Hard disk testing method and electronic device

Abstract

The application provides a hard disk testing method and electronic equipment, which can be applied to the technical field of hard disk testing. The hard disk testing method comprises the following steps: running a to-be-tested hard disk under the condition that a plurality of physical fields are independently applied, to obtain a first running parameter set, wherein the first running parameter set comprises a running parameter and a first test parameter value of the running parameter; determining a plurality of target parameters that meet a predetermined condition from the first running parameter set according to a reference performance parameter set, wherein the reference performance parameter set is obtained by running the to-be-tested hard disk in an environment without a physical field; superimposing the physical fields corresponding to the plurality of target parameters respectively to obtain a superimposed physical field, and running the to-be-tested hard disk under the superimposed physical field to obtain a second running parameter set; and determining a test result of the to-be-tested hard disk according to the second running parameter set and the reference performance parameter set.

Description

Technical Field

[0001] The present invention relates to the technical field of hard disk testing, and in particular to a hard disk testing method and electronic equipment. Background Art

[0002] With the increase in data volume, the importance of data storage has become increasingly prominent. As the main device for storing data, the reliability of the hard disk directly affects the security of the data. Therefore, the hard disk needs to be tested for reliability to avoid the problem of low data security caused by unreliable hard disk.

[0003] Currently, during the hard drive testing process, there is a significant difference between the simulated test environment and the actual operating environment of the hard drive, making it difficult to obtain accurate hard drive test results, thereby reducing the accuracy of the hard drive test. Summary of the Invention

[0004] In view of the above problems, the present invention provides a hard disk testing method and electronic equipment for improving the hard disk testing accuracy.

[0005] One aspect of the present invention provides a hard disk testing method, including: operating the hard disk to be tested under the condition that multiple physical fields are independently applied to obtain a first operating parameter set, the first operating parameter set including operating parameters and first test parameter values ​​of the operating parameters; determining multiple target parameters that meet predetermined conditions from the first operating parameter set based on a reference performance parameter set, the reference performance parameter set being obtained by operating the hard disk to be tested in an environment without a physical field; superimposing physical fields corresponding to the multiple target parameters to obtain a superimposed physical field, and operating the hard disk to be tested under the superimposed physical field to obtain a second operating parameter set; and determining a test result of the hard disk to be tested based on the second operating parameter set and the reference performance parameter set.

[0006] Another aspect of the present invention provides an electronic device, comprising: one or more processors; a memory for storing one or more computer programs, wherein the one or more processors execute the one or more computer programs to implement the steps of the above method.

[0007] According to an embodiment of the present invention, a hard drive testing method is provided. A first set of operating parameters is obtained by applying a single physical field. Multiple target parameters that meet predetermined conditions are determined from the first set of operating parameters based on a reference performance parameter set. The physical fields corresponding to the target parameters are superimposed. The hard drive under test is operated in the superimposed physical fields to obtain a second set of operating parameters. Test results for the hard drive under test are obtained based on the second set of operating parameters and the reference performance parameter set. Due to the superimposed coupling of multiple physical fields, the test environment of the hard drive under test more closely resembles the actual operating environment of the hard drive under test. This makes the test results obtained based on the second set of operating parameters for the hard drive under test in the superimposed physical fields more accurate, thereby improving the accuracy of hard drive testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] The above contents and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0009] Figure 1 A system architecture diagram of a hard disk testing method according to an embodiment of the present invention is shown;

[0010] Figure 2 A flow chart of a hard disk testing method according to an embodiment of the present invention is shown;

[0011] Figure 3 A flowchart of a hard disk testing method according to another embodiment of the present invention is shown;

[0012] Figure 4 Shown is an architecture diagram of a hard disk testing system according to an embodiment of the present invention;

[0013] Figure 5 It shows a structural block diagram of a hard disk testing device according to an embodiment of the present invention;

[0014] Figure 6 A block diagram of an electronic device suitable for implementing a hard disk testing method according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0015] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present invention. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of embodiments of the present invention. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concept of the present invention.

[0016] The terms used herein are only for describing specific embodiments and are not intended to limit the present invention. The terms "comprise", "include", etc. used herein indicate the presence of the features, steps, operations and / or components, but do not exclude the presence or addition of one or more other features, steps, operations or components.

[0017] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0018] When expressions such as "at least one of A, B, and C, etc." are used, they should generally be interpreted in accordance with the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0019] As data storage demands grow, the reliability of hard drives, the core storage medium, directly impacts data storage security. Inaccurate hard drive reliability test results can lead to multiple hard drive failures, which in turn increases data recovery costs.

[0020] Currently, in the process of testing hard drives, only a single physical field is used to construct a test environment to simulate the real environment in which the hard drive operates. However, this test environment ignores the interactive coupling between multiple physical fields. Moreover, the single physical field is mostly a static physical field that cannot be dynamically adjusted. As a result, the difference between the test environment and the real environment is large, making it difficult to obtain accurate hard drive test results, thereby reducing the accuracy of hard drive testing.

[0021] In view of this, an embodiment of the present invention provides a hard disk testing method for operating a hard disk to be tested under the condition of superposition and coupling of multiple physical fields to obtain test results, thereby improving the accuracy of hard disk testing.

[0022] Figure 1 A system architecture diagram of a hard disk testing method according to an embodiment of the present invention is shown.

[0023] like Figure 1 As shown, the application scenario 100 according to this embodiment may include a control device 101 , a temperature changing device 102 , an electromagnetic vibration generating device 103 , a power supply 104 , and a hard disk to be tested 105 .

[0024] Control device 101 is electrically connected to temperature-changing device 102, electromagnetic vibration generator 103, and power supply 104. Temperature-changing device 102, electromagnetic vibration generator 103, and power supply 104 are electrically connected to hard disk under test 105. Control device 101 is configured to control at least one of temperature-changing device 102, electromagnetic vibration generator 103, and power supply 104 to apply a physical field to hard disk under test 105 and analyze operating parameters and parameter values ​​of hard disk under test 105. Control device 101 may be a server.

[0025] The temperature changing device 102 is used to apply a temperature field to the hard disk 105 under test. The electromagnetic vibration generating device 103 is used to apply a vibration field to the hard disk 105 under test. The power supply 104 is used to apply a power disturbance field to the hard disk 105 under test.

[0026] It should be noted that the hard disk testing method provided in the embodiment of the present invention can generally be executed by the control device 101. Accordingly, the hard disk testing apparatus provided in the embodiment of the present invention can generally be set in the control device 101. The hard disk testing method provided in the embodiment of the present invention can also be executed by a control device or a control device cluster that is different from the control device 101 and can communicate with the temperature change device 102, the electromagnetic vibration generating device 103, the power supply 104 and / or the control device 101. Accordingly, the hard disk testing apparatus provided in the embodiment of the present invention can also be set in a control device or a control device cluster that is different from the control device 101 and can communicate with the temperature change device 102, the electromagnetic vibration generating device 103, the power supply 104 and / or the control device 101.

[0027] It should be understood that Figure 1 The number of control devices 101, temperature changing devices 102, electromagnetic vibration generating devices 103, power supplies 104, and hard disks under test 105 is merely illustrative. Any number of control devices 101, temperature changing devices 102, electromagnetic vibration generating devices 103, power supplies 104, and hard disks under test 105 may be provided as needed.

[0028] The following will be based on Figure 1 The scene described by Figures 2 to 4 The hard disk testing method according to the embodiment of the present invention is described in detail.

[0029] Figure 2 A flow chart of a hard disk testing method according to an embodiment of the present invention is shown.

