Calibration method, device, medium, and program product for a measuring device

Abstract

The present disclosure provides a calibration method, device, medium and program product of a measuring device. The method comprises: irradiating the surface of a pair of calibration pieces by each profilometer to obtain a first measurement data in a respective profilometer coordinate system; a feature pattern constructed by the pair of calibration pieces is located in the common field of view of each profilometer; determining the first pose conversion relationship information between each profilometer and the pair of calibration pieces based on the first measurement data; wherein the first pose conversion relationship information comprises the included angle between the optical axis direction of the profilometer and the reference line determined by the feature pattern, and the distance of each profilometer relative to the reference line obtained based on the first measurement data; obtaining the coordinate conversion information from the profilometer coordinate system to a unified coordinate system based on the first pose conversion relationship information of each profilometer. The calibration deviation caused by the rotation of a single profilometer can be avoided, so as to solve the problem of inaccurate three-dimensional measurement caused by the error in calibration.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of measurement, and in particular to a calibration method and device of a measurement device, a medium and a program product. BACKGROUND

[0002] The triangular rubber strip is the main filler of the tire bead part, which plays a role in supporting the tire wall. If the size of the triangular rubber is incomplete, it cannot effectively fill the tire bead, and the role of supporting the tire wall will be greatly reduced. Therefore, the completeness of the triangular rubber is crucial to the tire.

[0003] In the related art, when checking the size of the triangular rubber, a single 3D profilometer is often used to scan to obtain a single-view single-face size, but the single-face 3D data cannot observe the complete size of the triangular rubber, and manual rotation of the workpiece or manual rotation of the 3D profilometer is required to realize 360-degree coverage of the triangular rubber to obtain the complete three-dimensional profile of the triangular rubber. However, this method is prone to introduce vibration errors during rotation, thereby reducing the accuracy of three-dimensional detection. SUMMARY

[0004] In view of the above-mentioned shortcomings of the prior art, the purpose of the present disclosure is to provide a calibration method and device of a measurement device, a medium and a program product to solve the problems in the related art.

[0005] The first aspect of the present disclosure provides a calibration method, comprising:

[0006] irradiating the surface of a pair of calibration pieces by each of the profilometers to obtain a first measurement data in the respective profilometer coordinate system; wherein a pair of the calibration pieces are arranged at intervals in the region between the three profilometers; and a feature pattern formed by a pair of the calibration pieces is located in the common field of view of each profilometer;

[0007] determining a first pose conversion relationship information between each profilometer and a pair of calibration pieces based on the first measurement data; wherein the first pose conversion relationship information includes the included angle between the optical axis direction of the profilometer and the reference line determined by the feature pattern, and the distance of each profilometer relative to the reference line based on the first measurement data;

[0008] obtaining coordinate conversion information from each profilometer coordinate system to a unified coordinate system based on the first pose conversion relationship information of each profilometer.

[0009] In an embodiment of the first aspect, irradiating the surface of a pair of calibration pieces after height change by each profilometer to obtain a second measurement data in the respective profilometer coordinate system; obtaining measurement deviation data based on the first measurement data and the second measurement data; wherein the measurement deviation data is used to compensate for the calibration deviation in the unified coordinate system.

[0010] In an embodiment of the first aspect, the uniform coordinate system is implemented as a profilometer coordinate system of one of the profilometers.

[0011] In an embodiment of the first aspect, the feature pattern comprises a line or an extension of the line between a pair of the same points on the calibration pieces.

[0012] In an embodiment of the first aspect, the feature pattern comprises a line or an extension of the line between a pair of the same points on the calibration pieces.

[0013] In an embodiment of the first aspect, the scanning heights of the three profilometers are the same; and / or, the cross sections of the calibration pieces are implemented as circle centers or regular polygons.

