A method and detector for improving image anti-interference performance

Abstract

The present application relates to the technical field of X-ray detector, and provides a method and a detector capable of improving image anti-interference performance. The present application adds an interference detection circuit in the detector, and obtains an interference response coefficient of the X-ray detector to external interference intensity in an interference correction mode. In a normal acquisition mode, the interference response coefficient obtained in the interference correction mode, detector signal response data in the normal acquisition mode, and interference intensity of the interference detection circuit are used to obtain an effective detector image, so that more reliable, more stable, and more optimal image performance is obtained in an interference scene through lower and controllable hardware cost increase, so that interference stripes are greatly weakened or disappeared, and image quality is significantly improved.

Description

Technical Field

[0001] This invention relates to the field of X-ray detector technology, and in particular to a method and detector that can improve image anti-interference performance. Background Technology

[0002] X-ray detectors are widely used in medical, industrial, and security fields. In their actual applications, various external interferences may occur, such as electrostatic discharge, power fluctuations, power surges, power frequency magnetic field interference, and radio frequency conducted or radiated interference. X-ray flat panel detectors use a rolling shutter mode, scanning the entire pixel array by reading out line by line. Pixels in the same row maintain a completely consistent readout time. Therefore, when external interference occurs, the output image of the X-ray detector usually appears as random horizontal stripes.

[0003] Traditional X-ray detectors typically address this type of interference by adding different shielding, filtering, or grounding loop modifications to the hardware to address different types of interference. However, since external interference is usually common-mode interference and there are many types of interference, its transmission path is difficult to estimate. Different types of interference may even exhibit diametrically opposed effects under the same modification measures, making it difficult to completely solve this problem based on hardware design.

[0004] Some X-ray detector manufacturers have proposed using specific algorithms to subtract the interfering horizontal stripes in the image based on the difference between the interfering horizontal stripes and the normal image. However, since the interfering horizontal stripes have different characteristics under different types, intensities and spatial locations, the effectiveness of such methods is usually difficult to guarantee, and in some interference scenarios, it may even lead to a significant deterioration of other performance. Summary of the Invention

[0005] To address the problem of rolling stripes in the output images of existing X-ray detectors under external interference scenarios, this invention provides a method and detector that can improve the anti-interference performance of images, achieving more reliable, stable, and superior image performance under interference scenarios.

[0006] To achieve the above objectives, the present invention adopts the following technical solution.

[0007] Firstly, the present invention provides a method for improving image anti-interference performance, comprising: in the normal acquisition mode of the detector, a readout circuit reads the signal response data S of the pixel array line by line; simultaneously, an interference detection circuit detects and outputs interference intensity data R; and calculates the effective signal response data V, using the following formula: V = S - (R·K), K = S C / R C Where K is the interference response coefficient, and S C R is the detector response data caused by interference. CThe data is the corrected interference intensity data detected by the interference detection circuit; for pixels in the same row, the readout circuit reads the signal response data S synchronously with the interference intensity data R detected by the interference detection circuit.

[0008] In some embodiments of the present invention, the method employs overall correction, specifically including: a readout circuit reading the signal response data of all pixels in the pixel array row by row to obtain a matrix {S}. （m）(n)}, as the signal response data S; while the readout circuit reads the signal response data of a certain row of pixel array, the interference detection circuit detects the row interference intensity data corresponding to that row, traversing all rows to obtain a matrix {R} of size M*1. (m)}, where R is the interference intensity data, and 1≤m≤M, 1≤n≤N, where M and N are the number of rows and columns of the detector pixel array, respectively.

[0009] In other embodiments of the present invention, the above method may also employ line-by-line correction, specifically including: in the normal acquisition mode of the detector, the readout circuit reads the signal response data of the m-th row of pixels to obtain the matrix {S}. m（n）}, which serves as the signal response data S in the m-th row. m Simultaneously, the interference detection circuit detects the row interference intensity data R corresponding to the m-th row. m Where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively; through formula V m =S m -(R) m ·K) calculates the effective signal response data V of the m-th row. m ; Traverse all rows of the detector pixel array to obtain the effective signal response data matrix {V} corresponding to all pixels. （m）(n)}, which serves as the effective signal response data V.

