Backlight control method for television backlight test, television backlight test method and test system

Abstract

The invention discloses a backlight control method for a television backlight test, a television backlight test method and a test system, relates to the technical field of liquid crystal televisions, can adapt to different television complete machine products, can burn different backlight control programs according to actual production requirements, and provides different backlight control test schemes. A television mainboard is replaced to give a backlight control signal, and the backlight driving control of a Mini LED television product can be realized only by externally inputting a power supply; therefore, backlight testing and checking can be conveniently carried out by a light bar factory and a complete machine television factory, problems can be found more quickly, light bar faults can be positioned, the production testing efficiency is improved, the checking content is more perfect due to diversified testing programs, and the quality of television products is guaranteed.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of liquid crystal television, and particularly relates to a backlight control method for television backlight testing, a television backlight testing method and a testing system. BACKGROUND

[0002] With the development of television backlight technology, the backlight source of liquid crystal television has gradually evolved from the traditional ELED or DLED to MiniLED. The MiniLED backlight source is divided into thousands or even tens of thousands of independent areas, which can achieve higher contrast and more delicate picture performance. The current television product with backlight source is in the form of lamp driving integration, and the lamp beads and driving chips are integrated in the lamp strip or lamp panel. In order to ensure the production yield of the whole machine of this kind of television product, the backlight lighting test and inspection need to be carried out on the lamp strip or lamp panel, and the fault judgment is carried out on the defective lamp strip.

[0003] However, due to the different number of partitions and backlight control circuit parameters, the main board, power board and driving board need to be matched and different, and the control program of the driving board is also different. The same set of test systems cannot be directly used for backlight testing between different products. If the test system uses the matched main board, the lighting test is limited to the state of the matched main board. For example, the firmware version of the main board may not be compatible, resulting in the condition that the lamp beads cannot be correctly recognized. Moreover, the matched main board is a standard board card, and the software program needs to be determined to be burned according to the project state, and cannot be changed or flexibly switched to test the backlight program. The backlight control system for testing cannot be universal, and the flexibility and universality are poor. If it is damaged, it is not convenient to maintain and replace. SUMMARY

[0004] The purpose of the present application is to solve the problem that the backlight control method or the backlight control system in the prior art cannot be universal and has poor flexibility and universality because the main board, power board and backlight driving board need to be matched with the television backlight setting and are different, and the backlight program cannot be changed or tested in the backlight test or test. A backlight control method for television backlight testing, a television backlight testing method and a testing system are provided.

[0005] In order to achieve the above purpose, the technical scheme adopted by the present application is as follows:

[0006] A backlight control method for television backlight testing, comprising the following steps:

[0007] S1, setting a burning interface in a main control module, burning a backlight control program in a main control chip through the burning interface, so that the backlight control program is matched with the backlight requirement of the tested television;

[0008] S2, judging whether the driving board of the tested television is provided with a control chip or not;

[0009] If the drive board of the measured television is provided with a control chip, the pin of the master control chip of the master control module is configured as a standard signal compatible with the control chip;The standard signal includes:data output signal, clock signal, chip selection signal, data input signal;

[0010] If the drive board of the measured television is not provided with a control chip, the pin of the master control chip is configured as a drive signal compatible with the whole machine drive chip of the measured television;The drive signal includes at least one of SPB signal, OWC signal or single line signal;

[0011] S3、According to the backlight test operation, the corresponding backlight control signal is output to the drive board of the measured television through the backlight control program, and the working state of the backlight light source is controlled.

[0012] The backlight control method for television backlight test of the application does not need to start the mainboard of the measured television when testing the backlight of the television, and then the main control module matching the specific drive board can be connected to the external programmable backlight control program, so as to realize the external control of the backlight process of the measured television during the television backlight test;And by burning the backlight control program matching the backlight requirement of the measured television in the main control module, and according to the specific situation whether the drive board of the measured television is provided with a control chip, the pin of the master control chip is configured as the corresponding signal, the backlight program and the backlight control signal can be set according to the different backlight programs or backlight requirements of the measured television backlight drive board, so as to control the backlight of the television with different backlight programs, mainboards and backlight drive boards, and enhance the flexibility and universality of the television backlight control in the television backlight test.

