Radio frequency module, test method and electronic equipment

Abstract

The invention relates to a radio frequency module, a test method and electronic equipment. The radio frequency module comprises: a radio frequency transceiver chip, wherein the radio frequency transceiver chip comprises a transmitting port and a first power detection port; the radio frequency front end module is used for processing the radio frequency signal input by the first end and outputting the processed radio frequency signal through the second end of the radio frequency front end module; a radio frequency test seat and a coupling module; when different test types of tests are carried out on the radio frequency module, the radio frequency link between the radio frequency test socket and the coupling module is in different on-off states. The coupling module is used for sending a first coupling signal coupled from the radio frequency link to the first power detection port when the radio frequency link is in the on state, and the first coupling signal is used for the radio frequency transceiver chip to determine the test type of the radio frequency module. According to the radio frequency module provided by the invention, different test types can be conveniently and quickly distinguished.

Description

Technical Field

[0001] The present application relates to the field of radio frequency technology, and in particular to a radio frequency module, a testing method, and an electronic device. Background Art

[0002] With the popularity of electronic devices such as mobile phones, the performance requirements for electronic devices are becoming increasingly higher. To ensure the communication performance of electronic devices, various types of tests are currently performed on electronic devices based on relevant communication indicators, such as whole device testing and board-level testing.

[0003] Different test types use different test parameters. How to quickly and conveniently distinguish different test types and then call the test parameters corresponding to the test type for testing has become an urgent problem to be solved. Summary of the Invention

[0004] Based on this, it is necessary to provide a radio frequency module that can easily and quickly distinguish different test types.

[0005] In a first aspect, a radio frequency module is provided, comprising:

[0006] A radio frequency transceiver chip, the radio frequency transceiver chip comprising a transmitting port and a first power detection port;

[0007] A radio frequency front-end module, wherein a first end of the radio frequency front-end module is connected to the transmitting port, and the radio frequency front-end module is used to process the radio frequency signal input by the first end and output the processed radio frequency signal through the second end of the radio frequency front-end module;

[0008] A radio frequency test socket and a coupling module, wherein the second end of the radio frequency front-end module is connected to one end of the radio frequency test socket, the coupling module is connected to the other end of the radio frequency test socket and the first power detection port respectively, and the coupling module is also connected to the antenna module;

[0009] In which, when the RF module is tested with different test types, the RF link between the RF test socket and the coupling module is in different on-off states; the coupling module is used to send the first coupling signal coupled from the RF link to the first power detection port when the RF link is in the on state, and the first coupling signal is used by the RF transceiver chip to determine the test type of the RF module.

[0010] In a second aspect, a testing method is provided for use in a radio frequency transceiver chip included in the radio frequency module described in any one of the above items, the method comprising:

[0011] Detecting whether a first power detection port of the radio frequency transceiver chip receives a first coupling signal, and obtaining a detection result;

[0012] Determine the test type of the RF module based on the detection result.

[0013] According to a third aspect, an electronic device is provided, comprising the radio frequency module described in any one of the above items.

[0014] The beneficial effects of the technical solutions provided in the embodiments of the present application include at least:

[0015] The RF module of the embodiment of the present application includes: an RF transceiver chip, an RF front-end module, an RF test socket, and a coupling module. The RF transceiver chip includes a transmit port and a first power detection port. The first end of the RF front-end module is connected to the transmit port, the second end of the RF front-end module is connected to one end of the RF test socket, and the coupling module is connected to the other end of the RF test socket and the first power detection port, respectively. The coupling module is also connected to the antenna module. In this way, when the RF module is tested with different test types, the RF transceiver chip transmits the RF signal to the first end of the RF front-end module through the transmitting port. After the RF front-end module processes the RF signal input from the first end, the processed RF signal is output to one end of the RF test socket through the second end. Due to different test types, the RF link between the RF test socket and the coupling module can be in different on-off states, so that the RF test socket can transmit the RF signal to the coupling module when the RF link is turned on, so that the coupling module can send the first coupled signal coupled from the RF link to the first power detection port, or the RF test socket cannot transmit the RF signal to the coupling module when the RF link is disconnected, so that the coupling module cannot send the first coupled signal coupled from the RF link to the first power detection port, thereby enabling the RF transceiver chip to quickly and conveniently determine the test type of the RF module based on whether the first power detection port receives the first coupled signal, thereby realizing convenient and rapid distinction between different test types. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the conventional technology, the following briefly introduces the drawings required for use in the embodiments or the conventional technology descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 This is a schematic diagram of a radio frequency module in one embodiment of the present application;

[0018] Figure 2 This is a schematic diagram of a radio frequency module in another embodiment of the present application;

[0019] Figure 3 This is a schematic diagram of a radio frequency module in another embodiment of the present application;

[0020] Figure 4 This is a schematic diagram of a radio frequency module in another embodiment of the present application;

[0021] Figure 5 This is a flow chart of a testing method in one embodiment of the present application;

[0022] Figure 6 This is a flow chart of step 502 in one embodiment of the present application;

[0023] Figure 7 This is a schematic diagram of a testing device in one embodiment of the present application;

[0024] Figure 8 This is a diagram of the internal structure of an electronic device in one embodiment of the present application.

