Integrated test circuit and integrated test equipment

Abstract

The invention discloses an integrated test circuit and integrated test equipment, the integrated test circuit comprises a drive test circuit of a gate load, the drive test circuit of the gate load comprises a power supply module, a gate drive module, a first signal acquisition module, a first analog-to-digital conversion module and a controller, the power supply module is connected with the controller and the first signal acquisition module, and the gate drive module is connected with the first analog-to-digital conversion module. The first signal acquisition module is connected with the gate driving module, the power supply module is also connected with the gate driving module, and the gate driving module is connected with an actuator of a gate load; the first analog-to-digital conversion module is connected with the first signal acquisition module and the controller, the controller is used for controlling the gate driving module to be switched on or switched off, a power supply signal is sent to an actuator of a gate load through the gate driving module by the power supply module, and the first analog-to-digital conversion module is used for sending a voltage acquisition signal of the first signal acquisition module to the controller; and the controller is used for testing the driving current of the actuator according to the voltage acquisition signal. The detection precision is improved, the test circuit is simplified, and the cost is reduced.

Description

Technical Field

[0001] The present invention relates to the field of testing, and in particular to an integrated testing circuit and integrated testing equipment. Background Art

[0002] With the rapid growth of the new energy vehicle market, the charging door, a key actuator of the charging interface, faces increasing pressure. The stability of its driving current directly impacts charging safety and user experience. Currently, electric vehicles widely utilize high-power fast-charging technology, which places higher demands on the mechanical response speed and electrical reliability of the charging door. Existing methods, such as ammeters or voltmeters, provide poor detection accuracy.

[0003] Today's charging doors usually have two driving modes: automatic and manual, and also include a charging indicator light. Existing test circuits or test equipment cannot be compatible with the automatic opening test, manual opening test and charging indicator light test of the charging door at the same time. Summary of the Invention

[0004] The embodiments of the present invention provide an integrated test circuit and an integrated test device to solve the problem of poor test accuracy of existing test circuits.

[0005] Based on the above purpose, in one embodiment, an integrated test circuit is provided, the integrated test circuit comprising: A gate load drive test circuit, comprising a power supply module, a gate drive module, a first signal acquisition module, a first analog-to-digital conversion module, and a controller, wherein the input end of the power supply module is connected to the controller, the positive output end of the power supply module is connected to the input end of the first signal acquisition module, the first output end of the first signal acquisition module is connected to the first port of the gate drive module, the negative output end of the power supply module is connected to the second port of the gate drive module, the third port of the gate drive module is connected to the positive end of the actuator of the gate load, and the fourth port of the gate drive module is connected to the negative end of the actuator of the gate load; The first input end of the first analog-to-digital conversion module is connected to the second output end of the first signal acquisition module, and the output end of the first analog-to-digital conversion module is connected to the controller. The controller is used to control the gate drive module to be turned on or off, and to send a power signal to the actuator of the door load through the power supply module and the gate drive module. The first analog-to-digital conversion module is used to send the voltage acquisition signal of the first signal acquisition module to the controller, and the controller is used to test the drive current of the actuator according to the voltage acquisition signal.

[0006] In one embodiment, the second input end of the first analog-to-digital conversion module is connected to the output end of the position sensor in the door load, and the first analog-to-digital conversion module is used to send a door position signal of the position sensor to the controller, and the controller is used to test the position sensor according to the door position signal to determine the open state or closed state of the door load.

[0007] In one embodiment, the door drive module includes: a first switch, a second switch, a third switch, and a fourth switch, wherein the input end of the first switch serves as the first port of the door driving module, the output end of the first switch serves as the fourth port of the door driving module, and the control end of the first switch is connected to the controller; The input end of the second switch serves as the first port of the gate driving module, the output end of the second switch serves as the third port of the gate driving module, and the control end of the second switch is connected to the controller; The input end of the third switch serves as the second port of the gate driving module, the output end of the third switch serves as the third port of the gate driving module, and the control end of the third switch is connected to the controller; The input end of the fourth switch serves as the second port of the gate driving module, the output end of the fourth switch serves as the fourth port of the gate driving module, and the control end of the fourth switch is connected to the controller; The controller is used to control the first switch and the third switch to be turned on, or to control the second switch and the fourth switch to be turned on, so as to turn the gate drive module on or off.

[0008] In one embodiment, the integrated test circuit further includes: A pressure test circuit for a door load, the pressure test circuit comprising: a sixth switch and a second analog-to-digital conversion module, the input end of the sixth switch being used to input a power supply signal, the output end of the sixth switch being used as a power supply port, the power supply port being used to connect to the power supply end of the pressure sensor in the door load, and the control end of the sixth switch being connected to the controller; the input end of the second analog-to-digital conversion module being used as a test port, the test port being used to connect to the output end of the pressure sensor in the door load; and the output end of the second analog-to-digital conversion module being connected to the controller.

