Line fault analysis method and system based on 112 measuring table

Abstract

The invention discloses a line fault analysis method and system based on a 112 measuring table, and the method comprises the steps: obtaining roll-call test configuration data, carrying out the fault analysis of equipment according to the roll-call test configuration data, obtaining a first fault analysis result, obtaining a first time period parameter of routine test configuration, and obtaining a second time period parameter of routine test configuration; and performing fault analysis on the equipment according to the first time period parameter to obtain a second fault analysis result, obtaining a second time period parameter of dynamic test configuration, and performing fault analysis on the equipment according to the first time period parameter to obtain a third fault analysis result. Therefore, the user line can be tested, so that the fault reason can be accurately found out and repaired.

Description

Technical Field

[0001] The present invention belongs to the technical field of telephone line faults, and in particular relates to a line fault analysis method and system based on a 112 measurement station. Background Art

[0002] The 112 measurement system is primarily used for routine fault measurement in telecommunications departments. It measures and analyzes user circuits to identify line and telephone faults or operational errors. The system tests parameters such as line voltage, insulation resistance, capacitance, loop resistance, and current, and analyzes these parameters to determine if there are any line faults. It also tests the dialing performance, ringing / on / off functions, and hang-up reminder tones of user telephones to determine if there are any faults. Summary of the Invention

[0003] The present invention provides a line fault analysis method and system based on a 112 measuring station, which are used to solve the technical problem of being unable to determine the cause of a telephone fault.

[0004] In a first aspect, the present invention provides a line fault analysis method based on a 112 measurement station, comprising:

[0005] Obtaining roll call test configuration data, performing a fault analysis on the device according to the roll call test configuration data, and obtaining a first fault analysis result;

[0006] Obtaining a first time period parameter of a routine test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a second fault analysis result;

[0007] Obtaining a second time period parameter of a dynamic test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a third fault analysis result;

[0008] The first fault analysis result, the second fault analysis result, and the third fault analysis result are uploaded and an early warning is issued.

[0009] In a second aspect, the present invention provides a line fault analysis system based on a 112 measurement station, comprising:

[0010] A first analysis module is configured to obtain roll call test configuration data, perform fault analysis on the device according to the roll call test configuration data, and obtain a first fault analysis result;

[0011] a second analysis module configured to obtain a first time period parameter of a routine test configuration, perform a fault analysis on the device according to the first time period parameter, and obtain a second fault analysis result;

[0012] a third analysis module configured to obtain a second time period parameter of the dynamic test configuration, perform a fault analysis on the device according to the first time period parameter, and obtain a third fault analysis result;

[0013] The uploading module is configured to upload the first fault analysis result, the second fault analysis result and the third fault analysis result and issue an early warning.

[0014] According to a third aspect, an electronic device is provided, comprising: at least one processor, and a memory communicatively connected to the at least one processor, wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the steps of the line fault analysis method based on the 112 measuring station according to any embodiment of the present invention.

[0015] In a fourth aspect, the present invention further provides a computer-readable storage medium having a computer program stored thereon. When the program instructions are executed by a processor, the processor executes the steps of the line fault analysis method based on the 112 measurement station of any embodiment of the present invention.

[0016] The line fault analysis method and system based on the 112 measuring station of the present application, when a user's phone fails, obtains roll-name test configuration data, performs fault analysis on the device according to the roll-name test configuration data, obtains a first fault analysis result, obtains a first time period parameter of the routine test configuration, performs fault analysis on the device according to the first time period parameter, obtains a second fault analysis result, obtains a second time period parameter of the dynamic test configuration, performs fault analysis on the device according to the first time period parameter, obtains a third fault analysis result, and can test the user line, thereby more accurately finding the cause of the fault and repairing it. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following is a brief introduction to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 A flow chart of a line fault analysis method based on a 112 measurement station provided in one embodiment of the present invention;

[0019] Figure 2 A structural block diagram of a line fault analysis system based on a 112 measurement station provided in one embodiment of the present invention;

[0020] Figure 3It is a structural diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0021] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0022] See also Figure 1 , which shows a flow chart of a line fault analysis method based on a 112 measurement station of the present application.

[0023] like Figure 1 As shown, the line fault analysis method based on the 112 measurement station specifically includes the following steps:

[0024] Step S101: Acquire roll-name test configuration data, perform fault analysis on the device according to the roll-name test configuration data, and obtain a first fault analysis result.

