Test mode conversion method and device, storage medium and electronic equipment

Abstract

The invention discloses a test mode conversion method and device, a storage medium and electronic equipment, and relates to the technical field of smart home. The test mode conversion method is applied to the integrated chip, integrated firmware is burnt in a storage device of the integrated chip, the integrated firmware comprises production test logic corresponding to a production test mode and application test logic corresponding to an application mode, and the test mode conversion method comprises the steps that whether a mark file exists in a read-write configuration partition arranged in the storage device or not is determined, wherein the mark file is used for determining a test mode of the integrated chip; under the condition of determining that the mark file exists in the readable and writable configuration partition, determining that the test mode of the integrated chip is a yield test mode, and starting production test logic corresponding to the yield test mode in the integrated firmware; and under the condition that the execution of the production test logic is completed, sending a conversion instruction to the storage device through the serial port interface so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

Description

Technical Field

[0001] The present application relates to the field of smart home technology, and more specifically, to a test mode conversion method and device, a storage medium, and an electronic device. Background Art

[0002] In related technologies, two firmwares are typically burned into an integrated chip, one for production testing and one for application testing. After production testing is completed, the application testing of the integrated chip is performed by converting the production test serial port interface used for production testing into the application serial port interface used for application testing. This can lead to long burning times and low testing efficiency.

[0003] In view of the problems of long programming time and low testing efficiency of integrated chips in related technologies, no effective solution has been proposed yet. Summary of the Invention

[0004] The embodiments of the present application provide a test mode conversion method and device, a storage medium, and an electronic device to at least solve the problems of long integrated chip burning time and low test efficiency in related technologies.

[0005] According to one embodiment of the present application, a test mode conversion method is provided, which is applied to an integrated chip, and an integrated firmware is burned in a storage device of the integrated chip, wherein the integrated firmware includes production test logic corresponding to the production test mode and application test logic corresponding to the application mode, including: determining whether there is a flag file in a readable and writable configuration partition set in the storage device, wherein the flag file is used to determine the test mode of the integrated chip; when it is determined that the flag file exists in the readable and writable configuration partition, determining that the test mode of the integrated chip is the production test mode, and starting the production test logic corresponding to the production test mode in the integrated firmware; when the production test logic is executed, sending a conversion instruction to the storage device through a serial port interface, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

[0006] In an optional embodiment, after sending a conversion instruction to the storage device through the serial port interface, the method further includes: when it is determined that the conversion instruction is sent successfully, determining whether the flag file exists in the readable and writable configuration partition, wherein the conversion instruction includes at least one of the following: clearing the flag file in the readable and writable configuration partition, resetting the readable and writable configuration partition; when it is determined that the flag file does not exist in the readable and writable configuration partition, determining that the test mode of the integrated chip is the application mode.

[0007] In an optional embodiment, the production test logic includes at least one of the following: verifying the media access control address preset in the integrated chip through the serial port interface, wherein the verification includes at least one of the following: verifying whether the format of the media access control address conforms to the target format, and determining whether the media access control address is a valid unique address; determining whether the firmware version currently running on the integrated chip is the target version through the serial port interface; scanning the signal strength of available wireless access points within a preset range, and determining whether the signal strength is greater than or equal to a preset value.

[0008] In an optional embodiment, after starting the production test logic corresponding to the production test mode in the integrated firmware, the method further includes: obtaining a first test result obtained by executing the production test logic; pausing the execution of the production test logic when it is determined that the number of second test results in the first test result reaches a target number, wherein the second test result is a test result that does not meet the test expectations; and sending the production test data corresponding to the second test result to the computer terminal corresponding to the integrated chip through the serial port interface to instruct the computer terminal to generate a test report, wherein the test report is used to instruct the target object to detect the integrated chip according to the test report.

[0009] In an optional embodiment, after controlling the test mode of the integrated chip to switch from the production test mode to the application mode through the conversion instruction, the method further includes: sending a confirmation authorization request to the computer terminal corresponding to the integrated chip, wherein the confirmation authorization request is used to confirm to the computer terminal whether the integrated chip is authorized to call the application test logic; and upon receiving the authorization permission notification sent by the computer terminal based on the confirmation authorization request, executing the application test logic corresponding to the application mode.

[0010] In an optional embodiment, after executing the application test logic corresponding to the application mode, the method further includes: determining a third test result obtained by executing the application test logic; if all test results in the third test result meet the test expectations, sending a qualified notification to the computer terminal through the serial port interface to instruct the computer terminal to send a qualified report to the target object, wherein the qualified report is used to notify the target object that the integrated chip meets the preset standards.

[0011] In an optional embodiment, after determining whether there is a flag file in the readable and writable configuration partition set in the storage device, the method further includes: when it is determined that the flag file does not exist in the readable and writable configuration partition, determining that the test mode of the integrated chip is an application mode, and starting the application test logic corresponding to the application mode in the integrated firmware.

