Automatic test system and test method for high-power direct jump loop module

Abstract

The invention relates to the technical field of power system testing, in particular to an automatic testing system and method for a high-power direct jump loop module, and the system comprises a PC, a testing instrument, a testing clamp, an adapter plate, a high-density terminal, and a to-be-tested module. The PC is connected with the test instrument and is used for automatically sending a signal acquisition command to the test instrument, receiving data of the test instrument and carrying out logical judgment; the test fixture is used for fixing a to-be-tested module; the adapter plate is used for converting a differential signal of a module to be tested into a terminal definition with a unified specification and then is connected with the high-density terminal; the high-density terminal is used for connecting the test instrument and the module to be tested; the to-be-tested module is a high-power direct jump loop module, and an adaptive adapter plate is selected according to the model of the to-be-tested module. The method is universally used for high-power direct-jump loop modules of various models, and the production quality and the field operation and maintenance efficiency of the high-power direct-jump loop modules are remarkably improved.

Description

Technical Field

[0001] The present invention relates to the technical field of power system testing, in particular to an automatic testing system and a testing method for a high-power direct trip circuit module. Background Art

[0002] In power grid operation, direct tripping circuits are a core component ensuring safe and stable grid operation, and their reliability directly impacts the system's fault response capabilities. Currently, direct tripping circuits generally use optocoupler inputs for signal isolation and transmission. However, when a ground fault occurs in a DC system, transient DC components may be superimposed on the secondary cable, causing the tripping circuit to malfunction, posing a threat to grid security. To address this issue, Q / GDW 11487-2015 specifies that important circuits involving direct tripping must utilize intermediate relays with an operating voltage within the range of 55% to 70% of the rated DC supply voltage. These relays must also have an operating power greater than 5W and an operating time of 10 to 35 ms at rated voltage. As key components of direct tripping circuit modules, accurate testing and verification of their performance parameters (such as operating voltage, operating power, and operating time) is crucial for ensuring the reliability of power grid protection systems.

[0003] However, in the mass production testing of high-power direct-trip circuit modules, traditional testing methods have significant limitations. In the existing technology, the testing process usually relies on manual operation: the tester needs to manually adjust the DC power output, monitor the voltage and current changes of the relay circuit point by point, and record key parameters such as the operating power, operating voltage and operating time. This method has the following defects: differences in operator experience and subjective judgment can easily lead to test data deviations, and the accuracy and repeatability of the test results are difficult to guarantee; the manual adjustment and recording process is time-consuming and labor-intensive, and it is difficult to adapt to the mass production testing needs of large quantities of modules; traditional equipment can only complete the test of a single parameter item by item, and cannot achieve multi-parameter synchronous acquisition and comprehensive analysis, resulting in incomplete test coverage; the test requirements of different types of modules vary greatly, and the existing test system lacks flexible configuration capabilities, making it difficult to accommodate the test requirements of products of various specifications.

[0004] Therefore, power equipment manufacturers urgently need a universal direct-trip circuit module testing system that can realize automatic multi-parameter testing to replace traditional manual testing methods, improve testing efficiency and accuracy, and meet the power system's demand for high-reliability and high-consistency mass production testing of direct-trip circuit modules. Summary of the Invention

[0005] The purpose of the present invention is to provide an automatic testing system and testing method for high-power direct trip circuit modules in order to solve at least one of the above-mentioned technical problems. By integrating automatic control, high-precision data acquisition and intelligent analysis technology, accurate, efficient and batch testing of core parameters such as the operating voltage, operating power, and operating time of high-power direct trip circuit modules can be achieved, providing technical support for the reliability verification of power system protection equipment.

