A test apparatus and method for the combined effects of lightning and HIRF systems.

Abstract

This invention relates to the field of electromagnetic environment effect testing technology, and discloses a lightning and HIRF system-level integrated effect testing device and method. The lightning and HIRF system-level integrated effect testing device includes: an anechoic chamber, an EUT measuring instrument, a line impedance stabilization network, a transient signal generator, an oscilloscope, a lightning injection probe, a lightning current monitoring probe, a lightning voltage detection loop, a radiation signal generator, a radio frequency amplifier, a receiver, a near-end of a photoelectric converter, a synchronization position adjustment component, a far-end of the photoelectric converter, an antenna, and an electric field sensor. This invention can support system-level lightning and HIRF integrated effect testing under different polarization modes, irradiation angles, and various lightning waveforms. It can solve the problem of unknown integrated lightning and HIRF protection performance of aircraft electronic and electrical systems, and can reduce potential hazards to safe flight of aircraft in lightning and HIRF environments. Furthermore, the synchronization position adjustment component enables synchronous adjustment of the transmitting antenna and the electric field sensor.

Description

Technical Field

[0001] This invention relates to the field of electromagnetic environment effect testing technology, and more specifically, to a testing device and method for the combined effects of lightning and HIRF systems. Background Technology

[0002] With the rapid development of avionics technology, the sensitivity of aircraft electronic and electrical systems to the electromagnetic environment is increasing. Lightning and high-frequency electromagnetic radiation (HIRF) are the main strong electromagnetic environments encountered by aircraft during flight, posing a serious threat to the performance and safety of aircraft electronic and electrical systems. Currently, there is limited research on the combined effects of lightning and HIRF both domestically and internationally, and a lack of testing methods for the combined protection performance against lightning and HIRF is also lacking. Therefore, it is particularly important to construct a system-level test device for the combined effects of lightning and HIRF, and to propose a new testing method for the combined effects to support the evaluation of the combined protection performance against lightning and HIRF.

[0003] Currently, patents related to the indirect effects of lightning and HIRF mainly focus on individual tests of lightning or HIRF, with fewer focusing on comprehensive test methods.

[0004] For example, patent applications such as "An experimental device and method for testing the indirect effects of lightning and HIRF conduction sensitivity of aircraft" (Patent Publication No.: CN119165283A) and "A comprehensive experimental device and method for testing the indirect effects of lightning and HIRF radiation sensitivity of a system" (Patent Publication No.: CN119024087A) demonstrate that the second patent is based on a reverberation chamber environment. However, due to the randomness of polarization direction and the isotropic nature of irradiation angle in the HIRF environment of the reverberation chamber, this method cannot accurately analyze and evaluate the comprehensive effects of lightning and HIRF on equipment and systems under different polarization directions and irradiation angles. Furthermore, the high field strength within the reverberation chamber significantly impacts the testing equipment for the indirect effects of lightning. This equipment must be placed outside the reverberation chamber and requires long cables for lightning signal injection, making it difficult to achieve narrow pulses with fast rising edges, resulting in limited waveform limitations in the lightning indirect effect test. Summary of the Invention

[0005] The purpose of this invention is to provide a test apparatus and method for the combined effects of lightning and HIRF systems in order to solve the above-mentioned problems.

[0006] This invention provides a test apparatus for the combined system-level effects of lightning and HIRF, comprising:

[0007] An anechoic chamber, used to provide a HIRF radiation susceptibility testing environment for the tested electronic and electrical systems;

[0008] The test monitoring module includes an EUT measuring instrument and a line impedance stabilization network located in an anechoic chamber. Both the EUT measuring instrument and the line impedance stabilization network are electrically connected to the test cable on the tested electronic and electrical system.

[0009] The lightning indirect effect test module includes a transient signal generator, an oscilloscope, a lightning injection probe, a lightning current monitoring probe, and a lightning voltage detection loop, all located in an anechoic chamber. The lightning injection probe and the lightning current monitoring probe are sequentially mounted on the cable under test.

[0010] The HIRF sensitivity testing module includes a radiation signal generator, an RF amplifier, a receiver, a near end of a photoelectric converter located outside the anechoic chamber, a synchronization position adjustment component located inside the anechoic chamber, a far end of the photoelectric converter, and an antenna and an electric field sensor located on the synchronization position adjustment component. The synchronization position adjustment component is used to adjust the three-dimensional coordinate data of the antenna inside the anechoic chamber and drive the electric field sensor to move synchronously with the antenna.

[0011] The integrated control terminal, the test monitoring module, the lightning indirect effect test module, and the HIRF sensitivity test module are all electrically connected to the integrated control terminal.

[0012] As a further optimization of the present invention, the antenna, the radio frequency amplifier and the radiation signal generator are electrically connected in sequence, and the radiation signal generator is used to output a set HIRF radiation sensitivity test signal to the radio frequency amplifier;

[0013] The radio frequency amplifier is used to amplify the input HIRF radiation susceptibility test signal and transmit it to the antenna;

[0014] The antenna is used to radiate electromagnetic energy to the tested electronic and electrical system.