[0012] In an optional embodiment, according to another aspect of the present invention, a test mode conversion device is further provided, including: a determination module, configured to determine whether a flag file exists in a readable and writable configuration partition provided in a storage device, wherein the flag file is used to determine the test mode of an integrated chip; a startup module, configured to determine that the test mode of the integrated chip is a production test mode when it is determined that the flag file exists in the readable and writable configuration partition, and to start the production test logic corresponding to the production test mode in the integrated firmware; and a conversion module, configured to send a conversion instruction to the storage device through a serial port interface when the production test logic is executed, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

[0013] According to another aspect of an embodiment of the present application, an electronic device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the test mode conversion method through the computer program.

[0014] According to another aspect of the embodiments of the present application, a computer program product is provided, including a computer program, which implements the above-mentioned test mode conversion method when executed by a processor.

[0015] In an embodiment of the present application, when it is determined that a flag file for determining the test mode of the integrated chip exists in the read-write configuration partition, it is determined that the integrated chip is in production test mode, and the production test logic corresponding to the production test mode in the integrated firmware is started, wherein the integrated firmware is burned in the storage device of the integrated chip, and the integrated firmware contains the production test logic corresponding to the production test mode and the application test logic corresponding to the application mode; when the production test logic is executed, a conversion instruction is sent to the storage device through the serial port interface to control the test mode of the integrated chip to switch from production test mode to application mode through the conversion instruction. The above technical solution solves the problems of long integrated chip burning time and low test efficiency in the related art, reduces the burning time of the integrated chip, and improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0017] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 This is a hardware environment diagram of a test mode conversion method according to an embodiment of the present application;

[0019] Figure 2 is a flow chart of a test mode conversion method according to an embodiment of the present application;

[0020] Figure 3 A first memory device partition diagram of a test mode conversion method according to an optional embodiment of the present application;

[0021] Figure 4 is a first flow chart of a method for converting a test mode according to an optional embodiment of the present application;

[0022] Figure 5 A second memory device partition diagram of a test mode conversion method according to an optional embodiment of the present application;

[0023] Figure 6 is a second flow chart of a test mode conversion method according to an optional embodiment of the present application;

[0024] Figure 7 is a third flow chart of a test mode conversion method according to an optional embodiment of the present application;

[0025] Figure 8 This is a structural block diagram of a test mode conversion device according to an embodiment of the present application. DETAILED DESCRIPTION

[0026] In order to enable those skilled in the art to better understand the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of this application.

[0027] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequential order. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in a sequence other than those illustrated or described herein. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0028] According to one aspect of an embodiment of the present application, a test mode conversion method is provided. The test mode conversion method is widely used in smart home (Smart Home), smart home, smart home device ecology, smart residential (Intelligence House) ecology and other whole-house intelligent digital control application scenarios. Optionally, in this embodiment, the above test mode conversion method can be applied to Figure 1 In the hardware environment shown in FIG. 1 , an integrated chip 102 and a computer terminal 104 are formed. Figure 1 As shown, the integrated chip 102 is connected to the computer terminal 104 via a network, and can be used to provide services (such as application services, etc.) for the integrated chip 102 or the client installed on the integrated chip 102. A database can be set on the integrated chip 102 or independently of the integrated chip 102 to provide data storage services for the integrated chip 102 and the computer terminal 104. Cloud computing and / or edge computing services can be configured on the integrated chip 102 or independently of the integrated chip 102 to provide data computing services for the integrated chip 102 and the computer terminal 104.

[0029] The network may include, but is not limited to, at least one of the following: a wired network and a wireless network. The wired network may include, but is not limited to, at least one of the following: a wide area network, a metropolitan area network, and a local area network. The wireless network may include, but is not limited to, at least one of the following: Wi-Fi (Wireless Fidelity) and Bluetooth. The integrated chip 102 and the computer terminal 104 may be, but are not limited to, a PC, a mobile phone, a tablet computer, a smart air conditioner, a smart range hood, a smart refrigerator, a smart oven, a smart stove, a smart washing machine, a smart water heater, a smart washing machine, a smart dishwasher, a smart projection device, a smart TV, a smart clothes drying rack, smart curtains, smart audio and video, a smart socket, a smart speaker, a smart fresh air device, smart kitchen and bathroom equipment, smart bathroom equipment, a smart sweeping robot, a smart window cleaning robot, a smart mopping robot, a smart air purifier, a smart steamer, a smart microwave oven, a smart kitchen treasure, a smart purifier, a smart water dispenser, a system platform, and the like.

