Neutral beam injection one-shot experiment beam source system ignition analysis method and system
By adopting the bidirectional diffusion method in the neutral beam injection single-shot experimental beam source system, combining upward and downward analysis, and using historical experimental data to calculate the priority coefficient, the problem of incomplete fault tree analysis in the existing technology is solved, and a comprehensive and accurate analysis of large-scale system faults is achieved.
Patent Information
- Application Number
- CN202510755083.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-06
- Publication Date
- 2025-09-16
AI Technical Summary
In the existing technology, the fault tree drawing method has limitations in analyzing large systems such as the neutral beam injection single-shot experiment beam source system, making it difficult to fully identify the cause of the fault, resulting in incomplete analysis.
The bidirectional diffusion method is combined with upward analysis and downward analysis. Through the fault tree construction method, the ignition event of the beam source system of the first shot experiment is set as the top event. The priority coefficient is calculated based on the historical experimental data to ensure the accurate positioning of the high-level fault path and the underlying fault cause.
It achieves a comprehensive analysis of large-scale system failures, avoids inaccurate judgment of intermediate events and omission of some failure causes, and ensures the thoroughness and accuracy of failure analysis.
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Abstract
Description
Technical Field
[0001] The invention belongs to the field of negative ion source neutral beam injection experimental analysis, in particular to a neutral beam injection one-shot experimental beam source system ignition analysis method and system. Background Art
[0002] Neutral beam injection (NNBI) technology is a commonly used heating method in nuclear fusion research and is widely used in experimental devices such as tokamaks. NNBI accelerates ions and converts them into neutral beams for injection into plasma, heating the plasma and thus increasing the plasma temperature and promoting nuclear fusion reactions. As an efficient plasma heating method, NNBI technology is crucial to nuclear fusion experiments. However, during the experimental process, the reliability of the system directly affects the success rate and stability of the experimental results. Among the many causes of experimental sparks, beam source sparks are the most common.
[0003] The beam source system is a key subsystem of the NNBI. Its overall function is to produce a high-energy particle beam of a certain beam quality. The performance of the beam source system determines the performance of the entire system. A one-shot experiment simulates the entire process of negative ion generation, acceleration, neutralization, and plasma injection in a single pulse to test beam performance and heating effectiveness. This one-shot experiment provides data support for neutral beam injection and heating.
[0004] During a single-shot experiment, sparks can occur for a variety of reasons, but the most common cause is related to the beam source. The quality of the beam source system directly determines the experimental effectiveness and neutral beam energy yield. Therefore, establishing a fault tree for sparks in the beam source system is imperative for system analysis. However, the beam source system model is relatively large, with numerous and complex connections between various subsystems. Conventional fault tree drawing methods are difficult to meet the requirements of such a complex system, making a fault tree drawing method for complex systems particularly important.
[0005] The fault tree drawing methods used in the existing technology for experimental fault analysis are usually the downward method and the upward method, but for large systems, these two methods have certain limitations. First, the information they consider when drawing is relatively one-sided, and the analysis process is relatively loose, which is difficult to apply to large systems. Second, when analyzing the system, the intermediate events are most easily encountered, but in most cases it is difficult to accurately determine whether they are intermediate events. If only the upward method or the downward method is used, some fault causes may be missed, resulting in incomplete analysis of the experimental fault.
[0006] Therefore, the present invention proposes a method and system for analyzing the ignition of a beam source system in a neutral beam injection single shot experiment to solve the above problems. Summary of the Invention
[0007] The present invention aims to solve at least one of the technical problems existing in the prior art; to this end, the present invention proposes a method and system for analyzing the ignition of a neutral beam injection single-shot experimental beam source system, which is used to solve the fault tree drawing methods adopted in the prior art for experimental fault analysis, which are usually the downward method and the upward method, but for large systems, these two methods have certain limitations; first, the information considered when drawing is relatively one-sided, and the analysis process is relatively loose, which is difficult to apply to large systems; second, when analyzing the system, the intermediate event is most easily encountered, but in most cases it is difficult to accurately determine whether it is an intermediate event. If only the upward method or the downward method is used, some fault causes may be missed, thereby resulting in an incomplete analysis of the experimental fault.