[0015] As a further optimization of the present invention, the electric field sensor is electrically connected to the far end of the photoelectric converter and the near end of the photoelectric converter and the receiver. The far end of the photoelectric converter and the near end of the photoelectric converter are connected by optical fiber. The electric field sensor is used to measure the field strength data at a set location near the tested electronic and electrical system.

[0016] The remote end of the photoelectric converter is used to convert electrical signals into optical signals;

[0017] The near end of the photoelectric converter is used to convert optical signals into electrical signals;

[0018] The receiver is used to measure the calibration field strength data received from the electric field sensor and the field strength data monitored during the experiment.

[0019] As a further optimization of the present invention, the lightning injection probe is electrically connected to the transient signal generator, and the lightning current monitoring probe and the lightning voltage detection loop are both electrically connected to the oscilloscope.

[0020] The lightning voltage detection ring is used to detect the lightning voltage injection signal in the cable under test.

[0021] The transient signal generator is used to generate a set test level and adjust the waveform parameters of the test level;

[0022] The lightning injection probe is used to couple and inject the test level into the cable under test;

[0023] The lightning current monitoring probe is used to monitor the lightning current injection signal in the cable under test.

[0024] As a further optimization of the present invention, the synchronous position adjustment assembly includes a support group, a motor 1 fixedly connected to the support group, a lead screw 1 and a limiting slide rod symmetrically and movably connected to the support group, a limiting slide rail connected between the lead screw 1 and the limiting slide rod, a motor 2 fixedly connected to the limiting slide rail, a lead screw 2 movably connected to the limiting slide rail, a limiting slide block slidably connected to the limiting slide rail, a motor 3 and a limiting post fixedly connected to the limiting slide block, a lead screw 3 movably connected to the limiting slide block, a sliding support plate slidably connected to the limiting post, a fixed support rod fixedly connected to the sliding support plate, and a fixed support plate fixedly connected to the other end of the fixed support rod. The lead screw 1, lead screw 2, and lead screw 3 are respectively connected to the output shaft ends of the motor 1, motor 2, and motor 3. The limiting slide rail, the limiting slide block, and the sliding support plate are respectively threadedly connected to the lead screw 1, lead screw 2, and lead screw 3. The electric field sensor is connected to the fixed support plate, and the fixed support plate is provided with an adapter hole for the limiting post and lead screw 3 to pass through.

[0025] As a further optimization of the present invention, an irradiation angle adjustment mechanism is connected between the sliding support plate and the antenna, and the irradiation angle adjustment mechanism is used to adjust the irradiation angle of the antenna.

[0026] As a further optimization of the present invention, the irradiation angle adjustment mechanism includes a rotating shaft movably connected to a sliding support plate, a gear ring fixedly connected to the outer wall of the rotating shaft, a motor four fixedly connected to the sliding support plate, a gear connected to the output shaft end of the motor four, a gear fixedly connected to the rotating shaft, a motor five fixedly connected to a hinge frame, and a hinge plate hinged to the hinge frame. The hinge plate is fixedly connected to the antenna, the gear ring meshes with the gear, and the output shaft end of the motor five is fixedly connected to the hinge plate.

[0027] As a further optimization of the present invention, a telescopic isolation mechanism is connected between the sliding support plate and the limiting slide, between the motor and the anechoic chamber, between the antenna and the anechoic chamber, and between the electric field sensor and the far end of the photoelectric converter. The telescopic isolation mechanism includes a telescopic isolation sleeve and a through hole communicating with the internal space of the telescopic isolation sleeve. The through hole is provided on the limiting slide, the anechoic chamber, or the far end of the photoelectric converter.

[0028] As a further optimization of the present invention, a pressure regulating mechanism is connected between the motor three and the anechoic chamber. The pressure regulating mechanism includes a telescopic isolation sleeve two, a plurality of air holes one provided on the telescopic isolation sleeve two, a plurality of air holes two provided on the telescopic isolation sleeve one, and an air pressure regulator located outside the anechoic chamber. The air holes one and two do not overlap. The telescopic isolation sleeve one, the telescopic isolation sleeve two, and the inner wall of the anechoic chamber are all provided with wave-absorbing material. The telescopic isolation sleeve two is fitted outside the telescopic isolation sleeve one. The air pressure regulator is used to obtain and regulate the air pressure parameters inside the anechoic chamber.

[0029] A method for testing the combined effects of lightning and HIRF systems, employing the aforementioned testing apparatus, includes the following steps:

[0030] Step S1: Construct an anechoic chamber, a test monitoring module, a lightning indirect effect testing module, and a HIRF sensitivity testing module;

[0031] Step S2: Perform HIRF radiation susceptibility test field strength calibration in the range of 100MHz to 18GHz, calibrate the transient signal generator at the specified test level, and record the voltage waveform when the calibration loop is open and the current waveform when it is short-circuited.

