figure 3 1 is a schematic structural diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention;

[0046] Figure 4 1 is a schematic structural diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention;

[0047] Figure 5 1 is a schematic structural diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention;

[0048] Figure 6 This is a schematic structural diagram of a voltage reference source circuit application adaptability evaluation system provided by an embodiment of the present invention;

[0049] Figure 7A flow chart of a method for evaluating the application adaptability of a voltage reference source circuit provided by an embodiment of the present invention;

[0050] Figure 8 A flowchart of another method for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention;

[0051] Figure 9 A flowchart of another method for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention;

[0052] Figure 10 This is a flow chart of another voltage reference source circuit application adaptability evaluation method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0053] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0054] It should be noted that the terms "first", "second", etc. in the description and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0055] Figure 1 FIG. 1 is a schematic diagram of a voltage reference circuit application adaptability evaluation device provided by an embodiment of the present invention. Figure 1As shown, the voltage reference source circuit application adaptability evaluation device includes: a motherboard 01 and at least one daughterboard 02; the daughterboard 02 includes at least one connection interface module 201, and the connection interface module 201 is used to connect to the voltage reference source circuit; the daughterboard 02 and the motherboard 01 are also electrically connected through the connection interface module 201; the motherboard 01 includes: a control module 101, a test interface module 102 and an acquisition module 103; the control module 101 is connected to the acquisition module 103, and the control module 101 is used to control the acquisition module 103 to acquire the electrical signals sent by the daughterboard 02; the test interface module 102 is used to connect peripheral test equipment and the daughterboard 02.

[0056] The voltage reference source circuit includes: a voltage reference source device or a circuit formed by multiple voltage reference source devices.

[0057] Specifically, motherboard 01 integrates a control module 101, a test interface module 102, and an acquisition module 103. Control module 101 is responsible for controlling the entire test process. Optionally, control module 101 controls the operating status of acquisition module 103 and the conduction of test interface module 102. Acquisition module 103 collects electrical signals sent by daughterboard 02, which reflect the operating status and performance of the voltage reference circuit. Test interface module 102 connects peripheral test equipment to daughterboard 02, enabling the equipment to send test signals to the voltage reference circuit and receive and analyze the electrical signals collected by acquisition module 103.

[0058] The daughterboard 02 includes at least one connection interface module 201. This module is used to connect to the voltage reference circuit to be tested, ensuring a stable and reliable electrical connection between the circuit and the application adaptability evaluation device. By designing different daughterboards, it can be adapted to voltage reference circuits of different package specifications and models, thereby increasing the versatility and flexibility of the application adaptability evaluation device.

[0059] Exemplarily, an external peripheral test device is connected to the test interface module 102, and the test signal from the peripheral test device is transmitted to the connection interface module 201 of the daughter board 02 via the test interface module 102. The voltage reference circuit is connected to the connection interface module 201, and the test signal is input into the voltage reference circuit. After the voltage reference circuit receives the test signal, the acquisition module 103 of the motherboard 01, due to its connection to the connection interface 201, acquires the output signal of the voltage reference circuit under the test signal. The reliability of the voltage reference circuit is then evaluated based on the output signal of the voltage reference circuit under the test signal.

[0060] The daughterboard 02 and motherboard 01 are electrically connected to each other to achieve signal transmission and data exchange. Alternatively, the electrical connection can be a direct physical connection, such as a pin-and-socket connection, or a wireless connection or other form of connection, which is not limited here. The pins and sockets can be provided with snap-fits, and the connection interface module 201 also achieves a mechanical connection between the daughterboard 02 and motherboard 01.

[0061] The motherboard 01 and daughterboard 02 are separated, modularizing the functions of the application adaptability evaluation device and organically integrating the modules through electrical connections. Motherboard 01 is designed for maximum functionality, with modules related to acquisition, control, and data transmission integrated within it. Motherboard 01 also integrates the execution module for evaluating the adaptability of the voltage reference circuit. Since daughterboard 02 is separate from motherboard 01, it can be designed specifically for different types of voltage reference circuits. For example, if some voltage reference circuits have different interfaces, daughterboard 02 can be configured with different connection interfaces for each type of voltage reference circuit. Alternatively, if some types of voltage reference circuits are incompatible with the outputs of peripheral test equipment or the acquisition module 103 or test interface module 102 of motherboard 01, a connection interface module 201 can be provided to match the voltage reference circuit with the acquisition module 103 or test interface module 102 of the peripheral test equipment or motherboard 01. In this way, motherboard 01 can be designed solely for universality, adaptability, and maximum functionality, while adapting to different types of voltage reference circuits is accomplished solely through daughterboard 02. On the one hand, when evaluating different types of voltage reference circuits, simply replace the corresponding daughterboard 02, significantly improving the versatility and flexibility of adaptability evaluation. On the other hand, motherboard 01 no longer needs to be redesigned for each voltage reference circuit.