[0025] In this step, the user on the network management side performs a roll call test and determines whether there are other voice channels that are performing roll call tests.

[0026] If yes, the current roll call test can be optionally added to the test queue;

[0027] If not, the MCU side determines whether there are other channels undergoing roll call testing;

[0028] If yes, then return the network management side operation failure, otherwise update the roll call test status to in progress and return the network management side operation success;

[0029] The MCU sends a roll call test message and carries the forced test status to the FXS side, and the FXS side starts collecting roll call test data.

[0030] Determine whether data collection is completed;

[0031] If completed, an interrupt is directly triggered to request the MCU to obtain the collection results. Otherwise, it is determined whether the forced test state is no and whether there is an off-hook or incoming call;

[0032] If not, continue collecting, otherwise the record status is off-hook to terminate the collection, and trigger an interrupt, request the MCU side to obtain the collection results, and reply the collection results to the MCU side and the network management side in turn, and perform fault analysis.

[0033] It should be noted that the MCU side determines whether the collection result is completed;

[0034] If not completed, fill in the off-hook termination status, otherwise fill in the collection completion status and data, and send it to the network management side, and the network management side judges the collection result;

[0035] If the off-hook is terminated, a pop-up window will prompt "Do you want to perform a forced test?"

[0036] If the collection timeout occurs, the message "Collection timeout" will be displayed;

[0037] If the data collection is completed, the fault analysis results will be presented.

[0038] Step S102: obtaining a first time period parameter of a routine test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a second fault analysis result.

[0039] In this step, the user configures the routine test cycle on the network management side and updates the routine test cycle on the MCU side;

[0040] Determine whether a roll call test operation has been performed on the MCU side;

[0041] If yes, determine whether the routine collection time has arrived;

[0042] If it arrives, it will be added to the collection queue, otherwise it will continue to wait;

[0043] If not, a row is taken from the collection queue to perform the collection action and routine data collection is performed on the FXS side;

[0044] Determine whether data collection is completed;

[0045] If completed, an interrupt is directly triggered to request the MCU to obtain the collection results. Otherwise, it is determined whether the forced test state is no and whether there is an off-hook or incoming call;

[0046] If not, continue collecting, otherwise the record status is off-hook to terminate the collection, and trigger an interrupt, request the MCU side to obtain the collection results, and reply the collection results to the MCU side and the network management side in turn, and perform fault analysis.

[0047] It should be noted that the MCU side determines whether the collection result is completed;

[0048] If not completed, fill in the off-hook termination status, otherwise fill in the collection completion status and data, and send it to the network management side, and the network management side judges the collection result;

[0049] If the off-hook is terminated, the off-hook in the storage is terminated;

[0050] If the collection timeout occurs, the storage collection timeout occurs;

[0051] If the collection is completed, the fault analysis results will be stored in the database.

[0052] Step S103: obtaining a second time period parameter of the dynamic test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a third fault analysis result.

[0053] In this step, the user configures dynamic test enable on the network management side, updates the dynamic test enable on the MCU side, and sends the dynamic test enable to the FXS side.

[0054] Determining, on the FXS side, whether a roll call test or a routine test is currently being performed;

[0055] If so, determine whether the enabled voice channel changes from off-hook to on-hook;

[0056] If so, the phone capacitance is collected, and after the collection is completed, an interrupt is triggered to request the MCU side to obtain the collection result;

[0057] The collected results are then returned to the MCU and the network management side in turn, and fault analysis is performed.

[0058] It should be noted that the acquisition completion status and data are filled in on the MCU side, and the acquisition result is judged on the network management side;

[0059] If the collection timeout occurs, the message "Collection timeout" will be displayed;

[0060] If the data collection is completed, the fault analysis results will be presented.

[0061] Step S104: Upload the first fault analysis result, the second fault analysis result, and the third fault analysis result and issue an early warning.

[0062] In summary, the method of the present application, when a user's phone fails, obtains roll-name test configuration data, performs fault analysis on the device according to the roll-name test configuration data, obtains a first fault analysis result, obtains a first time period parameter of a routine test configuration, performs fault analysis on the device according to the first time period parameter, obtains a second fault analysis result, obtains a second time period parameter of a dynamic test configuration, performs fault analysis on the device according to the first time period parameter, obtains a third fault analysis result, and can test the user line, thereby more accurately finding the cause of the fault and repairing it.

