Probe piece bearing device and using method thereof

Abstract

The invention relates to the technical field of scanning microscopes, in particular to a probe piece bearing device and a using method thereof. The invention provides a probe piece bearing device. The probe piece bearing device comprises a bearing plate, a locking piece and at least one locking piece, wherein the bearing plate is matched with a microscope carrying platform; the bearing plate is provided with a bearing part and a handheld part which are connected, the top surface of the bearing part is lower than the top surface of the handheld part, so that a vertical limiting surface is formed between the top surface of the bearing part and the top surface of the handheld part, the bearing part is used for bearing a probe piece, and the bearing part is provided with a through hole extending along the thickness direction of the bearing plate. The probe piece is locked on the top surface of the bearing plate by the locking piece, so that the probe piece is kept in an absolutely horizontal state and does not incline, and therefore, when the probe piece is observed by the scanning microscope, the focusing and the flat scanning of the microscope are not influenced by the inclination of the probe piece.

Description

Technical Field

[0001] The present invention relates to the technical field of scanning microscopes, and in particular to a probe sheet carrying device and a method for using the same. Background Art

[0002] In geological research, rock and mineral samples tested with electron microprobes are typically prefabricated as polished electron microprobe slides. These slides are bonded together with epoxy resin to create probe slides, which facilitate the identification and localization of mineral particles under an optical microscope. However, since the default size of the fully automated scanning microscope stage is that of a standard glass slide, which is larger than the probe slide, the probe slide does not fit the microscope stage and cannot be inserted smoothly.

[0003] As attached Figure 1 As shown, currently, the two sides of the probe sheet 4 are fixed to the top surface of the ordinary glass sheet 5 using plasticine 6, and then the ordinary glass sheet 5 with the probe sheet 4 is placed on the microscope stage. However, when squeezing the plasticine 6, it is inevitable that the plasticine 6 enters the gap between the probe sheet 4 and the ordinary glass sheet 5. It is very likely that the amount of plasticine 6 on the left and right sides of the probe sheet 4 and the ordinary glass sheet 5 is different, which can easily lead to a certain gap between the probe sheet 4 and the lower glass sheet 5, and the probe sheet 4 tilts relative to the ordinary glass sheet 5, which ultimately leads to scanning failure. Summary of the Invention

[0004] (1) The problem to be solved by the present invention is that the conventional method of using plasticine and ordinary glass sheets to install the probe sheet easily causes the probe sheet to tilt relative to the ordinary glass sheet, ultimately leading to scanning failure.

[0005] (2) Technical solution

[0006] A probe sheet carrying device comprises a carrying plate matched with a microscope loading platform, a locking sheet and at least one locking member;

[0007] The carrying plate has a carrying portion and a hand-held portion connected to each other, the top surface of the carrying portion is lower than the top surface of the hand-held portion, so that a vertical limit surface is formed between the top surface of the carrying portion and the top surface of the hand-held portion, the carrying portion is used to carry the probe sheet, and the carrying portion is provided with a through hole extending along the thickness direction of the carrying plate;

[0008] The locking piece cooperates with the locking member to lock the probe piece on the top surface of the bearing portion, and the limiting surface cooperates with the locking piece to limit the sliding of the probe piece relative to the bearing plate.

[0009] According to one embodiment of the present invention, the top of the supporting plate has a first top surface, a limiting surface and a second top surface connected in sequence, the first top surface and the second top surface are parallel, the first top surface and the limiting surface are perpendicular, the first top surface is lower than the second top surface, the first top surface is the top surface of the supporting part, the second top surface is the top surface of the hand-holding part, and the through hole is provided on the first top surface.

[0010] According to one embodiment of the present invention, the locking plate includes a first plate, a second plate, and a third plate connected in sequence, the first plate and the second plate are perpendicular to each other, and the first plate and the third plate are parallel to each other;

[0011] The locking member is a screw, the first plate is provided with at least one hole for the screw to pass through, and the supporting plate is provided with at least one screw hole adapted to the screw on the first top surface.