[0032] Step S3: Power on the tested electronic and electrical system, select the working mode, and maintain the tested electronic and electrical system into a stable working state;

[0033] Step S4: For the tested electronic and electrical system that cannot be fully covered by the overall HIRF irradiation, calculate the 3dB beamwidth of the antenna based on the size of the tested electronic and electrical system and the HIRF test distance, calculate the displacement step of the antenna based on the 3dB beamwidth of the antenna, use single antenna equivalent test, and control the single displacement of the antenna to not exceed 3dB beamwidth through the synchronous position adjustment component.

[0034] Step S5: Set the frequency, polarization mode, and irradiation angle of the HIRF radiation sensitivity test and start the test. At the same time, start the transient signal generator and inject the lightning test level into the cable under test during the dwell time of each HIRF test frequency.

[0035] For a single bounce test, at least ten transient signals are applied, and the longest interval between the applied single bounce transient signals is no more than one minute.

[0036] For multiple-hit tests, at least ten multiple-hit transient signals shall be applied, and the longest interval between the applied multiple-hit transient signals shall not exceed five minutes.

[0037] For the multiple pulse group test, a multiple pulse group is applied every three seconds for at least five minutes.

[0038] Step S6: Change the output polarity of the transient signal generator and repeat step S5;

[0039] Step S7: Repeat steps S5 to S6 for each cable under test;

[0040] Step S8: Adjust the position of the antenna, and move the electric field sensor in the same way. Repeat steps S4 to S7.

[0041] Step S9: Change the antenna's illumination angle and repeat steps S4 to S8;

[0042] Step S10: Change the polarization of the antenna, and repeat steps S4 to S9;

[0043] Step S11: Change the frequency of the HIRF sensitivity test, and repeat steps S3 to S10 until the termination frequency of the HIRF test is reached.

[0044] Step S12: Change the operating mode of the tested electronic and electrical system, and repeat steps S3 to S11 until all operating modes of the tested electronic and electrical system are reached.

[0045] The beneficial effects of this invention are as follows: This invention can support the testing of system-level lightning and HIRF combined effects under different polarization modes, irradiation angles and various lightning waveforms, solve the problem of unknown comprehensive protection performance of aircraft electronic and electrical systems against lightning and HIRF, reduce potential hazards to safe flight of aircraft under lightning and HIRF environments, and achieve synchronous adjustment of transmitting antenna and electric field sensor through synchronous position adjustment component. Attached Figure Description

[0046] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0047] Figure 2 This is the invention Figure 1 A partial sectional view;

[0048] Figure 3 This is a flowchart of the test method for the combined effects of lightning and HIRF systems according to the present invention.

[0049] Figure 4 This is a schematic diagram of the synchronous position adjustment component of the present invention;

[0050] Figure 5 This is the invention Figure 2 An enlarged view of point A in the image;

[0051] Figure 6 This is the invention Figure 2 An enlarged view of point B in the image;

[0052] Figure 7 This is the invention Figure 4 A magnified view of point C in the image.

[0053] In the diagram: 1. Anechoic chamber; 21. Radiation signal generator; 22. RF amplifier; 23. Antenna; 24. Synchronization position adjustment assembly; 2401. Support assembly; 2402. Motor 1; 2403. Lead screw 1; 2404. Limiting slide bar; 2405. Limiting slide rail; 2406. Motor 2; 2407. Lead screw 2; 2408. Limiting slide block; 2409. Motor 3; 2410. Limiting post; 2411. Lead screw 3; 2412. Sliding support plate; 2413. Fixed support rod; 2414. Fixed support plate; 25. Receiver; 26. Near end of photoelectric converter; 27. Photoelectric converter 28. Electric field sensor; 31. Transient signal generator; 32. Oscilloscope; 33. Lightning injection probe; 34. Lightning current monitoring probe; 35. Lightning voltage detection ring; 41. EUT measuring instrument; 42. Line impedance stabilization network; 5. Telescopic isolation mechanism; 501. Perforation; 502. Telescopic isolation sleeve one; 6. Pressure adjustment mechanism; 601. Telescopic isolation sleeve two; 602. Air hole one; 7. Irradiation angle adjustment mechanism; 701. Rotating shaft; 702. Gear ring; 703. Motor four; 704. Gear; 705. Hinge frame; 706. Motor five; 707. Hinge plate. Detailed Implementation

[0054] The subject matter described herein will now be discussed with reference to exemplary embodiments. It should be understood that these embodiments are discussed merely to enable those skilled in the art to better understand and implement the subject matter described herein. Furthermore, features described in some examples may be combined in other examples.

[0055] like Figure 1 and Figure 2 As shown, a test device for the integrated effects of lightning and HIRF systems includes:

[0056] Anechoic chamber 1 is used to provide a HIRF radiation susceptibility testing environment for the tested electronic and electrical systems.

