Quality evaluation method and system for contact of vacuum interrupter

Abstract

The application belongs to the technical field of vacuum switch tube accessories, and particularly relates to a quality evaluation method and system for a contact of a vacuum arc-extinguishing chamber, which comprises the following steps: obtaining a rapid detection result of the contact; obtaining a first score of the contact according to the rapid detection result, and saving the first score; when a target contact is located in a first sorting device, if a target first score of the target contact is higher than an Nth-lowest first score, the first sorting device is controlled to sort the target contact into a qualified frame; if the target first score is lower than or equal to the Nth-lowest first score, the first sorting device is controlled to sort the target contact into a complex detection device and perform complex detection to obtain a target complex detection result; the target first score is deleted; if the target complex detection result is qualified, the quality of the target contact is qualified, and a second sorting device is controlled to sort the target contact with the qualified target complex detection result into the qualified frame. The method can balance low detection cost, high production efficiency and high credibility of evaluation results.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of vacuum switch tube accessories, in particular to a quality evaluation method and system for a contact of a vacuum arc-extinguishing chamber. BACKGROUND

[0002] The vacuum arc-extinguishing chamber, also known as a vacuum switch tube, is a core component of a medium and high voltage power switch, which can cut off the power supply of a medium and high voltage circuit and quickly extinguish arc and suppress current through the excellent insulation of the vacuum inside the tube. The moving and static contacts are components in the vacuum arc-extinguishing chamber and are also the positions where arc is generated and extinguished, which play a decisive role in the quality of the vacuum arc-extinguishing chamber.

[0003] The quality detection method of the contact includes relatively fast detection methods, such as size detection, non-destructive testing, surface quality detection, etc., and more complex detection methods, such as various performance tests (such as loop resistance test, rated current temperature rise test and breaking capacity test, etc.) that need to be performed on the entire vacuum arc-extinguishing chamber. The existing contact quality evaluation method often selects a part of the above detection methods for detection, and the contacts that pass all the detection are evaluated as qualified. If too many detection methods are selected, it will lead to increased detection cost and reduced production efficiency, and if too few detection methods are selected, it will lead to reduced reliability of the evaluation result. Therefore, the existing contact quality evaluation method cannot balance low detection cost, high production efficiency and high reliability of the evaluation result. SUMMARY

[0004] The embodiments of the application provide a quality evaluation method and system for a contact of a vacuum arc-extinguishing chamber, which can solve the problem that the existing contact quality evaluation method cannot balance low detection cost, high production efficiency and high reliability of the evaluation result.

[0005] In a first aspect, the embodiments of the application provide a quality evaluation method for a contact of a vacuum arc-extinguishing chamber, which is applied to a quality evaluation device for a contact of a vacuum arc-extinguishing chamber, the quality evaluation device for a contact of a vacuum arc-extinguishing chamber includes sequentially arranged fast detection apparatus, first sorting apparatus, complex detection apparatus and second sorting apparatus, the detection speed of the fast detection apparatus is greater than the detection speed of the complex detection apparatus; the method includes:

[0006] obtaining a fast detection result of the contact; wherein the fast detection result is a detection result of the fast detection apparatus for fast detection of the contact;

[0007] obtaining a first score of the contact according to the fast detection result, and saving the first score;

[0008] When the target contact is located in the first sorting device, if a target first score of the target contact is higher than an Nth-lowest first score, the first sorting device is controlled to sort the target contact into a qualified frame and delete the target first score; if the target first score is lower than or equal to the Nth-lowest first score, the first sorting device is controlled to sort the target contact into the complex detection device and perform complex detection to obtain a target complex detection result, and delete the target first score; wherein the target contact is a contact after the rapid detection, the target first score is a first score corresponding to the target contact, N is related to a detection speed of the rapid detection, a detection speed of the complex detection, and a number of the first scores that have not been deleted, and the Nth-lowest first score refers to an Nth-lowest first score among all the first scores that have not been deleted.

[0009] If the target complex detection result is qualified, the quality of the target contact is qualified, and the second sorting device is controlled to sort the target contact with the target complex detection result into a qualified frame.

[0010] The technical solutions described above in the embodiments of the present application have at least the following technical effects:

[0011] The quality evaluation method of the contact for the vacuum interrupter provided by the application comprises the following steps: firstly, obtaining the rapid detection result of the contact; secondly, obtaining the first score of the contact according to the rapid detection result and saving the first score; thirdly, when the target contact is located in the first sorting device, if the target first score of the target contact is higher than the Nth lowest first score, the first sorting device is controlled to sort the target contact into the qualified frame and delete the target first score; if the target first score is lower than or equal to the Nth lowest first score, the first sorting device is controlled to sort the target contact into the complex detection device and perform complex detection to obtain the target complex detection result and delete the target first score; fourthly, if the target complex detection result is qualified, the quality of the target contact is qualified, and the second sorting device is controlled to sort the target contact with the qualified target complex detection result into the qualified frame; and finally, the sorting of all contacts is completed.

[0012] In the second aspect, the embodiments of the application provide a quality evaluation system of a contact for a vacuum interrupter, which is applied to a quality evaluation device of a contact for a vacuum interrupter, the quality evaluation device of the contact for the vacuum interrupter comprises a rapid detection device, a first sorting device, a complex detection device and a second sorting device arranged in sequence, the detection speed of the rapid detection device is greater than the detection speed of the complex detection device, and the quality evaluation system comprises the following components.

