Discrete device aging test device

Abstract

A discrete device aging test device disclosed by the present invention comprises a control box and a test box connected with the control box, the test box comprises a first box body and a plurality of test assemblies arranged in the first box body, and each test assembly comprises a drawer box and a plurality of test units arranged in the drawer box. The test unit comprises a hot plate, a liquid cooling plate, a signal plate and a mounting plate on which a plurality of pieces to be tested can be mounted, the mounting plate is arranged on the upper end surface of the hot plate, a positioning column is arranged on the mounting plate, the signal plate is positioned above the mounting plate, the signal plate is in sliding connection with the positioning column, the liquid cooling plate is fixed on the signal plate, and a plurality of groups of signal pins are also arranged on the signal plate; the control box comprises a controller, the controller is electrically connected with the testing unit, when the to-be-tested piece is installed on the installation plate, after the signal plate slides downwards, the liquid cooling plate abuts against the to-be-tested piece, and the signal pins are electrically connected with the pins of the to-be-tested piece in a one-to-one mode. Pins do not need to be inserted, a to-be-tested piece is not prone to being damaged, the testing amount is large, and the testing efficiency is high.

Description

Technical Field

[0001] The present invention relates to the field of component testing, and in particular to a discrete component aging testing device. Background Art

[0002] In the electronics field, discrete components include resistors, capacitors, diodes, and transistors. To improve the quality of these components before they leave the factory, they are subjected to performance testing. These components generally have pins, and to test them, they are usually plugged into burn-in sockets or mounting sockets. This plugging method can easily damage the pins or cause cosmetic damage, reducing the yield rate and testing efficiency.

[0003] There are also a few test devices that place discrete devices in a mounting base with a press-fit force for testing, but the mounting base can generally only accommodate one or two discrete devices, resulting in a small test volume and thus a low test rate. Summary of the Invention

[0004] In order to overcome the deficiencies of the prior art, the present invention aims to provide a discrete device aging test device, which does not require plugging pins when testing discrete devices, is not easily damaged, has a large test volume, and has high test efficiency.

[0005] The purpose of the present invention is achieved by the following technical solutions: A discrete device aging test device comprises a control box and a test box connected to the control box, the test box comprising a first box body and a plurality of test components arranged in the first box body, the test components comprising a drawer box and a plurality of test units arranged in the drawer box, the test unit comprising a hot plate, a liquid cooling plate, a signal plate and a mounting plate on which a plurality of test pieces to be tested can be mounted, the mounting plate being arranged on the upper end surface of the hot plate, a positioning column being arranged on the mounting plate, the signal plate being located above the mounting plate, the signal plate being slidably connected to the positioning column, the liquid cooling plate being fixed on the signal plate, and a plurality of groups of signal pins being further arranged on the signal plate; the control box comprises a controller, the controller being electrically connected to the test unit, when the test piece to be tested is mounted on the mounting plate, after the signal plate slides downward, the liquid cooling plate presses against the test piece to be tested, and the signal pins are electrically connected one by one to the pins of the test piece to be tested.

[0006] Preferably, there are two test boxes, which are respectively fixed at both ends of the control box. The control box includes a first box body and an exhaust pipe. The exhaust pipe is arranged in the first box body. The exhaust pipe is provided with multiple exhaust ports, and the exhaust ports are all connected to the drawer boxes one by one.

[0007] Preferably, the test box further includes a first fan, which is arranged at the upper end of the first box body, and a side wall of the first box body is further provided with a heat dissipation port.

[0008] Preferably, the drawer box includes a box body, a flip cover and a smart lock for controlling the opening and closing of the flip cover, the flip cover and the smart lock are both located on one side of the box body opening, and the test unit is arranged in the box body.

[0009] Preferably, the drawer box further comprises an air outlet duct and a second fan, the air outlet duct and the second fan are both arranged on a side away from the opening of the box body, and the box body is connected to the exhaust port through the air outlet duct.

