Test equipment and vehicle lamp production line

Abstract

The invention belongs to the technical field of vehicle lamp testing, and particularly relates to a testing device and a vehicle lamp production line, the testing device comprises a conveying mechanism, an assembling mechanism, a testing mechanism and a sorting mechanism, the conveying mechanism comprises a rack and a rotating disc rotationally connected to the rack, and the assembling mechanism, the testing mechanism and the sorting mechanism are arranged at intervals in the circumferential direction of the rotating disc; the rotating disc conveys multiple components to the assembling mechanism, the assembling mechanism assembles the multiple components to form a target workpiece, the rotating disc conveys the target workpiece to the testing mechanism, the testing mechanism tests the target workpiece, and the rotating disc is further used for receiving the tested target workpiece from the testing mechanism and conveying the target workpiece to the sorting mechanism. The sorting mechanism comprises a material moving structure, a first material collecting structure and a second material collecting structure, and the material moving structure is used for transferring the target workpieces which are tested to be qualified to the first material collecting structure and transferring the target workpieces which are tested to be unqualified to the second material collecting structure. According to the invention, the production efficiency and the product consistency can be improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of vehicle lamp testing, and in particular relates to testing equipment and a vehicle lamp production line. Background Art

[0002] LEDs (Light Emitting Diodes) have become a significant source of light energy in recent years. Their advantages of energy conservation, carbon reduction, and long lifespan have led to their increasing use in lighting sources. In automotive lighting, LED headlights are widely adopted due to their energy conservation, long lifespan, and high brightness. LED headlights are typically assembled from core components including a circuit board, lamp housing, mask, and back cover. The production process includes critical quality control steps: first, the circuit board is precisely fixed within the lamp housing to ensure that the circuit and heat dissipation structure are compatible. Next, the circuit board-lamp housing assembly is assembled with the mask and back cover to form a complete lamp. Finally, the assembled LED headlights undergo multi-dimensional performance verification using automated testing equipment.

[0003] However, the degree of automation in LED production processes remains low, especially in assembly and testing, which largely rely on manual labor. This inefficiency prevents large-scale production and increases labor costs. Furthermore, differences in operator skill levels and operating habits lead to poor product consistency. Furthermore, after testing, qualified and unqualified products must be manually sorted, which is inefficient and significantly impacts sorting efficiency. Summary of the Invention

[0004] The purpose of the embodiments of the present application is to provide a testing device and a vehicle lamp production line, aiming to solve the problems of how to improve production efficiency and how to improve product consistency.

[0005] To achieve the above objectives, the technical solution adopted in this application is:

[0006] In the first aspect, a testing device is provided, comprising a conveying mechanism and an assembly mechanism, a testing mechanism and a sorting mechanism arranged in sequence along the conveying path of the conveying mechanism, the conveying mechanism comprising a frame and a turntable rotatably connected to the frame, the assembly mechanism, the testing mechanism and the sorting mechanism are arranged at intervals along the circumference of the turntable, the turntable conveys a plurality of components to the assembly mechanism, the assembly mechanism is used to assemble a plurality of the components to form a target workpiece, the turntable receives the target workpiece from the assembly mechanism and conveys the target workpiece to the testing mechanism, the testing mechanism is used to test the target workpiece, the turntable is also used to receive the target workpiece after the test is completed from the testing mechanism and convey it to the sorting mechanism, the sorting mechanism comprises a material transfer structure, a first aggregate structure and a second aggregate structure, the material transfer structure is used to transfer the target workpiece that has passed the test from the turntable to the first aggregate structure, and transfer the target workpiece that has failed the test from the turntable to the second aggregate structure.

[0007] In some embodiments, the testing mechanism includes a sliding current testing structure and a driving structure connected to the current testing structure, wherein the driving structure is used to drive the current testing structure to move along a first direction so that the current testing structure docks with the target workpiece, and the current testing structure is used to energize the target workpiece and detect the current of the target workpiece.

[0008] In some embodiments, the testing mechanism also includes a visual detection structure connected to the driving structure and slidingly arranged, the driving structure is used to drive the current testing structure and the visual detection structure to alternately dock with the target workpiece, the target workpiece includes an electrical connector electrically connected to the current testing structure, and the visual detection structure is used to detect whether the spatial posture of the electrical connector deviates from a preset reference axis after the current test is completed.

[0009] In some embodiments, the testing mechanism further includes a light detection sensor provided on the conveying path of the conveying mechanism, the target workpiece includes a light emitting element for emitting light, the light emitting element projects light toward the light detection sensor, and the light detection sensor is used to detect the intensity of the light.