[0014] The second aspect of the present disclosure provides a measuring device, comprising:

[0015] three profilometers, which are circumferentially spaced apart;

[0016] two calibration pieces, which are spaced apart and height-adjustably arranged in a region between the three profilometers;

[0017] a control unit, which is communicatively coupled to each of the profilometers, configured to acquire first measurement data of each profilometer irradiating on a surface of a pair of calibration pieces; determine first pose conversion relationship information between each profilometer and a pair of calibration pieces based on the first measurement data; and obtain coordinate conversion information from a coordinate system of each profilometer to a uniform coordinate system based on the first pose conversion relationship information of each profilometer.

[0018] In an embodiment of the second aspect, the included angle between two adjacent profilometers is 120 degrees.

[0019] The third aspect of the present disclosure provides a computer-readable storage medium, which stores program instructions, and the program instructions are executed to perform the calibration method according to any one of the first aspect.

[0020] The fourth aspect of the present disclosure provides a computer program product, comprising: program instructions for performing the calibration method according to any one of the first aspect.

[0021] As described above, the present disclosure provides a calibration method, device, medium and program product of a measuring device. The method comprises: irradiating the surface of a pair of calibration pieces by each profilometer to obtain a first measurement data in the respective profilometer coordinate system; wherein the pair of calibration pieces are arranged at intervals in the region between the three profilometers; the feature pattern formed by the pair of calibration pieces is located in the common field of view of each profilometer; determining the first pose conversion relationship information between each profilometer and the pair of calibration pieces based on the first measurement data; wherein the first pose conversion relationship information includes the included angle between the optical axis direction of the profilometer and the reference line determined by the feature pattern, and the distance of each profilometer relative to the reference line obtained based on the first measurement data; obtaining the coordinate conversion information from the profilometer coordinate system to a unified coordinate system based on the first pose conversion relationship information of each profilometer. Through the pair of calibration pieces and the three profilometers, the present disclosure can efficiently realize the calibration of the measuring device, and can also avoid the calibration deviation caused by the rotation of a single profilometer, thereby being used in subsequent three-dimensional measurement of the triangular rubber, so as to solve the problem of inaccurate three-dimensional measurement caused by the error in calibration. BRIEF DESCRIPTION OF DRAWINGS

[0022] Figure 1 Fig. 1 shows a top view of the calibration piece entering the field of view of the profilometer in an embodiment of the present disclosure.

[0023] Figure 2 Fig. 2 shows a schematic diagram of the scanning area of one profilometer in an embodiment of the present disclosure.

[0024] Figure 3 Fig. 3 shows a schematic diagram of the scanning area of another profilometer in an embodiment of the present disclosure.

[0025] Figure 4 Fig. 4 shows a schematic diagram of the scanning area of another profilometer in an embodiment of the present disclosure.

[0026] Figure 5 Fig. 5 shows a flowchart of the calibration method of the measuring device in an embodiment of the present disclosure.

[0027] Figure 6 Fig. 6 shows a schematic diagram of the first pose conversion relationship information in an embodiment of the present disclosure.

[0028] Figure 7 Fig. 7 shows a flowchart of the calibration method of the measuring device in another embodiment of the present disclosure.

[0029] Figure 8 Fig. 8 shows a schematic diagram of the calibration piece in an embodiment of the present disclosure. Figure 7 Fig. 9 shows a schematic diagram of the structure of the calibration piece in an example.

[0030] Figure 9 Fig. 10 shows a schematic diagram of the calibration piece in an embodiment of the present disclosure. Figure 7 Fig. 11 shows a schematic diagram of the cross-sectional view of the calibration piece in an example.

[0031] Figure 10 Fig. 1 shows a flow diagram of a measuring method of a measuring device according to an embodiment of the present disclosure.

[0032] Figure 11 Fig. 2 shows a circuit structure diagram of a computer device according to an embodiment of the present disclosure.