[0062] Furthermore, the voltage reference circuit application adaptability evaluation device of an embodiment of the present invention evaluates whether the voltage reference circuit complies with design specifications or technical parameters, verifying the long-term stability and reliability of the device in a real-world application environment. For example, the voltage reference circuit application adaptability evaluation device of an embodiment of the present invention is used to evaluate the voltage reference circuit's performance under combined conditions such as extreme temperatures or electrical signal fluctuations, as well as its compatibility with aerospace processes. Compared to voltage reference circuit testing in a laboratory environment, the voltage reference circuit application adaptability evaluation device provided by an embodiment of the present invention can configure a motherboard structure to accommodate voltage reference circuits with different interface types, improving the versatility of the adaptability evaluation device. Furthermore, the motherboard structure of the adaptability evaluation device also integrates signal input and signal acquisition modules, allowing each module to be "with the board" during the application evaluation, resulting in strong transferability. Accordingly, a highly transferable voltage reference circuit application adaptability evaluation device is more suitable for providing real-world application environments for voltage reference circuits. Exemplarily, when the transferred voltage reference source circuit provides different temperature environments for the voltage reference source circuit, it can be placed into a temperature box together with the application adaptability evaluation device and the corresponding electrically connected voltage reference source circuit, or transferred together in different temperature boxes.

[0063] In the voltage reference source circuit application adaptability evaluation device of the embodiment of the present invention, the motherboard integrates multiple functional modules, including a control module, a test interface module, and an acquisition module. The control module is responsible for controlling the entire test process, including the operating status of the acquisition module and the generation of test signals. The acquisition module is used to collect electrical signals sent by the daughterboard connection interface module. These signals can reflect the operating status and performance of the voltage reference source circuit. The test interface module is used to connect peripheral test equipment and the daughterboard to realize the transmission of test signals and data exchange. The daughterboard is responsible for connecting the voltage reference source circuit to be tested to adapt to voltage reference source circuits of different models and specifications. The voltage reference source circuit application adaptability evaluation device of the embodiment of the present invention consists of a motherboard and at least one daughterboard. The motherboard multiplexes control, signal input, and acquisition functions, and the daughterboard only needs to adapt to devices of different packaging specifications. The motherboard-daughterboard structure realizes rapid and accurate application adaptability evaluation of different voltage reference source circuits.

[0064] Based on the above embodiments, Figure 2 FIG. 1 is a schematic diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention. Figure 2 As shown, the voltage reference source circuit application adaptability evaluation device includes at least two daughter boards 02, each of which has a different interface type for the connection interface module 201. The motherboard 01 and daughter boards 02 are removable and interchangeable, where the removable and interchangeable daughter boards 02 correspond to voltage reference source circuits of different models and specifications.

[0065] Specifically, the voltage reference circuit application adaptability evaluation device is designed with at least two sub-boards 02, which can evaluate multiple voltage reference circuits simultaneously or separately, improving the efficiency of application adaptability evaluation. The connection interface module 201 of each sub-board 02 has different interface types to adapt to voltage reference circuits of different packaging specifications and models. By designing sub-boards with multiple interface types, a wider range of voltage reference circuit application adaptability evaluation needs can be covered.

[0066] The motherboard 01 and daughterboard 02 utilize pins, sockets, inter-board connectors, or other removable connections, allowing for easy replacement or upgrade of the daughterboard 02. If a daughterboard 02 fails, it can be quickly replaced with a new one, ensuring the continuity of application adaptability evaluation work. As application adaptability evaluation requirements change, the daughterboard 02 can be easily upgraded or replaced to meet the new requirements. Upgrading or replacing the daughterboard 02 can be accomplished without replacing the entire application adaptability evaluation device, reducing maintenance costs.

[0067] Exemplarily, the voltage reference source circuit is fixedly connected to the connection interface module 201 by means of welding, and different types of voltage reference source circuits are welded on different sub-boards 02 to achieve the correspondence between different sub-boards 02 and voltage reference source circuits of different models and specifications. By replacing the sub-board 02, the application adaptability evaluation of different types of voltage reference source circuits can be achieved.

[0068] The connection interface modules 201 on different sub-boards 02 can also be connection interfaces for different types of voltage reference source circuits. The voltage reference source circuit and the connection interface module 201 are fixedly connected by pluggable means, so that different sub-boards 02 correspond to voltage reference source circuits of different models and specifications, and the application adaptability evaluation of different types of voltage reference source circuits can be achieved by replacing the sub-board 02.

[0069] Based on the above embodiments, Figure 3 FIG. 1 is a schematic diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention. Figure 3 As shown, the daughter board 02 further includes: a fixed load module 202; the fixed load module 202 includes at least one load with different parameters; the fixed load module 202 is connected to the connection interface module 201; the mother board 01 further includes: a matrix switch switching module 104, the matrix switch switching module 104 is connected to the fixed load module 202; the matrix switch switching module 104 is used to control the load parameters provided by the fixed load module 202 to the voltage reference source circuit.

[0070] Specifically, the matrix switch module 104 is connected to the fixed load module 202, enabling the fixed load module 202 to receive control signals from the motherboard 01 and thereby provide at least one load with different parameters for the voltage reference source circuit connected to the daughterboard 02. The daughterboard 02 includes the fixed load module 202, which contains at least one load with different parameters and is connected to the connection interface module 201.