[0010] Preferably, the test unit further includes a plurality of pressure strips, the liquid cooling plate is arranged between the signal plate and the mounting plate, the plurality of pressure strips sequentially pass through the signal plate and the mounting plate and abut against the test piece, and the liquid cooling plate is a water cooling plate.

[0011] Preferably, the mounting plate is provided with a limiting hole and a plurality of mounting holes for mounting the test piece, the mounting holes are located one by one below the pressure strip, and the positioning column is fixed to the mounting plate through the limiting hole.

[0012] Preferably, the test unit further includes a heat conducting plate and a radiator, the mounting plate and the heat plate are respectively fixed on two end faces of the heat conducting plate, the radiator is fixed on one end face of the heat plate, and the radiator includes a plurality of mutually parallel fins.

[0013] Preferably, the control box further includes a drive box and a power supply assembly, the drive box includes a plurality of drive boards, the controller is electrically connected to the signal board through the drive board, and the controller is electrically connected to the hot plate through the power supply assembly.

[0014] Preferably, the drive box also includes a third fan, a connector and a router, the drive board is connected to the drive box through the connector, the third fan is arranged on the side of the drive box, the router is arranged at the upper end of the drive box, and the router is electrically connected to the controller.

[0015] Compared with the prior art, the present invention has the following beneficial effects: The discrete device aging test device disclosed in the present application includes multiple test units, each of which includes a hot plate, a liquid cooling plate, a signal plate, and a mounting plate capable of mounting multiple DUTs. Multiple DUTs (discrete devices) can be mounted (pressed) on the mounting plate and the liquid cooling plate without the need for plugging pins and with minimal damage to the DUTs. In addition, the present application includes multiple drawer boxes, each of which is equipped with multiple test units. Each test unit can be equipped with multiple test pieces, and is equipped with a liquid cooling plate for cooling, so that multiple test pieces can be tested at the same time, thereby improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the three-dimensional structure of the discrete device aging test device of the present invention; Figure 2 This is a schematic diagram of the three-dimensional structure of the test box of the present invention after removing the drawer box; Figure 3 This is a schematic diagram of the three-dimensional structure of the drawer box of the present invention after the flip cover is opened; Figure 4 For the present invention Figure 3 Schematic diagram of the enlarged structure at A in the middle; Figure 5 This is a schematic diagram of the three-dimensional structure of the drawer box of the present invention from another perspective; Figure 6 is a schematic diagram of the three-dimensional structure of the test unit of the present invention; Figure 7 It is a schematic diagram of the three-dimensional structure of the mounting plate of the present invention; Figure 8 Schematic diagram of the three-dimensional structure of the control box of the present invention; Figure 9 It is a schematic diagram of the three-dimensional structure of the drive box of the present invention.

[0017] In the figure: 100, discrete device aging test device; 10, test box; 11, test assembly; 12, first box; 121, first fan; 122, heat dissipation vent; 13, exhaust pipe; 131, exhaust vent; 20, control box; 21, controller; 211, touch screen; 22, power supply assembly; 23, second box; 24, drive box; 241, drive board; 242, connector; 243, third fan; 244, router; 25, keyboard box ;30. Drawer box;31. Box body;32. Flip cover;33. Opening;34. Smart lock;341. Latch;35. Second fan;36. Air outlet duct;40. Test unit;41. Mounting plate;411. Positioning column;412. Mounting hole;413. Limit hole;42. Signal board;421. Signal pin;422. Pressure strip;43. Liquid cooling plate;44. Heat conduction plate;45. Hot plate;46. Radiator;47. Connecting plate;50. Part to be tested. DETAILED DESCRIPTION