[0013] a rapid detection unit, configured to obtain a rapid detection result of the contact;

[0014] a first scoring unit, configured to obtain a first score of the contact according to the rapid detection result, and save the first score;

[0015] a first sorting unit and a complex detection unit, configured to, when a target contact is located in the first sorting device, if a target first score of the target contact is higher than an Nth-lowest first score, control the first sorting device to sort the target contact into a qualified frame, and delete the target first score; if the target first score is lower than or equal to the Nth-lowest first score, control the first sorting device to sort the target contact into the complex detection device and perform complex detection, to obtain a target complex detection result, and delete the target first score; wherein the target contact is a contact after the rapid detection, the target first score is a first score corresponding to the target contact, N is related to a detection speed of the rapid detection, a detection speed of the complex detection, and a number of the first scores that have not been deleted, and the Nth-lowest first score refers to an Nth-lowest first score among all the first scores that have not been deleted;

[0016] a second sorting unit, configured to, if the target complex detection result is qualified, control the second sorting device to sort the target contact with the qualified target complex detection result into the qualified frame.

[0017] In a third aspect, an embodiment of the present application provides a quality evaluation device for a contact of a vacuum arc-extinguishing chamber, including a rapid detection device, a first sorting device, a complex detection device, a second sorting device, and a control device, the control device including a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the method in any one of the first aspect when executing the computer program.

[0018] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program, and the computer program is executable on a processor to implement the method in any one of the first aspect.

[0019] In a fifth aspect, an embodiment of the present application provides a computer program product, which, when running on a quality evaluation device for a contact of a vacuum arc-extinguishing chamber, causes the quality evaluation device for the contact of the vacuum arc-extinguishing chamber to perform the quality evaluation method for the contact of the vacuum arc-extinguishing chamber in any one of the first aspect.

[0020] It can be understood that the beneficial effects of the above-mentioned second aspect to the fifth aspect can be referred to the relevant description in the above-mentioned first aspect, which will not be repeated here. BRIEF DESCRIPTION OF DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or prior art description will be briefly introduced below. Obviously, the drawings in the following description only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor on the basis of these drawings.

[0022] Figure 1 is a schematic flow chart of the quality evaluation method of the contact for vacuum interrupter provided by an embodiment of the present application;

[0023] Figure 2 is a structural flow chart of the quality evaluation method of the contact for vacuum interrupter provided by an embodiment of the present application;

[0024] Figure 3 is a structural schematic diagram of the quality evaluation system of the contact for vacuum interrupter provided by an embodiment of the present application;

[0025] Figure 4 is a structural schematic diagram of the quality evaluation equipment of the contact for vacuum interrupter provided by an embodiment of the present application. DETAILED DESCRIPTION

[0026] In the following description, specific details are set forth in order to provide a thorough understanding of the embodiments of the present application. However, persons skilled in the art should understand that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary details.

[0027] It should be understood that when used in the specification and the appended claims of the present application, the term "comprising" indicates the presence of described features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0028] It should also be understood that the term "and / or" used in the specification and the appended claims of the present application means any combination of one or more of the associated listed items and all possible combinations, and includes these combinations.

[0029] As used in the specification and the appended claims, the term "if' can be interpreted as meaning "when" or "upon" or "in response to determining" or "in response to detecting" depending on the context. Similarly, the phrase "if it is determined" or "if [the described condition or event] is detected" can be interpreted as meaning "upon determining" or "in response to determining" or "upon detecting [the described condition or event]" or "in response to detecting [the described condition or event]" depending on the context.

[0030] In addition, in the description of the present application and the appended claims, the terms "first", "second", "third", etc. are used only to distinguish descriptions, and cannot be understood as indicating or implying relative importance.

[0031] In the present application, the reference "one embodiment" or "some embodiments" and the like means that the specific features, structures or characteristics described in connection with the embodiment are included in one or more embodiments of the present application. Therefore, the statements "in one embodiment", "in some embodiments", "in other some embodiments", "in further some embodiments" and the like appearing in different places in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized. The terms "include", "contain", "have" and their variants mean "include but not limited to", unless otherwise specifically emphasized.

[0032] In the related art, the contact quality detection method includes relatively fast detection methods such as size detection, non-destructive testing, surface quality detection, etc., and more complex detection methods such as various performance tests (such as loop resistance test, rated current temperature rise test and breaking capacity test, etc.) on the vacuum arc extinguishing chamber whole tube. The existing contact quality evaluation method often selects a part of the above detection methods for detection, and the contacts detected by all the detection methods are evaluated as qualified. If too many detection methods are selected, the detection cost increases and the production efficiency decreases, and if too few detection methods are selected, the reliability of the evaluation result decreases. Therefore, the existing contact quality evaluation method cannot balance low detection cost, high production efficiency and high evaluation result reliability.

[0033] To solve the above problems, the embodiment of the present application provides a quality evaluation method of a contact for a vacuum interrupter. In the method, first, the rapid detection result of the contact is obtained. In this step, the rapid detection result of the contact is obtained after the rapid detection of the contact is completed. Second, the first score of the contact is obtained according to the rapid detection result, and the first score is saved. In this step, the rapid detection result of each contact is scored and calculated to obtain and save the first score of each contact. Then, when the target contact is located in the first sorting device, if the target first score of the target contact is higher than the Nth lowest first score, the first sorting device is controlled to sort the target contact into the qualified frame, and the target first score is deleted; if the target first score is lower than or the same as the Nth lowest first score, the first sorting device is controlled to sort the target contact into the complex detection device and perform complex detection to obtain a target complex detection result, and the target first score is deleted. In this step, when the target contact reaches the first sorting device, the first sorting device sorts the target contact according to the ranking of the target first score of the target contact. When the target first score is higher than the Nth lowest first score, the target contact is sorted into the qualified frame, and the target first score is deleted. When the target first score is lower than or the same as the Nth lowest first score, the target contact is sorted into the complex detection device to obtain the target complex detection result, and the target first score is deleted. That is, the N contacts with the smallest first score are sorted into the complex detection device, and the first score is deleted after sorting, so that the list of the first scores that are not deleted can be continuously updated, and the number of the first scores that are not deleted is a constant number. N is related to the detection speed of the rapid detection, the detection speed of the complex detection, and the number of the first scores that are not deleted. Essentially, it is to enable the rapid detection device and the complex detection device to run in alignment, so that one of the devices does not need to pause to wait for the other device to align after working for a period of time. Finally, if the target complex detection result is qualified, the quality of the target contact is qualified, and the second sorting device is controlled to sort the target contact with the qualified target complex detection result into the qualified frame. In this step, the second sorting device sorts the contacts that have completed complex detection, and the sorting of all contacts is completed. In the method, the single-path detection plus double-sorting mode is used to replace the traditional single-path detection plus single-sorting mode. The speed of the entire detection process is not determined by the detection method with the longest time consumption. The advantages of the complex detection with high time consumption and the high detection speed can be considered, that is, the low detection cost, high production efficiency and high evaluation result reliability can be considered.

