Equipment abnormal sound test method and device

Abstract

The invention relates to the technical field of testing, in particular to an equipment abnormal sound testing method and device, and the method comprises the steps: obtaining a first audio signal of a first sampling point and a second audio signal of a second sampling point in the opening and closing process of a to-be-tested equipment body, the distance between the first sampling point and the to-be-tested equipment is smaller than that between the second sampling point and the to-be-tested equipment; determining whether noise interference exists based on the first audio signal and the second audio signal; if the noise interference exists, performing noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal; and based on the third audio signal, determining whether the to-be-tested device has abnormal sound in the body opening and closing process. According to the equipment abnormal sound test method and device provided by the invention, the influence of external interference noise in the test process can be reduced, the possibility of misjudgment on good products is reduced, and the accuracy of a test result is improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a method and device for testing abnormal noise of equipment. Background Art

[0002] With the development of electronic devices, foldable electronic devices are attracting increasing attention from users. During the opening and closing process, various internal components of foldable electronic devices may experience assembly anomalies, resulting in unusual noises during the opening and closing process. Before foldable electronic devices are released to the market, they need to be tested for unusual noises. This can promptly identify any such noises and prevent them from impacting the user experience.

[0003] Currently, when testing the opening and closing noises of foldable electronic devices, there is often some external interference noise during the test process, causing testers to mistakenly identify the external interference noise as opening and closing noises, thereby misjudging some good products and affecting the accuracy of the test results. Summary of the Invention

[0004] In order to solve the above problems, the present application provides a method and device for testing abnormal noise of equipment, which can reduce the impact of external interference noise during the test process, reduce the possibility of misjudgment of good products, and improve the accuracy of test results.

[0005] To achieve the above-mentioned objectives, in a first aspect, the present application provides a method for testing abnormal noises in a device, comprising: obtaining a first audio signal at a first sampling point and a second audio signal at a second sampling point during the opening and closing process of the body of the device under test, wherein the distance between the first sampling point and the device under test is less than the distance between the second sampling point and the device under test; determining whether there is noise interference based on the first audio signal and the second audio signal; if there is noise interference, performing noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal; and determining whether there is abnormal noise during the opening and closing process of the body of the device under test based on the third audio signal.

[0006] The device abnormal noise testing method provided in this embodiment obtains a first audio signal and a second audio signal at a first sampling point and a second sampling point, respectively, during the opening and closing process of the body of the device to be tested. The sound information in the first audio signal mainly includes abnormal noise of the shaft and interference noise, and the sound information in the second audio signal mainly includes interference noise. At this time, by comparing the first audio signal and the second audio signal, it is possible to determine whether there is noise interference during the test process, thereby avoiding the situation where the analysis result is misjudgment caused by noise interference when the first audio signal is directly analyzed. At the same time, the second audio signal can also be used to perform noise reduction processing on the first audio signal to achieve active noise reduction of the first audio signal and obtain a third audio signal after noise removal. The third audio signal is then analyzed to determine whether there is abnormal noise during the opening and closing process of the device to be tested, so as to reduce the impact of external interference noise on the test results and improve the accuracy of the test results.

[0007] In an optional embodiment, based on the first audio signal and the second audio signal, determining whether there is noise interference includes: dividing the first audio signal into multiple first sub-signals of target time length, dividing the second audio signal into multiple second sub-signals of target time length, wherein the multiple second sub-signals correspond one-to-one to the multiple first sub-signals in the time domain; obtaining first frequency domain information corresponding to each first sub-signal and second frequency domain information corresponding to each second sub-signal, wherein each first frequency domain information includes the amplitude and phase of each frequency point in the corresponding first sub-signal, and each second frequency domain information includes the amplitude and phase of each frequency point in the corresponding second sub-signal; for each first sub-signal and second sub-signal that has a corresponding relationship in the time domain, based on the amplitude of each frequency point in the first sub-signal and the amplitude of each frequency point in the second sub-signal, determining whether there is noise interference. In this way, it is possible to implement segment-by-segment analysis of the first audio signal and the second audio signal, improve the accuracy of signal analysis, and thus improve the accuracy of noise interference analysis.

[0008] In an optional embodiment, for each first sub-signal and second sub-signal that have a corresponding relationship in the time domain, determining whether noise interference exists based on the amplitude of each frequency point in the first sub-signal and the amplitude of each frequency point in the second sub-signal includes: for each first sub-signal and second sub-signal that have a corresponding relationship in the time domain: obtaining the amplitude difference of each frequency point in the first sub-signal and the second sub-signal, and obtaining the average amplitude of each frequency point in the first sub-signal; obtaining the average value of the amplitude difference of each frequency point; and determining whether noise interference exists based on the relationship between the average value of the amplitude difference of each frequency point and the average amplitude of each frequency point. In this way, the presence of noise interference can be determined by comparing the first sub-signal and the second sub-signal.

[0009] In one optional embodiment, determining whether noise interference exists based on the relationship between the average value of the amplitude differences at each corresponding frequency point and the average amplitude at each frequency point includes: calculating the ratio of the average value of the amplitude differences divided by the average amplitude value; and determining the presence of noise interference if the ratio is less than a first preset threshold. In this way, the ratio of the average value of the amplitude differences to the average amplitude value can be used to represent the proportion of the impact of the shaft noise on the amplitude in the first frequency domain information. When the proportion of the impact of the shaft noise on the amplitude is relatively small, it indicates that the external noise interference has a greater impact on the amplitude, indicating the presence of noise interference.

[0010] In an optional embodiment, if there is noise interference, noise reduction processing is performed on the first audio signal based on the second audio signal to obtain a third audio signal, including: for each first sub-signal and second sub-signal that have a corresponding relationship in the time domain: based on the amplitude of each frequency point in the second sub-signal, the amplitude of each corresponding frequency point in the first sub-signal is reduced to obtain the adjusted amplitude of each frequency point in the first sub-signal; the adjusted amplitude of each frequency point in the first sub-signal is combined with the corresponding phase to obtain third frequency domain information corresponding to the first sub-signal; the third frequency domain information corresponding to the first sub-signal is inverse Fourier transformed to obtain a fourth audio signal corresponding to the first sub-signal; and the fourth audio signals corresponding to each first sub-signal are combined to obtain a third audio signal. In this way, the second frequency domain information can be used to reduce the noise of the first frequency domain information and obtain the noise-reduced third frequency domain information, and the third frequency domain information is then subjected to an inverse Fourier transform to obtain the noise-reduced third audio information.

[0011] In one optional embodiment, the amplitudes of corresponding frequency points in the first sub-signal are subtracted based on the amplitudes of the corresponding frequency points in the second sub-signal to obtain adjusted amplitudes for each frequency point in the first sub-signal. This includes: for each frequency point, if a first difference between the amplitude of the first sub-signal at that frequency point and the amplitude of the second sub-signal at that frequency point is greater than zero, determining the adjusted amplitude for that frequency point to be the first difference. In this way, the second frequency domain information of the second sub-signal can be used to perform noise reduction processing on the first frequency domain information of the first sub-signal, thereby improving the accuracy of determining abnormal shaft noise.

[0012] In one optional embodiment, the amplitudes of corresponding frequency points in the first sub-signal are subtracted based on the amplitudes of the corresponding frequency points in the second sub-signal to obtain adjusted amplitudes for the frequency points in the first sub-signal. This includes: for each frequency point, if a first difference between the amplitude of the first sub-signal at that frequency point and the amplitude of the second sub-signal at that frequency point is less than or equal to zero, determining the adjusted amplitude for that frequency point to be a preset constant value, wherein the preset constant value is greater than zero. This prevents the adjusted amplitude from being negative or zero, thereby avoiding abnormal results in subsequent sound pressure level calculations.

[0013] In one optional embodiment, determining whether the device under test makes abnormal noise during opening and closing based on the third audio signal includes: if the sound pressure level of at least one fourth audio signal is greater than a second preset threshold, determining that the device under test makes abnormal noise during opening and closing; and if the sound pressure levels of all fourth audio signals are less than or equal to the second preset threshold, determining that the device under test does not make abnormal noise during opening and closing. In this way, the presence of abnormal shaft noise can be determined based on the third audio signal, thereby determining whether the device under test is a qualified product.

[0014] In an optional embodiment, during the opening and closing process of the device under test, a first audio signal at a first sampling point and a second audio signal at a second sampling point are obtained, and before the distance between the first sampling point and the device under test is less than the distance between the second sampling point and the device under test, the method further includes: step a. determining a first sampling point, the first sampling point being adjacent to the device under test; step b. determining multiple second preselected sampling points, the second preselected sampling points being farther away from the device under test than the first sampling point; step c. during the opening and closing process of the device under test, obtaining a first test audio signal at the first sampling point and a second test audio signal at one of the preselected second sampling points; step d. obtaining the sound pressure level difference between the first test audio signal and the second test audio signal; step e. repeating steps c and d to obtain the sound pressure level difference at each second preselected sampling point; and step f. selecting the second preselected sampling point with the largest sound pressure level difference as the second sampling point. In this way, a suitable second sampling point can be selected, and this method is applicable to any device under test and soundproof box structure, and has high applicability.

[0015] In an optional embodiment, during the opening and closing process of the device under test, a first audio signal at a first sampling point and a second audio signal at a second sampling point are acquired, including: during the opening and closing process of the device under test, using a first acquisition module at the first sampling point and a second acquisition module at the second sampling point to synchronously acquire a first original sound source signal at the first sampling point and a second original sound source signal at the second sampling point; filtering the first original sound source signal to obtain a first audio signal; and filtering the second original sound source signal to obtain a second audio signal. In this way, preliminary filtering of the first and second original audio signals can be performed to filter out ambient sound in the soundproof box, facilitating subsequent analysis of noise interference and abnormal shaft noise.

