Voltage test curve determination method and device, terminal equipment and building site selection safety judgment method based on voltage test curve

Abstract

The invention discloses a voltage test curve determination method and device, terminal equipment and a building site selection safety judgment method based on a voltage test curve, and belongs to the field of electrical engineering. The method comprises the following steps: obtaining structural parameters of a test building, structural parameters of a grounding grid around the test building and soil resistivity of soil where the grounding grid around the test building is located; constructing a simulation model according to the structural parameters and the soil resistivity; external excitation is applied to the simulation model, so that the simulation model to which the external excitation is applied simulates to obtain voltage values of a preset reference earth surface point under different test parameter combinations; and according to the voltage value and the test parameter combination corresponding to the voltage value, fitting to obtain a voltage test curve for representing the change of the voltage along with the test parameters. By implementing the application, the problem that the area voltage distribution rule of the building land occupation, the building and the surrounding grounding grid layout is not clear in the prior art can be solved.

Description

Technical Field

[0001] The present invention relates to the field of electrical engineering, and in particular to a method and device for determining a voltage test curve, a terminal device, and a method for determining building site safety based on the voltage test curve. Background Art

[0002] In the field of modern construction engineering, the influence of the grounding grid during building site selection cannot be ignored. The horizontal spacing between the building and the surrounding grounding grid, as well as the reasonable determination of the building's own floor space, are directly related to the electrical safety and operational stability of the building throughout its life cycle. However, in the existing technology, there is no clear correlation between the influence of the building's own structural parameters (such as the length of the floor space) and the layout between the building and the surrounding grounding grid (such as the horizontal spacing between the two) on the voltage in the area where the building and the surrounding grounding grid are located.

[0003] Due to the lack of technical support for this fitting curve, when a building encounters sudden situations such as lightning strikes and electrical failures, it is difficult for engineering personnel to estimate the potential distribution in the area where the building and the surrounding grounding grid are located, resulting in damage or even paralysis of the building and its internal equipment, and posing a serious threat to the safety of people in the area between the building and the surrounding grounding grid. Summary of the Invention

[0004] The present invention provides a method, device, terminal equipment and a method for determining a voltage test curve, and a building site safety determination method based on the voltage test curve. The method can solve the problem of the influence of building area, building and surrounding grounding grid layout on regional voltage distribution law, which has not been clarified in the prior art.

[0005] An embodiment of the present invention provides a method for determining a voltage test curve, comprising:

[0006] Obtaining the structural parameters of the test building, the structural parameters of the grounding grid surrounding the test building, and the soil resistivity of the soil where the grounding grid surrounding the test building is located;

[0007] Constructing a simulation model based on the structural parameters of the grounding grid surrounding the test building, the structural parameters of the test building, and the soil resistivity;

[0008] Applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates a voltage value of a preset reference surface point under different test parameter combinations; wherein the test parameter combination is composed of the side length of the test building and the horizontal distance between the test building and the grounding grid surrounding the test building;

[0009] According to the voltage value and the test parameter combination corresponding to the voltage value, a voltage test curve for characterizing the change of voltage with the test parameter is obtained by fitting.

[0010] Further, the reference surface point includes a first reference surface point; the test parameter combination includes a first test parameter combination for analyzing a maximum contact voltage value; the voltage test curve includes a contact voltage characteristic test curve; and the voltage value includes a maximum contact voltage value;

[0011] The applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates and obtains voltage values ​​of a preset reference surface point under different test parameter combinations, includes:

[0012] A simulated ground short-circuit current is applied to the simulation model so that the simulation model after the simulated ground short-circuit current is applied simulates the ground potential rise of the grounding grid around the test building, and based on the ground potential rise, the difference between the potential generated by the first reference surface point under each first test parameter combination and the ground potential rise is calculated respectively to obtain the maximum contact voltage value corresponding to each first test parameter combination.

[0013] Furthermore, the voltage test curve for characterizing the change of voltage with test parameters is obtained by fitting according to the voltage value and the test parameter combination corresponding to the voltage value, including:

[0014] For each of the maximum contact voltage values, generating a first three-dimensional data point according to the maximum contact voltage value and the floor area length and horizontal spacing in the first test parameter combination corresponding to the maximum contact voltage value;

[0015] Regression analysis is performed on all first three-dimensional data points, and a contact voltage characteristic test curve is obtained by fitting to characterize the change of contact voltage with the side length and horizontal spacing of the floor space.