[0018] In order to more clearly understand the specific technical solutions, features and advantages of the present invention, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0019] In the description of the present invention, it should be noted that the terms "upper," "lower," "left," "right," "lateral," "longitudinal," "horizontal," "inner," and "outer" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, or the orientations or positional relationships in which the inventive product is typically placed when in use. These terms are intended solely to facilitate the description of the present invention and to simplify the description, and are not intended to indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present invention. Furthermore, the terms "first," "second," and "third," etc., are used solely to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0020] like Figures 1-6 As shown, the present application discloses a discrete device aging test device 100, comprising a control box 20 and a test box 10 connected to the control box 20, wherein the test box 10 comprises a first box body 12 and a plurality of test components 11 disposed in the first box body 12, wherein the test component 11 comprises a drawer box 30 and a plurality of test units 40 disposed in the drawer box 30, wherein the test unit 40 comprises a hot plate 45, a liquid cooling plate 43, a signal plate 42 and a mounting plate 41 on which a plurality of test pieces 50 can be mounted, wherein the mounting plate 41 is disposed on the upper end surface of the hot plate 45, and the mounting plate 41 has a plurality of test pieces 50 disposed on the upper end surface of the hot plate 45. A positioning post 411 is provided, and the signal board 42 is located above the mounting plate 41. The signal board 42 is slidably connected to the positioning post 411. The liquid cooling plate 43 is fixed on the signal board 42. The signal board 42 is also provided with multiple groups of signal pins 421. The control box 20 includes a controller 21, and the controller 21 is electrically connected to the test unit 40. When the device under test 50 is mounted on the mounting plate 41, after the signal board 42 slides downward, the liquid cooling plate 43 presses against the device under test 50, and the signal pins 421 are electrically connected one by one to the pins of the device under test 50.

[0021] In the above-described embodiment, the discrete device aging test apparatus 100 disclosed in this application includes multiple test units 40, each comprising a hot plate 45, a liquid cooling plate 43, a signal board 42, and a mounting plate 41 capable of mounting multiple DUTs 50 (discrete devices). The controller 21 is capable of transmitting test signals to the signal board 42 and the hot plate 45. The signal board 42 then transmits the test signals to the DUTs via signal pins 421, thereby implementing aging testing. Multiple DUTs 50 can be mounted (pressed together) on the mounting plate 41 and the liquid cooling plate 43 without the need for plugging pins and thus minimizing damage to the DUTs 50. A heating rod within the hot plate 45 provides heat to the DUTs, while the liquid cooling plate 43 cools the DUTs. The signal board 42 is capable of sliding up and down along the positioning posts 411. As the signal board 42 moves upward, the DUTs 50 can be mounted on the mounting plate 41.

[0022] In addition, the present application includes multiple drawer boxes 30, each drawer box 30 is provided with multiple test units 40, each test unit 40 can be installed with multiple test pieces 50, and is provided with a liquid cooling plate 43 that can reduce the temperature, so that multiple test pieces 50 can be tested at the same time, thereby improving the test efficiency.

[0023] In a preferred embodiment, Figure 1 and Figure 2 As shown, there are two test boxes 10, which are fixed at both ends of the control box 20. The control box 20 includes a first box body 12 and an exhaust pipe 13. The exhaust pipe 13 is disposed within the first box body 12 and is provided with multiple exhaust ports 131, each of which is in one-to-one communication with the drawer box 30. The test box 10 also includes a first fan 121, which is disposed at the upper end of the first box body 12. The side walls of the first box body 12 are also provided with heat dissipation ports 122.

[0024] In the above embodiment, the exhaust pipe 13 is connected to the outside, and the exhaust pipe 13 can ventilate each drawer box 30. The first fan 121 and the heat dissipation port 122 can dissipate heat for each drawer box 30 in the first box body 12, which can prevent too much heat from being generated due to testing too many discrete devices, thereby appropriately increasing the test volume.

[0025] In a preferred embodiment, Figure 3-Figure 5 As shown, the drawer box 30 includes a box body 31, an air outlet duct 36, a second fan 35, a flip cover 32, and a smart lock 34 for controlling the opening and closing of the flip cover 32. The flip cover 32 and the smart lock 34 are both located on one side of the opening 33 of the box body 31, and the test unit 40 is disposed in the box body 31. The air outlet duct 36 and the second fan 35 are both disposed on a side away from the opening of the box body 31, and the box body 31 is connected to the exhaust port 131 through the air outlet duct 36.