[0063] In a specific embodiment, a method based on 112 measurements includes dynamic testing, routine testing, and roll call testing:

[0064] Roll call test: Select a phone number and voice channel number for testing. The system reads data such as the user's external line resistance, capacitance, voltage, and phone resistance and capacitance from the device. The system analyzes fault scenarios such as parallel operation, short circuit, ground contact, and disconnection based on the read data. The analyzed faults are displayed on the system interface and reported as alarms in the system.

[0065] Routine test: It supports setting the test time period. When the specified time is reached, the system collects data from the device, analyzes the collected data, and reports an alarm.

[0066] Dynamic test: It is characterized by automatic testing when the user hangs up. However, if the user picks up the phone during the test, the test will be stopped immediately within 50ms and the dial tone will be restored. When a parallel connection is detected, there will be a sound prompt and an alarm will be reported.

[0067] Specifically: Network devices are responsible for:

[0068] Receive 112 measurement system instructions and perform roll call test, routine test or "forced test" roll call test data collection

[0069] Receive and record routine test cycle configuration issued by 112 measurement system

[0070] Receive and record the dynamic test enable status issued by the 112 measurement system

[0071] Record the collected roll call test, routine test and dynamic test data and collection status, and trap them to the network management. At the same time, they can be used by the 112 measurement system to query related items.

[0072] 112 Measurement System is responsible for:

[0073] Select phone numbers and voice channel numbers for roll call testing, routine testing, and dynamic testing configuration

[0074] Routine time can be configured: a certain time period per month, a certain time period per week, a certain time period per day; each channel supports 1 time period

[0075] Receive and query the collected data and status of network equipment's roll call test, routine test and dynamic test, and present

[0076] If the user picks up the phone during the roll call test, a pop-up window will appear to prompt the customer to confirm whether to "force the test"

[0077] Support 112 measurement strategy template configuration

[0078] Support 112 measurement fault analysis and fault alarm pop-up window

[0079] 112 Measurement and Collection Content

[0080] DC voltage (AB, AG, BG), AC voltage (AB, AG, BG), resistance (AB, AG, BG), line capacitance (AB, AG, BG), phone capacitance

[0081] 112 measurement acquisition method

[0082] Roll Call Test

[0083] Select a phone number and voice channel number for roll call test

[0084] "Off-hook, optional forced test": The network management system supports a pop-up window prompting the customer to confirm whether to "force the test" (the purpose is to avoid failure to start the test in a short-circuit scenario);

[0085] Return data within 15 seconds

[0086] Routine testing

[0087] Select a phone number and voice channel number for routine test configuration

[0088] Routine time can be configured: a certain time period per month, a certain time period per week, a certain time period per day

[0089] "Skip if busy": Skip the data if busy and record "user busy" without automatically delaying the data collection.

[0090] Dynamic testing

[0091] Supports opening and closing dynamic test functions for phone numbers and voice channel numbers

[0092] Return data within 15 seconds

[0093] Make it as user-unaware as possible

[0094] Failure Analysis

[0095] The following faults can be analyzed: short circuit, parallel operation, unconnected phone, line A touching ground, line B touching ground, line A touching electricity, line B touching electricity, line A mixed with other lines, line B mixed with other lines, poor insulation of lines AB, poor insulation of line A, poor insulation of line B, and line break. The 112 measurement system uses the following methods and formulas to calculate the fault analysis results based on the reported collected information.

[0096] The specific analysis method is as follows:

[0097] External line test management

[0098] Global configuration:

[0099] The system sends these time task configuration parameters to the device business process:

[0100]

[0101] Before the network management sends the test cycle configuration to the device, the device time must be synchronized first;

[0102] The configuration data is successfully added to the network management database after the device is sent;

[0103] The interface displays the newly added configuration data.

[0104] Roll Call Test

[0105] Currently, the device sends the test result data to the network administrator in the form of Trap messages, so the network administrator also needs to make corresponding modifications.

[0106] Business Process

[0107] The network management server sends the roll call test configuration data to the device;

[0108] The network management receives the test result data sent by the device;

[0109] Analyze the received data;

[0110] If the data returned indicates "off-hook during test", a prompt box will pop up on the network management interface, asking the user to choose whether to perform "force test". If "OK" is selected, the above process will be repeated.

