A heavy ion track positioning method suitable for microseeds

Abstract

The present application relates to the field of particle track microanalysis technology, and is a heavy ion track positioning method suitable for microseeds. The present application mainly uses a scanner to scan a biological stack, uses mapping software to process the scanning diagram, obtains a picture of a single seed hole, and acquires position information of seeds in the seed hole, uses a VHX microscope to scan a CR39 detection sheet, acquires passive detection information of each seed hole, and superimposes the passive detection information on the picture processed by the mapping software, analyzes radiation detection conditions at the Arabidopsis thaliana seeds, and further converts data to acquire various radiation information of the individual Arabidopsis thaliana seeds. The present application is committed to batch processing, rapid, high-precision processing of returned detection sheets. In terms of batch degree, the whole process is batch processing, and related software can be used to automatically output batch pictures and data, thereby reducing the degree of manual participation.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of particle track microanalysis technology, and particularly relates to a heavy ion track positioning method suitable for microseeds. BACKGROUND

[0002] The space environment contains many particles, and the radiation parameters of the particles in the space environment are usually analyzed by using a solid nuclear track detector. CR39 is a kind of solid nuclear track detector used for capturing radiation particle tracks. After the detection sheet is recovered and etched after space flight, the heavy ion track can be marked and measured under an optical microscope, and the heavy ion radiation nuclear track data can be obtained automatically after calibration by using software. By analyzing the nuclear track parameters of the Arabidopsis thaliana seed projection area on the CR39, the individual level radiation detection analysis of the Arabidopsis thaliana seed can be performed.

[0003] With more attention paid to deep space exploration, the flight time of the detection sheet for space flight becomes longer and the flight times become more, and the early scheme takes a long time and has low accuracy, which is no longer suitable for the current actual application requirements. On the problem of individual level heavy ion analysis of Arabidopsis thaliana seeds, the early scheme also has obvious deficiencies: the Arabidopsis thaliana seed is small in size, and the seed area cannot be accurately positioned. Due to the above three problems, it may have an impact on subsequent research. SUMMARY

[0004] In view of the above technical problems, a heavy ion track positioning method suitable for microseeds is provided. The present application mainly uses a scanner to scan the biological stack, uses drawing software to process the scanned image to obtain a single seed hole picture and obtain the position information of the seed in the seed hole, uses a VHX microscope to scan the CR39 detection sheet, superimposes the passive detection information of each seed hole and the picture processed by the drawing software, analyzes the radiation detection of the Arabidopsis thaliana seed, and further converts the data to obtain various radiation information of the individual Arabidopsis thaliana seed.

[0005] The technical means adopted by the present application are as follows:

[0006] A heavy ion track positioning method suitable for microseeds comprises the following steps:

[0007] Obtain the projection data of the seed stack on the detection sheet, and draw a model image of the seed hole position projected on the detection sheet;

[0008] Obtain the passive microscopic detection image of the corresponding detection sheet radiation at the transparent mask under the microscope by focusing twice in the same plane, and obtain the radiation detection information of the seed hole position in each model image;

[0009] Obtain the seed physical image by using a scanner, and cut the seed physical image into a single seed picture by using a slicing tool;

[0010] The object recognition function of the drawing software is used to identify the seed position in a single seed image, and a seed hole template image is obtained;

[0011] The passive radiation microscopic detection image corresponding to the detector at the transparent mask is superimposed with the seed template image to obtain the passive radiation detection situation corresponding to the seed position.

[0012] Calculate the number of heavy ion hits, the absorbed radiation dose, and the LET value of each seed.

[0013] Furthermore, the step of acquiring the projection data of the seeds stacked on the detector plate and drawing a pattern diagram of the seed hole positions projected onto the detector plate specifically includes:

[0014] Seeds are placed in seed holes and stacked, and a probe is placed on the stack to obtain the projection of the stack on the probe. A drawing is then created based on the projection to obtain a border of the same size as the probe. A pattern diagram of the seed hole positions projected onto the probe is drawn based on the stack model data through image processing.

[0015] Furthermore, the passive microscopic detection images of the corresponding detector sheet at the transparent mask are acquired twice under the microscope with the focus on the same plane, and the radiation detection information of the seed hole positions in each model image is obtained, specifically including:

[0016] Under a microscope, the passive microscopic detection image of the radiation corresponding to the detector at the transparent mask was obtained by focusing twice on the same plane. The printed mask film and the detector were then pasted together with 3M tape and photographed under a microscope. Based on the model diagram data, the stage was automatically moved at a distance according to the parameters of the electric stage and the film, and the radiation detection information of the seed hole positions in each model diagram was captured.