[0009] In one embodiment, the integrated test circuit further includes: An indicator light drive test circuit includes: a constant current drive module, a sampling module, a second signal acquisition module, and a third analog-to-digital conversion module, wherein the input end of the constant current drive module is connected to the controller, the output end of the constant current drive module is connected to one end of the sampling module, and the other end of the sampling module serves as a series port, which is used to connect to the positive end of the indicator light in the door load; the input end of the second signal acquisition module is connected in parallel with the sampling module, the output end of the second signal acquisition module is connected to the input end of the third analog-to-digital conversion module, and the output end of the third analog-to-digital conversion module is connected to the controller.

[0010] In one embodiment, the first signal acquisition module includes: a first current acquisition module and a first voltage amplification module, the input end of the first current acquisition module serves as the input end of the first signal acquisition module, the first output end of the first current acquisition module serves as the first output end of the first signal acquisition module, the second output end of the first current acquisition module is connected to the input end of the first voltage amplification module, and the output end of the first voltage amplification module serves as the second output end of the first signal acquisition module.

[0011] In one embodiment, the second signal acquisition module includes: A second current acquisition module and a second voltage amplification module, the input end of the second current acquisition module serves as the input end of the second signal acquisition module, the output end of the second current acquisition module is connected to the input end of the second voltage amplification module, and the output end of the second voltage amplification module serves as the output end of the second signal acquisition module.

[0012] In one embodiment, the gate load stress test circuit further includes a first voltage regulator, wherein the output end of the first voltage regulator is connected to the input end of the sixth switch, and the input end of the first voltage regulator is connected to a power supply.

[0013] In one embodiment, the indicator light drive test circuit further includes: a second voltage regulator, wherein the output end of the second voltage regulator is connected to the power supply end of the constant current drive module, and the input end of the second voltage regulator is connected to the power supply.

[0014] In one embodiment, an integrated test device is provided, wherein a circuit board is provided in the integrated test device, and the circuit layer of the circuit board is printed with the above-mentioned integrated test circuit.

[0015] The integrated test circuit and integrated test device described above include a gate load drive test circuit within the integrated test circuit. A controller controls the power supply module to supply power and control the conduction of the gate drive module. When the gate load is driven on or off, a first signal acquisition module detects the voltage, which is converted by a first analog-to-digital conversion module and transmitted to the controller. The controller then obtains the drive current to determine whether the gate load passes the test. Compared to existing integrated test circuits that use voltmeters and ammeters for gate load drive test circuits, the voltage acquisition signal obtained by the first signal acquisition module and the drive current obtained by the controller improve detection accuracy, simplify the test circuit, and reduce costs to a certain extent. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0017] Figure 1 is a schematic diagram of a gate load drive test circuit according to an embodiment of the present invention; Figure 2 is a specific circuit diagram of a gate drive module in one embodiment of the present invention; Figure 3 is a schematic diagram of a gate load stress test circuit according to an embodiment of the present invention; Figure 4 is a schematic diagram of an indicator light drive test circuit in one embodiment of the present invention; Figure 5 is a specific schematic diagram of the first signal acquisition module in one embodiment of the present invention; Figure 6 is a specific schematic diagram of the second signal acquisition module in one embodiment of the present invention; Figure 7 FIG. 1 is a connection diagram of a first voltage stabilizer in an embodiment of the present invention.

[0018] Figure numerals: 1. Drive test circuit, 11. Power supply module, 12. Gate drive module, 121. First switch, 122. Second switch, 123. Third switch, 124. Fourth switch, 13. First signal acquisition module, 131. First current acquisition module, 132. First voltage amplification module, 14. First analog-to-digital conversion module, 15. Controller, 2. Pressure test circuit, 21. Sixth switch, 22. Second analog-to-digital conversion module, 23. First voltage regulator, 3. Indicator light drive test circuit, 31. Constant current drive module, 32. Sampling module, 33. Second signal acquisition module, 331. Second current acquisition module, 332. Second voltage amplification module, 34. Third analog-to-digital conversion module, 35. Second voltage regulator. DETAILED DESCRIPTION

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0020] It should be understood that the present invention can be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided to make the disclosure thorough and complete and to fully convey the scope of the invention to those skilled in the art. In the drawings, the dimensions and relative dimensions of layers and regions may be exaggerated for clarity. Like reference numerals denote like elements throughout.

[0021] It should be understood that when an element or layer is referred to as being "on," "adjacent to," "connected to," or "coupled to" another element or layer, it may be directly on, adjacent to, connected to, or coupled to the other element or layer, or there may be intervening elements or layers. Conversely, when an element is referred to as being "directly on," "directly adjacent to," "directly connected to," or "directly coupled to" another element or layer, there may be no intervening elements or layers. It should be understood that although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers, and / or parts, these elements, components, regions, layers, and / or parts should not be limited by these terms. These terms are merely used to distinguish one element, component, region, layer, or part from another element, component, region, layer, or part. Thus, a first element, component, region, layer, or part discussed below may be represented as a second element, component, region, layer, or part without departing from the teachings of the present invention.