[0010] In some embodiments of the present invention, the interference response coefficient K is obtained in a first interference correction mode, wherein there is no X-ray irradiation in the first interference correction mode. The method for obtaining the interference response coefficient K includes: providing interference to the detector, wherein the interference includes at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conduction, and radiation interference; and the readout circuit reads the response data matrix {C} of all pixels in the pixel array line by line. （m）(n)}, as S C While the readout circuit reads the response data of a certain row of pixel arrays, the interference detection circuit detects the row interference intensity data corresponding to that row. This process is repeated across all rows to obtain a matrix {C} of size M*1. (m)}, as R C Where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively; through K=S C / RC K is calculated.

[0011] Furthermore, as an optional alternative technical solution, the interference response coefficient K is obtained in the first interference correction mode, where there is no X-ray irradiation. The method for obtaining the interference response coefficient K includes: providing interference to the detector, the interference including at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conducted interference, and radiated interference; and the readout circuit reading the response data of the m-th row of pixels in the pixel array to obtain the matrix {C}. m(n)}, as the response data S of the m-th row. Cm Simultaneously, the interference detection circuit detects the row interference intensity data R corresponding to the m-th row. Cm Where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively; through K m =S Cm / R Cm The interference response coefficient K of the m-th row is calculated. m ; Traverse all rows of the detector pixel array to obtain the interference response coefficient matrix {K} corresponding to all pixels. （m）(n)}, which serves as the interference response coefficient K.

[0012] Further, the interference response coefficient K is obtained in the second interference correction mode. The method for obtaining the interference response coefficient K includes: providing interference to the detector, the interference including at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conduction, and radiation interference; turning on the X-ray, and the detector acquiring the grayscale image P1 of the calibration sample under the interference environment; during the process of the detector acquiring the grayscale image P1 of the calibration sample under the interference environment, while the detector readout circuit reads the response data of a certain row of pixel array, the interference detection circuit detects the row interference intensity data corresponding to that row, traversing all rows to obtain a matrix {C} of size M*1. (m)}, as R C Where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively; obtain the bias dark field grayscale image P2 of the detector in an interference-free environment; subtract P2 from P1 to obtain the interference response image P3, and the pixel values ​​of each pixel in the interference response image P3 are the interference response data S of the detector. C Wherein, the grayscale image P1 and the grayscale image P2 are obtained based on the same detector and / or detector parameters; through K=S C / R C K is calculated.

[0013] Furthermore, the bias dark field grayscale image under interference-free environment is generated and stored in the X-ray detector at the factory.

[0014] In some embodiments of the present invention, the step of synchronously reading signal response data S by the readout circuit and detecting interference intensity data R by the interference detection circuit for the same row of pixels includes: when the readout circuit starts row acquisition, it outputs a row acquisition pulse, which serves as a data acquisition control signal for the interference detection circuit.

[0015] Secondly, the present invention also provides a detector that can improve the anti-interference performance of images, for implementing the above method. The detector includes an M×N pixel array, a readout circuit, a processor, and an interference detection circuit. The readout circuit is electrically connected to the processor and is used to transmit the read pixel array data to the processor. The interference detection circuit is electrically connected to the processor and is used to transmit the detected interference data to the processor. The processor is used to calculate the effective signal response data V.

[0016] Furthermore, the detector also includes a storage module that stores a bias dark field grayscale image of the detector in an interference-free environment.

[0017] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0018] This invention adds an interference detection circuit to the detector, obtaining the interference response coefficient of the X-ray detector to the intensity of external interference in interference correction mode. In normal acquisition mode, the interference response coefficient obtained in interference correction mode, along with the detector signal response data and the interference intensity from the interference detection circuit, yields an effective detector image. This achieves more reliable, stable, and superior image performance in interference scenarios with relatively low and controllable hardware cost increases, resulting in a significant reduction or elimination of interference fringes and a substantial improvement in image quality.

[0019] Furthermore, the anti-interference method of the present invention is applicable to multiple channels and various types of interference, such as random interference and fixed frequency interference. This provides a wider range of application scenarios for the method and detector of the present invention, and further improves the reliability of the detector and image quality. Attached Figure Description

[0020] The accompanying drawings, which are included to provide a further understanding of the invention and form part of this application, illustrate exemplary embodiments of the invention and, together with their description, serve to explain the invention and do not constitute an undue limitation thereof. In the drawings:

[0021] Figure 1 This is a schematic diagram of the detector hardware architecture that improves image anti-interference performance according to the present invention;

[0022] Figure 2 This is a schematic flowchart of the method for improving image anti-interference performance according to the present invention;

[0023] Figure 3 This is a schematic diagram of a method for obtaining the interference response coefficient K according to the present invention;

[0024] Figure 4 This is another schematic diagram of the method for obtaining the interference response coefficient K of the present invention;

[0025] Figure 5 This is another schematic diagram of the method for obtaining the interference response coefficient K of the present invention;

[0026] Figure 6 This is a schematic diagram of the overall interference correction method of the present invention to improve the anti-interference performance of images;

[0027] Figure 7 This is a schematic diagram of a line-by-line interference correction method for improving image anti-interference performance according to the present invention. Detailed Implementation

[0028] In the description of this invention, the following terms need to be explained:

[0029] For directional terms, the terms "center," "lateral," "longitudinal," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise" used in the specification and claims of this application indicate the orientation and positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. They should not be construed as limiting the specific protection scope of the present invention.

