AC switcher test system and method

Abstract

The invention discloses an alternating current switcher test system and method, relates to the technical field of alternating current switcher test, and aims to solve the problems of low efficiency and low test accuracy caused by manual test adopted by the current alternating current switcher test. The system comprises a computer host and a high-speed acquisition module connected with the computer host, the high-speed acquisition module can monitor the output state of the AC switcher in real time, the other end of the high-speed acquisition module is connected with a test butt-joint terminal, and a programmable power supply A and a programmable power supply B are connected between the computer host and the test butt-joint terminal. The programmable power supply A and the programmable power supply B can simulate the working state of the alternating current switcher when the power grid voltage fluctuates; the invention further comprises a corresponding testing method. The system and the method provided by the invention can realize high efficiency, precision and security of the AC switcher test.

Description

Technical Field

[0001] The present invention relates to the technical field of AC switcher testing, and in particular to an AC switcher testing system and method. Background Art

[0002] With the rapid development of modern industry, power systems, and various electronic devices, AC power switches, as key components for ensuring stable power supply and the proper functioning of equipment, are finding increasingly widespread application. In power systems, AC power switches are used to switch between different power lines, ensuring power continuity. In industrial automation production lines, they enable the conversion of different control circuits to meet diverse production process requirements. In communication base stations, AC power switches ensure that communication equipment remains operational even when the mains power is abnormal.

[0003] However, the performance of AC switchers directly impacts the reliability and safety of the entire system, making comprehensive and accurate testing crucial. Currently, most AC switcher testing relies on manual labor. In this era of mass production, with rapid product upgrades and a surging market demand for AC switchers, traditional manual testing methods are increasingly struggling to adapt to the demands of the industry.

[0004] Some existing AC switcher testing solutions, in addition to manual testing, also employ semi-automated testing methods, such as Chinese patent CN111404370A. This semi-automated testing typically involves the use of simple automated equipment at key test stages, such as automatic readout instruments to read electrical parameters or simple control devices to assist with switching operations. However, the overall testing process still relies on manual operation and judgment for the majority of the time, improving efficiency only at certain points. Summary of the Invention

[0005] The present invention solves the problem of low efficiency and low test accuracy caused by manual testing of current AC switchers, and proposes an AC switcher testing system and method to achieve efficient, accurate and safe testing of AC switchers.

[0006] In order to achieve the above-mentioned purpose, the present invention adopts the following technical solution: an AC switch test system, including a computer host and a high-speed acquisition module connected to the computer host, the high-speed acquisition module can monitor the output status of the AC switch in real time, the other end of the high-speed acquisition module is connected to a test docking terminal, and a programmable power supply A and a programmable power supply B are also connected between the computer host and the test docking terminal, the programmable power supply A and the programmable power supply B can simulate the working state of the AC switch when the grid voltage fluctuates.

[0007] The AC switch test system of the present invention is used for testing, which can significantly improve the degree of test automation and reduce manual operations; and the test functions are fully covered, and the test can perform intelligent analysis and diagnosis.

[0008] The present invention is further configured as follows: the input interface of the high-speed acquisition module is connected to the test docking terminal to achieve output acquisition, and the output interface of the high-speed acquisition module is connected to the computer host.

[0009] In this technical solution, the computer host realizes program control through the communication interface and the high-speed acquisition module.

[0010] The present invention is further configured as follows: the input interfaces of the programmable power supply A and the programmable power supply B are connected to the test docking terminals to provide input excitation for the AC switcher, and the output interfaces of the programmable power supply A and the programmable power supply B are connected to the computer host.

[0011] In this technical solution, the computer host is connected to the programmable power supply B and the programmable power supply A through the communication interface to realize program control.

[0012] The present invention is further configured as follows: the high-speed acquisition module includes an AC voltage conditioning circuit and an acquisition body, the AC voltage conditioning circuit includes a scaling unit, the scaling unit is connected to a signal conditioning unit, the signal conditioning unit is connected to a filtering unit, and the filtering unit is connected to the microcontroller of the acquisition body.

