Diagnostic method and apparatus for temperature sampling, battery management system, battery device, electric device, storage medium, program product

Abstract

The embodiment of the application provides a temperature sampling diagnosis method and device, a battery management system, a battery device, a power consumption equipment, a storage medium, and a program product. The temperature sampling diagnosis method comprises the following steps: acquiring sampling temperatures of multiple temperature sampling points in a battery device; the sampling temperature of each temperature sampling point is collected by a sampling chip through a corresponding sampling path; at least one group of isothermal points in the multiple temperature sampling points is determined based on a reference temperature distribution of the battery device under a normal working state; based on a size relationship between an absolute value of a difference value between the sampling temperatures of multiple isothermal points in the same group of isothermal points and a difference value threshold, the sampling paths corresponding to the multiple isothermal points are diagnosed respectively, and diagnosis results of the multiple isothermal points are obtained; the diagnosis results comprise that at least one of the multiple isothermal points corresponds to a failed sampling path, or none of the sampling paths corresponding to the multiple isothermal points fails. In this way, the hardware complexity and cost of the sampling chip can be reduced.

Description

Technical Field

[0001] This application relates to the field of battery technology, and in particular to diagnostic methods and devices for temperature sampling, battery management systems, battery devices, electrical equipment, storage media, and software products. Background Technology

[0002] This section is intended to provide background or context for embodiments of this application. The description herein is not intended to imply that it is prior art simply because it is included in this section.

[0003] New energy batteries are being used more and more widely in daily life and industry. For example, new energy vehicles equipped with batteries are already widely used. In addition, batteries are being used more and more in the field of energy storage.

[0004] In battery devices, the Battery Management System (BMS) plays a crucial role. One of its core functions is to accurately collect state information such as cell voltage and temperature through sampling chips to ensure the safe and stable operation of the battery. To meet functional safety standards (such as Automotive Safety Integrity Level (ASIL) C / D requirements), related technologies typically use sampling chips to sample the temperature of at least one temperature sampling point in the battery device, and use redundant hardware structures to diagnose the temperature sampling to improve sampling reliability. However, this redundant hardware structure leads to high overall hardware complexity and cost for the sampling chip; furthermore, the diagnostic logic for temperature sampling is deeply tied to the hardware structure, lacking flexibility and increasing the overall development and maintenance difficulty of the BMS. Summary of the Invention

[0005] In view of this, the embodiments of this application aim to provide a temperature sampling diagnostic method and apparatus, a battery management system, a battery device, an electrical device, a storage medium, and a program product, which can reduce the hardware complexity and cost of the sampling chip, improve the implementation flexibility of the temperature sampling diagnostic logic, facilitate rapid updates to the temperature sampling diagnostic logic, reduce the overall development and maintenance difficulty of the BMS, and ensure that the BMS has a functional safety level corresponding to the diagnostic scheme using redundant hardware.

[0006] The technical solution of this application embodiment is implemented as follows:

[0007] This application provides a diagnostic method for temperature sampling, applied to a control component in a battery management system. The battery management system further includes at least one sampling chip. The method includes:

[0008] The sampling temperature of multiple temperature sampling points in the battery device is obtained; the sampling temperature of each temperature sampling point is collected by the sampling chip through the corresponding sampling path, and the multiple temperature sampling points include at least one set of isothermal points, which are determined based on the reference temperature distribution of the battery device under normal operating conditions.

[0009] Based on the difference between the sampling temperatures of multiple isotherms in the same group of isotherms, the sampling paths corresponding to the multiple isotherms are diagnosed to obtain the diagnosis results of multiple isotherms; the diagnosis results include that the sampling path corresponding to at least one of the multiple isotherms is invalid, or that the sampling paths corresponding to the multiple isotherms are not invalid.

[0010] In this embodiment, at least one set of isothermal points is first determined based on the reference temperature distribution of the battery device under normal operating conditions. Then, the sampling temperature of each set of isothermal points is obtained. By calculating the difference between the sampling temperatures of multiple isothermal points in the same set, it is determined whether the corresponding sampling path has failed. Thus, compared to the method of relying on redundant hardware structures for temperature sampling diagnosis in related technologies, this embodiment does not require adding redundant hardware structures to the sampling chip to achieve temperature sampling diagnosis. On the one hand, it reduces the hardware complexity and cost of the sampling chip, improves the implementation flexibility of the temperature sampling diagnosis logic, and facilitates rapid updates to the temperature sampling diagnosis logic, reducing the overall development and maintenance difficulty of the BMS, while ensuring that the BMS has the functional safety level corresponding to the diagnostic scheme using redundant hardware. On the other hand, it can reduce potential hardware failures caused by the introduction of redundant hardware structures, thereby reducing the overall device failure rate of the BMS and improving the overall reliability and safety of the BMS.

[0011] In some embodiments, based on the difference between the sampling temperatures of multiple isotherms in the same group of isotherms, the sampling paths corresponding to the multiple isotherms are diagnosed to obtain the diagnostic results of the multiple isotherms, including:

[0012] For each pair of isotherms in the same group, the diagnostic results of the two isotherms are determined based on the relationship between the absolute value of the difference between the sampled temperatures of the two isotherms and the difference threshold.

[0013] In the above embodiments, by selecting every two isothermal points in the same group for comparison, the relationship between the absolute value of their sampling temperature difference and the difference threshold is used to determine whether the corresponding sampling path is faulty. This pairwise comparison method helps to quickly locate potential sampling path failures, improving diagnostic efficiency and accuracy.

[0014] In some embodiments, the diagnostic results for two isothermal points are determined based on the relationship between the absolute value of the difference between the sampled temperatures of two isothermal points and a difference threshold, including at least one of the following:

[0015] If the absolute value of the difference between the sampled temperatures of two isothermal points is greater than the difference threshold, the sampling path corresponding to at least one of the two isothermal points is determined to be invalid.

[0016] If the absolute value of the difference between the sampled temperatures of two isothermal points is less than or equal to the difference threshold, it is determined that the sampling paths corresponding to the two isothermal points are not invalid.

[0017] In the above embodiments, a difference threshold is used as the judgment standard. When the absolute value of the temperature difference between two isothermal points exceeds the threshold, it indicates that the difference is outside the reasonable range, and the corresponding sampling path may be abnormal, i.e., it is faulty. Conversely, if the absolute value of the difference does not exceed the threshold, it indicates that the difference is within the reasonable range, and the corresponding sampling path is considered normal, i.e., it is faulty. This can improve the accuracy of temperature sampling diagnosis, reduce false alarms, and enhance system stability.

[0018] In some embodiments, the diagnostic results for the two isothermal points are determined based on the relationship between the absolute value of the difference between the sampled temperatures of the two isothermal points and a difference threshold, including:

[0019] If the absolute value of the difference between the sampled temperatures of two isothermal points is greater than the difference threshold, the first fault count value corresponding to the two isothermal points is incremented by 1.

[0020] If the first fault count value corresponding to the isotherm point is greater than the first count threshold, the sampling path corresponding to the isotherm point is determined to be faulty.

[0021] In the above embodiments, a corresponding first fault count value is introduced for each isotherm point as a dynamic evaluation mechanism. If the absolute value of the difference between the sampled temperatures of two isotherms is greater than a difference threshold, the first fault count value corresponding to each of the two isotherms is incremented by 1. This process continues until the first fault count value corresponding to a certain isotherm point is greater than a first counting threshold, at which point the sampling path corresponding to that isotherm point is determined to be faulty. This reduces the misdiagnosis of sampling path failure caused by instantaneous errors and improves the robustness of temperature sampling diagnosis.

[0022] In some embodiments, determining the diagnostic results for two isothermal points based on the relationship between the absolute value of the difference between the sampled temperatures of two isothermal points and a difference threshold further includes:

[0023] If the absolute value of the difference between the sampled temperatures of two isothermal points is less than or equal to the difference threshold, the first fault count value corresponding to each of the two isothermal points is reduced by 1.

[0024] In the above embodiments, by decrementing the first fault count value corresponding to each of the two isothermal points by 1 when the absolute value of the difference between the sampled temperatures of the two isothermal points is less than or equal to the difference threshold, the failure determination process of the sampling path can be further optimized and the risk of false alarms can be reduced.

[0025] In some embodiments, obtaining the sampling temperature of multiple temperature sampling points in the battery device includes:

[0026] The sampled temperature sequence of each temperature sampling point in the battery device is obtained; the sampled temperature sequence of each temperature sampling point is collected by the sampling chip at at least two sampling time points through the corresponding sampling path;

[0027] The diagnostic methods based on temperature sampling mentioned above also include:

[0028] For each temperature sampling point, the sampling path corresponding to the temperature sampling point is diagnosed based on the rate of change of the sampled temperature at at least two sampling time points.

[0029] In the above embodiments, based on considering the temperature difference between isothermal points in the spatial dimension, the rate of change of the sampling temperature of the same temperature sampling point in the time dimension is introduced. By analyzing the changing trend of the sampling temperature of a single temperature sampling point over time, the detection capability of dynamic failure modes of temperature sampling is further enhanced, making up for the shortcomings of related technologies that use redundant hardware structures that cannot cover such failure scenarios.

[0030] In some embodiments, the sampling path corresponding to the temperature sampling point is diagnosed based on the rate of change of the sampled temperature at at least two sampling time points, including:

[0031] If the rate of change of the sampled temperature at a temperature sampling point is greater than the rate of change threshold at at least two sampling time points, the second fault count value corresponding to the temperature sampling point is incremented by 1.

[0032] If the second fault count value corresponding to the temperature sampling point is greater than the second count threshold, the sampling path corresponding to the temperature sampling point is determined to be faulty.

[0033] In the above embodiments, a corresponding second fault count value is introduced for each temperature sampling point as a dynamic evaluation mechanism. If the second fault count value corresponding to a certain temperature sampling point is greater than a second counting threshold, the second fault count value corresponding to that temperature sampling point is incremented by 1 until the second fault count value corresponding to that temperature sampling point is greater than the second counting threshold, at which point the sampling path corresponding to that isothermal point is considered to be faulty. In this way, the misdiagnosis of sampling path failure caused by accidental instantaneous errors can be reduced, and the robustness of temperature sampling diagnosis can be improved.

[0034] In some embodiments, diagnosing the sampling path corresponding to a temperature sampling point based on the rate of change of the sampled temperature at at least two sampling time points further includes:

[0035] If the rate of change of the sampled temperature at a temperature sampling point is less than or equal to the rate of change threshold at at least two sampling time points, the second fault count value corresponding to the temperature sampling point is decremented by 1.