[0008] To achieve the above-mentioned object, a first aspect of the present invention provides a method for analyzing ignition of a beam source system in a neutral beam injection single shot experiment, comprising:
[0009] Construct a fault tree for the target experimental system; wherein the target experimental system refers to the beam source system;
[0010] Analyze the current fault event based on the fault tree to obtain the upper-layer fault type and lower-layer fault type corresponding to the current fault event;
[0011] The priority coefficient of each event in the upper-layer fault type and the lower-layer fault type is calculated based on historical experimental data;
[0012] Process the current fault event based on the priority coefficient.
[0013] Preferably, constructing a fault tree of the target experimental system includes:
[0014] Set the ignition event of the beam source system of the first shot experiment as the top event of the fault tree;
[0015] Obtain the error type of the target experimental system based on historical experimental records;
[0016] By analyzing each fault type in the reported fault type, the upper layer event or lower layer event corresponding to the fault type is obtained;
[0017] Each fault type and the upper-layer events and lower-layer events corresponding to each fault type are integrated to generate a fault tree.
[0018] It should be noted that the historical experiment record refers to the record of the historical experimental process of a shot experiment; the error fault type refers to the fault type reported when a beam source system fails;
[0019] The upper-level event refers to a fault event located above the current event (closer to the top event) in the fault tree; it is a higher-level cause or associated system-level fault that causes the current event;
[0020] The lower-level event refers to a fault event located below the current event (closer to the bottom event) in the fault tree; it is a specific sub-cause of the current event or a bottom-level component failure.
[0021] Preferably, analyzing each fault type in the error reporting fault type includes:
[0022] Mark each fault type in the error fault type as the initial event;
[0023] Perform upward analysis based on the initial event to obtain the upper-level event corresponding to the fault type;
[0024] Based on the initial event, downward analysis is performed to obtain the lower-level events corresponding to the fault type.
[0025] Preferably, the upward analysis method includes:
[0026] A1: Based on the target experimental system structure diagram or functional module division, determine the upper-level subsystem to which the initial event belongs;
[0027] A2: Determine whether the upper-level subsystem is the target experimental system. If yes, the upper-level event of the initial event is the top event, and the upward analysis stops. If no, determine the fault event of the upper-level subsystem to which the initial event belongs based on historical experimental records.
[0028] A3: Update the initial event in step A1 to the fault event of the upper-level subsystem and repeat steps A1-A2 until the upper-level subsystem is the target experimental system.
[0029] It should be noted that determining the upper-level subsystem to which the initial event belongs means clarifying the position of the initial event in the system hierarchy through the system structure diagram or functional module division to ensure the accuracy of the starting point of upward analysis. For example, determining that the upper-level subsystem of "RF exciter ignition" is the plasma generator.
[0030] Preferably, the downward analysis method includes:
[0031] B1: Based on the target experimental system structure diagram or functional module division, determine the subunits of the component to which the initial event belongs;
[0032] B2: Determine whether the component to which the initial event belongs is the smallest unit; if so, the initial event is the bottom event in the fault tree, and the downward analysis stops; if not, extract several subunits of the component to which the initial event belongs, and obtain the fault events of several subunits when the initial event occurs based on historical experimental records;
[0033] B3: Update the fault events of several sub-units to new initial events, and return to step B2 until the component to which the initial event belongs is the smallest unit.
[0034] It should be noted that determining the number of sub-units of the component to which the initial event belongs refers to dividing the component corresponding to the fault event (initial event) currently to be analyzed into smaller sub-components or functional modules that can be further analyzed according to the physical structure or functional module of the target experimental system; for example, the component to which the RF exciter ignition belongs is the RF exciter, and its sub-units are matching capacitors, waveguide tubes, RF coils, etc.
[0035] Preferably, the analyzing the current fault event based on the fault tree includes:
[0036] Extract the current fault event and obtain the upper-level fault type and lower-level fault type corresponding to the current fault event based on the fault tree; the upper-level fault type refers to the set of upper-level fault events connected to the current fault event in the fault tree; the lower-level fault type refers to the set of lower-level fault events connected to the current fault event in the fault tree.
[0037] Preferably, the priority coefficient of each event in the upper layer fault type and the lower layer fault type is calculated based on historical experimental data, including:
[0038] Based on historical experimental data, the total number of failures in a shot experiment within a preset time period and the processing time of each failure are obtained;
[0039] By formula The priority coefficient of each event in the upper-layer fault type and the lower-layer fault type is calculated; where Pi is the priority coefficient corresponding to the i-th event, i is the sequence number of each event in the upper-layer fault type and the lower-layer fault type, i = {1, 2, 3…, N}, and N is the total number of events in the upper-layer fault type and the lower-layer fault type; α and β are weight coefficients; L is the total number of faults occurring in a shot experiment within a preset time period, Gi is the number of times the i-th event occurs in the total number of faults occurring in a shot experiment; Ti is the processing time when the i-th event occurs.