[0071] The fixed load module 202 of the daughterboard 02 contains at least one load with different parameters. These loads can simulate various load conditions that the voltage reference circuit may encounter in an actual operating environment, thereby comprehensively evaluating its performance. The matrix switch module 104 of the motherboard 01 is responsible for controlling the fixed load module 202 to provide the required load for the voltage reference circuit. Through matrix switching, loads with different parameters can be flexibly selected to meet the adaptability evaluation requirements of different applications.

[0072] For example, the fixed load module 202 can provide different loads for the voltage reference circuit to conduct load bias experiments. The fixed load module 202 internally includes at least one load with different parameters. These loads can be connected to the voltage reference circuit under the control of the matrix switch module 104, thereby simulating different load conditions. The fixed load module 202 is connected to the connection interface module 201, which is responsible for transmitting the load signal provided by the fixed load module 202 to the voltage reference circuit. The matrix switch module 104 sends a control signal to the fixed load module 202 based on application adaptability evaluation requirements, selects specific load parameters, and connects it to the voltage reference circuit. By varying the load parameters, load bias experiments can be conducted on the voltage reference circuit. The acquisition module 103, through the daughterboard 02, acquires the electrical signals output by the voltage reference circuit under different loads. The configuration of the matrix switch module 104 and the fixed load module 202 provides greater flexibility and diversity in the selection of loads applied to the voltage reference circuit. Personnel can quickly adjust load parameters according to evaluation requirements and conduct experiments under various load conditions without setting up additional peripheral test equipment, which improves the efficiency of application adaptability evaluation and reduces costs.

[0073] Based on the above embodiments, Figure 4 FIG. 1 is a schematic diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention. Figure 4 As shown, the motherboard 01 further includes: a communication module 105 ; the communication module 105 is connected to the control module 101 and is used to communicate with the host computer 20 and send electrical signals under the control of the control module 101 .

[0074] Specifically, the communication module 105 is responsible for implementing the communication function with the host computer 20 . The communication module 105 can convert the electrical signal collected by the voltage reference source circuit application adaptability evaluation device into a format suitable for transmission and send it to the host computer 20 .

[0075] Under the control of the control module 101, the communication module 105 transmits the electrical signals collected by the application adaptability evaluation device to the host computer 20. The host computer 20 processes and analyzes this data, thereby enabling comprehensive evaluation and management of the application adaptability evaluation results. The configuration of the communication module 105 enables the application adaptability evaluation device to automatically communicate with the host computer 20, reducing the need for manual operation. This improves the automation level of the application adaptability evaluation, reduces costs, and enhances the accuracy and reliability of the application adaptability evaluation.

[0076] Based on the above embodiments, Figure 5 FIG. 1 is a schematic diagram of another device for evaluating the application adaptability of a voltage reference circuit provided by an embodiment of the present invention. Figure 5 As shown, the motherboard control module 101 includes: an FPGA unit 1011, a clock crystal oscillator unit 1012, and a memory unit 1013; the clock crystal oscillator unit 1012 and the memory unit 1013 are respectively connected to the FPGA unit 1011; the clock crystal oscillator unit 1012 is used to provide a clock signal to the FPGA unit 1011; the memory unit 1013 is used to store the program of the FPGA unit 1011 and at least one of the voltage and current signals sent by the daughterboard. The output end of the LDO power supply module is connected to the power supply end of the FPGA unit 1011; the LDO power supply module is used to power the FPGA unit 1011. It also includes a JTAG unit 107, which is connected to the FPGA unit 1011 and is used to download programs to the FPGA unit 1011.

[0077] The introduction of the JTAG unit of the present invention makes the program update and debugging of the FPGA unit more convenient and efficient. The development cycle and debugging time of the application adaptability evaluation device are shortened, and work efficiency is improved. The programmable characteristics of the FPGA unit enable the control module to be flexibly configured and expanded according to different application adaptability evaluation requirements, and new application adaptability evaluation functions and algorithms can be realized. In the voltage reference source circuit application adaptability evaluation device of the embodiment of the present invention, the motherboard multiplexes the control, signal input and acquisition functions, and the daughterboard only needs to adapt to devices of different packaging specifications. The embodiment of the present invention realizes fast and accurate application adaptability evaluation of different voltage reference source circuits through the programmable mother-child board structure, thereby improving the scalability of the mother-child board application adaptability evaluation.

[0078] Based on the above embodiments, Figure 6FIG. 1 is a schematic diagram of a voltage reference circuit application adaptability evaluation system provided by an embodiment of the present invention. Figure 6 As shown, a peripheral test device 30, a host computer 20 and a voltage reference source circuit application adaptability evaluation device 10 of any embodiment of the present invention; the interface of the peripheral test device 30 is connected to the test interface module 102 of the motherboard 01 of the voltage reference source circuit application adaptability evaluation device 10, and the peripheral test device 30 is used to provide a test electrical signal to the voltage reference source circuit application adaptability evaluation device 10; the host computer 20 is connected to the control module 101 of the motherboard 01 of the voltage reference source circuit application adaptability evaluation device 10; the host computer 20 is used to receive the electrical signal sent by the voltage reference source circuit application adaptability evaluation device 10; the host computer 20 is also connected to the control end of the peripheral test device 30; the host computer 20 is also used to control the peripheral test device 30 to output the test electrical signal.