[0012] According to an embodiment of the present invention, the hole on the first plate is a strip-shaped hole, and the length direction of the strip-shaped hole is consistent with the length direction of the supporting plate.

[0013] According to an embodiment of the present invention, the distance between the top surface of the first plate body and the bottom surface of the third plate body is smaller than the thickness of the probe sheet.

[0014] According to an embodiment of the present invention, the width of the through hole is smaller than the width of the probe sheet.

[0015] According to one embodiment of the present invention, the supporting plate is any one of a copper plate, an aluminum plate, and a copper plate.

[0016] According to one embodiment of the present invention, the locking piece is a transparent plate.

[0017] A method for using a probe sheet carrier device, using the above-mentioned probe sheet carrier device, the method comprising the following steps:

[0018] S1: placing the probe sheet on the top surface of the carrying portion of the carrying plate, and making the side surface of the probe sheet close to the limiting surface of the carrying plate;

[0019] S2: Using the locking piece and the locking member to lock the probe sheet to the top surface of the carrying portion of the carrying plate;

[0020] S3: Place the carrier plate with the probe sheet on the stage of the microscope, and tighten the sheet clamp on the stage of the microscope to fix the carrier plate.

[0021] Beneficial effects of the present invention:

[0022] Using this probe carrier to install the probe piece can achieve the following technical effects:

[0023] First, since the probe piece is locked on the top surface of the carrier plate by the locking piece, the probe piece can be tightly attached to the carrier plate, so that the probe piece remains absolutely horizontal and will not tilt, thereby ensuring that when the scanning microscope observes the probe piece, the microscope focus and flat scanning will not be affected by the tilt of the probe piece.

[0024] Second, since the probe piece is locked on the top surface of the carrier plate by the locking piece, there is no plasticine impurity between the probe piece and the top surface of the carrier plate, and no impurities will be left in the test area of ​​the microscope, ensuring the reliability of the test results.

[0025] Third, since the probe piece is located above the through hole, and the area where the through hole is located is basically the microscope detection area, it can be ensured that when the probe piece is scanned, the microstructure of the mineral particles will not become blurred due to dust in the area below the probe piece.

[0026] Fourth, the method of using the locking piece and the locking member to lock the probe piece to the carrier plate is simple and easy to operate, and the probe piece can be locked to the carrier plate simply and quickly. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the specific embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0028] Figure 1 This is a schematic diagram of using plasticine to mount a probe sheet on an ordinary glass sheet in the prior art;

[0029] Figure 2 A front view of the probe sheet carrying device provided by an embodiment of the present invention after the probe sheet is installed;

[0030] Figure 3 A top view of the probe sheet carrying device provided by an embodiment of the present invention after the probe sheet is installed;

[0031] Figure 4 A front view of a probe sheet carrying device provided by an embodiment of the present invention;

[0032] Figure 5 A top view of a probe sheet carrying device provided by an embodiment of the present invention;

[0033] Figure 6 A structural diagram of a locking piece and a screw provided in an embodiment of the present invention;

[0034] Figure 7A schematic diagram of a probe sheet provided in an embodiment of the present invention.

[0035] Icons: 1. Carrying plate; 101. First top surface; 102. Second top surface; 103. Limiting surface; 104. Through hole; 2. Locking plate; 201. Strip hole; 202. First plate body; 203. Second plate body; 204. Third plate body; 3. Screw; 4. Probe piece; 401. Mineral particle distribution area; 5. Ordinary glass piece; 6. Plasticine. DETAILED DESCRIPTION

[0036] The following will clearly and completely describe the technical solutions of the present invention in conjunction with the embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0037] Example 1:

[0038] like Figure 2-Figure 7 As shown, the first embodiment of the present invention provides a probe sheet carrying device, comprising a carrying plate 1, a locking sheet 2 and at least one locking member;

[0039] The carrier plate 1 has a top and a bottom opposite to each other. The top of the carrier plate 1 is used to carry the probe sheet 4. The carrier plate 1 is provided with a through hole 104 extending along the thickness direction of the carrier plate 1.

