Coupler product durability test device for high-temperature environment

Abstract

The invention relates to the technical field of detection equipment, in particular to a coupler product durability test device for a high-temperature environment, which comprises an automatic temperature acquisition instrument, an automatic temperature rise tester and an automatic temperature control test box, and is characterized in that the automatic temperature acquisition instrument and the automatic temperature rise tester are connected with a computer for collecting data information through data wires; the temperature data of a product is read in real time through the automatic temperature acquisition instrument, the automatic temperature rise tester and the automatic temperature control test box, an accurate and smooth curve graph can be drawn through a large amount of data acquisition, the tested current and the temperature of the drying oven can be automatically adjusted, and continuous manual adjustment of personnel is reduced.

Description

Technical Field

[0001] This invention relates to the field of testing equipment technology, and specifically to a durability testing device for coupler products used in high-temperature environments. Background Technology

[0002] As the operating environments of various electrical appliances become more complex and the heat generated by the products themselves increases, the requirements for the parameters of various key components become more stringent, especially in terms of high-temperature resistance. If a product cannot withstand high-temperature environments, it may cause product aging or even the risk of product ignition.

[0003] International / domestic standards IEC 60320-1:2021 and GB / T17465.1-2022 propose relevant requirements for coupler products suitable for high-temperature environments. They specify the method for derating the operating current of the accessory when the ambient temperature is above +35℃ but not exceeding +90℃, and include various tests.

[0004] The current testing method involves placing the test product in an oven, with temperature measurement points positioned on the L and N terminals of the matching appliance input socket, appliance output socket, or plug connector. The product's rated current is then applied, and the real-time temperature is monitored using a temperature monitor. After reaching thermal stability at each selected current level, the current should be maintained for approximately 30 minutes. Stability is considered achieved when three consecutive temperature rise values, each recorded 5 minutes apart, show a difference of no more than 2K between them.

[0005] At this point, the ambient temperature is adjusted by heating the oven to simulate the operating environment of the product. By increasing the ambient temperature to reach the upper limit of 90℃, the initial temperature value ta of the product is determined. If the product itself generates a relatively high amount of heat after applying the rated current without initially heating the oven, the oven temperature will reach 90℃ at a relatively low level. A total of six tests are required on three samples to obtain the average initial temperature ta. The testing process requires continuous adjustment of the oven temperature, resulting in a long waiting time and cumbersome operation for personnel. The entire testing process is time-consuming and labor-intensive.

[0006] Once the ta value is determined, a curve graph showing the relationship between rated and dated currents and ambient temperature needs to be plotted. The temperature of the heating chamber is gradually increased, up to a maximum of 5°C, while the test current is decreased, maintaining the highest measured temperature at each terminal at (+90±1)°C. For each step, the measured dated operating current (Id) is recorded. Id should be the average of the three samples. This process continues until the highest temperature measured at the terminals and the heating chamber temperature are maintained at (+90±1)°C for 30 minutes. Finally, a curve graph showing the relationship between ambient temperature and the maximum operating current that the product can withstand is plotted using the highest ambient temperature value corresponding to each current. The entire process requires repeated adjustments to the current and oven temperature values, and involves collecting and recording numerous temperature and current values. Manual adjustment and recording are tedious, time-consuming, and cannot accurately determine the correspondence between multiple points. Summary of the Invention

[0007] The purpose of this invention is to address the shortcomings and deficiencies of existing technologies by providing a durability testing device for coupler products used in high-temperature environments.

[0008] The present invention discloses a durability testing device for coupler products used in high-temperature environments, comprising an automatic temperature acquisition instrument, an automatic temperature rise tester, and an automatic temperature control test chamber. The automatic temperature acquisition instrument and the automatic temperature rise tester are connected to a computer that collects data information via data cables.

[0009] Furthermore, the automatic temperature-controlled test chamber is an electric thermostatic drying oven with model number DHG-9036A.

