A method for testing a potentiometer and a system thereof

Abstract

The present application belongs to the technical field of performance test of potentiometer, and particularly relates to a test method of potentiometer, which comprises the following steps: obtaining test information, wherein the test information comprises a plurality of electrical characteristic data obtained by testing a plurality of potentiometers of a current test batch according to a preset test strategy; the electrical characteristic data comprises a plurality of test node identifiers and corresponding test voltages; obtaining the test result of the potentiometer of the current test batch according to the test information, and sending prompt information to a user equipment when the test result indicates a test abnormality; wherein the preset test strategy refers to taking different states of the potentiometer as different test nodes; adjusting the test parameters of a subsequent test node according to the test result of a previous test node, wherein the test parameters comprise test voltage, sampling frequency or test angle range. The present application dynamically adjusts the test parameters, so that the test is highly matched with the actual performance of the potentiometer.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of performance testing of potentiometers, in particular to a testing method and system for potentiometers. BACKGROUND

[0002] As a basic electronic component, potentiometers play an important role in various control and feedback applications, from desk lamp brightness adjustment to vehicle corner feedback, and are widely used in various fields. In the production and quality control of potentiometers, performance testing is one of the key links. However, the traditional potentiometer testing method has many shortcomings. Usually, the tester needs to manually record the data and waveform diagram of each test parameter and analyze the measurement results. This method is inefficient, labor-intensive, and prone to data recording and analysis errors, resulting in low test quality.

[0003] Therefore, we propose a testing method and system for potentiometers to solve the above problems. SUMMARY

[0004] In view of the deficiencies of the prior art, the present application provides a testing method and system for potentiometers, which solves the problems raised in the background art.

[0005] The present application specifically adopts the following technical solutions to achieve the above-mentioned purposes:

[0006] On the one hand, a testing method for potentiometers is provided, which comprises:

[0007] Obtaining test information, the test information comprising a plurality of electrical characteristic data obtained by testing a plurality of potentiometers of a current test batch according to a preset test strategy; the electrical characteristic data comprising a plurality of test node identifiers and their corresponding test voltages;

[0008] According to the test information, obtaining the test results of the potentiometers of the current test batch, and sending a prompt message to a user device when the test results indicate a test anomaly;

[0009] Wherein, the preset test strategy refers to different states of the potentiometer as different test nodes;

[0010] Adjusting the test parameters of the subsequent test nodes according to the test results of the previous test nodes, the test parameters including test voltage, sampling frequency or test angle range.

[0011] The beneficial effects are: dynamically adjusting the test parameters to match the actual performance of the potentiometer. Fine adjustment of the test voltage, accurate measurement of the resistance change of the potentiometer under different voltages, and avoidance of deviation. Multiple test nodes comprehensively evaluate the performance of the potentiometer, covering various actual working conditions. Combined with dynamic parameter adjustment, in-depth analysis of performance changes, and improvement of test accuracy. Adjust subsequent tests according to test node results, optimize resource allocation. Performance stable nodes reduce test resources, large fluctuation nodes increase sampling or test items, improve efficiency and reduce cost. Dynamic adjustment mechanism makes the test process efficient and flexible. Timely detection and adjustment to avoid repeated testing or excessive testing, shorten the time and improve the efficiency. It can be considered that this method is suitable for multi-potentiometer production scenarios, considering the performance differences under different batches and process conditions. Dynamic adjustment of parameters to adapt to the test requirements of new potentiometer models or improved products, reducing additional development costs.

[0012] Further, adjusting the test parameters of the subsequent test node according to the test results of the previous test node, comprising:

[0013] If the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, increase the sampling frequency of the subsequent node; or,

[0014] If the number of potentiometers whose linearity error exceeds the preset tolerance meets the corresponding number ratio, reduce the test voltage of the subsequent node and expand the test angle range.

[0015] The beneficial effects are that for voltage deviation adjustment, increasing the sampling frequency and narrowing the test angle range can more accurately focus on the specific area of the potentiometer performance anomaly. This concentrated testing strategy can effectively improve the probability of discovering potential fault points and reduce the missed detection caused by excessive test range or insufficient sampling, thereby more accurately evaluating the actual performance of the potentiometer. For linearity error adjustment, reducing the test voltage and expanding the test angle range can more comprehensively investigate the linearity characteristics of the potentiometer. Reducing the voltage helps to avoid misjudgment of the performance of the potentiometer due to improper test conditions, and expanding the angle range can fully expose the linearity performance of the potentiometer in the entire working range, providing more sufficient data support for accurately evaluating whether it meets the use requirements. By dynamically adjusting the test parameters of the subsequent nodes according to the test results of the previous node, the test resources can be more reasonably allocated. For areas with normal performance, the investment of test resources can be appropriately reduced; while for areas with potential problems, resources are concentrated for in-depth testing. This not only ensures the comprehensiveness and accuracy of the test, but also avoids unnecessary resource waste and improves the test efficiency. At the same time, the dynamic adjustment mechanism can avoid unnecessary repeated testing at subsequent test nodes. If the test parameters of the subsequent nodes are not adjusted according to the actual situation, the areas known to have problems may be repeatedly tested, or the normal areas may be over-tested. Through targeted adjustment, these redundant test steps can be effectively reduced, the test cycle can be shortened, and the test cost can be reduced.

[0016] Further, adjusting the test parameters of the subsequent test nodes according to the test results of the previous test node comprises:

[0017] If the number of potentiometers whose test voltage deviates from the preset threshold range at the previous test node meets the corresponding number ratio, the adjustment coefficient is updated according to the linearity error number ratio; the linearity error number ratio is the ratio of the number of potentiometers whose linearity error exceeds the preset tolerance at the previous test node;

[0018] According to the sampling frequency, the contact resistance change amount, the total resistance value and the updated adjustment coefficient of the current test node, the sampling frequency of the subsequent test node is obtained; at the same time, it is judged whether the linearity error number exceeds the corresponding number ratio;

[0019] If it exceeds, the test voltage of the subsequent node is reduced and the test angle range is expanded.

[0020] The beneficial effect is that according to the test result of the previous node, the sampling frequency, test voltage and angle range and other parameters of the subsequent test node are adjusted in a targeted manner. For the region with relatively stable performance or the case where the voltage deviation and linearity error are not significant, the test resource investment can be reasonably reduced; and for the region with potential problems or larger performance fluctuations, more in-depth testing is concentrated on. The flexible resource allocation method avoids unnecessary redundant testing, improves the test efficiency, reduces the test cost, and realizes the efficient use of test resources on the premise of ensuring the test quality.

[0021] Further, the adjusting the test parameters specifically includes: based on the contact resistance change of the previous test node, calculating the sampling frequency of the subsequent node according to the following formula: fn+1=fn×(1+k·ΔRc / Rt) Wherein, fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the contact resistance change, Rt is the total resistance, and k is the adjustment coefficient.