[0079] Specifically, the peripheral test equipment 30 is used to provide the electrical signals required for application adaptability evaluation. The peripheral test equipment 30 includes at least one of a DC power supply 301, an electronic load 302, and an oscilloscope 303. The DC power supply 301 provides a stable DC voltage, the electronic load 302 simulates a circuit load, and the oscilloscope 303 observes and records the voltage and current waveforms in the circuit. These devices are connected to the test interface module 102 of the motherboard 01 of the voltage reference circuit application adaptability evaluation device 10 via an interface to enable signal transmission. The host computer 20 is used for control and data processing in the application adaptability evaluation system. The host computer 20 is connected to the control module 101 of the motherboard 01 of the voltage reference circuit application adaptability evaluation device 10 to receive, process, and analyze the electrical signals sent by the voltage reference circuit application adaptability evaluation device 10. The host computer 20 is also connected to the control terminal of the peripheral test equipment 30 to control the output of the peripheral test equipment 30 by issuing control commands, thereby automating and intelligentizing the application adaptability evaluation process. The voltage reference circuit application adaptability evaluation device 10 is used to connect to the voltage reference circuit to be evaluated and collect and transmit test data. It receives test electrical signals from peripheral test equipment 30 via the test interface module 102 on the motherboard 01 and communicates with the host computer 20 via the control module 101 to upload test data and control the test process.

[0080] In the voltage reference source circuit application adaptability evaluation system provided by an embodiment of the present invention, the interface of the peripheral test equipment is connected to the test interface module of the motherboard of the voltage reference source circuit application adaptability evaluation device, and is used to provide a test electrical signal to the voltage reference source circuit application adaptability evaluation device. The host computer is connected to the control module of the motherboard of the voltage reference source circuit application adaptability evaluation device, and is used to receive the electrical signal sent by the voltage reference source circuit application adaptability evaluation device and control the peripheral test equipment to output the test electrical signal. In the voltage reference source circuit application adaptability evaluation system of an embodiment of the present invention, the application adaptability evaluation process is automated and intelligent, which reduces the need for manual intervention and improves the efficiency of application adaptability evaluation. The host computer can automatically send control instructions to the peripheral test equipment to realize the automatic output of test signals and the automatic collection of test data. The peripheral test equipment can increase or decrease the type and quantity of peripheral test equipment as needed to meet the needs of different evaluation scenarios. The voltage reference source circuit application adaptability evaluation system can be flexibly configured and expanded.

[0081] Figure 7 This is a flow chart of a method for evaluating the application adaptability of a voltage reference source circuit provided by an embodiment of the present invention. This embodiment is applicable to evaluating the application adaptability of a voltage reference source circuit reliability. This method can be executed by the voltage reference source circuit application adaptability evaluation device of each of the above embodiments, such as Figure 7 As shown, the method includes:

[0082] S401 , electrically connecting the voltage reference source circuit to the daughter board, electrically connecting the motherboard and the daughter board, and electrically connecting the peripheral test equipment to the test interface module of the motherboard.

[0083] like Figure 1-7 Specifically, the voltage reference circuit is electrically connected to the daughterboard 02 to ensure accurate signal transmission. The motherboard 01 and the daughterboard 02 are electrically connected to form a complete test circuit. The peripheral test device 30 is electrically connected to the test interface module 102 of the motherboard 01 to provide test electrical signals to the voltage reference circuit.

[0084] S402 : The peripheral test equipment outputs a test electrical signal to the motherboard. The test electrical signal is input to the voltage reference source circuit through the test interface module of the motherboard and the connection interface module of the daughterboard.

[0085] Peripheral test equipment 30 outputs test electrical signals to the motherboard. Exemplarily, these test electrical signals include DC voltage, AC signals, or other specific test signals. Daughterboard 02 receives the test electrical signals from motherboard 01 and, via a connection interface module, inputs these signals into a voltage reference circuit to simulate the electrical environment under actual operating conditions.

[0086] S403: The daughter board collects the electrical signal of the voltage reference source circuit under the test electrical signal and sends it to the mother board.

[0087] Daughterboard 02 collects electrical signals from the voltage reference circuit under test electrical signals. These signals reflect the voltage reference circuit's performance under specific application suitability evaluation conditions. Daughterboard 02 transmits the collected voltage and current signals to motherboard 01, which receives and processes these signals for subsequent data analysis and evaluation.

[0088] A method for evaluating the application adaptability of a voltage reference source circuit provided by an embodiment of the present invention is applied to the application adaptability evaluation of the reliability of a voltage reference source circuit. This method can be executed by the voltage reference source circuit application adaptability evaluation device of the above-mentioned embodiments, and has the beneficial effects of the voltage reference source circuit application adaptability evaluation device of any of the above-mentioned embodiments of the present invention.

[0089] Based on the above embodiments, Figure 8 A flow chart of another voltage reference source circuit application adaptability evaluation method provided by an embodiment of the present invention is shown in FIG. Figure 8 As shown, the method includes: the peripheral test equipment includes a DC power supply and an electronic load.

[0090] S501 , electrically connecting the voltage reference source circuit to the daughter board, electrically connecting the motherboard and the daughter board, and electrically connecting the peripheral test equipment to the test interface module of the motherboard.