[0034] The quality evaluation method of the contact for the vacuum interrupter provided by the embodiment of the present application can be applied to a quality evaluation device of the contact for the vacuum interrupter. At this time, the quality evaluation device of the contact for the vacuum interrupter is the execution subject of the quality evaluation method of the contact for the vacuum interrupter provided by the embodiment of the present application. The specific type of the quality evaluation device of the contact for the vacuum interrupter is not limited in the embodiment of the present application.

[0035] For example, the quality evaluation device for the contact of vacuum interrupter can include a rapid detection device, a first sorting device, a complex detection device, a second sorting device and a control device. The rapid detection device, the first sorting device, the complex detection device, the second sorting device and the control device are in communication connection. The rapid detection device, the first sorting device, the complex detection device and the second sorting device are arranged in sequence on a conveying belt, and there is only a sequence relationship among them.

[0036] The rapid detection device is a device for rapid detection, and the rapid detection is an indirect detection of the outer surface of the contact, which takes a short time. For example, the rapid detection device can include a three-coordinate measuring instrument (CMM) for detecting the size of the key part of the contact, an X-ray detector or an acoustic emission signal detector for non-destructive testing of the contact, and a roughness measuring instrument for surface quality detection of the contact.

[0037] The complex detection device is a device for complex detection, and the complex detection is a direct detection of the actual performance of the contact, which is complex and takes a longer time than the rapid detection. For example, the complex detection device can be an experimental vacuum interrupter with replaceable contacts connected in the circuit and a sensor for testing the loop resistance of the contact, the rated current temperature rise or the breaking capacity, etc. When the complex detection is the loop resistance test, the complex detection device is an experimental vacuum interrupter with replaceable contacts connected in the circuit and a large-range ammeter, which is arranged beside the loop resistance and used to detect the current passing through the loop resistance. When the complex detection is the rated current temperature rise test, the complex detection device is an experimental vacuum interrupter with replaceable contacts connected in the circuit and a temperature sensor, which is arranged beside the contact to detect the temperature of the contact by infrared. When the complex detection is the breaking capacity test, the complex detection device is an experimental vacuum interrupter with replaceable contacts connected in the circuit and an image sensor, which is arranged beside the contact to shoot whether the arc on the contact disappears.

[0038] The first sorting device and the second sorting device can include a bearing table and an electrically driven shunt plate, the electrically driven shunt plate including a driving motor and a plate, the driving motor being used to drive the plate to swing left and right, the contact being transmitted to the bearing table, and then the electrically driven shunt plate swinging in different directions according to different instructions of the control device to sort the contact to different positions. The electrically driven shunt plate can also be replaced by a mechanical arm.

[0039] The control device can obtain the rapid detection result of the rapid detection device, score the rapid detection result and save the score, control the first sorting device and the second sorting device to sort, and obtain the complex detection result of the complex detection device.

[0040] The fast detection device, the first sorting device, the complex detection device, and the second sorting device are arranged in sequence on the conveying belt, and the contact passes through the single-path detection and double-sorting mode vacuum interrupter contact quality evaluation device along with the conveying belt.

[0041] The control device can be a single-chip microcomputer, a microprocessor, a mobile phone, a notebook computer, a desktop computer, a computer, a laptop computer, etc.

[0042] In order to better understand the quality evaluation method of the vacuum interrupter contact provided by the embodiments of the present application, the specific implementation process of the quality evaluation method of the vacuum interrupter contact provided by the embodiments of the present application is exemplarily introduced as follows.

[0043] Figure 1 A schematic flowchart of the quality evaluation method of the vacuum interrupter contact provided by the embodiments of the present application is shown, and the quality evaluation method of the vacuum interrupter contact is applied to a quality evaluation device of the vacuum interrupter contact. The quality evaluation device of the vacuum interrupter contact includes a fast detection device, a first sorting device, a complex detection device, and a second sorting device. The contact is continuously input into the quality evaluation device of the vacuum interrupter contact through a conveying belt. The quality evaluation method of the vacuum interrupter contact includes the following steps.

[0044] S100, obtaining a fast detection result of the contact. The fast detection result is a detection result of the fast detection device on the contact.

[0045] It can be understood that the fast detection result of the contact is obtained from the fast detection device. The fast detection refers to a contact detection method with less time consumption and without being performed on the vacuum interrupter whole tube, such as size detection, nondestructive testing, and surface quality detection, etc.

[0046] Optionally, the fast detection includes at least one of size detection, nondestructive testing, and surface quality detection.

[0047] When the fast detection is size detection, the fast detection device can be a three-coordinate measuring instrument (CMM). After the contact is fixed, the fast detection device detects the size of each part of the contact. The detection can be performed according to a pre-set size detection list, such as the slot size on the contact, the contact surface radius, etc. Then, the actual size detected is subtracted from the pre-set target size to obtain an error size. All error sizes in the size detection list are the fast detection result.

[0048] When the rapid detection is non-destructive detection, the rapid detection device can be an X-ray detector or an acoustic emission signal detector. After the contact is fixed, the X-ray detector emits X-rays and receives X-rays penetrating the contact, or the probe of the acoustic emission signal detector emits acoustic emission signals and receives returned acoustic emission signals, to detect whether the contact has internal defects such as pores and cracks. These internal defects are the rapid detection results.