[0030] In this embodiment, a test mode conversion method is provided, which is applied to the above-mentioned integrated chip. Figure 2 1 is a flow chart of a method for converting a test mode according to an embodiment of the present application, the flow comprising the following steps:

[0031] Step S202, determining whether a flag file exists in a readable and writable configuration partition of the storage device, wherein the flag file is used to determine a test mode of the integrated chip;

[0032] Step S204: if it is determined that the flag file exists in the readable and writable configuration partition, determining that the test mode of the integrated chip is a production test mode, and starting the production test logic corresponding to the production test mode in the integrated firmware;

[0033] Step S206 , when the production test logic is executed, sending a conversion instruction to the memory device through the serial port interface, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

[0034] In an embodiment of the present application, it is determined whether a flag file exists in the readable and writable configuration partition of the storage device, wherein the flag file is used to determine the test mode of the integrated chip; if it is determined that the flag file exists in the readable and writable configuration partition, the test mode of the integrated chip is determined to be the production test mode, and the production test logic corresponding to the production test mode in the integrated firmware is started; if the production test logic is executed, a conversion instruction is sent to the storage device via the serial port interface to control the test mode of the integrated chip to switch from the production test mode to the application mode through the conversion instruction. The above technical solution solves the problem of long integrated chip burning time and low test efficiency in the related art.

[0035] It should be noted that in the prior art, after soldering, the integrated chip undergoes production testing via a production test serial interface. After the production test is complete, the production test serial interface is converted to an application serial interface, and application testing is performed via the application serial interface. However, the serial interface in this embodiment can be used for both production and application testing. This means that in this embodiment, the test mode is determined directly by determining whether a flag file exists in the read-write configuration partition, rather than switching between test modes via a hardware interface.

[0036] In an optional embodiment, after sending a conversion instruction to the storage device through the serial port interface, the method further includes: when it is determined that the conversion instruction is sent successfully, determining whether the flag file exists in the readable and writable configuration partition, wherein the conversion instruction includes at least one of the following: clearing the flag file in the readable and writable configuration partition, resetting the readable and writable configuration partition; when it is determined that the flag file does not exist in the readable and writable configuration partition, determining that the test mode of the integrated chip is the application mode.

[0037] When the production test process is completed and the test results are confirmed to be qualified, the integrated chip will send a conversion instruction to the storage device. The storage device receives and parses the conversion instruction to execute the conversion logic in the conversion instruction, wherein the above-mentioned conversion instruction includes at least one of the following: clearing the flag file in the readable and writable configuration partition and resetting the configurable partition. Clearing the flag file in the readable and writable configuration partition and resetting the configurable partition in the conversion instruction both mean that the flag file no longer exists in the configurable partition. Therefore, when the storage device completes the execution of the conversion instruction, the integrated chip once again determines whether there is a flag file in the readable and writable configuration partition. When it is determined that there is no flag file in the readable and writable configuration partition, the test mode of the integrated chip is converted from production test mode to application mode.

[0038] In an optional embodiment, the production test logic includes at least one of the following: verifying the media access control address preset in the integrated chip through the serial port interface, wherein the verification includes at least one of the following: verifying whether the format of the media access control address conforms to the target format, and determining whether the media access control address is a valid unique address; determining whether the firmware version currently running on the integrated chip is the target version through the serial port interface; scanning the signal strength of available wireless access points within a preset range, and determining whether the signal strength is greater than or equal to a preset value.

[0039] The MAC address is a unique hardware identifier for network devices, ensuring that the integrated circuit (IC) can be correctly identified and communicate within the network. The MAC address is typically a 48-bit hexadecimal number, represented as six groups of two-digit hexadecimal numbers separated by colons or dashes, for example: 00:1A:2B:3C:4D:5E or 00-1A-2B-3C-4D-5E. During the generation test, the IC checks whether the read MAC address conforms to this format. It also compares the read MAC address with a preset value or a record in a database to ensure there are no duplicates, thus avoiding address conflicts within the network.

[0040] This test queries the current firmware version of the integrated circuit through the serial port to ensure that the correct firmware version is loaded on the integrated circuit. The correct firmware version is the basis for the operational stability and functional integrity of the integrated circuit. This test can avoid subsequent problems caused by incorrect firmware versions, such as missing functions and compatibility issues.

[0041] When the integrated chip is designed to scan for wireless access points, the integrated chip searches for wireless network signals within a preset range through its built-in wireless transceiver (such as a Wi-Fi or Bluetooth module). The integrated chip records the signal strength of each wireless access point and compares it with a preset value (such as -70dBm). If the signal strength of the wireless access point is higher than or equal to this preset value, then the wireless access point is considered available, that is, the integrated chip can establish a stable connection with it and exchange data. On the contrary, if the signal strength is lower than -70dBm, then the wireless access point will be considered to have a signal quality that is too poor to maintain a stable connection, and is therefore marked as unavailable.

[0042] By executing the above production test logic, it is possible to ensure that the integrated chip has key network communication capabilities and the correct firmware version before leaving the factory, while verifying the validity and uniqueness of the media access control address.

[0043] In an optional embodiment, after starting the production test logic corresponding to the production test mode in the integrated firmware, the method further includes: obtaining a first test result obtained by executing the production test logic; pausing the execution of the production test logic when it is determined that the number of second test results in the first test result reaches a target number, wherein the second test result is a test result that does not meet the test expectations; and sending the production test data corresponding to the second test result to the computer terminal corresponding to the integrated chip through the serial port interface to instruct the computer terminal to generate a test report, wherein the test report is used to instruct the target object to detect the integrated chip according to the test report.

