Testing method and testing device for thermoelectric device

Abstract

The invention discloses a test method and a test device for a thermoelectric device, and the method comprises the steps: transmitting a temperature setting instruction to a black body and a temperature control assembly according to the temperature setting information in a test script, so as to carry out the setting of a temperature parameter, and transmitting a distance setting instruction to a displacement assembly, so as to set a distance parameter and a rotation angle, acquiring a detection value measured by the acquisition assembly, sending a movement instruction to the displacement assembly to push the thermopile to move to a position not irradiated by the black body, and repeating the measurement process if the test script contains the next group of temperature setting information; and processing the obtained multiple groups of detection values according to a data processing rule to obtain a test result. According to the method, precision sensors such as a thermopile are tested by applying the method in a testing device, and performance testing can be integrally and automatically carried out on a thermopile device; the method can adapt to different types of test scripts to execute different performance tests.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of sensor testing, in particular to a testing method and testing device of thermoelectric device. BACKGROUND

[0002] Precise sensors such as thermoelectric pile devices need to be tested for performance before use. The traditional technical method is usually to measure data artificially through black body radiation, which leads to scattered test data, low test efficiency and large artificial error, and it is difficult to test efficiently and obtain accurate test results. Therefore, the existing technical method has the problem of low test efficiency when testing the thermoelectric pile device. SUMMARY

[0003] The embodiments of the present application provide a testing method and testing device of thermoelectric device, aiming at solving the problem of low test efficiency in the prior art method when testing the thermoelectric pile device.

[0004] In a first aspect, the embodiments of the present application provide a testing method of thermoelectric device, which is applied to a controller of a testing device of thermoelectric device, the testing device of thermoelectric device further comprising a displacement assembly, a temperature control assembly, a black body, an acquisition assembly, a jig temperature sensor and a water tank temperature sensor in communication connection with the controller; the temperature control assembly comprises a water-cooled jig and a constant-temperature water tank, the water-cooled jig is arranged on the displacement assembly, the thermoelectric pile and the jig temperature sensor are arranged in the water-cooled jig, the water-cooled jig and the constant-temperature water tank are connected through a pipeline to form a cooling water circulation, the water tank temperature sensor is arranged in the constant-temperature water tank, the acquisition assembly is electrically connected with the sensing pin of the thermoelectric pile, and the method comprises: sending a temperature setting instruction to the black body and the temperature control assembly according to a group of temperature setting information in a preset test script to set the temperature parameters; sending a distance setting instruction to the displacement assembly to set the distance parameters between the thermoelectric pile and the black body and the rotation angle of the thermoelectric pile; obtaining a group of detection values measured by the acquisition assembly on the thermoelectric pile; the detection values include current detection values and voltage detection values corresponding to at least one rotation angle of the thermoelectric pile respectively; sending a moving instruction to the displacement assembly to move the thermoelectric pile to a position not irradiated by the black body; if the test script contains the next group of temperature setting information, generating a temperature setting instruction corresponding to the temperature setting information and returning to execute the step of sending the temperature setting instruction to the black body and the temperature control assembly to set the temperature parameters; If the next set of temperature setting information does not exist in the test script, the obtained multiple sets of detection values are processed according to a data processing rule corresponding to the test script to obtain a corresponding test result.

[0005] In a second aspect, the embodiment of the present application further provides a testing device for thermoelectric devices, a controller in the testing device for thermoelectric devices applies the testing method for thermoelectric devices as described in the first aspect above, and the testing device for thermoelectric devices further comprises a displacement assembly, a temperature control assembly, a black body, an acquisition assembly, a jig temperature sensor and a water tank temperature sensor in communication connection with the controller; the temperature control assembly comprises a water-cooled jig and a constant-temperature water tank, the water-cooled jig is arranged on the displacement assembly, a thermoelectric pile and the jig temperature sensor are arranged in the water-cooled jig, the water-cooled jig and the constant-temperature water tank are connected through a pipeline to form a cooling water circulation, the water tank temperature sensor is arranged in the constant-temperature water tank, and the acquisition assembly is electrically connected with sensing pins of the thermoelectric pile.

[0006] The embodiment of the present application provides a testing method and a testing device for thermoelectric devices, the method comprising: sending a temperature setting instruction to a black body and a temperature control assembly according to temperature setting information in a test script to set a temperature parameter, sending a distance setting instruction to a displacement assembly to set a distance parameter and a rotation angle, obtaining detection values measured by an acquisition assembly, sending a moving instruction to the displacement assembly to push a thermoelectric pile to a position not irradiated by the black body, and repeating the above measurement process if the test script contains next set of temperature setting information; and processing multiple sets of detection values obtained according to a data processing rule to obtain a test result. The above method is applied in a testing device to test a thermoelectric pile and other precision sensors, and can realize integrated and automated performance testing of thermoelectric pile devices; and can adapt to different types of test scripts to perform different performance tests. BRIEF DESCRIPTION OF DRAWINGS

[0007] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0008] Figure 1 A method flowchart of the testing method for thermoelectric devices provided by the embodiment of the present application; Figure 2 An application scenario schematic diagram of the testing method for thermoelectric devices provided by the embodiment of the present application; Figure 3 A partial structure diagram of the testing device for thermoelectric devices provided by the embodiment of the present application; Figure 4 Another partial structural diagram of a testing device of a thermoelectric device provided by an embodiment of the present application is shown in FIG. 4. Figure 5 A schematic block diagram of a computer device provided by an embodiment of the present application is shown in FIG. 5. Reference signs: 50, controller; 10, displacement assembly; 20, temperature control assembly; 30, black body; 40, acquisition assembly; 211, jig temperature sensor; 221, water tank temperature sensor; 21, water-cooled jig; 22, constant-temperature water tank; 23, pipeline; 51, thermoelectric pile; 11, first translation stage; 12, first rotary stage; 13, second translation stage; 14, third translation stage; 15, second rotary stage; 16, first adapter plate; 17, second adapter plate; 31, first black body; 32, second black body; 33, third black body. DETAILED DESCRIPTION