[0111] If the data return status is normal, the data will be stored in the network management database;

[0112] The network management server sends information to the network management interface, and the interface displays the data.

[0113] To improve efficiency and address device-side limitations, only one port test command can be issued at a time. The next command can only be issued after the test on that port is complete. The 112 measurement system needs to implement prompts and restrictions.

[0114] Since data collection between the 112 measurement system and devices is performed via UDP messages, the advantage of UDP messages is their high transmission speed, but their disadvantage is that messages can be easily lost due to network issues and other objective reasons. To ensure the accuracy of the 112 measurement system, a UDP data collection method has been added to effectively receive and collect data. After issuing a roll call test command to a device, if the system does not receive a message from the device within 30 seconds, it will be considered a timeout and the system will initiate a timeout mechanism. The so-called timeout mechanism means that when the timeout period is reached, the 112 measurement system will proactively query the device for data, no longer waiting for a response from the device.

[0115] Routine testing

[0116] Business Process

[0117] The network management server sends the time period parameters of routine test configuration to the device;

[0118] The network management receives the test result data sent by the device;

[0119] Analyze the received data;

[0120] If the data return status is normal, the data will be stored in the network management database;

[0121] The network management server sends information to the network management interface, and the interface displays the data.

[0122] Dynamic testing

[0123] Business Process

[0124] The network management server sends the time period parameters of the dynamic test configuration to the device;

[0125] The network management receives the test result data sent by the device;

[0126] Analyze the received data;

[0127] If the data return status is normal, the data will be stored in the network management database;

[0128] The network management server sends information to the network management interface, and the interface displays the data.

[0129] health records

[0130] Since in fault analysis, the data collected from the equipment side must be compared with a healthy and fault-free data comparison formula to draw a fault conclusion, a group of healthy and fault-free data needs to be saved in the 112 measurement system.

[0131] Manually create health records

[0132] Manually select a healthy data without faults and set it as a healthy file.

[0133] Automatically create health records

[0134] Function Implementation

[0135] 1) Trap message reporting

[0136] After the user hangs up, if the port status is no status or cleared, and the data is preliminarily checked to be correct, the device sends the collected health record information to the 112 measurement system.

[0137] 2) Early morning synchronization

[0138] When trap messages are lost and the NMS and device health records are out of sync, a scheduled task is run every morning to perform the synchronization method.

[0139] 3) Download and modify health records

[0140] The 112 measurement system has a health record download function.

[0141] process:

[0142] Generate files;

[0143] FTP downloads files to the device;

[0144] Notify device to sync.

[0145] Health record status query

[0146] 1) Health record status query

[0147] a) Filed

[0148] b) The file has been deleted;

[0149] c) No file has been created;

[0150] d) Failure in file creation;

[0151] Health record reconstruction process

[0152] When the user queries the health file value of the current port and finds a fault, (after troubleshooting), he can perform "fault repair";

[0153] The process is as follows:

[0154] 1) The network management clears the health file value of the current port;

[0155] 2) Send the device to re-establish the health record;

[0156] 3) Wait for the health record result. (Wait for the trap message)

[0157] Exception handling

[0158] Since all data from the 112 measurement system is sent to the system via UDP messages, to prevent message loss due to network problems, a collection task is added to the system. This task collects device measurement data every hour and compares it with the existing data in the 112 measurement system. Identical data is discarded, and different data is stored. This synchronizes data between the network management and the device.

[0159] See also Figure 2 , which shows a structural block diagram of a line fault analysis system based on 112 measurement stations of the present application.

[0160] like Figure 2As shown, the line fault analysis system 200 includes a first analysis module 210 , a second analysis module 220 , a third analysis module 230 and an upload module 240 .

[0161] Among them, the first analysis module 210 is configured to obtain roll-name test configuration data, perform fault analysis on the device according to the roll-name test configuration data, and obtain a first fault analysis result; the second analysis module 220 is configured to obtain the first time period parameter of the routine test configuration, perform fault analysis on the device according to the first time period parameter, and obtain a second fault analysis result; the third analysis module 230 is configured to obtain the second time period parameter of the dynamic test configuration, perform fault analysis on the device according to the first time period parameter, and obtain a third fault analysis result; the upload module 240 is configured to upload the first fault analysis result, the second fault analysis result and the third fault analysis result and issue an early warning.

[0162] It should be understood that Figure 2 Modules and references documented in Figure 1 Therefore, the operations and features described above for the method and the corresponding technical effects also apply to Figure 2 The modules in it will not be described in detail here.