[0026] In the above embodiment, the flip cover 32 can serve as the lid or door of the box body 31, the smart lock 34 can be electrically connected to the controller 21, and the smart lock 34 is provided with a latch 341. When the latch 341 is inserted into the flip cover 32, the flip cover 32 closes the opening 33 of the box body 31; when the latch 341 falls off the flip cover 32, the flip cover 32 opens the opening 33 of the box body 31; the air outlet pipe 36 and the second fan 35 are both beneficial to the heat dissipation of the box body 31, and the air outlet pipe 36 can also be the inlet and outlet pipes of the line.

[0027] like Figure 6-Figure 7As shown, in a preferred embodiment, the test unit 40 also includes a heat conducting plate 44, a heat sink 46 and a plurality of pressure strips 422. The liquid cooling plate 43 is arranged between the signal plate 42 and the mounting plate 41. The plurality of pressure strips 422 pass through the signal plate 42 and the mounting plate 41 in sequence and abut against the test piece 50. The liquid cooling plate 43 is a water cooling plate. The mounting plate 41 is provided with a limiting hole 413 and a plurality of mounting holes 412 for mounting the test piece. The mounting holes 412 are located one by one below the pressure strips 492. The positioning column 411 is fixed to the mounting plate 41 through the limiting hole 413. The mounting plate 41 and the heat plate 45 are respectively fixed to the two end faces of the heat conducting plate 44. The heat sink 46 is fixed to one end face of the heat plate 45. The heat sink 46 includes a plurality of mutually parallel heat sinks (not shown).

[0028] In the above embodiment, the pressure strip 422 can ensure a more stable installation of the DUT 50. The heat conducting plate 44 can transfer heat from the heat plate 45 to the mounting plate 41. The radiator 46 and heat sink facilitate heat dissipation. The water cooling plate facilitates heat dissipation and heat preservation. The limiting hole 413 facilitates the fixation of the positioning column 411. The mounting hole 412 facilitates the installation of the DUT 50. Generally, the pins of the DUT are led out of the mounting hole 412 and laid flat on the mounting plate 41, facilitating the electrical connection between the signal pin 421 and the pins of the DUT.

[0029] In a preferred embodiment, Figure 8-Figure 9 As shown, the control box 20 further includes a second box body 23, a drive box 24, and a power supply assembly 22. The drive box 24 includes a plurality of drive boards 241, a third fan 243, a connector 242, and a router 244. The controller 21 is electrically connected to the signal board 42 via the drive board 241, and the controller 21 is electrically connected to the heat plate 45 via the power supply assembly 22. The drive board 241 is connected to the drive box 24 via the connector 242. The third fan 243 is disposed on the side of the drive box 24. The router 244 is disposed at the upper end of the drive box 24 and is electrically connected to the controller 21.

[0030] In the above embodiment, the power supply assembly 22 includes multiple 1U power supplies, each of which is electrically connected to the test unit 40. The power supply assembly 22, the controller 21, and the drive box 24 are all disposed within the second housing 23. The drive board 241 can convert the test information sent by the controller 21 into a test signal and transmit it to the test unit 40 or the power supply assembly 22. The third fan 243 facilitates heat dissipation from the drive board 241, the connector 242 facilitates installation of the drive board 241, and the router 244 facilitates connection of the drive board 241 and the controller 21 to external network signals. To facilitate operation of the controller 21, the controller 21 includes a touch screen 211. To facilitate input of test information, the control box 20 also includes a keyboard box 25, which is disposed at the lower end of the controller 21. The keyboard box 25 contains a keyboard that is electrically connected to the controller 21.