[0040] It should be noted that the weight coefficient is set by those skilled in the art based on practical experience;
[0041] The higher the frequency of failure events, the greater the risk of recurrence and the more significant the systemic hidden dangers; the longer the processing time, the higher the complexity of the repair and the longer the impact on system operation; therefore, high frequency and long processing time together amplify the threat of failures to system stability, and the priority needs to be increased accordingly to prioritize intervention to avoid cumulative risks leading to larger-scale failures or cascading failures.
[0042] Preferably, the processing of the current fault event based on the priority coefficient includes:
[0043] Extract the priority coefficient of each event in the upper-layer fault type and lower-layer fault type corresponding to the current fault event;
[0044] Sort the priority coefficients in descending order to generate a priority sequence;
[0045] Each event in the upper-layer fault type and lower-layer fault type corresponding to the current fault event is checked in sequence according to the priority sequence.
[0046] A second aspect of the present invention provides a neutral beam injection one-shot experimental beam source system spark analysis system, comprising: a fault tree construction module, a data analysis module and a processing module;
[0047] Fault tree construction module: used to construct the fault tree of the target experimental system;
[0048] Data analysis module: used to analyze the current fault event based on the fault tree to obtain the upper-layer fault type and lower-layer fault type corresponding to the current fault event;
[0049] Processing module: used to calculate the priority coefficient of each event in the upper-layer fault type and the lower-layer fault type based on historical experimental data; and process the current fault event based on the priority coefficient.
[0050] Preferably, the data analysis module is in communication and / or electrically connected with the fault tree construction module and the processing module respectively.
[0051] Compared with the prior art, the present invention has the following beneficial effects:
[0052] The fault tree drawing methods used in the prior art for experimental fault analysis are usually the downward method and the upward method, but for large systems, these two methods have certain limitations; first, the information they consider when drawing is relatively one-sided, and the analysis process is relatively loose, which is difficult to apply to large systems; second, when analyzing the system, the intermediate events are most easily accessible, but in most cases it is difficult to accurately determine whether they are intermediate events. If only the upward method or the downward method is used, some fault causes may be missed, resulting in incomplete analysis of the experimental fault; the present invention completely solves the limitation problem of the existing fault tree analysis method in large system fault diagnosis through the "bidirectional diffusion method", by setting the experimental system ignition event as the top event, and then using A unique combination of upward analysis and downward analysis: upward analysis traces the fault event's upper subsystem layer by layer through the system structure diagram to the top event, ensuring that no high-level fault propagation path is missed; downward analysis is based on system component decomposition and sub-unit inspection to accurately identify the underlying fault cause; through this two-way diffusion mechanism, it avoids the one-way analysis defects of the existing upward or downward methods, and solves the problem of inaccurate judgment of intermediate events; at the same time, the present invention introduces a priority coefficient calculation model based on historical experimental data, comprehensively considering key factors such as fault frequency and processing time, and realizes intelligent sorting and precise processing of fault events, thereby ensuring the comprehensiveness and thoroughness of complex system fault analysis and effectively preventing the omission of key fault causes. BRIEF DESCRIPTION OF THE DRAWINGS
[0053] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0054] Figure 1 Schematic diagram of the method steps of an embodiment of the present invention;
[0055] Figure 2 Schematic diagram of system modules according to an embodiment of the present invention. DETAILED DESCRIPTION
[0056] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.
[0057] See also Figure 1The first embodiment of the present invention provides a method for analyzing sparking of a beam source system in a neutral beam injection shot experiment, comprising:
[0058] Construct a fault tree for the target experimental system; wherein the target experimental system refers to the beam source system;
[0059] Analyze the current fault event based on the fault tree to obtain the upper-layer fault type and lower-layer fault type corresponding to the current fault event;
[0060] The priority coefficient of each event in the upper-layer fault type and the lower-layer fault type is calculated based on historical experimental data;
[0061] Process the current fault event based on the priority coefficient.
