A method, system, medium and device for testing anti-interference capability of an in-vehicle chip

Abstract

The application provides a vehicle-mounted chip anti-interference capability test method, system, medium and equipment. The interference signal is superimposed into the standard signal to obtain a test excitation signal. The test excitation signal is input into a vehicle-mounted chip to be tested to obtain an anti-interference result. The control parameters of the interference signal are adjusted based on the anti-interference result to generate a new interference signal. The control parameters of the interference signal are continuously adjusted and input into the vehicle-mounted chip to be tested for testing, so as to generate multiple interference signals and test the failure boundary of the vehicle-mounted chip to be tested. The test effect of the vehicle-mounted chip can be improved, and the failure boundary condition of the vehicle-mounted chip can be accurately tested to help improve the performance of the vehicle-mounted chip.

Description

Technical Field

[0001] This application relates to the field of automotive chip testing technology, specifically to a method, system, medium, and equipment for testing the anti-interference capability of automotive chips. Background Technology

[0002] With the rapid development of vehicle networking and in-vehicle communication technologies, the communication functions of automotive chips are becoming increasingly sophisticated. However, in actual use, automotive chips encounter various environmental interferences, such as multipath effects, noise, and fading. To ensure that automotive chips have good anti-interference capabilities during vehicle operation, anti-interference capability tests are usually conducted on the chips before installation. However, if these real-world environments cannot be simulated during testing, the automotive chip may perform well in the laboratory but encounter problems in real-world applications. Therefore, environmental simulation is crucial to ensure that chips maintain high reliability in real-world scenarios by simulating complex and changing interference environments.

[0003] Existing testing methods mostly rely on preset fixed channel models, which are difficult to reproduce the complex characteristics of multipath time-varying and sudden interference in real-world scenarios. For example, the additive white Gaussian noise model simplifies channel noise to a stationary Gaussian distribution with constant power, but in reality, noise often exhibits non-Gaussian characteristics. Therefore, there is a need for a testing scheme for the anti-interference capability of automotive chips that can simulate complex interference environments in real-world scenarios. Summary of the Invention

[0004] To address the aforementioned technical problems, this application is proposed. Embodiments of this application provide a method, system, medium, and apparatus for testing the anti-interference capability of automotive chips.

[0005] According to one aspect of this application, a method for testing the anti-interference capability of an automotive chip is provided, comprising: generating an interference signal; wherein the interference signal includes a plurality of control parameters, the control parameters being used to adjust the interference signal; superimposing the interference signal onto a standard signal to obtain a test excitation signal; inputting the test excitation signal into an automotive chip under test to obtain an anti-interference result of the automotive chip under test; if the anti-interference result indicates that the automotive chip under test has not failed, adjusting the control parameters of the interference signal to generate a new interference signal; inputting the new test excitation signal into the automotive chip under test to obtain a new anti-interference result of the automotive chip under test; wherein the new test excitation signal is obtained by superimposing the new interference signal onto the standard signal; if the new anti-interference result indicates that the automotive chip under test has failed, determining the control parameter corresponding to the new interference signal as a failure threshold parameter of the automotive chip under test.

[0006] In one embodiment, generating the interference signal includes: generating an initial signal based on the plurality of control parameters; extracting feature information of the initial signal and performing spectral normalization on the feature information of the initial signal to obtain the interference signal.

[0007] In one embodiment, superimposing the interference signal onto a standard signal to obtain a test excitation signal includes: superimposing the interference signal onto the standard signal in a digital domain linear superposition to obtain a digital signal; converting the digital signal into an analog signal; performing frequency modulation on the analog signal to a target frequency band and suppressing noise through filtering to obtain a frequency-modulated signal; and inputting the frequency-modulated signal into a power amplifier to obtain the test excitation signal.

[0008] In one embodiment, the standard signal is generated by: generating a standard protocol frame and extracting feature information of the standard protocol frame; performing compliance verification on the feature information of the standard protocol frame; and if the compliance verification is successful, determining the standard protocol frame as the standard signal.

