Test and data processing system for active phased array component level test

Abstract

The invention relates to a test and data processing system for an active phased array component level test, which is designed and established by adopting a new test method and data processing in order to reduce the duplication of labor of technicians and improve the data processing efficiency. The device is used for an active test under an unattended condition, realizes automatic sensing and control under different test nodes, automatically completes component-level radio frequency performance data acquisition, and processes huge test data automatically acquired at fixed time in batches.

Description

Technical Field

[0001] The present invention belongs to the technical field of radar signal test and data processing, and in particular relates to a test and processing technology for active phased array component-level test data. Background Art

[0002] Active phased array antennas are widely used in satellite payloads, employing modular or sub-array integration technology. To mitigate risks and fully verify on-orbit environmental adaptability, reliability, and service life, various environmental tests or specialized tests are required for all levels of the onboard phased array antenna array, particularly active modules, active sub-arrays, and component-level equipment.

[0003] The development of phased array antennas requires numerous tests. Some, such as full-temperature and thermal vacuum tests, require continuous day and night testing, lasting for dozens of days, tailored to test conditions and requirements. This generates a significant amount of data that requires processing.

[0004] With limited development resources and timelines, development testing poses significant challenges to equipment, space, and human resources. Dedicated active module test systems and on-site data analysis and processing methods cannot meet engineering development needs. Summary of the Invention

[0005] In order to reduce the duplication of technical personnel's work and improve data processing efficiency, new test methods and data processing are adopted to design and build a test and data processing system for active phased array component-level testing. This system can be used for active testing in unattended conditions, realize automatic perception and control at different test nodes, automatically complete component-level RF performance data collection, and batch process the huge amount of test data collected automatically at regular intervals.

[0006] The system includes two aspects: automatic acquisition test system hardware and test control and data processing. The automatic acquisition test system can automatically collect and sense the current test environment through one-click testing, including the test environment temperature, the temperature of the device under test, the current power output of the device, etc. If the current test status exceeds the test condition temperature, or the operating temperature or power output status of the DUT exceeds the preset operating threshold, the test software will power off the DUT and issue an alert on the test interface. The test status at that temperature point will also be recorded for subsequent analysis. If the test status is normal—that is, the ambient temperature, DUT temperature, and instrument power output meet the current test conditions and thresholds—then the system will collect data for the DUT's specified items and complete the calibration test items for the specified position of the active module or active subarray, including T / R components and delay amplifier components, and / or the non-calibration test items for passive devices according to preset requirements. By collecting data from active modules or component-level devices, data sampling is achieved within the specified operating bandwidth range of active channels or passive links. Through data processing, large amounts of batch test data are processed in a timely manner, and the automatically sensed test environment is displayed in real time or at a scheduled interval. If an abnormal environment occurs, automatic power off is implemented and the fault time is recorded. The system enables unattended active phased array component-level testing and efficiently processes large amounts of test data, thereby reducing testing costs and improving data processing efficiency.

[0007] The active phased array component-level device test system inherits traditional module test systems and utilizes a universal high-speed network adapter, a programmable DC regulated power supply, an environmental and active device temperature control acquisition instrument, a multi-channel matrix switch, and a vector network analyzer. It automatically collects and interprets temperature, power supply output voltage, and current under current test conditions. Based on the currently configured test conditions, it automatically determines whether the current test status is normal, thus enabling automatic test status sensing. If the recorded test condition data exceeds the safety threshold for the current temperature or power supply operating status, the test system automatically shuts down the power supply and records the current test status, including time, device temperature, and power supply output voltage and current, for subsequent manual analysis, thus enabling unattended troubleshooting. At the beginning of each test moment, if the test system detects that the current test status is normal (i.e., the test conditions meet the safety threshold), it collects data from the component-level device under test, including calibration testing of active links and uncalibrated testing of passive links. After the test, the data is analyzed and processed according to the test task requirements, generating test data or a test report in a specified format. During the test, the test tasks are divided into two categories: test status perception and test data collection test. The test items are integrated into one-click operation, and the specified test data items are manually selected at the beginning of the test; in terms of data processing, fast batch processing is achieved according to the specified requirements.