[0057] The test monitoring module includes an EUT measuring instrument 41 and a line impedance stabilization network 42 located in an anechoic chamber 1. Both the EUT measuring instrument 41 and the line impedance stabilization network 42 are electrically connected to the test cable on the tested electronic and electrical system.

[0058] The lightning indirect effect test module includes a transient signal generator 31, an oscilloscope 32, a lightning injection probe 33, a lightning current monitoring probe 34, and a lightning voltage detection ring 35, all located in an anechoic chamber 1. The lightning injection probe 33 and the lightning current monitoring probe 34 are sequentially mounted on the cable under test.

[0059] The HIRF sensitivity testing module includes a radiation signal generator 21, an RF amplifier 22, a receiver 25, a near end of a photoelectric converter 26 located outside the anechoic chamber 1, a synchronization position adjustment component 24, a far end of a photoelectric converter 27 located inside the anechoic chamber 1, an antenna 23 and an electric field sensor 28 located on the synchronization position adjustment component 24. The synchronization position adjustment component 24 is used to adjust the three-dimensional coordinate data of the antenna 23 inside the anechoic chamber 1 and drive the electric field sensor 28 to move synchronously with the antenna 23.

[0060] The integrated control terminal, the test monitoring module, the lightning indirect effect test module, and the HIRF sensitivity test module are all electrically connected to the integrated control terminal.

[0061] Antenna 23, RF amplifier 22 and radiation signal generator 21 are electrically connected in sequence. Radiation signal generator 21 is used to output the set HIRF radiation sensitivity test signal to RF amplifier 22.

[0062] The radio frequency amplifier 22 is used to amplify the input HIRF radiation susceptibility test signal and transmit it to the antenna 23;

[0063] Antenna 23 is used to radiate electromagnetic energy to the tested electronic and electrical system.

[0064] The electric field sensor 28 is electrically connected to the far end 27 and the near end 26 of the photoelectric converter and the receiver 25. The far end 27 and the near end 26 of the photoelectric converter are connected by optical fiber. The electric field sensor 28 is used to measure the field strength data at a set location near the tested electronic and electrical system.

[0065] The remote end 27 of the photoelectric converter is used to convert electrical signals into optical signals;

[0066] The near end 26 of the photoelectric converter is used to convert optical signals into electrical signals;

[0067] The receiver 25 is used to measure the calibration field strength data received by the electric field sensor 28 and the field strength data monitored during the test.

[0068] The lightning injection probe 33 is electrically connected to the transient signal generator 31, and the lightning current monitoring probe 34 and the lightning voltage detection ring 35 are both electrically connected to the oscilloscope 32.

[0069] Lightning voltage detection ring 35 is used to detect lightning voltage injection signals in the cable under test;

[0070] The transient signal generator 31 is used to generate the set test level and adjust the waveform parameters of the test level;

[0071] The lightning injection probe 33 is used to couple and inject the test level into the cable under test;

[0072] The lightning current monitoring probe 34 is used to monitor the lightning current injection signal in the cable under test.

[0073] It should be noted that, as Figure 3 As shown, the specific steps included in the combined lightning and HIRF system-level effects test on the tested electronic and electrical system are as follows:

[0074] Step S1: Construct an anechoic chamber 1, a test monitoring module, a lightning indirect effect testing module, and a HIRF sensitivity testing module;

[0075] Step S2: Perform HIRF radiation susceptibility test field strength calibration in the range of 100MHz to 18GHz, calibrate the transient signal generator 31 at the specified test level, and record the voltage waveform when the calibration loop is open and the current waveform when it is short-circuited.

[0076] Step S3: Power on the tested electronic and electrical system, select the working mode, and maintain the tested electronic and electrical system into a stable working state;

[0077] Step S4: For the tested electronic and electrical system that cannot be fully covered by the overall HIRF irradiation, calculate the 3dB beamwidth of the antenna 23 based on the size of the tested electronic and electrical system and the HIRF test distance, calculate the displacement step of the antenna 23 based on the 3dB beamwidth of the antenna 23, use single antenna 23 equivalent test, and control the single displacement of the antenna 23 to not exceed the 3dB beamwidth through the synchronous position adjustment component 24.

[0078] Step S5: Set the frequency, polarization mode, and irradiation angle of the HIRF radiation sensitivity test and start the test. At the same time, start the transient signal generator 31 and inject the lightning test level into the cable under test during the dwell time of each HIRF test frequency.

[0079] For a single bounce test, at least ten transient signals are applied, and the longest interval between the applied single bounce transient signals is no more than one minute.

[0080] For multiple-hit tests, at least ten multiple-hit transient signals shall be applied, and the longest interval between the applied multiple-hit transient signals shall not exceed five minutes.

[0081] For the multiple pulse group test, a multiple pulse group is applied every three seconds for at least five minutes.