[0010] Furthermore, the automatic temperature acquisition device is a USB interface temperature logger with model number OMEGA OM-EL-USB-TC or a wireless temperature / humidity logger with model number Hobo MX220.

[0011] Among them: the USB interface temperature logger supports multiple thermocouple types and is suitable for laboratory and industrial environments; the Onset Hobo MX220 wireless temperature / humidity logger can transmit data via Bluetooth and is suitable for environmental monitoring. Alternatively, the Fluke 50-II high-precision handheld temperature acquisition device can be used, supporting thermocouples (K / J / T type) and RTD (PT100) probes.

[0012] Furthermore, the automatic temperature rise tester consists of a relay on / off counting trigger device and a voltage drop tester.

[0013] Among them, the relay on / off counting trigger device is model AB-TDS-JS1; the voltage drop tester is model AB-8831ZCH.

[0014] The following steps are used for durability testing of coupler products for high-temperature environments:

[0015] Step 1: After wiring the test product, place it directly into the automatic temperature-controlled test chamber;

[0016] Step 2: Set the initial test current value of the automatic temperature rise tester, start the automatic temperature acquisition instrument, and adjust the temperature value of the temperature environment chamber by testing the temperature data after the temperature stabilizes for 0.5 to 1.5 hours.

[0017] Step 3: Start the automatic temperature control test chamber to heat up. The automatic temperature control test chamber can be set and adjusted to heat up at a rate of 1 kJ / min until the temperature value at the temperature acquisition point stabilizes at 90 ± 1℃. At this time, an alarm will be triggered to notify that the test is completed. The temperature value of the oven will be automatically recorded as the ta value.

[0018] Step 4: Starting with the ambient temperature of the ta value in Step 3, reduce the value of the test current. By reducing the test current, the temperature value of the product will drop below 90. At this time, the automatic temperature control chamber will automatically adjust the ambient temperature according to the data change. After the current is reduced, the automatic temperature control chamber will raise the temperature to compensate for the temperature drop caused by the current reduction, and then maintain it within 90±1℃. The process will be continuously cyclically adjusted, and relevant data will be automatically collected to finally generate the derating curve of the product.

[0019] The beneficial effects of the present invention are as follows: The durability testing device for coupler products in high-temperature environments described in the present invention reads the product temperature data in real time through an automatic temperature acquisition instrument, an automatic temperature rise tester, and an automatic temperature control test chamber. It can draw accurate and smooth curves through a large amount of data acquisition and can automatically adjust the test current and the temperature of the oven, reducing the need for manual adjustments. Attached Figure Description

[0020] The accompanying drawings, which are provided to further illustrate the invention and form part of this application, are not intended to unduly limit the invention. In the drawings:

[0021] Figure 1 This is a schematic diagram of the topology of the present invention;

[0022] Figure 2 This is a derating curve diagram of the product of this invention. Detailed Implementation

[0023] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments. The illustrative embodiments and descriptions are only used to explain the present invention and are not intended to limit the present invention.

[0024] like Figure 1As shown in the figure, the durability testing device for coupler products in high-temperature environments described in this specific embodiment includes an automatic temperature acquisition instrument, an automatic temperature rise tester, and an automatic temperature control test chamber. The automatic temperature acquisition instrument and the automatic temperature rise tester are connected to a computer that collects data information via data cables.

[0025] Furthermore, the automatic temperature-controlled test chamber is an electric thermostatic drying oven with model number DHG-9036A.

[0026] Furthermore, the automatic temperature acquisition device is a USB interface temperature logger with model number OMEGA OM-EL-USB-TC or a wireless temperature / humidity logger with model number Hobo MX220.

[0027] Among them: the USB interface temperature logger supports multiple thermocouple types and is suitable for laboratory and industrial environments; the Onset Hobo MX220 wireless temperature / humidity logger can transmit data via Bluetooth and is suitable for environmental monitoring. Alternatively, the Fluke 50-II high-precision handheld temperature acquisition device can be used, supporting thermocouples (K / J / T type) and RTD (PT100) probes.