[0010] In some embodiments, the conveying mechanism also includes a rotating drive member mounted on the frame and connected to the turntable, the rotating drive member is used to drive the turntable to rotate so that the target workpiece is docked with the testing mechanism and the sorting mechanism in sequence, the turntable carries the target workpiece at the testing mechanism, and drives the target workpiece to slide to the material transfer structure, and the material transfer structure receives the target workpiece from the turntable.

[0011] In some embodiments, the conveying mechanism also includes a carrier provided on the turntable and used to fix the target workpiece, the carrier includes a placement seat for supporting the target workpiece and a limit block provided on the placement seat, a plurality of the limit blocks are arranged at intervals along the circumference of the carrier, and a plurality of the limit blocks surround to form a limit space for limiting the target workpiece.

[0012] In some embodiments, the testing mechanism is used to test multiple parameters of the target workpiece, the second aggregate structure has multiple independent storage areas, each storage area corresponds one-to-one to each parameter, and the material transfer structure is also used to transfer the target workpiece that fails any parameter test to the corresponding storage area.

[0013] In some embodiments, the second aggregate structure includes a silo having a accommodating cavity and a partition structure provided in the accommodating cavity, wherein the partition structure is used to divide the accommodating cavity into a plurality of sub-cavities, and the sub-cavities are configured as the storage area.

[0014] In some embodiments, the first aggregate structure and the second aggregate structure are spaced apart along the second direction, and the partition structure includes partitions, and a plurality of the partitions are spaced apart along a preset direction to divide the accommodating cavity into a plurality of sub-cavities arranged along the second direction.

[0015] In a second aspect, a vehicle lamp production line is provided, comprising the above-mentioned testing equipment.

[0016] The test equipment provided by the present application is characterized in that a turntable transports multiple components to an assembly mechanism, the assembly mechanism assembles the multiple components to form a target workpiece, and then the turntable transports the assembled target workpiece to a testing mechanism for testing. After the test, the turntable transports the tested target workpiece to a sorting mechanism, and the sorting mechanism transfers the target workpiece that has passed the test to a first aggregate structure through a material transfer structure, and transfers the target workpiece that has failed the test to a second aggregate structure. The entire process is automatically coordinated and operated by the assembly mechanism, the testing mechanism, the sorting mechanism, and the conveying mechanism, etc., and the degree of automation is greatly improved, manual operation is reduced, and functions such as assembly, testing, and sorting are integrated, which greatly improves production efficiency and improves product consistency; and the sorting mechanism automatically transfers qualified target workpieces and unqualified target workpieces to different positions for subsequent target workpiece processing, further improving production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or exemplary technical descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 This is a schematic diagram of the overall structure of the test equipment provided in the embodiment of the present application;

[0019] Figure 2 It is a structural diagram of the conveying mechanism and the testing mechanism provided in the embodiment of the present application;

[0020] Figure 3 It is a structural diagram of the testing mechanism provided in the embodiment of the present application;

[0021] Figure 4 This is a partial structural diagram of the test equipment provided in the embodiment of the present application;

[0022] Figure 5 is a structural diagram of a carrier provided in an embodiment of the present application;

[0023] Figure 6 It is a structural diagram of the sorting mechanism provided in an embodiment of the present application;

[0024] Figure 7 is a structural schematic diagram of a second aggregate structure provided in an embodiment of the present application;

[0025] Figure 8 It is a structural diagram of the picking mechanism provided in an embodiment of the present application.

[0026] Among them, the reference numerals in the figures are:

[0027] 10. Sorting mechanism; 110. First material collection structure; 120. Second material collection structure; 121. Bin; 122. Partition structure; 1221. Partition plate; 1231. Sub-cavity; 124. Opening; 125. Sensing structure; 130. Material transfer structure; 131. Linear motion mechanism; 132. Pickup mechanism; 1321. Base; 1322. Clamping drive member; 1323. Clamping member; 133. Lifting mechanism; 1331. Lifting drive member; 1332. Slide; 20. Testing mechanism; 21. Driving structure; 22. Current testing structure; 221. Probe; 23. Visual inspection structure; 24. Optical inspection sensor; 25. Laser sensor; 30. Conveying mechanism; 31. Rack; 32. Turntable; 33. Carrier; 331. Placement seat; 332. Limit block; 3321. Abutment surface; 333. Limit space; 34. Rotating drive member; 40. Assembly mechanism; 41. Lamp housing loading structure; 42. Mask loading structure; 43. Back cover loading structure; 50. Laser marking mechanism; 200. Storage area; 300. Target workpiece; 310. Component. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the invention for which protection is sought, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0029] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0030] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0031] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Furthermore, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0032] See also Figures 1 to 8 The embodiment of the present application provides a testing device, including a conveying mechanism 30 and an assembly mechanism 40, a testing mechanism 20 and a sorting mechanism 10 arranged in sequence along the conveying path of the conveying mechanism 30. The conveying mechanism 30 includes a frame 31 and a turntable 32 rotatably connected to the frame 31. The assembly mechanism 40, the testing mechanism 20 and the sorting mechanism 10 are arranged at intervals along the circumference of the turntable 32. The turntable 32 conveys a plurality of components 310 to the assembly mechanism 40. The assembly mechanism 40 is used to assemble the plurality of components 310 into a target workpiece 300. The turntable 32 receives the target workpiece 300 from the assembly mechanism 40. The workpiece 300 is transported to the testing mechanism 20, which is used to test the target workpiece 300. The turntable 32 is also used to receive the target workpiece 300 that has completed the test from the testing mechanism 20 and transport it to the sorting mechanism 10. The sorting mechanism 10 includes a material transfer structure 130, a first aggregate structure 110 and a second aggregate structure 120. The material transfer structure 130 is used to transfer the target workpiece 300 that has passed the test from the turntable 32 to the first aggregate structure 110, and transfer the target workpiece 300 that has failed the test from the turntable 32 to the second aggregate structure 120.