[0016] Furthermore, the reference surface point further includes a second reference surface point; the test parameter combination further includes a second test parameter combination for analyzing the maximum step voltage value; the voltage test curve further includes a step voltage characteristic test curve; the voltage value further includes a maximum step voltage value;

[0017] The applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates and obtains voltage values ​​of a preset reference surface point under different test parameter combinations, includes:

[0018] A simulated ground short-circuit current is applied to the simulation model so that the simulation model, after the simulated ground short-circuit current is applied, calculates the maximum step voltage value corresponding to each second test parameter combination based on the potential generated by the first reference surface point under each second test parameter combination and the potential simultaneously generated by the corresponding second reference surface point.

[0019] Furthermore, the voltage test curve for characterizing the change of voltage with test parameters is obtained by fitting according to the voltage value and the test parameter combination corresponding to the voltage value, including:

[0020] For each of the maximum step voltage values, generating a second three-dimensional data point according to the maximum step voltage value and the side length and horizontal spacing of the second test parameter combination corresponding to the maximum step voltage value;

[0021] Regression analysis is performed on all second three-dimensional data points, and a step voltage characteristic test curve is obtained by fitting to characterize the change of the maximum step voltage with the side length and the horizontal spacing.

[0022] An embodiment of the present invention further provides a voltage test curve determination device, comprising: a data acquisition module, a simulation model construction module, a simulation module, and a fitting module;

[0023] The data acquisition module is used to obtain the structural parameters of the test building, the structural parameters of the grounding grid surrounding the test building, and the soil resistivity of the soil where the grounding grid surrounding the test building is located;

[0024] The simulation model construction module is used to construct a simulation model according to the structural parameters of the grounding grid around the test building, the structural parameters of the test building and the soil resistivity;

[0025] The simulation module is configured to apply external excitation to the simulation model so that the simulation model after the external excitation is applied simulates a voltage value of a preset reference surface point under different test parameter combinations; wherein the test parameter combination is composed of the side length of the test building and the horizontal distance between the grounding grid surrounding the test building and the test building;

[0026] The fitting module is used to fit the voltage value and the test parameter combination corresponding to the voltage value to obtain a voltage test curve for characterizing the change of voltage with the test parameters.

[0027] The present application also provides a terminal device, including:

[0028] one or more processors;

[0029] a memory, coupled to the processor, for storing one or more programs;

[0030] When the one or more programs are executed by the one or more processors, the one or more processors implement the voltage test curve determination method as described in the above-mentioned embodiment of the invention.

[0031] An embodiment of the present invention further provides a method for determining building site safety based on a voltage test curve, comprising:

[0032] Obtaining data on the side length of the building to be evaluated and data on the horizontal distance between the building to be evaluated and the grounding grid surrounding the building to be evaluated;

[0033] Inputting the land side length data and the horizontal spacing data into a voltage test curve to obtain a theoretical maximum voltage value; wherein the voltage test curve is determined by the voltage test curve determination method;

[0034] If the theoretical voltage is less than the preset voltage safety threshold, it is determined that the building to be evaluated is in a safe area.

[0035] If the theoretical voltage is not less than a preset voltage safety threshold, it is determined that the building to be assessed is in a dangerous area.

[0036] Furthermore, the voltage test curve includes a contact voltage characteristic test curve and a step voltage characteristic test curve;

[0037] The step of inputting the land side length data and the horizontal spacing data into the voltage test curve to obtain the theoretical maximum voltage value includes:

[0038] Inputting the land side length data and the horizontal spacing data into the contact voltage characteristic test curve to obtain a theoretical maximum contact voltage value;

[0039] The land side length data and the horizontal spacing data are input into a step voltage characteristic test curve to obtain a theoretical maximum step voltage value.

[0040] Furthermore, the voltage safety threshold includes a contact voltage safety threshold and a step voltage safety threshold;

[0041] If the theoretical voltage is less than a preset voltage safety threshold, it is determined that the building to be evaluated is in a safe area; if the theoretical voltage is not less than the preset voltage safety threshold, it is determined that the building to be evaluated is in a dangerous area, including:

[0042] If the theoretical maximum contact voltage value is less than the preset contact voltage safety threshold and the theoretical maximum step voltage value is less than the preset step voltage safety threshold, it is determined that the building to be evaluated is in a safe area.

[0043] If the theoretical maximum contact voltage value is not less than a preset contact voltage safety threshold and the theoretical maximum step voltage value is not less than a preset step voltage safety threshold, it is determined that the building to be evaluated is in a dangerous area.