[0030] like Figure 2 As shown, the hard disk test of this embodiment includes operations S210 to S240.

[0031] In operation S210 , the hard disk under test is operated under the condition that a plurality of physical fields are independently applied to obtain a first operating parameter set, where the first operating parameter set includes operating parameters and first test parameter values ​​of the operating parameters.

[0032] In operation S220, a plurality of target parameters that meet predetermined conditions are determined from the first operating parameter set according to a reference performance parameter set, where the reference performance parameter set is obtained by operating the hard disk to be tested in an environment without a physical field.

[0033] In operation S230, the physical fields corresponding to the plurality of target parameters are superimposed to obtain a superimposed physical field, and the hard disk to be tested is operated under the superimposed physical field to obtain a second operating parameter set.

[0034] In operation S240 , a test result of the hard disk to be tested is determined according to the second operating parameter set and the reference performance parameter set.

[0035] In some embodiments, the physical field may refer to an environmental stress field applied to the hard disk, which may include a temperature field, a vibration field, and a power field.

[0036] The first operating parameter set may include operating parameters and first test parameter values ​​of the operating parameters. The operating parameters may include Self-Monitoring, Analysis, and Reporting Technology (SMART) parameters and hard disk underlying parameters. SMART parameters are basic parameters of the hard disk under test, such as the number of bad blocks, seek error rate, read speed, write speed, read error rate, and write error rate. Hard disk underlying parameters are core parameters of the hard disk under test, such as the head suspension resonant frequency, rotational vibration value, impact value, 12V voltage value, and head resistance value.

[0037] In some embodiments, during the process of reading the underlying signal, the hard disk servo signal can be read to ensure that the head accurately reads the underlying signal, the underlying signal can be controlled by the decoding threshold of the underlying signal to obtain decoded data, and the integrity of the underlying signal can be checked based on the decoded data.

[0038] In some embodiments, by operating the hard drive under test while independently applying each physical field, it is possible to simulate the extreme conditions that the hard drive under test might encounter during actual use and obtain operating parameters sensitive to each physical field. For example, if the temperature applied by the temperature field increases from 25°C to 70°C, and the read rate of the hard drive under test changes from D1 in the reference performance parameter set to D2, and the rate of change in the read rate (D2-D1) / D1 is greater than a predetermined rate of change threshold, the read rate of the hard drive under test is considered to be a target parameter sensitive to temperature changes.

[0039] The reference performance parameter set can be operating parameters and reference parameter values ​​obtained by operating the hard drive under test in a non-physical environment, such as a test environment at 25°C, without vibration or power disturbances. For example, the hard drive's read / write speed, latency, bit error rate, and corresponding reference parameter values ​​can be obtained in a test environment at 25°C, without vibration or power disturbances.

[0040] Based on the reference performance parameter set, multiple target parameters that meet the predetermined conditions can be determined from the first operating parameter set. The predetermined condition can be that the rate of change of the first test parameter value is greater than a predetermined rate of change threshold. In some embodiments, the current parameter can be a read rate parameter that is sensitive to the temperature field as described in the above embodiment. Each physical field can have at least one target parameter. For example, when the vibration frequency of the vibration field increases from 5 Hz to 2 kHz, the vibration frequency of the head cantilever changes from C1 to C2, and the rate of change of the vibration frequency of the head cantilever (C2-C1) / C1 is greater than the predetermined rate of change threshold, then the target parameter can be a head cantilever vibration frequency parameter that is sensitive to the vibration field. For example, if the power injection device injects a voltage drop from 12V to 9V into the hard drive under test, and the read error rate of the hard drive under test changes from W1 to W2, and the rate of change of the read error rate (W2-W1) / W1 is greater than the predetermined rate of change threshold, then the target parameter can be a read error rate parameter sensitive to power fields. If the write speed of the hard drive under test changes from X1 to X2, and the rate of change of the write speed (X2-X1) / X1 is less than the predetermined rate of change threshold, then the write speed cannot be used as a target parameter sensitive to power fields. The predetermined rate of change threshold can be adaptively adjusted based on actual needs, such as different parameter types.

[0041] Based on the reference performance parameter set, multiple target parameters that meet the predetermined conditions can be determined from the first operating parameter set. It can also be based on comparing the variance of the first test parameter value with the reference parameter value to obtain the target parameters that meet the predetermined conditions. The predetermined condition here can be adaptively adjusted so that the variance of the first test parameter value is greater than the predetermined variance.

[0042] In some embodiments, by operating the hard drive under test while independently applying each physical field, it is possible to simulate the extreme conditions that the hard drive might encounter during actual use, and to obtain the physical field parameters corresponding to hard drive failure or anomalies. These physical field parameters can then be used as the critical values ​​for the test environment. For example, if the hard drive generates an alarm or fails when the temperature field is applied to 90°C, 90°C can be used as the temperature critical value, and the test environment temperature must be set to less than 90°C.

[0043] Based on multiple target parameters determined from the first set of operating parameters, physical fields to which the multiple target parameters are respectively sensitive can be obtained. By superimposing the physical fields, a superimposed physical field can be obtained. For example, if the target parameters determined from the first set of operating parameters include read rate and head cantilever vibration frequency, then the physical fields to which the read rate and head cantilever vibration frequency are respectively sensitive, namely, the temperature field and the vibration field, can be superimposed. For example, the temperature can be adjusted to 85°C while applying a 2kHz sinusoidal vibration, where the root mean square value of the acceleration of the sinusoidal wave is 5 times the acceleration of gravity, to obtain a superimposed physical field. For example, if the target parameters determined from the first operating parameter set include read rate, head suspension vibration frequency, and read error rate, then physical fields sensitive to the read rate, head suspension vibration frequency, and read error rate, respectively, namely, the temperature field, vibration field, and power supply field, are superimposed. For example, the temperature is set to cycle from -20°C to 70°C at a rate of 10°C / min, and a vibration frequency of 5Hz to 500Hz with a power spectral density of 0.1g² / Hz is superimposed. A power supply disturbance field is also superimposed, where a voltage surge (16V, 100ms) is injected every 10 minutes, with 16V representing the voltage surge and 100ms representing the surge duration, to obtain a superimposed physical field. By operating the hard drive again under the superimposed physical field, the operating parameters of the hard drive are collected, and a second operating parameter set including the operating parameters and second test parameter values ​​of the operating parameters can be obtained.

[0044] For the same operating parameter, the difference between the second test parameter value and the reference parameter value can be obtained based on the comparison result of the second test parameter value of the operating parameter in the second operating parameter set and the reference parameter value of the operating parameter in the reference performance parameter set. When the difference is greater than a predetermined threshold, the operating parameter corresponding to the second test parameter value and the reference parameter value is taken as an abnormal parameter, and the test result can be obtained according to the fault type related to the abnormal parameter.

[0045] For example, if the difference between the second test parameter value and the reference parameter value for the tested hard drive temperature parameter is 20°C, which is greater than the predetermined threshold of 10°C, then the temperature parameter is considered abnormal. Based on the predetermined fault and operating parameter matching file, it can be determined that the fault type associated with the abnormal temperature parameter is controller thermal fatigue, which is related to an electrical fault in the tested hard drive. Based on controller thermal fatigue, the test result indicates that the tested hard drive may have an electrical fault. The fault and operating parameter matching file can record the mapping between operating parameters and fault types, and the fault type can be determined based on this mapping.