[0044] The production test logic is a series of test procedures designed to verify the proper functioning of various integrated circuit (IC) functions. These tests include, but are not limited to, signal strength verification, media access control (MAC) address verification, and firmware version checking. The first test result refers to the complete set of results obtained after executing these tests. Within the first test results, the second test results specifically refer to those that indicate the IC's functionality does not meet expected standards. The target number is a preset threshold used to determine whether to pause the test process. If the cumulative number of second test results reaches this target number, it indicates that the IC has a significant number of test items that do not meet production standards. The test process should be paused to avoid wasting resources or time on ICs that may have serious problems. Once a pause is determined, the IC sends all second test results and related production test data via a serial port to a computer terminal connected to the IC. This production test data includes specific test items, test values, expected values, and the reason for the test failure. After receiving the second test results and test data, the computer terminal generates a detailed test report. This test report instructs production line personnel or quality control to conduct further inspection and processing of ICs with test failures.

[0045] In an optional embodiment, after controlling the test mode of the integrated chip to switch from the production test mode to the application mode through the conversion instruction, the method further includes: sending a confirmation authorization request to the computer terminal corresponding to the integrated chip, wherein the confirmation authorization request is used to confirm to the computer terminal whether the integrated chip is authorized to call the application test logic; and upon receiving the authorization permission notification sent by the computer terminal based on the confirmation authorization request, executing the application test logic corresponding to the application mode.

[0046] Before conducting application testing, the integrated chip sends an authorization confirmation request to the computer terminal it's communicating with. This authorization confirmation request verifies that permission to call and execute the application test logic has been granted. Upon receiving the authorization confirmation request, the computer terminal determines whether to allow the integrated chip to proceed with the next step of application testing based on its internal authorization management logic and security policies. If the computer terminal sends an authorization permission notification, it confirms that the chip's authorization status has been verified and that the application test logic can be safely executed. Upon receiving the authorization permission notification, the integrated chip executes the application test logic corresponding to the application mode.

[0047] In an optional embodiment, after executing the application test logic corresponding to the application mode, the method further includes: determining a third test result obtained by executing the application test logic; if all test results in the third test result meet the test expectations, sending a qualified notification to the computer terminal through the serial port interface to instruct the computer terminal to send a qualified report to the target object, wherein the qualified report is used to notify the target object that the integrated chip meets the preset standards.

[0048] After completing production testing and switching to application mode, the integrated chip executes a series of application testing logic that more closely resembles user scenarios. These application tests include, but are not limited to, voice recognition accuracy, audio playback quality, network connection stability, and response speed. The third test result is a collection of all data and results obtained from these application tests. This third test result reflects the functional performance and reliability of the integrated chip in application mode. If all test items in the third test result meet or exceed test expectations, meaning the integrated chip's performance in the application test meets the preset standards, the integrated chip will send a pass notification to the computer terminal via the serial port. This pass notification indicates that the integrated chip has passed comprehensive application testing and is in good working condition, meeting design requirements. After receiving the pass notification, the computer terminal generates a pass report. This pass report summarizes the test results of the integrated chip, including all data from production and application testing, as well as a conclusion that the chip meets the preset standards. Through these reports, the target user confirms that the integrated chip has passed all tests, meets the preset standards, and is safe for use or further processing.

[0049] In an optional embodiment, after determining whether there is a flag file in the readable and writable configuration partition set in the storage device, the method further includes: when it is determined that the flag file does not exist in the readable and writable configuration partition, determining that the test mode of the integrated chip is an application mode, and starting the application test logic corresponding to the application mode in the integrated firmware.

[0050] During the integrated chip's startup process, the chip checks the read-write configuration partition in the storage device for a flag file. If the flag file is not found in the read-write configuration partition, the chip determines that the current test mode is application mode. Once the test mode is determined to be application mode, the chip initiates the application test logic corresponding to the application mode in the integrated firmware. The application test logic includes a series of test programs to verify the chip's functionality, performance, and compatibility in a real user environment. For example, these tests include voice recognition accuracy, audio playback quality, network connection stability, and other key functional tests directly related to the user experience.

[0051] In order to better understand the process of the above-mentioned test mode conversion method, the process of the above-mentioned test mode conversion implementation method is described below in combination with an optional embodiment, but it is not used to limit the technical solution of the embodiment of this application.

[0052] Figure 3 FIG. 1 is a first memory device partition diagram of a test mode conversion method according to an optional embodiment of the present invention, such as Figure 3 As shown, specifically including the following:

[0053] In traditional voice integrated circuit (IC) designs, the IC's memory is divided into multiple partitions to store different firmware, file systems, and configuration information. These partitions include: BOOT: Stores the bootloader, used to initialize the hardware and load firmware from other partitions. APP: Stores application firmware, which is used during normal operation of the IC and contains code for core functions such as voice recognition and audio processing. FileSystem: The file system partition stores non-firmware data such as user data, audio files, and configuration files. CFG: The configuration information partition stores the IC's operating parameters and configuration information. BOOT_OTA: The bootloader partition used for over-the-air (OTA) updates, allowing the IC to receive and apply software updates over the wireless network. APP_OTA: The application firmware partition used for OTA updates, to which the new IC firmware version is downloaded. FileSystem_OTA: Stores file system data after OTA updates. CFG_OTA: Stores configuration information updated via OTA.

