Real-time monitoring method for microfermentation of high-temperature-resistant saccharomycetes

By analyzing the environmental and reactant parameters in the current yeast fermentation process, matching them with multiple sets of sample yeast data, and real-time monitoring and regulation of environmental parameters, the problems of monitoring lag and low accuracy in high-temperature resistant yeast micro-fermentation were solved, thereby improving fermentation efficiency and quality.

CN120656546AActive Publication Date: 2025-09-16TAIAN TAICHONG PET FOOD CO LTD
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Patent Information

Application Number
CN202511127321.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-08-13
Publication Date
2025-09-16
Estimated Expiration
2045-08-13

AI Technical Summary

Technical Problem

Existing real-time monitoring methods for thermostable yeast micro-fermentation have problems of monitoring hysteresis and low accuracy, which affect fermentation efficiency and quality.

Method used

By obtaining the current environmental parameters and reactant parameter sequences, combining the fermentation data of multiple groups of sample yeasts, analyzing the differences and degree of change, matching fermentation sub-time periods and environmental sequences are obtained, and abnormal characterization values ​​are used for real-time monitoring and regulation.

Benefits of technology

The timeliness and accuracy of real-time monitoring of the thermostable yeast micro-fermentation process are improved, and the stability and quality of the fermentation process are improved.

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Patent Text Reader

Abstract

The invention relates to the technical field of yeast fermentation monitoring, in particular to a real-time monitoring method for microfermentation of high-temperature-resistant yeast. The method comprises the following steps: obtaining a matched fermentation sub-time period of a monitoring time period under each sample yeast, and obtaining a matched environment sequence corresponding to a current target environment parameter sequence under each sample yeast according to the matched fermentation sub-time period of the monitoring time period and a sample target environment parameter sequence; according to the deviation between the current target environment parameter sequence and a matching environment sequence corresponding to the current target environment parameter sequence and the fermentation quality score, obtaining an abnormal characterization value of each environment parameter type at the current fermentation monitoring moment; monitoring the environmental parameters of the target yeast at the current fermentation monitoring moment according to the abnormal characterization value; and the timeliness and the accuracy of real-time monitoring of the microfermentation process of the high-temperature-resistant saccharomycetes can be improved, so that the stability and the fermentation quality of the fermentation process can be improved.
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Description

Technical Field

[0001] The present invention relates to the technical field of yeast fermentation monitoring, and in particular to a method for real-time monitoring of thermostable yeast micro-fermentation. Background Art

[0002] During the micro-fermentation process, thermotolerant yeast is not only sensitive to changes in environmental parameters, as even slight fluctuations in environmental parameters such as temperature and oxygen intake may affect its metabolic pathway and product quality, but thermotolerant yeast also has different requirements for the environment at different fermentation stages. For example, in the early stages of fermentation, higher dissolved oxygen and temperature may be required to promote rapid bacterial proliferation, while in the later stages of fermentation, the temperature and oxygen supply may need to be lowered to inhibit the formation of by-products and optimize product quality. Therefore, in order to ensure the stability of the fermentation process and product quality, real-time monitoring of environmental parameters during the micro-fermentation of thermotolerant yeast is crucial.

[0003] The existing real-time monitoring of micro-fermentation of high-temperature resistant yeast is generally achieved based on the environmental parameters monitored in real time during fermentation. However, this method of real-time monitoring of the micro-fermentation process of high-temperature resistant yeast based only on the current environmental parameters monitored in real time will have problems of monitoring hysteresis and low monitoring accuracy. When there are problems of monitoring hysteresis and low monitoring accuracy, it will affect the accuracy of subsequent regulation of environmental parameters, thereby causing the fermentation efficiency of high-temperature resistant yeast to be slower or the fermentation quality to be poor. Therefore, how to improve the timeliness and accuracy of real-time monitoring of the micro-fermentation process of high-temperature resistant yeast has become an urgent problem to be solved. Summary of the Invention

[0004] In order to solve the above problems, the present invention provides a method for real-time monitoring of thermostable yeast micro-fermentation, and the technical solutions adopted are as follows: One embodiment of the present invention provides a method for real-time monitoring of thermostable yeast microfermentation, comprising the following steps: Obtaining, during a monitoring period at a current fermentation monitoring moment of the target yeast, current target environmental parameter sequences corresponding to different environmental parameter types and current target reactant parameter sequences corresponding to different reactant parameter types; obtaining sample target environmental parameter sequences and sample target reactant parameter sequences corresponding to a preset number of sample yeasts, each subsequence on the sample target reactant parameter sequence, and fermentation quality scores corresponding to the sample yeasts; Obtaining a matching fermentation sub-time period of the monitoring time period for each sample yeast strain based on the differences between the current target reactant parameter sequence and each sub-sequence of a sample target reactant parameter sequence that belongs to the same reactant parameter type as the current target reactant parameter sequence, and the degree of change of the sample target reactant parameter sequence; Obtaining a matching environment sequence corresponding to the current target environment parameter sequence for each sample yeast according to the matching fermentation sub-time period of the monitoring time period and the sample target environment parameter sequence; Obtaining an abnormality characterization value of each environmental parameter type at the current fermentation monitoring moment according to the deviation between the current target environmental parameter sequence and the matching environmental sequence corresponding to the current target environmental parameter sequence and the fermentation quality score; According to the abnormal characterization value, the environmental parameters of the target yeast at the current fermentation monitoring moment are monitored.

[0005] Beneficial effects: The present invention first obtains the matching fermentation sub-time period of the monitoring time period for each sample yeast according to the differences between the current target reactant parameter sequence and the various sub-sequences on the sample target reactant parameter sequence corresponding to the current target reactant parameter sequence and the degree of change of the sample target reactant parameter sequence, and obtains the matching environment sequence corresponding to the current target environment parameter sequence for each sample yeast according to the matching fermentation sub-time period of the monitoring time period and the sample target environment parameter sequence; then, according to the deviation between the current target environment parameter sequence and the matching environment sequence corresponding to the current target environment parameter sequence and the fermentation quality score, obtains the abnormal characterization value of each environmental parameter type at the current fermentation monitoring moment; finally, according to the abnormal characterization value, monitors the environmental parameters of the target yeast at the current fermentation monitoring moment; and the present invention can improve the timeliness and accuracy of abnormal monitoring of the environmental parameters of the target yeast at the current fermentation monitoring moment based on the deviation between the current target environment parameter sequence and the matching environment sequence corresponding to the current target environment parameter sequence and the fermentation quality score, that is, it can improve the timeliness and accuracy of real-time monitoring of the micro-fermentation process of high-temperature resistant yeast, thereby improving the stability of the fermentation process and the fermentation quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0006] In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0007] Figure 1 The present invention provides a flow chart of a method for real-time monitoring of thermostable yeast micro-fermentation. DETAILED DESCRIPTION

[0008] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field fall within the scope of protection of the embodiments of the present invention.

[0009] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains.

[0010] This embodiment provides a method for real-time monitoring of thermostable yeast microfermentation, which is described in detail as follows: like Figure 1 As shown, the real-time monitoring method of thermostable yeast micro-fermentation comprises the following steps: Step S001: During the monitoring period of the current fermentation monitoring moment of the target yeast, obtain the current target environmental parameter sequences corresponding to different environmental parameter types and the current target reactant parameter sequences corresponding to different reactant parameter types; obtain the sample target environmental parameter sequences and sample target reactant parameter sequences corresponding to a preset number of sample yeasts, each subsequence on the sample target reactant parameter sequence, and the fermentation quality score corresponding to the sample yeast.

[0011] The main purpose of this embodiment is to improve the timeliness and accuracy of real-time monitoring of the micro-fermentation process of high-temperature resistant yeast. The yeasts mentioned later in this embodiment are all high-temperature resistant yeast, and this embodiment mainly combines the changing characteristics of the reactants in the fermentation process. First, in the complete fermentation time period of the sample yeast, a fermentation time period that is closest to the changing characteristics of the reactants during the micro-fermentation of the actually monitored yeast is obtained, also called a matching fermentation sub-time period. Then, the deviation between the environmental parameters of the sample yeast micro-fermentation process collected in the matching fermentation sub-time period and the environmental parameters of the actually monitored yeast micro-fermentation is combined to evaluate whether there is any abnormality in the environmental parameters of the actually monitored yeast at the current fermentation monitoring moment, that is, this embodiment. The embodiment combines the characteristics of the fermentation reactants to obtain the matching environment sequence corresponding to the current target environment parameter sequence, and based on the deviation between the current target environment parameter sequence and the corresponding matching environment sequence, performs real-time monitoring and evaluation of the environmental parameters in the micro-fermentation process of the high-temperature resistant yeast. Compared with the real-time monitoring of the micro-fermentation process of the high-temperature resistant yeast based only on the current environmental parameters monitored in real time, this monitoring method can improve the timeliness and accuracy of the real-time monitoring of the micro-fermentation process of the high-temperature resistant yeast. In addition, after obtaining the results of real-time monitoring of the micro-fermentation process of the high-temperature resistant yeast, this embodiment can also adjust the environmental parameters according to the monitoring results to ensure the efficiency and quality of the fermentation of the high-temperature resistant yeast.