[0017] Furthermore, the step of acquiring a physical image of the seed through a scanner and then using a slicing tool to cut the physical image of the seed into individual seed images specifically includes:

[0018] The seed stack is scanned using a scanner to obtain a clear image of the seeds. Horizontal and vertical reference lines are added to the seed image so that each hole is within a single reference line grid. A slicing tool is used to slice the entire seed image into individual seed images based on the reference lines. The reference lines are drawn along the outer edge of the seed hole in the seed image to separate the seed hole from the interval between two holes, cutting it into small square images. The center of the square can coincide with the center of the round hole to find the center of the round hole.

[0019] Furthermore, the step of using object recognition to identify the seed position in a single seed image to obtain a seed hole template image specifically includes:

[0020] Using the object recognition function, the position of the seed inside the seed hole is identified. After batch processing of the images, the seeds inside the seed hole are removed and the image background is changed to white to obtain template images of transparent seed holes at each seed location.

[0021] Furthermore, the passive radiation microscopic detection image corresponding to the detector patch at the transparent mask is superimposed with the seed template image to obtain the passive radiation detection situation corresponding to the seed position, specifically including:

[0022] By focusing twice on the same plane to obtain the corresponding passive radiation detection image of the detector at the transparent mask, and superimposing it with the template image of the transparent seed hole at each seed location, an image of the passive radiation detection situation corresponding to the seed location is obtained.

[0023] Compared with the prior art, the present invention has the following advantages:

[0024] This invention provides a heavy ion track localization method suitable for microseeds, aiming to process returned detector data in batches, rapidly, and with high precision. In terms of batch processing, the entire process is batch-processed, and relevant software can automatically output batch images and data, reducing the need for manual intervention.

[0025] The heavy ion track localization method for microseeds provided by this invention offers several advantages in terms of timeliness. For a single CR-39 probe, data acquisition time can be controlled within 5 person-hours. This method collects approximately 5000 heavy ion tracks per probe. Compared to the method used in the biological stack of the Shijian-10 recoverable satellite, which processed 10 CR-39 probes with fewer than 1000 data points (single heavy ion tracks), the method took 606 days, averaging approximately 60 days per probe, involving 3 personnel (approximately 1080 person-hours per probe, with each person having 6 person-hours per day), averaging approximately 200 heavy ion tracks per probe. Therefore, compared to existing methods, this method increases the processing speed of the entire probe by approximately 210 times and the number of tracks detected per person-hour by approximately 60 times.

[0026] The heavy ion track localization method for tiny seeds provided by this invention improves accuracy by using mapping software to batch process and obtain the range of Arabidopsis thaliana seeds and obtain a template. This solves the problem that it is impossible to accurately obtain the range of Arabidopsis thaliana seeds in batches due to their small size. The method is faster, more accurate, and simpler to obtain the range of a single Arabidopsis thaliana seed.

[0027] Based on the above reasons, this invention can be widely applied in fields such as particle track microscopy analysis technology. Attached Figure Description

[0028] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0029] Figure 1 This is a flowchart of the heavy ion track localization method for microseeds in this invention. Detailed Implementation

[0030] It should be noted that, unless otherwise specified, the embodiments and features described in the present invention can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0031] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the present invention or its application or use. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0032] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the scope of exemplary embodiments according to the invention. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0033] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps described in these embodiments do not limit the scope of the invention. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0034] like Figure 1 As shown, the present invention provides a heavy ion track localization method suitable for microseeds, characterized by comprising:

[0035] The projection data of the seeds stacked on the probe sheet is obtained, and a pattern diagram of the seed hole positions projected onto the probe sheet is drawn using SolidWorks software. In a preferred embodiment, the seeds are stacked within the seed holes, and the probe sheet is placed on top of the stack to obtain the projection of the stacked seeds onto the probe sheet. A drawing is then created based on this projection, resulting in a border the same size as the probe sheet. The pattern diagram of the seed hole positions projected onto the probe sheet is drawn using image processing software (Adobe Illustrator) based on the stacked model data, and a transparent mask is printed. This step requires 0.5 people and is performed only once; it needs to be remeasured when the stack or probe sheet is replaced.