[0036] In the above embodiments, by decrementing the second fault count value corresponding to the temperature sampling point by 1 when the rate of change of the sampled temperature at the same temperature sampling point at at least two sampling time points is less than or equal to the rate of change threshold, the failure determination process of the sampling path can be further optimized and the risk of false alarms can be reduced.

[0037] This application provides a battery management system, including:

[0038] At least one sampling chip, each sampling chip is used to collect the sampling temperature of the corresponding temperature sampling point through the sampling path corresponding to the multiple temperature sampling points in the battery device; the multiple temperature sampling points include at least one set of isothermal points, and the at least one set of isothermal points is determined based on the reference temperature distribution of the battery device under normal operating conditions;

[0039] The control component, which communicates with the sampling chip, is used to acquire the sampling temperature of each group of isothermal points. Based on the difference between the sampling temperatures of multiple isothermal points in the same group, it diagnoses the sampling paths corresponding to the multiple isothermal points respectively.

[0040] In the above embodiments, at least one set of isothermal points is first determined based on the reference temperature distribution of the battery device under normal operating conditions. Then, the sampling temperature of each set of isothermal points is obtained, and the difference between the sampling temperatures of multiple isothermal points in the same set is determined to determine whether the corresponding sampling path has failed. Thus, compared to the method of relying on redundant hardware structures for temperature sampling diagnosis in related technologies, this embodiment does not require adding redundant hardware structures to the sampling chip to achieve temperature sampling diagnosis. On the one hand, it reduces the hardware complexity and cost of the sampling chip, improves the implementation flexibility of the temperature sampling diagnosis logic, and facilitates rapid updates to the temperature sampling diagnosis logic, reducing the overall development and maintenance difficulty of the BMS, while ensuring that the BMS has the functional safety level corresponding to the diagnostic scheme using redundant hardware. On the other hand, it can reduce potential hardware failures caused by the introduction of redundant hardware structures, thereby reducing the overall device failure rate of the BMS and improving the overall reliability and safety of the BMS.

[0041] In some embodiments, the sampling path corresponding to each temperature sampling point includes a temperature sensor disposed at the temperature sampling point and a sampling channel disposed in the sampling chip.

[0042] In the battery device, each sampling channel corresponds to a temperature sampling point, and the sampling temperature of each temperature sampling point is collected by the sampling chip through the corresponding sampling channel and the corresponding temperature sensor.

[0043] In the above embodiments, each sampling channel in the sampling chip corresponds one-to-one with each temperature sampling point. That is, a unique sampling channel is set for each temperature sampling point in each sampling chip of the battery device, and the sampling temperature of each temperature sampling point is acquired by the sampling chip through the unique corresponding sampling channel and the corresponding temperature sensor. This further reduces the hardware complexity and cost of the sampling chip. Furthermore, since the sampling path corresponding to each temperature sampling point includes the temperature sensor located at the temperature sampling point and the sampling channel in the sampling chip, the control component can diagnose the sampling channels and temperature sensors corresponding to multiple isotherms based on the differences between the sampling temperatures of multiple isotherms in the same set of isotherms. This allows for the coverage of more failure scenario diagnoses and improves the diagnostic capability for temperature sampling failure modes.

[0044] In some embodiments, the battery management system includes multiple sampling chips, and the sampling channels corresponding to each temperature sampling point in the same group of isotherms are set in different sampling chips.

[0045] In the above embodiments, by setting the sampling channels corresponding to each temperature sampling point in the same group of isotherms in different sampling chips, the different temperature sampling points in the same group can be sampled by different sampling chips. This reduces the missed diagnosis caused by the common failure of each sampling channel in a certain sampling chip (such as abnormal clock signal, undervoltage / overvoltage power supply, abnormal reference voltage source, etc.) leading to abnormal temperature synchronization of each temperature sampling point in the same group of isotherms.

[0046] This application provides a battery device, including at least one battery cell and the battery management system described in the above embodiments.

[0047] This application provides an electrical device that includes the battery device described in the above embodiments.

[0048] This application provides a temperature sampling diagnostic device applied to a control component in a battery management system. The battery management system further includes at least one sampling chip. The device includes:

[0049] The acquisition module is used to acquire the sampling temperature of multiple temperature sampling points in the battery device. The sampling temperature of each temperature sampling point is acquired by the sampling chip through the corresponding sampling path. The multiple temperature sampling points include at least one set of isothermal points, and the at least one set of isothermal points is determined based on the reference temperature distribution of the battery device under normal operating conditions.

[0050] The first diagnostic module is used to diagnose the sampling paths corresponding to multiple isotherms based on the difference between the sampling temperatures of multiple isotherms in the same group of isotherms.

[0051] This application provides a storage medium storing a computer program thereon. When the computer program is executed by a processor, it implements the steps in the temperature sampling diagnostic method described in the above embodiments.

[0052] This application provides a computer program product, including a computer program or instructions, which, when executed by a processor, implement the steps in the temperature sampling diagnostic method described in the above embodiments. Attached Figure Description

[0053] Figure 1 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 1 ;

[0054] Figure 2 A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 1 ;

[0055] Figure 3 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 2 ;

[0056] Figure 4 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 3 ;

[0057] Figure 5 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 4 ;

[0058] Figure 6 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 5 ;

[0059] Figure 7 A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 2 ;

[0060] Figure 8A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 3 ;

[0061] Figure 9 A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 4 ;

[0062] Figure 10 This is a schematic diagram of the composition structure of a battery device provided in an embodiment of this application;

[0063] Figure 11 This is a schematic diagram of the composition structure of an electrical device provided in an embodiment of this application;

[0064] Figure 12 A schematic diagram of the composition of the temperature sampling diagnostic device provided for the implementation of this application. Detailed Implementation

[0065] It should be noted that, unless otherwise specified, the embodiments and technical features in the embodiments of this application can be combined with each other, and the detailed descriptions in the specific implementation should be understood as explanations of the purpose of this application and should not be regarded as undue limitations on this application.

[0066] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having” and any variations thereof are intended to cover non-exclusive inclusion.

[0067] In the description of the embodiments of this application, technical terms such as "first," "second," and "third" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.

[0068] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0069] In the description of the embodiments in this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects are in an "or" relationship.

[0070] In the description of the embodiments of this application, unless otherwise expressly specified and limited, technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of this application according to the specific circumstances.

[0071] In the description of the embodiments of this application, unless otherwise expressly specified and limited, the technical term "contact" should be interpreted broadly, and can be direct contact, contact through an intermediate medium layer, contact between two contacting parties with substantially no interaction force, or contact between two contacting parties with interaction force.

[0072] With the development of clean energy, more and more devices are using electricity as their driving force, leading to the rapid development of power batteries, such as lithium-ion batteries, which can store large amounts of electrical energy and can be repeatedly charged and discharged. These power batteries are not only used in energy storage systems such as hydropower, thermal power, wind power, and solar power plants, but also widely used in electric vehicles such as electric bicycles, electric motorcycles, and electric cars, as well as in aerospace and other fields. As the application areas of power batteries continue to expand, the market demand is also constantly increasing.

[0073] In this embodiment, the battery device can be manufactured from battery cells and / or battery modules. A battery cell refers to a single battery cell, which is the basic unit capable of converting chemical energy into electrical energy. It can be used to manufacture battery modules or battery devices to supply power to electrical devices. A single battery cell can be a primary battery or a secondary battery. A secondary battery is a battery cell that can be recharged after discharge to reactivate its active materials and continue to be used. Battery cells can be lithium-ion batteries, sodium-ion batteries, sodium-lithium-ion batteries, lithium metal batteries, sodium metal batteries, lithium-sulfur batteries, magnesium-ion batteries, nickel-metal hydride batteries, nickel-cadmium batteries, or lead-acid batteries, etc., and this embodiment is not limited to these types. A single battery cell can be cylindrical, cuboid, or other shapes.

[0074] A battery cell includes an electrode assembly, which comprises a positive electrode, a negative electrode, and a separator. During the charging and discharging process of the battery cell, active ions (such as lithium ions) repeatedly insert and extract between the positive and negative electrodes. The separator is positioned between the positive and negative electrodes to prevent short circuits while allowing active ions to pass through.

[0075] In some embodiments, the separator is a separator membrane. This application does not impose any particular limitation on the type of separator membrane; any known porous separator membrane with good chemical and mechanical stability can be selected.

[0076] As an example, the main material of the separator can be selected from at least one of glass fiber, non-woven fabric, polyethylene, polypropylene, polyvinylidene fluoride, and ceramic. The separator can be a single-layer film or a multi-layer composite film, without particular limitation. When the separator is a multi-layer composite film, the materials of each layer can be the same or different, without particular limitation. The separator can be a separate component located between the positive and negative electrodes, or it can be attached to the surfaces of the positive and negative electrodes.

[0077] In some embodiments, the separator is a solid electrolyte. The solid electrolyte is disposed between the positive and negative electrodes, serving both to transport ions and to isolate the positive and negative electrodes.

[0078] In some embodiments, the battery cell also includes an electrolyte, which acts as a conductor of ions between the positive and negative electrodes. This application does not impose specific limitations on the type of electrolyte; it can be selected according to requirements. The electrolyte can be liquid, gel, or solid.

[0079] Liquid electrolytes include electrolyte salts and solvents.

[0080] In some embodiments, the electrolyte salt may be selected from at least one of lithium hexafluorophosphate, lithium tetrafluoroborate, lithium perchlorate, lithium hexafluoroarsenate, lithium bis(fluorosulfonyl)imide, lithium bis(trifluoromethanesulfonyl)imide, lithium trifluoromethanesulfonate, lithium difluorophosphate, lithium difluorooxalate borate, lithium dioxalate borate, lithium difluorodioxalate phosphate, and lithium tetrafluorooxalate phosphate.

[0081] In some embodiments, the solvent may be selected from at least one of ethylene carbonate, propylene carbonate, methyl ethyl carbonate, diethyl carbonate, dimethyl carbonate, dipropyl carbonate, methyl propyl carbonate, ethyl propyl carbonate, butyl carbonate, fluoroethylene carbonate, methyl formate, methyl acetate, ethyl acetate, propyl acetate, methyl propionate, ethyl propionate, propyl propionate, methyl butyrate, ethyl butyrate, 1,4-butyrolactone, sulfolane, dimethyl sulfone, methyl ethyl sulfone, and diethyl sulfone. The solvent may also be an ether solvent. Ether solvents may include one or more of ethylene glycol dimethyl ether, ethylene glycol diethyl ether, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether, tetraethylene glycol dimethyl ether, 1,3-dioxolane, tetrahydrofuran, methyl tetrahydrofuran, diphenyl ether, and crown ethers.