[0049] When the rapid detection is surface quality detection, the rapid detection device can be a roughness measuring instrument. After the contact is fixed, the roughness of the surface of the contact (especially the contact surface) is detected by the roughness measuring instrument, and the roughness of the surface of the contact is the rapid detection result.

[0050] S200, obtaining a first score of the contact according to the rapid detection result, and saving the first score.

[0051] It can be understood that the first score in the present application is to compare the quality of different contacts, and there is no determined corresponding relationship between the specific value of the first score and the rapid detection result, that is, only the size error of the contact is greater, and the first score is smaller, and the specific value of the first score does not need to be concerned, so that a linear score calculation method can be used, such as the first score = k * x. (k is a constant, and x is the sum of absolute values of all error sizes in the size detection list), or a monotonically increasing nonlinear score calculation method can be used, such as the first score = k * x. (wherein k>0, the growth rate of the function can be controlled by adjusting k, the first score is equal to 0 at x=0, tends to 100 at positive infinity, and the function is monotonically increasing in the entire real number domain), so as to obtain the first score of the contact.

[0052] There is also a case that there are multiple detection methods in the rapid detection, and a unified standard is needed to enable the first scores obtained by different detection methods to be added or subtracted. The unified standard means that the error size of X is equivalent to the internal defect of Y, and is equivalent to the surface roughness of Z. X:Y:Z is the unified standard (the first score obtained by size detection is divided by X, the first score obtained by non-destructive detection is divided by Y, and the first score obtained by surface quality detection is divided by Z). The value of the unified standard X:Y:Z depends on the degree of attention of the manufacturer to different detection methods. For example, the manufacturer pays more attention to the error size of the contact, and the value of X can be reduced to increase the value of the first score obtained by size detection. Then, the average value of the first scores of multiple detection methods can be obtained as the final first score.

[0053] In this way, a unified first score is determined, which can reflect the ranking of the rapid detection result of the contact.

[0054] S300, when the target contact is in the first sorting device, if the target first score of the target contact is higher than the Nth lowest first score, the first sorting device is controlled to sort the target contact into the qualified frame, and the target first score is deleted; if the target first score is lower than or equal to the Nth lowest first score, the first sorting device is controlled to sort the target contact into the complex detection device and perform complex detection to obtain a target complex detection result, and the target first score is deleted. The target contact is a contact after rapid detection, and the target first score is a first score corresponding to the target contact. N is related to the detection speed of rapid detection, the detection speed of complex detection, and the number of first scores that have not been deleted. The Nth lowest first score refers to the Nth lowest first score among all the first scores that have not been deleted.

[0055] It can be understood that the method adopts a single-path detection and double-sorting mode instead of a traditional single-path detection and single-sorting mode. The main role is to separate the time-consuming low rapid detection and the time-consuming high complex detection into two parts for detection, so that the complex detection no longer drags the entire detection process. That is, after rapid detection of all contacts, a part of the contacts with poor rapid detection results is selected for complex detection. In essence, it is equivalent to rough detection first and then selecting the worst part for fine detection.

[0056] The target contact is any contact after rapid detection. When the target contact reaches the first sorting device following the conveying belt, the target first score is compared with all the first scores that have not been deleted. When the target first score is higher than the Nth lowest first score (i.e., the target first score is not one of the N lowest first scores), it means that the quality of the target contact is good, and the target contact will not be subjected to complex detection. Therefore, the first sorting device is controlled to sort the target contact into the qualified frame. When the target first score is lower than or equal to the Nth lowest first score (i.e., the target first score is one of the N lowest first scores), it means that the quality of the target contact is poor, and the target contact will be selected for complex detection. Therefore, the first sorting device is controlled to sort the target contact into the complex detection device and perform complex detection to obtain a target complex detection result. After the target contact passes through the first sorting device, the target first score is deleted regardless of the sorting result, so as to ensure that the number of first scores that have not been deleted is a constant value (because the transmission rate in the quality evaluation device is the same, when one contact passes through the first sorting device and the first score is deleted, another contact will complete rapid detection and save the first score. Therefore, during the operation of the quality evaluation device, the number of first scores that have not been deleted is constant).

[0057] In an ideal case, the efficiency of the rapid detection device and the complex detection device are aligned, that is, in the quality evaluation equipment, the complex detection device is always running and the contacts do not accumulate in the complex detection device, but the number of contacts sorted to the complex detection device per unit time is exactly equal to the detection speed of the complex detection device, and the size of N determines the number of contacts sorted to the complex detection device, so the value of N is related to the detection speed of the rapid detection, the detection speed of the complex detection, and the number of the first scores that are not deleted, when N= When N = M x (Vfast / Vcomplex) (Vcomplex refers to the detection speed of the complex detection, Vfast refers to the detection speed of the rapid detection, and M refers to the number of the first scores that are not deleted), the average number of contacts flowing into the complex detection device per unit time is exactly equal to the detection speed of the complex detection.

[0058] Optionally, a first score minimum threshold can be added, and when the target first score of the target contact is less than the first score minimum threshold, the target contact is sorted into the unqualified frame. The first score minimum threshold can be obtained from the maximum dimensional tolerance allowed by the contact, the maximum number of internal defects, and the maximum surface roughness.

[0059] Optionally, the complex detection includes at least one of a loop resistance test, a rated current temperature rise test, and an opening capacity test.

[0060] When the complex detection is the loop resistance test, the complex detection device is an experimental vacuum interrupter and a multirange ammeter connected in the circuit of the replaceable contact, after the target contact is installed on the experimental vacuum interrupter and the experimental environment is configured, the loop resistance is calculated through Ohm's law, and the size of the loop resistance is the complex detection result.

[0061] When the complex detection is the rated current temperature rise test, the complex detection device is an experimental vacuum interrupter and a temperature sensor connected in the circuit of the replaceable contact, after the target contact is installed on the experimental vacuum interrupter and the experimental environment is configured, the rated current is connected for a fixed time, and then the surface temperature of the target contact is detected by the temperature sensor, and the surface temperature of the target contact is the complex detection result.