[0046] According to an embodiment of the present invention, a hard drive testing method is provided. A first set of operating parameters is obtained under the application of a single physical field. Based on a reference set of performance parameters, multiple target parameters that meet predetermined conditions are determined from the first set of operating parameters. The physical fields corresponding to the target parameters are superimposed. The hard drive under test is operated under the superimposed physical fields to obtain a second set of operating parameters. Test results for the hard drive under test are obtained based on the second set of operating parameters and the reference set of performance parameters. Due to the superimposed coupling of multiple physical fields, the test environment of the hard drive under test more closely resembles the actual operating environment of the hard drive under test. The test results obtained based on the second set of operating parameters for the hard drive under the superimposed physical fields are more accurate, thereby improving the accuracy of hard drive testing.

[0047] In some embodiments, the reference performance parameter set for the hard drive under test can be dynamically updated. For example, hard drives of different lifespans can be selected and operated in a non-physical environment to obtain reference performance parameter sets for different lifespan stages of the hard drives under test. Alternatively, for the same hard drive under test, the hard drive under test can be operated in a non-physical environment every predetermined period of time to obtain multiple reference performance parameter sets for the hard drive under test.

[0048] For example, the hard drive under test may have multiple reference performance parameter sets. When the hard drive under test is used for the first time, the hard drive under test is operated in a non-physical environment to obtain baseline parameter values ​​and an initial reference parameter set consisting of the baseline parameter values. When the hard drive under test is used for a predetermined period of time, the hard drive under test is operated in a non-physical environment after one predetermined period of time to obtain usage parameter values ​​for the predetermined period of time. Based on the baseline parameter values ​​and their weights, and the usage parameter values ​​and their weights, updated parameter values ​​and an updated reference parameter set consisting of the updated parameter values ​​can be obtained. Similarly, when the hard drive under test continues to be used for the predetermined period of time, the hard drive under test is operated in a non-physical environment after two predetermined periods of time to obtain usage parameter values ​​for the predetermined period of time. Based on the baseline parameter values ​​and their weights, and the usage parameter values ​​and their weights, updated parameter values ​​and an updated reference parameter set consisting of the updated parameter values ​​can be obtained until the hard drive is no longer usable. The weight of the baseline parameter value can reflect the importance of the baseline parameter in the updated parameter, and the weight of the usage parameter value can reflect the importance of the usage parameter in the updated parameter. The sum of the weight of the baseline parameter value and the weight of the usage parameter value can be 1.

[0049] According to an embodiment of the present invention, by dynamically updating the reference parameter set, the performance degradation of the hard disk after aging can be taken into account in determining the target parameters and the test results of the hard disk to be tested, thereby improving the accuracy of the hard disk test.

[0050] In some embodiments, the physical fields may include at least two of a temperature field, a vibration field, and a power field. The temperature field may be used to apply temperature to the hard disk under test, the vibration field may be used to apply a vibration spectrum to the hard disk under test, and the power field may be used to apply a power disturbance field to the hard disk under test.

[0051] The above-mentioned operation S210 may include the following operations: applying a temperature field to the hard disk under test through a temperature variable device to obtain a temperature parameter subset of the temperature field; applying a vibration field to the hard disk under test through an electromagnetic vibration generating device to obtain a vibration parameter subset of the vibration field; applying a power field to the hard disk under test through a power supply to obtain a power parameter subset of the power field; and determining a first operating parameter set based on the temperature parameter subset, the vibration parameter subset, and the power parameter subset. The operating parameters in the temperature parameter subset, the vibration parameter subset, and the power parameter subset may be the same, but the first test parameter values ​​of the operating parameters are different. The difference between these three parameter subsets is that the temperature parameter subset is obtained by collecting the operating parameters and the first test parameter values ​​of the operating parameters of the hard disk under test when the temperature field is applied alone to the hard disk under test, the vibration parameter subset is obtained when the vibration field is applied alone, and the power parameter subset is obtained when the power field is applied alone.

[0052] The temperature-variable device may include a high-low temperature alternating test chamber. The temperature-variable device applies a temperature field to the hard drive under test. This may be achieved by using a high-low temperature alternating test chamber to apply a temperature field within a range of -40°C to 125°C, with rapid temperature changes (≥20°C / min). The temperature-variable device can achieve localized thermal shock to the hard drive under test, such as targeted heating / cooling of specific areas of the hard drive, such as the main control area and storage particle area. The main control area may be the area where the controller on the hard drive under test is located. The controller is responsible for managing data storage, reading and writing, error correction, wear leveling, garbage collection, and other operations. The storage particle area may be the area where the storage particles are located. The storage particles may be the physical medium on the hard drive under test that actually stores data. The controller may store data in the storage particles.

[0053] The local thermal shock of the temperature-variable device can be achieved through precise temperature control of micro-thermoelectric arrays, dynamic positioning compensation by machine vision, gradient temperature field and pulse thermal shock, and multi-physical field collaborative loading process.

[0054] In some embodiments, precise temperature control using a micro-thermoelectric array can be achieved by deploying multiple thermoelectric cooling units on the surface of the hard drive under test. These units are used to control the temperature of the hard drive under test. By applying a temperature field to the units through a temperature-variable device, the hard drive under test is operated to obtain a subset of temperature parameters.

[0055] In some embodiments, the temperature-changing device can apply a temperature within a predetermined temperature range to the thermoelectric cooling unit. For example, the predetermined temperature range includes temperature A and temperature B different from temperature A. For example, by adjusting the temperature of all thermoelectric cooling units on the surface of the hard disk under test to temperature A and then operating the hard disk under test, a subset of temperature parameters under the temperature field can be obtained. For another example, by adjusting the temperature of at least one target thermoelectric cooling unit on the surface of the hard disk under test to temperature A, and adjusting the temperatures of the remaining thermoelectric cooling units on the surface of the hard disk under test, excluding the at least one target thermoelectric cooling unit, to temperature B, and then operating the hard disk under test, a subset of temperature parameters under the temperature field can be obtained. For another example, by adjusting the temperature of at least one target thermoelectric cooling unit on the surface of the hard disk under test to temperature A, and adjusting the temperatures of the remaining thermoelectric cooling units on the surface of the hard disk under test, excluding the at least one target thermoelectric cooling unit, to 25°C in a physical field-free environment, and then operating the hard disk under test, a subset of temperature parameters under the temperature field can be obtained.

[0056] According to an embodiment of the present invention, by deploying thermoelectric cooling units, differentiated temperature control can be achieved for the main control area and storage chip area of ​​the hard drive under test, avoiding the temperature gradient distortion caused by the overall heating / cooling of a traditional constant temperature chamber. Furthermore, by independently controlling each thermoelectric cooling unit, a non-uniform temperature distribution (e.g., high temperature on one side, low temperature on the other) can be created on the surface of the hard drive under test, simulating the localized thermal coupling effects of stacking multiple hard drives within a server chassis. This makes the test environment of the hard drive under test more realistic, improving the test accuracy of the hard drive under test.

[0057] In some embodiments, applying a temperature field to a thermoelectric cooling unit through a temperature changing device can be achieved by applying a temperature field to any thermoelectric cooling unit among a plurality of thermoelectric cooling units, and making the temperatures of the other thermoelectric cooling units except any one thermoelectric cooling unit the same as the temperature in an environment without a physical field.

[0058] In some embodiments, the processing operation for any thermoelectric cooling unit may include the following process: adjusting the temperature of any thermoelectric cooling unit to a predetermined temperature state, operating the hard disk under test, and obtaining a temperature parameter set for any thermoelectric cooling unit. Based on the temperature parameter set of any thermoelectric cooling unit under multiple predetermined temperature states, a temperature parameter subset may be obtained.