[0009] In one embodiment, the step of inputting the test excitation signal into the vehicle chip under test to obtain the anti-interference result of the vehicle chip under test includes: inputting the test excitation signal into the vehicle chip under test and collecting multiple performance indicators of the vehicle chip under test; the multiple performance indicators include the target bit error rate, error vector amplitude and receiver sensitivity of the vehicle chip under test; and determining the anti-interference result of the vehicle chip under test based on the multiple performance indicators.

[0010] In one embodiment, adjusting the control parameters of the interference signal to generate a new interference signal includes: adjusting the interference type, weight of each interference type, interference intensity, interference power level, fading depth or velocity of the interference signal to generate the new interference signal.

[0011] In one embodiment, the method for testing the anti-interference capability of the vehicle chip further includes: if the new anti-interference result indicates that the vehicle chip under test has not failed, then the control parameters of the interference signal are adjusted again until the vehicle chip under test fails.

[0012] According to another aspect of this application, a testing system for the anti-interference capability of an automotive chip is provided, comprising: an interference signal generation module for generating an interference signal; wherein the interference signal includes multiple control parameters, the control parameters being used to adjust the interference signal; a test signal generation module for superimposing the interference signal onto a standard signal to obtain a test excitation signal; a test result generation module for inputting the test excitation signal into the automotive chip under test to obtain an anti-interference result of the automotive chip under test; a control parameter adjustment module for adjusting the control parameters of the interference signal to generate a new interference signal if the anti-interference result indicates that the automotive chip under test has not failed; a test result update module for inputting the new test excitation signal into the automotive chip under test to obtain a new anti-interference result of the automotive chip under test; wherein the new test excitation signal is obtained by superimposing the new interference signal onto the standard signal; and a failure parameter determination module for determining the control parameter corresponding to the new interference signal as a failure critical parameter of the automotive chip under test if the new anti-interference result indicates that the automotive chip under test has failed.

[0013] According to another aspect of this application, a computer-readable storage medium is provided, the storage medium storing a computer program for performing any of the methods described above.

[0014] According to another aspect of this application, an electronic device is provided, comprising: a processor; a memory for storing processor-executable instructions; the processor being configured to perform any of the methods described above.

[0015] This application provides a method, system, medium, and device for testing the anti-interference capability of an automotive chip. The method involves generating an interference signal, which includes multiple control parameters used to adjust the interference signal; superimposing the interference signal onto a standard signal to obtain a test excitation signal; inputting the test excitation signal into the automotive chip under test to obtain the anti-interference result of the chip; if the anti-interference result indicates that the chip is not ineffective, adjusting the control parameters of the interference signal to generate a new interference signal; inputting the new test excitation signal into the chip to obtain a new anti-interference result; wherein the new test excitation signal is obtained by superimposing the new interference signal onto the standard signal; if the new anti-interference result indicates that the chip is not ineffective, the method adjusts the control parameters of the interference signal to generate a new interference signal; ... If the interference result indicates the failure of the automotive chip under test, then the control parameters corresponding to the new interference signal are determined as the failure critical parameters of the automotive chip under test. That is, by superimposing the interference signal onto the standard signal to obtain the test excitation signal, the test excitation signal is input into the automotive chip under test to obtain the anti-interference result, and the control parameters of the interference signal are adjusted based on the feedback of the anti-interference result to generate a new interference signal. By continuously adjusting the control parameters of the interference signal and inputting them into the automotive chip under test for testing, multiple interference signals can be generated and the failure boundary of the automotive chip under test can be tested. This not only improves the testing effect of the automotive chip, but also accurately tests the failure boundary conditions of the automotive chip, thus contributing to the performance improvement of the automotive chip. Attached Figure Description

[0016] The above and other objects, features, and advantages of this application will become more apparent from the more detailed description of the embodiments of this application in conjunction with the accompanying drawings. The drawings are provided to further illustrate the embodiments of this application and form part of the specification. They are used together with the embodiments of this application to explain this application and do not constitute a limitation thereof. In the drawings, the same reference numerals generally represent the same components or steps.