[0082] Among them, the gel electrolyte includes a polymer as the electrolyte backbone network, combined with an ionic liquid - lithium salt.

[0083] Solid electrolytes include polymer solid electrolytes, inorganic solid electrolytes, and composite solid electrolytes.

[0084] In some implementations, the electrode assembly is a wound structure. The positive and negative electrode sheets are wound into a wound structure.

[0085] In some implementations, the electrode assembly is a stacked structure.

[0086] In battery devices, the Battery Management System (BMS) plays a crucial role. One of its core functions is to accurately collect state information such as cell voltage and temperature through sampling chips to ensure the safe and stable operation of the battery. To meet functional safety standards (such as ASIL C / D), BMS-related technologies typically employ sampling chips to sample the temperature of at least one temperature sampling point in the battery device. Redundant hardware structures are used to diagnose the temperature sampling, improving sampling reliability. For example, the sampling chip may be configured with a main sampling path containing a primary analog-to-digital converter (ADC) and a secondary sampling path containing an auxiliary ADC. The primary and secondary ADCs for each cell are used for simultaneous sampling, and an internal comparator compares the two outputs to determine if any sampling path failures exist. Furthermore, to meet functional safety requirements, redundant multiplexers (MUX) or filters may be integrated to further enhance the completeness of the hardware diagnostic mechanism.

[0087] However, in the BMS of the aforementioned related technologies, the presence of redundant ADCs, comparators, and other diagnostic circuits within the sampling chip leads to a high overall hardware cost. Furthermore, the redundant ADCs, comparators, and other diagnostic circuits themselves may fail. When the main ADC and auxiliary ADC fail verification, the sampling chip cannot determine which ADC is sampling accurately. From a functional safety perspective, it can only enter a safe state, reporting a fault indicating the need for maintenance, thus increasing the overall system failure rate.

[0088] Furthermore, the design of the sampling chips in the aforementioned technologies is highly dependent on specific chip architectures, with significant differences in redundancy configurations and diagnostic logic between sampling chips from different manufacturers. Therefore, the diagnostic logic for temperature sampling is deeply tied to the hardware architecture, lacking flexibility, and optimizing the diagnostic strategy may require hardware redesign. In addition, when replacing sampling chips from different manufacturers, the software control strategy also needs to be adjusted accordingly, increasing the overall development and maintenance difficulty of the BMS.

[0089] In view of this, embodiments of this application provide a diagnostic method for temperature sampling, which can be applied to and executed by a control component in a battery management system. For example... Figure 1 As shown, the battery management system 10 includes at least one sampling chip 11 and a control component 12. Each sampling chip 11 is used to collect the sampling temperature of the corresponding temperature sampling point through the sampling path corresponding to multiple temperature sampling points in the battery device.

[0090] Figure 2 A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 1 ,like Figure 2 As shown, the diagnostic method for temperature sampling includes the following steps S201 to S202:

[0091] Step S201: Obtain the sampling temperature of multiple temperature sampling points in the battery device; the sampling temperature of each temperature sampling point is collected by the sampling chip through the corresponding sampling path, and the multiple temperature sampling points include at least one set of isothermal points, which are determined based on the reference temperature distribution of the battery device under normal operating conditions.

[0092] Step S202: Based on the difference between the sampling temperatures of multiple isotherms in the same group of isotherms, the sampling paths corresponding to the multiple isotherms are diagnosed to obtain the diagnosis results of the multiple isotherms; the diagnosis results include that the sampling path corresponding to at least one of the multiple isotherms is invalid, or that the sampling paths corresponding to the multiple isotherms are not invalid.

[0093] Here, the battery management system can be applied to any suitable battery device. It collects temperature data at various sampling points within the battery device using a sampling chip to meet management requirements such as safety and stability during battery operation. For example, the battery device may include, but is not limited to, power battery devices and / or energy storage battery devices, etc., as described in this application embodiment.

[0094] In some implementations, the sampling chip may include, but is not limited to, an analog front-end (AFE) chip, also known as a battery sampling chip, which can be used to collect the temperature at various temperature sampling points in the battery device. The AFE is an analog circuit module in the battery management system used to collect state information such as cell voltage and battery temperature. It typically includes components such as an ADC, MUX, filter, and voltage regulator, and is the core hardware unit for acquiring battery state information. The ADC is used to convert analog signals (such as cell voltage, current, or temperature) into digital signals for processing and analysis by the control components. It is understandable that, as a crucial component of the sampling path, the operating status of the ADC directly affects the accuracy of the sampled data.

[0095] It is understandable that the sampling path refers to the signal transmission path required to collect temperature information from the corresponding temperature sampling points. Failure of the sampling path may lead to distortion or loss of sampling data, thereby affecting the battery management system's judgment of the battery device's status.

[0096] In some implementations, the sampling path corresponding to each temperature sampling point is set independently. Each sampling path includes an ADC. Each ADC is used to receive the analog electrical signal corresponding to the sampling temperature of the temperature sampling point and convert the received analog electrical signal into a digital electrical signal. After the control component receives the digital electrical signal corresponding to the sampling temperature of the temperature sampling point, it converts the digital electrical signal into a temperature value to obtain the sampling temperature of the temperature sampling point.

[0097] In some implementations, the sampling paths corresponding to multiple temperature sampling points can share a single ADC. In each sampling period, multiple sampling paths can be selected by a multiplexer to input the analog electrical signals corresponding to the sampling temperatures of the respective temperature sampling points into the ADC, thereby obtaining the sampling temperatures of each temperature sampling point.

[0098] At least two temperature sampling points can be arranged in the battery device according to the actual application requirements.

[0099] In some implementations, temperature sampling points in the battery device can be arranged in critical hot areas of the battery device, such as cell stacking areas, near connectors, and / or cooling system outlets.

[0100] Each temperature sampling point in the battery device includes at least one set of isothermal points. It should be noted that, in the embodiments of this application, a set of isothermal points refers to a set of temperature sampling points with the same or similar temperatures under normal operating conditions of the battery device. Each set of isothermal points may include two or more temperature sampling points that are isothermal to each other.

[0101] In implementation, at least one set of isothermal points within the battery device can be determined based on a reference temperature distribution under normal operating conditions. This reference temperature distribution can be obtained through simulation and / or testing of the battery device under normal operating conditions. For example, the reference temperature distribution can be obtained by simulating and analyzing the internal temperature field of the battery device under various operating conditions, such as normal temperature charging, normal temperature discharging, high-temperature fast charging, low-temperature discharging, uniform motion of the electrical equipment, and rapid acceleration / deceleration of the electrical equipment. Based on this reference temperature distribution, it is possible to identify which locations have similar or identical temperatures under normal operating conditions, and thus select at least two points with similar or identical temperatures as a set of isothermal points.

[0102] In some implementations, based on the reference temperature distribution of the battery device under normal operating conditions, the highest temperature point, the lowest temperature point, at least one isotherm of the highest temperature point, and at least one isotherm of the lowest temperature point can be determined. The highest temperature point and at least one isotherm of the highest temperature point are grouped into one set of isotherms, and the lowest temperature point and at least one isotherm of the lowest temperature point are grouped into another set of isotherms. Since the highest and lowest temperatures of the battery device are typically the focus of the BMS during thermal management, by collecting temperature data from the highest temperature point, the isotherm of the highest temperature point, and the isotherm of the lowest temperature point, the temperature state of the battery device can be more accurately assessed, leading to more reasonable and precise thermal management.

[0103] In some implementations, two temperature sampling points that are isothermal to each other can be considered as a set of isothermal points. For example, P1 and P2 are one set of isothermal points, and P3 and P4 are another set of isothermal points.

[0104] In some implementations, three temperature sampling points that are mutually isothermal can be considered as a group of isothermal points. For example, P1, P2, and P3 are one group of isothermal points, and P4, P5, and P6 are another group of isothermal points.

[0105] In some embodiments, a temperature sensor is provided at each temperature sampling point in the battery device. The sampling chip 11 may have at least one sampling channel, and each temperature sampling point may correspond to one sampling channel. The sampling channel and the temperature sensor located at the temperature sampling point together form the sampling path corresponding to that temperature sampling point. For example, the temperature sensor may include a negative temperature coefficient (NTC) thermistor. The voltage value of each NTC thermistor is input into the corresponding sampling channel in the sampling chip. The sampling chip can convert the analog electrical signal corresponding to the voltage value of the NTC thermistor received into a digital electrical signal through the sampling channel and transmit it to the control component. After receiving the digital electrical signal corresponding to the voltage value of the NTC thermistor, the control component converts the digital electrical signal corresponding to the voltage value into the corresponding temperature value to obtain the sampling temperature.

[0106] In some implementations, the control component is the main control unit in the battery management system, responsible for coordinating the operation of each sampling chip, acquiring the sampling temperature of each temperature sampling point, and diagnosing the sampling paths corresponding to multiple isotherms based on the differences between the sampling temperatures of multiple isotherms in the same group of isotherms. For example, the control component may include, but is not limited to, a microcontroller unit (MCU). In implementation, the control component can employ any suitable software diagnostic strategy to diagnose the sampling paths corresponding to multiple isotherms based on the differences between the sampling temperatures of multiple isotherms in the same group of isotherms; this application does not limit this approach. For example, if the absolute value of the difference between the sampling temperatures of two isotherms in the same group of isotherms is greater than a difference threshold, then it is determined that the sampling path corresponding to at least one of these two isotherms is faulty. For example, it is possible to analyze the changes in the difference between the sampled temperatures of multiple isotherms in the same group at multiple consecutive sampling time points. If the change in the difference between the sampled temperatures of two isotherms in the same group at multiple consecutive sampling time points exceeds the set temperature difference change threshold, and / or the rate of change of the difference between the sampled temperatures of two isotherms at multiple consecutive sampling time points exceeds the set temperature difference change rate threshold, then it is determined that the sampling path corresponding to at least one of the two isotherms is invalid.

[0107] In some implementations, the sampling chip can periodically collect the sampling temperature of each temperature sampling point, and the control component can periodically acquire the sampling temperature of each temperature sampling point collected by the sampling chip.

[0108] In some implementations, the control component coordinates the operation of the entire system, including periodically triggering temperature sampling tasks, receiving sampling data, executing diagnostic logic, and outputting fault signals. Furthermore, the control component needs to communicate with the sampling chip to read the sampled temperature data and send control commands. In some implementations, the control component may also integrate a communication module to upload diagnostic results to a host computer or vehicle control system.