[0044] The following beneficial effects are achieved by implementing the present invention:

[0045] The present invention provides a method, device, terminal equipment and a method for determining a voltage test curve, and a building site safety determination method based on the voltage test curve. The method obtains the structural parameters of a test building, the structural parameters of a grounding grid surrounding the test building and the soil resistivity of the soil in which the grounding grid surrounding the test building is located, and constructs a simulation model. Then, by applying external excitation, the voltage values ​​under different test parameter combinations are obtained, and finally a voltage test curve is obtained by fitting. This effectively solves the problem in the prior art that the regional voltage distribution law is unclear due to the building footprint and the layout of the building and the surrounding grounding grid. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the technical solution of the present application, the following is a brief introduction to the drawings required for use in the implementation. Obviously, the drawings described below are only some implementation methods of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0047] Figure 1 This is a flow chart of a method for determining a voltage test curve provided in one embodiment of the present application;

[0048] Figure 2 It is a two-dimensional schematic diagram of the test building and the surrounding grounding grid layout shown from a top-down perspective in a simulation model provided in one embodiment of the present application;

[0049] Figure 3 This is a graph showing the maximum contact voltage as a function of the side length and horizontal spacing provided by an embodiment of the present application;

[0050] Figure 4 is a graph showing the maximum step voltage as a function of the side length and the horizontal spacing provided by an embodiment of the present application;

[0051] Figure 5 is a maximum contact voltage characteristic surface diagram provided by an embodiment of the present application;

[0052] Figure 6 This is a first contact voltage characteristic test curve of a certain embodiment of the present application, showing a change in the length of the footprint with the longitudinal horizontal spacing;

[0053] Figure 7 This is a contact voltage characteristic test curve of the maximum contact voltage as a function of the longitudinal horizontal spacing provided in a certain embodiment of the present application;

[0054] Figure 8 This is a contact voltage characteristic test curve of the maximum contact voltage as a function of the floor space length provided in a certain embodiment of the present application;

[0055] Figure 9 This is a characteristic test curve of maximum contact voltage varying with horizontal spacing under different footprint lengths provided by an embodiment of the present application;

[0056] Figure 10 This is a step voltage characteristic test curve of a certain embodiment of the present application, in which the maximum step voltage varies with the side length and horizontal spacing;

[0057] Figure 11 This is a schematic structural diagram of a voltage test curve determination device provided in one embodiment of the present application;

[0058] Figure 12 This is a schematic diagram of the structure of a terminal device provided in one embodiment of the present application;

[0059] Figure 13 It is a flowchart of a building site selection safety determination method based on a voltage test curve provided in a certain embodiment of the present application. DETAILED DESCRIPTION

[0060] To make the objectives, technical solutions, and advantages of this application more clear, the technical solutions in this application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making any creative efforts are within the scope of protection of this application.

[0061] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned figure descriptions are intended to cover non-exclusive inclusions.

[0062] In the description of the embodiments of this application, the technical terms "first" and "second" are used only to distinguish different objects and should not be understood to indicate or imply relative importance or implicitly specify the quantity, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined.

[0063] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0064] In the description of the embodiments of this application, the term "and / or" is simply a description of the association relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent the following three situations: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this document generally indicates that the associated objects are in an "or" relationship.

[0065] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0066] In the description of the embodiments of the present application, unless otherwise expressly specified or limited, technical terms such as "installed," "connected," "connected," and "fixed" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integration; mechanical connections or electrical connections; direct connections or indirect connections through an intermediate medium; internal connections between two components or interactions between two components. Those skilled in the art can understand the specific meanings of the above terms in the embodiments of the present application based on specific circumstances.

[0067] Example 1

[0068] See also Figure 1 To address the issue of the influence of building footprint, building and surrounding grounding grid layout on regional voltage distribution, which is still unclear in the prior art, an embodiment of the present invention provides a method for determining a voltage test curve, including:

[0069] S101. Obtaining structural parameters of a test building, structural parameters of a grounding grid surrounding the test building, and soil resistivity of the soil in which the grounding grid surrounding the test building is located;

[0070] Specifically, the structural parameters of the grounding grid around the test building include the geometric dimensions of the grounding grid, the grid shape and grid spacing of the grounding grid conductors, the material used for the grounding grid conductors (such as hot-dip galvanized flat steel, copper-clad steel round steel) and its resistivity, corrosion resistance and other parameters; the structural parameters of the test building include the dimensions of the foundation steel bars and metal frame, the grid shape and grid spacing of the steel mesh, the metal structure material and its conductivity, mechanical strength and other parameters; and the soil resistivity of the test building and the area where the grounding grid around the test building is located needs to be input.