[0031] In summary, the discrete device aging test device 100 installs (presses) the device under test 50 through the mounting plate 41 and the liquid cooling plate 43, without the need for plugging pins, and is not easily damaged by the device under test; and the present application is provided with multiple drawer boxes 30 and multiple test units 40, and each mounting plate 41 can dissipate heat through the liquid cooling plate 43, which can increase the test rate.

[0032] The basic principles, main features, and advantages of the present invention are shown and described above. Those skilled in the art should understand that the present invention is not limited to the above-described embodiments. The above-described embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and modifications may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and modifications are intended to fall within the scope of the present invention. The scope of protection claimed in the present invention is defined by the appended claims and their equivalents.

Claims

1. A discrete device aging test device, comprising a control box and a test box connected to the control box, wherein the test box comprises a first box body and a plurality of test components disposed within the first box body, characterized in that: The test assembly includes a drawer box and multiple test units arranged in the drawer box, the test unit includes a hot plate, a liquid cooling plate, a signal plate and a mounting plate on which multiple pieces to be tested can be installed, the mounting plate is arranged on the upper end surface of the hot plate, a positioning column is provided on the mounting plate, the signal plate is located above the mounting plate, the signal plate is slidably connected to the positioning column, the liquid cooling plate is fixed on the signal plate, and multiple groups of signal pins are also provided on the signal plate; the control box includes a controller, the controller is electrically connected to the test unit, when the piece to be tested is installed on the mounting plate, after the signal plate slides downward, the liquid cooling plate presses against the piece to be tested, and the signal pins are electrically connected one by one to the pins of the piece to be tested.

2. The discrete device aging test device according to claim 1, wherein: There are two test boxes, which are respectively fixed at both ends of the control box. The control box includes a first box body and an exhaust pipe. The exhaust pipe is arranged in the first box body. The exhaust pipe is provided with multiple exhaust ports, and the exhaust ports are all connected to the drawer boxes one by one.

3. The discrete device aging test device according to claim 2, wherein: The test box further includes a first fan, which is arranged at the upper end of the first box body. The side wall of the first box body is also provided with a heat dissipation port.

4. The discrete device aging test device according to claim 3, wherein: The drawer box includes a box body, a flip cover and a smart lock for controlling the opening and closing of the flip cover. The flip cover and the smart lock are both located on one side of the box body opening, and the test unit is arranged in the box body.

5. The discrete device aging test device according to claim 4, wherein: The drawer box further includes an air outlet pipe and a second fan. The air outlet pipe and the second fan are both arranged on a side away from the opening of the box body. The box body is connected to the exhaust port through the air outlet pipe.

6. The discrete device aging test device according to claim 1, wherein: The test unit further includes a plurality of pressure strips. The liquid cooling plate is arranged between the signal plate and the mounting plate. The plurality of pressure strips sequentially pass through the signal plate and the mounting plate and abut against the test piece. The liquid cooling plate is a water cooling plate.

7. The discrete device aging test device according to claim 6, wherein: The mounting plate is provided with a limiting hole and a plurality of mounting holes for mounting the test piece, the mounting holes are located one by one below the pressure strip, and the positioning column is fixed to the mounting plate through the limiting hole.

8. The discrete device aging test device according to claim 7, wherein: The test unit further includes a heat conducting plate and a radiator. The mounting plate and the heat plate are respectively fixed on two end surfaces of the heat conducting plate. The radiator is fixed on one end surface of the heat plate. The radiator includes a plurality of mutually parallel fins.

9. The discrete device aging test device according to claim 1, wherein: The control box further includes a drive box and a power supply assembly. The drive box includes a plurality of drive boards. The controller is electrically connected to the signal board via the drive board. The controller is electrically connected to the hot plate via the power supply assembly.

10. The discrete device aging test device according to claim 9, wherein: The drive box also includes a third fan, a connector and a router. The drive board is connected to the drive box through the connector. The third fan is arranged on the side of the drive box. The router is arranged at the upper end of the drive box. The router is electrically connected to the controller.

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