[0033] It should be noted that the target workpiece 300 of the embodiment of the present application is an LED car light. It is understandable that before the LED car light is tested by the testing mechanism 20, it needs to be assembled by the assembly mechanism 40. Figure 2As shown, the target workpiece 300 includes multiple detachably connected components 310. Specifically, the components 310 can be a circuit board, a lamp housing, a mask, and a back cover. The circuit board is used to carry the LED chip, the lamp housing provides heat dissipation and structural support, and the back cover is sealed. The testing mechanism 20 is used to test multiple parameters of the target workpiece 300, thereby achieving multi-dimensional performance verification. For example, the testing mechanism 20 can be used to test the light intensity, light color, current, and voltage of the target workpiece 300. Among them, the light intensity test can verify whether the brightness output meets the standard, the light color test can verify whether the color temperature and color coordinates meet the standards, and the current and voltage tests can verify the stability of the drive circuit and power consumption parameters.

[0034] After the test is completed, the turntable 32 receives the target workpiece 300 that has completed the test from the testing mechanism 20 and transports it to the sorting mechanism 10. The material transfer structure 130 of the sorting mechanism 10 transfers the target workpiece 300 that has passed the test of all parameters from the turntable 32 to the first aggregate structure 110 according to the test results of the testing mechanism 20, and transfers the target workpiece 300 that has failed the test of any parameter from the turntable 32 to the second aggregate structure 120.

[0035] The test equipment provided by the present application is that the turntable 32 transports multiple components 310 to the assembly mechanism 40, and the assembly mechanism 40 assembles the multiple components 310 to form a target workpiece 300, and then the turntable 32 transports the assembled target workpiece 300 to the testing mechanism 20 for testing. After the test, the turntable 32 transports the tested target workpiece 300 to the sorting mechanism 10, and the sorting mechanism 10 transfers the target workpiece 300 that has passed the test to the first aggregate structure 110 through the material transfer structure 130, and transfers the target workpiece 300 that has failed the test to the second aggregate structure 120. The entire process is automatically coordinated and operated by the assembly mechanism 40, the testing mechanism 20, the sorting mechanism 10 and the conveying mechanism 30, etc., and the degree of automation is greatly improved, manual operation is reduced, and the functions of assembly, testing and sorting are integrated, which greatly improves production efficiency and improves product consistency; and the sorting mechanism 10 automatically transfers qualified target workpieces 300 and unqualified target workpieces 300 to different positions for subsequent processing of the target workpieces 300, further improving production efficiency.

[0036] It should be noted that any target workpiece 300 is tested for various parameters of the target workpiece 300 in a preset order. For example, the current test is performed first, then the light intensity test is performed, and finally the light color test is performed. If the current parameter test is qualified, the next parameter test is automatically performed. If the current parameter test fails, the parameter test is determined to be unqualified, and the next parameter test will not be performed.

[0037] It can be understood that the present application also includes a control system (not shown in the figure), and the conveying mechanism 30, assembly mechanism 40, testing mechanism 20 and sorting mechanism 10 are all communicatively connected to the control system. The control system can control the conveying mechanism 30, assembly mechanism 40, testing mechanism 20 and sorting mechanism 10 to automatically cooperate and operate, thereby reducing the impact of human factors and improving production efficiency.