[0109] In this embodiment, at least one set of isothermal points is first determined based on the reference temperature distribution of the battery device under normal operating conditions. Then, the sampling temperature of each set of isothermal points is obtained. By calculating the difference between the sampling temperatures of multiple isothermal points in the same set, it is determined whether the corresponding sampling path has failed. Thus, compared to the method of relying on redundant hardware structures for temperature sampling diagnosis in related technologies, this embodiment does not require adding redundant hardware structures to the sampling chip to achieve temperature sampling diagnosis. On the one hand, it reduces the hardware complexity and cost of the sampling chip, improves the implementation flexibility of the temperature sampling diagnosis logic, and facilitates rapid updates to the temperature sampling diagnosis logic, reducing the overall development and maintenance difficulty of the BMS, while ensuring that the BMS has the functional safety level corresponding to the diagnostic scheme using redundant hardware. On the other hand, it can reduce potential hardware failures caused by the introduction of redundant hardware structures, thereby reducing the overall device failure rate of the BMS and improving the overall reliability and safety of the BMS.

[0110] In some embodiments, the step S202 above, which diagnoses the sampling paths corresponding to multiple isotherms based on the difference in sampling temperatures among multiple isotherms in the same group of isotherms, may include the following step S211:

[0111] Step S211: For every two isotherms in the same group of isotherms, the diagnostic results of the two isotherms are determined based on the relationship between the absolute value of the difference between the sampled temperatures of the two isotherms and the difference threshold.

[0112] The diagnostic results for the two isotherms include either the sampling path corresponding to at least one of the two isotherms being invalid, or the sampling paths corresponding to both of the two isotherms being valid.

[0113] Here, the difference threshold can be set by those skilled in the art based on the actual application scenario, and this application embodiment does not limit it in this regard. For example, the setting of the difference threshold can take into account a variety of factors, including but not limited to the working environment of the battery device, sampling accuracy, the characteristics of the temperature sensor, and the system's requirements for the false alarm rate.

[0114] In some implementations, the difference threshold can be equal to the maximum expected temperature difference at the isotherm under normal operating conditions.

[0115] In some implementations, the difference threshold may be slightly higher than the maximum expected temperature difference at the isotherm under normal operating conditions to prevent misjudgments caused by environmental fluctuations or measurement errors.

[0116] In some implementations, to improve diagnostic accuracy, a time-dimensional comparison can be introduced. For example, if the difference between the sampled temperatures of two isotherms at multiple consecutive sampling time points exceeds a threshold, the sampling path corresponding to the two isotherms is determined to be invalid. This method can significantly improve the availability and security of the system without increasing hardware costs.

[0117] It is understandable that the failure of the sampling path corresponding to two isothermal points may include, but is not limited to, the failure of the sampling path corresponding to at least one of the two isothermal points. The failure of the sampling path corresponding to a temperature sampling point may include, but is not limited to, the failure of the temperature sensor set at that temperature sampling point (e.g., temperature sensor drift or short circuit), and / or the abnormality of the sampling channel in the sampling chip corresponding to that temperature sampling point (e.g., ADC failure, filter failure).

[0118] In the above embodiments, by selecting every two isothermal points in the same group for comparison, the relationship between the absolute value of their sampling temperature difference and the difference threshold is used to determine whether the corresponding sampling path is faulty. This pairwise comparison method helps to quickly locate potential sampling path failures, improving diagnostic efficiency and accuracy.

[0119] In some embodiments, determining the diagnostic results of the two isothermal points in step S211 based on the relationship between the absolute value of the difference between the sampled temperatures of the two isothermal points and the difference threshold may include at least one of the following steps S221 and S222:

[0120] Step S221: If the absolute value of the difference between the sampled temperatures of two isothermal points is greater than the difference threshold, determine that the sampling path corresponding to at least one of the two isothermal points is invalid.

[0121] Step S222: If the absolute value of the difference between the sampled temperatures of the two isothermal points is less than or equal to the difference threshold, it is determined that the sampling paths corresponding to the two isothermal points are not invalid.

[0122] In some implementations, if the sampling path corresponding to at least one of the two isothermal points is determined to be faulty, the control component can further diagnose the source of the failure that caused the failure.

[0123] In the above embodiments, a difference threshold is used as the judgment standard. When the absolute value of the temperature difference between two isothermal points exceeds the threshold, it indicates that the difference is outside the reasonable range, and the corresponding sampling path may be abnormal, i.e., it is faulty. Conversely, if the absolute value of the difference does not exceed the threshold, it indicates that the difference is within the reasonable range, and the corresponding sampling path is considered normal, i.e., it is faulty. This can improve the accuracy of temperature sampling diagnosis, reduce false alarms, and enhance system stability.

[0124] In some embodiments, determining the diagnostic results of the two isothermal points in step S211 based on the relationship between the absolute value of the difference between the sampled temperatures of the two isothermal points and the difference threshold may include the following steps S231 and S232:

[0125] Step S231: If the absolute value of the difference between the sampled temperatures of two isothermal points is greater than the difference threshold, increment the first fault count value corresponding to the two isothermal points by 1.

[0126] Step S232: If the first fault count value corresponding to the isothermal point is greater than the first count threshold, the sampling path corresponding to the isothermal point is determined to be faulty.

[0127] In some implementations, a first fault counter can be configured for each temperature sampling point to count the first fault count value corresponding to that temperature sampling point. For example, for temperature sampling point P1, the first fault counter C11 is used to count the first fault count value corresponding to temperature sampling point P1; for temperature sampling point P2, the first fault counter C12 is used to count the first fault count value corresponding to temperature sampling point P2; and so on.

[0128] In some implementations, each group of isotherms contains two isotherms. A first fault counter can be set for each of the two isotherms in each group to count the first fault count values ​​corresponding to those two isotherms. For example, if one group of isotherms includes temperature sampling point P1 and temperature sampling point P2, the first fault count values ​​corresponding to temperature sampling point P1 and temperature sampling point P2 can be counted synchronously using the first fault counter C11. Similarly, if another group of isotherms includes temperature sampling point P3 and temperature sampling point P4, the first fault count values ​​corresponding to temperature sampling point P3 and temperature sampling point P4 can be counted synchronously using the first fault counter C12.

[0129] In the above embodiments, a corresponding first fault count value is introduced for each isotherm point as a dynamic evaluation mechanism. If the absolute value of the difference between the sampled temperatures of two isotherms is greater than a difference threshold, the first fault count value corresponding to each of the two isotherms is incremented by 1. This process continues until the first fault count value corresponding to a certain isotherm point is greater than a first counting threshold, at which point the sampling path corresponding to that isotherm point is determined to be faulty. This reduces the misdiagnosis of sampling path failure caused by instantaneous errors and improves the robustness of temperature sampling diagnosis.

[0130] In some embodiments, the step S211, which determines the diagnostic results of the two isothermal points based on the relationship between the absolute value of the difference between the sampled temperatures of the two isothermal points and the difference threshold, may further include the following step S241:

[0131] Step S241: If the absolute value of the difference between the sampled temperatures of the two isothermal points is less than or equal to the difference threshold, the first fault count value corresponding to the two isothermal points is reduced by 1.

[0132] In some implementations, if the absolute value of the difference between the sampled temperatures of two isothermal points is less than or equal to the difference threshold, and if the first fault count value corresponding to at least one temperature sampling point of the two isothermal points is greater than 0, then the first fault count value corresponding to at least one temperature sampling point is decremented by 1; if the first fault count value corresponding to at least one temperature sampling point of the two isothermal points is equal to 0, then the first fault count value corresponding to at least one temperature sampling point is kept at 0.

[0133] In the above embodiments, by decrementing the first fault count value corresponding to each of the two isothermal points by 1 when the absolute value of the difference between the sampled temperatures of the two isothermal points is less than or equal to the difference threshold, the failure determination process of the sampling path can be further optimized and the risk of false alarms can be reduced.

[0134] In some embodiments, obtaining the sampling temperature of multiple temperature sampling points in the battery device in step S201 may include the following step S251:

[0135] Step S251: Obtain the sampling temperature sequence of each temperature sampling point in the battery device; the sampling temperature sequence of each temperature sampling point is collected by the sampling chip at at least two sampling time points through the corresponding sampling path.

[0136] The diagnostic method based on temperature sampling described above may further include the following step S252:

[0137] Step S252: For each temperature sampling point, diagnose the sampling path corresponding to the temperature sampling point based on the rate of change of the sampled temperature at at least two sampling time points.

[0138] The temperature sequence of the temperature sampling points includes the sampled temperatures of the temperature sampling points at at least two sampling time points.

[0139] In implementation, the control component can diagnose the sampling path corresponding to the temperature sampling point in any suitable way based on the rate of change of the sampled temperature at at least two sampling time points. This application embodiment does not limit this.

[0140] In some implementations, if the rate of change of the sampled temperature at a temperature sampling point is greater than a rate of change threshold at at least two sampling time points, the sampling path corresponding to that temperature sampling point is determined to be invalid.

[0141] In some implementations, if the rate of change of the sampled temperature at a temperature sampling point is less than or equal to a rate of change threshold at at least two sampling time points, it is determined that the sampling path corresponding to the temperature sampling point is not invalid.

[0142] In the above embodiments, based on considering the temperature difference between isothermal points in the spatial dimension, the rate of change of the sampling temperature of the same temperature sampling point in the time dimension is introduced. By analyzing the changing trend of the sampling temperature of a single temperature sampling point over time, the detection capability of dynamic failure modes of temperature sampling is further enhanced, making up for the shortcomings of related technologies that use redundant hardware structures that cannot cover such failure scenarios.

[0143] In some embodiments, the step S252, which diagnoses the sampling path corresponding to the temperature sampling point based on the rate of change of the sampled temperature at at least two sampling time points, may include the following step S261:

[0144] Step S261: Based on the relationship between the rate of change of the sampled temperature at at least two sampling time points and the rate of change threshold, the sampling path corresponding to the temperature sampling point is diagnosed.

[0145] In the above embodiments, by comparing the rate of change of the sampled temperature at the same temperature sampling point at at least two sampling time points with a rate of change threshold, the failure of the corresponding sampling path is determined based on the relationship between the rate of change of the sampled temperature and the rate of change threshold. This helps to quickly locate potential dynamic failures of the sampling path, improving diagnostic efficiency and accuracy.

