Interface testing device and interface testing method

Abstract

The invention relates to the technical field of electronic circuits, and provides interface testing equipment and an interface testing method. The interface test equipment comprises a test module and an upper computer. The plurality of first interaction interfaces of the electronic equipment are connected through the test module, so that a plurality of interaction paths can be formed between the upper computer and the plurality of first interaction interfaces, namely, a plurality of interaction paths are formed between the upper computer and the electronic equipment. And the upper computer sends a path switching instruction to the test module to indicate the test module to sequentially conduct a plurality of interaction paths between the upper computer and the plurality of first interaction interfaces, so that the electronic equipment can sequentially report target information to the upper computer through the plurality of interaction paths. And the upper computer can output an interactive interface test result of the electronic equipment based on the receiving condition of the target information. According to the technical scheme, testing of the multiple interactive interfaces of the electronic equipment is achieved, a new scheme for testing the interactive interfaces of the electronic equipment is provided, the implementation cost is lower, and the testing efficiency is higher.

Description

Technical Field

[0001] The present application belongs to the field of electronic circuit technology, and in particular relates to an interface testing device and an interface testing method. Background Art

[0002] As electronic devices become increasingly intelligent, many incorporate numerous hardware interfaces to enable configuration. These interfaces not only allow for communication with other devices but also allow for the mounting of storage resources and expansion modules. Therefore, testing electronic devices' interfaces before they leave the factory is crucial.

[0003] However, electronic devices have a large number of interactive interfaces, and existing testing solutions require manual switching of different interactive interfaces to implement interactive interface testing, or require the use of multiple test computers at the same time to complete the test. It can be seen that existing interactive interface testing solutions for electronic devices have the problem of low efficiency. Summary of the Invention

[0004] The purpose of this application is to provide an interface testing device and an interface testing method, aiming to solve the problem of low efficiency of existing interactive interface testing solutions for electronic devices.

[0005] A first aspect of an embodiment of the present application provides an interface testing device for testing an interactive interface of an electronic device, the interface testing device comprising:

[0006] A test module, configured to connect to a plurality of first interaction interfaces of an electronic device;

[0007] A host computer is connected to the test module; the host computer is configured to send an interface information reporting instruction to the electronic device and send a path switching instruction to the test module according to a preset port test strategy; wherein the interface information reporting instruction is used to instruct the electronic device to report target information through the interactive path;

[0008] The test module is configured to sequentially connect multiple interaction paths between the host computer and the multiple first interaction interfaces according to the path switching instruction;

[0009] The host computer is further configured to output the test result of the interactive interface of the electronic device based on the reception status of the target information.

[0010] An embodiment of the present application provides an interface testing device for testing an interactive interface of an electronic device. The interface testing device includes a test module and a host computer. The test module is used to connect to multiple first interactive interfaces of the electronic device, and the host computer is connected to the test module. When testing the interactive interface of the electronic device, the host computer can send an interface information reporting instruction to the electronic device and send a path switching instruction to the test module according to a preset port test strategy. Since the interface information reporting instruction is used to instruct the electronic device to report target information through an interactive path, and the test module can sequentially connect multiple interactive paths between the host computer and the multiple first interactive interfaces according to the path switching instruction, the electronic device can sequentially report target information to the host computer through the multiple interactive paths. The host computer outputs the interactive interface test results of the electronic device based on the reception of the target information. In the above solution, by connecting the multiple first interactive interfaces of the electronic device through the test module, multiple interactive paths can be formed between the host computer and the multiple first interactive interfaces, that is, multiple interactive paths can be formed between the host computer and the electronic device. The host computer sends an interface information reporting instruction to the electronic device, instructing the electronic device to report the target information through the interactive path. At the same time, the host computer sends a path switching instruction to the test module, instructing the test module to sequentially connect multiple interactive paths between the host computer and multiple first interactive interfaces, so that the electronic device can sequentially report the target information to the host computer through multiple interactive paths. The host computer can output the interactive interface test results of the electronic device based on the reception of the target information. This achieves the ability to complete the testing of multiple interactive interfaces of the electronic device without manual interface switching or without the need for multiple host computers, providing a new solution for testing the interactive interfaces of electronic devices, which is lower in cost and higher in testing efficiency.