[0030] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0031] The terms “comprising” and “having”, and any variations thereof, in the specification and claims of this application are intended to cover non-exclusive inclusion, for example, a process, method, system, product, or device that includes a series of steps or units is not necessarily limited to those steps or units that are explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to such process, method, product, or device.

[0032] When an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or may have an intervening element present. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or may have an intervening element present. When an element is referred to as being "provided with" another element, it can be located on the surface or inside the element.

[0033] Unless otherwise expressly stated, throughout the specification and claims, the term "comprising" or its variations such as "including" or "comprises" shall be understood to include the stated elements or components without excluding other elements or other components.

[0034] In the specification and claims of this application, the term "electrical connection" can refer to a physical contact circuit connection, a communication connection, a wired communication connection, or a wireless communication connection.

[0035] In the application scenarios of X-ray detectors, there are usually various external interference situations. Since X-ray detectors contain analog equipment, they are often susceptible to interference. When interference occurs, the output image of the X-ray detector will show rolling stripes. Rolling stripes are difficult to correct, which will lead to a decrease in the performance of the entire system.

[0036] This invention treats external interference as the signal input to an X-ray detector. It adds an interference correction mode to the X-ray detector application and incorporates an interference detection circuit. In interference correction mode, the X-ray detector and the interference detection circuit simultaneously acquire the same external interference signal, obtaining the interference response coefficient of the X-ray detector to the intensity of external interference. In normal acquisition mode, the interference detection circuit and X-ray detector also acquire signals simultaneously. The X-ray detector image output corresponds to the sum of the responses of the user-input valid signal and the external interference signal. Multiplying the interference response coefficient obtained in interference correction mode with the interference intensity of the interference detection circuit in normal acquisition mode yields the contribution of the external interference signal to the X-ray detector image output in normal acquisition mode. Subtracting this contribution results in an X-ray detector image that perfectly corresponds to the user-input valid signal. To make this invention clearer, the technical solutions in the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this invention, not all embodiments. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0037] First, this invention provides a detector that can improve image anti-interference performance, the hardware architecture of which is as follows: Figure 1 As shown, the detector includes an M×N pixel array, a readout circuit, a signal processing circuit, a processor, and an interference detection circuit. The readout circuit is electrically connected to the processor and is used to transmit the read pixel array data to the processor. The interference detection circuit is electrically connected to the processor and is used to transmit the detected interference data to the processor. The processor is used to calculate the effective signal response data V. Figure 1 In the middle, SR1, SR2..., SR M-1 SR M These are the row selection circuits for rows 1, 2, 3, ..., M-1, M, respectively, INT1, INT2, ..., INT3. N-1 INT N The integrator circuits are in columns 1, 2, 3, ..., N-1, N respectively. ADC stands for Analog-to-Digital Converter, also known as A / D converter or simply ADC, which is usually an electronic component that converts analog signals into digital signals.

[0038] Alternatively, the detector may also include a power supply circuit, processor peripheral circuits, transmission circuits, etc. In some embodiments of the present invention, by adding an additional interference detection circuit, such as an electromagnetic field detection circuit, it is equivalent to adding a sensor for detecting external interference. The interference detection circuit may include an interference detection sensor, a filter circuit, an analog-to-digital converter, etc.; the interference detection sensor may be a voltage sensor or a current sensor for detecting power fluctuations, or an electromagnetic field sensor for detecting spatial interference. Through the interference detection circuit, the external interference signal and its intensity are detected, preparing for subsequent subtraction of interference contributions.

[0039] On the other hand, the present invention also provides a method for improving the image anti-interference performance of the above-mentioned detector, specifically as follows: Figure 2 As shown.

[0040] S1: In the detector's normal acquisition mode, the readout circuit reads the signal response data S of the pixel array line by line; simultaneously...