[0009] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0010] It should be understood that, when used in the specification and the appended claims, the terms “comprise” and “include” indicate the presence of described features, integers, steps, operations, elements, and / or components, but do not exclude one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0011] It should also be understood that the terms used in the present application specification are only for the purpose of describing specific embodiments and are not intended to limit the present application. As used in the present application specification and the appended claims, the singular forms “a”, “an” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0012] It should be further understood that the term “and / or” used in the present application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes these combinations.

[0013] Please refer to Figure 1 As shown in the figure, the embodiments of the present application provide a testing method of a thermoelectric device, which is applied to a controller of a testing device of a thermoelectric device, and the method is executed by application software installed in the controller. The specific application scenario is as follows Figure 2As shown, the test device of the thermoelectric device further comprises a displacement assembly 10, a temperature control assembly 20, a black body 30, an acquisition assembly 40, a jig temperature sensor 211 and a water tank temperature sensor 221 connected in communication with the controller 50. The controller 50 is a device with instruction transceiving and data processing, such as an MCU chip. The controller 50 can send the test results to an external display device to visually display the relevant data information obtained by the test through the external display device. The controller 50 can also be a terminal device integrated with an MCU chip and a display, such as a desktop computer, a notebook computer, a tablet computer or a mobile phone. The controller 50 can directly visually display the test results after obtaining the test results. The displacement assembly 10 is used to push the thermoelectric pile 51 to rotate and move to control the distance and orientation of the thermoelectric pile 51 relative to the black body 30. The temperature control assembly 20 is used to control the ambient temperature around the thermoelectric pile 51 to maintain a constant temperature around the thermoelectric pile 51, thereby improving the accuracy of the test results. The temperature control assembly 20 comprises a water-cooled jig 21 and a constant-temperature water tank 22. The water-cooled jig 21 is used to place the thermoelectric pile 51 to control the ambient temperature of the thermoelectric pile 51. The constant-temperature water tank 22 is used for water-cooled heat dissipation temperature control. The jig temperature sensor 211 is arranged in the water-cooled jig 21, and the water tank temperature sensor 221 is arranged in the constant-temperature water tank 22. The jig temperature sensor 211 and the water tank temperature sensor 221 are respectively used for temperature detection. The water tank temperature sensor 221 can be a PTC (Positive Temperature Coefficient) device or a high-precision thermocouple. The acquisition assembly 40 is used to acquire the current signal and the voltage signal obtained by the detection. The acquisition assembly 40 comprises a high-precision multimeter (for analog devices) or a data acquisition board (for digital devices).

[0014] As shown in Figure 1 The method comprises steps S110-S160.

[0015] S110, according to a set of temperature setting information in the preset test script, a temperature setting instruction is sent to the black body and the temperature control assembly to set the temperature parameters.

[0016] The test personnel can start the test script in the controller. Each performance test corresponds to one or more test scripts, which are system software programs developed for performance testing. One or more sets of temperature setting information can be set in the test script. The temperature setting information can generate a temperature setting instruction, and the temperature setting instruction can set the temperature parameters of the black body and the temperature control assembly. The black body and the temperature control assembly adjust the temperature according to the temperature setting instruction to meet the temperature requirements of the test.

[0017] The temperature setting information includes a target temperature and an ambient temperature. After the black body receives the temperature setting instruction corresponding to the target temperature, the temperature of the black body is set to the target temperature. After the water cooling jig and the constant temperature water tank receive the temperature setting instruction corresponding to the ambient temperature, the temperature of the water cooling jig and the constant temperature water tank is set to the ambient temperature.

[0018] In specific embodiments, after step S110, the method further includes steps of: determining whether the temperature of the black body reaches the target temperature in the temperature setting instruction; determining whether the temperature values detected by the jig temperature sensor and the water tank temperature sensor both reach the ambient temperature in the temperature setting instruction; and if the temperature of the black body reaches the target temperature and the detected temperature values both reach the ambient temperature, executing the step of sending the distance setting instruction to the displacement assembly.

[0019] Specifically, after sending the temperature setting instruction, it can be determined whether the temperature values detected by the jig temperature sensor and the water tank temperature sensor both reach the ambient temperature in the temperature setting instruction. For example, if the ambient temperature is set to 25℃, it can be determined whether the temperature values detected by the two temperature sensors both reach 25℃. Further, it can be determined whether the temperature of the black body reaches the target temperature in the temperature setting instruction. For example, if the target temperature is 200℃, it can be determined whether the temperature of the black body reaches 200℃.

[0020] If the temperature of the black body reaches the target temperature and the temperature values detected by the two temperature sensors both reach the ambient temperature, the subsequent step S120 is executed. If the temperature of the black body does not reach the target temperature, or the temperature value detected by any one of the temperature sensors does not reach the ambient temperature, the temperature determination process is executed again after a period of time, and the subsequent step S120 is executed after the temperature meets the corresponding determination condition.

[0021] S120, sending a distance setting instruction to the displacement assembly to set the distance parameter between the thermoelectric pile and the black body and the rotation angle of the thermoelectric pile.