[0011] A second aspect of the embodiments of the present application provides an interface testing method, which is applied to the interface testing device provided in the first aspect. The method includes:

[0012] Sending an interface information reporting instruction to the electronic device and, in accordance with a preset port test strategy, sending a path switching instruction to the test module; wherein the interface information reporting instruction is used to instruct the electronic device to report target information through an interactive path;

[0013] sequentially conducting a plurality of interaction paths between the host computer and the plurality of first interaction interfaces according to the path switching instruction;

[0014] Based on the reception of the target information, the interactive interface test results of the electronic device are output.

[0015] It can be understood that the beneficial effects of the second aspect mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 A schematic diagram of the structure of an interface testing device provided in an embodiment of the present application;

[0017] Figure 2 A schematic structural diagram of an interface testing device provided in another embodiment of the present application;

[0018] Figure 3 A schematic diagram of the specific structure of an interface test device provided in an embodiment of the present application Figure 1 ;

[0019] Figure 4 A schematic diagram of the specific structure of an interface test device provided in an embodiment of the present application Figure 2 ;

[0020] Figure 5 A schematic diagram of the specific structure of an interface test device provided in an embodiment of the present application Figure 3 ;

[0021] Figure 6 A schematic diagram of an implementation method of the overall solution of an embodiment of the present application;

[0022] Figure 7 This is a flowchart for implementing an interface testing method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0023] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0024] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0025] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.

[0026] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.

[0027] As electronic devices become increasingly intelligent, many incorporate numerous hardware interfaces to enable configuration. These interfaces not only allow for communication with other devices but also allow for the mounting of storage resources and expansion modules. Therefore, testing electronic devices' interfaces before they leave the factory is crucial.

[0028] However, electronic devices have a large number of interactive interfaces, and existing testing solutions require manual switching between different interactive interfaces to implement interactive interface testing, or require the use of multiple test computers simultaneously to complete the test. For example, when an electronic device has a large number of interactive interfaces, if the interface testing equipment used for testing has a small number of test interfaces, the tester needs to manually switch between the test interface and the interactive interface. This not only consumes manpower, but also makes the probability of error in the testing process uncontrollable due to manual operation. It can be seen that existing interactive interface testing solutions for electronic devices have the problem of low efficiency.

[0029] To solve the above technical problems, an embodiment of the present application provides an interface testing device for testing an interactive interface of an electronic device. The interface testing device includes: a test module and a host computer. The test module is used to connect to multiple first interactive interfaces of the electronic device, and the host computer is connected to the test module. When testing the interactive interface of the electronic device, the host computer can send an interface information reporting instruction to the electronic device, and send a path switching instruction to the test module according to a preset port test strategy. Since the interface information reporting instruction is used to instruct the electronic device to report target information through an interactive path, and the test module can sequentially connect multiple interactive paths between the host computer and the multiple first interactive interfaces according to the path switching instruction, the electronic device can sequentially report target information to the host computer through the multiple interactive paths. The host computer outputs the interactive interface test results of the electronic device based on the reception of the target information. In the above solution, by connecting the multiple first interactive interfaces of the electronic device through the test module, multiple interactive paths can be formed between the host computer and the multiple first interactive interfaces, that is, multiple interactive paths can be formed between the host computer and the electronic device. The host computer sends an interface information reporting instruction to the electronic device, instructing the electronic device to report the target information through the interactive path. At the same time, the host computer sends a path switching instruction to the test module, instructing the test module to sequentially connect multiple interactive paths between the host computer and multiple first interactive interfaces, so that the electronic device can sequentially report the target information to the host computer through multiple interactive paths. The host computer can output the interactive interface test results of the electronic device based on the reception of the target information. This achieves the ability to complete the testing of multiple interactive interfaces of the electronic device without manual interface switching or without the need for multiple host computers, providing a new solution for testing the interactive interfaces of electronic devices, which is lower in cost and higher in testing efficiency.