[0040] The locking sheet 2 and the locking member cooperate to lock the probe sheet 4 on the carrier plate 1 .

[0041] In this embodiment, the probe sheet 4 is placed on the top surface of the carrier plate 1 so that the probe sheet 4 is located above the through hole 104, and then the locking sheet 2 and the locking member are used to lock the probe sheet 4 on the carrier plate 1. Then, the carrier plate 1 with the probe sheet 4 is placed on the stage of the microscope, and the pressing clamp on the stage of the microscope is tightened so that the pressing clamp presses one end or both sides of the carrier plate 1, thereby fixing the carrier plate 1.

[0042] In the past, the probe piece 4 was fixed to the ordinary glass piece 5 using plasticine 6, which inevitably caused the plasticine 6 to enter the gap between the probe piece 4 and the ordinary glass piece 5. It was particularly easy for the probe piece 4 to tilt due to the different amounts of plasticine 6 on both sides of the bottom of the probe piece 4. When performing scanning microscope observation, both focusing and flat scanning would be affected.

[0043] Secondly, using plasticine 6 to fix the probe piece 4 requires careful adjustment of the amount and position of the plasticine 6 each time it is placed. This process is rather cumbersome, and it is difficult to accurately control the distribution of the plasticine 6, so that the conditions for fixing the probe piece 4 each time may be inconsistent, increasing the uncertainty and error of the experimental operation.

[0044] In addition, since the plasticine 6 may enter the gap between the probe sheet 4 and the ordinary glass sheet 5, during the electronic probe test, the plasticine 6 may contaminate the test surface of the probe sheet 4. Because the composition of the plasticine 6 is different from that of the sample, it may leave impurities in the test area, interfering with the electronic probe's accurate analysis of the elemental composition of the sample and reducing the reliability of the test results.

[0045] Finally, the surface of the ordinary glass sheet 5 may sometimes be contaminated with dust, and the dust particles may scatter and absorb light, making the light passing through the glass sheet uneven. For example, when observing the microstructure of mineral particles, details such as cellular structures or fine cleavage lines may become blurred due to the interference of dust and cannot be accurately distinguished.

[0046] Different from this, this embodiment no longer uses the method of combining plasticine 6 and ordinary glass sheet 5 to fix the probe sheet 4, but directly places the probe sheet 4 above the through hole 104 of the carrier plate 1, and then uses the locking sheet 2 and the locking member to lock the probe sheet 4 on the carrier plate 1. This can achieve the following effects:

[0047] First, since the probe piece 4 is locked on the top surface of the carrier plate 1 by the locking piece 2, the probe piece 4 can be tightly attached to the carrier plate 1, so that the probe piece 4 remains absolutely horizontal and will not tilt, thereby ensuring that when the scanning microscope observes the probe piece 4, the microscope focus and flat scanning will not be affected by the tilt of the probe piece 4.

[0048] Second, since the probe piece 4 is locked on the top surface of the carrier plate 1 by the locking piece 2, there is no impurity of plasticine 6 between the probe piece 4 and the top surface of the carrier plate 1, and no impurities will be left in the test area of ​​the microscope, ensuring the reliability of the test results.

[0049] Third, since the probe piece 4 is located above the through hole 104 and the area where the through hole 104 is located is basically the microscope detection area, it can be ensured that when the probe piece 4 is scanned, the microstructure of the mineral particles will not become blurred due to dust appearing in the area below the probe piece 4.

[0050] Fourthly, the method of using the locking piece 2 and the locking member to lock the probe sheet 4 onto the carrier plate 1 is simple and easy to operate, and the probe sheet 4 can be locked onto the carrier plate 1 simply and quickly.