[0025] Description of reference numerals:

[0026] 10-RF transceiver chip, 20-RF front-end module, 30-RF test socket, 40-coupling module, 101-transmitting port, 102-first power detection port, 103-second power detection port, 201-first end, 202-second end, 203-third end, 401-coupler. DETAILED DESCRIPTION

[0027] To facilitate understanding of the present application, the present application will be described more fully below with reference to the accompanying drawings. The accompanying drawings provide embodiments of the present application. However, the present application may be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to make the disclosure of the present application more thorough and comprehensive.

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application pertains. The terms used herein in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application.

[0029] It will be understood that the terms "first," "second," etc., used herein may be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, a first resistor may be referred to as a second resistor, and similarly, a second resistor may be referred to as a first resistor without departing from the scope of this application. The first resistor and the second resistor are both resistors, but they are not the same resistor.

[0030] It can be understood that the “connection” in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if there is transmission of electrical signals or data between the connected circuits, modules, units, etc.

[0031] As used herein, the singular forms "a," "an," and "the" may also include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include," "comprising," "having," and the like specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Furthermore, the term "and / or" as used in this specification includes any and all combinations of the relevant listed items.

[0032] To ensure the communication performance of electronic devices, various types of tests are required, such as full-device testing and board-level testing. Different test types use different test parameters, so electronic devices need to be able to identify different test types. Therefore, a method is needed to quickly and easily distinguish between different test types.

[0033] In view of this, an embodiment of the present application provides a radio frequency module that can quickly and easily distinguish different test types. The radio frequency module provided in an embodiment of the present application is exemplarily described below with reference to the accompanying drawings.

[0034] The radio frequency module provided in the embodiments of the present application can be used in electronic devices with wireless communication functions, which may be personal computers, laptops, smart phones, tablets, Internet of Things devices and portable wearable devices. The Internet of Things devices may be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc., and the portable wearable devices may be smart watches, smart bracelets, head-mounted devices, etc.

[0035] See Figure 1 In the embodiment of the present application, the RF module includes: a RF transceiver chip 10, a RF front-end module 20, a RF test socket 30 and a coupling module 40.

[0036] Please continue to see Figure 1The RF transceiver chip 10 includes a transmitting port 101 and a first power detection port 102. The first end 201 of the RF front-end module 20 is connected to the transmitting port 101. The RF front-end module 20 is configured to process the RF signal input by the first end 201 and output the processed RF signal through the second end 202 of the RF front-end module 20. The second end 202 of the RF front-end module 20 is connected to one end of the RF test socket 30. The coupling module 40 is connected to the other end of the RF test socket 30 and the first power detection port 102, respectively. The coupling module 40 is also connected to the antenna module.

[0037] The RF transceiver chip 10 is an integrated circuit that integrates RF receiving and transmitting functions and is a core component of wireless communication devices. The RF transceiver chip 10 serves to bridge the gap between baseband and RF signals. For example, it converts the low-frequency digital signal (after modulation) output by the baseband module into a high-frequency RF signal and transmits it through a transmit port 101. The RF transceiver chip 10 can be one that supports the 5G Wi-Fi band, for example, a WCN (Wireless Connectivity Network) chip. The transmit port 101 of the RF transceiver chip 10 is used to transmit RF signals. The first power detection port 102 of the RF transceiver chip 10 is an interface for monitoring RF signal power. Optionally, in this embodiment, the first power detection port 102 can determine a detection result based on whether a signal is received, or alternatively, the first power detection port 102 can determine a detection result based on the power or strength of the received signal.

[0038] The WCN chip is the core chipset responsible for non-cellular wireless communication functions, primarily responsible for 5G Wi-Fi signal transmission, reception, and modulation and demodulation. In addition to 5G CH0 (5th Generation Mobile Communication Technology Channel 0) and 5G CH1 (5th Channel 1), the WCN chip also includes 5G CH2 (5th Channel 2). However, in actual development, due to development cost considerations, the 5G CH2 channel is idle. Therefore, the RF module provided in the embodiments of this application can utilize the 5G CH2 channel to implement different test types.

[0039] The RF front-end module 20 primarily includes components such as a PA (power amplifier), a switch, an LNA (low noise amplifier), a filter, and a duplexer. These components combine to form the RF signal transmission link and the RF signal reception path. For example, the PA is provided in the RF signal transmission link, and the LNA is provided in the RF signal reception path. Of course, the RF signal transmission link and the RF signal reception path can also reuse some components, such as switches. The RF front-end module 20 can be, for example, a conventional front-end module product. The RF front-end module 20 includes a low-noise amplifier module, which can be one or more LNAs. The RF transceiver chip 10 is connected to the RF front-end module 20. During RF signal reception, the antenna outside the RF module receives the RF signal. After the RF signal enters the RF front-end module 20 and reaches the low-noise amplifier module, the low-noise amplifier module needs to operate to amplify the RF signal. In this embodiment, the RF front-end module 20 can perform a series of RF-level processing on the RF signal input from the first end 201 to obtain a processed RF signal, and output the processed RF signal through the second end 202 of the RF front-end module 20, so that the processed RF signal output from the second end 202 can meet the requirements of subsequent signal transmission and processing.