[0016] To achieve the above-mentioned objectives, in a second aspect, the present application provides a device abnormal sound testing apparatus, comprising: a first acquisition module, located at a first sampling point, configured to acquire a first original audio signal at the first sampling point during the opening and closing process of the body of the device under test; a second acquisition module, located at a second sampling point, configured to acquire a second original audio signal at the second sampling point during the opening and closing process of the body of the device under test, wherein the distance between the first sampling point and the device under test is less than the distance between the second sampling point and the device under test, and the first acquisition module and the second acquisition module acquire the audio signals synchronously; a processing module, configured to filter the first original sound source signal to obtain a first audio signal, and filter the second original sound source signal to obtain a second audio signal; the processing module is further configured to determine whether there is noise interference based on the first audio signal and the second audio signal; the processing module is further configured to, if noise interference is present, perform noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal; and the processing module is further configured to determine whether there is abnormal sound during the opening and closing process of the body of the device under test based on the third audio signal.

[0017] The device for testing abnormal noises of equipment provided by the present application is such that the first acquisition module close to the shaft of the equipment to be tested can not only collect abnormal noises of the shaft, but also collect external interference noises. At the same time, the second acquisition module can collect external interference noises, and the sound of the abnormal noises of the shaft collected is weak and can be ignored. At this time, the second acquisition module is equivalent to only collecting external interference noises. In this way, the processing module can use the audio information collected by the second acquisition module to determine whether the audio information collected by the first acquisition module is subject to noise interference, and can perform noise reduction processing on the audio signal collected by the first acquisition module in the presence of noise interference, so that when the audio signal collected by the first acquisition module is subsequently analyzed for abnormal noises of the shaft, the influence of external interference noises can be eliminated, thereby improving the accuracy of the test results.

[0018] In one optional embodiment, the first acquisition module includes multiple first microphones spaced apart along the axis of the rotating shaft of the device under test. Each first microphone is positioned at the same distance from the rotating shaft along the thickness of the device under test. This facilitates the first microphones to capture abnormal rotating shaft noise signals.

[0019] An optional embodiment further includes: a soundproof box; the first acquisition module and the second acquisition module are both disposed within the soundproof box; and the second acquisition module includes a second microphone positioned near the inner wall of the soundproof box and away from the device under test. This facilitates the use of the second microphone to collect external interfering noise signals while also reducing the amount of abnormal shaft noise signals collected. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solution of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0021] Figure 1 This is a schematic diagram of an inward folding screen mobile phone provided by this embodiment;

[0022] Figure 2 This is a schematic diagram of the external folding screen mobile phone provided by this embodiment;

[0023] Figure 3 Schematic diagram of the unfolded form of a foldable screen mobile phone provided by this embodiment;

[0024] Figure 4 This is a simplified structural diagram of a testing device provided by this embodiment;

[0025] Figure 5 This is a flow chart of a device abnormal sound testing method provided in this embodiment;

[0026] Figure 6 This is a flow chart of a method for determining sampling points in a device abnormal sound testing method provided in this embodiment;

[0027] Figure 7 Schematic diagram of the positions of the first sampling point and the second preselected sampling point relative to the device to be tested provided in this embodiment;

[0028] Figure 8 This is another schematic diagram of the positions of the first sampling point and the second pre-selected sampling point relative to the device to be tested provided by this embodiment;

[0029] Figure 9 This is a schematic diagram of the positions of the first sampling point and the second preselected sampling point relative to the device to be tested provided by this embodiment;

[0030] Figure 10 is a schematic diagram of a first sound pressure level curve and a second sound pressure level curve provided in this embodiment;

[0031] Figure 11 This is a schematic diagram of the relative positions of a device under test and a second preselected sampling point provided by this embodiment;

[0032] Figure 12 This is a flow chart of another device abnormal sound testing method provided by this embodiment;

[0033] Figure 13 is a diagram of the signal processing process provided by this embodiment;

[0034] Figure 14is a schematic diagram of a time domain curve of a first audio signal provided by this embodiment;

[0035] Figure 15 is a schematic diagram of a time domain curve of a second audio signal provided by this embodiment;

[0036] Figure 16 is a schematic diagram of a time domain curve of a third audio signal provided by this embodiment;

[0037] Figure 17 is a schematic diagram of a sound pressure level curve diagram of the first audio signal and the third audio signal in each subinterval provided by this embodiment;

[0038] Figure 18 Schematic diagram of the structure of a device for testing abnormal noise of equipment provided in this embodiment. DETAILED DESCRIPTION

[0039] The following will clearly describe the technical solutions in the embodiments of the present application in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments of the present application, other embodiments obtained by ordinary technicians in this field without making any creative work are all within the scope of protection of this application.

[0040] Hereinafter, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified with "first," "second," etc., may explicitly or implicitly include one or more of the features. In the description of this application, unless otherwise specified, "plurality" means two or more.

[0041] In addition, in this application, directional terms such as "upper", "lower", "inner" and "outer" are defined relative to the orientation of the components in the drawings. It should be understood that these directional terms are relative concepts. They are used for relative description and clarification, and they can change accordingly according to changes in the orientation of the components in the drawings.

[0042] As users' demand for portable electronic devices gradually increases, foldable electronic devices have attracted widespread attention. Foldable electronic devices refer to electronic devices whose bodies can be opened and closed (such as unfolded or folded). For example, foldable screen mobile phones and laptops. Among them, foldable screen mobile phones can also include internal folding screen mobile phones and external folding screen mobile phones.

[0043] Figure 1 This is a schematic diagram of the shape of an inward folding screen mobile phone provided in this embodiment.

[0044] like Figure 1As shown, the body 10 of the inward-folding screen phone can be folded toward one side of the foldable display 20. After the body 10 is folded, the foldable display 20 is hidden inside the body 10. It can be seen that when the inward-folding screen phone is folded, the foldable display 20 is hidden inside the body 10. When the inward-folding screen phone is unfolded, the foldable display 20 is in a normal straight screen state.

[0045] Figure 2 This is a schematic diagram of the external folding screen mobile phone provided in this embodiment.

[0046] like Figure 2 As shown, the body 10 of the external folding screen phone can be folded toward the back side of the foldable display 20. After the body 10 is folded, the foldable display 20 is displayed on the outside of the body 10. It can be seen that when the external folding screen phone is folded, the foldable display 20 wraps around the outside of the body 10. When the external folding screen phone is unfolded, the foldable display 20 is in a normal straight screen state.

[0047] Figure 3 This is a schematic diagram of the unfolded form of a foldable screen mobile phone provided in this embodiment.

[0048] Combine Figures 1 to 3 As can be seen, the main difference between an inward-folding screen mobile phone and an outward-folding screen mobile phone is the different foldable directions of the foldable display screen 20. When the inward-folding screen mobile phone and the outward-folding screen mobile phone are folded or unfolded, they are mainly achieved by the hinge 11 set on the fuselage 10.

[0049] Specifically, the body 10 of the foldable phone includes a first body 101 and a second body 102, which are connected by a hinge 11. The foldable display 20 covers the same side of the first body 101 and the second body 102, while also covering the hinge 11. To protect the hinge 11, a hinge cover (not shown) is provided on the side of the hinge facing away from the foldable display 20 to prevent foreign objects from entering the hinge 11 and affecting its normal operation.

[0050] When using a foldable phone, users often need to open and close the phone's body 10, causing the hinge 11 to rotate the first and second bodies 101, 102 relative to each other. Furthermore, because the hinge 11 is typically complex, improper fit of some components within the hinge 11 (e.g., scratching or interference between components) may produce unusual noises during the opening and closing of the phone. Because unusual noises from the hinge 11 can impact the user experience, foldable phones are tested for unusual noises before shipment. If unusual noises are detected during the hinge 11 test, and they are loud, the phone is considered defective and cannot be released to the market. If unusual noises are not detected or are minimal, the phone is considered acceptable and can be released to the market.

[0051] In one implementation, the abnormal noise test of the hinge of a foldable screen mobile phone can be achieved through manual inspection. Specifically, it can include using a tester to open and close the body of the foldable screen mobile phone to determine whether the foldable screen mobile phone has an abnormal noise problem with the hinge. In this test method, the environment in which the tester is located is random, and it is impossible to achieve uniform test conditions. At the same time, different testers have different sensitivities to sound, and the objectivity of the test results cannot be guaranteed, making the test results inaccurate. In addition, this test method has low test efficiency and cannot meet the needs of mass production.

[0052] In order to improve the accuracy of the test results and improve the test efficiency, a test device can be provided to test the abnormal noise of the hinge of the folding screen mobile phone. The test device can drive the folding screen mobile phone to unfold and fold, thereby simulating the process of a user using the folding screen mobile phone. At the same time, the test device is provided with a soundproof box and a sound collection component. The folding screen mobile phone is placed in the soundproof box, and the sound collection component is also placed in the soundproof box. In this way, during the opening and closing process of the folding screen mobile phone, the soundproof box can be used to isolate the external noise to a certain extent, and the sound collection component can be used to collect whether the folding screen mobile phone has abnormal noise from the hinge, so as to realize the abnormal noise test of the hinge of the folding screen mobile phone.

[0053] The test equipment can use the sound collection component to collect and record the sound of abnormal shaft noise. At this time, the sound pressure level of the sound collection result can be analyzed. If the sound pressure level is greater than the required value, it means that abnormal shaft noise exists; if the sound pressure level is less than or equal to the required value, it means that there is no abnormal shaft noise.

[0054] Figure 4 This is a simplified structural diagram of a testing device provided in this embodiment.