[0006] The present invention achieves the above-mentioned purpose through the following technical solutions: An automatic test system for high-power direct jump circuit modules, comprising: a PC, a test instrument, a test fixture, a transfer board, high-density terminals and a module to be tested; The PC is connected to the test instrument, and the PC is used to automatically send signal acquisition commands to the test instrument, receive data from the test instrument and perform logical judgment; The test fixture is used to fix the module to be tested; The adapter board is used to convert the differential signals of the module to be tested into a unified standard terminal definition and then connect it to the high-density terminal; The high-density terminals are used to connect the test instrument and the module to be tested; The module to be tested is a high-power direct jump circuit module, and an adapted adapter board is selected according to the model of the module to be tested.

[0007] Furthermore, the PC is connected to the test instrument via Ethernet.

[0008] Furthermore, the test instrument includes: a controllable DC power supply, a dry node acquisition module, and a wet node acquisition module; The controllable DC power supply is used to provide test power for the module to be tested, and the output voltage value of the controllable DC power supply is adjustable; The dry node acquisition module is used to collect the open-and-closed contact signal of the module to be tested; The wet node acquisition module is used to acquire the internal feedback voltage signal of the module to be tested.

[0009] Furthermore, the high-density terminals are provided on the test fixture; The adapter board includes a left terminal and a right terminal connected by an in-board conversion wiring; The mainboard side terminal signal of the module to be tested is connected to the high-density terminal; The front panel terminal signal of the module to be tested is connected to the left terminal, and different open-input and open-output wiring are connected to the right terminal according to a unified specification definition through internal wiring; the right terminal is connected to the high-density terminal.

[0010] Furthermore, the adapter plate is fixed on the test fixture via two connection fixing terminals.

[0011] An automatic testing method for a high-power direct trip circuit module, using any of the above-described automatic testing systems for a high-power direct trip circuit module, the method comprising the following steps: Step S102: reading the barcode of the module to be tested, and obtaining module configuration information that matches the barcode of the module to be tested; Step S104, connecting the modules in the automatic test system and initializing the automatic test system; Step S106, the controllable DC power supply provides an output voltage value to the module to be tested at a starting voltage; Step S108, determining whether the output voltage value reaches a preset voltage threshold; If so, the automatic test result is judged to be unqualified; Otherwise, determine whether the module to be tested operates normally based on the data collected by the dry node acquisition module; if so, execute step S110; otherwise, execute step S112; Step S110, judging whether a feedback signal is collected based on the data collected by the wet node collection module; if a feedback signal is collected, judging the automatic test result based on the action power and action time; if no feedback signal is collected, judging the automatic test result as unqualified; In step S112, the output voltage value is increased by a preset amplitude, and step S108 is executed.

[0012] Furthermore, the starting voltage is 55% of the rated voltage, the preset amplitude is 1V, and the preset voltage threshold is 70% of the rated voltage.

[0013] Furthermore, the automatic test result is judged based on the action power and the action time, including: if the action power is greater than 5W and the action time is 10ms-35ms, the automatic test result is judged to be qualified; otherwise, the automatic test result is judged to be unqualified.

[0014] An electronic device comprises a processor, a memory and a computer program stored in the memory and executable on the processor, wherein when the computer program is executed by the processor, the computer program implements any of the above-described automatic testing methods for high-power direct jump circuit modules.

[0015] A computer-readable storage medium stores a computer program, which, when executed by a processor, implements any of the above-described automatic testing methods for a high-power direct jump circuit module.

[0016] The beneficial effects of the present invention are: The present invention uses a PC as the core scheduling unit and realizes the fully automatic execution of the test process through Ethernet-coordinated controllable DC power supply, dry node acquisition module and wet node acquisition module. From barcode reading of configuration information, step-by-step voltage boost control starting from 55% of the rated voltage (step size 1V), to dry node monitoring of contact action and wet node synchronous capture of feedback signals, the test results are finally generated based on the composite judgment of action power (>5W) and time (10ms-35ms).

[0017] The adapter board of the present invention converts the differentiated signals of modules of different models into unified terminal definitions through on-board wiring. Combined with the high-density port resources of the test fixture, it realizes the adaptability of a system to multiple models of modules, significantly improving the scalability and repeatability of the test.