[0017] Figure 1 This is a flowchart illustrating a method for testing the anti-interference capability of an on-board chip according to an exemplary embodiment of this application.

[0018] Figure 2 This is a schematic diagram of the structure of a test system for the anti-interference capability of an on-board chip provided in an exemplary embodiment of this application.

[0019] Figure 3 This is a structural diagram of an electronic device provided in an exemplary embodiment of this application. Detailed Implementation

[0020] Hereinafter, exemplary embodiments according to this application will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are merely some embodiments of this application, and not all embodiments of this application. It should be understood that this application is not limited to the exemplary embodiments described herein.

[0021] Figure 1 This is a flowchart illustrating a method for testing the anti-interference capability of an automotive chip according to an exemplary embodiment of this application. Figure 1 As shown, the test method for the anti-interference capability of this automotive chip includes the following steps:

[0022] Step 110: Generate interference signal.

[0023] The interference signal includes multiple control parameters used to adjust the interference signal. This application generates interference signals (such as delay spread signals caused by multipath effects, Doppler shift signals, non-Gaussian impulse noise, burst interference envelopes, and signals with specific fading characteristics) through a GAN (Generative Adversarial Network) interference generation system. The GAN includes multiple control parameters such as channel type, moving speed, and interference level. By adjusting the control parameters, different interference signals can be generated.

[0024] Step 120: Superimpose the interference signal onto the standard signal to obtain the test excitation signal.

[0025] This application superimposes the generated interference signal onto the standard signal to obtain a test excitation signal carrying the interference signal, thereby simulating a signal environment in real-world scenarios where normal signals are mixed with interference signals.

[0026] Step 130: Input the test excitation signal into the vehicle chip under test to obtain the anti-interference result of the vehicle chip under test.

[0027] This application inputs a test excitation signal into the automotive chip under test (e.g., injects it into the RF input port of the automotive chip under test through a wired probe of a probe station) to perform anti-interference performance testing on the automotive chip under test and obtain the anti-interference test results of the automotive chip under test.

[0028] Step 140: If the anti-interference result indicates that the on-board chip under test has not failed, adjust the control parameters of the interference signal to generate a new interference signal.

[0029] If the anti-interference test results indicate that the automotive chip under test has not failed, meaning that the automotive chip under test works normally under the interference of the interference signal, then it means that the interference signal is insufficient to affect the normal operation of the automotive chip under test. If the interference signal set at this time is the target interference signal required for the test (e.g., meeting the interference signal type, intensity, etc. required by the automotive chip anti-interference standard), then it can be determined that the automotive chip under test meets the standard. In order to further explore the anti-interference performance boundary of the automotive chip under test, this application further adjusts the control parameters of the interference signal to adjust the type, intensity, etc. of the interference signal, thereby obtaining a new interference signal (which is more severe than the previous interference signal).

[0030] Step 150: Input the new test excitation signal into the vehicle chip under test to obtain the new anti-interference result of the vehicle chip under test.

[0031] The new test excitation signal is obtained by superimposing a new interference signal onto a standard signal. After obtaining the new interference signal, this application inputs the new test excitation signal (obtained by superimposing the new interference signal onto the standard signal) into the automotive chip under test to obtain a new anti-interference result, thereby realizing a closed-loop control, that is, adjusting the control parameters according to the test results to explore the anti-interference performance boundary of the automotive chip under test.

[0032] Step 160: If the new anti-interference result indicates that the vehicle chip under test has failed, then the control parameter corresponding to the new interference signal is determined as the failure critical parameter of the vehicle chip under test.