[0038] In some embodiments, as Figure 2 and Figure 3 As shown, the testing mechanism 20 includes a sliding current testing structure 22 and a driving structure 21 connected to the current testing structure 22. The driving structure 21 is used to drive the current testing structure 22 to move in a first direction so that the current testing structure 22 mates with the target workpiece 300. The current testing structure 22 is used to energize the target workpiece 300 and detect the current of the target workpiece 300. The current testing structure 22 can monitor the operating current of the target workpiece 300. When the target workpiece 300 is an LED headlight, the electrical connection integrity between the conductive terminals of the LED headlight and the headlight circuit can be directly verified. The current testing structure 22 can detect whether the headlight current is abnormal. When the headlight current is abnormal, insufficient lighting brightness or circuit overheating may occur, thereby diagnosing the current abnormality.

[0039] Furthermore, by providing a drive structure 21, test efficiency can be improved, ensuring the alignment consistency between the current test structure 22 and the target workpiece 300, significantly reducing operational complexity and the requirements for personnel skills. Furthermore, the test mechanism 20 of the embodiment of the present application is easily integrated into an automated production line or online testing station, ensuring efficient production cycles. Alternatively, the drive structure 21 may be a motor or a telescopic cylinder.

[0040] In some embodiments, as Figure 2 and Figure 3 As shown, the test mechanism 20 also includes a visual inspection structure 23 connected to the drive structure 21 and slidably arranged. The drive structure 21 is used to drive the current test structure 22 and the visual inspection structure 23 to alternately dock with the target workpiece 300. The target workpiece 300 includes an electrical connector electrically connected to the current test structure 22. The visual inspection structure 23 is used to detect whether the spatial posture of the electrical connector deviates from a preset reference axis after the current test is completed. Specifically, the electrical connector of the target workpiece 300 is a pin needle, which is used to electrically connect to an external structure. The current test structure 22 includes a probe 221, which abuts the pin needle and provides current to the pin needle. The pin needle has an electrical conduction function, and the headlight current can be detected while the headlight is on.

[0041] The visual detection structure 23 is used to detect whether the spatial posture of the electrical connector deviates from a preset reference axis. It can be understood that the preset reference axis is the extended axis of the electrical connector when the electrical connector is correctly installed. When the electrical connector is a pin, the visual detection structure 23 detects whether the spatial posture of the pin deviates from the preset reference axis, that is, whether the pin is skewed. Optionally, the visual detection structure 23 is a camera.

[0042] During the specific testing process, the driving structure 21 first drives the visual detection structure 23 to dock with the target workpiece 300, and the visual detection structure 23 detects whether the pin needle is skewed. Then the driving structure 21 drives the current testing structure 22 to dock with the target workpiece 300, and the current testing structure 22 lights up the LED lights and detects the light current at the same time. Finally, the driving structure 21 drives the visual detection structure 23 to dock with the target workpiece 300 again, thereby detecting whether the pin needle is skewed after the current test is completed. Therefore, through multiple detections, the reliability of the detection can be improved.

[0043] In some embodiments, as Figure 2 and Figure 3 As shown, the testing mechanism 20 further includes a light detection sensor 24 disposed on the conveying path of the conveying mechanism 30. The target workpiece 300 includes a light emitting element for emitting light. The light emitting element projects light toward the light detection sensor 24, and the light detection sensor 24 is used to detect the intensity of the light. Specifically, the light emitting element is an LED chip.

[0044] In some embodiments, the conveying mechanism 30 includes a frame 31, a turntable 32 rotatably connected to the frame 31 and used to carry the target workpiece 300, and a rotating drive member 34 provided on the frame 31 and connected to the turntable 32. The testing mechanism 20 and the material transfer structure 130 are arranged at intervals along the circumference of the turntable 32. The rotating drive member 34 is used to drive the turntable 32 to rotate so that the target workpiece 300 is docked with the testing mechanism 20 and the sorting mechanism 10 in sequence. The turntable 32 carries the target workpiece 300 at the testing mechanism 20 and drives the target workpiece 300 to slide to the material transfer structure 130. The material transfer structure 130 receives the target workpiece 300 from the turntable 32.

[0045] It can be understood that the testing mechanism 20 and the material transfer structure 130 are arranged at intervals. When the material transfer structure 130 receives the target workpiece 300 from the conveying mechanism 30, the testing mechanism 20 and its working area are separated from the unloading area of ​​the target workpiece 300 in spatial layout. The unloading operation of the target workpiece 300 completely avoids the spatial limitations of the testing area, which is conducive to improving the convenience of the material transfer structure 130 in taking materials.

[0046] In addition, by setting up a turntable 32 to drive the target workpiece 300 to move, compared with a linear layout in which the target workpiece 300 is transmitted along a straight line, the turntable 32 transmission method occupies a smaller area and has a more compact structure, which is conducive to reducing the space occupied by the test equipment.

