Semiconductor packages with spherical bond interconnect structures
Through the design of a multi-level ball-bond interconnect structure, the high-power density interconnection problem of small bonding pads in SiC and GaN semiconductor packages is solved, and a high current density and low-cost packaging solution is achieved, which is suitable for a variety of semiconductor die types.
Patent Information
- Application Number
- CN202510266671.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2024-03-08
- Filing Date
- 2025-03-07
- Publication Date
- 2025-09-09
AI Technical Summary
Existing technologies are unable to effectively solve the problem of high power density interconnection with small bonding pad sizes in SiC and GaN semiconductor packages, especially the high current density requirements in small pad areas are difficult to achieve.
A multi-level ball-bonding interconnect structure is adopted, including at least two levels of ball-bonding wire loops, which are stacked and connected in parallel to achieve high current density interconnection. The ball-bonding wire loops are stacked and electrically connected in parallel with each other in the vertical direction to support higher current density.
The current density of the package is increased, the cost is reduced, the applicability is enhanced, and the production efficiency is improved, and it is suitable for a variety of semiconductor package types.