Testing device

Abstract

The invention relates to the technical field of mainboard testing, and discloses a testing device, which is applied to testing of a mainboard to be tested, and comprises a host in which testing information corresponding to the mainboard to be tested is stored, and standard testboard information and standard mainboard information corresponding to the mainboard to be tested are also stored; the test board is provided with a to-be-tested station, and the test board is in communication connection with the host; the control panel is respectively in communication connection with the test board and the host, the control panel is used for collecting to-be-tested mainboard information of the to-be-tested mainboard, the control panel is also used for collecting test board information of the test board, and when the test board information corresponds to the standard test board information and the to-be-tested mainboard information corresponds to the standard to-be-tested mainboard information, the to-be-tested mainboard information corresponds to the standard to-be-tested mainboard information. And the control panel controls the host to send the test information to the test board, and when the test board receives the test information, the test board tests the mainboard to be tested. In this way, the test accuracy and the test efficiency are effectively improved.

Description

Technical Field

[0001] The present invention relates to the technical field of motherboard testing, and in particular to a testing device. Background Art

[0002] Motherboard testing is the process of comprehensively inspecting and evaluating a computer's motherboard. The motherboard is one of the core components of a computer, responsible for connecting and supporting various hardware devices, such as the processor, memory, graphics card, and hard drive. The purpose of motherboard testing is to ensure the proper functioning and stability of the motherboard, thereby guaranteeing the performance and reliability of the computer system.

[0003] There are many types of existing motherboard testing systems. Different test systems have different locations for inputting basic information required for testing. The basic information required for these tests includes the model and type of the motherboard and the test program corresponding to the motherboard, etc. It is inevitable that errors will occur when entering this cumbersome information, resulting in a mismatch between the motherboard to be tested and the test program, which greatly affects the efficiency and accuracy of the test. Summary of the Invention

[0004] The purpose of the present invention is to provide a testing device to solve the deficiencies in the background technology and effectively improve the testing accuracy.

[0005] To achieve the above object, the present invention provides the following technical solutions: A test device is used for testing a motherboard to be tested, comprising: a host, wherein the host stores test information corresponding to the motherboard to be tested, and also stores standard test bench information and standard motherboard information corresponding to the motherboard to be tested; a test bench having a test station to be tested, wherein the test bench is communicatively connected to the host; and a control board, which is communicatively connected to the test bench and the host respectively, wherein the control board is used to collect a motherboard to be tested information of the motherboard to be tested, and the control board is also used to collect a test bench information of the test bench, wherein when the test bench information When the information of the motherboard to be tested corresponds to the standard test bench information and corresponds to the standard motherboard to be tested information, the control board controls the host to send the test information to the test bench. When the test bench information does not correspond to the standard test bench information, the control board sends a test bench information error signal to the host. When the information of the motherboard to be tested does not correspond to the standard motherboard to be tested information, the control board sends a motherboard information error signal to the host. When the test bench receives the test information, the test bench tests the motherboard to be tested.

[0006] Preferably, the information of the motherboard to be tested, the test bench information, the standard test bench information and the standard motherboard information are all configured using a CFG format file and then stored in a memory of the host.

[0007] Preferably, the control board is mounted on the test bench, and a scanning mechanism is provided on the control board. The scanning mechanism is arranged near the position of the test station, and the scanning mechanism is used to identify the test motherboard information on the test motherboard.

[0008] Preferably, the scanning mechanism is a barcode scanner or a camera.

[0009] Compared with the prior art, the beneficial effect of the present invention is: through the above-mentioned method, when the information of the motherboard to be tested corresponds to the information of the standard motherboard to be tested, and the test bench information corresponds to the standard test bench information, it is possible to automatically add test information to the current motherboard to be tested, thereby avoiding the situation where the motherboard to be tested is tested with an incorrect test program, and effectively improving the test efficiency and test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 The schematic diagram of the test device. DETAILED DESCRIPTION

[0011] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0012] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0013] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as limiting the present invention.

[0014] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0015] The present invention provides a testing device 100, which is applied to the testing of a motherboard to be tested, and includes a host 101, a test bench 102 and a control board 103. The test bench 102 having a test station is connected to the host 101 in communication, and the control board 103 is connected to the test bench 102 and the host 101 in communication. The host 101 can be a computer or other mobile terminal. Assuming that the host 101 is a computer, the computer pre-stores a test information corresponding to the motherboard to be tested in its own memory, and also stores a test information corresponding to the motherboard to be tested. The control board 103 is used to collect the motherboard information to be tested of the motherboard to be tested, and the control board 103 is also used to collect the test bench 102 information of the test bench 102. When the test bench 102 information corresponds to the standard test bench 102 information and the motherboard information to be tested corresponds to the standard motherboard information to be tested, the control board 103 controls the host 101 to send the test information to the test bench 102. After receiving the test information, the test bench 102 tests the motherboard to be tested. In other words, only when the above information corresponds one to one will the host 101 send the test information for testing the motherboard to be tested to the test bench 102 for testing the motherboard to be tested. If any of the information is asymmetric, the next step of testing cannot be carried out. This greatly avoids the situation where the test information does not correspond to the motherboard to be tested, and well solves the shortcomings existing in the background technology, effectively improving the test quality and test efficiency.