[0030] See Figure 1 , Figure 1 The following is a schematic diagram of the structure of an interface test device provided in an embodiment of the present application. For ease of explanation, only the parts related to this embodiment are shown, which are detailed as follows:

[0031] exist Figure 1 In the embodiment, the interface testing device 100 is connected to the electronic device 110 and is used to test the interactive interface of the electronic device 110. Here, when the interactive interface of the electronic device 110 is tested, the tested interactive interface includes at least: a first interactive interface 111.

[0032] like Figure 1 As shown, the interface test device 100 includes: a test module 10 and a host computer 20. Specifically:

[0033] The testing module 10 is used to connect to a plurality of first interaction interfaces 111 of the electronic device 110 .

[0034] The host computer 20 is connected to the test module 10. The host computer 20 is configured to send an interface information reporting instruction to the electronic device 110 and, according to a preset port test strategy, send a path switching instruction to the test module 10. The interface information reporting instruction is used to instruct the electronic device 110 to report target information through the interactive path.

[0035] The test module 10 is configured to sequentially connect multiple interaction paths between the host computer 20 and the multiple first interaction interfaces 111 according to the path switching instruction.

[0036] The host computer 20 is further configured to output the interactive interface test result of the electronic device 110 based on the reception status of the target information.

[0037] In this embodiment, the test module 10 in the interface test device 100 can be configured with multiple interface units adapted to the first interactive interface 111, and can be connected to multiple first interactive interfaces 111 of the electronic device 110 through the multiple interface units. The host computer 20 and the test module 10 can be specifically connected by wired connection and / or wireless connection, which is not limited here. Here, the host computer 20 can also establish a connection with the electronic device 110 by wired and / or wireless means, and can then send an interface information reporting instruction to the electronic device 110.

[0038] It should be noted that, in a specific implementation, when the interactive interface of the electronic device 110 is tested, the interactive interface being tested may include the first interactive interface 111. Therefore, in order to ensure the stable sending of the interface information reporting instruction, a wireless method may be preferably used to establish a connection between the host computer 20 and the electronic device 110.

[0039] For example, the host computer 20 can provide a hotspot service, and the electronic device 110 is pre-configured with the hotspot information of the hotspot service. When the interface test device 100 is used to perform an interface test on the electronic device 110, the electronic device 110 can use the hotspot information to connect to the hotspot service provided by the host computer 20, thereby realizing wireless communication between the host computer 20 and the electronic device 110.

[0040] It is easy to understand that if the host computer 20 and the electronic device 110 are connected by wire, the physical communication interface of the host computer 20 can be used to connect to the communication interface of the electronic device 110. Here, the communication interface of the electronic device 110 is an interface other than the first interactive interface 111.

[0041] In all embodiments of the present application, after the test module 10 is connected to multiple first interaction interfaces 111 of the electronic device 110, only the interaction path between the host computer 20 and one first interaction interface 111 can be opened, so that the electronic device 110 can report the target information to the host computer 20 through the interaction path when responding to the interface information reporting instruction.

[0042] In this embodiment, while the host computer 20 sends the interface information reporting instruction to the electronic device 110, it also sends a path switching instruction to the test module 10 according to the preset port test strategy. The test module 10 can sequentially open multiple interaction paths between the host computer 20 and the multiple first interaction interfaces 111 according to the path switching instruction.

[0043] In a specific implementation, the preset port test strategy is used to at least indicate the conduction switching period of multiple interactive paths, that is, the conduction time interval of multiple interactive paths. Accordingly, the interface information reporting instruction sent by the host computer 20 to the electronic device 110 can include an information reporting period, and this information reporting period matches the conduction switching period. When responding to the interface information reporting instruction, the electronic device 110 reports the target information through the conductive interactive paths according to the information reporting period.