[0022] The beneficial effect is that the sampling frequency is dynamically adjusted based on the contact resistance change, so that the sampling process can better adapt to the actual performance change of the potentiometer. When the contact resistance changes greatly, the sampling frequency can be appropriately increased to capture the subtle performance changes of the potentiometer in different states, thereby obtaining more abundant and accurate data, reducing the data loss caused by insufficient sampling, and improving the accuracy of the test results. Based on the contact resistance change, the sampling frequency is targetedly optimized, which can more effectively concentrate the test resources in the regions where the performance of the potentiometer changes more obviously. This helps to analyze the performance of the potentiometer in these key regions in depth, and more accurately find potential quality problems or performance fluctuations. Due to the influence of factors such as material and process, the contact resistance change characteristics of different potentiometers may be different. By using this method of adjusting the sampling frequency based on the contact resistance change, various potentiometers with different characteristics can be flexibly adapted to. Whether the potentiometer has a relatively flat or fluctuating contact resistance change, appropriate test data can be obtained through corresponding sampling frequency adjustment, thereby improving the universality and flexibility of the test method.

[0023] Further, the sending of the prompt information to the user equipment when the test result indicates a test abnormality includes:

[0024] When the test result indicates an abnormality, the associated parameters in the historical test database are retrieved based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and corresponding environmental adaptability parameters;

[0025] An abnormality analysis report is generated according to the associated parameters, and the position identification and deviation data of the abnormal potentiometer are sent to the user equipment as prompt information.

[0026] The beneficial effect is that based on the deep analysis of the correlation parameters, the detailed report can be generated to clearly present the abnormality panorama. The user can accurately grasp the severity of the abnormality, the influence range and the development trend, and formulate accurate and effective solutions. The abnormality prompt information is sent to the user equipment in real time to realize real-time feedback of quality problems. The user does not need to wait for the end of the test process to view the report, but can know the abnormal condition on the production line in real time, timely intervene and handle, avoid batch production of defective products, reduce production cost, and improve overall quality control efficiency. With the organic combination of historical data and real-time abnormal information, a powerful basis is provided for quality control decision. Based on rich data resources, the user can accurately evaluate the stability of the production process and the reliability of the product quality, optimize the process flow and strengthen the weak links, and improve the product quality from the root.

[0027] Further, the test information is acquired, including:

[0028] The rotating shaft of the potentiometer is controlled by the direct drive motor to rotate at a preset rotating speed, and the following operations are performed synchronously during the rotation:

[0029] The contact resistance change amount between the moving contact of the potentiometer and the resistance body and the rotating torque data are collected;

[0030] The loading position of the test voltage is dynamically adjusted based on the contact resistance change amount, so that the test voltage is always loaded at the contact critical point of the moving contact and the resistance body;

[0031] The test voltage corresponding to each test node is taken as the acquired multiple electrical characteristic data and saved; when the rotating torque deviates from the preset threshold range, the contact pressure abnormality alarm is triggered and the current rotating angle coordinate is recorded.

[0032] The beneficial effect is that by dynamically adjusting the loading position of the test voltage, the test voltage is always applied to the actual contact critical point of the moving contact and the resistance body. This accurate voltage loading method can more truly reflect the electrical performance of the potentiometer in the actual working state, avoid measurement errors caused by deviation of the voltage loading position, and thus significantly improve the accuracy and reliability of the test results. The contact resistance change amount and the rotating torque data are collected synchronously to realize comprehensive monitoring of the mechanical performance and electrical performance of the potentiometer. The multi-dimensional data collection method can more completely evaluate the quality status of the potentiometer, discover potential problems that cannot be detected by single data collection, and further improve the accuracy and reliability of the test. Real-time monitoring and abnormal alarm function of the rotating torque can timely discover the contact pressure problem of the potentiometer in the rotating process. This helps to quickly locate the fault position, take corresponding maintenance or adjustment measures, reduce the rate of defective products in the production process, and improve the product quality control level.

[0033] Further, the loading position of the test voltage is dynamically adjusted based on the contact resistance change amount, comprising:

[0034] A critical point detection threshold of the contact resistance change amount is obtained; when the real-time collected contact resistance change amount exceeds the critical point detection threshold, it is determined that the moving contact and the resistance body are at the contact critical point;

[0035] The test voltage loading path is dynamically switched to the electrode position corresponding to the critical point; after adjusting the voltage loading position, the contact resistance change amount is re-detected to verify the critical point state, forming a closed-loop feedback control.

[0036] The beneficial effects are that by accurately identifying the critical point of the contact resistance change amount and dynamically adjusting the test voltage loading position, it can be ensured that the test voltage is always loaded at the actual contact critical point of the moving contact and the resistance body, avoiding measurement errors caused by loading position deviation, improving the accuracy of the potentiometer electrical performance test, and making the test results more truly reflect the actual performance of the potentiometer. The introduction of the closed-loop feedback control mechanism ensures the accuracy after each voltage loading position adjustment, avoiding repeated adjustments and unnecessary test steps. Real-time monitoring of the contact resistance change amount and rapid response to the critical point state ensure accurate control of the potentiometer contact state during testing. The closed-loop feedback control further enhances stability and reliability, ensuring the accuracy of test results and the smooth progress of the test process, even in complex test environments, reducing the risk of false positives caused by errors.

[0037] On the other hand, a potentiometer testing system is provided, the testing system comprising a driving module, a collection module and a controller;

[0038] The driving module comprises a direct drive motor and its corresponding speed reducer, for synchronous control of the potentiometer angle of the multiple potentiometers in the current test batch;

[0039] The collection module is used to collect the voltage, current and angle signals of each potentiometer in the current test batch;

[0040] The controller and the driving module and the collection module are electrically connected, and the controller is configured to:

[0041] Obtain test information, the test information comprising multiple electrical characteristic data obtained by the multiple potentiometers in the current test batch according to a preset test strategy; the electrical characteristic data comprising multiple test node identifiers and their corresponding test voltages;

[0042] According to the test information, the potentiometer test results of the current test batch are obtained, and prompt information is sent to the user equipment when the test results indicate test abnormalities;

[0043] The preset test strategy refers to taking different states of the potentiometer as different test nodes.

[0044] The test parameters of the subsequent test node are adjusted according to the test result of the previous test node, and the test parameters include a test voltage, a sampling frequency or a test angle range.

[0045] Further, adjusting the test parameters of the subsequent test node according to the test result of the previous test node includes:

[0046] If the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, the sampling frequency of the subsequent node is increased; or,

[0047] If the number of potentiometers whose linearity error exceeds the preset tolerance meets the corresponding number ratio, the test voltage of the subsequent node is reduced and the test angle range is expanded.