[0016] In addition, when the test bench information does not correspond to the standard test bench information, the control board 103 sends a test bench information error signal to the host 101, and the host 101 can send a warning audio through a buzzer or a speaker to remind the user that the current test bench information does not correspond to the standard test bench information; similarly, when the motherboard information to be tested does not correspond to the standard motherboard information to be tested, the control board 103 sends a motherboard information error signal to the host 101, and the host 101 can send a warning audio through a buzzer or a speaker to remind the user that the current motherboard information to be tested does not correspond to the standard motherboard information to be tested. In the above manner, when information mismatch occurs, the current user can be quickly notified, so that the test bench 102 or the motherboard to be tested can be processed in time, thereby improving test efficiency.

[0017] Next, the test information includes a test program corresponding to the current motherboard to be tested. After obtaining the information of the motherboard to be tested, the test information will only be sent to the test bench 102 and the test bench 102 will test the current motherboard to be tested only when the current test bench 102 information and the motherboard to be tested information are respectively the same as the standard test bench 102 information and the standard motherboard information.

[0018] As a preferred embodiment, the information of the motherboard to be tested, the information of the test bench 102, the information of the standard test bench 102 and the standard motherboard information are all set using a CFG format file and stored in a memory of the host 101. A file in the CFG format is a configuration file, which is usually used to store configuration information of a program or system. A CFG file can contain various parameters, options and settings for configuring the behavior of the software or system. For example, when the operator is setting the information of the standard test bench 102, the operator can enter the information of the standard test bench 102, such as the category and model of the test bench 102, in a specific format in the CFG file. After the above information is set, it will be stored in the memory of the host 101 in the form of CFG format for subsequent retrieval and use.

[0019] As another preferred embodiment, the control board 103 is installed on the test bench 102, and a scanning mechanism is provided on the control board 103. The scanning mechanism is provided near the position of the test station, and the scanning mechanism is used to identify the information of the motherboard to be tested on the motherboard to be tested. Furthermore, the scanning mechanism is a barcode scanner or a camera. In this way, the information of the motherboard to be tested can be quickly identified. When the information of the test bench 102 corresponds to the information of the standard test bench 102 and the information of the motherboard to be tested corresponds to the information of the standard motherboard to be tested, the control board 103 controls the host 101 to send the test information to the test bench 102. After receiving the test information, the test bench 102 tests the motherboard to be tested.

[0020] To sum up, through the above method, when the information of the motherboard to be tested corresponds to the information of the standard motherboard to be tested, and the information of the test bench 102 corresponds to the information of the standard test bench 102, the test information of the current motherboard to be tested can be automatically added, avoiding the situation of testing the motherboard to be tested with an incorrect test program, and effectively improving the test efficiency and test accuracy.

[0021] Based on the disclosure and teachings of the above description, those skilled in the art may also make changes and modifications to the above embodiments. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and modifications and variations of the present invention should also fall within the scope of protection of the claims of the present invention. In addition, although certain specific terms are used in this description, these terms are only for convenience of description and do not constitute any limitation to the present invention.

Claims

1. A testing device, used for testing a motherboard to be tested, characterized in that: include: A host computer, wherein the host computer stores test information corresponding to the motherboard to be tested, and also stores standard test bench information and standard motherboard information corresponding to the motherboard to be tested; A test bench having a station to be tested, the test bench being communicatively connected to the host; and A control board is respectively connected to the test bench and the host for communication, the control board is used to collect a motherboard information of the motherboard to be tested, and the control board is also used to collect a test bench information of the test bench, When the test bench information corresponds to the standard test bench information and the motherboard information to be tested corresponds to the standard motherboard information to be tested, the control board controls the host to send the test information to the test bench. When the test bench information does not correspond to the standard test bench information, the control board sends a test bench information error signal to the host. When the information of the motherboard to be tested does not correspond to the information of the standard motherboard to be tested, the control board sends a motherboard information error signal to the host. When the test bench receives the test information, the test bench tests the motherboard to be tested.

2. The testing device according to claim 1, wherein: The information of the motherboard to be tested, the information of the test bench, the information of the standard test bench and the information of the standard motherboard are all set using a file in a CFG format and then stored in a memory of the host.

3. The testing device according to claim 1, wherein: The control board is mounted on the test bench, and a scanning mechanism is provided on the control board. The scanning mechanism is provided near the position of the test station, and is used to identify the test motherboard information on the test motherboard.

4. The testing device according to claim 4, characterized in that The scanning mechanism is a barcode scanning gun or a camera.

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