[0054] It should be clear that the two partitions CFG and CFG_OTA are used to store configuration files. In the traditional burning process, they will not write anything during the production stage. The reason is that the configuration files usually contain personalized or dynamically adjusted parameters, such as network settings, user ID, preset parameters, etc. This information is unknown at the time of production and needs to be initialized through the network or user input when the integrated chip is activated or the user uses it for the first time. Therefore, in the production stage, in addition to the CFG and CFG_OTA partitions, other partitions such as BOOT, APP, FileSystem, BOOT_OTA, APP_OTA, FileSystem_OTA, etc. will be written with corresponding data. However, this method means that most of the space of the storage device will be occupied when the firmware is burned, resulting in a longer burning time, and it is necessary to switch the test mode through a specific serial port interface during testing, which increases the complexity and cost of the test.

[0055] Figure 4 FIG. 1 is a first flow chart of a method for converting a test mode according to an optional embodiment of the present invention, as shown in FIG. Figure 4 As shown, specifically including the following:

[0056] Step S402: Before soldering the integrated chip, the integrated firmware containing production test and application functions is burned into the various partitions of the storage device. The storage device is located on the integrated chip. The CFG and CFG_OTA partitions of the storage device are used to store configuration files and will not be written to anything. However, other partitions such as BOOT, APP, FileSystem, BOOT_OTA, and APP_OTA will be written with necessary code and data.

[0057] Step S404: When the integrated firmware already exists in the memory device of the integrated chip, the integrated chip is soldered to the circuit board corresponding to the integrated chip to complete the physical assembly and prepare to start the production test mode or application mode after power-on.

[0058] Step S406: After the integrated chip is powered on, the default startup is the production test firmware contained in the APP partition. In production test mode, production testing is performed through the serial port corresponding to the production test firmware, including but not limited to checking preset parameters, querying firmware versions, scanning wireless access point signal strength, checking algorithm authorization status, querying OTA preset addresses, controlling recording and recording data collection, and controlling the playback of swept audio. These tests are designed to verify that the basic functions and performance of the integrated chip meet design specifications.

[0059] Step S408: After the production test is completed, the production test serial port interface used for the production test needs to be converted into an application serial port interface, and the integrated chip switches the test mode to the application mode through the application serial port interface.

[0060] Step S410: Once the integrated chip switches to application mode, application testing can be performed, i.e., functional testing under simulated user scenarios. Application testing includes but is not limited to voice recognition accuracy, audio playback quality, network connection stability, and OTA update capabilities.

[0061] Step S412: If the integrated chip meets the preset standards in all the above test steps and no problems are found, then it can be considered that the integrated chip test is completed and the integrated chip is qualified.

[0062] Figure 3 and Figure 4 The present invention describes the burning content and test process of the integrated chip in the prior art. It can be seen that the firmware burning in the prior art will occupy most of the space of the storage device, and it is necessary to switch the test mode through a specific serial port interface during the test, resulting in a long integrated chip burning time and low test efficiency. In order to solve the technical problems existing in the prior art, this application describes a process of a test mode conversion method. The following describes the process of the above-mentioned test mode conversion implementation method in combination with the optional embodiment, but it is not used to limit the technical solution of the embodiment of this application.

[0063] Figure 5 FIG. 1 is a second memory device partition diagram according to a test mode conversion method according to an optional embodiment of the present invention, such as Figure 5 As shown, specifically including the following:

[0064] The multiple partitions of the storage device in the integrated chip in this embodiment include: BOOT: a boot loader partition, which is used to store the boot code that is executed first at startup. BOOT_OTA: an OTA boot loader partition, which is used to store the code for updating the boot loader. When the integrated chip needs to update its firmware wirelessly, this part of the code will be used to ensure that the integrated chip can safely upgrade from the old boot loader to the new boot loader. APP: an application firmware partition, which stores the firmware that the integrated chip runs in normal application mode, that is, the main program responsible for the operation of all functions of the integrated chip. This partition contains production test and application integration firmware, but in the production stage, it will determine whether to enter application mode or production test mode based on the flag file in the read-write configuration partition. APP_OTA: an OTA application firmware partition, which is used to store application firmware updated wirelessly. When the integrated chip needs to update the application firmware, the new version of the firmware will be downloaded to this partition, and then at the next startup, the boot loader will load the firmware of the APP_OTA partition for operation. FileSystem1: The first file system partition, used to store read-only data and resources of the application, such as speech recognition models, audio files, etc., which will not be changed during operation, ensuring the security of the data and the stable operation of the firmware. FileSystem2: The second file system partition, also used to store read-only data and resources of the application, but it can be marked as a production test file system. During the production test phase, the FileSystem2 partition will be used to store audio files or data related to production testing for use by the production test program. CFG: Read-write configuration partition, used to store data and configuration files that need to be read and written when the integrated chip is running, especially for storing a flag file to indicate whether the integrated chip should enter the production test mode. If there is no flag file, the integrated chip will start and run in application mode.