[0013] In order to realize the purpose of the application, another technical scheme is adopted in the application:

[0014] A television backlight test method, comprising the following steps:

[0015] T1、Through the power input interface, power is supplied to the main control module, the backlight light source and the drive board of the measured television;

[0016] T2、Through the test input interface, the backlight test operation is input, the master control module responds to the backlight test operation, and then executes the backlight control program, generates the backlight control signal and outputs it to the drive board through the output interface.

[0017] The television backlight test method can supply power for the main control module through the power input interface, or can be connected to the backlight light source and the driving board of the tested television through the power control module, or the power board of the tested television can be turned on to supply power for the backlight light source and the driving board, thereby providing the required power for the backlight from the outside of the tested television, avoiding the problem of incorrect start or inability to start due to the difficulty in compatibility of the main board model of the tested television; and the backlight test operation is input through the test input interface, and the backlight control method in steps S1-S3 is combined to respond to the backlight test operation, and then the backlight control program matched with the tested television is executed to generate the corresponding backlight control signal and output to the driving board, so that the driving board can realize the backlight test of the tested television from the outside according to the backlight test operation, without starting the main board or the power board of the tested television to realize the backlight test or the test, and according to the backlight mode of the tested television, the backlight control program is rewritten to match the backlight mode of the tested television to generate the corresponding backlight control signal, so that the backlight control main board for the test or the test can be used for most tested televisions, thereby improving the universality of the television backlight test; and the simple power input interface connection and the test input interface connection are combined with the backlight control method of the application, so that the tested television can be quickly connected for the backlight test, the backlight test is more convenient, the efficiency of the backlight test is improved, and the production benefit is improved.

[0018] Preferably, the television backlight test method comprises the following steps:

[0019] The test input interface is connected to a test button, and the test input interface is in a high level by default;

[0020] If the test button is pressed, the test input interface outputs a low level to the main control module; and if the test button is released, the test input interface outputs a high level to the main control module;

[0021] The main control module reads the low / high level output by the test input interface and determines whether to enter the test mode.

[0022] As a preferred scheme of the application, the level of the test input interface is used to determine whether the main control module enters the test mode, so that the test personnel can accurately control whether the main control module enters the test mode, thereby enhancing the convenience of the test personnel, reducing the test error rate or failure rate caused by the complexity of the key control or the complexity of the start program of the tested television, and further improving the accuracy and reliability of the test.

[0023] Preferably, the television backlight test method comprises the following steps:

[0024] T21, a plurality of backlight control programs are burned in the master control chip in the S1; a static variable M is built in the master control chip, and the initial value is 0;

[0025] T22, when the master control chip receives N groups of high-low levels, the static variable M is increased by N, and N backlight control programs are called to perform N groups of backlight tests on the tested television; N represents a natural number except 0;

[0026] T23, when M=N+1, the value of M is reset, and the T22 is returned to be executed.

[0027] As a preferred scheme of the present application, by burning a plurality of backlight control programs in the master control chip, and through the steps of T21 to T23, the selection of executing the backlight control program of the master control chip once or multiple times can be realized according to the specific operation mode of the test input interface, further enhancing the flexibility of the television backlight test; and for the television requiring multiple backlight mode tests, multiple backlight tests can be performed, enhancing the comprehensiveness of the television backlight test and improving the universality of the backlight test.

[0028] Preferably, in the television backlight test method, a plurality of backlight control programs are burned in the master control chip in the S1; at least one corresponding backlight control program is selected and called according to the backlight test operation and the backlight mode of the tested television.

[0029] As a preferred scheme of the present application, by burning a plurality of backlight control programs in the master control chip, the backlight control program corresponding to the backlight mode of the tested television can be selected and called according to the test requirements of the backlight test operation and the backlight mode of the tested television, realizing the flexible selection of the corresponding backlight control program for different tested televisions, or realizing different backlight test items according to the requirements of the backlight test operation, and flexibly selecting the corresponding backlight control program for testing, further improving the flexibility of the television backlight test.

[0030] Preferably, the television backlight test method comprises the following steps in the T1:

[0031] The input voltage from the input interface is converted into the master control voltage, the backlight voltage and the driving voltage by the voltage conversion module; and the timing of the backlight voltage and the driving voltage is controlled by the timing control circuit.