[0059] In some embodiments, each thermoelectric cooling unit deployed on the surface of the hard drive under test can be 5mm x 5mm in size and independently controlled. Based on real-time monitoring using the thermoelectric cooling units and infrared thermal imaging, it is possible to achieve fixed-point temperature control of both the main control area and the storage chip area with an accuracy of ±0.5°C. For example, the main control area can be heated to 85°C to test the thermal stability of the hard drive under test, while maintaining the storage chip area at a normal temperature of 25°C. This yields a set of temperature parameters.

[0060] In some embodiments, the processing operation for any thermoelectric cooling unit may also include the following process: for any thermoelectric cooling unit among multiple thermoelectric cooling units, any thermoelectric cooling unit can be used as a temperature control unit, and the remaining thermoelectric cooling units among the multiple thermoelectric cooling units except the temperature control unit are used to obtain a set of temperature-free control units; a temperature field is applied to the temperature control unit, and the temperature of the control unit in the set of temperature-free control units is made the same as the temperature in an environment without a physical field, and the hard disk to be tested is run to obtain a temperature parameter subset.

[0061] The process of applying a temperature field to a temperature control unit, making the temperature of the control units in a set without temperature control units the same as the temperature in an environment without a physical field, and running the hard disk to be tested to obtain a temperature parameter subset may include the following operations: looping the following operations until all the thermoelectric cooling units in the set without temperature control units are marked thermoelectric cooling units: adjusting the temperature of the thermoelectric cooling unit serving as the temperature control unit to a temperature within a predetermined temperature range, and running the hard disk to be tested until all the temperatures within the predetermined range are reached by the thermoelectric cooling unit, thereby obtaining a temperature parameter group; marking the thermoelectric cooling unit serving as the temperature control unit as a completion of the temperature test, and adding the marked thermoelectric cooling unit to the set without temperature control units, and selecting an unmarked thermoelectric cooling unit from the set without temperature control units as the temperature control unit; in the case where all the thermoelectric cooling units in the set without temperature control units are marked thermoelectric cooling units, a temperature parameter subset may be obtained based on multiple temperature parameter groups.

[0062] According to an embodiment of the present invention, by implementing local temperature control of the hard disk under test based on each thermoelectric cooling unit, it is possible to ensure full coverage of the thermoelectric cooling units while accurately locating the temperature-sensitive areas of the hard disk under test, clarifying the temperature changes in different areas, improving the comprehensiveness and accuracy of the hard disk test, and improving the accuracy of the hard disk test results.

[0063] According to an embodiment of the present invention, by independently controlling the temperature of the thermoelectric cooling unit and applying multiple predetermined temperature states to the same thermoelectric cooling unit, a temperature parameter group corresponding to the unit is generated and integrated into a temperature parameter subset. This allows for refined independent control of the thermoelectric cooling unit, changing the test environment of the hard drive to be tested from an overall uniform temperature control to a temperature difference control test scenario, thereby improving the accuracy of the hard drive test.

[0064] In some embodiments, the above-mentioned process of adjusting the temperature of any thermoelectric cooling unit to a predetermined temperature state and running the hard disk to be tested to obtain a temperature parameter group for any thermoelectric cooling unit may include the following operations: gradually increasing the temperature of the thermoelectric cooling unit according to the temperature adjustment step, and running the hard disk to be tested until the temperature of the thermoelectric cooling unit is raised from the lower limit temperature value to the upper limit temperature value; collecting the first test parameter value of the hard disk to be tested to obtain the temperature parameter group.

[0065] In some embodiments, the temperature adjustment step is 5°C / 30 minutes, the upper temperature limit is 70°C, and the lower temperature limit is 25°C. The temperature of the thermoelectric cooling unit can be increased from 25°C to 70°C at a rate of 5°C / 30 minutes. The hard disk under test is operated and its operating parameters are collected each time the temperature is increased by 5°C to obtain a temperature parameter group. A temperature parameter subset can be obtained based on the multiple temperature parameter groups.

[0066] According to an embodiment of the present invention, by performing a step-by-step temperature test on the thermoelectric cooling unit, the inflection point temperature of the hard disk performance parameters can be accurately recorded. The stepped temperature increase can avoid transient response interference caused by sudden temperature changes. In addition, by combining the parameter mutation point with the phase transition temperature of the hard disk internal material, the root cause of physical layer failure can be located, providing an extremely fine-grained decision-making basis for the hard disk testing process, thereby improving the accuracy of hard disk testing.

[0067] In some embodiments, machine vision dynamic positioning compensation for localized thermal shock can utilize a high-resolution industrial camera to identify the component layout of the hard drive under test. A six-axis robotic arm can then adjust the array of thermoelectric cooling units. This ensures close contact between the thermal coupling interfaces is maintained even if the drive shifts (e.g., ±0.2mm) during vibration testing. In a vibrating environment, a laser rangefinder can assist in correcting positioning offsets to ensure the temperature control zone remains within the target.

[0068] Localized thermal shock features include gradient temperature fields and pulsed thermal shock modes, which allow programmable control of temperature gradients across multiple regions. For example, a linear temperature field can be constructed from the main control area (120°C) to the storage core area (60°C), simulating actual uneven heat dissipation conditions. Millisecond-level pulse heating (e.g., a 30°C local temperature increase within 10ms) can be supported to replicate thermal transients caused by bursty read / write loads, potentially triggering potential faults such as solder joint fatigue.

[0069] The multi-physics field collaborative loading mode of local thermal shock can be to simultaneously inject vibration (such as 200Hz resonant frequency) and power supply disturbance (voltage drop) during the fixed-point temperature control process. By monitoring the power supply ripple changes in the main control area at high temperature (such as 70°C), or the data reading and writing errors when the storage particle area vibrates at low temperature (such as 25°C), the temperature-vibration-electrical coupling failure mechanism can be revealed.

[0070] In some embodiments, the electromagnetic vibration generator may include a multi-degree-of-freedom electromagnetic vibration table with a frequency range of 5Hz to 2kHz, supporting random vibration, sine sweep, and shock spectrum simulation. In some embodiments, custom vibration spectra can also be used to simulate vibration environments in scenarios such as automotive, aviation, and industrial equipment.

[0071] In some embodiments, a vibration field is applied to the hard disk under test through an electromagnetic vibration generating device, for example, a vibration field with a sinusoidal sweep frequency of 5 Hz to 2 kHz is applied. Under this vibration field, the mechanical resonance point parameters of the hard disk under test (such as the resonant frequency of the head cantilever) can be collected.

[0072] In some embodiments, a power field is applied to the hard drive under test via a power supply, and the power parameter subset obtained from the power field can be applied to the hard drive under test via a programmable DC power supply. The programmable power supply can support voltage fluctuations (±20%), instantaneous drops (12V to 5V within 5ms), surges (200% overvoltage), and high-frequency noise (1MHz to 100MHz). For example, a voltage drop (12V to 9V for 50ms) is injected into the hard drive under test to test the hard drive's anti-interference ability.

[0073] According to an embodiment of the present invention, by independently applying multiple physical fields to the hard disk to be tested, the individual influence of the physical field on the hard disk to be tested can be obtained, and then the parameters sensitive to the physical field can be determined. Then, the physical field of the sensitive parameter is superimposed, and the operating conditions of the hard disk to be tested under the superimposed physical field can be obtained, so that the test environment of the hard disk to be tested is closer to the real environment, thereby improving the coverage and accuracy of the test of the hard disk to be tested.