[0012] For ease of understanding, this embodiment will be described below by taking any thermostable yeast as an example to monitor environmental parameters during micro-fermentation, and the selected thermostable yeast will be referred to as the target yeast.

[0013] This embodiment then first obtains the monitoring time period corresponding to the current fermentation monitoring moment of the target yeast, and the main reason for obtaining the monitoring time period corresponding to the current fermentation monitoring moment is to avoid problems such as high false detection rate caused by single data. The last moment in the monitoring time period corresponding to the current fermentation monitoring moment in this embodiment is the current fermentation monitoring moment, that is, the monitoring time period corresponding to the current fermentation monitoring moment is composed of the current fermentation monitoring moment and the continuous collection moments before the current fermentation monitoring moment. The current fermentation monitoring moment is also the current collection moment, and this embodiment requires that the time length of the monitoring time period is a preset time length, and in specific applications, the implementer can set it according to actual conditions, such as setting the time length of the monitoring time period to 1 minute, that is, if the time length of the time period formed from a historical collection moment to the current fermentation monitoring moment is 1 minute, then the time period formed from the historical collection moment to the current fermentation monitoring moment is the monitoring time period corresponding to the current fermentation monitoring moment.

[0014] Then, in the monitoring time period corresponding to the current fermentation monitoring moment of the target yeast, the current target environmental parameter sequence corresponding to different environmental parameter types and the current target reactant parameter sequence corresponding to different reactant parameter types are obtained. Specifically, during the micro-fermentation process of the target yeast, environmental parameter acquisition equipment such as temperature sensors and Ph sensors are used to acquire the environmental parameters at each acquisition moment in the monitoring time period corresponding to the current fermentation monitoring moment, and acquisition equipment such as mass flow meters or infrared sensors are used to acquire the reactant parameters at each acquisition moment in the monitoring time period corresponding to the current fermentation monitoring moment. At this time, the collected environmental parameters are the environmental parameters during the fermentation of the target yeast and the reactant parameters generated during the fermentation; then, the time series sequence constructed by all environmental parameters belonging to the same environmental parameter type among all the environmental parameters acquired in the monitoring time period corresponding to the current fermentation monitoring moment is recorded as the current environmental parameter sequence to be processed corresponding to the corresponding environmental parameter type, and the time series sequence constructed by all environmental parameters belonging to the same environmental parameter type among all the reactant parameters acquired in the monitoring time period corresponding to the current fermentation monitoring moment is recorded as the current environmental parameter sequence to be processed corresponding to the corresponding environmental parameter type. The time series sequence constructed by all reactant parameters of a reactant parameter type is recorded as the current reactant parameter sequence to be processed corresponding to the corresponding reactant parameter type. The types of all parameters in the parameter sequence corresponding to any parameter type are of this parameter type. This embodiment requires collecting multiple types of environmental parameters and multiple types of reactant parameters at one collection moment. Then, this embodiment can obtain the current environmental parameter sequence to be processed corresponding to multiple environmental parameter types and the current reactant parameter sequence to be processed corresponding to multiple reactant parameter types; and the environmental parameter types in this embodiment include but are not limited to temperature, Ph, dissolved oxygen concentration, etc., and the reactant parameter types include but are not limited to ethanol concentration, organic acid concentration, carbon dioxide release, etc.; in addition, all environmental parameters and reactant parameters collected by sensors or collection devices will be synchronously uploaded to the data processing system via the data collection module to provide complete and continuous time series data support for subsequent abnormal monitoring, dynamic regulation, etc., and in this embodiment, the implementer needs to set the time interval between adjacent collection moments based on experience, actual conditions, etc., such as 1 second.

[0015] For example, if this embodiment collects three environmental parameters and two reactant parameters at one collection moment, the three environmental parameters are temperature, pH, and dissolved oxygen concentration, and the two reactant parameters are ethanol concentration and organic acid concentration, then the current sequence of environmental parameters to be processed corresponding to the dissolved oxygen concentration parameter type, the current sequence of environmental parameters to be processed corresponding to the temperature parameter type, the current sequence of environmental parameters to be processed corresponding to the Ph parameter type, the current sequence of reactant parameters to be processed corresponding to the ethanol concentration parameter type, and the current sequence of reactant parameters to be processed corresponding to the organic acid concentration type can be obtained.

[0016] Therefore, this embodiment obtains the current target environmental parameter sequence corresponding to different environmental parameter types and the current target reactant parameter sequence corresponding to different reactant parameter types through the above process; since this embodiment subsequently needs to match and compare the parameters collected during the micro-fermentation process of the target yeast with the parameters collected during the micro-fermentation process of multiple groups of sample yeasts, and the initial substrate dosage of different sample yeasts during fermentation is different, this difference will have a negative impact on the subsequent matching and comparison, so after obtaining the current environmental parameter sequence to be processed and the current reactant parameter sequence to be processed, this embodiment normalizes each current environmental parameter sequence to be processed and each current reactant parameter sequence to be processed, and records the normalized current environmental parameter sequence to be processed as the current target environmental parameter sequence, and records the normalized current reactant parameter sequence to be processed as the current target reactant parameter sequence, thereby obtaining the current target environmental parameter sequence corresponding to different environmental parameter types and the current target reactant parameter sequence corresponding to different reactant parameter types in the monitoring time period corresponding to the current fermentation monitoring moment of the target yeast. The normalization process of the current environmental parameter sequence to be processed is as follows: the initial substrate dosage of the target yeast during fermentation or the weight of the substrate initially added by the target yeast at the beginning of fermentation is recorded as M0, the substrate added during yeast fermentation refers to the raw material of the fermentation reaction, and the time series sequence composed of the results of comparing each parameter in the current environmental parameter sequence to be processed with M0 is recorded as the current environmental parameter sequence to be processed after normalization; the normalization process of the current reactant parameter sequence to be processed is as follows: the time series sequence composed of the results of comparing each parameter in the current reactant parameter sequence to be processed with M0 is recorded as the current reactant parameter sequence to be processed after normalization.

[0017] In order to improve the timeliness and accuracy of real-time monitoring of the micro-fermentation process of thermostable yeast, this embodiment needs to match and compare the micro-fermentation process of the target yeast with the micro-fermentation processes of multiple groups of sample yeasts, and analyze the various environmental parameters of the target yeast at the current fermentation monitoring moment based on the matching and comparison results. Therefore, this embodiment next needs to obtain the sample target environmental parameter sequences corresponding to different environmental parameter types and the sample target reactant parameter sequences corresponding to different reactant parameter types for a preset number of sample yeasts during the complete fermentation time period. These can also be referred to as the sample target environmental parameter sequences and sample target reactant parameter sequences corresponding to the preset number of sample yeasts. The sample target environmental parameter sequences and the sample target reactant parameter sequences are also normalized sequences. Therefore, the specific acquisition process of the sample target environmental parameter sequences and the sample target reactant parameter sequences corresponding to each sample yeast is as follows: For any sample yeast: during the complete fermentation time period of the sample yeast, obtain the sample to-be-processed environmental parameter sequences corresponding to different environmental parameter types and the sample to-be-processed reactant parameter sequences corresponding to different reactant parameter types, then normalize the sample to-be-processed environmental parameter sequences and the sample to-be-processed reactant parameter sequences, and record the normalized sample to-be-processed environmental parameter sequences and the sample to-be-processed reactant parameter sequences as the sample target environmental parameter sequences and the sample target reactant parameter sequences, thereby obtaining all the sample target environmental parameter sequences and all the corresponding sample target reactant parameter sequences corresponding to the sample yeast. For any sample yeast, one environmental parameter type corresponds to one sample target environmental parameter sequence, and one reactant parameter type corresponds to one sample target reactant parameter sequence. The process of normalizing any sample to-be-processed environmental parameter sequence corresponding to the sample yeast is as follows: the initial substrate dosage of the sample yeast during fermentation or the weight of the substrate initially added when the sample yeast starts fermentation is recorded as M1, and the time series sequence formed by comparing each parameter in the sample to-be-processed environmental parameter sequence with M1 is recorded as the normalized sample to-be-processed environmental parameter sequence; the process of normalizing the sample to-be-processed reactant parameter sequence corresponding to the sample yeast is as follows: the time series sequence formed by comparing each parameter in the sample to-be-processed reactant parameter sequence with M1 is recorded as the normalized sample to-be-processed reactant parameter sequence.