[0082] Step S6: Change the output polarity of transient signal generator 31, and repeat step S5;

[0083] Step S7: Repeat steps S5 to S6 for each cable under test;

[0084] Step S8: Adjust the position of antenna 23, and move electric field sensor 28 in the same way. Repeat steps S4 to S7.

[0085] Step S9: Change the illumination angle of antenna 23, and repeat steps S4 to S8;

[0086] Step S10: Change the polarization of antenna 23, and repeat steps S4 to S9;

[0087] Step S11: Change the frequency of the HIRF sensitivity test, and repeat steps S3 to S10 until the termination frequency of the HIRF test is reached.

[0088] Step S12: Change the operating mode of the tested electronic and electrical system, and repeat steps S3 to S11 until all operating modes of the tested electronic and electrical system are reached; thereby completing the comprehensive lightning and HIRF protection performance evaluation of the electronic and electrical system. The lightning and HIRF comprehensive effect test device constructed based on an anechoic chamber environment can solve the problem that existing lightning and HIRF comprehensive effect test devices cannot accurately analyze and evaluate equipment and systems under different polarization directions and different irradiation angles due to the randomness of polarization direction and the isotropic nature of irradiation angle in the reverberation chamber HIRF environment. This invention addresses issues such as the combined effects of lightning and HIRF and the limitations of lightning test waveforms. Furthermore, through the synchronous position adjustment component 24, the antenna 23 and the electric field sensor 28 can be synchronously adjusted in three-dimensional space (up / down, left / right, and forward / backward). It has good compatibility and is simple to implement in engineering. It can support system-level tests of the combined effects of lightning and HIRF under different polarization modes, irradiation angles, and various lightning waveforms. It can solve the problem of unknown combined lightning and HIRF protection performance of aircraft electronic and electrical systems and reduce potential hazards to safe flight of aircraft in lightning and HIRF environments.

[0089] In an optional embodiment of the invention, such as Figure 4 and Figure 7As shown, the synchronous position adjustment assembly 24 includes a support group 2401, a motor 2402 fixedly connected to the support group 2401, a lead screw 2403 and a limiting slide rod 2404 symmetrically and movably connected to the support group 2401, a limiting slide rail 2405 connected between the lead screw 2403 and the limiting slide rod 2404, a motor 2406 fixedly connected to the limiting slide rail 2405, a lead screw 2407 movably connected to the limiting slide rail 2405, a limiting slide block 2408 slidably connected to the limiting slide rail 2405, a motor 2409 fixedly connected to the limiting slide block 2408 and a limiting post 2410, a lead screw 2411 movably connected to the limiting slide block 2408, and a slidably connected... The sliding support plate 2412 on the limiting post 2410, the fixed support rod 2413 fixedly connected to the sliding support plate 2412, and the fixed support plate 2414 fixedly connected to the other end of the fixed support rod 2413, the lead screw 1 2403, lead screw 2407, and lead screw 3 2411 are respectively connected to the output shaft ends of motor 1 2402, motor 2406, and motor 3 2409, the limiting slide rail 2405, the limiting slide block 2408, and the sliding support plate 2412 are respectively threaded to lead screw 1 2403, lead screw 2407, and lead screw 3 2411, the electric field sensor 28 is connected to the fixed support plate 2414, and the fixed support plate 2414 is provided with an adapter hole for the limiting post 2410 and lead screw 3 2411 to pass through.

[0090] It should be noted that, as described above, when adjusting the positions of antenna 23 and electric field sensor 28 within the anechoic chamber 1 using the synchronous position adjustment component 24, motor 1 2402 can drive lead screw 1 2403 to rotate. One end of the limiting slide rail 2405 is threadedly connected to lead screw 1 2403, and the other end is slidably connected to limiting slide rod 2404. Therefore, when lead screw 1 2403 rotates, the limiting slide rail 2405, whose movement direction is restricted, can only move along the X-axis under the drive of lead screw 1 2403. When the limiting slide rail 2405 moves, it can drive motor 22 2406, lead screw 22 2407, limiting slide block 2408, motor 3 2409, limiting post 2410, lead screw 3 2411, sliding support plate 2412, fixed support rod 2413, and fixed support plate 2414 connected to it to move in the same direction and at the same distance, thereby simultaneously driving antenna 23 and electric field sensor 28. 8. When the motor 2406 drives the lead screw 2407 to rotate, it can drive the limit slide 2408, which is slidably connected to the limit slide rail 2405, to move along the Y-axis. This causes the motor 2409, limit column 2410, lead screw 2411, sliding support plate 2412, fixed support rod 2413, and fixed support plate 2414 connected to it to move in the same direction and at the same distance. This enables the antenna 23 and the electric field sensor 28 to move synchronously along the Y-axis. When the motor 2409 drives the lead screw 2411 to rotate, the sliding support plate 2412, whose movement direction is restricted by the limit column 2410 and lead screw 2411, can only move along the Z-axis. This drives the fixed support rod 2413 and fixed support plate 2414 connected to it to move synchronously. This achieves the effect of the antenna 23 and the electric field sensor 28 moving synchronously along the Z-axis.