[0146] In some embodiments, the step S252, which diagnoses the sampling path corresponding to the temperature sampling point based on the rate of change of the sampled temperature at at least two sampling time points, may include the following steps S271 and S272:

[0147] Step S271: If the rate of change of the sampled temperature at the temperature sampling point is greater than the rate of change threshold at at least two sampling time points, increment the second fault count value corresponding to the temperature sampling point by 1.

[0148] Step S272: If the second fault count value corresponding to the temperature sampling point is greater than the second count threshold, the sampling path corresponding to the temperature sampling point is determined to be faulty.

[0149] In some implementations, a second fault counter can be configured for each temperature sampling point to count the second fault count value corresponding to that temperature sampling point. For example, for temperature sampling point P1, the second fault counter C21 is used to count the second fault count value corresponding to temperature sampling point P1; for temperature sampling point P2, the second fault counter C22 is used to count the second fault count value corresponding to temperature sampling point P2; and so on.

[0150] In the above embodiments, a corresponding second fault count value is introduced for each temperature sampling point as a dynamic evaluation mechanism. If the second fault count value corresponding to a certain temperature sampling point is greater than a second counting threshold, the second fault count value corresponding to that temperature sampling point is incremented by 1 until the second fault count value corresponding to that temperature sampling point is greater than the second counting threshold, at which point the sampling path corresponding to that isothermal point is considered to be faulty. In this way, the misdiagnosis of sampling path failure caused by accidental instantaneous errors can be reduced, and the robustness of temperature sampling diagnosis can be improved.

[0151] In some embodiments, the step S252, which diagnoses the sampling path corresponding to the temperature sampling point based on the rate of change of the sampled temperature at at least two sampling time points, may further include the following step S281:

[0152] Step S281: If the rate of change of the sampled temperature at the temperature sampling point at at least two sampling time points is less than or equal to the rate of change threshold, the second fault count value corresponding to the temperature sampling point is decremented by 1.

[0153] In some implementations, if the rate of change of the sampled temperature at a temperature sampling point at at least two sampling time points is less than or equal to the rate of change threshold, and if the second fault count value corresponding to the temperature sampling point is greater than 0, then the second fault count value corresponding to the temperature sampling point is decremented by 1; if the second fault count value corresponding to the temperature sampling point is equal to 0, then the second fault count value corresponding to the temperature sampling point is kept at 0.

[0154] In the above embodiments, by decrementing the second fault count value corresponding to the temperature sampling point by 1 when the rate of change of the sampled temperature at the same temperature sampling point at at least two sampling time points is less than or equal to the rate of change threshold, the failure determination process of the sampling path can be further optimized and the risk of false alarms can be reduced.

[0155] This application provides a battery management system, see further details. Figure 1 The battery management system 10 includes:

[0156] At least one sampling chip 11 is provided, each sampling chip 11 being used to acquire the sampling temperature of a corresponding temperature sampling point through a sampling path corresponding to a plurality of temperature sampling points in the battery device; the plurality of temperature sampling points include at least one set of isothermal points, the at least one set of isothermal points being determined based on the reference temperature distribution of the battery device under normal operating conditions;

[0157] The control component 12 is communicatively connected to the sampling chip 11 and is used to acquire the sampling temperature of each group of isothermal points. Based on the difference between the sampling temperatures of multiple isothermal points in the same group, the control component 12 diagnoses the sampling paths corresponding to the multiple isothermal points and obtains the diagnostic results of the multiple isothermal points. The diagnostic results include that the sampling path corresponding to at least one of the multiple isothermal points is invalid, or that the sampling paths corresponding to the multiple isothermal points are not invalid.

[0158] In the above embodiments, at least one set of isothermal points is first determined based on the reference temperature distribution of the battery device under normal operating conditions. Then, the sampling temperature of each set of isothermal points is obtained, and the difference between the sampling temperatures of multiple isothermal points in the same set is determined to determine whether the corresponding sampling path has failed. Thus, compared to the method of relying on redundant hardware structures for temperature sampling diagnosis in related technologies, this embodiment does not require adding redundant hardware structures to the sampling chip to achieve temperature sampling diagnosis. On the one hand, it reduces the hardware complexity and cost of the sampling chip, improves the implementation flexibility of the temperature sampling diagnosis logic, and facilitates rapid updates to the temperature sampling diagnosis logic, reducing the overall development and maintenance difficulty of the BMS, while ensuring that the BMS has the functional safety level corresponding to the diagnostic scheme using redundant hardware. On the other hand, it can reduce potential hardware failures caused by the introduction of redundant hardware structures, thereby reducing the overall device failure rate of the BMS and improving the overall reliability and safety of the BMS.

[0159] In some embodiments, the control component 12 is further configured to determine the diagnostic result of two isotherms for each pair of isotherms in the same set of isotherms, based on the relationship between the absolute value of the difference between the sampled temperatures of the two isotherms and the difference threshold.

[0160] In some embodiments, such as Figure 3 As shown, the battery management system 10 also includes a communication component 13.

[0161] Here, the communication component 13 is an intermediate module connecting the sampling chip 11 and the control component 12, and its function is to transmit data between the two.

[0162] In some embodiments, the communication component 13 may include an isolation communication chip for implementing high- and low-voltage isolated communication between the sampling chip 11 and the control component 12. The isolation communication component may achieve high- and low-voltage isolation using capacitors and / or transformers, etc.

[0163] In some embodiments, such as Figure 4 As shown, the sampling path corresponding to each temperature sampling point includes a temperature sensor (such as NTC1, NTC2, ..., NTCn, where n is an integer greater than 1) set at the temperature sampling point, and a sampling channel (such as S1, S2, ..., Sn) set in the sampling chip 11.

[0164] In the battery device, each sampling channel corresponds to a temperature sampling point, and the sampling temperature of each temperature sampling point is collected by the sampling chip through the corresponding sampling channel and the corresponding temperature sensor.

[0165] For example, the sampling temperature of the i-th temperature sampling point is acquired by the sampling chip through the corresponding sampling channel Si and the corresponding temperature sensor NTCi, where i=1,2,...,n.

[0166] See also Figure 4 Each sampling channel S1, S2, ... Sn in each sampling chip 11 is connected one-to-one with the temperature sensors NTC1, NTC2, ... NTCn set at each temperature sampling point in the battery device to collect the sampling temperature of the corresponding temperature sampling point. Among them, TSREF is a pull-up power supply used to power each temperature sensor, which can be provided by the sampling chip 11, and R is the corresponding pull-up resistor.

[0167] In some implementations, see also Figure 4 The battery management system 10 may include a sampling chip 11, which may be configured with multiple sampling channels S1, S2, ... Sn. The multiple sampling channels S1, S2, ... Sn are connected one-to-one with temperature sensors NTC1, NTC2, ... NTCn set at each temperature sampling point in the battery device, and are used to collect the sampling temperature of the corresponding temperature sampling point.

[0168] In some embodiments, the battery management system 10 may include a plurality of sampling chips 11, each sampling chip 11 may be provided with a sampling channel, which is connected to a temperature sensor set at a certain temperature sampling point in the battery device, for collecting the sampling temperature at that temperature sampling point.

[0169] In some embodiments, the battery management system 10 may include multiple sampling chips 11, each of which may have multiple sampling channels. These sampling channels are connected one-to-one with temperature sensors located at multiple temperature sampling points in the battery device to collect the sampling temperature at the corresponding temperature sampling point. Each sampling channel can be connected to the corresponding temperature sensor through any suitable pin on the sampling chip; this embodiment does not limit this. For example, each sampling channel can be connected to the corresponding temperature sensor through a general-purpose input / output (GPIO) pin on the sampling chip.

[0170] In the above embodiments, each sampling channel in the sampling chip corresponds one-to-one with each temperature sampling point. That is, a unique sampling channel is set for each temperature sampling point in each sampling chip of the battery device, and the sampling temperature of each temperature sampling point is acquired by the sampling chip through the unique corresponding sampling channel and the corresponding temperature sensor. This further reduces the hardware complexity and cost of the sampling chip. Furthermore, since the sampling path corresponding to each temperature sampling point includes the temperature sensor located at the temperature sampling point and the sampling channel in the sampling chip, the control component can diagnose the sampling channels and temperature sensors corresponding to multiple isotherms based on the differences between the sampling temperatures of multiple isotherms in the same set of isotherms. This allows for the coverage of more failure scenario diagnoses and improves the diagnostic capability for temperature sampling failure modes.

[0171] In some embodiments, the battery management system 10 includes multiple sampling chips 11, and the sampling channels corresponding to each temperature sampling point in the same group of isotherms are set in different sampling chips.

[0172] In some implementations, such as Figure 5As shown, the battery management system 10 includes a first sampling chip 11a and a second sampling chip 11b. Each set of isothermal points includes two temperature sampling points that are isothermal to each other. The sampling channels corresponding to the two temperature sampling points in the same set of isothermal points are respectively set in the first sampling chip 11a and the second sampling chip 11b. That is, the two temperature sampling points that are isothermal to each other will not be sampled by the same sampling chip. For example, both the first sampling chip 11a and the second sampling chip 11b include a multiplexer (MUX), a level shifter (LVLS) (optional), and an ADC. The first sampling chip 11a has multiple sampling channels, which can share a single ADC and an optional level shifter (LVLS). These multiple sampling channels can be selected via the MUX to connect to temperature sensors NTC1, NTC3, ..., NTC(2n-1), thereby inputting the analog electrical signals corresponding to the voltage values ​​of the temperature sensors NTC1, NTC3, ..., NTC(2n-1) into their respective sampling channels. The second sampling chip 11b also has multiple sampling channels, which can be selected via the MUX to connect to temperature sensors NTC2, NTC4, ..., NTC... (2n) are connected respectively, so that the analog electrical signals corresponding to the voltage values ​​of temperature sensors NTC2, NTC4, ... NTC(2n) are respectively input into the corresponding sampling channels; each sampling channel converts the received analog electrical signal corresponding to the voltage value into the corresponding digital electrical signal and transmits it to the control component 12. The control component 12 converts the digital electrical signal corresponding to the voltage value of each temperature sensor into the temperature value, thereby obtaining the sampling temperature of each temperature sampling point; among them, NTC1 and NTC2 are temperature sensors set at two temperature sampling points in the same group of isotherms, NTC3 and NTC4 are temperature sensors set at two temperature sampling points in the same group of isotherms, ... NTC(2n-1) and NTC(2n) are temperature sensors set at two temperature sampling points in the same group of isotherms.