[0091] S502. The peripheral test equipment outputs at least one of a reference voltage output function application adaptability evaluation signal, a transient interference stability application adaptability evaluation signal, a power supply bias application adaptability evaluation signal, and a load bias application adaptability evaluation signal to the motherboard; the test electrical signal is input to the voltage reference source circuit through the test interface module of the motherboard and the connection interface module of the daughterboard.

[0092] Specifically, step S502 includes multiple applicability evaluation items for the voltage reference source circuit. In different applicability evaluation items, the test electrical signals output by the peripheral test equipment 30 to the motherboard 01 are different.

[0093] During the evaluation of the adaptability of the reference voltage output function, the peripheral test equipment outputs a signal for evaluating the adaptability of the reference voltage output function to the motherboard. The signal for evaluating the adaptability of the reference voltage output function includes:

[0094] The DC power supply outputs a first input signal, and the electronic load provides a first load condition;

[0095] The DC power supply provides a first input signal of the voltage reference source circuit to the motherboard, and the electronic load provides a first load condition of the voltage reference source circuit to the motherboard;

[0096] The first input signal is a rated input signal of the voltage reference source circuit, and the first load condition is a full-load output condition of the voltage reference source circuit.

[0097] In the transient interference stability application adaptability evaluation, the peripheral test equipment outputs a transient interference stability application adaptability evaluation signal to the motherboard. The transient interference stability application adaptability evaluation signal includes: under the condition that the DC power supply provides the first input signal of the voltage reference source circuit to the motherboard and the electronic load provides the first load condition of the voltage reference source circuit to the motherboard, the DC power supply provides the first step signal of the voltage reference source circuit to the motherboard; the first step signal is a rated reverse current of the voltage reference source circuit or an input voltage range of the voltage reference source circuit that changes from the low end to the high end and then changes from the high end to the low end;

[0098] Alternatively, when the DC power supply provides a first input signal of the voltage reference source circuit to the motherboard and the electronic load provides a first load condition of the voltage reference source circuit to the motherboard, the electronic load provides a second step signal of the voltage reference source circuit to the motherboard; the second step signal is a load current of the voltage reference source circuit that changes from a low end to a high end and then changes from a high end to a low end.

[0099] During the power bias application adaptability evaluation, the peripheral test equipment outputs a power bias application adaptability evaluation signal to the motherboard. The power bias application adaptability evaluation signal includes: a DC power supply providing at least one second input signal of a voltage reference source circuit to the motherboard; the second input signal covers the rated reverse current of the voltage reference source circuit or the input voltage range of the voltage reference source circuit;

[0100] In the load bias application adaptability evaluation, the electronic load provides a second load condition of at least one voltage reference source circuit to the motherboard; the second load condition covers the rated reverse current or load current range of the voltage reference source.

[0101] S503 , the daughter board collects the electrical signal of the voltage reference source circuit under the test electrical signal and sends it to the mother board; the mother board receives the electrical signal of the voltage reference source circuit under the test electrical signal.

[0102] Optionally, in this embodiment, the test electrical signal includes at least one of a reference voltage output function application adaptability evaluation signal, a transient interference stability application adaptability evaluation signal, a power supply bias application adaptability evaluation signal, and a load bias application adaptability evaluation signal; correspondingly, the voltage reference source circuit applicability evaluation items include at least one of a reference voltage output function application adaptability evaluation, a power supply bias test application adaptability evaluation, a load bias test application adaptability evaluation, and a transient interference stability application adaptability evaluation. The evaluation results corresponding to different applicability evaluation items are shown in Table 1 below. After the peripheral test equipment outputs the test electrical signal to the motherboard, the output voltage accuracy of the voltage reference source circuit is collected to determine whether the output voltage accuracy of the voltage reference source circuit meets the preset conditions. If the output voltage accuracy of the voltage reference source circuit meets the preset conditions, the reliability of the voltage reference source circuit under test is determined to be good in the corresponding applicability evaluation item; if the output voltage accuracy of the voltage reference source circuit does not meet the preset conditions, the reliability of the voltage reference source circuit under test is determined to be poor in the corresponding applicability evaluation item. The preset conditions include the product definition of the voltage reference source circuit under test.

[0103] Table 1

[0104] Furthermore, the voltage reference source circuit application adaptability evaluation method of the embodiment of the present invention is to evaluate whether the voltage reference source circuit meets the design specifications or technical parameters, and verify the long-term stability and reliability of the device in a real application environment.

[0105] Compared to the voltage reference source circuit application adaptability evaluation method in a laboratory environment, the voltage reference source circuit application adaptability evaluation method provided by the embodiment of the present invention outputs a test electrical signal from the peripheral test equipment to the motherboard. As mentioned above, the test electrical signal may include: a signal for transient interference stability application adaptability evaluation, a signal for power supply bias application adaptability evaluation; and the voltage reference source circuit conditions provided by the electronic load include: the load conditions required for load bias application adaptability evaluation. The test electrical signal provided by the DC power supply is to simulate different electrical environments in actual application situations; and the load conditions provided by the electronic load are to simulate the impact of the subsequent circuit on the voltage reference source circuit in actual application situations. That is, the voltage reference source circuit application adaptability evaluation method provided by the embodiment of the present invention verifies the long-term stability and reliability of the voltage reference source circuit in a real application environment. The voltage reference source circuit application adaptability evaluation method provided by the embodiment of the present invention is a systematic verification method for the voltage reference source circuit in actual application scenarios, and is to evaluate the reliability of the voltage reference source device in aerospace equipment through multi-dimensional electrical simulation.

