Power station test waveform distributed acquisition and centralized display automatic processing method

Abstract

The invention relates to a power station test waveform distributed acquisition, centralized display and automatic processing method, which comprises the following steps of: 1, distributed acquisition: acquiring a rotating speed signal of a power station unit through a rotating speed acquisition device, acquiring rotating speed waveform data of the unit close to the unit by using a Hall sensor, acquiring an electrical parameter signal of the unit through an electrical acquisition device, converting the two signals into digital signals; 2, data uploading: the rotating speed acquisition device and the electrical acquisition device upload digital signals to a centralized processing interaction unit through an Ethernet switch; a Hall sensor acquires a pulse signal, performs primary calculation and uploads data; 3, centralized processing: performing real-time waveform display, automatic waveform processing and interaction on the digital signal by a centralized processing interaction unit, and automatically calculating a steady-state fluctuation rate, a transient adjustment rate and stable time; and 4, data storage and report generation: storing the original data and the analysis result to a database server, and generating a test report according to a user instruction.

Description

Technical Field

[0001] This invention belongs to the field of power system monitoring technology, specifically relating to a method and system for distributed acquisition, centralized display and automatic processing of power plant test waveforms, applicable to factory testing and operation monitoring of power plant equipment such as diesel generator sets and steam turbine generator sets. Background Technology

[0002] During factory testing, power plants (such as diesel generator sets and steam turbine generator sets) undergo dynamic parameter acquisition and processing to verify the compliance of various dynamic parameters (speed, voltage, and current). Currently, only oscilloscopes for acquiring these dynamic parameters exist on the market; there are no devices available that can automatically process the required parameters for ship power plants.

[0003] During factory testing of marine power plant equipment (taking diesel generator sets as an example, hereinafter referred to as generator sets), waveforms of speed, voltage, and current are measured to verify whether the generator set's performance indicators meet the requirements. This is done to calculate indicators such as steady-state speed fluctuation rate, transient speed regulation rate and settling time, steady-state voltage fluctuation rate, transient voltage change rate and settling time. Currently available oscilloscope acquisition devices have two problems: firstly, they only offer waveform acquisition and display capabilities, and the output waveforms are mostly in image format and cannot be edited; secondly, the large size of these devices makes flexible on-site testing difficult. Thirdly, most existing acquisition and display devices are integrated, requiring close proximity to the tested equipment, resulting in poor testing conditions for personnel. Fourthly, remote control room acquisition methods often result in weak sensor signal anti-interference capabilities.

[0004] In existing related technologies, such as the automatic monitoring device for ship power plant testing disclosed in patent document (CN200972497Y), data receiving and storage devices and computers are used for data processing. However, this device does not adopt a distributed acquisition architecture, has weak anti-interference capabilities, and cannot achieve real-time waveform analysis and automatic report generation, resulting in insufficient flexibility. The ship collision avoidance monitoring device disclosed in patent document (CN116795028A), although employing a multi-core architecture for data processing, is mainly aimed at the status monitoring and collision avoidance early warning of ship actuators. Its application scenario differs from power plant testing, and it does not involve distributed acquisition and automatic waveform processing functions.

[0005] Therefore, there is an urgent need for a system with distributed data acquisition, centralized processing, automatic analysis, and report generation capabilities to solve the problems of weak anti-interference ability, poor flexibility, and low efficiency in existing technologies. Summary of the Invention

[0006] To address the aforementioned issues, this invention proposes a distributed acquisition, centralized display, and automatic processing method for power plant test waveforms. Firstly, the distributed acquisition and centralized display processing increases testing flexibility, enhances anti-interference capabilities, and improves the testing environment for monitoring personnel. Secondly, the collected data is automatically processed to generate relevant indicators such as volatility, adjustment rate, and settling time, increasing the intuitiveness of the testing process and significantly improving convenience. The method directly generates reports, eliminating the need for post-test data processing.

[0007] To achieve the above objectives, the technical solution of the present invention is: a method for distributed acquisition, centralized display, and automatic processing of power plant test waveforms, comprising the following steps:

[0008] S1: Distributed acquisition: The speed signal of the power plant unit is acquired through the speed acquisition device, the speed waveform data of the unit is acquired using Hall sensors close to the unit, and the electrical parameter signal of the unit is acquired through the electrical acquisition device. Both signals are converted into digital signals.