[0044] Exemplarily, the path switching instruction sent by the host computer 20 to the test module 10 according to the preset port test strategy can be an electrical signal corresponding to the conduction switching cycle. When the test module 10 responds to the path switching instruction, it can follow the conduction switching cycle carried or indicated by the path switching instruction to sequentially conduct multiple interactive paths between the host computer 20 and the multiple first interactive interfaces 111. At the same time, the electronic device 110 responds to the interface information reporting instruction, and the electronic device 110 reports the target information of its second interactive interface 112 through the conducted interactive path according to the information reporting cycle carried or indicated by the interface information reporting instruction. This ensures that when the test module 10 conducts each interactive path between the host computer 20 and the multiple first interactive interfaces 111, the electronic device 110 can report the target information through the conducted interactive path, thereby achieving testing of each first interactive interface 111 in the electronic device 110. Here, since the electronic device 110 reports the target information to the host computer 20 through the connected interactive path, the host computer 20 can determine the test result of the first interactive interface 111 based on the reception of the target information.

[0045] In a specific implementation, the target information may be preset information pre-configured in the electronic device 110, such as the serial number and MAC address of the electronic device 110. Accordingly, the interface information reporting instruction sent by the host computer 20 to the electronic device 110 may specifically be a serial number reporting instruction and a MAC address reporting instruction of the electronic device 110.

[0046] In some embodiments, the target information may also be identification information corresponding to each first interaction interface 111 in the plurality of first interaction interfaces 111, such as the serial number or sequence number of the first interaction interface 111. In this way, the host computer 20 may directly determine the test results of all first interaction interfaces 111 based on the target information.

[0047] As an embodiment, the upper computer 20 can be specifically configured to, in the process of multiple interactive paths being connected in sequence, if no target information is received, determine that the interactive interface test result of the electronic device 110 is failed; in the process of multiple interactive paths being connected in sequence, if all target information is received, determine that the interactive interface test result of the electronic device 110 is passed.

[0048] In this embodiment, if the host computer 20 does not receive the target information during the process of sequentially connecting multiple interactive pathways, it may mean that the host computer 20 does not receive the target information when only one interactive pathway is connected. If the host computer 20 receives all the target information during the process of sequentially connecting multiple interactive pathways, it may mean that the host computer 20 receives the target information when each interactive pathway is sequentially connected.

[0049] It is easy to understand that, since the electronic device 110 includes multiple first interactive interfaces 111, during the process of performing an interface test on the electronic device 110, the host computer 20 must receive the target information sent by the electronic device 110 through each first interactive interface 111 before it can determine that the interactive interface test result of the electronic device 110 is passed. Accordingly, during the process of multiple interactive paths between the host computer 20 and multiple first interactive interfaces 111 being connected in sequence, if there is a situation where the host computer 20 does not receive the target information, it means that at least one first interactive interface 111 in the electronic device 110 is unable to transmit the target information to the host computer 20, and thus the interactive interface test result of the electronic device 110 can be determined to be failed.

[0050] As an example, in a specific implementation, a stress test may be performed on the first interactive interface 111 in the electronic device 110. For example, multiple interactive paths may be repeatedly opened in sequence to perform a data transmission stability test on the first interactive interface 111 in the electronic device 110.

[0051] As another example, during specific implementation, a separate test may be performed on a first interactive interface 111 in the electronic device 110. For example, when the host computer 20 receives target information transmitted through a predetermined first interactive interface 111, it indicates that normal interaction can be performed between the first interactive interface 111 and the host computer 20, and thus the interactive interface test result of the electronic device 110 may be determined to be passed.

[0052] Figure 2 FIG. 2 is a schematic diagram showing the structure of an interface testing device provided by another embodiment of the present application. As an embodiment, the target information includes mounting information of the second interactive interface 112 of the electronic device 110 .

[0053] and Figure 1 The difference between the interface testing device 100 shown is that, in this embodiment, the host computer 20 in the interface testing device 100 is also configured to, when receiving the mounting information, compare the mounting information with the preset information, and when the mounting information is consistent with the preset information, determine that the interactive interface test result of the electronic device 110 is passed; when the mounting information is inconsistent with the preset information, determine that the interactive interface test result of the electronic device 110 is failed.

[0054] In this embodiment, when the interaction interface of the electronic device 110 is tested, the tested interaction interfaces include: a first interaction interface 111 and a second interaction interface 112. Here, the second interaction interface 112 is the interaction interface of the electronic device 110, and the second interaction interface 112 can be mounted with an external device.