[0055] like Figure 4As shown, the test equipment includes a device housing and a soundproof box, and the soundproof box can be set inside the device housing. However, if there is a large interference noise outside the device housing during the test, and the frequency range involved in the external interference noise is relatively wide, different external interference noises can cover various frequency bands from low frequency to high frequency, and the soundproof box cannot completely isolate the external interference noise, especially the isolation ability of low-frequency noise is limited. External interference noise may be transmitted to the inside of the soundproof box, affecting the collection results of the sound collection component. At this time, the sound collection component may collect and record the external interference noise. When analyzing the sound collection results, the external interference noise with a wide frequency band cannot be filtered out by simple filtering means, so that the external interference noise may be regarded as the abnormal noise of the hinge of the folding screen mobile phone, resulting in misjudgment of the abnormal noise test of the hinge of the folding screen mobile phone, affecting the accuracy of the test results.

[0056] Among them, the external interference noise can be the sound generated by placing a tray or other objects on the device housing, the sound of people tapping the device, etc.

[0057] In order to improve the accuracy of abnormal noise testing of the hinges of foldable electronic devices, the present application provides a device abnormal noise testing method and apparatus, which can reduce external interference noise, reduce the possibility of misjudgment, and improve the accuracy of test results.

[0058] Figure 5 This is a flow chart of a device abnormal sound testing method provided in this embodiment.

[0059] like Figure 5 As shown, this embodiment provides a device abnormal sound testing method, including:

[0060] Step S110: acquiring a first audio signal at a first sampling point and a second audio signal at a second sampling point during the opening and closing process of the device under test, wherein the distance between the first sampling point and the device under test is smaller than the distance between the second sampling point and the device under test.

[0061] The device under test may be any foldable electronic device, including but not limited to mobile phones, tablet computers, laptop computers, ultra-mobile personal computers (UMPCs), handheld computers, touch-screen TVs, walkie-talkies, netbooks, POS machines, personal digital assistants (PDAs), wearable devices such as headphones, Bluetooth glasses, virtual reality devices, and other mobile or fixed terminals with foldable functions, without limitation.

[0062] For example, when performing an abnormal noise test on a device under test, the device under test, the first sampling point, and the second sampling point may all be located in a soundproof box of the test device to reduce the influence of external noise.

[0063] In this embodiment, the first sampling point and the second sampling point are located at different positions, and the distance between the first sampling point and the device under test is smaller than the distance between the second sampling point and the device under test. Therefore, if the device under test has abnormal shaft noise, the abnormal noise will first reach the first sampling point and then the second sampling point. Because the energy of the sound signal is gradually reduced during propagation, the energy of the abnormal shaft noise signal in the first audio signal obtained at the first sampling point is higher and the sound pressure level is higher; while the energy of the abnormal shaft noise signal in the second audio signal obtained at the second sampling point is lower and the sound pressure level is lower. In this way, the first audio signal obtained at the first sampling point can be used as the main reference signal for abnormal shaft noise.

[0064] At the same time, if there is external interference noise during the test, it will be transmitted into the soundproof box. When the external interference noise propagates into the soundproof box, it will first propagate through the soundproof box body before reaching the first and second sampling points. Since the first and second sampling points are both fixed inside the soundproof box, the distances from the external interference noise to the first and second sampling points are similar. Therefore, the external interference noise detected by the first and second sampling points are basically the same.

[0065] In this way, the first sampling point can serve as the main sampling point during the test process. The sound information in the first audio signal obtained at the first sampling point mainly includes the abnormal shaft noise of the device under test and external interference noise. The second sampling point can serve as the reference sampling point during the test process. The sound information in the second audio signal obtained at the second sampling point mainly includes external interference noise. Therefore, the second audio signal can be used as a reference to confirm whether there is interference in the sound information of the first audio signal. The second audio signal can also be used to reduce the interference noise in the first audio signal, thereby improving the accuracy of the analysis of the abnormal shaft noise information.

[0066] Among them, external interference noise may include but is not limited to the sound produced by placing a pallet or other items on top of the soundproof box, the sound of people tapping the soundproof box or other equipment around the soundproof box, the sound of objects falling in the environment, and the sound of abnormal operation of surrounding equipment, etc., which are uncertain sounds.

[0067] From the above, it can be seen that the two sampling points located at different positions can be used to receive the sound of abnormal shaft noise and the sound of external interference respectively, thereby improving the accuracy of the test results.

[0068] Exemplarily, the first audio signal may be obtained by filtering the first sound source signal after acquiring the first sound source signal at the first sampling point, so as to achieve preliminary processing of the first sound source signal.

[0069] The filtering process performed on the first sound source signal may be a 200 Hz high-pass filtering of the first sound source signal. In this way, interference signals below 200 Hz in the first sound source signal may be filtered out, such as the ambient sound in the soundproof box.

[0070] At the same time, the filtering process performed on the second sound source signal may be a 200 Hz high-pass filtering of the second sound source signal. In this way, interference signals below 200 Hz in the second sound source signal may be filtered out, such as the ambient sound in the soundproof box.

[0071] It is understandable that in other implementations, the filtering processes for the first sound source signal and the second sound source signal may be different, and this application does not limit this.

[0072] Step S120: Determine whether there is noise interference based on the first audio signal and the second audio signal.

[0073] Because the first and second audio signals contain different sound information, the first audio signal primarily contains abnormal shaft noise, while the second audio signal primarily contains external interference noise. Therefore, the sound information in the first and second audio signals can be compared to determine whether there is noise interference.

[0074] If noise interference is determined to be present after comparing and analyzing the first and second audio signals, noise reduction can be performed on the first audio source signal to remove the noise information contained in the first audio signal, thereby facilitating subsequent analysis of whether abnormal shaft noise is present. If noise interference is determined to be absent after comparing and analyzing the first and second audio signals, the first audio signal can be directly analyzed to confirm whether abnormal shaft noise is present.

[0075] Step S130: If noise interference exists, perform noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal.

[0076] As can be seen from the above description, when noise interference is confirmed, the sound information contained in the second audio signal is primarily noise information. Therefore, the second audio signal can be used to reduce the noise in the first audio signal, thereby generating a third audio signal. The sound information contained in the third audio signal is primarily the sound information of abnormal shaft noise, making the third audio signal more accurate for analyzing the test results.

[0077] It is worth noting that the second audio signal can not only be used to compare with the first audio signal to determine whether there is noise interference, but also can be used to implement noise reduction processing on the first audio signal, so that after determining the presence of noise, the noise can also be processed to obtain a third audio signal, thereby improving the accuracy of the test results.

[0078] Step S140: determining whether there is an abnormal sound during the opening and closing of the device under test based on the third audio signal.

[0079] The third audio signal is obtained by removing noise from the first audio signal. Therefore, when analyzing the third audio signal, changes in the sound pressure level are primarily due to abnormal shaft noise. Therefore, analyzing the test results can minimize the impact of noise interference, reduce the likelihood of misidentification of abnormal noise due to noise, and improve the accuracy of the test results.

[0080] The device noise testing method provided in this embodiment obtains a first audio signal and a second audio signal at a first sampling point and a second sampling point, respectively, during the opening and closing of the device under test. Because the distance between the first sampling point and the device under test is shorter than that between the second sampling point and the device under test, the noise from the device's shaft reaches the first sampling point first and only reaches the second sampling point after traveling a greater distance. Therefore, the noise from the shaft that reaches the first sampling point first has greater energy, resulting in a higher proportion of the noise from the shaft in the first audio signal. The noise from the shaft that subsequently reaches the second sampling point is significantly attenuated, resulting in a lower proportion of the noise from the shaft in the second audio signal. Furthermore, because the first and second sampling points are located at similar distances from the soundproof enclosure, when external interference noise is present, the first and second sampling points can capture similar interference noise. In other words, the sound information in the first audio signal primarily consists of the noise from the shaft and the interference noise, while the sound information in the second audio signal primarily consists of the interference noise. In this way, by comparing the first audio signal and the second audio signal, it is possible to determine whether there is noise interference during the test process, thereby avoiding misjudging the noise as abnormal noise when directly analyzing the first audio signal, resulting in inaccurate analysis results. In addition, the second audio signal can also be used to perform noise reduction processing on the first audio signal to achieve active noise reduction of the first audio signal and obtain a third audio signal after removing the noise. In this way, by analyzing the third audio signal again, it is possible to accurately determine whether there is abnormal noise during the opening and closing process of the device under test. It can be seen that the device abnormal noise testing method provided in the embodiment of the present application can reduce the impact of external interference noise on the test results and improve the accuracy of the test results.

[0081] Figure 6 This is a flow chart of a method for determining sampling points in a device abnormal sound testing method provided in this embodiment.

[0082] like Figure 6 As shown, this embodiment also provides a method for determining a sampling point, including:

[0083] Step S201: Determine a first sampling point, where the first sampling point is adjacent to the device under test.

[0084] In this embodiment, the first sampling point mainly collects sound information of abnormal noise of the shaft of the device under test. Therefore, the first sampling point can be placed close to the shaft to obtain the sound information of the shaft during the opening and closing process of the device.

[0085] Figure 7 This is a schematic diagram of the positions of the first sampling point and the second preselected sampling point relative to the device under test provided in this embodiment. In order to avoid the device under test from blocking the first sampling point, Figure 7 The dotted box in the figure represents the device under test.

[0086] like Figure 7 As shown, for example, first sampling point 210 can be positioned corresponding to the axis x of the rotating shaft, and along the thickness direction of device under test 200, first sampling point 210 can be 2 cm away from the rotating shaft. This allows first sampling point 210 to be positioned close to the rotating shaft while still providing a certain distance between the rotating shaft and first sampling point 210, facilitating the arrangement and installation of device under test 200 and first sampling point 210 within soundproof box 310.

[0087] It is understandable that in other implementations, the distance between the first sampling point 210 and the rotation axis may also be 1 cm, 3 cm, etc., which is not limited in this embodiment.

[0088] Optionally, there may be one or more first sampling points 210 .

[0089] When there is only one first sampling point 210 , the first sampling point 210 may be located at the center of the rotation axis of the device under test 200 .

