Infrared temperature measurement jig

Abstract

The invention relates to an infrared temperature measurement jig. The jig comprises a base; the lifting plate is arranged on the base in a height-adjustable manner; the sample table is detachably mounted on the lifting plate; the two conductive elastic pieces are detachably installed on the base at intervals, one end of each conductive elastic piece and the sample table jointly form a limiting gap used for limiting the atomization core, and the distance between the two conductive elastic pieces is adjustable. According to the infrared temperature measurement jig, the conductive elastic sheets are detachably mounted on the base, and the distance between the two conductive elastic sheets is adjustable, so that different types of conductive elastic sheets can be replaced according to different requirements, and the distance between the two conductive elastic sheets can be adjusted according to the structure of the atomization core to meet the requirement of electric connection. Moreover, as the lifting plate is detachably mounted on the base and the height of the lifting plate relative to the base is adjustable, different types of sample tables can be selected as required, the height of the lifting plate can be adjusted according to the thickness of the atomizing core, and meanwhile, the atomizing core can be quickly mounted and dismounted.

Description

Technical Field

[0001] This application relates to the field of atomization technology, and in particular to an infrared temperature measuring fixture. Background Art

[0002] As the core functional component of electronic atomizing devices, the atomizer core is used to heat and atomize the aerosol generation matrix. The temperature distribution characteristics of the atomizer core directly determine the atomization efficiency, substance release, and user experience of the aerosol generation matrix. The uniformity of the temperature gradient on the atomization surface of the atomizer core directly affects the particle size distribution of the aerosol generated by atomization. Local overheating of the atomization surface will lead to a surge in the generation of odors and harmful substances. Therefore, accurately assessing the atomization temperature of the atomizer core is an indispensable part of the atomizer core design.

[0003] However, existing temperature detection devices for atomizer cores suffer from poor compatibility due to structural defects, making them unsuitable for atomizer cores of different shapes and sizes, thus hindering the research and development of atomizer cores. Summary of the Invention

[0004] Therefore, it is necessary to provide an infrared temperature measurement fixture to address the poor compatibility of temperature detection devices for atomizing cores.

[0005] An infrared thermometer fixture for detecting the temperature of an atomizing core, the infrared thermometer fixture comprising:

[0006] Base;

[0007] A lifting plate, height adjustable, is mounted on the base;

[0008] A sample stage, detachably mounted on the lifting plate; and

[0009] Two conductive springs are detachably and spaced apart on the base. One end of each conductive spring and the sample stage together form a limiting gap for limiting the atomizing core, and the distance between the two conductive springs is adjustable.

[0010] In one embodiment, the infrared temperature measuring fixture includes a driving mechanism, the driving mechanism comprising:

[0011] The speed reducer is mounted on the base.

[0012] The lifting knob is connected to the input end of the reducer; and

[0013] A transmission assembly is installed on the base. The transmission assembly is connected between the output end of the reducer and the lifting plate. The transmission assembly drives the lifting plate to rise and fall under the drive of the reducer.

[0014] In one embodiment, the infrared temperature measuring fixture further includes two spring-loaded mounting units, each spring-loaded mounting unit including a detachably connected mounting base and a cover plate, and each conductive spring-loaded device is correspondingly located between the mounting base and the cover plate of one spring-loaded mounting unit.

[0015] In one embodiment, the infrared temperature measuring fixture includes a spring adjustment mechanism, the spring adjustment mechanism comprising:

[0016] A fixing block is installed on the base and located on one side of the lifting plate;

[0017] The guide rail is mounted on the base and located between the lifting plate and the fixed block; and

[0018] A screw rod passes through the fixing block and is threadedly connected to the fixing block;

[0019] In one of the spring-loaded mounting units, the mounting seat is located on the guide rail and fixed to the screw, and the screw is used to drive the spring-loaded mounting unit to reciprocate along the guide rail.