[0065] and Figure 3 Compared to the multiple partitions in the prior art, this embodiment does not require writing the contents of the APP_OTA partition and the readable and writable configuration partition during production, reducing the amount of firmware to be burned during production testing and improving production efficiency. Furthermore, by integrating production testing functions into the application firmware partition, the need for reserving additional production testing interfaces on the hardware is avoided, simplifying hardware design and reducing costs. Furthermore, by determining whether a flag file exists in the readable and writable configuration partition, the test mode of the integrated chip is determined, simplifying the test process and improving test efficiency and reliability.

[0066] Obviously, the embodiments described above are only part of the embodiments of the present application, not all of the embodiments. In order to better understand the above test mode conversion method, the above process is described below in conjunction with the embodiments, but it is not intended to limit the technical solutions of the embodiments of the present application. Specifically:

[0067] Figure 6 FIG. 1 is a second flow chart of a method for converting a test mode according to an optional embodiment of the present invention, as shown in FIG. Figure 6 As shown, specifically including the following:

[0068] Step S602: The firmware is burned into the storage device. The firmware contains the production test logic corresponding to the production test mode and the application test logic corresponding to the application mode. However, to simplify the production test process, the contents of the APP_OTA partition and the read-write configuration partition are not written to reduce storage space usage and burning time.

[0069] Step S604: soldering the integrated chip to the circuit board corresponding to the integrated chip to complete the physical assembly and prepare to start the production test mode or application mode after power-on.

[0070] Step S606: The integrated chip determines whether the module should enter production test mode by checking whether a flag file exists in the read-write configuration partition. If the flag file exists in the read-write configuration partition, the integrated chip enters production test mode and executes the corresponding production test logic. The production test logic includes verifying the integrated chip's preset media access control address, querying the firmware version, scanning the signal strength of wireless access points, querying the algorithm authorization status, and querying the OTA preset address.

[0071] Step S608: When the production test logic is executed, the integrated chip does not need to switch the physical interface, but directly sends a conversion instruction to the storage device through the serial port interface that is the same as the production test mode, and controls the test mode of the integrated chip from the production test mode to the application mode through the conversion instruction, wherein the conversion instruction includes at least one of the following: clearing the flag file in the readable and writable configuration partition, and resetting the readable and writable configuration partition.

[0072] Step S610: If the integrated chip meets the preset standards in all the above test steps and no problems are found, then it can be considered that the integrated chip test is completed and the integrated chip is qualified.

[0073] Figure 7 FIG3 is a third flow chart of a method for converting a test mode according to an optional embodiment of the present invention, as shown in FIG3. Figure 7 As shown, specifically including the following:

[0074] When the integrated chip is soldered to the circuit board and the power-on mode is started, the integrated chip is determined to enter the production test mode by determining whether there is a flag file in the read-write configuration partition. If the flag file exists in the read-write configuration partition, it is determined that the integrated chip has entered the production test mode, and the production test logic corresponding to the production test mode in the integrated firmware is started to perform the production test mode tasks. The production test logic includes verifying the preset media access control address of the integrated chip, querying the firmware version, scanning the signal strength of wireless access points, querying the algorithm authorization status, and querying the OTA preset address.

[0075] When the production test logic is executed (equivalent to the end of the production test mode in the figure), a conversion instruction is sent to the storage device through the serial port interface, wherein the conversion instruction includes at least one of the following: clearing the flag file in the readable and writable configuration partition, and resetting the readable and writable configuration partition. When the storage device completes the execution of the conversion instruction, the flag file no longer exists in the readable and writable configuration partition (equivalent to the clearing of the production test mode flag in the figure), and the integrated chip is restarted at this time, and it is determined again whether the flag file exists in the readable and writable configuration partition. If the flag file does not exist in the readable and writable configuration partition, it is determined that the integrated chip enters the application mode, and the application test logic corresponding to the application mode in the integrated firmware is started to execute the application mode task.

[0076] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), including a number of instructions for enabling a terminal device (which can be a mobile phone, computer, operating terminal, or network device, etc.) to execute the methods of each embodiment of the present application.