[0018] The number of sample to-be-processed environmental parameter sequences corresponding to any sample yeast and the type of environmental parameters to which they belong are consistent with the number of current to-be-processed environmental parameter sequences and the type of environmental parameters to which they belong. The number of sample to-be-processed reactant parameter sequences corresponding to any sample yeast and the type of reactant parameters to which they belong are consistent with the number of current to-be-processed reactant parameter sequences and the type of reactant parameters to which they belong. That is, if the current to-be-processed environmental parameter sequence in this embodiment is the current to-be-processed environmental parameter sequence corresponding to the temperature parameter type and the current to-be-processed environmental parameter sequence corresponding to the Ph parameter type, then the sample to-be-processed environmental parameter sequence corresponding to any sample yeast includes the sample to-be-processed environmental parameter sequence corresponding to the temperature parameter type and the sample to-be-processed environmental parameter sequence corresponding to the Ph parameter type. If the current to-be-processed reactant parameter sequence in this embodiment is the ethanol concentration parameter type, The current sequence of reactant parameters to be processed corresponding to the number type and the current sequence of reactant parameters to be processed corresponding to the organic acid concentration type, then the sequence of sample environmental parameters to be processed corresponding to any sample yeast includes the sequence of sample reactant parameters to be processed corresponding to the ethanol concentration parameter type and the sequence of sample reactant parameters to be processed corresponding to the organic acid concentration type; in addition, in specific applications, the implementer needs to set the value of the preset number according to the requirements for monitoring accuracy, and set it according to the principle that the larger the value of the preset number, the greater the monitoring accuracy of the yeast environmental parameters, and the smaller the value of the preset number, the smaller the monitoring accuracy of the yeast environmental parameters. For example, the preset number can be set to 50, that is, there are 50 groups of sample yeasts, the sample yeasts are also high-temperature resistant yeasts, and the sample yeasts are consistent with the type, fermentation process and subsequent use of the target yeast.

[0019] In addition, in the complete fermentation time period of any sample yeast, the specific process of obtaining the sample to-be-processed environmental parameter sequence corresponding to different environmental parameter types and the sample to-be-processed reactant parameter sequence corresponding to different reactant parameter types is as follows: first, the complete fermentation time period of the sample yeast is recorded as time period U, and the time period from the start of fermentation to the completion of fermentation of the sample yeast is the complete fermentation time period of the sample yeast, and then all environmental parameters and reactant parameters belonging to the micro-fermentation process of the sample yeast collected at each collection time in the time period U are obtained from the database or storage module, and the time series composed of all environmental parameters of the same environmental parameter type among all environmental parameters whose collection time belongs to the time period U and belong to the micro-fermentation process of the sample yeast are recorded as The sample to-be-processed environmental parameter sequence corresponding to the corresponding environmental parameter type is recorded as the sample to-be-processed reactant parameter sequence corresponding to the corresponding reactant parameter type, and the time series sequence composed of all reactant parameters belonging to the same reactant parameter type among all reactant parameters in the micro-fermentation process of the sample yeast whose collection time belongs to the time period U is recorded as the sample to-be-processed reactant parameter sequence corresponding to the corresponding reactant parameter type. That is, the environmental parameters in the sample to-be-processed environmental parameter sequence and the reactant parameters in the sample to-be-processed reactant parameter sequence corresponding to the sample yeast are all environmental parameters and reactant parameters during the micro-fermentation of the sample yeast, and the time interval between adjacent collection moments when collecting and monitoring the parameters during the micro-fermentation process of the sample yeast is consistent with the time interval between adjacent collection moments when collecting and monitoring the parameters during the micro-fermentation process of the target yeast.

[0020] Therefore, this embodiment obtains all sample target environmental parameter sequences and all sample target reactant parameter sequences corresponding to each sample yeast through the above process.

[0021] Since this embodiment subsequently needs to match the microfermentation process of the target yeast with the microfermentation processes of multiple groups of sample yeasts in combination with the characteristics of the reactants, so as to perform comparative analysis between similar fermentation stages, and since the length of the monitoring time period corresponding to the current fermentation monitoring moment is much shorter than the length of the complete fermentation time period of the sample yeast, this embodiment then needs to divide the complete fermentation time period of the sample yeast, and obtain each subsequence on the sample target reactant parameter sequence and each subsequence on the sample target environment parameter sequence based on the division results. The specific process is as follows: For any sample yeast, a preset time sliding window is constructed, and then the leftmost end of the preset time window is aligned with the starting moment of the complete fermentation time period of the sample yeast, and then the preset time sliding window is slid on the complete fermentation time period of the sample yeast until the end moment of the complete fermentation time period of the sample yeast first appears in the sliding window, and the sliding is stopped, thereby obtaining each time sliding window on the complete fermentation time period of the sample yeast, and the time period corresponding to the t-th time sliding window on each time sliding window on the complete fermentation time period of the sample yeast is recorded as the t-th fermentation sub-time period of the sample yeast; for the t-th time sliding window on the complete fermentation time period of the sample yeast and any sample target environment parameter sequence T1 and any sample target reactant parameter sequence T2 corresponding to the sample yeast, on the sample target environment parameter sequence T1, the time constituted by all parameters whose collection time belongs to the t-th time sliding window is recorded. The time series is recorded as the t-th subsequence on the sample target environment parameter sequence T1. On the sample target reactant parameter sequence T2, the time series sequence composed of all parameters belonging to the t-th time sliding window at the acquisition moment is recorded as the t-th subsequence on the sample target reactant parameter sequence T2, that is, the time period corresponding to the t-th subsequence on the sample target reactant parameter sequence T2 is the same as the time period corresponding to the t-th subsequence on the sample target environment parameter sequence T1. For example, the fermentation sub-time period corresponding to the t-th subsequence on the sample target reactant parameter sequence T2 and the fermentation sub-time period corresponding to the t-th subsequence on the sample target environment parameter sequence T1 are both the t-th fermentation sub-time period of the sample yeast. Therefore, it can be seen that the number of subsequences on any sample target environment parameter sequence or the number of subsequences on any sample target reactant parameter sequence corresponding to the sample yeast is consistent with the number of time sliding windows on the complete fermentation time period of the sample yeast. In addition, since this embodiment subsequently matches and compares the subsequence with the current target reactant parameter sequence and the current target environment parameter sequence, this embodiment requires that the time length of the preset time sliding window is consistent with the time length of the monitoring time period of the current fermentation monitoring moment; and in specific applications, the implementer needs to set the sliding step according to actual conditions such as the amount of calculation. For example, in this embodiment, the sliding step can be set to the time interval between adjacent collection moments or to half the length of the preset time sliding window, etc.

[0022] Therefore, this embodiment can obtain each subsequence on the sample target reactant parameter sequence and each subsequence on the sample target environment parameter sequence through the above process.

[0023] Next, this embodiment uses a manual or machine method to score or grade the fermentation quality of each sample yeast to obtain a fermentation quality score corresponding to each sample yeast; and this embodiment requires that the higher the fermentation quality score, the better the overall fermentation quality of the corresponding sample yeast from the beginning to the end of fermentation, or the better the fermentation quality of the corresponding sample yeast, and also requires that the value range of the fermentation quality score is 0 to 1. The specific process of scoring or grading the fermentation quality of the sample yeast is well known, so it will not be described in detail.

[0024] Therefore, in this embodiment, the fermentation quality score corresponding to each sample yeast was obtained through the above process.

[0025] Step S002: obtaining the matching fermentation sub-time period of the monitoring time period for each sample yeast based on the differences between the current target reactant parameter sequence and each sub-sequence on the sample target reactant parameter sequence corresponding to the current target reactant parameter sequence and the degree of change of the sample target reactant parameter sequence; obtaining the matching environment sequence corresponding to the current target environment parameter sequence for each sample yeast based on the matching fermentation sub-time period of the monitoring time period and the sample target environment parameter sequence.