[0028] Furthermore, the automatic temperature rise tester consists of a relay on / off counting trigger device and a voltage drop tester.

[0029] Among them, the relay on / off counting trigger device is model AB-TDS-JS1; the voltage drop tester is model AB-8831ZCH.

[0030] Of course, the automatic temperature rise tester can also be the OMEGA OM-DAQ-TC model, which features a portable design, compatibility with various thermocouples, and a low-cost solution suitable for testing small and medium-sized couplers. Alternatively, the Keysight 34972A model can be used, supporting multi-channel temperature acquisition (thermocouple / RTD), integrating data logging and analysis functions, and is suitable for high-precision temperature rise testing; applicable scenarios include long-term durability testing of high-frequency couplers or high-power devices.

[0031] The following steps are used for durability testing of coupler products for high-temperature environments:

[0032] Step 1: After wiring the test product, place it directly into the automatic temperature-controlled test chamber;

[0033] Step 2: Set the initial test current value of the automatic temperature rise tester, start the automatic temperature acquisition instrument, and adjust the temperature value of the temperature environment chamber by testing the temperature data after the temperature stabilizes for 0.5 to 1.5 hours.

[0034] Step 3: Start the automatic temperature control test chamber to heat up. The automatic temperature control test chamber can be set and adjusted to heat up at a rate of 1 kJ / min until the temperature value at the temperature acquisition point stabilizes at 90 ± 1℃. At this time, an alarm will be triggered to notify that the test is completed. The temperature value of the oven will be automatically recorded as the ta value.

[0035] Step 4: Starting with the ambient temperature of the ta value in Step 3, reduce the value of the test current. By reducing the test current, the temperature value of the product will drop below 90. At this time, the automatic temperature control chamber will automatically adjust the ambient temperature according to the data change. After the current is reduced, the automatic temperature control chamber will raise the temperature to compensate for the temperature drop caused by the current reduction, and then maintain it within 90±1℃. The process will be continuously cyclically adjusted, and relevant data will be automatically collected to finally generate the derating curve of the product.

[0036] The working principle of this invention is explained in detail below:

[0037] This design is a further innovative development aimed at solving the problem of the cumbersome process of manually probing and trying to confirm the ta value of couplers, as well as the problem of requiring a lot of manual settings and operations, and recording of temperature and current values, when acquiring data and plotting the curve relationship between rated and derating currents related to ambient temperature.

[0038] This solution mainly involves creating a complete testing system using an automatic temperature acquisition instrument, an automatic temperature rise tester, and an automatic temperature control test chamber.

[0039] During use, after wiring the test product, place it directly into the automatic temperature-controlled environmental chamber (automatic temperature-controlled test chamber); set the initial test current value of the automatic temperature rise tester, start the automatic temperature acquisition instrument, and adjust the temperature value of the environmental chamber by using the temperature data after 1 hour of testing to stabilize the temperature; start the temperature environment chamber to heat up. The temperature environment chamber can be set and adjusted to a heating rate of 1 kJ / min until the temperature value at the temperature acquisition point stabilizes at 90 ± 1℃, at which point an alarm will be triggered to notify that the test is complete. At this time, the temperature value of the oven will be automatically recorded as the ta value.

[0040] This invention utilizes a test system that can automatically acquire derating curves using an ambient temperature (td) and a derating current (Id) as an example. The temperature sensing value is set to 90±1℃. Starting at the ambient temperature (ta), the test current is reduced. As the test current decreases, the product temperature will drop below 90℃. The automatic temperature-controlled environmental chamber will then automatically adjust the ambient temperature based on the data changes. After the current decreases, the environmental chamber will heat up to compensate for the temperature drop caused by the current reduction, and then maintain the temperature within 90±1℃. This cycle is continuously repeated, automatically acquiring relevant data, and ultimately generating a derating curve for the product, as shown in the attached figure. Figure 2 .