[0041] S2: The interference detection circuit detects and outputs interference intensity data R;

[0042] S3: Calculate the effective signal response data V, using the following formula:

[0043] V = S - (R·K), (1)

[0044] K=S C / R C (2)

[0045] Where K is the interference response coefficient, S C R is the detector response data caused by interference. C This is the correction interference intensity data detected by the interference detection circuit; in normal acquisition mode, the user can control whether the detector is in an X-ray environment and when image acquisition begins as needed.

[0046] In the above scheme, for the same row of pixels, the readout circuit reads the signal response data S and the interference detection circuit detects the interference intensity data R synchronously. That is to say, S1 and S2 are performed synchronously. The start time of the acquisition of the interference detection circuit and the detector row readout circuit is completely consistent with the acquisition frequency. During the single row acquisition process, the row interference intensity data output by the interference detection circuit corresponds to the N columns of response data read out by the detector in this row. Optionally, in some implementations, synchronization between the detector and the interference detection circuit is achieved by the following method: the X-ray detector directly outputs a row acquisition pulse, which is used as the data acquisition control signal for the interference detection circuit. Thus, when the detector readout circuit begins row acquisition, it automatically sends a row acquisition pulse to the interference detection circuit. The interference detection circuit uses this row acquisition pulse as a trigger signal to start acquiring interference signals. In this way, the interference detection circuit acquiring interference signals and the row acquisition circuit acquiring data for each row of pixels can always remain synchronized. That is, when the detector's row acquisition circuit begins acquiring data for a certain row of pixels, the interference detection circuit simultaneously begins acquiring interference signals. This allows the detection circuit to obtain the corresponding external interference data during the acquisition of that row of pixels, facilitating subsequent correction of that row of pixels by subtracting interference during this period. Because the interference detection circuit and the row acquisition circuit are always synchronized, accurate correction of each row of pixels can be achieved.

[0047] In the above scheme, calculating the effective signal response data V requires the interference response coefficient K. This interference response coefficient should be obtained in advance through an interference correction mode and stored in the detector before the user's normal image acquisition. Then, when the user uses the detector to acquire images normally, the pre-corrected interference response coefficient K is used directly. Optionally, depending on the correction approach, the method for obtaining the interference response coefficient K will also differ, and the so-called interference correction mode will also vary.

[0048] Optionally, in some embodiments, the interference response coefficient K of the detector is obtained by adjusting the X-ray detector to a first interference correction mode. In the first interference correction mode, there is no X-ray irradiation, meaning the detector's X-rays are not activated, but external interference is provided to the detector, including at least one of electrostatic discharge, power fluctuations, power surges, power frequency magnetic field interference, radio frequency conducted interference, and radiated interference. External interference can be one type, multiple types superimposed, or multiple channels of the same type of interference superimposed. If the interference is multiple or multi-channel, the aforementioned interference detection circuit should also be designed to be multi-channel to detect different channels or different types of interference. In the first interference correction mode, without X-ray irradiation, only external interference is provided. The detector reads pixel data in the absence of X-ray irradiation, which is the response data S on the detector caused by the interference. CThis response data is consistent with the interference intensity data R detected by the interference detection circuit. C Dividing by the sum yields the interference response coefficient K. For multiple interferences of the same type, the average interference intensity R can be obtained by averaging the values ​​of the multiple interferences. C平均 Then use the response data S on the detector caused by the interference. C Compared with the average interference intensity data R C平均 The interference response coefficient K is obtained by division. For different types of interference, the above method can be applied to each type of interference. That is, in the first interference correction mode, no X-ray illumination is provided, only a certain type of external interference is provided, such as interference 1. The detector reads pixel data without X-ray illumination, which is the response data S on the detector caused by interference 1. C1 This response data is consistent with the interference intensity data R detected by the interference detection circuit. C1 Dividing by the first two gives the interference response coefficient K1. This allows us to obtain the degree of influence of different types of interference on the detector response, i.e., the different types of interference response coefficients K1, K2, K3…K. n Where n is the number of interference types, K1, K2, K3...K n These are the interference response coefficients for the 1st, 2nd, 3rd, ..., nth interference types. In practical applications, the interference response coefficients K1, K2, K3...K1 for each type of interference are selected based on the specific interference type. n , through the following formula (3)

[0049] (3)

[0050] Where V represents the effective signal response data, S represents the signal response data of the pixel array read line by line by the readout circuit in the normal acquisition mode of the detector, and R1, R2, R3...R n These are the interference intensity data for the 1st, 2nd, 3rd, ..., nth type of interference, K1, K2, K3...K n These are the interference response coefficients for the 1st, 2nd, 3rd, ..., nth interferences, respectively.