[0163] In other embodiments, embodiments of the present invention further provide a computer-readable storage medium having a computer program stored thereon, wherein when the program instructions are executed by a processor, the processor is caused to execute the line fault analysis method based on the 112 measurement station in any of the above method embodiments;

[0164] As an embodiment, the computer-readable storage medium of the present invention stores computer-executable instructions, and the computer-executable instructions are configured as follows:

[0165] Obtaining roll call test configuration data, performing a fault analysis on the device according to the roll call test configuration data, and obtaining a first fault analysis result;

[0166] Obtaining a first time period parameter of a routine test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a second fault analysis result;

[0167] Obtaining a second time period parameter of a dynamic test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a third fault analysis result;

[0168] The first fault analysis result, the second fault analysis result, and the third fault analysis result are uploaded and an early warning is issued.

[0169] The computer-readable storage medium may include a program storage area and a data storage area. The program storage area may store an operating system and application programs required for at least one function; the data storage area may store data generated based on the use of the line fault analysis system based on the 112 measurement station. Furthermore, the computer-readable storage medium may include high-speed random access memory and may also include storage, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, the computer-readable storage medium may optionally include storage remote from the processor. Such remote storage may be connected to the line fault analysis system based on the 112 measurement station via a network. Examples of such networks include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0170] Figure 3 Schematic diagram of the structure of an electronic device provided by an embodiment of the present invention. Figure 3 As shown, the device includes: a processor 310 and a memory 320. The electronic device may also include: an input device 330 and an output device 340. The processor 310, the memory 320, the input device 330 and the output device 340 may be connected via a bus or other means. Figure 3 The example uses a bus connection. Memory 320 is the aforementioned computer-readable storage medium. Processor 310 executes the non-volatile software programs, instructions, and modules stored in memory 320 to execute various server functions and data processing, thereby implementing the line fault analysis method based on the 112 measurement station described in the aforementioned method embodiment. Input device 330 can receive input digital or character information and generate key signal input related to user settings and function control of the line fault analysis system based on the 112 measurement station. Output device 340 can include a display device such as a display screen.

[0171] The electronic device can execute the method provided by the embodiment of the present invention, and has the functional modules and beneficial effects corresponding to the execution method. For technical details not fully described in this embodiment, please refer to the method provided by the embodiment of the present invention.

[0172] As an embodiment, the electronic device is applied to a line fault analysis system based on a 112 measurement station and is used for a client, and includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to:

[0173] Obtaining roll call test configuration data, performing a fault analysis on the device according to the roll call test configuration data, and obtaining a first fault analysis result;

[0174] Obtaining a first time period parameter of a routine test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a second fault analysis result;

[0175] Obtaining a second time period parameter of a dynamic test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a third fault analysis result;

[0176] The first fault analysis result, the second fault analysis result, and the third fault analysis result are uploaded and an early warning is issued.

[0177] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus the necessary general hardware platform, or of course, by hardware. Based on this understanding, the essence of the above technical solution or the part that contributes to the existing technology can be embodied in the form of a software product. The computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, an optical disk, etc., and includes a number of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods of each embodiment or certain parts of the embodiment.

[0178] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A line fault analysis method based on a 112 measurement station, characterized in that: include: Obtaining roll call test configuration data, performing a fault analysis on the device according to the roll call test configuration data, and obtaining a first fault analysis result; Obtaining a first time period parameter of a routine test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a second fault analysis result; Obtaining a second time period parameter of a dynamic test configuration, performing a fault analysis on the device according to the first time period parameter, and obtaining a third fault analysis result; The first fault analysis result, the second fault analysis result, and the third fault analysis result are uploaded and an early warning is issued.

2. A line fault analysis method based on a 112 measurement station according to claim 1, characterized in that: The acquiring of roll-name test configuration data, performing fault analysis on the device according to the roll-name test configuration data, and obtaining a first fault analysis result includes: Perform a roll call test on the network management side and determine whether other channels are undergoing roll call tests. If yes, the current roll call test can be optionally added to the test queue; If not, the MCU side determines whether there are other channels that are undergoing roll call testing; If yes, then return the network management side operation failure, otherwise update the roll call test status to in progress and return the network management side operation success; The MCU sends a roll call test message and carries the forced test status to the FXS side, and the FXS side starts collecting roll call test data. Determine whether data collection is completed; If completed, an interrupt is directly triggered to request the MCU to obtain the collection results. Otherwise, it is determined whether the forced test state is no and whether there is an off-hook or incoming call; If not, continue collecting, otherwise the record status is off-hook to terminate the collection, and trigger an interrupt, request the MCU side to obtain the collection results, and reply the collection results to the MCU side and the network management side in turn, and perform fault analysis.