[0106] In the voltage reference source circuit application adaptability evaluation method provided by the embodiment of the present invention, by outputting multiple test signals, the method can comprehensively evaluate the performance of the voltage reference source circuit under different conditions, including the reference voltage output function, transient interference stability, power supply pull-off and load pull-off performance. The voltage reference source circuit application adaptability evaluation method provided by the embodiment of the present invention can select different test signals to output according to actual needs, realizing a flexible applicability evaluation scheme. This helps to meet the test requirements of different projects of different voltage reference source circuits and improve test efficiency.

[0107] Based on the above embodiments, Figure 9 A flow chart of another voltage reference source circuit application adaptability evaluation method provided by an embodiment of the present invention is shown in FIG. Figure 9 As shown, the method includes:

[0108] S601 , electrically connecting the voltage reference source circuit to the daughter board, electrically connecting the motherboard and the daughter board, and electrically connecting the peripheral test equipment to the test interface module of the motherboard.

[0109] S602. The DC power supply provides a first input signal of the voltage reference source circuit to the motherboard. The electronic load provides a first load condition of the voltage reference source circuit to the motherboard. The voltage reference source circuit is in a first temperature test condition or a second temperature test condition. The test electrical signal is input to the voltage reference source circuit through the test interface module of the motherboard and the connection interface module of the daughterboard.

[0110] The level of the first input signal is the rated input voltage of the voltage reference source circuit, and the first load condition is the full-load output condition of the voltage reference source circuit;

[0111] The first temperature test condition includes: the voltage reference source circuit performs a preset number of temperature transition cycles between a first temperature condition and a second temperature condition, wherein the first temperature condition and the second temperature condition are respectively a high temperature condition and a low temperature condition;

[0112] Specifically, the first temperature test condition is the temperature condition for performing a temperature cycle test on the voltage reference source circuit. The specific temperature values in the first temperature condition and the second temperature condition are selected based on the characteristics of the voltage reference source circuit, the highest temperature and the lowest temperature in the actual operating temperature range of the voltage reference source circuit, which are not limited here. Exemplarily, the first temperature test condition also includes the temperature conditions in Table 2 below:

[0113] Table 2

[0114]

[0115] The second temperature test condition includes: the voltage reference source circuit operates under the third temperature condition for a preset time. The specific temperature value of the third temperature condition is selected according to the characteristics of the voltage reference source circuit. The maximum actual operating temperature of the voltage reference source circuit is not limited here. The second temperature test condition is the temperature condition when the voltage reference source circuit is subjected to a temperature cycle test. Exemplarily, the second temperature condition also includes the temperature conditions in Table 3 below:

[0116] Table 3

[0117]

[0118] S603 , the daughter board collects the electrical signal of the voltage reference source circuit under the test electrical signal and sends it to the mother board; the mother board receives the electrical signal of the voltage reference source circuit under the test electrical signal.

[0119] A DC power supply provides a first input signal of the voltage reference source circuit to the motherboard, and an electronic load provides a first load condition of the voltage reference source circuit to the motherboard, and the voltage reference source circuit is in a first temperature test condition or a second temperature test condition. The first temperature test condition and the second temperature test condition correspond to temperature cycle application adaptability evaluation and stability application adaptability evaluation. In the temperature cycle application adaptability evaluation or stability application adaptability evaluation, the evaluation results corresponding to different applicability evaluation items are shown in Table 4 below. The output voltage accuracy of the corresponding voltage reference source circuit is collected to determine whether the output voltage accuracy of the voltage reference source circuit meets the preset conditions. If the output voltage accuracy of the voltage reference source circuit meets the preset conditions, the reliability of the voltage reference source circuit under test is determined to be good in the corresponding applicability evaluation item; if the output voltage accuracy of the voltage reference source circuit does not meet the preset conditions, the reliability of the voltage reference source circuit under test is determined to be poor in the corresponding applicability evaluation item. The preset conditions include the product definition of the voltage reference source circuit under test.

[0120] Table 4

[0121]

[0122] Based on the above embodiments, Figure 10 A flow chart of another voltage reference source circuit application adaptability evaluation method provided by an embodiment of the present invention is shown in FIG. Figure 10 As shown, the method includes:

[0123] S701 , electrically connecting the voltage reference source circuit to the daughter board, electrically connecting the motherboard and the daughter board, and electrically connecting the peripheral test equipment to the test interface module of the motherboard.

[0124] S702, the DC power supply and the electronic load provide the motherboard with a powered bias condition and an unpowered bias condition, and the voltage reference source circuit is in a radiation environment test condition. The test electrical signal is input to the voltage reference source circuit through the test interface module of the motherboard and the connection interface module of the daughterboard.