[0026] Since the variation characteristics of the yeast's reactant parameters can indirectly reflect its fermentation state and stage, this embodiment first obtains the fermentation stage of the sample yeast that is closest to or most closely matches the stage of the target yeast at the current fermentation monitoring moment based on the differences between the current target reactant parameter sequence and each subsequence on the sample target reactant parameter sequence of the same reactant parameter type as the current target reactant parameter sequence, as well as the degree of variation of the sample target reactant parameter sequence. This is hereinafter referred to as the matching fermentation sub-time period of the monitoring time period at the current fermentation monitoring moment for each sample yeast, and the closer the fermentation stage of the monitoring time period at the current fermentation monitoring moment is to the matching fermentation sub-time period, the closer the fermentation stage is to the matching fermentation sub-time period. After obtaining the matching fermentation sub-time period of the monitoring time period at the current fermentation monitoring moment for each sample yeast, a subsequence whose collection time falls within the matching fermentation sub-time period and belongs to the sample target environmental parameter sequence is obtained. That is, based on the matching fermentation sub-time period of the monitoring time period and the sample target environmental parameter sequence, a matching environmental sequence corresponding to the current target environmental parameter sequence for each sample yeast is obtained. Subsequently, the current target environmental parameter sequence is compared with the matching environmental sequence, and the environmental parameters of the target yeast at the current fermentation monitoring moment are monitored based on the comparison result.

[0027] Based on the above, this embodiment needs to first obtain the matching fermentation sub-time period of the monitoring time period under each sample yeast according to the difference between the current target reactant parameter sequence and each sub-sequence on the sample target reactant parameter sequence of the same reactant parameter type corresponding to the current target reactant parameter sequence, as well as the degree of change of the sample target reactant parameter sequence. The matching fermentation sub-time period is the basis for subsequently obtaining the matching environment sequence. Then the specific acquisition process of the matching fermentation sub-time period under each sample yeast is as follows: first, according to the difference between adjacent parameters in all sample target reactant parameter sequences belonging to the same reactant parameter type, the matching credibility corresponding to each reactant parameter type is obtained. If all parameters in two sequences belong to the parameters after normalization of ethanol concentration, then it is determined that the reactant parameter types to which the two sequences belong are the same, and the reactants to which the two sequences belong are the same. The reactant parameter types are all ethanol concentration parameter types. Then, the process of obtaining the matching fermentation sub-time period of the monitoring time period of the current fermentation monitoring moment under any sample yeast A is taken as an example to illustrate. Then the process of obtaining the matching fermentation sub-time period of the monitoring time period of the current fermentation monitoring moment under sample yeast A is as follows: first, among all the sample target reactant parameter sequences corresponding to sample yeast A, obtain the sample target reactant parameter sequences that belong to the same reactant parameter type as each current target reactant parameter sequence, and record them as the same type of reactant sequences corresponding to the current target reactant parameter sequence under sample yeast A, that is, if a sample target reactant parameter sequence Y1 corresponding to sample yeast A and a current target reactant parameter sequence Y2 belong to the same reactant parameter type, then sequence Y1 is the same type of reactant sequence as the current target reactant parameter sequence Y2 under sample yeast A. And in the sample target reactant parameter sequence corresponding to any sample yeast, there is a reactant sequence of the same type as the current target reactant parameter sequence; then, based on the differences between the current target reactant parameter sequence and the respective subsequences on the reactant sequence of the same type corresponding to the current target reactant parameter sequence under sample yeast A, the initial matching degree between the current target reactant parameter sequence and the respective subsequences on the reactant sequence of the same type corresponding to the current target reactant parameter sequence under sample yeast A is obtained, and based on the initial matching degree and the matching weight value corresponding to the reactant parameter type, the target matching degree between the current target reactant parameter sequence and the respective subsequences on the reactant sequence of the same type corresponding to the current target reactant parameter sequence under sample yeast A is obtained, and based on the target matching degree, the matching fermentation sub-time period of the monitoring time period under sample yeast A is obtained; the monitoring time periods in this embodiment are all monitoring time periods corresponding to the current fermentation monitoring moment.

[0028] In this embodiment, the specific process of obtaining the matching credibility corresponding to each reactant parameter type based on the differences between adjacent parameters in all sample target reactant parameter sequences belonging to the same reactant parameter type is as follows: for any reactant parameter type B: first, among all sample target reactant parameter sequences corresponding to all sample yeasts, a set constructed by all sample target reactant parameter sequences belonging to reactant parameter type B is recorded as the sequence set corresponding to reactant parameter type B, and the relative change degree representation value of each sample target reactant parameter sequence in the sequence set corresponding to reactant parameter type B is obtained, and the sequence composed of the relative change degree representation values ​​of all sample target reactant parameter sequences in the sequence set corresponding to reactant parameter type B is recorded as the relative change degree representation value sequence corresponding to reactant parameter type B; then, the coefficient of variation of the relative change degree representation value sequence corresponding to reactant parameter type B is calculated, and the coefficient of variation of the obtained relative change degree representation value sequence is negatively correlated and then normalized, and the normalization result is used as the matching credibility corresponding to reactant parameter type B; and the expression of the matching credibility corresponding to reactant parameter type B is: , where exp() is an exponential function with a constant e as the base, and its function here is to normalize the coefficient of variation. is the coefficient of variation of the relative degree of change characterizing the value sequence corresponding to the reactant parameter type B, is the total number of reactant parameter types in this example, is the coefficient of variation of the relative change degree characterization value sequence corresponding to the nth reactant parameter type. The value of N is consistent with the number of sample target reactant parameter sequences corresponding to any sample yeast. The method for obtaining the coefficient of variation of the relative change degree characterization value sequence corresponding to any reactant parameter type is the same as the method for obtaining the coefficient of variation of the relative change degree characterization value sequence corresponding to reactant parameter type B. The coefficient of variation of any sequence is the ratio of the standard deviation of the corresponding sequence to the sequence mean.

[0029] Furthermore, since a smaller coefficient of variation of the relative change degree representation value sequence corresponding to a certain reactant parameter type indicates that the reactant parameters belonging to that reactant parameter type have a stronger commonality in the micro-fermentation processes of all sample yeasts, and a stronger commonality indicates that the change characteristics of that reactant parameter type in the micro-fermentation process of thermostable yeasts are similar or that the changes are regular, or in other words, these reactant parameter types with strong commonality are more representative of the fermentation reaction. In order to improve the reliability and accuracy of matching, this embodiment makes more representative reactant data types contribute more to the final matching result, or makes more representative reactant data more dominant in the final matching result. Furthermore, since a smaller coefficient of variation of the relative change degree representation value sequence corresponding to a reactant parameter type indicates a greater matching credibility for the corresponding reactant parameter type, a greater matching credibility for a certain reactant parameter type indicates that the corresponding reactant data type contributes more to the final matching result, or that the corresponding reactant data type more dominates the final matching result. In other words, when the matching credibility for a certain reactant parameter type is greater, the credibility of the initial matching degree calculated between subsequent sequences belonging to the reactant parameter type is higher.

[0030] In this embodiment, the specific process of obtaining the relative change degree characterizing value of any sample target reactant parameter sequence is as follows: for any sample target reactant parameter sequence, first obtain the range of the sample target reactant parameter sequence and the neighborhood difference sequence of the sample target reactant parameter sequence. The neighborhood difference sequence of the sample target reactant parameter sequence is constructed by the absolute values ​​of the differences between all adjacent parameters in the corresponding sample target reactant parameter sequence, that is, the kth neighborhood difference value in the neighborhood difference sequence of the sample target reactant parameter sequence is the absolute value of the difference between the kth parameter and the k+1th parameter in the sample target reactant parameter sequence; then calculate the product of the range of the sample target reactant parameter sequence and the mean of the neighborhood difference sequence of the sample target reactant parameter sequence, and record it as the first product value. The specific expression of the first product value is: , wherein R1 is the range of the sample target reactant parameter sequence, the range of any sequence is the absolute value of the difference between the maximum and minimum values ​​in the corresponding sequence, R2 is the mean of the neighborhood difference sequence of the sample target reactant parameter sequence, and the larger the R1 and R2 are, the greater the degree of change of the sample target reactant parameter sequence, or in other words, the greater the degree of change of the reactant parameter type to which the sample target reactant parameter sequence belongs during the entire fermentation process of the sample yeast to which the sample target reactant parameter sequence belongs; then the first product value is linearly normalized and recorded as the variation degree representation value of the sample target reactant parameter sequence, and as another real-time method, the first product value can also be compared with the sample target reactant parameter sequence. The ratio of the mean of the columns is used as the variation degree representation value of the sample target reactant parameter sequence. The purpose of normalization or comparison with the mean of the sample target reactant parameter sequence is to eliminate the dimension. Finally, according to the variation degree representation value of each sample target reactant parameter sequence corresponding to each sample yeast, the relative variation degree representation value of each sample target reactant parameter sequence corresponding to each sample yeast is obtained. The larger the relative variation degree representation value of a sample target reactant parameter sequence is, the greater the variation degree of the reactant parameter type to which the sample target reactant parameter sequence belongs is compared with other reactant parameter types during the entire fermentation process of the sample yeast to which the sample target reactant parameter sequence belongs.