[0091] It should be noted that the specific structure and / or material and / or size and / or position within the anechoic chamber 1 of the above-mentioned support group 2401, lead screw 1 2403, limiting slide rod 2404, limiting slide rail 2405, lead screw 2 2407, limiting slide block 2408, limiting column 2410, lead screw 3 2411, sliding support plate 2412, fixed support rod 2413, and fixed support plate 2414 can all be adjusted according to the experimental design parameters. Furthermore, motor 1 2402, motor 2 2406, and motor 3 2409 are all treated to prevent electromagnetic interference, so as to eliminate any interference that their electromagnetic radiation may cause to the HIRF radiation environment.

[0092] In an optional embodiment of the invention, such as Figure 2 and Figure 6 As shown, an irradiance angle adjustment mechanism 7 is connected between the sliding support plate 2412 and the antenna 23. The irradiance angle adjustment mechanism 7 is used to adjust the irradiance angle of the antenna 23.

[0093] The irradiation angle adjustment mechanism 7 includes a rotating shaft 701 movably connected to the sliding support plate 2412, a gear ring 702 fixedly connected to the outer wall of the rotating shaft 701, a motor 703 fixedly connected to the sliding support plate 2412, a gear 704 connected to the output shaft end of the motor 703, a gear 704 fixedly connected to the rotating shaft 701, a motor 706 fixedly connected to the hinge frame 705, and a hinge plate 707 hinged to the hinge frame 705. The hinge plate 707 is fixedly connected to the antenna 23, the gear ring 702 meshes with the gear 704, and the output shaft end of the motor 706 is fixedly connected to the hinge plate 707.

[0094] It should be noted that, as mentioned above, when adjusting the irradiance angle, the gear 704 can be driven to rotate by the motor 703. When the gear 704 rotates, it can drive the gear ring 702 to rotate. When the gear ring 702 rotates, it can drive the rotating shaft 701, the hinge frame 705, the motor 706, the hinge plate 707 and the antenna 23 to rotate in the same direction and at the same angle. The motor 706 can drive the hinge plate 707 to rotate around the axis at the hinge point with the hinge frame 705 to set the angle, thereby adjusting the specific irradiance angle of the antenna 23.

[0095] In an optional embodiment of the invention, such as Figure 2 , Figure 4 and Figure 5 As shown, telescopic isolation mechanisms 5 are connected between the sliding support plate 2412 and the limiting slide 2408, between the motor 2409 and the anechoic chamber 1, between the antenna 23 and the anechoic chamber 1, and between the electric field sensor 28 and the far end 27 of the photoelectric converter. The telescopic isolation mechanism 5 includes a telescopic isolation sleeve 502 and a through hole 501 communicating with the internal space of the telescopic isolation sleeve 502. The through hole 501 is provided on the limiting slide 2408, the anechoic chamber 1, or the far end 27 of the photoelectric converter.

[0096] It should be noted that, as mentioned above, the antenna 23 and the electric field sensor 28 need to be positioned. The motors 2402, 2406, 2409, 703, and 706 in the synchronous position adjustment assembly 24 are all movable. Thus, the power supply lines of the above-mentioned electrical components are wrapped by the telescopic isolation mechanism 5. On the one hand, this is to treat the electromagnetic radiation that may be generated and prevent it from affecting the HIRF radiation environment. On the other hand, it can constrain the shape of the power supply lines during movement to prevent them from affecting other structures. Moreover, the telescopic structure can prevent the power supply lines from being mostly spread on the inner wall of the anechoic chamber 1. If a protective layer that follows the shape of the power supply cable is used, it is impossible to constrain its position and shape. This would cause distributed capacitance to form between the protective layer and the absorbing material on the inner wall of the anechoic chamber 1, thereby interfering with the measurement results.

[0097] In an optional embodiment of the invention, such as Figure 2 , Figure 4 and Figure 5 As shown, a pressure regulating mechanism 6 is connected between the motor 2409 and the anechoic chamber 1. The pressure regulating mechanism 6 includes a telescopic isolation sleeve 2 601, several air holes 1 602 provided on the telescopic isolation sleeve 2 601, several air holes 2 provided on the telescopic isolation sleeve 1 502, and a pressure regulator located outside the anechoic chamber 1. The air holes 1 602 and air holes 2 do not overlap. The inner walls of the telescopic isolation sleeve 1 502, the telescopic isolation sleeve 2 601, and the anechoic chamber 1 are all provided with wave-absorbing material. The telescopic isolation sleeve 2 601 is fitted outside the telescopic isolation sleeve 1 502. The pressure regulator is used to obtain and regulate the air pressure parameters inside the anechoic chamber 1.