[0040] Among them, the RF test socket 30 is an interface device for connecting the RF chip or device with the test machine, and plays a key role in RF testing. The RF test socket 30 may include a test socket housing, a test socket conventional probe and an RF coaxial connector. Among them, the coupling module 40 is an electronic module for realizing signal coupling (i.e., signal transmission, distribution, mixing or isolation). The working essence of the coupling module 40 is to use electromagnetic induction, capacitance effect, resistance voltage division or direct connection to transfer part or all of the signal energy in one circuit to another circuit while minimizing interference to the original circuit. Among them, the RF link refers to the path between the RF test socket 30 and the coupling module 40. In this embodiment, the RF test socket 30 can transmit the received processed RF signal to the coupling module 40 when the RF link is turned on, so that the coupling module 40 can couple out the first coupling signal.

[0041] Optionally, during the testing of the RF module, the RF link can be disconnected by buckling the buckle of the RF test socket 30, so that the coupling module 40 cannot be coupled to the first coupling signal, and thus the first coupling signal cannot be transmitted to the first power detection module; or, the RF link can be turned on by not buckling the buckle of the RF test socket 30, so that the coupling module 40 can be coupled to the first coupling signal, thereby transmitting the first coupling signal to the first power detection module, and turning on the link between the RF link and the antenna module.

[0042] It should be noted that the coupling module 40 needs to be set between the RF test socket 30 and the antenna module, so that by controlling whether the RF test socket 30 is clipped, the RF link between the RF test socket 30 and the coupling module 40 can be controlled to be in different on-off states. Optionally, during the test process, if the RF test socket 30 is clipped, the signal cannot be transmitted to the coupling module 40; if the RF test socket 30 is not clipped, the signal can be transmitted to the coupling module 40.

[0043] In this embodiment, when the RF module is tested with different test types, the RF signal can be transmitted to the first end 201 of the RF front-end module 20 through the transmitting port 101 of the RF transceiver chip 10. The RF front-end module 20 can process the RF signal input from the first end 201 and output the processed RF signal to the RF test socket 30 through the second end 202 of the RF front-end module 20. Then, the RF test socket 30 can transmit the received processed RF signal to the coupling module 40 through the other end when the RF link is turned on. Then, the coupling module 40 can couple a first coupled signal from the signal transmitted by the RF link and send the first coupled signal to the first power detection port 102 of the RF transceiver chip 10. Then, the RF transceiver chip 10 can determine the test type of the RF module based on the first coupled signal.

[0044] Optionally, the RF transceiver chip 10 can determine that the test type is test A when the first coupling signal is received, and determine that the test type is test B when the first coupling signal is not received; or, the RF transceiver chip 10 can also determine whether the power of the first coupling signal reaches a preset power threshold when the first coupling signal is received, and determine that the test type is test A if the power reaches the preset power threshold, and determine that the test type is test B if the power reaches the preset power threshold.

[0045] The RF module includes an RF transceiver chip, an RF front-end module, an RF test socket, and a coupling module. The RF transceiver chip includes a transmit port and a first power detection port. The first end of the RF front-end module is connected to the transmit port, the second end of the RF front-end module is connected to one end of the RF test socket, and the coupling module is connected to the other end of the RF test socket and the first power detection port, respectively. The coupling module is also connected to the antenna module. In this way, when the RF module is tested with different test types, the RF transceiver chip transmits the RF signal to the first end of the RF front-end module through the transmitting port. After the RF front-end module processes the RF signal input from the first end, the processed RF signal is output to one end of the RF test socket through the second end. Due to different test types, the RF link between the RF test socket and the coupling module can be in different on-off states, so that the RF test socket can transmit the RF signal to the coupling module when the RF link is turned on, so that the coupling module can send the first coupled signal coupled from the RF link to the first power detection port, or the RF test socket cannot transmit the RF signal to the coupling module when the RF link is disconnected, so that the coupling module cannot send the first coupled signal coupled from the RF link to the first power detection port, thereby enabling the RF transceiver chip to quickly and conveniently determine the test type of the RF module based on whether the first power detection port receives the first coupled signal, thereby realizing convenient and rapid distinction between different test types.

[0046] In one possible implementation, Figure 2 As shown, the coupling module 40 includes a coupler 401 . The input end of the coupler 401 is connected to the other end of the RF test socket 30 , the through end of the coupler 401 is connected to the antenna module, and the coupling end of the coupler 401 is connected to the first power detection port 102 .

[0047] Coupler 401 is the core component of coupling module 40 responsible for extracting a portion of the signal energy from the RF link as the first coupled signal while ensuring normal transmission of the main path signal. The input end of coupler 401 receives the input signal, the through-end transmits the majority of the input signal's energy, and the coupled end extracts a portion of the signal energy from the input signal as the coupled signal.

[0048] Optionally, the coupling module 40 may further include other auxiliary components such as an attenuator, a filter, a radio frequency switch, a matching network, and a protection circuit.

[0049] Optionally, coupler 401 may be a waveguide coupler, a coaxial coupler, a fiber coupler, or the like. Preferably, coupler 401 provided in the embodiments of the present application may be a microstrip coupler. Microstrip couplers are compact and easy to integrate, thus reducing the cost of the RF module provided in the embodiments of the present application.