[0173] In some implementations, such as Figure 6As shown, the battery management system 10 includes a first sampling chip 11a, a second sampling chip 11b, and a third sampling chip 11c. Each set of isothermal points includes three temperature sampling points that are mutually isothermal. The sampling channels corresponding to the three temperature sampling points in the same set of isothermal points are respectively set in the first sampling chip 11a, the second sampling chip 11b, and the third sampling chip 11c. That is, the three temperature sampling points that are mutually isothermal will not be sampled by the same sampling chip. For example, the first sampling chip 11a, the second sampling chip 11b, and the third sampling chip 11c each include a multiplexer (MUX), a level converter (LVLS) (optional), and an ADC. The first sampling chip 11a has multiple sampling channels, which can share one ADC and one level converter (LVLS) (optional). These multiple sampling channels can be selected by the MUX to connect to temperature sensors NTC1, NTC4, ..., NTC(3n-2), thereby inputting the analog electrical signals corresponding to the voltage values ​​of the temperature sensors NTC1, NTC4, ..., NTC(3n-2) into the corresponding sampling channels. The second sampling chip 11b has multiple sampling channels, which can be selected by the MUX to connect to temperature sensors NTC2, NTC5, ..., NTC(3n-1), thereby inputting the analog electrical signals corresponding to the voltage values ​​of the temperature sensors NTC2, NTC5, ..., NTC(3n-1) into the corresponding sampling channels. The third... The sampling chip 11c has multiple sampling channels, which can be selected by the MUX to connect to temperature sensors NTC3, NTC6, ..., NTC(3n) respectively, so that the analog electrical signals corresponding to the voltage values ​​of temperature sensors NTC3, NTC6, ..., NTC(3n) are input into the corresponding sampling channels respectively; each sampling channel converts the received analog electrical signal corresponding to the voltage value into the corresponding digital electrical signal and transmits it to the control component 12. The control component 12 converts the digital electrical signal corresponding to the voltage value of each temperature sensor into a temperature value, thereby obtaining the sampling temperature of each temperature sampling point; among them, NTC1, NTC2 and NTC3 are temperature sensors set at three temperature sampling points in the same group of isotherms, NTC4, NTC5 and NTC6 are temperature sensors set at three temperature sampling points in the same group of isotherms, ..., NTC(3n-2), NTC(3n-1) and NTC(3n) are temperature sensors set at three temperature sampling points in the same group of isotherms.

[0174] In some implementations, each ADC backend can also be connected to a data register Reg and a digital control unit (DCU). The sampled data after analog-to-digital conversion is sent to the data register Reg and then to the communication component 13 via the digital control unit (DCU, which includes a communication control module), and then to the control component 12 for diagnostics.

[0175] In the above embodiments, by setting the sampling channels corresponding to each temperature sampling point in the same group of isotherms in different sampling chips, the different temperature sampling points in the same group of isotherms can be sampled by different sampling chips. This reduces the missed diagnosis caused by the common failure of each sampling channel in a certain sampling chip (such as clock failure, power supply undervoltage / overvoltage, reference voltage source failure, etc.) leading to abnormal temperature synchronization of each temperature sampling point in the same group of isotherms.

[0176] The following describes the application of the temperature sampling diagnostic method and battery management system provided in this application in real-world scenarios.

[0177] Taking automotive electronics as an example, the current automotive electronics field typically uses AFE (Automatic External Filter) to sample the temperature of battery devices. In order to meet the functional safety standards (such as ASIL C / D) for preventing thermal runaway caused by battery overheating at the BMS level, AFE usually uses redundant ADCs for sampling. That is, the main ADC and another redundant auxiliary ADC are used together to collect the temperature of the battery device. The AFE chip compares the temperature sensor voltage values ​​sampled by the main ADC and the auxiliary ADC to confirm whether the ADC sampling path has failed, so as to avoid inaccurate temperature acquisition due to AFE sampling failure.

[0178] The above-mentioned scheme for implementing temperature sampling diagnosis using primary and secondary ADC verification has the following drawbacks:

[0179] The implementation of functional safety through master-slave ADC verification has the following drawbacks:

[0180] 1) In order to ensure the independence of primary and secondary verification, the input pins (i.e., pins) for temperature sampling, level converters and ADCs all need to be redundant, which greatly increases the hardware cost;

[0181] 2) The introduced redundant ADCs and redundant level converters will also fail. When the main ADC and auxiliary ADC fail to pass the verification, the AFE cannot locate which ADC sampling is accurate. From the perspective of functional safety, it can only enter the safe state and report the fault prompt that maintenance is required, which leads to an increase in the overall failure rate of the system.

[0182] 3) When an external temperature sensor (such as an NTC) fails, because the sampling values ​​of the main ADC and the auxiliary ADC are basically the same, the failure of the NTC itself cannot be diagnosed through redundancy check.

[0183] 4) When the NTC temperature rises rapidly but does not reach the over-temperature threshold, the sampling values ​​of the main ADC and the auxiliary ADC are basically the same, which cannot cover the cell protection in this scenario.

[0184] In view of this, the embodiments of this application provide a BMS that meets the ASIL D safety level and a corresponding software-based temperature sampling diagnostic scheme based on a single ADC hardware architecture.

[0185] In this embodiment, considering that the temperature of the battery device typically does not change drastically suddenly, this characteristic mainly relies on the combined effects of cell manufacturing process, battery packaging technology, and thermal management technology. The consistency of the cell manufacturing process directly affects the internal temperature distribution of the battery device; highly consistent cells generate more uniform heat during charging and discharging, reducing rapid fluctuations in local temperature. Simultaneously, battery packaging technology determines the heat conduction path; a good packaging design promotes rapid heat dissipation and reduces the formation of local hot spots. Regarding thermal management technology, advanced thermal management systems (such as liquid cooling, air cooling, or the application of phase change materials) can effectively regulate the temperature of the battery device, ensuring temperature stability even under extreme conditions. Through simulations and tests under conditions such as high-temperature fast charging, low-temperature discharging, rapid acceleration and deceleration, and multiple charge-discharge cycles, the fastest rate of temperature change under the most severe conditions can be accurately calculated, identifying the highest temperature point and its isotherm, as well as the lowest temperature point and its isotherm within the battery device.

[0186] Based on the above characteristics, the following assumptions can be made:

[0187] The rate of temperature change of the battery device within a certain time period is less than a certain value;

[0188] The temperature sensor NTC of the battery device has a distribution of points (i.e. temperature sampling points) that include the highest and lowest temperature points in the battery device, and each of these temperature points has one or two isothermal points. The temperature difference between two temperature sampling points that are isothermal points is less than one value.

[0189] Based on this, the embodiments of this application utilize the characteristic that there are at least two or three temperature sampling points that are isothermal points within the same battery device. By comparing the temperature differences between each temperature sampling point within the same set of isothermal points in real time, the failure of the corresponding sampling channel in the sampling chip and the failure of the NTC body can be detected. In addition, by combining time-dimensional analysis and calculating the temperature change rate of a single temperature sampling point, the failure of the corresponding sampling channel in the sampling chip, the failure of the NTC body, and the thermal runaway of the battery device can be detected.

[0190] In this embodiment, by utilizing the temperature change rate of the same temperature sampling point in the battery device and the characteristic that there are multiple isothermal points in the same battery device, a single ADC is used to collect the temperature of each temperature sampling point in the battery device. By comparing the temperature difference of the isothermal points or judging the slope of the temperature change of the same temperature sampling point, it is determined whether the sampling path corresponding to each temperature sampling point is faulty, without the need to use redundant ADCs, level converters and other hardware structures.

[0191] Compared with the schemes that use redundant ADC verification in related technologies, the embodiments of this application have at least the following advantages:

[0192] 1) Each temperature sampling point requires only one sampling channel inside the AFE, that is, only one ADC and one temperature sampling input pin. In this way, the number of internal components and external circuit components of the AFE is reduced, and the hardware cost is significantly reduced. This advantage is particularly prominent when a single ADC is used to achieve functional safety.

[0193] 2) Reducing the number of auxiliary ADCs lowers the original failure rate of the AFE, improving the overall availability of the system. It is understandable that software false alarms may occur during the verification of the main and auxiliary ADCs due to inconsistent sampling frequencies or poor synchronization.

[0194] 3) When the NTC body drifts and fails, the main and auxiliary ADC verification can still pass. The NTC body failure can be identified by the isothermal temperature difference and temperature change slope in the scheme of this application embodiment.

[0195] 4) When the battery device temperature rises abnormally, the main and auxiliary ADC verification can still pass, and the system will not report a fault when the temperature value does not reach the over-temperature threshold. The temperature change slope in the solution of this application can identify the abnormal temperature of the battery device as early as possible, reducing the safety risks such as thermal runaway caused by continued use.

[0196] Figure 7 A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 2 This method can be executed by a control component (such as an MCU) in the battery management system, such as... Figure 7 As shown, the diagnostic method includes the following steps S301 to S307:

[0197] Step S301: Periodically start the temperature sampling task of AFE;

[0198] Among them, by starting the AFE to obtain the temperature sampling task, the control component can obtain the sampling temperatures T1 to T(2n) corresponding to NTC1 to NTC(2n) respectively;

[0199] For example, suppose there are two isothermal points in the battery pack. The temperature sampling points where NTC1 and NTC2 are located are isothermal points to each other, the temperature sampling points where NTC3 and NTC4 are located are isothermal points to each other, and so on, NTC(2n-1) and NTC(2n) are isothermal points to each other.

[0200] Step S302: Determine whether the temperature difference between the two isothermal points is greater than the difference threshold.

[0201] If yes, proceed to step S303; if no, proceed to step S304.

[0202] For example, it can be determined whether |T2-T1|, |T4-T3|, and |T(2n)-T(2n-1)| are greater than the difference threshold.

[0203] Step S303: Increment the first fault count value corresponding to the two isothermal points by 1;

[0204] Each temperature sampling point corresponds to a first fault count value. If the temperature difference between two isothermal points is greater than the difference threshold, the first fault count value corresponding to these two isothermal points is incremented by 1.

[0205] Step S304: Determine whether the first fault count value corresponding to the two isothermal points is greater than 0;

[0206] If so, proceed to step S305.

[0207] Step S305: Decrement the first fault count value corresponding to the two isothermal points by 1 respectively;

[0208] Step S306: Determine whether the first fault count value corresponding to each temperature sampling point is greater than the first count threshold;

[0209] If the first fault count value corresponding to a certain temperature sampling point is greater than the first count threshold, proceed to step S307.

[0210] Step S307: Report a sampling failure at the temperature sampling point.