[0098] It should be noted that, as mentioned above, the air pressure inside the anechoic chamber 1 changes when the telescopic isolation sleeve 502 is stretched and compressed. In order to maintain the pressure inside the anechoic chamber 1 at a set value, a telescopic isolation sleeve 601 is fitted over one of the telescopic isolation sleeves 502. Air holes 602 and 602 are respectively opened on the telescopic isolation sleeve 601 and the telescopic isolation sleeve 502. The air pressure change value inside the anechoic chamber 1 is obtained by the air pressure sensor in the air pressure regulator, and the air pressure inside the anechoic chamber 1 is regulated by the air pump in the air pressure regulator. This allows the air pressure inside the anechoic chamber 1 to be dynamically adjusted in accordance with the synchronous position adjustment component 24 as it adjusts the position of the antenna 23 and the electric field sensor 28. This reduces experimental interference factors, improves the accuracy of experimental data, and also improves the realism of the simulation by changing the air pressure inside the anechoic chamber 1, which can further improve the authority and accuracy of the experimental data.

[0099] The above description of this embodiment is not limited to the specific implementation described above. The specific implementation described above is merely illustrative and not restrictive. Those skilled in the art can make many other forms based on the guidance of this embodiment, all of which are within the protection scope of this embodiment.

Claims

1. A test device for the integrated effects of lightning and HIRF systems, characterized in that, include: An anechoic chamber, used to provide a HIRF radiation susceptibility testing environment for the tested electronic and electrical systems; The test monitoring module includes an EUT measuring instrument and a line impedance stabilization network located in an anechoic chamber. Both the EUT measuring instrument and the line impedance stabilization network are electrically connected to the test cable on the tested electronic and electrical system. The lightning indirect effect test module includes a transient signal generator, an oscilloscope, a lightning injection probe, a lightning current monitoring probe, and a lightning voltage detection loop, all located in an anechoic chamber. The lightning injection probe and the lightning current monitoring probe are sequentially mounted on the cable under test. The HIRF sensitivity testing module includes a radiation signal generator, an RF amplifier, a receiver, a near end of a photoelectric converter located outside the anechoic chamber, a synchronization position adjustment component located inside the anechoic chamber, a far end of the photoelectric converter, and an antenna and an electric field sensor located on the synchronization position adjustment component. The synchronization position adjustment component is used to adjust the three-dimensional coordinate data of the antenna inside the anechoic chamber and drive the electric field sensor to move synchronously with the antenna. The integrated control terminal, the test monitoring module, the lightning indirect effect test module, and the HIRF sensitivity test module are all electrically connected to the integrated control terminal.

2. The experimental device for the integrated effects of lightning and HIRF systems according to claim 1, characterized in that, The antenna, radio frequency amplifier, and radiation signal generator are electrically connected in sequence. The radiation signal generator is used to output a set HIRF radiation susceptibility test signal to the radio frequency amplifier. The radio frequency amplifier is used to amplify the input HIRF radiation susceptibility test signal and transmit it to the antenna; The antenna is used to radiate electromagnetic energy to the tested electronic and electrical system.

3. The experimental device for the integrated effects of lightning and HIRF systems according to claim 1, characterized in that, The electric field sensor is electrically connected to the remote end of the photoelectric converter and the near end of the photoelectric converter and the receiver. The remote end of the photoelectric converter and the near end of the photoelectric converter are connected by optical fiber. The electric field sensor is used to measure the field strength data at a set location near the tested electronic and electrical system. The remote end of the photoelectric converter is used to convert electrical signals into optical signals; The near end of the photoelectric converter is used to convert optical signals into electrical signals; The receiver is used to measure the calibration field strength data received from the electric field sensor and the field strength data monitored during the experiment.

4. The experimental device for the integrated effects of lightning and HIRF systems according to claim 1, characterized in that, The lightning injection probe is electrically connected to the transient signal generator, and the lightning current monitoring probe and the lightning voltage detection loop are both electrically connected to the oscilloscope. The lightning voltage detection ring is used to detect the lightning voltage injection signal in the cable under test. The transient signal generator is used to generate a set test level and adjust the waveform parameters of the test level; The lightning injection probe is used to couple and inject the test level into the cable under test; The lightning current monitoring probe is used to monitor the lightning current injection signal in the cable under test.

5. The experimental device for the integrated effects of lightning and HIRF systems according to claim 1, characterized in that, The synchronous position adjustment assembly includes a support group, a motor 1 fixedly connected to the support group, a lead screw 1 and a limiting slide rod symmetrically and movably connected to the support group, a limiting slide rail connected between the lead screw 1 and the limiting slide rod, a motor 2 fixedly connected to the limiting slide rail, a lead screw 2 movably connected to the limiting slide rail, a limiting slide block slidably connected to the limiting slide rail, a motor 3 and a limiting post fixedly connected to the limiting slide block, a lead screw 3 movably connected to the limiting slide block, a sliding support plate slidably connected to the limiting post, a fixed support rod fixedly connected to the sliding support plate, and a fixed support plate fixedly connected to the other end of the fixed support rod. The lead screw 1, lead screw 2, and lead screw 3 are respectively connected to the output shaft ends of motor 1, motor 2, and motor 3. The limiting slide rail, the limiting slide block, and the sliding support plate are respectively threadedly connected to lead screw 1, lead screw 2, and lead screw 3. The electric field sensor is connected to the fixed support plate, and the fixed support plate is provided with an adapter hole for the limiting post and lead screw 3 to pass through.