[0062] Construct a fault tree for the target experimental system, including:
[0063] Set the ignition event of the beam source system of the first shot experiment as the top event of the fault tree;
[0064] Obtain the error type of the target experimental system based on historical experimental records;
[0065] By analyzing each fault type in the reported fault type, the upper layer event or lower layer event corresponding to the fault type is obtained;
[0066] Each fault type and the upper-layer events and lower-layer events corresponding to each fault type are integrated to generate a fault tree.
[0067] By analyzing each fault type in the error fault type, including:
[0068] Mark each fault type in the error fault type as the initial event;
[0069] Perform upward analysis based on the initial event to obtain the upper-level event corresponding to the fault type;
[0070] Based on the initial event, downward analysis is performed to obtain the lower-level events corresponding to the fault type.
[0071] Upward analysis methods include:
[0072] A1: Based on the target experimental system structure diagram or functional module division, determine the upper-level subsystem to which the initial event belongs;
[0073] A2: Determine whether the upper-level subsystem is the target experimental system. If yes, the upper-level event of the initial event is the top event, and the upward analysis stops. If no, determine the fault event of the upper-level subsystem to which the initial event belongs based on historical experimental records.
[0074] A3: Update the initial event in step A1 to the fault event of the upper-level subsystem and repeat steps A1-A2 until the upper-level subsystem is the target experimental system.
[0075] Downward analysis methods include:
[0076] B1: Based on the target experimental system structure diagram or functional module division, determine the subunits of the component to which the initial event belongs;
[0077] B2: Determine whether the component to which the initial event belongs is the smallest unit; if so, the initial event is the bottom event in the fault tree, and the downward analysis stops; if not, extract several subunits of the component to which the initial event belongs, and obtain the fault events of several subunits when the initial event occurs based on historical experimental records;
[0078] B3: Update the fault events of several sub-units to new initial events, and return to step B2 until the component to which the initial event belongs is the smallest unit.
[0079] Analyze the current fault event based on the fault tree, including:
[0080] Extract the current fault event and obtain the upper-level fault type and lower-level fault type corresponding to the current fault event based on the fault tree; the upper-level fault type refers to the set of upper-level fault events connected to the current fault event in the fault tree; the lower-level fault type refers to the set of lower-level fault events connected to the current fault event in the fault tree.
[0081] The priority coefficients of each event in the upper-layer fault type and lower-layer fault type are calculated based on historical experimental data, including:
[0082] Based on historical experimental data, the total number of failures in a shot experiment within a preset time period and the processing time of each failure are obtained;
[0083] By formula The priority coefficient of each event in the upper-layer fault type and the lower-layer fault type is calculated; where Pi is the priority coefficient corresponding to the i-th event, i is the sequence number of each event in the upper-layer fault type and the lower-layer fault type, i = {1, 2, 3…, N}, and N is the total number of events in the upper-layer fault type and the lower-layer fault type; α and β are weight coefficients; L is the total number of faults occurring in a shot experiment within a preset time period, Gi is the number of times the i-th event occurs in the total number of faults occurring in a shot experiment; Ti is the processing time when the i-th event occurs.
[0084] Process the current fault event based on the priority coefficient, including:
[0085] Extract the priority coefficient of each event in the upper-layer fault type and lower-layer fault type corresponding to the current fault event;
[0086] Sort the priority coefficients in descending order to generate a priority sequence;
[0087] Each event in the upper-layer fault type and lower-layer fault type corresponding to the current fault event is checked in sequence according to the priority sequence.
[0088] For example, suppose a nuclear fusion laboratory experiences a "RF exciter ignition" failure in the beam source system during a "one-shot experiment." An analysis is required, as follows:
[0089] 1. Build a fault tree;
[0090] Step 1: Define the top event;
[0091] Top event: The first experimental beam source system was ignited.
[0092] Step 2: Get historical fault types;
[0093] Extract the error fault types related to the beam source system from historical experimental data, such as RF exciter sparking, extraction electrode sparking, and accelerating electrode overheating.
[0094] Step 3: Initial incident analysis;
[0095] Initial event: RF exciter sparks (current fault event).
[0096] Upward analysis:
[0097] 1. Determine the upper-level subsystem: According to the system structure diagram, the RF exciter belongs to the plasma generator subsystem.
[0098] 2. Tracing back to the top event: The plasma generator subsystem belongs to the beam source system (top event).