[0090] When there are multiple first sampling points 210, the multiple first sampling points 210 can be spaced apart along the axis x of the rotation shaft of the device under test 200. The multiple first sampling points 210 can be spaced apart at equal intervals or at unequal intervals. Figure 7 In the example, there are three first sampling points 210 , and the three first sampling points 210 are first sampling point No. 1 211 , first sampling point No. 2 212 , and first sampling point No. 3 213 , so that the first sampling points 210 can be distinguished by numbering.

[0091] It is worth noting that the number and specific configuration of the first sampling points 210 can be selected according to actual conditions and are not limited in this embodiment.

[0092] Step S202: determining a plurality of second pre-selected sampling points, where the second pre-selected sampling points are farther away from the device under test than the first sampling points.

[0093] In this embodiment, the second sampling point primarily collects external interference noise, so the second sampling point needs to be as far away from the rotation axis of the device under test 200 as possible. However, there may be multiple locations within the soundproof box 310 that are far away from the rotation axis of the device under test 200. Therefore, multiple locations farther away from the rotation axis than the first sampling point 210 can be selected as second pre-selected sampling points 220. In subsequent processes, the location of a second sampling point is determined from the second pre-selected sampling points 220.

[0094] Combine Figure 6 and Figure 7 It can be seen that, for example, the second pre-selected sampling points 220 can be selected from several positions surrounding the periphery of the device under test 200 and close to the inner wall of the sound insulation box 310. In this way, the second pre-selected sampling points 220 can be as far away from the device under test 200 as possible, and at the same time can be closer to the inner wall of the sound insulation box 310, which is more convenient for collecting interference noise outside the sound insulation box 310.

[0095] Furthermore, since there are numerous locations around the periphery of the device under test 200 and close to the inner wall of the soundproof box 310, to improve efficiency, a symmetry axis y of the device under test can be selected perpendicular to the rotation axis x. Consequently, there are symmetrical points around the periphery of the device under test 200 that are equidistant from the device under test 200. When selecting the second preselected sampling point 220, one of the symmetrical points can be selected as the second preselected sampling point 220, thereby improving testing efficiency for the second preselected sampling point 220.

[0096] Optionally, multiple second preselected sampling points 220 may be arranged around the device under test 200 along one side of the symmetry axis y. At the same time, in order to facilitate marking the second preselected sampling points 220 at various positions, each second preselected sampling point 220 may be numbered.

[0097] Figure 7 : shows a selection method for multiple second pre-selected sampling points 220, including second pre-selected sampling point No. 1 221, second pre-selected sampling point No. 2 222, second pre-selected sampling point No. 3 223, second pre-selected sampling point No. 4 224, second pre-selected sampling point No. 5 225, second pre-selected sampling point No. 6 226, and second pre-selected sampling point No. 7 227, so that the positions of the second pre-selected sampling points 220 are distinguished by using labels.

[0098] Figure 8 This is another schematic diagram of the positions of the first sampling point and the second preselected sampling point relative to the device to be tested provided by this embodiment.

[0099] like Figure 8 As shown, alternatively, the plurality of second pre-selected sampling points 220 may be located at different positions on both sides of the symmetry axis y, which is not limited in this embodiment.

[0100] Figure 9 This is another schematic diagram of the positions of the first sampling point and the second preselected sampling point relative to the device to be tested provided by this embodiment.

[0101] like Figure 9 As shown, in other embodiments, multiple second pre-selected sampling points 220 can also be set around the device under test 200, and suitable positions are selected as second sampling points through multiple testing processes. The setting according to the symmetry axis y of the device under test 200 provided in this embodiment is only an example.

[0102] In this embodiment, Figure 7 The setting positions of multiple second pre-selected sampling points in are taken as an example for description.

[0103] Step S203: During the opening and closing process of the device under test, a first test audio signal at a first sampling point and a second test audio signal at one of the second preselected sampling points are obtained.

[0104] like Figure 7 As shown. After determining the positions of the first sampling point 210 and the second preselected sampling point 220, testing can be performed at the first sampling point 210 and one of the second preselected sampling points 220. In this case, the body of the device under test 200 can be opened and closed, thereby obtaining a first test audio signal at the first sampling point 210 and a second test audio signal at the second preselected sampling point 220. This facilitates subsequent selection of an appropriate second preselected sampling point 220 as the second sampling point based on a comparison of the first and second test audio signals.

[0105] Step S204: Obtain a sound pressure level difference between the first test audio signal and the second test audio signal.

[0106] Exemplarily, a first sound pressure level of the first test audio signal and a second sound pressure level of the second test audio signal may be calculated respectively, and then the sound pressure level difference may be obtained using the first sound pressure level and the second sound pressure level.

[0107] Optionally, before calculating the first sound pressure level and the second sound pressure level according to the first test audio signal and the second test audio signal, the first test audio signal and the second test audio signal may be filtered to filter out the ambient sound in the soundproof box 310 .

[0108] Specifically, the first test audio signal and the second test audio signal may be subjected to a 200 Hz high-pass filter to filter out the ambient sound in the soundproof box 310 , thereby facilitating calculation of the sound pressure levels of the first test audio signal and the second test audio signal.

[0109] When there is only one first sampling point 210 , there is only one first test audio signal, and a first sound pressure level can be directly calculated from the first test audio signal.

[0110] When there are multiple first sampling points 210, one of the first sampling points 210 can be selected for testing with the second preselected sampling point 220. In each subsequent test of the second preselected sampling point 220, the same first sampling point 210 is selected for testing to ensure uniformity of test conditions. Alternatively, multiple first sampling points 210 can be selected for testing simultaneously with one second preselected sampling point 220. Multiple first test audio signals can be obtained from the multiple first sampling points 210. In this case, the sound pressure level of each first test audio signal can be calculated separately, and the average of the multiple sound pressure levels can be used as the first sound pressure level to facilitate calculation of the difference between the first sound pressure level and the second sound pressure level.

[0111] Specifically, when calculating the sound pressure levels of the first test audio signal and the second test audio signal, the sound pressure levels within a 10ms interval in which the abnormal shaft noise exists in the first test audio signal and the second test audio signal can be calculated to obtain the first sound pressure level and the second sound pressure level.

[0112] Alternatively, in other implementations, the sound pressure levels of the first test audio signal and the second test audio signal during the entire test duration may be directly calculated, which is not limited in this embodiment.

[0113] Step S205: repeating the above steps S203-S204 to obtain the sound pressure level difference at each second preselected sampling point.

[0114] In this embodiment, since there are multiple second preselected sampling points 220, in order to avoid mutual interference when multiple second preselected sampling points 220 jointly obtain sound information of the device under test 200 during the opening and closing process, each second preselected sampling point 220 can be tested separately.

[0115] Exemplarily, the above steps S203 - S204 may be repeated to test each second preselected sampling point 220 , thereby obtaining the sound pressure level difference between each second preselected sampling point 220 and the first sampling point 210 .

[0116] Step S206: Select the second pre-selected sampling point with the largest sound pressure level difference as the second sampling point.

[0117] Figure 10Schematic diagram of a first sound pressure level curve and a second sound pressure level curve provided in this embodiment.

[0118] Figure 10 The first sound pressure level curve and the second sound pressure level curve in are the first sound pressure level curve and the second sound pressure level curve respectively obtained after testing the first sampling point 210 and the plurality of second preselected sampling points 220. Figure 10 The horizontal axis represents the number of the second pre-selected sampling point 220, and the vertical axis represents the sound pressure level in dB. Figure 10 The first sound pressure level curve in is the first sound pressure level obtained after the first sampling point 210 is tested, and the second sound pressure level curve is the second sound pressure level obtained after the second preselected sampling points 220 are tested.

[0119] contrast Figure 10 It can be seen from the first sound pressure level curve and the second sound pressure level curve in that the sound pressure level of the first sampling point 210 is greater than the sound pressure level of the second preselected sampling point 220, and the sound pressure level differences between the second preselected sampling points 220 and the first sampling point 210 at different locations are different.

[0120] Specifically, at the location of the second preselected sampling point 221, number 1, the difference between the first and second sound pressure levels is 0.43 dB. At the location of the second preselected sampling point 222, number 2, the difference between the first and second sound pressure levels is 1.96 dB. At the location of the second preselected sampling point 223, number 3, the difference between the first and second sound pressure levels is 2.23 dB. At the location of the second preselected sampling point 224, number 4, the difference between the first and second sound pressure levels is 4.90 dB. At the location of the second preselected sampling point 225, number 5, the difference between the first and second sound pressure levels is 8.61 dB. At the location of the second preselected sampling point 226, number 6, the difference between the first and second sound pressure levels is 8.84 dB. At the location of the second preselected sampling point 227, number 7, the difference between the first and second sound pressure levels is 7.07 dB.

[0121] Figure 11 : is a schematic diagram of the relative position of a device under test and a second preselected sampling point provided by this embodiment. Figure 11 The device under test 200 is an external folding screen mobile phone, and is in a 90° folded state.

[0122] Combine Figure 10 and Figure 11 As shown above Figure 10The sound pressure level and sound pressure level difference in the figure are obtained by testing an external folding screen mobile phone as an example of device under test 200. When the external folding screen mobile phone is flipped from the unfolded state to the folded state, the second pre-selected sampling point 226, number 6, faces away from the opening side of the external folding screen mobile phone in the folded state. Therefore, the abnormal sound at the external folding screen mobile phone's hinge needs to pass through the foldable display 20 before it can be transmitted to the second pre-selected sampling point 220, which faces away from the opening side. The foldable display 20 is a complete and relatively dense structure. When the abnormal sound of the hinge passes through the foldable display 20, it will be significantly attenuated. However, the second pre-selected sampling point 221, number 1, on the opening side, is located on the opening side of the external folding screen mobile phone. The abnormal sound of the hinge can be directly transmitted through the gap of the shaft cover 12. At the same time, because the shaft cover 12 is generally multi-sectioned and has a certain gap, the abnormal sound of the hinge is less attenuated when passing through the gap of the shaft cover 12.