[0071] S102, constructing a simulation model based on the structural parameters of the grounding grid surrounding the test building, the structural parameters of the test building, and the soil resistivity;

[0072] Specifically, based on the structural parameters of the grounding grid around the test building, the structural parameters of the test building, and the soil resistivity, an accurate three-dimensional simulation model is constructed using preset electromagnetic simulation software; wherein, the simulation model includes a simulation structure of the grounding grid around the test building and a simulation structure of the test building established based on the parameters; the model is intended to simulate the electrical behavior of the actual grounding system and the building under specific soil conditions.

[0073] S103, applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates a voltage value of a preset reference surface point under different test parameter combinations; wherein the test parameter combination is composed of the side length of the test building and the horizontal distance between the test building and the grounding grid surrounding the test building;

[0074] In this embodiment, the reference surface point includes a first reference surface point; the test parameter combination includes a first test parameter combination for analyzing a maximum contact voltage value; the voltage test curve includes a contact voltage characteristic test curve; and the voltage value includes a maximum contact voltage value;

[0075] The applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates and obtains voltage values ​​of a preset reference surface point under different test parameter combinations, includes:

[0076] Applying a simulated ground short-circuit current to the simulation model so that the simulation model after being applied with the simulated ground short-circuit current simulates a ground potential rise of the grounding grid surrounding the test building, and calculating, based on the ground potential rise, the difference between the potential generated by the first reference ground point under each first test parameter combination and the ground potential rise, to obtain a maximum contact voltage value corresponding to each first test parameter combination;

[0077] Schematically, the contact voltage refers to the difference between the potential of the faulty device casing and the potential of the surface point where the human foot is located, which is borne by the human body when the ground fault current flows into the ground grid. Therefore, in this embodiment, the contact voltage characteristic test curve is used as the object to be fitted.

[0078] Specifically, the simulated ground short-circuit current is injected into the grounding grid nodes in the simulation model according to the designed amplitude and waveform, thereby simulating the transient current distribution between the soil and the grounding grid under extreme working conditions such as lightning strikes and electrical faults, and confirming the ground potential rise V0 of the grounding grid around the test building;

[0079] Specifically, in order to study the impact of changes in both the side length and the horizontal spacing on the touch voltage at the reference surface point A, a reference surface point A is selected in the area where the test building and the grounding grid surrounding the test building are located. The reference surface point A is used as the first reference surface point, and the maximum touch voltage value generated by the first reference surface point under the first test parameter combination is determined by changing the side length and the horizontal spacing (the changed parameters constitute the first test parameter combination);

[0080] Specifically, see Figure 2 , which is a two-dimensional schematic diagram of the test building and its surrounding grounding grid layout displayed from a top-down perspective by the simulation model in this embodiment; Figure 2 The gray area on the left represents the grounding grid around the test building, and Figure 2 The area on the right side of the center containing the diagonal fill represents the test building; D represents the horizontal distance between the test building's surrounding grounding grid and the test building, d represents the vertical distance between the test building's surrounding grounding grid and the test building, and L represents the side length of the test building's footprint;

[0081] The closer the test building is to the terminal station on the grounding network surrounding the test building, the greater the touch voltage that may occur on the grounding network surrounding the test building;

[0082] It should be noted that, considering the actual situation and in order to simplify the subsequent analysis, the relationship between the length of the test building's footprint L, the horizontal spacing D and the maximum contact voltage is first analyzed. By changing the length of the test building's footprint L and the horizontal spacing D, the corresponding maximum contact voltage change is recorded, and the fitting is obtained. Figure 3 ,Depend on Figure 3 It can be seen that when the horizontal distance D is set to 3 meters or more, the maximum contact voltage shows a cliff-like drop compared to that within 3 meters. At the same time, the change of the corresponding maximum step voltage is recorded and fitted to obtain Figure 4 ,Depend on Figure 4 It can be seen that when the horizontal spacing D is set to 5 meters or more, the maximum step voltage shows a significant downward trend compared to that within 5 meters;

[0083] Therefore, for the convenience and safety of actual construction wiring planning, this embodiment first sets the horizontal spacing between the test building's surrounding grounding grid and the test building to a fixed value D = 5m. Then, when the vertical horizontal spacing d and the floor area length L are changed, the contact voltage generated at the reference surface point A is studied, and the law of the horizontal distance between the test building and the test building's surrounding grounding grid is studied. The contact voltage calculation formula is as follows:

[0084]

[0085] UTA=V0-VA(xA,yA,0);

[0086] Where V i (x i ,y i ,0) is the potential generated by the grounding grid around the test building at a reference surface point A in any linear segment i; V A (x A ,y A ,0) is the total potential generated by all linear segments of the grounding grid around the test building at the reference surface point A; U TA is the contact voltage generated at point A on the reference ground surface;