6. The experimental device for the integrated effects of lightning and HIRF systems according to claim 5, characterized in that, An irradiance angle adjustment mechanism is connected between the sliding support plate and the antenna, and the irradiance angle adjustment mechanism is used to adjust the irradiance angle of the antenna.

7. The experimental device for the integrated effects of lightning and HIRF systems according to claim 6, characterized in that, The irradiation angle adjustment mechanism includes a rotating shaft movably connected to a sliding support plate, a gear ring fixedly connected to the outer wall of the rotating shaft, a motor four fixedly connected to the sliding support plate, a gear connected to the output shaft end of the motor four, a gear fixedly connected to the rotating shaft, a motor five fixedly connected to a hinge frame, and a hinge plate hinged to the hinge frame. The hinge plate is fixedly connected to the antenna, the gear ring meshes with the gear, and the output shaft end of the motor five is fixedly connected to the hinge plate.

8. The experimental device for the integrated effects of lightning and HIRF systems according to claim 7, characterized in that, Telescopic isolation mechanisms are connected between the sliding support plate and the limiting slide, between the motor and the anechoic chamber, between the antenna and the anechoic chamber, and between the electric field sensor and the far end of the photoelectric converter. The telescopic isolation mechanism includes a telescopic isolation sleeve and a through hole communicating with the internal space of the telescopic isolation sleeve. The through hole is located on the limiting slide, the anechoic chamber, or the far end of the photoelectric converter.

9. The experimental device for the integrated effects of lightning and HIRF systems according to claim 8, characterized in that, A pressure regulating mechanism is connected between the motor three and the anechoic chamber. The pressure regulating mechanism includes a telescopic isolation sleeve two, several air holes one on the telescopic isolation sleeve two, several air holes two on the telescopic isolation sleeve one, and an air pressure regulator located outside the anechoic chamber. The air holes one and two do not overlap. The telescopic isolation sleeve one, the telescopic isolation sleeve two, and the inner wall of the anechoic chamber are all provided with microwave absorbing material. The telescopic isolation sleeve two is fitted outside the telescopic isolation sleeve one. The air pressure regulator is used to acquire and regulate the air pressure parameters inside the anechoic chamber.

10. A test method for the combined effects of lightning and HIRF systems, characterized in that, The experimental apparatus for the combined effects of lightning and HIRF systems as described in any one of claims 1-9 includes the following steps: Step S1: Construct an anechoic chamber, a test monitoring module, a lightning indirect effect testing module, and a HIRF sensitivity testing module; Step S2: Perform HIRF radiation susceptibility test field strength calibration in the range of 100MHz to 18GHz, calibrate the transient signal generator at the specified test level, and record the voltage waveform when the calibration loop is open and the current waveform when it is short-circuited. Step S3: Power on the tested electronic and electrical system, select the working mode, and maintain the tested electronic and electrical system into a stable working state; Step S4: For the tested electronic and electrical system that cannot be fully covered by the overall HIRF irradiation, calculate the 3dB beamwidth of the antenna based on the size of the tested electronic and electrical system and the HIRF test distance, calculate the displacement step of the antenna based on the 3dB beamwidth of the antenna, use single antenna equivalent test, and control the single displacement of the antenna to not exceed 3dB beamwidth through the synchronous position adjustment component. Step S5: Set the frequency, polarization mode, and irradiation angle of the HIRF radiation sensitivity test and start the test. At the same time, start the transient signal generator and inject the lightning test level into the cable under test during the dwell time of each HIRF test frequency. For a single bounce test, at least ten transient signals are applied, and the longest interval between the applied single bounce transient signals does not exceed one minute. For multiple-hit tests, at least ten multiple-hit transient signals shall be applied, and the longest interval between the applied multiple-hit transient signals shall not exceed five minutes. For the multiple pulse group test, a multiple pulse group is applied every three seconds for at least five minutes. Step S6: Change the output polarity of the transient signal generator and repeat step S5; Step S7: Repeat steps S5 to S6 for each cable under test; Step S8: Adjust the position of the antenna, and move the electric field sensor in the same way. Repeat steps S4 to S7. Step S9: Change the antenna's illumination angle and repeat steps S4 to S8; Step S10: Change the polarization of the antenna, and repeat steps S4 to S9; Step S11: Change the frequency of the HIRF sensitivity test, and repeat steps S3 to S10 until the termination frequency of the HIRF test is reached. Step S12: Change the operating mode of the tested electronic and electrical system, and repeat steps S3 to S11 until all operating modes of the tested electronic and electrical system are available.

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