[0055] It can be understood that in all embodiments of the present application, the first interactive interface 111 and the second interactive interface 112 in the electronic device 110 can specifically be at least one of a USB interface, a Type-C interface, an HDMI interface, and a UART interface.

[0056] For example, in actual applications, a storage device, such as a USB flash drive, a mobile hard disk, etc., can be mounted on the second interactive interface 112, so that the electronic device 110 can read the information or data of the storage device, and use the information or data of the storage device as the mounting information of the second interactive interface 112, and report it to the host computer 20 through the interactive path.

[0057] It should be noted that the preset information refers to reference information pre-stored in the host computer 20 for comparison with the mounted information. For example, when the mounted information is information or data of a storage device, the preset information may also be information or data of the storage device.

[0058] It is understandable that when the host computer 20 receives the mounting information, it indicates that the interactive function of the first interactive interface 111 of the electronic device 110 is good. By comparing the mounting information with the preset information, if the mounting information is consistent with the preset information, it can be determined that the second interactive interface 112 can read the mounted device information, and then it can be determined that the interactive interface test result of the electronic device 110 is passed. When the host computer 20 determines that the mounting information is inconsistent with the preset information, it can be determined that the second interactive interface 112 cannot read the mounted device information or reads incorrectly, and then it can be determined that the interactive interface test result of the electronic device 110 is failed.

[0059] Figure 3 The specific structure of an interface test device provided in an embodiment of the present application is shown Figure 1 .like Figure 3 As shown, as an embodiment, the test module 10 is configured with multiple interface units 101 and switch units 102. Specifically:

[0060] The plurality of interface units 101 are connected to the plurality of first interaction interfaces 111 in a one-to-one correspondence. The switch unit 102 is configured with a fixed terminal 1021 and a plurality of selection terminals 1022. The fixed terminal 1021 is connected to the host computer 20. The plurality of selection terminals 1022 are connected to the plurality of interface units 101 in a one-to-one correspondence.

[0061] In this embodiment, the switch unit 102 in the test module 10 is controlled by the host computer 20. Since the multiple interface units 101 are connected to the multiple first interactive interfaces 111 in a one-to-one correspondence, and the multiple selection terminals 1022 of the switch unit 102 are connected to the multiple interface units 101 in a one-to-one correspondence, after the host computer 20 sends a path switching instruction to the test module 10, the switch unit 102 responds to the path switching instruction and sequentially connects the paths between the fixed terminal 1021 and the multiple interface units 101, thereby sequentially connecting the multiple interactive paths between the host computer 20 and the multiple first interactive interfaces 111.

[0062] In a specific implementation, the switch unit 102 may be a switching chip, or a switching circuit composed of multiple switching tubes, or a single-pole multi-throw electronically controlled switch, which is not limited here.

[0063] Figure 4 The specific structure of an interface test device provided in an embodiment of the present application is shown Figure 2 .like Figure 4 As shown, as an embodiment, the test module 10 is further configured with a communication interface 103 .

[0064] The communication interface 103 is connected to the fixed end 1021 , and the communication interface 103 is used to connect to the host computer 20 .

[0065] In this embodiment, the communication interface 103 can serve as an external port of the test module 10 for connecting to the host computer 20 .

[0066] Here, the test module 10 can specifically be a modular port module. By providing a communication interface 103 on the test module 10, the test module 10 and the host computer 20 can be more easily replaced with each other. By configuring the communication interface 103 on the test module 10, the test module 10 can be connected to a host computer 20 with different functions, or a test module 10 with different functions can be replaced for the host computer 20, which can meet the different configuration requirements of the interface test device 100, that is, provide a basis for the flexible configuration of the interface test device 100.

[0067] Figure 5 The specific structure of an interface test device provided in an embodiment of the present application is shown Figure 3 .like Figure 5 As shown, as an embodiment, the test module 10 is further configured with a control unit 104 .

[0068] The control unit 104 is configured to control the fixed terminal 1021 and the plurality of selection terminals 1022 of the switch unit 102 to be turned on in sequence according to the path switching instruction.