[0022] Further sending the distance setting instruction to the displacement assembly, the displacement assembly receives the distance setting instruction, and correspondingly pushes the thermoelectric pile to move to adjust the distance between the thermoelectric pile and the black body corresponding to the distance parameter. At the same time, the displacement assembly can also adjust the angle of the thermoelectric pile corresponding to the rotation angle according to the distance setting instruction.

[0023] S130, obtaining a set of detection values measured by the acquisition assembly on the thermoelectric pile.

[0024] A set of detection values can be obtained by measuring the thermoelectric element through the acquisition component. During the process of obtaining the set of detection values, the rotation angle of the thermoelectric element can be continuously adjusted, and each rotation angle corresponds to the measurement of the current detection value and the voltage detection value, respectively. Therefore, the obtained set of detection values includes the current detection value and the voltage detection value corresponding to at least one rotation angle of the thermoelectric element.

[0025] S140, send a moving instruction to the displacement component to push the thermoelectric element to a position not irradiated by the black body.

[0026] Send a moving instruction to the displacement component to push the thermoelectric element to a position not irradiated by the black body.

[0027] S150, if the test script contains the next set of temperature setting information, generate a temperature setting instruction corresponding to the temperature setting information and return to execute the step of sending the temperature setting instruction to the black body and the temperature control component to set the temperature parameter.

[0028] Determine whether the test script contains the next set of temperature setting information. If the test script contains the next set of temperature setting information, generate a temperature setting instruction corresponding to the temperature setting information, and return to execute step S110.

[0029] S160, if the test script does not contain the next set of temperature setting information, process the obtained multiple sets of detection values according to the data processing rule corresponding to the test script to obtain the corresponding test result.

[0030] If there is no next set of temperature setting information, process the obtained multiple sets of detection values according to the data processing rule corresponding to the test script to obtain the corresponding test result.

[0031] In specific embodiments, before processing the obtained multiple sets of detection values according to the data processing rule corresponding to the test script, it further includes: determining whether the temperature values detected by the black body, the jig temperature sensor and the water tank temperature sensor all reach the preset initial temperature value; if the temperature values detected by the black body, the jig temperature sensor and the water tank temperature sensor all reach the initial temperature value, send a closing instruction to the black body and the temperature control component.

[0032] Before processing the obtained multiple sets of detection values according to the data processing rule, it can also be determined whether the temperature values detected by the black body, the jig temperature sensor and the water tank temperature sensor reach the preset initial temperature value (such as 25℃); if all reach the initial temperature value, send a closing instruction to the black body and the temperature control component to close the black body and the temperature control component (by closing the power supply of the black body and the temperature control component).

[0033] In a specific embodiment, the test script is a voltage-temperature relationship test script; and the processing of the obtained multiple sets of detection values according to the data processing rule corresponding to the test script to obtain the corresponding test result comprises: calculating the average value of the voltage detection value in each set of detection values as the output voltage corresponding to each target temperature; each set of detection values comprises the current detection value and the voltage detection value corresponding to one rotation angle of the thermoelectric pile; performing nonlinear fitting on multiple pairs of data corresponding to the target temperature and the output voltage to obtain a corresponding fitting curve; calculating the corresponding voltage value according to the fitting curve with the environmental temperature and the target temperature as dependent variables; and obtaining the voltage-temperature relationship table after correction deviation as the corresponding test result by subtracting the isothermal output voltage corresponding to the voltage value from each voltage value; the isothermal output voltage is the output voltage when the environmental temperature and the target temperature corresponding to the voltage value are equal.

[0034] Embodiment 1: The blackbody includes a first blackbody, a second blackbody and a third blackbody, and the first blackbody, the second blackbody and the third blackbody are all set to 25℃ in the initial state.

[0035] S1, the controller reads the current position information of the displacement component, and judges whether the position information is located at the initial position (the initial position is the position where the thermoelectric pile is not irradiated by the blackbody), if not, sends a position adjustment instruction to the displacement component to control the displacement component to adjust the thermoelectric pile to the initial position; S2, execute the voltage-temperature relationship test script and send a temperature setting instruction to the blackbody to set the temperature of the blackbody to the target temperature; S3, send a temperature setting instruction to the temperature control component to set the constant temperature water tank to the environmental temperature; S4, judge whether the temperature of the blackbody reaches the above-mentioned set target temperature, if not, continue to wait and judge again; S5, if it reaches, obtain the temperature value of the water tank temperature sensor and judge whether it reaches the above-mentioned set environmental temperature, if not, continue to wait and judge again; S6, if it reaches, obtain the temperature value of the jig temperature sensor, and judge whether the temperature value reaches the above-mentioned set environmental temperature, if it does not reach the set environmental temperature, fine-tune the temperature value set by the constant temperature water tank and repeat step S5 until the temperature value of the jig temperature sensor reaches the environmental temperature set in the current set of temperature setting information; S7, send a distance setting instruction to the displacement component to push the thermoelectric pile to the measurement position, ensure that the thermoelectric pile at the measurement position is aligned with the center of the blackbody radiation surface, and the distance between the thermoelectric pile and the third blackbody is equal to the set measurement distance; S8, a set of detection values measured by the acquisition assembly on the thermoelectric element. Repeat the acquisition of multiple voltage detection values and current detection values as a set of detection values; S9, push the thermoelectric element to the initial position to avoid the thermoelectric element from being heated by the irradiation; if there is next set of temperature setting information in the voltage-temperature relationship test script, send a new temperature setting instruction to the blackbody and temperature control assembly based on the temperature setting information, and repeat steps S4-S9; S10, after all data acquisition is completed, set the temperature of the blackbody to 25℃ and the temperature of the constant temperature water tank to 25℃, wait for the temperature of the blackbody and the constant temperature water tank to reach 25℃, and turn off the blackbody and the constant temperature water tank.