[0036] Under a microscope, the radiation passive microscopic detection images of the corresponding detector sheet at the transparent mask are obtained by focusing twice on the same plane, thus acquiring radiation detection information of the seed holes in each model diagram. Specifically, in a preferred embodiment of this invention, the radiation passive microscopic detection images of the corresponding detector sheet at the transparent mask are obtained under a microscope using the method of focusing twice on the same plane. The printed mask film and detector sheet are then overlapped and pasted together using 3M tape, and photographed under a microscope. Based on the model diagram data, the stage is automatically moved according to the parameters of the electric stage and the film, and the radiation detection information of the seed holes in each model diagram is captured. This step requires 4 person-hours per sheet of 550 seeds.

[0037] The seed image is obtained using a scanner, and then sliced ​​into individual seed images using a slicing tool. Specifically, in a preferred embodiment, the seeds are scanned to obtain a clear image. This image is then imported into Adobe Photoshop, where horizontal and vertical reference lines are added to ensure each hole is within a single reference line grid. The slicing tool is then used to slice the image based on these reference lines, dividing the overall seed image into individual seed images. Reference lines are drawn along the outer edges of the seed holes in the image, separating the seed holes from the gaps between them, resulting in small square images. The center of each square is aligned with the center of a round hole, thus locating the center of the round hole. This step requires 0.5 person-hours.

[0038] The object recognition function of Photoshop is used to identify the seed positions in a single seed image, resulting in a seed hole template image. In a preferred embodiment, the object recognition function is used to identify the positions of seeds within the seed holes. After batch processing of the images, the seeds within the seed holes are removed, and the image background is changed to white, resulting in template images of transparent seed holes for each seed. This step is a batch automatic recognition program and does not require manual intervention.

[0039] The passive radiation detection images of the detector at the transparent mask location are acquired twice by focusing on the same plane and then superimposed with the seed template image to obtain the passive radiation detection information corresponding to the seed position. Specifically, in a preferred embodiment of this invention, the passive radiation detection images of the detector at the transparent mask location are acquired twice by focusing on the same plane and then superimposed with the template images of the transparent seed holes at each seed position to obtain an image showing the passive radiation detection information corresponding to the seed position. This step is an automatic superimposition process and is performed without human intervention.

[0040] A convolutional neural network model is used to capture particles in the overlay image, calculating the number of heavy ion hits, radiation absorbed dose, and LET value for each seed. In implementation, the method is based on the patent application "Automatic Acquisition Method and System for Two-Stage Radiation Particle Tracks for Solid-State Nuclear Track Detectors" (application number 2024105074274). The radiation particle dataset is preprocessed, manually labeled major and minor axis points are corrected, and the heavy ion track data is normalized. A YOLOv7 model is used as the detector to extract image features, obtaining the bounding rectangles of multiple radiation particles. Images of the roughly located rectangles are extracted, and ROIAglin is used to normalize rectangles of different sizes to the same representation space, while amplifying the radiation particle features within the rectangles. A measuring device is used to extract feature information of the radiation particles and predict their tracks. The predicted relative center point, major and minor axes, and angles are restored to their absolute center point, major and minor axes, and angles relative to the image, realizing a heavy ion track localization method suitable for tiny seeds.

[0041] Example

[0042] like Figure 1 As shown, in this embodiment, a scanner is used to scan the biological stack, and then the scan image is processed using mapping software to obtain an image of a single seed well and obtain the location information of the seed within the seed well. A VHX microscope is used to scan the CR39 detector plate to obtain the passive detection information of each seed well, and this information is superimposed on the image processed by the mapping software to analyze the radiation detection at the Arabidopsis seed. Furthermore, data conversion is performed to obtain various radiation information for individual Arabidopsis seeds.

[0043] Arabidopsis seeds are small and numerous, and manually delineating the seed range is time-consuming. Therefore, a program was written using the batch processing and object selection functions of Adobe Photoshop to batch process images to obtain templates. The obtained seed templates were then overlaid with the radiation detection information of specific areas of the probe sheet to obtain the radiation information of individual Arabidopsis seeds.

[0044] Heavy ions striking the CR39 detector sheet leave tracks on it. After etching, small holes can be observed on the detector sheet surface under a microscope. By calculating the area of ​​these holes, various parameters of each heavy ion can be obtained. After the bio-stack returns, the detector sheet is attached to a transparent mask pre-drawn and printed based on the projection data of the bio-stack on the detector sheet using 3M tape. Then, a VHX microscope is used to capture passive detection images of the detector sheet at the transparent mask location twice using co-planar focusing, thus photographing the passive detection at each seed hole location. Capturing passive detection images of the detector sheet at the transparent mask location twice using co-planar focusing involves first focusing on the mask surface, locating the seed holes according to the seed hole information marked on the mask, and then refocusing on the CR39 detector sheet without changing their positions, thus achieving the purpose of photographing the detection at the seed hole location.