[0020] In one embodiment, the conductive spring includes a metal substrate and a gold-plated conductive layer covering the surface of the metal substrate.

[0021] In one embodiment, the conductive spring includes a connecting portion, a fixing portion, and a contact portion. The connecting portion and the contact portion are respectively connected to opposite ends of the fixing portion, and the connecting portion and the contact portion extend toward opposite sides in the thickness direction of the fixing portion.

[0022] Wherein, the included angle θ between the fixing part and the contact part is ≥90°.

[0023] In one embodiment, the end of the contact portion away from the fixing portion is bent and extends parallel to the fixing portion; or

[0024] The contact portion is capable of extending and retracting in its own extension direction.

[0025] In one embodiment, the sample stage has a limiting groove for placing the atomizing core.

[0026] In one embodiment, the bottom wall of the limiting groove is provided with a support bracket for supporting the atomizing core.

[0027] In one embodiment, the sample stage is provided with a liquid tank, and a liquid storage cavity is formed inside the liquid tank. The sample stage is also provided with a liquid guiding channel that connects the limiting groove and the liquid storage cavity. The liquid tank is provided with a ventilation hole that connects the liquid storage cavity and the outside atmosphere.

[0028] The aforementioned infrared thermometer fixture features detachable conductive springs mounted on the base, with adjustable distance between the two springs. This allows for the replacement of different types of conductive springs to meet varying requirements, and the distance between the two springs can be adjusted according to the atomizing core's structure to satisfy electrical connection requirements. Furthermore, since the lifting plate is detachably mounted on the base and its height relative to the base is adjustable, not only can different types of sample stages be selected as needed, but the height of the lifting plate can also be adjusted according to the atomizing core's thickness, enabling rapid installation and removal of the atomizing core. Attached Figure Description

[0029] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.

[0030] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0031] Figure 1 This is a schematic diagram of the structure of an infrared temperature measuring fixture according to an embodiment of this application.

[0032] Figure 2 for Figure 1 An exploded view of the infrared thermometer fixture shown.

[0033] Figure 3 This is a schematic diagram of the structure of a conductive spring sheet according to an embodiment of this application.

[0034] Figure 4 This is a schematic diagram of the structure of a conductive spring sheet according to another embodiment of this application.

[0035] Figure 5 This is a schematic diagram of the structure of a conductive spring sheet according to another embodiment of this application.

[0036] Figure 6 This is a schematic diagram of the sample stage according to an embodiment of this application.

[0037] Figure 7 This is a schematic diagram of the sample stage according to another embodiment of this application.

[0038] Figure 8 This is a schematic diagram of the sample stage according to another embodiment of this application.

[0039] Figure 9 This is a schematic diagram of the sample stage according to another embodiment of this application.

[0040] Figure 10 for Figure 9 The sample stage shown is a cross-sectional view.

[0041] Explanation of reference numerals in the attached figures:

[0042] 100. Infrared temperature measuring fixture; 110. Base; 112. Base top wall; 120. Lifting plate; 130. Sample stage; 130a. Limiting groove; 130b. Liquid guiding channel; 132. Support bracket; 140. Liquid tank; 141. Tank cover; 140a. Liquid storage chamber; 150. Conductive spring; 152. Connecting part; 154. Fixing part; 156. Contact part; 160. Drive mechanism; 161. Lifting knob; 163. Reducer; 165. Transmission assembly; 1652. Transmission plate; 1654. Lifting rod; 170. Spring mounting unit; 172. Mounting seat; 174. Cover plate; 180. Spring adjusting mechanism; 181. Fixing block; 183. Guide rail; 185. Slider; 187. Screw. Detailed Implementation

[0043] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0044] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0045] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0046] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0047] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0048] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0049] See Figure 1 and Figure 2 This application provides an infrared temperature measuring fixture 100, which is used in conjunction with an infrared thermal imager to detect the temperature of the atomizing surface applied to the atomizing core during the atomization process. The atomizing core is used in an electronic atomization device to heat and atomize the aerosol generation matrix.