[0033] If the test result obtained after adjusting the control parameters is that the automotive chip under test fails, it means that the control parameters (including all parameters of the interference signal) corresponding to the interference signal at this time are the critical failure parameters of the automotive chip under test, thus obtaining the anti-interference performance boundary of the automotive chip under test. To improve the accuracy of the critical failure parameters, after the automotive chip under test fails, this application can reduce the step size of the control parameter adjustment, reduce the severity of the interference signal based on the control parameters corresponding to the current failure result, and further refine the critical failure parameters.

[0034] This application provides a method for testing the anti-interference capability of an automotive chip. The method involves generating an interference signal, which includes multiple control parameters used to adjust the interference signal; superimposing the interference signal onto a standard signal to obtain a test excitation signal; inputting the test excitation signal into the automotive chip under test to obtain the anti-interference result of the chip; if the anti-interference result indicates that the chip is not faulty, adjusting the control parameters of the interference signal to generate a new interference signal; inputting the new test excitation signal into the chip to obtain a new anti-interference result; wherein the new test excitation signal is obtained by superimposing the new interference signal onto the standard signal; if the new anti-interference result indicates that the chip is not faulty... If the automotive chip under test fails, the control parameters corresponding to the new interference signal are determined as the failure threshold parameters of the automotive chip under test. That is, by superimposing the interference signal onto the standard signal to obtain the test excitation signal, the test excitation signal is input into the automotive chip under test to obtain the anti-interference result, and the control parameters of the interference signal are adjusted based on the feedback of the anti-interference result to generate a new interference signal. By continuously adjusting the control parameters of the interference signal and inputting them into the automotive chip under test for testing, multiple interference signals can be generated and the failure boundary of the automotive chip under test can be tested. This not only improves the testing effect of the automotive chip, but also accurately tests the failure boundary conditions of the automotive chip, thus contributing to the performance improvement of the automotive chip.

[0035] In one embodiment, step 110 can be implemented as follows: an initial signal is generated based on multiple control parameters; feature information of the initial signal is extracted and spectral normalization is performed on the feature information of the initial signal to obtain an interference signal.

[0036] Specifically, this application can set initial control parameters, generate an initial signal based on the initial control parameters, and extract feature information from the initial signal. Specifically, the method of extracting feature information can be to input the initial signal into a U-Net encoder, a temporal feature extraction layer (LSTM), and a multi-scale convolutional layer to extract feature information from the initial signal, and perform spectral normalization on the feature information to constrain the signal within a certain amplitude range to obtain an interference signal.

[0037] In one embodiment, step 120 can be implemented as follows: superimposing the interference signal onto the standard signal in the digital domain to obtain a digital signal; converting the digital signal into an analog signal; performing frequency modulation on the analog signal to the target frequency band and suppressing noise through filtering to obtain a frequency-modulated signal; and inputting the frequency-modulated signal into a power amplifier to obtain a test excitation signal.

[0038] This application performs real-time digital domain linear superposition of the generated interference signal and standard signal in a signal synthesizer, and converts the synthesized digital signal into an analog signal through a DAC. The analog signal is then modulated to the target frequency band by a mixer, and then the out-of-band noise is suppressed by a bandpass filter to obtain a frequency-modulated signal. The frequency-modulated signal is then input to a power amplifier, which adjusts it to the target level to obtain the test excitation signal.

[0039] In one embodiment, the above-mentioned standard signal can be generated by: generating a standard protocol frame and extracting the feature information of the standard protocol frame; performing compliance verification on the feature information of the standard protocol frame; and determining the standard protocol frame as a standard signal if the compliance verification is successful.

[0040] This application can generate standard protocol frames and verify the compliance of the frame structure of the generated standard protocol frames by a protocol classifier. Specifically, by parsing the I / Q data stream of the standard protocol frame in real time, the physical layer structure of the standard protocol frame is checked item by item in strict accordance with the target communication protocol specification. The classifier matches and compares the parsing results with the pre-loaded protocol rule base. If all key elements pass the verification, the standard protocol frame is determined to be compliant and identified as a standard signal.