[0009] S2: Data Upload: The speed acquisition device and electrical acquisition device upload digital signals to the centralized processing and interaction unit via an Ethernet switch; the Hall sensor acquires a pulse signal, performs a calculation, and uploads the data.

[0010] S3: Centralized Processing: The centralized processing and interaction unit displays the digital signal waveform in real time, automatically processes and interacts with the waveform, and automatically calculates the steady-state volatility, transient regulation rate and settling time.

[0011] S4: Data Storage and Report Generation: Store raw data and analysis results to the database server and generate test reports according to user instructions.

[0012] Furthermore, in step S1, the process of acquiring the rotational speed signal includes: the Hall sensor generates a pulse signal for each measurement point it senses, the rotational speed data processing module records the time interval between adjacent pulse signals, calculates the rotational period and rotational speed, and uploads the rotational speed data every 20ms.

[0013] Furthermore, the calculation process for acquiring the rotational speed signal includes: initializing an array a[i] of size i, where i is the number of measurement points on the rotation axis; recording the rotation time between adjacent measurement points and storing it in array a[i]; summing the elements of array a[i] to obtain the time b for one rotation, and calculating the rotational speed n = 60 / b; and uploading the rotational speed n to the Ethernet switch every preset time of 20ms.

[0014] Furthermore, in step S1, the speed acquisition device is equipped with a speed acquisition verification mechanism. During the operation of the unit, the self-control will collect speed data and upload it through RS485 communication. The speed acquisition device calculates the average speed N1 within the past communication period according to the RS485 communication cycle, and compares it with the speed data N2 collected and uploaded by the unit itself by making a difference I = |N1-N2|≤1. If the calculated difference is greater than the deviation value, an alarm signal is uploaded.

[0015] Further, in step S1, the electrical parameter acquisition process includes: all electrical parameters are processed into effective values ​​in the electrical acquisition device. The electrical acquisition device acquires the real-time values ​​of the unit's output voltage and current through the transformer and current transformer, and calculates the effective values ​​through the phase-locked loop algorithm. The acquisition process of the electrical acquisition device is as follows: the FPGA controls the AD chip to acquire electrical parameters, periodically sends them to the ARM chip, and completes the phase-locked loop calculation on the ARM chip to obtain the effective values. The sampling frequency of the electrical acquisition device is set to sam = 10kHz. A phase-locked loop calculation is performed every three acquisition points to obtain an effective value. The effective values ​​are stored sequentially in the array a[]. After the array is full and t0 = 20ms of data is acquired, the array is uploaded to the Ethernet.

[0016] Furthermore, in step S3, the automatic waveform processing and interaction includes the calculation process of speed fluctuation rate, the calculation process of unit transient regulation rate and stabilization time; the speed fluctuation rate calculation process includes: extracting the highest value n1 and the lowest value n2 of the parameter within a preset time window; calculating the average value n m = (n1+n2) / 2; according to the formula or Calculate volatility.

[0017] Furthermore, the calculation process for the unit's transient adjustment rate and settling time includes: displaying and automatically processing the speed waveform, automatically processing electrical parameters, identifying transient extreme points and steady-state values ​​before abrupt changes in the parameter waveforms; according to the formula:

[0018]

[0019] Calculate the transient adjustment rate; determine the time point at which the parameters recover to the steady-state volatility range, and the difference between this time point and the moment of abrupt change is the steady-state time; where: δ d For transient rate of change, %; n min The lowest instantaneous rotational speed, in r / min; n i The rotational speed before the sudden increase is expressed in r / min; n N This is the rated speed, expressed in r / min.