[0050] The infrared temperature measuring fixture 100 includes a base 110, a lifting plate 120, a sample stage 130, and two conductive springs 150. The lifting plate 120 is height-adjustably mounted on the base 110, the sample stage 130 is detachably mounted on the lifting plate 120, and the two conductive springs 150 are detachably and spaced apart on the base 110. One end of each conductive spring 150 and the sample stage 130 together form a limiting gap for limiting the atomizing core, and the distance between the two conductive springs 150 is adjustable.

[0051] In this way, the atomizing core can be placed on the sample stage 130, and then the atomizing core is limited and electrically connected to the atomizing core through the conductive spring 150. An external power supply can apply electrical energy to the atomizing core through the conductive spring 150. The atomizing core can heat up under the action of electrical energy to heat the atomized aerosol to generate a matrix. During this process, the infrared thermal imager is located directly above the atomizing core to obtain the temperature of the atomizing core.

[0052] Since the conductive springs 150 of the infrared thermometer fixture 100 are detachably mounted on the base 110, and the distance between the two conductive springs 150 is adjustable, different types of conductive springs 150 can be replaced according to different requirements. Furthermore, the distance between the two conductive springs 150 can be adjusted according to the structure of the atomizing core to meet electrical connection requirements. Moreover, since the lifting plate 120 is detachably mounted on the base 110 and its height relative to the base 110 is adjustable, not only can different types of sample stages 130 be selected as needed, but the height of the lifting plate 120 can also be adjusted according to the thickness of the atomizing core, simultaneously enabling rapid installation and removal of the atomizing core.

[0053] Please continue reading. Figure 1 and Figure 2 The base 110 has a hollow cubic shell structure, including a base top wall 112, a base bottom wall, and a base side wall connected between the base top wall 112 and the base bottom wall. The base side wall surrounds the base bottom wall and the base top wall 112 in the circumferential direction to form a base receiving cavity.

[0054] Specifically, in the following embodiments, the length direction of the base 110 is defined as the first direction (i.e., Figure 1 The X direction shown), and the width direction of the base 110 are the second direction (i.e., Figure 1 The Y direction shown), the height direction of the base 110 is the third direction (i.e., Figure 1 (as shown in the Z direction), wherein the first direction, the second direction, and the third direction intersect each other. In a preferred embodiment, the first direction, the second direction, and the third direction are perpendicular to each other, and the third direction is parallel to the vertical direction.

[0055] The lifting plate 120 has a rectangular flat plate structure and is supported on the top wall 112 of the base. A mounting groove is provided on the side of the lifting plate 120 facing away from the top wall 112 of the base. The mounting groove is open on one side in a second direction, so the sample stage 130 can be inserted into the mounting groove along the second direction. Thus, the sample stage 130 is detachably mounted on the lifting plate 120, allowing for the replacement of different types of sample stages 130 as needed.

[0056] The infrared temperature measuring fixture 100 includes a drive mechanism 160, which drives the lifting plate 120 to move up and down in a third direction to change its installation height relative to the top wall 112 of the base.

[0057] In some embodiments, the drive mechanism 160 includes a lifting knob 161, a reducer 163, and a transmission assembly 165. The reducer 163 is located within the base receiving cavity, the lifting knob 161 is mounted on the input end of the reducer 163 and located outside the base receiving cavity, and the transmission assembly 165 is located within the base receiving cavity and is drively connected to the reducer 163 and the lifting plate 120. The transmission assembly 165 drives the lifting plate 120 to rise and fall under the influence of the reducer 163. Furthermore, when the conductive spring 150 applies downward pressure to the atomizing core, the reducer 163 prevents the lifting plate 120 from moving upwards under the push of the atomizing core.