[0047] Optionally, the rotary drive element 34 may include a stepper motor, a speed reducer, and an indexing mechanism. The stepper motor provides precise angular control, controlling the rotation angle and speed by receiving pulse signals. The speed reducer, typically a planetary speed reducer or a worm gear speed reducer, reduces the motor's output speed while significantly increasing the output torque to meet the needs of driving the relatively large inertia turntable 32, while also improving system rigidity and reducing vibration. The indexing mechanism is key to achieving precise indexing and positioning. Specifically, the indexing mechanism may employ a cam divider, which internally employs a conjugate cam structure to convert the motor's continuous rotational motion into intermittent, precise indexing motion of the turntable 32. This mechanism exhibits extremely high positioning and repeatability, strong load-bearing capacity, excellent rigidity, smooth operation, and a long service life. It is suitable for medium- to high-speed, high-precision, and heavy-load applications.

[0048] In some embodiments, the conveying mechanism 30 further includes a carrier 33 disposed on the turntable 32 and used to secure the target workpiece 300. The carrier 33 ensures that the target workpiece 300 does not shake or shift during the inspection process, thereby improving the accuracy of the inspection. It will be understood that in the embodiment of the present application, the turntable 32 is a disc-shaped structure, and the carrier 33 is disposed at the edge of the turntable 32. The assembly mechanism 40, the testing mechanism 20, and the sorting mechanism 10 are arranged in a circular array around the circumference of the turntable 32 with the rotation center of the turntable 32 as the center of the circle.

[0049] Optionally, multiple carriers 33 can be set on the turntable 32, and the turntable 32 drives each carrier 33 to dock with the assembly mechanism 40, the testing mechanism 20 and the sorting mechanism 10 in turn. The movement of the entire system only requires one rotating drive component to complete the transportation of all carriers 33, which greatly simplifies the drive and control system. There is no need for a complex linear conveyor system, multi-axis robotic arms or a large number of independent propulsion cylinders to realize the transfer of carriers 33 between the assembly mechanism 40, the testing mechanism 20 and the sorting mechanism 10.

[0050] Furthermore, the carrier 33 includes a placement seat 331 for supporting the target workpiece 300 and a stopper 332 disposed on the placement seat 331. A plurality of stoppers 332 are arranged at intervals along the circumference of the carrier 33. The plurality of stoppers 332 surround and form a stopper space 333 for limiting the position of the target workpiece 300. The plurality of stoppers 332 limit the target workpiece 300 from multiple directions, thereby improving the position of the target workpiece 300, maintaining a stable position of the target workpiece 300 during testing, and thereby improving the stability and accuracy of the test.

[0051] In some embodiments, the shape of the limiting space 333 is adapted to the outer contour of the target workpiece 300, that is, multiple limiting blocks 332 are arranged to form a contoured cavity to accommodate the target workpiece 300. Since the contoured cavity is highly consistent with the outer contour of the target workpiece 300, it provides a maximized contact area, eliminates the slight shaking or rotational freedom that may exist in the target workpiece 300 during the positioning process, and multiple complex surfaces are contact constrained at the same time, so that the target workpiece 300 can be accurately and uniquely fixed in the expected position and direction.

[0052] In addition, the operator only needs to place the target workpiece 300 into the matching contoured cavity, and it will automatically and quickly fall into the correct position. There is no need for tedious adjustments and alignment of multiple locating pins or reference surfaces, which greatly reduces clamping time, operation difficulty and error rate.

[0053] In some embodiments, the limit block 332 has an abutment surface 3321 that abuts the target workpiece 300. The abutment surface 3321 is adapted to the outer surface shape of the target workpiece 300. Multiple abutment surfaces 3321 are contacted and constrained at the same time, which can accurately and uniquely fix the target workpiece 300 in the expected position and direction.

[0054] Optionally, the optical detection sensor 24 is arranged below the turntable 32, the turntable 32 is provided with a first through hole, the placement seat 331 is provided with a second through hole, the first through hole corresponds to the second through hole, and the light-emitting element fixed on the carrier 33 can project light to the optical detection sensor 24 through the first through hole and the second through hole, so that the optical detection sensor 24 can detect the intensity of the light.

[0055] In some embodiments, the turntable 32 is also equipped with a laser sensor 25, which is used to detect the height difference and gap between the rear cover and the lamp housing of the target workpiece 300. Optionally, the laser sensor 25 is a line-scan 3D camera. A cylindrical lens diffuses the laser light into a linear beam, which is then projected onto the surface of the object, creating diffuse reflection. The camera captures the reflected light at a specific angle and calculates the surface contour information based on the positional offset of the laser line in the image using triangulated geometry. Line-scan 3D cameras, with their non-contact scanning, micron-level accuracy, and high-speed imaging capabilities, have become a core tool for dimensional measurement and defect detection in intelligent manufacturing.