[0050] In this embodiment, the input end of the coupler 401 is connected to the other end of the RF test socket 30, and can receive the processed RF signal transmitted by the RF test socket 30 when the RF link between the RF test socket 30 and the coupler 401 is conductive, and continue to transmit most of the energy of the processed RF signal to the antenna module through the through end, and extract part of the signal energy from the processed RF signal through the coupling end as a first coupled signal, and transmit the first coupled signal to the first power detection port 102.

[0051] In this embodiment, the coupling module includes a coupler, the input end of the coupler is connected to the other end of the RF test socket, the straight-through end of the coupler is connected to the antenna module, and the coupling end of the coupler is connected to the first power detection port. In this way, the coupling module can receive the processed RF signal transmitted by the RF test socket, and transmit most of the signal energy to the antenna module through the straight-through end, and transmit part of the signal to the first power detection port through the coupling end, thereby realizing the test including the antenna module and enabling the RF transceiver chip to quickly determine the test type according to the received signal; in addition, the coupler included in the coupling module can quickly distinguish the test type of the RF module, and its implementation principle is simple and the cost is low.

[0052] In the above Figure 2 Based on this, in one embodiment, when the RF module is tested using the RF test socket 30 for the first test type, the RF link between the RF test socket 30 and the coupling module 40 is disconnected, and the first test type includes at least board-level testing. When the RF module is tested using the second test type, the RF link between the RF test socket 30 and the coupling module 40 is connected, and the second test type includes at least whole-device testing.

[0053] The testing process of electronic equipment usually includes whole-machine testing and board-level testing. Among them, board-level testing is a special test for the connectivity, functional integrity, performance parameters and reliability of the hardware circuit of the electronic circuit board (such as PCB board, module board) after assembly is completed, for example, testing the RF module. Whole-machine testing is a comprehensive verification of the overall function, performance, reliability and compliance of the electronic equipment or system after assembly. In this embodiment, the first test type may include board-level testing, and the second test type may include whole-machine testing, for example, testing an electronic device including a RF module and an antenna module.

[0054] It is understood that during board-level testing, the RF signal does not need to be sent to the antenna module. Therefore, the RF link between the RF test socket 30 and the coupling module 40 can be disconnected to prevent the RF signal from flowing to the coupling module 40, thereby avoiding the problem of the returned test signal being too low in power. During full-device testing, the RF signal needs to be sent to the antenna module. The RF link between the RF test socket 30 and the coupling module 40 can be opened to allow the signal to be transmitted to the antenna module through the coupling module 40.

[0055] In this embodiment, when the RF module is tested for the first test type through the RF test socket 30, the RF link between the RF test socket 30 and the coupling module 40 is in a disconnected state. At this time, it can be determined that the test type of the RF module is the first test type, and the corresponding power sending RF signal of the board-level test can be called. When the RF module is tested for the second test type, the RF link between the RF test socket 30 and the coupling module 40 is in a conductive state. At this time, it can be determined that the test type of the RF module is the second test type, and the corresponding power sending RF signal of the whole machine test can be called.

[0056] It should be noted that during the test process, the power of the RF signal used for the whole device test is different from the power of the RF signal used for the board-level test. The power of the RF signal used for the board-level test is lower than the power of the RF signal used for the whole device test.

[0057] Since the RF signal power does not meet the standard, the power of the RF signal in the board-level test cannot be used for the whole machine test; since too high RF signal power will damage the RF transceiver chip 10, the power of the RF signal in the whole machine test cannot be used for board-level testing.

[0058] In this embodiment, when the RF module is tested with the RF test socket for the first test type, the RF link between the RF test socket and the coupling module is in a disconnected state; and when the RF module is tested with the second test type, the RF link between the RF test socket and the coupling module is set to be in a conductive state, so that the corresponding test type can be quickly determined by the RF link between the RF test socket and the coupling module being in different on-off states, and then the transmission power corresponding to different test types can be called.

[0059] Based on the above embodiment, the RF transceiver chip 10 can determine whether the test type of the RF module is the first test type or the second test type. The specific process of determining the first test type and the second test type is described in detail below.

[0060] In one embodiment, see Figure 2The RF transceiver chip 10 is configured to determine that the test type is the second test type when the first coupling signal is detected through the first power detection port 102 .

[0061] It should be noted that, since the RF link between the RF test socket 30 and the coupling module 40 is in a conductive state when the RF module is tested for the second test type, the coupling module 40 can receive the signal transmitted by the RF test socket 30, send the signal to the antenna module through the through-end, and obtain the first coupled signal through the coupling end, so that the first coupled signal can be transmitted to the first detection port.

[0062] In this embodiment, the RF transceiver chip 10 may determine that the RF link is directly connected to the antenna when the first coupling signal is detected through the first power detection port 102 , thereby determining that the test type is the second test type.

[0063] In this embodiment, when the RF transceiver chip detects the first coupled signal through the first power detection port, since the coupler is connected to the antenna module, it can accurately determine that the signal can be sent to the antenna module, thereby quickly and accurately determining that the test type is a whole machine test, that is, the second test type.

[0064] In another embodiment, see Figure 3 The RF transceiver chip 10 further includes a second power detection port 103 , and the third end 203 of the RF front-end module 20 is connected to the second power detection port 103 .