[0018] The present invention reduces manual intervention to a minimum, achieves millimeter-level capture of action characteristic parameters, provides efficient and accurate technical support for reliability verification of power system protection equipment, and effectively reduces on-site operation and maintenance risks and batch testing costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a schematic structural diagram of an automatic testing system for a high-power direct trip circuit module according to an embodiment of the present invention; Figure 2 This is a wiring diagram of an automatic test system for a high-power direct trip circuit module according to an embodiment of the present invention; Figure 3 This is a flow chart of an automatic testing method for a high-power direct trip circuit module according to an embodiment of the present invention; Figure 4 The present invention is another embodiment of the automatic testing method for high-power direct jump circuit module flow chart. DETAILED DESCRIPTION

[0020] The present invention will now be discussed with reference to exemplary embodiments. It should be understood that the embodiments discussed are only intended to enable those skilled in the art to better understand and implement the present invention, rather than to imply any limitation on the scope of the present invention.

[0021] As used herein, the term "including" and variations thereof are to be interpreted as open-ended terms meaning "including, but not limited to." The term "based on" is to be interpreted as "based, at least in part, on." The terms "one embodiment" and "an embodiment" are to be interpreted as "at least one embodiment."

[0022] Example 1 Figure 1 This is a schematic structural diagram of an automatic test system for a high-power direct trip circuit module according to an embodiment of the present invention. Figure 2This is a wiring diagram of an automatic test system for a high-power direct trip circuit module according to an embodiment of the present invention. Figure 1-2 As shown, according to one embodiment of the present invention, an automatic testing system for a high-power direct jump circuit module includes: a PC, a test instrument, a test fixture, an adapter board, a high-density terminal and a module to be tested; The PC is connected to the test instrument, and the PC is used to automatically send signal acquisition commands to the test instrument, receive data from the test instrument and perform logical judgment; The test fixture is used to fix the module to be tested; The adapter board is used to convert the differentiated signals of the module to be tested into a unified standard terminal definition and then connect it to the high-density terminal; High-density terminals are used to connect test instruments and modules to be tested; The module to be tested is a high-power direct jumper circuit module. Select the appropriate adapter board according to the model of the module to be tested.

[0023] In this embodiment, an automatic testing system for high-power direct-trip circuit modules is proposed, comprising a PC, test instruments, a test fixture, an adapter board, high-density terminals, and a module to be tested. During testing, the PC is equipped with automatic testing software, which establishes a real-time communication link with the test instrument via a bus such as LAN / GPIB / USB. On the one hand, the PC automatically issues signal acquisition, excitation application, and timing control instructions according to a pre-written test script. On the other hand, the system reads back the raw data measured by the instrument, such as voltage, current, switching quantity, and SOE (Sequence of Events) time, in real time. Threshold comparison, logical operations, and fault diagnosis are performed within the host computer software, ultimately generating a visual report. The test fixture uses a pneumatic or electric locking mechanism to quickly clamp the module to be tested. It also has built-in high-current copper busbars and heat sinks to ensure reliable transmission of high-power direct-trip current and heat dissipation, avoiding measurement errors caused by temperature rise. The adapter board serves as an adaptation layer. Based on the differences in physical form, signal definition, and voltage resistance level of the direct jump module interface, it maps various differentiated signals to the standard connector through a replaceable adapter board, realizing flexible testing of "one module and one board".

[0024] The test system applies a rated DC voltage and injects a controlled fault current to the module under test through high-density terminals and an adapter board. It simultaneously monitors the voltage and current waveforms across the trip coil, as well as the operating time. A PC uses high-speed sampling data to calculate the current-time integral and compares it with the module's ampere-second characteristic curve to determine whether its trip sensitivity meets specifications. If anomalies such as delayed operation, contact adhesion, or coil overheating are detected, the system immediately shuts off power and prompts maintenance.

[0025] The present invention is generally applicable to various types of high-power direct jump circuit modules. The full-function test time of the module using the present invention is significantly shortened, the test consistency error is reduced, and the production quality and on-site operation and maintenance efficiency of the high-power direct jump circuit module are significantly improved.