[0069] In this embodiment, the control unit 104 is configured to respond to a path switching instruction and control the fixed terminal 1021 and the plurality of selection terminals 1022 of the switch unit 102 to be turned on in sequence.

[0070] like Figure 5 As shown, the test module 10 is connected to the host computer 20 via the communication interface 103. The host computer 20 sends a path switching instruction to the control unit 104 via the communication interface 103. Based on the path switching instruction, the control unit 104 controls the fixed end 1021 and the multiple selection ends 1022 of the switch unit 102 to be connected in sequence, thereby sequentially connecting multiple interaction paths between the host computer 20 and the multiple first interaction interfaces 111. When the electronic device 110 reports target information through the interaction path, it can be transmitted to the host computer 20 via the communication interface 103 of the test module 10.

[0071] The above scheme, by connecting the multiple first interactive interfaces of the electronic device through the test module, can form multiple interactive paths between the host computer and the multiple first interactive interfaces, that is, multiple interactive paths are formed between the host computer and the electronic device. The host computer sends an interface information reporting instruction to the electronic device, instructing the electronic device to report the target information through the interactive path. At the same time, the host computer sends a path switching instruction to the test module, instructing the test module to sequentially connect the multiple interactive paths between the host computer and the multiple first interactive interfaces, so that the electronic device can sequentially report the target information to the host computer through the multiple interactive paths. The host computer can output the interactive interface test results of the electronic device based on the reception of the target information. It is achieved that the test of multiple interactive interfaces of the electronic device can be completed without manual interface switching or without multiple host computers, providing a new solution for testing the interactive interface of the electronic device, which is lower in cost and higher in testing efficiency.

[0072] For example, Figure 6 A schematic diagram of an implementation method of the overall solution of the embodiment of the present application is shown. Figure 6 In the example, the electronic device is an interactive flat panel 110A. The first interactive interface of the interactive flat panel 110A includes: interface HDMI1 / TOUCH1, interface HDMI2 / TOUCH2 and interface HDMI3 / TOUCH3. The second interactive interface includes: interface USB-A1 and interface USB-A2. Figure 6 As shown, the interface unit in the test module 10 may include a USB1 interface, a USB2 interface, and a USB3 interface. Correspondingly, the switch unit may include a USB switch. The communication interface may include a HUB communication interface.

[0073] exist Figure 6 In the embodiment, the interface testing device 100 is used to perform an interactive interface test on the interactive flat panel 110A. Specifically, the first interactive interface of the interactive flat panel 110A is connected to the interface unit in the test module 10. Specifically, the HDMI1 / TOUCH1 interface, the HDMI2 / TOUCH2 interface, and the HDMI3 / TOUCH3 interface of the interactive flat panel 110A are connected to the USB1 interface, the USB2 interface, and the USB3 interface, respectively.

[0074] exist Figure 6In the example shown, the host computer 20 sends an interface information reporting instruction to the interactive flat panel 110A via the UART port. Simultaneously, the host computer 20 generates a path switching instruction according to a preset port test strategy and sends the path switching instruction to the test module 10 via the HUB communication port. The HUB communication port then transmits the path switching instruction to the MCU via the UART connection. Alternatively, the host computer 20 directly sends the path switching instruction to the MCU via the UART connection. Here, the MCU sequentially connects multiple interactive paths between the host computer 20 and the HDMI1 / TOUCH1 interface, the HDMI2 / TOUCH2 interface, and the HDMI3 / TOUCH3 interface, respectively, based on the path switching instruction.

[0075] Specifically, the host computer 20 sends a path switching instruction to the MCU via the USB or UART serial port, instructing the MCU to control the USB switch to switch to the first path via the GPIO port connection. The first path refers to the path consisting of the HDMI1 / TOUCH1 interface of the interactive flat panel 110A, the USB1 interface of the test module 10, the USB switch, the HUB communication interface, and the host computer 20. The host computer 20 also sends an interface information reporting instruction to the interactive flat panel 110A via the UART serial port, instructing the interactive flat panel 110A to report target information via the interactive path. Specifically, the target information is the mounting status of the USB-A1 interface and the USB-A2 interface, and is reported to the host computer 20 via the HDMI1 / TOUCH1 interface. Based on the mounting status of the USB-A1 interface and the USB-A2 interface, the host computer 20 outputs the test results of the interactive flat panel 110A's interactive interface, namely, the test results of the HDMI1 / TOUCH12 interface and / or the USB-A1 interface and the USB-A2 interface.