[0087] It should be noted that the linear segment i is each linear component of the grounding grid around the test building in the simulation model after being discretized;

[0088] S104, fitting a voltage test curve for characterizing a change in voltage with the test parameters based on the voltage value and a combination of test parameters corresponding to the voltage value;

[0089] In this embodiment, the voltage test curve for characterizing the change of voltage with the test parameters is obtained by fitting according to the voltage value and the test parameter combination corresponding to the voltage value, including:

[0090] For each of the maximum contact voltage values, generating a first three-dimensional data point according to the maximum contact voltage value and the floor area length and horizontal spacing in the first test parameter combination corresponding to the maximum contact voltage value;

[0091] Regression analysis is performed on all first three-dimensional data points to obtain a contact voltage characteristic test curve that is used to characterize the change of contact voltage with the length of the floor area and the horizontal spacing;

[0092] Specifically, see Figure 5, is a first three-dimensional data point generated by performing regression analysis based on the maximum contact voltage value and the footprint length and horizontal spacing in the first test parameter combination corresponding to the maximum contact voltage value, and fitting to obtain a contact voltage characteristic surface, which includes three contact voltage characteristic test curves, respectively. Figure 6 、 Figure 7 and Figure 8 To express, where Figure 6 The characteristic curve of the land side length changing with the longitudinal horizontal spacing is shown. Figure 7 Characteristic test curve showing the maximum contact voltage changes with the change of longitudinal horizontal spacing, Figure 8 Characteristic test curve showing the maximum contact voltage changing with the length of the floor space; see Figure 9 , showing the relationship between the maximum contact voltage and the horizontal spacing under different floor space lengths. Through multiple curves of different colors, the numerical differences and changing trends of the maximum contact voltage under different floor space lengths can be intuitively compared;

[0093] In addition, based on Figure 6 、 Figure 7 and Figure 8 By fitting the contact voltage characteristic test curve, a set of mathematical expressions that can accurately reflect the quantitative relationship between the side length, longitudinal horizontal spacing and the maximum contact voltage are obtained:

[0094] L=a1d 4 -a2d 3 +a3d 2 -a4d+c1;

[0095] U TAmax =b1d 3 -b2d 2 +b3d-c2;

[0096]

[0097] Where U TAmax represents the maximum contact voltage; L represents the side length of the floor area; a1, a2, a3 and a4 are the first fitting constants, c1 is the second fitting constant, and the first fitting constant and the second fitting constant are used to determine the specific form of the functional relationship between the side length L of the floor area and the change of the longitudinal horizontal spacing d; b1, b2 and b3 are the third fitting constants, c2 is the fourth fitting constant, and the third fitting constant and the fourth fitting constant are used to determine the maximum contact voltage U TAmax The specific form of the functional relationship that changes with the longitudinal horizontal spacing d; e1, e2 and e3 are the fifth fitting constants, c3 and c4 are the sixth fitting constants, and the fifth fitting constant and the sixth fitting constant are used to determine the maximum contact voltage U TAmax The specific form of the functional relationship that changes with the length L of the land area.

[0098] In this embodiment, the reference surface point further includes a second reference surface point; the test parameter combination further includes a second test parameter combination for analyzing the maximum step voltage value; the voltage test curve further includes a step voltage characteristic test curve; and the voltage value further includes a maximum step voltage value;

[0099] The applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates and obtains voltage values ​​of a preset reference surface point under different test parameter combinations, includes:

[0100] applying a simulated ground short-circuit current to the simulation model, so that the simulation model, after being applied with the simulated ground short-circuit current, calculates a maximum step voltage value corresponding to each second test parameter combination based on a potential generated by the first reference ground point under each second test parameter combination and a potential simultaneously generated by the corresponding second reference ground point;

[0101] Specifically, in order to explore the influence of the joint change of the footprint length and the horizontal spacing on the step voltage value, a reference surface point B is set, and the reference surface point B is used as the second reference surface point, so as to explore the change law of the step voltage value when the footprint length and the horizontal spacing are changed together by measuring the potential difference between the first reference surface point and the second reference surface point, and by changing the footprint length and the horizontal spacing (the changed parameters constitute the second test parameter combination, wherein the first test parameter combination is used to fit the contact voltage characteristic test curve and the second test parameter combination is used to fit the step voltage characteristic test curve) to determine the maximum step voltage value generated by the first reference surface point and the second reference surface point under the second test parameter combination, the step voltage U AB The calculation formula is as follows:

[0102] UAB=VA(xA,yA,0)-VB(xB,yB,0);

[0103] Where V B (x B ,y B ,0) is the potential of reference surface point B.