[0033] Reference signs: measuring device 10; profilometer 11; first telescopic part 111; calibration member 12; first cylinder 121; second cylinder 122; second telescopic part 123; computer device 200; bus 201; processor 202; memory 203; communicator 204. DETAILED DESCRIPTION

[0034] The above embodiments of the present disclosure are merely used to illustrate the present disclosure. It should be readily understood by those skilled in the art that the present disclosure can be implemented or applied in other different embodiments without departing from the spirit and scope of the present disclosure. The embodiments disclosed in the present disclosure and the characteristics in the embodiments can be combined with each other in the case of no conflict.

[0035] The above embodiments of the present disclosure are merely used to illustrate the present disclosure. It should be readily understood by those skilled in the art that the present disclosure can be implemented or applied in other different embodiments without departing from the spirit and scope of the present disclosure. The embodiments disclosed in the present disclosure and the characteristics in the embodiments can be combined with each other in the case of no conflict.

[0036] In the description of the present disclosure, the expressions of “one embodiment”, “some embodiments”, “example”, “specific example” or “some examples” etc. mean that the specific features, structures, materials or characteristics represented in connection with the embodiment or example are included in at least one embodiment or example of the present disclosure. Moreover, the specific features, structures, materials or characteristics represented can be combined in any one or a group of embodiments or examples in a suitable manner. In addition, the different embodiments or examples represented in the present disclosure and the features of the different embodiments or examples can be combined and integrated by those skilled in the art without conflict.

[0037] In addition, the terms “first”, “second” are only used for the purpose of description and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features limited by “first”, “second” can explicitly or implicitly include at least one of the features. In the description of the present disclosure, the meaning of “a group” is two or more, unless otherwise specifically limited.

[0038] For the purpose of clearness of the present disclosure, devices irrelevant to the description are omitted, and the same reference numerals are assigned to the same or similar constituent elements throughout the specification.

[0039] Throughout the specification, when it is said that a certain device is "connected" to another device, this includes not only the case of "direct connection" but also the case of "indirect connection" in which other elements are interposed therebetween. In addition, when it is said that a certain device "includes" a certain constituent element, other constituent elements are not excluded unless specifically stated to the contrary, but it means that other constituent elements can be further included.

[0040] Although the terms first, second, etc. are used herein to refer to various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, a first interface and a second interface, etc. are denoted. Also, as used herein, the singular forms "a," "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises," "comprising," "includes" and / or "including," when used herein, specify the presence of stated features, steps, operations, elements, modules, items, components, and / or groups thereof, but do not preclude the presence or addition of one or more other features, steps, operations, elements, modules, items, components, and / or groups thereof. As used herein, the terms "or" and "and / or" are construed to be inclusive, or mean one and / or any combination. Therefore, "A, B, or C" or "A, B, and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B, and C." Exceptions to this definition are only present when items, components, or functions are inherently mutually exclusive between different implementations.

[0041] The professional terms used herein are used only to refer to specific embodiments, and are not intended to limit the present disclosure. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. The meaning of "include" used in the specification is to specify a certain characteristic, region, integer, step, operation, element, and / or component, and is not to exclude the presence or addition of other characteristics, regions, integers, steps, operations, elements, and / or components.

[0042] Although not differently defined, the technical terms and scientific terms used herein include the technical terms and scientific terms used herein, and all terms have the same meaning as generally understood by those skilled in the art to which the present disclosure belongs. The terms defined in a generally used dictionary are additionally interpreted to have meanings consistent with the related technical documents and the currently prompted messages, and are not over-interpreted as ideal or very formal meanings unless defined.

[0043] The bead filler is the main filler of the bead portion, and plays a role of supporting the sidewall. If the size of the bead filler is incomplete, the bead filler cannot effectively fill the bead, and the role of supporting the sidewall is greatly reduced. Therefore, whether the size of the bead filler is complete or not is crucial to the tire.

[0044] In the related art, when the size of the bead filler is checked, a single 3D profilometer is often used to scan to obtain a single-view single-face size. However, the single-face 3D data cannot observe the complete size of the bead filler, and manual rotation of the workpiece or manual rotation of the 3D profilometer is required to realize 360-degree coverage of the bead filler to obtain the complete three-dimensional profile of the bead filler. However, this method is prone to introduce vibration errors during rotation, thereby reducing the accuracy of three-dimensional detection.