[0022] Spatially relative terms such as "under," "beneath," "below," "under," "above," "above," etc., may be used herein for convenience of description to describe the relationship of one element or feature shown in the figures to other elements or features. It should be understood that the spatially relative terms are intended to include different orientations of the device in use and operation in addition to the orientations shown in the figures. For example, if the device in the drawings is flipped, then the elements or features described as "under" or "beneath" or "beneath" the other elements will be oriented as "over" the other elements or features. Thus, the exemplary terms "under" and "under" may include both the upper and lower orientations. The device may be oriented otherwise (rotated 90 degrees or in other orientations) and the spatial descriptors used herein are interpreted accordingly.

[0023] The purpose of the terms used herein is only to describe specific embodiments and is not intended to limit the present invention. When used herein, the singular forms "a", "an", and "the" are intended to include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "comprising" and / or "comprising", when used in this specification, determine the presence of the features, integers, steps, operations, elements and / or parts, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, parts and / or groups. When used herein, the term "and / or" includes any and all combinations of the relevant listed items.

[0024] In order to fully understand the present invention, detailed structures and steps will be provided in the following description to illustrate the technical solutions proposed by the present invention. Preferred embodiments of the present invention are described in detail below. However, in addition to these detailed descriptions, the present invention may also have other implementations.

[0025] In one embodiment, an integrated test circuit is provided, such as Figure 1 As shown, the integrated test circuit includes: A door load drive test circuit 1 includes a power supply module 11, a door drive module 12, a first signal acquisition module 13, a first analog-to-digital conversion module 14, and a controller 15. The input end of the power supply module 11 is connected to the controller 15, the positive output end P1 of the power supply module 11 is connected to the input end of the first signal acquisition module 13, the first output end L1 of the first signal acquisition module 13 is connected to the first port F1 of the door drive module 12, the negative output end P2 of the power supply module 11 is connected to the second port F2 of the door drive module 12, the third port F3 of the door drive module 12 is connected to the positive end of the actuator of the door load, and the fourth port F4 of the door drive module 12 is connected to the negative end of the actuator of the door load. The first input end G1 of the first analog-to-digital conversion module 14 is connected to the second output end L2 of the first signal acquisition module 13, and the output end of the first analog-to-digital conversion module 14 is connected to the controller 15. The controller 15 is used to control the door drive module 12 to be turned on or off, and to send a power signal to the actuator of the door load through the power supply module 11 and the door drive module 12. The first analog-to-digital conversion module 14 is used to send the voltage acquisition signal of the first signal acquisition module 13 to the controller 15, and the controller 15 is used to test the drive current of the actuator according to the voltage acquisition signal.

[0026] Among them, the door load can be a charging door at the charging interface of an electric vehicle, or an electric door at the gas port of a car, etc., or other electric doors that require electric drive, all of which are within the protection scope of this application. The actuator of the door load can refer to a motor that drives the door load to open or close. Testing the driving current of the actuator means that after the controller 15 receives the voltage acquisition signal, it divides the voltage acquisition signal by the reference voltage, then divides it by the resistance of the sampling resistor in the first signal acquisition module 13, and then divides it by the amplification factor of the voltage amplifier in the first signal acquisition module 13 to obtain the driving current of the actuator, and then judges whether the driving current exceeds the threshold value according to the preset driving current threshold value. When it does not exceed the threshold value, it indicates that the door load has passed the test.

[0027] The model of the power module 11 can be DKP6008, the model of the first analog-to-digital conversion module 14 can be ADS1256, and the model of the controller 15 can be STM32F103VET6. The models of the various modules involved in the present invention are all examples and can be adjusted as needed. They will not be repeated hereafter.

[0028] The working process of the above integrated test circuit is: Connect the gate load to the gate load drive test circuit 1; The controller 15 sends a power supply signal to the power supply module 11 and a first conduction signal to the door drive module 12. The positive output terminal P1 of the power supply module 11 outputs the positive power supply signal to the first signal acquisition module 13. The power supply signal is transmitted to the door drive module 12 through the first output terminal L1 of the first signal acquisition module 13. After passing through the door drive module 12, it is transmitted to the actuator of the door load, and the actuator of the door load performs the door opening or closing action. The first signal acquisition module 13 detects the voltage signal in real time, converts the analog voltage acquisition signal into a digital signal through the first analog-to-digital conversion module 14, and transmits it to the controller 15. The controller 15 obtains the driving current based on the received voltage acquisition signal and determines whether the gate load passes the test based on the preset driving current threshold.

[0029] In this embodiment, a gate load drive test circuit is provided within the integrated test circuit. A controller controls the power supply module to supply power and the conduction of the gate drive module. When the gate load is driven on or off, a first signal acquisition module detects the voltage, which is converted by a first analog-to-digital conversion module and transmitted to the controller. The controller then obtains the drive current to determine whether the gate load passes the test. Compared to existing integrated test circuits that use a voltmeter and ammeter for gate load drive test circuits, this method, in which the voltage signal is obtained by the first signal acquisition module and the drive current is obtained by the controller, improves detection accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0030] In one embodiment, if Figure 1 As shown, the second input terminal G2 of the first analog-to-digital conversion module 14 is connected to the output terminal of the position sensor in the door load, and the first analog-to-digital conversion module 14 is used to send the door position signal of the position sensor to the controller 15. The controller 15 is used to test the position sensor according to the door position signal to determine the open state or closed state of the door load.