[0074] When the above-mentioned physical field is applied, the operating parameters of the hard disk to be tested need to be collected. The collection process can include two parts: multi-physical field sensor array data collection and hard disk health monitoring.

[0075] The operating data of the hard drive under test can be categorized into temperature (e.g., hard drive surface temperature distribution), vibration (e.g., seek error rate, head suspension resonant frequency), and power supply (e.g., 5V voltage, 12V voltage). Multi-physics sensor array data acquisition can be categorized into temperature, vibration, and power supply data.

[0076] Temperature data can be collected using patch thermocouples (±0.5°C accuracy) and infrared thermal imagers (spatial resolution 0.1mm).

[0077] Vibration data can be collected using a micro-electro-mechanical systems (MEMS) accelerometer (50 kHz sampling rate) and a laser vibrometer (non-contact measurement).

[0078] Power supply data can be acquired by using a current probe (1 GHz) and an oscilloscope to record transient responses.

[0079] Hard drive health monitoring can be performed by collecting SMART parameters (such as the number of bad blocks and seek error rate) in real time and determining the drive's health based on these parameters. It can also analyze the drive's underlying signals, such as reading the drive's servo signals to ensure the head accurately reads the underlying signals. The underlying signals are then controlled using decoding thresholds to generate decoded data. Based on this decoded data, the underlying signals are then integrity-checked to determine the drive's health.

[0080] In some embodiments, the first operating parameter set collected using the above-described collection method may be compared with a reference performance parameter set. For example, the reference performance parameter set includes reference parameter values ​​of the operating parameters. Determining multiple target parameters that meet predetermined conditions from the first operating parameter set based on the reference performance parameter set may include the following operations: determining a rate of change of the first test parameter value based on the reference parameter value of the operating parameter and a first test parameter value; and, if the rate of change of the first test parameter value exceeds a predetermined rate of change threshold, determining the operating parameter corresponding to the first test parameter value as the target parameter.

[0081] In some embodiments, a reference parameter value and a first test parameter value can be compared to obtain a rate of change of the first test parameter value. If the rate of change is greater than a predetermined rate of change threshold, the operating parameter corresponding to the first test parameter value can be considered to be a parameter sensitive to physical fields. For example, if the temperature of the hard disk under test changes from 25°C to 30°C, and the parameter value of operating parameter E changes from reference parameter value E1 to first test parameter value E2, then the rate of change of the first test parameter value is (E2-E1) / E1, which is greater than the predetermined rate of change threshold, and operating parameter E is considered to be sensitive to temperature fields. For another example, if the temperature of the hard disk under test changes from 25°C to 30°C, and the parameter value of operating parameter F changes from reference parameter value F1 to first test parameter value F2, then the rate of change of the first test parameter value is (F2-F1) / F1, which is greater than the predetermined rate of change threshold, and operating parameter F is considered to be insensitive to temperature fields.

[0082] According to an embodiment of the present invention, by utilizing the above method, target parameters that are sensitive to the physical field can be obtained. Based on the target parameters, physical fields can be superimposed, and the hard disk to be tested can be tested under the superimposed physical field. This can make the test environment of the hard disk to be tested closer to the real environment, thereby improving the test accuracy of the hard disk.

[0083] In some embodiments, when the target parameters are obtained according to the above operations, the physical fields corresponding to multiple target parameters can be synchronously superimposed or asynchronously superimposed to obtain a superimposed physical field. Synchronous superposition means that the physical fields corresponding to multiple target parameters are applied to the hard disk to be tested at the same time, and asynchronous superposition means that the physical fields corresponding to multiple target parameters are applied to the hard disk to be tested alternately at a predetermined frequency.

[0084] For example, if the target parameters correspond to temperature, vibration, and power fields, the simultaneous superposition of physical fields can include applying a temperature field ranging from -20°C to 70°C at a rate of 10°C / min, superimposing a vibration field ranging from 5Hz to 500Hz with a power spectral density of 0.1g² / Hz, and simultaneously superimposing a power disturbance field that injects a voltage surge (16V, 100ms) every 10 minutes, with 16V representing the voltage surge and 100ms representing the surge duration, to produce the superimposed physical field. This superimposed physical field can simulate the actual operating environment of the hard drive under test, accelerating its aging.

[0085] The asynchronous superposition of physical fields may include: applying a temperature field ranging from -20°C to 70°C with a change rate of 10°C / min; after the temperature field is applied for a predetermined time, it is replaced with a vibration field ranging from 5Hz to 500Hz with a power spectrum density of 0.1g² / Hz; after the vibration field is applied for a predetermined time, it is replaced with a power disturbance field that injects a voltage surge (16V, 100ms) every 10 minutes, where 16V is the voltage surge and 100ms is the duration of the surge; after the power field is applied for a predetermined time, the temperature field continues to be applied.

[0086] In other embodiments, the temperature field and vibration field can be superimposed, or the temperature field and power field can be superimposed. For example, a 2kHz sinusoidal vibration with a root mean square acceleration of 5 times the acceleration of gravity can be applied at a temperature of 85°C. Another example is a 5ms power outage at a temperature of -40°C. These extreme test environments can help screen for potential defects in the hard drive under test.

[0087] According to an embodiment of the present invention, a superimposed physical field is obtained by synchronously or asynchronously superimposing physical fields. Testing the hard disk to be tested under the superimposed physical field can improve the accuracy of the hard disk to be tested and improve the reliability of the test results of the hard disk to be tested.

[0088] In some embodiments, the hard disk to be tested is operated under the above-mentioned superimposed physical field, and the operating parameters of the hard disk to be tested, as well as the second test parameter value under the superimposed physical field, are collected to obtain a second operating parameter set. Based on the second operating parameter set and the reference performance parameter set, the test result of the hard disk to be tested can be determined. The process may include the following operations: determining the difference between the second test parameter value in the second operating parameter set and the reference parameter value in the reference performance parameter set; determining abnormal operating parameters from the second operating parameter set based on the comparison result between the difference and a predetermined threshold; and obtaining the test result based on the fault type related to the abnormal operating parameter.

[0089] In some embodiments, the abnormal operating parameter can be determined based on a comparison result between the difference between the second test parameter value and the reference parameter value and a predetermined threshold. For example, in a superimposed physical field of a temperature field and a vibration field, where the temperature field applies a uniform temperature to all thermoelectric cooling units, if the difference between the second test parameter value and the reference parameter value for the temperature of the main control area of ​​the hard disk under test is greater than a predetermined threshold (e.g., 10°C), the abnormal operating parameter of the hard disk under test can be considered to be the temperature of the main control area. Based on the abnormal main control area temperature, it can be determined that the controller of the main control area of ​​the hard disk under test has failed. The fault type associated with this fault may be an electrical fault, so the test result may be that an electrical fault has occurred in the hard disk under test.

[0090] In some embodiments, when the abnormal operating parameter is a vibration spectrum, if the rate of change of the vibration spectrum reaches a predetermined threshold, it can be considered that the bearing of the hard disk under test is worn, and the test result of a mechanical failure of the hard disk under test is obtained. When the abnormal operating parameter is an acoustic emission signal, if the acoustic emission signal has an abnormal signal value, it can be considered that the head of the hard disk under test has crashed, and the test result of a mechanical failure of the hard disk under test is obtained. When the abnormal operating parameter is power supply ripple, if the power supply ripple increases to a predetermined threshold or the increase value of the power supply ripple reaches a predetermined threshold, it can be considered that the capacitor of the hard disk under test has aged, and the test result of an electrical failure of the hard disk under test is obtained. The predetermined thresholds can be adaptively set according to actual needs.