[0065] The RF front-end module 20 is further configured to send a second coupled signal coupled from the RF front-end module 20 to the second power detection port 103. The RF transceiver chip 10 is further configured to determine that the test type is the first test type when the first coupled signal is not detected through the first power detection port 102 and the second coupled signal is detected through the second power detection port 103.

[0066] The second power detection port 103 is a port in the RF transceiver chip 10 for detecting whether a signal is received.

[0067] The RF front-end module 20 may also include a coupler 401. The second coupled signal refers to a signal obtained by the coupler 401 in the RF front-end module 20 coupling the received signal.

[0068] It should be noted that, when the RF module is tested with the RF test socket 30 for the first test type, the RF link between the RF test socket 30 and the coupling module 40 is in a disconnected state. Therefore, the coupling module 40 cannot receive the signal transmitted by the RF test socket 30, and thus cannot transmit the first coupled signal to the first detection port. Therefore, the first power detection port 102 cannot detect the first coupled signal; at the same time, the RF front-end module 20 can send the second coupled signal to the second power detection port 103, so the second power detection port 103 can detect the second coupled signal.

[0069] In this embodiment, when the RF front-end module 20 receives a signal, it can couple a second coupled signal from the signal and send the second coupled signal to the second power detection port 103 through the third end 203, so that the second power detection port 103 can detect the second coupled signal, and when the first power detection port 102 does not detect the first coupled signal, it can be determined that the signal is not transmitted to the antenna module, and thus the test type can be determined to be the first test type.

[0070] In this embodiment, the RF transceiver chip also includes a second power detection port, and the third end of the RF front-end module is connected to the second power detection port. The RF front-end module can send the second coupled signal coupled from the RF front-end module to the second power detection port, so that when the first coupled signal is not detected through the first power detection port and the second coupled signal is detected through the second power detection port, it can be accurately determined that the signal is not transmitted to the antenna module, and then the test type can be quickly and accurately determined to be a board-level test, that is, the first test type.

[0071] Please continue to see Figure 3 In one embodiment, the RF transceiver chip 10 is further configured to determine that a faulty component exists in the RF path between the RF front-end module 20 and the coupling module 40 when a first coupling signal is detected through the first power detection port 102 and a second coupling signal is detected through the second power detection port 103, and when a first power of the first coupling signal is less than a first threshold and a second power of the second coupling signal is greater than a second threshold.

[0072] It is understood that, if the test is normal, the power of the first coupled signal received by the first power detection port 102 must reach a preset threshold, and the power of the second coupled signal received by the second power detection port 103 must also reach a preset threshold. In this embodiment, the threshold that the power of the first coupled signal must reach is determined as the first threshold, and the threshold that the power of the second coupled signal must reach is determined as the second threshold.

[0073] Among them, in addition to the RF test socket 30, the RF path between the RF front-end module 20 and the coupling module 40 may also include devices such as filters and combiners. If the second power of the second coupling signal is greater than the second threshold, it can be determined that there is no faulty device in the RF link between the RF front-end module 20 and the second power detection port 103, that is, it can be determined that there is no fault in the RF front-end module 20. At this time, if the first power of the first coupling signal is less than the first threshold, it means that the coupling module 40 can be coupled to the first coupling signal, and the power of the first coupling signal is less than the normal value, then it can be determined that there is a faulty device in the RF path between the RF front-end module 20 and the coupling module 40, resulting in a reduction in the power of the signal transmitted to the coupling module 40, thereby causing the power of the first coupling signal to be less than the first threshold.

[0074] In this embodiment, the RF transceiver chip 10 can determine that there is no faulty component in the RF link between the RF front-end module 20 and the second power detection port 103 when a first coupling signal is detected through the first power detection port 102 and a second coupling signal is detected through the second power detection port 103, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold. Thus, it can be determined that there is a faulty component in the RF path between the RF front-end module 20 and the coupling module 40.

[0075] As a possible implementation, if the second power detection port 103 cannot detect the second coupled signal, it can be determined that there is a faulty component between the RF front-end module 20 and the second power detection port 103 .

[0076] In this embodiment, when the RF transceiver chip detects a first coupling signal through the first power detection port and a second coupling signal through the second power detection port, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold, it can determine that there is no faulty component in the RF link between the RF front-end module and the second power detection port, and that there is no fault in the RF front-end module. This can quickly determine that there is a faulty component in the RF path between the RF front-end module and the coupling module, and then can repair the faulty component, thereby improving the reliability of the whole machine test.

[0077] See below Figure 4 , taking the first test type as the whole machine test and the second test type as the board-level test as an example, the process of determining the test type of the RF module is explained. Figure 4The RF module includes a WCN chip, a 5G FEM (5G Front-End Module), an RF test socket, and a coupler. The WCN chip includes an A1_TX (A1_Transmit) port, an A2_TX port, an A1_PDET (A1_Power Detection) port, and an A2_PDET port. The A1_PDET port can be the 5G CH1 PDET port in the WCN chip, and the A2_PDET port can be the 5G CH2 PDET port in the WCN chip. The first end of the 5G FEM is connected to the A1_TX and A2_TX ports, respectively. The second end of the 5G FEM is connected to one end of the RF test socket, and the third end of the 5G FEM is connected to the 5G CH1 PDET port. The coupler is connected to the other end of the RF test socket and the 5G CH2 PDET port, respectively. The coupler is also connected to the antenna module.