[0051] The signal response data S of the pixel array obtained by the detector under various types of interference is corrected to obtain the effective signal response data V of the detector under various interferences.

[0052] Specifically, depending on the specific practical needs and image requirements, the above-mentioned interference response coefficient K can be calculated either as a whole or row by row.

[0053] Optionally, in some implementations, the interference response coefficient K is obtained by overall calculation. In this case, the method for obtaining the interference response coefficient K is as follows: Figure 3 As shown, it includes:

[0054] S01: Providing interference to the detector, the interference including at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conducted interference, and radiated interference;

[0055] S02: The readout circuit reads the response data matrix of all pixels in the pixel array line by line {C （m）(n)}, as S C While the readout circuit reads the response data of a certain row of pixel arrays, the interference detection circuit detects the row interference intensity data corresponding to that row. This process is repeated across all rows to obtain a matrix {C} of size M*1. (m)}, as R C , where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively;

[0056] S03: Through K=S C / R C K is calculated.

[0057] In other implementations, the interference response coefficient K can also be obtained by calculating line by line. In this case, the method for obtaining the interference response coefficient K is as follows: Figure 4 As shown, it includes:

[0058] S001: Providing interference to the detector, the interference including at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conducted interference, and radiated interference;

[0059] S002: The readout circuit reads the response data of the m-th row of the pixel array to obtain the matrix {C}. m(n)}, as the response data S of the m-th row. Cm Simultaneously, the interference detection circuit detects the row interference intensity data R corresponding to the m-th row. Cm , where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively;

[0060] S003: Via K m =S Cm / R Cm The interference response coefficient K of the m-th row is calculated. m ;

[0061] S004: Traverse all rows of the detector pixel array to obtain the interference response coefficient matrix {K} corresponding to all pixels. （m）(n)}, which serves as the interference response coefficient K.

[0062] For example, for a 1024-row * 1280-column pixel array, the first row of pixels corresponds to a 1280-column interference response data matrix {C}. 1(n)} and the interference intensity R in the first row C1Dividing them one by one yields the interference response coefficient matrix {K} of the 1280 columns corresponding to the first row. 1(n) By expanding row by row using the same method, the interference response coefficient matrix {K} corresponding to all pixels can be obtained. （m）(n)} is the interference response coefficient K.

[0063] The interference response coefficient K can also be obtained in other ways. Optionally, in some implementations, the interference response coefficient K is obtained in the second interference correction mode by adjusting the X-ray detector to the second interference correction mode. In this case, the method for obtaining the interference response coefficient K is as follows: Figure 5 As shown, it includes:

[0064] S0001: Providing interference to the detector, the interference including at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conducted interference, and radiated interference;

[0065] S0002: The X-ray detector is activated, and under interference conditions, it acquires the grayscale image P1 of the calibration sample. During this process, while the detector reads the response data of a certain row of pixel arrays, the interference detection circuit detects the corresponding row interference intensity data. This process is repeated across all rows to obtain a matrix {C} of size M*1. (m)}, as R C , where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively;

[0066] S0003: Acquire the bias dark field grayscale image P2 of the detector in an interference-free environment;

[0067] S0004: Subtract P2 from P1 to obtain the interference response image P3. The pixel values ​​of each pixel in the interference response image P3 are the interference response data S of the detector. C The grayscale image P1 and the grayscale image P2 are obtained based on the same detector and / or detector parameters.

[0068] S0005: Through K=S C / R C K is calculated.

[0069] Compared to the first correction mode, the interference response data matrix obtained by subtracting the bias dark-field grayscale image in the second correction mode is more accurate. Optionally, in some embodiments, the bias dark-field grayscale image under interference-free environment is generated and stored in the X-ray detector at the factory. The detector directly subtracts the grayscale image during acquisition to optimize user experience, or it can be manually generated by the user to ensure real-time performance; to improve accuracy, the aforementioned bias dark-field grayscale image can also be obtained by averaging multiple frames of bias dark-field grayscale images.

[0070] Once the interference response coefficient K is determined using the above method, image acquisition and correction can be performed in normal acquisition mode. The interference response coefficient K can be determined by calibrating and adjusting the detector before it leaves the factory for various types of interference to determine the degree of interference's impact on the image, i.e., the interference response coefficient K. Alternatively, it can be determined by the user after purchasing the detector, based on the actual usage environment, to make the detector more suitable for the customer's actual usage scenario and to ensure more reliable and realistic image performance.