[0032] As a preferred scheme of the present application, the voltage conversion is performed by the voltage conversion module, which can ensure the voltage stability of the master control voltage, the power supply voltage and the driving voltage; and the timing of the light source voltage and the driving voltage is controlled by the timing control circuit, which ensures that the light source voltage or the lamp bead voltage is stable when the driving board outputs the backlight control signal, so as to realize the dynamic adjustment of the current value of the lamp bead by the driving board, and ensure the reliability of the whole system.

[0033] Preferably, the television backlight test method of the present application specifically comprises the following steps of T1:

[0034] If the power board of the television to be tested can be turned on, the input voltage of the power input interface is connected to the control signal and timing control module by outputting a control signal through the power control module, and the input voltage is output to the backlight light source and the driving board through the control signal and timing control module, thereby controlling the voltage of the backlight light source and the driving board.

[0035] As a preferred scheme of the present application, if the power board of the television to be tested can be turned on, the voltage control of the backlight light source and the driving board can be realized through the control signal and timing control module, so as to realize the dynamic adjustment of the current value of the lamp beads by the driving board and ensure the reliability of the entire system.

[0036] In order to achieve the purpose of the present application, another scheme adopted by the present application is as follows:

[0037] A television backlight test system comprises an input interface, a power control module, a main control module and an output interface; the input interface is used for accessing power; the power control module is used for inputting voltage to the main control module and adjusting the voltage of the backlight power supply and the driving board in cooperation with the main control module.

[0038] The main control module comprises a main control chip, a signal processing unit, a burning interface and a test input interface; the main control chip is used for controlling the input or output of the backlight control signal; the signal processing unit is used for processing the backlight control signal; the burning interface is used for connecting a computer to realize rewriting of the backlight control program; the test input interface is used for external connection and input of test operation; and the output interface is used for outputting the backlight control signal of the main control module to the driving board of the television to be tested.

[0039] The television backlight test system of the present application does not need to start or use the main board of the television to be tested, so that the television backlight test is not limited by the compatibility of the main board of the television, and has strong universality; and compared with the traditional backlight control system for television backlight test, the system can rewrite the backlight control program through the main control module, can set the matching backlight control program according to different backlight modes or different backlight control requirements of the television to be tested, so that the backlight control system can more flexibly adapt to the requirements of the television backlight test, and the flexibility and applicability of the backlight test are improved.

[0040] Preferably, the television backlight test system of the present application, the chip pin of the main control chip

[0041] As described above, due to the adoption of the above technical scheme, the present application has the following beneficial effects:

[0042] 1. The backlight control method, when testing the backlight of a television, does not need to start the mainboard of the tested television, and further connects a burnable backlight control program and a main control module matching a specific drive board outside the tested television, so as to realize external control of the backlight process of the tested television during the backlight test of the television; and the backlight program and the backlight control signal can be set according to the backlight program or the backlight requirement of the backlight drive board of the tested television, so as to control the backlight of the television with different backlight programs, different mainboards and different backlight drive boards, and the flexibility and the universality of the backlight control in the television backlight test are enhanced.

[0043] 2. The television backlight test method, which can supply power to the backlight light source and the drive board from the outside of the tested television, avoids the problems of starting error or failure to start due to the difficulty in compatibility of the mainboard model of the tested television; and the backlight test operation is input through a test input interface, and the backlight control method in steps S1-S3 of the present application is combined to respond to the backlight test operation, so as to realize the backlight test of the tested television from the outside of the tested television, without starting the mainboard or the power board of the tested television, and the backlight test or the test is realized, so that the test or the test backlight control board can be used for most of the tested televisions, and the universality of the television backlight test is improved; and through the simple connection of the power input interface and the test input interface, and the backlight control method of the present application, the backlight test is more convenient, the efficiency of the backlight test is improved, and the production benefit is improved.

[0044] 3. The backlight test system, which does not need to start or use the mainboard of the tested television, and is not limited by the compatibility of the television mainboard when used for the television backlight test, and has strong universality; and compared with the traditional backlight control system for the television backlight test, the system can rewrite the backlight control program through the main control module, and can set the matching backlight control program according to the different backlight modes or different backlight control requirements of the tested television, so that the backlight control system can more flexibly adapt to the requirements of the television backlight test, and the flexibility and the applicability of the backlight test are improved. BRIEF DESCRIPTION OF DRAWINGS

[0045] Figure 1 is a flowchart of the backlight control method for the television backlight test of the present application;

[0046] Figure 2 is a flowchart of the television backlight test method of the present application;

[0047] Figure 3 is a module structure connection diagram of the television backlight test system of the present application. DETAILED DESCRIPTION

[0048] The present application will be described in detail below with reference to the drawings.