[0013] In this technical solution, the AC voltage conditioning circuit of the high-speed acquisition module can raise the AC voltage signal to above 0V.

[0014] The present invention is further configured as follows: the scaling unit includes an AC transformer and a resistor R1 connected in parallel with a coil on one side of the AC transformer; one end of the resistor R1 is connected to the signal conditioning unit; and the other end of the resistor R1 is grounded.

[0015] In this technical solution, the AC transformer and the resistor R1 proportionally reduce the input AC voltage signal to a voltage range that can be detected by the AD signal of the single-chip microcomputer.

[0016] The present invention is further configured as follows: the signal conditioning unit includes a resistor R2, the resistor R2 is connected to the negative input terminal of the operational amplifier, the positive input terminal of the operational amplifier is respectively connected to resistors R3 and R4, the other end of the resistor R3 is grounded, and the other end of the resistor R4 is connected to a power supply, and a resistor R5 and a capacitor C1 are arranged and connected in parallel between the negative input terminal and the output terminal of the operational amplifier.

[0017] In this technical solution, resistors R2, R3, R4, R5, capacitor C1, and an operational amplifier form a conditioning unit to raise the AC voltage signal to above 0V.

[0018] The present invention is further configured as follows: the filtering unit includes a resistor R6 connected to the output end of the operational amplifier, the resistor R6 is respectively connected to the capacitor C2 and the AD pin of the microcontroller, and the other end of the capacitor C2 is grounded.

[0019] In this technical solution, resistor R6 and capacitor C2 form a filtering unit to filter out high-frequency interference signals and connect to the microcontroller for collection.

[0020] An AC switch test method, applicable to the above-mentioned AC switch test system, comprises the following steps: The host computer starts testing, and the high-speed acquisition module, programmable power supply A, and programmable power supply B perform communication self-test; The input state simulation thread and the output state acquisition thread are executed in parallel. The input state simulation thread uses programmable power supply A and programmable power supply B to simulate the normal working state of the AC switch and the abnormal working state of each circuit and output the working voltage. The output state acquisition thread uses a high-speed acquisition module to continuously acquire the output voltage value of the AC switch until receiving the end notification of the input state simulation thread. Determine whether the AC switch is qualified based on the voltage value collected from the output state, and record the test results.

[0021] In this technical solution, the host computer runs the test program, and the programmable power supply and high-speed data acquisition module perform communication self-tests. It then starts two threads: an input state simulation thread and an output state acquisition thread. These two threads execute in parallel. After both threads complete, the collected output state voltage values ​​are evaluated to confirm that all voltage values ​​have not fluctuated abnormally. If so, the AC switch passes the test; otherwise, the test is abnormal.

[0022] The present invention is further configured as follows: the input state simulation thread specifically includes: S100: Both programmable power supply A and programmable power supply B output normal operating voltage and wait for the set time. S200: Programmable power supply A maintains its state, programmable power supply B outputs abnormal voltage, and waits for the set time; S300: Programmable power supply A maintains its state, and programmable power supply B outputs normal operating voltage and waits for the set time. S400, programmable power supply A outputs abnormal voltage, programmable power supply B maintains the status and waits according to the set time.

[0023] The present invention is further configured such that: determining whether the AC switch is qualified according to the voltage value collected according to the output state specifically includes: The voltage values ​​collected from the output state are judged. If all voltage values ​​do not fluctuate abnormally, the AC switch test is qualified; otherwise, the AC switch test is abnormal.

[0024] In this technical solution, whether the AC switch test is qualified is determined by judging whether all voltage values ​​have no abnormal fluctuations.

[0025] The present invention can bring the following beneficial effects: The present invention relates to an AC switch test system that can solve the technical problems of low efficiency, poor accuracy and high safety risks of existing manual testing methods of AC switches, so as to achieve efficient, accurate and safe testing of AC switchers. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 This is a schematic diagram of the framework of an AC switch test system of the present application.

[0027] Figure 2 This is a schematic diagram of an AC voltage conditioning circuit of an AC switch test system of the present application.

[0028] Figure 3 This is a flow chart of an AC switch testing method of the present application.