[0045] Based on the above problems, the present disclosure provides a calibration method of a measuring device. By using a pair of calibration pieces and three profilometers, the calibration of the measuring device can be efficiently realized, and the calibration deviation caused by the rotation of a single profilometer can be avoided, thereby being used in subsequent three-dimensional measurement of the bead filler to solve the problem of inaccurate three-dimensional measurement caused by the error in calibration.

[0046] Figure 1 FIG. 1 shows a top view of a calibration piece 12 in the view of a profilometer 11 in an embodiment of the present disclosure. Figure 2 FIG. 2 shows a schematic view of a scanning area of one profilometer 11 in an embodiment of the present disclosure. Figure 3 FIG. 3 shows a schematic view of a scanning area of another profilometer 11 in an embodiment of the present disclosure. Figure 4 FIG. 4 shows a schematic view of a scanning area of still another profilometer 11 in an embodiment of the present disclosure. Figure 1 In the example, the measuring device 10 includes three profilometers 11 and a pair of calibration pieces 12. The three profilometers 11 are arranged at intervals in the circumferential direction, and the pair of calibration pieces 12 are arranged at intervals in the region surrounded by the three profilometers 11.

[0047] Exemplarily, the included angle between the three profilometers 11 is configured to be 120 degrees, so that the sum of the scanning areas of the three profilometers 11 can completely cover the outer edge surface of the pair of calibration pieces 12. In other embodiments, the included angle between the three profilometers 11 is configured to be other degrees that can enable the sum of the scanning areas of the three profilometers 11 to completely cover the outer edge surface of the pair of calibration pieces 12, and is not limited thereto.

[0048] Exemplarily, the scanning heights of the three profile meters 11 are the same (Z-axis height). It can be understood that, first, the same height ensures that the measurement reference surfaces (such as laser emission points) of the three profile meters 11 are in the same plane, avoids the measurement reference deviation caused by the height difference, and makes the three groups of data directly comparable or fused, thereby improving the reliability of the calibration result. Second, no additional height (Z-axis) compensation parameters need to be calculated during calibration, thereby reducing the calibration complexity. For example, in the calibration of multiple profile meters 11, the height alignment can reduce the degree of freedom requirement during the coordinate system conversion, thereby improving the calibration efficiency. It should be noted that the specifications of the three profile meters 11 need to be the same. It can be understood that the same sensor characteristics (such as laser wavelength, sampling frequency, detection accuracy, optical resolution, etc.) ensure that the responses of the three devices to the same surface are consistent, thereby avoiding the measurement deviation caused by the hardware difference. The unified calibration parameters (such as zero point offset, gain coefficient, temperature compensation curve) can be directly reused without separately calibrating each device, thereby reducing the human error.

[0049] It can be understood by those skilled in the art that multiple profile meters 11 can collect data from different angles or positions, further verify the consistency of the responses of the calibration piece 12 at different spatial positions, and reduce the local error (such as the influence of mechanical installation deviation or optical distortion). At the same time, the joint calibration of the three profile meters 11 can identify the influence of the tilt or deviation of the mechanical structure (such as the clamp and the platform) on the measurement, and compensate the error through multi-view data.

[0050] Exemplarily, the calibration piece 12 is implemented in a cylindrical shape, the first measurement data obtained by each profile meter 11 is the measurement data of an arc line composed of multiple continuous points, and the arc lines of the measurement data obtained by the three profile meters 11 for the same calibration piece 12 can completely cover the circumference of the calibration piece 12. The data of the cylindrical calibration piece 12 is calculated, the center of the circle, the diameter and the straight line between the two centers of the circle are obtained through the data fitting circle, so as to facilitate the subsequent judgment and calibration.