[0104] In this embodiment, the voltage test curve for characterizing the change of voltage with the test parameters is obtained by fitting according to the voltage value and the test parameter combination corresponding to the voltage value, including:

[0105] For each of the maximum step voltage values, generating a second three-dimensional data point according to the maximum step voltage value and the side length and horizontal spacing of the second test parameter combination corresponding to the maximum step voltage value;

[0106] Regression analysis is performed on all second three-dimensional data points to obtain a step voltage characteristic test curve that is used to characterize the change of maximum step voltage with the length of the footprint and the horizontal spacing;

[0107] Specifically, see Figure 10 , is a step voltage characteristic test curve obtained by fitting in this embodiment and used to characterize the maximum step voltage as the length of the footprint and the horizontal spacing change.

[0108] Example 2

[0109] See Figure 11 , is a voltage test curve determination device provided by an embodiment of the present invention, comprising: a data acquisition module, a simulation model construction module, a simulation module and a fitting module;

[0110] The data acquisition module is used to obtain the structural parameters of the test building, the structural parameters of the grounding grid surrounding the test building, and the soil resistivity of the soil where the grounding grid surrounding the test building is located;

[0111] The simulation model construction module is used to construct a simulation model based on the structural parameters of the grounding grid around the test building, the structural parameters of the test building, and the soil resistivity; wherein the simulation model includes a simulation structure of the grounding grid around the test building and a simulation structure of the test building;

[0112] The simulation module is configured to apply external excitation to the simulation model so that the simulation model after the external excitation is applied simulates a voltage value of a preset reference surface point under different test parameter combinations; wherein the test parameter combination is composed of the side length of the test building and the horizontal distance between the grounding grid surrounding the test building and the test building;

[0113] The fitting module is used to fit the voltage value and the test parameter combination corresponding to the voltage value to obtain a voltage test curve for characterizing the change of voltage with the test parameters.

[0114] Example 3

[0115] See also Figure 12 , an embodiment of the present application further provides a terminal device, including:

[0116] one or more processors;

[0117] a memory, coupled to the processor, for storing one or more programs;

[0118] When the one or more programs are executed by the one or more processors, the one or more processors implement the voltage test curve determination method as described above.

[0119] The processor is used to control the overall operation of the terminal device to complete all or part of the steps of the above-mentioned voltage test curve determination method. The memory is used to store various types of data to support the operation of the terminal device. For example, this data may include instructions for any application or method used to operate on the terminal device, as well as application-related data. The memory can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk or optical disk.

[0120] In an exemplary embodiment, the terminal device can be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors or other electronic components to execute the voltage test curve determination method described in any of the above embodiments and achieve the same technical effect as the above method.

[0121] Example 4

[0122] See Figure 13 , is a building site safety determination method based on a voltage test curve provided by an embodiment of the present invention, comprising:

[0123] S201, obtaining data on the side length of the building to be evaluated and data on the horizontal distance between the building to be evaluated and the grounding grid surrounding the building to be evaluated;

[0124] S202, inputting the land side length data and the horizontal spacing data into a voltage test curve to obtain a theoretical maximum voltage value; wherein the voltage test curve is determined by the voltage test curve determination method;

[0125] S203: If the theoretical voltage is less than the preset voltage safety threshold, it is determined that the building to be evaluated is in a safe area.

[0126] If the theoretical voltage is not less than a preset voltage safety threshold, it is determined that the building to be assessed is in a dangerous area;

[0127] Specifically, the voltage test curve is a voltage test curve determined by any embodiment of the voltage test curve determination method;

[0128] Specifically, in actual application scenarios, the site selection requirements of buildings need to consider multi-dimensional factors, among which electrical safety factors are particularly important; when judging site safety, voltage safety cannot be ignored. Therefore, in this embodiment, a method for determining the safety of building site selection is provided. First, the side length data of the building to be evaluated and the horizontal spacing data between the building to be evaluated and the grounding grid around the building to be evaluated are obtained (taking into account actual engineering experience, when the horizontal spacing is greater than 5 meters, the electrical risk indicators such as the contact voltage around the building will be significantly reduced, and the safety margin will be greatly improved, basically meeting the requirements of conventional safety standards. Therefore, in order to focus on critical scenarios with potential risks, this embodiment only considers the site selection situation with a horizontal spacing of 5 meters). The side length data and the horizontal spacing data are input into the voltage test curve to obtain the theoretical maximum voltage value, so as to determine whether the theoretical maximum voltage value is less than the preset voltage safety threshold to determine whether the building to be evaluated is in a safe area:

[0129] If the theoretical voltage is less than the preset voltage safety threshold, it is determined that the building to be evaluated is in a safe area.