[0125] Specifically, the powered bias condition includes: a DC power supply providing a first input signal to the voltage reference circuit of the motherboard, and an electronic load providing a first load condition to the voltage reference circuit of the motherboard. The level of the first input signal is the rated input voltage of the voltage reference circuit, and the first load condition is the full-load output condition of the voltage reference circuit. The unpowered bias condition includes: a DC power supply and an electronic load providing no input signal or load condition to the motherboard.

[0126] In the radiation environment test conditions, the voltage reference source circuit under test on the daughterboard is placed in an irradiation chamber and irradiated at a specified dose rate. This includes: irradiating the voltage reference source circuit at a preset dose rate.

[0127] Optionally, the preset dose rate includes 0.01rad(Si / s).

[0128] S703, the daughter board collects the electrical signal of the voltage reference source circuit and sends it to the mother board; the mother board receives the electrical signal of the voltage reference source circuit under the test electrical signal.

[0129] The daughter board collects the electrical signal of the voltage reference source circuit and sends it to the mother board, including setting at least one preset radiation dose node. When the radiation dose reaches the preset radiation dose node, the daughter board collects the electrical signal of the voltage reference source circuit and sends it to the mother board, correspondingly collects the output voltage accuracy of the voltage reference source circuit, and judges whether the output voltage accuracy of the voltage reference source circuit meets the preset conditions. If the output voltage accuracy of the voltage reference source circuit meets the preset conditions, it is judged that the reliability of the measured voltage reference source circuit is good in the corresponding applicability evaluation item; if the output voltage accuracy of the voltage reference source circuit does not meet the preset conditions, it is judged that the measured voltage reference source circuit has poor reliability in the corresponding applicability evaluation item.

[0130] Optionally, the at least one preset radiation dose node includes: 5Krad, 10Krad, and 15Krad.

[0131] S704 , when the output voltage accuracy of the voltage reference source circuit does not meet the preset conditions or the total irradiation dose reaches the preset total dose, stop applying the adaptability evaluation.

[0132] Optionally, the total irradiation dose comprises 15 krad.

[0133] Furthermore, the voltage reference source circuit application adaptability evaluation method of the embodiment of the present invention is to evaluate whether the voltage reference source circuit meets the design specifications or technical parameters, and verify the long-term stability and reliability of the device in a real application environment.

[0134] Compared to the voltage reference circuit application adaptability evaluation method in a laboratory environment, the voltage reference circuit application adaptability evaluation method provided in the embodiment of the present invention provides different temperature conditions for the voltage reference circuit to simulate the temperature environment in actual applications. The voltage reference circuit application adaptability evaluation method provided in the embodiment of the present invention is a systematic verification method for voltage reference circuits in actual application scenarios. It aims to evaluate the reliability of voltage reference components in aerospace equipment through thermal environment simulation.

[0135] Optionally, the method for evaluating the application adaptability of a voltage reference source circuit further includes evaluating the application adaptability of the voltage reference source circuit's assembly process. After the application adaptability evaluation of the voltage reference source circuit described in any embodiment of the present invention, the voltage reference source circuit lead soldering condition is visually inspected to determine whether the circuit lead soldering quality is intact and consistent with that before the test. If the circuit lead soldering quality is intact and the soldering condition is consistent with that before the test, the voltage reference source circuit's assembly process adaptability is determined to be good. If there is a problem with the circuit lead soldering quality and the soldering condition is inconsistent with that before the test, the voltage reference source circuit's assembly process adaptability is determined to be poor.

[0136] In the voltage reference source circuit application adaptability evaluation method provided by the embodiment of the present invention, by simulating the electrical and temperature conditions of the voltage reference source circuit in the actual working environment, the method can comprehensively evaluate its performance under different conditions, including full-load output performance under rated input voltage, stability under high and low temperature conditions, and low-temperature startup performance. The voltage reference source circuit application adaptability evaluation method provided by the embodiment of the present invention selects different temperature test conditions according to actual needs to achieve a flexible application adaptability evaluation scheme. This helps to meet the application adaptability evaluation needs of different projects of different voltage reference source circuits and improve the efficiency of application adaptability evaluation.

[0137] It should be understood that the various forms of the processes shown above can be used to reorder, add, or delete steps. For example, the steps described in the present invention can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solution of the present invention can be achieved. This is not limited herein.

[0138] The above specific embodiments do not limit the scope of protection of the present invention. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention are intended to be included within the scope of protection of the present invention.

Claims

1. A voltage reference source circuit application adaptability evaluation device, characterized in that: include: a motherboard and at least one daughterboard; The daughter board includes at least one connection interface module, and the connection interface module is used to connect to the voltage reference source circuit; The daughter board and the mother board are also electrically connected via the connection interface module; The motherboard includes: a control module, a test interface module and an acquisition module; The control module is connected to the acquisition module, and the control module is used to control the acquisition module to acquire the electrical signal sent by the daughter board; the test interface module is used to connect peripheral test equipment and the daughter board.

2. The voltage reference source circuit application adaptability evaluation device according to claim 1, characterized in that: At least two daughter boards are included, and the interface types of the connection interface modules of at least two daughter boards are different.

3. The voltage reference source circuit application adaptability evaluation device according to claim 1, characterized in that: The motherboard and the daughterboard are detachably connected and replaceable, wherein the detachably replaced daughterboard corresponds to voltage reference source circuits of different models and specifications.