[0051] It should be noted that the size of the carrier plate 1 in this embodiment is substantially the same as that of the ordinary glass sheet 5 , that is, the size of the carrier plate 1 matches the loading area on the microscope loading platform.

[0052] In some embodiments, the width of the support plate 1 is 2 cm to 3 cm, the length is 8 cm to 8.5 cm, and the thickness is less than 1 cm. In this embodiment, the support plate 1 used is 3 cm in width, 8 cm in length, and 5 mm in thickness.

[0053] In some embodiments, the through hole 104 on the supporting plate 1 is rectangular in shape, with a width of 2 cm to 2.9 cm and a length of 4 cm to 5 cm. In this embodiment, the through hole 104 has a width of 2.8 cm and a length of 5 cm.

[0054] It should be noted that, typically, the probe sheet 4 has a width of 3 cm and a length of 4.8 cm. Since the width of the probe sheet 4 (3 cm) is greater than the width of the through hole 104 (2.8 cm), after the probe sheet 4 is placed on the first top surface 101 of the carrier plate 1, the probe sheet 4 will rest on the edges of the carrier plate 1 located in front and behind the through hole 104.

[0055] In this embodiment, if Figure 3 and Figure 4 As shown, the top of the supporting plate 1 has a first top surface 101, a limiting surface 103 and a second top surface 102 connected in sequence, the first top surface 101 and the second top surface 102 are parallel, the first top surface 101 and the limiting surface 103 are perpendicular, the first top surface 101 is lower than the second top surface 102, and the through hole 104 is provided on the first top surface 101.

[0056] Further, such as Figure 3 、 Figure 4 and Figure 5 As shown, the locking plate 2 includes a first plate body 202, a second plate body 203 and a third plate body 204 connected in sequence, the first plate body 202 and the second plate body 203 are perpendicular to each other, the first plate body 202 and the third plate body 204 are parallel, and at least one strip hole 201 is provided on the first plate body 202, and the length direction of the strip hole 201 is consistent with the length direction of the supporting plate 1.

[0057] In some embodiments, the locking member is any one of a screw 3 and a bolt, preferably a screw 3.

[0058] In this embodiment, at least one screw hole corresponding to each screw 3 is provided on the first top surface 101 .

[0059] In this embodiment, when installing the probe piece 4, first loosen the screw 3 on the locking piece 2, and then push the locking piece 2 outward, that is, toward Figure 4Push the locking piece 2 on the left side of the probe sheet 4, then place the probe sheet 4 above the through hole 104, and then push the locking piece 2 to the right. The surface of the second plate 203 of the locking piece 2 presses against the side wall of the probe sheet 4 and pushes the probe sheet 4 to the right until the right side of the probe sheet 4 is tightly against the limiting surface 103 of the carrier plate 1. Finally, tighten the screw 3. Under the pressure of the screw 3, the third plate 204 of the locking piece 2 is tightly pressed against the top surface of the probe sheet 4, thereby locking the probe sheet 4 to the carrier plate 1. Then place the carrier plate 1 on the microscope stage and use the pressure clamp on the microscope stage to press the carrier plate 1.

[0060] It should be noted that the strip hole 201 provided on the locking plate 2 enables the locking plate 2 to move left and right relative to the supporting plate 1, thereby adjusting the distance between the limiting surface 103 of the supporting plate 1 and the second plate body 203 of the locking plate 2, thereby being able to accommodate probe plates 4 of more sizes.

[0061] In addition, if the strip-shaped hole 201 is not provided, when replacing the probe piece 4 on the carrier plate 1, one can only first unscrew the screw 3, then remove the probe piece 4 and place another probe piece 4 on the carrier plate 1, and finally use the screw 3 to lock the locking piece 2 on the carrier plate 1, which is rather troublesome. In the present embodiment, when replacing the probe piece 4, one only needs to loosen the screw 3, then push the locking piece 2 toward the left so that the locking piece 2 is away from the probe piece 4, then directly remove the probe piece 4 on the carrier plate 1 and replace it with another probe piece 4, then push the locking piece 2 toward the right, and finally tighten the screw 3. In this way, the work of replacing the probe piece 4 can be completed without unscrewing the screw 3, which is more convenient to use.