[0058] In one specific embodiment, the transmission assembly 165 includes a transmission plate 1652, multiple lifting rods 1654, and connecting rods. The transmission plate 1652 is fixed to one side of the lifting plate 120 via a fixing post. One end of each lifting rod 1654 is mounted to the bottom wall of the base, and the other end of each lifting rod 1654 is fixed to the transmission plate 1652. The lifting rods 1654 can extend and retract in a third-dimensional direction. The output end of the reducer 163 is connected to the transmission plate 1652 via a connecting rod. The torque output by the reducer 163 is converted into reciprocating movement of the transmission plate 1652 in a third-dimensional direction via the connecting rod, thereby driving the lifting plate 120 to rise and fall in that direction. The lifting rods 1654 provide support and guidance for the transmission plate 1652, ensuring smooth movement of the transmission plate 1652 in the third-dimensional direction. It is understood that the specific structure of the transmission assembly 165 is not limited to this and can be configured as needed to meet different transmission requirements.

[0059] Please continue reading. Figure 1 and Figure 2 The infrared temperature measuring fixture 100 also includes two spring clip mounting units 170, which are located on opposite sides of the lifting plate 120 in a first direction. Each spring clip mounting unit 170 includes a detachably connected mounting base 172 and a cover plate 174. The mounting base 172 is an elongated structure extending along the first direction, and a groove is formed at one end of the mounting base 172 facing the lifting plate 120. The cover plate 174 is fixed in the groove by screws or other fasteners. Each conductive spring clip 150 can be correspondingly positioned between the mounting base 172 and the cover plate 174 of one spring clip mounting unit 170. In this way, the conductive spring clip 150 is detachably mounted on the spring clip mounting unit 170, and the conductive spring clip 150 can be replaced by removing or installing the cover plate 174.

[0060] In some embodiments, the infrared thermometer fixture 100 includes a spring adjustment mechanism 180 for adjusting the distance between one conductive spring 150 and another conductive spring 150.

[0061] In some specific embodiments, the spring adjustment mechanism 180 includes a fixing block 181, a guide rail 183, a slider 185, and a screw 187. The fixing block 181 is mounted on the base 110 and located on one side of the lifting plate 120 in a first direction. The screw 187 passes through the fixing block 181 along the first direction and is threadedly connected to it. The guide rail 183 is mounted on the base 110 and located between the lifting plate 120 and the fixing block 181, extending along the first direction. The slider 185 is mounted on the guide rail 183 and can reciprocate along it in the first direction. A mounting base 172 of a spring mounting unit 170 is mounted on the slider 185 and fixed to one end of the screw 187.

[0062] Thus, when the screw 187 is rotated, the screw 187 rotates relative to the fixed block 181 and moves in the first direction, thereby driving the spring plate mounting unit 170 to reciprocate along the guide rail 183 in the first direction via the slider 185, thereby adjusting the distance between the two conductive spring plates 150.

[0063] The conductive spring 150 has an elongated structure, including a metal substrate and a gold-plated conductive layer covering the surface of the metal substrate, thereby reducing the contact resistance of the conductive spring 150. In a preferred manner, the resistance value of the conductive spring 150 is less than 1% of the resistance value of the atomizing core being measured.

[0064] Please combine Figure 1 and Figure 3 As shown, the conductive spring 150 includes an integrally formed connecting portion 152, a fixing portion 154, and a contact portion 156. The connecting portion 152 and the contact portion 156 are respectively connected to opposite ends of the fixing portion 154, and the connecting portion 152 and the contact portion 156 extend toward opposite sides in the thickness direction of the fixing portion 154. Thus, the fixing portion 154 is confined within the spring mounting unit 170 and parallel to the first direction, the connecting portion 152 extends obliquely upward in a direction away from the sample stage 130 for connection with an external power supply structure, and the contact portion 156 extends obliquely downward toward the side where the other spring mounting unit 170 is located for contacting the atomizing core under test for electrical connection with the atomizing core.