[0020] Furthermore, the rotational speed waveform is displayed and automatically processed: A time display window time T is received from the interactive interface. cConfirm waveform display array size Initialize a speed curve array a[i]; the centralized processing interactive unit receives speed data from the corresponding port of the speed acquisition device, parses it, and stores the data one by one in array a[i]. When array a[i] is full, the last i-1 positions of array a[i] are truncated to form a new array b[i-1]. The newly received data is concatenated to b[i-1] to form a new array, and the array is assigned to a[i]. This process is repeated to continuously update array a[i]; a waveform graph with the elements of array a[i] as the vertical axis and the time interval t0 as the horizontal axis is drawn in real time on the interactive interface. As array a[i] changes, the waveform graph is updated and displayed in real time on the interactive interface; during the process of receiving unit speed data, the data is continuously stored in the database. A storage mark is performed every 1 minute for subsequent historical data callback work, including...

[0021] c) Automatic processing of speed fluctuation rate

[0022] Initialize the maximum speed n1 and minimum speed n2 data. Upon receiving new data, assign the data to n1 and n2 respectively. Upon receiving new data again, compare the data with n1 and n2 respectively, and reassign the new maximum and minimum speeds to n1 and n2 respectively. While continuously updating the array a[i], confirm the values ​​of n1 and n2 in real time and calculate the volatility according to the speed volatility calculation formula, displaying it in real time on the interactive interface. When outputting the test report, print the waveform, maximum speed, minimum speed, and volatility in the same report in real time.

[0023] d) Automatic processing of transient rate adjustment and settling time

[0024] Upon receiving a sudden acceleration / deceleration transient change command from the interactive interface, the background process automatically extracts the speed array a[i], generates a report, as follows:

[0025] Initialize the steady-state data arrays q[j] and h[j] before the transient change and after the transient change, respectively. Use the optimized traversal method to find the extreme value a[ext] in the rotation speed array a[i], where ext is the position of the corresponding element of the extreme value in the array a[i].

[0026] According to the aforementioned average speed formula Calculate the average rotational speed q[j] and h[j] respectively. nm h nm Value; find the element value and corresponding position before the transient change a[q] s The search for |q is found by iterating from the ext position forward through the array. nmThe value of i corresponding to -a[ext-i++]|<1 is taken as q. s =ext-,

[0027] The transient speed regulation rate can then be calculated:

[0028]

[0029] According to the national standard requirements for speed fluctuation rate, the fluctuation rate should be controlled within ±0.5%. The allowable range of speed fluctuation after transient speed change is calculated as x = 0.5%h. nm Of which 0.5% can be set separately according to different standard requirements;

[0030] Based on the definition of steady time, the position corresponding to the transient change has now been identified as q. s Now we need to determine the position of entering the steady-state fluctuation range. We use a traversal method to search backward from the i-1 position in array a[i], that is, to find the j value corresponding to |xa[(i-1)-j++]|<1. We then take the element and position that enters the steady-state range after the transient change as a[h s ] = a[(i-1)-j];

[0031] Based on the above calculations, the settling time is:

[0032] t1=(h s -q s )t0

[0033] Based on the above calculation results, the rotational speed curve is plotted on the interactive interface, and schematic lines are drawn at the corresponding transient changes and the positions where steady-state fluctuations begin. After receiving the print command from the interactive interface, the report is output directly.

[0034] Furthermore, automatic processing of electrical parameters: The system receives a time display window time Tc from the interactive interface and confirms the waveform display array size i = T. c (sam), where sam is the sampling rate; initialize an electrical curve array a[i][3]; the display and automatic processing calculation of electrical parameters are the same as the speed processing method, the difference being that they are processed and displayed simultaneously with multiple curves.

[0035] Furthermore, in step S4, the test report includes waveforms, maximum value, minimum value, average value, volatility, transient adjustment rate, and settling time, and indicates whether the preset standard is met.

[0036] The beneficial effects of this invention are:

[0037] This invention utilizes a distributed acquisition of dynamic parameters followed by centralized display and processing. Distributed acquisition significantly reduces signal attenuation and interference during long-distance transmission, while centralized display and processing greatly improves the testing environment for personnel and allows for centralized, automated processing and report generation using concentrated computing power. Power plants typically experience high operation and maintenance costs during testing; this testing system can drastically shorten the testing cycle, thereby significantly reducing costs. This method displays waveforms in real-time, processes data, and determines data quality. Automatic data processing can be paused at any time during testing, avoiding human error during post-processing. Potential faults often manifest in waveforms; real-time display and automatic processing of waveforms can provide early warnings of equipment failures. Furthermore, this method stores waveform data in a database and allows for historical data recall at any time. After a fault occurs, the method can analyze the fault waveform at the corresponding time point to assist in determining the cause of the equipment failure. The establishment of a waveform file database provides data support for subsequent equipment fault diagnosis and digital model building. Attached Figure Description

[0038] Figure 1 It is a distributed acquisition, centralized processing, and display system;

[0039] Figure 2 This refers to the rotational speed acquisition process:

[0040] Figure 3 It is the transient rate of change and the settling time.