[0211] The temperature sampling diagnostic method described in this application utilizes the characteristics of isothermal points within the battery device. By setting a reasonable difference threshold, it achieves rapid detection and diagnosis of hardware failures in the temperature sampling path, without relying on redundant ADCs to diagnose failures on the sampling path or the NTC itself. In this scheme, the number of ADCs within a single AFE can be one or more. Temperature difference comparisons can be performed on different ADC channels within the same AFE or on ADC channels within different AFEs.

[0212] Figure 8 A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 3 This method can be executed by a control component (such as an MCU) in the battery management system, such as... Figure 8 As shown, the diagnostic method includes the following steps S401 to S415:

[0213] Step S401: Periodically start the temperature sampling task of AFE;

[0214] Among them, by starting the AFE to obtain the temperature sampling task, the control component can obtain the sampling temperatures T1 to T(3n) corresponding to NTC1 to NTC(3n) respectively;

[0215] For example, suppose there are three isothermal points in the battery pack. The temperature sampling points where NTC1, NTC2, and NTC3 are located are isothermal points to each other, the temperature sampling points where NTC4, NTC5, and NTC6 are located are isothermal points to each other, and so on, NTC(3n-2), NTC(3n-1), and NTC(3n) are isothermal points to each other.

[0216] Step S402: Determine whether |T(3i)-T(3i-1)| is greater than the difference threshold;

[0217] If yes, proceed to step S403; if no, proceed to step S404.

[0218] Where i is a positive integer less than or equal to n.

[0219] Step S403: Increment the first fault count value corresponding to the temperature sampling points where NTC(3i) and NTC(3i-1) are located by 1;

[0220] Step S404: Determine whether the first fault count value corresponding to the two temperature sampling points is greater than 0;

[0221] If so, proceed to step S405.

[0222] The two temperature sampling points determined here are the temperature sampling points where NTC(3i) and NTC(3i-1) are located, respectively.

[0223] Step S405: Decrement the first fault count value that is greater than 0 in the first fault count values ​​corresponding to the two temperature sampling points by 1;

[0224] Step S406: Determine whether |T(3i)-T(3i-2)| is greater than the difference threshold;

[0225] If yes, proceed to step S407; if no, proceed to step S408.

[0226] Step S407: Increment the first fault count value corresponding to the temperature sampling points where NTC(3i) and NTC(3i-2) are located by 1;

[0227] Step S408: Determine whether the first fault count value corresponding to the two temperature sampling points is greater than 0;

[0228] If so, proceed to step S409.

[0229] The two temperature sampling points determined here are the temperature sampling points where NTC(3i) and NTC(3i-2) are located, respectively.

[0230] Step S409: Decrement the first fault count value that is greater than 0 in the first fault count values ​​corresponding to the two temperature sampling points by 1;

[0231] Step S410: Determine whether |T(3i-1)-T(3i-2)| is greater than the difference threshold;

[0232] If yes, proceed to step S411; if no, proceed to step S412.

[0233] Step S411: Increment the first fault count value corresponding to the temperature sampling points where NTC(3i-1) and NTC(3i-2) are located by 1 respectively;

[0234] Step S412: Determine whether the first fault count value corresponding to the two temperature sampling points is greater than 0;

[0235] If so, proceed to step S413.

[0236] The two temperature sampling points determined here are the temperature sampling points where NTC(3i-1) and NTC(3i-2) are located, respectively.

[0237] Step S413: Decrement the first fault count value that is greater than 0 in the first fault count values ​​corresponding to the two temperature sampling points by 1;

[0238] Step S414: Determine whether the first fault count value corresponding to each temperature sampling point is greater than the first count threshold;

[0239] If the first fault count value corresponding to a certain temperature sampling point is greater than the first count threshold, proceed to step S415.

[0240] Step S415: Report a sampling failure at the temperature sampling point.

[0241] The temperature sampling diagnostic method described in the above-described embodiments of this application can identify which temperature sampling point in the same set of isothermal points has a faulty sampling path.

[0242] Figure 9 A schematic diagram of the implementation process of a temperature sampling diagnostic method provided in this application embodiment. Figure 4 This method can be executed by a control component (such as an MCU) in the battery management system, such as... Figure 9 As shown, the diagnostic method includes the following steps S501 to S507:

[0243] Step S501: Periodically start the temperature sampling task of AFE;

[0244] By periodically initiating the temperature sampling task of the AFE, the control component can obtain the sampling temperatures T11, T12, ..., T1n of the temperature sampling point where NTC1 is located at time t1, and T21, T22, ..., T2n of the temperature sampling point where NTC2 is located at time t2, and so on, storing the sampling temperatures of all temperature sampling points at each time (corresponding to the sampling time points in the aforementioned embodiments).

[0245] Step S502: Determine whether the rate of change of the sampled temperature at each temperature sampling point at two adjacent time points is greater than the rate of change threshold.

[0246] If yes, proceed to step S503; if no, proceed to step S504.

[0247] Step S503: Increment the second fault count value corresponding to the temperature sampling point by 1;

[0248] Each temperature sampling point corresponds to a second fault count value. If the rate of change of the sampled temperature at a certain temperature sampling point is greater than the rate of change threshold between two adjacent times, the second fault count value corresponding to that temperature sampling point is incremented by 1.

[0249] Step S504: Determine whether the second fault count value corresponding to the temperature sampling point is greater than 0;

[0250] If so, proceed to step S505.

[0251] Step S505: Decrement the second fault count value corresponding to the temperature sampling point by 1;

[0252] Step S506: Determine whether the second fault count value corresponding to each temperature sampling point is greater than the second count threshold;

[0253] If the second fault count value corresponding to a certain temperature sampling point is greater than the second count threshold, proceed to step S507.

[0254] Step S507: Report a sampling failure at the temperature sampling point.

[0255] By using the above method to calculate the rate of change of the sampling temperature at the temperature sampling point, the detection capability of dynamic failure modes (such as oscillation) of the temperature sampling path can be enhanced, and abnormal temperature rise of the battery cell can be diagnosed, making up for the inability of redundant ADCs to cover this failure mode.

[0256] In this embodiment, two software strategies, namely temperature difference comparison and temperature sampling change rate calculation, are combined. By using multiple dimensions, namely temperature difference in the spatial dimension and change rate in the time dimension, a wider range of failure modes are covered, thereby improving the reliability and security of the system and reducing the cost of hardware redundant ADCs.

[0257] Table 1 is a list of failure modes of AFE modules that can be covered by the temperature sampling diagnostic method provided in the embodiments of this application. Analysis shows that these failure modes can all be detected by the software-based temperature difference comparison or temperature change rate provided in the embodiments of this application.

[0258] Table 1

[0259]

[0260] Setup time refers to the time required for the output of the analog-to-digital converter to converge to the final value of a step input.

[0261] The diagnostic method in this application embodiment can realize full-process verification from fault diagnosis to fault handling, and can cover all single-point failures of AFE, so as to achieve the functional safety requirements of ASIL C / D.

[0262] This application provides a battery device, such as... Figure 10 As shown, the battery device 30 includes at least one battery cell 20 and the battery management system 10 described in the above embodiments.

[0263] This application provides an embodiment of an electrical device, such as... Figure 11 As shown, the electrical device 40 includes the battery device 30 described in the above embodiments.

[0264] Here, electrical equipment can be any electrical equipment, including but not limited to automobiles, airplanes, electric bicycles, electric motorcycles, electric boats, and / or ships.

[0265] This application provides a temperature sampling diagnostic device, which is applied to the control component of a battery management system. The battery management system also includes at least one sampling chip. Figure 12 A schematic diagram of the composition of the temperature sampling diagnostic device provided for the implementation of this application is shown below. Figure 12 As shown, the temperature sampling diagnostic device 500 includes:

[0266] The acquisition module 510 is used to acquire the sampling temperature of multiple temperature sampling points in the battery device; the sampling temperature of each temperature sampling point is acquired by the sampling chip through the corresponding sampling path, and the multiple temperature sampling points include at least one set of isothermal points, which are determined based on the reference temperature distribution of the battery device under normal operating conditions.

[0267] The first diagnostic module 520 is used to diagnose the sampling paths corresponding to multiple isotherms based on the difference between the sampling temperatures of multiple isotherms in the same group of isotherms, and to obtain the diagnostic results of multiple isotherms; the diagnostic results include that the sampling path corresponding to at least one of the multiple isotherms is invalid, or that the sampling paths corresponding to the multiple isotherms are not invalid.

[0268] In some embodiments, the first diagnostic module 520 is further configured to: for every two isotherms in the same group of isotherms, determine the diagnostic result of the two isotherms based on the relationship between the absolute value of the difference between the sampled temperatures of the two isotherms and the difference threshold.

[0269] In some embodiments, the first diagnostic module 520 is further configured to: determine that the sampling path corresponding to at least one of the two isothermal points is invalid if the absolute value of the difference between the sampled temperatures of the two isothermal points is greater than a difference threshold; or determine that the sampling paths corresponding to the two isothermal points are not invalid if the absolute value of the difference between the sampled temperatures of the two isothermal points is less than or equal to a difference threshold.

[0270] In some embodiments, the first diagnostic module 520 is further configured to: increment the first fault count value corresponding to each of the two isothermal points by 1 when the absolute value of the difference between the sampling temperatures of the two isothermal points is greater than the difference threshold; and determine that the sampling path corresponding to the isothermal point is faulty when the first fault count value corresponding to the isothermal point is greater than the first count threshold.

[0271] In some embodiments, the first diagnostic module 520 is further configured to: decrement the first fault count value corresponding to each of the two isothermal points by 1 if the absolute value of the difference between the sampled temperatures of the two isothermal points is less than or equal to the difference threshold.

[0272] In some embodiments, the acquisition module 510 is further configured to: acquire the sampling temperature sequence of each temperature sampling point in the battery device; the sampling temperature sequence of each temperature sampling point is acquired by the sampling chip at at least two sampling time points through a corresponding sampling path;

[0273] The above-mentioned temperature sampling diagnostic device further includes: a second diagnostic module, used to diagnose the sampling path corresponding to each temperature sampling point based on the rate of change of the sampling temperature at at least two sampling time points.

[0274] In some embodiments, the second diagnostic module is further configured to: increment the second fault count value corresponding to the temperature sampling point by 1 when the rate of change of the sampled temperature at the temperature sampling point at at least two sampling time points is greater than the rate of change threshold; and determine that the sampling path corresponding to the temperature sampling point is faulty when the second fault count value corresponding to the temperature sampling point is greater than the second count threshold.

[0275] In some embodiments, the second diagnostic module is further configured to: decrement the second fault count value corresponding to the temperature sampling point by 1 if the rate of change of the sampled temperature at the temperature sampling point at at least two sampling time points is less than or equal to the rate of change threshold.