[0056] In some embodiments, the testing mechanism 20 is used to test multiple parameters of the target workpiece 300, and the second aggregate structure 120 has multiple independent storage areas 200, each storage area 200 corresponding to each parameter. The material transfer structure 130 is also used to transfer the target workpiece 300 that fails any parameter test to the corresponding storage area 200. For example, one of the storage areas 200 is used to receive the target workpiece 300 that fails the light intensity test, and the other storage area 200 is used to receive the target workpiece 300 that fails the current test. This eliminates the need for secondary manual sorting and retesting of products that fail the test, which is beneficial to improving sorting efficiency.

[0057] The testing mechanism 20 is used to test multiple parameters of the target workpiece 300, thereby achieving multi-dimensional performance verification. For example, the testing mechanism 20 can be used to test the light intensity, light color, current, and voltage of the target workpiece 300. Among them, the light intensity test can verify whether the brightness output meets the standard; the light color test can verify whether the color temperature and color coordinates meet the standards; the current and voltage tests can verify the stability of the driving circuit and power consumption parameters.

[0058] In some embodiments, the second material collection structure 120 includes a housing 121 having a receiving cavity and a partitioning structure 122 disposed within the receiving cavity. The partitioning structure 122 is used to divide the receiving cavity into multiple sub-cavities 1231, each of which is configured as a material storage area 200. The provision of the partitioning structure 122 ensures that each material storage area 200 is isolated, preventing the mixing of target workpieces 300 and increasing the difficulty of sorting. Furthermore, by integrating multiple sub-cavities 1231 within a single housing 121, space is saved compared to providing multiple independent material boxes, facilitating the miniaturization of the testing equipment, and is particularly suitable for the high-density layout requirements of LED automotive light production lines.

[0059] In some embodiments, the first aggregate structure 110 and the second aggregate structure 120 are spaced apart along the second direction, and the partition structure 122 includes a partition 1221. A plurality of partitions 1221 are spaced apart along a preset direction to separate the accommodating cavity into a plurality of sub-cavities 1231 arranged along the second direction. In other words, the first aggregate structure 110 and the second aggregate structure 120 are linearly arranged in the same direction, and the sub-cavities 1231 of the second aggregate structure 120 are linearly arranged in the same direction, that is, the storage areas 200 are linearly arranged in the same direction, so that the material transfer mechanism only needs to move linearly along a single axis to cover all material discharge points, thereby optimizing the movement path of the material transfer mechanism and being able to utilize the unidirectional space to reduce the space occupied by the first aggregate structure 110 and the second aggregate structure 120, which is conducive to the miniaturization of the test equipment.

[0060] In some embodiments, the accommodating cavity forms an opening 124 at the top of the second material collection structure 120 for receiving the target workpiece 300. The opening 124 is connected to each sub-cavity 1231. The second material collection structure 120 also includes a sensing structure 125 disposed at the edge of the opening 124 and used to detect whether the target workpiece 300 is in place. It can be understood that the opening 124 is located at the top of the bin body 121 and is connected to each sub-cavity 1231, thereby facilitating each sub-cavity 1231 to receive the target workpiece 300 from the material transfer structure 130. By providing the sensing structure 125, the sensing structure 125 can provide real-time feedback to ensure that each target workpiece 300 falls into the correct position, thereby ensuring the reliability of the classified collection.

[0061] Optionally, the sensing structure 125 is a through-beam photoelectric switch. When the target workpiece 300 is placed into the storage area 200 by the material transfer mechanism, the light beam of the through-beam photoelectric switch is blocked by the target workpiece 300, triggering a switch signal. This allows accurate determination of whether the target workpiece 300 has successfully entered the designated storage area 200, thus avoiding missed detections or misjudgments due to the target workpiece 300 falling or shifting. Furthermore, the through-beam photoelectric switch, through direct optical path detection, can accurately identify positional changes of the target workpiece 300, making it suitable for high-speed moving object detection. Its short response time makes it suitable for high-speed automated production lines, reducing the risk of missed or misjudgments.

[0062] Optionally, the first aggregate structure 110 also has a cavity for accommodating qualified target workpieces 300, and a sensing structure 125 is also provided at the entrance of the cavity. The specific structure and function of the sensing structure 125 are similar to those of the second aggregate structure 120 and will not be repeated here.

[0063] In some embodiments, the material transfer structure 130 includes a linear motion mechanism 131 and a pickup mechanism 132 slidably disposed on the linear motion mechanism 131 and configured to pick up the target workpiece 300. The linear motion mechanism 131 is disposed across the first material collection structure 110 and the second material collection structure 120. The linear motion mechanism is configured to drive the pickup mechanism 132 to move in a second direction so that the pickup mechanism 132 docks with the first material collection structure 110 and the second material collection structure 120, respectively. By driving the pickup mechanism 132 to move via the linear motion mechanism, the displacement accuracy of the pickup mechanism 132 can be improved, allowing the pickup mechanism 132 to be accurately moved to a predetermined position.