[0041] In one embodiment, step 130 can be implemented by: inputting a test excitation signal into the vehicle chip under test and collecting multiple performance indicators of the vehicle chip under test; the multiple performance indicators include the target bit error rate, error vector amplitude and receiver sensitivity of the vehicle chip under test; and determining the anti-interference result of the vehicle chip under test based on the multiple performance indicators.

[0042] After generating the test stimulus signal, this application inputs the test stimulus signal into the vehicle chip under test and collects multiple performance indicators of the vehicle chip under test (including the target bit error rate, error vector amplitude, and receiver sensitivity of the vehicle chip under test). Based on the multiple performance indicators, the anti-interference result of the vehicle chip under test is determined. Specifically, this application can set multiple thresholds. If any one of the target bit error rate, error vector amplitude, and receiver sensitivity of the vehicle chip under test reaches the corresponding threshold, it is determined to be a failure. Alternatively, the target bit error rate, error vector amplitude, and receiver sensitivity of the vehicle chip under test are weighted to obtain a failure judgment result characterization value. When the result characterization value reaches the threshold, it is determined to be a failure.

[0043] In one embodiment, step 140 can be implemented by adjusting the interference type, weight of each interference type, interference intensity, interference power level, fading depth or speed of the interference signal to generate a new interference signal.

[0044] When the test shows that the vehicle chip under test has not failed, this application further adjusts the type of interference signal (e.g., increasing the moving speed to simulate a larger Doppler frequency shift), the weight of each type of interference, the interference intensity, the interference power level, the fading depth or speed, etc., to generate a more severe interference signal, and then conducts an anti-interference performance test on the vehicle chip under test again.

[0045] In one embodiment, the method for testing the anti-interference capability of the vehicle chip may further include: if the new anti-interference result indicates that the vehicle chip under test has not failed, then the control parameters of the interference signal are adjusted again until the vehicle chip under test fails.

[0046] If the test results after adjustment still show that the vehicle chip under test has not failed, then the control parameters of the interference signal are adjusted again. By continuously adjusting the control parameters, a more severe interference signal is obtained until the vehicle chip under test fails, thereby obtaining the critical point of the anti-interference performance of the vehicle chip under test.

[0047] Figure 2 This is a schematic diagram of the structure of a test system for the anti-interference capability of an on-board chip provided in an exemplary embodiment of this application. Figure 2 As shown, the testing system 20 for the anti-interference capability of the automotive chip includes: an interference signal generation module 21 for generating an interference signal; wherein the interference signal includes multiple control parameters, which are used to adjust the interference signal; a test signal generation module 22 for superimposing the interference signal onto a standard signal to obtain a test excitation signal; a test result generation module 23 for inputting the test excitation signal into the automotive chip under test to obtain the anti-interference result of the automotive chip under test; a control parameter adjustment module 24 for adjusting the control parameters of the interference signal to generate a new interference signal if the anti-interference result indicates that the automotive chip under test has not failed; a test result update module 25 for inputting the new test excitation signal into the automotive chip under test to obtain a new anti-interference result of the automotive chip under test; wherein the new test excitation signal is obtained by superimposing the new interference signal onto a standard signal; and a failure parameter determination module 26 for determining the control parameter corresponding to the new interference signal as the failure threshold parameter of the automotive chip under test if the new anti-interference result indicates that the automotive chip under test has failed.