[0041] Figure 4 This is an example of a speed fluctuation rate report; it is a test report format for speed fluctuation rate.

[0042] Figure 5 This is an example of a test report format for transient performance indicators, including transient rate of change and settling time.

[0043] Figure 6 This is an example of a voltage volatility report, in the format of a test report for voltage volatility.

[0044] Figure 7 This is an example of a test report format for transient voltage regulation rate and settling time reports, representing transient voltage performance indicators. Detailed Implementation

[0045] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0046] The present invention provides an automatic processing method for distributed acquisition, integrated display, and processing of test waveforms for marine power stations, as detailed below:

[0047] (1) Centralized waveform window display, real-time processing of volatility, transient adjustment rate and time and generation of reports, waveform data database storage and real-time historical data recall;

[0048] (2) Multi-channel speed and multi-channel electrical parameters are distributedly acquired and processed into digital signals and uploaded to Ethernet;

[0049] (3) The unit speed waveform data is collected using a Hall sensor near the unit. The acquisition device performs a calculation and uploads the data every time it receives a pulse signal.

[0050] (4) The unit's electrical parameters are collected by the AD chip controlled by the FPGA and periodically sent to the ARM. The phase-locked loop calculation is completed on the ARM, and the calculation results are uploaded periodically.

[0051] (5) Distributed acquisition and centralized display and processing enhance the anti-interference ability and flexibility of acquisition, and improve the testing environment for testers.

[0052] like Figure 1 As shown, the method of this invention achieves its purpose through distributed acquisition of dynamic parameters and centralized display and processing. Distributed acquisition can significantly reduce signal attenuation and interference during long-distance transmission, while centralized display and processing greatly improves the testing environment for personnel and allows for centralized, automated processing and report generation using concentrated computing power. The speed acquisition device collects dynamic parameters of the unit's speed via a Hall sensor, while the electrical acquisition device directly collects dynamic electrical parameters of the unit. Both acquisition devices convert the collected signals into digital signals, which are then uploaded to the upper-layer Ethernet via a switch. The centralized processing and interaction unit receives signals from the speed acquisition device and the electrical acquisition device on the Ethernet and displays the waveforms in real time. Interactive buttons are provided for real-time waveform analysis, and the waveform data is stored in a database for historical retrieval.

[0053] Specific implementation process:

[0054] (1) Rotation speed acquisition process

[0055] like Figure 2 As shown, the unit has i measuring points arranged on its rotating shaft. After the unit starts, the Hall sensor (or photoelectric sensor, hereinafter referred to as Hall sensor) senses a pulse signal each time it approaches a measuring point. That is, the unit obtains i pulse signals after each rotation. During the speed measurement process, the speed value is calculated as the average speed of the past rotation. The speed acquisition device performs a calculation after acquiring each pulse signal. The calculation process is as follows:

[0056] Initialize an array a[i] of size i;

[0057] After the unit starts, when the Hall sensor approaches any measuring point m, the speed acquisition device collects the rising edge of the pulse signal and records the data at that moment, storing it in a. m The time of the rising edge of the pulse signal at measurement point m+1 is recorded and stored in a.m+1 Calculate the time t that the rotation takes between measuring point m and measuring point m+1 of the unit. m =a m+1 -a m , time t m Stored in array a[0];

[0058] The unit continues to rotate, and the speed acquisition device collects the rising edge of the pulse signal at measurement point m+2, records the time, and stores it in a. m+2 Calculate the time t that the rotation takes between measuring points m+1 and m+2 of the unit. m+1 =a m+2 -a m+1 , time t m+1 Stored in array a[1];

[0059] This process continues until all the time data between all i measuring points are stored in array a[i] after one complete rotation. The sum of all elements in array a[i] yields the time b required for the unit to rotate one revolution. The reciprocal of time b is used to obtain the rotational speed n. The rotational speed acquisition device uploads the rotational speed value n to the Ethernet at intervals of t0 (usually 20ms).