[0026] According to one embodiment of the present invention, the test instrument includes: a controllable DC power supply, a dry node acquisition module, and a wet node acquisition module; The controllable DC power supply is used to provide test power for the module to be tested, and the output voltage value of the controllable DC power supply is adjustable; The dry contact acquisition module is used to collect the open-and-closed contact signals of the module to be tested; The wet node acquisition module is used to collect the internal feedback voltage signal of the module to be tested.

[0027] In this implementation, the automated test system prioritizes "fixed instrument resources and flexible test objects." The test instrument integrates a controllable DC power supply with a continuously adjustable output of 0-300V / 0-100A. Its voltage and current loops utilize 16-bit DAC + 18-bit ADC closed-loop control, enabling 0.1% accuracy setting and readback within 10ms. The instrument panel features a rich array of ports (e.g., high-current power terminals, dry-node DI, wet-node AI, and Ethernet RJ45). These ports are densely arranged on a standard 19-inch connector array, independent of the model of the high-power direct-loop circuit module being tested.

[0028] The test process is fully automated by a PC using the Ethernet SCPI / LXI protocol. Upon power-up, the PC first reads the QR code or RFID tag attached to the module and automatically downloads the model's configuration parameters, including the rated trip voltage, current threshold, and power-time curve. It then instructs the controllable DC power supply to increase the voltage in a step or ramp manner. Simultaneously, the dry-node acquisition module scans the open / close state of the open contact at a 1kHz frequency, while the wet-node acquisition module simultaneously samples the internal feedback voltage (±300V range, 0.05% accuracy). When a transition from open to closed is detected, or the feedback voltage crosses the set threshold, the system immediately marks the trip time t0 and calculates the trip power (P = U(t0) × I(t0)) based on the instantaneous voltage and current values ​​within 50ms before and after this time. Finally, the PC automatically populates a pre-set template with the test data, waveforms, and calculation results, generating a PDF / Excel report that is uploaded to the MES, enabling efficient, accurate, and flexible batch testing of high-power direct trip circuit modules.

[0029] Through the innovative design of fixed instrument resources and flexible test objects, combined with high-precision controllable power supply, multi-type signal acquisition and automated test process, the present invention realizes efficient, accurate and flexible batch testing of high-power direct jump circuit modules, significantly shortens the full-function test time, reduces test consistency errors, and greatly improves production quality and on-site operation and maintenance efficiency.

[0030] According to one embodiment of the present invention, high-density terminals are provided on a test fixture; The adapter board includes a left terminal and a right terminal connected by an in-board conversion wiring; The terminal signals on the mainboard side of the module to be tested are connected to the high-density terminals; The front panel terminal signals of the module to be tested are connected to the left terminals, and different open-input and open-output wiring are connected to the right terminals according to unified specification definitions through internal wiring; the right terminals are connected to high-density terminals.

[0031] Preferably, the adapter plate is fixed on the test fixture via two connection fixing terminals.

[0032] In this implementation, the test system's three-tiered "test fixture-adapter board-test instrument" architecture redefines the automated test interface for multiple module models. The test fixture serves as both a mechanical positioning and heat dissipation platform and a secondary safety enclosure. Its rear panel integrates a high-density terminal array, where all test instrument channels are secured and connected. Two non-intersecting routing channels are reserved within the test fixture. The first is dedicated to motherboard-side signals, routing directly from the motherboard connector of the module under test via a high-current copper busbar and shielded wiring harness to the high-density terminals. This handles high-current, high-power, or high-speed differential signals. The second is the front-panel signal path, connecting from the panel terminals via an internal wiring harness to the terminals on the left side of a quick-swap adapter board. The adapter board is a thin PCB with paired terminals on the left and right sides, with microstrip / stripline interconnection between the boards. The "customized pins" of each module, such as inputs, outputs, open contacts, and voltage feedback, are renumbered according to a unified standard and output from the right terminals. These pins are then short-circuited back to the high-density terminal array. The adapter board is secured to the fixture with two locating pins / locks at each end, enabling tool-free replacement of one module with one board. To change the model under test, simply remove the old adapter board and insert the new one, without changing any cables or instrument configuration. Because the high-density terminal array is fixed to the fixture, the test software simply reads the identification resistor or QR code on the adapter board to automatically call the corresponding channel mapping table, completing seamless automatic testing of different module models.