[0078] 1) During full-device testing, the RF test socket's snap-in cable is unfastened, indicating that the RF link between the RF test socket and the coupling module is in a conductive state. This RF link directly connects to the antenna module. At this point, the coupler near the antenna module can feed the coupled first signal back to the WCN chip's 5G CH2 PDET port. When the 5G CH2 PDET port detects signal power, it determines that the RF module is in full-device testing and transmits RF signals at the appropriate transmit power for full-device testing.

[0079] 2) When performing board-level testing, the buckle of the RF test socket is buckled, that is, the RF link between the RF test socket and the coupling module is in the on state. At this time, the coupler close to the antenna module cannot couple to the first coupling signal, so the 5GCH2 PDET port cannot detect the signal power; and the second coupling signal coupled by the 5G FEM can be sent to the 5G CH1PDET port, then the 5G CH1 PDET can detect the signal power, and the board-level test can be removed. The corresponding transmit power of the board-level test is called to transmit the RF signal for board-level testing.

[0080] In one embodiment, Figure 5 As shown, a testing method is provided, which can be applied to the RF transceiver chip included in the above-mentioned RF module, and the testing method includes:

[0081] Step 501: Detect whether a first power detection port of a radio frequency transceiver chip receives a first coupling signal, and obtain a detection result.

[0082] Among them, the first power detection port is used to monitor and control the power of the radio frequency signal, and can measure the power level of the transmitted signal or the received signal in real time, and provide feedback for the power control loop inside the radio frequency transceiver chip or the external control system. The first coupling signal is obtained by coupling the input signal by the coupling module. In this embodiment, the radio frequency transceiver chip can use the signal detection device to monitor in real time or periodically detect whether there is an output signal at the first power detection port to obtain a detection result. Optionally, if the first power detection port has an output signal, it can be determined that the detection result is that the first power detection port has received the first coupling signal; if the first power detection port has no output signal, it can be determined that the detection result is that the first power detection port has not received the first coupling signal.

[0083] Step 502: Determine the test type of the RF module based on the test result.

[0084] It should be noted that different test results indicate different test types for the RF module. If the first power detection port receives the first coupled signal, it can be determined to correspond to the first test type; if the first power detection port does not receive the first coupled signal, it can be determined to correspond to the second test type.

[0085] In this embodiment, the RF transceiver chip can determine that the test type of the RF module is the first test type when the detection result is that the first power detection port receives the first coupling signal, and determine that the test type of the RF module is the second test type when the detection result is that the first power detection port does not receive the first coupling signal.

[0086] In this embodiment, a detection result is obtained by detecting whether the first power detection port of the RF transceiver chip receives the first coupling signal, so that the test type of the RF module can be quickly and accurately determined based on the detection result.

[0087] In one embodiment, the step 502 includes:

[0088] When the detection result is that the first coupled signal is detected through the first power detection port, the test type is determined to be the second test type, and the second test type at least includes a whole-device test.

[0089] In this embodiment, when the detection result is that the first coupling signal is detected through the first power detection port, it can be determined that the RF signal sent by the RF transceiver chip is transmitted to the antenna module, and then the test type can be determined as a whole machine test. At this time, the test type can be determined as the second test type.

[0090] In another embodiment, Figure 6 As shown, the above step 502 includes:

[0091] Step 601: If the detection result is that the first coupling signal is not detected through the first power detection port, detect whether the second power detection port of the radio frequency transceiver chip receives the second coupling signal;

[0092] Step 602: When a second coupled signal is detected through the second power detection port, determine that the test type is a first test type, where the first test type at least includes a board-level test.

[0093] In this embodiment, when the detection result is that the first coupling signal is not detected through the first power detection port, it can be determined that the RF signal sent by the RF transceiver chip is not transmitted to the antenna module, that is, the test type is not the second test type. At this time, it can be detected whether the second power detection port of the RF transceiver chip receives the second coupling signal, and when the second coupling signal is detected through the second power detection port, it can be determined that the test type is a board-level test. At this time, it can be determined that the test type is the first test type.

[0094] In this embodiment, the RF transceiver chip can quickly determine that the test type is the second test type when the detection result is that the first coupled signal is detected through the first power detection port, and determine that the test type is not the second test type when the detection result is that the first coupled signal is not detected through the first power detection port, and detect whether the second power detection port of the RF transceiver chip receives the second coupled signal. In this way, when the second coupled signal is detected through the second power detection port, the test type can be quickly determined to be the first test type, thereby improving the efficiency of determining the test type.

[0095] In one embodiment, the testing method further comprises:

[0096] When a first coupling signal is detected through the first power detection port and a second coupling signal is detected through the second power detection port of the RF transceiver chip, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold, it is determined that there is a faulty component in the RF path between the RF front-end module and the coupling module.

[0097] It should be noted that when the test process is normal, the first coupling signal fed back to the first power detection port and the second coupling signal fed back to the second power detection port should both meet the preset power threshold requirements. If the second power of the second coupling signal is greater than the second threshold, it can be determined that there is no fault in the RF front-end module. At this time, if the first coupling signal does not reach the first threshold, it can be determined that there is a faulty device in the RF path between the RF front-end module and the coupling module.