[0031] In this embodiment, the specific process of obtaining the relative change degree representation value of each sample target reactant parameter sequence corresponding to each sample yeast according to the change degree representation value of each sample target reactant parameter sequence corresponding to each sample yeast is as follows: first, the comprehensive representation value of each sample yeast is obtained, and the ratio of the change degree representation value of each sample target reactant parameter sequence corresponding to each sample yeast to the comprehensive representation value of the corresponding sample yeast is used as the relative change degree representation value of the corresponding sample target reactant parameter sequence, and the comprehensive representation value of any sample yeast is the result of accumulating the change degree representation values ​​of all sample target reactant parameter sequences corresponding to the sample yeast.

[0032] In this embodiment, based on the differences between the current target reactant parameter sequence and each subsequence on the same type of reactant sequence corresponding to the current target reactant parameter sequence under sample yeast A, the specific process of obtaining the initial matching degree between the current target reactant parameter sequence and each subsequence on the same type of reactant sequence corresponding to the current target reactant parameter sequence under sample yeast A is as follows: For the current target reactant parameter sequence b corresponding to any reactant parameter type B and the c-th subsequence on the same type reactant sequence of the current target reactant parameter sequence b under the sample yeast A, that is, the current target reactant parameter sequence corresponding to the reactant parameter type B is the current target reactant parameter sequence b: first calculate the DTW distance between the current target reactant parameter sequence b and the c-th subsequence, and perform negative correlation mapping on the DTW distance between the current target reactant parameter sequence b and the c-th subsequence, and record the mapping result as the first matching representation value, and the first matching representation value is , D1 is the DTW distance between the current target reactant parameter sequence b and the cth subsequence, is a preset constant to prevent the denominator from being 0. In this embodiment, the preset constant can be set to 0.01; then the mean of the current target reactant parameter sequence b and the mean of the c-th subsequence are calculated, and the absolute value of the difference between the mean of the current target reactant parameter sequence b and the mean of the c-th subsequence is negatively mapped and recorded as the second matching representation value, and the second matching representation value is , D2 is the absolute value of the difference between the mean of the current target reactant parameter sequence b and the mean of the cth subsequence, where This is also to prevent the denominator from being 0; finally, the product of the first matching representation value and the second matching representation value is calculated and used as the initial matching degree between the current target reactant parameter sequence b and the c-th subsequence on the same type of reactant sequence as the current target reactant parameter sequence b under sample yeast A. Furthermore, when the first matching representation value and the second matching representation value are larger, it indicates that the similarity between the fermentation stage of the target yeast in the time period corresponding to the target reactant parameter sequence b and the fermentation stage of the sample yeast A in the time period corresponding to the c-th subsequence is higher, and the higher the similarity, the larger the value of the initial matching degree, that is, the higher the initial matching degree between the current target reactant parameter sequence b and the c-th subsequence on the same type of reactant sequence as the current target reactant parameter sequence b under sample yeast A, the higher the similarity between the fermentation stage of the target yeast in the time period corresponding to the target reactant parameter sequence b and the fermentation stage of the sample yeast A in the time period corresponding to the c-th subsequence.

[0033] In this embodiment, based on the initial matching degree and the matching weight value corresponding to the reactant parameter type, the specific process of obtaining the target matching degree between the current target reactant parameter sequence and each subsequence on the reactant sequence of the same type corresponding to the current target reactant parameter sequence under the sample yeast A is as follows: For the current target reactant parameter sequence b and the c-th subsequence on the same type of reactant sequence as the current target reactant parameter sequence b under the sample yeast A: calculate the product of the initial matching degree between the current target reactant parameter sequence b and the c-th subsequence on the same type of reactant sequence as the current target reactant parameter sequence b under the sample yeast A and the matching credibility corresponding to the reactant parameter type B, and use it as the target matching degree between the current target reactant parameter sequence b and the c-th subsequence on the same type of reactant sequence as the current target reactant parameter sequence b under the sample yeast A; and after calculating the initial matching degree The reason why the target matching degree is obtained by combining the matching credibility corresponding to different reactant parameter types is that the credibility of the initial matching degree calculated for different reactant parameter types is different, that is, the reactant parameter type with a greater matching credibility corresponding to the reactant parameter type has a greater credibility of the initial matching degree calculated. Therefore, in order to ensure the reliability and accuracy of the finally obtained matching fermentation sub-time period, after calculating the initial matching degree, the final target matching degree is obtained by combining the initial matching degree with the matching credibility corresponding to the reactant parameter type, and the obtained target matching degree is the basis for subsequently obtaining the matching fermentation sub-time period.

[0034] In this embodiment, the specific process of obtaining the matching fermentation sub-time period of the monitoring time period of the sample yeast A according to the target matching degree is as follows: First, calculate the cumulative sum of the target matching degrees between the current target reactant parameter sequence corresponding to all reactant parameter types in the monitoring time period of the current fermentation monitoring moment and the c-th subsequence on the reactant sequence of the same type corresponding to the current target reactant parameter sequence under the sample yeast A, and record it as the matching index value between the monitoring time period and the c-th fermentation sub-time period of the sample yeast A; and since the time period corresponding to the subsequences at the same position on all sample target environmental parameter sequences corresponding to the sample yeast A belongs to the same fermentation sub-time period of the sample yeast A, and based on the process of obtaining the subsequence in step S001, the time period corresponding to the c-th subsequence on all sample target reactant parameter sequences corresponding to the sample yeast A The time periods are all the cth fermentation sub-time periods of sample yeast A. The time period corresponding to any subsequence refers to the time period formed by the acquisition time of the first parameter in the subsequence to the acquisition time of the last parameter in the subsequence. The time periods corresponding to all current target reactant parameter sequences are monitoring time periods. Therefore, the cumulative result of the target matching degree between all current target reactant parameter sequences and the cth subsequence on the same type of reactant sequence corresponding to the current target reactant parameter sequence under sample yeast A can be recorded as the matching index value between the monitoring time period and the cth fermentation sub-time period of sample yeast A; and the calculation expression of the matching index value between the monitoring time period and the cth fermentation sub-time period of sample yeast A is: , is the target matching degree between the current target reactant parameter sequence corresponding to the s-th reactant parameter type and the c-th subsequence on the reactant sequence of the same type as the current target reactant parameter sequence corresponding to the s-th reactant parameter type under sample yeast A, where N is the total number of reactant parameter types in this embodiment; The larger the value, the more similar the fermentation stage of the target yeast in the monitoring time period is to the fermentation stage of the sample yeast in the cth fermentation sub-time period of sample yeast A. This also indicates that the probability that the cth fermentation sub-time period of sample yeast A is the matching fermentation sub-time period of the monitoring time period of sample yeast A is greater, and a matching fermentation sub-time period of the monitoring time period can be obtained for one sample yeast. Then, among the matching index values ​​between the monitoring time period and all the fermentation sub-time periods of sample yeast A, the fermentation sub-time period corresponding to the maximum matching index value is selected as the matching fermentation sub-time period of the monitoring time period of sample yeast A. That is, if the matching index value between the monitoring time period and the cth fermentation sub-time period of sample yeast A is the largest among the matching index values ​​between the monitoring time period and all the fermentation sub-time periods of sample yeast A, then the cth fermentation sub-time period of sample yeast A is the matching fermentation sub-time period of the monitoring time period of sample yeast A.

[0035] Therefore, this embodiment obtains the matching fermentation sub-time periods of the monitoring time periods under different sample yeasts through the above process. After obtaining the matching fermentation sub-time periods of the monitoring time periods under each sample yeast, it continues to obtain the matching environment sequence corresponding to the current target environment parameter sequence under each sample yeast according to the matching fermentation sub-time periods of the monitoring time periods under each sample yeast and the sample target environment parameter sequence corresponding to each sample yeast; then the specific acquisition process of the matching environment sequence corresponding to the current target environment parameter sequence under each sample yeast is as follows: for any sample yeast A and any current target environment parameter sequence d: first, in all sample target environment parameter sequences corresponding to sample yeast A, obtain the sample target environment parameter sequence that belongs to the same environment parameter type as the current target environment parameter sequence d, and record it as the same type environment sequence of the current target environment parameter sequence d under sample yeast A; then, in the same type environment sequence of the current target environment parameter sequence d under sample yeast A, obtain the matching environment sequence whose collection time is within the monitoring time under sample yeast A. All parameters of the matching fermentation sub-time period of the acquisition time period are obtained, and the sequence constructed by all parameters of the matching fermentation sub-time period whose acquisition time is located in the monitoring time period under the sample yeast A is recorded as the matching environment sequence corresponding to the current target environment parameter sequence d under the sample yeast A, or in other words, among all subsequences on the same type of environment sequence, the subsequence whose acquisition time period is the matching fermentation sub-time period of the monitoring time period under the sample yeast A is taken as the matching environment sequence corresponding to the current target environment parameter sequence d under the sample yeast A; for example, if the cth fermentation sub-time period of the sample yeast A is the matching fermentation sub-time period of the monitoring time period under the sample yeast A, and based on step S001, it can be known that the time period corresponding to the cth subsequence on the same type of environment sequence of the current target environment parameter sequence d under the sample yeast A is the cth fermentation sub-time period of the sample yeast A, then it can be known that the cth subsequence on the same type of environment sequence of the current target environment parameter sequence d under the sample yeast A is the matching environment sequence corresponding to the current target environment parameter sequence d under the sample yeast A.