[0064] In some embodiments, the pickup mechanism 132 includes a base 1321 connected to the linear motion mechanism 131, a clamping driver 1322 connected to the base 1321, and a slidably arranged clamping member 1323. Two clamping members 1323 are arranged at intervals, and the clamping driver 1322 is used to drive the two clamping members 1323 to move toward each other to clamp the target workpiece 300. By driving the two clamping members 1323 to move toward each other and clamp the target workpiece 300 by the clamping driver 1322, the stability of the target workpiece 300 can be improved and the target workpiece 300 can be prevented from falling during the movement. It is understandable that when the target workpiece 300 needs to be released, the clamping driver 1322 can drive the two clamping members 1323 to move away from each other, at which time the clamping members 1323 are separated from the target workpiece 300, thereby releasing the target workpiece 300.

[0065] Optionally, multiple pickup mechanisms 132 are provided at intervals, and each of the multiple pickup mechanisms 132 is connected to the linear motion mechanism 131, so that a single movement of the linear motion mechanism can pick up multiple target workpieces 300, thereby improving the efficiency of transporting the target workpieces 300. Optionally, in the embodiment of the present application, two pickup mechanisms 132 are arranged at intervals.

[0066] In some embodiments, the material transfer structure 130 includes a lifting mechanism, the lifting structure 133 includes a lifting drive 1331 connected to the linear moving mechanism 131 and a slide 1332 connected to the output end of the lifting drive 1331, the picking mechanism 132 is connected to the slide 1332, and the lifting drive 1331 drives the slide 1332 to rise and fall, so that the picking mechanism 132 is synchronously lifted and lowered with the slide 1332, so that the picking mechanism 132 can move to a preset height to pick up the target workpiece 300 or release the target workpiece 300, thereby improving the reliability of material transfer.

[0067] In some embodiments, the assembly mechanism 40 includes a lamp housing loading structure 41, a mask loading structure 42, and a back cover loading structure 43 arranged at intervals along the circumference of the turntable 32. The lamp housing loading structure 41 is used to load the lamp housing onto the carrier 33. The turntable 32 then drives the carrier 33 to move to the mask loading structure 42. The mask loading structure 42 loads the mask onto the carrier 33 and assembles the mask and lamp housing together. The circuit board is then manually loaded onto the carrier 33 and assembled with the mask and lamp housing. Finally, the turntable 32 drives the carrier 33 to move to the back cover loading structure 43. The back cover loading structure 43 loads the back cover onto the carrier 33 and assembles the back cover with the circuit board, mask, and lamp housing, thereby completing the assembly of the target workpiece 300. Optionally, a laser marking mechanism 50 is further provided between the testing mechanism 20 and the sorting mechanism 10. The laser marking mechanism 50 is used to perform laser marking on the target workpiece 300.

[0068] The present invention also proposes a car lamp production line, which includes testing equipment. The specific structure of the testing equipment refers to the above-mentioned embodiment. Since this car lamp production line adopts all the technical solutions of all the above-mentioned embodiments, it also has all the beneficial effects brought by the technical solutions of the above-mentioned embodiments, which will not be repeated here.

[0069] To sum up, in the testing equipment provided by the present application, the turntable 32 transports multiple components 310 to the assembly mechanism 40, the assembly mechanism 40 assembles multiple components 310 to form a target workpiece 300, and then the turntable 32 transports the assembled target workpiece 300 to the testing mechanism 20 for testing. After the test, the turntable 32 transports the tested target workpiece 300 to the sorting mechanism 10, and the sorting mechanism 10 transfers the target workpiece 300 that has passed the test to the first aggregate structure 110 through the material transfer structure 130, and transfers the target workpiece 300 that has failed the test to the second aggregate structure 120. The entire process is automatically coordinated and operated by the assembly mechanism 40, the testing mechanism 20, the sorting mechanism 10 and the conveying mechanism 30, etc., and the degree of automation is greatly improved, manual operation is reduced, and the assembly, testing and sorting functions are integrated, which greatly improves production efficiency and improves product consistency; and the sorting mechanism 10 automatically transfers qualified target workpieces 300 and unqualified target workpieces 300 to different positions for subsequent processing of the target workpieces 300, further improving production efficiency.

[0070] The above are merely optional embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included within the scope of the claims of the present application.