[0029] Reference numerals: 1. Computer host 2. High-speed acquisition module 3. Programmable power supply B 4. Programmable power supply A 5. Test docking terminal. DETAILED DESCRIPTION

[0030] In order to make the objectives, technical solutions and advantages of the present invention more clear, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific implementation method described herein is only an optimal embodiment of the present invention, which is only used to explain the present invention and does not limit the scope of protection of the present invention. All other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0031] Existing AC switchers are tested manually. This involves connecting the AC switcher to a test circuit, connecting it to different adjustable AC power sources, and manually adjusting the AC power source voltage to observe whether the switcher accurately and reliably switches circuits. The switcher is also inspected for any lags or malfunctions during the switching process. Currently, testing AC switchers primarily relies on manual operation, a traditional testing method with numerous insurmountable drawbacks that urgently need to be addressed through innovative technologies.

[0032] Manual testing is extremely inefficient: When testing AC switchers for various performance indicators, such as switching time and output voltage, testers must manually complete a series of tedious operations, including connecting test equipment, setting parameters, and reading and recording data. When faced with testing large numbers of AC switchers, this method is not only time-consuming and labor-intensive, but also significantly slows down the entire testing process, making it difficult to meet the demands of large-scale production and rapid delivery.

[0033] Test accuracy is also difficult to guarantee: manual data reading is susceptible to interference from factors such as visual errors and subjective judgment. Different testers may read the same test data with different results, resulting in inconsistent and unreliable test results. Furthermore, since it is difficult to maintain consistent operating procedures during manual testing, omissions of test steps and incorrect parameter settings are common, further affecting the accuracy of test results.

[0034] Safety risks also exist: AC switch testing involves a strong electrical environment, and manual labor involves direct contact with the test equipment and the object being tested. When conducting high-voltage and high-current tests such as withstand voltage and overcurrent protection, if an operational error occurs, the tester will face serious safety threats such as electric shock and arc burns, posing a huge hidden danger to personal safety.

[0035] Although some semi-automated testing methods are used, manual intervention is still required. Connecting test lines, setting test parameters, and performing comprehensive data analysis still require manual work, which limits test efficiency gains and still presents accuracy and consistency issues caused by manual operation.

[0036] Existing semi-automated testing equipment can only test a few common parameters of AC switchers and cannot fully cover the complex and diverse performance indicators of AC switchers. For example, existing semi-automated equipment is unable to perform performance testing under certain special operating conditions and complex electromagnetic compatibility testing.

[0037] Lack of intelligent analysis and diagnosis: Existing technologies are unable to conduct in-depth analysis and intelligent diagnosis of test data. Even if test data is obtained, it is only simply recorded and initially compared. Data analysis cannot identify potential faults and performance defects of AC switchers, and cannot provide strong support for product optimization and improvement.

[0038] Based on the above background, the present invention aims to provide a dedicated testing system for AC switches to solve the technical problems of low efficiency, poor accuracy and high safety risks of existing manual testing methods of AC switches, and to achieve efficient, accurate and safe testing of AC switchers.

[0039] Example 1 This embodiment proposes an AC switch test system, referring to Figure 1 It mainly includes a computer host 1 and a high-speed acquisition module 2. The high-speed acquisition module can be connected to the computer host. The high-speed acquisition module can monitor the output status of the AC switch in real time and quickly record the sudden change of voltage at the switching moment, providing a complete and accurate data basis for the subsequent analysis of the performance of the AC switch. The other end of the high-speed acquisition module is connected to the test docking terminal 5. A programmable power supply A4 and a programmable power supply B3 are also set and connected between the computer host and the above-mentioned test docking terminal. The programmable power supply A and the programmable power supply B can simulate the working state of the AC switch when the grid voltage fluctuates. By setting the programmable power supply to output voltages of different amplitudes and frequencies, the switching performance and stability of the AC switch under these complex working conditions can be observed, which helps to comprehensively evaluate the adaptability and reliability of the AC switch.

[0040] The AC switcher testing system of the present invention is used for testing, which can significantly improve the degree of test automation and reduce manual operations.