[0008] The hardware of the phased array component-level device test system utilizes a CPCI bus interface and instrumentation that supports network access and remote control. The control device comprises a multi-function network adapter, and the main control board is comprised of a Loongson 2F core board and an FPGA expansion board. It utilizes a high-speed CPCI bus and supports hot-swappable technology. The programmable DC power supply, multi-probe temperature acquisition instrument, vector network analyzer, unit vector energy matrix, network adapter, and matrix switch that power the device under test are interconnected via the CPCI bus and network switches, enabling control and communication testing between devices and switching between passive devices and active links. Through a combination of software and instrumentation, test status awareness, non-calibrated RF parameter testing, active link calibration testing, and automatic recording are achieved in a timely and orderly manner. The system offers comprehensive performance, unattended operation, and a high degree of integration.

[0009] The phased array component-level device test system uses embedded module technology for full-process test items and manual selection of single test items. It regularly senses and interprets test status based on preset parameters, performs a secondary interpretation of abnormal status, and implements automatic power-off protection for equipment in abnormal situations. Under normal test conditions, test items are automatically tested and data recorded on a regular basis. Component-level device test items can be selected based on device conditions, including fully active calibration test, non-calibration test, or non-calibration test + calibration test items. These items are preset before testing, allowing for flexible configuration.

[0010] The test items include four categories: The first category is test status perception and control. At the beginning of the test, each working condition of the device under test is set, such as temperature, duty cycle working time, number of cycles, and test start time. Before the test data is recorded, the temperature of the test environment, such as the test chamber and the device under test, is collected, and the temperature at the location where the temperature sensing hardware in the test system is set and the temperature of the device under test are read, and compared with the temperature set in the test. If the test environment temperature exceeds the temperature threshold set in the test chamber, or the operating temperature of the device under test exceeds the product operating temperature condition threshold, the device is powered off and the current temperature data and instrument power supply status are recorded. The voltage and current of the instrument power supply of the device are collected and compared with the parameters during normal operation. If the voltage and current are abnormal, the power output is cut off through the control software to protect the safety of the device under test, and the current temperature data and instrument power supply status are recorded. If the collected environment and equipment temperatures are normal, and the voltage and current of the instrument power supply output are normal, the test system will start timing according to the preset test time and prepare to carry out test data recording according to the specified project.

[0011] The second type is non-calibrated testing, which tests the transmission coefficient of the passive link of the test component. It uses S11 or S12 for testing, and sets the link channels to equal amplitude and phase one by one to record data.

[0012] The third category, test piece link data, eliminates errors introduced by the test piece during the test process. The RF test piece used in the link under test is aligned with the amplitude and phase, placed in a test chamber and connected to the device under test within the same test system. This allows for synchronous, uncalibrated test data capture of the test piece link for post-test data cancellation. The fourth category, calibration test, is to conduct channel-specific state traversal test on active modules or active sub-arrays. Using internal calibration link test, the specified states of all channels of T / R channels and delay amplifier components are traversed one by one. Except for the open channels, the remaining channels are in the load state. The four types of test items cover the components of the RF, control, and power supply links of component-level equipment, traverse the specified positions of each passive channel and active link, and realize synchronous testing of passive and active link performance in the same test chamber to eliminate errors of each component-level equipment under different test conditions.

[0013] The active module test system uses C# to collect data, process data in batches, automatically sense the test status, automatically collect test data, and implement emergency power-off processing in unattended situations. It can also implement test data batch processing according to customized requirements.

[0014] In terms of test system hardware, the use of high-speed RF testing, CPCI bus, instrument integration technology that can be controlled through the network port, and test piece synchronous calibration method have greatly improved test efficiency and test accuracy.

[0015] In terms of test system operation, it integrates automated one-click full-process project testing, local project automated testing and manual testing, with flexible configuration.

[0016] The test items integrate internal calibration test and non-calibration test to achieve a comprehensive evaluation of the internal calibration link and main RF link of the module performance.