[0036] The obtained multiple sets of detection values are processed by a data processing rule. First, abnormal voltage detection values in the detection values are removed according to an outlier exclusion strategy. For example, the average voltage of the voltage detection values in the obtained detection values is calculated, and the standard deviation corresponding to the average voltage is further calculated. The voltage confidence interval is determined according to the standard deviation and the average voltage. The voltage detection values within the voltage confidence interval are excluded.

[0037] In the above embodiment, the rotation angle of the thermoelectric element is not adjusted, so each set of detection values corresponds to a set of temperature setting information in the voltage-temperature relationship test script. A set of temperature setting information includes a target temperature and an environment temperature. This voltage-temperature relationship test only needs to set multiple different target temperatures, so one target temperature corresponds to one set of detection values. The temperature setting range of the first blackbody is -40℃-80℃, the temperature setting range of the second blackbody is 25℃-500℃, and the temperature setting range of the third blackbody is 25℃-300℃, to cover the test range of the voltage-temperature relationship (VT) test.

[0038] The average value of the remaining voltage detection values after excluding abnormal voltage detection values in each set of detection values is calculated as the output voltage corresponding to each target temperature. One target temperature corresponds to one output voltage, and one target temperature and one output voltage form a pair of data. The obtained multiple pairs of data can be nonlinearly fitted to obtain the corresponding fitting curve. Using the obtained fitting curve, the environment temperature and the target temperature in each set of temperature setting information are used as the dependent variable to calculate the corresponding voltage value; the obtained voltage value is subtracted by the corresponding isothermal output voltage to obtain the voltage value after correction deviation. The corresponding relationship between the corrected voltage value and the target temperature can constitute a voltage-temperature relationship table, which is used as the corresponding test result. The isothermal output voltage corresponding to the voltage value is the output voltage when the environment temperature and the target temperature corresponding to the voltage value in the fitting curve are equal.

[0039] In another specific embodiment, the test script is a field of view angle test script; and the processing of the obtained multiple sets of detection values according to the data processing rule corresponding to the test script to obtain the corresponding test result comprises: calculating the average value of the voltage detection values with the same rotation angle in each set of detection values as the output voltage corresponding to each rotation angle; each set of detection values comprises the current detection value and the voltage detection value of the thermoelectric pile at multiple rotation angles respectively; performing nonlinear fitting on multiple pairs of data corresponding to the rotation angle and the output voltage to obtain a fitting curve; obtaining the voltage highest point in the fitting curve as the corresponding field of view angle center point; obtaining the clockwise angle point and the counterclockwise angle point in the fitting curve corresponding to the voltage ratio according to the voltage ratio in the field of view angle test script and the voltage value of the field of view angle center point; and obtaining the field of view angle of each voltage ratio as the corresponding test result according to the angle between the angle points corresponding to each voltage ratio.

[0040] Embodiment 2: If the test script is a field of view angle test script, the voltage value output by the thermoelectric pile in the range of 90° clockwise rotation to 90° counterclockwise rotation needs to be collected.

[0041] S1, the controller reads the current position information of the displacement component, and judges whether the position information is located at the initial position (the initial position is the position where the thermoelectric pile is not irradiated by the black body); if not, sends a position adjustment instruction to the displacement component to control the displacement component to adjust the thermoelectric pile to the initial position; S2, execute the voltage-temperature relationship test script and send a temperature setting instruction to the black body to set the temperature of the black body to the target temperature (the target temperature for executing the field of view angle test by default is 200℃); S3, send a temperature setting instruction to the temperature control component to set the constant temperature water tank to the environment temperature (the environment temperature for executing the field of view angle test by default is 25℃); S4, judge whether the temperature of the black body reaches the above-mentioned set target temperature, if not, continue to wait and judge again; S5, if it reaches, obtain the temperature value of the water tank temperature sensor and judge whether it reaches the above-mentioned set environment temperature, if not, continue to wait and judge again; S6, if it reaches, obtain the temperature value of the jig temperature sensor, and judge whether the temperature value reaches the above-mentioned set environment temperature, if it does not reach the set environment temperature, fine-tune the temperature value set by the constant temperature water tank and repeat step S5 until the temperature value of the jig temperature sensor reaches the environment temperature set in the current set of temperature setting information; S7, send a distance setting instruction to the displacement assembly to push the thermoelectric pile to the measurement position, ensure that the thermoelectric pile in the measurement position is aligned with the center of the blackbody radiation surface, the second rotary table is placed in the 0° position (the rotation angle of the thermoelectric pile is 0°), and the distance between the thermoelectric pile and the third blackbody is equal to the set measurement distance (the default measurement distance for performing the field of view angle test is greater than 1 meter); S8, the acquisition assembly obtains a group of detection values measured by the thermoelectric pile; S9, control the second rotary table in the displacement assembly to rotate clockwise by 0.5° (the rotation angle of the thermoelectric pile corresponds to a clockwise rotation of 0.5°) through the displacement assembly; S10, the acquisition assembly obtains a group of detection values measured by the thermoelectric pile again; S11, judge whether the data acquisition in the clockwise direction is completed, if not, repeat steps S9-S10; S12, send a position reset instruction to the displacement assembly to control the displacement assembly to push the thermoelectric pile to move to the measurement position, ensure that the thermoelectric pile in the measurement position is aligned with the center of the radiation surface of the third blackbody, and the second rotary table is placed in the 0° position; S13, control the second rotary table in the displacement assembly to rotate counterclockwise by 0.5° through the displacement assembly; S14, the acquisition assembly obtains a group of detection values measured by the thermoelectric pile again; S15, judge whether the data acquisition in the counterclockwise direction is completed, if not, repeat steps S13-S14; S16, after completing all data acquisition, set the temperature of the blackbody to 25℃, set the temperature of the constant-temperature water tank to 25℃, wait for the temperature of the blackbody and the constant-temperature water tank to reach 25℃, and turn off the blackbody and the constant-temperature water tank.