[0062] It should be clear that the function of the limiting surface 103 of the carrier plate 1 is to cooperate with the locking plate 2 to limit the probe plate 4, prevent the probe plate 4 from moving on the carrier plate 1, and improve the stability of the probe plate 4 on the carrier plate 1.

[0063] Specifically, after placing the probe sheet 4 on the through hole 104 of the carrier plate 1, the locking sheet 2 is pushed toward the right, and the second plate 203 of the locking sheet 2 pushes the probe sheet 4 toward the limiting surface 103, so that the right side of the locking sheet 2 is tightly against the limiting surface 103, and then the screw 3 is tightened to fix the locking sheet 2. At this time, since the left and right side surfaces of the probe sheet 4 are tightly limited between the second plate 203 of the locking sheet 2 and the limiting surface 103 of the carrier plate 1, the probe sheet 4 is difficult to shake, thereby improving the stability of the probe sheet 4 on the carrier plate 1.

[0064] In this embodiment, the distance between the top surface of the first plate 202 of the locking plate 2 and the bottom surface of the third plate 204 is less than the thickness of the probe sheet 4. Thus, when the bottom surface of the third plate 204 of the locking plate 2 is attached to the top surface of the probe sheet 4, a certain gap still exists between the first plate 202 of the locking plate 2 and the upper surface of the first top surface 101 of the carrier plate 1. Then, when the screw 3 is tightened, the third plate 204 of the locking plate 2 can firmly press the probe sheet 4 under the pressure of the screw 3.

[0065] Since the third plate body 204 of the locking plate 2 can tightly press the probe plate 4, the bottom surface of the probe plate 4 can fully contact the first top surface 101 of the supporting plate 1, and the gap between the bottom surface of the probe plate 4 and the first top surface 101 of the supporting plate 1 is very small, which can keep the probe plate 4 in a horizontal state without tilting.

[0066] In some embodiments, the width of the locking piece 2 is 1 cm-2 cm, preferably 2 cm, and the width direction of the locking piece 2 is consistent with the width direction of the supporting plate 1 .

[0067] In some embodiments, the locking plate 2 is provided with a plurality of strip-shaped holes 201, which are arranged along the width direction of the locking plate 2. Accordingly, a plurality of screw holes are provided along the width direction of the first top surface 101 of the carrier plate 1. In this way, the probe sheet 4 can be more securely fastened to the carrier plate 1 using the plurality of screws 3.

[0068] In some embodiments, the carrier plate 1 is any one of a steel plate, an aluminum plate, and a copper plate, preferably a steel plate. It should be noted that this embodiment does not impose any specific restrictions on the material of the carrier plate 1.

[0069] It should be noted that the mineral particles are usually distributed in the middle area of ​​the probe sheet 4, rather than at the edge of the probe sheet 4. Figure 7 As shown, the distance a between the mineral particle distribution area 401 and the left edge of the probe sheet 4 and the distance b between the mineral particle distribution area 401 and the right edge of the probe sheet 4 generally vary in width. However, generally, the distance between the mineral particle distribution area 401 and the left edge of the probe sheet 4 is at least greater than 2 mm, and the distance between the mineral particle distribution area 401 and the right edge of the probe sheet 4 is at least greater than 2 mm.

[0070] Therefore, in order to prevent the locking piece 2 from blocking the mineral particles on the probe piece 4 and affecting the detection, the width of the third plate 204 of the locking piece 2 should be set between 1 mm and 2 mm, preferably 2 mm.

[0071] In this way, when the locking piece 2 presses the probe piece 4 , the third plate 204 of the locking piece 2 will not block the mineral particles on the probe piece 4 , and will not affect the detection result.