[0065] In a preferred embodiment, the included angle θ between the fixing part 154 and the contact part 156 is ≥90°, thereby preventing the conductive spring 150 from obstructing the atomization surface of the atomizing core detected by the infrared thermal imager during testing. Depending on the strength of different atomizing cores or testing requirements, the contact part 156 can be configured in different forms to contact the atomization surface of the atomizing core.

[0066] Specifically, in one embodiment, such as Figure 3 As shown, the end face of the contact portion 156 away from the fixing portion 154 contacts the atomizing core. In another embodiment, as... Figure 4As shown, the end of the contact portion 156 away from the fixing portion 154 is bent and extended parallel to the fixing portion 154, thereby having a larger contact area with the atomizing core. In other embodiments, such as Figure 5 As shown, the contact portion 156 has a cylindrical structure and can extend and retract in its own extension direction, thereby automatically adjusting its own length to match the atomizing core.

[0067] It is understandable that the shape of the contact part 156 is not limited and can be set to different shapes as needed to meet the testing requirements of different atomizing cores.

[0068] Please combine Figure 1 , Figure 2 as well as Figure 6 As shown, the sample stage 130 has a rectangular flat plate structure. A limiting groove 130a for placing the atomizing core is provided on one side of the sample stage 130. Specifically, in one embodiment, the limiting groove 130a has a circular cross-section. It is understood that the shape of the limiting groove 130a is not limited to this and can be set as needed to meet different limiting requirements.

[0069] The sample stage 130 can be formed of a non-conductive, poorly thermally conductive, non-corrosive to the atomizing liquid, and easy-to-process material. Specifically, in some embodiments, the sample stage 130 can be formed of at least one of PMMA (polymethyl methacrylate), PCTG (polyethylene terephthalate-1,4-cyclohexanediol), PC (polycarbonate), and high-temperature resistant ceramics. It is understood that the material forming the sample stage 130 is not limited to these and can be selected as needed to meet different detection requirements.

[0070] like Figure 7 As shown, in some embodiments, the bottom wall of the limiting groove 130a is provided with a support bracket 132 for supporting the atomizing core. The support bracket 132 includes two support parts, which are spaced apart to form a liquid guiding gap between the atomizing core and the bottom wall of the limiting groove 130a. The aerosol generating matrix can enter the bottom of the atomizing core through the liquid guiding gap.

[0071] like Figure 8 As shown, in some embodiments, the support bracket 132 of the bottom wall of the limiting groove 130 includes four support parts, which are arranged in a matrix and form a cross-shaped liquid guiding gap between them. The aerosol generation matrix can enter the bottom of the atomizing core through the liquid guiding gap.

[0072] like Figure 9 and Figure 10As shown, in some embodiments, the limiting groove 130a is located on one side of the sample stage 130 along its length. A cylindrical liquid reservoir 140 is provided on the side of the sample stage 130 away from the limiting groove 130a along its length. The liquid reservoir 140 forms a storage chamber 140a for storing the aerosol generation matrix. The sample stage 130 also has a liquid guiding channel 130b connecting the limiting groove 130a and the storage chamber 140a. Thus, the aerosol generation matrix in the storage chamber 140a can enter the limiting groove 130a through the liquid guiding channel 130b.

[0073] Furthermore, the side wall of the liquid reservoir 140 is provided with a vent 140b that connects the liquid storage chamber 140a to the external atmosphere, and the vent 140b is located on the side of the liquid reservoir 140 closer to the sample stage 130. A communication port is provided at the end of the liquid reservoir 140 away from the sample stage 130, and the communication port is sealed by a cover 141. The cover 141 is formed of a material such as silicone or rubber that can elastically deform under external force. The cover 141 has a communication hole for connecting a pressure gauge, which is used to detect the pressure inside the liquid storage chamber 140a.