[0048] Further, if the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, the adjustment coefficient is updated according to the linearity error number ratio; the linearity error number ratio is the ratio of the number of potentiometers whose linearity error exceeds the preset tolerance in the previous test node;

[0049] According to the sampling frequency, the contact resistance change, the total resistance value and the updated adjustment coefficient of the current test node, the sampling frequency of the subsequent test node is obtained; at the same time, it is judged whether the linearity error number exceeds the corresponding number ratio;

[0050] If it exceeds, the test voltage of the subsequent node is reduced and the test angle range is expanded.

[0051] Further, the sending of prompt information to the user equipment when the test result indicates a test anomaly includes:

[0052] When the test result indicates an anomaly, the associated parameters in the historical test database are retrieved based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and corresponding environmental adaptability parameters;

[0053] An abnormality analysis report is generated according to the associated parameters, and the position identification and deviation data of the abnormal potentiometer are synchronized to the user equipment as prompt information. BRIEF DESCRIPTION OF DRAWINGS

[0054] Figure 1 The flowchart of the potentiometer test method provided by the embodiment of the application is shown;

[0055] Figure 2 The flowchart of the sending of prompt information provided by the embodiment of the application is shown;

[0056] Figure 3 A flowchart of a process for obtaining test information is provided for an embodiment of the present application.

[0057] Figure 4 A flowchart of a process for adjusting the loading position of the test voltage is provided for an embodiment of the present application. DETAILED DESCRIPTION

[0058] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art without creative effort fall within the protection scope of the present application.

[0059] In the prior art, there are problems of low efficiency, complex test parameter setting and lack of intelligent data analysis in the potentiometer test method. This is because the traditional manual or single machine static test is trapped in the efficiency-precision-cost triangle: the production line requires thousands of units per hour, and the manual single test time becomes the bottleneck; the fixed test parameters for multiple potentiometer samples cannot adapt to process batch fluctuations, resulting in low yield or missed detection.

[0060] Compared with the prior art, the present application provides a potentiometer intelligent test method based on a preset test strategy and dynamic adjustment of test parameters, which can directly drive the motor to synchronously drive multiple stations for parallel testing, compress the single time, adjust the voltage, sampling frequency and angle range in real time according to the previous node result, convert process fluctuations into algorithm optimization, synchronously monitor the rotation torque and contact resistance, instantaneously capture critical point abnormalities, and link the historical process database to generate a report with position coordinates, realize positioning and closed-loop improvement. The method will be described below, and then the system will be described. EMBODIMENT

[0061] Referring to Figure 1 The present embodiment provides a potentiometer test method, which comprises:

[0062] S101, obtaining test information, the test information comprising a plurality of electrical characteristic data obtained by a plurality of potentiometers of a current test batch according to a preset test strategy; the electrical characteristic data comprising a plurality of test node identifiers and their corresponding test voltages;

[0063] S102, obtaining the potentiometer test result of the current test batch according to the test information, and sending prompt information to a user device when the test result indicates a test abnormality;

[0064] The preset test strategy refers to taking different states of the potentiometer as different test nodes. The test parameters of the subsequent test nodes are adjusted according to the test results of the previous test nodes of the plurality of potentiometers in the current test batch, and the test parameters include test voltage, sampling frequency or test angle range. The previous test node can be understood as a node before the current test node, that is, the node before the subsequent test node.

[0065] In the potentiometer test process, test information containing electrical characteristic data of a plurality of potentiometers is first collected. The test information is obtained according to a preset test strategy and can reflect the electrical performance of the potentiometer in different states. The test information covers test node identification and corresponding test voltage. The test node identification is used to distinguish the test states of the potentiometer, and the test voltage (data) directly reflects the voltage output of each potentiometer in a specific state in the same batch. Different states of the potentiometer are set as different test nodes, and the test nodes can cover states such as rotation angle and load condition to comprehensively evaluate the performance of the potentiometer. The test parameters of the subsequent nodes are adjusted according to the results of the previous test nodes. For example, if the resistance value of the previous test node is close to the upper limit, the test voltage range of the subsequent node is reduced; if the voltage fluctuation is large, the sampling frequency is increased; and if the performance fluctuates in a specific angle range, the angle range is reduced. The adjustment can be obtained based on a preset rule through system calculation and analysis.

[0066] For each potentiometer, the electrical characteristic data of all test nodes can be integrated to calculate the test results of the potentiometer according to a preset algorithm and standard. By comparing the test results with a preset threshold or standard, it is determined whether the potentiometer is abnormal. When the potentiometer is abnormal, details such as the identity of the potentiometer, the abnormal node and the electrical characteristics are recorded, and prompt information is sent to a user device, such as a notebook computer or a tablet computer, to quickly locate and solve the problem.

[0067] Therefore, the test parameters are dynamically adjusted to make the test highly match the actual performance of the potentiometer. The performance of the potentiometer is comprehensively evaluated by multiple test nodes, which covers various actual working states. In combination with the dynamic parameter adjustment, the performance change is analyzed in depth to improve the test accuracy. The subsequent test is adjusted according to the test node results, which facilitates the optimization of resource allocation, such as reducing test resources for stable performance nodes, increasing sampling or test items for large fluctuation nodes, improving efficiency, reducing cost, and dynamically adjusting the mechanism to make the test process efficient and flexible. Problems are found and adjusted in time to avoid repeated testing or excessive testing, shorten the time and improve the efficiency. It can be considered that this method considers the performance difference under different batches and process conditions and is suitable for production test scenes of multiple potentiometer samples. The dynamic adjustment of the parameters adapts to the test needs of improved products and reduces additional development costs.

[0068] In some embodiments, the test parameters of the subsequent test nodes are adjusted according to the test results of the previous test nodes, including:

[0069] If the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding proportion of the number, the sampling frequency of the subsequent node is increased; or

[0070] If the number of potentiometers whose linearity error exceeds the preset tolerance meets the corresponding proportion of the number, the test voltage of the subsequent node is reduced and the test angle range is expanded.

[0071] As an example, for the case where the test voltage deviates from the preset threshold range, at the current test node, the acquired test voltage is monitored in real time and compared with the preset threshold range. The preset threshold range is a reasonable interval determined based on the specification requirements and normal working performance of the potentiometer. If the test voltage deviates from the preset threshold range, triggering the adjustment mechanism to increase the sampling frequency of the subsequent node can capture the electrical characteristic changes of the potentiometer in different working states more meticulously. Because a higher sampling frequency can obtain more data points in the same time, it helps to more accurately depict the performance curve of the potentiometer, so as to more likely find potential abnormal points or performance fluctuations. At the same time, the test angle range of the subsequent node can also be reduced. If the voltage deviates from the normal range at the current node, the performance of the potentiometer in a larger angle range may have problems. Reducing the test angle range can concentrate the test resources and perform more in-depth evaluation of the performance of the potentiometer in a smaller angle interval, which helps to quickly locate the specific angle position that causes the voltage anomaly.