[0077] Figure 8 is a structural block diagram of a test mode conversion device according to an embodiment of the present application; Figure 8 Shown, including:

[0078] a determination module 80, configured to determine whether a flag file exists in a readable and writable configuration partition of the storage device, wherein the flag file is used to determine a test mode of the integrated chip;

[0079] A startup module 82 is configured to, upon determining that the flag file exists in the readable and writable configuration partition, determine that the test mode of the integrated chip is a production test mode, and start the production test logic corresponding to the production test mode in the integrated firmware;

[0080] The conversion module 84 is configured to send a conversion instruction to the memory device via a serial port interface when the production test logic is executed, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

[0081] In an embodiment of the present application, it is determined whether a flag file exists in the readable and writable configuration partition of the storage device, wherein the flag file is used to determine the test mode of the integrated chip; if it is determined that the flag file exists in the readable and writable configuration partition, the test mode of the integrated chip is determined to be the production test mode, and the production test logic corresponding to the production test mode in the integrated firmware is started; if the production test logic is executed, a conversion instruction is sent to the storage device via the serial port interface to control the test mode of the integrated chip to switch from the production test mode to the application mode through the conversion instruction. The above technical solution solves the problem of long integrated chip burning time and low test efficiency in the related art.

[0082] In an optional embodiment, the conversion module 84 is further used to determine whether the flag file exists in the readable and writable configuration partition when it is determined that the conversion instruction is sent successfully, wherein the conversion instruction includes at least one of the following: clearing the flag file in the readable and writable configuration partition, resetting the readable and writable configuration partition; and when it is determined that the flag file does not exist in the readable and writable configuration partition, determining that the test mode of the integrated chip is the application mode.

[0083] In an optional embodiment, the startup module 82 is further configured to verify the media access control address preset in the integrated chip through the serial port interface, wherein the verification includes at least one of the following: verifying whether the format of the media access control address conforms to the target format, and determining whether the media access control address is a valid unique address; determining whether the firmware version currently running on the integrated chip is the target version through the serial port interface; and scanning the signal strength of available wireless access points within a preset range, and determining whether the signal strength is greater than or equal to a preset value.

[0084] In an optional embodiment, the startup module 82 is also used to obtain a first test result obtained by executing the production test logic; when it is determined that the number of second test results in the first test result reaches a target number, suspend the execution of the production test logic, wherein the second test result is a test result that does not meet the test expectations; and send the production test data corresponding to the second test result to the computer terminal corresponding to the integrated chip through the serial port interface to instruct the computer terminal to generate a test report, wherein the test report is used to instruct the target object to detect the integrated chip according to the test report.

[0085] In an optional embodiment, the conversion module 84 is further used to send a confirmation authorization request to the computer terminal corresponding to the integrated chip, wherein the confirmation authorization request is used to confirm to the computer terminal whether the integrated chip is authorized to call the application test logic; upon receiving the authorization permission notification sent by the computer terminal based on the confirmation authorization request, the application test logic corresponding to the application mode is executed.

[0086] In an optional embodiment, the conversion module 84 is further used to determine a third test result obtained by executing the application test logic; when all test results in the third test result meet the test expectations, a qualified notification is sent to the computer terminal through the serial port interface to instruct the computer terminal to send a qualified report to the target object, wherein the qualified report is used to notify the target object that the integrated chip meets the preset standards.

[0087] In an optional embodiment, the determination module 80 is further used to determine that the test mode of the integrated chip is the application mode when it is determined that the flag file does not exist in the readable and writable configuration partition, and to start the application test logic corresponding to the application mode in the integrated firmware.

[0088] An embodiment of the present application further provides a storage medium, which includes a stored program, wherein the program executes any of the above methods when it is run.

[0089] Optionally, in this embodiment, the storage medium may be configured to store program codes for executing the following steps:

[0090] S1, determining whether a flag file exists in a readable and writable configuration partition of the storage device, wherein the flag file is used to determine a test mode of the integrated chip;

[0091] S2, when it is determined that the flag file exists in the readable and writable configuration partition, determining that the test mode of the integrated chip is a production test mode, and starting the production test logic corresponding to the production test mode in the integrated firmware;

[0092] S3, when the production test logic is executed, sending a conversion instruction to the memory device through the serial port interface, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

[0093] An embodiment of the present application further provides an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0094] Optionally, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.

[0095] Optionally, in this embodiment, the processor may be configured to execute the following steps through a computer program:

[0096] S1, determining whether a flag file exists in a readable and writable configuration partition of the storage device, wherein the flag file is used to determine a test mode of the integrated chip;

[0097] S2, when it is determined that the flag file exists in the readable and writable configuration partition, determining that the test mode of the integrated chip is a production test mode, and starting the production test logic corresponding to the production test mode in the integrated firmware;

[0098] S3, when the production test logic is executed, sending a conversion instruction to the memory device through the serial port interface, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

[0099] Optionally, in this embodiment, the above-mentioned storage medium may include but is not limited to: a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk, and other media that can store program codes.

[0100] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any one of the above method embodiments are implemented.

[0101] An embodiment of the present application further provides another computer program product, comprising a non-volatile computer-readable storage medium, wherein the non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of any of the above method embodiments are implemented.

[0102] An embodiment of the present application also provides a computer program, which includes computer instructions, which are stored in a computer-readable storage medium; a processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device performs the steps of any of the above method embodiments.