[0123] Therefore, among the seven second pre-selected sampling points 220 numbered 1-7, the sound pressure level differences between second pre-selected sampling points 1 221, 222, 323, and 4, which face the opening side of the folded external foldable screen phone, and first sampling point 210 are generally small. However, the sound pressure level differences between second pre-selected sampling points 5 225, 6 226, and 7 227, which face away from the opening side of the folded external foldable screen phone, and first sampling point 210 are generally large. Among them, second pre-selected sampling point 6 226 is the farthest from the external foldable screen phone and has the largest sound pressure level difference between first sampling point 210 and second pre-selected sampling point 6 226. Therefore, second pre-selected sampling point 6 226 can be selected as the second sampling point to facilitate the distinction between the sound information collected by the first sampling point 210 and the second sampling points.

[0124] It is understandable that when the device under test 200 is a foldable device such as an inward-folding screen mobile phone or a laptop computer, or the structure of the sound insulation box 310 is different, the position of the second sampling point selected according to the above steps S201-S206 may be different.

[0125] Figure 12 This is a flow chart of another device abnormal sound testing method provided in this embodiment.

[0126] like Figure 12 As shown, the device abnormal sound testing method provided in this embodiment includes:

[0127] Step S301: During the opening and closing process of the device under test, synchronously collect data using a first acquisition module at a first sampling point and a second acquisition module at a second sampling point, and obtain a first original sound source signal at the first sampling point and a second original sound source signal at the second sampling point.

[0128] In this embodiment, during a formal test of abnormal shaft noise in the device under test 200, a first acquisition module located at a first sampling point 210 and a second acquisition module located at a second sampling point can be used to acquire a first original sound source signal at the first sampling point 210 and a second original sound source signal at the second sampling point. The synchronous acquisition by the first acquisition module and the second acquisition module ensures that the first original sound source signal and the second original sound source signal are acquired within the same time period, have the same start and end times, and have the same sampling length.

[0129] Step S302: filtering the first original sound source signal to obtain a first audio signal, and filtering the second original sound source signal to obtain a second audio signal.

[0130] Figure 13 It is a diagram of the signal processing process provided by this embodiment.

[0131] Combine Figure 12 and Figure 13 As shown, when the first acquisition module and the second acquisition module collect sound signals, they also collect the ambient sound inside the soundproof box 310, causing the first original sound source signal and the second original sound source signal to include the ambient sound inside the soundproof box 310. However, the ambient sound inside the soundproof box 310 is not a target signal to be collected during the test, but rather background noise. Therefore, the first original sound source signal and the second original sound source signal can be filtered to obtain the first audio signal and the second audio signal, thereby filtering out the ambient sound inside the soundproof box 310 to prevent the abnormal noise of the shaft from being drowned out by the background noise.

[0132] Optionally, the first original sound source signal and the second original sound source signal can be subjected to 200 Hz high-pass filtering to filter out low-frequency noise below 200 Hz, thereby achieving preliminary noise reduction processing on the first original sound source signal and the second original sound source signal, thereby obtaining the first audio signal and the second audio signal.

[0133] It is worth noting that, in order to avoid affecting other information in the first original audio signal and the second original audio signal, the first original audio signal and the second original audio signal should be filtered using the same filtering method. The specific filtering method is not limited in this embodiment.

[0134] Figure 14 is a schematic diagram of a time domain curve of the first audio signal provided by this embodiment.

[0135] Figure 15 is a schematic diagram of a time domain curve of the second audio signal provided by this embodiment.

[0136] Combine Figure 7 、 Figure 14 and Figure 15As shown, for example, the number of first sampling points 210 is three, and the three first sampling points 210 are first sampling point 1 211, first sampling point 212, and first sampling point 3 213. In the process of performing abnormal sound test on the device under test 200, the three first sampling points 210 and one second sampling point ( Figure 7 In order to facilitate the subsequent analysis of whether the noise reduction process is effective, the top plate of the device can be actively knocked during the test as external interference noise. Figure 14 (a) is the first audio signal obtained by filtering the first original sound source signal collected at the first sampling point 211, Figure 14 (b) is the first audio signal obtained by filtering the first original sound source signal collected at the first sampling point 212, Figure 14 (c) is the first audio signal obtained by filtering the first original sound source signal collected at the first sampling point 213 of No. 3. Figure 15 At the second sampling point ( Figure 7 The second audio signal after filtering is obtained by collecting the second original sound source signal at the second pre-selected sampling point 226 in FIG. 6 .

[0137] Among them, Figure 14 (a) Figure 14 (b) Figure 14 (c) and Figure 15 In the figure, the area of ​​the dotted box O is the abnormal sound signal of the shaft, and the area of ​​the dotted box P is the external interference noise signal. Figure 14 and Figure 15 It can be seen that the signal of the abnormal shaft noise contained in the second audio signal is relatively weak, while the signal of the abnormal shaft noise contained in the first audio signal is relatively strong.

[0138] In addition, the above steps S301-S302 are used to implement the above step S110. Therefore, for the contents not specifically expanded in S301-S302, reference can be made to the above step S110 and will not be repeated here.

[0139] Step S303: Segment the first audio signal into a plurality of first sub-signals of target duration, and segment the second audio signal into a plurality of second sub-signals of target duration, wherein the plurality of second sub-signals correspond one-to-one to the plurality of first sub-signals in the time domain.

[0140] The abnormal sound of the rotating shaft of the device under test 200 is a short sound signal, which usually lasts for a short time. The first audio signal is divided into multiple first sub-signals of target duration, and the first audio signal with a wider coverage range in the time domain can be divided into multiple sub-signals, so that the first audio signal can be analyzed section by section, thereby improving the accuracy of the analysis of the abnormal sound signal of the rotating shaft. At the same time, the second audio signal is divided into multiple second sub-signals of target duration, and the multiple second sub-signals and the multiple first sub-signals correspond one-to-one in the time domain, so that the second audio signal can be divided into multiple sub-signals corresponding to the first audio signal, thereby facilitating comparative analysis of the first sub-signal and the second sub-signal, and using the second sub-signal to perform segment-by-segment noise reduction on the first sub-signal.

[0141] like Figure 13 As shown, if the time length of the first audio signal and the second audio signal in the time domain is nt and the target time length is t, the first audio signal can be divided into n first sub-signals, and the second audio signal can be divided into n second sub-signals, and the n first sub-signals and the n second sub-signals have a one-to-one correspondence in the time domain.

[0142] For example, the duration of the sound signal of the abnormal shaft noise is usually less than 10ms. Therefore, the target duration t can be set to 10ms, thereby reducing the possibility of dividing the sound signal of the abnormal shaft noise into two first sub-signals when segmenting the first audio signal, and further reducing the impact on the sound signal of the abnormal shaft noise when performing segmented analysis on the first audio signal. At this time, the time length of each first sub-signal is 10ms. If the time length nt of the first audio signal in the time domain is 3s, 300 first sub-signals can be obtained when the first audio signal is segmented. Similarly, the time length of each second sub-signal is 10ms, and the time length nt of the second audio signal in the time domain is the same as the time length nt of the first audio signal in the time domain. When the second audio signal is segmented, the same number of second sub-signals as the first sub-signals and one-to-one corresponding in the time domain can be obtained.

[0143] It is understandable that in other implementations, the target duration t may also be 5ms, 12ms, 15ms, etc., which is not limited in this embodiment.

[0144] Alternatively, if the target duration t is 10 ms and the sampling frequency of the first audio signal and the second audio signal is 48 kHz, each first sub-signal and each second sub-signal has a one-to-one correspondence of 480 sampling points in the time domain. This results in a greater number of sampling points in each first sub-signal and each second sub-signal, facilitating subsequent comparative analysis of each first sub-signal and each second sub-signal.

[0145] Step S304: Obtain first frequency domain information corresponding to each first sub-signal and second frequency domain information corresponding to each second sub-signal. Each first frequency domain information includes the amplitude and phase of each frequency point in the corresponding first sub-signal, and each second frequency domain information includes the amplitude and phase of each frequency point in the corresponding second sub-signal.

[0146] Compared to time-domain analysis, frequency-domain analysis makes it easier to apply filtering and noise reduction techniques. Before analyzing the first sub-signal for noise interference, it's helpful to first obtain frequency-domain information for both the first and second sub-signals. This information can then be used for interference noise analysis and noise reduction.

[0147] Exemplarily, each first sub-signal can be subjected to a Fourier transform, specifically a fast Fourier transform (FFT), to achieve efficient conversion of a large number of first sub-signals, thereby obtaining first frequency domain information of each first sub-signal in the frequency domain. Similarly, each second sub-signal can be subjected to a Fourier transform, specifically a fast Fourier transform (FFT), to achieve efficient conversion of a large number of second sub-signals, thereby obtaining second frequency domain information of each second sub-signal in the frequency domain. In this way, by performing a fast Fourier transform on the sampling points of the first sub-signal and the second sub-signal in the time domain, each first sub-signal can obtain the amplitude and phase of each frequency point in the frequency domain, and each second sub-signal can obtain the amplitude and phase of each frequency point in the frequency domain.

[0148] Specifically, after converting each first sub-signal and each second sub-signal from the time domain to the frequency domain, the data of each frequency point in each first sub-signal is a complex number, which can be expressed as z=a+bi. At this time, the amplitude A of each frequency point can be obtained by The phase of each frequency point can be calculated by Calculated.

[0149] like Figure 13 The first frequency domain information obtained after Fourier transform of each first sub-signal includes the amplitude and phase of multiple frequency points. Among them, in the first frequency domain information, the amplitude of each first sub-signal at the nth frequency point is A 1n , phase is phase 1n In the second frequency domain information, the amplitude of each second sub-signal at the nth frequency point is A 2n , phase is phase 2n .