[0099] 3. Logical path:
[0100] Beam source system ignition (top event) → plasma generator ignition (upper intermediate event) → RF exciter ignition (current event);
[0101] Downward analysis:
[0102] 1. Decomposition of sub-units: The RF exciter includes matching capacitors, waveguide coils, RF coils and other components.
[0103] 2. Identify bottom events: matching capacitor error (bottom event), waveguide coil interference (bottom event), and RF coil sparking (secondary intermediate event). RF coil sparking can be further decomposed into uneven coil cooling (bottom event) and insulation wear (bottom event).
[0104] Complete fault tree structure:
[0105] Beam source system sparks → plasma generator sparks → RF exciter sparks → matching capacitor error or waveguide interference or RF coil sparks;
[0106] RF coil sparking → uneven coil cooling and insulation wear.
[0107] 2. Calculate the priority coefficient;
[0108] Data collection:
[0109] Total number of failures (L): In the past 100 experiments, the beam source system failed 20 times.
[0110] Current event data: as shown in Table 1;
[0111]
[0112]
[0113] Table 1
[0114] By formula Calculate the priority coefficient of each event;
[0115] Assume that the weight coefficients α = 0.6, β = 0.4;
[0116] Take "RF exciter ignition" as an example:
[0117] Substituting the data, we get Pi≈0.509;
[0118] The priority ranking of all events is as shown in Table 2;
[0119] event Priority coefficient (Pi) Insulation wear 0.621 RF exciter ignition 0.509 Uneven coil cooling 0.487 Waveguide interference 0.412 Matching capacitor error 0.358
[0120] Table 2
[0121] 3. Troubleshooting;
[0122] Priority sequence: Sort by priority coefficient from high to low and process them in sequence;
[0123] Processing flow:
[0124] 1. Prioritize checking insulation wear:
[0125] Check the thickness and wear of the RF coil insulation layer to determine whether the material needs to be replaced.
[0126] 2. Check if the RF exciter is sparking:
[0127] Test matching capacitance parameters and detect whether there is electromagnetic interference in the waveguide.
[0128] 3. Optimize the cooling system:
[0129] Adjust the cooling water flow to ensure uniform temperature distribution of the coil.
[0130] This embodiment uses a bidirectional diffusion method: upward analysis associates "RF exciter sparking" with the top event to ensure the completeness of the high-level fault path; downward analysis decomposes bottom events such as "uneven coil cooling" to avoid missing the root cause.
[0131] See Figure 2 , a second aspect of the present invention provides a neutral beam injection one-shot experimental beam source system spark analysis system, comprising: a fault tree construction module, a data analysis module and a processing module;
[0132] Fault tree construction module: used to construct the fault tree of the target experimental system;
[0133] Data analysis module: used to analyze the current fault event based on the fault tree to obtain the upper-layer fault type and lower-layer fault type corresponding to the current fault event;
[0134] Processing module: used to calculate the priority coefficient of each event in the upper-layer fault type and the lower-layer fault type based on historical experimental data; and process the current fault event based on the priority coefficient.
[0135] Some of the data in the above formula are calculated by removing the dimensions and taking their numerical values. The formula is a formula that is closest to the actual situation obtained by software simulation of a large amount of collected data; the preset parameters and preset thresholds in the formula are set by technical personnel in this field according to actual conditions or obtained through simulation of a large amount of data.
[0136] The above embodiments are only used to illustrate the technical method of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical method of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical method of the present invention.
Claims
1. A method for analyzing the sparking of a beam source system in a neutral beam injection single shot experiment, characterized in that: include: Construct a fault tree for the target experimental system; wherein the target experimental system refers to the beam source system; Analyze the current fault event based on the fault tree to obtain the upper-layer fault type and lower-layer fault type corresponding to the current fault event; The priority coefficient of each event in the upper-layer fault type and the lower-layer fault type is calculated based on historical experimental data; Process the current fault event based on the priority coefficient.
2. The method for analyzing sparking of a beam source system in a neutral beam injection single shot experiment according to claim 1, characterized in that: The constructing of the fault tree of the target experimental system includes: Set the ignition event of the beam source system of the first shot experiment as the top event of the fault tree; Obtain the error type of the target experimental system based on historical experimental records; By analyzing each fault type in the reported fault type, the upper layer event or lower layer event corresponding to the fault type is obtained; Each fault type and the upper-layer events and lower-layer events corresponding to each fault type are integrated to generate a fault tree.