[0033] Example 2 like Figure 1-2 As shown, according to one embodiment of the present invention, an automatic testing system for a high-power direct trip circuit module includes: It is equipped with a PC with automatic test software, test fixtures, adapter boards, various models of modules for the high-power direct jump circuit to be tested, and test instruments.

[0034] The test fixture is used to fix the high-power direct jump circuit module to be tested; The adapter board is fixed on the test fixture through two connection fixing terminals. Different models of modules to be tested can be compatible tested by replacing the adapter board.

[0035] The test instrument includes a controllable DC power supply, a dry node acquisition module, and a wet node acquisition module; The controllable DC power supply provides open-port test power to the high-power direct-trip circuit. Its output voltage is adjustable and it communicates with the PC via Ethernet. A test program on the PC adjusts the power supply's output amplitude and can read back the output voltage and current values.

[0036] The dry node acquisition module and the wet node acquisition module are connected to the open contact and internal voltage feedback signal of the module to be tested respectively. The PC and automatic test software automatically control the two modules to collect signals and make logical judgments through Ethernet.

[0037] The test system dynamically adjusts the output DC voltage of the controllable DC power supply using automatically acquired module configuration information and records changes in the DC current data transmitted back by the power supply. The test system calculates the DC voltage and operating power at the moment of operation and generates a test report. The test system automatically executes the test process, including increasing the DC source output, monitoring the tripping of the high-power relay circuit, recording data, and calculating the operating power.

[0038] In this embodiment, an automatic test system for high-power direct jump circuit modules is proposed, which consists of a PC equipped with automatic test software, a test fixture, a replaceable adapter board, various models of high-power direct jump circuit modules, and a test instrument. The test fixture fixes the module to be tested in an up-and-down manner through a pressure plate and a carrier plate, and a high-density adapter terminal is set at the rear. The layout of the instrument port on the connector is fixed and the resources are rich, and it does not change due to changes in the test object; the adapter board is pluggable and fixed to one side of the fixture by two connecting fixed terminals. Different models of modules only need to replace the corresponding adapter board for compatible testing. The motherboard side terminal signal of the module to be tested is directly led to the high-density terminal on the rear panel of the fixture through the internal wiring harness, and the panel side terminal signal is first connected to the left terminal of the adapter board, and then returned to the high-density terminal from the right terminal after the internal wiring is defined according to the unified specification, realizing the signal mapping of "one module and one board" with zero modification. The test instrument consists of a controllable DC power supply, a dry-node acquisition module, and a wet-node acquisition module. The controllable DC power supply communicates with the PC via Ethernet. Under the control of the test software, it dynamically adjusts the output DC voltage according to the module configuration information and reads back the voltage and current values. The dry-node acquisition module and the wet-node acquisition module are respectively connected to the open contacts and internal voltage feedback signals of the module under test. They are controlled by the PC and automatic test software via Ethernet to complete signal acquisition and logic judgment. The test system automatically performs DC source incremental output, high-power relay circuit tripping monitoring, current data recording, voltage and power calculation at the time of operation, and generates a complete test report.

[0039] The improved degree of automation of the test system proposed in the present invention significantly reduces the need for manual operation, thereby improving the efficiency and repeatability of the test; the replaceable adapter plate design enables the same set of test fixtures to adapt to different models of high-power direct jump circuit modules, increasing the applicability of the test system.