[0051] Exemplarily, the optical axis direction of each profile meter 11 is aligned with a pair of calibration pieces 12, only the included angle between the optical axis direction and the line connecting the pair of calibration pieces 12 is different, so the first measurement data obtained by each profile meter 11 is also different. Figure 2 、 Figure 3 and Figure 4 The thickened arc lines in the example are the image data obtained by the three profile meters 11 respectively, and the first measurement data is calculated according to the image data. As can be seen, the sum of the scanning regions of the three profile meters 11 can completely cover the outer edge surface of a pair of calibration pieces 12, thereby avoiding the situation that the calibration accuracy is reduced due to the fact that the scanning region cannot completely cover the outer edge surface of a pair of calibration pieces 12.

[0052] Exemplarily, one of the three profile meters 11 is aligned to the pair of calibration pieces 12 orthogonally, and the other two are aligned to the pair of calibration pieces 12 obliquely. Preferably, the scanning direction of one of the three profile meters 11 is perpendicular to the line connecting the centers of the pair of calibration pieces 12.

[0053] In other embodiments, the calibration pieces 12 can also be implemented as square columns and regular pentagonal columns, without limitation.

[0054] Figure 5 FIG. 1 shows a flowchart of a calibration method of a measuring device 10 according to an embodiment of the present disclosure. In Figure 5 In the example, the calibration method can be applied to Figure 1 In the example, three profile meters 11 are circumferentially spaced apart.

[0055] In the example, the calibration method comprises: Figure 5

[0056] Step S101: irradiating the surface of a pair of calibration pieces 12 by each of the profile meters 11 to obtain a first measurement data in the coordinate system of the respective profile meter 11.

[0057] Exemplarily, a pair of calibration pieces 12 are arranged at a region between the three profile meters 11, and a feature pattern formed by the pair of calibration pieces 12 is located in the common field of view of each of the profile meters 11. Exemplarily, the feature pattern comprises a line connecting two points on the pair of calibration pieces 12 or an extension line of the line. In the embodiment, the feature pattern is implemented as a line connecting the centers of the cylindrical calibration pieces 12 derived from the first measurement data. Preferably, the two points are at the same height (i.e., have the same Z-axis coordinate value).

[0058] In other embodiments, the feature pattern can also be implemented as two points on the pair of calibration pieces 12 at different positions. For example, any point on the top wall, the side wall, or the top wall arc.

[0059] Step S102: determining a first pose conversion relationship information between each of the profile meters 11 and the pair of calibration pieces 12 based on the first measurement data.

[0060] Figure 6 FIG. 2 shows a schematic diagram of the first pose conversion relationship information according to an embodiment of the present disclosure. In Figure 6 ​In an example, the first pose conversion relationship information includes an included angle a between an optical axis direction of the profilometer 11 and a reference line determined by the feature pattern, and a distance L of each profilometer 11 relative to the reference line obtained based on the first measurement data. Those skilled in the art can understand that each first pose conversion relationship information can make each corresponding profilometer 11 obtain its included angle with the calibration piece 12 in space, and thus obtain the angle calibration process of the profilometer 11 in space. In the subsequent calibration process, the included angle is used to rotate the first measurement data, and the distance is used to translate the first measurement data.

[0061] Step S103: Obtain coordinate conversion information of each profilometer 11 coordinate system to a unified coordinate system based on the first pose conversion relationship information of each profilometer 11.

[0062] Those skilled in the art can understand that when multiple profilometers 11 are calibrated or measured, the point cloud data under different viewing angles needs to be transformed to a unified coordinate system through a rotation matrix and a translation matrix, and then spliced into a complete three-dimensional model.

[0063] Figure 7 Fig. 2 shows a flowchart of a calibration method of a measurement device 10 in another embodiment of the present disclosure. In the embodiment, the measurement device 10 includes a plurality of profilometers 11 and a calibration piece 12. Figure 7 In an example, the calibration method in another embodiment includes:

[0064] Step S201: Irradiate the surface of a pair of calibration pieces 12 by each profilometer 11 to obtain a first measurement data in the profilometer 11 coordinate system.