3. A line fault analysis method based on a 112 measurement station according to claim 2, characterized in that: The step of returning the collected results to the MCU side and the network management side and performing fault analysis includes: Determine whether the acquisition result is completed on the MCU side; If not completed, fill in the off-hook termination status, otherwise fill in the collection completion status and data, and send it to the network management side, and the network management side judges the collection result; If the off-hook is terminated, a pop-up window will prompt "Do you want to perform a forced test?" If the collection timeout occurs, the message "Collection timeout" will be displayed; If the data collection is completed, the fault analysis results will be presented.

4. A line fault analysis method based on a 112 measurement station according to claim 1, characterized in that: The acquiring of the first time period parameter of the routine test configuration, and performing fault analysis on the device according to the first time period parameter to obtain a second fault analysis result includes: The user configures the routine test cycle on the network management side and updates the routine test cycle on the MCU side; Determine whether a roll call test operation has been performed on the MCU side; If yes, determine whether the routine collection time has arrived; If it arrives, it will be added to the collection queue, otherwise it will continue to wait; If not, a row is taken from the collection queue to perform the collection action and routine data collection is performed on the FXS side; Determine whether data collection is completed; If completed, an interrupt is directly triggered to request the MCU to obtain the collection results. Otherwise, it is determined whether the forced test state is no and whether there is an off-hook or incoming call; If not, continue collecting, otherwise the record status is off-hook to terminate the collection, and trigger an interrupt, request the MCU side to obtain the collection results, and reply the collection results to the MCU side and the network management side in turn, and perform fault analysis.

5. A line fault analysis method based on a 112 measurement station according to claim 4, characterized in that: The step of returning the collected results to the MCU side and the network management side and performing fault analysis includes: Determine whether the acquisition result is completed on the MCU side; If not completed, fill in the off-hook termination status, otherwise fill in the collection completion status and data, and send it to the network management side, and the network management side judges the collection result; If the off-hook is terminated, the off-hook in the storage is terminated; If the collection timeout occurs, the storage collection timeout occurs; If the collection is completed, the fault analysis results will be stored in the database.

6. A line fault analysis method based on a 112 measurement station according to claim 1, characterized in that: The acquiring the second time period parameter of the dynamic test configuration, and performing fault analysis on the device according to the first time period parameter to obtain a third fault analysis result includes: Configure dynamic test enable on the NMS side, update the dynamic test enable on the MCU side, and send the dynamic test enable to the FXS side. Determining, on the FXS side, whether a roll call test or a routine test is currently being performed; If so, determine whether the enabled voice channel changes from off-hook to on-hook; If yes, the phone capacitance is collected, and after the collection is completed, an interrupt is triggered to request the MCU to obtain the collection result; The collected results are then returned to the MCU and the network management side in turn, and fault analysis is performed.

7. A line fault analysis method based on a 112 measurement station according to claim 6, characterized in that: The step of returning the collected results to the MCU side and the network management side and performing fault analysis includes: Filling the acquisition completion status and data on the MCU side, and judging the acquisition result on the network management side; If the collection timeout occurs, the message "Collection timeout" will be displayed; If the data collection is completed, the fault analysis results will be presented.

8. A line fault analysis system based on 112 measuring station, characterized in that: include: A first analysis module is configured to obtain roll call test configuration data, perform fault analysis on the device according to the roll call test configuration data, and obtain a first fault analysis result; a second analysis module configured to obtain a first time period parameter of a routine test configuration, perform a fault analysis on the device according to the first time period parameter, and obtain a second fault analysis result; a third analysis module configured to obtain a second time period parameter of the dynamic test configuration, perform a fault analysis on the device according to the first time period parameter, and obtain a third fault analysis result; The uploading module is configured to upload the first fault analysis result, the second fault analysis result and the third fault analysis result and issue an early warning.

9. An electronic device, characterized in that: include: At least one processor, and a memory communicatively connected to the at least one processor, wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

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