[0041] Furthermore, the high-speed acquisition module is connected to the test docking terminal through its input interface to achieve output acquisition, and the output interface of the high-speed acquisition module is connected to the computer host.

[0042] The input interfaces of programmable power supply A and programmable power supply B are connected to the test docking terminals to provide input excitation for the AC switcher, and the output interfaces of programmable power supply A and programmable power supply B are connected to the computer host.

[0043] In more detail, the host computer can perform data acquisition and processing, control and coordination, display and monitoring, and data storage and management according to the test program.

[0044] The two ends of the high-speed acquisition module are respectively connected to the above-mentioned computer host and the test docking terminal.

[0045] The host computer can be connected to the high-speed acquisition module through its communication interface to achieve program control.

[0046] The two ends of the programmable power supply A and the programmable power supply B are connected to the computer host and the test docking terminal 5 respectively.

[0047] The computer host 1 is connected to the program-controlled power supply A and the program-controlled power supply B through its communication interface to realize program control.

[0048] For high-speed acquisition modules, refer to Figure 2It mainly includes an AC voltage conditioning circuit and an acquisition body connected thereto. The AC voltage conditioning circuit mainly includes a scaling unit, a signal conditioning unit and a filtering unit. The scaling unit is connected to the signal conditioning unit, the signal conditioning unit is connected to the filtering unit, and the filtering unit can be connected to the microcontroller of the acquisition body.

[0049] In this technical solution, the AC voltage conditioning circuit of the high-speed acquisition module can raise the AC voltage signal to above 0V.

[0050] Continue to refer Figure 2 The scaling unit mainly includes an AC transformer L1 and a resistor R1. One side coil of the AC transformer L1 is connected in parallel with the resistor R1. One end of the resistor R1 is connected to the signal conditioning unit, and the other end of the resistor R1 is grounded.

[0051] In this technical solution, the AC transformer L1 and the resistor R1 proportionally reduce the input AC voltage signal to a voltage range that can be detected by the AD signal of the single-chip microcomputer.

[0052] The signal conditioning unit mainly includes resistors R2 and R3. Resistor R2 is connected to the negative input terminal of the operational amplifier, and the positive input terminal of the operational amplifier is connected to resistors R3 and R4 respectively. The other end of resistor R3 is grounded, and the other end of resistor R4 is connected to the power supply. A resistor R5 and a capacitor C1 are arranged and connected in parallel between the negative input terminal and the output terminal of the operational amplifier.

[0053] One end of the resistor R1 and the resistor R2 are connected, and the other end thereof is grounded.

[0054] One end of the resistor R2 is connected to the resistor R1, and the other end is connected to the negative input terminal of the operational amplifier U1.

[0055] The resistor R3 and the resistor R4 are connected, the other end of the resistor R3 is grounded, and the other end of the resistor R4 is connected to a power supply.

[0056] The series connection node of resistor R3 and resistor R4 is connected to the positive input terminal of operational amplifier U1.

[0057] The resistor R5 and the capacitor C1 are connected in parallel, with one end of the parallel node connected to the negative input terminal of the operational amplifier U1, and the other end connected to the output terminal of the operational amplifier U1.

[0058] In this technical solution, resistors R2, R3, R4, R5, capacitor C1, and an operational amplifier form a conditioning unit to raise the AC voltage signal to above 0V.

[0059] In more detail, one end of the resistor R2 is connected to one end of the resistor R1 of the scaling unit, the other end of the resistor R2 is connected to the negative input terminal of the operational amplifier U1, one end of the resistor R3 is grounded, the other end of the resistor R3 is respectively connected to the resistor R4 and the positive input terminal of the operational amplifier U1, and the end of the resistor R4 away from the resistor R3 is connected to a 5V power supply. In addition, the operational amplifier U1 is also connected to one end of the resistor R5, and the other end of the resistor R5 is connected to the output terminal of the operational amplifier U1. Similarly, the operational amplifier U1 is also connected to one end of the capacitor C1, and the other end of the capacitor C1 is connected to the output terminal of the operational amplifier U1.