[0074] Thus, the sample stage 130 can simulate the actual working scenario of the atomizing core within an electronic atomizing device. During the test, the aerosol-generating matrix within the storage chamber 140a is continuously consumed, creating a negative pressure at the top of the storage chamber 140a. Once the negative pressure increases to a certain level, external air enters the storage chamber 140a through the ventilation port 140b, thereby achieving a dynamic negative pressure balance. The size of the ventilation port 140b can be adjusted to regulate the magnitude of the negative pressure within the storage chamber 140a.

[0075] The infrared temperature measurement fixture 100 described above has good compatibility and wide applicability. It can be adapted to atomizing cores of different shapes and sizes by adjusting the conductive spring 150 and the sample stage 130, which facilitates rapid analysis in the atomizing core development stage. Moreover, the replacement and adjustment of the sample stage 130 and the conductive spring 150 are relatively convenient, thereby achieving high testing efficiency.

[0076] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0077] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. An infrared thermometer fixture for detecting the temperature of an atomizing core, characterized in that, The infrared temperature measuring fixture includes: base; A lifting plate, height adjustable, is mounted on the base; A sample stage, detachably mounted on the lifting plate; and Two conductive springs are detachably and spaced apart on the base. One end of each conductive spring and the sample stage together form a limiting gap for limiting the atomizing core, and the distance between the two conductive springs is adjustable.

2. The infrared temperature measuring fixture according to claim 1, characterized in that, The infrared temperature measuring fixture includes a driving mechanism, which includes: The speed reducer is mounted on the base. The lifting knob is connected to the input end of the reducer; and A transmission assembly is installed on the base. The transmission assembly is connected between the output end of the reducer and the lifting plate. The transmission assembly drives the lifting plate to rise and fall under the drive of the reducer.

3. The infrared temperature measuring fixture according to claim 1, characterized in that, The infrared temperature measuring fixture also includes two spring-loaded mounting units. Each spring-loaded mounting unit includes a detachably connected mounting base and a cover plate. Each conductive spring is correspondingly located between the mounting base and the cover plate of one of the spring-loaded mounting units.

4. The infrared temperature measuring fixture according to claim 3, characterized in that, The infrared temperature measuring fixture includes a spring adjustment mechanism, which includes: A fixing block is installed on the base and located on one side of the lifting plate; A guide rail is installed on the base and located between the lifting plate and the fixing block; The slider is movably limited within the guide rail; A screw rod passes through the fixing block and is threadedly connected to the fixing block; In one of the spring-loaded mounting units, the mounting base is mounted on the slider and fixed to the screw, and the screw is used to drive the spring-loaded mounting unit to reciprocate along the guide rail.

5. The infrared temperature measuring fixture according to claim 1, characterized in that, The conductive spring includes a metal substrate and a gold-plated conductive layer covering the surface of the metal substrate.

6. The infrared temperature measuring fixture according to claim 1, characterized in that, The conductive spring includes a connecting portion, a fixing portion, and a contact portion. The connecting portion and the contact portion are respectively connected to opposite ends of the fixing portion, and the connecting portion and the contact portion extend to opposite sides in the thickness direction of the fixing portion. Wherein, the included angle θ between the fixing part and the contact part is ≥90°.

7. The infrared temperature measuring fixture according to claim 6, characterized in that, The end of the contact portion away from the fixing portion is bent and extended parallel to the fixing portion; or The contact portion is capable of extending and retracting in its own extension direction.

8. The infrared temperature measuring fixture according to claim 1, characterized in that, The sample stage has a limiting groove for placing the atomizing core.

9. The infrared temperature measuring fixture according to claim 8, characterized in that, The bottom wall of the limiting groove is provided with a support bracket for supporting the atomizing core.

10. The infrared temperature measuring fixture according to claim 8, characterized in that, The sample stage is provided with a liquid tank, and a liquid storage cavity is formed inside the liquid tank. The sample stage is also provided with a liquid guiding channel that connects the limiting groove and the liquid storage cavity. The liquid tank is provided with a ventilation hole that connects the liquid storage cavity and the outside atmosphere.

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