[0091] According to an embodiment of the present invention, by automatically performing difference threshold determination and abnormal parameter correlation analysis, accurate detection and classification of hard disk failures under multi-physical field coupling conditions are achieved, thereby improving the efficiency and accuracy of hard disk testing.

[0092] In some embodiments, the parameters of the physical field can also be automatically adjusted based on the parameter values ​​of real-time operating parameters (such as temperature drift, vibration resonance frequency change) to ensure accurate stress loading.

[0093] In some embodiments, a combination of wavelet transform and machine learning can be used to separate the contributions of temperature, vibration, and power supply disturbances to faults. For example, a Gaussian frequency-modulated sine wavelet is used on the vibration signal to separate vibration components in different frequency bands to obtain the characteristics of the contribution of vibration to the fault. A rectangular pulse wavelet is used on the temperature signal to extract temperature sudden change events to obtain the characteristics of the contribution of temperature to the fault. A compactly supported orthogonal wavelet family is used on the power supply signal to separate steady-state power supply and transient surges to obtain the characteristics of the contribution of power supply to the fault. The machine learning model is trained based on the separated contribution characteristics. The trained machine learning model can output the fault type of the hard disk to be tested based on the input physical field characteristics.

[0094] In another embodiment, the chemical degradation law of the hard disk under test driven by temperature can be combined with the physical failure process of the hard disk under test based on the materials science and mechanics of the hard disk to construct a multi-stress coupling life prediction model to predict the mean time between failures of the hard disk under test in a complex environment.

[0095] In another embodiment, a copula model may be used to quantify the interaction coefficients of temperature, vibration, and power supply disturbances, and output an acceleration factor to estimate the expected lifespan of the hard disk under test in a real environment.

[0096] For example, when using a Copula model to quantify the interaction coefficients of temperature, vibration, and power supply disturbances, marginal distribution modeling can be performed first. This involves establishing independent probability distribution models for each physical field. For the temperature field, a Weibull distribution is used to capture accelerated aging effects; for the vibration field, a lognormal distribution is used to describe mechanical fatigue characteristics; and for the power supply disturbance, a generalized Pareto distribution is used to characterize extreme events. These three distributions serve as the basis for the marginal distributions of the Copula model. Next, a Copula function is constructed. Functions that focus on the dependencies between temperature, vibration, and power supply variables and separate marginal distributions from dependencies (such as the extreme value copula and the lower tail copula) are selected to establish a joint distribution for these multiple fields. Generative metafunctions are used to couple these marginal distributions, forming a joint probability model that characterizes the complex dependencies between temperature, vibration, and power supply. The parameters in the metafunction reflect the strength of the correlation between the fields. Once marginal distribution modeling is performed, interaction coefficients can be calculated. Using conditional probability density decomposition techniques, the dependencies between each two physical fields are extracted. Three sets of bivariate interaction coefficients (temperature-vibration interaction coefficient, temperature-power supply interaction coefficient, and vibration-power supply interaction coefficient) are calculated, ultimately yielding a composite coupling coefficient. This composite coupling coefficient incorporates two key pieces of information: the arithmetic mean of the three bivariate interaction strengths and the degree of deviation of the joint probability from the independence assumption (i.e., the degree of nonlinear coupling), enabling statistical quantification of the multi-physics coupling effect. Finally, dynamic monitoring and verification can be performed. An iterative algorithm can be developed to update function parameters in real time. The variance contribution index is combined to analyze the contribution of each physical field, and the significance of the coupling effect can be verified using a chi-square test. The resulting composite coupling coefficient can be directly used to modify traditional acceleration factors, quantifying both the individual and synergistic effects of temperature, vibration, and power supply.

[0097] Figure 3 A flow chart of a hard disk testing method according to another embodiment of the present invention is shown.

[0098] like Figure 3 As shown, the method may include operations S310 to S340.

[0099] In operation S310 , a benchmark test is performed on the hard drive to obtain a set of reference performance parameters. The hard drive is operated in a standard environment (25°C, no vibration, stable power supply) without physical stress, and the reference parameter values ​​of the hard drive (read / write speed, latency, bit error rate) are recorded.

[0100] In operation S320, a single physical field test is performed on the hard disk to obtain a first set of operating parameters. This process can be referred to operation S210.

[0101] In operation S330, a superposition physical field test is performed on the hard disk to obtain a second set of operating parameters. This process may refer to operation S230.

[0102] In operation S340, a fault analysis is performed on the hard disk to be tested according to the second operating parameter set and the second operating parameter set.

[0103] By superimposing and coupling multiple physical fields and integrating them with intelligent fault analysis, this embodiment of the present invention achieves a more efficient and accurate reliability assessment than traditional methods. This can improve the disk fault detection rate and intermittent fault capture rate, shorten test cycles, and reduce energy consumption.

[0104] Figure 4 FIG. 4 shows an architecture diagram of a hard disk testing system according to an embodiment of the present invention.

[0105] like Figure 4 As shown, an embodiment of the present invention further provides a hard disk testing system, including a digital signal processor 401, a high and low temperature alternating test chamber 402, a multi-degree-of-freedom electromagnetic vibration table 403, a power supply device 404 and a hard disk 105 to be tested.

[0106] The digital signal processor 401 is used to send control signals to the high and low temperature alternating test chamber 402, the multi-degree-of-freedom electromagnetic vibration table 403, and the power supply device 404 to accurately adjust test parameters (such as temperature value, vibration frequency, voltage disturbance amplitude, etc.); it is also used to collect the output signals of the hard disk 105 under different physical field environments (such as read and write response time, error code, temperature sensor data, vibration feedback signal, etc.); it is also used to perform fault analysis on the output signals and identify potential faults of the hard disk.

[0107] The high and low temperature alternating test chamber 402 is used to simulate different temperature environments (high and low temperature cycles, constant temperature changes, etc.) to test the impact of temperature changes on the read and write speed, data integrity, and life of mechanical components (such as motors and heads) of the hard disk 105 under test.

[0108] The multi-degree-of-freedom electromagnetic vibration table 403 is used to simulate the vibration scenarios of the hard disk in the transportation, installation and other environments by applying vibrations or shocks of different frequencies and amplitudes, and evaluate the vibration resistance of the hard disk 105 under test (such as the risk of head collision and solder joint detachment).

[0109] The power supply device 404 is used to simulate power supply voltage fluctuations, pulse interference, power outages and power restorations, and to test the working stability of the hard disk under unstable power supply (such as data loss, firmware corruption, abnormal restart, etc.).

[0110] During the operation of each device, time synchronization of each device can also be achieved through synchronization signals to ensure the timing consistency of physical field effects such as temperature, vibration, and power disturbances (such as synchronously applying vibration and power disturbances at a specific temperature), thereby avoiding the accuracy of test results affected by timing deviations.

[0111] The hard disk testing system provided according to the embodiment of the present invention realizes comprehensive reliability verification of hard disks in complex environments through precise control of multiple physical fields, real-time data acquisition and collaborative analysis, thereby improving the accuracy of hard disk testing.

[0112] Based on the above hard disk testing method, the present invention also provides a hard disk testing device. Figure 5 The device is described in detail.

[0113] Figure 5 A structural block diagram of a hard disk testing device according to an embodiment of the present invention is shown.

[0114] like Figure 5 As shown, the hard disk testing device 500 of this embodiment includes a testing module 510 , a first determining module 520 , an overlay module 530 and a second determining module 540 .