[0048] This application provides a testing system for the anti-interference capability of an automotive chip. An interference signal generation module 21 generates an interference signal, which includes multiple control parameters used to adjust the interference signal. A test signal generation module 22 superimposes the interference signal onto a standard signal to obtain a test excitation signal. A test result generation module 23 inputs the test excitation signal into the automotive chip under test to obtain the anti-interference result of the chip. If the anti-interference result indicates that the chip is not faulty, a control parameter adjustment module 24 adjusts the control parameters of the interference signal to generate a new interference signal. A test result update module 25 inputs the new test excitation signal into the chip under test to obtain a new anti-interference result. The new test excitation signal is a superimposed version of the new interference signal. The interference signal is added to the standard signal to obtain the test excitation signal. If the new anti-interference result indicates that the vehicle chip under test has failed, the failure parameter determination module 26 determines the control parameter corresponding to the new interference signal as the failure critical parameter of the vehicle chip under test. That is, by superimposing the interference signal onto the standard signal to obtain the test excitation signal, the test excitation signal is input into the vehicle chip under test to obtain the anti-interference result, and the control parameter of the interference signal is adjusted based on the feedback of the anti-interference result to generate a new interference signal. By continuously adjusting the control parameter of the interference signal and inputting it into the vehicle chip under test for testing, multiple interference signals can be generated and the failure boundary of the vehicle chip under test can be tested. This not only improves the test effect of the vehicle chip, but also accurately tests the failure boundary conditions of the vehicle chip, thus helping to improve the performance of the vehicle chip.

[0049] In one embodiment, the interference signal generation module 21 can be further configured to: generate an initial signal based on multiple control parameters; extract feature information of the initial signal and perform spectral normalization on the feature information of the initial signal to obtain an interference signal.

[0050] In one embodiment, the test signal generation module 22 can be further configured to: superimpose the interference signal onto the standard signal for digital domain linear superposition to obtain a digital signal; convert the digital signal into an analog signal; perform frequency modulation on the analog signal to the target frequency band and suppress noise through filtering to obtain a frequency-modulated signal; and input the frequency-modulated signal into a power amplifier to obtain a test excitation signal.

[0051] In one embodiment, the above-mentioned vehicle chip anti-interference capability testing system 20 can be further configured to: generate a standard protocol frame and extract the feature information of the standard protocol frame; perform compliance verification on the feature information of the standard protocol frame; if the compliance verification is qualified, then determine that the standard protocol frame is a standard signal.

[0052] In one embodiment, the test result generation module 23 can be further configured to: input the test excitation signal into the vehicle chip under test, and collect multiple performance indicators of the vehicle chip under test; the multiple performance indicators include the target bit error rate, error vector amplitude and receiver sensitivity of the vehicle chip under test; and determine the anti-interference result of the vehicle chip under test based on the multiple performance indicators.

[0053] In one embodiment, the control parameter adjustment module 24 can be further configured to: adjust the interference type, weight of each interference type, interference intensity, interference power level, fading depth or speed of the interference signal to generate a new interference signal.

[0054] In one embodiment, the above-mentioned vehicle chip anti-interference capability testing system 20 can be further configured to: if the new anti-interference result indicates that the vehicle chip under test has not failed, then the control parameters of the interference signal are adjusted again until the vehicle chip under test fails.

[0055] Below, for reference Figure 3 This application describes an electronic device according to embodiments thereof. The electronic device may be either or both of a first device and a second device, or a standalone device independent of them, which may communicate with the first device and the second device to receive acquired input signals from them.

[0056] Figure 3 A block diagram of an electronic device according to an embodiment of this application is illustrated.

[0057] like Figure 3 As shown, the electronic device 10 includes one or more processors 11 and memory 12.

[0058] The processor 11 may be a central processing unit (CPU) or other form of processing unit with data processing capabilities and / or instruction execution capabilities, and may control other components in the electronic device 10 to perform desired functions.

[0059] The memory 12 may include one or more computer program products, which may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may include, for example, random access memory (RAM) and / or cache memory. The non-volatile memory may include, for example, read-only memory (ROM), hard disk, flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor 11 may execute the program instructions to implement the methods of the various embodiments of this application described above and / or other desired functions. Various contents such as input signals, signal components, and noise components may also be stored in the computer-readable storage medium.

[0060] In one example, the electronic device 10 may also include an input device 13 and an output device 14, which are interconnected via a bus system and / or other forms of connection mechanism (not shown).