[0031] Among them, during the door opening and closing processes, the voltage of the position sensor will change all the time. The door position signal refers to this changing voltage. This voltage signal is converted by the first analog-to-digital conversion module 14 and transmitted to the controller 15. The controller 15 determines whether the door is fully open or fully closed based on the voltage signal.

[0032] The working process of the above integrated test circuit is: Connect the gate load to the gate load drive test circuit 1; The controller 15 sends a power supply signal to the power supply module 11 and a first conduction signal to the door drive module 12. The positive output terminal P1 of the power supply module 11 outputs the positive power supply signal to the first signal acquisition module 13. The power supply signal is transmitted to the door drive module 12 through the first output terminal L1 of the first signal acquisition module 13. After passing through the door drive module 12, it is transmitted to the actuator of the door load, and the actuator of the door load performs the door opening or closing action. The first signal acquisition module 13 detects the voltage signal in real time, converts the analog voltage acquisition signal into a digital signal through the first analog-to-digital conversion module 14, and transmits it to the controller 15. The controller 15 obtains the driving current based on the received voltage acquisition signal and determines whether the gate load passes the test based on a preset driving current threshold. When the door load performs an opening or closing action, the position sensor on the door load sends a door position signal to the controller 15 in real time through the first analog-to-digital conversion module 14. At the same time, when the door load performs an opening or closing action, the controller 15 records the current first time or second time. When the controller 15 determines that the door load is fully opened or fully closed based on the door position signal, the controller 15 records the current third time or fourth time. The third time minus the first time is the time required for the door to be fully opened, and the fourth time minus the second time is the time required for the door to be fully closed. The controller 15 determines whether the door passes the test based on the obtained time required for the door to be fully opened and the time required for the door to be fully closed, as well as the preset door opening time range and door closing time range.

[0033] In this embodiment, a door load drive test circuit is provided within the integrated test circuit. A controller controls the power supply module to supply power and the conduction of the door drive module. When the door load is driven open or closed, a first signal acquisition module detects the voltage, which is converted by a first analog-to-digital conversion module and transmitted to the controller. The controller then obtains the drive current and determines whether the door load passes the test. The controller also obtains a door position signal through the first analog-to-digital conversion module to determine the open or closed state of the door load, as well as the opening and closing time. This improves detection accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0034] In one embodiment, if Figure 2 As shown, the door drive module 12 includes: A first switch 121, a second switch 122, a third switch 123, and a fourth switch 124, wherein the input end of the first switch 121 serves as the first port F1 of the door driving module 12, the output end of the first switch 121 serves as the fourth port F4 of the door driving module 12, and the control end of the first switch 121 is connected to the controller 15; The input end of the second switch 122 serves as the first port F1 of the door driving module 12 , the output end of the second switch 122 serves as the third port F3 of the door driving module 12 , and the control end of the second switch 122 is connected to the controller 15 ; The input end of the third switch 123 serves as the second port F2 of the door driving module 12 , the output end of the third switch 123 serves as the third port F3 of the door driving module 12 , and the control end of the third switch 123 is connected to the controller 15 ; The input end of the fourth switch 124 serves as the second port F2 of the door driving module 12 , the output end of the fourth switch 124 serves as the fourth port F4 of the door driving module 12 , and the control end of the fourth switch 124 is connected to the controller 15 ; The controller 15 is configured to control the first switch 121 and the third switch 123 to be turned on, or control the second switch 122 and the fourth switch 124 to be turned on, so as to turn the door driving module 12 on or off.

[0035] The first, second, third and fourth switches may all be solid-state relays or other types of switches, all of which are within the protection scope of the present invention.

[0036] The working process of the above integrated test circuit is: Connect the gate load to the gate load drive test circuit 1; The controller 15 sends a power supply signal to the power module 11 and simultaneously controls the second switch 122 and the fourth switch 124 to be turned on, and the first switch 121 and the third switch 123 to be turned off, so that the positive output terminal P1 of the power module 11 outputs a positive power supply signal to the first signal acquisition module 13. The first output terminal L1 of the first signal acquisition module 13 transmits the power supply signal to the positive terminal of the actuator of the door load through the second switch 122. The power supply signal is then returned from the positive terminal of the actuator to the negative output terminal P2 of the power module 11 through the fourth switch 124, and the actuator of the door load performs the door opening action. The first signal acquisition module 13 detects the voltage signal in real time, converts the analog voltage acquisition signal into a digital signal through the first analog-to-digital conversion module 14, and transmits it to the controller 15. The controller 15 obtains the driving current based on the received voltage acquisition signal and determines whether the door load passes the door opening test based on a preset driving current threshold. The controller 15 then controls the first switch 121 and the third switch 123 to be turned on, and the second switch 122 and the fourth switch 124 to be turned off, so that the positive output terminal P1 of the power supply module 11 outputs a positive power supply signal to the first signal acquisition module 13. The first output terminal L1 of the first signal acquisition module 13 transmits the power supply signal to the positive terminal of the actuator of the door load through the first switch 121. The power supply signal is then returned from the positive terminal of the actuator to the negative output terminal P2 of the power supply module 11 through the third switch 123, and the actuator of the door load performs the door closing action. The first signal acquisition module 13 detects the voltage signal in real time, converts the voltage acquisition signal of the analog signal into a digital signal through the first analog-to-digital conversion module 14, and transmits it to the controller 15. The controller 15 obtains the driving current based on the received voltage acquisition signal, and determines whether the door load passes the door closing test through a preset driving current threshold.