[0062] When the complex detection is the opening capacity test, the complex detection device is an experimental vacuum interrupter and an image sensor connected in the circuit of the replaceable contact, after the target contact is installed on the experimental vacuum interrupter and the experimental environment is configured, the experimental vacuum interrupter is opened to a specified maximum current, and then the surface of the target contact is collected by the image sensor to observe whether the arc is completely extinguished within a specified time, and whether the arc is completely extinguished within a specified time is the complex detection result.

[0063] In this way, the single-path detection plus double-sorting mode is used to replace the single-path detection plus single-sorting mode, the speed of the entire detection process is not determined by the most time-consuming detection method, the advantages of high time-consuming complex detection and high detection speed can be considered, and the value of N is related to the detection speed of the fast detection, the detection speed of the complex detection, and the number of the first scores that are not deleted, so that the efficiency of the fast detection device and the complex detection device is aligned.

[0064] Optionally, the detection speed of the fast detection is at least twice the detection speed of the complex detection.

[0065] It can be understood that the greater the difference between the detection speed of the fast detection and the detection speed of the complex detection, the greater the difference between the single-path detection plus double-sorting mode in the method and the traditional single-path detection plus single-sorting mode. When the difference between the detection speed of the fast detection and the detection speed of the complex detection is small, the first sorting device and the second sorting device in the method will slow down the entire detection process, resulting in negative promotion. Therefore, it is stipulated that the detection speed of the fast detection is at least twice the detection speed of the complex detection.

[0066] In this way, the advantages of the method can be fully utilized.

[0067] Optionally, before deleting the target first score, the method further comprises:

[0068] S310, obtaining the number of the first scores that are not deleted.

[0069] It can be understood that there can be various situations that cause the number of the first scores that are not deleted to be a constant value. For example, there is a missing in the continuous input stream of the contact, or the quality evaluation device detects the residual contact during the period after the contact stops inputting. The change in the number of the first scores will cause N to change, and N can become a floating point number, causing many unnecessary calculation problems (such as how to round N) and increasing complexity. Therefore, it is necessary to obtain the number of the first scores that are not deleted, so that the number of the first scores that are not deleted is a constant value.

[0070] S320, when the number of the first scores that are not deleted is less than a first constant, copying and saving the target first score in a pre-deletion list. The first score saved in the pre-deletion list is counted as the first score that is not deleted, and the number of the first scores that are not deleted is increased.

[0071] It can be understood that the first constant, i.e. the number of the first scores in normal condition, is a constant value, and when the number of the first scores not deleted is less than the first constant, it means that an unexpected situation occurs to cause the number of the first scores not deleted to be insufficient, and therefore the target first score is copied and saved in the pre-deletion list (the first score saved in the pre-deletion list will not be deleted in the step S300), the first score saved in the pre-deletion list is counted as the first score not deleted, and the number of the first scores not deleted is increased, and therefore the number of the first scores is equivalent to +1, so as to make up for the number of the first scores.

[0072] In this way, the original method is patched, and the processing logic of the original method does not need to be changed, and the problem that the number of the first scores is not a constant value can be solved.

[0073] S330, and when the number of the first scores not deleted is equal to the first constant, and when the storage quantity in the pre-deletion list is greater than 0, one first score in the pre-deletion list is exchanged with the target first score according to the storage order.

[0074] It can be understood that when the number of the first scores not deleted is equal to the first constant, it means that the number of the first scores is in normal condition, and the number of the first scores does not need to be changed, but when the storage quantity in the pre-deletion list is greater than 0, the next step (deleting the target first score) needs to be considered, the target first score is deleted in the next step, so that the first score in the pre-deletion list is fixed (i.e. the first score in the pre-deletion list will not be updated), and the first score in the pre-deletion list cannot reflect the first score level of the contact in recent period, and therefore it is necessary to exchange one first score in the pre-deletion list with the target first score according to the storage order, i.e. the target first score is added to the pre-deletion list, and one first score in the pre-deletion list is deleted in the next step (one first score in the pre-deletion list is selected according to the storage order, and the first score with the earliest storage time is selected), so as to update the pre-deletion list in real time.

[0075] In this way, the pre-deletion list can be updated in real time, and the first score level of the contact in recent period can be reflected.

[0076] S340, and when the number of the first scores not deleted is greater than the first constant, a certain number of the first scores saved in the pre-deletion list are deleted according to the storage order, so that the number of the first scores not deleted is equal to the first constant.

[0077] It can be understood that when the number of the first scores not deleted is greater than the first constant, it means that the first constant is greater than the number of the first scores not deleted due to the unexpected situation (for example, the unexpected shutdown of the complex detection device, resulting in the accumulation of contacts), at this time, a certain number of the first scores stored in the pre-deletion list are deleted according to the storage order, so that the number of the first scores not deleted is equal to the first constant.

[0078] For example, the number of the first scores not deleted is 102, and the first constant is 100, then the two first scores stored earliest in the pre-deletion list are deleted according to the storage order.

[0079] In this way, at any moment, the number of the first scores not deleted is a constant value.

[0080] Optionally, the first constant is equal to the number of the first scores not deleted when the first sorting device starts sorting for the first time.

[0081] It can be understood that when the first constant is a constant value set in advance, if the number of the first scores not deleted changes due to the unexpected situation in the start-up stage of the quality evaluation device (i.e., the stage when the first sorting device has not started sorting), then the pre-deletion list needs to be added or deleted when the quality evaluation device just ends the start-up stage, and the related calculation of the pre-deletion list needs to be performed in each subsequent sorting process, which wastes a lot of computing power. Therefore, the first constant is equal to the number of the first scores not deleted when the first sorting device starts sorting for the first time, so that the unexpected situation in the start-up stage of the quality evaluation device is solved in the initialization process.

[0082] In this way, there is no need to worry about the unexpected situation in the start-up stage of the quality evaluation device, and the computing power of the control device can be saved in specific situations.