[0130] If the theoretical voltage is not less than a preset voltage safety threshold, it is determined that the building to be assessed is in a dangerous area.

[0131] In this embodiment, the voltage test curve includes a contact voltage characteristic test curve and a step voltage characteristic test curve;

[0132] The step of inputting the land side length data and the horizontal spacing data into the voltage test curve to obtain the theoretical maximum voltage value includes:

[0133] Inputting the land side length data and the horizontal spacing data into the contact voltage characteristic test curve to obtain a theoretical maximum contact voltage value;

[0134] Inputting the land side length data and the horizontal spacing data into a step voltage characteristic test curve to obtain a theoretical maximum step voltage value;

[0135] Specifically, the contact voltage characteristic test curve and the step voltage characteristic test curve are determined by any embodiment of the voltage test curve determination method;

[0136] Specifically, in actual application, after obtaining the side length data and horizontal spacing data of the building to be evaluated, these two sets of data are used as independent variables and substituted into the constructed contact voltage characteristic test curve and step voltage characteristic test curve respectively. Through calculation, the theoretical maximum contact voltage value is obtained from the contact voltage characteristic test curve. The theoretical maximum contact voltage value reflects the voltage that a person may withstand when contacting the building and related parts of the grounding grid; the theoretical maximum step voltage value is obtained from the step voltage characteristic test curve. The theoretical maximum step voltage value reflects the maximum voltage that may occur between the two feet of a person when walking around the building. These two theoretical voltage values ​​together provide a basis for evaluating the safety of building site selection.

[0137] In this embodiment, the voltage safety threshold includes a contact voltage safety threshold and a step voltage safety threshold;

[0138] If the theoretical voltage is less than a preset voltage safety threshold, it is determined that the building to be evaluated is in a safe area; if the theoretical voltage is not less than the preset voltage safety threshold, it is determined that the building to be evaluated is in a dangerous area, including:

[0139] If the theoretical maximum contact voltage value is less than the preset contact voltage safety threshold and the theoretical maximum step voltage value is less than the preset step voltage safety threshold, it is determined that the building to be evaluated is in a safe area.

[0140] If the theoretical maximum contact voltage value is not less than a preset contact voltage safety threshold and the theoretical maximum step voltage value is not less than a preset step voltage safety threshold, it is determined that the building to be assessed is in a dangerous area;

[0141] Specifically, the contact voltage safety threshold and the step voltage safety threshold can be set according to actual conditions.

[0142] The above is a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. A method for determining a voltage test curve, characterized in that: include: Obtaining the structural parameters of the test building, the structural parameters of the grounding grid surrounding the test building, and the soil resistivity of the soil where the grounding grid surrounding the test building is located; Constructing a simulation model based on the structural parameters of the grounding grid surrounding the test building, the structural parameters of the test building, and the soil resistivity; Applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates a voltage value of a preset reference surface point under different test parameter combinations; wherein the test parameter combination is composed of the side length of the test building and the horizontal distance between the test building and the grounding grid surrounding the test building; According to the voltage value and the test parameter combination corresponding to the voltage value, a voltage test curve for characterizing the change of voltage with the test parameter is obtained by fitting.

2. The method for determining a voltage test curve according to claim 1, wherein: The reference surface point includes a first reference surface point; the test parameter combination includes a first test parameter combination for analyzing a maximum contact voltage value; the voltage test curve includes a contact voltage characteristic test curve; and the voltage value includes a maximum contact voltage value; The applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates and obtains voltage values ​​of a preset reference surface point under different test parameter combinations, includes: A simulated ground short-circuit current is applied to the simulation model so that the simulation model after the simulated ground short-circuit current is applied simulates the ground potential rise of the grounding grid around the test building, and based on the ground potential rise, the difference between the potential generated by the first reference surface point under each first test parameter combination and the ground potential rise is calculated respectively to obtain the maximum contact voltage value corresponding to each first test parameter combination.

3. The method for determining a voltage test curve according to claim 2, wherein: The step of fitting a voltage test curve for characterizing a change in voltage with a test parameter based on the voltage value and a test parameter combination corresponding to the voltage value includes: For each of the maximum contact voltage values, generating a first three-dimensional data point according to the maximum contact voltage value and the floor area length and horizontal spacing in the first test parameter combination corresponding to the maximum contact voltage value; Regression analysis is performed on all first three-dimensional data points, and a contact voltage characteristic test curve is obtained by fitting to characterize the change of contact voltage with the side length and horizontal spacing of the floor space.