[0049] In order to make the objects, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and should not be used to limit the present application.

[0050] Embodiment 1

[0051] Referring to Figure 1 and Figure 2 The embodiment discloses a backlight control method for television backlight test, comprising the following steps:

[0052] S1, setting a burning interface in a master control module, burning a backlight control program in a master control chip through the burning interface, and matching the backlight control program with a backlight requirement of a television to be tested;

[0053] S2, judging whether a drive board of the television to be tested is provided with a control chip or not;

[0054] If the drive board of the television to be tested is provided with the control chip, pin configuration of the master control chip of the master control module is adapted to a standard signal of the control chip; the standard signal comprises a data output signal, a clock signal, a chip selection signal and a data input signal;

[0055] For example, the chip pin is configured as an SPI signal, such as an MOSI signal, an SCK signal, a CS signal and an MISO signal, which is adapted to the control chip on the drive board according to a standard SPI protocol, data is output to the drive board control chip through MOSI, SCK and CS output pins, and the drive chip outputs data to the master control module through the MISO pin.

[0056] Meanwhile, a special output pin of the control chip is fed back to the drive board through a connecting interface, the drive board feeds back to the master control chip of the master control module through an output interface, the master control chip judges faults according to the returned high and low levels, if it is a high level, there is no abnormality, and if it is a low level, there is an abnormality in the light bar or the light board.

[0057] If the drive board of the television to be tested is not provided with the control chip, the pin configuration of the master control chip is adapted to a drive signal of a drive chip of the whole machine of the television to be tested; the drive signal comprises at least one of an SPB signal, an OWC signal or a single-wire signal;

[0058] For example, the master control chip configures the chip pin according to the driving protocol matched with the whole machine driving chip as the corresponding driving signal, such as SPB signal, OWC signal or single-wire signal; the driving signal of the master control chip includes output signal and input signal, the output signal outputs data to the driving chip through the output pin, and the input signal returns data to the master control module through the output pin of the driving chip; wherein the SPB signal is understood as the shortest path bridge connection signal, which is used for communication connection between the master control chip and the driving board; the OWC signal is understood as the optical wireless communication signal, which is a wireless communication technology using light as the transmission medium, and is used for communication connection and data transmission between the master control chip and the driving board.

[0059] S3, according to the backlight test operation, output the corresponding backlight control signal to the driving board of the tested television through the backlight control program, and then control the working state of the backlight light source.

[0060] For example, considering that the factory connection line is long and the signal attenuation is serious, the backlight control signal output by the master control module is processed through a signal processing unit, such as an RC circuit for signal optimization or a signal enhancement circuit for signal enhancement, and then output to the driving board through the output interface. The driving board controls the driving chip on the light bar or light panel through the connection interface of the light bar or light panel, and then controls the working state of the lamp beads. The signal processing unit can be a simple RC circuit or a voltage dividing circuit, or a signal enhancement circuit.

[0061] The backlight of the tested television according to the application is understood as different specifications and models of the mainboard, driving board and power board of the television due to different requirements of the display color definition of the television, for example, different number of backlight partitions and different parameters of the backlight control circuit of different televisions, which require different backlight modes through the setting of the backlight control program. It can be understood as a specific backlight mode of a certain model of television and the corresponding backlight control program.

[0062] In this embodiment, reference is made to the module structure of the master control module shown in Figure 3 It can be known from the module structure of the master control module that the master control module can be connected to a computer or the like through a burning interface electrical signal to realize the burning of the backlight control program in the master control chip. The technical personnel can know the backlight control program of the tested television itself matched with the backlight requirement of the tested television through the backlight requirement or model of the tested television, and then realize the matching of the backlight control program burned in the master control chip with the backlight requirement of the tested television through rewriting or compiling.