[0065] Step S202: Determine first pose conversion relationship information between each profilometer 11 and a pair of calibration pieces 12 based on the first measurement data.

[0066] Step S203: Obtain coordinate conversion information of each profilometer 11 coordinate system to a unified coordinate system based on the first pose conversion relationship information of each profilometer 11.

[0067] Step S204: Irradiate the surface of a pair of calibration pieces 12 after height change by each profilometer 11 to obtain a second measurement data in the profilometer 11 coordinate system.

[0068] Step S204: Obtain measurement deviation data based on the first measurement data and the second measurement data; wherein the measurement deviation data is used to compensate for calibration deviation in the unified coordinate system.

[0069] Those skilled in the art will understand that the repeatability and linearity errors of the profilometer 11 at different heights can be detected by using the calibration element 12, which varies in height. For example, height differences may cause light path refraction, shading effects, or changes in sensor response; multi-height calibration can expose and correct these problems; single-height calibration may mask these height-related errors, leading to systematic deviations in actual measurements.

[0070] Figure 8 The following is a description of this disclosure. Figure 7 A schematic diagram of the profilometer 11 in the example. Figure 7 In this embodiment, the height of each profilometer 11 is adjustable to allow the profilometer 11 to illuminate the calibration element 12 at a different height. Figure 8 In the example, the profilometer 11 is driven to connect to a vertically arranged first telescopic member 111, which moves up and down under the telescopic movement of the profilometer. Exemplarily, the telescopic member is implemented as a hydraulic cylinder, pneumatic cylinder, or electric cylinder. Those skilled in the art will understand that changing the height of the calibration member 12 by the telescopic movement of the telescopic member can avoid positional errors caused by replacing calibration members 12 at different heights, thereby further improving the accuracy of the calibration method. Preferably, the three profilometers 11 remain at the same height after simultaneous raising or lowering, that is, the three profilometers 11 rise or fall by the same distance. It should be noted that a pair of calibration members 12 remain within the field of view of the three profilometers 11 after rising or falling.

[0071] Figure 9 The following is a description of this disclosure. Figure 7 A cross-sectional view of calibration component 12 in the example. Figure 7 In this embodiment, the height of the calibration element 12 is adjustable to allow the profilometer 11 to illuminate the calibration element 12 at another height. Figure 9 In the example, the calibration element 12 includes a first cylindrical body 121 with a top opening, a second cylindrical body 122 with a bottom opening and sleeved outside the first cylindrical body 121, and a second telescopic element 123 disposed inside the first cylindrical body 121 and the second cylindrical body 122 and drivenly connected to the first cylindrical body 121 and the second cylindrical body 122. Those skilled in the art will understand that the second cylindrical body 122, positioned above the first cylindrical body 121, prevents changes in the diameter of the calibration element 12 scanned by the profilometer 11 after the second cylindrical body 122 is raised or lowered, thereby reducing variables in the calibration process. Preferably, the pair of calibration elements 12 are raised or lowered by the same distance.

[0072] Figure 10 The diagram shown is a flowchart illustrating the measurement method of the measuring device 10 in an embodiment of this disclosure. Figure 10In the example, three profilometers 11 are defined as a first profilometer, a second profilometer and a third profilometer. The measurement method comprises:

[0073] S301: start of the calculation process;

[0074] S302: start of data acquisition by the profilometer 11;

[0075] S303: loading of calibration parameters;

[0076] S304: calculation of first profilometer data;

[0077] S305: calculation of second profilometer data;

[0078] S306: calculation of third profilometer data;

[0079] S307: data rotation;

[0080] S308: data translation;

[0081] S309: data fusion;

[0082] S3010: generation of a 360-degree profile;

[0083] S3011: end.

[0084] It can be understood that, Figure 10 In the example, the data is the first measurement data and the first pose conversion relationship information; or, the first measurement data, the second measurement data and the first pose conversion relationship information.