[0042] The obtained multiple groups of detection values are processed through a data processing rule. First, abnormal voltage detection values in the detection values are removed according to an abnormal value exclusion strategy. For example, the mean value of the voltage detection values is obtained, and the standard deviation corresponding to the mean value of the voltage is further calculated. According to the standard deviation and the mean value of the voltage, the corresponding voltage confidence interval is determined. The voltage detection values within the voltage confidence interval are excluded.

[0043] The average value of the voltage detection values with the same rotation angle in each group of detection values is calculated, and the average value of the multiple voltage detection values corresponding to the same rotation angle is calculated, so that the output voltage corresponding to each rotation angle is obtained. One rotation angle and one output voltage are combined to form a pair of data, and the obtained multiple pairs of data are subjected to nonlinear fitting to obtain a corresponding fitting curve; the highest voltage point (the highest voltage point is also the center point of the curve) in the fitting curve is obtained as the corresponding field of view angle center point. Further, According to the voltage ratio in the field of view angle test script and the voltage value of the field of view angle center point, the clockwise angle point and the counterclockwise angle point corresponding to the voltage ratio in the fitting curve are obtained; for example, the voltage ratio is 50% and 90%, and the voltage value V z of the field of view angle center point is 100%, and the corresponding clockwise angle point and counterclockwise angle point of 50% V z and 90% V z are obtained, respectively.

[0044] The angles between the angle points corresponding to each voltage ratio are calculated, and the corresponding field of view angle is obtained as the test result. For example, the angle between the two angle points (clockwise angle point and counterclockwise angle point) corresponding to 50% V z is calculated, the angle between the two angle points (clockwise angle point and counterclockwise angle point) corresponding to 90% V z is calculated; the field of view angle under 50% signal intensity and the field of view angle under 90% V z signal intensity are obtained, and the two obtained field of view angles (FOV angle values) are taken as the corresponding test results.

[0045] In the above embodiment, before the average value of the voltage detection values in each group of detection values is calculated as the output voltage corresponding to each target temperature, or before the average value of the voltage detection values with the same rotation angle in each group of detection values is calculated, the abnormal voltage detection values in the detection values are removed according to a preset abnormal value removal strategy.

[0046] Before the obtained detection values are actually processed, the abnormal voltage detection values can also be removed, and the specific processing process is described in detail in Embodiments 1 and 2 above, which will not be repeated here.

[0047] In yet another specific embodiment, the test script is a resistance temperature coefficient test script, and the processing of the obtained multiple sets of detection values according to the data processing rule corresponding to the test script to obtain a corresponding test result comprises: calculating first and second resistance values corresponding to two sets of detection values at two different ambient temperatures; removing abnormal resistance values in the first and second resistance values according to a preset abnormal value exclusion strategy to obtain first and second effective resistance values; calculating first and second resistance average values corresponding to the first and second effective resistance values; and calculating a resistance temperature coefficient as the corresponding test result according to a coefficient calculation formula corresponding to the resistance temperature coefficient test script.

[0048] Embodiment 3 When the test script is a resistance temperature coefficient test script, the voltage value output by the thermoelectric element in the range of 90° clockwise to 90° counterclockwise rotation angle needs to be collected. In this embodiment, the ambient temperature for testing is adjusted.

[0049] S1, control the first black body, the second black body and the third black body to be closed, and set two ambient temperatures for resistance temperature coefficient testing as T1 and T2 (for example, T1 is 25℃ and T2 is 50℃); S2, send a temperature setting instruction to the temperature control component to set the constant-temperature water tank to the first ambient temperature T1; S3, obtain the temperature value of the water tank temperature sensor and determine whether the above set ambient temperature is reached, if not, continue to wait and then determine again; S4, if reached, obtain the temperature value of the jig temperature sensor, and determine whether the temperature value reaches the above set ambient temperature, if not, fine-tune the temperature value set by the constant-temperature water tank and repeat step S3 until the temperature value of the jig temperature sensor reaches the ambient temperature set in the current set of temperature setting information (i.e., the first ambient temperature T1); S5, the collection component measures the thermoelectric element to obtain a set of detection values. Multiple voltage detection values and current detection values are collected as a set of detection values, and each current detection value and voltage detection value can correspond to a first resistance value R T1 ; S6, send a temperature setting instruction to the temperature control component according to a new set of temperature setting information to set the constant-temperature water tank to the second ambient temperature T2; S7, obtain the temperature value of the water tank temperature sensor and determine whether the above set ambient temperature is reached, if not, continue to wait and then determine again; S8, if reached, the temperature value of the jig temperature sensor is obtained, and it is judged whether the temperature value reaches the set ambient temperature, if not, the temperature value of the constant temperature water tank is fine-tuned and step S7 is repeated until the temperature value of the jig temperature sensor reaches the ambient temperature set in the current set of temperature setting information (i.e. the second ambient temperature T2); S9, the acquisition assembly measures the thermoelectric element again to obtain a group of detection values. A plurality of voltage detection values and current detection values are repeatedly collected as a group of detection values, and each current detection value and voltage detection value can correspond to a calculated second resistance value R T2 . S10, after all data collection is completed, the temperature of the constant temperature water tank is set to 25℃, the temperature of the constant temperature water tank is waited to reach 25℃, and the constant temperature water tank is closed.