[0071] Optionally, depending on the specific application requirements and image specifications, interference correction can also be performed using either overall correction or line-by-line correction during normal acquisition. Specifically, in some embodiments of this invention, the method employs overall correction. That is, although the detector's line acquisition and the interference detection circuit operate synchronously, no subtraction calculation is performed during this process. After the detector has acquired one frame of image, the interference detection circuit has also synchronously acquired the interference intensity data corresponding to all lines. Then, subtraction calculation is performed based on the overall one frame of image and the interference intensity data of all lines to obtain the effective signal response data V. In this case, the above scheme can be further refined as follows: Figure 6 As shown.

[0072] S10: In the normal acquisition mode of the detector, the detector is exposed to external interference and X-ray illumination. The detector simultaneously responds to both external interference and X-ray illumination. During image acquisition, the readout circuit reads the signal response data of all pixels in the pixel array line by line, obtaining a frame of signal response data matrix {S} corresponding one-to-one with M rows * N columns of pixels. （m）(n)}, as signal response data S;

[0073] S20: While the readout circuit reads the signal response data of a certain row of pixel arrays, the interference detection circuit detects the row interference intensity data corresponding to that row, traversing all rows to obtain a matrix of size M*1 {R (m)}, where R is the interference intensity data, and 1≤m≤M, 1≤n≤N, where M and N are the number of rows and columns of the detector pixel array, respectively.

[0074] Then, perform step S3 above, using the signal response data S and interference intensity data R obtained in steps S10 and S20 to calculate the effective signal response data V, which is the corrected image data. For example, the interference response coefficient matrix {K} of the N columns of pixels corresponding to the first row. 1(n)} and the interference intensity R in the first row (1) Multiplying them one by one yields the interference response data matrix {S} of the N columns of pixels corresponding to the first row. R1(n) By expanding row by row using the same method, the interference response data matrix {S} corresponding to all pixels can be obtained. R（m）(n)}, using the signal response data matrix {S} of the entire image frame （m）(n) Subtract the interference response data matrix {S} corresponding to all pixels R（m）(n)} is the effective signal response data matrix of the image, i.e., the effective signal response data V.

[0075] The overall correction method involves simultaneously acquiring row data and interference signal data. Each row acquires and stores the pixel data and interference signal strength data for all rows. Then, based on the overall frame image and the corresponding interference data for each row, overall correction is performed, and the corrected valid image is output. This method allows the row readout circuit to acquire pixel data sequentially without waiting, ensuring that the image readout speed is not affected.

[0076] Optionally, in other embodiments of the present invention, line-by-line correction can also be used. That is, the detector's line acquisition and the interference detection circuit are performed synchronously. Simultaneously, subtraction calculations are performed during line acquisition. That is, after the detector acquires an image of a line of pixels, the interference detection circuit simultaneously acquires the corresponding interference intensity data for that line. Then, the effective signal response data for that line is calculated using the formula described above. The detector directly outputs the corrected data for that line. This process is repeated until all lines of data have been acquired and corrected, resulting in the effective signal response data V for the entire image. At this point, the above method is as follows: Figure 7 As shown, it specifically includes:

[0077] S100: In the normal acquisition mode of the detector, the readout circuit reads the signal response data of the m-th row of pixels to obtain the matrix {S m（n）}, which serves as the signal response data S in the m-th row. m ;at the same time,

[0078] S200: Interference detection circuit detects the row interference intensity data R corresponding to the m-th row. m , where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively;

[0079] S300: Through formula V m =S m-(R) m ·K) calculates the effective signal response data V of the m-th row. m ;

[0080] S400: Traverse all rows of the detector pixel array to obtain the effective signal response data matrix {V} corresponding to all pixels. （m）(n)}, which serves as the effective signal response data V.

[0081] Taking a flat panel detector with a pixel matrix of 1024 rows * 1280 columns as an example, the time when the interference detection circuit starts to collect interference intensity is consistent with the time when the flat panel detector starts to collect data for each row of pixels. That is, every time the flat panel detector starts to collect data for a row of pixels, the interference detection circuit synchronously performs an interference intensity collection. The frequencies of the two are consistent and both are 100kHz.