[0061] When the electronic device is a standalone device, the input device 13 can be a communication network connector for receiving the collected input signals from the first device and the second device.

[0062] In addition, the input device 13 may also include, for example, a keyboard, a mouse, etc.

[0063] The output device 14 can output various information to the outside, including determined distance information, direction information, etc. The output device 14 may include, for example, a display, a speaker, a printer, and a communication network and its connected remote output devices, etc.

[0064] Of course, for the sake of simplicity, Figure 3 Only some of the components of the electronic device 10 relevant to this application are shown in this illustration; components such as buses, input / output interfaces, etc., are omitted. In addition, the electronic device 10 may include any other suitable components depending on the specific application.

[0065] In addition to the methods and apparatus described above, embodiments of this application may also be computer program products, which include computer program instructions that, when executed by a processor, cause the processor to perform the steps in the methods according to various embodiments of this application described in the "Exemplary Methods" section above.

[0066] The computer program product can be written in any combination of one or more programming languages ​​to perform the operations of the embodiments of this application. The programming languages ​​include object-oriented programming languages ​​such as Java and C++, as well as conventional procedural programming languages ​​such as C or similar languages. The program code can be executed entirely on the user's computing device, partially on the user's computing device, as a standalone software package, partially on the user's computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0067] Furthermore, embodiments of this application may also be computer-readable storage media storing computer program instructions thereon, which, when executed by a processor, cause the processor to perform the steps in the methods according to various embodiments of this application described in the "Exemplary Methods" section above.

[0068] The computer-readable storage medium may be any combination of one or more readable media. A readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may be, for example, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: an electrical connection having one or more wires, a portable disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof.

[0069] The basic principles of this application have been described above with reference to specific embodiments. However, it should be noted that the advantages, benefits, and effects mentioned in this application are merely examples and not limitations, and should not be considered as essential features of each embodiment of this application. Furthermore, the specific details disclosed above are for illustrative and facilitative purposes only, and are not limitations. These details do not limit the application to the necessity of employing the aforementioned specific details for implementation.

[0070] The block diagrams of devices, apparatuses, devices, and systems involved in this application are merely illustrative examples and are not intended to require or imply that they must be connected, arranged, or configured in the manner shown in the block diagrams. As those skilled in the art will recognize, these devices, apparatuses, devices, and systems can be connected, arranged, and configured in any manner. Words such as “comprising,” “including,” “having,” etc., are open-ended terms meaning “including but not limited to,” and are used interchangeably with them. The terms “or” and “and” as used herein refer to the terms “and / or,” and are used interchangeably with them unless the context clearly indicates otherwise. The term “such as” as used herein refers to the phrase “such as but not limited to,” and is used interchangeably with it.

[0071] It should also be noted that in the apparatus, equipment, and methods of this application, the components or steps can be disassembled and / or recombined. These disassemblies and / or recombinations should be considered as equivalent solutions of this application.

[0072] The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use this application. Various modifications to these aspects will be readily apparent to those skilled in the art, and the general principles defined herein can be applied to other aspects without departing from the scope of this application. Therefore, this application is not intended to be limited to the aspects shown herein, but rather to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0073] The above description has been given for purposes of illustration and description. Furthermore, this description is not intended to limit the embodiments of this application to the forms disclosed herein. Although numerous exemplary aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, alterations, additions, and sub-combinations thereof.