[0150] Step S305: for each first sub-signal and second sub-signal having a corresponding relationship in the time domain, determine whether there is noise interference based on the amplitude of each frequency point in the first sub-signal and the amplitude of each frequency point in the second sub-signal.

[0151] When analyzing whether there is noise interference in the first sub-signal, it is necessary to compare the corresponding first and second sub-signals in the time domain. Each first sub-signal includes multiple frequency points. For the first sub-signal, the shaft noise and interference noise have a greater impact on the amplitude of each frequency point, which can be regarded as the sum of the amplitude of the shaft noise and the amplitude of the interference noise. The number of frequency points in each second sub-signal is the same as the number of frequency points in the first sub-signal, and for the second sub-signal, the interference noise has a greater impact on the amplitude of each frequency point, which can be regarded as the amplitude of the interference noise.

[0152] Therefore, by comparing the amplitude of the first sub-signal at each frequency point with the amplitude of the second sub-signal at each frequency point, it can be determined whether the amplitude of the first sub-signal at each frequency point is primarily due to the amplitude of the abnormal shaft noise or the amplitude of the interference noise. If the amplitude of the first sub-signal at each frequency point is primarily due to the amplitude of the abnormal shaft noise, it indicates that there is no interference noise. If the amplitude of the first sub-signal at each frequency point is primarily due to the interference noise or due to both the abnormal shaft noise and the interference noise, it indicates that there is interference noise.

[0153] In some embodiments, for each first sub-signal and second sub-signal having a corresponding relationship in the time domain, the above step S305 may be implemented by the following steps:

[0154] Step S3051: obtaining the amplitude difference between each frequency point in the first sub-signal and the second sub-signal, and obtaining the average amplitude of each frequency point in the first sub-signal.

[0155] As can be seen from the above description, the first sub-signal includes multiple frequency points, each of which has a corresponding amplitude. When analyzing the frequency domain information of the first sub-signal, the average amplitude of each frequency point within each first sub-signal can be calculated to obtain the average amplitude of the first sub-signal in the frequency domain. Simultaneously, the amplitude difference corresponding to each frequency point in the first and second sub-signals is calculated to obtain the amplitude difference of the corresponding frequency points, facilitating subsequent analysis of interference noise.

[0156] For example, the amplitude of each frequency point in the first sub-signal can be A 1n , where n is an integer and is the nth frequency point, such as A 11 is the amplitude of the first frequency point in the first frequency domain information of the first sub-signal. The amplitude of each frequency point in the second sub-signal can be A 2n , where n is an integer and is the nth frequency point, such as A 21is the amplitude of the first frequency point in the second frequency domain information of the second sub-signal. At this time, the amplitude difference corresponding to each frequency point in the first sub-signal and the second sub-signal is A 1n -A 2n , the average amplitude of each frequency point in each first sub-signal mean(A1)=(A 11 +A 12 +…+A 1n ) / n.

[0157] Step S3052: Obtain the average value of the amplitude difference of each frequency point.

[0158] Because external interference noise typically presents a persistent sound signal, the first and second sub-signals can be directly compared across the entire frequency domain, eliminating the need to compare each frequency point one by one. This improves analysis efficiency. For example, the average of the amplitude differences at each frequency point and the average of each frequency point in the first sub-signal can be obtained to facilitate subsequent analysis of the interference noise.

[0159] For example, the average value of the amplitude difference of each frequency point (mean(A 1n -A 2n )=((A 11 -A 21 )+(A 12 -A 22 )+…+(A 1n -A 2n )) / n.

[0160] In some embodiments, the average value of the amplitude difference of each frequency point can also be obtained by calculating the average amplitude mean(A1) of each frequency point in the first sub-signal and the average amplitude mean(A2) of each frequency point in the second sub-signal, and taking the difference between mean(A1) and mean(A2).

[0161] It is understandable that in other embodiments, the average value of the amplitude difference of each frequency point may be obtained by other calculation methods, and the specific calculation method is not limited in this embodiment.

[0162] Step S3053: Determine whether there is noise interference based on the relationship between the average value of the amplitude difference of each frequency point and the average amplitude of each frequency point.

[0163] In this embodiment, whether noise interference exists may be determined by comparing the average value of the amplitude difference of each frequency point with the average amplitude of each frequency point.

[0164] For example, the ratio R of the average value of the amplitude difference of each frequency point divided by the average amplitude is calculated, for example: The ratio R can be expressed as the ratio of the average amplitude of the first sub-signal in the frequency domain information after noise interference is removed to its original average amplitude. In other words, the ratio R can represent the ratio of the average amplitude of the first sub-signal in the frequency domain information due to the abnormal shaft noise to its original average amplitude. Thus, if the ratio R of the first sub-signal amplitude is less than a first preset threshold, it indicates that the amplitude of the first sub-signal in the frequency domain information is primarily due to noise, and noise interference can be determined.

[0165] Optionally, the first preset threshold may be 0.1, and when R is less than 0.1, it indicates that noise interference exists, and when R is greater than or equal to 0.1, it indicates that there is no noise interference.

[0166] Alternatively, the first preset threshold may also be 0.15, 0.2, 0.25, etc., which is not limited in this embodiment.

[0167] Steps S303-S305 described above are used to determine whether noise interference exists within the first audio signal. This can be used to indicate whether noise reduction processing is required for the first audio signal. If noise reduction processing is performed directly on the first audio signal without determining whether noise interference exists within the first audio signal, the weak sound information of the abnormal shaft noise contained in the second audio signal will weaken the sound information of the abnormal shaft noise in the first audio signal, hindering the subsequent analysis of the abnormal shaft noise in the first audio signal.

[0168] In addition, the above steps S303-S305 are used to implement the above step S120. Therefore, for the contents not specifically expanded in S303-S305, reference can be made to the above step S120 and will not be repeated here.

[0169] When it is determined in step S305 that noise interference exists, noise reduction processing needs to be performed. For example, noise reduction processing can be performed section by section on the multiple first sub-signals using the multiple second sub-signals.

[0170] In the noise reduction processing, for each of the first sub-signal and the second sub-signal having a corresponding relationship in the time domain, the method includes:

[0171] Step S306: based on the amplitude of each frequency point in the second sub-signal, subtract the amplitude of each corresponding frequency point in the first sub-signal to obtain an adjusted amplitude of each frequency point in the first sub-signal.

[0172] In this embodiment, since the amplitude information of each frequency point in the second sub-signal is primarily affected by external interference noise, the amplitude information of each frequency point in the first sub-signal is affected by a combination of the abnormal shaft noise and the external interference noise. To eliminate the influence of the external interference noise on the abnormal shaft noise in the first sub-signal, the amplitude information of each frequency point in the second sub-signal can be used to subtract the amplitude information of each frequency point in the first sub-signal, thereby obtaining the adjusted amplitude information of each frequency point in the first sub-signal.

[0173] Exemplarily, the adjusted amplitude of each frequency point of the first sub-signal can be obtained by subtracting the amplitude of each frequency point of the second sub-signal from the amplitude of each frequency point of the first sub-signal.

[0174] If the first difference between the amplitude of each frequency point of the first sub-signal and the amplitude of each frequency point of the second sub-signal is greater than zero, in other words, A 1n -A 2n >0, the amplitude of each frequency point of the first sub-signal is adjusted to A' 1n Can be equal to the first difference A 1n -A 2n .

[0175] If the first difference between the amplitude of each frequency point of the first sub-signal and the amplitude of each frequency point of the second sub-signal is less than or equal to zero, in other words, A 1n -A 2n ≤0, then:

[0176] When A 1n -A 2n When <0, it means that the first sub-signal has almost no abnormal shaft noise collected at this frequency point, and only noise interference. In the subsequent analysis, it can be assumed that there is no abnormal shaft noise at this frequency point. At this time, the adjustment amplitude can be assigned to a preset constant value, which can be any value close to zero, but cannot be zero. When the adjustment amplitude in the frequency domain information is zero, after converting the frequency domain information into a time domain signal, the obtained time domain signal is zero. At this time, the sound pressure level of the calculated time domain signal will appear negative infinity. Therefore, in order to avoid abnormal values ​​in the subsequent calculation of the sound pressure level, the preset constant value can be directly set to non-zero.

[0177] When A 1n -A 2n = 0, as can be seen from the above description, an abnormal value will appear when calculating the sound pressure level. In this case, the adjustment amplitude needs to be assigned a preset constant value, which can be any value close to zero but not zero.

[0178] That is to say, the amplitude of the first sub-signal is adjusted at this frequency point

[0179] Exemplarily, α may be any value greater than zero and close to zero, such as 0.001, 0.0001, or 0.000001.

[0180] Step S307: combining the adjusted amplitude of each frequency point in the first sub-signal with the corresponding phase to obtain third frequency domain information corresponding to the first sub-signal.

[0181] In step S304, the first frequency domain information of the first sub-signal includes the amplitude and phase of each frequency point. The amplitude of each frequency point of the first sub-signal undergoes noise reduction processing in step S306 to obtain an adjusted amplitude for each frequency point. Therefore, the adjusted amplitude for each frequency point is combined with the corresponding phase information to obtain third frequency domain information. Thus, the third frequency domain information corresponds to the frequency domain information of the first sub-signal after noise reduction processing.

[0182] For example, after combining the adjusted amplitude of each frequency point in the first sub-signal with the corresponding phase information to obtain the third frequency domain information, the data of each frequency point of the first sub-signal in the third frequency domain information can be expressed as z′ n =A′ 1n ×(cos(phase 1n )+sin(phase 1n )i), where phase 1n is the phase of the first sub-signal at the nth frequency point in the first frequency domain information.

[0183] like Figure 13 As shown, the amplitude of the nth frequency point in the third frequency domain information is A′ 1n , phase is phase 1n .

[0184] Step S308: performing an inverse Fourier transform on the third frequency domain information corresponding to the first sub-signal to obtain a fourth audio signal corresponding to the first sub-signal.