[0040] Example 3 Figure 3 The following is a flow chart of an automatic testing method for a high-power direct trip circuit module according to an embodiment of the present invention. Figure 3 As shown, according to one embodiment of the present invention, an automatic testing method for a high-power direct trip circuit module adopts any one of the automatic testing systems for a high-power direct trip circuit module of the present invention, and the method comprises the following steps: Step S102: reading the barcode of the module to be tested and obtaining module configuration information that matches the barcode of the module to be tested; Step S104, connecting the modules in the automatic test system and initializing the automatic test system; Step S106, the controllable DC power supply provides an output voltage value to the module under test at the starting voltage; Step S108, determining whether the output voltage value reaches a preset voltage threshold; if so, determining that the automatic test result is unqualified; otherwise, determining whether the module under test operates normally based on the data collected by the dry node acquisition module; if so, executing step S110; otherwise, executing step S112; Step S110, judging whether a feedback signal is collected based on the data collected by the wet node collection module; if a feedback signal is collected, judging the automatic test result based on the action power and action time; if no feedback signal is collected, judging the automatic test result as unqualified; In step S112, the output voltage value is increased by a preset amplitude, and step S108 is executed.

[0041] Preferably, the starting voltage is 55% of the rated voltage, the preset amplitude is 1V, and the preset voltage threshold is 70% of the rated voltage.

[0042] Preferably, in step S110, the automatic test result is judged based on the action power and the action time, including: if the action power is greater than 5W and the action time is 10ms-35ms, the automatic test result is judged to be qualified; otherwise, the automatic test result is judged to be unqualified.

[0043] In this embodiment, an automated testing method for high-power direct-jump circuit modules is proposed, and the standardization and intelligence of the test process are achieved through the collaborative design of software and hardware. In the specific implementation, the configuration information of the module to be tested (such as rated action voltage, current threshold, etc.) is first quickly obtained through a barcode or RFID reading module to provide a parameter benchmark for subsequent tests. During the initialization phase of the test system, each functional module (including a controllable DC power supply, a dry node acquisition module, and a wet node acquisition module) establishes a physical connection with the module to be tested through a standard 19-inch connector array to ensure that the port resources are decoupled from the test object. During the test process, the controllable DC power supply uses 55% of the rated voltage as the starting output voltage, adopts a step-by-step boost strategy with a step size of 1V, and combines a closed-loop control system composed of a 16-bit DAC and an 18-bit ADC to achieve 0.1% precision adjustment and real-time readback of the output voltage. The dry-node acquisition module continuously monitors the closed / open state of the open contacts at a 1kHz sampling rate. Upon detecting a transition from open to closed, the test system immediately marks the actuation time t0 and triggers the wet-node acquisition module to synchronously capture the feedback voltage waveform for 50ms before and after that time (±300V range, 0.05% accuracy). If no valid actuation signal is detected even after the output voltage reaches 70% of the rated voltage during the boost process, the module is deemed unqualified. If an actuation event is detected within the threshold, the presence of the feedback signal is further verified. Only when the wet-node acquisition module synchronously detects a voltage transition at time t0 does the test system calculate the actuation power (P = U × I) based on the instantaneous voltage U(t0) and current I(t0). This is then combined with the actuation time window (10ms-35ms) to perform a composite judgment: the actuation power must be greater than 5W and the duration must meet the required conditions to be considered acceptable. Failure of either condition results in a failure.

[0044] The present invention realizes the automation of the entire process from parameter configuration, signal acquisition to result determination by combining the solidification of hardware resources with the flexibility of test logic, which significantly improves the test efficiency and result consistency.

[0045] Example 4 Figure 4 FIG1 is a flow chart of an automatic testing method for a high-power direct jump circuit module according to another embodiment of the present invention. Figure 4 As shown, according to one embodiment of the present invention, an automatic testing method for a high-power direct trip circuit module adopts any one of the automatic testing systems for a high-power direct trip circuit module of the present invention; the testing method comprises the following steps: Step S201, automatically read the module barcode and obtain the module configuration information through the barcode search library; Read the barcode of the module to be tested to obtain relevant configuration information of the module, such as the number of trip output relays, the number of high-power input channels, the rated voltage of the module, etc.