[0103] Optionally, specific examples in this embodiment may refer to the examples described in the above embodiments and optional implementation modes, and this embodiment will not be described in detail here.

[0104] Obviously, those skilled in the art should understand that the modules or steps of the present application described above can be implemented using a general-purpose computing device, they can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices. Alternatively, they can be implemented using program code executable by the computing device, so that they can be stored in a storage device and executed by the computing device. In some cases, the steps shown or described can be performed in a different order than herein, or they can be made into separate integrated circuit modules, or multiple modules or steps can be made into a single integrated circuit module for implementation. Thus, the present application is not limited to any specific combination of hardware and software.

[0105] The above is only a preferred embodiment of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. A test mode conversion method, characterized in that: Applied to an integrated chip, an integrated firmware is burned into the memory device of the integrated chip, and the integrated firmware contains production test logic corresponding to the production test mode and application test logic corresponding to the application mode, including: Determining whether a flag file exists in a readable and writable configuration partition of the storage device, wherein the flag file is used to determine a test mode of the integrated chip; When it is determined that the flag file exists in the readable and writable configuration partition, determining that the test mode of the integrated chip is a production test mode, and starting the production test logic corresponding to the production test mode in the integrated firmware; When the production test logic is executed, a conversion instruction is sent to the memory device through the serial port interface, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

2. The test mode conversion method according to claim 1, characterized in that: After sending the conversion instruction to the storage device through the serial port interface, the method further includes: If it is determined that the conversion instruction is sent successfully, determining whether the flag file exists in the readable and writable configuration partition, wherein the conversion instruction includes at least one of the following: clearing the flag file in the readable and writable configuration partition, resetting the readable and writable configuration partition; When it is determined that the flag file does not exist in the readable and writable configuration partition, the test mode of the integrated chip is determined to be the application mode.

3. The test mode conversion method according to claim 1, characterized in that: The production test logic includes at least one of the following: Verifying the media access control address preset by the integrated chip through the serial port interface, wherein the verification includes at least one of the following: verifying whether the format of the media access control address conforms to a target format, and determining whether the media access control address is a valid and unique address; Determining, through the serial port interface, whether the firmware version currently running on the integrated chip is the target version; Scan the signal strengths of available wireless access points within a preset range and determine whether the signal strengths are greater than or equal to a preset value.

4. The test mode conversion method according to claim 1, characterized in that: After starting the production test logic corresponding to the production test mode in the integrated firmware, the method further includes: Obtaining a first test result obtained by executing the production test logic; pausing execution of the production test logic if it is determined that the number of second test results in the first test results reaches a target number, wherein the second test results are test results that do not meet test expectations; The production test data corresponding to the second test result is sent to the computer terminal corresponding to the integrated chip through the serial port interface to instruct the computer terminal to generate a test report, wherein the test report is used to instruct the target object to detect the integrated chip according to the test report.

5. The test mode conversion method according to claim 1, characterized in that: After controlling the test mode of the integrated chip to switch from the production test mode to the application mode through the conversion instruction, the method further includes: Sending a confirmation authorization request to a computer terminal corresponding to the integrated chip, wherein the confirmation authorization request is used to confirm with the computer terminal whether the integrated chip is authorized to call the application test logic; Upon receiving the authorization permission notification sent by the computer terminal based on the authorization confirmation request, the application test logic corresponding to the application mode is executed.

6. The test mode conversion method according to claim 5, characterized in that: After executing the application test logic corresponding to the application mode, the method further includes: determining a third test result obtained by executing the application test logic; When all the test results in the third test result meet the test expectations, a qualified notification is sent to the computer terminal through the serial port interface to instruct the computer terminal to send a qualified report to the target object, wherein the qualified report is used to notify the target object that the integrated chip meets the preset standards.

7. The test mode conversion method according to claim 1, characterized in that: After determining whether a flag file exists in the readable and writable configuration partition of the storage device, the method further includes: When it is determined that the flag file does not exist in the readable and writable configuration partition, the test mode of the integrated chip is determined to be the application mode, and the application test logic corresponding to the application mode in the integrated firmware is started.

8. A test mode conversion device, characterized in that: include: a determination module, configured to determine whether a flag file exists in a readable and writable configuration partition of the storage device, wherein the flag file is used to determine a test mode of the integrated chip; a startup module configured to, upon determining that the flag file exists in the readable and writable configuration partition, determine that the test mode of the integrated chip is a production test mode, and start the production test logic corresponding to the production test mode in the integrated firmware; The conversion module is used to send a conversion instruction to the storage device through a serial port interface when the production test logic is executed, so as to control the test mode of the integrated chip to be converted from the production test mode to the application mode through the conversion instruction.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored program, wherein the method according to any one of claims 1 to 7 is executed when the program is executed.

10. An electronic device comprising a memory and a processor, characterized in that: A computer program is stored in the memory, and the processor is configured to execute the method according to any one of claims 1 to 7 through the computer program.

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