4. The voltage reference source circuit application adaptability evaluation device according to claim 1, characterized in that: The daughter board further includes: a fixed load module; The fixed load module includes at least one load with different parameters; the fixed load module is connected to the connection interface module.

5. The voltage reference source circuit application adaptability evaluation device according to claim 4, characterized in that: The motherboard further includes: a matrix switch switching module, wherein the matrix switch switching module is connected to the fixed load module; The matrix switch switching module is used to control the load parameters provided by the fixed load module to the voltage reference source circuit.

6. The voltage reference source circuit application adaptability evaluation device according to claim 1, characterized in that: The motherboard further includes: a communication module; The communication module is connected to the control module and is used to communicate with the host computer to send the electrical signal under the control of the control module.

7. A voltage reference source circuit application adaptability evaluation system, characterized in that: include: Peripheral test equipment, a host computer, and a voltage reference source circuit application adaptability evaluation device according to any one of claims 1 to 6; The interface of the peripheral test equipment is connected to the test interface module of the motherboard of the voltage reference source circuit application adaptability evaluation device, and the peripheral test equipment is used to provide a test electrical signal to the voltage reference source circuit application adaptability evaluation device; The host computer is connected to the control module of the motherboard of the voltage reference source circuit application adaptability evaluation device; the host computer is used to receive the electrical signal sent by the voltage reference source circuit application adaptability evaluation device; The host computer is also connected to the control terminal of the peripheral test equipment; the host computer is also used to control the peripheral test equipment to output a test electrical signal.

8. A method for evaluating the application adaptability of a voltage reference source circuit, characterized in that: include: Electrically connecting the voltage reference source circuit to the daughter board, electrically connecting the motherboard and the daughter board, and electrically connecting the peripheral test equipment to the test interface module of the motherboard; The peripheral test equipment outputs a test electrical signal to the motherboard, and the test electrical signal is input to the voltage reference source circuit through the test interface module of the motherboard and the connection interface module of the daughterboard; the daughterboard collects the electrical signal of the voltage reference source circuit under the test electrical signal and sends it to the motherboard.

9. The voltage reference source circuit application adaptability evaluation method according to claim 8, characterized in that: The peripheral test equipment includes a DC power supply and an electronic load; The test electrical signal includes at least one of a reference voltage output function application adaptability evaluation signal, a transient interference stability application adaptability evaluation signal, a power supply bias application adaptability evaluation signal, and a load bias application adaptability evaluation signal; The peripheral test device outputting the reference voltage output function application adaptability evaluation signal to the motherboard includes: the DC power supply providing the first input signal of the voltage reference source circuit to the motherboard, and the electronic load providing the first load condition of the voltage reference source circuit to the motherboard; Wherein, the first input signal is the rated input signal of the voltage reference source circuit, and the first load condition is the full-load output condition of the voltage reference source circuit; The peripheral testing device outputting the transient interference stability application adaptability evaluation signal to the motherboard includes: When the DC power supply provides the first input signal of the voltage reference source circuit to the motherboard and the electronic load provides the first load condition of the voltage reference source circuit to the motherboard, the DC power supply provides the first step signal of the voltage reference source circuit to the motherboard; wherein the first step signal is a rated reverse current of the voltage reference source circuit or an input voltage range of the voltage reference source circuit that changes from a low end to a high end and then changes from a high end to a low end; Alternatively, when the DC power supply provides the first input signal of the voltage reference source circuit to the motherboard and the electronic load provides the first load condition of the voltage reference source circuit to the motherboard, the electronic load provides the motherboard with a second step signal of the voltage reference source circuit; the second step signal is a load current of the voltage reference source circuit that changes from a low end to a high end and then changes from a high end to a low end. The peripheral test device outputting the power bias application adaptability evaluation signal to the motherboard includes: the DC power supply providing at least one second input signal of the voltage reference source circuit to the motherboard; The second input signal covers a range of a rated reverse current of the voltage reference source circuit or an input voltage of the voltage reference source circuit; The peripheral test device outputting the load bias application adaptability evaluation signal to the motherboard includes: the electronic load providing a second load condition of at least one voltage reference source circuit to the motherboard; The second load condition covers a rated reverse current or load current range of the voltage reference source.

10. The voltage reference source circuit application adaptability evaluation method according to claim 8, characterized in that: The peripheral test equipment includes a DC power supply and an electronic load; The peripheral test device outputs a test electrical signal to the motherboard, further comprising: a DC power supply providing a first input signal of the voltage reference source circuit to the motherboard, an electronic load providing a first load condition of the voltage reference source circuit to the motherboard, and the voltage reference source circuit is in a first temperature test condition or a second temperature test condition; The level of the first input signal is the rated input voltage of the voltage reference source circuit, and the first load condition is the full-load output condition of the voltage reference source circuit; The first temperature test condition includes: the voltage reference source circuit performs a preset number of temperature transition cycles between a first temperature condition and a second temperature condition, wherein the first temperature condition and the second temperature condition are respectively a high temperature condition and a low temperature condition; The second temperature test condition includes: the voltage reference source circuit operates under a third temperature condition for a preset time period; wherein the third temperature condition is greater than the second temperature condition.

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