[0046] Step S202, transport the module into the fixture and fix it; Step S203: The system is powered on; the controllable DC power supply is initialized, outputting 1V incrementally from 55% of the rated voltage, and timing is performed; After the test module enters the fixture and is secured, the PC's automatic test program controls the system to power on, powering up all test instruments and the module under test. It also adjusts the DC power supply's input voltage, increasing the output in 1V steps starting from 55% of the rated voltage specified in the configuration information. Step S204, determining whether the output voltage reaches 70% of the rated voltage; if so, executing step S210; otherwise, executing step S205; Step S205, through the dry contact acquisition module detection, determine whether the dry contact state has changed; if so, execute step S206; otherwise, execute step S203; Step S206, recording the operating voltage, current, and time; Determine whether the output voltage is within the rated voltage range of 55%-70%; if so, determine whether the status read by the dry node acquisition module has changed, that is, whether the high-power direct jump circuit opening interface can operate normally. If it operates normally, the corresponding current, voltage and calculated power are the action current, action voltage and action power.

[0047] Step S207, determining whether the wet node acquisition module has collected the feedback signal; if so, executing step S208; otherwise, executing step S210; The wet node acquisition module determines whether the high-power internal feedback signal of the module is collected.

[0048] Step S208, calculate the action power and action time; determine whether the action power is greater than 5W and the action time is between 10ms and 35ms; if so, execute step S209; otherwise, execute step S210; Step S209: the database records the result and marks it as qualified; Step S210: The database records an exception and marks it as unqualified.

[0049] Control the rated DC power supply voltage input and test the trip relay's operating time. If the operating time is between 10ms and 35ms, the operating power is greater than 5W, the operating voltage is between 55% and 70% of the rated DC power supply voltage, and a high-power feedback signal is collected, the module is considered qualified and the test record is stored in the database. Otherwise, the program will automatically display the specific reason for failure.

[0050] This embodiment proposes an automated testing method for high-power direct-trip circuit modules, which is fully automated through a supporting test system. The specific process is as follows: First, the module barcode is automatically read, and its configuration information (such as rated voltage and relay parameters) is retrieved from a database. The module is then transported to a fixture and secured. After the system is powered on, the controllable DC power supply is initialized, and the output voltage is increased in 1V steps starting from 55% of the rated voltage. If no actuation signal is detected after the output voltage reaches 70% of the rated value, the module is directly judged as unqualified. If the threshold is not reached, the dry contact acquisition module monitors the open contact state change. When a contact closure is detected, the current voltage, current, and time are recorded. The wet contact acquisition module then verifies whether an internal feedback signal is synchronously captured. If a feedback signal is present, the actuation power (U×I) and actuation time are calculated, and the qualified conditions of actuation power greater than 5W and a time between 10ms and 35ms are determined. Finally, the test results are marked as qualified or abnormal, and the data is stored in a database.

[0051] The present invention can adapt to different types of modules by replacing the fixture adapter plate, realizes the flexibility and efficiency of mass production testing, and significantly improves the test repeatability and expansion capability.

[0052] According to one embodiment of the present invention, an electronic device includes a processor, a memory, and a computer program stored in the memory and runnable on the processor. When the computer program is executed by the processor, any automatic testing method for a high-power direct jump circuit module of the present invention is implemented.

[0053] According to one embodiment of the present invention, a computer-readable storage medium stores a computer program, which, when executed by a processor, implements any automatic testing method for a high-power direct jump circuit module of the present invention.

[0054] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the methods, devices and media described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0055] The above description is merely a preferred embodiment of the present application and an illustration of the technical principles employed. Those skilled in the art should understand that the scope of the invention herein is not limited to the technical solutions formed by the specific combination of the above-mentioned technical features, but also encompasses other technical solutions formed by any combination of the above-mentioned technical features or their equivalents without departing from the inventive concept. For example, a technical solution formed by replacing the above-mentioned features with (but not limited to) technical features having similar functions disclosed in this application.