[0036] Therefore, this embodiment obtains the matching environment sequences corresponding to the current target environment parameter sequences under different sample yeasts through the above process.

[0037] Step S003: obtaining abnormal characterization values ​​of various environmental parameter types at the current fermentation monitoring moment according to the deviation between the current target environmental parameter sequence and the matching environmental sequence corresponding to the current target environmental parameter sequence and the fermentation quality score.

[0038] After obtaining the matching environment sequence corresponding to the current target environment parameter sequence, this embodiment compares the current target environment parameter sequence with the matching environment sequence corresponding to the current target environment parameter sequence, and then combines the fermentation quality scores corresponding to different sample yeasts to obtain the abnormal characterization value of each environmental parameter type at the current fermentation monitoring moment. That is, this embodiment first obtains the deviation degree characterization value between the current target environment parameter sequence and the matching environment sequence corresponding to the current target environment parameter sequence, and then obtains the abnormal characterization value of each environmental parameter type at the current fermentation monitoring moment based on the deviation degree characterization value between the current target environment parameter sequence and the matching environment sequence corresponding to the current target environment parameter sequence and the fermentation quality scores corresponding to different sample yeasts. The abnormal characterization value is the basis for judging whether there is an abnormality in the environmental parameter type at the current fermentation monitoring moment, and is also the basis for judging whether the environmental parameters need to be adjusted. Therefore, the specific acquisition process of the abnormal characterization value of each environmental parameter type at the current fermentation monitoring moment is as follows: First, the weight index value corresponding to each sample yeast is obtained, and the weight index value corresponding to sample yeast A is the maximum matching index value among the matching index values ​​between the monitoring time period corresponding to the current fermentation monitoring moment and all the fermentation sub-time periods of sample yeast A. When the maximum matching index value among the matching index values ​​between the monitoring time period of the current fermentation monitoring moment and all the fermentation sub-time periods of sample yeast A is larger, it indicates that the matching effect is better, or the fermentation stage of the target yeast in the monitoring time period is more similar to the fermentation stage of the sample yeast A in the fermentation sub-time period corresponding to the maximum matching index value. The more similar the fermentation stages are, the higher the credibility of the initial deviation value between the current target environmental parameter sequence calculated subsequently and the matching environmental sequence corresponding to the current target environmental parameter sequence of the sample yeast A should be. Then, the process of obtaining the abnormal characterization value of any environmental parameter type D at the current fermentation monitoring moment is described as an example. The specific process of obtaining the abnormal characterization value of the environmental parameter type D at the current fermentation monitoring moment is as follows: First, the current target environmental parameter sequence corresponding to the environmental parameter type D is recorded as the current target environmental parameter sequence d, and the set constructed by the matching environmental sequences corresponding to the current target environmental parameter sequence d under all sample yeasts is recorded as the matching set corresponding to the current target environmental parameter sequence d, that is, one current target environmental parameter sequence under one sample yeast corresponds to one matching environmental sequence; then, the slope of the current target environmental parameter sequence d and the slope of each matching environmental sequence in the matching set are obtained, and based on the difference between the last parameter in the current target environmental parameter sequence d and the last parameter in each matching environmental sequence in the matching set corresponding to the current target environmental parameter sequence d, the difference between the slope of the current target environmental parameter sequence d and the slope of each matching environmental sequence in the matching set, and the weight index value corresponding to each sample yeast, the deviation degree representation value between the current target environmental parameter sequence d and each matching environmental sequence in the matching set corresponding to the current target environmental parameter sequence d is obtained; then, based on the deviation degree representation value and the fermentation quality score corresponding to each sample yeast, the abnormal representation value of the environmental parameter type D at the current fermentation monitoring moment is obtained. The slope of any sequence specifically refers to the steepness or direction of the overall change trend presented by the sequence. The calculation process of the slope of any sequence is well known. For example, the two-point method, linear regression method, median method, etc. can be used to calculate the slope of the sequence, so it will not be described in detail.

[0039] In this embodiment, the specific process of obtaining the deviation degree representation value between the current target environment parameter sequence d corresponding to the environment parameter type D and each matching environment sequence in the matching set corresponding to the current target environment parameter sequence d is as follows: For the f-th matching environment sequence in the matching set corresponding to the current target environment parameter sequence d corresponding to the environment parameter type D: first calculate the absolute value of the difference between the last parameter in the current target environment parameter sequence d and the last parameter in the f-th matching environment sequence, and record it as the parameter feature difference, use the normalization function Norm() to normalize the parameter feature difference, and record the processed result as the first index value; then calculate the absolute value of the difference between the slope of the current target environment parameter sequence d and the slope of the f-th matching environment sequence, and record it as the slope feature difference, use the normalization function Norm() to normalize the slope feature difference, and record the processed result as the second index value; then calculate the weighted sum of the first index value and the second index value The result of the sum is recorded as the initial deviation value between the current target environment parameter sequence d and the f-th matching environment sequence. Finally, the initial deviation value between the current target environment parameter sequence d and the f-th matching environment sequence is multiplied by the weight index value corresponding to the sample yeast to which the f-th matching environment sequence belongs. The result is recorded as the deviation degree representation value between the current target environment parameter sequence d and the f-th matching environment sequence. If a matching environment sequence belongs to the sample target environment parameter sequence corresponding to a sample yeast or belongs to a subsequence of the sample target environment parameter sequence corresponding to a sample yeast, then it indicates that the matching environment sequence belongs to the sample yeast; and the specific calculation expression of the deviation degree representation value between the current target environment parameter sequence d and the f-th matching environment sequence is:

[0040] in, is the deviation between the current target environment parameter sequence d and the fth matching environment sequence, the Norm() normalization function, is the weight factor, K1 is the parameter characteristic difference, K2 is the slope characteristic difference, is the weight index value corresponding to the sample yeast to which the f-th matching environment sequence belongs; and since the changing trend of environmental parameters can better reflect the changing state of the entire reaction process, this embodiment will reflect the weight of the trend term, that is, the weight factor K2 The setting is relatively large, and the implementer can set it according to the actual situation. For example, in this embodiment, Set to 0.65; In addition, the larger K1 and K2 are, The bigger it is, The larger the value of The larger the value is, the greater the difference between the current target environment parameter sequence d and the fth matching environment sequence.

[0041] In this embodiment, the specific process of obtaining the abnormality characteristic value of the environmental parameter type D at the current fermentation monitoring moment according to the deviation degree characteristic value and the fermentation quality score corresponding to each sample yeast is as follows: First, obtain the weighted deviation degree characterization value set corresponding to the environmental parameter type D, and accumulate all the weighted deviation degree characterization values ​​in the weighted deviation degree characterization value set corresponding to the environmental parameter type D and then perform normalization processing on the result as the abnormal characterization value of the environmental parameter type D at the current fermentation monitoring moment. Here, the normalization function Norm() is used for normalization processing, and the abnormal characterization value ranges from 0 to 1; and the hth weighted deviation degree characterization value in the weighted deviation degree characterization value set corresponding to the environmental parameter type D is ,in, It is the deviation degree characterization value between the current target environmental parameter sequence d corresponding to the environmental parameter type D and the h-th matching environmental sequence in the matching set corresponding to the current target environmental parameter sequence d, Q is the fermentation quality score corresponding to the sample yeast to which the h-th matching environmental sequence belongs, and the sample yeast with a larger fermentation quality score has a better fermentation quality. Therefore, in this embodiment, the deviation degree characterization value obtained based on the sample yeast with a larger fermentation quality score has a more dominant position in determining the abnormal characterization value of the environmental parameter type at the current fermentation monitoring moment or has a greater contribution in determining the abnormal characterization value of the environmental parameter type at the current fermentation monitoring moment. In addition, the larger the abnormal characterization value of environmental parameter type D at the current fermentation monitoring moment, the greater the probability that the environmental parameters of the target yeast belonging to environmental parameter type D at the current fermentation monitoring moment are abnormal or the trend of abnormality in the future is more obvious, or it indicates that at the current fermentation monitoring moment, the environmental parameters belonging to environmental parameter type D among the environmental parameters involved in the fermentation of the target yeast are abnormal. The probability that the environmental parameters are abnormal or the trend of abnormality in the future is more obvious. In addition, when calculating the abnormal characterization value above, since the value range of the fermentation quality score in this embodiment is 0 to 1, this embodiment does not need to normalize the fermentation quality score before use. However, if in other real-time methods, if the value range of the fermentation quality score is not 0 to 1, then the fermentation quality score needs to be normalized before use.