[0037] In this embodiment, a gate load drive test circuit is provided within the integrated test circuit. A controller controls the power supply module to turn on and off various switches within the gate drive module. When the gate load is driven on or off, a first signal acquisition module detects the voltage, which is converted by a first analog-to-digital conversion module and transmitted to the controller. The controller then obtains the drive current to determine whether the gate load passes the test. Compared to existing integrated test circuits that use a voltmeter and ammeter for gate load drive test circuits, this method, which uses the first signal acquisition module to obtain the voltage signal and the controller to obtain the drive current, improves detection accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0038] In one embodiment, if Figure 3 As shown, the integrated test circuit further includes: The pressure test circuit 2 of the door load includes: a sixth switch 21 and a second analog-to-digital conversion module 22, the input end of the sixth switch 21 is used to input a power signal, the output end of the sixth switch 21 serves as a power port, the power port is used to connect the power supply end of the pressure sensor in the door load, and the control end of the sixth switch 21 is connected to the controller 15; the input end of the second analog-to-digital conversion module 22 serves as a test port, the test port is used to connect the output end of the pressure sensor in the door load; the output end of the second analog-to-digital conversion module 22 is connected to the controller 15.

[0039] The sixth switch 21 may be a power electronic switch, model TPS2553DBVR; the second analog-to-digital conversion module 22 may be model ADS1256, both of which may be adjusted as needed.

[0040] The working process of the above integrated test circuit is: Connect the gate load to the stress test circuit 2; The controller 15 sends a switch-on instruction to the sixth switch 21. After the sixth switch 21 is turned on, it receives a power signal from the input end and outputs the power signal to the power supply end of the pressure sensor through the power port to power the pressure sensor. A preset force is applied to the pressure sensor, and the voltage output from the output end of the pressure sensor is detected in real time through the test port by the second analog-to-digital conversion module 22, and then transmitted to the controller 15. The controller 15 detects that the voltage output by the pressure sensor has changed, determines that there is external force pressing, and controls the door load to open or close.

[0041] In this embodiment, a pressure test circuit for the door load is provided within the integrated test circuit. A controller controls the on / off switching of a sixth switch, supplies power to a pressure sensor, and applies a preset force to the pressure sensor. When the controller detects a change in the voltage output by the pressure sensor, it controls the door load to open or close. The voltage is detected by a first signal acquisition module, converted by a first analog-to-digital conversion module, and transmitted to the controller. The controller then generates a drive current to determine whether the door load passes the test. This integration of the drive test and pressure test for the door load improves detection accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0042] In one embodiment, if Figure 4 As shown, the integrated test circuit further includes: The indicator light drive test circuit 3 includes: a constant current drive module 31, a sampling module 32, a second signal acquisition module 33, and a third analog-to-digital conversion module 34, wherein the input end of the constant current drive module 31 is connected to the controller, the output end of the constant current drive module 31 is connected to one end of the sampling module 32, and the other end of the sampling module 32 serves as a series port, which is used to connect the positive end of the indicator light in the door load; the input end of the second signal acquisition module 33 is connected in parallel with the sampling module 32, the output end of the second signal acquisition module 33 is connected to the input end of the third analog-to-digital conversion module 34, and the output end of the third analog-to-digital conversion module 34 is connected to the controller 15.

[0043] The sampling module 32 is a sampling resistor, which may be one sampling resistor or a plurality of sampling resistors connected in series, and may be adjusted as needed.

[0044] The working process of the above integrated test circuit is: Connect the door load to the indicator light drive test circuit 3; The controller 15 sends a constant current drive signal to the constant current drive module 31. After receiving the constant current drive signal, the constant current drive module 31 outputs current to the sampling module 32. After passing through the other end of the sampling module 32, it reaches the positive end of the indicator light of the door load, powering the indicator light so that the indicator light works normally. The voltage of the sampling module 32 is collected by the second signal acquisition module 33, and the collected voltage is output to the third analog-to-digital conversion module 34 for processing, and then output to the controller 15. The controller 15 determines the driving current of the indicator light of the door load based on the processed collected voltage, and makes a judgment based on the preset current threshold. When the driving current is within the preset current threshold, the detection is passed; when the driving current is not within the preset current threshold, the detection is failed.

[0045] In this embodiment, an indicator light drive test circuit is provided within the integrated test circuit. A controller controls a constant current drive module, causing it to output a signal to a sampling module. After passing through the sampling module, the signal powers the indicator light of the door load. A second signal acquisition module then tests the sampling module's drive voltage. After passing through a third analog-to-digital conversion module 34, the signal is transmitted to the controller, which then tests whether the indicator light of the door load passes the test. This integrated drive test and pressure test for the door load improves test accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0046] In one embodiment, if Figure 5 As shown, the first signal acquisition module 13 includes: a first current acquisition module 131 and a first voltage amplification module 132. The input end of the first current acquisition module 131 serves as the input end of the first signal acquisition module 13, and the first output end of the first current acquisition module 131 serves as the first output end L1 of the first signal acquisition module 13. The second output end of the first current acquisition module 131 is connected to the input end of the first voltage amplification module 132, and the output end of the first voltage amplification module 132 serves as the second output end L2 of the first signal acquisition module 13.