[0045] This method uses a VHX microscope with a compatible motorized stage, allowing for semi-automatic imaging by setting the distance of each lateral or longitudinal movement. The lateral and longitudinal movement distances are pre-set during imaging, with parameters consistent with the projection data of the organism superimposed on the probe slide. The microscope captures the side of the probe slide in contact with the seed, at 200x magnification, with the focus adjusted for a clear view. Light intensity is adjusted to avoid excessive brightness or darkness. The acquired images are then overlaid with the template and read using automated scanning software customized for this data format to obtain measurements of the number of heavy ion tracks and their major and minor axes.

[0046] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for heavy ion track localization suitable for microseeds, characterized in that, The application relates to a method for obtaining the radiation passive detection information of a seed position. The method comprises the following steps: acquiring projection data of a seed stack on a detection sheet, drawing a model diagram of seed hole positions projected on the detection sheet; twice under the microscope to acquire passive micro-detection diagrams of the corresponding detection sheet at the transparent mask position, and acquiring the radiation detection information of the seed hole positions in each model diagram; acquiring a seed real object diagram by using a scanner, and cutting the seed real object diagram into single seed pictures by using a slicing tool; clear seed real object diagrams are acquired by scanning the seed stack by using the scanner, horizontal and vertical reference lines are added to the seed real object diagrams so that single holes can be in a single reference line grid, the whole seed diagram is cut into single seed pictures by slicing based on the reference lines, the reference lines are drawn along the outer edges of the seed hole positions in the seed real object diagrams, the seed hole positions are separated from the interval between two holes, and the single seed pictures are cut into square small block pictures, the centers of the square small block pictures can be coincided with the centers of the circular holes so that the centers of the circular holes can be found; the seed positions in the single seed pictures are recognized by using the object recognition function of a drawing software, and a seed hole template picture is obtained; the passive micro-detection diagrams of the corresponding detection sheet at the transparent mask position are superimposed with the seed hole template picture, and the radiation passive detection conditions corresponding to the seed positions are acquired; the heavy ion hitting times, the radiation absorbed dose and the LET value of particles of each seed are calculated.

2. The method for heavy-ion track localization suitable for microseeds according to claim 1, characterized in that, The method for acquiring the projection data of the seed stack on the detection sheet and drawing the model diagram of the seed hole positions projected on the detection sheet comprises the following steps: the seeds are placed in the seed holes to form a stack, the detection sheet is placed on the stack, the projection of the stack on the detection sheet is obtained, a frame with the same size as the detection sheet is drawn on the basis of the projection, and the model diagram of the seed hole positions projected on the detection sheet is drawn according to the stack model data through image processing.

3. The method for heavy-ion track localization suitable for microseeds according to claim 1, characterized in that, The method for acquiring the passive micro-detection diagrams of the corresponding detection sheet at the transparent mask position twice under the microscope and acquiring the radiation detection information of the seed hole positions in each model diagram comprises the following steps: the passive micro-detection diagrams of the corresponding detection sheet at the transparent mask position are acquired twice under the microscope, the printed mask film is pasted on the detection sheet through 3M adhesive tape, and then the detection sheet is photographed under the microscope, the automatic moving distance of the object table is set according to the model diagram data and the film parameters, and the radiation detection information in the seed hole positions in each model diagram is acquired.

4. The method for heavy-ion track localization suitable for microseeds according to claim 1, characterized in that, The method for recognizing the seed positions in the single seed pictures by using the object recognition function of a drawing software and obtaining the seed hole template picture comprises the following steps: the positions of the seeds in the seed hole positions are recognized by using the object recognition function, the seeds in the seed hole positions are removed after the pictures are processed in batches, and the background of the pictures is converted into white, so that the template pictures of the transparent seed holes at the positions of each seed are obtained.

5. The method for heavy-ion track localization suitable for microseeds according to claim 1, characterized in that, The passive micro-detection diagrams of the corresponding detection sheet at the transparent mask position are superimposed with the seed hole template picture, and the radiation passive detection conditions corresponding to the seed positions are acquired, which comprises the following steps: the passive micro-detection diagrams of the corresponding detection sheet at the transparent mask position are superimposed with the template pictures of the transparent seed holes at the positions of each seed, and the radiation passive detection condition pictures corresponding to the seed positions are obtained.

Images