[0072] For the case where the linearity error exceeds the preset tolerance, at the current test node, the output characteristics of the potentiometer are analyzed for linearity, and the deviation between the actual output and the ideal linear output, i.e. the linearity error, is calculated. The preset tolerance is a maximum allowable error range set according to the design standards and use requirements of the potentiometer. When the linearity error exceeds the preset tolerance, the test voltage of the subsequent node is adjusted. Reducing the test voltage can make the potentiometer work under relatively milder conditions, which helps to distinguish whether the poor linearity of the potentiometer itself or the apparent linearity error caused by excessively harsh test conditions. At the same time, a lower test voltage can also avoid further exacerbating the non-linear characteristics of the potentiometer due to excessive voltage stress. The test angle range of the subsequent node can be expanded, by increasing the test angle range, more data points are obtained to comprehensively evaluate the linearity changes of the potentiometer in the entire working angle range, which helps to judge whether the potentiometer has linearity problems in a local angle range or is difficult to meet the linearity requirements in the entire working range.

[0073] Thus, for voltage deviation adjustment, adjusting the sampling frequency can more accurately focus on the specific area of the potentiometer performance anomaly. This centralized testing strategy can effectively improve the probability of discovering potential fault points, reduce the missed detection caused by excessive test range or insufficient sampling, and more accurately evaluate the actual performance of the potentiometer. For linearity error adjustment, reducing the test voltage and expanding the test angle range can more comprehensively investigate the linearity characteristics of the potentiometer. Reducing the voltage helps to avoid misjudgment of the performance of the potentiometer due to improper test conditions, and expanding the angle range can fully expose the linearity performance of the potentiometer in the entire working range, providing more sufficient data support for accurately evaluating whether it meets the use requirements.

[0074] By dynamically adjusting the test parameters of the subsequent nodes according to the test results of the previous node, the test resources can be more reasonably allocated. For areas with normal performance, the investment of test resources can be appropriately reduced; while for areas with potential problems, resources are concentrated for in-depth testing. This not only ensures the comprehensiveness and accuracy of the test, but also avoids unnecessary resource waste, improving the test efficiency. At the same time, the dynamic adjustment mechanism can avoid unnecessary repeated testing at subsequent test nodes. If the test parameters of the subsequent nodes are not adjusted according to the actual situation, the areas known to have problems may be repeatedly tested, or the normal areas may be over-tested. Through targeted adjustment, these redundant test steps can be effectively reduced, the test period can be shortened, and the test cost can be reduced.

[0075] In some embodiments, adjusting the test parameters of the subsequent test nodes according to the test results of the previous test node comprises:

[0076] If the number of potentiometers whose test voltage deviates from the preset threshold range in the previous test node meets the corresponding number ratio, the adjustment coefficient is updated according to the linearity error number ratio; the linearity error number ratio is the ratio of the number of potentiometers whose linearity error exceeds the preset tolerance in the previous test node;

[0077] According to the sampling frequency, the contact resistance change, the total resistance value and the updated adjustment coefficient of the current test node, the sampling frequency of the subsequent test node is obtained; at the same time, it is judged whether the linearity error number exceeds the corresponding number ratio;

[0078] If it exceeds, the test voltage of the subsequent node is reduced and the test angle range is expanded.

[0079] The technical solution monitors whether the test voltage of the potentiometer deviates from the preset threshold range in the previous test node. If the proportion of the number of deviated potentiometers to the total number (i.e., the voltage deviation proportion) reaches a preset condition, an adjustment mechanism is triggered. Meanwhile, the proportion of the number of potentiometers with linear error exceeding the standard in the previous node (i.e., the linear error number proportion) is calculated, and the adjustment coefficient is updated based on the proportion. The adjustment coefficient is used to dynamically optimize the sampling frequency of the subsequent test node, ensuring accurate allocation of test resources.

[0080] Specifically, the way to update the adjustment coefficient can be adjustment based on the linear error number proportion. If the linear error number proportion increases, the adjustment coefficient is increased.

[0081] Meanwhile, unlike the previous embodiment, considering that the test voltage deviating from the preset threshold range is a relatively obvious abnormal situation and has a greater impact on the overall performance of the potentiometer, by first judging the number proportion of the test voltage deviation, it can be quickly determined whether there is a universal voltage problem. If the test voltage of a large number of potentiometers deviates, it indicates that there is some unstable factor in the test system itself, or the characteristics of the potentiometer batch have changed. After determining the voltage problem, the linear error number proportion is judged, which can further focus on the linearity problem of the potentiometer. Through the way of hierarchical screening, the problem range can be gradually narrowed from the overall voltage problem to the specific linearity error problem, so that the subsequent test parameter adjustment is more targeted. At the same time, through the sequential judgment method, resources can be saved on unnecessary calculations.

[0082] Therefore, according to the test results of the previous node, the sampling frequency, test voltage, and angle range of the subsequent test node are adjusted in a targeted manner. For regions with relatively stable performance or where voltage deviation and linearity error are not significant, test resource investment can be reasonably reduced; while for regions with potential problems or large performance fluctuations, resources are concentrated for more in-depth testing. The flexible resource allocation method avoids unnecessary redundant testing, improves test efficiency, reduces test cost, and realizes efficient use of test resources on the premise of ensuring test quality.

[0083] In some embodiments, based on the contact resistance change amount of the previous test node (of the potentiometer), the sampling frequency of the subsequent node is calculated according to the following formula: fn+1=fn×(1+k·ΔRc / Rt) where fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the contact resistance change amount, Rt is the total resistance, k is the adjustment coefficient, and k initial value is 1.

[0084] Thus, based on the contact resistance change amount, the sampling frequency is dynamically adjusted, so that the sampling process can better adapt to the actual performance changes of the potentiometer. When the contact resistance changes greatly, the sampling frequency is appropriately increased, so that the subtle performance changes of the potentiometer in different states can be captured, richer and more accurate data can be obtained, data loss caused by insufficient sampling can be reduced, and the accuracy of the test results can be improved.

[0085] Based on the contact resistance change, the sampling frequency is optimized in a targeted manner, which can more effectively concentrate the test resources in the areas where the performance of the potentiometer changes more obviously. This helps to deeply analyze the performance of the potentiometer in these key areas and more accurately find potential quality problems or performance fluctuations.

[0086] Due to the influence of factors such as material and process, the contact resistance change characteristics of different potentiometers may be different. By using this method of adjusting the sampling frequency based on the contact resistance change amount, various potentiometers with different characteristics can be flexibly adapted to. Whether the contact resistance changes gently or fluctuates greatly, appropriate test data can be obtained through corresponding sampling frequency adjustment, and the universality and flexibility of the test method are improved.