[0047] The model of the first current acquisition module 131 may be MAX4173, and the model of the first voltage amplification module 132 may be AD620. Both models may be adjusted as needed.

[0048] The working process of the above integrated test circuit is: Connect the gate load to the gate load drive test circuit 1; The controller 15 sends a power supply signal to the power module 11 and a first conduction signal to the door drive module 12. The positive output terminal P1 of the power module 11 outputs the positive power supply signal to the first current acquisition module 131. The power supply signal is transmitted to the door drive module 12 through the first output terminal L1 of the first current acquisition module 131. The first current acquisition module 131 collects the drive current. The power supply signal is then transmitted through the door drive module 12 to the actuator of the door load, which then performs the door opening or closing action. The first voltage amplification module 132 detects the voltage signal in real time, converts the voltage acquisition signal of the analog signal into a digital signal through the first analog-to-digital conversion module 14, and transmits it to the controller 15. The controller 15 obtains the driving current based on the received voltage acquisition signal and determines whether the gate load passes the test based on the preset driving current threshold. When the door load performs an opening or closing action, the position sensor on the door load sends a door position signal to the controller 15 in real time through the first analog-to-digital conversion module 14. At the same time, when the door load performs an opening or closing action, the controller 15 records the current first time or second time. When the controller 15 determines that the door load is fully opened or fully closed based on the door position signal, the controller 15 records the current third time or fourth time. The third time minus the first time is the time required for the door to be fully opened, and the fourth time minus the second time is the time required for the door to be fully closed. The controller 15 determines whether the door passes the test based on the obtained time required for the door to be fully opened and the time required for the door to be fully closed, as well as the preset door opening time range and door closing time range.

[0049] In this embodiment, a first current acquisition module and a first voltage amplification module are provided within the first signal acquisition module. A controller controls the power supply module to supply power and the conduction of the gate drive module. When the gate load is driven on or off, the first current acquisition module acquires the drive current, and the first voltage amplification module detects the voltage. The detected voltage is converted by the first analog-to-digital conversion module and transmitted to the controller, which then obtains the drive current and determines whether the gate load passes the test. Compared to existing integrated test circuits that use voltmeters and ammeters for gate load drive test circuits, obtaining the voltage signal through the first signal acquisition module and the drive current through the controller improves detection accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0050] In one embodiment, if Figure 6 As shown, the second signal acquisition module 33 includes: A second current acquisition module 331 and a second voltage amplification module 332, wherein the input end of the second current acquisition module 331 serves as the input end of the second signal acquisition module 33, the output end of the second current acquisition module 331 is connected to the input end of the second voltage amplification module 332, and the output end of the second voltage amplification module 332 serves as the output end of the second signal acquisition module 33.

[0051] The model of the second current acquisition module 331 may be MAX4137, and the model of the second voltage amplification module 332 may be AD620, and both models may be adjusted as needed.

[0052] The working process of the above integrated test circuit is: Connect the door load to the indicator light drive test circuit 3; The controller 15 sends a constant current drive signal to the constant current drive module 31. After receiving the constant current drive signal, the constant current drive module 31 outputs current to the sampling module 32. After passing through the other end of the sampling module 32, it reaches the positive end of the indicator light of the door load, powering the indicator light so that the indicator light works normally. The second current acquisition module 331 acquires the current of the sampling module 32, outputs the current to the second voltage amplification module 332, obtains the acquired voltage, outputs the acquired voltage to the third analog-to-digital conversion module 34 for processing, and then outputs it to the controller 15. The controller 15 determines the driving current of the indicator light of the door load based on the obtained processed acquired voltage, and makes a judgment based on the preset current threshold. When the driving current is within the preset current threshold, the detection is passed; when the driving current is not within the preset current threshold, the detection is failed.

[0053] In this embodiment, an indicator light drive test circuit is provided within the integrated test circuit. A controller controls a constant current drive module, causing it to output a signal to a sampling module. After passing through the sampling module, the signal powers the indicator light of the door load. The sampling module's drive voltage is then tested by a second current acquisition module and a second voltage amplification module. The signal is then transmitted to the controller through a third analog-to-digital conversion module 34, where it is tested to determine whether the indicator light of the door load passes the test. This integration of the drive test and pressure test for the door load improves test accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0054] In one embodiment, if Figure 7 As shown, the gate load stress test circuit 2 further includes a first voltage regulator 23 , the output end of the first voltage regulator 23 is connected to the input end of the sixth switch 21 , and the input end of the first voltage regulator 23 is connected to a power supply.

[0055] The model of the first voltage stabilizer 23 may be LM317, which can be adjusted as needed.