[0050] The data processing rule is used to process the obtained multiple groups of detection values, and the first resistance value and the second resistance value corresponding to the two groups of detection values at two different ambient temperatures are calculated; the first detection value can correspond to a plurality of first resistance values R T1 , and the second detection value can correspond to a plurality of second resistance values R T2 . According to the abnormal value exclusion strategy, the abnormal resistance values in the first resistance value and the second resistance value are removed. The process of removing abnormal resistance values here is similar to the process of removing abnormal values in the above-mentioned embodiments 1 and 2, and only the physical unit of the value is converted from voltage to resistance. The abnormal resistance values in the first resistance value are removed to obtain the first effective resistance value, and the abnormal resistance values in the second resistance value are removed to obtain the second effective resistance value.

[0051] The average value of the plurality of first effective resistance values is calculated to obtain the first resistance average value R' T1 , and the average value of the plurality of second effective resistance values is calculated to obtain the second resistance average value R' T2 ; according to the coefficient calculation formula corresponding to the resistance temperature coefficient test script, the first resistance average value, the second resistance average value and the two different ambient temperatures are calculated to obtain the resistance temperature coefficient as the corresponding test result. The coefficient calculation formula can be expressed by formula (1): (1) TCR is the calculated resistance temperature coefficient.

[0052] In the test method of the thermoelectric device disclosed in the above embodiments, the method comprises: sending a temperature setting instruction to the black body and the temperature control assembly according to temperature setting information in a test script to set a temperature parameter, sending a distance setting instruction to the displacement assembly to set a distance parameter and a rotation angle, obtaining a detection value measured by the collection assembly, sending a moving instruction to the displacement assembly to push the thermoelectric pile to a position not irradiated by the black body, and repeating the above measurement process if the test script contains next group of temperature setting information; and processing the obtained multiple groups of detection values according to a data processing rule to obtain a test result. The above method is applied in the test device to test the thermoelectric pile and other precision sensors, and can realize integrated and automated performance testing of the thermoelectric pile device; and can adapt to different types of test scripts to perform different performance tests.

[0053] The application can realize automatic testing of VT, FOV and TCR of the thermoelectric pile device, and solve the problems of dispersed test results, low efficiency and large human error of the traditional test method. Meanwhile, the device can adapt to thermoelectric pile sensors of different sizes and field angles, and can perform test program modularization writing on different thermoelectric pile sensors to meet specific needs.

[0054] The application also provides a test device for a thermoelectric device, and the controller in the test device applies any one of the above test methods for the thermoelectric device. Specifically, please refer to Figures 2 to 4 .

[0055] As Figures 2 to 4 shown, the test device further comprises a displacement assembly 10, a temperature control assembly 20, a black body 30, a collection assembly 40, a jig temperature sensor 211 and a water tank temperature sensor 221 which are in communication connection with the controller 50; the temperature control assembly 20 comprises a water-cooled jig 21 and a constant-temperature water tank 22, the water-cooled jig 21 is arranged on the displacement assembly 10, the thermoelectric pile 51 and the jig temperature sensor 211 are arranged in the water-cooled jig 21, the water-cooled jig 21 and the constant-temperature water tank 22 are connected through a pipeline 23 to form a cooling water circulation, the water tank temperature sensor 221 is arranged in the constant-temperature water tank 22, and the collection assembly 40 is electrically connected with the sensing pin of the thermoelectric pile 51.

[0056] In a more specific embodiment, the displacement assembly 10 comprises a first translation stage 11, a first rotation stage 12, a second translation stage 13, a third translation stage 14, a second rotation stage 15, a first adapter plate 16 and a second adapter plate 17; the first translation stage 11 is slidably arranged on the first rotation stage 12; the second translation stage 13 is rotatably arranged on the first rotation stage 12; the first adapter plate 16 is slidably arranged on the second translation stage 13, and the third translation stage is fixedly arranged on a side of the first adapter plate 16; the second adapter plate 17 is slidably arranged on the third translation stage, and the second rotation stage 15 is rotatably arranged on the third translation stage.

[0057] In a more specific embodiment, the blackbody 30 comprises a first blackbody 31, a second blackbody 32 and a third blackbody 33; the first blackbody 31 and the second blackbody 32 are arranged in close proximity and serve as radiation sources; when the detection value is measured, the first connecting line between the third blackbody 33 and the thermoelectric pile 51 is parallel to the second connecting line, which is the connecting line between the first blackbody 31 and the second blackbody 32.

[0058] In the controller of the testing device for thermoelectric devices provided in the embodiments of the present application, the above-mentioned testing method for thermoelectric devices is applied, temperature setting instructions are sent to the blackbody and the temperature control assembly according to the temperature setting information in the test script to set the temperature parameters, distance setting instructions are sent to the displacement assembly to set the distance parameters and the rotation angle, the detection values measured by the collection assembly are obtained, movement instructions are sent to the displacement assembly to push the thermoelectric pile to a position not irradiated by the blackbody, and if the test script contains the next set of temperature setting information, the above-mentioned measurement process is repeated; the multiple sets of detection values obtained are processed according to the data processing rules to obtain the test results. The above-mentioned method is applied in the testing device to test the thermoelectric pile and other precision sensors, and can realize integrated and automated performance testing of the thermoelectric pile device; and can adapt to different types of test scripts to perform different performance tests.

[0059] The above-mentioned testing method for thermoelectric devices can be realized in the form of a computer program, which can run on a computer device as shown in Figure 5 , and the controller can be realized as a computer device as shown in Figure 5 .