[0083] S400, if the target complex detection result is qualified, the quality of the target contact is qualified, and the second sorting device is controlled to sort the target contact with the qualified target complex detection result into a qualified frame.

[0084] It can be understood that a threshold value can be set to determine whether the target complex detection result is qualified, and the second sorting device is controlled to sort the target contact with the qualified target complex detection result into a qualified frame, and the unqualified target contact flows to another unqualified frame.

[0085] In this way, the quality sorting process of all contacts is completed.

[0086] Optionally, the method further comprises:

[0087] S510, obtaining a global qualified rate of the complex detection, and obtaining a local qualified rate of the complex detection. The global qualified rate refers to a qualified rate of all contacts subjected to the complex detection, and the local qualified rate refers to a qualified rate of the last L contacts subjected to the complex detection, where L is a positive integer.

[0088] It can be understood that the detection mode of first rough detection and then selecting a part of contacts with the worst quality for fine detection is adopted in the present application to balance the improvement of detection efficiency and the reliability of detection results. However, the present application has a prerequisite: when the qualified rate after fine detection (complex detection) is high enough, the quality of the contacts subjected to only rough detection (fast detection) is reliable, that is, the qualified rate of complex detection needs to be high enough to make the quality of the contacts subjected to only fast detection reliable. Therefore, it is necessary to improve the qualified rate of complex detection.

[0089] Before improving the qualified rate of complex detection, first, a global qualified rate of the complex detection is obtained, which refers to a qualified rate of all contacts and is used to represent an overall average qualified rate of the contacts. Then, a local qualified rate of the complex detection is obtained, which refers to a qualified rate of the last L contacts subjected to the complex detection and is used to represent a recent qualified rate of the contacts, where L is a preset positive integer.

[0090] S520, obtaining a final qualified rate according to the global qualified rate and the local qualified rate.

[0091] It can be understood that if only the global qualified rate is used as the final qualified rate of complex detection, the problem of insensitivity to the change of the qualified rate of the contacts in a short period will occur. Therefore, it is necessary to consider the global qualified rate and the local qualified rate simultaneously. The average of the global qualified rate and the local qualified rate can be obtained as the final qualified rate, or min (global qualified rate, local qualified rate) can be obtained as the final qualified rate.

[0092] In this way, the short-term change of the qualified rate of complex detection can be detected sensitively, and the average qualified rate of all contacts can be monitored.

[0093] S530, when the final qualified rate is less than a first threshold, adding a correction value to N; when the final qualified rate is greater than a second threshold, subtracting the correction value from N, if the corrected N is less than the initial N, resetting the corrected N to the initial N. The correction value is a constant and a positive integer; the first threshold is less than the second threshold.

[0094] It can be understood that when the final qualified rate is less than the first threshold, it means that the qualified rate of the complex detection needs to be improved, so the N can be increased by a correction value, so that N becomes larger (N becomes larger means that more contacts with higher first scores will be sorted into the complex detection device, so that the final qualified rate is improved), and the correction value is a constant integer; and when the final qualified rate is greater than the second threshold (the first threshold is less than the second threshold), it means that the qualified rate of the complex detection is too high, and the burden of the complex detection device can be reduced, so N can be reduced by a correction value, so that N becomes smaller, so as to reduce the burden of the complex detection device, and the modified N cannot be less than the initial N, otherwise it may cause the complex detection device to idle and waste production capacity.

[0095] For example, the number of first scores that are not deleted is 100, and the initial value of N is 10, that is, 10 contacts with the lowest first scores are selected from 100 contacts for complex detection. The final qualified rate of the complex detection is less than the first threshold, so N is increased by a correction value to become 20, that is, 20 contacts with the lowest first scores are selected from 100 contacts for complex detection, and then the final qualified rate of the complex detection is between the first threshold and the second threshold, so N is not modified.

[0096] In this way, the value of N is dynamically adjusted, so that the qualified rate of the complex detection is in a suitable range, and then the qualified quality of the contacts passing through the rapid detection is reliable enough.

[0097] Optionally, a temporary storage device is arranged between the first sorting device and the complex detection device, and the temporary storage device is used to receive the contacts input by the first sorting device and stably output to the complex detection device.

[0098] It can be understood that the speed of the contacts sorted by the first sorting device is uncertain, and the speed of the contacts received by the complex detection device is fixed, so it is necessary to arrange a temporary storage device for buffering between the first sorting device and the complex detection device. The temporary storage device is used to receive the contacts input by the first sorting device and stably output to the complex detection device. The temporary storage device can be a storage space plus a quantitative conveyor belt.

[0099] In this way, the problem of speed difference between the output and the input of the first sorting device and the complex detection device can be solved.

[0100] Figure 2 A structural flowchart of a quality evaluation method for contacts of a vacuum arc-extinguishing chamber is shown, Figure 2 The single-path detection and double-sorting mode of the method is shown.

[0101] It should be understood that the size of the serial number of each step in the above embodiment does not mean the order of execution, and the execution order of each process should be determined according to its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiments of the application.

[0102] Corresponding to the quality evaluation method of the contact for vacuum interrupter described in the above embodiment, the embodiments of the application also provide a quality evaluation system for the contact for vacuum interrupter. Each unit of the system can implement each step of the quality evaluation method for the contact for vacuum interrupter. Figure 3 The structure block diagram of the quality evaluation system for the contact for vacuum interrupter provided by the embodiments of the application is shown, and only the parts related to the embodiments of the application are shown for ease of illustration.

[0103] Referring to Figure 3 The system comprises:

[0104] The rapid detection unit is configured to obtain a rapid detection result of the contact. The rapid detection result is a detection result of the rapid detection device on the contact.

[0105] The first scoring unit is configured to obtain a first score of the contact according to the rapid detection result, and save the first score.