[0056] The working process of the above integrated test circuit is: Connect the gate load to the stress test circuit 2; The input terminal of the first voltage regulator 23 receives the power signal and processes the power signal into a power signal of a preset voltage; The controller 15 sends a switch-on instruction to the sixth switch 21. After the sixth switch 21 is turned on, it receives a power signal of a preset voltage from the input end and outputs the power signal of the preset voltage to the power supply end of the pressure sensor through the power port to power the pressure sensor. A preset force is applied to the pressure sensor, and the voltage output from the output end of the pressure sensor is detected in real time through the test port by the second analog-to-digital conversion module 22, and then transmitted to the controller 15. The controller 15 detects that the voltage output by the pressure sensor has changed, determines that there is external force pressing, and controls the door load to open or close.

[0057] In this embodiment, a first voltage regulator is provided in the pressure test circuit for the door load. After processing the power signal through the first voltage regulator, a controller controls the on / off switching of a sixth switch, supplies power to the pressure sensor, and applies a preset force to the pressure sensor. When the controller detects a change in the voltage output by the pressure sensor, it controls the door load to open or close. The voltage is detected by a first signal acquisition module, converted by a first analog-to-digital conversion module, and transmitted to the controller. The controller then generates a drive current to determine whether the door load passes the test. This integrated drive test and pressure test for the door load improves detection accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0058] In one embodiment, if Figure 6 As shown, the indicator light drive test circuit 3 further includes: a second voltage stabilizer 35, the output end of the second voltage stabilizer 35 is connected to the power supply end of the constant current drive module 31, and the input end of the second voltage stabilizer 35 is connected to the power supply.

[0059] Among them, the model of the second voltage regulator 35 can be LM317, which can be adjusted as needed and is within the protection scope of this application.

[0060] Connect the door load to the indicator light drive test circuit 3; The second voltage stabilizer 35 receives the power supply signal and converts the power supply signal into a power supply signal of a preset voltage; The controller 15 sends a constant current drive signal to the constant current drive module 31. After receiving the constant current drive signal, the constant current drive module 31 outputs a power signal of a preset voltage to the sampling module 32. After passing through the other end of the sampling module 32, it reaches the positive end of the indicator light of the door load, powering the indicator light and making it work normally. The second current acquisition module 331 acquires the current of the sampling module 32, outputs the current to the second voltage amplification module 332, obtains the acquired voltage, outputs the acquired voltage to the third analog-to-digital conversion module 34 for processing, and then outputs it to the controller 15. The controller 15 determines the driving current of the indicator light of the door load based on the obtained processed acquired voltage, and makes a judgment based on the preset current threshold. When the driving current is within the preset current threshold, the detection is passed; when the driving current is not within the preset current threshold, the detection is failed.

[0061] In this embodiment, a second voltage regulator is provided in the indicator light drive test circuit. A controller controls the constant current drive module, causing it to output a signal to the sampling module. After passing through the sampling module, the signal is used to power the indicator light of the door load. The sampling module's drive voltage is then tested by a second current acquisition module and a second voltage amplification module. After passing through a third analog-to-digital conversion module 34, the signal is transmitted to the controller for testing to determine whether the indicator light of the door load passes the test. This integrated drive test and pressure test for the door load improves test accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0062] In one embodiment, an integrated test device is provided, wherein a circuit board is provided in the integrated test device, and the circuit layer of the circuit board is printed with the above-mentioned integrated test circuit.

[0063] Among them, a pressure testing device is also provided in the integrated testing equipment. The pressure testing device is used to apply a preset force to the pressure sensor when the integrated testing equipment tests the pressure sensor of the door load, and then determine whether the door load passes the test through the pressure testing circuit.

[0064] like Figure 1 As shown, the working process of the above integrated test equipment is: Connect the door load to the integrated test equipment; The controller 15 sends a power supply signal to the power supply module 11 and a first conduction signal to the door drive module 12. The positive output terminal P1 of the power supply module 11 outputs the positive power supply signal to the first signal acquisition module 13. The power supply signal is transmitted to the door drive module 12 through the first output terminal L1 of the first signal acquisition module 13. After passing through the door drive module 12, it is transmitted to the actuator of the door load, and the actuator of the door load performs the door opening or closing action. The first signal acquisition module 13 detects the voltage signal in real time, converts the analog voltage acquisition signal into a digital signal through the first analog-to-digital conversion module 14, and transmits it to the controller 15. The controller 15 obtains the driving current based on the received voltage acquisition signal and determines whether the gate load passes the test based on the preset driving current threshold.

[0065] In this embodiment, a controller controls the power supply module to supply power and the conduction of the gate drive module. When driving the gate load on or off, the first signal acquisition module detects the voltage, which is converted by the first analog-to-digital conversion module and transmitted to the controller. The controller then obtains the drive current to determine whether the gate load passes the test. Compared to existing integrated test circuits that use voltmeters and ammeters for gate load drive test circuits, obtaining the voltage signal through the first signal acquisition module and obtaining the drive current through the controller improves detection accuracy, simplifies the test circuit, and reduces costs to a certain extent.

[0066] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention, and should all be included in the scope of protection of the present invention.