Claims

1. A method for testing anti-interference capability of an in-vehicle chip, characterized in that, include: An interference signal is generated; wherein the interference signal includes multiple control parameters, the control parameters being used to adjust the interference signal; The interference signal is superimposed on the standard signal to obtain the test excitation signal; The test excitation signal is input into the vehicle chip under test to obtain the anti-interference result of the vehicle chip under test. If the anti-interference result indicates that the vehicle chip under test has not failed, then the control parameters of the interference signal are adjusted to generate a new interference signal; A new test excitation signal is input to the vehicle chip under test to obtain a new anti-interference result for the vehicle chip under test; wherein, the new test excitation signal is obtained by superimposing the new interference signal onto the standard signal; If the new anti-interference result indicates that the vehicle chip under test has failed, then the control parameter corresponding to the new interference signal is determined as the failure critical parameter of the vehicle chip under test. The step of superimposing the interference signal onto the standard signal to obtain the test excitation signal includes: The interference signal is superimposed on the standard signal for linear superposition in the digital domain to obtain a digital signal; Convert the digital signal into an analog signal; The analog signal is mixed and modulated to the target frequency band, and noise is suppressed by filtering to obtain the frequency-modulated signal; The frequency modulation signal is input into the power amplifier to obtain the test excitation signal.

2. The method of claim 1, wherein, The generated interference signal includes: An initial signal is generated based on the aforementioned multiple control parameters; The feature information of the initial signal is extracted and the feature information of the initial signal is subjected to spectral normalization to obtain the interference signal.

3. The method of claim 1, wherein the method further comprises: The standard signal is generated in the following ways: Generate a standard protocol frame and extract the feature information of the standard protocol frame; Perform compliance verification on the feature information of the standard protocol frame; If the compliance check passes, the standard protocol frame is determined to be the standard signal.

4. The method of claim 1, wherein the method further comprises: The step of inputting the test excitation signal into the vehicle chip under test to obtain the anti-interference result of the vehicle chip under test includes: The test excitation signal is input to the vehicle chip under test, and multiple performance indicators of the vehicle chip under test are collected; the multiple performance indicators include the target bit error rate, error vector amplitude and receiver sensitivity of the vehicle chip under test. Based on the aforementioned performance indicators, the anti-interference result of the vehicle chip under test is determined.

5. The test method for the anti-interference capability of automotive chips according to claim 1, characterized in that, The step of adjusting the control parameters of the interference signal to generate a new interference signal includes: The interference type, weight of each interference type, interference intensity, interference power level, fading depth or velocity of the interference signal are adjusted to generate the new interference signal.

6. The test method for the anti-interference capability of automotive chips according to claim 1, characterized in that, The test method for the anti-interference capability of the vehicle-mounted chip also includes: If the new anti-interference result indicates that the vehicle chip under test has not failed, then the control parameters of the interference signal are adjusted again until the vehicle chip under test fails.

7. A testing system for the anti-interference capability of automotive chips, characterized in that, include: An interference signal generation module is used to generate an interference signal; wherein the interference signal includes multiple control parameters, the control parameters being used to adjust the interference signal; The test signal generation module is used to superimpose the interference signal onto the standard signal to obtain the test excitation signal; The test result generation module is used to input the test excitation signal into the vehicle chip under test to obtain the anti-interference result of the vehicle chip under test; The control parameter adjustment module is used to adjust the control parameters of the interference signal to generate a new interference signal if the anti-interference result indicates that the vehicle chip under test has not failed. The test result update module is used to input a new test excitation signal into the vehicle chip under test to obtain a new anti-interference result of the vehicle chip under test; wherein, the new test excitation signal is obtained by superimposing the new interference signal onto the standard signal; The failure parameter determination module is used to determine the control parameter corresponding to the new interference signal as the failure critical parameter of the vehicle chip under test if the new anti-interference result indicates that the vehicle chip under test has failed. The test signal generation module is configured as follows: The interference signal is superimposed on the standard signal for linear superposition in the digital domain to obtain a digital signal; Convert the digital signal into an analog signal; The analog signal is mixed and modulated to the target frequency band, and noise is suppressed by filtering to obtain the frequency-modulated signal; The frequency modulation signal is input into the power amplifier to obtain the test excitation signal.

8. A computer-readable storage medium, characterized in that, The storage medium stores a computer program for performing the method described in any one of claims 1-6.

9. An electronic device, characterized in that, include: processor; Memory used to store the processor's executable instructions; The processor is used to execute the method described in any one of claims 1-6.

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