[0082] (1) Before the user's normal data acquisition, the flat panel detector enters the interference correction mode. In this mode, the flat panel detector is kept in a no-X-ray scene. Then, the flat panel detector reads out row by row to obtain a frame of interference response data matrix {C}, which corresponds one-to-one with 1024 rows * 1280 columns of pixels. （m）(n) The interference detection circuit outputs a row interference strength data matrix {R} of size 1024*1. (m)}, where 1≤m≤1024 and 1≤n≤1280;

[0083] (2) The interference response data matrix of 1280 columns corresponding to the first row of pixels {C 1(n)} and the interference intensity R in the first row C1 Dividing them one by one yields the interference response coefficient matrix {K} of the 1280 columns corresponding to the first row. 1(n) By expanding row by row using the same method, the interference response coefficient matrix {K} corresponding to all pixels can be obtained. （m）(n)};

[0084] (3) The flat panel detector enters the normal acquisition mode. In this mode, the flat panel detector is exposed to external interference and X-ray illumination. The flat panel detector responds to both external interference and X-ray illumination. During image acquisition, the flat panel detector reads out a frame of signal response data matrix {S} corresponding to 1024 rows * 1280 columns of pixels line by line. （m）(n) The interference detection circuit outputs a row interference strength data matrix {R} of size 1024*1. (m)}, where 1≤m≤1024 and 1≤n≤1280;

[0085] (4) The interference response coefficient matrix of 1280 columns corresponding to the first row of pixels {K 1(n)} and the interference intensity R in the first row （1）Multiplying them one by one yields the interference response data matrix {S} of the 1280 columns corresponding to the first row. R1(n) By expanding row by row using the same method, the interference response data matrix {S} corresponding to all pixels can be obtained. R（m）(n)};

[0086] (5) Transfer the signal response data matrix {S} （m）(n)} and the interference response data matrix {S R1(n) The effective signal response matrix after deducting interference contribution is obtained by directly subtracting the two, which is the grayscale image data after deducting interference contribution.

[0087] The line-by-line correction method involves simultaneously acquiring external interference intensity data during the row acquisition process using a concurrent interference detection circuit. This data is then used for synchronous correction calculations, resulting in each row output by the detector being the corrected, valid image. Once all rows have been acquired, a single frame of interference-free horizontal stripes is output. This method performs interference correction simultaneously with row readout, eliminating the need to store row acquisition and interference data, thus optimizing overall computation time. The detector outputs the corrected, valid image directly.

[0088] This invention treats external interference as the signal input to an X-ray detector. An interference correction mode is added to the X-ray detector application, and no valid signal is input in this mode. In this mode, the X-ray detector's image output only includes the response to the external interference signal. Simultaneously, an interference detection circuit is added to the X-ray detector. By simultaneously acquiring the same external interference signal through both the X-ray detector and the interference detection circuit, the interference response coefficient of the X-ray detector to the intensity of external interference is obtained. In normal acquisition mode, the interference detection circuit and X-ray detector also acquire signals simultaneously. In this mode, the X-ray detector image output corresponds to the sum of the responses to the user-input valid signal and the external interference signal. By using the interference response coefficient obtained in the interference correction mode and the interference intensity of the interference detection circuit in normal acquisition mode, the contribution of the external interference signal to the X-ray detector image output in normal acquisition mode can be reconstructed. Subtracting this contribution yields an X-ray detector image that completely corresponds to the user-input valid signal. Furthermore, this invention employs an interference response coefficient to quantify the response of a unit intensity of interference on the detector image. Based on this interference response coefficient, the contribution of the detector image response data under interference of any intensity can be obtained. Therefore, the anti-interference method of this invention is applicable to interference of various intensities, and it is also applicable to interference of any frequency. As long as the interference can be detected by the interference detection circuit and the interference intensity is acceptable, the contribution value of the interference to the image can be obtained. Therefore, this invention is applicable to interference of any frequency and any intensity, has strong applicability, and the detector using the method of this invention has higher applicability and reliability. It has milestone significance in the field of X-ray detector image improvement.