[0060] The filter unit includes a resistor R6, which is connected to the output of the operational amplifier. The resistor R6 is also connected to the capacitor C2 and the AD pin of the microcontroller. The other end of the capacitor C2 is grounded. That is, the node of the resistor R6 and capacitor C2 connected in series is connected to the AD pin of the microcontroller.

[0061] In this technical solution, resistor R6 and capacitor C2 form a filtering unit to filter out high-frequency interference signals and connect to the microcontroller for collection.

[0062] Example 2 This embodiment provides an AC switch test system, which mainly includes a computer host 1 and a high-speed acquisition module 2. The high-speed acquisition module can be connected to the computer host.

[0063] The high-speed acquisition module can monitor the output status of the AC switch in real time and quickly record the sudden change in voltage at the switching moment, providing a complete and accurate data basis for subsequent analysis of the AC switch's performance.

[0064] The other end of the high-speed acquisition module is connected to the test docking terminal 5. A program-controlled power supply A4 and a program-controlled power supply B3 are also provided and connected between the computer host and the above-mentioned test docking terminal.

[0065] Programmable power supplies A and B can simulate the operating state of an AC switcher when the grid voltage fluctuates. By setting the programmable power supplies to output voltages of different amplitudes and frequencies, the switching performance and stability of the AC switcher under these complex working conditions can be observed, which helps to comprehensively evaluate the adaptability and reliability of the AC switcher.

[0066] The AC switcher testing system of the present invention is used for testing, which can significantly improve the degree of test automation and reduce manual operations.

[0067] Furthermore, the high-speed acquisition module is connected to the test docking terminal through its input interface to achieve output acquisition, and the output interface of the high-speed acquisition module is connected to the computer host.

[0068] The input interfaces of programmable power supply A and programmable power supply B are connected to the test docking terminals to provide input excitation for the AC switcher, and the output interfaces of programmable power supply A and programmable power supply B are connected to the computer host.

[0069] In more detail, the host computer can perform data acquisition and processing, control and coordination, display and monitoring, and data storage and management according to the test program.

[0070] The two ends of the high-speed acquisition module are respectively connected to the above-mentioned computer host and the test docking terminal.

[0071] The host computer can be connected to the high-speed acquisition module through its communication interface to achieve program control.

[0072] The two ends of the programmable power supply A and the programmable power supply B are connected to the computer host and the test docking terminal 5 respectively.

[0073] The computer host 1 is connected to the program-controlled power supply A and the program-controlled power supply B through its communication interface to realize program control.

[0074] For high-speed acquisition modules, refer to Figure 2 It mainly includes an AC voltage conditioning circuit and an acquisition body connected thereto. The AC voltage conditioning circuit mainly includes a scaling unit, a signal conditioning unit and a filtering unit. The scaling unit is connected to the signal conditioning unit, the signal conditioning unit is connected to the filtering unit, and the filtering unit can be connected to the microcontroller of the acquisition body.

[0075] In this technical solution, the AC voltage conditioning circuit of the high-speed acquisition module can raise the AC voltage signal to above 0V.

[0076] Continue to refer Figure 2 The scaling unit mainly includes an AC transformer L1 and a resistor R1. One side coil of the AC transformer L1 is connected in parallel with the resistor R1. One end of the resistor R1 is connected to the signal conditioning unit, and the other end of the resistor R1 is grounded.

[0077] In this technical solution, the AC transformer L1 and the resistor R1 proportionally reduce the input AC voltage signal to a voltage range that can be detected by the AD signal of the single-chip microcomputer.

[0078] The signal conditioning unit mainly includes resistors R2 and R3. Resistor R2 is connected to the negative input terminal of the operational amplifier, and the positive input terminal of the operational amplifier is connected to resistors R3 and R4 respectively. The other end of resistor R3 is grounded, and the other end of resistor R4 is connected to the power supply. A resistor R5 and a capacitor C1 are arranged and connected in parallel between the negative input terminal and the output terminal of the operational amplifier.