[0017] The test system integrates data batch processing and automated analysis software, which can remove errors from data under different working conditions (eliminating the influence of accompanying test pieces from the tested data), analyze data stability, and automatically interpret the input of amplitude and phase fluctuation health standard values. It can also generate automatic reports for the tested items based on the requirements of the data analysis project. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a hierarchical diagram of system composition.

[0019] Figure 2 This is a schematic diagram of the system hardware composition.

[0020] Figure 3 This is the schematic diagram of the system hardware composition.

[0021] Figure 4 This is a diagram of the network interface.

[0022] Figure 5 This is the wiring diagram of the active module.

[0023] Figure 6 This is the system working principle diagram.

[0024] Figure 7 It is a test flow chart. DETAILED DESCRIPTION

[0025] The following, in conjunction with the accompanying drawings, specifically describes the technical solution of the present invention for testing component-level equipment of a spaceborne active phased array antenna, including internal calibration testing of active modules and non-calibration testing of integrated networks.

[0026] The test system includes a sensing unit, a test unit, a control and processing unit, such as Figure 1 As shown. The sensing unit includes temperature sensing components and power sensing components. The temperature sensing component includes a multi-probe temperature patrol meter and a thermistor. The power sensing component includes remote control, telemetry, and acquisition components for voltage and power supply temperature. The test unit includes a vector network analyzer, a programmable DC power supply, a multi-port matrix switch, power supply and control, and RF signal transmission cables. The control and processing unit includes a CPCI computer and an integrated acquisition card, a network adapter, and a switch enable matrix. Each component is integrated in the test cabinet, as shown in the figure. Figure 2 shown.

[0027] The components are interconnected through low-frequency cables and radio frequency cables, including four links. The computer used for data acquisition, processing and control is connected to the switch enable controller, temperature patrol meter, programmable DC power supply, network adapter, vector network analyzer and switch matrix through the CPCI bus and network port respectively. The enable control command signal sent by the computer reaches the switch enable controller through the network port. The enable controller performs switch enable control on the specified address device according to the command requirements, such as Figure 3 shown.

[0028] Temperature sensing link: The temperature probe of the temperature patrol meter is set to a predetermined position to monitor the ambient temperature and the shell temperature of the device under test; the temperature patrol meter and the DC power supply are connected through a network cable, a network switch, and a CPCI bus, and timed data collection is achieved through a human-computer interaction interface.

[0029] Power supply link: The secondary power supply of the device under test is connected to the DC power supply via a low-frequency power supply twisted-pair cable with a built-in enable control cable. The computer in the control and processing unit has a built-in human-computer interaction interface, which is connected to the DC power supply via a network cable and controls the power module's switch.

[0030] Control link: The computer is connected to the network switch and array control module through a network cable, and sends control instructions and data to the array control module; the switch enable controller is connected to the switch matrix through the network port to control the timing operation of the specified port of the switch matrix; the network adapter interacts with the vector network analyzer for test control through the network port, and sends timing control signals to the vector network analyzer through the BNC port; the network adapter sends control signals, timing signals, enable signals, data signals, and telemetry signals through twisted-pair cables to achieve differential to single-ended control signal transmission and interact with the control interface of the module under test; the control link collects DC power supply information through timing control and telemetry instructions to achieve perception of the status of the device under test and the DC power supply.

[0031] RF link: The vector network analyzer is connected to the multi-port power splitter main port and the switch matrix main port outside the test box through RF cables connected to the two Port ports. The power splitter port is connected to the designated main port of the active module under test, the calibration main port N1, and the link port to be tested of the integrated network through RF cables L1 with equal amplitude and phase. Each port of the switch matrix is ​​connected to the main port M1 of the active module under test and the port at the other end of the link to be tested of the integrated network through RF cables L2 with equal amplitude and phase.

[0032] The device under test (EUT) includes active modules and passive integrated networks. The definitions of each port are as follows: Figure 4 As shown, ports 1 to 7 on the left correspond to ports 1 to 7 on the right, respectively, and the S12 test is performed; the active module wiring is as follows Figure 5 As shown, the cable combination L1 and L2 is used to test the cancellation of cable-induced errors.