[0063] Embodiment 2:

[0064] Reference is made to Figure 1 and Figure 2 On the basis of embodiment 1, the television backlight test method disclosed in this embodiment adopts the backlight control method for television backlight test as in embodiment 1, and includes the following steps:

[0065] T1, power input interface for the master module, the backlight of the measured television and the drive board power supply;

[0066] T2, through the test input interface input backlight test operation, the master module responds to the backlight test operation, and then executes the rewritten backlight control program S1, generates a backlight control signal and outputs it to the drive board through the output interface.

[0067] For example, the power input interface can be connected to a standard power board or a constant voltage source through a wiring harness to input a constant voltage VIN.

[0068] Specifically, the television backlight test method of the application, through the test input interface input backlight test operation, specifically includes the following steps: the test input interface is connected to the test button, and the test input interface is set to high level by default; if the test button is pressed, the test input interface outputs low level to the master module; if the test button is released, the test input interface outputs high level to the master module; the master module reads the low / high level output by the test input interface and judges whether to enter the test mode.

[0069] Specifically, the television backlight test method of the application, T2 further includes the following steps:

[0070] T21, S1 in the master control chip burn multiple backlight control programs; a static variable M is built in the master control chip, and the initial value is 0;

[0071] T22, when the master control chip receives N groups of high-low level, the static variable M increases by N, and N backlight control programs are called to test the measured television for N groups of backlight; N represents a natural number except 0;

[0072] T23, when M=N+1, M value is reset, and T22 is returned.

[0073] For example, the test mode contains N backlight control programs, a static variable M is built in, the initial value is 0, the IO input interface state appears 1 high→low, the static variable M increases by 1, and the first backlight control program is called.

[0074] Specifically, the television backlight test method of the application, S1 in the master control chip burn multiple backlight control programs; according to the backlight test operation and the backlight mode of the measured television, at least one corresponding backlight control program is selected and called.

[0075] Specifically, the television backlight test method of the application, T1 specifically includes the following steps: through the setting of the voltage conversion module, the input voltage from the input interface is converted into the master voltage, the backlight voltage and the drive voltage; through the timing control circuit, the timing of the backlight voltage and the drive voltage is controlled.

[0076] Specifically, the television backlight test method T1 specifically comprises the following steps: if the power board of the television to be tested can be turned on, outputting a control signal through a power control module, connecting the input voltage of the power input interface to the control signal and the timing control module, outputting the input voltage to the backlight light source and the drive board through the control signal and the timing control module, and then controlling the voltage of the backlight light source and the drive board.

[0077] For example, the voltage conversion module in the voltage control module can convert the power supply VCC required by the master control module or the power supply VDD required by the light bar driving chip using DCDC or LDO. If the power board is connected, the voltage required by the power board control signal BL_ON or STB can also be output. For devices with timing requirements, a timing control module is used to control the timing between different output voltages.

[0078] Embodiment 3:

[0079] Reference Figure 3 As shown in Embodiment 2, on the basis of Embodiment 2, the present embodiment discloses a television backlight test system for implementing the television backlight test method of Embodiment 2, comprising: an input interface, a power control module, a master control module, and an output interface; the input interface is used for accessing power; the power control module is used for inputting voltage to the master control module and adjusting the voltage of the backlight power supply and the drive board in cooperation with the master control module; the master control module comprises a master control chip, a signal processing unit, a burning interface, and a test input interface; the master control chip is used for controlling the input or output of the backlight control signal; the signal processing unit is used for processing the backlight control signal; the burning interface is used for connecting a computer to realize rewriting of the backlight control program; the test input interface is used for external connection and input of test operation; and the output interface is used for outputting the backlight control signal of the master control module to the drive board of the television to be tested.

[0080] The master control chip in the present application is understood as a programmable chip, such as a micro control unit MCU or a single chip microcomputer, which can be configured by software to configure the IO port into different backlight control signals, such as standard SPI signals or driving protocol signals; and then can output signals according to different signal protocol formats according to the definition of the pin IO port in the chip specification book, and connect to the corresponding drive board or light bar / light panel through the output interface, for controlling the working state of the lamp beads.

[0081] The test input interface in the present application can realize the input of test operation through electrical signal connection, wherein the test operation can be realized through test keys, for example, the test keys can be simple mechanical key switches, can be controlled through relays, or can be connected to PLC circuits for automatic key control.