[0060] After one revolution, the speed acquisition device again acquires data at measurement point m, and stores the data at the rising edge of the pulse signal in a. m Calculate the time t that the rotation takes between the unit's measuring point m+n-1 and measuring point m. m =a m -a m+n-1 , time t m The data is stored in array a[0]; the sum of all elements in array a[n] is recalculated, which is the time b required for one rotation, so as to calculate the rotation speed n. The rotation speed acquisition device uploads the new n value to the Ethernet at intervals t0.

[0061] The new rotational speed value n is calculated in real time and repeatedly in the above manner and uploaded to the upper-layer Ethernet for use by the centralized processing and interaction unit. According to the above requirements, the rotational speed acquisition device uploads the rotational speed value n to the upper-layer Ethernet at regular intervals t0; when a new measurement point signal is received at time t... m >t0 and t m When <T (generally taken as 2it0), continue uploading the value of n according to the original time interval. When t m When the value of n is greater than T, the value of n is set to 0 before uploading.

[0062] The speed acquisition device is equipped with a speed acquisition and verification mechanism. During the operation of the unit, the self-control will collect speed data and upload it through RS485 communication. The speed acquisition device calculates the average speed N1 over the past communication period according to the RS485 communication cycle, and compares it with the speed data N2 collected and uploaded by the unit itself. The difference is I = |N1-N2|≤J (generally set to 1). If the calculated difference is greater than the deviation value, an alarm signal is uploaded.

[0063] (2) Electrical parameter acquisition process

[0064] The electrical parameters in this invention refer to AC electrical parameters. To ensure the intuitiveness of the data display and to verify the validity of the steady-state fluctuation rate, transient adjustment rate, and settling time, all electrical parameters are processed into effective values ​​in the electrical acquisition device. The electrical acquisition device collects the real-time values ​​of the unit's output voltage and current through transformers and current transformers, and calculates the effective values ​​using a phase-locked loop (PLL) algorithm. The acquisition process of the electrical acquisition device is as follows: the FPGA controls the AD chip to collect electrical parameters, which are periodically sent to the ARM chip. The PLL calculation is performed on the ARM chip to obtain the effective values. The sampling frequency of the electrical acquisition device is set to sam = 10kHz. A PLL calculation is performed every three data points to obtain one effective value. The effective values ​​are stored sequentially in array a[]. After the array is full for the data acquisition t0 (generally 20ms), the array is uploaded to the Ethernet.

[0065] (3) Automatic waveform processing and interactive functions

[0066] First, we will explain the terms volatility, transient regulation, and settling time. Since the definitions of electrical and rotational speed are similar, we will use rotational speed as the starting point for explanation, as follows:

[0067] 1) Rotational speed fluctuation rate

[0068] When the unit is running stably under any load range from no-load to rated load, the highest speed n1 or lowest speed n2 measured at certain time intervals and their average value n are... m The difference with respect to the average rotational speed n m The percentages are as follows:

[0069] or

[0070] In the formula:

[0071] v Speed ​​fluctuation rate, %;

[0072] n m Average speed, i.e. The unit is revolutions per minute (r / min);

[0073] n1 is the maximum speed, expressed in revolutions per minute (r / min).

[0074] n2 is the minimum rotational speed, measured in revolutions per minute (r / mln).

[0075] 2) Transient regulation rate and settling time of the unit

[0076] The instantaneous speed regulation rate of a generator unit refers to the lowest instantaneous speed n when the generator unit is set to its stable speed regulation rate, under rated load and rated speed, and then subjected to a sudden unloading followed by a sudden application of a specified symmetrical load. min Or the highest instantaneous speed n max Speed ​​n before load change i The difference, for the rated speed n N The percentage. Similar to sudden addition and sudden removal, this invention has used the term "sudden addition" for explanation. The specific calculation is as follows:

[0077]

[0078] δ d Transient rate of adjustment, %;

[0079] n min Minimum instantaneous speed, in revolutions per minute (r / min);

[0080] n i Speed ​​before sudden acceleration, in revolutions per minute (r / min).