[0060] Please refer to Figure 5 , Figure 5 is a schematic block diagram of the computer device provided in the embodiments of the present application. The computer device can be a controller for executing the testing method for thermoelectric devices to perform performance testing of the thermoelectric devices.

[0061] Please refer to Figure 5The computer device 500 includes a processor 502, a memory, and a network interface 505 connected through a communication bus 501, wherein the memory can include a storage medium 503 and an internal memory 504.

[0062] The storage medium 503 can store an operating system 5031 and a computer program 5032. The computer program 5032, when executed, can cause the processor 502 to perform the testing method of the thermoelectric device, wherein the storage medium 503 can be a volatile storage medium or a non-volatile storage medium.

[0063] The processor 502 is configured to provide computing and control capabilities to support the operation of the entire computer device 500.

[0064] The internal memory 504 provides an environment for the execution of the computer program 5032 in the storage medium 503, and the computer program 5032, when executed by the processor 502, can cause the processor 502 to perform the testing method of the thermoelectric device.

[0065] The network interface 505 is configured to perform network communication, such as providing transmission of data information, etc. Figure 5 The structure shown in FIG. 5 is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device 500 to which the scheme of the present application is applied. Specifically, the computer device 500 can include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0066] The processor 502 is configured to run the computer program 5032 stored in the memory to implement the corresponding functions in the testing method of the thermoelectric device described above.

[0067] Those skilled in the art can understand that Figure 5 The embodiments of the computer device shown in FIG. 5 do not constitute a limitation on the specific structure of the computer device. In other embodiments, the computer device can include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components. For example, in some embodiments, the computer device can only include a memory and a processor. In such embodiments, the structure and functions of the memory and the processor are consistent with those of the memory 504 and the processor 502 shown in the embodiments, and will not be described here. Figure 5

[0068] ​It should be understood that, in the embodiments of the present application, the processor 502 can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor.

[0069] In another embodiment of the present application, a computer readable storage medium is provided. The computer readable storage medium can be a volatile or non-volatile computer readable storage medium. The computer readable storage medium stores a computer program, wherein the computer program is executed by a processor to implement the steps included in the above-mentioned testing method of thermoelectric devices.

[0070] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-mentioned devices, apparatuses and units can refer to the corresponding processes in the foregoing method embodiments, which will not be described here. Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized by electronic hardware, computer software or a combination of both. In order to clearly illustrate the interchangeability of hardware and software, the components and steps of each example have been described in a general manner in the foregoing description. Whether the functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. The skilled person can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0071] In several embodiments provided by the present application, it should be understood that the disclosed devices, apparatuses and methods can be implemented in other ways. For example, the above-described apparatus embodiments are merely schematic, for example, the division of the units is merely logical function division, and actual implementation can have another division manner, or units with the same function can be combined into one unit, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some interfaces, devices or units, and can also be electrical, mechanical or other form of connection.

[0072] The units described as separate components may or may not be physically separate, and the components displayed as units may or may not be physical units, i.e., may be located in one place, or may be distributed to multiple network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the embodiment of the present application.

[0073] In addition, each functional unit in each embodiment of the present application can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of a software functional unit.

[0074] The integrated unit, if realized in the form of a software functional unit and sold or used as an independent product, can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the present application essentially or the part of the prior art that contributes to the present application, or all or part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a computer readable storage medium and includes a number of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned computer readable storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a magnetic disk or an optical disk, and various program code storage media.

[0075] The above is only a specific embodiment of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or replacements within the technical range disclosed by the present application, and these modifications or replacements should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A method for testing a thermoelectric device, characterized in that: The method is applied to a controller of a thermoelectric device test device, wherein the thermoelectric device test device further comprises a displacement component, a temperature control component, a black body, a collection component, a fixture temperature sensor, and a water tank temperature sensor that are communicatively connected to the controller; the temperature control component comprises a water-cooling fixture and a constant-temperature water tank, the water-cooling fixture is disposed on the displacement component, the thermopile and the fixture temperature sensor are both placed in the water-cooling fixture, the water-cooling fixture and the constant-temperature water tank are connected via a pipeline to form a cooling water circulation, the water tank temperature sensor is placed in the constant-temperature water tank, and the collection component is electrically connected to the sensing pin of the thermopile. The method comprises: Sending a temperature setting instruction to the blackbody and the temperature control component to set temperature parameters according to a set of temperature setting information in a preset test script; Sending a distance setting instruction to the displacement component to set the distance parameter between the thermopile and the blackbody and the rotation angle of the thermopile; Acquire a set of detection values ​​obtained by the acquisition component measuring the thermopile; the detection values ​​include current detection values ​​and voltage detection values ​​corresponding to at least one rotation angle of the thermopile; Sending a movement instruction to the displacement component to push the thermopile to a position not illuminated by the black body; If the test script contains the next set of temperature setting information, generating a temperature setting instruction corresponding to the temperature setting information and returning to execute the step of sending the temperature setting instruction to the blackbody and the temperature control component to set the temperature parameters; If the next set of temperature setting information does not exist in the test script, the obtained multiple sets of detection values ​​are processed according to the data processing rules corresponding to the test script to obtain corresponding test results.

2. The method for testing a thermoelectric device according to claim 1, wherein: After sending the temperature setting instruction to the black body and the temperature control component to set the temperature parameters, the method further includes: determining whether the temperature of the blackbody reaches the target temperature in the temperature setting instruction; Determining whether the temperature values ​​detected by the fixture temperature sensor and the water tank temperature sensor both reach the ambient temperature in the temperature setting instruction; If the temperature of the black body reaches the target temperature and the detected temperature values ​​all reach the ambient temperature, the step of sending the distance setting instruction to the displacement component is executed.