[0085] It can be understood by those skilled in the art that after the three-dimensional profile size of the triangular rubber is measured by the above steps, the size between each adjacent two vertexes of the triangular rubber is measured, the size is compared with the predetermined data, if the difference between the size and the predetermined data exceeds the predetermined tolerance, it is determined that the part of the triangular rubber is unqualified, otherwise, it is determined that the part of the triangular rubber is qualified.

[0086] Figure 11 The circuit structure schematic diagram of the computer device in an embodiment of the present disclosure is shown in FIG. 2. In the embodiment, the computer device 200 comprises a central processing unit (CPU) 201, a memory 202, a bus 203, an input device 204 and an output device 205. Figure 11 In the example, the computer device 200 can be implemented in a server, a desktop computer, a notebook computer, a tablet computer, a smart phone or other terminal. The computer device 200 can be used to realize the control unit in the embodiment. Figure 6

[0087] ​The computer device 200 comprises a bus 201, a processor 202, a memory 203. The processor 202 and the memory 203 can communicate through the bus 201. The memory 203 can store program instructions. The processor 202 implements the method steps in the previous embodiments by running the program instructions in the memory 203, for example Figure 2 the steps in the calibration method of the embodiments, or Figure 5 the steps in the measurement method of the embodiments.

[0088] The bus 201 can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, although only one thick line is shown in the figure, it does not mean that there is only one bus or only one type of bus.

[0089] In some embodiments, the processor 202 can be implemented as a Central Processing Unit (CPU), a Micro Control Unit (MCU), a System On Chip, or a Field Programmable Gate Array (FPGA), etc. The memory 203 can include a volatile memory for temporary storage of data during program execution, such as a Random Access Memory (RAM).

[0090] The memory 203 can also include a non-volatile memory for data storage, such as a Read-Only Memory (ROM), a flash memory, a Hard Disk Drive (HDD) or a Solid-State Disk (SSD).

[0091] In some embodiments, the computer device 200 can further include a communicator 204. The communicator 204 is configured to communicate with external devices. In specific examples, the communicator 204 can include one or a set of wired and / or wireless communication circuitry. For example, the communicator 204 can include one or more of, for example, a wired network card, a USB module, a serial interface module, etc. The wireless communication module can comply with one or more of, for example, Near Field Communication (NFC) technology, Infared (IR) technology, Global System for Mobile communications (GSM), General Packet Radio Service (GPRS), Code Division Multiple Access (CDMA), Wideband Code division multiple access (WCDMA), Time-Division Code Division Multiple Access (TD-SCDMA), Long Term Evolution (LTE), Blue Tooth (BT), Global Navigation Satellite System (GNSS), etc.

[0092] The present disclosure also provides a computer readable storage medium storing program instructions, which when executed implement the steps of the method of any of the above embodiments, for example Figure 5 the steps of the calibration method of the embodiments, or Figure 7 the steps of the calibration method.

[0093] The steps of the method of the above embodiments can be implemented as software or computer code stored in a recording medium such as a CD ROM, a RAM, a floppy disk, a hard disk or a magneto-optical disk, or by computer code downloaded from a network and originally stored in a remote recording medium or a non-transitory machine readable medium and then stored in a local recording medium, so that the method represented herein can be processed by such software on a recording medium using a general purpose computer, a special purpose processor or programmable or special purpose hardware such as an ASIC or an FPGA.

[0094] The present disclosure also provides a computer program product comprising: program instructions for performing the steps of the calibration method of the embodiments, or Figure 5 the steps of the calibration method of the embodiments, or Figure 7program instructions of steps in the calibration method of the measuring device.