[0076] For example, during the test, it is assumed that both the USB-A1 and USB-A2 interfaces are mounted with a USB flash drive. When the host computer 20 outputs the interactive interface test result of the interactive flat panel 110A based on the mounting status of the USB-A1 and USB-A2 interfaces, if it is determined that both the USB-A1 and USB-A2 interfaces are mounted with a USB flash drive, the test result is passed. If it is determined that at least one of the USB-A1 and USB-A2 interfaces is not mounted with a USB flash drive, the test result is failed.

[0077] It is easy to understand that after the host computer 20 notifies the MCU to control the USB switch to switch to the first path and the host computer 20 outputs the test results of the first path, the MCU controls the USB switch to switch to the second path. Here, similar to the first path, the second path refers to the path composed of the HDMI2 / TOUCH2 interface of the interactive flat panel 110A, the USB2 interface of the test module 10, the USB switch, the HUB communication interface, and the host computer 20. The host computer 20 receives the mounting status of the USB-A1 interface and the USB-A2 interface through this second path and outputs the test results of the interactive interface of the interactive flat panel 110A, that is, the test results of the HDMI2 / TOUCH2 interface and / or the USB-A1 interface and the USB-A2 interface.

[0078] Similarly, after the host computer 20 notifies the MCU to control the USB switch to switch to the second path, and the host computer 20 outputs the test results of the second path, the MCU controls the USB switch to switch to the third path. Here, similar to the first and second paths, the third path refers to the path consisting of the HDMI3 / TOUCH3 interface of the interactive flat panel 110A, the USB3 interface of the test module 10, the USB switch, the HUB communication interface, and the host computer 20. The host computer 20 receives the mounting status of the USB-A1 interface and the USB-A2 interface through this third path and outputs the test results of the interactive interface of the interactive flat panel 110A, that is, the test results of the HDMI3 / TOUCH3 interface and / or the USB-A1 interface and the USB-A2 interface.

[0079] Figure 7 The interface testing method provided in this embodiment is applied to the interface testing device 100 in any of the above embodiments. Figure 7 As shown, the interface testing method specifically includes the following steps:

[0080] S701: Send an interface information reporting instruction to the electronic device, and send a path switching instruction to the test module according to a preset port test strategy; wherein the interface information reporting instruction is used to instruct the electronic device to report target information through an interactive path.

[0081] S702: sequentially opening multiple interaction paths between the host computer and the multiple first interaction interfaces according to the path switching instruction;

[0082] S703: Outputting the interactive interface test result of the electronic device based on the reception status of the target information.

[0083] As an embodiment, step S703 may specifically include:

[0084] When the target information is not received, the interactive interface test result of the electronic device is determined to be failed; when the target information is received, the interactive interface test result of the electronic device is determined to be passed.

[0085] As an embodiment, the target information includes mounting information of the second interactive interface of the electronic device. Step S703 may specifically include:

[0086] When the mounting information is received, the mounting information is compared with the preset information. If the mounting information is consistent with the preset information, the electronic device's interactive interface test result is determined to be passed. If the mounting information is inconsistent with the preset information, the electronic device's interactive interface test result is determined to be failed.

[0087] As an embodiment, when it is determined that the interactive interface test result of the electronic device fails, the method may further include the following steps:

[0088] Return to the step of sending an interface information reporting instruction to the electronic device, and sending a path switching instruction to the test module according to the preset port test strategy.

[0089] Here, when it is determined that the interactive interface test result of the electronic device fails, the process returns to step S701, so that the interactive interface test of the electronic device can be automatically looped. Of course, in a specific implementation, the number of times the process returns to step S701 can be set. For example, when the number of times the process returns to step S701 reaches a preset threshold, the process stops returning to step S701.