4. The method for determining a voltage test curve according to claim 2, wherein: The reference surface point further includes a second reference surface point; the test parameter combination further includes a second test parameter combination for analyzing the maximum step voltage value; the voltage test curve further includes a step voltage characteristic test curve; the voltage value further includes a maximum step voltage value; The applying external excitation to the simulation model so that the simulation model after the external excitation is applied simulates and obtains voltage values ​​of a preset reference surface point under different test parameter combinations, includes: A simulated ground short-circuit current is applied to the simulation model so that the simulation model, after the simulated ground short-circuit current is applied, calculates the maximum step voltage value corresponding to each second test parameter combination based on the potential generated by the first reference surface point under each second test parameter combination and the potential simultaneously generated by the corresponding second reference surface point.

5. The method for determining a voltage test curve according to claim 4, wherein: The step of fitting a voltage test curve for characterizing a change in voltage with a test parameter based on the voltage value and a test parameter combination corresponding to the voltage value includes: For each of the maximum step voltage values, generating a second three-dimensional data point according to the maximum step voltage value and the side length and horizontal spacing of the second test parameter combination corresponding to the maximum step voltage value; Regression analysis is performed on all second three-dimensional data points, and a step voltage characteristic test curve is obtained by fitting to characterize the change of the maximum step voltage with the side length and the horizontal spacing.

6. A device for determining a voltage test curve, characterized in that: include: Data acquisition module, simulation model building module, simulation module and fitting module; The data acquisition module is used to obtain the structural parameters of the test building, the structural parameters of the grounding grid surrounding the test building, and the soil resistivity of the soil where the grounding grid surrounding the test building is located; The simulation model construction module is used to construct a simulation model according to the structural parameters of the grounding grid around the test building, the structural parameters of the test building and the soil resistivity; The simulation module is configured to apply external excitation to the simulation model so that the simulation model after the external excitation is applied simulates a voltage value of a preset reference surface point under different test parameter combinations; wherein the test parameter combination is composed of the side length of the test building and the horizontal distance between the grounding grid surrounding the test building and the test building; The fitting module is used to fit the voltage value and the test parameter combination corresponding to the voltage value to obtain a voltage test curve for characterizing the change of voltage with the test parameters.

7. A terminal device, characterized in that: include: one or more processors; a memory, coupled to the processor, for storing one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the voltage test curve determination method according to any one of claims 1 to 5.

8. A building site selection safety determination method based on voltage test curve, characterized in that: include: Obtaining data on the side length of the building to be evaluated and data on the horizontal distance between the building to be evaluated and the grounding grid surrounding the building to be evaluated; Inputting the land side length data and the horizontal spacing data into a voltage test curve to obtain a theoretical maximum voltage value; wherein the voltage test curve is determined by the voltage test curve determination method according to any one of claims 1 to 5; If the theoretical voltage is less than the preset voltage safety threshold, it is determined that the building to be evaluated is in a safe area. If the theoretical voltage is not less than a preset voltage safety threshold, it is determined that the building to be assessed is in a dangerous area.

9. The building site selection safety determination method based on voltage test curve according to claim 8, characterized in that: The voltage test curve includes a contact voltage characteristic test curve and a step voltage characteristic test curve; The step of inputting the land side length data and the horizontal spacing data into the voltage test curve to obtain the theoretical maximum voltage value includes: Inputting the land side length data and the horizontal spacing data into the contact voltage characteristic test curve to obtain a theoretical maximum contact voltage value; The land side length data and the horizontal spacing data are input into a step voltage characteristic test curve to obtain a theoretical maximum step voltage value.

10. The building site selection safety determination method based on voltage test curve according to claim 9, characterized in that: The voltage safety threshold includes a contact voltage safety threshold and a step voltage safety threshold; If the theoretical voltage is less than a preset voltage safety threshold, it is determined that the building to be evaluated is in a safe area; if the theoretical voltage is not less than the preset voltage safety threshold, it is determined that the building to be evaluated is in a dangerous area, including: If the theoretical maximum contact voltage value is less than the preset contact voltage safety threshold and the theoretical maximum step voltage value is less than the preset step voltage safety threshold, it is determined that the building to be evaluated is in a safe area. If the theoretical maximum contact voltage value is not less than a preset contact voltage safety threshold and the theoretical maximum step voltage value is not less than a preset step voltage safety threshold, it is determined that the building to be evaluated is in a dangerous area.

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