[0276] This application provides a storage medium storing a computer program thereon. When the computer program is executed by a processor, it implements the steps in the temperature sampling diagnostic method described in the above embodiments.

[0277] This application provides a computer program product, including a computer program or instructions, which, when executed by a processor, implement the steps in the temperature sampling diagnostic method described in the above embodiments.

[0278] It should be noted that the descriptions of the various embodiments above tend to emphasize the differences between them, while their similarities or commonalities can be referred to interchangeably. The descriptions of the system, device, apparatus, storage medium, and program product embodiments above are similar to the descriptions of the method embodiments above, and have similar beneficial effects. For technical details not disclosed in the system, device, apparatus, storage medium, and program product embodiments of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0279] In this application embodiment, if the above-described method is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application embodiment, in essence, or the part that contributes to related technologies, can be embodied in the form of a software product. This software product is stored in a storage medium and includes several instructions to cause the control component in the battery management system to execute all or part of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, a portable hard drive, a read-only memory (ROM), a magnetic disk, or an optical disk. Thus, this application embodiment is not limited to any specific hardware, software, or firmware, or any combination of hardware, software, and firmware.

[0280] The units described above as separate components may or may not be physically separate, and the components shown as units may or may not be physical units; they may be located in one place or distributed across multiple network units; some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs. Furthermore, the functional units in the embodiments of this application may all be integrated into one processing unit, or each unit may be a separate unit, or two or more units may be integrated into one unit; the integrated unit may be implemented in hardware or in a combination of hardware and software functional units.

[0281] It should be understood that in the description of this application, the reference to terms such as "in one embodiment," "in some embodiments," "in other embodiments," "yet another embodiment," "in some implementations," "in other implementations," or "exemplary," etc., refers to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of the embodiments of this application. In this application, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Furthermore, without contradiction, those skilled in the art can combine the different embodiments or examples described in this application, as well as the features of the different embodiments or examples.

[0282] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0283] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and devices can be implemented in other ways. The apparatus and device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components may be combined, or integrated into another system, or some features may be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed may be through some interfaces, and the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0284] The above are merely exemplary embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application are included within the protection scope of this application.

Claims

1. A diagnostic method of temperature sampling, characterized by, A control component applied to a battery management system, the battery management system further comprising at least one sampling chip, the method comprising: obtaining sampling temperatures of a plurality of temperature sampling points in a battery device; the sampling temperature of each temperature sampling point is collected by the sampling chip through a corresponding sampling path, and the plurality of temperature sampling points comprise at least one group of isothermal points, the at least one group of isothermal points being determined based on a reference temperature distribution of the battery device in a normal working state; diagnosing the sampling paths corresponding to a plurality of isothermal points in the same group of isothermal points based on differences between the sampling temperatures of the plurality of isothermal points, to obtain diagnosis results of the plurality of isothermal points; the diagnosis results comprise that at least one of the sampling paths corresponding to the plurality of isothermal points is invalid, or none of the sampling paths corresponding to the plurality of isothermal points is invalid; the diagnosis results of the plurality of isothermal points obtained by diagnosing the sampling paths corresponding to the plurality of isothermal points in the same group of isothermal points based on differences between the sampling temperatures of the plurality of isothermal points, comprise: for each two isothermal points in the same group of isothermal points, determining diagnosis results of the two isothermal points based on a size relationship between an absolute value of the difference between the sampling temperatures of the two isothermal points and a difference threshold value; the diagnosis results of the two isothermal points determined based on the size relationship between the absolute value of the difference between the sampling temperatures of the two isothermal points and the difference threshold value, comprise: in a case where the absolute value of the difference between the sampling temperatures of the two isothermal points is greater than the difference threshold value, adding 1 to first fault count values corresponding to the two isothermal points respectively; in a case where the first fault count value corresponding to the isothermal point is greater than a first count threshold value, determining that the sampling path corresponding to the isothermal point is invalid.

2. The diagnostic method of temperature sampling according to claim 1, characterized in that, the diagnosis results of the two isothermal points determined based on the size relationship between the absolute value of the difference between the sampling temperatures of the two isothermal points and the difference threshold value, comprise at least one of: in a case where the absolute value of the difference between the sampling temperatures of the two isothermal points is greater than the difference threshold value, determining that at least one of the sampling paths corresponding to the two isothermal points is invalid; in a case where the absolute value of the difference between the sampling temperatures of the two isothermal points is less than or equal to the difference threshold value, determining that none of the sampling paths corresponding to the two isothermal points is invalid.

3. The diagnostic method of temperature sampling of claim 1, wherein, the diagnosis results of the two isothermal points determined based on the size relationship between the absolute value of the difference between the sampling temperatures of the two isothermal points and the difference threshold value, further comprise: in a case where the absolute value of the difference between the sampling temperatures of the two isothermal points is less than or equal to the difference threshold value, subtracting 1 from first fault count values corresponding to the two isothermal points respectively.

4. The diagnostic method of temperature sampling according to any one of claims 1 to 3, characterized in that, the obtaining of the sampling temperatures of the plurality of temperature sampling points in the battery device, comprises: obtaining a sampling temperature sequence of each temperature sampling point in the battery device; the sampling temperature sequence of each temperature sampling point is collected by the sampling chip through a corresponding sampling path at at least two sampling time points; the method further comprises: For each temperature sampling point, based on a size relationship between a change rate of the sampling temperature of the temperature sampling point at at least two sampling time points and a change rate threshold, a sampling path corresponding to the temperature sampling point is diagnosed.

5. The diagnostic method of temperature sampling according to claim 4, characterized in that, The diagnosis of the sampling path corresponding to the temperature sampling point based on the size relationship between the change rate of the sampling temperature of the temperature sampling point at at least two sampling time points and the change rate threshold comprises: In a case where the change rate of the sampling temperature of the temperature sampling point at at least two sampling time points is greater than the change rate threshold, a second fault count value corresponding to the temperature sampling point is increased by 1; In a case where the second fault count value corresponding to the temperature sampling point is greater than a second count threshold, it is determined that the sampling path corresponding to the temperature sampling point is invalid.

6. The diagnostic method of temperature sampling according to claim 5, characterized in that, The diagnosis of the sampling path corresponding to the temperature sampling point based on the size relationship between the change rate of the sampling temperature of the temperature sampling point at at least two sampling time points and the change rate threshold further comprises: In a case where the change rate of the sampling temperature of the temperature sampling point at at least two sampling time points is less than or equal to the change rate threshold, the second fault count value corresponding to the temperature sampling point is decreased by 1.

7. A battery management system, characterized by, Comprise: At least one sampling chip, each of the sampling chips is configured to collect a sampling temperature of a corresponding temperature sampling point through a sampling path corresponding to the temperature sampling point in a battery device; The plurality of temperature sampling points comprises at least one group of isothermal points, the at least one group of isothermal points is determined based on a reference temperature distribution of the battery device in a normal working state; A control component in communication connection with the sampling chip is configured to acquire the sampling temperatures of each group of isothermal points, diagnose the sampling paths corresponding to a plurality of isothermal points in the same group of isothermal points based on a difference between the sampling temperatures of the plurality of isothermal points, and obtain diagnosis results of the plurality of isothermal points; the diagnosis results comprise that at least one of the plurality of isothermal points corresponds to an invalid sampling path, or none of the sampling paths corresponding to the plurality of isothermal points is invalid; The control component is further configured to, for each two isothermal points in the same group of isothermal points, determine diagnosis results of the two isothermal points based on a size relationship between an absolute value of a difference between the sampling temperatures of the two isothermal points and a difference threshold; The control component is further configured to, in a case where the absolute value of the difference between the sampling temperatures of the two isothermal points is greater than the difference threshold, increase a first fault count value corresponding to the two isothermal points by 1; In a case where the first fault count value corresponding to the isothermal point is greater than a first count threshold, it is determined that the sampling path corresponding to the isothermal point is invalid.

8. The battery management system of claim 7, wherein: The sampling path corresponding to each temperature sampling point comprises a temperature sensor arranged at the temperature sampling point and a sampling channel arranged in the sampling chip; In the battery device, each sampling channel corresponds to each temperature sampling point one by one, and the sampling temperature of each temperature sampling point is collected by the sampling chip through the corresponding sampling channel and the corresponding temperature sensor.

9. The battery management system of claim 8, wherein, The battery management system comprises a plurality of sampling chips, and the sampling channels corresponding to the temperature sampling points in the same isothermal point group are arranged in different sampling chips.

10. A battery device characterized by comprising: The battery management system comprises at least one battery cell and the battery management system as claimed in any one of claims 7 to 9.

11. An electrical device, characterized by The battery device comprises the battery management system as claimed in claim 10.

12. A diagnostic device for temperature sampling, characterized by The control component is applied to a battery management system, and the battery management system further comprises at least one sampling chip. The acquisition module is configured to acquire sampling temperatures of a plurality of temperature sampling points in the battery device, wherein the sampling temperature of each temperature sampling point is collected by the sampling chip through a corresponding sampling path, and the plurality of temperature sampling points comprise at least one isothermal point group, and the at least one isothermal point group is determined based on a reference temperature distribution of the battery device in a normal working state. The first diagnosis module is configured to diagnose the sampling paths corresponding to a plurality of isothermal points in the same isothermal point group based on differences between the sampling temperatures of the plurality of isothermal points, and obtain diagnosis results of the plurality of isothermal points, wherein the diagnosis results comprise that at least one sampling path corresponding to the plurality of isothermal points is invalid, or all the sampling paths corresponding to the plurality of isothermal points are not invalid. The first diagnosis module is further configured to determine the diagnosis results of each two isothermal points in the same isothermal point group based on a size relationship between an absolute value of a difference between the sampling temperatures of the two isothermal points and a difference threshold value. The first diagnosis module is further configured to increase first fault count values corresponding to the two isothermal points by 1 in a case where the absolute value of the difference between the sampling temperatures of the two isothermal points is greater than the difference threshold value, and determine that the sampling paths corresponding to the isothermal points are invalid in a case where the first fault count values corresponding to the isothermal points are greater than a first count threshold value.

13. A storage medium having stored thereon a computer program, characterized in that The computer program is executed by a processor to implement the steps of the temperature sampling diagnosis method in any one of claims 1 to 6.

14. A computer program product comprising computer programs or instructions, characterized in that, The computer program or instructions are executed by a processor to implement the steps of the temperature sampling diagnosis method in any one of claims 1 to 6.

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