[0042] Therefore, this embodiment can obtain the abnormal characterization values ​​of various environmental parameter types of the target yeast at the current fermentation monitoring moment through the above process.

[0043] Step S004: monitoring the environmental parameters of the target yeast at the current fermentation monitoring time according to the abnormality characterization value.

[0044] After obtaining the abnormal characterization values ​​of each environmental parameter type of the target yeast at the current fermentation monitoring time, this embodiment determines whether the environmental parameter of the target yeast at the current fermentation monitoring time is abnormal based on the magnitude of the abnormal characterization value. Specifically, for environmental parameter type D, if it is determined that the abnormal characterization value of environmental parameter type D at the current fermentation monitoring time is greater than a preset abnormal threshold, then it is determined that among all the environmental parameters of the target yeast collected at the current fermentation monitoring time, the environmental parameter belonging to environmental parameter type D is abnormal or has an abnormal trend. If it is determined that the abnormal characterization value of environmental parameter type D at the current fermentation monitoring time is not greater than the preset abnormal threshold, then it is determined that among all the environmental parameters of the target yeast collected at the current fermentation monitoring time, the environmental parameter belonging to environmental parameter type D is not abnormal or has no abnormal trend. In specific applications, the implementer needs to set the preset abnormal threshold based on actual conditions, experimental statistics, etc. For example, in this embodiment, the preset abnormal threshold can be set to 0.15.

[0045] Therefore, this embodiment can monitor various environmental parameters of the target yeast at the current fermentation monitoring time through the above process. After the monitoring is completed, it is necessary to immediately adjust the type of abnormal environmental parameters based on the monitoring results. The adjustment process is as follows: If it is determined that the abnormal characterization value of environmental parameter type D at the current fermentation monitoring moment is greater than the preset abnormal threshold, then based on the matching environment sequence corresponding to the current target environmental parameter sequence corresponding to the environmental parameter type D under each sample yeast, the matching parameter set corresponding to the environmental parameter type D at the current fermentation monitoring moment and the target reference factor of each matching parameter in the matching parameter set are obtained, and a new set formed by multiplying each matching parameter in the matching parameter set by the target reference factor of the corresponding matching parameter is used as the weighted matching parameter set, and the cumulative result of all weighted matching parameters in the weighted matching parameter set is used as the initial adjustment recommended value of environmental parameter type D for the target yeast at the next fermentation monitoring moment, and the product of the initial adjustment recommended value and the weight of the substrate initially added to the target yeast when fermentation starts is used as the target adjustment recommended value of environmental parameter type D for the target yeast at the next fermentation monitoring moment. At this time, the multiplication with the weight of the added substrate is for normalization restoration, that is, restoring the environmental parameter to the original scale; and when the target yeast is at the next fermentation monitoring moment, the environmental parameter belonging to environmental parameter type D is adjusted to the target adjustment recommended value of environmental parameter type D. In addition, this embodiment utilizes the control system of the automation equipment to achieve parameter adjustment, such as adjusting the PID control system to the above-mentioned target adjustment recommended value.

[0046] In this embodiment, the specific process of obtaining the matching parameter set corresponding to the environmental parameter type D at the current fermentation monitoring moment and the target reference factor of each matching parameter in the matching environmental parameter set is as follows: For the vth sample yeast, if the matching environment sequence corresponding to the current target environment parameter sequence corresponding to the environment parameter type D under the vth sample yeast is the xth subsequence on the sample target environment parameter sequence X corresponding to the vth sample yeast, and the sample target environment parameter sequence X belongs to the environment parameter type D, then the first parameter on the x+1th subsequence on the sample target environment parameter sequence X is used as the vth matching parameter in the matching parameter set corresponding to the environment parameter type D; that is, a matching parameter corresponding to the environment parameter type D can be obtained under any sample yeast.

[0047] For the vth matching parameter in the matching environmental parameter set corresponding to the environmental parameter type D: Based on the above, it can be known that the sample target environmental parameter sequence to which the vth matching parameter belongs belongs to the vth sample yeast, then the product of the fermentation quality score of the vth sample yeast and the weight index value corresponding to the vth sample yeast is used as the initial reference factor of the vth sample yeast, the result after normalization of the initial reference factor of the vth sample yeast is used as the target reference factor of the vth sample yeast, and the target reference factor of the vth sample yeast is used as the target reference factor of the vth matching parameter, that is, the matching index value The matching parameters obtained from the sample yeast with a larger value and a larger fermentation quality score have a greater contribution in obtaining the target adjustment recommendation value, or the matching parameters obtained from the sample yeast with a larger value and a larger fermentation quality score have a more dominant position in determining the target adjustment recommendation value; the specific process of normalizing the initial reference factor of the vth sample yeast is: the cumulative sum of the initial reference factors of all sample yeasts is taken as the comprehensive reference factor, and the ratio of the initial reference factor of the vth sample yeast to the comprehensive reference factor is taken as the result of normalizing the initial reference factor of the vth sample yeast.

[0048] Thus, this embodiment has completed the real-time monitoring and control of the environmental parameters of the target yeast at the current fermentation monitoring moment.

[0049] In summary, this embodiment first obtains the matching fermentation sub-time period of the monitoring time period for each sample yeast based on the difference between the current target reactant parameter sequence and each sub-sequence on the sample target reactant parameter sequence corresponding to the current target reactant parameter sequence and the degree of change of the sample target reactant parameter sequence, and obtains the matching environment sequence corresponding to the current target environment parameter sequence for each sample yeast based on the matching fermentation sub-time period of the monitoring time period and the sample target environment parameter sequence; then, based on the deviation between the current target environment parameter sequence and the matching environment sequence corresponding to the current target environment parameter sequence and the fermentation quality score, obtains the abnormal characterization value of each environmental parameter type at the current fermentation monitoring moment; finally, based on the abnormal characterization value, the environmental parameters of the target yeast at the current fermentation monitoring moment are monitored; and this embodiment can improve the timeliness and accuracy of abnormal monitoring of the environmental parameters of the target yeast at the current fermentation monitoring moment based on the deviation between the current target environment parameter sequence and the matching environment sequence corresponding to the current target environment parameter sequence and the fermentation quality score, that is, it can improve the timeliness and accuracy of real-time monitoring of the micro-fermentation process of the high-temperature resistant yeast, thereby improving the stability and fermentation quality of the fermentation process.

[0050] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. A method for real-time monitoring of thermostable yeast microfermentation, characterized in that: The method comprises the following steps: Obtaining, during a monitoring period at a current fermentation monitoring moment of the target yeast, current target environmental parameter sequences corresponding to different environmental parameter types and current target reactant parameter sequences corresponding to different reactant parameter types; obtaining sample target environmental parameter sequences and sample target reactant parameter sequences corresponding to a preset number of sample yeasts, each subsequence on the sample target reactant parameter sequence, and fermentation quality scores corresponding to the sample yeasts; Obtaining a matching fermentation sub-time period of the monitoring time period for each sample yeast strain based on the differences between the current target reactant parameter sequence and each sub-sequence of a sample target reactant parameter sequence that belongs to the same reactant parameter type as the current target reactant parameter sequence, and the degree of change of the sample target reactant parameter sequence; Obtaining a matching environment sequence corresponding to the current target environment parameter sequence for each sample yeast according to the matching fermentation sub-time period of the monitoring time period and the sample target environment parameter sequence; Obtaining an abnormality characterization value of each environmental parameter type at the current fermentation monitoring moment according to the deviation between the current target environmental parameter sequence and the matching environmental sequence corresponding to the current target environmental parameter sequence and the fermentation quality score; According to the abnormal characterization value, the environmental parameters of the target yeast at the current fermentation monitoring moment are monitored.