[0115] The testing module 510 is configured to operate the hard disk under test under the condition that multiple physical fields are independently applied to obtain a first operating parameter set, where the first operating parameter set includes operating parameters and first test parameter values ​​of the operating parameters.

[0116] The first determination module 520 is configured to determine a plurality of target parameters that meet predetermined conditions from a first operating parameter set according to a reference performance parameter set, wherein the reference performance parameter set is obtained by operating the hard disk to be tested in an environment without a physical field.

[0117] The superposition module 530 is configured to superimpose the physical fields corresponding to the multiple target parameters to obtain a superimposed physical field, and operate the hard disk to be tested under the superimposed physical field to obtain a second operating parameter set.

[0118] The second determining module 540 is configured to determine a test result of the hard disk to be tested according to the second operating parameter set and the reference performance parameter set.

[0119] In some embodiments, the testing module 510 may include a testing submodule, a second testing submodule, a third testing submodule, and a first determining submodule.

[0120] The test submodule is used to apply a temperature field to the hard disk to be tested through a temperature variable device to obtain a temperature parameter subset of the temperature field.

[0121] The second testing submodule is configured to apply a vibration field to the hard disk to be tested through an electromagnetic vibration generating device to obtain a vibration parameter subset of the vibration field.

[0122] The third testing submodule is configured to apply a power field to the hard disk to be tested through a power supply to obtain a power parameter subset of the power field.

[0123] The first determining submodule is configured to determine a first operating parameter set according to the temperature parameter subset, the vibration parameter subset, and the power parameter subset.

[0124] In some embodiments, the testing submodule may include a testing unit.

[0125] The test unit is used to operate the hard disk to be tested under the condition that a temperature field is applied to the thermoelectric cooling unit through the temperature changing device to obtain a temperature parameter subset.

[0126] In some embodiments, a test unit may include a test sub-unit.

[0127] The test subunit is used to apply a temperature field to any thermoelectric cooling unit among the multiple thermoelectric cooling units, and make the temperatures of the other thermoelectric cooling units except the one thermoelectric cooling unit the same as the temperature in the environment without physical field.

[0128] In some embodiments, the test subunit is further used to perform processing operations on multiple thermoelectric cooling units, where the processing operations on any thermoelectric cooling unit include: adjusting the temperature of any thermoelectric cooling unit to a predetermined temperature state, and running the hard disk to be tested to obtain a temperature parameter group for any thermoelectric cooling unit.

[0129] In some embodiments, the test subunit is further used to gradually increase the temperature of the thermoelectric cooling unit according to the step size, and run the hard disk to be tested until the temperature of the thermoelectric cooling unit is raised to the upper limit temperature value; collect the first test parameter value of the hard disk to be tested to obtain a temperature parameter group.

[0130] In some embodiments, the first determination module 520 may include a second determination submodule and a third determination submodule.

[0131] The second determining submodule is configured to determine a rate of change of the first test parameter value according to a reference parameter value of the operating parameter and the first test parameter value.

[0132] The third determining submodule is configured to use the operating parameter corresponding to the first test parameter value as the target parameter when the change rate of the first test parameter value is greater than a predetermined change rate threshold.

[0133] In some embodiments, the overlay module 530 may include an overlay sub-module.

[0134] The superposition submodule is used to synchronously or asynchronously superimpose the physical fields corresponding to multiple target parameters to obtain a superimposed physical field. Synchronous superposition means that the physical fields corresponding to multiple target parameters are applied to the hard disk to be tested at the same time, and asynchronous superposition means that the physical fields corresponding to multiple target parameters are applied to the hard disk to be tested alternately according to a predetermined frequency.

[0135] In some embodiments, the second determination module 540 may include a fourth determination submodule, a fifth determination submodule, and a sixth determination submodule.

[0136] The fourth determining submodule is configured to determine a difference between a second test parameter value in the second operating parameter set and a second test parameter value in the reference performance parameter set.

[0137] The fifth determining submodule is configured to determine an abnormal operating parameter from the second operating parameter set according to a comparison result between the difference and a predetermined threshold.

[0138] The sixth determining submodule is configured to obtain a test result based on a fault type associated with the abnormal operating parameter.

[0139] According to embodiments of the present invention, any multiple modules among the testing module 510, the first determination module 520, the overlay module 530, and the second determination module 540 may be combined into a single module, or any one of these modules may be split into multiple modules. Alternatively, at least part of the functionality of one or more of these modules may be combined with at least part of the functionality of other modules and implemented in a single module. According to embodiments of the present invention, at least one of the testing module 510, the first determination module 520, the overlay module 530, and the second determination module 540 may be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application-specific integrated circuit (ASIC), or may be implemented in hardware or firmware through any other reasonable means of circuit integration or packaging, or may be implemented in any one of software, hardware, and firmware, or any suitable combination of these. Alternatively, at least one of the testing module 510, the first determination module 520, the overlay module 530, and the second determination module 540 may be at least partially implemented as a computer program module that, when executed, performs the corresponding functionality.

[0140] Figure 6 A block diagram of an electronic device suitable for implementing a hard disk testing method according to an embodiment of the present invention is shown.

[0141] like Figure 6As shown, an electronic device 600 according to an embodiment of the present invention includes a processor 601, which can perform various appropriate actions and processes based on programs stored in a read-only memory (ROM) 602 or programs loaded from a storage unit 608 into a random access memory (RAM) 603. The processor 601 may include, for example, a general-purpose microprocessor (e.g., a CPU), an instruction set processor and / or related chipsets and / or a special-purpose microprocessor (e.g., an application-specific integrated circuit (ASIC)), etc. The processor 601 may also include onboard memory for caching purposes. The processor 601 may include a single processing unit or multiple processing units for performing different actions of the method flow according to an embodiment of the present invention.

[0142] Various programs and data required for the operation of the electronic device 600 are stored in the RAM 603. The processor 601, ROM 602, and RAM 603 are connected to each other via a bus 604. The processor 601 executes the programs in the ROM 602 and / or RAM 603 to perform various operations according to the method flow of the embodiment of the present invention. It should be noted that the programs may also be stored in one or more memories other than the ROM 602 and RAM 603. The processor 601 may also execute the programs stored in the one or more memories to perform various operations according to the method flow of the embodiment of the present invention.

[0143] According to an embodiment of the present invention, electronic device 600 may further include an input / output (I / O) interface 605, which is also connected to bus 604. Electronic device 600 may also include one or more of the following components connected to I / O interface 605: an input section 606 including a keyboard, mouse, etc.; an output section 607 including devices such as a cathode ray tube (CRT), liquid crystal display (LCD), and speakers; a storage section 608 including a hard disk; and a communication section 609 including a network interface card such as a LAN card or modem. Communication section 609 performs communication processing via a network such as the Internet. A drive 610 is also connected to I / O interface 605 as needed. Removable media 611, such as a magnetic disk, optical disk, magneto-optical disk, semiconductor memory, etc., is installed in drive 610 as needed, so that computer programs read from the removable media can be installed into storage section 608 as needed.

[0144] The present invention also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments, or may exist independently and not incorporated into the device / apparatus / system. The computer-readable storage medium carries one or more programs, which, when executed, implement the method according to the embodiments of the present invention.

[0145] According to an embodiment of the present invention, a computer-readable storage medium may be a non-volatile computer-readable storage medium, and may include, for example, but not limited to: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, a computer-readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. For example, according to an embodiment of the present invention, a computer-readable storage medium may include the ROM 602 and / or RAM 603 described above, and / or one or more memories other than ROM 602 and RAM 603.