[0106] The first sorting unit and the complex detection unit are configured to, when the target contact is located in the first sorting device, if the target first score of the target contact is higher than the Nth lowest first score, control the first sorting device to sort the target contact into the qualified frame, and delete the target first score; if the target first score is lower than or equal to the Nth lowest first score, control the first sorting device to sort the target contact into the complex detection device and perform complex detection to obtain a target complex detection result, and delete the target first score. The target contact is the contact after rapid detection, and the target first score is the first score corresponding to the target contact. N is related to the detection speed of the rapid detection, the detection speed of the complex detection, and the number of the first scores that have not been deleted. The Nth lowest first score refers to the Nth lowest first score among all the first scores that have not been deleted.

[0107] The second sorting unit is configured to, if the target complex detection result is qualified, control the second sorting device to sort the target contact with the qualified target complex detection result into the qualified frame.

[0108] It should be noted that the information interaction, execution process and the like between the above units are based on the same concept as the method embodiments of the application, and the specific functions and the technical effects brought by them can be referred to the method embodiments part, which will not be repeated here.

[0109] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units is used as an example. In practical applications, the above functions can be assigned to different functional units as needed, that is, the internal structure of the device can be divided into different functional units to complete all or part of the functions described above. The functional units in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0110] This application also provides a quality evaluation device for contacts used in vacuum interrupters. Figure 4 This is a schematic diagram of a quality assessment device for contacts in a vacuum interrupter provided in one embodiment of this application. Figure 4 As shown, the control device 5 of the quality evaluation equipment for the contacts of the vacuum interrupter in this embodiment includes: at least one processor 50 ( Figure 4 Only one is shown in the image), at least one memory 51 ( Figure 4 (Only one is shown in the image) and a computer program 52 stored in the at least one memory 51 and executable on the at least one processor 50. When the processor 50 executes the computer program 52, it causes the control device 5 of the vacuum interrupter contact quality assessment device to perform the steps in any of the above-described embodiments of the vacuum interrupter contact quality assessment method, or causes the control device 5 of the vacuum interrupter contact quality assessment device to perform the functions of each unit in the above-described device embodiments.

[0111] Exemplarily, the computer program 52 may be divided into one or more units, which are stored in the memory 51 and executed by the processor 50 to complete this application. The one or more units may be a series of computer program instruction segments capable of performing specific functions, which describe the execution process of the computer program 52 in the control device 5 of the quality assessment equipment for the contacts of the vacuum interrupter.

[0112] The control device 5 of the quality evaluation device for the contact of vacuum interrupter can be a single chip microcomputer, a microprocessor, a mobile phone, a tablet computer, a wearable device, a vehicle-mounted device, a notebook computer, an ultra-mobile personal computer (UMPC), a netbook, a personal digital assistant (PDA), a desktop computer, a smart big screen, a smart television, a handheld device with wireless communication function. The control device 5 of the quality evaluation device for the contact of vacuum interrupter can include, but is not limited to, a processor 50 and a memory 51. Those skilled in the art can understand that Figure 4 The control device 5 of the quality evaluation device for the contact of vacuum interrupter is only an example and does not constitute a limitation on the control device 5 of the quality evaluation device for the contact of vacuum interrupter, which can include more or fewer components than those shown, or combine certain components, or different components, for example, can also include input and output devices, network access devices, buses, etc.

[0113] The processor 50 can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gates or transistor logic components, discrete hardware components, etc. The general-purpose processor can be a microprocessor or can also be any conventional processor.

[0114] The memory 51 can be an internal storage unit of the control device 5 of the vacuum interrupter contact quality evaluation device in some embodiments, for example, a hard disk or a memory of the control device 5 of the vacuum interrupter contact quality evaluation device. The memory 51 can also be an external storage device of the control device 5 of the vacuum interrupter contact quality evaluation device in other embodiments, for example, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the control device 5 of the vacuum interrupter contact quality evaluation device. Further, the memory 51 can include both an internal storage unit and an external storage device of the control device 5 of the vacuum interrupter contact quality evaluation device. The memory 51 is used to store an operating system, an application program, a boot loader, data, and other programs, for example, program codes of the computer program, etc. The memory 51 can also be used to temporarily store data that has been output or will be output.

[0115] The embodiments of the present application further provide a computer readable storage medium, which stores a computer program. The computer program is executed by a processor to implement the steps in any of the above method embodiments.

[0116] The embodiments of the present application provide a computer program product. When the computer program product is run on the vacuum interrupter contact quality evaluation device, the vacuum interrupter contact quality evaluation device implements the steps in any of the above method embodiments.

[0117] The integrated unit, if implemented in the form of a software function unit and sold or used as an independent product, can be stored in a computer readable storage medium. Based on such understanding, all or part of the routes in the above-mentioned embodiment methods can be instructed by a computer program to relevant hardware, and the computer program can be stored in a computer readable storage medium. The computer program can implement the steps of the above-mentioned various method embodiments when executed by a processor. The computer program includes computer program code, which can be in the form of source code, object code, executable files or some intermediate forms. The computer readable medium at least includes any entity or device capable of carrying the computer program code to the quality evaluation device for the contact of the vacuum interrupter, recording medium, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal and software distribution medium, such as U disk, mobile hard disk, magnetic disk or optical disk.

[0118] In the above embodiments, the description of each embodiment has its own focus, and the parts not described or recorded in detail in a certain embodiment can be referred to the related description of other embodiments.

[0119] Those skilled in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are realized in hardware or software depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to realize the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0120] In the embodiments provided in the present application, it should be understood that the disclosed quality evaluation method for the contact of the vacuum interrupter, the quality evaluation system for the contact of the vacuum interrupter and the quality evaluation device for the contact of the vacuum interrupter can be realized by other ways. For example, the above-described quality evaluation method for the contact of the vacuum interrupter, the quality evaluation system for the contact of the vacuum interrupter and the quality evaluation device for the contact of the vacuum interrupter embodiments are only illustrative, for example, the division of the units is only a logical function division, and actual implementation can have another division mode, for example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the displayed or discussed each other can be indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0121] The units described as separate components may or may not be physically separate, and the components displayed as units may or may not be physical units, that is, may be located in one place, or may also be distributed to multiple network units. Part or all of the units can be selected to achieve the purpose of the embodiment scheme according to actual needs.