[0072] It should be noted that this embodiment does not impose any specific restrictions on the material of the locking piece 2. In some embodiments, the locking piece is made of copper or steel. Preferably, the locking piece 2 is made of copper.

[0073] In some embodiments, the locking piece 2 is a transparent piece, such as a transparent plastic plate. Since the locking piece 2 is transparent, the width of the third plate 204 of the locking piece 2 can be appropriately extended, for example, increased to 10 mm.

[0074] Example 2:

[0075] A second embodiment of the present invention provides a method for using a probe sheet carrying device, which specifically includes the following steps:

[0076] When the first probe sheet 4 is tested, the first step is to place the probe sheet 4 on the first top surface 101 of the carrier plate 1 and adjust the position of the probe sheet 4 so that three sides of the probe sheet 4 overlap the edges of the through hole 104 .

[0077] In the second step, align the strip hole 201 on the locking piece 2 with the screw hole on the supporting plate 1, and then pass the screw 3 through the strip hole 201 on the locking piece 2 and screw it into the screw hole on the supporting plate 1. Note that the screw 3 is not tightened at this time.

[0078] The third step is to push the locking piece 2 toward the side where the limiting surface 103 is located. The locking piece 2 pushes the probe piece 4 toward the side of the limiting surface 103 until the end face of the probe piece 4 facing the limiting surface 103 is tightly attached to the limiting surface 103, and then tighten the screw 3 with a screwdriver.

[0079] Alternatively, push the probe piece 4 toward the side where the limiting surface 103 is located so that the end face of the probe piece 4 facing the limiting surface 103 is tightly attached to the limiting surface 103, and then push the locking piece 2 toward the side where the limiting surface 103 is located so that the second plate 203 on the locking piece 2 is tightly attached to the probe piece 4, and then use a screwdriver to tighten the screw 3.

[0080] In the fourth step, the carrier plate 1 with the probe sheet 4 is placed on the stage of the microscope, and the sheet clamp on the stage of the microscope is tightened to fix the carrier plate 1 .

[0081] Step 5: After the first probe piece 4 is tested, loosen the screw 3 and gently push the locking piece 2 toward the side away from the limiting surface 103 to move the locking piece 2 away from the probe piece 4, and then remove the probe piece 4.

[0082] When testing the subsequent probe sheet 4 , first, the probe sheet 4 is placed on the first top surface 101 of the carrier plate 1 , and the position of the probe sheet 4 is adjusted so that three sides of the probe sheet 4 overlap the edges of the through hole 104 .

[0083] Then, push the locking piece 2 toward the side where the limiting surface 103 is located, and the locking piece 2 pushes the probe piece 4 toward the side of the limiting surface 103 until the end face of the probe piece 4 facing the limiting surface 103 is tightly attached to the limiting surface 103, and finally use a screwdriver to tighten the screw 3.

[0084] Alternatively, push the probe piece 4 toward the side where the limiting surface 103 is located so that the end face of the probe piece 4 facing the limiting surface 103 is tightly attached to the limiting surface 103, and then push the locking piece 2 toward the side where the limiting surface 103 is located so that the second plate 203 on the locking piece 2 is tightly attached to the probe piece 4, and then use a screwdriver to tighten the screw 3.

[0085] Finally, the carrier plate 1 with the probe sheet 4 is placed on the stage of the microscope, and the sheet clamp on the stage of the microscope is tightened to fix the carrier plate 1 .

[0086] It can be seen that the method of using the probe sheet supporting device has at least the following advantages compared to the previous method of fixing the probe sheet 4 by combining plasticine 6 and ordinary glass sheet 5:

[0087] First, the probe sheet 4 can be tightly attached to the carrier plate 1 , so that the probe sheet 4 remains absolutely horizontal without tilting.

[0088] Second, the probe sheet 4 is located above the through hole 104 . When the probe sheet 4 is scanned, the microstructure of the mineral particles will not be blurred due to dust in the area below the probe sheet 4 .