[0087] Referring to Figure 2 In some embodiments, the sending of the prompt information to the user equipment when the test result indicates a test anomaly comprises:

[0088] S201, when the test result indicates an anomaly, retrieving associated parameters in a historical test database based on the model of the potentiometer; the database contains process fluctuation data of different batches of potentiometers and corresponding environmental adaptability parameters;

[0089] S202, generating an anomaly analysis report according to the associated parameters and synchronizing the location identification and deviation data of the abnormal potentiometer to the user equipment as prompt information.

[0090] During the test of the potentiometer, the test results are monitored in real time, and whether the performance of the potentiometer is abnormal is determined according to the preset standard. The test results cover various information such as electrical characteristic data, which are compared with the qualified standard. Once the deviation exceeds the allowed range, it is determined that the test is abnormal, triggering the subsequent process. After the anomaly is triggered, the model information of the potentiometer is extracted, and then the historical test database is opened. The historical test database includes process fluctuation data of different batches of potentiometers and matching environmental adaptability parameters.

[0091] Precise positioning of the process fluctuation data and environmental adaptability parameters closely related to the current abnormal potentiometer model from the database. Process fluctuation data reviews the fluctuations in key process steps such as raw material fluctuations and machining precision changes experienced by the potentiometer during production; environmental adaptability parameters include the influence of environmental factors such as temperature and humidity on the performance of the model. The trained model can be used to generate a corresponding abnormal analysis report, and the generated abnormal analysis report, the location identification of the abnormal potentiometer, and the deviation data are integrated into the system. The location identification precisely locates the abnormal potentiometer, and the deviation data quantitatively presents the performance deviation, providing a comprehensive description of the abnormal situation.

[0092] Thus, based on the deep analysis of the correlation parameters, the essence of the problem can be revealed through the phenomenon, detailed reports can be generated, and the overall situation of the abnormality can be clearly presented. Users can accurately grasp the severity, scope of influence, and development trend of the abnormality, and develop accurate and effective solutions. Abnormal prompt information is sent to the user's device in real time to realize real-time feedback of quality problems. Users do not need to wait for the test process to end before viewing the report, and can immediately know the abnormal situation on the production line, intervene in a timely manner, avoid mass production of defective products, reduce production costs, and improve overall quality control efficiency. With the organic combination of historical data and real-time abnormal information, quality control decisions are provided with strong support. Based on rich data resources, users can accurately assess the stability of the production process and the reliability of product quality, optimize the process flow, and strengthen weak links to improve product quality from the root.

[0093] Referring to Figure 3 In some embodiments, test information is obtained, including:

[0094] The direct drive motor controls the potentiometer shaft to rotate at a predetermined speed, and the following operations are performed synchronously during rotation:

[0095] S301, collect the contact resistance change between the moving contact of the potentiometer and the resistance body and the rotation torque data;

[0096] S302, dynamically adjust the loading position of the test voltage based on the contact resistance change, so that the test voltage is always loaded at the critical point of contact between the moving contact and the resistance body;

[0097] It can be considered that when the moving contact slides on the resistance body, the contact resistance is not constant, but changes sharply within a small angle of just touching or about to break, i.e. the contact is in a critical contact state. Real-time monitoring of resistance change, once the resistance change exceeds the set value, the true contact point can be determined. Because the potentiometer is rotating, the position of the moving contact is always changing, and the closed-loop action of detection-judgment-switching can be avoided, which avoids the measurement error caused by applying voltage to the virtual contact position.

[0098] S303, save the test voltage corresponding to each test node as the obtained electrical characteristic data; when the rotation torque deviates from the preset threshold range, trigger the contact pressure abnormality alarm and record the current rotation angle coordinate.

[0099] The direct drive motor drives the potentiometer shaft to rotate at a constant speed according to the preset rotation speed. This uniform rotation provides stable test conditions for subsequent data collection, ensuring that the moving contact of the potentiometer slides on the resistance body at a uniform speed, thereby achieving uniform sampling of the performance of the potentiometer at different rotation positions.

[0100] The data collection task is performed synchronously during the rotation of the potentiometer. On the one hand, the contact resistance change between the moving contact and the resistance body is collected in real time, and the subtle changes in contact resistance during the rotation of the potentiometer are accurately captured through high-precision resistance measuring instruments. On the other hand, rotation torque data is collected simultaneously, and the torque sensor is used to monitor the torque received by the potentiometer shaft during rotation in real time, reflecting the rotation resistance of the potentiometer at different rotation positions.

[0101] Based on the collected contact resistance change, the contact critical point of the moving contact and the resistance body is judged in real time. When the contact resistance change is detected, the loading position of the test voltage is quickly adjusted to ensure that the test voltage is always loaded on the actual contact critical point of the moving contact and the resistance body. This process is realized through a fast-response control circuit and an accurate voltage adjustment module, which can accurately load the test voltage to the new contact critical point at the moment of the change of the moving contact position, thereby ensuring the effectiveness and accuracy of the test voltage.

[0102] The collected rotation torque data is monitored in real time and compared with the preset torque threshold range. When the rotation torque exceeds or is lower than this preset range, the contact pressure abnormality alarm mechanism is immediately triggered. The alarm information is quickly generated and sent to the relevant monitoring equipment or operating personnel for timely action. At the same time, the rotation angle coordinate at this time is recorded to accurately locate the specific position of the torque anomaly, providing key information for subsequent problem investigation and analysis.

[0103] The test voltage corresponding to each test node is taken as electrical characteristic data, and is integrated with contact resistance change, rotation torque data, and rotation angle coordinate information. These data are systematically saved to the database or data storage device to form a complete test data record. This not only provides detailed data support for the quality evaluation of the current batch of potentiometers, but also provides historical data resources for subsequent quality traceability, process optimization, and product improvement.

[0104] Therefore, by dynamically adjusting the test voltage loading position, it is ensured that the test voltage always acts on the actual contact critical point of the moving contact and the resistor body. The voltage loading mode is used to truly reflect the electrical performance of the potentiometer in the actual working state, avoids measurement errors caused by deviation of the voltage loading position, and thus significantly improves the accuracy and reliability of the test results.

[0105] Synchronous acquisition of contact resistance change and rotation torque data realizes comprehensive monitoring of the mechanical and electrical performance of the potentiometer. The multi-dimensional data acquisition mode can more completely evaluate the quality condition of the potentiometer, discover potential problems that cannot be detected by single data acquisition, and further improve the accuracy and reliability of the test.

[0106] Real-time monitoring and abnormal alarm of the rotation torque can timely discover the contact pressure problems that may occur in the rotation process of the potentiometer. This helps to quickly locate the fault position, take corresponding maintenance or adjustment measures, reduce the rate of defective products in the production process, and improve the product quality control level.