[0185] After obtaining the third frequency domain information corresponding to the first sub-signal, the third frequency domain information of multiple first sub-signals can be converted into time domain signals through inverse Fourier transform (IFFT), thereby obtaining multiple fourth audio signals, so as to facilitate the subsequent calculation of the sound pressure level of the abnormal noise of the shaft.

[0186] Step S309: combining the fourth audio signals corresponding to the first sub-signals to obtain a third audio signal.

[0187] Since there are multiple fourth audio signals, and the multiple fourth audio signals correspond one-to-one to the multiple first sub-signals, the multiple fourth audio signals can be combined in the order of correspondence with the first sub-signals to obtain the third audio signal.

[0188] The third audio signal is obtained by performing noise reduction on the first audio signal based on the second audio signal, and the third audio signal is a signal after active noise reduction is performed in the shaft abnormal noise test.

[0189] Figure 16 is a schematic diagram of a time domain curve of the third audio signal provided by this embodiment.

[0190] Combine Figure 14 and Figure 16 , Figure 16 A time domain curve of a third audio signal obtained by performing noise reduction on the first audio signal based on the second audio signal is provided in FIG. Figure 16 (a) is the third audio signal after the first audio signal obtained from the first sampling point 211 is subjected to noise reduction processing. Figure 16 (b) is the third audio signal after noise reduction processing of the first audio signal obtained from the first sampling point 212. Figure 16 (c) is the third audio signal after the noise reduction processing is performed on the first audio signal obtained at the first sampling point 213 No. 3.

[0191] Compare separately Figure 14 (a) and Figure 16 (a) Figure 14 (b) and Figure 16 (b) Figure 14 (c) and Figure 16 As can be seen in (c) of the third audio signal obtained after noise reduction, the shaft noise signal is well preserved, while the external interference noise is largely removed. This demonstrates that the noise reduction method provided in this embodiment can reduce the external interference noise without affecting the shaft noise signal, thereby improving the accuracy of the shaft noise detection.

[0192] Figure 17 3 is a schematic diagram of a sound pressure level curve diagram of the first audio signal and the third audio signal in each subinterval provided by this embodiment.

[0193] Figure 17 The vertical axes of (a), (b), and (c) are all sound pressure levels in dB. Figure 17The horizontal axes of (a), (b), and (c) represent time periods or the number of subintervals, in units of . In this embodiment, a subinterval of the first audio signal is a first sub-signal, and a subinterval of the third audio signal is a fourth audio signal. For example, if the total duration of the first and third audio signals is 3 seconds and the target duration is 10 ms, segmenting the first and third audio signals yields 300 first sub-signals and 300 fourth audio signals.

[0194] Specifically, Figure 17 Taking points M and N in (a) as an example, point M represents the sound pressure level of the 50th first sub-signal, which is approximately 42 dB, and point N represents the sound pressure level of the 50th fourth audio signal, which is approximately 32 dB. During the same time period, the sound pressure level of the noise-reduced third audio signal is lower than that of the first audio signal, effectively reducing the possibility of misjudging abnormal shaft noise in device 200 due to external interference noise.

[0195] At the same time, from Figure 17 As can be seen from (a), (b), and (c) in the figure, the maximum sound pressure level in the first audio signal is about 74.51 dB. After noise reduction processing, the maximum sound pressure level in the third audio signal is 58.56 dB, reducing the noise by 15.95 dB.

[0196] also, Figure 17 In (a), (b), and (c), for the first audio signal, the maximum sound pressure level occurs in the 140th first sub-signal, and after noise reduction processing, the maximum sound pressure level occurs in the 90th fourth audio signal. This shows that the time period in which the maximum sound pressure level in the first audio signal occurs is caused by external interference noise, and is not just caused by abnormal shaft noise. If the abnormal shaft noise is judged directly by the first audio signal at this time, it is easily affected by external interference noise, resulting in misjudgment. However, judging the abnormal shaft noise by the third audio signal can eliminate the influence of external interference noise and obtain a more accurate judgment result.

[0197] The above-mentioned process of steps S306-S309 is mainly used to perform noise reduction processing on the first audio signal, thereby improving the accuracy of the subsequent analysis of the abnormal sound of the shaft and reducing the possibility of misjudgment.

[0198] It is worth noting that the above steps S306-S309 are used to implement the above step S130. Therefore, for the contents not specifically expanded in S306-S309, reference can be made to the above step S130 and will not be repeated here.

[0199] Step S310: determining whether an abnormal sound is generated during the opening and closing of the device under test 200 based on the third audio signal.

[0200] In this embodiment, the third audio signal includes multiple fourth audio signals, and the duration of each fourth audio signal is the same as the duration of the first sub-signal. When analyzing the abnormal shaft noise, the sound pressure level of each fourth audio signal can be directly calculated to determine whether the shaft of the device under test 200 has abnormal noise.

[0201] Exemplarily, if the sound pressure level of at least one fourth audio signal is greater than the second preset threshold, it is determined that the device under test 200 has abnormal noise during the opening and closing process of the body; if the sound pressure levels of all fourth audio signals are less than or equal to the second preset threshold, it is determined that the device under test 200 has no abnormal noise during the opening and closing process of the body.

[0202] Specifically, when the sound pressure level of at least one fourth audio signal is greater than the second preset threshold, it indicates that abnormal shaft noise is present in the fourth audio signal. In other words, when the sound pressure level of one fourth audio signal among the plurality of fourth audio signals is greater than the second preset threshold, it indicates that the device under test 200 has an abnormal shaft noise problem and is a defective product.

[0203] When the sound pressure levels of all fourth audio signals are less than or equal to the second preset threshold, it indicates that there is no abnormal shaft noise in the fourth audio signal. In other words, when the sound pressure level of no fourth audio signal among the plurality of fourth audio signals is greater than the second preset threshold, it indicates that the device under test 200 does not have an abnormal shaft noise problem and is a good product.

[0204] For example, the second preset threshold can be 60dB. Assuming that a fourth audio signal has a sound pressure level of 62dB, it indicates that the device under test 200 has abnormal shaft noise and is defective. If the sound pressure levels of all fourth audio signals are less than or equal to 60dB, it indicates that the device under test 200 does not have abnormal shaft noise.

[0205] The device abnormal noise testing method provided in this embodiment provides a method for selecting the first sampling point and the second sampling point. The method can also determine whether the first audio signal obtained at the first sampling point is subject to noise interference based on the second audio signal obtained at the second sampling point. The method can then use the second audio signal to perform noise reduction processing on the first audio signal, thereby removing the influence of external interference noise during the test process, avoiding misjudgment of abnormal shaft noise due to external interference noise, and improving the accuracy of the test results.

[0206] Figure 18 Schematic diagram of the structure of a device for testing abnormal noise of equipment provided in this embodiment.

[0207] like Figure 18As shown, this embodiment further provides an equipment abnormal sound testing device 300, including a first acquisition module 320, a second acquisition module 330, a processing module (not shown in the figure) and a sound insulation box 310.

[0208] The first acquisition module 320 is disposed in the soundproof box 310 and located at a first sampling point, and is configured to acquire a first original sound source signal at the first sampling point during the opening and closing process of the body of the device under test.

[0209] Exemplarily, the first acquisition module 320 may include multiple first microphones 321 spaced apart along the axis of the device's shaft. This allows the multiple first microphones 321 to correspond to different positions on the device's shaft. When performing a shaft abnormal sound test, the multiple first microphones 321 can capture any abnormal shaft sound for subsequent analysis.

[0210] It is worth noting that each first microphone 321 can collect a group of first original sound source signals. When analyzing the abnormal noise of the shaft, it is necessary to analyze each first original sound source signal to improve the accuracy of the test result.

[0211] Specifically, along the thickness direction of the device under test, each first microphone 321 is at the same distance from the rotating shaft, so that each first microphone 321 can collect abnormal noise from the rotating shaft for subsequent analysis.

[0212] Optionally, along the thickness direction of the device under test, each first microphone 321 is 2 cm away from the rotating shaft. This allows the first microphone 321 to be as close to the rotating shaft as possible while also providing a certain amount of spacing for the device under test to avoid affecting the opening and closing of the device under test.

[0213] The second acquisition module 330 is arranged in the soundproof box 310 at the second sampling point, and is configured to collect the second original sound source signal at the second sampling point during the opening and closing process of the body of the device under test, and the second acquisition module 330 and the first acquisition module 320 perform acquisition simultaneously.

[0214] Exemplarily, the second acquisition module 330 may include a second microphone 331, and the second microphone 331 is located away from the device under test and close to the inner wall of the soundproof box. The second microphone 331 basically does not pick up abnormal shaft noise, or the abnormal shaft noise picked up by the second microphone 331 is relatively weak and can be ignored. The second microphone 331 can pick up external interference noise. In this way, the second original audio signal can be used to determine whether there is noise interference in the first original sound source signal and to perform noise reduction and other processing on the first original sound source signal to improve the accuracy of the test results.

[0215] Optionally, along the thickness direction of the device under test, the second microphone 331 may be located at the same height as the first microphone 321 , or the second microphone 331 may be located at a different height from the first microphone 321 , which is not limited in this application.

[0216] The soundproof box 310 is used to provide a relatively independent and quiet space for the first acquisition module 320, the second acquisition module 330 and the device under test during the test process, thereby isolating the external noise interference to a large extent. During the test process, the soundproof box 310 is in a closed state.

[0217] The processing module is configured to filter the first original sound source signal to obtain a first audio signal, and filter the second original sound source signal to obtain a second audio signal. The processing module is also configured to determine whether there is noise interference based on the first and second audio signals. If there is noise interference, the processing module is further configured to perform noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal. The processing module is further configured to determine whether there is abnormal noise during the opening and closing of the device under test based on the third audio signal. In this way, the processing module can be used to process the audio signals collected by the first acquisition module 320 and the second acquisition module 330 to analyze whether there is abnormal noise from the shaft.