[0041] This invention involves arranging the test samples and placing them in an automatic temperature-controlled test chamber. The initial test current value of the automatic temperature rise tester is set, and the automatic temperature acquisition instrument is activated. During the process, the automatic temperature-controlled test chamber automatically increases the temperature based on the stability of the data. Then, depending on whether the current highest temperature exceeds the limit, it automatically decreases the temperature. Finally, the stable relationship between current and temperature is recorded, and a curve is plotted using the data.

[0042] The experimental environment and measuring instruments in this invention:

[0043] a)) Atmospheric pressure: 86 kPa~106 kPa;

[0044] b)) Ambient temperature: 23℃±2℃, and no airflow or heat radiation in the laboratory;

[0045] c) Relative humidity: 45%–75%;

[0046] d) The accuracy of voltmeters, power meters, automatic temperature acquisition instruments, automatic temperature rise testers, and automatic temperature control test chambers should not be less than ±0.5%.

[0047] The advantages of this invention are as follows:

[0048] (1) The high-temperature environment coupler product durability testing device invented in this study is applicable to various types of products, improves working efficiency and operational flexibility, reduces overall cost, and can accurately measure data.

[0049] (2) The present invention can read the temperature data of the product in real time and draw accurate and smooth curves through a large amount of data collection.

[0050] (3) The present invention can automatically adjust the test current and oven temperature, reducing the need for manual adjustments.

[0051] (4) The present invention has an over-temperature alarm system to avoid fire caused by over-temperature and to avoid test failure caused by over-temperature, thus avoiding repeated testing. After avoiding the above situations, the overall efficiency is improved.

[0052] The above description is only a preferred embodiment of the present invention. Therefore, all equivalent changes or modifications made in accordance with the features and principles described in the claims of this patent application are included in the scope of this patent application.

Claims

1. A durability testing device for coupler products used in high-temperature environments, characterized in that: It includes an automatic temperature acquisition instrument, an automatic temperature rise tester, and an automatic temperature control test chamber. The automatic temperature acquisition instrument and the automatic temperature rise tester are connected to a computer that collects data information via data cables.

2. The durability testing device for coupler products in high-temperature environments according to claim 1, characterized in that: The automatic temperature control test chamber is an electric thermostatic drying oven with model number DHG-9036A.

3. The durability testing device for coupler products in high-temperature environments according to claim 1, characterized in that: The automatic temperature acquisition device is either a USB interface temperature logger with model number OMEGA OM-EL-USB-TC or a wireless temperature / humidity logger with model number HoboMX220.

4. The durability testing device for coupler products in high-temperature environments according to claim 1, characterized in that: The automatic temperature rise tester consists of a relay on / off counting trigger device and a voltage drop tester; wherein, the relay on / off counting trigger device is model AB-TDS-JS1; and the voltage drop tester is model AB-8831ZCH.

5. Durability test of coupler products for high-temperature environments, characterized in that: The following steps are used: Step 1: After wiring the test product, place it directly into the automatic temperature-controlled test chamber; Step 2: Set the initial test current value of the automatic temperature rise tester, start the automatic temperature acquisition instrument, and adjust the temperature value of the temperature environment chamber by testing the temperature data after the temperature stabilizes for 0.5 to 1.5 hours. Step 3: Start the automatic temperature control test chamber to heat up. The automatic temperature control test chamber can be set and adjusted to heat up at a rate of 1 kJ / min until the temperature value at the temperature acquisition point stabilizes at 90 ± 1℃. At this time, an alarm will be triggered to notify that the test is completed. The temperature value of the oven will be automatically recorded as the ta value. Step 4: Starting with the ambient temperature of the ta value in Step 3, reduce the value of the test current. By reducing the test current, the temperature value of the product will drop below 90. At this time, the automatic temperature control chamber will automatically adjust the ambient temperature according to the data change. After the current is reduced, the automatic temperature control chamber will raise the temperature to compensate for the temperature drop caused by the current reduction, and then maintain it within 90±1℃. The process will be continuously cyclically adjusted, and relevant data will be automatically collected to finally generate the derating curve of the product.

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