[0146] An embodiment of the present invention further includes a computer program product comprising a computer program containing program code for executing the method shown in the flowchart. When the computer program product is executed in a computer system, the program code is used to cause the computer system to implement the hard disk testing method provided in the embodiment of the present invention.

[0147] The computer program executes the above functions defined in the system / device of the embodiment of the present invention when the computer program is executed by the processor 601. According to the embodiment of the present invention, the system, device, module, unit, etc. described above can be implemented by a computer program module.

[0148] In one embodiment, the computer program may be stored on a tangible storage medium such as an optical storage device or a magnetic storage device. In another embodiment, the computer program may be transmitted and distributed in the form of a signal on a network medium, downloaded and installed via the communication portion 609, and / or installed from a removable medium 611. The program code contained in the computer program may be transmitted using any appropriate network medium, including but not limited to wireless, wired, or any suitable combination thereof.

[0149] In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 609 and / or installed from a removable medium 611. When the computer program is executed by the processor 601, the above-described functions defined in the system of the embodiment of the present invention are performed. According to the embodiment of the present invention, the systems, devices, means, modules, units, etc. described above can be implemented by computer program modules.

[0150] According to an embodiment of the present invention, the program code for executing the computer program provided by the embodiment of the present invention can be written in any combination of one or more programming languages. Specifically, these computer programs can be implemented using high-level procedural and / or object-oriented programming languages, and / or assembly / machine languages. Programming languages ​​include, but are not limited to, languages ​​such as Java, C++, Python, "C" or similar programming languages. The program code can be executed entirely on the user computing device, partially on the user device, partially on a remote computing device, or entirely on a remote computing device or server. In the case of a remote computing device, the remote computing device can be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computing device (for example, using an Internet service provider to connect via the Internet).

[0151] The flowcharts and block diagrams in the accompanying drawings illustrate the possible implementation architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present invention. In this regard, each box in the flowchart or block diagram can represent a module, program segment, or a part of code, and the above-mentioned module, program segment, or a part of code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in an order different from that marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, and the combination of boxes in the block diagram or flowchart, can be implemented with a dedicated hardware-based system that performs the specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0152] It will be understood by those skilled in the art that the features described in the various embodiments of the present invention may be combined and / or coupled in various ways, even if such combinations or couplings are not explicitly described in the present invention. In particular, the features described in the various embodiments of the present invention may be combined and / or coupled in various ways without departing from the spirit and teachings of the present invention. All such combinations and / or couplings fall within the scope of the present invention.

[0153] The above describes embodiments of the present invention. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although each embodiment has been described separately above, this does not mean that the measures in each embodiment cannot be advantageously used in combination. Without departing from the scope of the present invention, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A hard disk testing method, characterized in that: The method comprises: operating the hard disk under test while the multiple physical fields are independently applied to obtain a first operating parameter set, wherein the first operating parameter set includes operating parameters and first test parameter values ​​of the operating parameters; determining, from the first operating parameter set, a plurality of target parameters that meet predetermined conditions according to a reference performance parameter set obtained by operating the hard disk to be tested in an environment without a physical field; superimposing the physical fields corresponding to the multiple target parameters respectively to obtain a superimposed physical field, and operating the hard disk to be tested under the superimposed physical field to obtain a second operating parameter set; A test result of the hard disk to be tested is determined according to the second operating parameter set and the reference performance parameter set.

2. The method according to claim 1, characterized in that The physical fields include at least two of a temperature field, a vibration field, and a power field; The step of operating the hard disk under test while the multiple physical fields are independently applied to obtain a first set of operating parameters includes: Applying the temperature field to the hard disk to be tested by a temperature changing device to obtain a temperature parameter subset of the temperature field; applying the vibration field to the hard disk to be tested by an electromagnetic vibration generating device to obtain a vibration parameter subset of the vibration field; Applying the power field to the hard disk to be tested through a power supply to obtain a power parameter subset of the power field; The first operating parameter set is determined based on the temperature parameter subset, the vibration parameter subset, and the power parameter subset.

3. The method according to claim 2, characterized in that In the case where multiple thermoelectric cooling units are deployed on the surface of the hard disk to be tested, Applying the temperature field to the hard disk to be tested by a temperature changing device to obtain a temperature parameter subset of the temperature field includes: In a case where the temperature field is applied to the thermoelectric cooling unit by the temperature changing device, the hard disk to be tested is operated to obtain the temperature parameter subset.

4. The method according to claim 3, characterized in that The step of operating the hard disk to be tested to obtain the temperature parameter subset while applying the temperature field to the thermoelectric cooling unit through the temperature changing device includes: For any one of the plurality of thermoelectric cooling units, the temperature field is applied to the one thermoelectric cooling unit, and the temperatures of the other thermoelectric cooling units except the one thermoelectric cooling unit are made the same as the temperature in the environment without physical field.

5. The method according to claim 4, characterized in that The step of applying the temperature field to any one of the thermoelectric refrigeration units and making the temperatures of the other thermoelectric refrigeration units except the one of the thermoelectric refrigeration units the same as the temperature in the environment without the physical field comprises: Processing operations are performed on the multiple thermoelectric cooling units, wherein the processing operations on any thermoelectric cooling unit include: adjusting the temperature of any thermoelectric cooling unit to a predetermined temperature state, and running the hard disk to be tested to obtain a temperature parameter group for the any thermoelectric cooling unit.

6. The method according to claim 5, characterized in that The step of adjusting the temperature of any thermoelectric cooling unit to a predetermined temperature state and operating the hard disk to be tested to obtain a temperature parameter group for the any thermoelectric cooling unit includes: gradually increasing the temperature of the thermoelectric cooling unit according to the temperature adjustment step, and operating the hard disk to be tested until the temperature of the thermoelectric cooling unit is increased from a lower limit temperature value to an upper limit temperature value; A first test parameter value of the hard disk to be tested is collected to obtain the temperature parameter group.

7. The method according to claim 1, characterized in that The reference performance parameter set includes reference parameter values ​​of the operating parameters; The determining, based on the reference performance parameter set, a plurality of target parameters that meet predetermined conditions from the first operating parameter set includes: determining a rate of change of the first test parameter value based on the reference parameter value of the operating parameter and the first test parameter value; When the change rate of the first test parameter value is greater than a predetermined change rate threshold, the operating parameter corresponding to the first test parameter value is used as the target parameter.

8. The method according to claim 1, characterized in that The superimposing the physical fields corresponding to the multiple target parameters to obtain the superimposed physical field includes: The physical fields corresponding to the multiple target parameters are synchronously superimposed or asynchronously superimposed to obtain the superimposed physical field. The synchronous superposition means that the physical fields corresponding to the multiple target parameters are applied to the hard disk to be tested at the same time. The asynchronous superposition means that the physical fields corresponding to the multiple target parameters are applied to the hard disk to be tested alternately at a predetermined frequency.

9. The method according to claim 1, characterized in that The step of determining a test result of the hard disk to be tested according to the second operating parameter set and the reference performance parameter set includes: determining a degree of difference between a second test parameter value in the second operating parameter set and a reference parameter value in the reference performance parameter set; determining an abnormal operating parameter from the second operating parameter set based on a comparison result between the difference and a predetermined threshold; The test result is obtained according to the fault type related to the abnormal operating parameter.

10. An electronic device comprising: one or more processors; a memory for storing one or more computer programs, It is characterized in that the one or more processors execute the one or more computer programs to implement the steps of the method according to any one of claims 1 to 9.

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