[0218] It is understandable that the processing module can be a computer, a control panel, a processor, or other equipment that can be used to process audio signals and is communicatively connected to the first acquisition module 320 and the second acquisition module 330. The processing module is not limited in this embodiment.

[0219] Optionally, a clamp, a bracket, etc. may be provided in the sound insulation box 310 .

[0220] The fixture is used to fix the device under test and drive the device under test to open and close. It is understandable that the fixture can be designed according to the size and type of the device under test and the structure of the sound insulation box 310, which is not limited in this embodiment.

[0221] The bracket can be used to support the first acquisition module 320 or the second acquisition module 330 .

[0222] For example, the bracket of the first acquisition module 320 can be positioned relative to the device under test, so that the first microphone 321 can be aligned with the rotation axis of the device under test. The bracket of the second acquisition module 330 can be positioned around the inner wall of the soundproof box 310, so that the second microphone can be positioned away from the device under test and can easily collect external interference noise.

[0223] It is understandable that the equipment abnormal sound testing device 300 may also include other structures, which are not limited in this embodiment.

[0224] The device abnormal noise testing device 300 provided in the present application has a first acquisition module 320 close to the shaft of the device to be tested that can not only collect abnormal noise from the shaft, but also collect external interference noise. At the same time, the second acquisition module 330 can collect external interference noise, and the sound of the abnormal noise from the shaft collected is weak and can be ignored. At this time, the second acquisition module 330 is equivalent to only collecting external interference noise. In this way, the processing module can use the audio information collected by the second acquisition module 330 to determine whether the audio information collected by the first acquisition module 320 is subject to noise interference, and can perform noise reduction processing on the audio signal collected by the first acquisition module 320 in the presence of noise interference, so that when the audio signal collected by the first acquisition module 320 is subsequently analyzed for abnormal noise from the shaft, the influence of external interference noise can be eliminated, thereby improving the accuracy of the test results.

[0225] It should be noted that those skilled in the art will readily conceive of other embodiments of the present application after considering the specification and practicing the application disclosed herein. This application is intended to cover any variations, uses, or adaptations of the present application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The description and examples are to be considered merely as exemplary, and the true scope of this application is indicated by the claims.

[0226] It should be understood that the present application is not limited to the exact structures described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A device abnormal sound testing method, characterized in that: include: During the opening and closing process of the device under test, obtaining a first audio signal at a first sampling point and a second audio signal at a second sampling point, wherein the distance between the first sampling point and the device under test is smaller than the distance between the second sampling point and the device under test; determining whether there is noise interference based on the first audio signal and the second audio signal; If noise interference exists, performing noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal; Determine whether there is an abnormal sound during the opening and closing of the device under test based on the third audio signal.

2. The device abnormal noise testing method according to claim 1, characterized in that: The determining whether there is noise interference based on the first audio signal and the second audio signal includes: Segmenting the first audio signal into a plurality of first sub-signals of target duration, and segmenting the second audio signal into a plurality of second sub-signals of the target duration, wherein the plurality of second sub-signals correspond one-to-one to the plurality of first sub-signals in the time domain; Obtaining first frequency domain information corresponding to each first sub-signal and second frequency domain information corresponding to each second sub-signal, wherein each first frequency domain information includes the amplitude and phase of each frequency point in the corresponding first sub-signal, and each second frequency domain information includes the amplitude and phase of each frequency point in the corresponding second sub-signal; For each of the first sub-signal and the second sub-signal that have a corresponding relationship in the time domain, whether noise interference exists is determined based on the amplitude of each frequency point in the first sub-signal and the amplitude of each frequency point in the second sub-signal.

3. The device abnormal noise testing method according to claim 2, characterized in that: The determining whether there is noise interference based on the amplitude of each frequency point in the first sub-signal and the amplitude of each frequency point in the second sub-signal for each of the first sub-signal and the second sub-signal that have a corresponding relationship in the time domain includes: For each of the first sub-signal and the second sub-signal having a corresponding relationship in the time domain: Obtaining an amplitude difference between each frequency point in the first sub-signal and the second sub-signal, and obtaining an average amplitude of each frequency point in the first sub-signal; Obtaining an average value of the amplitude differences of the respective frequency points; Based on the relationship between the average value of the amplitude differences of the various frequency points and the average amplitude of the various frequency points, it is determined whether there is noise interference.

4. The device abnormal noise testing method according to claim 3, characterized in that: The determining whether there is noise interference based on a relationship between an average value of the amplitude differences of the corresponding frequency points and an average amplitude of the frequency points includes: calculating a ratio of the average of the amplitude differences divided by the average amplitude; If the ratio is less than a first preset threshold, it is determined that noise interference exists.

5. The device abnormal noise testing method according to claim 2, characterized in that: If noise interference exists, performing noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal includes: For each of the first sub-signal and the second sub-signal having a corresponding relationship in the time domain: subtracting the amplitude of each corresponding frequency point in the first sub-signal based on the amplitude of each frequency point in the second sub-signal to obtain an adjusted amplitude of each frequency point in the first sub-signal; combining the adjusted amplitude and the corresponding phase of each frequency point in the first sub-signal to obtain third frequency domain information corresponding to the first sub-signal; Performing an inverse Fourier transform on the third frequency domain information corresponding to the first sub-signal to obtain a fourth audio signal corresponding to the first sub-signal; The fourth audio signals corresponding to the first sub-signals are combined to obtain the third audio signal.

6. The device abnormal noise testing method according to claim 5, characterized in that: The subtracting the amplitude of each corresponding frequency point in the first sub-signal based on the amplitude of each frequency point in the second sub-signal to obtain the adjusted amplitude of each frequency point in the first sub-signal includes: For each frequency point, if a first difference obtained by subtracting the amplitude of the second sub-signal at the frequency point from the amplitude of the first sub-signal at the frequency point is greater than zero, the adjusted amplitude of the frequency point is determined to be the first difference.

7. The device abnormal noise testing method according to claim 6, characterized in that: The subtracting the amplitude of each corresponding frequency point in the first sub-signal based on the amplitude of each frequency point in the second sub-signal to obtain the adjusted amplitude of each frequency point in the first sub-signal includes: For each frequency point, if a first difference obtained by subtracting the amplitude of the frequency point in the first sub-signal from the amplitude of the frequency point in the second sub-signal is less than or equal to zero, the adjusted amplitude of the frequency point is determined to be a preset constant value, and the preset constant value is greater than zero.

8. The device abnormal noise testing method according to claim 5, characterized in that: The determining, based on the third audio signal, whether there is an abnormal sound during the opening and closing of the device under test includes: If the sound pressure level of at least one of the fourth audio signals is greater than a second preset threshold, it is determined that the device under test has an abnormal sound during the opening and closing process of the device body; If the sound pressure levels of all the fourth audio signals are less than or equal to the second preset threshold, it is determined that no abnormal sound occurs during the opening and closing of the device under test.

9. The device abnormal noise testing method according to any one of claims 1 to 8, characterized in that: The method further comprises: obtaining a first audio signal at a first sampling point and a second audio signal at a second sampling point during the opening and closing process of the device under test, and before the distance between the first sampling point and the device under test is less than the distance between the second sampling point and the device under test; Step a. determining a first sampling point, wherein the first sampling point is adjacent to the device under test; Step b. determining a plurality of second preselected sampling points, wherein the second preselected sampling points are farther away from the device under test than the first sampling points; Step c. During the opening and closing process of the device under test, obtaining a first test audio signal of the first sampling point and a second test audio signal of one of the second preselected sampling points; Step d. obtaining a sound pressure level difference between the first test audio signal and the second test audio signal; Step e. Repeating steps c and d to obtain the sound pressure level difference at each of the second preselected sampling points; Step f. Selecting the second preselected sampling point with the largest sound pressure level difference as the second sampling point.

10. The device abnormal noise testing method according to any one of claims 1 to 8, characterized in that: The step of acquiring a first audio signal at a first sampling point and a second audio signal at a second sampling point during the opening and closing process of the device under test comprises: During the opening and closing process of the body of the device under test, synchronously collecting sound signals using a first collection module at the first sampling point and a second collection module at the second sampling point to obtain a first original sound source signal at the first sampling point and a second original sound source signal at the second sampling point; The first original sound source signal is filtered to obtain the first audio signal, and the second original sound source signal is filtered to obtain the second audio signal.

11. A device for testing abnormal noise of equipment, characterized in that: include: A first acquisition module, located at the first sampling point, is configured to acquire a first original audio signal at the first sampling point during the opening and closing process of the body of the device under test; a second acquisition module, located at the second sampling point, configured to acquire a second original audio signal at the second sampling point during the opening and closing of the device under test, wherein the distance between the first sampling point and the device under test is smaller than the distance between the second sampling point and the device under test, and the first acquisition module and the second acquisition module acquire the audio signal synchronously; a processing module configured to filter the first original sound source signal to obtain a first audio signal, and filter the second original sound source signal to obtain a second audio signal; The processing module is further configured to determine whether there is noise interference based on the first audio signal and the second audio signal; The processing module is further configured to, if noise interference exists, perform noise reduction processing on the first audio signal based on the second audio signal to obtain a third audio signal; The processing module is further configured to determine, based on the third audio signal, whether the device under test makes an abnormal sound during the opening and closing process of the device body.

12. The equipment abnormal noise testing device according to claim 11, characterized in that: The first acquisition module includes a plurality of first microphones, and the plurality of first microphones are arranged at intervals along the axis direction of the rotating shaft of the device under test; Along the thickness direction of the device under test, the distance between each of the first microphones and the rotation axis is the same.

13. The equipment abnormal noise testing device according to claim 11 or 12, characterized in that: Also includes: soundproof box; The first acquisition module and the second acquisition module are both arranged inside the soundproof box; The second acquisition module includes a second microphone, and the second microphone is close to the inner wall of the sound insulation box and away from the device under test.

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