[0089] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features, and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for improving the anti-interference performance of an image, characterized in that, Comprising In the normal acquisition mode of the detector, the readout circuit reads the signal response data S of the pixel array row by row; at the same time, The interference detection circuit detects and outputs the interference intensity data R; The effective signal response data V is calculated, and the calculation formula is as follows: V=S-(R·K), K = S C / R C , where K is the interference response coefficient, S C is the detector response data due to interference, R C is the corrected interference strength data detected by the interference detection circuit; For the same row of pixels, the readout circuit reads the signal response data S synchronously with the interference detection circuit detecting the interference intensity data R; The interference response coefficient K is obtained in the first interference correction mode, and the first interference correction mode is free of X-ray irradiation. The method for obtaining the interference response coefficient K comprises: The detector is provided with interference, and the interference comprises at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conduction, and radiation interference; The readout circuit reads out a response data matrix {C （m）(n)} of all the pixels of the pixel array row by row as S C ; When the readout circuit reads the response data of a certain row of the pixel array, the interference detection circuit detects the row interference intensity data corresponding to the row, and traverses all rows to obtain an M*1 matrix {C (m)} as R C , where 1≤m≤M, 1≤n≤N, and M and N are the number of rows and columns of the detector pixel array, respectively. K = S C R C K is calculated; or The method for obtaining the interference response coefficient K comprises: The detector is provided with interference, and the interference comprises at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conduction, and radiation interference; The readout circuit reads the response data of the pixels in the mth row of the pixel array to obtain a matrix {C m(n)}, as the response data S Cm of the mth row; simultaneously, The interference detection circuit detects the row interference intensity data R corresponding to the mth row Cm wherein 1≤m≤M, 1≤n≤N, M and N are the number of rows and columns of the detector pixel array, respectively; By K m = S Cm / R Cm The interference response coefficient K m of the mth row is calculated traversing all the rows of the detector pixel array, obtaining a matrix of interference response coefficients corresponding to all the pixels {K （m）(n)} as the interference response coefficient K; or The interference response coefficient K is obtained in the second interference correction mode, and the method for obtaining the interference response coefficient K comprises: The detector is provided with interference, and the interference comprises at least one of electrostatic discharge, power fluctuation, power surge, power frequency magnetic field interference, radio frequency conduction, and radiation interference; X-rays are turned on, and the detector obtains a gray value image P1 of a correction sample in the interference environment; In the process that the detector acquires the gray value image P1 of the correction sample in the interference environment, the detector readout circuit reads the response data of a certain row of pixel array, and the interference detection circuit detects the row interference strength data corresponding to the row at the same time, all rows are traversed to obtain a matrix {C (m)} of size M*1, as R C , where 1≤m≤M, 1≤n≤N, M and N are the number of rows and columns of the detector pixel array respectively; A bias dark field gray value image P2 of the detector in a non-interference environment is obtained; P2, to obtain an interference response image P3, each pixel value of the interference response image P3 being interference response data S of the detector C wherein the grey value image P1 and the grey value image P2 are based on the same detector and / or detector parameters; K = S C R C K is calculated.

2. The method of claim 1, wherein, The method adopts overall correction, and specifically comprises: The readout circuit reads the signal response data of all the pixels of the pixel array row by row to obtain a matrix {S （m）(n)} as the signal response data S; When the readout circuit reads the signal response data of a certain row of the pixel array, the interference detection circuit detects the row interference intensity data corresponding to the row, and traverses all rows to obtain an M*1 matrix {R (m)} as the interference intensity data R, where 1≤m≤M, 1≤n≤N, and M and N are respectively the number of rows and the number of columns of the detector pixel array.

3. The method of claim 1, wherein, The method adopts row-by-row correction, and specifically comprises: In the normal acquisition mode of the detector, the readout circuit reads the signal response data of the mth row of pixels to obtain a matrix {S m（n）} as the signal response data S m of the mth row; at the same time, the interference detection circuit detects the row interference intensity data R m corresponding to the mth row, where 1≤m≤M, 1≤n≤N, and M and N are respectively the number of rows and the number of columns of the pixel array of the detector. The effective signal response data Vmof the mth row is calculated by the formula V m = S m - (R m ·K) m ; All rows of the detector pixel array are traversed to obtain a matrix of valid signal response data {V （m）(n)} corresponding to all pixels as valid signal response data V.

4. The method of claim 1, wherein, The bias dark field gray value image in the non-interference environment is generated at the time of factory shipment and stored in the X-ray detector.

5. The method of claim 1, wherein, For the same row of pixels, the readout circuit reads the signal response data S synchronously with the interference detection circuit detecting the interference intensity data R, which comprises that when the readout circuit starts row acquisition, a row acquisition pulse is outputted, and the row acquisition pulse serves as a data acquisition control signal of the interference detection circuit.

6. A detector for improving the image interference immunity, for implementing the method according to any one of claims 1 to 5, characterized in that, The detector comprises an M×N pixel array, a readout circuit, a processor, and an interference detection circuit. The readout circuit is electrically connected to the processor and is used to transmit the read data of the pixel array to the processor. The interference detection circuit is electrically connected to the processor and is used to transmit the detected interference data to the processor. The processor is used to calculate the effective signal response data V.

7. The probe of claim 6, wherein, The detector further comprises a storage module, and the storage module stores a bias dark field gray value image of the detector in a non-interference environment.

Images