[0081] Settling time refers to the time from the onset of a speed change until the speed recovers to a point where the deviation from the stable speed under the corresponding load is within the range of speed fluctuation. See details... Figure 3 Mid-time t1.

[0082] a. Speed ​​waveform display and automatic processing

[0083] The user interface receives a time T, which is then displayed in the time display window. c Confirm waveform display array size Initialize a rotational speed curve array a[i];

[0084] The centralized processing interaction unit receives the speed data from the corresponding port of the speed acquisition device, parses it, and stores the data one by one in the array a[i]. When the array a[i] is full, the last i-1 bits of the array a[i] are truncated to form a new array b[i-1]. The newly received data is concatenated to b[i-1] to form a new array and the array is assigned to a[i]. The array a[i] is continuously updated in this manner.

[0085] The interactive interface plots a waveform in real time with the elements of array a[i] as the vertical axis and the time interval t0 as the horizontal axis. As array a[i] changes continuously, the waveform is updated and displayed in real time on the interactive interface.

[0086] During the process of receiving unit speed data, the data is continuously stored in the database, and a storage mark is performed every 1 minute for subsequent historical data recall.

[0087] (a) Automatic processing of speed fluctuation rate

[0088] Initialize the maximum speed n1 and minimum speed n2 data. Upon receiving new data, assign the data to n1 and n2 respectively. Upon receiving new data again, compare the new data with n1 and n2, and reassign the new maximum and minimum speeds to n1 and n2 respectively. While continuously updating array a[i], simultaneously confirm the values ​​of n1 and n2 and calculate the volatility according to the speed volatility calculation formula, displaying it in real-time on the interactive interface. When outputting the test report, print the waveform, maximum speed, minimum speed, and volatility in the same report in real-time. Figure 4 As shown.

[0089] (b) Automatic processing of transient rate adjustment and settling time

[0090] Upon receiving a sudden acceleration / deceleration transient change command from the interactive interface, the background process automatically extracts the speed array a[i], generates a report, as follows:

[0091] Initialize the steady-state data arrays q[j] and h[j] before the transient change and after the transient change, respectively.

[0092] Use the optimized traversal method to find the extreme value a[ext] in the rotation speed array a[i], where ext is the position of the corresponding element of the extreme value in the array a[i].

[0093] According to the aforementioned average speed formula Calculate the average rotational speed q[j] and h[j] respectively. nm h nm value;

[0094] Find the element value and corresponding position a[q] before the transient change s The search for |q is found by iterating from the ext position forward through the array. nm The value of i corresponding to -a[ext-i++]|<1 is taken as q. s =ext-i.

[0095] The transient speed regulation rate can then be calculated:

[0096]

[0097] According to the national standard requirements for speed fluctuation rate, the fluctuation rate should be controlled within ±0.5%. The allowable range of speed fluctuation after transient speed change is calculated as x = 0.5%h. nm Of which 0.5% can be set separately according to different standard requirements;

[0098] Based on the definition of steady time, the position corresponding to the transient change has now been identified as q. s Now we need to determine the position where the system enters the steady-state fluctuation range. We use a traversal method to search backwards from position i-1 in array a[i], that is, to find the j value corresponding to |xa[(i-1)-j++]|<1. We then take the element and position that enters the steady-state range after the transient change as a[h]. s ] = a[(i-1)-j];

[0099] Based on the above calculations, the settling time is:

[0100] t1=(h s -q s )t0

[0101] Based on the above calculation results, the rotational speed curve is plotted on the interactive interface, with schematic lines drawn before the corresponding transient changes and at the points where steady-state fluctuations begin. Upon receiving the print command from the interactive interface, a report is directly output; see details below. Figure 5 .

[0102] b. Automatic processing of electrical parameters

[0103] Electrical parameters generally involve three-phase parameters, i.e., U. ab U bc U ca Therefore, a two-dimensional array a[i][3] needs to be set up for processing, where the data in columns 1, 2, and 3 correspond to U respectively. ab U bc U ca data.