[0089] Third, the method of using the locking piece 2 and the locking member to lock the probe sheet 4 to the carrier plate 1 is simple and easy to operate, and the probe sheet 4 can be locked to the carrier plate 1 simply and quickly.

[0090] In the description of the present invention, it should be noted that the terms "upper" and "lower" and other terms indicating orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate and simplify the description of the present invention. They are not intended to indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation, and therefore should not be construed as limitations on the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0091] In the description of the present invention, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium, or they can refer to connections between the internal parts of two components. A person of ordinary skill in the art will understand the specific meanings of the above terms in the present invention based on the specific circumstances. In addition, in the description of the present invention, unless otherwise specified, "plurality" means two or more.

[0092] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A probe sheet carrying device, characterized in that: It comprises a carrier plate (1) matched with a microscope loading platform, a locking piece (2), and at least one locking member; The carrier plate (1) has a connected carrier portion and a hand-held portion, the top surface of the carrier portion is lower than the top surface of the hand-held portion, so that a vertical limiting surface (103) is formed between the top surface of the carrier portion and the top surface of the hand-held portion, the carrier portion is used to carry the probe sheet (4), and the carrier portion is provided with a through hole (104) extending along the thickness direction of the carrier plate (1); The locking piece (2) and the locking member cooperate to lock the probe piece (4) on the top surface of the bearing portion, and the limiting surface (103) and the locking piece (2) cooperate to limit the sliding of the probe piece (4) relative to the bearing plate (1).

2. The probe sheet carrying device according to claim 1, characterized in that: The top of the supporting plate (1) has a first top surface (101), a limiting surface (103) and a second top surface (102) connected in sequence, the first top surface (101) and the second top surface (102) are parallel to each other, the first top surface (101) and the limiting surface (103) are perpendicular to each other, the first top surface (101) is lower than the second top surface (102), the first top surface (101) is the top surface of the supporting part, the second top surface (102) is the top surface of the hand-held part, and the through hole (104) is provided on the first top surface (101).

3. The probe sheet carrying device according to claim 2, characterized in that: The locking plate (2) comprises a first plate (202), a second plate (203) and a third plate (204) connected in sequence, wherein the first plate (202) and the second plate (203) are perpendicular to each other, and the first plate (202) and the third plate (204) are parallel to each other; The locking member is a screw (3), the first plate (202) is provided with at least one hole for the screw (3) to pass through, and the supporting plate (1) is provided with at least one screw hole adapted to the screw (3) on the first top surface (101).

4. The probe sheet carrying device according to claim 3, characterized in that: The hole on the first plate (202) is a strip-shaped hole (201), and the length direction of the strip-shaped hole (201) is consistent with the length direction of the supporting plate (1).

5. The probe sheet carrying device according to claim 3, characterized in that: The distance between the top surface of the first plate body (202) and the bottom surface of the third plate body (204) is smaller than the thickness of the probe sheet (4).

6. The probe sheet carrying device according to claim 1, characterized in that: The width of the through hole (104) is smaller than the width of the probe sheet (4).

7. The probe sheet carrying device according to claim 1, characterized in that: The carrier plate (1) is any one of a copper plate, an aluminum plate, and a copper plate.

8. The probe sheet carrying device according to claim 1, characterized in that: The locking piece (2) is a transparent plate.

9. A method for using a probe sheet carrying device, characterized in that: A probe sheet carrying device according to any one of claims 1 to 8 is used, and the method of using the device comprises the following steps: S1: placing the probe sheet (4) on the top surface of the carrying portion of the carrying plate (1), and making the side surface of the probe sheet (4) close to the limiting surface (103) of the carrying plate (1); S2: Using the locking piece (2) and the locking member to lock the probe piece (4) to the top surface of the bearing portion of the bearing plate (1); S3: placing the carrier plate (1) with the probe sheet (4) on the microscope stage, and tightening the sheet clamp on the microscope stage to fix the carrier plate (1).

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