[0033] The test system provides test strategies through control interfaces, data interfaces, and drivers, including test condition perception, system calibration, test data collection and recording, data analysis and processing, such as Figure 6 The test strategy provides a human-computer interaction interface for allocating and scheduling system resources, enabling data exchange between the test system and the user, displaying antenna status and information, and performing uncalibrated or calibrated tests at each temperature point. The computer is connected to the data acquisition module via a network cable and a network switch.

[0034] The test process of active modules is as follows: Figure 7 As shown, the component under test is connected to the test system, and the RF link automatically switches from the RF main link to the internal calibration link and the integrated network link.

[0035] Connect and confirm that all test equipment is normal, calibrate the test link, set the parameters of test condition perception through the human-computer interaction interface, and select full-active calibration test and / or non-calibration test for component-level equipment test items; the test system uses the CPCI bus to connect the network adapter, temperature collector, and programmable DC power supply to sense the initial test status of each test point during the test process.

[0036] The test system collects temperature and power information of the device under test, including ambient temperature, programmable DC power output, device temperature, and device power voltage. The test status is determined through the control and processing unit. Based on preset data timing collection, ambient and device temperature thresholds, power output voltage, and current thresholds, it determines whether the device under test is in a normal test state and controls whether each test point is powered off based on the threshold settings.

[0037] If the environment and equipment are normal, the test system will enable the switch matrix, select the specified switch matrix port according to the timing, and automatically collect and record the RF link data corresponding to the specified port. If the initial reading is abnormal, a secondary reading of the abnormal state will be performed. If the secondary reading is abnormal, the switch enable controller will be used to cut off the power to the programmable DC power supply, and the test status monitored at the time of the abnormality will be recorded for subsequent analysis. After the test, the RF data, monitoring temperature, and power supply data at different temperature points are compared and batch processed.

[0038] Test step 1: Set the initial parameters of the active module through the human-computer interaction interface, including test items, test parameters, and test status thresholds.

[0039] Taking the full-temperature test as an example, it includes the temperature points required for the test, heating or cooling time, holding time, number of tests, the highest and lowest temperatures during the operation of the equipment, and the output voltage and output current thresholds of the programmable power supply.

[0040] Test Step 2: Calibrate the passive link and active link separately and save the calibration data.

[0041] Test step 3: When the test conditions reach the first test point, the test point is recorded; test status perception is performed, and the temperature of the tested environment and the housing temperature of the device under test are collected in sequence; the voltage and current output by the DC power supply are collected, and the test system automatically compares the ambient temperature with the current operating temperature of the test chamber. If the ambient temperature exceeds the preset test chamber temperature point range of ±3°C, a secondary interpretation is performed, and the operating temperature of the device under test, the power output voltage, and the preset current thresholds are compared. If the threshold range is exceeded, the device under test is powered off and an early warning is issued on the human-computer interaction interface; the test status of the temperature point is recorded for subsequent analysis; if the test status is normal, data of the specified items of the device under test are collected and tested, including single-channel specified state calibration test and passive link test; after the specified item test is completed, the current test point is tested again. If normal, the temperature is raised or lowered according to the timing setting, and the next temperature point test is performed; all temperature points are traversed, and all data is automatically collected and recorded.

[0042] Test Step 4: The data of each test point is summarized and edited into a file, which records the test status data and calibrated or uncalibrated data of the current test point in sequence. According to the test requirements, the data is batch processed to compare the amplitude and phase stability of the measured channels at the specified test point and the consistency of the data between channels.

[0043] The above are embodiments of the present invention and do not limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention are included in the protection scope of the present invention.

Claims

1. A test and data processing system for active phased array component level testing, characterized in that: include: Sensing unit, testing unit, control and processing unit, the sensing unit includes temperature sensing component and power sensing component, the temperature sensing component includes multi-probe temperature patrol meter and thermistor, the power sensing component includes remote control, telemetry and acquisition component of voltage and power supply temperature, the testing unit includes vector network analyzer, programmable DC power supply, multi-port matrix switch, power supply and control and radio frequency signal transmission cable, the control and processing unit includes CPCI computer and integrated acquisition card, network adapter, switch enable matrix, each component is integrated in the test cabinet; the components are interconnected by low-frequency cables and radio frequency cables, including four links, the computer used for data acquisition, processing and control is connected to the switch enable controller, temperature patrol meter, programmable DC power supply, network adapter, vector network analyzer and switch matrix through CPCI bus and network port respectively, the enable control instruction signal sent by the computer reaches the switch enable controller through the network port, and the enable controller performs switch enable control on the specified address device according to the instruction requirements.