[0104] The user interface receives a time T, which is then displayed in the time display window. c Confirm waveform display array size i = T c (sam), where sam is the sampling rate; initialize an electrical curve array a[i][3];

[0105] The display and automatic processing calculation of electrical parameters are the same as those of speed processing. The main difference lies in the simultaneous processing and display of multiple curves. The calculation process will not be described in detail here.

[0106] For details on voltage fluctuation rate, please refer to Figure 6 For details on transient voltage change rate and settling time, please refer to [link / reference]. Figure 7 .

Claims

1. A method for distributed acquisition, centralized display, and automatic processing of power plant test waveforms, characterized in that: Includes the following steps: S1: Distributed acquisition: The speed signal of the power plant unit is acquired through the speed acquisition device, the speed waveform data of the unit is acquired using Hall sensors close to the unit, and the electrical parameter signal of the unit is acquired through the electrical acquisition device. Both signals are converted into digital signals. S2: Data Upload: The speed acquisition device and electrical acquisition device upload digital signals to the centralized processing and interaction unit via an Ethernet switch; the Hall sensor acquires a pulse signal, performs a calculation, and uploads the data. S3: Centralized Processing: The centralized processing and interaction unit displays the digital signal waveform in real time, automatically processes and interacts with the waveform, and automatically calculates the steady-state volatility, transient regulation rate and settling time. S4: Data Storage and Report Generation: Store raw data and analysis results to the database server and generate test reports according to user instructions.

2. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 1, characterized in that, In step S1, the acquisition process of the rotation speed signal includes: the Hall sensor generates a pulse signal for each measurement point it senses, the rotation speed data processing module records the time interval between adjacent pulse signals, calculates the rotation period and rotation speed, and uploads the rotation speed data every 20ms.

3. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 2, characterized in that, The acquisition process of the rotation speed signal includes: initializing an array a[i] of size i, where i is the number of measurement points on the rotation axis; recording the rotation time between adjacent measurement points and storing it in array a[i]; summing the elements of array a[i] to obtain the time b for one rotation, and calculating the rotation speed n = 60 / b; and uploading the rotation speed n to the Ethernet switch every preset time of 20ms.

4. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 1, characterized in that, In step S1, the speed acquisition device is set up with a speed acquisition verification mechanism. During the operation of the unit, the self-control will collect speed data and upload it through RS485 communication. The speed acquisition device calculates the average speed N1 in the past communication period according to the RS485 communication cycle, and compares it with the speed data N2 collected and uploaded by the unit itself by making a difference I = |N1-N2|≤1. If the calculated difference is greater than the deviation value, an alarm signal is uploaded.

5. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 1, characterized in that, In step S1, the electrical parameter acquisition process includes: all electrical parameters are processed into effective values ​​in the electrical acquisition device. The electrical acquisition device acquires the real-time values ​​of the unit's output voltage and current through the transformer and current transformer, and calculates the effective values ​​through the phase-locked loop algorithm. The acquisition process of the electrical acquisition device is as follows: the FPGA controls the AD chip to acquire electrical parameters, which are periodically sent to the ARM chip. The phase-locked loop calculation is completed on the ARM chip to obtain the effective values. The sampling frequency of the electrical acquisition device is set to sam = 10kHz. A phase-locked loop calculation is performed every three acquisition points to obtain an effective value. The effective values ​​are stored sequentially in the array a[]. After the array is full and t0 = 20ms of data is acquired, the array is uploaded to the Ethernet.

6. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 1, characterized in that, In step S3, the automatic waveform processing and interaction includes the calculation process of speed fluctuation rate, the calculation process of unit transient regulation rate and stabilization time; The calculation process for speed fluctuation rate includes: extracting the highest and lowest values ​​n1 and n2 of the parameter within a preset time window; and calculating the average value n. m = (n1+n2) / 2; according to the formula or Calculate volatility.

7. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 6, characterized in that, The calculation process for the unit's transient adjustment rate and settling time includes: displaying and automatically processing the speed waveform, automatically processing electrical parameters, identifying transient extreme points and steady-state values ​​before abrupt changes in the parameter waveforms; according to the formula: Calculate the transient adjustment rate; determine the time point at which the parameters recover to the steady-state volatility range, and the difference between this time point and the moment of abrupt change is the steady-state time; where: δ d For transient rate of change, %; n min The lowest instantaneous rotational speed, in r / min; n i The rotational speed before the sudden increase is expressed in r / min; n N This is the rated speed, expressed in r / min.

8. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 7, characterized in that, Speed ​​waveform display and automatic processing: Receives a time display window T input via the interactive interface. c Confirm waveform display array size Initialize a speed curve array a[i]; the centralized processing interactive unit receives speed data from the corresponding port of the speed acquisition device, parses it, and stores the data one by one in array a[i]. When array a[i] is full, the last i-1 positions of array a[i] are truncated to form a new array b[i-1]. The newly received data is concatenated to b[i-1] to form a new array, and the array is assigned to a[i]. This process is repeated to continuously update array a[i]; a waveform graph with the elements of array a[i] as the vertical axis and the time interval t0 as the horizontal axis is drawn in real time on the interactive interface. As array a[i] changes, the waveform graph is updated and displayed in real time on the interactive interface; during the process of receiving unit speed data, the data is continuously stored in the database. A storage mark is performed every 1 minute for subsequent historical data callback work, including... a) Automatic processing of speed fluctuation rate Initialize the maximum speed n1 and minimum speed n2 data. Upon receiving new data, assign the data to n1 and n2 respectively. Upon receiving new data again, compare the data with n1 and n2 respectively, and reassign the new maximum and minimum speeds to n1 and n2 respectively. While continuously updating the array a[i], confirm the values ​​of n1 and n2 in real time and calculate the volatility according to the speed volatility calculation formula, displaying it in real time on the interactive interface. When outputting the test report, print the waveform, maximum speed, minimum speed, and volatility in the same report in real time. b) Automatic processing of transient rate adjustment and settling time Upon receiving a sudden acceleration / deceleration transient change command from the interactive interface, the background process automatically extracts the speed array a[i], generates a report, as follows: Initialize the steady-state data arrays q[j] and h[j] before the transient change and after the transient change, respectively. Use the optimized traversal method to find the extreme value a[ext] in the rotation speed array a[i], where ext is the position of the corresponding element of the extreme value in the array a[i]. According to the aforementioned average speed formula Calculate the average rotational speed q[j] and h[j] respectively. nm h nm Value; find the element value and corresponding position before the transient change a[q] s The search for |q is found by iterating from the ext position forward through the array. nm The value of i corresponding to -a[ext-i++]|<1 is taken as q. s =ext-, The transient speed regulation rate can then be calculated: According to the national standard requirements for speed fluctuation rate, the fluctuation rate should be controlled within ±0.5%. The allowable range of speed fluctuation after transient speed change is calculated as x = 0.5%h. nm Of which 0.5% can be set separately according to different standard requirements; Based on the definition of steady time, the position corresponding to the transient change has now been identified as q. s Now we need to determine the position of entering the steady-state fluctuation range. We use a traversal method to search backward from the i-1 position in array a[i], that is, to find the j value corresponding to |xa[(i-1)-j++]|<1. We then take the element and position that enters the steady-state range after the transient change as a[h s ] = a[(i-1)-j]; Based on the above calculations, the settling time is: t1=(h s -q s )t0 Based on the above calculation results, the rotational speed curve is plotted on the interactive interface, and schematic lines are drawn at the corresponding transient changes and the positions where steady-state fluctuations begin. After receiving the print command from the interactive interface, the report is output directly.

9. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 7, characterized in that, Automatic processing of electrical parameters: Receives a time display window time Tc from the interactive interface, and confirms the waveform display array size i = T. c (sam), where sam is the sampling rate; initialize an electrical curve array a[i][3]; the display and automatic processing calculation of electrical parameters are the same as the speed processing method, the difference being that they are processed and displayed simultaneously with multiple curves.

10. The automatic processing method for distributed acquisition, centralized display, and processing of power plant test waveforms according to claim 1, characterized in that, In step S4, the test report includes waveforms, maximum value, minimum value, average value, volatility, transient adjustment rate, and settling time, and indicates whether the preset standard is met.

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