[0079] One end of the resistor R1 and the resistor R2 are connected, and the other end thereof is grounded.

[0080] One end of the resistor R2 is connected to the resistor R1, and the other end is connected to the negative input terminal of the operational amplifier U1.

[0081] The resistor R3 and the resistor R4 are connected, the other end of the resistor R3 is grounded, and the other end of the resistor R4 is connected to a power supply.

[0082] The series connection node of resistor R3 and resistor R4 is connected to the positive input terminal of operational amplifier U1.

[0083] The resistor R5 and the capacitor C1 are connected in parallel, with one end of the parallel node connected to the negative input terminal of the operational amplifier U1, and the other end connected to the output terminal of the operational amplifier U1.

[0084] In this technical solution, resistors R2, R3, R4, R5, capacitor C1, and an operational amplifier form a conditioning unit to raise the AC voltage signal to above 0V.

[0085] The filter unit includes a resistor R6, which is connected to the output of the operational amplifier. The resistor R6 is also connected to the capacitor C2 and the AD pin of the microcontroller. The other end of the capacitor C2 is grounded. That is, the node of the resistor R6 and capacitor C2 connected in series is connected to the AD pin of the microcontroller.

[0086] On this basis, this embodiment also proposes an AC switch test method, referring to Figure 3 , which mainly includes the following steps.

[0087] The computer host starts running the test program, and the communication between the high-speed acquisition module, programmable power supply A and programmable power supply B completes the equipment self-test.

[0088] After completing the self-test, two threads are started at the same time, namely the input state simulation thread and the output state acquisition thread, and the two threads are executed in parallel.

[0089] For the input state simulation thread, it mainly simulates the normal working state of the AC switch and the abnormal working state of each line based on the programmable power supply A and the programmable power supply B and outputs the working voltage.

[0090] It mainly includes the following processes.

[0091] In step S100, both the programmable power supply A and the programmable power supply B output normal working voltage and wait according to the set time. Specifically, this process simulates the normal working state of the AC switcher. The programmable power supply B and the programmable power supply A output the working voltage according to the voltage value set in the test program and wait according to the time set in the program.

[0092] In step S200, the programmable power supply A maintains the state, the programmable power supply B outputs an abnormal voltage, and waits according to the set time; specifically, the abnormal working state of the AC switch input B is simulated; the programmable power supply A maintains the previous state, the programmable power supply B outputs an abnormal voltage according to the voltage value set in the test program, and waits according to the time set in the program.

[0093] In step S300, the programmable power supply A maintains the state, the programmable power supply B outputs the normal working voltage, and waits according to the set time; specifically, the normal working state of the simulated AC switch is maintained, the programmable power supply A maintains the previous state, the programmable power supply B outputs the working voltage according to the voltage value set in the test program, and waits according to the time set in the program.

[0094] In step S400, programmable power supply A outputs an abnormal voltage, while programmable power supply B maintains its state and waits for a set time. Specifically, the system simulates an abnormal operating state of input A of the AC switch. Programmable power supply B maintains its previous state, while programmable power supply A outputs an abnormal voltage according to the voltage value set in the test program and waits for a set time.

[0095] After the line ends, the output status collection thread is notified that it can end.

[0096] For the output state acquisition thread, the process is as follows: the high-speed acquisition module continuously acquires the output voltage value of the AC switch until receiving the end notification of the input state simulation thread.

[0097] Finally, the AC switcher is tested based on the voltage values ​​collected during the output state, and the test results are recorded. Specifically, the voltage values ​​collected during the output state are evaluated. If these voltage values ​​do not fluctuate abnormally within a fixed period, the AC switcher passes the test. If these voltage values ​​fluctuate abnormally within a fixed period, the test is abnormal.

[0098] In this technical solution, whether the AC switch test is qualified is determined by judging whether all voltage values ​​have no abnormal fluctuations.

[0099] Finally, it should be noted that the above embodiments are intended only to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the embodiments, it should be understood by those skilled in the art that modifications or equivalent substitutions to the technical solutions of the present invention do not depart from the spirit and scope of the technical solutions of the present invention and are intended to be encompassed by the claims of the present invention.