[0107] Referring to Figure 4 In some embodiments, the loading position of the test voltage is dynamically adjusted based on the contact resistance change, including:

[0108] S401, a critical point detection threshold of the contact resistance change is acquired; when the real-time acquired contact resistance change exceeds the critical point detection threshold, it is determined that the moving contact and the resistor body are at a contact critical point;

[0109] S402, the test voltage loading path is dynamically switched to the electrode position corresponding to the critical point; after the voltage loading position is adjusted, the contact resistance change is re-detected to verify the critical point state, forming a closed-loop feedback control.

[0110] The critical point detection threshold of the contact resistance change is preset. The critical point detection threshold is obtained through experiments and data analysis, and is used to reflect the change of the contact state of the moving contact and the resistor body. In the rotation process of the potentiometer, the contact resistance change is acquired in real time. Once the real-time contact resistance change acquired exceeds the preset critical point detection threshold, it is determined that the current moving contact and the resistor body are at a contact critical point.

[0111] Based on the above determination result, a control signal is triggered, and the loading path of the test voltage is dynamically switched, so that the test voltage is precisely loaded to the electrode position corresponding to the contact critical point. This process relies on a fast-response control circuit and an accurate voltage regulation module to ensure that the test voltage can complete the adjustment of the loading position in a very short time.

[0112] After adjusting the voltage loading position, the contact resistance change detection program is started again to verify the adjusted contact critical point state. By re-detecting and comparing the new contact resistance change with the critical point detection threshold, it is confirmed whether the moving contact and the resistor body are truly at the contact critical point. This closed-loop feedback control mechanism can ensure the accuracy and reliability of the test voltage loading position, avoiding test errors caused by loading position deviation.

[0113] Therefore, by accurately identifying the critical point of contact resistance change and dynamically adjusting the test voltage loading position, it can be ensured that the test voltage is always loaded at the actual contact critical point of the moving contact and the resistor body, avoiding measurement errors caused by loading position deviation, improving the accuracy of the potentiometer electrical performance test, and making the test results more truly reflect the actual performance of the potentiometer. The introduction of the closed-loop feedback control mechanism ensures the accuracy of the voltage loading position after each adjustment, avoiding repeated adjustments and unnecessary test steps. Real-time monitoring of contact resistance change and rapid response to critical point state ensure accurate control of the potentiometer contact state during testing. Closed-loop feedback control further enhances stability and reliability, ensuring the accuracy of test results and smooth testing process even in complex testing environments, reducing the risk of false positives caused by errors.

[0114] As an example, a potentiometer testing method is provided, and the specific implementation steps are as follows:

[0115] Step 1, obtain test information. First, control the potentiometer shaft to rotate at a preset speed by a direct drive motor, the speed range is 100-1000 rpm, preferably 500 rpm. During rotation, collect the contact resistance change between the moving contact and the resistor body and the rotation torque data. The measurement range of contact resistance change is 0-100 Ω, and the torque range is 0-10 N·m. Based on the contact resistance change, dynamically adjust the loading position of the test voltage, so that the test voltage is always loaded at the contact critical point of the moving contact and the resistor body. Through real-time calculation, the test voltage corresponding to each test node is obtained as electrical characteristic data and saved.

[0116] Step 2, obtain test results. When the rotation torque deviates from the preset threshold range of 0.5-2 N·m, trigger the contact pressure abnormality alarm and record the current rotation angle coordinate. When the test result indicates a test anomaly, retrieve the associated parameters in the historical test database based on the potentiometer model. The database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters. According to the associated parameters, generate an abnormality analysis report and synchronize the position identification and deviation data of the abnormal potentiometer to the user device as prompt information.

[0117] Step 3, determine whether the test parameters need to be adjusted. First, calculate whether the absolute value of the test voltage deviation of the previous test node exceeds the preset threshold 0.1V. If it exceeds, execute step 1 to reacquire the test information; if it does not exceed, execute step 4 to adjust the test parameters.

[0118] Step 4, adjust the test parameters of the subsequent test node according to the test results of the previous test node. If the test voltage of the previous test node deviates from the preset threshold range ±0.5V, increase the sampling frequency of the subsequent node from 100kHz to 200kHz, or reduce the test angle range from ±15° to ±10°. If the linearity error of the previous test node exceeds 5%, reduce the test voltage of the subsequent node from 5V to 3V, and expand the test angle range from ±15° to ±25°. Based on the contact resistance change of the previous test node, the sampling frequency of the subsequent node is calculated according to the formula:

[0119] Sampling frequency fn+1=fn×(1+0.1×ΔRc / Rt). Where fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the contact resistance change, Rt is the total resistance 100Ω, and the adjustment coefficient k is 0.05.

[0120] The potentiometer test method controls the uniform rotation of the potentiometer shaft by a direct drive motor, and synchronously collects the contact resistance change and rotation torque data during the rotation process. Based on the contact resistance change, the test voltage loading position is dynamically adjusted to always load at the contact critical point of the moving contact and the resistance body, and the test voltage corresponding to each test node is saved as electrical characteristic data. When the rotation torque deviates from the preset threshold range, the contact pressure abnormality alarm is triggered and the current rotation angle coordinate is recorded. When the test results are abnormal, the associated parameters in the historical test database are retrieved, an abnormality analysis report is generated, and the report is synchronized to the user device along with the position identification and deviation data of the abnormal potentiometer. In addition, the test parameters of the subsequent test node, such as test voltage, sampling frequency or test angle range, are adjusted based on the test results of the previous test node to optimize the test process and improve the test accuracy. At the same time, based on the contact resistance change of the previous test node, the sampling frequency of the subsequent node is calculated according to the formula, realizing the dynamic optimization of the test parameters.

[0121] The technical scheme provided by the embodiment can ensure that the test voltage is always loaded at the actual contact position of the moving contact and the resistance body, thereby effectively avoiding measurement errors caused by deviation of the voltage loading position. Compared with the prior art, this dynamic adjustment mechanism significantly improves the accuracy of testing the electrical performance of the potentiometer, making the test results more truly reflect the actual performance of the potentiometer, and providing a more reliable basis for quality evaluation of the potentiometer.

[0122] The introduced closed-loop feedback control mechanism ensures the accuracy of each voltage loading position adjustment. By re-detecting the contact resistance change after adjustment to verify the critical point state, repeated adjustment and unnecessary test steps are avoided. This innovative design enables the system to efficiently and stably complete the dynamic switching and verification of the test voltage loading position, reducing time waste and resource consumption in the test process, effectively improving the overall test process efficiency. Compared with traditional methods, this feedback-based dynamic adjustment mechanism can better adapt to the actual working state of the potentiometer, ensuring smooth progress of the test process.

[0123] By monitoring the contact resistance change in real time and quickly responding to the critical point state, the problem of insensitivity to potentiometer contact state changes in existing technology is solved. The introduction of the closed-loop feedback control mechanism further enhances stability and reliability, ensuring the accuracy of test results and smooth progress of the test process even in complex test environments. This real-time monitoring and feedback control mechanism can effectively reduce the risk of false positives caused by errors, ensuring the stability and reliability of the potentiometer test process.