[0122] The above embodiments are only used to illustrate the technical solutions of the present application, but not limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can still be modified, or some technical features can be replaced by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A method for evaluating the quality of contacts used in vacuum interrupters, characterized in that, A quality assessment device for contacts used in vacuum interrupters, comprising a rapid detection device, a first sorting device, a complex detection device, and a second sorting device arranged sequentially, wherein the detection speed of the rapid detection device is greater than the detection speed of the complex detection device; the method includes: Obtain the rapid detection result of the contact; wherein, the rapid detection result is the detection result of the rapid detection device performing rapid detection on the contact; The first score of the contact is obtained based on the rapid detection results, and the first score is saved; When the target contact is located within the first sorting device, if the target first score of the target contact is higher than the Nth lowest first score, the first sorting device is controlled to sort the target contact into the qualified frame and delete the target first score; if the target first score is lower than or the same as the Nth lowest first score, the first sorting device is controlled to sort the target contact into the complex detection device and perform complex detection to obtain the target complex detection result and delete the target first score; wherein, the target contact is the contact after the rapid detection, the target first score is the first score corresponding to the target contact; N is related to the detection speed of the rapid detection, the detection speed of the complex detection, and the number of first scores that have not been deleted, and the Nth lowest first score refers to the Nth lowest first score among all the first scores that have not been deleted. If the target complexity test result is qualified, the quality of the target contact is qualified, and the second sorting device is controlled to sort the target contact with the qualified target complexity test result into the qualified frame.

2. The method for evaluating the quality of contacts for a vacuum interrupter as described in claim 1, characterized in that, The method further includes: Obtain the global pass rate of the complex test, and then obtain the local pass rate of the complex test; wherein, the global pass rate refers to the complex test pass rate of all contacts that have undergone the complex test, and the local pass rate refers to the pass rate of the most recent L contacts that have undergone the complex test, where L is a positive integer; The final pass rate is obtained based on the global pass rate and the local pass rate; When the final pass rate is less than the first threshold, a correction value is added to N; when the final pass rate is greater than the second threshold, the correction value is subtracted from N. If the corrected N is less than the initial N, the corrected N is initially reset to the initial N. Wherein, the correction value is a constant and a positive integer; the first threshold is less than the second threshold.

3. The method for evaluating the quality of contacts for a vacuum interrupter as described in claim 1, characterized in that, Before deleting the target first score, the method further includes: Get the number of the first ratings that have not been deleted; When the number of undeleted first ratings is less than a first constant, the target first rating is copied and saved in the pre-deletion list; wherein, the first rating saved in the pre-deletion list is counted as the undeleted first rating, and the number of undeleted first ratings is increased. When the number of undeleted first ratings is equal to the first constant, and when the number stored in the pre-deletion list is greater than 0, one of the first ratings in the pre-deletion list is swapped with the target first rating in the order of storage. When the number of undeleted first ratings is greater than the first constant, a certain number of the first ratings stored in the pre-deletion list are deleted in storage order so that the number of undeleted first ratings is equal to the first constant.

4. The method for evaluating the quality of contacts for a vacuum interrupter as described in claim 3, characterized in that, The first constant is equal to the number of the first scores that were not deleted when the first sorting device first started sorting.

5. The method for evaluating the quality of contacts for a vacuum interrupter as described in claim 1, characterized in that, A temporary storage device is provided between the first sorting device and the complex detection device. The temporary storage device is used to receive the contact input from the first sorting device and stably output to the complex detection device.

6. The method for evaluating the quality of contacts for a vacuum interrupter as described in claim 1, characterized in that, The detection speed of the rapid detection is at least twice that of the complex detection.

7. The method for evaluating the quality of contacts for a vacuum interrupter as described in claim 1, characterized in that, The rapid inspection includes at least one of dimensional inspection, non-destructive testing, and surface quality inspection.

8. The method for evaluating the quality of contacts for a vacuum interrupter as described in claim 1, characterized in that, The complex testing includes at least one of the following: loop resistance test, rated current temperature rise test, and breaking capacity test.

9. A quality evaluation system for contacts used in vacuum interrupters, characterized in that, The system is applied to a quality assessment device for contacts used in vacuum interrupters. The quality assessment device for contacts includes a rapid detection device, a first sorting device, a complex detection device, and a second sorting device arranged sequentially. The detection speed of the rapid detection device is greater than the detection speed of the complex detection device. The system includes: A rapid detection unit is used to obtain the rapid detection result of the contact; wherein, the rapid detection result is the detection result of the rapid detection device performing rapid detection on the contact; The first scoring unit is used to obtain a first score for the contact based on the rapid detection result and to save the first score; The first sorting unit and the complex detection unit are configured to, when a target contact is located within the first sorting device, if the target first score of the target contact is higher than the Nth lowest first score, control the first sorting device to sort the target contact into the qualified frame and delete the target first score; if the target first score is lower than or the same as the Nth lowest first score, control the first sorting device to sort the target contact into the complex detection device and perform complex detection to obtain a target complex detection result, and delete the target first score; wherein, the target contact is the contact after the rapid detection, the target first score is the first score corresponding to the target contact; N is related to the detection speed of the rapid detection, the detection speed of the complex detection, and the number of first scores that have not been deleted, and the Nth lowest first score refers to the Nth lowest first score among all the first scores that have not been deleted. The second sorting unit is used to control the second sorting device to sort the target contacts that have passed the target complex test into the qualified frame if the target contact is qualified.

10. A quality assessment device for contacts used in a vacuum interrupter, comprising a control device and sequentially arranged rapid detection device, a first sorting device, a complex detection device, and a second sorting device, wherein the control device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the method as described in any one of claims 1 to 8.

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