Claims

1. An AC switch test system, characterized in that: The invention comprises a computer host (1) and a high-speed acquisition module (2) connected to the computer host (1), wherein the high-speed acquisition module (2) can monitor the output state of an AC switch in real time, the other end of the high-speed acquisition module (2) is connected to a test docking terminal (5), and a program-controlled power supply A (4) and a program-controlled power supply B (3) are further connected between the computer host (1) and the test docking terminal (5), wherein the program-controlled power supply A (4) and the program-controlled power supply B (3) can simulate the working state of the AC switch when the grid voltage fluctuates.

2. The AC switch test system according to claim 1, characterized in that: The input interface of the high-speed acquisition module (2) is connected to the test docking terminal (5) to achieve output acquisition, and the output interface of the high-speed acquisition module (2) is connected to the computer host (1).

3. An AC switch test system according to claim 1 or 2, characterized in that: The input interfaces of the programmable power supply A (4) and the programmable power supply B (3) are connected to the test docking terminal to provide input excitation for the AC switcher, and the output interfaces of the programmable power supply A (4) and the programmable power supply B (3) are connected to the computer host (1).

4. An AC switch test system according to claim 1 or 2, characterized in that: The high-speed acquisition module (2) comprises an AC voltage conditioning circuit and an acquisition body, the AC voltage conditioning circuit comprises a scaling unit, the scaling unit is connected to a signal conditioning unit, the signal conditioning unit is connected to a filtering unit, and the filtering unit is connected to a single-chip microcomputer of the acquisition body.

5. The AC switch test system according to claim 4, characterized in that: The scaling unit includes an AC transformer and a resistor R1 connected in parallel with a coil on one side of the AC transformer. One end of the resistor R1 is connected to the signal conditioning unit, and the other end of the resistor R1 is grounded.

6. The AC switch test system according to claim 5, characterized in that: The signal conditioning unit includes a resistor R2, which is connected to the negative input terminal of the operational amplifier. The positive input terminal of the operational amplifier is respectively connected to resistors R3 and R4. The other end of the resistor R3 is grounded, and the other end of the resistor R4 is connected to a power supply. A resistor R5 and a capacitor C1 are arranged and connected in parallel between the negative input terminal and the output terminal of the operational amplifier.

7. The AC switch test system according to claim 6, characterized in that: The filtering unit includes a resistor R6 connected to the output end of the operational amplifier. The resistor R6 is respectively connected to the capacitor C2 and the AD pin of the single chip computer. The other end of the capacitor C2 is grounded.

8. An AC switch test method, applicable to an AC switch test system according to any one of claims 1 to 7, characterized in that: The following steps are involved: The host computer starts testing, and the high-speed acquisition module, programmable power supply A, and programmable power supply B perform communication self-test; The input state simulation thread and the output state acquisition thread are executed in parallel; the input state simulation thread uses programmable power supply A and programmable power supply B to simulate the normal working state of the AC switch and the abnormal working state of each line and output the working voltage; Output state acquisition thread: The high-speed acquisition module continuously acquires the output voltage value of the AC switch until receiving the end notification of the input state simulation thread; Determine whether the AC switch is qualified based on the voltage value collected from the output state, and record the test results.

9. The AC switch testing method according to claim 8, characterized in that: The input state simulation thread specifically includes: S100: Both programmable power supply A and programmable power supply B output normal operating voltage and wait for the set time. S200: Programmable power supply A maintains its state, programmable power supply B outputs abnormal voltage, and waits for the set time; S300: Programmable power supply A maintains its state, and programmable power supply B outputs normal operating voltage and waits for the set time. S400, programmable power supply A outputs abnormal voltage, programmable power supply B maintains the status and waits according to the set time.

10. An AC switch testing method according to claim 8 or 9, characterized in that: The determining whether the AC switch is qualified according to the voltage value collected from the output state specifically includes: The voltage values ​​collected from the output state are judged. If all voltage values ​​do not fluctuate abnormally, the AC switch test is qualified; otherwise, the AC switch test is abnormal.

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