[0098] In this embodiment, the RF transceiver chip can determine that there is no faulty component in the RF link between the RF front-end module and the second power detection port when a first coupling signal is detected through the first power detection port and a second coupling signal is detected through the second power detection port, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold. That is, there is no fault in the RF front-end module, and thus it can be determined that there is a faulty component in the RF path between the RF front-end module and the coupling module.

[0099] In this embodiment, when the RF transceiver chip detects a first coupling signal through the first power detection port and a second coupling signal through the second power detection port, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold, it can determine that there is no faulty component in the RF link between the RF front-end module and the second power detection port, and that there is no fault in the RF front-end module. This can quickly determine that there is a faulty component in the RF path between the RF front-end module and the coupling module, and then can repair the faulty component, thereby improving the reliability of the whole machine test.

[0100] It should be understood that, although the steps in the flowcharts of the above embodiments are shown in sequence as indicated by the arrows, these steps are not necessarily performed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be performed in other orders. Moreover, at least a portion of the steps in the flowcharts of the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily performed at the same time, but can be performed at different times. The execution order of these steps or stages is not necessarily to be performed in sequence, but can be performed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0101] Based on the same inventive concept, the present application also provides a testing device for implementing the aforementioned testing method. The solution provided by this device is similar to the solution described in the aforementioned method. Therefore, the specific limitations of one or more testing device embodiments provided below can be found in the above-mentioned limitations of the testing method and will not be repeated here.

[0102] In one embodiment, Figure 7 As shown, a testing device is provided, including: a detection module 701 and a first determination module 702, wherein:

[0103] The detection module 701 is configured to detect whether a first power detection port of the radio frequency transceiver chip receives a first coupling signal, and obtain a detection result.

[0104] The first determination module 702 is configured to determine a test type of the RF module according to the detection result.

[0105] In one embodiment, the first determining module 702 includes:

[0106] The first determining unit is configured to, when the detection result is that the first coupled signal is detected through the first power detection port, determine that the test type is a second test type, where the second test type at least includes a whole-device test.

[0107] In one embodiment, the first determining module 702 includes:

[0108] A detection unit, configured to detect whether a second power detection port of the radio frequency transceiver chip receives a second coupling signal when a detection result shows that no first coupling signal is detected through the first power detection port;

[0109] The second determining unit is configured to determine, when a second coupled signal is detected through the second power detection port, that the test type is a first test type, where the first test type at least includes a board-level test.

[0110] In one embodiment, the apparatus further comprises:

[0111] The first determination module is configured to determine that a faulty component exists in the RF path between the RF front-end module and the coupling module when a first coupling signal is detected through the first power detection port, a second coupling signal is detected through the second power detection port of the RF transceiver chip, and a first power of the first coupling signal is less than a first threshold and a second power of the second coupling signal is greater than a second threshold.

[0112] Each module in the above-mentioned test device can be implemented in whole or in part through software, hardware, or a combination thereof. Each module can be embedded in or independent of the processor in the computer device in hardware form, or can be stored in the memory of the computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0113] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Figure 8As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O) and a communication interface. The processor, memory and input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and computer program in the non-volatile storage medium. The database of the computer device is used to store test data. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a test method is implemented.

[0114] Those skilled in the art will understand that Figure 8 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0115] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0116] Detecting whether a first power detection port of the radio frequency transceiver chip receives a first coupling signal, and obtaining a detection result;

[0117] Determine the test type of the RF module based on the test results.

[0118] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0119] When the detection result is that the first coupled signal is detected through the first power detection port, the test type is determined to be the second test type, and the second test type at least includes a whole-device test.

[0120] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0121] If the detection result is that the first coupling signal is not detected through the first power detection port, detecting whether the second power detection port of the radio frequency transceiver chip receives the second coupling signal;

[0122] In a case where the second coupled signal is detected through the second power detection port, the test type is determined to be a first test type, and the first test type at least includes a board-level test.

[0123] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0124] When a first coupling signal is detected through the first power detection port and a second coupling signal is detected through the second power detection port of the RF transceiver chip, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold, it is determined that there is a faulty component in the RF path between the RF front-end module and the coupling module.

[0125] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0126] Detecting whether a first power detection port of the radio frequency transceiver chip receives a first coupling signal, and obtaining a detection result;

[0127] Determine the test type of the RF module based on the test results.

[0128] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0129] When the detection result is that the first coupled signal is detected through the first power detection port, the test type is determined to be the second test type, and the second test type at least includes a whole-device test.

[0130] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0131] If the detection result is that the first coupling signal is not detected through the first power detection port, detecting whether the second power detection port of the radio frequency transceiver chip receives the second coupling signal;

[0132] In a case where the second coupled signal is detected through the second power detection port, the test type is determined to be a first test type, and the first test type at least includes a board-level test.

[0133] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0134] When a first coupling signal is detected through the first power detection port and a second coupling signal is detected through the second power detection port of the RF transceiver chip, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold, it is determined that there is a faulty component in the RF path between the RF front-end module and the coupling module.

[0135] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0136] Detecting whether a first power detection port of the radio frequency transceiver chip receives a first coupling signal, and obtaining a detection result;

[0137] Determine the test type of the RF module based on the test results.