[0124] At the same time, by combining historical test database and abnormal analysis report generation mechanism, more comprehensive and accurate data support is provided for product quality evaluation. When the test result is abnormal, the system can retrieve the associated parameters in the historical test database based on the potentiometer model, generate detailed abnormal analysis reports, and synchronize the reports along with the position identification and deviation data of the abnormal potentiometer to the user device. This innovative initiative not only helps users quickly locate problems, but also provides strong evidence for product quality improvement, thereby enhancing the market competitiveness and brand image of enterprises. Compared with existing technologies, this analysis method combining historical data and real-time test results can more comprehensively evaluate the quality of potentiometers, effectively improving the effectiveness of product quality evaluation. Embodiment

[0125] The embodiment provides a potentiometer test system, the test system comprising a driving module, a collection module and a controller;

[0126] The driving module comprises a direct drive motor and its corresponding speed reducer, for synchronous control of the potentiometer angle of multiple potentiometers in the current test batch;

[0127] The collection module is used to collect the voltage, current and angle signals of each potentiometer in the current test batch;

[0128] The controller and the driving module and the collection module are electrically connected, and the controller is configured to:

[0129] acquire test information, the test information including a plurality of electrical characteristic data acquired by a plurality of potentiometers according to a preset test strategy in a current test batch; the electrical characteristic data including a plurality of test node identifiers and corresponding test voltages;

[0130] According to the test information, the test result of the potentiometer in the current test batch is acquired, and prompt information is sent to the user equipment when the test result indicates a test abnormality;

[0131] The preset test strategy refers to different states of the potentiometer as different test nodes.

[0132] According to the test result of the previous test node, the test parameters of the subsequent test node are adjusted, including test voltage, sampling frequency or test angle range.

[0133] In some embodiments, adjusting the test parameters of the subsequent test node according to the test result of the previous test node includes:

[0134] If the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, the sampling frequency of the subsequent node is increased; or,

[0135] If the number of potentiometers whose linearity error exceeds the preset tolerance meets the corresponding number ratio, the test voltage of the subsequent node is reduced and the test angle range is expanded.

[0136] In some embodiments, if the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, the adjustment coefficient is updated according to the linearity error number ratio; the linearity error number ratio is the ratio of the number of potentiometers whose linearity error exceeds the preset tolerance in the previous test node.

[0137] According to the sampling frequency, the contact resistance change, the total resistance value and the updated adjustment coefficient of the current test node, the sampling frequency of the subsequent test node is acquired; at the same time, it is judged whether the linearity error number exceeds the corresponding number ratio.

[0138] If it exceeds, the test voltage of the subsequent node is reduced and the test angle range is expanded.

[0139] In some embodiments, adjusting the test parameters specifically includes: based on the contact resistance change of the previous test node, calculating the sampling frequency of the subsequent node according to the following formula: fn+1=fn×(1+k·ΔRc / Rt) Wherein, fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the contact resistance change, Rt is the total resistance value, and k is the adjustment coefficient.

[0140] In some embodiments, the sending prompt information to the user equipment when the test result indicates an abnormality comprises:

[0141] When the test result indicates an abnormality, the associated parameters in the historical test database are called based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters;

[0142] An abnormality analysis report is generated according to the associated parameters, and the location identification and deviation data of the abnormal potentiometer are synchronized to the user equipment as prompt information.

[0143] In some embodiments, the test information is obtained, comprising:

[0144] The potentiometer shaft is uniformly rotated at a preset rotation speed by a direct drive motor, and the following operations are performed synchronously during rotation:

[0145] The contact resistance change amount between the moving contact of the potentiometer and the resistance body and the rotation torque data are collected;

[0146] The loading position of the test voltage is dynamically adjusted based on the contact resistance change amount, so that the test voltage is always loaded at the contact critical point of the moving contact and the resistance body;

[0147] The test voltage corresponding to each test node is taken as the obtained multiple electrical characteristic data and saved; when the rotation torque deviates from the preset threshold range, an abnormal contact pressure alarm is triggered and the current rotation angle coordinate is recorded.

[0148] In some embodiments, the dynamically adjusting the loading position of the test voltage based on the contact resistance change amount comprises:

[0149] The critical point detection threshold of the contact resistance change amount is obtained; when the real-time collected contact resistance change amount exceeds the critical point detection threshold, it is determined that the moving contact and the resistance body are at the contact critical point;

[0150] The test voltage loading path is dynamically switched to the electrode position corresponding to the critical point; after adjusting the voltage loading position, the contact resistance change amount is detected again to verify the critical point state, forming a closed-loop feedback control.

[0151] As an example, a potentiometer test system is provided, comprising a driving module, a collection module and a controller. The driving module comprises a direct drive motor and a speed reducer. The collection module is used to collect the voltage, current and rotation angle signals of the potentiometer. The controller uses an industrial control computer.

[0152] The test software is installed on the controller, and the test parameters are set through the software interface. Before the test starts, the potentiometer model is selected through the software interface, and the system automatically retrieves the corresponding test strategy and database parameters. During the test, the controller collects test data in real time and analyzes them. When an anomaly is found, an abnormal report is automatically generated and sent to the user's mobile phone through the wireless network.

[0153] After the test is completed, the system automatically generates a test report containing test results, abnormality analysis conclusions, and parameter adjustment suggestions. Users can adjust the test strategy according to the report to optimize the test parameters. The system realizes the automation and intelligence of potentiometer testing, improving the test efficiency and accuracy.

[0154] As another example, an improved scheme for testing a potentiometer is also provided, which is applied to the above-mentioned potentiometer testing system and further optimizes the parameter adjustment strategy during the test. The specific steps are as follows:

[0155] Step 1, obtain test information. Before the test starts, set the test parameters through the software interface, including a test voltage range of 1-10V, a sampling frequency range of 50-500kHz, and a test angle range of ±30°. During the test, the potentiometer shaft rotates at a constant speed of 500rpm. During rotation, the contact resistance change, rotational torque, and potentiometer output voltage data are collected. The measurement range of the contact resistance change is 0-200Ω, and the torque range is 0-5N·m.

[0156] Step 2, obtain test results. When the torque deviates from the 1N·m threshold, an abnormal alarm is triggered and the current rotation angle is recorded. When the test results are abnormal, the system automatically analyzes the abnormal reasons and retrieves related parameters from the database according to the potentiometer model.

[0157] Step 3, determine whether the test parameters need to be adjusted. First, calculate whether the voltage deviation of the current test node exceeds the 0.2V threshold. If it exceeds, execute Step 1 to reacquire test information; if it does not exceed, execute Step 4 to adjust the test parameters.