3. The method for analyzing sparking of a beam source system in a neutral beam injection single shot experiment according to claim 2, characterized in that: The analysis of each fault type in the error reporting fault type includes: Mark each fault type in the error fault type as the initial event; Perform upward analysis based on the initial event to obtain the upper-level event corresponding to the fault type; Based on the initial event, downward analysis is performed to obtain the lower-level events corresponding to the fault type.
4. The method for analyzing sparking of a beam source system in a neutral beam injection single shot experiment according to claim 3, characterized in that: The upward analysis method includes: A1: Based on the target experimental system structure diagram or functional module division, determine the upper-level subsystem to which the initial event belongs; A2: Determine whether the upper-level subsystem is the target experimental system. If yes, the upper-level event of the initial event is the top event, and the upward analysis stops. If no, determine the fault event of the upper-level subsystem to which the initial event belongs based on historical experimental records. A3: Update the initial event in step A1 to the fault event of the upper-level subsystem and repeat steps A1-A2 until the upper-level subsystem is the target experimental system.
5. The method for analyzing sparking of a beam source system in a neutral beam injection single shot experiment according to claim 3, characterized in that: The downward analysis method includes: B1: Based on the target experimental system structure diagram or functional module division, determine the subunits of the component to which the initial event belongs; B2: Determine whether the component to which the initial event belongs is the smallest unit; if so, the initial event is the bottom event in the fault tree, and the downward analysis stops; if not, extract several subunits of the component to which the initial event belongs, and obtain the fault events of several subunits when the initial event occurs based on historical experimental records; B3: Update the fault events of several sub-units to new initial events, and return to step B2 until the component to which the initial event belongs is the smallest unit.
6. The method for analyzing sparking of a beam source system in a neutral beam injection single shot experiment according to claim 1, characterized in that: The analysis of the current fault event based on the fault tree includes: Extract the current fault event and obtain the upper-level fault type and lower-level fault type corresponding to the current fault event based on the fault tree; the upper-level fault type refers to the set of upper-level fault events connected to the current fault event in the fault tree; the lower-level fault type refers to the set of lower-level fault events connected to the current fault event in the fault tree.
7. The method for analyzing sparking of a beam source system in a neutral beam injection single shot experiment according to claim 1, characterized in that: The priority coefficient of each event in the upper layer fault type and the lower layer fault type is calculated based on historical experimental data, including: Based on historical experimental data, the total number of failures in a shot experiment within a preset time period and the processing time of each failure are obtained; By formula The priority coefficient of each event in the upper-layer fault type and the lower-layer fault type is calculated; where Pi is the priority coefficient corresponding to the i-th event, i is the sequence number of each event in the upper-layer fault type and the lower-layer fault type, i = {1, 2, 3…, N}, and N is the total number of events in the upper-layer fault type and the lower-layer fault type; α and β are weight coefficients; L is the total number of faults occurring in a shot experiment within a preset time period, Gi is the number of times the i-th event occurs in the total number of faults occurring in a shot experiment; Ti is the processing time when the i-th event occurs.
8. The method for analyzing sparking of a beam source system in a neutral beam injection single shot experiment according to claim 1, characterized in that: The processing of the current fault event based on the priority coefficient includes: Extract the priority coefficient of each event in the upper-layer fault type and lower-layer fault type corresponding to the current fault event; Sort the priority coefficients in descending order to generate a priority sequence; Each event in the upper-layer fault type and lower-layer fault type corresponding to the current fault event is checked in sequence according to the priority sequence.
9. A system for analyzing the sparking of a beam source system in a neutral beam injection single shot experiment, which executes the method for analyzing the sparking of a beam source system in a neutral beam injection single shot experiment according to any one of claims 1 to 8, characterized in that: include: Fault tree construction module, data analysis module and processing module; Fault tree construction module: used to construct the fault tree of the target experimental system; Data analysis module: used to analyze the current fault event based on the fault tree to obtain the upper-layer fault type and lower-layer fault type corresponding to the current fault event; Processing module: used to calculate the priority coefficient of each event in the upper-layer fault type and the lower-layer fault type based on historical experimental data; And, processing the current fault event based on the priority coefficient.
10. The ignition analysis system for a neutral beam injection single shot experiment beam source system according to claim 9, characterized in that: The data analysis module is in communication and / or electrically connected with the fault tree construction module and the processing module respectively.
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