[0082] The output interface can be an FFC socket or an electronic wire socket. The socket signal can include voltage, backlight control signal and the like, and is connected to a driving board or a lamp strip / lamp panel through a wire harness. The socket specification and pin definition are flexible and changeable to adapt to different overall driving schemes.

[0083] The above merely provides the preferred embodiments of the application, but not for limiting the application. Any modification, equivalent replacement and improvement made in the spirit and principle of the application shall be included in the protection scope of the application.

Claims

1. A backlight control method for TV backlight testing, characterized in that: The following steps are involved: S1. Setting a burning interface in the main control module, and burning a backlight control program in the main control chip through the burning interface so that the backlight control program matches the backlight requirements of the tested TV; S2, determining whether the driver board of the tested TV is equipped with a control chip; If the driver board of the TV under test is provided with a control chip, the pins of the main control chip of the main control module are configured as standard signals compatible with the control chip; the standard signals include: data output signal, clock signal, chip select signal, data input signal; If the driver board of the TV under test does not have a control chip, the pins of the main control chip are configured to provide a drive signal compatible with the driver chip of the TV under test; the drive signal includes at least one of an SPB signal, an OWC signal, or a single-line signal; S3. According to the backlight test operation, the backlight control program outputs a corresponding backlight control signal to the driver board of the tested TV, thereby controlling the working state of the backlight light source.

2. A TV backlight testing method, characterized in that: The backlight control method for TV backlight testing according to claim 1 is adopted, and comprises the following steps: T1, supply power to the main control module, the backlight source and the driver board of the TV under test through the power input interface; T2. Input a backlight test operation through the test input interface. The main control module responds to the backlight test operation and then executes the backlight control program to generate a backlight control signal and outputs it to the driver board through the output interface.

3. The TV backlight testing method according to claim 2, wherein: The step of inputting a backlight test operation through the test input interface specifically includes the following steps: The test input interface is connected to a test button, and the test input interface is at a high level by default; If the test button is pressed, the test input interface outputs a low level to the main control module; if the test button is released, the test input interface outputs a high level to the main control module; The main control module reads the low / high level output by the test input interface and determines whether to enter the test mode.

4. The TV backlight testing method according to claim 3, wherein: T2 also includes the following steps: T21, in S1, multiple backlight control programs are burned into the main control chip; a static variable M is built into the main control chip, with an initial value of 0; T22. When the main control chip receives N groups of high-low levels, the static variable M is increased by N, and N backlight control programs are called to perform N groups of backlight tests on the TV under test, respectively; N represents a natural number other than 0; T23. When M=N+1, the value of M is reset and the process returns to execute T22.

5. The TV backlight testing method according to claim 2, wherein: In the step S1 , a plurality of backlight control programs are burned into the main control chip; and at least one corresponding backlight control program is selected and called according to the backlight test operation and the backlight mode of the tested television.

6. The TV backlight testing method according to claim 2, wherein: The T1 specifically includes the following steps: By setting up a voltage conversion module, the input voltage from the input interface is converted into a main control voltage, a backlight voltage and a driving voltage; and the timing of the backlight voltage and the driving voltage is controlled by a timing control circuit.

7. The TV backlight testing method according to claim 2, wherein: The T1 specifically includes the following steps: If the power board of the TV under test can be turned on, a control signal is output through the power control module, and the input voltage of the power input interface is connected to the control signal and timing control module. Through the control signal and timing control module, the input voltage is output to the backlight light source and the driver board, thereby controlling the voltage of the backlight light source and the driver board.

8. A TV backlight test system, characterized in that: Used to implement the television backlight testing method according to claim 2, comprising: an input interface, a power control module, a main control module, and an output interface; the input interface is used to connect to the power supply; the power control module is used to input voltage to the main control module and cooperate with the main control module to adjust the voltage of the backlight power supply and the driver board; The main control module includes a main control chip, a signal processing unit, a burning interface and a test input interface; the main control chip is used to control the input or output of the backlight control signal; the signal processing unit is used to process the backlight control signal; the burning interface is used to connect to a computer to rewrite the backlight control program; the test input interface is used to externally connect and input test operations; and the output interface is used to output the backlight control signal of the main control module to the driver board of the TV under test.

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