[0056] It should be understood that the size of the serial numbers of each step in the content of the invention and the embodiments of the present invention does not absolutely mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

Claims

1. An automatic test system for high-power direct trip circuit modules, characterized in that: include: PC, test instruments, test fixtures, adapter boards, high-density terminals and modules to be tested; The PC is connected to the test instrument, and the PC is used to automatically send signal acquisition commands to the test instrument, receive data from the test instrument and perform logical judgment; The test fixture is used to fix the module to be tested; The adapter board is used to convert the differential signals of the module to be tested into a unified standard terminal definition and then connect it to the high-density terminal; The high-density terminals are used to connect the test instrument and the module to be tested; The module to be tested is a high-power direct jump circuit module, and an adapted adapter board is selected according to the model of the module to be tested.

2. The automatic test system for high-power direct trip circuit modules according to claim 1, characterized in that: The PC is connected to the test instrument via Ethernet.

3. The automatic testing system for high-power direct trip circuit modules according to claim 1, characterized in that: The test instrument includes: a controllable DC power supply, a dry node acquisition module, and a wet node acquisition module; The controllable DC power supply is used to provide test power for the module to be tested, and the output voltage value of the controllable DC power supply is adjustable; The dry node acquisition module is used to collect the open-and-closed contact signal of the module to be tested; The wet node acquisition module is used to acquire the internal feedback voltage signal of the module to be tested.

4. The automatic test system for high-power direct trip circuit modules according to claim 1, characterized in that: The high-density terminals are arranged on the test fixture; The adapter board includes a left terminal and a right terminal connected by an in-board conversion wiring; The mainboard side terminal signal of the module to be tested is connected to the high-density terminal; The front panel terminal signal of the module to be tested is connected to the left terminal, and different open-input and open-output wiring are connected to the right terminal according to a unified specification definition through internal wiring; the right terminal is connected to the high-density terminal.

5. The automatic test system for high-power direct trip circuit modules according to claim 1, characterized in that: The adapter plate is fixed on the test fixture via two connection fixing terminals.

6. An automatic testing method for a high-power direct trip circuit module, using the automatic testing system for a high-power direct trip circuit module according to any one of claims 1 to 5, characterized in that: The method comprises the following steps: Step S102: reading the barcode of the module to be tested, and obtaining module configuration information that matches the barcode of the module to be tested; Step S104, connecting the modules in the automatic test system and initializing the automatic test system; Step S106, the controllable DC power supply provides an output voltage value to the module to be tested at a starting voltage; Step S108, determining whether the output voltage value reaches a preset voltage threshold; if so, determining that the automatic test result is unqualified; otherwise, determining whether the module to be tested operates normally based on the data collected by the dry node acquisition module; if so, executing step S110; otherwise, executing step S112; Step S110, judging whether a feedback signal is collected based on the data collected by the wet node collection module; if a feedback signal is collected, judging the automatic test result based on the action power and action time; if no feedback signal is collected, judging the automatic test result as unqualified; In step S112, the output voltage value is increased by a preset amplitude, and step S108 is executed.

7. The automatic testing method for a high-power direct trip circuit module according to claim 6, characterized in that: The starting voltage is 55% of the rated voltage, the preset amplitude is 1V, and the preset voltage threshold is 70% of the rated voltage.

8. The automatic testing method for a high-power direct trip circuit module according to claim 6, characterized in that: The automatic test result is judged based on the action power and the action time, including: if the action power is greater than 5W and the action time is 10ms-35ms, the automatic test result is judged to be qualified; otherwise, the automatic test result is judged to be unqualified.

9. An electronic device, characterized in that: The invention comprises a processor, a memory and a computer program stored in the memory and runnable on the processor, wherein when the computer program is executed by the processor, the automatic testing method for a high-power direct jump circuit module as described in any one of claims 6 to 8 is implemented.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by the processor, the automatic testing method for a high-power direct jump circuit module as described in any one of claims 6 to 8 is implemented.

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