3. The method for testing a thermoelectric device according to claim 1, wherein: Before processing the acquired multiple groups of test values ​​according to the data processing rules corresponding to the test script, the method further includes: Determine whether the temperature of the black body, the temperature values ​​detected by the fixture temperature sensor, and the water tank temperature sensor all reach a preset initial temperature value; If the temperature of the black body, the temperature values ​​detected by the fixture temperature sensor, and the water tank temperature sensor all reach the initial temperature values, a shutdown instruction is sent to the black body and the temperature control component.

4. The method for testing a thermoelectric device according to claim 2, wherein: The test script is a voltage-temperature relationship test script; The processing of the acquired multiple groups of test values ​​according to the data processing rules corresponding to the test script to obtain corresponding test results includes: Calculating an average value of the voltage detection values ​​in each group of detection values ​​as the output voltage corresponding to each target temperature; each group of detection values ​​includes a current detection value and a voltage detection value corresponding to each rotation angle of the thermopile; Performing nonlinear fitting on multiple pairs of data corresponding to the target temperature and the output voltage to obtain corresponding fitting curves; The ambient temperature and the target temperature are used as dependent variables according to the fitting curve to calculate a corresponding voltage value; Subtract the corresponding isothermal output voltage from each voltage value to obtain a voltage-temperature relationship table after correction of the deviation as the corresponding test result; the isothermal output voltage is the output voltage when the ambient temperature corresponding to the voltage value is equal to the target temperature.

5. The method for testing a thermoelectric device according to claim 2, wherein: The test script is a field of view angle test script; The processing of the acquired multiple groups of test values ​​according to the data processing rules corresponding to the test script to obtain corresponding test results includes: Calculating an average value of voltage detection values ​​at the same rotation angle in each group of detection values ​​as the output voltage corresponding to each rotation angle; each group of detection values ​​includes current detection values ​​and voltage detection values ​​corresponding to the thermopile at multiple rotation angles; Performing nonlinear fitting on multiple pairs of data corresponding to the rotation angle and the output voltage to obtain corresponding fitting curves; Obtaining the highest voltage point in the fitting curve as the corresponding viewing angle center point; According to the voltage ratio in the viewing angle test script and the voltage value at the viewing angle center point, obtaining a clockwise angle point and a counterclockwise angle point in the fitting curve corresponding to the voltage ratio; By calculating the angles between the angle points corresponding to the voltage ratios, the viewing angles of the voltage ratios are obtained as the corresponding test results.

6. The method for testing a thermoelectric device according to claim 4 or 5, characterized in that: Before calculating the average value of the voltage detection values ​​in each group of detection values ​​as the output voltage corresponding to each target temperature, or calculating the average value of the voltage detection values ​​with the same rotation angle in each group of detection values, the method further includes: Abnormal voltage detection values ​​in the detection values ​​are removed according to a preset abnormal value elimination strategy.

7. The method for testing a thermoelectric device according to claim 2, wherein: The test script is a resistance temperature coefficient test script, and the obtained multiple groups of detection values ​​are processed according to the data processing rules corresponding to the test script to obtain corresponding test results, including: Calculate the first resistance value and the second resistance value corresponding to the two sets of detection values ​​at two different ambient temperatures; removing abnormal resistance values ​​from the first resistance value and the second resistance value according to a preset abnormal value elimination strategy to obtain a first effective resistance value and a second effective resistance value; Calculating a first resistance average value and a second resistance average value corresponding to the first effective resistance value and the second effective resistance value respectively; The first resistance average value, the second resistance average value, and two different ambient temperatures are calculated according to a coefficient calculation formula corresponding to the resistance temperature coefficient test script to obtain a resistance temperature coefficient as a corresponding test result.

8. A testing device for a thermoelectric device, characterized in that: The controller in the testing device for the thermoelectric device applies the testing method for the thermoelectric device according to any one of claims 1 to 7. The testing device for the thermoelectric device further comprises a displacement component, a temperature control component, a black body, a collection component, a fixture temperature sensor, and a water tank temperature sensor that are communicatively connected to the controller; the temperature control component comprises a water-cooling fixture and a constant-temperature water tank, the water-cooling fixture is arranged on the displacement component, the thermopile and the fixture temperature sensor are placed in the water-cooling fixture, the water-cooling fixture and the constant-temperature water tank are connected by a pipeline to form a cooling water circulation, the water tank temperature sensor is placed in the constant-temperature water tank, and the collection component is electrically connected to the sensing pin of the thermopile.

9. The testing device for thermoelectric devices according to claim 8, characterized in that: The displacement assembly includes a first translation stage, a first rotation stage, a second translation stage, a third translation stage, a second rotation stage, a first adapter plate, and a second adapter plate; The first translation stage is slidably arranged on the first rotating stage; the second translation stage is rotatably arranged on the first rotating stage; the first adapter plate is slidably arranged on the second translation stage, and the third moving stage is fixedly arranged on the side of the first adapter plate; the second adapter plate is slidably arranged on the third moving stage, and the second rotating stage is rotatably arranged on the third moving stage.

10. The testing device for thermoelectric devices according to claim 8 or 9, characterized in that: The black body includes a first black body, a second black body and a third black body; The first black body and the second black body are arranged adjacent to each other and serve as radiation sources; When measuring and acquiring the detection value, a first connection line between the third black body and the thermopile is parallel to a second connection line, and the second connection line is a connection line between the first black body and the second black body.

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