2. A method for real-time monitoring of thermostable yeast micro-fermentation according to claim 1, characterized in that: The method for obtaining the matching fermentation sub-time period of the monitoring time period for each sample yeast includes: According to the differences between adjacent parameters in all sample target reactant parameter sequences belonging to the same reactant parameter type, the matching reliability corresponding to each reactant parameter type is obtained; For any sample yeast A, among all sample target reactant parameter sequences corresponding to the sample yeast A, sample target reactant parameter sequences belonging to the same reactant parameter type as each current target reactant parameter sequence are obtained and recorded as the same type reactant sequence corresponding to the current target reactant parameter sequence under sample yeast A. Based on the differences between the current target reactant parameter sequence and each subsequence on the same type reactant sequence corresponding to the current target reactant parameter sequence under sample yeast A, an initial matching degree between the current target reactant parameter sequence and each subsequence on the same type reactant sequence corresponding to the current target reactant parameter sequence under sample yeast A is obtained. Based on the initial matching degree and the matching weight value corresponding to the reactant parameter type, a target matching degree between the current target reactant parameter sequence and each subsequence on the same type reactant sequence corresponding to the current target reactant parameter sequence under sample yeast A is obtained. Based on the target matching degree, a matching fermentation sub-time period of the monitoring time period under the sample yeast A is obtained.

3. A method for real-time monitoring of thermostable yeast microfermentation according to claim 2, characterized in that: The method for obtaining the matching credibility corresponding to each reactant parameter type includes: The result of linear normalization of the product of the range of the sample target reactant parameter sequence and the mean of the neighborhood difference sequence of the corresponding sample target reactant parameter sequence is recorded as the variation degree representation value of the corresponding sample target reactant parameter sequence. The neighborhood difference sequence of any sample target reactant parameter sequence is constructed by the absolute values ​​of the differences between all adjacent parameters in the corresponding sample target reactant parameter sequence. The cumulative sum of the variation degree representation values ​​of all sample target reactant parameter sequences corresponding to each sample yeast is recorded as the comprehensive representation value of the corresponding sample yeast. The ratio of the variation degree representation value of each sample target reactant parameter sequence corresponding to each sample yeast to the comprehensive representation value of the corresponding sample yeast is recorded as the relative variation degree representation value of the corresponding sample target reactant parameter sequence. For any reactant parameter type B, a sequence constructed by the relative change degree characterization values ​​of all sample target reactant parameter sequences belonging to reactant parameter type B in all sample target reactant parameter sequences corresponding to all sample yeasts is recorded as the relative change degree characterization value sequence corresponding to reactant parameter type B. The result obtained by negative correlation mapping the coefficient of variation of the relative change degree characterization value sequence and then normalizing it is recorded as the matching credibility corresponding to reactant parameter type B.

4. A method for real-time monitoring of thermostable yeast microfermentation according to claim 2, characterized in that: Methods for obtaining the initial matching degree include: For the current target reactant parameter sequence b corresponding to any reactant parameter type B and the cth subsequence on the reactant sequence of the same type as the current target reactant parameter sequence b under sample yeast A: the result of negative correlation mapping of the DTW distance between the current target reactant parameter sequence b and the cth subsequence is recorded as the first matching representation value, the result of negative correlation mapping of the absolute value of the difference between the mean of the current target reactant parameter sequence b and the mean of the cth subsequence is recorded as the second matching representation value, and the product of the first matching representation value and the second matching representation value is recorded as the initial matching degree between the current target reactant parameter sequence b and the cth subsequence on the reactant sequence of the same type as the current target reactant parameter sequence b under sample yeast A.

5. A method for real-time monitoring of thermostable yeast microfermentation according to claim 4, characterized in that: Methods for obtaining target matching include: For the current target reactant parameter sequence b and the c-th subsequence, the initial matching degree between the current target reactant parameter sequence b and the c-th subsequence on the reactant sequence of the same type as the current target reactant parameter sequence b under sample yeast A is multiplied by the matching credibility corresponding to the reactant parameter type B, and the result is used as the target matching degree between the current target reactant parameter sequence b and the c-th subsequence on the reactant sequence of the same type as the current target reactant parameter sequence b under sample yeast A.

6. A method for real-time monitoring of thermostable yeast microfermentation according to claim 2, characterized in that: The method for obtaining a matching fermentation sub-period of the monitoring period under the sample yeast A according to the target matching degree comprises: Calculate the cumulative sum of the target matching degrees between the current target reactant parameter sequence corresponding to all reactant parameter types and the c-th subsequence on the reactant sequence of the same type corresponding to the current target reactant parameter sequence under sample yeast A, and record it as the matching index value between the monitoring time period and the c-th fermentation sub-time period of the sample yeast A. The fermentation sub-time period corresponding to the c-th subsequence on all sample target reactant parameter sequences corresponding to the sample yeast A is the c-th fermentation sub-time period of the sample yeast A. The fermentation sub-time period corresponding to the maximum matching index value among the matching index values ​​between the monitoring time period and all fermentation sub-time periods of the sample yeast A is used as the matching fermentation sub-time period of the monitoring time period under the sample yeast A.

7. A method for real-time monitoring of thermostable yeast microfermentation according to claim 2, characterized in that: The method for obtaining the matching environment sequence corresponding to the current target environment parameter sequence under each sample yeast includes: For the sample yeast A and any current target environmental parameter sequence d, the sample target environmental parameter sequences of all sample target environmental parameter sequences corresponding to the sample yeast A that belong to the same environmental parameter type as the current target environmental parameter sequence d are recorded as the same type of environmental sequence of the current target environmental parameter sequence d under the sample yeast A, and the sequence constructed by all parameters in the same type of environmental sequence whose collection time is in the matching fermentation sub-time period of the monitoring time period under the sample yeast A is recorded as the matching environmental sequence corresponding to the current target environmental parameter sequence d under the sample yeast A.

8. The method for real-time monitoring of thermostable yeast microfermentation according to claim 6, wherein: The method for obtaining the abnormal characterization value of each environmental parameter type at the current fermentation monitoring time includes: Obtaining the weight index value corresponding to each sample yeast, wherein the weight index value corresponding to the sample yeast A is the maximum matching index value among the matching index values ​​between the monitoring time period and all fermentation sub-time periods of the sample yeast A; For any environmental parameter type D within the monitoring time period of the current fermentation monitoring moment: The set constructed by the matching environment sequences corresponding to the current target environment parameter sequence d under all sample yeasts is recorded as the matching set corresponding to the current target environment parameter sequence d, wherein the current target environment parameter sequence d is the current target environment parameter sequence corresponding to the environment parameter type D; Obtaining a deviation degree representation value between the current target environment parameter sequence d and each matching environment sequence in the matching set corresponding to the current target environment parameter sequence d based on a difference between the last parameter in the current target environment parameter sequence d and the last parameter in each matching environment sequence in the matching set, a difference between the slope of the current target environment parameter sequence d and the slope of each matching environment sequence in the matching set, and a weight index value corresponding to the sample yeast; According to the deviation degree characterization value and the fermentation quality score corresponding to the sample yeast, the abnormal characterization value of the environmental parameter type D at the current fermentation monitoring moment is obtained.

9. A method for real-time monitoring of thermostable yeast micro-fermentation according to claim 8, characterized in that: The method for obtaining the deviation degree representation value includes: For the f-th matching environment sequence in the matching set corresponding to the current target environment parameter sequence d, the normalized result of the absolute value of the difference between the last parameter in the current target environment parameter sequence d and the last parameter in the f-th matching environment sequence is recorded as the first index value, the normalized result of the absolute value of the difference between the slope of the current target environment parameter sequence d and the slope of the f-th matching environment sequence is recorded as the second index value, and the result of multiplying the weighted sum of the first index value and the second index value by the weight index value corresponding to the sample yeast to which the f-th matching environment sequence belongs is recorded as the deviation degree representation value between the current target environment parameter sequence d and the f-th matching environment sequence.

10. The method for real-time monitoring of thermostable yeast micro-fermentation according to claim 7, characterized in that: The method for obtaining the abnormal characterization value of the environmental parameter type D includes: Obtain a set of weighted deviation degree characterization values ​​corresponding to the environmental parameter type D, accumulate all weighted deviation degree characterization values ​​in the weighted deviation degree characterization value set and then perform normalization processing on the result as the abnormal characterization value of the environmental parameter type D at the current fermentation monitoring moment; the h-th weighted deviation degree characterization value in the weighted deviation degree characterization value set is the result of multiplying the deviation degree characterization value between the current target environmental parameter sequence d and the h-th matching environmental sequence in the matching set corresponding to the current target environmental parameter sequence d by the fermentation quality score corresponding to the sample yeast to which the h-th matching environmental sequence belongs.

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