[0158] Step 4, adjust the test parameters of the subsequent test nodes according to the test results of the previous test node. If the voltage deviation of the previous node exceeds 0.3V or the linearity error exceeds 10%, take appropriate adjustment measures: reduce the voltage by 1V or increase the frequency by 20kHz; if the torque is abnormal, adjust the angle range to ±20°. After adjustment, the system automatically calculates and sets new test parameters and continues the next round of testing.

[0159] The improved scheme improves the accuracy and stability of the test by a more accurate parameter adjustment strategy, and is suitable for test and evaluation of various types of potentiometers.

[0160] Finally, it should be noted that: the above only for the preferred embodiments of the present application, and not for the purpose of limiting the present application, although the foregoing embodiments of the present application are described in detail, for those skilled in the art, it still can be modified, or the equivalent replacement of part of the technical features described in the foregoing embodiments. Any modification, equivalent replacement, improvement, etc. within the spirit and principles of the present application shall be included within the scope of the present application.

Claims

1. A method of testing a potentiometer, characterized by: The method comprises: acquiring test information, the test information comprising a plurality of electrical characteristic data acquired by a plurality of potentiometers in a current test batch according to a preset test strategy; the electrical characteristic data comprising a plurality of test node identifiers and corresponding test voltages; acquiring a potentiometer test result of the current test batch according to the test information, and sending prompt information to a user device when the test result indicates a test abnormality; wherein the preset test strategy refers to different states of the potentiometer as different test nodes; test parameters of a subsequent test node are adjusted according to a test result of a previous test node, the test parameters comprising a test voltage, a sampling frequency or a test angle range; acquiring test information, comprising: controlling the potentiometer shaft to rotate at a preset speed by a direct drive motor, and synchronously performing the following operations during rotation: collecting contact resistance variation between the moving contact of the potentiometer and the resistor body and rotation torque data; dynamically adjusting the loading position of the test voltage based on the contact resistance variation, so that the test voltage is always loaded at the contact critical point of the moving contact and the resistor body; saving the test voltage corresponding to each test node as the acquired plurality of electrical characteristic data; when the rotation torque deviates from the preset threshold range, triggering a contact pressure abnormality alarm and recording the current rotation angle coordinate.

2. The method of testing a potentiometer according to claim 1, wherein, adjusting the test parameters of the subsequent test node according to the test result of the previous test node, comprising: if the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, increasing the sampling frequency of the subsequent node; or if the number of potentiometers whose linearity error exceeds the preset tolerance meets the corresponding number ratio, reducing the test voltage of the subsequent node and expanding the test angle range.

3. The method of testing a potentiometer according to claim 1, wherein, adjusting the test parameters of the subsequent test node according to the test result of the previous test node, comprising: if the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, updating the adjustment coefficient according to the linearity error number ratio; the linearity error number ratio is the ratio of the number of potentiometers whose linearity error exceeds the preset tolerance in the previous test node; acquiring the sampling frequency of the subsequent test node according to the sampling frequency of the current test node, the contact resistance variation, the total resistance value and the updated adjustment coefficient; at the same time, judging whether the linearity error number exceeds the corresponding number ratio; if so, reducing the test voltage of the subsequent node and expanding the test angle range.

4. A method of testing a potentiometer according to claim 2 or 3, characterised in that, The adjustment of the test parameters specifically comprises: calculating the sampling frequency of the subsequent node according to the following formula based on the contact resistance variation of the previous test node: fn+1=fn×(1+k·ΔRc / Rt) wherein fn+1 is the sampling frequency of the subsequent node, fn is the sampling frequency of the current test node, ΔRc is the contact resistance variation, Rt is the total resistance value, and k is the adjustment coefficient.

5. The method of testing a potentiometer of claim 1, wherein, the sending of the prompt information to the user device when the test result indicates a test abnormality, comprising: When the test result indicates an abnormality, associated parameters in a historical test database are called based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and corresponding environmental adaptability parameters; An abnormality analysis report is generated according to the associated parameters, and the position identification and deviation data of the abnormal potentiometer are synchronized to the user equipment as prompt information.

6. The method of testing a potentiometer of claim 1, wherein, Based on the contact resistance change amount, the loading position of the test voltage is dynamically adjusted, including: A critical point detection threshold of the contact resistance change amount is obtained; when the real-time collected contact resistance change amount exceeds the critical point detection threshold, it is determined that the moving contact and the resistance body are at a contact critical point; The test voltage loading path is dynamically switched to the electrode position corresponding to the critical point; after the voltage loading position is adjusted, the contact resistance change amount is re-detected to verify the critical point state, forming a closed-loop feedback control.

7. A system for testing potentiometers, characterized by The test system includes a driving module, a collection module and a controller; The driving module includes a direct drive motor and a corresponding speed reducer, which is used to synchronously control the potentiometer rotation angle of the plurality of potentiometers in the current test batch; The collection module is used to collect the voltage, current and rotation angle signals of each potentiometer in the current test batch; The controller is electrically connected with the driving module and the collection module, and the controller is configured to: Obtain test information, including a plurality of electrical characteristic data obtained by testing a plurality of potentiometers in the current test batch according to a preset test strategy; The electrical characteristic data includes a plurality of test node identifications and corresponding test voltages; According to the test information, the test result of the potentiometer in the current test batch is obtained, and prompt information is sent to the user equipment when the test result indicates a test abnormality; The preset test strategy refers to different states of the potentiometer as different test nodes; the test parameters of the subsequent test nodes are adjusted according to the test result of the previous test node, and the test parameters include test voltage, sampling frequency or test angle range; Obtain test information, including: Control the potentiometer shaft to rotate at a preset rotation speed by the direct drive motor, and synchronously execute the following operations during rotation: Collect the contact resistance change amount between the moving contact of the potentiometer and the resistance body and the rotation torque data; Based on the contact resistance change amount, the loading position of the test voltage is dynamically adjusted, so that the test voltage is always loaded at the contact critical point of the moving contact and the resistance body; The test voltage corresponding to each test node is saved as the obtained plurality of electrical characteristic data; when the rotation torque deviates from the preset threshold range, an abnormal contact pressure alarm is triggered and the current rotation angle coordinate is recorded.

8. The potentiometer testing system of claim 7, wherein, According to the test result of the previous test node, the test parameters of the subsequent test nodes are adjusted, including: If the number of potentiometers whose test voltage deviates from the preset threshold range meets the corresponding number ratio, the sampling frequency of the subsequent node is increased; or, If the number of potentiometers whose linearity error exceeds the preset tolerance meets the corresponding number ratio, the test voltage of the subsequent node is reduced and the test angle range is expanded.

9. The potentiometer testing system of claim 7, wherein, When the test result indicates a test abnormality, prompt information is sent to the user equipment, including: When the test result indicates an abnormality, associated parameters in a historical test database are recalled based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and corresponding environmental adaptability parameters thereof; An abnormality analysis report is generated according to the associated parameters, and the location identification and deviation data of the abnormal potentiometer are synchronized to a user device as prompt information.

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