[0095] In summary, the present disclosure provides a calibration method, device, medium and program product of a measuring device. The method comprises: irradiating the surface of a pair of calibration pieces by each profilometer to obtain a first measurement data in the respective profilometer coordinate system; wherein the pair of calibration pieces are arranged at intervals in the region between the three profilometers; the feature pattern constructed by the pair of calibration pieces is located in the common field of view of each profilometer; determining the first pose conversion relationship information between each profilometer and the pair of calibration pieces based on the first measurement data; wherein the first pose conversion relationship information includes the included angle between the optical axis direction of the profilometer and the reference line determined by the feature pattern, and the distance of each profilometer relative to the reference line obtained based on the first measurement data; obtaining the coordinate conversion information from the profilometer coordinate system to a unified coordinate system based on the first pose conversion relationship information of each profilometer. The advantage of the above arrangement is that through a pair of calibration pieces and three profilometers, the calibration of the measuring device can be efficiently realized, and the calibration deviation caused by the rotation of a single profilometer can be avoided, so as to be used in subsequent three-dimensional measurement of the triangular rubber, so as to solve the problem of inaccurate three-dimensional measurement caused by the error in calibration.

[0096] The above embodiments only exemplarily illustrate the principles and effects of the present disclosure, and are not used to limit the present disclosure. Any person skilled in the art can modify or change the above embodiments without departing from the spirit and scope of the present disclosure. Therefore, all equivalent modifications or changes completed by those skilled in the art without departing from the spirit and technical idea disclosed by the present disclosure should still be covered by the protection scope of the present disclosure.

Claims

1. A method of calibrating a measuring device, characterized in that The measuring device comprises at least three profilometers arranged at intervals in the circumferential direction and scanning beams pointing inward; the method comprises: Irradiating the surface of a pair of calibration pieces by each profilometer to obtain a first measurement data in the respective profilometer coordinate system; wherein a pair of calibration pieces are arranged at intervals in the region between the three profilometers; the feature pattern formed by a pair of calibration pieces is located in the common field of view of each profilometer; the cross section of the calibration piece is implemented as a circle; the first measurement data obtained by each profilometer is the measurement data of an arc composed of a plurality of consecutive points, and a circle is fitted based on the measurement data to obtain the center of the circle; the feature pattern comprises a line connecting the centers of the pair of calibration pieces or an extension line of the line; The scanning heights of the three profilometers are the same; Determine the first pose conversion relationship information between each profilometer and a pair of calibration pieces based on the first measurement data; wherein the first pose conversion relationship information comprises the included angle between the optical axis direction of the profilometer and the reference line determined by the feature pattern, and the distance of each profilometer relative to the reference line based on the first measurement data; Based on the first pose conversion relationship information of each profilometer, obtain the coordinate conversion information from the profilometer coordinate system to a unified coordinate system.

2. The calibration method of claim 1, wherein, Irradiate the surface of a pair of calibration pieces after height change by each profilometer to obtain a second measurement data in the respective profilometer coordinate system; obtain measurement deviation data based on the first measurement data and the second measurement data; wherein the measurement deviation data is used to compensate for the calibration deviation in the unified coordinate system.

3. The calibration method of claim 1, wherein, The unified coordinate system is implemented as the profilometer coordinate system of one of the profilometers.

4. A measuring device, characterized in that The measuring device is used to perform the calibration method of any one of claims 1-3; the measuring device comprises: Three profilometers arranged at intervals in the circumferential direction; Two calibration pieces arranged at intervals and height-adjustable in the region between the three profilometers; A control unit communicatively coupled to each profilometer for obtaining the first measurement data by irradiating the surface of a pair of calibration pieces by each profilometer; determining the first pose conversion relationship information between each profilometer and a pair of calibration pieces based on the first measurement data; based on the first pose conversion relationship information of each profilometer, obtaining the coordinate conversion information from the profilometer coordinate system to a unified coordinate system.

5. The measuring device of claim 4, wherein, The included angle between two adjacent profilometers is 120 degrees.

6. A computer-readable storage medium, characterized in that, Program instructions are stored, and the program instructions are executed to perform the calibration method of any one of claims 1 to 3.

7. A computer program product, characterised in that, Comprise: For performing the calibration method of any one of claims 1 to 3.

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