[0138] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0139] When the detection result is that the first coupled signal is detected through the first power detection port, the test type is determined to be the second test type, and the second test type at least includes a whole-device test.

[0140] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0141] If the detection result is that the first coupling signal is not detected through the first power detection port, detecting whether the second power detection port of the radio frequency transceiver chip receives the second coupling signal;

[0142] In a case where the second coupled signal is detected through the second power detection port, the test type is determined to be a first test type, and the first test type at least includes a board-level test.

[0143] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0144] When a first coupling signal is detected through the first power detection port and a second coupling signal is detected through the second power detection port of the RF transceiver chip, and the first power of the first coupling signal is less than the first threshold and the second power of the second coupling signal is greater than the second threshold, it is determined that there is a faulty component in the RF path between the RF front-end module and the coupling module.

[0145] Throughout this specification, references to terms such as "some embodiments," "other embodiments," and "desired embodiments" indicate that a particular feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present application. The schematic descriptions of these terms throughout this specification do not necessarily refer to the same embodiment or example.

[0146] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0147] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art could make various modifications and improvements without departing from the spirit of the present application, all of which fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.

Claims

1. A radio frequency module, characterized in that: The radio frequency module includes: A radio frequency transceiver chip, the radio frequency transceiver chip comprising a transmitting port and a first power detection port; A radio frequency front-end module, wherein a first end of the radio frequency front-end module is connected to the transmitting port, and the radio frequency front-end module is used to process the radio frequency signal input by the first end and output the processed radio frequency signal through the second end of the radio frequency front-end module; A radio frequency test socket and a coupling module, wherein the second end of the radio frequency front-end module is connected to one end of the radio frequency test socket, the coupling module is connected to the other end of the radio frequency test socket and the first power detection port respectively, and the coupling module is also connected to the antenna module; In which, when the RF module is tested with different test types, the RF link between the RF test socket and the coupling module is in different on-off states; the coupling module is used to send the first coupling signal coupled from the RF link to the first power detection port when the RF link is in the on state, and the first coupling signal is used by the RF transceiver chip to determine the test type of the RF module.

2. The radio frequency module according to claim 1, wherein: The coupling module includes a coupler; The input end of the coupler is connected to the other end of the radio frequency test socket, the through end of the coupler is connected to the antenna module, and the coupling end of the coupler is connected to the first power detection port.

3. The radio frequency module according to claim 2, wherein: The coupler is a microstrip coupler.

4. The radio frequency module according to claim 1, wherein: When the RF module is tested by the RF test socket in a first test type, the RF link between the RF test socket and the coupling module is disconnected, and the first test type includes at least a board-level test; When the RF module is subjected to a second test type test, the RF link between the RF test socket and the coupling module is in a conducting state, and the second test type at least includes a whole-machine test.

5. The radio frequency module according to claim 4, characterized in that: The radio frequency transceiver chip is configured to determine that the test type is the second test type when the first coupled signal is detected through the first power detection port.

6. The radio frequency module according to claim 4, characterized in that: The RF transceiver chip further includes a second power detection port, and the third end of the RF front-end module is connected to the second power detection port; The RF front-end module is further configured to send a second coupled signal coupled from the RF front-end module to the second power detection port; The RF transceiver chip is further configured to determine that the test type is the first test type when the first coupled signal is not detected through the first power detection port and the second coupled signal is detected through the second power detection port.

7. The radio frequency module according to claim 6, wherein: The RF transceiver chip is further configured to determine that a faulty component exists in the RF path between the RF front-end module and the coupling module when the first coupling signal is detected through the first power detection port, the second coupling signal is detected through the second power detection port, and the first power of the first coupling signal is less than a first threshold and the second power of the second coupling signal is greater than a second threshold.

8. The radio frequency module according to claim 1, wherein: The RF transceiver chip is a RF transceiver chip that supports the 5G WIFI frequency band.

9. A testing method, characterized in that: Used in the radio frequency transceiver chip included in the radio frequency module according to any one of claims 1 to 8, the method comprising: Detecting whether a first power detection port of the radio frequency transceiver chip receives a first coupling signal, and obtaining a detection result; Determine the test type of the RF module based on the detection result.

10. The method according to claim 9, characterized in that Determining the test type of the RF module according to the detection result includes: If the detection result is that the first coupled signal is detected through the first power detection port, the test type is determined to be a second test type, and the second test type at least includes a whole-device test.

11. The method according to claim 9, characterized in that Determining the test type of the RF module according to the detection result includes: If the detection result is that the first coupling signal is not detected through the first power detection port, detecting whether the second power detection port of the radio frequency transceiver chip receives a second coupling signal; In a case where the second coupled signal is detected through the second power detection port, the test type is determined to be a first test type, and the first test type at least includes a board-level test.

12. The method according to claim 9, characterized in that The method further comprises: When the first coupling signal is detected through the first power detection port and the second coupling signal is detected through the second power detection port of the RF transceiver chip, and the first power of the first coupling signal is less than a first threshold and the second power of the second coupling signal is greater than a second threshold, it is determined that a faulty component exists in the RF path between the RF front-end module and the coupling module.

13. An electronic device, characterized in that: The invention comprises the radio frequency module according to any one of claims 1 to 8.

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