Claims

1. A testing device, characterized in that: The invention relates to a conveying mechanism (30) and an assembling mechanism (40), a testing mechanism (20) and a sorting mechanism (10) which are sequentially arranged along a conveying path of the conveying mechanism (30); the conveying mechanism (30) comprises a frame (31) and a turntable (32) rotatably connected to the frame (31); the assembling mechanism (40), the testing mechanism (20) and the sorting mechanism (10) are arranged at intervals along the circumference of the turntable (32); the turntable (32) conveys a plurality of components (310) to the assembling mechanism (40); the assembling mechanism (40) is used to assemble the plurality of components (310) to form a target workpiece (300); the turntable (32) receives the target workpiece (300) from the assembling mechanism (40) and transfers the target workpiece (300) to the assembling mechanism (40); and the turntable (32) receives the target workpiece (300) from the assembling mechanism (40) and transfers the target workpiece (300) to the assembling mechanism (40). The target workpiece (300) is transported to the testing mechanism (20), and the testing mechanism (20) is used to test the target workpiece (300). The turntable (32) is also used to receive the target workpiece (300) that has completed the test from the testing mechanism (20) and transport it to the sorting mechanism (10). The sorting mechanism (10) includes a material transfer structure (130), a first aggregate structure (110) and a second aggregate structure (120). The material transfer structure (130) is used to transfer the target workpiece (300) that has passed the test from the turntable (32) to the first aggregate structure (110), and to transfer the target workpiece (300) that has failed the test from the turntable (32) to the second aggregate structure (120).

2. The test device according to claim 1, wherein: The testing mechanism (20) comprises a slidingly arranged current testing structure (22) and a driving structure (21) connected to the current testing structure (22); the driving structure (21) is used to drive the current testing structure (22) to move along a first direction so that the current testing structure (22) is docked with the target workpiece (300); and the current testing structure (22) is used to energize the target workpiece (300) and detect the current of the target workpiece (300).

3. The testing device according to claim 2, wherein: The testing mechanism (20) further comprises a visual detection structure (23) connected to the driving structure (21) and arranged in a sliding manner, wherein the driving structure (21) is used to drive the current testing structure (22) and the visual detection structure (23) to alternately dock with the target workpiece (300), wherein the target workpiece (300) comprises an electrical connector electrically connected to the current testing structure (22), and the visual detection structure (23) is used to detect whether the spatial posture of the electrical connector deviates from a preset reference axis after the current test is completed.

4. The testing device according to claim 3, wherein: The testing mechanism (20) further includes a light detection sensor (24) provided on a conveying path of the conveying mechanism (30); the target workpiece (300) includes a light emitting element for emitting light; the light emitting element projects light toward the light detection sensor (24); and the light detection sensor (24) is used to detect the intensity of the light.

5. The testing device according to any one of claims 1 to 4, characterized in that: The conveying mechanism (30) further includes a rotating drive member (34) disposed on the frame (31) and connected to the turntable (32), wherein the rotating drive member (34) is used to drive the turntable (32) to rotate so that the target workpiece (300) is docked with the testing mechanism (20) and the sorting mechanism (10) in sequence, and the turntable (32) carries the target workpiece (300) at the testing mechanism (20) and drives the target workpiece (300) to slide to the material transfer structure (130), and the material transfer structure (130) receives the target workpiece (300) from the turntable (32).

6. The testing device according to claim 5, wherein: The conveying mechanism (30) further comprises a carrier (33) disposed on the turntable (32) and used for fixing the target workpiece (300), the carrier (33) comprising a placement seat (331) for carrying the target workpiece (300) and a limiting block (332) disposed on the placement seat (331), a plurality of the limiting blocks (332) being arranged at intervals along the circumference of the carrier (33), and the plurality of limiting blocks (332) surrounding each other form a limiting space (333) for limiting the target workpiece (300).

7. The testing device according to any one of claims 1 to 4, characterized in that: The testing mechanism (20) is used to test multiple parameters of the target workpiece (300); the second material collection structure (120) has multiple independent storage areas (200); each storage area (200) corresponds to each parameter one by one; and the material transfer structure (130) is also used to transfer the target workpiece (300) that fails any parameter test to the corresponding storage area (200).

8. The testing device according to claim 7, wherein: The second aggregate structure (120) includes a silo (121) having a accommodating cavity and a partition structure (122) provided in the accommodating cavity, wherein the partition structure (122) is used to divide the accommodating cavity into a plurality of sub-cavities (1231), and the sub-cavities (1231) are configured as the storage area (200).

9. The testing device according to claim 8, wherein: The first aggregate structure (110) and the second aggregate structure (120) are arranged at intervals along the second direction, and the partition structure (122) includes a partition (1221), and a plurality of the partitions (1221) are arranged at intervals along a preset direction to separate the accommodating cavity (123) into a plurality of sub-cavities (1231) arranged along the second direction.

10. A car lamp production line, characterized by: Comprising a test device as claimed in any one of claims 1 to 9.

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