2. The test and data processing system for component-level testing of active phased arrays according to claim 1, characterized in that: include: Temperature sensing link: The temperature probe of the temperature patrol meter is set to a predetermined position to monitor the ambient temperature and the shell temperature of the device under test; the temperature patrol meter and the DC power supply are connected through a network cable, a network switch, and a CPCI bus, and timed acquisition is achieved through a human-computer interaction interface; power supply link: The secondary power supply of the device under test is connected to the DC power supply through a low-frequency power supply twisted pair cable, with a built-in enable control cable; the computer in the control and processing unit has a built-in human-computer interaction interface, connected to the DC power supply through a network cable, and controls the switching of the power module; control link: The computer is connected to the network switch and the array control module through a network cable, and sends control instructions and data to the array control module; the switch enable controller is connected to the switch matrix through the network port to control the timing operation of the specified port of the switch matrix; the network adapter interacts with the vector network analyzer for test control through the network port and sends timing control signals to the vector network analyzer through the BNC port; The network adapter sends control signals, timing signals, enable signals, data signals, and telemetry signals through twisted-pair cables to achieve differential to single-ended control signal transmission and interact with the control interface of the module under test; the control link collects information about the DC power supply through timing control and telemetry instructions to achieve perception of the status of the device under test and the DC power supply; RF link: the vector network analyzer is connected to the multi-port power divider main port and the switch matrix main port outside the test box through RF cables connected to the two Port ports. The power divider port is connected to the designated main port of the active module under test, the calibration main port N1, and the link port to be tested of the integrated network through RF cables L1 with equal amplitude and phase. Each port of the switch matrix is ​​connected to the main port M1 of the active module under test and the port at the other end of the link to be tested of the integrated network through RF cables L2 with equal amplitude and phase.

3. The test and data processing system for active phased array component-level testing according to claim 1, characterized in that: include: The test strategy is provided through the control interface, data interface, and driver, including test condition perception, system calibration, test data collection and recording, data analysis and processing. The test strategy provides a human-computer interaction interface for allocating and scheduling system resources, realizing data exchange between the test system and the user, displaying the status and information of the antenna, and performing non-calibrated or calibrated tests at each temperature point. The computer is connected to the data acquisition module through a network cable and a network switch.

4. The test and data processing system for component-level testing of active phased arrays according to claim 1, characterized in that: include: The system uses embedded module technology for full-process test items and manual selection of single test items. It regularly senses and interprets the test status according to preset parameters, performs a secondary interpretation of abnormal status, and realizes automatic power-off protection for equipment in abnormal situations. Under normal test status, automatic testing and data recording are completed on a regular basis for test items. Component-level equipment test items are selected according to equipment conditions, including fully active calibration test, non-calibration test, or non-calibration test + calibration test items. These items are preset before testing, and the configuration call is flexible.