Claims

1. An integrated test circuit, characterized in that: The integrated test circuit comprises: A gate load drive test circuit, comprising a power supply module, a gate drive module, a first signal acquisition module, a first analog-to-digital conversion module, and a controller, wherein the input end of the power supply module is connected to the controller, the positive output end of the power supply module is connected to the input end of the first signal acquisition module, the first output end of the first signal acquisition module is connected to the first port of the gate drive module, the negative output end of the power supply module is connected to the second port of the gate drive module, the third port of the gate drive module is connected to the positive end of the actuator of the gate load, and the fourth port of the gate drive module is connected to the negative end of the actuator of the gate load; The first input end of the first analog-to-digital conversion module is connected to the second output end of the first signal acquisition module, and the output end of the first analog-to-digital conversion module is connected to the controller. The controller is used to control the gate drive module to be turned on or off, and to send a power signal to the actuator of the door load through the power supply module and the gate drive module. The first analog-to-digital conversion module is used to send the voltage acquisition signal of the first signal acquisition module to the controller, and the controller is used to test the drive current of the actuator according to the voltage acquisition signal.

2. The integrated test circuit according to claim 1, characterized in that: The second input end of the first analog-to-digital conversion module is connected to the output end of the position sensor in the door load. The first analog-to-digital conversion module is used to send a door position signal of the position sensor to the controller. The controller is used to test the position sensor according to the door position signal to determine the open state or closed state of the door load.

3. The integrated test circuit according to claim 1 or 2, characterized in that: The door drive module comprises: a first switch, a second switch, a third switch, and a fourth switch, wherein the input end of the first switch serves as the first port of the door driving module, the output end of the first switch serves as the fourth port of the door driving module, and the control end of the first switch is connected to the controller; The input end of the second switch serves as the first port of the gate driving module, the output end of the second switch serves as the third port of the gate driving module, and the control end of the second switch is connected to the controller; The input end of the third switch serves as the second port of the gate driving module, the output end of the third switch serves as the third port of the gate driving module, and the control end of the third switch is connected to the controller; The input end of the fourth switch serves as the second port of the gate driving module, the output end of the fourth switch serves as the fourth port of the gate driving module, and the control end of the fourth switch is connected to the controller; The controller is used to control the first switch and the third switch to be turned on, or to control the second switch and the fourth switch to be turned on, so as to turn the gate drive module on or off.

4. The integrated test circuit according to claim 1, wherein: The integrated test circuit further includes: A pressure test circuit for a door load, the pressure test circuit comprising: a sixth switch and a second analog-to-digital conversion module, the input end of the sixth switch being used to input a power supply signal, the output end of the sixth switch being used as a power supply port, the power supply port being used to connect to the power supply end of the pressure sensor in the door load, and the control end of the sixth switch being connected to the controller; the input end of the second analog-to-digital conversion module being used as a test port, the test port being used to connect to the output end of the pressure sensor in the door load; and the output end of the second analog-to-digital conversion module being connected to the controller.

5. The integrated test circuit according to claim 1 or 4, characterized in that: The integrated test circuit further includes: An indicator light drive test circuit includes: a constant current drive module, a sampling module, a second signal acquisition module, and a third analog-to-digital conversion module, wherein the input end of the constant current drive module is connected to the controller, the output end of the constant current drive module is connected to one end of the sampling module, and the other end of the sampling module serves as a series port, which is used to connect to the positive end of the indicator light in the door load; the input end of the second signal acquisition module is connected in parallel with the sampling module, the output end of the second signal acquisition module is connected to the input end of the third analog-to-digital conversion module, and the output end of the third analog-to-digital conversion module is connected to the controller.

6. The integrated test circuit according to claim 1 or 2, characterized in that: The first signal acquisition module includes: a first current acquisition module and a first voltage amplification module, the input end of the first current acquisition module serves as the input end of the first signal acquisition module, the first output end of the first current acquisition module serves as the first output end of the first signal acquisition module, the second output end of the first current acquisition module is connected to the input end of the first voltage amplification module, and the output end of the first voltage amplification module serves as the second output end of the first signal acquisition module.

7. The integrated test circuit according to claim 5, characterized in that: The second signal acquisition module includes: A second current acquisition module and a second voltage amplification module, the input end of the second current acquisition module serves as the input end of the second signal acquisition module, the output end of the second current acquisition module is connected to the input end of the second voltage amplification module, and the output end of the second voltage amplification module serves as the output end of the second signal acquisition module.

8. The integrated test circuit according to claim 4, characterized in that: The gate load stress test circuit further includes a first voltage regulator, wherein the output end of the first voltage regulator is connected to the input end of the sixth switch, and the input end of the first voltage regulator is connected to a power supply.

9. The integrated test circuit according to claim 5, characterized in that: The indicator light drive test circuit further includes: a second voltage stabilizer, wherein the output end of the second voltage stabilizer is connected to the power supply end of the constant current drive module, and the input end of the second voltage stabilizer is connected to the power supply.

10. An integrated test device, characterized in that: A circuit board is provided in the integrated test device, and the integrated test circuit according to any one of claims 1 to 9 is printed on a circuit layer of the circuit board.

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