[0090] It is understandable that in Figure 7 In the embodiment shown, due to the improvements and specific implementation methods related to this application, Figures 1 to 6 The corresponding embodiment is described in detail. In the specific implementation, Figures 1 to 6 The contents of the corresponding embodiments are combined with Figure 7 The embodiments of the present invention are used to implement the technical solution of the present application, so they will not be described in detail here.

[0091] Those skilled in the art will clearly understand that for the sake of convenience and brevity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0092] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. An interface testing device, characterized in that: Used to test the interactive interface of an electronic device, the interface testing device includes: A test module, configured to connect to a plurality of first interaction interfaces of the electronic device; A host computer connected to the test module; the host computer is configured to send an interface information reporting instruction to the electronic device and send a path switching instruction to the test module according to a preset port test strategy; wherein the interface information reporting instruction is used to instruct the electronic device to report target information through an interactive path; The test module is configured to sequentially connect multiple interaction paths between the host computer and the multiple first interaction interfaces according to the path switching instruction; The host computer is further configured to output an interactive interface test result of the electronic device based on the reception status of the target information.

2. The interface testing device according to claim 1, wherein: The test module is configured with a plurality of interface units and switch units; The multiple interface units are configured to be connected to the multiple first interaction interfaces in a one-to-one correspondence; The switch unit is configured with a fixed terminal and a plurality of selection terminals; The fixed end is used to connect to the host computer; The multiple selection terminals are used for one-to-one connection with the multiple interface units.

3. The interface testing device according to claim 1 or 2, characterized in that: The test module is further configured with a communication interface; The communication interface is connected to the fixed end, and the communication interface is used to connect to the host computer.

4. The interface testing device according to claim 3, wherein: The test module is further configured with a control unit; The control unit is configured to control the fixed end and the plurality of selection ends of the switch unit to be turned on in sequence according to the path switching instruction.

5. The interface testing device according to claim 1, wherein: The host computer is specifically configured to, during the process of the multiple interactive paths being sequentially connected, if the target information is not received, determine that the interactive interface test result of the electronic device is failed; during the process of the multiple interactive paths being sequentially connected, if all the target information is received, determine that the interactive interface test result of the electronic device is passed.

6. The interface testing device according to claim 1, wherein: The target information includes mounting information of the second interactive interface of the electronic device; The host computer is also configured to, upon receiving the mounting information, compare the mounting information with the preset information, and determine that the test result of the interactive interface of the electronic device is passed when the mounting information is consistent with the preset information; and determine that the test result of the interactive interface of the electronic device is failed when the mounting information is inconsistent with the preset information.

7. An interface testing method, characterized in that: Applied to the interface testing device according to claim 1, the method comprises: Sending an interface information reporting instruction to the electronic device, and sending a path switching instruction to the test module according to a preset port test strategy; wherein the interface information reporting instruction is used to instruct the electronic device to report the target information of its second interactive interface through the interactive path; sequentially conducting a plurality of interaction paths between the host computer and the plurality of first interaction interfaces according to the path switching instruction; Based on the reception of the target information, an interactive interface test result of the electronic device is output.

8. The interface testing method according to claim 7, wherein: The step of outputting a test result of an interactive interface of the electronic device based on a reception condition of the target information includes: When the target information is not received, determining that the interactive interface test result of the electronic device is failed; When the target information is received, it is determined that the interactive interface test result of the electronic device is passed.

9. The interface testing method according to claim 7, wherein: The target information includes mounting information of the second interactive interface of the electronic device; The step of outputting a test result of an interactive interface of the electronic device based on a reception condition of the target information includes: When receiving the mounting information, comparing the mounting information with preset information; When the mounting information is consistent with the preset information, determining that a test result of the interactive interface of the electronic device is passed; When the mounting information is inconsistent with the preset information, it is determined that the interactive interface test result of the electronic device is failed.

10. The interface testing method according to claim 9, wherein: When it is determined that the interactive interface test result of the electronic device is passed, the method further includes: Return to the step of sending an interface information reporting instruction to the electronic device, and sending a path switching instruction to the test module according to a preset port test strategy.

Images