5. The test and data processing system for component-level testing of active phased arrays according to claim 4, characterized in that: The test items include: the first category, test status perception and control: at the beginning of the test, each working condition such as temperature, duty cycle working time, number of cycles, and test start time is set for the device under test; before the test data is recorded, the temperature of the test environment such as the test chamber and the device under test is collected, and the temperature at the location where the temperature sensing hardware in the test system is set and the temperature of the device under test are read, and compared with the temperature set in the test. If the test environment temperature exceeds the temperature threshold set in the test chamber, or the operating temperature of the device under test exceeds the product operating temperature condition threshold, the device is powered off, and the current temperature data and instrument power supply status are recorded; the power supply voltage and current of the device power supply instrument are collected and compared with the parameters during normal operation. If the voltage and current are abnormal, the power supply output is cut off through the control software to protect the safety of the device under test, and the current temperature data and instrument power supply status are recorded; if the collected environment and equipment temperature are normal, and the voltage and current output of the instrument power supply are normal, the test system will time according to the preset test time and prepare to carry out the specified project. The first is non-calibrated testing, which tests the transmission coefficient of the passive link of the test component using S11 or S12, setting the link channels one by one to equal amplitude and phase for data acquisition. The third is test piece link data, which eliminates errors introduced by the test piece during the test. The RF test piece used in the tested link is set to equal amplitude and phase, placed in the test chamber with the device under test, and connected to the same test system. Non-calibrated test data is then synchronously acquired for the test piece link for post-test data cancellation. The fourth is calibration testing, which tests the active module or active sub-array through a channel-specific state traversal test using an internal calibration link test. The specified states of all channels of the T / R channel and delay amplifier component are traversed one by one. Except for the open channels, all other channels are in a load state. The four test items cover the RF, control, and power supply link components of the component-level equipment, traversing the specified states of each passive channel and active link. Synchronous testing of the passive and active link performance is achieved in the same test chamber, eliminating errors in different test conditions for each component-level device.

6. The test and data processing system for component-level testing of active phased arrays according to claim 1, characterized in that: The test process includes: connecting the component under test with the test system, and the RF link automatically switches from the RF main link to the internal calibration link and the integrated network link; connecting and confirming that each test device is normal, calibrating the test link, and setting the parameters of the test condition perception through the human-computer interaction interface for the component-level device test items to select full active calibration test and / or non-calibration test; the test system uses the CPCI bus to connect the network adapter, temperature collector, and programmable DC power supply to sense the initial test status of each test point during the test process; the test system collects the temperature and power information of the device under test, collects information on the ambient temperature, programmable DC power supply output, device temperature, and device power supply voltage, and realizes the test status interpretation through the control and processing unit. Based on the preset data timing acquisition, environment and equipment temperature thresholds, power supply output voltage and current thresholds, it is determined whether the test equipment is in a normal test state, and the power off of each test point is controlled according to the threshold setting; if the environment and equipment are normal, the test system enables the switch matrix, selects the specified switch matrix port according to the timing, and automatically acquires and records the RF link data corresponding to the specified port; if the initial judgment is abnormal, a secondary judgment is made on the abnormal state. If the secondary judgment is abnormal, the switch enable controller is used to cut off the power to the programmable DC power supply, and the test status monitored at the time of the abnormality is recorded for subsequent analysis; after the test, the RF data, monitoring temperature, and power supply data at different temperature points are compared and batch processed.

7. The test and data processing system for component-level testing of active phased array according to claim 6, characterized in that: include: Test step 1: Set the initial parameters of the active module through the human-computer interaction interface, including test items, test parameters, and test status thresholds; Test step 2: Calibrate the passive link and active link separately and save the calibration data; Test step 3: When the test condition reaches the first test point, record the test point; The test status is sensed by sequentially collecting the temperature of the tested environment and the temperature of the device's housing. The voltage and current output by the DC power supply are collected, and the test system automatically compares the ambient temperature with the current operating temperature of the test chamber. If the ambient temperature exceeds the preset test chamber temperature point range of ±3°C, a secondary interpretation is performed to compare the device's operating temperature, power supply output voltage, and current preset thresholds. If the threshold range is exceeded, the device is powered off for protection, and an early warning is issued on the human-computer interaction interface. The test status of the temperature point is recorded for subsequent analysis. If the test status is normal, the data of the specified items of the device under test are collected and tested, including single-channel specified state calibration test and passive link test. After the specified item test is completed, the current test point is tested again. If normal, the temperature is raised or lowered according to the timing setting, and the next temperature point test is carried out. All temperature points are traversed and all data are automatically collected and recorded. Test step 4: The data of each test point is summarized and edited into a file, and the test status data, calibration or non-calibration data of the current test point are recorded in turn. According to the test requirements, the data is batch processed to compare the amplitude and phase stability of the measured channel of the specified test point and the consistency of the data between channels.

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